Inspection during the production of modules or precursors of modules

Abstract

An inspection device comprises a first layer conveyor, which has a receiver and a first drive in order to receive a respective anode or cathode layer by means of the receiver from a first transfer point and to bring same to a first depositing point. At the first depositing point, a stacking table receives the anode or cathode layer from the receiver to form a layer stack. At the first depositing point, the first layer conveyor deposits an anode or cathode layer from its receiver on the stacking table when the receiver is at the first depositing point. A third image recorder is directed to a region comprising an upper edge of a layer stack located on the stacking table, seen in a side view of the layer stack, which region contains a connection lug of an anode or cathode layer at the top of the layer stack, and the third image recorder acquires a third image before or after the anode or cathode layer is placed on the stacking table. Depending on signalling based on a processing of the third acquired image, a controller indicates the (un)usability of the layer stack.

Description

[0001] Inspection during the production of modules or pre-module stages

[0002] Description

[0003] background

[0004] This discloses an inspection during the manufacture of modules or module precursors. These modules or their precursors can be, for example, layered assemblies containing layer material, assemblies for fuel or battery cells, or parts for their manufacture. The layer material can include electrode layers configured as anode or cathode layers. The inspection is disclosed as a method and as a device. Details are defined in the claims. The description also contains relevant information on the structure and functioning of the inspection, as well as on device and method variants.

[0005] State of the art

[0006] WO 2021 171 946 A1 relates to a stacking table on which laminate stacks consisting of release liners and electrode layers are stacked. A transport unit is used to transport the release liners and electrode layers and place them on the stacking table. The above-mentioned testing device checks the position of the electrode layers in the laminate stacks released by the transport unit.

[0007] JP 2014 078464 A relates to a laminating machine for producing a laminated body from a rectangular film as a positive electrode, a rectangular film as a negative electrode, which are alternately laminated over a rectangular release film.

[0008] WO 2021 171 946 A1 relates to a testing device for checking the position of the electrode layer in a laminate in which a release film and an electrode layer are bonded by an adhesive, from the release film side. An infrared radiator irradiates the laminate with infrared light from the release film side. An infrared-sensitive camera records the infrared light transmitted through the release film and reflected by the electrode layer. A detection unit detects the position of the electrode layer based on the image captured by the camera.

[0009] WO 2020 130 184 A1 describes the production of a cell stack of a secondary battery. A stacking table is movable back and forth. A separator feed unit is positioned on the stacking table and feeds a separator to the stacking table. A first multi-head is provided on one side of the stacking table and stacks one layer after the other by depositing the electrode layers onto the stacking table, which is moved to one side. A second multi-head is provided on the other side of the lamination table and stacks the electrode layers onto the stacking table, which is moved to the other side.

[0010] Technical problem

[0011] Based on this, a cost-effective and robust arrangement of a stacking unit and a procedure for stacking layered material with high processing speed are to be provided in order to manufacture modules or precursors of modules, for example of fuel or battery cells containing layered material, with high precision.

[0012] Proposed solution

[0013] To solve this problem, inspection devices and inspection methods according to the independent device and method claims are proposed.

[0014] The inspection solutions presented here can be integrated into a handling system (device or method) in which the stacking table moves back and forth and is fed with an anode or cathode at each of the end positions by one of two layer conveyors to form the electrode stack. The back-and-forth movement of the stacking table between the first and second delivery points limits the number of anode or cathode layers that can be deposited per unit of time. A solution presented here, which radially retracts the respective pick-up(s) of one layer turner when approaching the pick-up(s) of the other layer turner, particularly in the space between the two layer turners, allows a smaller distance between the first and second delivery points than with a circular trajectory of the pick-up(s) of both layer turners, which must not touch each other.This allows the length of the stacking table's travel path between the two delivery points to be reduced. This is particularly relevant after the pick-ups have placed the anode or cathode layers on the stacking table's tray (6 o'clock position in Fig. 1), and the empty pick-ups enter the space between the two layer turners. Without this radial retraction of the pick-ups, their trajectories would be significantly longer, which would require an increased distance between the first and second delivery points. This also enables a more compact design of the entire device. In one variant, the pick-ups of the two layer turners each move on an approximately stationary ellipse, whose (vertical) major axes extend from the center of the respective transfer point to the center of the respective delivery point, and whose (horizontal) minor axes do not touch each other.Guiding the pickups along these approximately elliptical paths avoids collision of the pickups when rotating from the delivery point back to the transfer point, even though the two layer turners are arranged close to each other in order to keep the path of the stacking table from one layer turner to the other as short as possible.

[0015] In one variant of the device, the first and second layer turners are designed and configured to extend the pick-ups by means of their respective second drives when the pick-ups approach the respective first or second transfer point and / or the first or second delivery point. To pick up the anode or cathode layers at the respective transfer points (12 o'clock or 6 o'clock position in Fig. 1), the pick-ups of the two layer turners can be extended radially. The radial movement of the pick-ups begins before the pick-ups reach the 6 o'clock or 12 o'clock position, and not only when they have reached the position.

[0016] This increases the accuracy of picking up the anode and cathode layers from the two conveyors at the respective transfer points. This allows a higher number of anode and cathode layers to be deposited on the stacking table per unit of time without compromising the accuracy of the electrode stack.

[0017] In one variant of the device, an endless separator is fed from above into the space between the two layer turners, which is folded into a Z shape on the stacking table. The stacking table continuously moves horizontally back and forth between the two depositing positions, so that for an electrode stack, starting with the separator and then alternating between the anode and cathode layers, always separated by the folded separator, are alternately deposited on the stacking table by the two layer turners.

[0018] In one variant of the device, the first conveyor and the second conveyor are arranged adjacent to each other and spaced apart from each other. In one variant of the device, the first conveyor and / or the second conveyor are designed as belt conveyors, each of which faces the first or second layer turner with its underside, in order to convey the individual anode layers or the individual cathode layers by their underside to the first or second transfer point.

[0019] In one variant of the device, the first conveyor and / or the second conveyor each have a controlled vacuum / overpressure conveyor belt. They are designed and configured to pick up the individual anode layers or cathode layers by means of controlled pneumatic vacuum and to hold them during conveyance to the first or second transfer point. In one variant of the device, the individual anode layers or cathode layers are delivered to the first or second layer turner at the first or second transfer point by means of controlled pneumatic overpressure, for example in the form of a short blow.

[0020] In one variant of the device, the first and / or second layer turner each have several pick-ups for picking up the individual anode or cathode layers. The pick-ups are designed and configured to rotate continuously or intermittently past the respective transfer point and the respective delivery point. The pick-ups of the first and / or second layer turner can pick up or deliver the respective individual anode or cathode layer.

[0021] The angle of rotation of the first and / or second layer turner is, for example, approximately 180°. However, it can also be less (for example, 90°) or more (for example, 270°). The angle of rotation describes the extent by which a layer is pivoted or turned between the transfer point and the delivery point by the layer conveyor. The layer is turned by picking up a layer from the conveyor using the layer turner, turning it, and then placing it on the stacking table. This means that the free upper side of the layer facing away from the conveyor before being picked up by the pickers is the same free upper side of the layer after being placed on the stacking table, but with the orientation turned by the angle of rotation (for example, 180°). The rotation of the first and second layer turners and their pickers takes place around their respective centers of rotation / axes of rotation.

[0022] In one variant of the device, the first and second layer turners essentially have the same structure, same function, and / or same dimensions. In one variant of the device, the first and second layer turners are provided and configured to rotate clockwise or counterclockwise by means of their respective first drive such that the individual anode or cathode layers move from their transfer point to their delivery point while avoiding a space between the first and second layer turners. In other words, the individual anode or cathode layers are...

[0023] Cathode layers are conveyed from their transfer point to their delivery point "outside" the first or second layer turner, and not between the two layer turners.

[0024] In one variant of the device, the first and second transfer points between the first conveyor and the second conveyor, respectively, and the first and second layer turners each have a first center, and the first and second delivery points each have a second center between the first and second layer turners and the stacking table, respectively. In one variant of the device, these respective first and second centers lie on a straight line that essentially at least approximately intersects a respective center of rotation of the first conveyor and the second conveyor, respectively.

[0025] In one variant of the device, the stacking table has a storage area for the individual anode and cathode layers. In one variant of the device, the stacking table has a single- or multi-axis adjustment device designed to move the storage area along or around the respective axis(es) to align it with the first or second delivery point. This allows for precise stacking of the layers on the storage area, enabling reliable production without significant losses due to defective electrode stacks.

[0026] In one variant of the device, the stacking table has at least one first and at least one second clamping finger, which are provided and configured to alternately or simultaneously engage or disengage the uppermost anode and cathode layers and / or to press the uppermost anode and cathode layers against the electrode stack on the support. In one variant, the support / stacking table is rotatable about a z-axis (vertical axis) with the clamping fingers. In one variant, the support / stacking table is positionable in the x- and / or y-direction with the clamping fingers.

[0027] In a variant of the device, the first and second layer turners are provided and configured to pick up the individual anode layers and the individual cathode layers by means of a controlled pneumatic negative pressure and to hold them during turning to the first or second delivery point. Additionally or instead, the individual anode layers and the individual cathode layers are to be delivered to the first or second delivery point by means of a controlled pneumatic positive pressure in order to stack the layers on the tray.

[0028] In one variant of the device, the first and second layer turners each have a rotatable overpressure / underpressure distributor, which is provided and configured to supply the receivers with the controlled pneumatic underpressure and / or overpressure. In one variant of the device, the first and second layer turners are provided and configured to turn only individual anode layers or only individual cathode layers toward the first or second discharge point, respectively.

[0029] In a variant of the device, each adjusting device is provided and configured to lower the storage when stacking the individual anode layers and individual cathode layers by a distance which essentially corresponds to a thickness of an individual anode layer or an individual cathode layer.

[0030] In one variant of the device, the first drive is designed as a rotary drive, which is intended and configured to rotate the receiver of the layer turner. In one variant of the device, the second drive has a rotary drive with an eccentric shaft geared to the receivers in order to radially retract and / or extend the receiver of the respective layer turner. Alternatively, the second drive has a linear drive geared to one of the receivers in order to radially retract and / or extend the receivers of the respective layer turner.

[0031] A method for producing modules or precursors of modules, in particular fuel or battery cells containing layer material, carried out for example using the device explained above, comprises, for example in the following order, the steps: conveying individual anode layers to a first transfer point for transfer to a first layer turner; conveying individual cathode layers to a second transfer point for transfer to a second layer turner; picking up respective individual anode or cathode layers at the respective first or second transfer point by means of corresponding pick-ups of a respective first or second layer turner; turning the picked up individual anode or cathode layers by a respective angle of rotation to a respective first or second delivery point; moving a stacking table back and forth with a drive between the first and second delivery points; delivering the respective individual anode or cathode layers.Cathode layer at the first or second delivery point to the stacking table when the stacking table is located at the first or second delivery point; and radially retracting the pick-up of the first and / or second layer turner when it approaches the pick-up of the other layer turner.

[0032] This approach of the pickup of one layer turner to the pickup of the other layer turner is particularly relevant in the space between the two layer turners when the pickup approaches a pickup of the other layer turner on the way from its delivery point to its transfer point or from its transfer point to its delivery point.

[0033] A first variant of the inspection device for layered material, in particular for the production of fuel or battery cells, has a first layer conveyor and a first drive and is provided and configured to pick up a respective individual anode or cathode layer from a first transfer point by means of the at least one pick-up device and to bring it to a first delivery point. In this variant, the first layer conveyor is provided and configured to deliver a respective individual anode or cathode layer from its pick-up device to the stacking table at the first delivery point when the respective at least one pick-up device is located at the first delivery point. In this variant, at least one drive is provided to align the pick-up device and the stacking table relative to one another depending on a signal based on processing of the first and / or second image acquisition.In this variant, a first image sensor between the first transfer point and the first delivery point is aligned with a first region of the first layer conveyor and is provided and configured for a first image feed when the at least one sensor of the first layer conveyor passes the first image sensor. In this variant, alternatively or cumulatively, a second image sensor between the first transfer point and the first delivery point is aligned with a second region of the first layer conveyor and is provided and configured for a second image feed when the at least one sensor of the first layer conveyor passes the second image sensor. In this variant, a stacking table is provided and configured to receive the respective individual anode or cathode layer at the first delivery point to form a layer stack.

[0034] In one variant, the first layer conveyor comprises a layer turner which is provided and configured to pick up a respective individual anode or cathode layer from the first transfer point by means of the at least one pick-up device and to rotate it by a respective angle of rotation to a first delivery point.

[0035] In one variant, the first layer conveyor comprises a layer gripper which is provided and configured to pick up a respective individual anode or cathode layer from the first transfer point and to bring it to the first delivery point by means of a pickup, for example in the form of a suction or gripping tool.

[0036] In one variant, a second layer conveyor is provided and configured to pick up a single cathode or anode layer and transport it to a second delivery point. In one variant, a first image sensor is arranged between the second transfer point and the second delivery point, aligned with a first region of the second layer conveyor, and is arranged and configured for a first image feed when the second layer conveyor passes the first image sensor. Alternatively or cumulatively, in one variant, a second image sensor is arranged between the second transfer point and the second delivery point, aligned with a second region of the second layer conveyor, and is arranged and configured for a second image feed when the second layer conveyor passes the second image sensor.

[0037] In one variant, the second layer conveyor comprises a layer turner which is provided and configured to pick up a respective individual anode or cathode layer from the second transfer point by means of the at least one pick-up device and to rotate it by a respective rotation angle to a second delivery point.

[0038] In one variant, the second layer conveyor comprises a layer gripper which is provided and configured to pick up a respective individual anode or cathode layer from the second transfer point by means of a pickup, for example in the form of a suction or gripping tool, and to bring it to the second delivery point.

[0039] In one variant, a drive is assigned to the stacking table, which is provided and configured to move the stacking table back and forth between the first and second delivery points. In one variant, the first and second layer conveyors are each provided and configured to deliver a single anode or cathode layer to the stacking table at the first or second delivery point. In one variant, at least one drive is provided to align the respective layer conveyor and / or the respective at least one layer turner or layer gripper relative to the stacking table as a function of a signal based on processing of the first and / or second image acquisition in a controller. This drive can be designed as an additional drive in the Y direction and / or as a rotary drive about the Z axis in theta for depositing.

[0040] In one variant, the first region and the second region of the at least one sensor of the layer turner are corner regions of the at least one sensor of the layer turner that are diagonally located to one another. In one variant, the first corner region and the second corner region of the at least one sensor of the layer turner are provided and configured to record a first corner or second corner of the individual anode or cathode layer. In one variant, the first and / or the second image sensor between the transfer point and the delivery point are aligned with the first or second corner region of the sensor at the time of the first or second image acquisition at an angle of approximately 30° to approximately 150°, or at an angle of approximately 60° to approximately 120°, at an angle of approximately 80° to approximately 100°, or at an angle of approximately 90°, to the surface of the sensor in the respective region.

[0041] In one variant, the first and / or second image sensor are adjustable along their optical axes for focusing and / or are movable during operation. In one variant, a white light source associated with the first and / or second image sensor is designed and configured to illuminate the anode / cathode layer for image acquisition by the first and / or second image sensor.In one variant, at least one optically active element is each assigned to the first and / or the second image sensor; wherein the optically active element is intended and configured to detect the position and / or orientation of the anode / cathode layer at one or more locations or regions before or upon arrival at the delivery point or on the way to the delivery point; and / or wherein the at least one optically active element is a lens or lens arrangement, a mirror or mirror arrangement, a prism or prism arrangement, a light guide arrangement, a surface light, a coaxial ring light, a dark field light, or combinations thereof.

[0042] In one variant, the control unit is designed and configured to determine correction values ​​from the image acquisition or acquisitions based on the position and / or orientation of the anode / cathode layer before it is picked up by the stacking table, the position and / or orientation of the stacking table, and / or the position and / or orientation of the picked up individual anode / cathode layer relative to the stacking table during the turning of the anode / cathode layer to the stacking table. In one variant, the control unit is designed and configured to take these correction values ​​into account when aligning the stacking table with the transported anode / cathode layer relative to the deposit location in positioning commands to the layer turner, the pick-up device, and / or the stacking table.In one variant, the control unit is designed and configured to take these correction values ​​for the alignment and location of the stacking table into account when picking up the anode / cathode layer in positioning commands to the layer turner, the pick-up device, and / or the stacking table in such a way that the stacking table picks up the respective anode / cathode layer in a central zero position and / or aligned with the electrode stack located at the delivery point. In one variant, the control unit is designed and configured to determine the alignment and location of the stacking table during or before picking up the anode / cathode layer by checking the position of the incoming anode / cathode layer in the image feeds immediately before the delivery point.

[0043] In one variant, the sensor is radially movable relative to its axis of rotation, and the first image sensor and / or the second image sensor is configured for a first or second image acquisition when the sensor moves radially outwards or inwards.

[0044] A variant of an inspection method in the production of modules or precursors of modules comprises the steps of: picking up an anode / cathode layer from a transfer point; bringing the anode / cathode layer from the transfer point to a delivery point; detecting the position and / or orientation of the anode / cathode layer at the layer turner by means of a first image sensor between the transfer point and the delivery point, wherein the first image sensor is aligned with a first region of the layer turner and is provided and configured for a first image acquisition when the anode / cathode layer passes the first image sensor at the layer turner.

[0045] In one variant of the inspection method, the position and / or orientation of the anode / cathode layer on the layer turner is detected by means of a second image sensor between the transfer point and the delivery point, wherein the second image sensor is aligned with a second region of the layer turner and is provided and configured for a second image acquisition when the at least one sensor of the layer turner passes the second image sensor. In one variant of the inspection method, the sensor and the stacking table are aligned relative to one another depending on a signal based on processing of the first and / or second image acquisition.In a variant of the inspection method, the respective individual anode or cathode layer is delivered from the respective at least one receiver at the delivery point onto the stacking table to form a layer stack when the respective at least one receiver is located at the delivery point.

[0046] In one variant of the inspection method, the first and / or second image recorders capture the position and / or orientation of the anode / cathode layer in x, y, z, and / or theta directions in a vertical, ± approximately 25°, top view (relative to the surface of the anode / cathode layer) as the at least one sensor of the layer turner passes the respective image recorder. In one variant of the inspection method, a light source associated with the first and / or second image recorder illuminates the anode / cathode layer for image capture by the first and / or second image recorder. In one variant of the inspection method, the first and / or second image recorders capture the entire anode / cathode layer with one image capture in order to capture its position and / or orientation in x, y, z, and / or theta directions.In one variant of the inspection method, the first and / or second image recorder captures an area, at least one corner area, two diagonal corner areas, and / or at least one corner area and at least a section of an edge of the anode / cathode layer relative to a respective specified image recorder zero point with a single image acquisition in order to capture the position and / or orientation in x, y, z, and / or theta of the anode / cathode layer. In one variant of the inspection method, the first and / or second image recorder are designed as a matrix camera or as a line scan camera, which capture the position and / or orientation in x, y, z, and / or theta of the anode / cathode layer before or upon its arrival at the delivery point or on the way to the delivery point.

[0047] In one variant of the inspection method, correction values ​​are determined from the position and / or orientation in x, y, z, and / or theta of the anode / cathode layer after it has been picked up by the at least one pick-up device of the layer turner, the position and / or orientation in x, y, z, and / or theta of the stacking table, and / or the position and / or orientation in x, y, z, and / or theta of the picked-up individual anode / cathode layer during turning of the anode / cathode layer to the stacking table. In one variant of the inspection method, these correction values ​​are taken into account when aligning the pick-up device of the layer turner with the transported anode / cathode layer relative to the stacking table at the delivery point in x, y, z, and / or theta.In a variant of the inspection method, these correction values ​​in x, y, z, and / or theta are taken into account when aligning the pickup of the layer turner in such a way that the anode / cathode layer is picked up by the stacking table in a central zero position and / or aligned.

[0048] With the first type of inspection proposed here during cell production using the first and second image sensors (cameras), the electrode layers are stacked as precisely as possible. This allows the finished fuel or battery cells to achieve the highest possible efficiency. The less precisely the electrode layers are stacked, the lower the efficiency. The inspection proposed here records the exact position of the electrode layer (during turning, i.e.) immediately before stacking. From this position, a measurement is determined and applied to correct the relative position between the stacking table and the sensor of the layer turner. This ensures the greatest possible accuracy in depositing each electrode layer on the growing stack.This approach avoids production waste and allows higher efficiencies of the finished fuel or battery cells to be achieved.

[0049] In one variant, the first and second corner areas of the inspected electrode or layer turner are different. In one variant, a stacking table is provided and configured to receive the respective individual anode or cathode layer at the first delivery point to form a layer stack.

[0050] In one variant, the first corner area and the second corner area of ​​the first layer turner are diagonally located areas of the first layer turner. In one variant, the first corner area and the second corner area are two (approximately equal) surface areas of the at least one pickup of the first layer turner when this pickup is located on the path between the first transfer point and the first delivery point.

[0051] In one variant, the first corner region and the second corner region of the at least one receiver of the first layer conveyor are provided and configured to receive a first corner and a second corner, respectively, of the individual anode or cathode layer.

[0052] In one variant, the first and / or second image sensors between the first / second transfer point and the first / second delivery point are aligned with the first or second corner region of the first / second layer conveyor at the time of the first and / or second image acquisition at an angle of approximately 25° to approximately 150°, or at an angle of approximately 60° to approximately 120°, or at an angle of approximately 80° to approximately 100°, or at an angle of approximately 90° (relative to the area of ​​the anode / cathode layer or the first / second sensor).

[0053] In inspection variants, the first and / or second camera captures the position and / or orientation of the anode / cathode layer (relative to the surface of the anode / cathode layer or the first / second image sensor) in a vertical, ± approximately 25° to approximately ± 30°, top view of the anode / cathode layer as it passes the respective image sensor. In inspection variants, the first and / or second image sensor are adjustable along their optical axes for focusing and / or movable during operation.

[0054] In inspection variants, a white light source associated with the first and / or second image sensor illuminates the anode / cathode layer for image acquisition by the first and / or second image sensor, respectively. In inspection variants, the first and / or second camera captures the entire anode / cathode layer with a (single) image acquisition to determine its position and / or orientation.

[0055] In variants of the inspection method, the first and / or the second camera captures with a single image acquisition an area, at least one corner area, two diagonal corner areas, and / or at least one corner area and at least a portion of an edge of the anode / cathode layer in order to capture the position and / or orientation of the anode / cathode layer.

[0056] In variants of the inspection, the first and / or the second camera are designed as a matrix or line scan camera, which detects the position and / or orientation of the anode / cathode layer during turning towards the stacking table.

[0057] In inspection variants, correction values ​​are determined from the position and / or orientation of the anode / cathode layer on the pick-up during the turning of the anode / cathode layer toward the delivery point on the stacking table. These correction values ​​are taken into account in inspection variants when aligning the stacking table relative to the pick-up with the transported anode / cathode layer at the delivery point.

[0058] In variants of the inspection, these correction values ​​are taken into account when aligning the stacking table for picking up the anode / cathode layer by the stacking table in such a way that the anode / cathode layer is picked up by the stacking table in a central zero position and / or aligned.

[0059] During inspection, in one variant, the stacking device can be positioned relative to the anode / cathode layer before / during its placement on the stacking table using the calculated correction values ​​so that the anode / cathode layer is picked up by the stacking table in a zero position. For this purpose, the position and / or orientation of the stacking table relative to the anode / cathode layer / layer conveyor at the delivery point can be corrected. Likewise, after picking up during transport, the stacking table can be positioned according to the correction values ​​from the image acquisition so that the anode / cathode layer is deposited by the stacking table at the delivery point on the electrode stack located there, appropriately and with minimal or no further corrective movement. This can be carried out very quickly and with high precision. A device such as the one explained below is suitable for inspection.

[0060] In variants of the inspection, a (white) light source assigned to the camera(s) is intended and configured to illuminate the anode / cathode layer for image acquisition by the respective camera.

[0061] In variants of the inspection, at least one optically active element is connected upstream of one or all cameras, designed and configured to detect the position and / or orientation of the anode / cathode layer at one or more locations or areas prior to being picked up by the pickup or upon arrival at the delivery point or on the way to the delivery point. In variants of the device, the at least one optically active element is a lens or lens arrangement, a mirror or mirror arrangement, a prism or prism arrangement, a fiber optic arrangement, a surface light, a coaxial ring light, a dark-field light, or combinations thereof.In variants of the inspection, a control unit is intended and configured to determine correction values ​​from the image acquisition and / or data from the detection device and / or the first and / or the second camera from the position and / or orientation of the anode / cathode layer before it is picked up by the stacking table, the position and / or orientation of the stacking table, and / or the position and / or orientation of the picked up individual anode / cathode layer relative to the stacking table during turning of the anode / cathode layer to the stacking table.

[0062] In inspection variants, the control unit is designed and configured to take these correction values ​​into account when aligning the stacking table with the transported anode / cathode layer relative to the delivery point in positioning commands to the layer turner and / or its pick-up device and / or the stacking table. In inspection variants, a control unit is designed and configured to take these correction values, the orientation and location of the stacking table into account in positioning commands when picking up the anode / cathode layer in such a way that the stacking table picks up the respective anode / cathode layer in a central zero position and / or aligned with the electrode stack located at the delivery point.

[0063] By checking the position of the incoming anode / cathode layer immediately before the discharge point, the alignment and location of the stacking table can be precisely determined during or before picking up the anode / cathode layer. This allows the stacking table to precisely and accurately pick up the anode / cathode layer to form a stack of electrode layers that is precisely aligned in both vertical extension and angular position around the vertical axis.

[0064] An inspection device for layer material, in particular for the production of fuel or battery cells, comprises in a second variant a first layer conveyor which has at least one pick-up and a first drive and is provided and configured to pick up a respective individual anode or cathode layer by means of the at least one pick-up from a first transfer point and to bring it to a first delivery point. In one variant, a stacking table is provided and configured to pick up the respective individual anode or cathode layer from the pick-up at the first delivery point to form a layer stack. In one variant, the first layer conveyor is provided and configured to deliver a respective individual anode or cathode layer from its pick-up to the stacking table at the first delivery point when the pick-up is located at the first delivery point.In one variant, a third image sensor is directed at an area comprising a top edge of a layer stack located on the stacking table in a side view of the layer stack, which includes a connection tab of an anode or cathode layer located at the top of the layer stack, and is provided and configured for a third image acquisition before and / or after the anode or cathode layer is placed on the stacking table. In one variant, a controller is provided and configured to indicate the (un)usability of the layer stack depending on a signal based on processing of the third image acquisition. The stack can then be (automatically) removed.

[0065] In one variant, the layer conveyor comprises a layer turner which is provided and configured to pick up a respective individual anode or cathode layer from the first transfer point by means of the at least one pick-up device and to rotate it by a respective rotation angle to a first delivery point.

[0066] In a further variant, the layer conveyor comprises a layer gripper which is provided and configured to pick up a respective individual anode or cathode layer from the first transfer point and to bring it to the first delivery point by means of the one pickup, for example in the form of a suction or gripping tool.

[0067] In a further variant, the inspection device comprises a second layer conveyor, which is provided and configured to receive a single cathode or anode layer and transport it to a second delivery point. In one variant, a drive is assigned to the stacking table, which drive is provided and configured to move the stacking table back and forth between the first and second delivery points. In one variant, the first and second layer conveyors are each provided and configured to deliver a single anode or cathode layer to the stacking table at the first and second delivery points, respectively.In one variant, at least one drive is provided to align the respective layer conveyor and / or a respective at least one layer turner or layer gripper relative to the stacking table in dependence on a signaling based on a processing of the first and / or second image feed in a controller.

[0068] In one variant, the second layer conveyor comprises a layer turner which is provided and configured to pick up a respective individual anode or cathode layer from the second transfer point by means of the at least one pick-up device and to rotate it by a respective rotation angle to a second delivery point.

[0069] In one variant, the second layer conveyor comprises a layer gripper which is provided and configured to pick up a respective individual anode or cathode layer from the second transfer point by means of a pickup, for example in the form of a suction or gripping tool, and to bring it to the second delivery point.

[0070] In one variant, a first third region and a second third region of the layer stack each comprise a connection tab of the respective uppermost anode or cathode layer on the stacking table at the first or second delivery point. In one variant, one or two third image sensors are arranged on a first side of the inspection device, and one or two third image sensors are arranged on a second side of the inspection device. In one variant, one or more third image sensors are arranged stationary relative to the movable stacking table. In one variant, one or more third image sensors are connected to the stacking table in order to be movable with it.

[0071] In one variant of the inspection device, the at least one third image sensor is adjustable for focusing along its optical axis and / or movable during operation. In one variant, a light source assigned to the third image sensor is intended and configured to illuminate the anode / cathode layer for image acquisition by the third image sensor. In one variant, at least one optically active element is assigned to the at least one third image sensor. In one variant, the optically active element is intended and configured to make the connection tab of an anode or cathode layer located on top of the layer stack visible in the third image acquisition after the anode or cathode layer has been deposited on the layer stack.In one variant, the at least one optically active element is a lens or lens arrangement, a mirror or mirror arrangement, a prism or prism arrangement, a light guide arrangement, a surface light, a coaxial ring light, a dark-field light, a transmitted-light light, or a combination thereof. With transmitted-light light, the light is directed opposite to the viewing direction of the image sensor. The light does not pass through the material of the connection tab, as is the case, for example, with a semiconductor chip with IR light.

[0072] In one variant of the inspection device, the transmitted light is arranged on the opposite side of the third image sensor, beyond the position of the connecting flag on the stacking table, and is configured to place the connecting flag in the light beam path. This allows processing of the third image acquisition to detect a lifting of the connecting flag if the top edge of the connecting flag is not substantially horizontal (< ± 10° relative to the horizontal or the optical axis of the respective third image sensor) or aligned flush with the electrode and / or causes an interfering contour.

[0073] In a variant of the inspection device, the coaxial ring illumination is arranged on the side of the third image sensor on this side of the position of the connection flag on the stacking table and is designed to take the connection flag into the light beam path in order to detect, by means of processing the third image acquisition, a lifting of the connection flag in that the uppermost edge of the connection flag is not oriented (< ± 10° relative to the horizontal or to the optical axis of the respective third image sensor), or is aligned flat with the electrode and / or causes an interfering contour.

[0074] A second inspection method in the production of modules or precursors of modules comprises the steps of: picking up an anode / cathode layer at a first transfer point and bringing the anode or cathode layer from the first transfer point to a first delivery point; delivering the respective individual anode or cathode layer at the delivery point onto a stacking table to form a layer stack; directing a third image sensor onto an area comprising an upper edge of a layer stack located on the stacking table in a side view, wherein the area comprises a connection tab of an anode or cathode layer located on top of the layer stack; and wherein a third image is taken by means of the third image sensor after the anode or cathode layer has been...Cathode layer is deposited on the stacking table; and indicating a (un)usability of the layer stack in dependence on a signaling based on processing of the third image acquisition.In one variant, the inspection method further comprises the steps of: adjusting the at least one third image sensor for focusing along its optical axis and / or moving the at least one third image sensor for focusing along its optical axis during operation; and / or illuminating the anode / cathode layer for a third image acquisition by the at least one third image sensor by means of a light source assigned to the at least one third image sensor; and / or assigning at least one optically active element to the at least one third image sensor; wherein the optically active element is intended and configured to make the connection tab of an anode or cathode layer located on top of the layer stack visible in a side view in the third image acquisition, after the anode or cathode layer has been...Cathode layer is deposited on the layer stack; and / or wherein the at least one optically active element is a lens or lens arrangement, a mirror or mirror arrangement, a prism or prism arrangement, a light guide arrangement, a surface light, a coaxial ring illumination, a dark field illumination, a transmitted light illumination, or a combination thereof.

[0075] In one variant, the inspection method further comprises the steps of: arranging the transmitted light illumination on the opposite side of the at least one third image sensor, beyond the position of the connection flag on the stacking table, and setting up the at least one third image sensor to take the connection flag into the light beam path; in order to detect, by means of processing the third image acquisition, a lifting of the connection flag in which the uppermost edge of the connection flag is not aligned (< ± 10° relative to the horizontal or to the optical axis of the respective third image sensor), or is flush with the electrode and / or causes an interfering contour.

[0076] In one variant, the inspection method further comprises the steps of: arranging the coaxial ring illumination on the side of the at least one third image sensor, this side of the position of the connection flag on the stacking table, and setting up the at least one third image sensor to take the connection flag into the light beam path; detecting, by means of processing the third image acquisition, a lifting of the connection flag in that, in the third image acquisition, the uppermost edge of the connection flag is not oriented horizontally (< ± 10° relative to the horizontal or to the optical axis of the respective third image sensor), or flush with the electrode and / or causes an interfering contour.The further, second inspection during cell production proposed here with at least one third image sensor (camera) also checks the most even alignment possible of the connection tab of the uppermost electrode layer to the connection tab(s) below.

[0077] This additional inspection should be performed alternatively or in addition to the first inspection. This prevents potential failure or loss of efficiency of the finished fuel or battery cells. When stacking an electrode layer, it is possible that its terminal lugs stand up, bulge, or bend, creating the risk of them being kinked, for example, when stacking the next electrode layer of the same polarity. If the terminal lugs are not fully connected to one another, the efficiency of the fuel or battery cell decreases. If a terminal lug is bent over the separating film and comes into contact with the counter electrode layer, this can cause a short circuit in the cell. The inspection proposed here records the precise orientation of the terminal lugs of each electrode layer immediately after stacking.From this position, a measurement is determined and applied to correct the relative position between the stacking table and the pick-up of the layer turner. This ensures that the placement of each electrode layer on the growing stack is as accurate as possible compared to the electrode stack already on the stacking table. This results in less waste and greater efficiency.

[0078] A further, third inspection of the cell production comprises, for example in the following order, the steps: providing a separated anode / cathode layer; conveying the anode / cathode layer to a delivery point; stacking the conveyed anode / cathode layer at the delivery point onto a stacking table; detecting an electrode stack grown around the stacked anode / cathode layer at the delivery point in at least one side view of a corner and / or a vertical edge of the electrode stack at the delivery point; and checking the orientation and / or position of the or each stacked anode / cathode layer relative to the remaining electrode stack grown at the delivery point.

[0079] This can be achieved with an inspection device for layer material, in particular for the production of fuel or battery cells, in a third variant, in which: a first layer conveyor is provided and configured to receive a respective individual anode or cathode layer and bring it to a first delivery point; a stacking table is provided and configured to receive the respective individual anode or cathode layer at the first delivery point to form a layer stack; the first layer conveyor is provided and configured to deliver a respective individual anode or cathode layer to the stacking table at the first delivery point;and a fourth image sensor is aligned with a fourth region of the layer stack of anode and cathode layers in a planar side view of the layer stack and is provided and configured for image acquisition after the anode or cathode layer has been placed on the layer stack on the stacking table, wherein the fourth region comprises a corner of an anode or cathode layer located on top of the layer stack and / or a vertical edge of the layer stack; and / or a fifth image sensor is aligned with a fifth region of the layer stack of anode and cathode layers in a planar side view of the layer stack and is provided and configured to capture images after the anode or cathode layer on the layer stack has been placed on the stacking table, wherein the fifth region comprises a corner of an anode or cathode layer located at the top of the layer stack and / or a vertical edge of the layer stack;The fourth region or the fifth region of the anode or cathode layer comprise regions of the layer stack of anode and cathode layers that are adjacent or diagonal to one another in the layer area in a respective side view of the layer stack. The inspection device can be configured to indicate the usability or unusability of the layer stack depending on a signal based on processing an image capture of the fourth or fifth image sensor.

[0080] The fourth and fifth areas are, in a variant, different regions of the layer stack on the stacking table.

[0081] In one variant, the layer conveyor comprises a layer turner which is provided and configured to pick up a respective individual anode or cathode layer from the first transfer point by means of at least one pickup and to rotate it by a respective rotation angle to the first delivery point.

[0082] In one variant, the layer conveyor comprises a layer gripper, which is intended and configured to pick up a respective individual anode or cathode layer from the first transfer point by means of a pickup, for example in the form of a suction or gripping tool, and to bring it to the first delivery point. In one variant, the fourth image sensor and / or the fifth image sensor are adjustable for focusing along their optical axis and / or movable during operation. In one variant, a light source assigned to the fourth image sensor and / or the fifth image sensor is intended and configured to illuminate the anode / cathode layer for a fourth image capture or a fifth image capture by the fourth image sensor or fifth image sensor, respectively. In one variant, at least one optically active element is assigned to the fourth image sensor or fifth image sensor, respectively.In one variant, the optically active element is intended and configured to make the corner of the anode or cathode layer located on top of the layer stack and / or the vertical edge of the layer stack recognizable in the fourth image acquisition or the fifth image acquisition, respectively, after the anode or cathode layer has been deposited on the layer stack. In one variant, the at least one optically active element is a lens or lens arrangement, a mirror or mirror arrangement, a prism or prism arrangement, a light guide arrangement, a surface light, a coaxial ring illumination, a dark-field illumination, a transmitted-light illumination, or a combination thereof.

[0083] In one variant, the transmitted light illumination is arranged on the opposite side of the fourth image sensor or the fifth image sensor, beyond the position of the corner of the anode or cathode layer located at the top of the layer stack and / or the vertical edge of the layer stack, and is configured to include the corner and / or the vertical edge in the light beam path. In one variant, a lifting, displacement, or rotation of the anode or cathode layer can be detected by processing the fourth image acquisition or the fifth image acquisition, in that the corner and / or the vertical edge of the anode or cathode layer located at the top of the layer stack causes an interfering contour in the image acquisition.

[0084] In one variant, the coaxial ring illumination is arranged on the side of the fourth image sensor or the fifth image sensor on this side of the position of the corner of the anode or cathode layer located at the top of the layer stack and / or the vertical edge of the layer stack, and is configured to include the corner and / or the vertical edge in the light beam path. In one variant, by processing the fourth image acquisition or the fifth image acquisition, a lifting, displacement, or rotation of the anode or cathode layer can be detected, in that the corner and / or the vertical edge causes an interfering contour in the image acquisition.In one variant, a first fourth region and a first fifth region of the layer stack each comprise a corner of a first, substantially horizontally oriented edge of the anode or cathode layer located on top of the layer stack and / or a vertical edge of the layer stack on the stacking table and / or a second fourth region and a second fifth region of the layer stack each comprise a corner of a second edge of the anode or cathode layer located on top of the layer stack and / or a vertical edge of the layer stack on the stacking table. In one variant, one or more fourth or fifth image sensors are arranged stationary relative to the movable stacking table. In one variant, one or more fourth or fifth image sensors are connected to the stacking table in order to be movable therewith.

[0085] In one variant, a third inspection method in the production of modules or precursors of modules comprises the steps of: picking up an anode / cathode layer by means of at least one pick-up device from a transfer point; delivering the respective individual anode or cathode layer from the respective at least one pick-up device at a delivery point onto a stacking table to form a layer stack when the respective at least one pick-up device is located at the delivery point; directing a fourth image pick-up device onto a fourth region of the layer stack comprising anode and cathode layers in a planar side view of the layer stack, wherein the fourth region comprises a corner of an anode or cathode layer located on top of the layer stack and / or a vertical edge of the layer stack; and performing a fourth image capture after the anode or cathode layer has been placed on the layer stack on the stacking table; and / or setting a fifthImage sensor onto a fifth region of the layer stack of anode and cathode layers in a side view of the layer stack, wherein the fifth region comprises a corner of an anode or cathode layer located on top of the layer stack and / or a vertical edge of the layer stack; and / or performing a fifth image acquisition after the anode or cathode layer has been placed on the layer stack on the stacking table; and / or wherein the fourth region or the fifth region of the anode or cathode layer comprise regions of the layer stack of anode and cathode layers that are adjacent to or diagonally to one another in the layer area in a respective side view of the layer stack; and indicating a usability of the layer stack depending on a signaling based on processing of the fourth or the fifth image acquisition. In one variant, the inspection procedure comprises the following steps: Setting the fourth or fifth image sensorfor focusing along its optical axis and / or moving the respective image sensor for focusing along its optical axis during operation. In one variant, the fourth or fifth area is illuminated for the fourth or fifth image acquisition by the respective image sensor using a light source assigned to the fourth or fifth image sensor. In one variant, at least one optically active element is assigned to the fourth or fifth image sensor in order to make the corner of the anode or cathode layer located on top of the layer stack and / or the vertical edge of the layer stack visible in the fourth or fifth image acquisition after the anode or cathode layer has been placed on the layer stack. In one variant, the at least one optically active element is a lens or lens arrangement, a mirror or mirror arrangement, a prism or prism arrangement, a light guide arrangement,an area light, a coaxial ring light, a darkfield light, a transmitted light, or a combination thereof.

[0086] In one variant, the inspection method comprises the steps of: arranging the transmitted light illumination on the opposite side of the fourth or fifth image sensor beyond the position of the corner of the anode or cathode layer located at the top of the layer stack and / or the vertical edge of the layer stack on the stacking table, and setting up the transmitted light illumination to include the corner and / or the vertical edge of the layer stack in the light beam path. In one variant, by processing the fourth or fifth image acquisition, detection of at least partial lifting, displacement, or rotation of the anode or cathode layer located at the top of the layer stack occurs, in that the top corner and / or the vertical edge causes an interfering contour.

[0087] In one variant, the inspection method comprises the steps of: arranging the coaxial ring illumination on the side of the fourth or fifth image sensor on this side of the position of the corner of the anode or cathode layer located on top of the layer stack and / or the vertical edge of the layer stack on the stacking table, and for this purpose setting up the transmitted light illumination to include the corner and / or the vertical edge of the layer stack in the light beam path. In one variant, by processing the fourth or fifth image acquisition, detection of at least partial lifting, displacement or twisting of the anode or cathode layer located on top of the layer stack takes place, in that the top corner and / or the vertical edge causes an interfering contour. In one variant, one or more fourth or fifthfifth image sensor oriented at an angle of approximately ± 5° to approximately ± 25° to a longitudinal or transverse edge of the anode or cathode layer located at the top of the layer stack, for example ± 13°.

[0088] In one variant, the inspection method during the production of modules or precursors of modules further comprises the steps of: picking up an anode / cathode layer by means of at least one second pick-up device of a second layer turner from a second transfer point; delivering the respective individual anode or cathode layer from the respective at least one pick-up device at a second delivery point onto the stacking table to form the layer stack when the respective second pick-up device is located at the delivery point; directing a fourth image sensor onto a fourth region of the layer stack comprising anode and cathode layers in a planar side view of the layer stack, wherein the fourth region comprises a corner of an anode or cathode layer located on top of the layer stack and / or a vertical edge of the layer stack;and performing a fourth image acquisition after the anode or cathode layer has been placed on the layer stack on the stacking table; and / or directing a fifth image sensor onto a fifth region of the layer stack of anode and cathode layers in a planar side view of the layer stack, wherein the fifth region comprises a corner of an anode or cathode layer located on top of the layer stack and / or a vertical edge (HK) of the layer stack; and performing a fifth image acquisition after the anode or cathode layer has been placed on the layer stack on the stacking table; and / or wherein the fourth region or the fifth region of the anode or cathode layer comprise regions of the layer stack of anode and cathode layers that are adjacent or diagonal to one another in the layer area in a respective side view of the layer stack;and indicating a (un)usability of the layer stack depending on a signaling based on processing of the fourth or fifth image acquisition;

[0089] This further, third inspection shall be carried out alternatively or in addition to the first and / or second inspection.

[0090] This procedure allows for precise determination of the position of the top layer relative to the other layers of the electrode stack. This inspection becomes increasingly important with increasing electrode stack height, since incorrect placement of the top layer without further correction will inevitably result in the rejection of the electrode stack. The inspection becomes increasingly more accurate with increasing electrode stack height, as the geometric areas to be measured (corners or vertical edges of the electrode stack) can be recorded and evaluated more easily and precisely.

[0091] In a variant of the third inspection, this also allows for the calculation of more precise correction values ​​when placing the next layer on the electrode stack. Overall, this approach, with its precise position verification, significantly reduces the risk of short circuits, for example, in fuel or battery cells.

[0092] This is also evident from the fact that previous solutions only deposit the layers with an accuracy of about ± 0.5 mm, while the solution presented here, to reduce rejects and improve efficiency, allows an accuracy of ± 0.1 mm and more when depositing the anode / cathode layers on the electrode stack.

[0093] In one variant of the process, four matrix cameras are used, which (as seen from the side) are directed at all four corners / (vertical) edges of the electrode stack at the deposition point. In one variant of the process, incident light, backlight, or darkfield illumination is provided using respective light sources. This allows the relevant areas of the various anode / cathode layers to be clearly identified. In another variant of the process, the beam path of the third camera is guided using mirrors or prisms to adapt to spatial conditions.

[0094] In one variant of the process, a matrix camera is used with a field of view of the electrode stack from the side, which captures the entire electrode stack in a single image, or two matrix cameras, each capturing one of two corners of the electrode stack from the side, or four matrix cameras, each capturing all four corners of the electrode stack from above, and which are directed from the side onto the electrode stack at the deposition point. Here, too, in one variant, the beam path of the cameras is guided to adapt to spatial conditions using appropriate arrangements of mirrors or prisms, etc. For illumination, a coaxial (red) illumination and / or a (white) point source is used for each of the cameras. This allows for very precise detection that the anode / cathode layers are always deposited in the correct place and in the correct orientation on the electrode stack.

[0095] In a variant of the process, the movements of the lifting device with the respective workpiece carrier along the vertical axis (z-axis) and their inaccuracies are also taken into account. Before the anode / cathode layers are deposited to form the electrode stack, the x and y positions of the workpiece carrier are recorded with the cameras at various z-heights. This way, the cameras can be used to check during the depositing of the anode / cathode layers whether the anode / cathode layers have been stacked in the correct x and y position, which corresponds to the respective z-position of the workpiece carrier on the lifting device. The accuracy in the direction of rotation around the vertical axis (in theta) when picking up the anode / cathode layers with the stacking device can also be corrected in this way for later precise stacking of the anode / cathode layers of the electrode stack.

[0096] In a variant of the device, a control unit is intended and configured to determine a position of a stacked anode / cathode layer in relation to the remaining layers of the electrode stack by checking the position / rotation / offset of the individual anode / cathode layers relative to one another after the anode / cathode layers have been placed on the electrode stack, and / or wherein the control unit is intended and configured to determine an offset of the individual anode / cathode layers relative to one another using an image acquisition of at least one third camera from at least one (vertical and / or transverse) edge of the electrode stack.In a variant of the device, the control unit is intended and configured to check a received image capture by corner / edge search to determine whether one or more of the anode / cathode layers of the electrode stack are above or below the other anode / cathode layers, and / or whether an accuracy was maintained when stacking the anode / cathode layers.

[0097] In one variant of the device, the control unit is designed and configured to determine, from the image acquisition of alternating anode layers and cathode layers of the electrode stack, different dimensions with a stepped (vertical) edge in the z-direction in the side view, and to examine the stacked anode layers and cathode layers for their shape and / or dimensions. In one variant of the device, the control unit is designed and configured to examine the stacked anode layers and cathode layers to determine the deviation by which each individual layer is above or below the other anode or cathode layers of the electrode stack.In a variant of the device, the control unit is designed and configured to examine an image acquisition to determine the deviation in the z-direction (vertical axis) with which the various anode / cathode layers form steps in the electrode stack.

[0098] In a variant of the device, the control unit is intended and configured to receive image captures from at least two third cameras, which include side views of corners and / or their edges in the vertical axis (z-axis) of the electrode stack at the deposition location, in order to examine the anode layers and cathode layers stacked on top of one another to determine the deviation in the x or y direction (transverse, longitudinal) with which each individual layer is above or below the other anode or cathode layers of the electrode stack in the longitudinal and / or transverse direction of the layers; and / or to examine the deviation in the z-direction (vertical axis) with which the various anode / cathode layers form steps in the electrode stack.

[0099] In a variant of the device, the at least two cameras are aligned to a (vertical) edge of the electrode stack, and / or (white) spotlights illuminate the desired position on the electrode stack to illuminate the respective edge of the electrode stack.

[0100] In a variant of the device, the control unit is intended and configured to receive image captures from at least four cameras, which contain the four corners of the electrode stack at the deposition location as seen from the side, in order to determine a position of the uppermost stacked anode / cathode layer in relation to at least one underlying layer of the electrode stack by checking the position / rotation / offset of the individual anode / cathode layers relative to one another after the anode / cathode layers have been deposited on the electrode stack by means of an image capture from each of the four cameras.

[0101] In a variant of the device, the control unit is designed and configured to take into account movements of the lifting device with the respective workpiece carrier along the vertical axis (z-axis) and their inaccuracies by capturing the x- and y-positions of the workpiece carrier at various z-heights with the third cameras before the start of the deposition of the anode / cathode layers to form the electrode stack, the corresponding data are stored in a data memory for comparison with the x- and y-positions of the workpiece carrier at various z-heights during the deposition of the anode / cathode layers in order to check whether the anode / cathode layers have been stacked within the accuracy at the x- and y-position corresponding to the respective z-position of the workpiece carrier on the lifting device,and / or to correct the orientation in the direction of rotation around the z-axis (vertical axis) (in theta) when picking up and / or depositing the anode / cathode layers.

[0102] The procedures and devices described above allow a significant reduction in the risk of short circuits in the module thus formed, which also leads to an increase in the overall quality and efficiency of the finished fuel or battery cell.

[0103] Overall, the device and method described above allows an accuracy of ± 0.1 mm or better at high stack throughput.

[0104] Above, process aspects are presented in device terms and vice versa. Both the process aspects and the device aspects serve to explain the arrangement and its operation.

[0105] Short description of the characters

[0106] Further features, properties, and advantages of the devices and methods can be found in the following description in conjunction with the drawings. Possible modifications will become clear to a person skilled in the art from the following description, which refers to the accompanying drawings. The figures schematically show the devices discussed here and explain their operation. In the figures, identical or analogous parts are not individually provided with reference numerals.

[0107] Here we show:

[0108] Fig. 1 shows a device for producing modules or precursors of modules in a schematic front view;

[0109] Fig. 2 shows a schematic side view of one of the two layer turners of a device for producing modules or precursors of modules in a further variant; Fig. 3 shows a perspective side view of a layer turner with a stacking table on which a layer stack is located;

[0110] Fig. 4a and 4b show a plan view of the storage of a stacking table on which a stack of layers is located, at the first and second storage locations with a configuration of the image sensors for the second inspection;

[0111] Figs. 5a and 5b show a plan view of the placement of a stacking table on which a stack of layers is located at the first and second placement locations with a configuration of the image sensors for the third inspection;

[0112] Fig. 6 is a plan view of the placement of a stacking table on which a stack of layers is located at the first and second placement locations with a configuration of the image sensors for the second inspection; and

[0113] Fig. 7 is a plan view of the placement of a stacking table on which a stack of layers is located at the first and second placement locations with a further configuration of the image sensors for the third inspection.

[0114] Detailed Description of Variants of the Devices and Methods Figure 1 schematically illustrates a device 100 for producing modules or module precursors. Here, the device 100 is explained using the example of the production of fuel or battery cells containing layer material and / or fluid.

[0115] In the device 100, a first conveyor 110 serves to convey individual anode layers AL to a first transfer point U1 for transfer to a first layer turner 150. A second conveyor 120 serves to convey individual cathode layers KL to a second transfer point U2 for transfer to a second layer turner 200.

[0116] As illustrated in Fig. 1, the first conveyor 110 and the second conveyor 120 are arranged at the same level, adjacent to, and spaced from one another in the upper region of the device 100. The first conveyor 110 and the second conveyor 120 are configured here as belt conveyors, with their respective undersides 112, 122 facing the first and second layer turners 150, 200, respectively. Thus, the first conveyor 110 and the second conveyor 120 can convey the individual anode layers AL and the individual cathode layers KL by their undersides 112, 122 to the first and second transfer points U1, U2, respectively. In particular, the first conveyor 110 and the second conveyor 120 each have a controlled vacuum conveyor belt with suction openings 114, 124 in order to pick up the individual anode layers AL and the individual cathode layers KL by means of controlled pneumatic vacuum p- and to hold them during conveyance to the first and second transfer points Ul, U2, respectively.By means of an optionally controlled pneumatic overpressure p++, the individual anode layers AL or the individual cathode layers KL can be delivered in a controlled and rapid manner at the first or second transfer point Ul, U2 to the first or second layer turner 150, 200. Alternatively, the pneumatic vacuum p- of the first or second conveyor 110, 120 can be reduced or eliminated at the first or second transfer point Ul, U2. The first conveyor 110 can receive the individual anode layers AL from a stack or a third conveyor (not shown), in particular a vacuum conveyor belt. The second conveyor 120 can receive the individual cathode layers KL from a stack or a fourth conveyor (not shown), in particular a vacuum conveyor belt.

[0117] The first and second layer turners 150, 200 each have four approximately rectangular, flat pick-ups 156, 206 and each have a first drive 300 (see Fig. 2). Using the pick-ups 156, 206, a respective individual anode or cathode layer AL, KL is picked up flatly at the respective first or second transfer point U1, U2 from the first or second conveyor 110, 120. These pick-ups 156, 206 are indirectly mounted for radial displacement on a rotatably mounted shaft 160, 210. This shaft 160, 210 rotates the respective pick-ups 156, 206 by means of the first drive 300 through a respective rotation angle RW—here 180°—to a respective first or second delivery point A1, A2. The first drive 300 rotates the layer turners 150, 200 in total.Thus, the first and second layer turners 150, 200, with their respective multiple pick-ups, are configured to pick up the individual anode or cathode layers AL, KL when the pick-ups rotate successively past the respective transfer point Ul, U2 and the respective delivery point Al, A2 continuously or intermittently, and in the process pick up or deliver the respective individual anode or cathode layer AL, KL. The first and second layer turners 150, 200 rotate clockwise or counterclockwise by means of their respective first drive 300 such that the individual anode or cathode layers AL, KL move from their transfer point Ul, U2 to their delivery point Al, A2, avoiding the space R between the first and second layer turners 150, 200. It is evident that the first and second layer turners 150, 200 essentially have the same structure, same function and / or same dimensions.

[0118] An endless separator belt (not shown in detail) is guided from above between the two conveyors 110, 120 into and through the space R and exits at the lower end of the space R from a gap between two rotatably mounted rollers. The separator belt is folded into a Z-shape on the stacking table, and the anode and cathode layers are separated from each other by the separator.

[0119] The first and second layer turners 150, 200 have (see Fig. 1) an arrangement of linear drives 351 arranged on slewing rings for the pickups 156, 206 as a second drive 350, of which a linear drive 351 is gear-coupled to one of the pickups 156, 206 in order to radially retract and / or extend the pickups of the respective layer turner 150, 200.

[0120] In a further variant, the first and second layer turners 150, 200 each have a second drive 350 (see Fig. 2) for the pick-ups 156, 206. This second drive 350 serves to radially retract the respective pick-up 156, 206 when—after the respective layer has been deposited on the stacking table 400—the pick-up of the other layer turner approaches the space between the two layer turners on its way to its transfer point U1, U2. The second drive 350 rotates the tube, the connected turntable, and the pick-ups 156, 206 around the rotation center DZ. Due to the coupling to an eccentric, explained below, the pick-ups 156, 206 are moved radially. The first drive 300 is a controlled servo motor that rotates the layer turner as a whole to rotate the pickup around a rotation center of the layer turner. The second drive 350 is arranged in the manner shown in Fig.2, a servo motor is controlled independently of the first rotary drive 300 and is geared to the inner shaft 160, 210, designed as an eccentric shaft. This eccentric shaft is provided with eccentrics 372, 374 for each of the pickups to radially retract and extend the pickups 156, 206 of the respective layer turner 150, 200. For this purpose, each eccentric 372, 374 is enclosed by a needle bearing, which carries a ring 376, 378 on the outside, which is hinged to the respective pickup 156, 206. When the shaft 160, 210 rotates, the respective eccentric 372, 374 causes the sensors 156, 206, which are guided in radially oriented linear guides 380, 382, ​​to move outwards or inwards.In particular, a radial retraction of the pickups of the first and / or the second layer turner occurs when the pickup approaches a pickup of the other layer turner on the way from its delivery point to its transfer point or from its transfer point to its delivery point.

[0121] The second drive 350 rotates the respective inner shaft 160, 210 and causes the radial extension and retraction of the pickups. In particular, the second drive 350 also serves to ensure that the first and second layer turners radially extend the respective pickups when the pickups approach the respective first or second transfer point U1, U2 and the first or second delivery point A1, A2. Overall, in this variant, the pickups of the two layer turners each move approximately on an approximate, stationary ellipse, whose major axes extend from the center of the respective transfer point to the center of the respective delivery point, and whose minor axes do not touch each other. In Fig. 1, this ellipse E is illustrated by a dash-dotted line on the second layer turner 200. It is clear that this movement does not have to be symmetrical, since the pickup remote from space R is radially extended further than the pickup located in space R.

[0122] The first drive 300 and the second drive 350 are connected via a combined angular and axial gear 390 and independently rotate the inner shaft 160, 210 or all pickups of a layer turner as a whole via a connecting element, e.g., a tube 352. As illustrated in Fig. 2, the tube 352 and the shaft coupled to the first drive 300 have collinear axes of rotation.

[0123] A stacking table 400 for receiving the individual anode or cathode layers AL, KL at the respective first or second delivery point Al, A2 is provided with a drive 410. This drive 410 moves the stacking table 400 back and forth in a controlled manner along the x-axis between the first and second delivery points Al, A2, so that the stacking table 400 is precisely aligned with the individual anode or cathode layer AL, KL to be deposited on it. In Fig. 1, the stacking table is shown in its left-aligned position below the layer turner 150 in solid lines, and in its right-aligned position below the layer turner 200 in short dashed lines.

[0124] The first and second layer turners 150, 200 each deliver a single anode or cathode layer AL, KL from their pick-up 156, 206 - in the 6 o'clock position in Fig. 1 - to the stacking table 400 at the first or second delivery point A1, A2, respectively, when the pick-up 156, 206 is located at the first or second delivery point A1, A2.

[0125] For this purpose, in the variant of the device 100 illustrated here, the first and second transfer points U1, U2 each have a first center (approximately above the center of the pick-up located in the 12 o'clock position between the pick-up and the conveyor), and the first and second delivery points A1, A2 each have a second center (approximately below the center of the pick-up located in the 6 o'clock position between the pick-up and the stacking table). These respective first and second centers lie on an imaginary straight line that intersects a respective rotation center DZ of the first layer turner 150 and the second layer turner 200, respectively. The first and second layer turners each turn only individual anode layers AL and only individual cathode layers KL toward the first and second delivery points A1, A2, respectively.

[0126] In the arrangement with the eccentric drive, the first drive of a layer turner and the second drive of the same layer turner can rotate continuously in the same direction or temporarily in opposite directions. This allows the rotary movement of the layer turner as a whole to overlap with the radial inward / outward movement of its pick-ups in such a way that a particularly small distance between the two layer turners, and thus a particularly short path between the two delivery points, is possible. Furthermore, the two layer turners (in both variants of Fig. 1 and 2) can be rotated by their respective first drives in such a way that the pick-up(s) of one layer turner rotate in exact antiphase with the pick-up(s) of the other layer turner.This means that if there is one pick-up per layer turner, one pick-up of one layer turner is located near the transfer point, while the other pick-up of the other layer turner is located near the delivery point. In the case of four pick-ups per layer turner, one pick-up of one layer turner leads the other pick-up of the other layer turner by approximately 45°.

[0127] The stacking table 400 has a support 420 for the individual anode and cathode layers AL, KL, as well as an adjusting device 430 with a corresponding rotary drive around the z-axis, which moves the support 420 along the axes and around the z-axis. Thus, the stacking table 400 and its support 420, or more precisely their center, can be precisely aligned with the first and second delivery points A1, A2, respectively, as well as the pickup in the 6 o'clock position. The stacking table 400 has a first and a second clamping finger 442, 444. In one variant, two clamping fingers are provided on each of two opposite sides. The clamping fingers move in the y-direction perpendicular to the rotation plane of the pickup.These two clamping fingers 442, 444 grip laterally from both (transverse or longitudinal) sides along the x- or y-direction over the electrode stack formed from the anode and cathode layers AL, KL and, in a controlled manner, engage or disengage from the uppermost of the anode and cathode layers AL, KL in order to press the uppermost of the anode and cathode layers AL, KL against the electrode stack ES on the support 420. For this purpose, corresponding linear drives 446, 448 are provided in the z-direction and in the x-direction or y-direction, depending on the arrangement of the clamping fingers 442, 444, which move the first and second clamping fingers 442, 444 in a controlled manner relative to the base plate 450 of the stacking table 400 and to its support 420. In one variant, the stacking table 400 is supported on a rigid plate with a recess. The base plate 450 can only be moved in the x-direction along two linear guides relative to the rigid plate.On the base plate 450 is a Y-plate that can be moved in the y-direction relative to the base plate 450. The Y-plate supports an actuator plate. The support 420 is located on the actuator plate. The actuator plate, together with the support 420, is rotatable about the z-axis, as are the clamping fingers and their actuators.

[0128] On the actuator plate, there is an x- or y-actuator for each clamping finger, depending on the direction of movement and arrangement of the clamping fingers, to position an individual clamping finger in the y-direction. The z-actuator of each clamping finger is arranged on a separate plate, which is located on the y-plate and next to the support 420. The y-actuator thus moves the separate plate and thus the respective clamping finger 442, 444 along with its z-actuator.

[0129] The clamping fingers 442, 444 also serve to clamp the endless separator belt against the storage 420 or the previously formed stack during the movement of the stacking table between the delivery points A1, A2, so that anode and cathode layers A1, KL deposited on the storage 420 are always separated by the electrically insulating separator.

[0130] When the Y-plate is moved in the y-direction, the actuator plate is moved in the y-direction along with the clamping fingers. The support 420 can be positioned in the z-direction by a z-drive, which can be located directly below the support and has freedom of movement in the x-direction in the central recess of the rigid plate.

[0131] The first and second layer turners 150, 200 are configured to pick up the individual anode layers AL and the individual cathode layers KL by means of controlled pneumatic negative pressure p- and to hold them during turning to the first and second delivery points A1, A2, respectively. Furthermore, in the variant of the device 100 shown here, the first and second layer turners 150, 200 are configured to dispense the individual anode layers AL and the individual cathode layers KL into the first and second delivery points, respectively, by means of a short blow, by means of controlled pneumatic overpressure p++, in order to stack the layers AL, KL on the support 420 to form the electrode stack ES.

[0132] To this end, Fig. 2 illustrates that the first and second layer turners 150, 200 each have a rotatable overpressure / underpressure distributor 650 arranged around the inner shaft 160, 210 to supply the sensors with the controlled pneumatic underpressure p- and / or overpressure p++. Two concentric rings 652, 654 are provided, rotatably surrounding each other in a fluid-tight manner, in which an overpressure / underpressure transfer 656 is realized for each of the sensors. From the over / under pressure transfer 656, a fluid line extends for each transducer 156, 206 into the inner shaft 160, 210 and from there to a connection for a radially flexible line 656 to the respective transducer 156, 206. The flexible line 656 is connected to a plurality of openings in the surface of the transducers facing away from the center of rotation.

[0133] Alternatively, each of these openings is assigned an elastic nozzle which projects slightly (e.g., less than 3 mm) above the surface of the pick-up and is connected to the flexible line 656. This allows the anode layers AL and cathode layers KL to be picked up safely and gently and released again with high precision in their alignment on the support 420. During stacking, the adjusting device 430 lowers the support 420 in a controlled manner after each deposit of the individual anode layers AL and the individual cathode layers KL by a distance corresponding to the thickness of a single anode layer AL or a single cathode layer KL. This ensures a very short, defined free path between the release from the pick-up 156, 206 and the impact on the electrode stack ES.The first to third inspection of the layer material integrated into the above variants, for example in the production of fuel or battery cells, is illustrated below.

[0134] The first inspection device has a first layer conveyor 150 (left in Fig. 1) with four pick-ups 156 and a first drive 300 for picking up a respective individual anode or cathode layer AL, KL from a first transfer point U1 by means of the at least one pick-up 156 and transporting it to a first delivery point A1. At the first delivery point A1, the first layer turner 150 delivers a respective individual anode or cathode layer AL, KL from its pick-up 156 to the stacking table 400, more precisely onto its storage area 420, when the respective at least one pick-up 156 is located at the first delivery point A1. The drive 410 aligns the pick-up 156 and the stacking table 400 relative to one another depending on a signaling based on processing of the first and / or second image acquisition.A first image sensor K1 is aligned between the first transfer point U1 and the first delivery point A1 with a first area E1 of the first layer turner 150 and performs a first image acquisition when the sensor 156 of the first layer turner 150 with the individual anode or cathode layer AL, KL passes the first image sensor K1. A second image sensor K2 is aligned between the first transfer point U2 and the first delivery point A2 with a second area E2 of the first layer turner 150 and performs a second image acquisition when the sensor 156 of the first layer turner 150 with the individual anode or cathode layer AL, KL passes the image sensor K2. The second area E2 can be different from the first area E1. The stacking table 400 receives the respective individual anode layer AL at the first delivery point Al and the respective individual cathode layer KL at the second delivery point A2 to form a layer stack.

[0135] In the variant shown, the first layer conveyor 150 has a layer turner 156 to pick up a respective individual anode or cathode layer by means of the at least one pick-up device 156 from the first transfer point Ul and to rotate it by a respective rotation angle - here approximately 180° - to the first delivery point Al.

[0136] In a variant not shown here, the first layer conveyor 150 has a layer gripper which picks up a respective individual anode or cathode layer from the first transfer point U1 by means of a pickup, for example in the form of a suction or gripping tool, and brings it to the first delivery point A1. Analogous to the first layer conveyor 150, a second layer conveyor 200 (on the right in Fig. 1) is provided and configured to pick up a single cathode or anode layer KL, AL and bring it to a second delivery point A2. A first image sensor Kl' between the second transfer point U2 and the second delivery point A2 is aligned with a first area EI' of the second layer conveyor 200 and performs a first image capture when the second layer conveyor 200 passes the first image sensor Kl'.A second image sensor K2' is aligned between the second transfer point U2 and the second delivery point A2 to a second area E2' of the second layer conveyor and performs a second image capture when the second layer conveyor passes the second image sensor K2'.

[0137] In the variant shown, the second layer conveyor 200 has a layer turner 206, which picks up a respective individual anode or cathode layer by means of the at least one pick-up 206 from the second transfer point U2 and rotates it by a respective rotation angle - here 180° - to a second delivery point A2.

[0138] In a variant not shown further here, the second layer conveyor 200 comprises a layer gripper which is provided and configured to pick up a respective individual anode or cathode layer by means of a pickup, for example in the form of a suction or gripping tool, from the second transfer point U2 and to bring it to the second delivery point A2.

[0139] A drive 410 is assigned to the stacking table 400, which moves the stacking table 400 back and forth between the first and second delivery points A1, A2. The first and second layer conveyors each deliver a single anode or cathode layer AL, KL to the stacking table 400 at the first and second delivery points A1, A2, respectively, when the stacking table 400 is located at the first and second delivery points A1, A2, respectively. A drive aligns the respective layer conveyor and / or the respective at least one layer turner 156, 206 with the stacking table 400 depending on a signal based on processing the first and second image feeds.

[0140] The first area E1 and the second area E2 of the sensors of the two layer turners 150, 200 are diagonally located corner areas of the sensors of the layer turners 150, 200. The first area E1 and the second area E2 of the sensors of the two layer turners 150, 200 are provided and configured to record a first corner or a second corner of the individual anode or cathode layer AL, KL, respectively. Consequently, the first and second image sensors Kl, K2, Kl', K2' are arranged diagonally to one another and aligned with the first area E1 and the second area E2 of the sensors of the two layer turners 150, 200 as they pass the first and second image sensors Kl, K2, Kl', K2'. The first and second image sensors Kl, K2, Kl', K2' are arranged here between the two transfer points Ul, U2 and the two delivery points Al, A2 in such a way that they point to the first and second image sensors respectively.second area E1, E2 of the respective sensors 156, 206 are aligned at an angle of approximately 90° between the camera axis and the anode or cathode in the inspection position for the first and second image sensors Kl, K2, Kl', K2' at the time of the first and / or second image acquisition.

[0141] The first and / or second image sensors Kl, K2, Kl', K2' are adjustable along their optical axes for focusing. In other variants, they are instead or additionally movable during operation. White light sources assigned to the first and second image sensors Kl, K2, Kl', K2' illuminate the anode / cathode layer for image acquisition. In further variants, one or more optically active elements are assigned to the first or second image sensors Kl, K2, Kl', K2' in order to detect the position and / or orientation of the anode / cathode layer at one or more locations or areas before or upon arrival at the delivery point or on the way to the delivery point. Optically active elements can be a lens or lens arrangement, a mirror or mirror arrangement, a prism or prism arrangement, a light guide arrangement, a surface light, a coaxial ring light, a dark-field light, etc., or combinations thereof.

[0142] The control unit ECU determines from the image capture(s) correction values ​​from the position and / or orientation of the anode / cathode layer AL, KL before it is picked up by the stacking table 400, the position and / or orientation of the stacking table 400, and / or the position and / or orientation of the picked up individual anode / cathode layer AL, KL relative to the stacking table 400 during turning of the anode / cathode layer AL, KL to the stacking table 400. The control unit ECU takes these correction values ​​into account when aligning the stacking table 400 with the transported anode / cathode layer relative to the deposit location A1, A2 in setting commands to the layer turner, the pick-up device and / or the stacking table.The control unit 400 takes these correction values ​​into account, in particular for the alignment and location of the stacking table when picking up the anode / cathode layer, in positioning commands to the layer turner, the pick-up device and / or the stacking table such that the stacking table picks up the respective anode / cathode layer in a central zero position and / or aligned with the electrode stack located at the delivery point.

[0143] The control unit determines the orientation and location of the stacking table 400 during or before picking up the anode / cathode layer AL, KL by checking the position of the incoming anode / cathode layer AL, KL in the image feeds immediately before the respective delivery point Al, A2.

[0144] An inspection method is also used for inspection, comprising the steps of: picking up an anode / cathode layer AL, KL by means of a pickup 156 of a layer turner 150, 200 from a transfer point U1, U2; conveying the pickup 156 of the layer turner 150, 200 from the transfer point to a delivery point A1, A2; detecting the position and / or orientation in x, y, z, and / or theta of the anode / cathode layer AL, KL on the pickup 156 of the layer turner 150, 200 by means of a first image pickup K1 between the transfer point U1 and the delivery point A1, wherein the first image pickup K1 is aligned with a first area E1 of the layer turner 150 and is provided and configured for a first image acquisition when the pickup of the layer turner passes the first image pickup K1;Detecting the position and / or orientation in x, y, z, and / or theta of the anode / cathode layer AL, KL on the at least one sensor 156 of the layer turner 150, 200 by means of a second image sensor K2 between the transfer point U1, U2 and the delivery point A1, wherein the second image sensor K2 is aligned with a second region E2 of the layer turner 150 and is provided and configured for a second image acquisition when the sensor of the layer turner passes the second image sensor K2; aligning the sensor 156 and the stacking table 400, more precisely its storage area 420, relative to one another as a function of a signaling based on processing of the first and / or second image acquisition; and delivering the anode or cathode layer AL, KL from the receiver 156 at the delivery point Al, A2 onto the stacking table 400 to form a layer stack when the respective receiver 156 is located at the delivery point Al, A2;

[0145] The first and second image sensors Kl, K2 capture the position and / or orientation of the anode / cathode layer AL, KL in x, y, z, and / or theta in a vertical plan view as the sensor of the layer turner passes the respective image sensor Kl, K2. A light source LI, L2 assigned to the first and / or second image sensors Kl, K2 illuminates the anode / cathode layer AL, KL for image acquisition by the first and second image sensors Kl, K2. In a variant not illustrated, the first and second image sensors Kl, K2 capture the entire anode / cathode layer AL, KL with one image acquisition in order to capture its position and / or orientation in x, y, z, and / or theta.In a further variant, the first and / or second image recorders K1, K2 capture an area, at least one corner area, two diagonal corner areas, or at least one corner area and at least a section of an edge of the anode / cathode layer AL, KL relative to a respective specified image recorder zero point with a single image acquisition in order to capture the position and / or orientation in x, y, z, and / or theta of the anode / cathode layer AL, KL. The first or second image recorders K1, K2 can be configured as matrix cameras or as line scan cameras that capture the position and / or orientation in x, y, z, and / or theta of the anode / cathode layer AL, KL before or upon arrival at the delivery point A1 or on the way to the delivery point A1.

[0146] The correction values ​​are determined from the position and / or orientation in x, y, z, and / or theta of the anode / cathode layer AL, KL after it has been picked up by the at least one pick-up device of the layer turner, the position and / or orientation in x, y, z, and / or theta of the stacking table 400, and / or the position and / or orientation in x, y, z, and / or theta of the picked-up individual anode / cathode layer AL, KL during turning of the anode / cathode layer AL, KL to the stacking table 400. These correction values ​​are taken into account when aligning in x, y, z, and / or theta of the stacking table 400 at the delivery point A1, A2 relative to the pick-up device of the layer turner with the transported anode / cathode layer AL, KL at the delivery point A1, A2. These correction values ​​are entered in x, y, z, and / or theta when aligning the stacking table 400 or.of the pick-up of the layer turner is taken into account in such a way that the anode / cathode layer AL, KL is picked up by the stacking table 400 in a central zero position and / or aligned.

[0147] In the second inspection device 100, the first layer conveyor 150 picks up a single anode or cathode layer AL, KL from a first transfer point U1 and brings it to a first delivery point A1. A stacking table 400, or more precisely its storage area 420, picks up the single anode or cathode layer AL, KL at the first delivery point A1 to form a layer stack. The first layer conveyor 150 delivers a single anode or cathode layer AL, KL to the stacking table 400 at the first delivery point A1 when the stacking table 400 is located at the first delivery point A1. A third image sensor K3, K3' is directed at at least one area E3, E3' encompassing a top edge OK of a layer stack located on the stacking table 400 in a side view. This area E3, E3' comprises a connection tab T of an anode or cathode layer AL, KL located at the top of the layer stack.The third image sensor K3, K3' performs a third image acquisition after the anode or cathode layer AL, KL has been deposited on the layer stack on the stacking table 400. A control unit ECU indicates the usability or unusability of the layer stack depending on a signal based on processing the third image acquisition.

[0148] The layer conveyor here has a layer turner, which picks up individual anode or cathode layers from the first transfer point Ul by means of one of four pick-ups 156 and rotates them by a respective rotation angle - here 180° - to the first delivery point Al.

[0149] In a variant not further illustrated, the layer conveyor has a layer gripper which picks up a respective individual anode or cathode layer from the first transfer point Ul by means of a pickup, for example in the form of a suction or gripping tool, and brings it to the first delivery point Al.

[0150] A second layer conveyor, analogous to the first layer conveyor, picks up a single cathode or anode layer KL, AL and transports it to a second delivery point A2. A drive 410 is assigned to the stacking table 400, which moves the stacking table 400 back and forth between the first and second delivery points A1, A2. The first and second layer conveyors each deliver a single anode or cathode layer AL, KL to the stacking table 400 at the first and second delivery points A1, A2, respectively, when the stacking table 400 is located at the first and second delivery points A1, A2, respectively. At least one drive serves to align the respective layer conveyor and / or the respective at least one layer turner 156, 206 or layer gripper relative to the stacking table 400 in dependence on a signaling based on a processing of the first and / or second image acquisition in a control ECU.

[0151] The second layer conveyor also has a layer turner and also picks up a single anode or cathode layer from the second transfer point U2 by means of the pick-up 206 and rotates it through a rotation angle—here 180°—to a second delivery point A2. In a variant not shown, the second layer conveyor has a layer gripper that picks up a respective single anode or cathode layer from the second transfer point U2 by means of a pick-up, for example in the form of a suction or gripping tool, and brings it to the second delivery point A2.

[0152] A first third region E3 and a second third region E3' - see Fig. 4a - of the layer stack each comprise - in side view - a connection lug of the respective uppermost anode or cathode layer AL, KL on the stacking table 400 at the first or second delivery point A1, A2. One or two third image recorders K3, K3a, K3', K3a' are arranged on a first side, for example the left side in Fig. 1, of the inspection device 100 or the storage area 420, and one or two third image recorders K3, K3a, K3', K3a' are arranged on a second side opposite the first side, for example the right side in Fig. 1, of the inspection device 100. Two third image sensors K3, K3a, K3', K3a' to one side of the inspection device 100 or the storage 420 are spaced apart from each other with respect to a Y-direction.In one variant, one or more third image sensors K3, K3a, K3', K3a' are arranged in a stationary manner relative to the stacking table 400 which moves back and forth between the two delivery points A1, A2. This is illustrated in Fig. 4a. In variants not shown in detail, of the four stationary third image sensors K3, K3a' K3a, K3', only two diagonally arranged third image sensors are provided, i.e., the third image sensors K3, K3a' or the third image sensors K3a, K3' in Fig. 4a. Alternatively, in variants not shown in detail, of the four stationary third image sensors K3, K3a' K3a, K3', only two third image sensors arranged on one side of the stacking table 400 are provided, i.e., the third image sensors K3, K3a or the third image sensors K3a', K3' in Fig. 4a.In one variant, an optical axis of the one third image sensor or of each of the plurality of image sensors is oriented horizontally or has a maximum deviation of + / - 10° from a horizontal.

[0153] As a further variant, Fig. 6 shows a plan view of the storage area 420 of a stacking table, on which a layer stack is located, at the first and second storage locations with a configuration of the image sensors for the second inspection. The third image sensors K3a, K3' are illustrated as examples, which capture the first and second third regions E3, E3', respectively - in a side view from the outside - using backlight or transmitted light from light sources WL. Thus, a connection tab of the respective uppermost anode or cathode layer AL, KL on the stacking table 400 is inspected at the first or second delivery location A1, A2, respectively. If space permits, in other variants one or more third image sensors K3, K3a, K3', K3a' are permanently connected to the stacking table 400 - see Fig. 4b - and can be moved with it between the two storage locations A1, A2.In variants not shown in detail, of the four third image sensors K3, K3a' K3a, K3' that can be moved with the stacking table, only two diagonally arranged third image sensors are provided, i.e., in Fig. 4b, the third image sensors K3, K3a' or the third image sensors K3a, K3'. Alternatively, in variants not shown in detail, of the four third image sensors K3, K3a' K3a, K3' that can be moved with the stacking table, only two third image sensors arranged on one side of the stacking table 400 are provided, i.e., in Fig. 4b, the third image sensors K3, K3a that can be moved with the stacking table or the third image sensors K3a', K3' that can be moved with the stacking table.

[0154] The third image sensor(s) K3, K3a, K3', K3a' are adjustable along their optical axes to focus on the areas E3, E3'. A light source L3 assigned to the third image sensor(s) K3, K3a, K3', K3a' - see Fig. 3 - illuminates the anode / cathode layer on the layer stack for image acquisition by the third image sensor(s). Here, the light source L3 is a coaxial ring illumination. The coaxial ring illumination is arranged on the side of the third image sensor K3, directly adjacent to the respective third image sensor K3, K3a, K3', K3a' on this side of the position of the connection flag T on the stacking table 400, and is configured to include the connection flag T in the light beam path. Thus, by processing the third image capture, a vertical lifting of the connecting flag T can be detected, in that the uppermost edge of the connecting flag T is not oriented horizontally in the image capture and / or causes an interference contour.

[0155] A second inspection method in the production of modules or precursors of modules comprises the steps: picking up an anode / cathode layer AL, KL at the first transfer point Ul and bringing the anode or cathode layer AL, KL from the first transfer point Ul to a first delivery point Al; delivering the respective individual anode or cathode layer AL, KL at the delivery point Al, A2 onto a stacking table 400 to form a layer stack; directing a third image sensor K3, K3' onto a region E3 comprising an upper edge OK of a layer stack located on the stacking table 400 in a side view, wherein the region comprises a connection tab T of an anode or cathode layer AL, KL located at the top of the layer stack; and wherein a third image acquisition is carried out by means of the third image sensor K3, K3' after the anode orCathode layer AL, KL is deposited on the stacking table 400; and indicating an unusability of the layer stack in dependence on a signaling based on processing of the third image acquisition.

[0156] In the variant shown, the coaxial ring illumination is arranged on the side of the third image sensor, this side of the position of the connecting flag T on the stacking table 400, and the third image sensor K3 is set up so that the connecting flag T is placed in the light beam path. Finally, the third image acquisition takes place, which is processed in the ECU to detect, by processing the third image acquisition, a lifting of the connecting flag T, in that the top edge of the connecting flag T is not oriented horizontally in the third image acquisition and / or causes an interference contour.

[0157] In a third inspection device 100 for layer material, particularly for the production of fuel or battery cells, a first layer conveyor 150 picks up a single anode or cathode layer AL, KL and transports it to a first delivery point Al. A stacking table 400 picks up the anode or cathode layer AL, KL at the first delivery point Al to form a layer stack. The first layer conveyor 150 delivers the anode or cathode layer AL, KL to the stacking table 400 at the first delivery point Al.A fourth image sensor K4 is aligned with a fourth region E4 of the layer stack comprising anode and cathode layers AL, KL in a planar side view of the layer stack and performs a fourth image acquisition after the anode or cathode layer AL, KL has been deposited on the layer stack on the stacking table 400. The fourth region E4 includes a corner of an anode or cathode layer AL, KL located at the top of the layer stack and / or a vertical edge HK of the layer stack. This allows not only the topmost layer to be detected, but also one or more incorrectly positioned layers of the overall stack located further down. This allows for the detection of outliers that have shifted due to changes in the processes.In the variant shown, a fifth image sensor K5 is aligned with a fifth region E5 of the layer stack of anode and cathode layers AL, KL in a planar side view of the layer stack and performs a fifth image acquisition after the anode or cathode layer AL, KL has been deposited on the layer stack on the stacking table 400. The fifth region E5 comprises a corner of an anode or cathode layer AL, KL located at the top of the layer stack (or below it, see above) and / or a vertical edge HK of the layer stack. The regions E4 and E5 are disjoint here. In particular, the fourth region E4 and the fifth region E5 of the anode or cathode layer AL, KL comprise regions of the layer stack of anode and cathode layers AL, KL that are adjacent to or diagonally to one another in the layer surface in a respective side view of the layer stack.

[0158] The layer conveyor comprises a layer turner 156 for picking up a single anode or cathode layer from the first transfer point Ul by means of at least one pick-up device 156 and rotating it by a respective angle of rotation - here 180° - to the first delivery point Al.

[0159] The fourth image sensor K4 and the fifth image sensor K5 are adjustable for focusing along their optical axes. A light source assigned to the fourth image sensor K4 and the fifth image sensor K5 respectively illuminates the anode / cathode layer for a fourth image acquisition or a fifth image acquisition by the fourth image sensor K4 or fifth image sensor K5. The fourth image sensor K4 or fifth image sensor K5 is each assigned at least one optically active element which makes the corner E4 or E5 of the anode or cathode layer AL, KL located on top of the layer stack and the respective vertical edge HK of the layer stack visible in the fourth image acquisition or the fifth image acquisition after the anode or cathode layer AL, KL has been placed on the layer stack. The at least one optically active element here is a coaxial ring illumination.The coaxial ring illumination is located on the side of the fourth image sensor K4 or the fifth image sensor K5, this side of the position of the corner of the anode or cathode layer AL, KL located at the top (or further down, see above) on the layer stack and the respective vertical edge HK of the layer stack. Together with the respective image sensor, it places the corner and / or the vertical edge HK in the light beam path. Thus, by processing the fourth image acquisition or the fifth image acquisition, any lifting, displacement, or rotation around the vertical axis of the anode or cathode layer AL, KL can be detected, as the corner and / or the vertical edge HK creates an interfering contour in the image acquisition.

[0160] A first fourth region E4 and a second fourth region E4' of the layer stack each comprise a corner of the anode or cathode layer AL, KL located at the top of the layer stack and a vertical edge HK of the layer stack on the stacking table 400 when the stacking table is located at the first or second delivery point A1, A2. In one variant, a first fourth image sensor K4 and a first fifth image sensor K5 are arranged on a first side of the inspection device 100 (left in Fig. 5a), and a second fourth image sensor K4' and a second fifth image sensor K5' are arranged on a second side of the inspection device 100 opposite the first side (right in Fig. 5a). In Fig. 5a, these plurality of fourth and fifth image sensors are arranged stationary relative to the movable stacking table 400, more precisely, its storage area 420. In Fig. 5b these are several fourth orfifth image sensor connected to the stacking table 400 in order to be movable with it.

[0161] In order to realize a compact overall arrangement of the inspection device with low vibration for inspection, in one variant the first and / or the second image sensor K1, K2, optionally also the first fourth image sensor K4 and / or the first fifth image sensor K5, are arranged on a support frame which extends parallel to the sensor 156 when the sensor 156 passes the first and / or second image sensor K1, K2. In a further embodiment, the support frame can be L-shaped (horizontally lying L) and can encompass the layer turner 150 in an L-shape, so that a side of the layer turner 150 facing away from the first drive 300 (see Fig. 2) is rotatably mounted on the support frame. The second layer turner 200 can also be assigned such a support frame for the same purpose in order to accommodate the image sensors assigned to the second layer turner 200.

[0162] In variants not shown in detail, of the four fourth and fifth image sensors K4, K4', K5, K5', only two diagonally arranged image sensors are provided, i.e., in Fig. 5a or Fig. 5b, the image sensors K4, K5' or the image sensors K4', K5. Alternatively, in variants not shown in detail, of the four fourth and fifth image sensors K4, K4', K5, K5' that can be moved with the stacking table, only two image sensors arranged on one side of the stacking table 400 are provided, i.e., in Fig. 5b, the image sensors K4, K5 that can be moved with the stacking table 400 or the image sensors K4', K5' that can be moved with the stacking table.

[0163] As a further variant, Fig. 7 shows a plan view of the placement of a stacking table on which a layer stack is located, at the first and second placement locations with a configuration of the image sensors for the third inspection. For example, the fourth and fifth image sensors K4, K5, K4', K5' are oriented at an angle beta of approximately ± 5° to approximately ± 25° to a longitudinal or transverse edge of the anode or cathode layer AL, KL located at the top of the layer stack, for example, approximately ± 13°. This avoids any disruptive influence of the loop or S-shaped endless separator (not shown). The optical axis of the fourth or fifth image sensor K4, K5, K4', K5' at the first or second output point Al, A2, as seen from above, can be positioned either to the left or right of the (imaginary) extended transverse or longitudinal edge of the anode or cathode layer AL, located at the top of the layer stack.KL can be inclined by the angle beta. This is illustrated by the image sensors shown in dashed lines in Fig. 7. Thus, a corner region of the respective uppermost anode or cathode layer AL, KL on the stacking table 400 is inspected at the first or second delivery point A1, A2. A third inspection method comprises the steps: picking up an anode / cathode layer AL, KL by means of at least one pick-up device 156, 206 of a layer turner 150, 200 from a transfer point U1, U2; picking up the respective individual anode or cathode layer AL, KL from the respective at least one pick-up device 156 at a delivery point A1, A2 onto a stacking table 400 to form a layer stack when the respective at least one pick-up device 156, 206 is located at the delivery point A1, A2; Directing a fourth image sensor K4 onto a fourth area E4 of the layer stack of anode and cathode layers AL, KL in a planar side view of the layer stack,wherein the fourth region E4 comprises a corner of an anode or cathode layer AL, KL located at the top of the layer stack and / or a vertical edge HK of the layer stack; and performing a fourth image acquisition after the anode or cathode layer AL, KL has been placed on the layer stack on the stacking table 400; and / or directing a fifth image sensor K5 onto a fifth region E5 of the layer stack comprising anode and cathode layers AL, KL in a planar side view of the layer stack, wherein the fifth region E5 comprises a corner of an anode or cathode layer AL, KL located at the top of the layer stack and / or a vertical edge HK of the layer stack; and performing a fifth image acquisition after the anode or cathode layer AL, KL has been deposited on the layer stack on the stacking table 400. The fourth area E4 or the fifth area E5 of the anode or cathode layer AL,KL adjacent in the layer area (for example, lying on the same edge of the layer) or diagonally to each other regions of the layer stack of anode and cathode layers AL, KL in a respective side view of the layer stack; and indicating a (un)usability of the layer stack depending on a signaling based on processing of the fourth or fifth image acquisition.

[0164] The fourth or fifth image sensor K4, K5 is adjustable for focusing along its optical axis. The fourth or fifth area E4, E5 for the fourth or fifth image acquisition is illuminated by the respective image sensor K4, K5 K4', K5' using a light source assigned to the fourth or fifth image sensor. An optically active element is assigned to the fourth or fifth image sensor, here in the form of a coaxial ring illumination in order to make the corner of the anode or cathode layer AL, KL located on top of the layer stack and / or the vertical edge HK of the layer stack visible in the fourth or fifth image acquisition after the anode or cathode layer AL, KL has been placed on the layer stack. The coaxial ring illumination is arranged as incident light on the side of the fourth or fifth image acquisition.of the fifth image sensor, this side of the position of the corner of the anode or cathode layer located at the top of the layer stack or the vertical edge of the layer stack on the stacking table. For this purpose, the incident light illumination is set up to include the corner and the vertical edge HK of the layer stack in the light beam path. This allows, by processing the fourth or fifth image acquisition, an at least partial lifting, displacement, or rotation of the anode or cathode layer AL, KL located at the top of the layer stack to be detected, in which the top corner and / or the vertical edge HK causes an interfering contour.

[0165] The variants of handling and inspection, their construction and operating aspects, as well as the variants of the procedure described above, serve only to improve understanding of the structure, functionality, and properties; they do not limit the disclosure to the exemplary embodiments. The figures are partly schematic. Key properties and effects are sometimes shown significantly enlarged in order to clarify the functions, operating principles, technical designs, and features. Each functionality, principle, technical design, and feature disclosed in the figures or in the text can be incorporated into all claims, each feature in the text, and in the other figures., other modes of operation, principles, technical embodiments and features contained in this disclosure or resulting therefrom can be freely and arbitrarily combined so that all conceivable combinations can be assigned to the described procedure. This also includes combinations between all individual embodiments in the text, i.e. in every section of the description, in the claims and also combinations between different variants in the text, in the claims and in the figures. The claims also do not limit the disclosure and thus the possible combinations of all the features shown with one another. All disclosed features are explicitly disclosed here, both individually and in combination with all other features.

Claims

Patent claims 1. An inspection device (100) for layer material, in particular for the production of fuel or battery cells, wherein - a first layer conveyor (150) is provided and arranged to pick up a respective individual anode or cathode layer (AL, KL) from a first transfer point (Ul) and to bring it to a first delivery point (Al); - a stacking table (400) is provided and configured to receive the respective individual anode or cathode layer (AL, KL) at the first delivery point (Al) to form a layer stack; - the first layer conveyor (150) is provided and arranged to deliver a single anode or cathode layer (AL, KL) to the stacking table (400) at the first delivery point (Al); and - a third image sensor (K3, K3') is directed at at least one region (E3, E3') comprising a top edge (OK) of a layer stack located on the stacking table (400) in a side view, which region comprises a connection tab (T) of an anode or cathode layer (AL, KL) located at the top of the layer stack, and is provided and configured for a third image acquisition after the anode or cathode layer (AL, KL) has been placed on the layer stack on the stacking table (400); and - a control system which is provided and arranged to indicate the (un)usability of the layer stack in dependence on a signalling based on a processing of the third image acquisition.

2. The inspection device (100) according to claim 1, wherein - the layer conveyor comprises a layer turner (150) which is provided and configured to pick up a respective individual anode or cathode layer from the first transfer point (Ul) by means of at least one pick-up device (156) and to rotate it by a respective angle of rotation to a first delivery point (A1).

3. The inspection device (100) according to claim 1, wherein - the layer conveyor comprises a layer gripper which is provided and configured to pick up a respective individual anode or cathode layer from the first transfer point (Ul) by means of a pickup, for example in the form of a suction or gripping tool, and to bring it to the first delivery point (Al).

4. The inspection device (100) according to one of claims 1 to 3, wherein - a second layer conveyor is provided and configured to receive a single cathode or anode layer (KL, AL) and to transport it to a second delivery point (A2); - a drive (410) is assigned to the stacking table (400), which drive is provided and configured to move the stacking table (400) back and forth between the first and second delivery points (Al, A2); - the first and second layer conveyors are each provided and configured to deliver a single anode or cathode layer (AL, KL) to the stacking table (400) at the first and second delivery points (Al, A2), respectively; and / or - at least one drive is provided to align the respective layer conveyor and / or the respective at least one layer turner (150, 200) or layer gripper relative to the stacking table (400) in dependence on a signaling based on a processing of a first and / or second image feed in a controller.

5. The inspection device (100) according to claim 4, wherein - the second layer conveyor comprises a layer turner which is provided and configured to pick up a respective individual anode or cathode layer from the second transfer point (U2) by means of the at least one pick-up device (206) and to rotate it by a respective angle of rotation to a second delivery point (A2).

6. The inspection device (100) according to claim 4, wherein the second layer conveyor comprises a layer gripper which is provided and configured to pick up a respective individual anode or cathode layer from the second transfer point (U2) by means of a pickup, for example in the form of a suction or gripping tool, and to bring it to the second delivery point (A2).

7. The inspection device (100) according to any one of the preceding claims, wherein - a first third region (E3) and a second third region (E3') of the layer stack each comprise a connection tab of the respective uppermost anode or cathode layer (AL, KL) on the stacking table (400) at the first or second delivery point (Al, A2); and / or - one or two third image recorders (K3, K3a, K3', K3a') are arranged on a first side of the inspection device (100), and one or two third image recorders receivers (K3, K3a, K3', K3a') are arranged on a second side of the inspection device (100); and / or - one or more third image sensors (K3, K3a, K3', K3a') are arranged stationary relative to the movable stacking table (400); and / or - one or more third image sensors (K3, K3a, K3', K3a') are connected to the stacking table (400) in order to be movable therewith.

8. The inspection device (100) according to any one of the preceding claims, wherein - the at least one third image sensor (K3, K3a, K3', K3a') is adjustable for focusing along its optical axis and / or movable during operation; and / or - a light source associated with the third image sensor (K3, K3a, K3', K3a') is designed and arranged to illuminate the anode / cathode layer for image capture by the third image sensor (K3, K3a, K3', K3a'); and / or - at least one optically active element is assigned to the third image sensor (K3, K3a, K3', K3a'); - the optically active element is intended and configured to make the terminal flag (T) of an anode or cathode layer (AL, KL) located at the top of the layer stack recognizable in the third image after the anode or cathode layer (AL, KL) has been placed on the layer stack; and / or wherein - the at least one optically active element is a lens, or lens arrangement, a mirror or a mirror arrangement, a prism or a prism arrangement, a light guide arrangement, a surface light, a coaxial ring illumination, a dark field illumination, a transmitted light illumination, or a combination thereof.

9. The inspection device (100) according to any one of the preceding claims, wherein - the transmitted light illumination (DL) is arranged on the opposite side of the third image sensor (K3), beyond the position of the connecting flag (T) on the stacking table (400), and is configured to take the connecting flag (T) into the light beam path; in order to detect, by means of processing the third image acquisition, a lifting of the connecting flag (T) in which the uppermost edge of the connecting flag (T) is not oriented substantially horizontally (< ± 10°) in the image acquisition and / or causes an interfering contour.

10. The inspection device (100) according to any one of the preceding claims, wherein - the coaxial ring illumination is arranged on the side of the third image sensor (K3), on this side of the position of the connecting flag (T) on the stacking table (400), and is configured to take the connecting flag (T) into the light beam path; in order to detect, by means of processing the third image acquisition, a lifting of the connecting flag (T) in which the uppermost edge of the connecting flag (T) is not oriented substantially horizontally in the image acquisition and / or causes an interfering contour.

11. An inspection procedure in the manufacture of modules or precursors of modules comprises the following steps: - picking up a single anode / cathode layer (AL, KL) at a first transfer point (Ul) and bringing the anode or cathode layer (AL, KL) from the first transfer point (Ul) to a first delivery point (Al); - depositing the respective individual anode or cathode layer (AL, KL) at the deposit point (Al, A2) onto a stacking table (400) to form a layer stack; - Directing a third image sensor (K3, K3') onto a region (E3) comprising a top edge (OK) of a layer stack located on the stacking table (400) in a side view, wherein the region comprises a connection tab (T) of an anode or cathode layer (AL, KL) located at the top of the layer stack; and wherein a third image acquisition is performed by means of the third image sensor (K3, K3') after the anode or cathode layer (AL, KL) has been placed on the stacking table (400); and - Indicating a (un)usability of the layer stack depending on a signaling based on processing of the third image acquisition.

12. The inspection method according to the preceding claim, further comprising the steps: - Adjusting the third image sensor (K3, K3a, K3', K3a') to focus along its optical axis and / or moving the third image sensor (K3, K3a, K3', K3a') to focus along its optical axis during operation; and / or - illuminating the anode / cathode layer for a third image acquisition by the third image sensor (K3, K3a, K3', K3a') by means of a light source associated with the third image sensor; and / or - Assigning at least one optically active element to the third image recording mer; wherein the optically active element is intended and configured to make the connection flag (T) of an anode or cathode layer (AL, KL) located at the top of the layer stack visible in the third image in a side view after the anode or cathode layer (AL, KL) has been deposited on the layer stack; and / or wherein - the at least one optically active element is a lens, or lens arrangement, a mirror or a mirror arrangement, a prism or a prism arrangement, a light guide arrangement, a surface light, a coaxial ring illumination, a dark field illumination, a transmitted light illumination, or a combination thereof.

13. The inspection method according to any one of the preceding method claims, further comprising the steps: - Arranging the transmitted light illumination (DL) on the opposite side of the third image sensor (K3), beyond the position of the connection flag (T) on the stacking table (400), and - Setting up the connecting flag (T) to be placed in the light beam path; in order to detect, by means of processing the third image acquisition, a lifting of the connecting flag (T) in which the uppermost edge of the connecting flag (T) is not oriented horizontally and / or causes an interference contour.

14. The inspection method according to any one of the preceding method claims, further comprising the steps: - Arranging the coaxial ring illumination on the side of the third image sensor (K3), this side of the position of the connection flag (T) on the stacking table (400), and - Arrange to place the connecting flag (T) in the light beam path; - Detecting, by means of processing the third image capture, a lifting of the connecting flag (T) in which the uppermost edge of the connecting flag (T) is not oriented horizontally in the third image capture and / or causes an interference contour.

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