Probe cleaning sheet with enhanced cleaning power and method for manufacturing the same

Abstract

To provide a probe cleaning sheet with enhanced cleaning power for surely and thoroughly cleaning a probe tip surface and a side surface, and to provide a method for manufacturing the same.SOLUTION: A probe cleaning sheet 10 includes a cleaner layer 20, a polishing layer 40, a release layer 50, and a base material layer 60, wherein a plurality of polishing cleaning particles are mixed in the cleaner layer 20, and a plurality of abrasive grains are mixed in the polishing layer 40. The manufacturing method includes a first kneading step S1, a first processing step S2, a second kneading step S3, a figure forming step S4, a polishing step S5, and an upper film processing step S6. In a probe cleaning sheet 10, after the release layer 50 is peeled from the polishing layer 40, primary cleaning and thorough cleaning are performed by the polishing layer 40 to scrape off the dirt, and the silicone rubber of the cleaner layer 20 has electrostatic and lipophilic properties to transfer the dirt on the probe onto the cleaner layer 20.SELECTED DRAWING: Figure 1

Description

[Technical field]

[0001] The present invention relates to a probe cleaning sheet with enhanced cleaning power and a manufacturing method thereof, which is particularly applicable to the electronics and mechanical field, and is mainly used for cleaning probes. [Background technology]

[0002] In the testing of electronic components (such as final test (FT) or chip probing (CP), but not limited to these), electrical measurements are usually made using probe pins. If there is a foreign object or a scratch on the probe, it will affect the test results of the electronic components.

[0003] By the way, there is a cleaning sheet that removes foreign matter attached to the tip of a probe, which includes an elastic base material composed of a substrate and a cleaner layer on the substrate. The cleaner layer includes a silicone resin and / or a silicone elastomer obtained by crosslinking a polysiloxane having a siloxane structure, and a plurality of abrasive grains added thereto. The abrasive granules are composite particles composed of a parent particle and a number of child particles attached or bonded to the periphery of the parent particle, the average particle diameter of the parent particle is between 1 um and 20 um, the average particle diameter of the child particles is within a range of 1 / 10 or more and 1 / 1000 or less of the average particle diameter of the parent particle, the mother particle is an elastic organic particle, and the child particles are inorganic particles. (See Patent Document 1 for an example.)

[0004] In addition, the mother particles of the above-mentioned probe cleaning sheet are elastic organic particles, and the child particles are bonded to the circumferential surface of the mother particles. Therefore, in the process of piercing the probe, the abrasive granules in contact with the probe surface are reduced, and the abrasive particle size and the amount of deformation caused by compression when pressure is applied are limited in the polishing process, so the polishing effect is only on the needle tip surface, and the needle tip side is not polished effectively. Since the dirt on the probe is not only on the needle tip surface, the probe cannot be cleaned efficiently. [Prior art documents] [Patent documents]

[0005] [Patent Document 1] Japanese Patent JP5437667 published: Cleaning sheet for cleaning probe tips Summary of the Invention [Problem to be solved by the invention]

[0006] The main object of the present invention is to reliably clean the surface and side surfaces at the tip of a probe, thereby improving the problem of poor cleaning effect due to the cleaning effect of known techniques and restrictions on the cleaning position relative to the probe. [Means for solving the problem]

[0007] In order to achieve the above-mentioned objects and effects, the present invention is divided into two parts. First, the probe cleaning sheet with enhanced cleaning power of the present invention includes: The cleaner layer contains a plurality of abrasive cleaning particles, each of which is composed of a plurality of cleaning molecular particles, and is made of silicone rubber. An abrasive layer is disposed on one side of the cleaner layer, and a plurality of abrasive grains are mixed in the abrasive layer. A release layer is removably affixed to one side of the abrasive layer, and the release layer is molded on an opposite side of the cleaner layer. A substrate layer is disposed on one side of the cleaner layer and molded to the opposite side from the abrasive layer. When the release layer is peeled off from the abrasive layer, the probe is first cleaned by the abrasive grains in the abrasive layer, and when the probe penetrates deeper into the cleaner layer, the probe penetrates deeper into the abrasive cleaning grains in the cleaner layer and is cleaned, scraping off and removing dirt, and the silicone rubber in the cleaner layer has electrostatic and oleophilic properties, so that the dirt on the probe is transferred onto the cleaner layer.

[0008] Another main technology of the present invention is the manufacturing process, which is the manufacturing method of the probe cleaning sheet with enhanced cleaning power. The steps include: In the primary mixing step, silicone rubber and abrasive powder are mixed in a special machine to form the mixed rubber, which is then molded into a high-density cleaning block using a die. The primary processing step involves crushing and grinding the high-density cleaning block with a dedicated machine to form a number of abrasive cleaning granules. In the secondary kneading step, the abrasive cleaning granules are again mixed with silicone rubber in a special machine and formed into a kneaded rubber material. In the plastic molding step, the kneaded rubber material is divided into equal parts, and any one of the kneaded rubber materials is placed on a substrate, and the kneaded rubber material and the substrate are placed in a mold, and the kneaded rubber material is molded into a cleaner layer. The polishing step includes mixing the silicon ink with a plurality of abrasive grains and printing the mixture on the top surface of the cleaner layer to form a polishing layer, which is attached to the cleaner layer by printing. In the upper film processing step, a release layer is detachably attached to the uppermost surface of the polishing layer to protect the polishing layer. Effect of the Invention

[0009] The probe cleaning sheet with enhanced cleaning power of the present invention and the method for producing the same have the following advantages: By installing each abrasive cleaning granule in the cleaner layer, after the probe tip is inserted, the probe tip and side are cleaned by each cleaning molecular particle contained in each abrasive cleaning granule, and transferred onto the silicone rubber of the cleaner layer, thereby firmly cleaning the probe tip surface and side surface reliably and thoroughly. Therefore, it can be said that the present invention has practicality and inventive step, and should be promoted in the industry and made public. [Brief description of the drawings]

[0010] [Figure 1] FIG. [Diagram 2]FIG. 2 is a cross-sectional view taken along line II-II of FIG. [Diagram 3] FIG. 3 is an enlarged view of a part of FIG. 2. [Figure 4] FIG. 2 is a step block diagram of the present invention. [Diagram 5] FIG. 2 is a step flow chart of the present invention. [Figure 6] FIG. 2 is a diagram showing the usage state of the probe of the present invention after it is inserted into the cleaner layer. [Figure 7] FIG. 13 is a diagram showing the usage state after the probe of the present invention is removed. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0011] (One embodiment) In order to clearly explain the above-mentioned objects and effects of the present invention, the features and effects are described in detail with examples and diagrams. As shown in Figures 1 to 7, the present invention has two main technologies. First, the structure will be described. The probe cleaning sheet with enhanced cleaning power of the present invention is a probe 100 commonly used in the cleaning machine field. The probe cleaning sheet 10 includes: The cleaner layer 20 contains a plurality of abrasive cleaning particles 201 arranged at unequal distances from each other, and each abrasive cleaning particle 201 is composed of a plurality of cleaning molecular particles 202. The cleaning molecular particles 202 are arranged in a dispersed manner. The cleaner layer 20 is made of silicone rubber 30. The abrasive layer 40 is disposed on one side of the cleaner layer 20, and a plurality of abrasive grains 401 are mixed in the abrasive layer 40, and the density of each abrasive grain 401 in the abrasive layer 40 is greater than the density of the plurality of cleaning molecule grains 202 in each abrasive cleaning grain 201. A release layer 50 is removably attached to one side of the polishing layer 40, and the release layer 50 faces the cleaner layer 20. The release layer 50 mainly protects the polishing layer 40 before use of the probe cleaning sheet 10, and prevents dirt from adhering to the polishing layer 40 and affecting cleaning. A substrate layer 60 is disposed on one side of the cleaner layer 20 and molded opposite the abrasive layer 40 . When the release layer 50 is peeled off from the polishing layer 40, the probe 100 is first cleaned by the abrasive grains 401 in the polishing layer 40, and when the probe 100 penetrates deeper into the cleaner layer 20, the probe 100 penetrates deeper into the abrasive cleaning grains 201 of the cleaner layer 20 and is cleaned, scraping out and removing dirt, and the silicone rubber of the cleaner layer 20 has electrostatic and oleophilic properties, so that the dirt on the probe 100 is transferred onto the cleaner layer 20 (for example, the hollow circle at the depression formed at the bottom after the probe 100 in Figure 7 is released represents the dirt).

[0012] A method for manufacturing the enhanced cleaning power probe cleaning sheet 10 is described below, which includes the steps: In the primary kneading step S1, silicon rubber 30 and abrasive powder 1 are kneaded in a dedicated machine to form kneaded rubber 2, and the kneaded rubber 2 is molded into a high-density cleaning block 3 by stamping. In the primary processing step S2, the high-density cleaning block 3 is crushed and polished by a dedicated machine to form a plurality of polished cleaning grains 201. In the secondary kneading step S3, the abrasive cleaning grains 201 are kneaded again with the silicone rubber 30 by a dedicated machine, and formed into a kneaded rubber material 4. In the plastic molding step S4, the kneaded rubber material 4 is divided into equal parts (divided into parts A to G in FIG. 5), and any one of the kneaded rubber materials 4 is taken and placed on a substrate 5 (this substrate 5 is the base material layer 60, and since they are separate objects in the manufacturing process, they are named substrate 5 and base material layer 60 to distinguish between the manufacturing process and structure. FIG. 5 mainly shows the solid line process from each kneaded rubber material 4 to the substrate 5 and then to the mold). The kneaded rubber material 4 is then placed together with the substrate 5 into the mold, and the kneaded rubber material 4 is molded into the cleaner layer 20 (when the substrate 5 is molded with the kneaded rubber material 4, it is first necessary to perform a surface treatment on the substrate 5. There are two types of treatment methods: a physical treatment such as plasma treatment, and a chemical treatment such as a smear treatment agent). The polishing step S5 also includes mixing the silicon ink 6 with a plurality of abrasive grains 401 and printing the mixture on the top surface of the cleaner layer 20 to form the polishing layer 40. The polishing layer 40 is applied to the cleaner layer 20 by printing. In the upper film processing step S6, a release layer 50 is detachably attached to the top surface of the polishing layer 40 to protect the polishing layer 40. (The above-mentioned molding method of the cleaner layer 20 may be to put the kneaded rubber material 4 into a mold and mold the kneaded rubber material 4 directly into the cleaner layer 20. After the polishing processing step S5 is completed, the kneaded rubber material 4 is directly sent to the mold as in the dotted line process, so that the backing rubber 7 is attached to the other side opposite the polishing layer 40. The backing rubber 7 and the substrate 5 are regarded as the same as the base layer 60, but depending on the difference in the molding of the kneaded rubber material 4, it can be molded with or without being placed on the substrate 5.)

[0013] The above is a description based on the structure and manufacturing method of the present invention, which mainly describes that each abrasive cleaning granule 201 is installed inside the cleaner layer 20, and each abrasive cleaning granule 201 is composed of a number of cleaning molecular granules 202. As can be seen from FIG. 2, each cleaning molecular granule 202 in each abrasive cleaning granule 201 is coated and irregularly arranged within each abrasive cleaning granule 201. Therefore, after the tip of the probe 100 performs primary cleaning by the abrasive layer, it then enters the cleaner layer 20 and is inserted into each abrasive cleaning granule 201. Therefore, during the puncturing process of the probe 100, there are more abrasive granules 401 that the probe can contact, Furthermore, due to the good envelopment of the outer surface of the polishing and cleaning particles 201 formed by the silicon rubber 30, and the addition of the primary cleaning of the polishing layer 40, the probe 100, which needs to penetrate deep into the layer where dirt is heavily accumulated, has a good cleaning effect. Compared with the type shown in FIG. 2 of the Japanese proposal listed as the conventional technology, it has excellent cleaning power, but the elastic compression of the conventional mother particle is greater than the probe piercing force, so the probe stops at the child particle. If the material around the composite mother particle is of low elastic compression, the probe will push the composite mother particle downward, and the polishing will be limited to the depression formed on the probe surface and will not be able to pierce, and the polishing depth will be insufficient. Therefore, the present invention has a better cleaning power than the conventional one. The above is shown in FIG. 6 and FIG. 7.

[0014] Next, other technical features of the present invention will be described. First, in order to ensure that the use of the probe cleaning sheet 10 starts from the polishing layer 40, the base layer 60 is a substrate or a rubber backing, and when the base layer 60 is a substrate, the material of the substrate is any one of a glass fiber board, a plastic board, a lead-free board, or a metal board, and when the base layer 60 is a rubber backing (not shown), the probe cleaning sheet 10 can be adhered to the machine base.

[0015] In addition, in the installation of each cleaning molecular particle 202, the present invention mainly treats the surface of each cleaning molecular particle 202 to enhance the cross-linking strength of the silicone rubber 30, and further effectively cleans the dirt on the surface of the probe 100. In addition, each cleaning molecular particle 202 is an abrasive grain with a particle length of 1 μm to 5 μm, and each cleaning molecular particle 202 is any one of inorganic fine particles of aluminum oxide, silicon nitride, boron nitride, silicon carbide, boron carbide, silicon dioxide, and diamond. The silicone rubber 30 used in the cleaner layer 20 is made of an epoxy resin, a polyurethane resin or an acrylic resin, thereby enhancing adhesion between each of the abrasive cleaning particles 201 . The silicone rubber of the cleaner layer 20 is a general-purpose type, a high-resilience type, a high-strength type, a mixture of a general-purpose type and a long-life type, or any one of a general-purpose type, a long-life type, and a high-strength type. When the silicone rubber of the high-density cleaning block 3 is a mixture of a general-purpose type and a long-life type, the mixture ratio of the general-purpose type and the long-life type is 0:1 to 1:1. The above is shown in Figures 2 and 3.

[0016] In the manufacturing process of the probe cleaning sheet 10, after the polishing step S5, the first baking step S7, the first cooling step S8, the second baking step S9 and the second cooling step S10 are further carried out. Through multiple baking and cooling processes, the connection between the polishing layer 40 and the cleaner layer 20 is further strengthened. In addition, the silicon ink 6 is made of silicon rubber, and each abrasive grain 401 is aluminum oxide. Furthermore, the grain diameter of each abrasive grain 401 is 1-5um, and the weight ratio of the silicon ink 6 to the abrasive grain 401 in the polishing layer 40 is 1:0.8-1:1.55. In summary, the present invention certainly improves the cleaning power, and the placement of each abrasive cleaning grain 201 improves the envelopment of the probe 100. In addition, the thickness of the cleaner layer 20 is reduced, and the risk of powder falling off is also reduced, so the probe cleaning sheet 10 with enhanced cleaning power and the manufacturing method of the probe cleaning sheet 10 of the present invention are unprecedented innovative structures, have not been published in any publications, and there are no similar products on the market, so they are certainly novel. In addition, the unique features and functions of the present invention are far beyond the conventional, so they are inventive compared to the publicly known, and comply with the requirements for patent applications under the Taiwan Patent Act, so an application is filed in accordance with the Act.

[0017] The above-described embodiments are merely the best specific examples of the present invention, and are not intended to limit the structural features of the present invention. Any changes or modifications that can be easily conceived within the scope of the present invention by a person skilled in the art are all within the scope of the claims of the present invention. [Explanation of symbols]

[0018] 100 Probes 10 Probe cleaning sheets 20 Cleaner Layer 201 Abrasive cleaning granules 202 Cleaning Molecular Granules 30 Silicone rubber 40 Polishing layer 401 Abrasive grain 50 Release layer 60 Base material layer S1 Primary mixing step S2 Primary processing step S3 Secondary mixing step S4 Plastic molding step S5 Polishing step S6 Upper film processing step S7 First firing step S8 First cooling step S9 Second firing step S10 Second cooling step 1 Polishing powder 2. Mixed rubber 3 High density wash block 4. Mixed rubber materials 5 Substrate 6 Silicone Ink 7 Rubber lining

Claims

1. A probe cleaning sheet having enhanced cleaning power, comprising a cleaner layer, an abrasive layer, a release layer, and a substrate layer, The cleaner layer has a plurality of abrasive cleaning particles mixed therein, and each abrasive cleaning particle is composed of a plurality of cleaning molecular particles, and the cleaner layer is made of silicone rubber; The polishing layer is disposed on one side of the cleaner layer, and a plurality of abrasive grains are mixed in the polishing layer, the release layer is detachably attached to one side of the polishing layer, and the release layer is disposed on the opposite side to the cleaner layer; The substrate layer is disposed on one side of the cleaner layer and on the opposite side of the polishing layer; When the release layer is peeled off from the abrasive layer, first the probe is cleaned by the abrasive grains in the abrasive layer, and when the probe penetrates deeper into the cleaner layer, the probe penetrates deeper into the abrasive cleaning grains in the cleaner layer and is cleaned, scraping out and removing dirt, and the silicone rubber in the cleaner layer has electrostatic properties and oleophilicity, so that dirt on the probe is transferred onto the cleaner layer. This is a probe cleaning sheet with enhanced cleaning power.

2. 2. A probe cleaning sheet with enhanced cleaning power as described in claim 1, characterized in that the base layer is a substrate or a backing rubber, and when the base layer is a substrate, the material of the substrate is any one of a glass fiber board, a plastic board, a lead-free board, and a metal plate.

3. 2. The probe cleaning sheet according to claim 1, wherein each of said cleaning molecular particles is subjected to a surface treatment.

4. 4. The probe cleaning sheet according to claim 3, wherein the length of each of said cleaning molecular particles is an abrasive powder particle having a diameter of 1 to 5 μm.

5. 5. The probe cleaning sheet with enhanced cleaning power according to claim 4, wherein each of said cleaning molecular particles is an inorganic fine particle selected from the group consisting of aluminum oxide, silicon nitride, boron nitride, silicon carbide, boron carbide, silicon dioxide and diamond.

6. 2. The probe cleaning sheet with enhanced cleaning power according to claim 1, wherein the silicone rubber in said cleaner layer is made of an epoxy resin, a polyurethane resin or an acrylic resin.

7. 7. The probe cleaning sheet with enhanced cleaning power as claimed in claim 6, wherein the silicone rubber of the cleaner layer is any one of a general-purpose type, a high-repulsion type, a high-strength type, a mixture of a general-purpose type and a long-life type, or a general-purpose type, a long-life type and a high-strength type.

8. 8. The probe cleaning sheet with enhanced cleaning power according to claim 7, wherein when the silicone rubber in the cleaner layer is a mixture of a general-purpose type and a long-life type, the mixing ratio of the general-purpose type to the long-life type is 0:1 to 1:

1.

9. A method for producing a probe cleaning sheet with enhanced cleaning power, comprising a primary kneading step, a primary processing step, a secondary kneading step, a plastic molding step, a polishing step, and an upper film processing step, In the primary kneading step, the silicon rubber and the abrasive powder are kneaded in a dedicated machine to form the kneaded rubber, and the kneaded rubber is molded into a high-density cleaning block by molding. In the primary processing step, the high-density cleaning block is crushed and polished by a dedicated machine to form a plurality of polished cleaning grains; In the secondary kneading step, each abrasive cleaning grain is kneaded again with silicone rubber in a dedicated machine to form a kneaded rubber material; In the plastic molding step, the kneaded rubber material is divided into equal parts, and one of the kneaded rubber materials is directly put into a mold to form a cleaner layer; In the polishing step, the silicon ink and a plurality of abrasive grains are mixed by stirring, and printed on the top surface of the cleaner layer to form a polishing layer, and the polishing layer is placed on the cleaner layer by printing; The method for manufacturing a probe cleaning sheet with enhanced cleaning power is characterized in that in the upper film processing step, a release layer is detachably attached to the uppermost surface of the polishing layer to protect the polishing layer.

10. 10. The method for manufacturing a probe cleaning sheet with enhanced cleaning power according to claim 9, further comprising the steps of a first baking step, a first cooling step, a second baking step and a second cooling step after the polishing step.

11. The method for manufacturing a probe cleaning sheet with enhanced cleaning power as claimed in claim 9, characterized in that the silicone ink is made of silicone rubber, each abrasive grain is spherical aluminum oxide, and the grain diameter of each abrasive grain is 1 to 5 um, and the weight ratio of the silicone ink to the abrasive grains in the abrasive layer is 1:0.8 to 1:1.

55.

12. A method for manufacturing a probe cleaning sheet with enhanced cleaning power as described in claim 9, characterized in that after the polishing step is completed, a step of adhering a backing rubber is continued, and after the installation of the abrasive layer is completed, a backing rubber is adhered to the side of the cleaner layer opposite the side on which the abrasive layer is provided.

13. 10. The method for manufacturing a probe cleaning sheet with enhanced cleaning power according to claim 9, characterized in that in the plastic molding step, any one of the kneaded rubber materials is taken and placed on a substrate, the kneaded rubber material is placed in a mold together with the substrate, and the kneaded rubber material is molded into the cleaner layer on the substrate.

14. 14. A method for manufacturing a probe cleaning sheet with enhanced cleaning power as claimed in claim 13, characterized in that before the substrate is placed in a mold together with the kneaded rubber material, the substrate is subjected to a surface treatment, the surface treatment method being a physical treatment or a chemical treatment, the physical treatment method being, for example, plasma treatment, and the chemical treatment method being, for example, the use of a smear treatment agent.

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