Device and method for measuring alignment errors of a directed beam source

EP4646576A1Pending Publication Date: 2025-11-12TRIOPTICS GMBH
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Patent Information

Application Number
EP2024704348
Authority / Receiving Office
EP · EP
Patent Type
Applications
Current Assignee / Owner
Priority Date
2023-02-09
Filing Date
2024-02-05
Publication Date
2025-11-12

AI Technical Summary

Technical Problem

Current methods for measuring alignment errors of laser diodes and similar directed beam sources are complex and time-consuming, requiring sequential measurement of the optical axis position, which increases costs and complexity.

Method used

A device with a beam splitter dividing the beam into two partial beams, one focused with focusing optics and the other unfocused, allowing simultaneous measurement of tilt and lateral offset using spatially resolving radiation sensors, significantly reducing measurement time.

Benefits of technology

Enables rapid and independent measurement of tilt and offset, reducing the overall measurement time and allowing for more efficient alignment of the beam source with the optical system.

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Abstract

A device for measuring alignment errors of a laser diode or other directed beam source (12) comprises a holder (22) for the beam source (12), which is rotatably mounted about a rotary axis (18) by means of a drive (18). The device further comprises a first spatially resolving radiation sensor (36), a beam splitter (26), which splits a beam (24) generated by the beam source (12) into a first partial beam (28) and a second partial beam (30), and a focussing optic (32). The focussing optic is arranged in a radiation path of the first partial beam (28) and has a focal plane in which the first radiation sensor (36) is arranged. A second spatially resolving radiation sensor (38) is arranged in a radiation path of the second partial beam (30). A computing device (40) calculates from first locations, which are swept over by the first partial beam (28) during a rotation of the beam source (12) on the first radiation sensor (36), and from second locations, which are swept over by the second partial beam (30) during the rotation of the beam source (12) on the second radiation sensor (38), a tilt (d) and a lateral offset (α) of the beam (24) generated by the beam source (12).
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