Ultracold atom measurement system and associated process
FR3162842A1Pending Publication Date: 2025-12-05THALES SA
Patent Information
- Application Number
- FR2024005537
- Authority / Receiving Office
- FR · FR
- Patent Type
- Applications
- Current Assignee / Owner
- Filing Date
- 2024-05-29
- Publication Date
- 2025-12-05
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Abstract
Ultracold atom measurement system and associated method The present invention relates to an ultracold atom measurement system (10), the measurement system (20) comprising: - an array of ultracold atom inertial sensors (14), each sensor (14) of the array being an interferometric sensor configured to measure a physical quantity by implementing an interferometry sequence, - a processing unit (22) configured to apply, for at least one subset of sensors, a respective interferometry sequence to each sensor (14) of a subset of sensors, the implementation of the respective interferometry sequences by said at least one subset of sensors (14) leading the sensors (14) of the subset to measure the same physical quantity with a trajectory followed during the movement varying from one sensor (14) of the subset to another sensor (14) of the subset by at least one parameter relating to the trajectory.Figure for the abbreviation: figure 1.
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Citation Information
Patent Citations
On-chip trapped ultracold atom sensor allowing rotational velocity to be measured
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EP4102182A1
Corrected bias rate gyroscope cold atom sensor
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