Examination assembly, primary-gas-conducting system, and method

Abstract

The invention relates to an examination assembly for examining an examination object in a gas stream drawn from a primary gas, the examination assembly having a holder, an examination chamber and a gas feed device, wherein, during the feeding of pressurized gas by means of the gas feed device, a gas stream drawn from a primary gas and passing through the examination chamber is produced and returned again. Thus, a defined examination can be carried out in the examination chamber. The invention also relates to an associated primary-gas-conducting system and to an associated method.

Description

[0001] Investigation setup, primary gas system and procedure

[0002] The invention relates to an examination arrangement for examining an object in a gas stream taken from primary gas. The invention further relates to an associated primary gas-carrying system and an associated method.

[0003] Gases occur in various constellations in industrial or energy-generating processes. For example, hot gas is generated during the combustion of waste or fossil fuels and is then typically referred to as flue gas. Primary gases also occur, for example, during the gasification of solids such as plastic waste. Such primary gases typically have a specific chemical composition, which can be very well defined depending on the process and application, but can also be subject to significant fluctuations. An example of the latter case is the combustion of waste, whose composition can fluctuate considerably depending on the current delivery to a waste incineration plant.

[0004] Primary gases are typically intended for specific, predetermined purposes, such as heat extraction for energy recovery or further use in chemical processes. In some cases, such as combustion processes for thermal recovery, they are typically subjected to purification to reduce or prevent the release of pollutants into the environment. Furthermore, many primary gases have corrosive properties, which can have a detrimental effect on boiler or reactor walls, for example, which, in the worst case, can lead to system failure and / or unscheduled maintenance.

[0005] It has been shown that it is advantageous to conduct investigations on test objects using primary gases in environments that are as realistic as possible and under conditions that are as defined as possible. This allows, for example, a corrosive effect to be investigated, a proposed chemical process to be investigated, or the effect of a cleaning process to be investigated under defined conditions. It is an object of the invention to provide devices and methods that enable investigations in connection with primary gases and that are, for example, alternative or better designed than known devices and methods.

[0006] This is achieved according to the invention by an investigation arrangement, a primary gas-carrying system, and a method according to the respective main claims. Advantageous embodiments can be found, for example, in the respective subclaims. The content of the claims is incorporated into the content of the description by express reference.

[0007] The invention relates to an examination arrangement for examining an examination object in a gas stream taken from primary gas. The examination arrangement comprises a holder for fastening the examination arrangement to a wall of a primary gas-carrying system. The examination arrangement comprises an examination chamber for accommodating the examination object therein. The examination chamber has an inlet opening and an outlet opening, wherein the examination chamber is fastened to the holder for positioning the examination chamber within the primary gas-carrying system, in particular such that the inlet opening and the outlet opening open into a primary gas-carrying region of the primary gas-carrying system. The examination arrangement comprises a gas supply device for supplying pressurized gas from outside the primary gas-carrying system.The examination arrangement comprises at least one nozzle which is connected to the gas supply device, wherein the nozzle is arranged such that gas flowing out of the nozzle induces a gas flow through the examination chamber from the inlet opening to the outlet opening.

[0008] Using such an examination setup, it is possible to examine an object under conditions that are as realistic and well-defined as possible in a gas stream taken directly from the primary gas. The gas stream can be generated particularly easily by supplying pressurized gas, for example, by supplying simple compressed air. No mechanically moving parts are required. Due to the arrangement of the examination chamber, which is typically surrounded by primary gas, the examination can be carried out at the original temperature of the primary gas. Alternatively, a deliberately changed temperature can be set, for example, as described below. Furthermore, the time within which an examination is to be carried out can be defined very precisely.

[0009] Using the test setup, for example, test objects in the form of material samples can be tested and their susceptibility to corrosion and / or the formation of deposits in a primary gas can be investigated. Likewise, test objects in the form of chemical reagents can be examined, allowing a simple assessment of possible chemical reactions. Furthermore, the effectiveness of filters, for example, can be investigated under defined conditions and on a small scale.

[0010] In principle, an examination arrangement is to be understood in particular as an arrangement which enables the examination of an examination object as described herein. The examination object is typically not considered to be a component of the examination arrangement. The examination arrangement can be permanently installed in a facility such as a boiler of a power plant or a waste incineration plant or a reactor, or it can be used flexibly and, for example, deployed wherever it is needed. For example, an opening such as a manhole or an existing measuring opening can be used to attach the examination arrangement. The holder typically also serves to ensure a seal with regard to an opening in which the examination arrangement is arranged.This prevents the unwanted escape of primary gas into an environment in which, for example, people may be present. The holder can in particular be suitably designed to be attached to a wall of the primary gas-carrying system, for which purpose, for example, screw caps, snap closures or other fastening means can be used. The primary gas can, for example, be a hot gas, which typically means gases with a temperature of at least 60 °C. Such gases can also be considerably hotter, for example several hundred °C or even over 1,000 °C. When such hot gas is produced in a combustion process, it is typically referred to as flue gas. Such combustion processes are typically used to burn fossil fuels or waste, in particular to utilize the heat generated and / or to dispose of the waste.

[0011] The primary gas can also be a synthesis gas, for example, which is produced in chemical processes such as gasification or pyrolysis. The resulting gases are typically fed into a subsequent chemical process. At the appropriate temperature, such synthesis gases can also be referred to as hot gas.

[0012] In principle, however, the primary gas is not limited to the aforementioned types. Rather, gases at room temperature and / or low temperatures can also be used. Furthermore, gases of any composition can be used.

[0013] The term primary gas indicates in particular that it is the gas from which the gas stream mentioned is taken.

[0014] The examination chamber typically surrounds the object to be examined, if the object is located therein, on at least some sides. For example, the examination chamber can surround the object to be examined, in particular except for the inlet opening and / or outlet opening. The gas stream, which is the primary gas, is typically drawn in through the inlet opening. This can be drawn in in a defined manner, in particular by suitable supply of pressurized gas, such as compressed air.

[0015] The primary gas-carrying system is not a component of the test setup. Rather, the test setup is designed to be used in conjunction with a primary gas-carrying system. The primary gas-carrying region is typically the area of ​​the primary gas-carrying system in which the primary gas is located or into which it is directed. For example, it can be the interior of a boiler, which can be delimited by a wall of the boiler, i.e., a boiler wall.

[0016] The gas supply device is used to supply pressurised gas. Compressed air can be used for this, for example. This is easy to generate and is already available in many systems. However, other gases such as inert gases or reactive gases can also be used. Typically, the gas supplied via the gas supply device remains in the primary gas-carrying system after exiting through the outlet opening. It is thus released, for example, together with a gas stream via the outlet opening back into the primary gas-carrying system. This is typically not problematic, particularly since problematic gases are generally not used for the pressurised gas and the quantities are small compared to the quantities of primary gas present or flowing past.

[0017] A nozzle is understood, in particular, to be an element from which the pressurized gas supplied via the gas supply device flows out. In particular, the nozzle can be narrowed or tapered in the flow direction, so that the escaping gas is accelerated. This can create a suction effect that draws the gas flow through the inlet opening and maintains it so that the gas flow is directed toward the outlet opening and exits there. This can be achieved in a similar way to the principle of a water jet pump.

[0018] The gas supply device can be designed as a line, for example. It can supply the pressurized gas to all nozzles used.

[0019] Compressed air typically refers to compressed outside air. Compressed gas is a more general term and basically refers to any pressurized gas, i.e., in particular, gas with a pressure greater than atmospheric pressure, whereby the gas can have any composition. For example, inert gases or reactive gases can also be used for the compressed gas. According to one embodiment, the examination chamber has a tube for receiving the object to be examined. The inlet opening can, in particular, be arranged on the tube. This allows for a simple design. However, other forms of the examination chamber can also be used.

[0020] A tube can, in particular, be designed to extend along a longitudinal direction. It can have a round cross-section. However, it can also have an angular cross-section, for example, a quadrangular, rectangular, square, triangular, pentagonal cross-section, or a cross-section with more than five corners. The mentioned cross-section can refer to an inner cross-section and / or an outer cross-section.

[0021] According to one embodiment, the examination chamber has a first section and a second section. These are, in particular, at least partially delimited from one another. In particular, they can be delimited from one another in terms of material. The inlet opening can, in particular, be formed on the first section, and the outlet opening can, in particular, be formed on the second section. This allows the examination chamber to be divided into two sections, which can be specifically adapted for their respective functions.

[0022] It can advantageously be provided that the first section is delimited from the second section, completely or at least partially, only by means of a preferably strip-shaped wall. Such a strip-shaped wall can in particular be a flat material, for example a steel strip. Instead of a strip-shaped wall, it can also be referred to as a sheet-shaped wall. Typically, both the first region and the second region are directly adjacent to such a strip-shaped wall. In particular, the strip-shaped wall can be the partition wall mentioned below or a wall of a pipe, wherein in this case the first section can be formed in particular within the pipe.

[0023] Between the first section and the second section, a deflection section can be formed, in particular, for deflecting a gas flow flowing through the inlet opening toward the outlet opening. This enables a defined deflection of the gas flow, so that the deflection section, in particular, can be designed in a suitable manner for the deflection. Furthermore, it is possible to dispense with a deflection in the first section and / or the second section, so that such sections can be designed, for example, in such a way that the gas flow therein is as undisturbed and / or straight as possible.

[0024] The deflection can be achieved, in particular, by 180°. This enables an overall compact arrangement. In particular, the gas flow can first be drawn in through the inlet opening and guided through a straight section of the test chamber. A subsequent deflection of 180° enables compact feeding to the outlet opening.

[0025] The deflection can, in particular, take place around a band-shaped wall. This can, in particular, separate the first section from the second section.

[0026] In particular, this can be the band-shaped wall mentioned above. Reference is made to the above explanations. The wall can, in particular, directly adjoin the deflection section with one end face.

[0027] The first section can be designed as a continuous tube, in particular from the inlet opening to the deflection section, and / or extend along a longitudinal axis, in particular only one longitudinal axis. This allows a uniform volume flow through the first section to be achieved without bends. Turbulence is thus avoided, which can have a beneficial effect on the conduct of examinations. Likewise, the second section, in particular from the deflection section to the outlet opening, can be designed as a continuous tube and / or extend along a longitudinal axis, in particular only one longitudinal axis. A longitudinal axis is typically straight. It can, in particular, be defined for the entire respective section.

[0028] The first section can, in particular, be tubular. This enables a simple design. The tube can, for example, have a round cross-section. However, it can also, for example, have a square, rectangular or other cross-section. Reference is made to the above explanations. The second section can, in particular, have an annular cross-section. The second section can, in particular, surround the first section. In particular, a particularly compact design can be enabled by combining a tubular first section and an annular second section. An annular cross-section can, in particular, be circularly delimited on the inside and / or outside. However, square, rectangular, quadrangular, triangular, pentagonal designs or designs with more than five corners are also possible.In particular, a cross-section on the inside can correspond to an outer cross-section of a pipe, in which, in particular, the first section can be located. The annular cross-section can, in particular, have the same cross-sectional shape on the outside as on the inside. An annular cross-section can extend completely around the first section along a circumference. However, it can alternatively also extend only partially around the first section. For example, the annular cross-section can occupy a defined angular range.

[0029] The first and second sections can be separated from each other, in particular by a partition wall. This allows for easy separation and ensures that the gas flow is directed as desired.

[0030] The partition wall can be designed entirely or partially flat and / or level. This allows for a simple design. However, a tubular design of the partition wall is also possible, for example.

[0031] According to one embodiment, the partition wall has a curvature that expediently at least partially defines the outlet opening and / or directs the gas flow to the outlet opening. This allows the integration of this functionality into the partition wall, which can thus also serve to direct the gas flow toward the outlet opening.

[0032] According to one embodiment, the examination arrangement has a projection which is expediently fastened to the holder and projects into the first section. In particular, this can be a spike-shaped projection. This projection can serve, in particular, to deflect incoming gas flow. In particular, the deflection section or its boundary can be formed entirely or partially on the projection. In particular, the projection can delimit the deflection section entirely or partially. The projection can also be designed to hold an examination object. This can serve, in particular, to position further elements such as a probe for carrying out measurements and / or for checking a material applied to the probe in the examination chamber. The examination object can also be held more generally by means of the projection.

[0033] According to an advantageous embodiment, the at least one nozzle opens into the second section. This allows for the most uniform gas flow possible in the first section and the development of a suction effect in the second section. The nozzle can, in particular, be directed toward the outlet opening.

[0034] In particular, multiple nozzles can be used. These can be arranged along a line, such as a circle. However, in principle, only one nozzle can also be used.

[0035] In particular, it can be provided that the examination chamber is open to the primary gas-carrying area exclusively at the inlet opening and the outlet opening. Preferably, no other opening to the primary gas-carrying area is provided. In particular, it can be provided that only one inlet opening and / or one outlet opening is / are present.

[0036] In particular, it can be provided that the examination chamber is arranged between the inlet opening and the outlet opening exclusively on the inside of the holder. This can particularly relate to a primary gas-carrying system. In particular, the examination chamber can therefore be arranged exclusively within the primary gas-carrying system or on the inside of the holder if the examination arrangement is used on a primary gas-carrying system. In particular, it can be provided that the examination chamber does not cross the holder and / or a plane defined by the holder, which plane completely or at least substantially contains a surface that seals an opening in a wall of the primary gas-carrying system. According to one possible embodiment, the nozzle is arranged separately from the examination chamber and is connected to the examination chamber for generating a negative pressure in the examination chamber by gas flowing out of the nozzle.This allows a greater spatial separation to be achieved between the test chamber and the nozzle. The nozzle can be connected to the test chamber, for example, via a labyrinth and / or at least one baffle. This can prevent any dirt particles from getting into the nozzle and potentially clogging it. In particular, the nozzle can be designed as a Venturi nozzle. For example, the nozzle can be arranged on a side of the holder opposite the test chamber. This allows the nozzle to be arranged outside the primary gas-carrying system. This can, for example, prevent the nozzle from being exposed to the temperatures prevailing within the primary gas-carrying system. Nevertheless, pressurized gas escaping from the nozzle is typically returned to the primary gas, such as flue gas or synthesis gas, via the outlet opening.The nozzle can, for example, extend transversely to a longitudinal extent of the examination chamber and / or its first section and / or its second section, particularly when arranged on the side of the holder opposite the examination chamber. This allows for a compact design.

[0037] In particular, the outlet opening can be positioned closer to the mount than the inlet opening. This prevents the gas flow escaping from the outlet opening from being sucked back into the inlet opening. The inlet opening is thus located at a point where unadulterated primary gas can be sucked in.

[0038] The nozzle or nozzles can be directed toward the outlet opening, in particular from within the examination chamber. This allows the pressurized gas supplied by the gas supply device to be supplied in such a way that the desired gas flow is generated. The inlet opening and the outlet opening can, in particular, point in the same direction and / or be aligned parallel to each other. This allows for a simple design. However, other relative orientations are also possible.

[0039] The inlet opening and / or the outlet opening can, in particular, be arranged relative to the holder so as to be oriented transversely to the flow direction of the primary gas. This allows the primary gas to be drawn in, particularly at the inlet opening, in such a way that as few particles as possible are drawn in.

[0040] In particular, the outlet opening can be oriented transversely to the inlet opening, or the outlet opening can form an angle of between 90° and 60° to the inlet opening. This allows for a directed discharge of the gas flow from the outlet opening, so that the discharged gas flow is returned to the primary gas in such a way that, for example, it is not sucked back into the inlet opening and / or otherwise causes as few problems as possible. In particular, each opening can define a respective plane or surface, which can be defined in particular by a respective border of the opening. Orientation information can refer to this in particular.

[0041] In particular, the outlet opening can be arranged to discharge the gas flow entering through the inlet opening entirely or at least substantially parallel to the direction of the passing primary gas. This enables the smoothest possible transition from the gas flow into the primary gas. Furthermore, it can also create a suction effect, which is generated by the passing primary gas and supports the generation of the gas flow within the examination arrangement.

[0042] The gas supply device can be designed, in particular, to pass gas through the holder. This allows the nozzle to be arranged within the primary gas-carrying system.

[0043] According to one embodiment, at least one settling section, expediently with a locally enlarged cross-section, is formed in the test chamber. This allows the gas flow within the test chamber to be locally slowed, for example, to a standstill or to a speed close to a standstill. This is achieved by the expansion, which divides the gas flow, expressed as mass per unit time, over a larger cross-sectional area. This enables examinations with the gas at least almost at a standstill. For example, an object under investigation can be placed within the settling section.

[0044] According to one embodiment, at least one filter for filtering primary gas flowing in through the inlet opening is arranged in the examination chamber upstream of the object under investigation. This allows the gas flow to be suitably filtered before it reaches the object under investigation.

[0045] According to one embodiment, at least one cold trap is arranged in the examination chamber. This can generate a locally reduced temperature. This allows, for example, components of the gas stream to be precipitated and used for examination. The cold trap can, for example, represent an object under examination. It can also be used in addition to other objects under examination.

[0046] According to one embodiment, at least one reagent for chemical reaction with the primary gas, or a receptacle for such a reagent, is arranged in the examination chamber. This allows the reaction of such a reagent with the primary gas to be examined.

[0047] According to one embodiment, a closable access opening is formed in the holder, by means of which the examination chamber is accessible from outside the primary gas-carrying system. This allows examination objects to be exchanged even during operation. The access opening can, in particular, be closable such that primary gas does not escape when the access opening is closed. For example, the access opening can be closable via a flap or a closure. It can be opened temporarily, for example, to insert or remove an examination object. According to one embodiment, a cooling arrangement for cooling an examination object is arranged in the examination chamber. Such a cooling arrangement can, in particular, be designed to specifically cool an examination object so that the examination object can be examined at a defined temperature that is lower than an ambient temperature.The cooling arrangement can, for example, be connected to a holder for an examination object. This allows the holder to be cooled, or the examination object can be cooled directly, for example, by blowing cool gas onto it. The cooling arrangement can, for example, have a supply for cool gas, a cooling device for the gas, and / or a Peltier element.

[0048] According to one embodiment, the examination arrangement comprises a closure device for closing and releasing the inlet opening, wherein the closure device can be actuated from outside the primary gas-carrying system. According to one embodiment, the examination arrangement comprises a closure device for closing and releasing the outlet opening, wherein the closure device can be actuated from outside the primary gas-carrying system. This allows a targeted opening and closing of the inlet opening and / or outlet opening from outside the primary gas-carrying system, so that, for example, a constant gas atmosphere can be achieved within the examination arrangement for a defined period of time. Contamination of the examination arrangement can also be prevented when it is not needed by closing the closure device or closure devices.The two closure devices mentioned can, for example, be referred to as the first closure device and the second closure device.

[0049] According to one embodiment, the examination chamber is at least partially formed as a tube, wherein, in particular, a component extendable through the inlet opening or the outlet opening can be arranged or is arranged in the tube. This enables the use of the examination chamber as a retreat, wherein a component can be reliably stored therein and extended only when needed to be used directly in the primary gas for examination. This can also be understood, in particular, as an independent aspect of the invention, which can be implemented, in particular, independently of the use of an examination object in the examination chamber.

[0050] According to one embodiment, the examination chamber is at least partially formed as a tube, wherein the tube, according to possible embodiments, is designed in multiple layers, is thermally insulated, and / or has a cooling device. This can be used in particular to establish a desired temperature, in particular a temperature lower than the ambient temperature. This allows examinations to be carried out at such lower temperatures. For example, a cooling device can be designed as a channel for passing air through. Cooling by means of water or another fluid can also be carried out, for example. For example, materials such as steel, ceramic, a ceramic body, several ceramic bodies, a ceramic granulate, a ceramic fiber material, carbon fiber, or mineral fiber material can be used for insulation, in particular for thermal insulation. However, other materials can also be used.

[0051] According to one embodiment, a component that forms the test chamber in whole or in part can be removed and / or inserted into the test setup from outside the primary gas-carrying system. This allows for easy replacement of such a component, thus avoiding extensive maintenance work or even shutting down systems for the purpose of replacement.

[0052] According to one embodiment, the examination arrangement has at least one heat conduction path between at least one component forming the examination chamber and a temperature control area, wherein the temperature control area can be temperature-controlled from outside the primary gas-carrying system. This allows targeted heat dissipation, wherein, for example, the entire examination arrangement can be cooled in a targeted manner. Temperature control can be achieved, for example, by passing a fluid such as water or another cooling liquid or by applying pressurized air. The heat conduction path can be made, for example, of copper or another material with good thermal conductivity. According to one embodiment, the examination arrangement has at least one camera designed to record an interior of the examination chamber and / or an environment of the examination arrangement.This allows, for example, targeted optical observations to be carried out. For example, the object under investigation can be observed using the camera. In particular, it can be an electronic camera. This can, for example, be set up to take automated and / or time-controlled recordings. It can be designed for the direct transmission of data outside the primary gas-carrying system. It can also be designed to initially store the data internally so that it can be read out later. Direct control of the camera from the outside can also be provided. Alternatively, a direct observation option can also be provided, for example by providing a viewing window or a light guide.

[0053] According to one embodiment, the testing arrangement comprises at least one supply line for supplying a gaseous, liquid, and / or powdered substance from outside the primary gas-carrying system into the testing chamber. This allows the testing arrangement or the testing chamber to become a reactor, whereby the supplied substance can react, for example, with the primary gas and / or the gas flow passing through the testing chamber. This allows for the targeted investigation of chemical reactions that may occur when the supplied substance interacts with the primary gas.

[0054] According to one embodiment, the examination arrangement comprises a filter arranged in the gas stream between the object under examination and the outlet opening for filtering outflowing gas. This allows the outflowing gas stream to be filtered to prevent contamination in the primary gas.

[0055] According to one embodiment, the examination arrangement has at least one filter or fabric filter tube as the examination object, through which the gas flow is passed. This allows a filter to be examined, for example, a test with regard to clogging and / or its filtering effect. The filter or fabric filter tube can be arranged in particular at the inlet opening, or it can be arranged adjacent to or directly adjacent to the inlet opening. It can in particular be arranged closer to the inlet opening than to the outlet opening, in particular when viewed along a flow of the gas flow in the examination chamber. This allows the implementation of pulsing processes as described below.

[0056] The examination arrangement can, in particular, comprise a pulsing device designed to pulse a filter cake from the filter or fabric filter bag through the inlet opening. This can simulate pulsing during the cleaning of dust on filters such as fabric filter bags. In particular, the pulsing device can be designed to generate a temporary overpressure on a side of the filter or fabric filter bag opposite the inlet opening. This can cause the filter or fabric filter bag to bulge towards the inlet opening. This can expel a filter cake that has accumulated in or on the filter or fabric filter bag through the inlet opening. Such a process is referred to as pulsing. The filter itself can thus be the object of examination.

[0057] In particular, gas flowing from the nozzle(s) can generate a motive flow that draws in primary gas at the inlet opening. This can be done similarly to a water jet pump and enables simple and reliable operation.

[0058] In particular, at least one object to be examined and / or at least one receptacle for an object to be examined can be arranged in the examination chamber. Such an object to be examined can be examined in a suitable manner under defined conditions. A receptacle for an object to be examined can, in particular, hold the object to be examined and, for example, secure it against slipping or blowing out.

[0059] In particular, the nozzle(s) can be arranged between the examination object or the receptacle for an examination object and the outlet opening. This ensures, in particular, that only the gas flow extracted from the primary gas flows over the examination object and is not distorted by the pressurized gas, which serves solely to generate this gas flow. The same applies if multiple examination objects and / or multiple receptacles are present.

[0060] The bracket can be designed, in particular, for mounting in a wall opening. This allows the use of a typical opening such as a manhole, an inspection opening, or another opening in a wall.

[0061] The holder can be designed, in particular, to seal the opening against the escape of primary gas. This can be used, in particular, to ensure tightness, thus avoiding the use of additional sealing agents.

[0062] In particular, the mount can be designed entirely or partially as a plate. This allows for a simple design and easy adaptation to a typically plate-shaped or flat wall. However, other designs are also possible. In particular, it can be provided that the examination chamber is arranged only on one side, especially on the inside, of the plate. In particular, it can be provided that the examination chamber does not pass through the plate.

[0063] According to one embodiment, the examination arrangement further comprises an inert gas supply for supplying inert gas into the examination chamber. This allows inert gas to be supplied, which can ensure that an inert gas atmosphere develops within the examination chamber. This can, for example, prevent a chemical reaction that would otherwise occur for a predefined period of time. During this period, inert gas can be supplied. For example, the inert gas supply device can be designed to supply inert gases such as nitrogen or a noble gas such as helium, neon, or argon. For example, appropriate tanks or cylinders for such an inert gas can be provided and / or be part of the inert gas supply device. The invention further relates to a primary gas-carrying system.The primary gas-conducting system has a wall enclosing a primary gas-conducting region and further comprises an examination arrangement as described herein. All embodiments and variants described herein may be used with regard to the examination arrangement. The examination arrangement is, in particular, fastened by means of the holder such that the examination chamber is located within the primary gas-conducting region, the inlet and outlet openings open into the primary gas-conducting region, and / or the gas supply device can be supplied with pressurized gas from outside the primary gas-conducting region. As a result, the examination arrangement can be suitably used within the primary gas-conducting system to conduct examinations. Reference is made to the variants and advantages already described above.

[0064] In particular, an opening can be formed in the wall, which is closed by the holder. This allows for easy installation of the test setup in the primary gas-carrying system.

[0065] The inlet opening and / or the outlet opening can be oriented, in particular, transversely to a flow direction of the primary gas. In particular, the test arrangement, in conjunction with the primary gas-carrying system, can be designed to achieve such geometric relationships. Reference is made to the relevant advantages and variants, which have already been described above.

[0066] The examination arrangement can, in particular, be mobile or stationary. A mobile examination arrangement is understood to mean, in particular, an examination arrangement that can be used on different primary gas-carrying systems and is typically only used when needed. A stationary examination arrangement can, in particular, be permanently installed in a primary gas-carrying system and can be designed such that it cannot be removed or can only be removed with considerable effort, such as severing material connections. The invention further relates to a method for examining an examination object, wherein the method comprises the following steps:

[0067] Introducing an examination object into an examination arrangement as described herein, wherein all embodiments and variants described herein can be used with regard to the examination arrangement, Introducing the examination arrangement into a primary gas-carrying system so that the examination chamber is located within a primary gas-carrying area and the inlet opening and the outlet opening open in the primary gas-carrying area,

[0068] Pressurizing the gas supply device with compressed gas or compressed air, and carrying out an examination on the object under investigation within the primary gas-carrying system and / or after removal from the primary gas-carrying system.

[0069] Using such a method, the test setup can be advantageously used to conduct a test in a primary gas-carrying system or under the influence of a primary gas. All variants already described are also applicable to the method. The aforementioned advantages can also be achieved.

[0070] In particular, the primary gas-carrying system can be designed as described herein. All described designs and variants can be used accordingly.

[0071] In particular, the gas supply device can be pressurized with compressed gas or compressed air, so that a gas flow directed from the inlet opening to the outlet opening has the same velocity as the primary gas flowing outside the examination chamber. This allows the same conditions to be created on the examination object, not only in terms of chemical composition and / or temperature, but also in terms of flow velocity, as when the examination object is held directly in the primary gas.

[0072] For example, flow velocity sensors can be used to measure the velocity of the gas flow and / or the primary gas, or a suitable supply rate of compressed gas or compressed air can be calculated based on experiments and / or simulations.

[0073] In particular, an electronic control device may be present or used to carry out the method as described herein.

[0074] According to one embodiment, the gas supply device is only supplied with compressed gas or compressed air for a period of time which is shorter than the time the object under investigation remains within the primary gas-carrying system.

[0075] This allows for a time-resolved examination, with the gas flow through the examination chamber only being generated as long as the gas supply device is pressurized with compressed gas or compressed air. During other times, typically only a very slight diffusion of primary gas occurs. For example, the examination chamber can be purged with inert gas outside of the times when compressed gas or compressed air is being applied, so that, for example, reactions during such time windows are deliberately prevented.

[0076] The test chamber can also be considered a mini-laboratory. It can be used to conduct experiments under defined conditions, requiring significantly less effort than if a corresponding atmosphere were to be created synthetically.

[0077] In particular, an object under investigation can be mechanically protected, for example, from mechanical influences such as gas and particle flow, as well as from pressure waves or pulses, such as those from online cleaning in a flue gas system. Protection from thermal influences is also possible, for example, through reduced heat transfer.

[0078] For example, a negative pressure can be applied in the test chamber, for example as described above with reference to the nozzle, and this can create a controlled flow of flue gas or other gas through the test chamber. Such a gas flow can be redirected back into the primary gas. For example, tests can be carried out to determine components of a primary gas. These can be solid, liquid, or gaseous. Application sites are typically not temperature-restricted. Various internal fittings can, for example, provide information on substance species and substance loads. If the negative pressure can be adjusted so that a gas flow through the test chamber corresponds to a primary gas velocity, an unhindered inflow of a representative primary gas load is achieved with the opening arranged in the direction of the primary gas flow.

[0079] The substance species of interest can be separated or reacted with by fittings in the test chamber. For example, particles can be separated by installing calming sections (expanding the cross-section). These can be classified, for example, in impactors. Cyclone sections can also be provided. By installing filters, for example made of ceramic material, all or at least almost all particles can be separated. If necessary, even more efficient separation can be achieved by arranging different separation techniques for different particle size groups in series. The separated particles can be analyzed with regard to species, load, and morphology.By installing cold traps, similar to finned tubes, for example, the desublimatable and / or condensable and / or solidifiable substance species, such as salt species and salt load, can be determined. This allows additional information to be obtained (extending to the measurement techniques of a temperature-range probe and grid probe, even summatively over longer time frames). By installing reagents, a specific gas species, such as sulfur trioxide, can be determined.

[0080] The negative pressure test chamber can, for example, be equipped with various components (inserted kits) and capture various characteristics of the flue gas or primary gas in short time frames. The kits, inserted one after the other, can then be analyzed in a laboratory. A cover (e.g., plugged or screwed onto the test chamber) can be installed on the outside (for example, on a boiler room), for example, with the air supply line for cooling and nozzle air, which contains the nozzles and the test chamber.

[0081] Such a setup also allows for applications with pressurized reactors. The reactors can be loaded in the depressurized state, and during operation, the sampling time can be controlled by when the nozzle air is activated, i.e., the flow begins. During periods without nozzle air, no primary gas flows through the test chamber, and nothing is collected.

[0082] Pressureless processes can also be implemented. For example, everything can be prepared for a measurement, and an object can be located within the test chamber. When a specific event occurs, the process can be precisely activated and then stopped again by switching on the nozzle air.

[0083] If the examination chamber is correspondingly larger, larger loads of flue gas can also be sieved, for example to detect larger particles (e.g. carbonaceous particles, carbon fibers, erosive particles, aluminum flakes, other contaminants).

[0084] In addition, larger test chambers provide a kind of bypass function, meaning that a portion of the primary gas can be removed and recirculated. This allows for testing technical components, for example, for contamination or deactivation of catalysts, or for conducting material tests.

[0085] In particular, the primary gas typically does not leave the primary gas-carrying system. In the case of flue gas, it can be said that it does not leave the boiler. A defined and controlled flow can be created, for example, analogous to a bypass path. This results in a high degree of variability in terms of dimensions, temperatures, and internals. The examination chamber can be designed so that it can be equipped online from the outside. Internals can be designed to be cooled, for example using compressed air. A reaction time can be controllable, for example similar to switching on and off. All components of a primary gas, such as flue gas, can be specifically addressed by appropriate internals. A permanent installation of an otherwise empty examination chamber and, if necessary, also the pressure supply device can be implemented in order to be able to carry out examinations at any time.

[0086] Further features and advantages will become apparent to those skilled in the art from the exemplary embodiments described below with reference to the accompanying drawings. These show: Fig. 1: a primary gas-carrying system with an examination arrangement according to a first exemplary embodiment,

[0087] Fig. 2: an examination arrangement according to a second embodiment, Fig. 3: an examination arrangement according to a third embodiment, Fig. 4: an examination arrangement according to a fourth embodiment, Fig. 5: an examination arrangement according to a fifth embodiment, Fig. 6: an examination chamber with a settling section, Fig. 7: an examination chamber with filters, Fig. 8: an examination chamber with a cold trap,

[0088] Fig. 9: an examination chamber with access opening,

[0089] Fig. 10: an examination chamber with cooling arrangement,

[0090] Fig. 11: an examination arrangement with closure devices, Fig. 12: an examination chamber with camera, and Fig. 13: an examination chamber with supply line.

[0091] Fig. 1 shows a purely schematic view of a primary gas-carrying system 10 with an examination arrangement 100 according to a first exemplary embodiment. The primary gas-carrying system 10 has a wall 20 which delimits the primary gas-carrying system 10 to the outside. In particular, the wall delimits an area 25 in which primary gas is located or primary gas flows. For example, it can be a flue gas-carrying system, or it can be a reactor in which process gas or synthesis gas is produced. The primary gas can in particular have an elevated temperature, for example of several hundred degrees Celsius for flue gas, but it can in principle have any desired temperature, which typically follows certain technical conditions. An opening 22 is formed in the wall 20, which opening can be, for example, a manhole or a conventional inspection opening.The aforementioned examination arrangement 100 according to the first exemplary embodiment is mounted therein. Holding devices 102, not shown in detail but shown only schematically, serve for fastening. A sealing element 103 is provided to prevent the escape of primary gas at this location.

[0092] The examination arrangement 100 has a holder 110. In this case, this holder is designed as a disc that essentially covers the opening 22. The holder 110 serves, in particular, to attach the components described below.

[0093] The examination arrangement 100 comprises an examination chamber 200. In this case, this chamber comprises a tube 210, which defines a part of the examination chamber 200. In particular, a first section 221 of the examination chamber 200 is formed within the tube 210. An inlet opening 205 is formed on this section, which, as shown, extends parallel to the wall 20. If a primary gas moves at least approximately along the wall 20 within the area delimited by the wall 20, as is the case, for example, in typical flue gas-conducting systems, primary gas can thus be sucked in through the inlet opening 205 transversely to the flow direction.

[0094] Radially outside the first section 221 is a second section 222 of the examination chamber 200. In this case, this section is delimited by an outer tube 215. A deflection section 223 is located between them in terms of flow. An outlet opening 206 is arranged at the second section 222 of the examination chamber 200, through which a gas stream drawn in through the inlet opening 205 and deflected in the deflection section 223 can be discharged again. The discharge takes place within the wall 20, so that the gas stream is not directed outward.

[0095] The tube 210 represents, in particular, a band-shaped wall. It delimits the first section 221 from the second section 222 and borders the deflection section 223 at the end face. The examination arrangement 100 further comprises a gas supply device 120 for supplying pressurized gas from outside the wall 20. In the present case, this is designed in the form of tubes and supplies a first nozzle 121 and a second nozzle 122. These can be pressurized with compressed air from outside and extend, as shown, into the second section 222 of the examination chamber 200. When compressed air is introduced through the nozzles 121, 122, a suction effect is created which sucks in a gas stream taken from the primary gas through the inlet opening 205, directs it through the first section 221 of the examination chamber 200, deflects it by 180° in the deflection section 223, directs it into the second section 222 of the examination chamber 200 and releases it again through the outlet opening 206.Thus, a gas flow can be easily generated within the examination chamber 200, which typically has the same chemical composition as the surrounding primary gas.

[0096] In this case, an examination object 130 is located within the examination chamber 200. The aforementioned gas flow flows around this examination object, allowing its behavior within this gas flow to be examined. Furthermore, the examination chamber 200 contains a receptacle 135, in which, in principle, another examination object can be accommodated. This object can also be examined. It should be understood that this embodiment is only shown as an example, and that more or fewer examination objects or receptacles for examination objects may be present.

[0097] In particular, this allows for investigations to be conducted under highly realistic conditions. At the same time, the investigation chamber 200 or its tube 210 shields against unwanted influences such as entrained particles. Further options are also possible, which have already been explained above and / or will be explained further below.

[0098] If the tube 210 is made of a thermally conductive material and / or is comparatively thin, for example, the temperature inside the examination chamber 200 is at least substantially the same as outside. This enables corresponding examinations. By providing insulation and, if necessary, cooling or heating devices, the temperature inside the examination chamber 200 and / or in one or more examination objects 130 or receptacles 135 can be specifically influenced, thus enabling examinations at different temperatures.

[0099] The outlet opening 206 is axially set back compared to the inlet opening 205. This prevents gas flowing out through the outlet opening 206 from being sucked back in through the inlet opening 205.

[0100] It should be understood that the object under investigation 130 can also be a reagent. This can, for example, be in liquid form. This allows reactions with the surrounding gas stream to be investigated. The reagent can, for example, be stored in a suitable container that is open on at least one side.

[0101] Fig. 2 shows an examination arrangement 100 according to a second exemplary embodiment of the invention. Reference is essentially made to the description of the first exemplary embodiment. Relevant deviations are described below.

[0102] In the second embodiment, the deflection chamber 223 is formed substantially along a projection 115, which extends from the holder 110 into the first section 221 of the examination chamber 200. It has an approximately dome-shaped geometry. This allows for a more uniform deflection of the gas flow from the first section 221 into the second section 222. The first nozzle 121 and the second nozzle 122 are formed in the projection 115, as shown.

[0103] Compressed air can be supplied to both nozzles 121, 122 from the outside. This is achieved via a compressed air duct 128, which passes through the holder 110.

[0104] Furthermore, in the illustrated embodiment, the outlet opening 206 is designed transversely to the inlet opening 205. This allows the gas flow to be directed sideways in a targeted manner, for example, it can be discharged in the direction of the outflowing primary gas. This also prevents discharged gas from re-entering the inlet opening 205. This ensures that the inlet opening 205 always draws in fresh gas.

[0105] Fig. 3 shows an examination arrangement 100 according to a third exemplary embodiment. In contrast to the second exemplary embodiment, the projection 115 is designed as a holder for a component 117. As shown, the component 117 extends outward through the inlet opening 205 into the area enclosed by the wall 20 (not shown in Fig. 3), so that further examinations are also possible. For example, the component 117 can be a probe with a temperature gradient.

[0106] Fig. 4 shows an examination arrangement 100 according to a fourth exemplary embodiment. In contrast to the previous exemplary embodiments, the second section 222 is not arranged radially outside the first section 221, but rather the first section 221 and the second section 222 are arranged side by side within the tube 210. A partition wall 212 serves for separation. This partition wall is arranged at least partially within the tube 210. At the end facing away from the holder 110, it has a bend 213, which serves to divert the gas flow through the laterally arranged outlet opening 206. The partition wall 212 represents a band-shaped wall.

[0107] In this case, the gas supply device 120 feeds a single nozzle 121, which opens directly into the second section 222 of the examination chamber 200. This generates the gas flow as already described above.

[0108] Fig. 5 shows an examination arrangement 100 according to a fifth exemplary embodiment. In contrast to the previous exemplary embodiments, the gas supply device 120 has a nozzle 125, which is arranged on a side of the holder 110 opposite the examination chamber 200. The nozzle 125 is designed as a Venturi nozzle and serves to generate a negative pressure. It is connected to the examination chamber 200 via a labyrinth 127. Thus, when a negative pressure is generated in the Venturi nozzle 125 by supplying compressed air, a negative pressure can be generated in the examination chamber 200, which in turn leads to the aforementioned gas stream, which is sucked in through the inlet opening 205. The labyrinth 127 effectively prevents the Venturi nozzle 125 from becoming clogged by any particles that may be flying along.

[0109] The Venturi nozzle 125 is connected to the outlet opening 206 via an outlet line 126. This allows the gas flow to be redirected back to a space within the primary gas-carrying system, as in the other embodiments.

[0110] Fig. 6 shows an investigation chamber 200 in which a settling section 230 is formed. As shown, the settling section 230 is realized by a local widening of the cross-section. Thus, at the same mass flow within the settling section 230, the gas flowing through it has a larger cross-section available and flows considerably more slowly within the settling section 230. This allows investigations to be conducted with at least a nearly stationary gas, even if the gas flow is otherwise generated as a clearly perceptible flowing gas stream.

[0111] Fig. 7 shows a purely schematic view of an examination chamber 200, in which an inlet-side filter 240 is arranged adjacent to the inlet opening 205. Likewise, an outlet-side filter 245 is arranged adjacent to the outlet opening 206. An examination object is schematically shown between the two filters 240, 245.

[0112] The inlet filter 240 can filter the gas stream before it reaches the test object 130. This can, for example, remove unwanted particles. The outlet filter 245 can, for example, ensure that reaction products that may arise during the reaction of the gas stream with the test object 130 cannot be released into the surrounding primary gas. Furthermore, the filters 240, 245 can also be used to determine the mass of separated particles.

[0113] It should be understood that in principle only one of the two filters 240, 245 shown can be used.

[0114] Fig. 8 shows an examination chamber 200 with a cold trap 250 arranged therein. The cold trap 250 can be supplied with a cooling fluid, for example, a liquid and / or air or another gas, through a line 255. This allows it to be cooled in a targeted manner so that components contained in the gas stream precipitate at the cold trap 250. This allows for a targeted examination of these components. The cold trap 250 can, for example, be removed after an examination to examine the precipitated components.

[0115] Fig. 9 shows an examination chamber 200 mounted on a support 110, in which an access opening 112 is located. The access opening 112 serves to insert or remove examination objects or other components into the examination chamber 200 during operation of the primary gas-carrying system, also referred to as online. The access opening 112 thus allows external access by an operator at any time.

[0116] The access opening 112 can be selectively closed by a flap 114. This prevents the escape of primary gas when access to the examination chamber 200 is not required. However, if the aforementioned work is to be performed, for example, an examination object is to be inserted or removed, the flap 114 can be opened briefly, allowing the corresponding work to be performed.

[0117] Fig. 10 shows an examination chamber 200 with a cooling arrangement 260. The cooling arrangement 260 is designed as a receptacle for an examination object. It is connected to an area outside the primary gas-carrying system 10 via a line 265. This allows the cooling arrangement 260 to be cooled by supplying a gas or liquid, for example, compressed air or cooling water, and thus allows an examination to be conducted at a temperature lower than the ambient temperature. Alternatively, Peltier elements, for example, can also be used. A temperature sensor can be provided to monitor the temperature.

[0118] Fig. 11 shows an embodiment of an examination arrangement 100, which is constructed similarly to that of Fig. 1, and in particular additionally has a first closure device 275 for closing the inlet opening 205 and a second closure device 276 for closing the outlet opening 206. The second closure device 276 is designed in several parts so that the circumferential channel can be completely closed. In the embodiment shown, each of the closure devices 275, 276 is designed such that a plate can close the respective opening 205, 206, and the plate can be rotated from outside the primary gas-carrying system. This allows easy operation even while the examination arrangement 100 is installed in a primary gas-carrying system, so that the entry of primary gas through the openings 205, 206 can be avoided at all times.

[0119] In particular, the closure devices 275, 276 can be combined with the access opening 112 mentioned above, especially if the access opening can be closed by a flap 114. In this case, the examination chamber can fulfill a lock function with respect to material.

[0120] Furthermore, Fig. 11 also shows a heat conduction path 280, which serves to dissipate heat from the tube 210, which forms the first section 221 of the examination chamber 200, to the outside. This heat conduction path 280 can be made, for example, of copper or another material with good thermal conductivity. A temperature control region 285 is arranged outside the primary gas-carrying system 10, to which the heat conduction path 280 is thermally connected. This enables targeted heat dissipation, for example, by connecting a cooling arrangement to the temperature control region 285.

[0121] In the embodiment according to Fig. 11, an inert gas supply device 270 is also present, which in this case is designed as a pipe that extends from outside the inert gas-carrying system into the first section 221 of the examination chamber 200. This allows inert gas such as nitrogen or a noble gas to be supplied to purge the examination chamber 200. For example, with the closure devices 275, 276 closed, the examination chamber 200 can be purged with inert gas, whereby the inert gas can escape through any remaining slight openings. Entry of primary gas into the examination chamber 200 is thus prevented as long as the inert gas flows in and the closure devices 275, 276 are closed. This allows a reaction of an examination object with the primary gas to be specifically prevented for a defined period of time.When an examination is to be conducted, the supply of inert gas can be switched off and the closure devices 275, 276 can be opened. Primary gas then flows through the examination chamber 200 for a definable period of time, in particular when the gas supply device 120 is subjected to pressurized gas, thereby inducing a gas flow. After the examination has been completed, the supply of inert gas can be reactivated and the closure devices 275, 276 can be closed again. This prevents any further reaction of an examination object with primary gas. In this way, it is possible to precisely specify how long an examination in the form of a reaction with primary gas should last. This can be understood as an independent aspect relevant to the invention, in particular as a method aspect.

[0122] Fig. 12 shows an examination chamber 200 having a camera 290. The camera 290 is arranged within the examination chamber 200 and connected to an area outside the primary gas-carrying system via a line 295. The camera 290 is designed to observe an examination object 130 within the examination chamber 200. This allows a reaction to be observed automatically and / or online, providing additional information.

[0123] Fig. 13 shows an investigation chamber 200 with a supply line 300 for supplying a gaseous, liquid, and / or powdered substance from outside the primary gas-carrying system 10 into the investigation chamber 200. In this case, a powdered substance is shown purely as an example, which emerges from the supply line 300. In this case, this substance falls into a receptacle 135 provided for this purpose, in which a reaction with the primary gas can take place. This allows the investigation chamber 200 to be used as a reactor, for example, as a miniature reactor. A reaction can be induced between the supplied substance and the primary gas, whereby, for example, processes can be investigated that are later to be implemented on an industrial scale. The embodiments shown and described can also be combined with one another.

[0124] Overall, the designs described herein allow for investigations to be conducted under defined conditions or for processes to be investigated and optimized on a small scale, which represents a significant reduction in effort compared to direct large-scale implementations. Very precisely defined conditions can be established under which reactions with a primary gas are to take place. This allows, for example, the investigation of materials to test and optimize them with regard to their corrosion resistance, or even the acquisition of insights into processes.

[0125] The steps mentioned in the method according to the invention can be carried out in the specified order. However, they can also be carried out in a different order, as long as this is technically reasonable. The method according to the invention can be carried out in one of its embodiments, for example, with a specific combination of steps, in such a way that no further steps are carried out. However, in principle, further steps can also be carried out, even those not mentioned.

[0126] It should be noted that features may be described in combination in the claims and the description, for example, to facilitate understanding, although they may also be used separately. Those skilled in the art will recognize that such features may also be combined independently with other features or combinations of features.

[0127] References in subclaims may indicate preferred combinations of the respective features, but do not exclude other combinations of features. List of reference symbols

[0128] 10 primary gas system

[0129] 20 Wall

[0130] 22 Opening

[0131] 25 primary gas-carrying area

[0132] 100 Investigation order

[0133] 102 Holding device

[0134] 103 Sealing element

[0135] 110 bracket

[0136] 112 Access opening

[0137] 114 flap

[0138] 115 lead

[0139] 117 Component

[0140] 120 Gas supply device

[0141] 121 nozzle

[0142] 122 nozzle

[0143] 125 Venturi nozzle

[0144] 126 Outlet line

[0145] 127 Labyrinth

[0146] 128 compressed air duct

[0147] 130 Object of investigation

[0148] 135 recording

[0149] 200 Investigation Chamber

[0150] 205 Inlet opening

[0151] 206 exhaust port

[0152] 210 pipe

[0153] 212 Partition wall

[0154] 213 Curvature

[0155] 215 outer tube

[0156] 221 first section

[0157] 222 second section

[0158] 223 Deflection section

[0159] 230 calming section

[0160] 240 input side filter output side filter

[0161] cold trap

[0162] Line

[0163] Cooling arrangement

[0164] Line

[0165] Inert gas supply device

[0166] locking device

[0167] locking device

[0168] Heat conduction path

[0169] Temperature control range

[0170] camera

[0171] Line

[0172] supply line

Claims

Patent claims 1. An examination arrangement (100) for examining an examination object (130) in a gas stream taken from primary gas, the examination arrangement (100) comprising: a holder (110) for fastening the examination arrangement (100) to a wall (20) of a primary gas-conducting system (10), an examination chamber (200) for receiving the examination object (130) therein, the examination chamber (200) comprising an inlet opening (205) and an outlet opening (206), and the examination chamber (200) being fastened to the holder (110) for positioning the examination chamber (200) within the primary gas-conducting system (10) such that the inlet opening (205) and the outlet opening (206) open into a primary gas-conducting region (25) of the primary gas-conducting system (10), a gas supply device (120) for supplying pressurized Gas from outside the primary gas-carrying system (10), and at least one nozzle (121, 122, 125),which is connected to the gas supply device (120), wherein the nozzle (121, 122, 125) is arranged so that gas flowing out of the nozzle (121, 122, 125) induces a gas flow through the examination chamber (200) from the inlet opening (205) to the outlet opening (206).

2. Examination arrangement (100) according to one of the preceding claims, wherein the examination chamber (200) has a first section (221) and a second section (222) which are at least partially delimited from one another, wherein the inlet opening (205) is formed on the first section (221) and the outlet opening (206) is formed on the second section (222).

3. Examination arrangement (100) according to claim 2, wherein the first section (221) is delimited from the second section (222), completely or at least partially, only by means of a band-shaped wall.

4. Examination arrangement (100) according to one of claims 2 or 3, wherein a deflection section (223) for deflecting a gas flow flowing in through the inlet opening (205) towards the outlet opening (206) is formed between the first section (221) and the second section (222). Examination arrangement (100) according to claim 4, wherein the deflection occurs through 180°. Examination arrangement (100) according to one of claims 4 or 5, wherein the deflection occurs around a band-shaped wall which delimits the first section (221) from the second section (222). Examination arrangement (100) according to one of claims 4 to 6, wherein the first section (221) is designed as a continuous tube from the inlet opening (205) to the deflection section (223) and / or extends along a longitudinal axis, and / or wherein the second section (222) is designed as a continuous tube from the deflection section (223) to the outlet opening (206) and / or extends along a longitudinal axis. Examination arrangement (100) according to one of claims 2 to 7, wherein the first section (221) is tubular. Examination arrangement (100) according to one of claims 2 to 8, wherein the second portion (222) has an annular cross-section and surrounds the first portion (221).The examination arrangement (100) according to one of claims 2 to 9, wherein the first section (221) and the second section (222) are separated from one another by a partition wall (212). The examination arrangement (100) according to claim 10, wherein the partition wall (212) is completely or partially flat and / or planar. The examination arrangement (100) according to one of claims 10 or 11, wherein the partition wall (212) has a curvature (213) which at least partially defines the outlet opening (206) and / or directs the gas flow to the outlet opening (206). Examination arrangement (100) according to one of claims 2 to 12, which has a projection (115) which is fastened to the holder (110) and projects into the first section (221). Examination arrangement (100) according to claim 13, wherein the deflection section (223) is formed entirely or partially on the projection (115), and / or wherein the projection (115) is designed to hold an examination object (130). Examination arrangement (100) according to one of claims 2 to 14, wherein the at least one nozzle (121, 122) opens into the second section (222). Examination arrangement (100) according to one of the preceding claims, wherein the examination chamber (200) has a tube (210) for receiving the examination object (130) therein, and wherein the inlet opening (205) is arranged on the tube (210).Examination arrangement (100) according to one of the preceding claims, wherein the examination chamber (100) is open towards the primary gas-conducting region (25) exclusively at the inlet opening (205) and the outlet opening (206). Examination arrangement (100) according to one of the preceding claims, wherein the examination chamber (100) is arranged between the inlet opening (205) and the outlet opening (206) exclusively on the inside of the holder (110). Examination arrangement (100) according to one of the preceding claims, wherein the nozzle (125) is arranged separately from the examination chamber (200) and is connected to the examination chamber (200) for generating a negative pressure in the examination chamber (200) by gas flowing out of the nozzle (125). Examination arrangement (100) according to claim 19, wherein the nozzle (125) is connected to the examination chamber (200) via a labyrinth (127) and / or at least one deflection wall. Examination arrangement (100) according to one of claims 19 or 20, wherein the nozzle (125) is designed as a Venturi nozzle. Examination arrangement (100) according to one of claims 19 to 21, wherein the nozzle (125) is arranged on a side of the holder (110) opposite the examination chamber (200). Examination arrangement (100) according to one of the preceding claims, wherein the outlet opening (206) is arranged closer to the holder (110) than the inlet opening (205). Examination arrangement (100) according to one of the preceding claims, wherein the nozzle (121, 122) or the nozzles (121, 122) are directed from within the examination chamber (200) towards the outlet opening (206). Examination arrangement (100) according to one of the preceding claims, wherein the inlet opening (205) and the outlet opening (206) point in the same direction and / or are aligned parallel to one another.Examination arrangement (100) according to one of the preceding claims, wherein the inlet opening (205) and / or the outlet opening (206) are arranged relative to the holder (110) so as to be oriented transversely to the flow direction of the primary gas. Examination arrangement (100) according to one of the preceding claims, wherein the outlet opening (206) is oriented transversely to the inlet opening (205), or wherein the outlet opening (206) forms an angle between 90° and 60° to the inlet opening (205). Examination arrangement (100) according to one of the preceding claims, wherein the outlet opening (206) is arranged to discharge the gas flow entering through the inlet opening (205) entirely or at least substantially parallel to the direction of the passing primary gas. Examination arrangement (100) according to one of the preceding claims, wherein the gas supply device (120) is designed to pass gas through the holder (110). Examination arrangement (100) according to one of the preceding claims, wherein at least one calming section (230) with a locally enlarged cross-section is formed in the examination chamber (200). Examination arrangement (100) according to one of the preceding claims, wherein at least one filter (240) for filtering primary gas flowing in through the inlet opening (205) is arranged in front of the examination object (130) in the examination chamber (200). Examination arrangement (100) according to one of the preceding claims, wherein at least one cold trap (250) is arranged in the examination chamber (200).Examination arrangement (100) according to one of the preceding claims, wherein at least one reagent for chemical reaction with the primary gas, or a receiving device for such a reagent, is arranged in the examination chamber (200). Examination arrangement (100) according to one of the preceding claims, wherein a closable access opening (112) is formed in the holder (110), by means of which the examination chamber (200) is accessible from outside the primary gas-carrying system (10). Examination arrangement (100) according to one of the preceding claims, wherein a cooling arrangement (260) for cooling an examination object (130) is arranged in the examination chamber (200). Examination arrangement (100) according to one of the preceding claims, which has a closure device (275) for closing and opening the inlet opening (205), wherein the closure device (275) is operable from outside the primary gas-carrying system (10), and / or.which has a closure device (276) for closing and opening the outlet opening (206), wherein the closure device (276) can be actuated from outside the primary gas-carrying system (10). Examination arrangement (100) according to one of the preceding claims, wherein the examination chamber (200) is at least partially designed as a tube (210, 215), wherein a component that can be extended through the inlet opening (205) or through the outlet opening (206) can be or is arranged in the tube (210, 215). Examination arrangement (100) according to one of the preceding claims, wherein the examination chamber (200) is at least partially designed as a tube (210, 215), wherein the tube (210, 215) is designed in multiple layers, is thermally insulated, and / or has a cooling device.Examination arrangement (100) according to one of the preceding claims, wherein a component forming the examination chamber (200) in whole or in part is removable and / or insertable from the examination arrangement (100) from outside the primary gas-carrying system (10). Examination arrangement (100) according to one of the preceding claims, which has at least one heat-conducting path (280) between at least one component forming the examination chamber (200) and a temperature-control region (285), wherein the temperature-control region (285) can be temperature-controlled from outside the primary gas-carrying system (10). Examination arrangement (100) according to one of the preceding claims, which has at least one camera (290) designed to record an interior of the examination chamber (200) and / or an environment of the examination arrangement (100).Examination arrangement (100) according to one of the preceding claims, which has at least one supply line (300) for supplying a gaseous, liquid and / or powdery substance from outside the primary gas-carrying system (10) into the examination chamber (200). Examination arrangement (100) according to one of the preceding claims, which comprises a filter (245) arranged in the gas flow between the examination object (130) and the outlet opening (206) for filtering outflowing gas. Examination arrangement (100) according to one of the preceding claims, which comprises, as the examination object (130), a filter or a fabric filter tube through which the gas flow is passed. Examination arrangement (100) according to claim 44, wherein the examination arrangement (100) comprises at least one pulsing device designed to pulse a filter cake of the filter or the fabric filter tube via the inlet opening (205). Examination arrangement (100) according to one of the preceding claims, wherein gas flowing out of the nozzle (121, 122, 125) or the nozzles (121, 122, 125) generates a driving flow which sucks in primary gas at the inlet opening (205).Examination arrangement (100) according to one of the preceding claims, wherein at least one examination object (130) and / or at least one receptacle (135) for an examination object (130) is arranged in the examination chamber (200). Examination arrangement (100) according to claim 47, wherein the nozzle (121, 122, 125) or the nozzles (121, 122, 125) are arranged in terms of flow between the examination object (130) or the receptacle (135) for an examination object (130) and the outlet opening (206). Examination arrangement (100) according to one of the preceding claims, wherein the holder (110) is designed for fastening in an opening (22) in the wall (20). Examination arrangement (100) according to claim 49, wherein the holder (110) is designed to seal the opening (22) against the escape of primary gas. Examination arrangement (100) according to one of the preceding claims, wherein the holder (110) is designed entirely or partially as a plate. Examination arrangement (100) according to one of the preceding claims, which further comprises an inert gas supply device (270) for supplying inert gas into the examination chamber (200). Primary gas-conducting system (10) comprising a wall (20) which encloses a primary gas-conducting region (25), and an examination arrangement (100) according to one of the preceding claims, wherein the examination arrangement (100) is fastened by means of the holder (110) such that the examination chamber (200) is located within the primary gas-conducting region (25), the inlet opening (205) and the outlet opening (206) open into the primary gas-conducting region (25), and the gas supply device (120) can be supplied with pressurized gas from outside the primary gas-conducting region (25).The primary gas-conducting system (10) according to claim 53, wherein an opening (22) is formed in the wall (20), which opening is closed by the holder (110). The primary gas-conducting system (10) according to one of claims 53 or 54, wherein the inlet opening (205) and / or the outlet opening (206) are oriented transversely to a flow direction of the primary gas. A method for examining an object (130) under examination, the method comprising the following steps: Introducing an examination object (130) into an examination arrangement (100) according to one of claims 1 to 52, Inserting the examination arrangement (100) into a primary gas-carrying system (10) such that the examination chamber (200) is located within a primary gas-carrying region (25), and the inlet opening (205) and the outlet opening (206) open into the primary gas-carrying region (25), Pressurizing the gas supply device (120) with compressed gas or compressed air, and carrying out an examination on the examination object (130) within the primary gas-carrying system (10) and / or after removal from the primary gas-carrying system (10). The method according to claim 56, wherein a primary gas-carrying system (10) according to one of claims 53 to 55 is used. The method according to one of claims 56 or 57, wherein the gas supply device (120) is supplied with compressed gas or compressed air such that a gas flow directed from the inlet opening (205) to the outlet opening (206) has the same velocity as the primary gas flowing outside the examination chamber (200). The method according to one of claims 56 to 58, wherein the gas supply device (120) is supplied with compressed gas or compressed air only during a time interval that is shorter than the time the examination object (130) remains within the primary gas-carrying system (10).

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