Device board for electronic component test equipment

JP1811817SActive Publication Date: 2025-10-29ADVANTEST CORP
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Patent Information

Application Number
JP2025008358D
Authority / Receiving Office
JP · JP
Patent Type
Designs
Current Assignee / Owner
Filing Date
2025-04-25
Publication Date
2025-10-29
Estimated Expiration
2050-04-25

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Abstract

This device board is installed in electronic device test equipment that tests the electrical characteristics of electronic devices such as semiconductor devices like memory and CPUs (Central Processing Units). The electronic device under test is pressed against the socket installed in this device, and test signals are supplied and the response is measured to determine whether the device is good or bad, or to identify defective areas. As shown in the reference diagram showing the names of each part, the socket board and socket guide are connected by a lock pin and screw, sandwiching the socket between them. Also, by orienting the lock pin in a certain direction, the socket guide and socket can be removed by loosening the screw while the socket board remains fixed to the main body of the electronic device test equipment.
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