X-ray thickness measuring device

Abstract

To provide an X-ray thickness measuring device capable of suppressing the occurrence of collisions in communication data.SOLUTION: An X-ray thickness measuring device according to an embodiment includes a controller, and a plurality of elements that are electrically connected to the controller and are involved in at least one of generating X-rays and detecting the X-rays. The controller broadcasts a trigger to the plurality of elements, and the plurality of elements that have received the trigger transmit data to the controller based on their respective delay times set by clocks provided in the respective elements.SELECTED DRAWING: Figure 2

Description

[Technical field]

[0001] An embodiment of the present invention relates to an X-ray thickness measurement device. [Background technology]

[0002] For example, there is an X-ray thickness measuring device that measures the thickness of rolled plate materials online in a rolling line for iron or non-ferrous metals that operates 24 hours a day. Such an X-ray thickness measuring device includes, for example, an X-ray generating unit that irradiates X-rays onto the plate material to be measured, an X-ray detecting unit that detects X-rays attenuated by passing through the plate material, a calibration device that has multiple reference plates and calibrates the detected X-ray values, and a condition measuring device that measures data related to conditions such as vibration. In addition, the X-ray thickness measuring device is provided with a controller that is electrically connected to these components, and the controller communicates data with these components individually. For example, Ethernet (registered trademark) can be used as a standard for data communication between the controller and these components.

[0003] Here, communication of commands from the controller to the X-ray generator etc. is performed when necessary, such as when an operator operates the device, etc. Communication of data from the X-ray generator etc. to the controller is performed separately.

[0004] In this case, a collision may occur between communication data from the controller and communication data to the controller. Also, a collision may occur between communication data from the controllers, or between communication data to the controllers. If a collision occurs, information contained in the communication data may be lost, or the communication data may need to be resent, resulting in extra time being spent on communication.

[0005] In the case of an X-ray thickness measuring device, the controller often communicates with the X-ray generator etc. at a predetermined control cycle. Therefore, if there is a possibility of retransmission due to collision, the control cycle cannot be shortened, making it difficult to improve responsiveness.

[0006] Therefore, there has been a demand for the development of an X-ray thickness measurement device that can suppress the occurrence of collisions in communication data. [Prior art documents] [Patent documents]

[0007] [Patent Document 1] JP 2018-100849 A Summary of the Invention [Problem to be solved by the invention]

[0008] An object of the present invention is to provide an X-ray thickness measuring device capable of suppressing the occurrence of collisions in communication data. [Means for solving the problem]

[0009] The X-ray thickness measurement device according to the embodiment includes a controller and a plurality of elements that are electrically connected to the controller and are involved in at least one of generating X-rays and detecting the X-rays. The controller broadcasts a trigger to the plurality of elements, and the plurality of elements that receive the trigger transmit data to the controller based on their respective delay times set by clocks provided in the respective elements. [Brief description of the drawings]

[0010] [Figure 1] 1 is a block diagram of an X-ray thickness measurement device according to an embodiment of the present invention. [Diagram 2] 1 is a timing chart illustrating communication between a controller and each element. [Diagram 3] 11 is a timing chart illustrating communication between a controller and each element according to another embodiment. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0011] Hereinafter, an embodiment will be described with reference to the drawings. In the drawings, the same components are denoted by the same reference numerals, and detailed description thereof will be omitted as appropriate.

[0012] FIG. 1 is a block diagram of an X-ray thickness measurement device 100 according to the present embodiment. As shown in FIG. 1, the X-ray thickness measurement device 100 includes, for example, an X-ray generation unit 1, an X-ray detection unit 2, a calibration device 3, a state measurement device 4, a housing 5, and a controller 6. The X-ray generating unit 1 includes, for example, an X-ray generator 10, a circuit unit 14, and an X-ray power supply 15.

[0013] The X-ray generator 10 includes, for example, an X-ray tube 11, a filament 12, and a target 13. X-ray tube 11 is, for example, a tubular body capable of maintaining the internal atmosphere in a vacuum state. Filament 12 and target 13 are provided inside X-ray tube 11. Filament 12 and target 13 face each other. For example, filament 12 is a cathode. For example, target 13 is an anode. Filament 12 and target 13 are electrically connected to X-ray power supply 15 via circuit unit 14.

[0014] The filament 12 emits thermoelectrons when power is supplied from the X-ray power supply 15. The emitted thermoelectrons collide with the target 13 to generate X-rays 16. The generated X-rays 16 are irradiated toward the measurement object 200. The measurement object 200 is, for example, a plate material containing a metal such as iron or non-ferrous metal.

[0015] The X-ray power supply 15 includes, for example, a filament power supply that controls the power applied to the filament 12, a high-voltage power supply that accelerates the thermoelectrons emitted from the filament 12, a communication unit that communicates with the controller 6, and a clock. The X-ray power supply 15 is electrically connected to the controller 6.

[0016] The X-ray detection unit 2 is provided at a position facing the X-ray generator 10. For example, the X-ray generator 10 can be provided below the position to which the measurement object 200 is transported. For example, the X-ray detection unit 2 can be provided above the position to which the measurement object 200 is transported.

[0017] The X-rays 16 transmitted through the measurement object 200 are incident on the X-ray detection unit 2. The X-ray detection unit 2 outputs at least one of a detection voltage and a detection current as a detection signal according to the intensity of the X-rays 16 attenuated by transmitting through the measurement object 200. The detection signal output from the X-ray detection unit 2 is input to the controller 6 via the conversion unit 21. The conversion unit 21 is, for example, an AD converter.

[0018] Moreover, the X-ray detection unit 2 may further include a communication unit for communicating with the controller 6, a clock, and the like.

[0019] Here, the relationship between the amount of attenuation of the X-rays 16 transmitted through the measurement object 200 and the thickness of the measurement object 200 is nonlinear. For this reason, the X-ray thickness measurement device 100 is provided with a calibration device 3.

[0020] The calibration device 3 is provided between the X-ray generator 10 and the X-ray detection unit 2, and is electrically connected to the controller 6. The calibration device 3 includes, for example, a plurality of reference plates 31 having different thicknesses and a drive unit for moving each of the plurality of reference plates 31 to a predetermined position. The drive unit is electrically connected to the controller 6. Calibration by the calibration device 3 is performed when there is no measurement object 200 between the X-ray generator 10 and the X-ray detection unit 2. The X-rays 16 irradiated from the X-ray generator 10 pass through the reference plate 31 and enter the X-ray detection unit 2. Since the thickness of the reference plate 31 is known, if the relationship between the value of the detection signal from the X-ray detection unit 2 and the thickness of the reference plate 31 is known, the relationship between the value of the detection signal from the X-ray detection unit 2 and the thickness of the measurement object 200 can be obtained. In this case, by combining a plurality of reference plates 31 having different thicknesses, it is possible to deal with a plurality of thicknesses of the measurement object 200.

[0021] Furthermore, the calibration device 3 may further include a communication unit for communicating with the controller 6, a clock, and the like.

[0022] The state measuring device 4 is electrically connected to the controller 6 and detects the state of the X-ray thickness measuring device 100. The state measuring device 4 measures, for example, a physical force applied to the X-ray thickness measuring device 100. For example, if the vibration applied to the X-ray thickness measuring device 100 becomes large, the X-ray generator 10 may break down or the measurement accuracy may decrease. In addition, for example, if the vibration is measured at multiple positions on the housing 5, it is possible to analyze the distortion of the housing 5. For example, the state measuring device 4 can be a vibration sensor (for example, an accelerometer). Note that the state measuring device 4 may be, for example, a strain gauge or a temperature sensor.

[0023] It is possible to provide a plurality of state measuring devices 4. The state measuring device 4 can be provided in each of the X-ray generator 10, the X-ray detection unit 2, and the calibration device 3, for example.

[0024] Moreover, the state measuring device 4 may further include a communication unit for communicating with the controller 6, a clock, and the like.

[0025] The housing 5 is provided on the floor or the like of a location where the X-ray thickness measurement device 100 is installed. For example, the X-ray generation unit 1, the X-ray detection unit 2, the calibration device 3, and the state measurement device 4 can be provided inside the housing 5.

[0026] The controller 6 controls the operation of the elements provided in the X-ray thickness measurement device 100 (e.g., the X-ray generation unit 1, the X-ray detection unit 2, the calibration device 3, and the status measurement device 4), calculates and analyzes the data sent from the elements, and controls communications between the elements.

[0027] As an example, the elements are described as the X-ray generating unit 1, the X-ray detecting unit 2, the calibration device 3, and the state measuring device 4, but the elements are not limited to these. For example, the elements may be electrically connected to the controller 6 and involved in at least one of X-ray generation and X-ray detection. As described above, the elements may include a communication unit that communicates with the controller 6, and a clock.

[0028] The controller 6 includes, for example, an arithmetic unit such as a CPU (Central Processing Unit) or a GPU (Graphics Processing Unit), and a storage device such as a semiconductor memory or a hard disk drive. The controller 6 is, for example, a computer. The storage device of the controller 6 stores programs for controlling the operation of each element, calculating and analyzing data, and communicating with each element.

[0029] The controller 6 communicates data with each element individually according to Ethernet. The communication standard is not limited to Ethernet. However, if data communication is performed using Ethernet, it is possible to increase communication capacity and improve security.

[0030] Here, a collision may occur in the communication data if the controller 6 simply transmits data to each element, or each element transmits data to the controller 6. If a collision occurs, information contained in the communication data may be lost, or the communication data may need to be retransmitted, resulting in extra time being required for communication.

[0031] In the case of the X-ray thickness measuring device 1, it is preferable that the controller 6 communicates with a plurality of elements at a predetermined control period. Therefore, if there is a possibility of retransmission due to collision, the control period cannot be shortened, making it difficult to improve responsiveness.

[0032] Furthermore, when multiple condition measuring devices 4 are provided, if data (e.g., vibration data) is transmitted to the controller 6 at its own time for each of the multiple condition measuring devices 4, it may become difficult to use and analyze the obtained data.

[0033] However, if multiple state measuring devices 4 transmit data at the same time, collisions will occur in the communication data. Therefore, it is preferable that the multiple state measuring devices 4 transmit data within as short a time as possible and prevent collisions in the communication data.

[0034] For example, if multiple pieces of vibration data can be obtained over as short a time as possible, it becomes possible to analyze the influence on each element as well as the distortion of the housing 5. If the distortion of the housing 5 can be analyzed, for example, it becomes possible to know the change in the distance between the X-ray generator 10 and the X-ray detection unit 2, the change in the angle of incidence of the X-rays 16 with respect to the measurement object 200, and the like, and therefore it is possible to improve the accuracy of the measured thickness.

[0035] If only the distortion of the housing 5 is to be analyzed, at least two state measuring devices 4 may be provided at any positions. However, if a state measuring device 4 is provided for each element, as described above, it becomes possible to perform, for example, an analysis of the effect on each element and an analysis of the effect on the accuracy of the measured thickness.

[0036] FIG. 2 is a timing chart illustrating the communication between the controller 6 and each element. 2, the controller 6 broadcasts a trigger to the X-ray detection unit 2, the X-ray generation unit 1, and the calibration device 3. Upon receiving the trigger, the X-ray detection unit 2, the X-ray generation unit 1, and the calibration device 3 each transmit data to the controller 6. The data transmitted from the X-ray detection unit 2 is, for example, a detection value of the thickness of the measurement object 200. The data transmitted from the X-ray generation unit 1 is, for example, a value of a current or voltage flowing through the X-ray generator 10. The data transmitted from the calibration device 3 is, for example, a thickness or number (total thickness) of the reference plates 31 used for calibration.

[0037] When transmitting data, the timing of data transmission from the X-ray detection unit 2, the X-ray generation unit 1, and the calibration device 3 is set so as not to overlap. For example, since the size of each data transmitted from the X-ray detection unit 2, the X-ray generation unit 1, and the calibration device 3, and therefore the time required for transmission, are known in advance, the time until the data transmission of the X-ray detection unit 2, the X-ray generation unit 1, and the calibration device 3 is completed can be set in advance. The time until the transmission of the next data is started (delay time) can be set by adding a predetermined time to the time until the transmission of the previous data is completed. The time added to the time until the transmission of the previous data is completed can be a time on the order of microseconds determined appropriately according to the Ethernet standard. The delay time can be set by a clock provided in each of the X-ray detection unit 2, the X-ray generation unit 1, and the calibration device. In other words, the clock functions as a timer.

[0038] In the case of the X-ray thickness measurement device 100, it is preferable to transmit data at a predetermined control cycle. Therefore, the time from the start of transmission of the previous data to the start of transmission of the next data can be constant.

[0039] 2, data is transmitted in the order of the X-ray detection unit 2, the X-ray generation unit 1, and the calibration device 3, but the order of data transmission is not particularly limited and can be changed as appropriate. As an example, data transmission from the X-ray detection unit 2, the X-ray generation unit 1, and the calibration device 3 is illustrated, but the same can be applied to other elements that transmit data. In this case, the number and types of elements that transmit data are not particularly limited.

[0040] In this way, the data from the X-ray detection unit 2, the X-ray generation unit 1, and the calibration device 3 are transmitted in sequence with time intervals between each other, so that collisions in communication data can be prevented.

[0041] Next, the controller 6 receives data from the last transmitting element (the calibration device 3 in the example shown in FIG. 2), and then sequentially transmits commands to the X-ray detection unit 2, the X-ray generation unit 1, and the calibration device 3. For example, the commands are setting values ​​related to the X-ray detection unit 2, the X-ray generation unit 1, and the calibration device 3.

[0042] After receiving data from the last transmitting element, the communication line is free, so that it is possible to prevent collisions between commands and data transmitted from the elements.

[0043] Furthermore, since the size of the command data and therefore the time required for transmission are known in advance, the time until the command transmission is completed can be set in advance. The time until the transmission of the next command is started (delay time) can be set by adding a predetermined time to the time until the transmission of the previous command is completed. The time added to the time until the transmission of the previous command is completed can be set to a time (a time on the order of nanoseconds to a time on the order of microseconds) appropriately determined in accordance with the Ethernet standard. The delay time can be set by a clock provided in the controller 6.

[0044] 2, commands are sent in the order of the X-ray detection unit 2, the X-ray generation unit 1, and the calibration device 3, but the order of sending commands is not particularly limited and can be changed as appropriate. Also, as an example, sending commands to the X-ray detection unit 2, the X-ray generation unit 1, and the calibration device 3 is illustrated, but the same applies to other elements that need to send commands. In this case, there is no particular limit to the number or types of elements that send commands.

[0045] In this way, commands to the X-ray detection unit 2, the X-ray generation unit 1, and the calibration device 3 can be transmitted sequentially with time intervals between them, thereby making it possible to prevent collisions in communication data.

[0046] In addition, if the occurrence of collisions in communication data can be suppressed in the above manner, it is possible to suppress information or commands contained in the communication data from being lost, or to suppress the need for retransmission, which would otherwise increase communication time. If the possibility of retransmission due to collisions is almost eliminated, the control period can be shortened, thereby improving responsiveness.

[0047] Although not shown in FIG. 2, data can also be transmitted sequentially from each of the multiple state measuring devices 4 with a time interval between each transmission. Since the size of data from the state measuring device 4 and therefore the time required for transmission are known in advance, the time until data transmission is completed can be set in advance. The time until the transmission of the next data is started (delay time) can be set by adding a predetermined time to the time until the transmission of the previous data is completed. The time added to the time until the transmission of the previous data is completed can be a time on the order of microseconds that is appropriately determined according to the Ethernet standard. The delay time can be set by a clock provided in the state measuring device 4.

[0048] In this way, the controller 6 can receive data from a plurality of state measuring devices 4 within a time period on the order of microseconds. In other words, data (e.g., vibration data) from a plurality of state measuring devices 4 at times that can be considered to be almost simultaneous can be obtained, making it easier to use and analyze the obtained data.

[0049] The data transmission from the state measuring device 4 may be before the data transmission from each of the aforementioned elements, between the data transmission from each element and the transmission of a command to each element, or after the command is transmitted to each element.

[0050] FIG. 3 is a timing chart illustrating communication between the controller 6 and each element according to another embodiment. FIG. 2 illustrates an example in which a trigger is broadcast, but as shown in FIG. 3, the trigger can include command information for a plurality of elements (for example, the X-ray detection unit 2, the X-ray generation unit 1, and the calibration device 3). In this embodiment as well, the controller 6 broadcasts a trigger including command information for the plurality of elements to the plurality of elements. Each element that receives the trigger transmits data to the controller 6 after its respective delay time in the same manner as described above. That is, in this embodiment as well, it is possible to enjoy the same effects as those described above.

[0051] Furthermore, since the trigger includes command information, there is no need to transmit the command information separately as in the above-mentioned example. Furthermore, the amount of information in commands for multiple elements is equal to or less than the amount of information stored in the header of an Ethernet frame. For example, the amount of information stored in the header is about 50 bytes, and the amount of information in commands is about 50 to 20 bytes. Therefore, even if command information for multiple elements is added to the area of ​​an Ethernet frame where trigger information is stored, the amount of information in the entire frame does not increase significantly. If the increase in the amount of information in the entire frame is about the same as described above, the transmission time is almost the same as when only the trigger is sent. Therefore, if command information for multiple elements is included in a trigger, the time required to send a command to each of the multiple elements can be eliminated, thereby shortening the control cycle and improving responsiveness.

[0052] Although not shown in Fig. 3, data may be transmitted sequentially from each of the multiple state measuring devices 4 at time intervals. The transmission of data from the multiple state measuring devices 4 may be the same as that described above.

[0053] The trigger can also include data on the delay time of each element, so that even if the amount of data from multiple elements changes, the delay time can be adjusted according to the change in the amount of data.

[0054] As described above, in the case of the X-ray thickness measuring device 100, it is preferable to transmit data at a predetermined control period. However, when the X-ray thickness measuring device 100 is set up (for example, calibration by the calibration device 3, changing the set values ​​of each element, operation by the operator, etc.), the time required for the controller 6 to perform calculations is often longer than the time required for the controller 6 to perform calculations when measuring the thickness of the measurement object 200. In this case, if the control period is set based on the case of a setup in which the calculation time is longer, it is not possible to improve the responsiveness. Also, the time required for the controller 6 to perform calculations when measuring the thickness of the measurement object 200 is almost constant.

[0055] Therefore, when measuring the thickness of the measurement object 200, a trigger is broadcast at a predetermined control period, and when setting up the X-ray thickness measurement device 100, the timing of broadcasting the trigger can be changed according to the calculation time required for the setup. For example, the controller 6 can broadcast a trigger after the calculation required for the setup is completed.

[0056] That is, when measuring the thickness of the measurement object 200, the control period is kept constant, and when setting up the X-ray thickness measurement device 100, the control period can be changed as necessary. In this way, productivity can be improved.

[0057] As described above, the controller 6 broadcasts a trigger to a plurality of elements. The plurality of elements that receive the trigger transmit data to the controller 6 based on their respective delay times set by their respective clocks. In this case, a predetermined time interval is provided between each of the data transmitted from the multiple elements to the controller 6.

[0058] The trigger may also include information on commands for a plurality of elements and information on delay times for each of the plurality of elements. In addition, when measuring the thickness of the object to be measured 200, the controller 6 broadcasts a trigger at a constant period, and when setting up the X-ray thickness measurement device 100, the controller 6 can change the timing of broadcasting the trigger depending on the calculation time required for the setup.

[0059] In addition, the controller 6 broadcasts a trigger to multiple elements and multiple state measuring devices 4, and the multiple state measuring devices 4 that receive the trigger can transmit data to the controller 6 based on their respective delay times set by clocks provided in each of the multiple state measuring devices 4. In this case, a predetermined time interval is provided between each of the data transmitted from the plurality of state measuring devices 4 to the controller 6.

[0060] Although some embodiments of the present invention have been illustrated above, these embodiments are presented as examples and are not intended to limit the scope of the invention. These novel embodiments can be implemented in various other forms, and various omissions, substitutions, modifications, etc. can be made without departing from the gist of the invention. These embodiments and their modifications are included in the scope and gist of the invention, and are included in the scope of the invention and its equivalents described in the claims. In addition, the above-mentioned embodiments can be implemented in combination with each other. [Explanation of symbols]

[0061] 1 X-ray generating unit, 2 X-ray detecting unit, 3 calibration device, 4 status measuring device, 5 housing, 6 controller, 16 X-ray, 100 X-ray thickness measuring device, 200 measurement object

Claims

1. A controller; A plurality of elements electrically connected to the controller and involved in at least one of generating X-rays and detecting the X-rays; Equipped with The controller broadcasts a trigger to the plurality of elements; An X-ray thickness measurement device in which the plurality of elements that receive the trigger transmit data to the controller based on their respective delay times set by clocks provided in the respective elements.

2. 2. The X-ray thickness measurement device according to claim 1, wherein a predetermined time interval is provided between each of the data transmitted from each of the plurality of elements to the controller.

3. 3. The X-ray thickness measurement device according to claim 1, wherein the trigger includes information on a command for the plurality of elements and information on the delay time for each of the plurality of elements.

4. The controller: When measuring the thickness of the object, the trigger is broadcast at a constant interval.

3. The X-ray thickness measurement device according to claim 1, wherein, when setting up the X-ray thickness measurement device, a timing for broadcasting the trigger is changed according to a calculation time required for the setting up.

5. a plurality of status measuring devices electrically connected to the controller for detecting a status of the X-ray thickness measuring device; the controller broadcasts the trigger to the elements and the state measuring devices; 2. The X-ray thickness measurement device according to claim 1, wherein the plurality of status measuring devices that receive the trigger transmit data to the controller based on their respective delay times set by clocks provided in each of the plurality of status measuring devices.

6. 6. The X-ray thickness measuring device according to claim 5, wherein a predetermined time interval is provided between each of the data transmitted from each of the plurality of state measuring devices to the controller.

Images