Program and measurement apparatus

Abstract

To provide a program and a measurement apparatus that enable proper and simple input of results of inspection.SOLUTION: A program causes a user terminal 10 to execute: a process of receiving an operation from a user to select an inspection target; a process of receiving an operation from the user to designate an inspection area in the inspection target; a process of receiving, from a measurement apparatus 30, a result of measurement conducted by the measurement apparatus 30 on the inspection area of the inspection target; and a process of storing, in a storage apparatus 20, the result of the measurement in association with the inspection target and the inspection area.SELECTED DRAWING: Figure 4

Description

[Technical field]

[0001] The present invention relates to a program, and more particularly to a program for causing a user terminal to execute processing for supporting an examination. The present invention also relates to a measuring device for use in inspecting buildings. [Background technology]

[0002] When inspecting multiple locations in a building or its construction site, the inspector records the inspection results for each location. There are various methods for recording the inspection results, one example being a method in which the inspector inputs and records information via a terminal used by the inspector. In this method, it is necessary to input each inspection location and the inspection results for each location.

[0003] Another method for recording the test results is to have the examiner speak the contents of the test results, convert the voice into text by speech recognition processing, and record the text (see, for example, Patent Document 1). Even when this method is adopted, the test results need to be entered for each test location, so the examiner must speak the test results for each test location. [Prior art documents] [Patent documents]

[0004] [Patent Document 1] JP 2017-084050 A Summary of the Invention [Problem to be solved by the invention]

[0005] Incidentally, it is desirable to make the input of test results easier, and the more test locations there are, the more convenient the input method is required. Naturally, the test results need to be input accurately, but input errors may occur, for example, when the test results are spoken or manually input.

[0006] Therefore, the present invention has been made in consideration of the above problems, and an object of the present invention is to provide a program and a measurement device for appropriately and simply inputting test results. [Means for solving the problem]

[0007] The above problem is solved by the program of the present invention by having a terminal device used by a user execute the following processes: a process of accepting from the user a selection operation of an object to be inspected; a process of accepting from the user a designation operation of an inspection point on the object to be inspected; a process of receiving from the measuring device the results of measurements performed by the measuring device on the inspection point on the object to be inspected; and a process of storing the results of the measurements in a storage device in association with the object to be inspected and the inspection point. According to the above program, the results of measurements performed for inspection can be accurately and easily stored in the storage device.

[0008] In addition, in the above program, when multiple inspection points are set on one inspection object, it is preferable to have the terminal device repeatedly execute, for each inspection point, a process of accepting a specified operation, a process of receiving the measurement results from the measuring device, and a process of storing the measurement results in a storage device in association with the inspection object and the inspection points. According to the above configuration, when a plurality of inspection points are set for one inspection object, the results of measurements performed at each inspection point can be accurately and easily stored in the storage device.

[0009] The above program may further cause the terminal device to execute a process of assigning an order to each of the designation operations received for each inspection location, and a process of assigning an order to each of the measurement results received for each inspection location. In this case, in the process of storing the measurement results in the storage device, the measurement results may be stored in the storage device in association with the inspection locations designated by the designation operations in the same order as the order assigned to the measurement results. According to the above configuration, for each of a plurality of inspection points set on one inspection object, the measurement results can be appropriately and easily associated with the inspection point and stored in the storage device.

[0010] In the above configuration, the designation operation may be an operation in which the user utters a voice indicating the inspection location. In this case, in the process of storing the measurement result in the storage device, the measurement result received immediately after the designation operation may be stored in the storage device in association with the inspection location designated by the designation operation. According to the above configuration, the inspection location is input by voice, the results of the measurement performed for the inspection are acquired, and the acquired measurement results are stored in the storage device in association with the inspection location. This makes it easier to store the results of the measurement performed for each inspection location in association with the inspection location.

[0011] Furthermore, the above program may cause the terminal device to execute the following processes in an inspection of an object to be inspected: accepting a designation operation for designating an inspection point of the object to be inspected, receiving a measurement result for the inspection point from a measuring device, and storing the measurement result in a storage device in association with the object to be inspected and the inspection point. In this case, the above program may cause the terminal device to execute the following processes: receiving again the measurement result for the inspection point from the measuring device, and updating the measurement result associated with the object to be inspected and the inspection point to the measurement result for the inspection point received again. According to the above configuration, when measurement results for an inspection point are stored and then measurement results for the same inspection point are acquired again, the remeasurement results can be stored in association with the inspection point.

[0012] The above program may further cause the terminal device to execute a process of displaying, on a display screen of the terminal device, an image for identifying the position of the inspection object and information related to the inspection location. According to the above configuration, the inspector can more easily confirm the position of the inspection object and the inspection location through the screen of the terminal device.

[0013] Furthermore, the above-mentioned problems are solved by the measuring device of the present invention, which is a measuring device equipped with a processor, by the processor executing a process of accepting from a user a selection operation of an object to be inspected, a process of accepting from the user a designation operation of an inspection point on the object to be inspected, a process of performing a measurement on the inspection point on the object to be inspected, and a process of outputting data for storing the results of the measurement in association with the object to be inspected and the inspection point. According to the above-described measuring device, the results of measurements performed for inspection can be stored accurately and easily.

[0014] In addition, in the above-mentioned measuring device, when multiple inspection points are set on one inspection object, the processor may repeatedly execute, for each inspection point, a process of accepting a designation operation, a process of performing measurement, and a process of outputting data for storing the measurement results in association with the inspection object and the inspection points. According to the above configuration, even when a plurality of inspection points are set for one inspection object, the results of measurements performed at each inspection point can be accurately and easily stored.

[0015] Furthermore, according to the program of the present invention, the above-mentioned problem is solved by having a terminal device used by a user execute the following processes: a process of accepting from the user a selection operation of an object to be inspected; a process of identifying an inspection point on the object to be inspected; a process of receiving from the reading device read data obtained by reading a point where measurement information is displayed on the measuring device when measurement is performed on the inspection point on the object to be inspected by the measuring device; a process of identifying a result of the measurement based on the measurement information identified from the read data; and a process of storing the result of the measurement in a storage device in association with the object to be inspected and the inspection point. According to the above program, even if the measurement results are not received from the measuring device, the measurement results can be accurately and easily stored in the storage device.

[0016] In addition, in the above program, the terminal device may further execute a process of receiving from a user a specific operation for identifying the positional relationship between the object to be inspected and the measuring device, and in the process of identifying the result of the measurement, the result of the measurement may be identified based on the measurement information and the positional relationship between the object to be inspected and the measuring device. According to the above configuration, the measurement result can be specified more accurately.

[0017] In addition, in the above program, in the process of receiving read data from the reading device, a captured image of a location where the measurement information on the measuring device is displayed and a location where the positional relationship between the object to be inspected and the measuring device can be determined is received from the reading device as read data, and in the process of identifying the result of the measurement, the captured image is analyzed to identify the positional relationship between the object to be inspected and the measuring device, and the result of the measurement may be identified based on the measurement information and the positional relationship between the object to be inspected and the measuring device. According to the above configuration, the result of the measurement can be more easily identified.

[0018] In addition, in the above program, when the degree of inclination of an object to be inspected is measured using a measuring device and the two directions that intersect with the direction in which the object to be inspected extend along the vertical direction are defined as a first direction and a second direction, the terminal device may be caused to execute a process of obtaining the degree of inclination at the first inspection location as a measurement result based on read data obtained by reading with a reading device a location where measurement information is displayed on the measuring device when attached to a first inspection location located on one side of the first direction on the object to be inspected, and a process of obtaining the degree of inclination at the second inspection location as a measurement result based on read data obtained by reading with a reading device a location where measurement information is displayed on the measuring device when attached to a second inspection location located on one side of the second direction on the object to be inspected. According to the above configuration, the test object can be measured from directions that intersect with each other, and the measurement results can be determined more accurately. Effect of the Invention

[0019] According to the present invention, it is possible to provide a program and a measuring device for appropriately and simply inputting test results. [Brief description of the drawings]

[0020] [Figure 1] FIG. 1 is a diagram showing the flow of an inspection. [Diagram 2] 1 is a diagram showing a configuration of an inspection system according to an embodiment of the present invention. [Diagram 3] FIG. 11 is a flow diagram of a process executed by a user terminal during an examination. [Figure 4] FIG. 13 is a diagram showing an example of a screen displayed on a user terminal during an examination. [Diagram 5] 10 is an explanatory diagram of a procedure for associating measurement results with an inspection object and an inspection point. FIG. [Figure 6] 13A and 13B are diagrams illustrating a modified procedure for associating measurement results with inspection objects and inspection points; [Figure 7] 1 is a diagram showing a configuration of a measurement apparatus according to an embodiment of the present invention. [Figure 8] FIG. 4 is a flow diagram of a process executed by a processor of the measuring device during inspection. [Figure 9] 13A to 13C are explanatory diagrams illustrating a procedure for attaching a measuring device according to a modified example of the present invention to an object to be inspected. [Figure 10] FIG. 2 is a plan view for explaining the positional relationship between an inspection object and a measuring device. [Figure 11] FIG. 11 is an explanatory diagram of an example of a measurement result. [Figure 12] FIG. 11 is a flow diagram of a process executed by a user terminal during an examination. [Figure 13] FIG. 13 is a diagram showing an example of a screen displayed on a user terminal during an examination. [Figure 14]13 is an explanatory diagram of a modified example of a procedure for setting an inspection object and an inspection point. FIG. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0021] Hereinafter, the present invention will be described with reference to the accompanying drawings, giving several specific embodiments of the present invention. Note that the basic data processing technologies (communication / transmission technology, data acquisition technology, data recording technology, data processing / analysis technology, voice recognition technology, natural language processing technology, image processing technology, visualization technology, etc.) required to realize the contents of each embodiment of the present invention are well-known technologies, and therefore will not be described here.

[0022] <<First embodiment of the present invention>> The first embodiment of the present invention relates to the inspection of buildings (including buildings under construction). Specifically, in the first embodiment, one or more inspection points are set for one or more inspection objects in a building, measurements are performed using a measuring device at each inspection point, and the measurement results at each inspection point are stored in a storage device as inspection results.

[0023] Here, buildings include detached houses, or collective housing such as condominiums and apartments, and may also include buildings other than houses, specifically, commercial facilities such as offices, shops, movie theaters, department stores, etc., public facilities such as hospitals, schools, etc., factories, buildings, etc. In the following, an example of an inspection carried out at a housing construction site will be described.

[0024] After a specified work (construction) is performed in a house construction project, an inspector performs an inspection to evaluate the appropriateness of the work by inspecting the building materials handled in the work (construction) as the inspection objects, as shown in Figure 1. The contents of the inspection are set according to the work and the building materials handled in the work.

[0025] To explain with a specific example, when construction work is carried out to install multiple pillars as building materials, each pillar becomes an inspection object, and the erection state of each pillar (i.e., the inclination of the pillar) is inspected. In the inspection, the deviation between the actual position and the reference position (e.g., the correct installation position) of the installed pillar, i.e., the construction error, is measured. The construction error is measured using a known measuring device, and specifically, as shown in FIG. 1, a measuring device 30 is attached to the pillar to be inspected, and a measurement is requested from the measuring device, which triggers the measurement of the construction error.

[0026] In addition, measurements of construction errors (hereinafter also referred to as inspection measurements) can be performed on each column from multiple directions; more specifically, measurements can be performed on the four side surfaces of a rectangular column as inspection points. For each pillar, it is possible to select either a pattern in which all four sides are the inspection points, or a pattern in which any one of sides 1 to 3 is the inspection point, and inspection measurements may be carried out according to the selected pattern.

[0027] When the inspection of one pillar, i.e., one inspection object, is completed, the results of the measurements taken for the inspection are recorded as the inspection results, as shown in Figure 1. The measurement results may be the numerical values ​​of the measured construction errors themselves, or they may be words, phrases, or abbreviations that indicate the suitability of the construction (pass / fail judgment result) such as "OK" or "NG" judged from the numerical values.

[0028] The measurement results as inspection results are stored in the storage device 20 (see FIG. 2) in association with the pillar and inspection location where the measurement results were obtained. Then, for one pillar, the measurement results of one or more inspection locations are stored as a record, and when the inspection of all pillars is completed, records showing the measurement results are accumulated in the storage device 20 for the number of installed pillars. In this way, a database of the measurement results of each pillar is constructed in the storage device 20.

[0029] Next, a description will be given of the examination support system S according to the first embodiment. The examination support system S is used by an examiner in the above-mentioned examination, and is configured with a user terminal 10, a storage device 20, and a measuring device 30, as shown in FIG.

[0030] The user terminal 10 is a terminal device used by an examiner, in other words, the examiner corresponds to a user of the user terminal 10. The user terminal 10 is configured, for example, by a smartphone, a mobile phone, a tablet terminal, a laptop type personal computer, a wearable terminal, or the like.

[0031] The storage device 20 stores the measurement results acquired by the user terminal 10, and accumulates the measurement results for all the poles installed in the house, as described above. The storage device 20 may be an auxiliary storage device (storage) mounted on the user terminal 10, or may be configured by a computer capable of communicating with the user terminal 10 via a network. The auxiliary storage device serving as the storage device 20 may include a NAS (Network Attached Storage). The computer serving as the storage device 20 may include an online storage or a database server.

[0032] The measuring device 30 is a device that measures a predetermined measurement item (specifically, construction error) at at least one inspection point for each pillar, and is a portable measuring device that can be carried by an inspector. Note that the shape and performance of the measuring device 30 are not particularly limited, and may be appropriately determined depending on the measurement item, measurement environment, measurement conditions, etc.

[0033] 2, the measurement device 30 includes a processor 31, a memory 32, and a communication interface 33. These devices have the same configuration as the processor 11, memory 12, storage 13, and communication interface 14 of the user terminal 10, or have a configuration similar thereto. After completing one measurement, the measurement device 30 outputs the measurement result, and more specifically, transmits data indicating the measurement result to the user terminal 10 via wired or wireless communication.

[0034] The configuration of the user terminal 10 will be described. As shown in FIG. 2, the user terminal 10 includes a processor 11, a memory 12, a storage 13, a communication interface 14, an input device 15, and an output device 16.

[0035] The processor 11 is composed of, for example, a CPU (Central Processing Unit), an MPU (Micro-Processing Unit), an MCU (Micro Controller Unit), a GPU (Graphics Processing Unit), a DSP (Digital Signal Processor), a TPU (Tensor Processing Unit), or an ASIC (Application Specific Integrated Circuit). The memory 12 is configured by semiconductor memories such as a Read Only Memory (ROM) and a Random Access Memory (RAM).

[0036] The storage 13 is composed of, for example, a flash memory, a hard disc drive (HDD), a solid state drive (SSD), a flexible disc (FD), a magneto-optical disc (MO disc), a compact disc (CD), a digital versatile disc (DVD), a secure digital card (SD card), or a universal serial bus memory (USB memory).

[0037] The communication interface 14 is configured by, for example, a network interface card or a communication interface board. The user terminal 10 is capable of data communication with other devices via the communication interface 14. Devices with which the user terminal 10 can communicate include a measuring device 30.

[0038] The input device 15 is configured, for example, by a touch panel, etc. The input device 15 also includes a recording device (sound collecting device) made up of a microphone, and a photographing device made up of a camera. The output device 16 is composed of, for example, a display device such as a display, a speaker, etc. The display device may be a display device provided in the user terminal 10 itself, or may be a display device connected to the user terminal 10 in a wired or wireless manner. Furthermore, the display device connected to the user terminal 10 may include a general stationary display, as well as an HMD (Head Mounted Display) such as VR goggles.

[0039] In addition, a program for an operating system and an application program for inspection (hereinafter, referred to as an inspection app) are installed as software in the user terminal 10. The inspection app corresponds to the program of the present invention, and may be acquired by reading it from a recording medium readable by the user terminal 10. Alternatively, the inspection app may be acquired by receiving (downloading) it via a network such as the Internet or an intranet.

[0040] The inspection application is read and executed by the processor 11, whereby the user terminal 10 performs its functions. In other words, the inspection application causes the user terminal 10 to execute a series of processes related to the inspection according to the flow shown in Fig. 4. To explain in detail, the processor 11 first accepts a setting operation related to the inspection contents from the inspector (S001). In the setting operation, the inspector sets the contents of the inspection to be performed, specifically, by selecting the corresponding inspection contents from a candidate list of inspection contents (not shown) displayed on the screen of the user terminal 10, and touching the contents on the screen.

[0041] Next, the processor 11 displays an image showing the positions of multiple pillars that are candidates for the inspection target and information on the inspection points of each pillar on the display screen of the user terminal 10 in order to identify the pillars to be inspected in the house to be inspected (more specifically, the construction site of the house) (S002). The displayed image is an image for identifying the position of the inspection target, and specifically, as shown in FIG. 3, is a plan view showing the installation locations of the pillars in the house to be constructed, and is also, for example, a design drawing or construction drawing drawn by BIM (Building Information Modeling) or CAD (Computer Aided Design). The display data of the image is stored in the storage 13 of the user terminal 10. As shown in Figure 3, the information on the inspection points for each pillar is a diagram showing the inspection points for each pillar and their positional relationship with the pillar, for example, information indicating the position and direction of each of the multiple inspection points set for each pillar, specifically, an input field for the measurement results provided in that direction, and a symbol assigned to each inspection point.

[0042] In addition, an image for identifying the position of the above-mentioned inspection target is displayed in the left half area of ​​the display screen shown in Fig. 3. In this image, the circled numbers indicate the identification numbers of the pillars, and the positions where the numbers are arranged indicate the installation locations of the pillars in the building. In addition, the right half of the display screen shown in Figure 3 displays information about the inspection points; specifically, a screen is displayed showing the four inspection points on the pillar being inspected and the measurement results at each inspection point. In addition, the image for identifying the position of the object to be inspected and the information regarding the inspection location may be displayed simultaneously on one screen as shown in FIG. 3, or may be displayed individually on separate screens by switching the screen, etc.

[0043] Next, the processor 11 accepts from the inspector a selection operation for a pillar as an object to be inspected and a designation operation for an inspection point on the pillar (S003). The selection operation is, for example, an operation in which the inspector selects a pillar to be inspected in a house using the user terminal 10. To be more specific, the inspector selects a pillar to be inspected from a plurality of pillars (strictly speaking, pillars that have not yet been inspected) displayed on the display screen of the user terminal 10. In the first embodiment, the inspector makes a sound indicating the selected pillar, and the microphone provided in the user terminal 10 records (collects) the sound made by the inspector, whereby the processor 11 accepts the selection operation of the inspector. That is, in the first embodiment, the selection operation is an operation in which the inspector makes a sound indicating the pillar (object to be inspected) to be inspected.

[0044] More specifically, the inspector utters a voice expressing information for identifying the pillar to be inspected, for example, a number given to the pillar, and the processor 11 analyzes the voice uttered by the inspector. The processor 11 then recognizes the voice uttered by the inspector, verbalizes the recognized voice, and identifies the pillar to be inspected based on the verbalized voice (S004). As a specific method for the voice recognition and the verbalization of the voice, a known method can be used, and for example, the voice recognition and the verbalization may be performed by applying a voice recognition model and a natural language processing model constructed by machine learning / AI (Artificial Intelligence).In addition, information required for identifying the pillar to be inspected, for example, a number (more specifically, an identification number) assigned to each pillar, may be stored in the storage 13 of the user terminal 10.

[0045] The inspector then designates which of the four sides of the pillar to be inspected is to be the inspection location. In the first embodiment, when designating the inspection location, the inspector makes a sound to represent the inspection location. The microphone of the user terminal 10 records (collects) the sound made by the inspector, and the processor 11 accepts the designation operation by the inspector. That is, in the first embodiment, the designation operation is an operation in which the inspector makes a sound to represent the inspection location. When the processor 11 receives the designation operation, the processor 11 analyzes the voice of the examiner about the examination location, specifically, recognizes the voice, and verbalizes the recognized voice. Then, the processor 11 identifies the examination location based on the verbalized voice (S004).

[0046] To explain the identification of the inspection point more specifically, let us assume that the four sides of the pillar to be inspected are called "A", "B", "C", and "D", respectively, and the inspector says "A" as the side of the inspection point. In this case, the processor 11 recognizes and verbalizes the inspector's voice, and collates the verbalized voice to see if it corresponds to "A", "B", "C", or "D", and as a result, identifies "A" as the inspection point. As a specific method for the voice recognition and the verbalization of the voice, a known method can be used, and for example, the voice recognition and verbalization may be performed by applying a voice recognition model and a natural language processing model constructed by machine learning / AI (Artificial Intelligence).In addition, information required for identifying the examination location, for example, words representing the examination location such as "A", "B", "C", "D", etc., may be stored in the storage 13 of the user terminal 10.

[0047] In the first embodiment, multiple inspection points can be specified for one pillar that is an inspection target. In other words, multiple inspection points may be set for one inspection target, and in this case, the processor 11 executes a process of accepting a designation operation by the inspector and a process of identifying the inspection point for each inspection point.

[0048] The processor 11 accepts one designation operation, and when it identifies one inspection location designated by the inspector in the designation operation, executes a process of receiving the results of measurement at that inspection location from the measuring device 30 (S005). Specifically, when the pillar to be inspected and the inspection location are identified, the user terminal 10 communicates with the measuring device 30 and requests the measuring device 30 to perform measurement. At this time, the measuring device 30 is attached to the pillar to be inspected in a state in which it can measure the construction error (measurement item) at the inspection location.

[0049] Then, when the measuring device 30 receives the measurement request, it starts the measurement, and more specifically, it measures the construction error at the specified inspection point. After the measurement is completed, the measuring device 30 generates data indicating the measurement result and transmits it to the user terminal 10. The processor 11 of the user terminal 10 receives the measurement result by receiving the data sent from the measuring device 30.

[0050] After receiving the measurement results from the measuring device 30, the processor 11 executes a process of storing the measurement results in the storage device 20 in association with the pillar to be inspected and the inspection location (S006). In addition, in the first embodiment, when storing the measurement results in the storage device 20, the measurement results received immediately after the designation operation are stored in the storage device 20 in association with the inspection location designated by the designation operation.

[0051] To explain more specifically, let us assume that a designation operation is performed to designate "A" as the inspection point among the four sides "A", "B", "C", and "D" of the pillar to be inspected (hereinafter, the target pillar T), and immediately thereafter, the measurement device 30 performs measurement on the target pillar T with "A" as the inspection point. In this case, the measurement result is transmitted from the measurement device 30 to the user terminal 10, and when the user terminal 10 receives the above measurement result, that is, the result of the measurement performed on the target pillar T with "A" as the inspection point, the measurement result is stored in the storage device 20 in association with the target pillar T and the inspection point "A". Here, storing the measurement result in association with the target pillar T and the inspection point "A" means storing the measurement result in a manner that allows the user to recognize that it is the measurement result for the target pillar T and the inspection point "A".

[0052] Furthermore, when the measurement results are stored in the storage device 20, the processor 11 executes a process of displaying the stored measurement results on the display screen of the user terminal 10 (S007). At this time, the measurement results are displayed in correspondence with the pillar and inspection location to which the measurement results are associated, and specifically, as shown in Fig. 3, they are displayed near the inspection location on the display screen when the inspection location for the pillar to be inspected is specified. In the figure, the measurement result "-1" is displayed for inspection location "A". This allows the inspector to check whether the measurement results have been obtained for that inspection location by looking at the display screen.

[0053] In addition, in the first embodiment, as described above, a plurality of inspection points can be specified for one pillar that is the inspection target. In this case, the processor 11 executes, for each inspection point, a process of receiving the measurement results from the measuring device 30 and a process of storing the measurement results in the storage device 20 in association with the pillar that is the inspection target and the inspection points. In other words, when a plurality of inspection points are set for one inspection object (S008), the inspection application causes the user terminal 10 to repeatedly execute, for each inspection point, a process of accepting a designation operation, a process of receiving the measurement results from the measuring device 30, and a process of storing the measurement results in the storage device 20 in association with the pillar that is the inspection target and the inspection points.

[0054] To explain this in more detail with reference to Fig. 5, after pillar "7" is specified as the pillar to be inspected, the inspector performs a designation operation to designate side "A" as the inspection location, and the processor 11 of the user terminal 10 accepts the designation operation and specifies that the inspection location is side "A". The processor 11 then requests the measuring device 30 to perform measurement, and obtains the measurement results from the measuring device 30. The processor 11 then stores the measurement results obtained immediately after this designation operation in the storage device 20 in association with the pillar "7" to be inspected and the inspection location "A".

[0055] Thereafter, when the inspector performs a designation operation to designate side surface "B" as another inspection point for the same inspection target pillar "7", the processor 11 accepts the designation operation and identifies the inspection point as side surface "B". The processor 11 then obtains the results of the measurement by the measuring device 30 in the same procedure as above, and stores the measurement results obtained immediately after this designation operation in the storage device 20 in association with the inspection target pillar "7" and inspection point "B".

[0056] Thereafter, whenever the inspector specifies another inspection point for the same inspection target pillar "7", the same procedure as above is repeated. In this way, by repeating the above procedure for each pillar while changing the inspection point, the measurement results obtained for each inspection point can be stored in the storage device 20 in association with the inspection point, as shown in Fig. 5. In the first embodiment, the measurement results for four inspection points can be stored for one pillar, but the present invention is not limited to this. For example, in the first embodiment, the measurement results can be obtained only for one of the inspection points, one to three, and the measurement of the remaining inspection points can be omitted to postpone the inspection.

[0057] Furthermore, when inspecting one pillar, if another pillar is to be inspected, i.e., if another inspection target exists (S009), the processor 11 repeats the processes in steps S003 to S008 described above. Then, when the inspection of all inspection targets is completed, the inspection process flow ends.

[0058] As described above, in the first embodiment, the user terminal 10 accepts an operation to select the pillar to be inspected and an operation to specify an inspection point on the selected pillar, and receives the measurement results of the inspection point from the measuring device 30. The processor 11 of the user terminal 10 then stores the received measurement results in the storage device 20 in association with the pillar to be inspected and the inspection point. This makes it possible to store the measurement results at the inspection point as the inspection result for the pillar to be inspected by a simpler operation. Furthermore, since the measurement results are obtained directly from the measuring device 30, more accurate measurement results can be obtained and stored. The above effects are particularly effective when multiple inspection points are set for one pillar to be inspected; specifically, the results of measurements performed at each of the multiple inspection points can be accurately and easily stored in the memory device 20.

[0059] In the first embodiment, the inspector performs the selection operation and the designation operation by uttering a voice representing the pillar to be inspected and the inspection location. This allows the inspector to perform the selection operation and the designation operation more easily.

[0060] The selection operation and the designation operation may be operations other than those described above, for example, an image showing a plurality of pillars that are candidates for inspection may be displayed on the screen of the user terminal 10, and the inspector may select the pillar to be inspected from the screen and touch the selected pillar on the screen. In this case, the user terminal 10 may accept this touch operation as a selection operation, and identify the pillar to be inspected based on the operation content, specifically, the place touched by the inspector on the displayed image. In addition, when multiple inspection points are set for each pillar, the multiple inspection points for each pillar may be displayed on the screen of the user terminal 10 in a selectable format, and the examiner may select one inspection point from the multiple inspection points and specify the inspection point by touching the inspection point on the screen. In this case, the processor 11 of the user terminal 10 may accept the above touch operation as a specifying operation, and identify the specified inspection point based on the operation content, specifically, the point touched by the examiner.

[0061] Furthermore, in the first embodiment, when re-measurement is performed on an inspection location where measurement has already been performed and the measurement results recorded, the measurement results already stored in association with that inspection location can be updated (replaced) with the results of the re-measurement.

[0062] More specifically, in an inspection of a pillar to be inspected, the processor 11 executes a process of accepting a designation operation for designating an inspection point (hereinafter, inspection point X) for the pillar. In this case, the processor 11 executes a process of receiving a measurement result for the inspection point X from the measuring device 30, and a process of storing the measurement result in the storage device 20 in association with the pillar to be inspected and the inspection point X.

[0063] After that, it is assumed that the processor 11 executes again the process of accepting a designation operation for designating the inspection point X for the same inspection target pillar. In this case, the inspection application causes the processor 11 to execute a process of receiving again the measurement results for the inspection point X from the measuring device 30. Furthermore, the inspection application causes the processor 11 to execute a process of updating the measurement results stored in the storage device 20 in association with the inspection target pillar and the inspection point X to the measurement results for the inspection point X received again.

[0064] As described above, in the first embodiment, when the measurement result of the inspection point X is acquired and stored in the storage device 20, and then the measuring device 30 is made to perform remeasurement, the result of the remeasurement can be stored as the inspection result at the inspection point X. Thereby, when the measurement of the inspection point X is redone, the result of the remeasurement can be stored as the inspection result for the inspection point X. For example, when the acquired measurement result exceeds the control value (tolerable range of error), the inspection point X may be corrected (re-constructed) and then the measurement may be performed again. In that case, the measurement may be performed again, and the result of the remeasurement may be stored in association with the inspection point X. At this time, the measurement result already stored in association with the inspection point X in the storage device 20 may be overwritten with the latest information (i.e., the result of the remeasurement). Alternatively, both the measurement result already stored in association with the inspection point X (the measurement result before the remeasurement) and the result of the remeasurement may be stored in association with the inspection point X.

[0065] <<Second embodiment of the present invention>> In the first embodiment, when multiple inspection points are set for one pillar to be inspected, the process of accepting the inspection point designation operation, the process of receiving the measurement results at the inspection points from the measuring device 30, and the process of storing the measurement results in the memory device 20 are repeated for each inspection point. More specifically, in the first embodiment, one cycle consists of a process of accepting a designation operation, a process of receiving the measurement results, and a process of storing the measurement results in the memory device 20, and this cycle is repeated each time an inspection location is designated.

[0066] However, the flow from receiving the designation operation to storing the measurement results may be other than the above. For example, as shown in Fig. 6, after receiving designation operations for multiple test locations collectively, the measurement results at each of the multiple test locations may be acquired collectively and stored collectively in the storage device 20. This embodiment is referred to as the second embodiment, and the second embodiment will be described below. The second embodiment is generally the same as the first embodiment, except for the specific procedure (flow) from accepting a designation operation to storing a measurement result. In the following, the second embodiment will be described with a focus on the differences from the first embodiment.

[0067] In the second embodiment, when an inspection application is launched to perform an inspection, the processor 11 of the user terminal 10 executes a process of accepting a selection operation from the inspector to select a pillar to be inspected. After that, the processor 11 executes a process of accepting a designation operation from the inspector to designate an inspection point on the pillar to be inspected, and in this process, the designation operations for multiple inspection points can be accepted collectively.

[0068] More specifically, as shown in FIG. 6, when an inspector specifies multiple inspection locations for a pillar to be inspected, the inspector produces a voice representing each inspection location in sequence, such as "A, B," etc. Processor 11 accepts the specification operation for multiple inspection locations for each inspection location, and, more simply, accepts the voice representing each inspection location in the order in which the voice was produced. Processor 11 then executes a process of assigning an order to each of the specification operations accepted for each inspection location. To explain this by taking the above case as an example, the specification operation specifying inspection location "A" is assigned the order number 1, and the specification operation specifying inspection location "B" is assigned the order number 2.

[0069] Moreover, in the second embodiment, measurements are performed at each of a plurality of inspection locations. To explain in detail, when an inspector specifies a plurality of inspection locations for a pillar to be inspected, the inspector performs measurements at each inspection location in the same order as the order in which the inspection locations were specified. The measurement results at each inspection location are transmitted from the measuring device 30 to the user terminal 10 each time a measurement is completed. The processor 11 causes the user terminal 10 to execute a process of receiving the measurement results at each inspection location from the measuring device 30 for each inspection location, as shown in FIG. 6.

[0070] Furthermore, the processor 11 further executes a process of assigning a number to each of the measurement results received from the measuring device 30 for each inspection point. Taking the above case as an example, the measurement result at inspection point "A" is assigned the number 1, and the measurement result at inspection point "B" is assigned the number 2.

[0071] After that, the processor 11 executes a process of storing the measurement results at each inspection point in the storage device 20. In this process, the measurement results at each inspection point are stored in the storage device 20 in association with the inspection point designated by the designation operation in the same order as the order given to the measurement results. To explain the above case as an example, since the designation operation of designating the inspection point "A" and the measurement result at the inspection point "A" ("-1" in FIG. 6) are assigned the order of 1, the measurement result at the inspection point "A" is associated with the pillar to be inspected and the inspection point "A" and stored in the storage device 20. Similarly, the designation operation of designating the inspection point "B" and the measurement result at the inspection point "B" ("+1" in FIG. 6) are assigned the order of 2, the measurement result at the inspection point "B" is associated with the pillar to be inspected and the inspection point "B" and stored in the storage device 20.

[0072] As described above, in the second embodiment, when multiple inspection points are specified for one pillar to be inspected, the specification operation for the multiple inspection points can be performed collectively (successively), and the measurement results for the multiple inspection points can be obtained collectively (successively). Furthermore, in the second embodiment, the above configuration allows the measurement results at each inspection point to be appropriately stored in the storage device 20 in association with the inspection point.

[0073] <<Regarding the third embodiment of the present invention>> In the first and second embodiments, a selection operation for selecting a pillar to be inspected and a designation operation for designating an inspection point on the selected pillar are accepted by the user terminal 10. However, this is not limited to this, and for example, the above operations may be accepted by the measuring device 30. Such an embodiment is referred to as a third embodiment, and the third embodiment will be described below. The third embodiment is substantially the same as the first embodiment, except for the fact that the selection operation and the designation operation are received by the measurement device 30, and the configuration of the measurement device 30. The following will mainly describe the third embodiment with respect to the differences from the first embodiment.

[0074] The measurement device 30 according to the third embodiment has a processor 31, a memory 32, and a communication interface 33, similar to the first embodiment, and a measurement program is stored in the memory 32. The processor 31 reads the measurement program and executes each process described below.

[0075] 7, the measuring device 30 according to the third embodiment is provided with an operation panel 34 that can be operated by an examiner, on the outer wall of the device housing. The operation panel 34 has two display units 35 and 36, selection buttons 37a and 37b, and designation buttons 38a, 38b, 38c, and 38d.

[0076] The identification number of the pillar selected as the inspection target is displayed on one display unit 35 as information about the pillar. The display content of this display unit 35 can be changed by operating selection buttons 37a and 37b. Pressing one selection button 37a changes the displayed identification number of the pillar to a larger number, and pressing the other selection button 37b changes the displayed identification number of the pillar to a smaller number.

[0077] The other display unit 36 ​​displays the measurement results for the specified inspection point on the pillar to be inspected, specifically, the measurement results when the construction error at the inspection point is measured. The inspection point is specified by operating the specification buttons 38a, 38b, 38c, and 38d, and one of the four specification buttons corresponding to the inspection point to be specified is pressed. In the measuring device 30 configured as shown in Fig. 7, for example, when specifying inspection point "A", specification button 38a is pressed, and when specifying inspection point "C", specification button 38c is pressed.

[0078] In the third embodiment, an inspection is performed using the measuring device 30 configured as described above. Specifically, the processor 31 of the measuring device 30 executes a series of processes related to the inspection according to the flow shown in Fig. 8. To explain in more detail, the processor 31 executes a process of accepting from the inspector a selection operation of a pillar to be inspected, and a process of accepting from the inspector a designation operation of an inspection point on the pillar selected as a search target (S011). As described above, the selection operation is performed via the above-mentioned selection buttons 37a and 37b, and the designation operation is performed via the above-mentioned designation buttons 38a, 38b, 38c, and 38d.

[0079] The processor 31 also executes a process for measuring the inspection location of the pillar to be inspected (S012). After that, the processor 31 executes a process for outputting data (hereinafter, inspection data) for storing the measurement results in association with the pillar to be inspected and the inspection location (S013). The inspection data is data (records) indicating the pillar to be inspected, the inspection location, and the measurement results at the inspection location. In the process for outputting the inspection data, the inspection data is output so as to be stored in the storage device 20, and more specifically, is transmitted via the network to the user terminal 10 or other device having the storage device 20 (e.g., a server computer). The device that receives the inspection data stores the inspection results indicated by the inspection data in association with the pillar to be inspected and the inspection location also indicated by the inspection data in the storage device 20. The stored measurement results are displayed on the device that receives the inspection data in association with the inspection location.

[0080] In the third embodiment, similarly to the first embodiment, a plurality of inspection points may be set for one pillar to be inspected (i.e., one inspection object). In this case (S014), the processor 31 repeatedly executes the process of accepting a designation operation, the process of taking measurements at the inspection points, and the process of outputting the inspection data for each inspection point. Furthermore, when inspecting one pillar and then inspecting another pillar, that is, when another inspection target exists (S015), the processor 31 repeatedly executes the series of processes described above.

[0081] As described above, in the third embodiment, the selection operation and the designation operation are accepted by the measurement device 30, so that the process from performing these operations to obtaining the measurement results can be performed by operating a single measurement device 30.

[0082] <<Fourth embodiment of the present invention>> In the first embodiment, the processor 11 executes a process of receiving the measurement result from the measurement device 30. However, this is not limited to this, and for example, after reading a portion (corresponding to a scale portion described later) on which measurement information is displayed in the measurement device 30A (see FIG. 9) with a reading device, the processor 11 may execute a process of receiving read data (corresponding to a photographed image described later) obtained by the reading from the reading device (corresponding to a photographing device described later). In this case, the processor 11 may specify the measurement result based on the measurement information specified from the received read data. Such an embodiment is referred to as a fourth embodiment, and the fourth embodiment will be described below. The fourth embodiment is substantially the same as the first embodiment, except for receiving read data from a reading device, specifying a measurement result based on measurement information specified from the read data, and the configuration of the measuring device 30A, etc. The following will mainly describe the fourth embodiment, focusing on the differences from the first embodiment.

[0083] As shown in FIG. 9, the measuring device 30A is, for example, a rectangular prism-shaped measuring device extending in a predetermined direction, and measures the degree of inclination of an object to be inspected that is arranged in a state of extending along the vertical direction. One end of the measuring device 30A in the extending direction is provided with a scale part with graduations. The value indicated by a needle pointing to one scale corresponding to the measurement result of the scale part indicates the degree of inclination of the pillar, and the needle swings to the left or right depending on the inclination of the pillar with respect to the vertical direction. In the following description, the "needle pointing to one scale corresponding to the measurement result of the scale part" is also simply referred to as the "needle of the scale part". The measuring device 30A may be a so-called dial plumb bob, or may be a digital device with a communication function.

[0084] The user terminal 10 according to the fourth embodiment is placed on the scale of the measuring device 30A and is fixed to the measuring device 30A by a fixture (not shown). More specifically, as described above, the user terminal 10 has a photographing device (corresponding to a reading device) consisting of a camera as the input device 15, and is placed so that the photographing device can photograph the scale. More specifically, the user terminal 10 is placed so that the optical axis of the photographing device is aligned with the rotation center of the needle of the scale. In the example shown in FIG. 9, a mark is attached in advance to the rotation center of the needle on the scale of the measuring device 30A. On the other hand, when the user terminal 10 is attached to the measuring device 30A, the display screen of the user terminal 10 becomes a live view screen on which a mark indicating the position of the optical axis is displayed, and the user terminal 10 can be placed in a desired position by aligning the two marks.

[0085] 9, a spacer (such as a slide arm) is attached to the side of the measuring device 30A, and during measurement, the measurement is performed while pressing the spacer against the inspection point (side surface) of the pillar to be inspected. Note that the side surface of the measuring device 30A may be pressed directly against the inspection point without attaching a spacer. The spacer can be attached to either the left or right side of the measuring device 30A. This allows the mounting direction of the measuring device 30A to be appropriately changed according to the position of the pillar to be inspected so that the scale portion can be easily viewed by the inspector. To explain more specifically with reference to FIG. 10 (plan view), when measuring the inspection point "B" of the pillar to be inspected, two patterns can be appropriately selected: a pattern in which the measuring device 30A is mounted on the pillar so that the user terminal 10 faces the inspection point "A" of the pillar (hereinafter, "Pattern P1"), and a pattern in which the measuring device 30A is mounted on the pillar so that the user terminal 10 faces the inspection point "C" of the pillar (hereinafter, "Pattern P2"). In the following description, two directions intersecting (orthogonal to) the extension direction of the inspection object are defined as a first direction and a second direction. In the example shown in Fig. 10, the direction in which inspection point "B" (corresponding to the first inspection point) and inspection point "D" are aligned is defined as the "first direction", and the direction in which inspection point "A" (corresponding to the second inspection point) and inspection point "C" are aligned is defined as the "second direction". Inspection point "B" is located on one side of the inspection object in the first direction, and inspection point "A" is located on one side of the inspection object in the second direction.

[0086] At this time, the direction in which the needle of the scale of the measuring device 30A swings is different in the above two patterns. Specifically, as shown in FIG. 11, if the pillar is tilted toward the inspection point "B", in pattern P1, the needle of the scale swings to the right, and measurement information such as "1 to the right" is obtained. In pattern P2, the needle of the scale swings to the left, and measurement information such as "1 to the left" is obtained. In this way, even if the same inspection point "B" is being measured, the direction in which the needle swings will be different depending on how the measuring device 30A is attached.

[0087] On the other hand, the measurement results stored in the storage device 20 are values ​​indicated by the measurement information of the scale section, with "+" and "-" added. Specifically, as shown in Fig. 11, if the pillar to be inspected is inclined toward inspection point "B", the measurement result of inspection point "B" will be a "+" value, for example, "+1" as shown in Fig. 11, regardless of whether it is pattern P1 or pattern P2. Conversely, if the pillar to be inspected is inclined toward inspection point "D", the measurement result of inspection point "B" will be a "-" value regardless of whether it is pattern P1 or pattern P2.

[0088] Therefore, in order to correctly identify the measurement results, in addition to the measurement information of the scale, it is necessary to identify the positional relationship between the pillar to be inspected and the measuring device 30A, more specifically, the position of the measuring device 30A relative to the pillar to be inspected when viewed from the user terminal 10. 11, in pattern P1, the position of the measuring device 30A relative to the pillar to be inspected when viewed from the user terminal 10 is "the left side of the pillar," and in pattern P2, the position of the measuring device 30A relative to the pillar to be inspected when viewed from the user terminal 10 is "the right side of the pillar." Based on this position information and the measurement information of the scale portion ("1 to the right" in the case of pattern P1, and "1 to the left" in the case of pattern P2), the measurement result "+1" is identified.

[0089] Next, a series of processes relating to the inspection will be specifically described with reference to Fig. 12. First, the processor 11 executes steps S101 to S104 similar to steps S001 to S004 in the first embodiment. Next, the processor 11 accepts from the user an identifying operation for identifying the positional relationship between the pillar to be inspected and the measuring device 30A (S105). As shown in Fig. 13, the identifying operation is an operation in which, for example, an inspector uses the user terminal 10 to identify the position of the measuring device 30A relative to the pillar to be inspected. Specifically, the inspector selects either the left arrow or the right arrow displayed on the display screen of the user terminal 10. In the example shown in Fig. 13, the inspector selects the right arrow, and in this case, the pillar to be inspected is located to the right of the measuring device 30A (user terminal 10).

[0090] Next, the processor 11 receives from the reading device a captured image (read data) obtained by reading the scale portion of the measuring device 30A with the photographing device (S106). Specifically, when the measuring device 30A measures the inspection point of the pillar to be inspected, the display screen of the user terminal 10 transitions to a photographing mode by performing a predetermined operation on the user terminal 10, and the scale portion displaying the measurement information can be photographed. The processor 11 executes a process of receiving the captured image from the photographing device.

[0091] Next, the processor 11 identifies measurement information by analyzing the captured image (S107). Specifically, the processor 11 identifies the measurement information, i.e., the information indicated by the needle of the scale (e.g., "1 to the right" in FIG. 11), by using a known technique for extracting text information, numerical information, and the like from the captured image. Next, the processor 11 identifies the measurement result based on the measurement information and the positional relationship between the pillar to be inspected and the measuring device 30A (S108). Specifically, the processor 11 identifies the measurement result (e.g., "+1" in FIG. 11) based on the measurement information extracted from the read data (e.g., "1 to the right" in FIG. 11) and the positional information of the measuring device 30A relative to the object to be inspected when viewed from the user terminal 10 side (e.g., "left side of the pillar" in FIG. 11). More specifically, the processor 11 obtains the degree of inclination at the inspection point "B" as the measurement result based on a captured image obtained by reading with a reading device the location where the measurement information is displayed of the measuring device 30A in a state where it is attached to the inspection point "B" of the pillar to be inspected. The processor 11 also obtains the degree of inclination at the inspection point "A" as the measurement result based on a captured image obtained by reading with a reading device the location where the measurement information is displayed of the measuring device 30A in a state where it is attached to the inspection point "A".

[0092] Next, the processor 11 stores the measurement results in the storage device 20 in association with the pillar to be inspected and the inspection location (S109), and displays the stored measurement results on the display screen of the user terminal 10 (S110). Thereafter, similarly to the first embodiment, when a plurality of inspection points are designated for one pillar that is the inspection target, the processor 11 repeatedly executes steps S105 to S110 for each inspection point. Furthermore, similarly to the first embodiment, when inspecting one pillar and then inspecting another pillar, i.e., when another inspection target exists (S112), the processor 11 repeats the processes in steps S103 to S111 described above. Then, when the inspection of all inspection targets is completed, the inspection process flow ends.

[0093] As described above, in the fourth embodiment, the read data is received from the reading device, and the measurement result can be identified based on the measurement information identified from the read data. Therefore, even if the measurement result is not received from the measuring device 30A, in other words, even if communication cannot be performed between the user terminal 10 and the measuring device 30A, the measurement result can be accurately and easily stored in the storage device 20. Furthermore, in the fourth embodiment, by receiving a specifying operation from the user for specifying the positional relationship between the pillar to be inspected and the measuring device 30A, it is possible to specify the measurement result more accurately. Furthermore, in the fourth embodiment, the processor 11 can acquire the degree of inclination at the inspection point "B" as a measurement result. On the other hand, the processor 11 can obtain the degree of inclination of both the inspection point "B" located on one side in the first direction and the inspection point "A" located on one side in the second direction as the measurement result. Therefore, the inspection object can be measured from directions intersecting each other, and the measurement result can be specified more accurately.

[0094] In the above description, a specific operation for specifying the positional relationship between the pillar to be inspected and the measuring device 30A is received from the user, but this is not limited to this. For example, the processor 11 may receive, as read data, from the reading device, a captured image of a location where the positional relationship between the pillar to be inspected and the measuring device 30A can be known, together with a scale portion on which measurement information is displayed. Note that the "location where the positional relationship between the pillar to be inspected and the measuring device 30A can be known" includes, for example, adjacent ends of the pillar to be inspected and the measuring device 30A, that is, both the end of the pillar to be inspected on the measuring device 30A side and the end of the measuring device 30A on the pillar to be inspected side. In this case, the processor 11 can identify the positional relationship between the pillar to be inspected and the measuring device 30A by analyzing the captured image, and can identify the measurement result based on the measurement information and the positional relationship between the pillar to be inspected and the measuring device 30A. For example, known subject detection technology and subject identification technology can be used as a method for analyzing the captured image. Note that the "subject" refers to both the pillar to be inspected and the measuring device 30A. According to this configuration, it is possible to identify the measurement result by analyzing the captured image without receiving the above-mentioned identifying operation from the user, which makes it possible to more easily identify the measurement result.

[0095] In the above description, the operation of specifying the inspection point on the pillar to be inspected is received from the user, but this is not limiting, and for example, the inspection point may be identified from a captured image (read data), more specifically, a captured image of the pillar to be inspected and the measuring device 30A. This eliminates the need to receive the operation of specifying the inspection point from the user, and makes it easier to identify the measurement result.

[0096] In the above description, the measuring device 30A is a device that measures the degree of inclination of a building's pillar. However, this is not limited to this, and the measuring device may be a device that measures the dimensions of an opening in a building, such as a window frame (sash). Specifically, the measuring device may be, for example, a device that extends in a predetermined direction and measures the distance between both ends of the measuring device in the extension direction, or the diagonal dimension of the opening may be measured by arranging the measuring device along the diagonal of the opening. In this case, as in the above description, the processor 11 of the user terminal 10 may receive a captured image obtained by reading the scale part of the measuring device with a photographing device from the reading device. For example, if the results of the measurements of the diagonal dimensions of the opening in two directions that intersect (orthogonal) with each other are significantly different, it is suspected that the opening is not an appropriate frame shape (e.g., a rectangle, etc.) but an inappropriate frame shape (e.g., a diamond, etc.), and the process can be smoothly moved to a detailed investigation thereafter.

[0097] <<Other embodiments>> Although one embodiment of the program and measuring device of the present invention has been described above, the above embodiment is merely an example for facilitating understanding of the present invention and does not limit the present invention. In other words, the present invention can be modified and improved without departing from the spirit of the present invention. In addition, the present invention naturally includes its equivalents.

[0098] In addition, in the above embodiment, the selection operation for selecting the pillar to be inspected and the designation operation for designating the inspection point of that pillar are performed separately, but this is not limited to this, and the selection operation and designation operation may be performed together. For example, as shown in FIG. 14, among the candidate pillars for inspection (indicated by circular marks in the figure), all pillars to be actually inspected are selected, and one or more inspection points are specified for each pillar. At this time, as shown in FIG. 14, a consecutive number is assigned to each inspection point of the pillar selected as the inspection target. The pillar corresponding to the point assigned with this number corresponds to the selected pillar for inspection, and the point assigned with the number corresponds to the inspection point specified for the pillar for inspection. When the selection operation and the specification operation are performed together in this way, the inspection measurements are performed in the order indicated by the consecutive numbers, and the measurement results are obtained. Then, the measurement results may be stored in association with the pillar for inspection and the inspection point identified from the corresponding consecutive number.

[0099] In the above embodiment, an example of an inspection is described in which the construction error at each inspection point of a pillar is measured, but the present invention is not limited to this. That is, the present invention can also be used in cases where inspections other than the above are performed, such as inspections of the rising cover thickness of each of the multiple reinforcing bars that make up the foundation of a house, the alignment of exterior wall panels that make up the exterior walls of a house, and the diagonal dimensions of window sashes of a house. [Explanation of symbols]

[0100] 10 User terminal 11 Processors 12. Memory 13. Storage 14 Communication Interface 15 Input Devices 16 Output Devices 20 Storage device 30,30A Measuring device 31 Processors 32 Memory 33 Communication Interface 34 Operation Panel 35,36 Display section 37a, 37b Selection button 38a, 38b, 38c, 38d Designation button S Inspection Support System

Claims

1. In a terminal device used by a user, A process of accepting a selection operation of an object to be inspected from the user; A process of accepting an operation of designating an inspection point on the inspection object from the user; receiving from a measuring device a result of a measurement performed by the measuring device on the test point of the test object; and storing the results of the measurement in a storage device in association with the object to be inspected and the inspection location.

2. In the case where a plurality of the inspection points are set in one of the inspection objects, the terminal device A process of receiving the designation operation; receiving results of the measurements from the measurement device; and storing the measurement results in the storage device in association with the inspection object and the inspection location.

3. The terminal device, A process of assigning an order to each of the designated operations received for each of the inspection locations; and further executing a process of assigning an order to each of the measurement results received for each of the inspection points; The program according to claim 2, wherein in the process of storing the results of the measurement in the storage device, the results of the measurement are stored in the storage device in association with the inspection points specified by the designation operation in the same order as the order assigned to the results of the measurement.

4. the designation operation is an operation in which the user utters a voice indicating the inspection point, The program according to claim 1 , wherein in the process of storing the measurement results in the storage device, the measurement results received immediately after the designation operation are stored in the storage device in association with the inspection point designated by the designation operation.

5. In an inspection of one inspection object, the terminal device A process of receiving the designation operation for designating an inspection point of the one inspection object; receiving a result of the measurement for the inspection point from the measurement device; a process of storing the measurement result in the storage device in association with the one inspection object and the certain inspection point; When the process of accepting the designation operation for designating the certain inspection point is executed again after the process of accepting the designation operation for designating the certain inspection point is executed, the terminal device receiving again from the measurement device a result of the measurement for the certain inspection point; updating the measurement results associated with the one test object and the one test location with the measurement results for the one test location that has been received again; The program according to claim 1 , which causes a program to execute the following:

6. The terminal device, The program according to claim 1 , further comprising a process of displaying an image for identifying a position of the inspection object and information about the inspection location on a display screen of the terminal device.

7. A measurement device including a processor, The processor, A process of accepting a selection operation of an object to be inspected from a user; A process of accepting an operation of designating an inspection point on the inspection object from the user; A process of performing a measurement on the inspection point of the inspection object; and outputting data for storing the results of the measurement in association with the object to be inspected and the inspection location.

8. When a plurality of the inspection points are set on one of the inspection objects, the processor A process of receiving the designation operation; A process of performing the measurement; 8. The measuring apparatus according to claim 7, further comprising: a process of outputting the data for storing the result of the measurement in association with the inspection object and the inspection point; and a process of outputting the data for storing the result of the measurement in association with the inspection object and the inspection point.

9. In a terminal device used by a user, A process of accepting a selection operation of an object to be inspected from the user; A process of identifying an inspection point on the inspection object; a process of receiving, from a reading device, read data obtained by reading a portion displayed with the measurement information of the measuring device when the measuring device measures the inspection portion of the inspection object by the measuring device; A process of determining a result of the measurement based on the measurement information determined from the read data; and storing the results of the measurement in a storage device in association with the object to be inspected and the inspection location.

10. The terminal device, further executing a process of receiving, from the user, a specifying operation for specifying a positional relationship between the inspection object and the measuring device; The program according to claim 9 , wherein in the process of identifying the result of the measurement, the result of the measurement is identified based on the measurement information and a positional relationship between the inspection object and the measuring device.

11. In the process of receiving the read data from the reading device, a captured image of a location where the measurement information is displayed on the measuring device and a location where a positional relationship between the inspection object and the measuring device can be known is received from the reading device as the read data, 10. The program according to claim 9, wherein the process of identifying the result of the measurement identifies a positional relationship between the object to be inspected and the measuring device by analyzing the captured image, and identifies the result of the measurement based on the measurement information and the positional relationship between the object to be inspected and the measuring device.

12. In a case where the degree of inclination of the test object arranged in a state of extending along the vertical direction is measured by the measurement device, when two directions intersecting the extension direction of the test object are defined as a first direction and a second direction, The terminal device, a process of acquiring the degree of inclination at the first inspection location as a result of the measurement, based on the read data obtained by reading, with the reading device, a location where the measurement information is displayed in the measuring device in a state where the measuring device is attached to the first inspection location located on one side of the first direction of the object to be inspected; and acquiring the degree of inclination at the second inspection location as a result of the measurement based on the read data obtained by reading with the reading device a location where the measurement information is displayed in the measuring device attached to the second inspection location located on one side of the second direction on the object to be inspected.

Images