Dynamic detection levels in non-volatile memory devices - Patents.com

Abstract

A system, method and device dynamically determine a sensing level in a memory device. The device includes non-volatile memory cells included in a plurality of memory sectors, a plurality of static reference cells configured to represent a first reference value for distinguishing between memory states, and a plurality of dynamic reference cells configured to represent the first reference value after a specified amount of memory sector activity. The device also includes a comparator configured to be coupled to at least one of the plurality of memory cells and at least two of the plurality of static reference cells and the plurality of dynamic reference cells, and further configured to determine a memory state of the at least one memory cell based at least in part on a second reference value determined by a combination of the plurality of static reference cells and the at least two of the plurality of dynamic reference cells.

Description

[Technical field]

[0001] CROSS-REFERENCE TO RELATED APPLICATIONS This application is an international application of U.S. Nonprovisional Application No. 17 / 649,326, filed January 28, 2022, which claims the benefit under 35 U.S.C. § 119(e) of U.S. Provisional Application No. 63 / 256,126, filed October 15, 2021, the entire contents of which are incorporated herein by reference.

[0002] This disclosure relates generally to memory devices, and more particularly to dynamic sensing levels associated with such memory devices. [Background technology]

[0003] A memory device may store data values ​​using memory cells in a memory array. Such memory arrays may include word lines and bit lines for identifying and selecting such memory cells in the memory array. Additionally, reference cells may be used to store reference values ​​that are used to identify what values ​​can be stored in a particular memory cell. As such memory cells undergo multiple program and erase operations, their operating characteristics may change due to changes in conductive properties. Thus, conventional memory devices remain limited as they age and the operating characteristics of the memory cells change, resulting in bit errors due to such changes in operating characteristics. [Brief description of the drawings]

[0004] [Figure 1] 1 illustrates an example of a device for dynamic detection level determination, configured in accordance with some embodiments. [Diagram 2] 1 illustrates an example of another device for dynamic detection level determination, configured in accordance with some embodiments. [Diagram 3] 1 illustrates an example of yet another device for dynamic detection level determination, configured in accordance with some embodiments. [Figure 4] 1 illustrates an example of a method for dynamic detection level determination, arranged in accordance with some embodiments. [Diagram 5] 1 illustrates an example of another method for dynamic detection level determination, arranged in accordance with some embodiments. [Figure 6] 1 illustrates yet another example method for dynamic detection level determination, arranged in accordance with some embodiments. [Figure 7] 1 illustrates an example of a system configured in accordance with some embodiments. [Figure 8] 1 illustrates an example of a memory sector included in a device for dynamic detection level determination, configured in accordance with some embodiments. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0005] In the following description, numerous specific details are set forth to provide a thorough understanding of the presented concepts. The presented concepts may be practiced without some or all of these specific details. In other instances, well-known process operations have not been described in detail so as not to unnecessarily obscure the described concepts. While some concepts will be described in conjunction with specific examples, it will be understood that these examples are not intended to be limiting.

[0006] A memory device may include non-volatile memory cells that undergo multiple program and erase operations over the life of such memory device. Thus, the current distributions associated with such program and erase operations may drift and increase over time. Thus, a reference voltage that may be used to distinguish one memory state from another, or a programmed state from an erased state, may initially provide accurate results, but as drift begins, the reference voltage may no longer be accurate. For example, a static reference value may initially be selected such that the current distributions associated with program operations are below the static reference value and the current distributions associated with erase operations are above the static reference value. As drift begins and the distributions increase in value, the current distributions of the program operations may shift sufficiently large that some of the distributions are no longer greater than the static reference value. When this occurs, the static reference value may no longer be able to distinguish between the two, as at least some of the distributions of both the program and erase operations exceed the static reference value, resulting in bit errors.

[0007] The embodiments disclosed herein provide the capability for dynamically determined reference levels used in sensing operations. As described in more detail below, a combination of static and dynamic reference cells can be used to represent reference voltage levels that track changes in memory cell operating characteristics over time. Additionally, multiple groups of reference cells can be used in combination to reduce the variation in the reference voltage and increase the accuracy of representing the reference voltage. In this way, the accuracy of the reference voltage in its ability to model drift or changes in memory cell operating characteristics is improved, as is the accuracy of the sensing operations and memory state determination. In this way, bit error rates can be reduced and the life of the memory device can be extended.

[0008] 1 illustrates an example of a device for dynamic sensing level determination, configured in accordance with some embodiments. As described in more detail below, a memory device such as device 100 may include various memory cells that may be programmed with memory states. More specifically, conductive characteristics of the memory cells may be configured to represent memory states, and sensing operations may be performed to identify or read such memory states. Also, as described in more detail below, the sensing levels used in such sensing operations may be dynamically determined to compensate for changes that may occur due to aging and / or use of the memory cells.

[0009] In various embodiments, device 100 includes various bit lines and word lines, such as bit line 102 and word line 104. As shown in FIG. 1, the bit lines and word lines may intersect at memory cells and thus may be configured to select a particular memory cell based on the intersection of a selected bit line and a selected word line. Such memory cells may be metal-oxide-semiconductor field-effect transistor (MOSFET) devices and may have threshold voltages that are altered or modified to represent a memory state. In various embodiments, memory cells and / or reference cells may be one-transistor (1T) configurations, two-transistor (2T) configurations, or split-gate (1.5T) configurations, or combinations thereof. For example, a threshold voltage may be set for a particular MOSFET device, and the threshold voltage may be sensed and compared to a reference level to determine that a data value has been programmed and stored. More specifically, if the threshold voltage is greater than the reference level, it may represent a first memory state. Furthermore, if the threshold voltage is less than the reference level, it may represent a second memory state. For example, a higher conductance (e.g., a higher cell current) and a lower threshold voltage can represent an erased state, while a lower conductance and a higher threshold voltage can represent a programmed state. Further details regarding such comparisons to reference levels are discussed in more detail below.

[0010] In various embodiments, memory cells included in device 100 are arranged in subunits, also referred to herein as memory sectors. Thus, memory cells within device 100 may be organized in multiple different sectors, and device 100 may include hundreds of memory sectors.

[0011] The device 100 further includes various reference cells, such as a first reference cell 106 and a second reference cell 108. As described in more detail below, the reference cells may be used to determine reference voltages used for determining the memory states described above. Thus, the voltages stored by the first reference cell 106 and the second reference cell 108 may be used to determine reference levels, also referred to herein as reference voltages, for a particular sensing operation in a particular memory cell associated with those reference cells. Further details regarding such sensing operations are described in more detail below.

[0012] In various embodiments, the first reference cell 106 is a static reference cell configured to have a current distribution that is between the current distribution of a program operation and the current distribution of an erase operation. Thus, the current distribution and corresponding reference voltage of the static reference cell are limited by the current distributions of the program and erase operations. Thus, the mean and sigma, or variance term, of the reference current distribution in the static reference cell remain substantially constant over the life of the device 100.

[0013] In various embodiments, the second reference cells 108 are dynamic reference cells configured to have a current distribution that adjusts based on the aging of memory cells over the life of the device 100. Thus, in various embodiments, the dynamic reference cells may be programmed and erased along with their corresponding memory cells to accurately track changes that occur due to such program and erase operations. Such changes may include an increase in program and erase currents used for program and erase operations as memory cells age. Thus, the current distribution of the dynamic reference cells may be dynamic and may change over time. Thus, the dynamic reference cells have a reference voltage that is tied to memory sector activity and changes over time, while the static reference cells are not tied to memory sector activity and do not change over time as much as the dynamic reference cells. As described in more detail below, the reference levels may be determined using a combination of static and dynamic reference cells.

[0014] Device 100 further includes a sense amplifier 110 configured to perform the sensing operations described above. More specifically, sense amplifier 110 may be an operational amplifier with one input terminal coupled to a memory cell, such as memory cell 111, and another input terminal tied to one or more reference cells. In this manner, sense amplifier 110 may compare a sensed voltage of a memory cell to a reference voltage determined by one or more reference cells, as described in more detail below. Additionally, sense amplifier 110 may be included in or coupled to a comparator to perform memory state determination.

[0015] The device 100 further includes various switches, such as switch 112. In various embodiments, the switches are configured to selectively couple various bit lines together to average the voltages represented by the reference cells on those bit lines. More specifically, as shown in FIG. 1, switches 112, 114 and 116 are closed to couple bit line 102, bit line 118, bit line 120 and bit line 122. As also shown in FIG. 1, bit line 102 is coupled to the first reference cell 106 and the second reference cell 108, bit line 118 is coupled to the third reference cell 124 and the fourth reference cell 126, bit line 120 is coupled to the fifth reference cell 128 and the sixth reference cell 130, and bit line 122 is coupled to the seventh reference cell 132 and the eighth reference cell 134.

[0016] As shown in FIG. 1, switches 112, 114, and 116 are closed to average the reference voltages on bit lines 102, 118, 120, and 122. As described in more detail below, each dynamic reference cell may have a relatively large variance in its reference voltage / current due to differences in MOSFET device characteristics as well as differences in corresponding sector activity. Such averaging of the reference voltages can substantially reduce the variance in the reference voltage / current, thus extending the life and operation of device 100. As shown in FIG. 1, complementary switches, such as switches 136, 138, and 140, are open.

[0017] 1 shows four sets of reference cells used in combination, it can be understood that any number of sets may be used. For example, eight sets of reference cells can be used to further reduce the variance of the reference voltages and currents. For example, the variance of the reference current in a single pair of static and dynamic reference cells may be given by Equation 1 shown below.

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[0018] When used in combination, averaging of the reference currents can reduce the total variance. For example, capacitance averaging of four pairs of static and dynamic reference cells can further reduce the variance as shown in Equation 2 below.

number

[0019] Furthermore, capacitance averaging of eight pairs of static and dynamic reference cells can further reduce the variance, as shown in Equation 3 below.

number

[0020] In some embodiments, the number of sets of reference cells used may be dynamically updated and changed over the life of device 100. For example, after a specified number of program and / or erase operations, eight sets of reference cells may be used instead of four. In this manner, the number of sets of reference cells may be dynamically selected to further improve the efficiency and life of device 100.

[0021] 2 illustrates an example of another device for dynamic sensing level determination, configured in accordance with some embodiments. As previously described, a memory device such as device 200 may include various memory cells that may be programmed to store memory values. Also, as described in more detail below, the reference levels used in such sensing operations may be dynamically determined to compensate for changes that may occur due to aging and / or use of the memory cells. More specifically, a combination of reference cells may be used to determine a reference voltage for the sensing operation, while also compensating for the dispersion of such reference cells.

[0022] In various embodiments, the device 200 includes a first reference cell 106, a second reference cell 108, and a sense amplifier 110, as described above with reference to Figure 1. As shown in Figure 2, the first reference cell 106 and the second reference cell 108 are coupled to a bit line 102, which is coupled to an input terminal of the sense amplifier 110. Further, as shown in Figure 2, multiple sets of reference cells may be coupled to the input terminal of the sense amplifier 110 via one or more switches, as described above with reference to Figure 1. Additionally, an additional bit line 202 is coupled to the memory cell 204 and also coupled to an additional input terminal of the sense amplifier 110.

[0023] In some embodiments, four sets of reference cells are coupled to the input terminals of the sense amplifier 110. Thus, the reference voltage may be determined based on Equation 4 shown below.

number

[0024] In Equation 4, V pre_charge may be the precharge voltage used to charge the memory cell to be read during the sensing operation. Thus, V pre_charge is a specified voltage known to the device 200. Similarly, t sense And C bl and C sa may be known to the device 200 or may be determined based on measured behavior of the bit lines and / or sense amplifiers. In various embodiments, the capacitance and time values ​​are determined during the design process. For example, C bl and C sa The known values ​​such as may be determined by the manufacturer using a simulation tool such as SPICE. sense Timing values ​​such as I may be determined by a manufacturer during the manufacturing process to meet timing specifications or performance parameters. ref_av Further clarification of is given by Equation 5 shown below.

number

[0025] Therefore, I ref_av may be determined by averaging the measured currents of each of the pair of reference cells, and the averaged current measurements may be used to determine a reference voltage based on Equation 4 above. In this manner, the measurements of the set of reference cells may be used to determine a reference current and a reference voltage, which are then provided to an input terminal of a sense amplifier, such as sense amplifier 110. As shown in FIG. 2, this reference voltage may be compared to a measured current and voltage obtained from a memory cell 204 that is coupled to the other input terminal of sense amplifier 110 via a bit line 202, and the output of sense amplifier 110 may provide an indication of the result of the sensing operation and the memory state stored in memory cell 204.

[0026] It may be understood that the embodiments disclosed herein may use different combinations of static and dynamic reference cell configurations. As previously mentioned, a set or group of reference cells may include four static reference cells and four dynamic reference cells. In one example, all four static reference cells may be programmed to the same reference voltage and reference current / conductance. In various embodiments, the programming and erasing operations described herein may refer to full programming and full erasing. Furthermore, all dynamic reference cells may be programmed according to the program operation of device 200. In other examples, all four static reference cells may be programmed to the same reference voltage, while some dynamic reference cells are programmed and one or more dynamic reference cells remain in an erased state. In yet other examples, all four static reference cells may be programmed to the same reference voltage, while one or more, or all, of the dynamic reference cells may be partially programmed or partially erased. Furthermore, all four static reference cells may be programmed to the same reference voltage, and the dynamic reference cells may be disabled and not used during the average reference voltage determination. Thus, different implementations of static and dynamic reference cells can be used to configure the reference current behavior to track the behavior of memory cells with improved accuracy.

[0027] 3 illustrates an example of yet another device for dynamic sensing level determination, configured in accordance with some embodiments. As also previously described, a memory device such as device 300 can include various memory cells that can be programmed to store memory values ​​as well as associated reference cells. As described in more detail below, transistors can be used to implement bit line selection logic as well as the previously described switches.

[0028] Thus, device 300 may include various sense amplifiers, such as sense amplifier 302, amplifier 304, amplifier 306, and amplifier 308. The sense amplifiers may be coupled to various bit lines of the mirrored memory sectors and their associated memory cells and reference cells. As shown in FIG. 3, transistors, such as first transistor 310 and second transistor 312, may be used to selectively couple bit lines, such as bit line 314 and bit line 316, to sense amplifiers, such as sense amplifier 302. Additionally, various transistors, such as third transistor 318, may be used to couple bit lines, such as bit line 316 and bit line 320, to one another. In this manner, various selection transistors may be used to perform the averaging of the aforementioned currents and measurements. In various embodiments, the operation of the selection logic as well as other transistors may be controlled by a device or system component, such as a memory controller.

[0029] 4 illustrates an example of a method for dynamic sensing level determination, configured in accordance with some embodiments. Similar to that described above, various memory cells may be programmed to store memory values. Additionally, methods such as method 400 may be performed with respect to dynamically determined reference levels used for read operations performed on such memory cells. In this manner, the reference levels used in such sensing operations may be dynamically determined to compensate for changes that may occur due to aging and / or use of the memory cells.

[0030] Method 400 may perform operation 402 in which a plurality of reference cells may be selected. As also described above, the plurality of reference cells may include one or more sets of reference cells. Furthermore, the reference cells may include static and dynamic reference cells. Thus, during operation 402, a group or set of reference cells may be selected, and one or more switches may be configured to couple bit lines of the identified reference cells. In various embodiments, the reference cells are identified based on a particular memory cell identified for a read or sense operation. Thus, the associated reference cells may be identified based on a designated mapping and / or complementary addressing scheme used in the mirrored memory sector.

[0031] The method 400 may perform an operation 404 in which a reference value may be determined. Thus, as described in more detail below, a voltage may be applied to the reference cells as well as to the bit lines associated with the memory cells. The cells may be activated to discharge the voltage and thus provide one or more discharge currents. As described in more detail below, coupling of the switches may couple the bit lines of the reference cells together, thus averaging the discharge currents in the selected reference cells and providing a reference value seen by the input terminals of the sense amplifiers coupled to the reference cells.

[0032] The method 400 may perform an operation 406 in which the memory cell state may be determined based at least in part on the averaged reference voltage. As previously described, the transistors under the reference cell and the memory cell may be turned on and the sense amplifier may determine whether the reference cell or the memory cell discharges faster and may perform a corresponding voltage comparison. The memory state of the memory cell may be determined based on the result of the discharge behavior, as may be inferred from the conductance behavior previously described in connection with the programmed and erased states. More specifically, the voltage of the memory cell above the averaged reference voltage may identify a first memory state, and the voltage of the memory cell below the averaged reference voltage may identify a second memory state. As previously described, the discharge current of the reference cell is capacitively averaged, thus dramatically reducing the individual variance of the reference cells, allowing for greater accuracy and reduced error rates in memory state determination.

[0033] 5 illustrates an example of another method for dynamic sensing level determination, configured in accordance with some embodiments. As previously described, reference levels may be dynamically determined for read operations performed on such memory cells. Thus, a method such as method 500 may be performed to identify and select a particular reference cell for a particular memory cell, and to utilize multiple reference cells for a single memory cell. In this manner, the reference levels used in such sensing operations may be dynamically determined to compensate for changes that may occur due to aging and / or use of the memory cells.

[0034] The method 500 may perform an operation 502 in which a memory cell may be identified. In various embodiments, the identified memory cell may be a memory cell identified for a read operation or other memory operation. Thus, the memory cell may be identified as part of an operation of the memory device. In one example, the memory cell may be identified based on one or more identifiers or data values ​​included in a memory access request.

[0035] The method 500 may perform an operation 504 in which a first plurality of reference cells may be identified. In various embodiments, the first plurality of reference cells includes static reference cells and dynamic reference cells. For example, the reference cells may include static reference cells and dynamic reference cells included on complementary bit lines as the identified memory cells. Thus, the memory cells may be included in a mirrored architecture, as previously described. The static reference cells and dynamic reference cells may be identified based on the complementary relationship of the cells and / or a predefined mapping stored in memory.

[0036] The method 500 may perform an operation 506 in which a second plurality of reference cells may be identified. The second plurality of reference cells includes additional static and dynamic reference cells used in combination with the first plurality of static and dynamic reference cells, similar to that described above. More specifically, additional reference cells may be identified during operation 506 to be used for current averaging and variance reduction of the reference values. Although operations 504 and 506 are described separately, it may be understood that they may be performed simultaneously and / or as part of the same operation. Thus, operations 504 and 506 may be combined and performed as a single operation.

[0037] In some embodiments, the second plurality of static and dynamic reference cells may be identified based at least in part on a specified mapping or set of rules. For example, based on a specified number of bit lines, which may have been determined during a configuration process of the memory device, static and dynamic reference cells may be identified for the next three bit lines. In this manner, additional reference cells may be identified using one or more predetermined rules. In various embodiments, the second plurality of reference cells may be identified based on logic implemented in firmware. In some embodiments, the second plurality of reference cells is identified based on programmable software. It may be understood that the second plurality of reference cells may be any suitable number of reference cells.

[0038] The method 500 may perform an operation 508 in which the first plurality of static memory cells and the reference cell are coupled to a second plurality of static memory cells and the reference cell. Thus, switches may be closed to couple the bit lines together and may also couple the terminals of the reference cells together. As previously mentioned, the reference cell may also be coupled to an input terminal of a sense amplifier associated with the identified memory cell. In this manner, the reference cell may be coupled to a first input terminal of the sense amplifier and the identified memory cell may be coupled to a second input terminal of the same sense amplifier.

[0039] The method 500 may perform an operation 510 in which a precharge voltage is applied to a plurality of bit lines. Thus, a voltage may be applied to the bit lines to charge them to a predetermined voltage. As previously discussed, the precharge voltage is a predetermined voltage that may be used for scanning operations as well as other memory operations.

[0040] Method 500 may perform an operation 512 that may generate one or more discharge currents. Thus, the gates of the reference cells and memory cells may be opened or activated, and the charge voltage may be discharged through the transistors underlying the reference cells and memory cells. As previously described, the discharge current may be averaged with respect to the selected reference cells because the selected reference cells are coupled together through the switches, and one or more capacitances, such as bit line capacitance and sense amplifier capacitance, may further provide capacitive averaging. As previously described with reference to Equations 1-3, the reference cells are coupled together and the currents of the reference cells are capacitively averaged, so that the individual variance of the reference cells is reduced.

[0041] The method 500 may perform an operation 514 in which a reference value may be determined. The reference value thus appears on the bit line coupled to the input terminal of the sense amplifier as a result of the averaged discharge current. Thus, a reference value corresponding to the capacitive averaging of the discharge current may be determined. In this manner, the variance of the reference voltage represented by the reference cell is also reduced, improving the accuracy of the determination and application of the dynamic reference voltage, and thus resulting in a lower bit error rate and longer life of the memory device disclosed herein.

[0042] The method 500 may perform an operation 516 that may determine a memory state based at least in part on the reference value. As previously described, the discharge rate of the voltage and current affects the output of the sense amplifier to provide an indication of whether the memory cell has a higher or lower conductance / threshold voltage than the reference cell, and therefore whether the memory cell is in a programmed or erased state. More specifically, if the voltage of the memory cell is lower than the averaged reference voltage, the memory cell may be determined to be in an erased state. If the voltage of the memory cell is higher than the averaged reference voltage, the memory cell may be determined to be in a programmed state.

[0043] 6 illustrates an example of yet another method for dynamic sensing level determination, configured in accordance with some embodiments. As previously described, reference levels may be dynamically determined for operations performed on memory cells. Thus, a method such as method 600 may be performed to identify and select a particular memory sector and identify a reference cell within the particular memory sector. In this manner, the reference levels used in such sensing operations may be dynamically determined in a manner compatible with memory sector architectures such as mirrored memory arrays.

[0044] The method 600 may perform an operation 602 that may identify a memory cell and a memory sector. As previously described, the identified memory cell may be a memory cell identified for a read operation or other memory operation, and may be identified as part of an operation of the memory device. In one example, the memory cell may be identified based on one or more identifiers or data values ​​included in the memory access request. Additionally, a memory sector associated with the cell may be identified. For example, the memory sector that includes the memory cell may be identified based on a specified mapping.

[0045] Method 600 may perform operation 604, in which multiple reference cells may be selected. In various embodiments, the reference cells may include static and dynamic reference cells coupled to complementary bit lines as the identified memory cell, and may be included in a mirrored architecture. More specifically, the memory sector identified during operation 602 may be used to identify a mirrored or complementary memory sector, and the appropriate reference cell may be identified within the complementary memory sector. Thus, static and dynamic reference cells may be identified based on the complementary relationship of the cells and sectors identified by the mapping stored in the memory. Similar to the above, the reference cells may be used for current averaging and variance reduction of the reference values.

[0046] The method 600 may perform an operation 606 in which a pre-charge voltage may be applied to a number of bit lines. Thus, a voltage may be applied to the bit lines to charge them to a predetermined voltage. As previously mentioned, the pre-charge voltage is a predetermined voltage that may be used for scanning operations as well as other memory operations.

[0047] The method 600 may perform an operation 608 in which a memory state may be determined based at least in part on the averaged discharge currents and averaged reference voltages of the plurality of static memory cells and the reference cell. As previously described, the gates of the reference and memory cells may be opened or activated, and the charge voltage may be discharged through transistors below the reference and memory cells. Also, as previously described, the rate of voltage discharge affects the output of the sense amplifier, providing an indication of whether the memory cell has a higher or lower conductance than the reference cell, and therefore whether the memory cell is in a programmed or erased state.

[0048] Method 600 may perform operation 610 where it may be determined whether other memory cells and memory sectors should be selected. Thus, if additional memory cells are to be read or scanned as part of the requested operation, those cells may be identified and method 600 may return to operation 602. If additional memory cells and memory sectors are not to be selected, method 600 may end.

[0049] 7 illustrates an example of a system configured according to some embodiments. According to certain exemplary embodiments, the system 700 may be suitable for implementing various components described above, such as the device 100, the device 200, and the device 300. In various embodiments, the system 700 may include a processor 701 that may be configured to perform one or more processing operations. For example, the processor 701 may be configured to perform a selection and scanning operation, and may further be configured to perform a memory state determination operation. The system 700 may also include a bus 715 that may be configured to enable communication between various components of the system 700.

[0050] In various embodiments, the system 700 may further include a memory array 702 and a control circuit 728 that may be configured to perform aspects of the selection and scanning operations described above. In various embodiments, the control circuit 728 may include one or more processors and dedicated memory that may be configured to perform the operations described above. In this manner, the system 700 may have a dedicated processing unit, such as the control circuit 728, that may be configured to perform the selection and scanning operations described above. In one example, the control circuit 728 is a memory controller. Further, in some embodiments, the control circuit 728 may be implemented in an application specific integrated circuit (ASIC) or in the reprogrammable logic of a field programmable gate array. In some embodiments, the control circuit 728 may be implemented in a programmable system or controller that further includes non-volatile memory, such as a programmable system-on-chip or PSoC™ controller available from Cypress Semiconductor of San Jose, Calif. In various embodiments, one or more components of the system 700 may be implemented on the same circuit die and in the same package. For example, the control circuit 728 and the memory 702 may be implemented on the same circuit die. In some embodiments, they may be implemented in different dies and different packages.

[0051] In various embodiments, the communications interface 711 may be configured to send and receive data to and from other system components, and may be configured to send and receive packets or data segments over a network. For example, the communications interface 711 may be communicatively coupled to a user interface device via a bus, such as bus 715, or over a communications network. As previously mentioned, the communications interface 711 may be configured to receive data from such user interface devices, which may be included in a data processing system or computer system. In various embodiments, such data may include data requests for applications executed by such computer systems.

[0052] 8 shows an example of a memory sector included in a device for dynamic sensing level determination, configured according to some embodiments. As described in more detail below, the memory sector may be configured to be mirrored. For example, a pair 804 of normal sectors 802 of a NOR flash memory 803 is accompanied by a sense amplifier 820 that generates an output signal according to the previously described embodiment. In this example, each normal physical sector 802 includes four erase sectors, also called E-sectors 808, and a pair 804 includes two normal sectors 802 that sandwich a dynamic reference word line (DREF WL), a static reference word line (static REF WL) and a sense amplifier (SA).

[0053] In one embodiment, as an example, the physical sector pair 804 includes eight E-sectors. As shown in FIG. 8, E-sectors 0-3 are mirrored to E-sectors 4-7. Sensing of data located above or on one side of the SA is performed on the other side of the SA (and vice versa). For example, memory cells in E-sector 0 are sensed using static and dynamic reference cells at the bottom or other side of the SA. In various embodiments, the selection, combination and algorithms for combining dynamic and static reference cells are disclosed in earlier portions of this patent document.

[0054] Although the foregoing concepts have been described in some detail for clarity of understanding, it will be apparent that certain changes and modifications may be implemented within the scope of the appended claims. It should be noted that there are many alternative ways of implementing the processes, systems and devices. Thus, the present examples should be considered as illustrative and not restrictive.

Claims

1. a plurality of non-volatile memory cells included in a plurality of memory sectors; a plurality of static reference cells configured to represent a first reference value for distinguishing between memory states; a plurality of dynamic reference cells configured to represent the first reference value after a specified amount of memory sector activity; a comparator configured to be coupled to at least one memory cell of the plurality of memory cells and to at least two of the plurality of static reference cells and the plurality of dynamic reference cells, and further configured to determine a memory state of the at least one memory cell based at least in part on a second reference value determined based on an averaging of a combination of at least two of the plurality of static reference cells and the plurality of dynamic reference cells; 16. A device comprising:

2. the plurality of memory sectors are configured as mirrored erase sectors, and the plurality of memory cells are coupled to a plurality of bit lines and a plurality of word lines; The device of claim 1 .

3. the device further comprising a plurality of switches configured to couple at least some of the plurality of bit lines together during a sensing operation. The device of claim 2.

4. the sensing operation is performed on the at least one memory cell, and each of the at least some of the plurality of bit lines is coupled to a static reference cell, and the at least some of the plurality of bit lines comprises a number of bit lines equal to a number of static reference cells coupled to the comparator. The device of claim 3.

5. each of said at least some of said plurality of bit lines is further coupled to a dynamic reference cell in a mirrored memory sector corresponding to the memory sector of said at least one memory cell; The device of claim 4.

6. at least one of the dynamic reference cells coupled to the at least some of the plurality of bit lines is in a fully erased or partially erased state; The device of claim 5.

7. the dynamic reference cell having a reference value that is partially or fully programmed; The device of claim 5.

8. the second reference value is determined based on a capacity averaging of discharge current through the at least some combinations of the plurality of static reference cells and the plurality of dynamic reference cells. The device of claim 1 .

9. the combination comprises two or more pairs of a static reference cell and a dynamic reference cell; The device of claim 8.

10. the capacitance averaging is configured to reduce variance of the first reference values ​​represented by the at least some of the plurality of static reference cells and the plurality of dynamic reference cells. The device of claim 8.

11. identifying a memory cell among a plurality of memory cells included in a plurality of memory sectors; selecting, using a plurality of switches, a plurality of reference cells comprising at least two of a plurality of static reference cells and a plurality of dynamic reference cells and associated with the memory cell; determining a reference value based on an averaging of the at least two combinations of the plurality of static reference cells and the plurality of dynamic reference cells; determining a state of the memory cell based at least in part on the reference value using a comparator; The method includes:

12. the combination of the at least two of the plurality of static reference cells and the plurality of dynamic reference cells is included in a mirrored erase sector corresponding to the memory sector of the identified memory cell. The method of claim 11.

13. said step of identifying a memory cell is included in a sensing operation performed at least in part by a sense amplifier; The method of claim 11.

14. the reference value is determined based on a capacity averaging of discharge current through the combination of the at least two of the plurality of static reference cells and the plurality of dynamic reference cells. The method of claim 11.

15. the combination comprises two or more pairs of a static reference cell and a dynamic reference cell; The method of claim 14.

16. the capacitance averaging reduces variance in reference voltages represented by at least some of the plurality of static reference cells and the plurality of dynamic reference cells. The method of claim 14.

17. identifying a memory cell among a plurality of memory cells included in a plurality of memory sectors; coupling the memory cell to a comparator; selecting a plurality of reference cells using a plurality of switches, the plurality of reference cells comprising at least two of a plurality of static reference cells and a plurality of dynamic reference cells; coupling the plurality of reference cells to the comparator; applying a precharge voltage to a plurality of bit lines coupled to the memory cells and the plurality of reference cells; discharging the precharge voltage through the memory cell and the plurality of reference cells; using the comparator to determine a state of the memory cell based at least in part on a result of the discharge and an averaging of the discharge through the plurality of reference cells; The method includes:

18. the at least two of the plurality of static reference cells and the plurality of dynamic reference cells are included in a mirrored erase sector corresponding to the memory sector of the identified memory cell; 20. The method of claim 17.

19. the step of discharging further comprises generating a discharge current through the plurality of reference cells, the discharge current being capacity-averaged.

20. The method of claim 17.

20. The method further includes determining a reference value based on the discharge current.

20. The method of claim 19.

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