SPECTROSCOPICAL ANALYSIS DEVICE WITH A MULTI-CHAMBER CUVET FOR FLUID OR GAS ANALYSIS AND CORRESPONDING METHOD

Description

[0001] The invention relates to a spectroscopic analysis device with a multi-chamber cuvette for fluid or gas analysis and a corresponding method.

[0002] Currently, cuvettes are used in gas analyzers. To detect multiple gas components with a single cuvette, different wavelengths of radiation are alternately introduced. These wavelengths can be in the UV or IR range. This is achieved, for example, using appropriate light sources. The light is introduced on one side of the cuvette, and the resulting radiation intensity is measured on the opposite side. Depending on the components it contains and their concentrations, the gas being analyzed absorbs different wavelength ranges to varying degrees, thus reducing the radiation intensity on the receiving side accordingly. This allows for reliable detection of the respective gas components (via wavelengths) and their concentrations (via intensity).

[0003] To provide different wavelengths, optical filters are used that can be mechanically swung into the beam path. This allows for the acquisition of additional information. However, this increases the complexity of the measurement setup, leads to higher costs, requires more installation space, and increases the overall system's susceptibility to errors. Furthermore, the dynamics and accuracy of the measurement system are reduced because swung-in of the filters, in conjunction with the actual measurement step, further reduces the time required for all other measurements without filters. On the receiver side, optical elements are also required to focus the radiation exiting the cuvette onto the detectors used, depending on the application. This, too, requires installation space and incurs additional costs.

[0004] DE 20 2019 101 137 U1 relates to an analysis device according to the preamble of claim 1.

[0005] DE 20 2021 104 857 U1 describes an analytical device for determining the concentration of at least nitric oxide in a gas mixture. In one embodiment, the analytical device comprises a pair of measuring chambers, wherein the measuring gas can be introduced into one measuring chamber of the pair and wherein a reference measuring gas is contained in the other measuring chamber of the pair. In another embodiment, the analytical device comprises two such pairs of measuring chambers, wherein the two pairs of measuring chambers are arranged separately from one another.

[0006] US patent 6 940 083 B2 discloses an analysis device with two connected measuring chambers.

[0007] The object of the present invention is therefore to create a spectroscopic analysis device that is more robust than those of the prior art and that allows for shorter measurement times or, alternatively, higher measurement accuracy.

[0008] The problem is solved with respect to the spectroscopic analysis device according to independent claim 1.

[0009] The spectroscopic analysis device according to the invention comprises a multi-chamber cuvette for fluid or gas analysis. The multi-chamber cuvette has at least two measuring chambers into which the fluid or gas for analysis can be introduced. The at least two measuring chambers are optically separated from each other. This means that light emitted through one measuring chamber cannot couple into the second measuring chamber, as would happen, for example, through an optically transparent wall. Furthermore, an illumination device is provided, which is configured to generate light and couple it into the at least one first and second measuring chamber. Additionally, a detection device is provided, which is configured to measure the intensity of the light emitted (transmitted) by the fluid or gas in the first measuring chamber for a first wavelength and to generate a first measurement result.Furthermore, the detection device is designed to measure the intensity of the light emitted by the fluid or gas in the second measuring chamber for a second wavelength and to generate a second measurement result. The first and second wavelengths are different.

[0010] It is particularly advantageous to use a multi-chamber cuvette comprising at least two measuring chambers. This allows the fluid or gas to be analyzed simultaneously with two different wavelengths or wavelength ranges. This enables a particularly rapid determination of which substances are present or absent in the fluid or gas. As a result, higher measurement dynamics and greater accuracy are achieved compared to state-of-the-art gas analyzers.

[0011] By using at least two measurement chambers, spatial multiplexing is achieved, eliminating the need for swiveling filters. The robustness of the analysis device is increased by removing corresponding moving elements (e.g., chopper wheel or filter wheel). It is emphasized that the spectroscopic analysis device can, of course, include more than two measurement chambers. Thus, the spectroscopic analysis device can include three, four, or more than four measurement chambers. It is particularly advantageous that the light radiating through the first measurement chamber is free of components of the second wavelength by the time it reaches the detection unit. Conversely, the light radiating through the second measurement chamber is also free of components of the first wavelength by the time it reaches the detection unit.As will be explained later, the light can be generated in such a way that it does not contain the unwanted components (narrowband light), or the unwanted components can be filtered out on the transmission path by a suitable filter arrangement.

[0012] Instead of the first wavelength, a first wavelength range can also be used or understood, and instead of the second wavelength, a second wavelength range can also be used or understood. All disclosures relating to the first and second wavelengths also apply accordingly to the first and second wavelength ranges. The wavelength ranges can each comprise contiguous and / or non-contiguous ranges of wavelengths. According to the invention, the wavelength ranges can be different. Different wavelength ranges can, for example, have no common wavelengths or differ in at least one wavelength each.

[0013] The light emitted through a measuring chamber (e.g. the first or second measuring chamber) can also include only light of the first wavelength or only of the first wavelength range, or only light of the second wavelength or only of the second wavelength range.

[0014] In In an advantageous further development of the analytical device, the multi-chamber cuvette is an extruded part, preferably made of extruded aluminum. This allows the multi-chamber cuvette to be manufactured particularly cost-effectively. The multi-chamber cuvette comprises or consists of metal or a metal alloy. The material comprising the multi-chamber cuvette is opaque to the first wavelength and the second wavelength.

[0015] According to the invention, the multi-chamber cuvette is a one-piece extruded part, preferably made of extruded aluminum. In this case, the first measuring chamber and the second measuring chamber are formed from a single common part. Preferably, the first measuring chamber and the second measuring chamber are separated from each other by a single common partition. In other words, the first measuring chamber and the second measuring chamber are separated from each other only by exactly one partition. Preferably, the first measuring chamber and the second measuring chamber are of the same length and / or have the same cross-sectional area.

[0016] In an advantageous further development of the analysis device, the first measuring chamber and the second measuring chamber are separated from each other within the analysis device or within the multi-chamber cuvette, so that no exchange of the fluid or gas from the first measuring chamber to the second measuring chamber is possible within the analysis device or within the multi-chamber cuvette.

[0017] In an advantageous further development of the analysis device, the detection unit is designed to generate the first and second measurement results in parallel. This allows the measurement results to be compared directly.

[0018] In an advantageous embodiment of the analytical device, the multi-chamber cuvette comprises at least a first and a second reference measuring chamber. Furthermore, the illumination device is configured to couple light into the at least one first and second reference measuring chamber. The detection device is configured to measure the intensity of the light emitted (transmitted) by the first reference measuring chamber for the first wavelength and to generate a first reference measurement result. The detection device is further configured to measure the intensity of the light emitted by the second reference measuring chamber for the second wavelength and to generate a second reference measurement result. Preferably, each measuring chamber comprises a corresponding reference measuring chamber. The reference measuring chamber allows for a plausibility check or a correction of the first or second measurement result.It is particularly advantageous that the light radiating through the first reference measuring chamber is free of components of the second wavelength at the latest by the time it reaches the detection device. Conversely, the same applies: the light radiating through the second reference measuring chamber is also free of components of the first wavelength at the latest by the time it reaches the detection device. As will be explained later, the light can be generated in such a way that it does not contain the unwanted components (narrowband light), or the unwanted components can be filtered out along the transmission path by a suitable filter arrangement.

[0019] According to the invention, the multi-chamber cuvette is a one-piece extruded part, preferably made of extruded aluminum. In this case, the first measuring chamber, the second measuring chamber, the first reference measuring chamber, and the second reference measuring chamber are formed from a single part. Preferably, the first measuring chamber, the second measuring chamber, the first reference measuring chamber, and the second reference measuring chamber are of the same length and / or have the same cross-sectional area. Preferably, each chamber is separated from at least one other chamber by a single partition. In other words, the partition is a common partition.

[0020] In an advantageous further development of the analysis device, the first and second reference measuring chambers are optically separated from each other and from the first and second measuring chambers. This ensures that coupled-in light cannot interact with light in other measuring chambers and thus distort the measurement results.

[0021] In an advantageous further development of the analysis device, the detection unit is configured to compensate for the first measurement result with the first reference measurement result. Furthermore, the detection unit is configured to compensate for the second measurement result with the second reference measurement result. "Compensation" refers in particular to the appropriate calibration of the sensitivity of the detection unit or the taking into account the degradation of the light source. This allows for a more accurate measurement of the intensity of the light emitted by the first and second measuring chambers.

[0022] In an advantageous further development of the analysis device, the detection unit is configured to average the first measurement result over time and the second measurement result over time. Preferably, the compensated first and second measurement results are averaged over time.

[0023] In an advantageous further development, the first reference chamber is free of the fluid or gas to be analyzed. Additionally or alternatively, the first reference chamber contains a reference fluid or a reference gas. The reference gas can be, for example, normal air or nitrogen. This allows the sensitivity of the detection device, which captures the light transmitted through the first reference chamber, to be determined. Additionally, the second reference chamber is free of the fluid or gas to be analyzed. Additionally or alternatively, the second reference chamber contains a reference fluid or a reference gas. The reference gas can be, for example, normal air. This allows the sensitivity of the detection device, which captures the light transmitted through the second reference chamber, to be determined.

[0024] In an advantageous embodiment of the analysis device, the first measuring chamber and the first reference measuring chamber are identical in construction. Additionally or alternatively, the second measuring chamber and the second reference measuring chamber are identical in construction. Additionally or alternatively, at least one first measuring chamber and the second measuring chamber are identical in construction. Additionally or alternatively, at least one first reference measuring chamber and the second reference measuring chamber are identical in construction. The term "identical" means that the respective chambers comprise the same volume and / or the same cross-sectional area, or that the volume and / or the cross-sectional area of ​​the respective chambers differ from each other by less than 10% or by less than 5%. Preferably, the path traveled by the light through the respective measuring chamber or reference measuring chamber is also the same length.

[0025] In an advantageous embodiment of the analysis device, a first filter arrangement is provided and configured to filter out wavelengths from the light generated by the illumination device, such that the light emitted through the first measuring chamber and the first reference measuring chamber contains, at the latest (with respect to the path) in the detection device, only the first wavelength or the first wavelength range. Additionally or alternatively, a second filter arrangement is provided and configured to filter out wavelengths from the light generated by the illumination device, such that the light emitted through the second measuring chamber and the second reference measuring chamber contains, at the latest (with respect to the path) in the detection device, only the second wavelength or the second wavelength range.The first filter arrangement is opaque for the second wavelength, and the second filter arrangement is opaque for the first wavelength.

[0026] In an advantageous embodiment of the analytical device, the first filter arrangement comprises an optical filter or a gas-filled filter. Additionally or alternatively, the second filter arrangement comprises an optical filter or a gas-filled filter. The type of filter used can depend, for example, on the wavelength that the filter is intended to transmit or filter out.

[0027] In an advantageous embodiment of the analytical device, the first filter arrangement is fixedly arranged within the spectroscopic analytical device, wherein the first filter arrangement is transparent to light of the first wavelength and opaque to light of the second wavelength. The first filter arrangement is: a) between the lighting device and the first measuring chamber; or b) within the first measuring chamber; or c) between the first measuring chamber and the detection device; or d) within the detection device; Furthermore, the first filter arrangement is arranged: a) between the illumination device and the first reference measuring chamber; or b) within the first reference measuring chamber; or c) between the first reference measuring chamber and the detection device; or d) within the detection device.

[0028] The term "stationary" means that the first filter assembly cannot be automatically replaced or moved by a motor. Preferably, the first filter assembly is clamped between other elements, so that other elements must first be disassembled to replace the first filter assembly. This results in a compact and therefore cost-effective design. The first filter assembly can comprise a single filter element or several separate filter elements. Alternatively, adhesive bonding can be used, particularly to achieve a gas-tight connection.

[0029] In an advantageous embodiment of the analytical device, a second filter arrangement is fixedly arranged within the spectroscopic analytical device, wherein the second filter arrangement is transparent to light of the second wavelength and opaque to light of the first wavelength. The second filter arrangement is: a) between the lighting device and the second measuring chamber; or b) within the second measuring chamber; or c) between the second measuring chamber and the detection device; or d) within the detection device; Furthermore, the second filter arrangement is arranged: a) between the illumination device and the second reference measuring chamber; or b) within the second reference measuring chamber; or c) between the second reference measuring chamber and the detection device; or d) within the detection device.

[0030] The term "stationary" means that the second filter assembly is not automatically replaceable or motor-driven. Preferably, the second filter assembly is clamped between other elements, so that other elements must first be disassembled to replace the second filter assembly. This results in a compact and therefore cost-effective design. The second filter assembly can comprise a single-piece filter element or several separate filter elements. Alternatively, it can be bonded, particularly to achieve a gas-tight connection.

[0031] In an advantageous further development of the analysis device, the illumination system is configured to generate broadband light that includes at least light of the first and light of the second wavelength. In this case, a corresponding first and second filter arrangement is necessary.

[0032] In an advantageous embodiment of the analysis device, the illumination device is configured to generate light which includes at least light of the first and second wavelengths, and wherein the at least one illumination device is configured to couple the generated light into the at least one first and second measuring chamber and into the at least one first and second reference measuring chamber, wherein the coupling is effected, for example, via optical fibers.

[0033] In an advantageous further development of the analysis device, the lighting device comprises exactly one light source or several light sources.

[0034] In an advantageous embodiment of the analytical device, the illumination device comprises at least a first and a second light source, wherein the first light source is configured to generate light with only the first wavelength and wherein the at least one first light source is further configured to couple the generated light into the first measuring chamber and into the first reference measuring chamber. The phrase "with only the first wavelength" means that a narrowband light is generated, which preferably includes the first wavelength but not the second wavelength. The second light source is configured to generate light with only the second wavelength and wherein the at least one second light source is further configured to couple the generated light into the second measuring chamber and into the second reference measuring chamber.The phrase "with only the second wavelength" means that a narrowband light is produced which preferably contains the second wavelength, but not the first wavelength. In In another embodiment, it would also be conceivable that, for example, the narrowband light of the second wavelength lies completely or partially within the wavelength range of the narrowband light of the first wavelength. In In another embodiment, it would also be conceivable that, for example, the narrowband light of the first wavelength lies completely or partially within the wavelength range of the narrowband light of the second wavelength.

[0035] InIn an advantageous further development of the analysis device, the illumination unit is configured to couple light of the first wavelength centrally into the first measuring chamber and the first reference measuring chamber, and to couple light of the second wavelength centrally into the second measuring chamber and the second reference measuring chamber. The central coupling is achieved via an optical waveguide, each of which is arranged in the center of a first end face of the respective measuring chamber or reference measuring chamber.

[0036] InIn an advantageous further development of the analysis device, the illumination device is configured to couple the light into the first measuring chamber at the first end face, wherein the light transmitted through the first measuring chamber is coupled out of the first measuring chamber at an opposite end face and fed to the first detection device. Furthermore, the illumination device is configured to couple the light into the first reference measuring chamber at a first end face, wherein the light transmitted through the first reference measuring chamber is coupled out of the first reference measuring chamber at an opposite end face and fed to the first detection device. The first detection device is configured to evaluate the light transmitted through the first measuring chamber and the light transmitted through the first reference measuring chamber separately.The above also applies, additionally or alternatively, to the second measuring chamber and the second reference measuring chamber.

[0037] InIn an advantageous embodiment of the analytical device, the lighting device comprises at least one first light source, in particular exactly one first light source, configured to generate first light with the first wavelength. The first light source is arranged directly adjacent to the first measuring chamber and the first reference measuring chamber such that the generated first light shines into both the first measuring chamber and the first reference measuring chamber. Alternatively, the first light source is arranged at a distance from the first measuring chamber and the first reference measuring chamber such that the generated first light can be supplied to the first measuring chamber and the first reference measuring chamber via a first optical waveguide, respectively. The lighting device further comprises at least one second light source, in particular exactly one second light source, configured to generate second light with the second wavelength.The second light source is positioned directly adjacent to the second measuring chamber and the second reference measuring chamber in such a way that the generated second light shines into both the second measuring chamber and the second reference measuring chamber. Alternatively, the second light source is positioned at a distance from the second measuring chamber and the second reference measuring chamber, so that the generated second light can be supplied to the second measuring chamber and the second reference measuring chamber via a second optical waveguide each.

[0038] InIn an advantageous further development of the analysis device, the detection device for the first measuring chamber and the first reference measuring chamber for detecting light with the first wavelength each comprises a photodiode or a pyroelectric detector or an image sensor or an opto-neumatic detector. The type of detection element depends in particular on the wavelength of the light to be detected. Additionally or alternatively, the detection device for the second measuring chamber and the second reference measuring chamber for detecting light with the second wavelength each comprises a photodiode or a pyroelectric detector or an image sensor or an opto-neumatic detector. The type of detection element depends in particular on the wavelength of the light to be detected.

[0039] Alternatively, the detection device for detecting light with the first wavelength comprises a common first image sensor configured to simultaneously receive both the light emitted through the first measuring chamber and the light emitted through the first reference measuring chamber. Additionally or alternatively, the detection device for detecting light with the second wavelength comprises a common first image sensor configured to simultaneously receive both the light emitted through the second measuring chamber and the light emitted through the second reference measuring chamber.

[0040] Alternatively, the detection device for detecting light with the first and second wavelengths comprises a common image sensor. This common image sensor is designed to simultaneously receive the light emitted through both the first and second measuring chambers as well as the light emitted through the first and second reference measuring chambers. The evaluation is preferably also performed in parallel.

[0041] In In an advantageous further development of the analysis device, the image sensor is an area sensor or a line sensor.

[0042] In an advantageous further development of the analysis device, the first image sensor is used to simultaneously receive the light from the first and second measuring chambers as well as the first and second reference measuring chambers. In this further development, the differently irradiated areas of the image sensor can be read out independently of one another, either in parallel or serially.

[0043] In an advantageous embodiment of the analysis device, the image sensor comprises a substrate, which in particular consists of silicon. A semiconductor layer is arranged on the substrate, configured to form a plurality of pixels. Microlenses are preferably mounted on the respective pixels. A cover glass, preferably a single piece, is arranged on the microlenses. A luminescent coating is preferably applied to at least part of the cover glass.

[0044] In an advantageous embodiment of the analytical device, the device is configured to supply the same fluid or gas to both the first and second measuring chambers. This allows for a significantly faster analysis of the fluid or gas due to the parallel measurement at different wavelengths. Alternatively, the analytical device is configured to supply different fluids or gases to the first and second measuring chambers. This allows for the parallel analysis of two different fluids or gases.

[0045] In a further advantageous embodiment of the analytical device, the analytical device is free of a chopper and / or filter wheel. This increases the robustness of the analytical device.

[0046] In an advantageous embodiment of the analytical device, at least one first reference measuring chamber and / or the second reference measuring chamber is free of a connection for supplying a fluid or gas. This ensures that the properties of the reference measuring chamber do not change.

[0047] In a further advantageous embodiment of the analysis device, the at least one first reference measurement chamber and / or the second reference measurement chamber comprises a device designed to eliminate any interfering components that may occur in the optical path.

[0048] In an advantageous embodiment of the analytical device, the at least one first measuring chamber and the second measuring chamber each comprise an inlet connection for supplying the fluid or gas to be analyzed to the respective first and second measuring chambers. Furthermore, the at least one first measuring chamber and the second measuring chamber each comprise an outlet connection for discharging the fluid or gas to be analyzed from the respective first and second measuring chambers. Preferably, at least the inlet connections are interconnected so that the same fluid or gas can be supplied to the first and second measuring chambers. Optionally, the outlet connections can also be interconnected.

[0049] In an advantageous embodiment of the analysis device, the input and output ports of each measuring chamber are arranged offset from one another along the longitudinal direction of the chamber, with the light also passing through the chamber in the longitudinal direction. This ensures that the fluid or gas to be analyzed is introduced into the path of the light for a longer period, resulting in particularly accurate first and second measurements.

[0050] A further object of the invention is a method according to claim 14. The method serves for the spectroscopic analysis of fluid or gas and utilizes a multi-chamber cuvette, wherein the multi-chamber cuvette is a one-piece extruded part and comprises at least two measuring chambers into which fluid or gas can be introduced for analysis. The at least two measuring chambers are optically separated from one another, and an illumination device and a detection device are further provided. In a first method step, light is generated by the illumination device and coupled into the first and second measuring chambers. In a second method step, the intensity of the light emitted by the fluid or gas in the first measuring chamber is measured for a first wavelength, and a first measurement result is generated.In a third process step, the intensity of the light emitted by the fluid or gas in the second measuring chamber is measured for a second wavelength, and a second measurement result is generated, wherein the first and second wavelengths are different. The second and third process steps are preferably carried out simultaneously and continuously repeated.

[0051] The invention is described below by way of example only, with reference to the drawings. The drawings show: Figure 1: an embodiment of the spectroscopic analysis device with a multi-chamber cuvette; Figures 2, 3, 4: various embodiments of the spectroscopic analysis device in an exploded view; Figure 5: an embodiment of the spectroscopic analysis device with a multi-chamber cuvette comprising a first and second measuring chamber and a first and second reference measuring chamber; Figures 6A, 6B, 6C, 6D: various cross-sectional shapes of the multi-chamber cuvette of the spectroscopic analysis device; and Figure 7: a flowchart describing a method for spectroscopic analysis.

[0052] Figure 1Figure 1 shows an embodiment of the spectroscopic analysis device 1. The spectroscopic analysis device 1 comprises a multi-chamber cuvette 2 for fluid or gas analysis. If the spectroscopic analysis device 1 is used solely for gas analysis, it can also be referred to as a spectroscopic gas analysis device 1.

[0053] The multi-chamber cuvette 2 comprises a first measuring chamber 3 and a second measuring chamber 4. The first measuring chamber 3 and the second measuring chamber 4 are optically separated from each other. A lighting device 5 is also shown. The lighting device 5 is configured to generate light and couple it into at least one first and second measuring chamber 3, 4. In Figure 1, the lighting device 5 comprises two light sources 5a, 5b. The first light source 5a is configured to generate light of a first wavelength. The second light source 5b is configured to generate light of a second wavelength. The two wavelengths are different. The first light source 5a is connected to the first measuring chamber 3 via a first optical waveguide 6a, so that light generated by the first light source 5a couples into the first measuring chamber 3.The second light source 5b is connected to the second measuring chamber 4 via a second optical waveguide 6b, so that light generated by the second light source 5b couples into the second measuring chamber 4. Preferably, the coupling of the light takes place at a respective end face of the first and second measuring chambers 3 and 4.

[0054] The first wavelength could be, for example, IR or UV light. The second wavelength could also be, for example, UV or IR light. It is also conceivable that both the first and second wavelengths contain light in the IR or UV range.

[0055] In this case, the light shines within the first and second measuring chambers 2 and 3 from one end face to the opposite end face. The first measuring chamber 3 is designed so that a fluid or gas to be analyzed can be introduced into the beam path of the coupled light. Preferably, the entire first measuring chamber 3 can be filled with the fluid or gas to be analyzed. It is also possible that only a portion of the first measuring chamber 3 is filled with the fluid or gas to be analyzed. The second measuring chamber 4 is likewise designed so that a fluid or gas to be analyzed can be introduced into the beam path of the coupled light. Preferably, the entire second measuring chamber 4 can be filled with the fluid or gas to be analyzed. It is also possible that only a portion of the second measuring chamber 4 is filled with the fluid or gas to be analyzed.Preferably, the first measuring chamber 3 and the second measuring chamber 4 are filled with the same fluid or the same gas, so that a corresponding analysis can be carried out particularly quickly by using different wavelengths in parallel.

[0056] The fluid or gas to be analyzed can be fed into at least one first measuring chamber 3 or second measuring chamber 4 via an inlet port 7. Preferably, the first measuring chamber 3 and the second measuring chamber 4 each include an outlet port 8 to discharge the analyzed fluid or gas. In the longitudinal direction of the respective first and second measuring chambers 3 and 4, the inlet port 7 and the outlet port 8 are arranged offset from each other, with the inlet port 7 preferably being located closer to the lighting device 5 than the outlet port 8.

[0057] The spectroscopic analysis device 1 also includes a detection device 9 configured to measure the intensity of the light emitted by the fluid or gas and to output a corresponding measurement result. The detection device 9 is therefore configured to measure the intensity of the light for a first wavelength emitted through the first measuring chamber 3 in order to generate a first measurement result. The detection device 9 is further configured to measure the intensity of the light for a second wavelength emitted through the second measuring chamber 4 in order to generate a second measurement result.

[0058] In Figure 1The light generated by the first light source 5a preferably comprises only the first wavelength and is, in particular, free of the second wavelength. This ensures that the first measuring chamber 3 is only penetrated by light of the first wavelength, so that the first measurement result only includes the intensity of the light of the first wavelength. Furthermore, the light generated by the second light source 5b preferably comprises only the second wavelength and is, in particular, free of the first wavelength. This ensures that the second measuring chamber 4 is only penetrated by light of the second wavelength, so that the second measurement result only includes the intensity of the light of the second wavelength. The use of further filter arrangements is not necessary in this case.

[0059] The detection device 9 preferably connects flush to a second end face of the first or second measuring chamber 3, 4. Preferably, the detection device 9 seals the second end face of the first or second measuring chamber 3, 4 in a fluid-tight or gas-tight manner. A corresponding sealing rubber arrangement may also be provided. On the other side, the illumination device 5 preferably seals the first end face of the first or second measuring chamber 3, 4 in a fluid-tight or gas-tight manner. A corresponding sealing rubber arrangement may also be provided. Alternatively, the cuvette can also be sealed gas-tight / fluid-tight with another component.

[0060] The detection device 9 can be connected to a higher-level control or monitoring unit. The detection device 9 can be configured to transmit the first and second measurement results to the higher-level control and monitoring unit. Preferably, the detection device 9 is configured to generate the first and second measurement results in parallel. In particular, the first and second measurement results are averaged over time.

[0061] Figure 2 An exploded view shows an embodiment of the spectroscopic analysis device 1. In contrast to Figure 1The illumination device 5 is flush with the first end face of the multi-chamber cuvette 2. The illumination device 5 is free of optical fibers. Both the first light source 5a and the second light source 5b generate broadband light, which contains light of an unwanted wavelength in addition to the desired wavelength. Thus, the first light source 5a may generate light with the first wavelength and couple it into the first measuring chamber 3, but may also generate light with an unwanted wavelength, in particular the second wavelength. Similarly, the second light source 5b may generate light with the second wavelength and couple it into the second measuring chamber 4. However, the second light source 5b may also generate light with an unwanted wavelength, in particular the first wavelength.

[0062] The lighting device 5 preferably comprises at least one laser diode. In particular, the first light source 5a and / or the second light source 5b preferably comprise a laser diode. The first light source 5a and / or the second light source 5b may also comprise at least one LED or at least one IR light source.

[0063] To obtain meaningful and accurate first and second measurement results, a first and second filter arrangement 10, 11 are provided. Figure 2The first filter arrangement 10 is arranged between the first measuring chamber 3 and the detection device 9. The first filter arrangement 10 is designed to filter out at least the second wavelength from the light that the first light source 5a couples into the first measuring chamber 3. The second filter arrangement 11 is arranged between the second measuring chamber 4 and the detection device 9. The second filter arrangement 11 is designed to filter out at least the first wavelength from the light that the second light source 5b couples into the second measuring chamber 4.

[0064] The detection device 9 also includes a first detector element 9a, which is configured to measure the intensity of light with the first wavelength. The first detector element 9a can be, for example, a photodiode, a pyroelectric detector, or an image sensor. The detection device 9 also includes a second detector element 9b, which is configured to measure the intensity of light with the second wavelength. The second detector element 9b can be, for example, a photodiode, a pyroelectric detector, or an image sensor.

[0065] The exemplary embodiment from Figure 2 This also shows that the multi-chamber cuvette 2, and thus the first measuring chamber 3 and the second measuring chamber 4, is an extruded part. The first measuring chamber 3 and the second measuring chamber 4 are preferably of the same length.

[0066] In Figure 3The lighting device 5 comprises a common light source configured to generate broadband light with at least the first wavelength and the second wavelength. In the exemplary embodiment from Figure 3 The first filter arrangement 10 is arranged between the lighting device 5 and the first measuring chamber 3. Furthermore, the second filter arrangement 11 is arranged between the lighting device 5 and the second measuring chamber 4. In contrast to the embodiment shown in Figure 2 In the exemplary embodiment, Figure 3 The already filtered light is coupled into the individual measuring chambers 3, 4.

[0067] In the embodiment from Figure 4The first light source 5a is configured to generate light, preferably only with the first wavelength and not with the second wavelength, and to couple it centrally into the first measuring chamber 3. The second light source 5b is configured to generate light, preferably only with the second wavelength and not with the first wavelength, and to couple it centrally into the second measuring chamber 4. InIn this embodiment, therefore, no first or second filter arrangement 10, 11 is necessary. Furthermore, the detection device 9 comprises an image sensor configured to convert both light from the first measuring chamber 3 with the first wavelength and light from the second measuring chamber 4 with the second wavelength into corresponding first and second measurement results. In this embodiment, the image sensor is designed as an area sensor and covers both the second end face of the first measuring chamber 3 and the second end face of the second measuring chamber 4.

[0068] Figure 5Figure 1 shows a further embodiment of the spectroscopic analysis device 1 with the multi-chamber cuvette 2. The analysis device 1 comprises the first measuring chamber 3 and the second measuring chamber 4. The multi-chamber cuvette further comprises a first reference measuring chamber 12 and a second reference measuring chamber 13. The illumination device 5 is configured to couple light into the at least one first and second reference measuring chamber 12, 13. The detection device 9 is configured to measure the intensity of the light emitted by the first reference measuring chamber 12 for the first wavelength and to generate a first reference measurement result. The detection device 9 is further configured to measure the intensity of the light emitted by the second reference measuring chamber 13 for the second wavelength and to generate a second reference measurement result.

[0069] The first and second reference measuring chambers 12, 13 are optically separated from each other and also optically from the first and second measuring chambers 3, 4.

[0070] The detection device 9 is configured to compensate for the first measurement result with the first reference measurement result. The detection device 9 is further configured to compensate for the second measurement result with the second reference measurement result.

[0071] The first reference measuring chamber 12 is arranged next to the first measuring chamber 3. The second reference measuring chamber 13 is arranged next to the second measuring chamber 4.

[0072] The first reference measuring chamber 12 is preferably identical in construction to the first measuring chamber 3. Additionally or alternatively, the second reference measuring chamber 13 is identical in construction to the second measuring chamber 4. In this embodiment, all measuring chambers 3, 4, 12, 13 are identical in construction to one another, in particular having the same length. Preferably, they also have a similar cross-section and a similar volume. The term "similar" can be understood to mean deviations of preferably less than 20% or less than 10%.

[0073] In this embodiment, the lighting device 5 comprises a first light source 5a and a second light source 5b. Both the first light source 5a and the second light source 5b are configured to generate broadband light encompassing both the first and second wavelengths. The first light source 5a is arranged on the multi-chamber cuvette 2 such that it couples the generated light into both the first measuring chamber 3 and the first reference measuring chamber 12. The second light source 5b is arranged on the multi-chamber cuvette 2 such that it couples the generated light into both the second measuring chamber 4 and the second reference measuring chamber 13. In this embodiment, a first filter arrangement 10 is arranged between the lighting device 5 and the multi-chamber cuvette 2 and is configured to remove the second wavelength from the broadband light generated by the first light source 5a.In this case, the first filter arrangement 10 comprises two filter elements, one of which closes off the first measuring chamber 3 and the other of which closes off the first reference measuring chamber 12 at their respective first end faces. A second filter arrangement 11 is arranged in this embodiment between the illumination device 5 and the multi-chamber cuvette 2 and is configured to remove the first wavelength from the broadband light generated by the second light source 5b. In this case, the second filter arrangement 11 comprises two filter elements, one of which closes off the second measuring chamber 4 and the other of which closes off the second reference measuring chamber 13 at their respective first end faces.

[0074] Furthermore, the detection device 9 comprises two first detector elements 9a, one first detector element 9a being arranged on each of the second end faces of the first measuring chamber 3 and the first reference measuring chamber 12. The detection device 9 also comprises two second detector elements 9b, one second detector element 9b being arranged on each of the second end faces of the second measuring chamber 4 and the second reference measuring chamber 13.

[0075] The Figures 6A, 6B, 6C and 6D Figure 1 shows different cross-sectional shapes of the multi-chamber cuvette 2 of the spectroscopic analysis device 1. Figure 6A The multi-chamber cuvette 2 comprises a first, second and third reference measuring chamber 12, 13, 14. Furthermore, the multi-chamber cuvette 2 comprises a first, second and third measuring chamber 3, 4, 16. In cross-section, all or some of the measuring chambers 12, 13, 14, 3, 4, 16 may have rounded corner areas.

[0076] Figure 6Bshows a similar embodiment for the multi-chamber cuvette 2 as Figure 6A , wherein in cross-section all corner areas of the individual measuring chambers 12, 13, 14, 3, 4, 16 are not rounded, but angular.

[0077] Figure 6C shows the same embodiment as Figure 6A , except that the multi-chamber cuvette 2 comprises a first, second, third and fourth reference measuring chamber 12, 13, 14, 15 and a first, second, third and fourth measuring chamber 3, 4, 16, 17. In cross-section, all or some measuring chambers 12, 13, 14, 15, 3, 4, 16, 17 may have rounded corner regions.

[0078] Figure 6D shows a similar embodiment for the multi-chamber cuvette 2 as Figure 6B , wherein in cross-section all corner areas of the individual measuring chambers 12, 13, 14, 15, 3, 4, 16, 17 are not rounded, but angular.

[0079] In the Figures 6A, 6B, 6C, 6D The multi-chamber cuvette 2 is a one-piece extruded part.

[0080] Figure 7This document describes a method for the spectroscopic analysis of fluid or gas using a multi-chamber cuvette 2, wherein the multi-chamber cuvette 2 comprises at least two measuring chambers 3, 4 into which the fluid or gas can be introduced for analysis. The at least two measuring chambers 3, 4 are optically separated from each other, and an illumination device 4 and a detection device 9 are further provided. In a first process step S1, light is generated by the illumination device 5 and coupled into the first and second measuring chambers 3, 4. In a second process step S2, the intensity of the light emitted by the fluid or gas in the first measuring chamber 3 is measured for a first wavelength, and a first measurement result is generated.In a third process step S 3, the intensity of the light emitted by the fluid or gas in the second measuring chamber 4 is measured for a second wavelength and a second measurement result is generated, whereby the first wavelength and the second wavelength are different.

[0081] The invention is not limited to the described embodiments. Within the scope of the invention, all described and / or drawn features can be combined with one another as desired, unless otherwise stated. Reference symbol list Spectroscopic analysis device 1 multi-chamber cuvette 2 First measuring chamber 3 Second measuring chamber 4 Lighting equipment 5 First light source 5a Second light source 5b First optical fiber 6a Second optical fiber 6b Input port 7 Output connection 8 Detection device 9 First detector element 9a Second detector element 9b First filter arrangement 10 Second filter arrangement 11 First reference measuring chamber 12 Second reference measuring chamber 13 Third reference measuring chamber 14 Fourth reference measuring chamber 15 Third measuring chamber 16 Fourth measuring chamber 17 Procedural steps S1, S2, S3

Claims

1. A spectroscopic analysis apparatus (1) for fluid or gas analysis, comprising at least two measurement chambers (3, 4, 16, 17) into which fluid or gas can be introduced for analysis, wherein the at least two measurement chambers (3, 4, 16, 17) are optically separated from one another, wherein an illumination device (5) is provided that is configured to generate light and to couple the light into the at least one first and second measurement chamber (3, 4, 16, 17), and wherein a detection device (9) is provided that is configured to measure an intensity of the light radiated by the fluid or gas in the first measurement chamber (3) for a first wavelength and to generate a first measurement result and that is further configured to measure an intensity of the light radiated by the fluid or gas in the second measurement chamber (4) for a second wavelength and to generate a second measurement result, wherein the first wavelength and the second wavelength are different, characterized in that the analysis apparatus (1) comprises a multi-chamber cuvette (2), with the multi-chamber cuvette (2) comprising the at least two measurement chambers (3, 4, 16, 17), with the multi-chamber cuvette (2) being a single-piece extruded part.

2. A spectroscopic analysis apparatus (1) according to claim 1, wherein the detection device (9) is configured to generate the first measurement result and the second measurement result in parallel.

3. A spectroscopic analysis apparatus (1) according to one of the preceding claims, wherein the multi-chamber cuvette (2) comprises at least a first and a second reference measurement chamber (12, 13, 14, 15), wherein the illumination device (5) is configured to couple light into the at least one first and second reference measurement chamber (12, 13, 14, 15), and wherein the detection device (9) is configured: a) to measure an intensity of the light radiated through the first reference measurement chamber (12) for the first wavelength and to generate a first reference measurement result; and b) to measure an intensity of the light radiated through the second reference measurement chamber (13) for the second wavelength and to generate a second reference measurement result.

4. A spectroscopic analysis apparatus (1) according to claim 3, wherein the first and the second reference measurement chamber (12, 13) are optically separated from one another and optically separated from the first and the second measurement chamber (3, 4).

5. A spectroscopic analysis apparatus (1) according to claim 3 or 4, wherein the detection device (9) is configured to compensate the first measurement result with the first reference measurement result, and wherein the detection device (9) is configured to compensate the second measurement result with the second reference measurement result.

6. A spectroscopic analysis apparatus (1) according to any one of the claims 3 to 5, wherein the detection device (9) is configured to average the first measurement result over time and to average the second measurement result over time.

7. A spectroscopic analysis apparatus (1) according to any one of the claims 3 to 6, wherein the first measurement chamber (3) and the first reference measurement chamber (12) are designed identically to one another and / or wherein the second measurement chamber (4) and the second reference measurement chamber (13) are designed identically to one another and / or wherein the at least one first measurement chamber (3) and the second measurement chamber (4) are designed identically to one another and / or wherein the at least one first reference measurement chamber (12) and the second reference measurement chamber (13) are designed identically to one another.

8. A spectroscopic analysis apparatus (1) according to any one of the claims 3 to 7, wherein a first filter arrangement (10) is provided and is configured to filter out wavelengths from the light generated by the illumination device (5) so that the light which is radiated through the first measurement chamber (3) and through the first reference measurement chamber (12) only includes the first wavelength at the latest in the detection device (9) and / or wherein a second filter arrangement (11) is provided and is configured to filter out wavelengths from the light generated by the illumination device (5) so that the light which is radiated through the second measurement chamber (4) and through the second reference measurement chamber (13) only includes the second wavelength at the latest in the detection device (9).

9. A spectroscopic analysis apparatus (1) according to claim 8, wherein the illumination device (5) is configured to generate a broadband light which at least includes light of the first and the second wavelength.

10. A spectroscopic analysis apparatus (1) according to any one of the claims 3 to 8, wherein the illumination device (5) comprises at least a first and a second light source (5a, 5b), wherein the first light source (5a) is configured to generate light with only the first wavelength, wherein the at least one first light source (5a) is configured to couple the generated light into the first measurement chamber (3) and into the first reference measurement chamber (12), and wherein the second light source (5b) is configured to generate light with only the second wavelength, wherein the at least one second light source (5b) is configured to couple the generated light into the second measurement chamber (4) and into the second reference measurement chamber (13).

11. A spectroscopic analysis apparatus (1) according to any one of the claims 3 to 10, wherein the illumination device (5) is configured to couple light with the first wavelength centrally into the first measurement chamber (3) and into the first reference measurement chamber (12) in each case and to couple light with the second wavelength centrally into the second measurement chamber (4) and into the second reference measurement chamber (13) in each case, wherein the central coupling in takes place via a respective optical waveguide (6a, 6b) which is in each case arranged at the center of a first end face of the respective measurement chamber (3, 4) or reference measurement chamber (12, 13).

12. A spectroscopic analysis apparatus (1) according to any one of the claims 3 to 10, wherein the illumination device (5) comprises at least a first light source (5a) which is configured to generate a first light with the first wavelength, and wherein the illumination device (5) comprises at least a second light source (5b) which is configured to generate a second light with the second wavelength, wherein the first light source (5a) is arranged directly at the first measurement chamber (3) and the first reference measurement chamber (12) such that the generated first light radiates into both the first measurement chamber (3) and the first reference measurement chamber (12) or is arranged spaced apart from the first measurement chamber (3) and the first reference measurement chamber (12) so that the generated first light can be fed via a respective first optical waveguide (6a) to the first measurement chamber (3) and the first reference measurement chamber (12), and wherein the second light source (5b) is arranged directly at the second measurement chamber (4) and the second reference measurement chamber (13) such that the generated second light radiates into both the second measurement chamber (4) and the second reference measurement chamber (13) or is arranged spaced apart from the second measurement chamber (4) and the second reference measurement chamber (13) so that the generated second light can be fed via a respective second optical waveguide (6b) to the second measurement chamber (4) and the second reference measurement chamber (13).

13. A spectroscopic analysis apparatus (1) according to any one of the claims 3 to 12, wherein the detection device (9) comprises: a) for the first measurement chamber (3) and the first reference measurement chamber (12) for detecting light with the first wavelength, in each case a photodiode or a pyroelectric detector or an image sensor or an optopneumatic detector; and / or for the second measurement chamber (4) and the second reference measurement chamber (13) for detecting light with the second wavelength, in each case a photodiode or a pyroelectric detector or an image sensor or an optopneumatic detector; or b) for the first measurement chamber (3) and the first reference measurement chamber (12) for detecting light with the first wavelength, a common first image sensor which is configured to simultaneously receive both the light radiated through the first measurement chamber (3) and the light radiated through the first reference measurement chamber (12); and / or for the second measurement chamber (4) and the second reference measurement chamber (13) for detecting light with the second wavelength, a common second image sensor which is configured to simultaneously receive both the light radiated through the second measurement chamber (4) and the light radiated through the second reference measurement chamber (13); or c) for the first measurement chamber (3) and the first reference measurement chamber (12) for detecting light with the first wavelength and for the second measurement chamber (4) and the second reference measurement chamber (13) for detecting light with the second wavelength, a common image sensor which is configured to simultaneously receive both the light radiated through the first and second measurement chamber (3, 4) and the light radiated through the first and second reference measurement chamber (12, 13).

14. A method for the spectroscopic analysis of fluid or gas using a multi-chamber cuvette (2), wherein the multi-chamber cuvette (2) is a single-piece extruded part and comprises at least two measurement chambers (3, 4, 16, 17) into which fluid or gas can be introduced for analysis, wherein the at least two measurement chambers (3, 4, 16, 17) are optically separated from one another, wherein an illumination device (5) and a detection device (9) are provided and wherein the method comprises the following method steps: - generating (S1) light by the illumination device (5) and coupling the light into the first and second measurement chamber (3, 4, 16, 17); - measuring (S2) an intensity of the light radiated by the fluid or gas in the first measurement chamber (3) for a first wavelength and generating a first measurement result by the detection device (9); - measuring (S3) an intensity of the light radiated by the fluid or gas in the second measurement chamber (4) for a second wavelength and generating a second measurement result by the detection device (9), wherein the first wavelength and the second wavelength are different.