Measuring device, measurement method, and program

Abstract

To provide a measuring device capable of measuring characteristics including a transient response when a sine wave accompanying an actual transient change is inputted.SOLUTION: The measuring device comprises: a modulated wave generation unit for generating a ramp pulse modulated wave derived by modulating a carrier wave composed of a sine wave with a ramp pulse wave; an output unit for outputting a signal of the ramp pulse modulated wave generated by the modulated wave generation unit; an input unit to which an output signal from a measurement object being supplied with the signal of the ramp pulse modulated wave is inputted; and a characteristics estimation unit for estimating the characteristics of the measurement object on the basis of the ramp pulse modulated wave outputted from the output unit and an output signal from the measurement object. The modulated wave generation unit may change the frequency of the carrier wave in the ramp pulse modulated wave continuously or in steps, and the characteristics estimation unit may estimate the frequency characteristics of the measurement object.SELECTED DRAWING: Figure 2

Description

[Technical Field]

[0001] The present invention relates to measuring the characteristics of an object to be measured that can be used by inputting a sine wave. [Background technology]

[0002] BACKGROUND ART Conventionally, there is known a measuring device that supplies a sinusoidal signal to an object under test to measure the frequency characteristics of the object under test (see, for example, Patent Document 1). [Prior art documents] [Patent documents]

[0003] [Patent Document 1] Japanese Patent Publication No. 2020-165795 [Non-patent literature]

[0004] [Non-Patent Document 1] T. Hirakawa, N. Hasegawa, Y. Nakamoto, and Y. Ohta, "Calculation methods for the characteristics of rectifiers with modulated inputs using cw characteristics and amplitude probability distribution," in 2022 Wireless Power Week (WPW). IEEE, 2022, pp. 396-399. [Non-patent document 2] N. Ayir, T. Riihonen, and M. Heino, "Practical waveform-to-energy harvesting model and transmit waveform optimization for rf wireless power transfer systems," IEEE Transactions on Microwave Theory and Techniques, 2023. Summary of the Invention [Problem to be solved by the invention]

[0005] In the measurement device for measuring the characteristics of the device under test, there is a problem in that it is desired to measure the characteristics of the device under test including the transient response when a sinusoidal signal with realistic transient changes is input to the device under test. [Means for solving the problem]

[0006] An apparatus according to one aspect of the present invention is a measurement apparatus for measuring characteristics of an object under test, comprising: a modulated wave generation unit that generates a ramp pulse modulated wave by modulating a sine wave carrier wave with a ramp pulse wave, an output unit that outputs a signal of the ramp pulse modulated wave generated by the modulated wave generation unit, an input unit that receives an output signal from the object under test to which the ramp pulse modulated wave signal is supplied, and a characteristic estimation unit that estimates characteristics of the object under test based on the ramp pulse modulated wave signal output from the output unit and the output signal from the object under test input to the input unit.

[0007] In the measurement device, the modulated wave generating unit may change the frequency of the carrier wave in the ramp pulse modulated wave continuously or stepwise, and the characteristic estimating unit may estimate the frequency characteristics of the device under test.

[0008] The measuring device may include a control unit that controls the modulated wave generating unit to change at least one of the frequency fc of the carrier wave, the terminal power Pfin of the ramp pulse portion of the ramp pulse modulated wave, the starting power Pst (≠Pfin) of the ramp pulse portion of the ramp pulse modulated wave, the duty ratio D of the time occupied by the ramp pulse portion relative to the repetition period of the ramp pulse modulated wave, and the repetition period T of the ramp pulse portion in the ramp pulse modulated wave.

[0009] A method according to another aspect of the present invention is a method for measuring characteristics of an object under test, which includes generating a ramp pulse modulated wave by modulating a sine wave carrier wave with a ramp pulse wave, outputting a signal of the ramp pulse modulated wave and supplying it to an object under test, and estimating the characteristics of the object under test based on the signal of the ramp pulse modulated wave supplied to the object under test and an output signal from the object under test to which the signal of the ramp pulse modulated wave has been supplied. Includes.

[0010] The measurement method includes changing the frequency of the carrier wave in the ramp pulse modulated wave continuously or stepwise, and estimating the frequency characteristics of the device under test. may include:

[0011] The measurement method may include changing at least one of the frequency fc of the carrier wave, the terminal power Pfin of the ramp pulse portion of the ramp pulse modulated wave, the starting power Pst (≠Pfin) of the ramp pulse portion of the ramp pulse modulated wave, the duty ratio D which is the time occupied by the ramp pulse portion relative to the repetition period of the ramp pulse modulated wave, and the repetition period T of the ramp pulse portion in the ramp pulse modulated wave.

[0012] A program according to yet another aspect of the present invention is a program executed by a computer or processor provided in a measurement device that measures characteristics of an object under test, the program including: program code for generating a ramp pulse modulated wave by modulating a sine wave carrier wave with a ramp pulse wave, program code for outputting a signal of the ramp pulse modulated wave and supplying it to the object under test, and program code for estimating the characteristics of the object under test based on the signal of the ramp pulse modulated wave supplied to the object under test and an output signal from the object under test to which the ramp pulse modulated wave signal has been supplied.

[0013] The program may include program code for continuously or stepwise changing the frequency of the carrier wave in the ramp pulse modulated wave, and program code for estimating the frequency characteristics of the device under test.

[0014] The program may include program code for changing at least one of the frequency fc of the carrier wave, the terminal power Pfin of the ramp pulse portion of the ramp pulse modulated wave, the starting power Pst (≠Pfin) of the ramp pulse portion of the ramp pulse modulated wave, the duty ratio D of the time occupied by the ramp pulse portion relative to the repetition period of the ramp pulse modulated wave, and the repetition period T of the ramp pulse portion in the ramp pulse modulated wave.

[0015] In the measurement apparatus, the measurement method, and the program, the object under test may be a device, apparatus, equipment, or circuit that uses a modulated wave obtained by modulating a carrier wave with a modulating signal. For example, the object under test may be an amplifier, a transmitter, a receiver, a transceiver, an antenna, or a rectifier circuit in a power receiving device for wireless power transmission. Furthermore, there are no limitations on the frequency fc of the carrier wave and the frequency of the modulating signal. For example, the frequency fc of the carrier wave may be 1 GHz or higher.

[0016] The program may include a machine-learned model that estimates the characteristics. [Effects of the Invention]

[0017] According to the present invention, it is possible to measure characteristics including transient responses when a sinusoidal signal with realistic transient changes is input to an object under test. [Brief explanation of the drawings]

[0018] [Figure 1] FIG. 1 is an explanatory diagram showing an example of a schematic configuration of a measurement system including a measurement device according to an embodiment. [Figure 2] FIG. 2 is a block diagram showing an example of the main configuration of the measurement device according to the embodiment. [Figure 3] FIG. 3 is an explanatory diagram showing an example of a generalized DUT (device under test) whose characteristics can be measured by the measurement device according to the embodiment. [Figure 4] FIG. 4 is an explanatory diagram showing an example of frequency characteristics of the efficiency of a rectifier circuit of a power receiving device. [Figure 5] FIG. 5 is an explanatory diagram showing an example of frequency characteristics of reflectance and transmittance of an antenna. [Figure 6] FIG. 6 is a waveform diagram showing an example of a signal waveform in a steady state of a modulated wave such as a communication signal input to an actual amplifier or a power reception signal input to a rectifier circuit. [Figure 7] FIG. 7 is an explanatory diagram showing an example of a section to be processed by Fourier transform in the communication signal (modulated wave) of FIG. [Figure 8] FIG. 8 is an explanatory diagram showing an example of a power probability density distribution of a modulated wave in a DUP such as an amplifier or a rectifier circuit. [Figure 9] FIG. 9 is an explanatory diagram showing an example of the output versus input power characteristics of a modulated wave in a DUP such as an amplifier or a rectifier circuit. [Figure 10] Figures 10(a), 10(b), and 10(c) are explanatory diagrams showing an example of the time change in frequency, time change in amplitude, and waveform of an input signal (CW input) consisting of a continuous sine wave used in measurements related to the reference example. [Figure 11] Figures 11(a), 11(b), and 11(c) are explanatory diagrams showing an example of the time change in frequency, time change in amplitude, and waveform of an input signal (Swept-sine) consisting of a frequency-swept sine wave used in measurements related to the reference example. [Figure 12] 12(a), 12(b), and 12(c) are explanatory diagrams showing an example of the time change in frequency, the time change in amplitude, and the waveform of an input signal (Step-sine) consisting of a sine wave whose amplitude is changed in steps and used in measurements related to the reference example. [Figure 13]Figures 13(a), 13(b), and 13(c) are explanatory diagrams showing an example of the time change in frequency, the time change in amplitude, and the waveform of an input signal consisting of a single ramp pulse modulated wave (Ramp-sine) consisting of a sine wave whose amplitude is continuously changed and can be used in the measurement device of the embodiment. [Figure 14] Figures 14(a), 14(b), and 14(c) are explanatory diagrams showing an example of the time change in frequency, the time change in amplitude, and the waveform of an input signal consisting of a ramp-pulse-sine modulated wave (Ramp-pulse-sine) that is a repetition of pulsed sine waves with continuously increasing amplitude that can be used in the measurement device of the embodiment. [Figure 15] Figures 15(a), 15(b), and 15(c) are explanatory diagrams showing an example of the time change in frequency, the time change in amplitude, and the waveform of an input signal consisting of a ramp pulse modulated wave (inverse-ramp-pulse-sine) that is a repetition of pulsed sine waves with successively smaller amplitudes that can be used in the measurement device of the embodiment. [Figure 16] Figures 16(a), 16(b), and 16(c) are explanatory diagrams showing an example of the time change in frequency, time change in amplitude, and waveform of a generalized ramp pulse modulated wave that can be used in the measurement device of the embodiment, respectively. [Figure 17] Fig. 17(a) is an explanatory diagram showing an example of the waveform of a ramp pulse modulated wave input to a DUT in a measurement device according to an embodiment, and Fig. 17(b) is an explanatory diagram showing an example of the waveform of an output from a DUT when two types of ramp pulse modulated waves with different repetition frequencies shown in Fig. 17(a) are input. DETAILED DESCRIPTION OF THE INVENTION

[0019] Hereinafter, an embodiment of the present invention will be described with reference to the drawings. The device according to the embodiment described in this document is a measurement device that can measure characteristics (e.g., frequency characteristics, operating characteristics) including the actual transient response of a device under test (hereinafter also referred to as a "DUT" (Device Under Test)), such as an amplifier in a wireless device or a rectifier circuit in a receiving device for wireless power transmission, by using a ramp pulse modulated wave in which a carrier wave consisting of a sine wave is modulated with a ramp pulse wave.

[0020] Fig. 1 is an explanatory diagram showing an example of the schematic configuration of a measurement system including a measurement device 10 according to this embodiment. In Fig. 1, a ramp pulse modulated wave signal, which is output as a signal for characteristic measurement from an output section (output port) 120 of the measurement device 10, is supplied to an input port of a DUP 30 via a cable 210. An output signal output from the output port of the DUP 30 to which the ramp pulse modulated wave signal has been supplied is supplied to an input section (input port) 130 of the measurement device 10 via a cable 220, and is used to estimate the characteristics of the DUP 30.

[0021] The DUT 30, whose characteristics are measured by the measurement apparatus 10 of this embodiment, is an apparatus, device, circuit, or the like that can be used by inputting a sine wave signal or a modulated wave obtained by modulating a sine wave carrier wave with a modulating signal. For example, the DUT 30 may be an amplifier, a transmitter, a receiver, a transceiver, an antenna, or a rectifier circuit in a power receiving device for wireless power transmission. There are no limitations on the frequency of the sine wave, the carrier wave, or the modulating signal input to the DUT 30. For example, the frequency of the sine wave input to the DUT 30 may be, for example, 1 GHz or higher. Furthermore, the frequency of the modulating signal that modulates the sine wave carrier wave may be, for example, 10 MHz to 1 GHz, and particularly may be several tens of MHz to several hundreds of MHz.

[0022] FIG. 2 is a block diagram showing an example of the main components of a measurement apparatus 10 according to an embodiment. In FIG. 2, the measurement apparatus 10 includes a modulated wave generating unit 110, an output unit 120, an input unit 130, and a characteristic estimating unit 140. The modulated wave generating unit 110 generates a ramp pulse modulated wave by modulating a sine wave carrier wave with a ramp pulse wave. The output unit 120 outputs the ramp pulse modulated wave signal generated by the modulated wave generating unit 110. The output unit 120 is connected to an input unit of a DUT via a cable capable of transmitting high-frequency signals. The input unit 130 receives an output signal from a DUT (device under test) to which the ramp pulse modulated wave signal is supplied. The input unit 130 is connected to a signal output unit of the DUT via a cable capable of transmitting high-frequency signals. The characteristic estimating unit 140 estimates the characteristics of the DUT based on the ramp pulse modulated wave signal output from the output unit 120 and the output signal from the DUT input to the input unit 130.

[0023] The modulated wave generating section 110 may change the frequency fc of the carrier wave in the ramp pulse modulated wave continuously or stepwise, and the characteristic estimating section 140 may estimate the frequency characteristic of the DUT.

[0024] The measurement device 10 may include a control unit 150 that controls the other units, such as the modulated wave generating unit 110. The control unit 150 may control the modulated wave generating unit 110 to change the settings of the generation conditions of the ramp pulse modulated wave. For example, the control unit 150 may control the modulated wave generating unit 110 to change at least one of the frequency fc of the carrier wave of the ramp pulse modulated wave, the terminal power Pfin of the ramp pulse portion of the ramp pulse modulated wave, the starting power Pst (≠Pfin) of the ramp pulse portion of the ramp pulse modulated wave, the duty ratio D, which is the time occupied by the ramp pulse portion relative to the repetition period of the ramp pulse modulated wave, and the repetition period T of the ramp pulse portion of the ramp pulse modulated wave. This control can improve the measurement accuracy of the characteristics (e.g., frequency characteristics) of the DUP.

[0025] The measurement apparatus 10 may include a characteristic output section 160 that outputs the estimation results of the DUT characteristics (e.g., frequency characteristics) estimated by the characteristic estimation section 140. For example, the characteristic output section 160 may display an image of the estimation results (e.g., a characteristic graph) of the DUT characteristics (e.g., frequency characteristics) estimated by the characteristic estimation section 140 on a display, output the estimation results as sound information such as audio, or transmit data of the estimation results to an external device via wired or wireless communication. The characteristic output section 160 may display the waveform of at least one of the ramp pulse modulated wave signal output from the output section 120 and the output signal from the DUT input to the input section 130 in a graph with the horizontal axis as the time axis, or transmit the waveform to an external device via wired or wireless communication.

[0026] FIG. 3 is an explanatory diagram showing an example of a generalized DUT (device under test) 30 whose characteristics can be measured by the measurement device according to the embodiment. The DUT 30 has a main body 300, one or more input ports 310(1) to 310(n), one or more output ports 310(1) to 310(k), and one or more auxiliary ports 310(1) to 310(m). Ramp pulse modulated wave signals output from the output unit 120 of the measurement device 10 are supplied to and input to the input ports 310(1) to 310(n). The ramp pulse modulated wave signals input to the input ports vary depending on the measurement conditions. The output signals output from the output ports 310(1) to 310(k) are input to the input unit 130 of the measurement device 10. A measurement auxiliary device or a power supply that is independent of the measurement conditions is connected to the auxiliary port. The ramp pulse modulated wave signal input to the input port and the output signal output from the output ports 310(1) to 310(k) are measured and recorded by the measuring device 10.

[0027] Each DUT 30, such as a high-frequency element or high-frequency device, measured by the measuring apparatus 10 has its own characteristics. For example, a rectifier circuit in a power receiving device for wireless power transmission has frequency characteristics of efficiency as shown in Fig. 4. Also, for example, an antenna for wireless communication has frequency characteristics of reflectance and transmittance for signals transmitted and received by wireless communication as shown in Fig. 5.

[0028] The frequency characteristics of DUTs such as the rectifier circuits and antennas are characteristics in a steady state, and are obtained in conventional measurement methods using continuous wave input measurements in which a continuous sine wave (continuous wave) is input to the DUT. In such continuous wave input measurements, a transient response period occurs, which takes time to reach a steady state when the input conditions are changed. Furthermore, DUTs such as equipment and devices that receive modulated waves, such as amplifiers for wireless devices and rectifier circuits in wireless power transmission receivers, face conditions that require consideration of transient response. However, conventional measurement methods use continuous waves to measure frequency response in frequency space, making it impossible to measure characteristics that take the transient response into account.

[0029] FIG. 6 is a waveform diagram showing an example of a signal waveform in a steady state of a modulated wave, such as a communication signal input to an amplifier of an actual wireless device or a power receiving signal input to a rectifier circuit in a power receiving device for wireless power transmission. When the modulation frequency of the modulated wave is sufficiently small, the response of the amplifier and rectifier circuit can keep up with the changes in the modulated wave, so the steady state is always maintained. On the other hand, when the modulation frequency of the modulated wave is high, the response of the amplifier and rectifier circuit cannot keep up with the changes in the modulated wave, and the transient response becomes dominant over the overall operation. Therefore, analysis and measurement of the transient response are important for detailed analysis of the characteristics (frequency characteristics) of amplifiers, rectifier circuits, etc. to which modulated waves are input.

[0030] One method for measuring the characteristics (frequency characteristics) of amplifiers, rectifier circuits, etc. to which modulated waves are input is to use the Fourier transform. The absolute integrable function that forms the basis of the Fourier transform is defined as follows (1):

number

[0031] variable

number

number

[0032] The above formula (1) requires a definition in the entire time domain, so it cannot be used for measurements, etc. Therefore, in practice, it is necessary to extract it by period.

[0033] In practice, it is impossible to measure an infinite number of sample points, and the amount of data that can be used is limited, so for example, a discrete Fourier transform defined by the following equation (2) is used.

number

[0034] For example, as shown in Figure 7, a signal over a finite time period of 900 is cut out and subjected to discrete Fourier transform processing. However, this method using discrete Fourier transform involves cutting out a portion of the actual signal to perform the Fourier transform, which causes a problem of signal consistency where the waveform of the signal to be processed (Figure 7) deviates from the waveform of the actual signal (Figure 6), making it an inaccurate and unsuitable method.

[0035] As a characteristic analysis method that eliminates the discrepancy between the waveform of the signal to be processed and the waveform of the actual signal, a highly versatile analysis method that focuses on the time distribution of the modulated wave input to a rectifier circuit has been proposed (see Non-Patent Documents 1 and 2). For example, as shown in Fig. 8, the power probability density distribution of the modulated wave at the input and output of a DUT such as an amplifier or rectifier circuit can be measured, and based on the measurement results, the output-to-input power characteristic that shows the relationship between the input power and output power of the DUT can be obtained, as shown in Fig. 9. However, the method that focuses on the signal time distribution assumes that the period of the transient response of the device under test such as a rectifier circuit is sufficiently short.

[0036] In view of the above background, the measuring device 10 of this embodiment uses a ramp pulse modulated wave in which a carrier wave consisting of a sine wave is modulated with a ramp pulse wave, thereby making it possible to analyze the characteristics of a DUT, such as an amplifier in a wireless device or a rectifier circuit in a receiving device for wireless power transmission, when a modulated wave is input, including the actual transient response.

[0037] [Reference example] 10(a) to 10(c), 11(a) to 11(c), and 12(a) to 12(c) are explanatory diagrams showing examples of input signals used in measurements according to the reference example. FIGS. 10(a) to 10(c) are examples of input signals (CW input) consisting of a continuous sine wave, FIGS. 11(a) to 11(c) are examples of input signals (swept-sine) consisting of a frequency-swept sine wave, and FIGS. 12(a) to 12(c) are examples of input signals (step-sine) consisting of a sine wave whose amplitude changes in steps. When these modulated waves are used for measurements, it is not possible to measure characteristics, including transient responses, when a sine wave signal with realistic transient changes is input to a DUT. Furthermore, because the envelope of the modulated wave does not have a continuous slope on the time axis, it is not possible to measure characteristics that depend on the slope of the envelope of a realistic modulated wave.

[0038] For example, by setting the input periods in which the amplitude of the signals in Figures 10(a) to 10(c) and 12(a) to 12(c) is constant longer, it is possible to measure the steady-state response of the DUT for each input period, but it is not possible to measure characteristics including the transient response of the DUT. Also, since a modulated wave with a constant amplitude, i.e., a modulated wave whose envelope does not have a continuous slope on the time axis, is input to the DUT in each input period, it is not possible to measure characteristics that depend on the slope of the envelope of the modulated wave in a realistic DUT to which a modulated wave with a continuously changing amplitude is input.

[0039] 10(a) to 10(c) in a stepped manner starting from a no-input state and measuring the time response waveform of the DUT, the stability and transient response of the DUT can be measured. However, because the amount of change in amplitude when the stepped input is made is not finite, it is not possible to measure characteristics including the transient response when a sinusoidal signal with realistic transient changes is input to the DUT. Furthermore, it is not possible to measure characteristics that depend on the gradient of the envelope of a modulated wave in a realistic DUT when a modulated wave with continuously changing amplitude is input.

[0040] [Example] 13(a) to 13(c), 14(a) to 14(c), and 15(a) to 15(c) are explanatory diagrams showing examples of input signals used in measurements according to the reference example. Figures 13(a) to 13(c) are examples of input signals consisting of a single ramp-pulse modulated wave (Ramp-sine) consisting of a sine wave whose amplitude is continuously changed at a predetermined slope. Figures 14(a) to 14(c) are examples of input signals consisting of a ramp-pulse modulated wave (Ramp-pulse-sine) consisting of repeated pulsed sine waves whose amplitude is continuously increased at a predetermined slope. Figures 15(a) to 15(c) are examples of input signals consisting of a ramp-pulse modulated wave (Inverse-ramp-pulse-sine) consisting of repeated pulsed sine waves whose amplitude is continuously decreased at a predetermined slope. By using any of these ramp pulse modulated waves for measurements, it is possible to measure characteristics including the transient response when a sinusoidal signal with realistic amplitude transient changes is input to a DUT. In addition, because the envelope of the modulated wave has a slope on the time axis, it is possible to measure characteristics that depend on the slope of the envelope of the modulated wave in a realistic DUT when a modulated wave with continuously changing amplitude is input.

[0041] Furthermore, when the DUT to be measured by inputting a ramp pulse modulated wave as exemplified in the above embodiment is a rectifier circuit of the above-mentioned power receiving device, the time characteristics of the output voltage waveform can be analyzed in more detail than with conventional methods. Furthermore, when the DUT to be measured by inputting a ramp pulse modulated wave as exemplified in the above embodiment is an amplifier of a wireless device, the occurrence of spurious signals in modulated wave amplification and amplification efficiency can be discussed in more detail from the time domain. Furthermore, when the DUT to be measured by inputting a ramp pulse modulated wave as exemplified in the above embodiment is a harmonic device, limitations on the operational stability of the high-frequency device that depend on the slope of the envelope wave can be measured.

[0042] When a ramp pulse modulated wave as exemplified in the above embodiment is input to a DUT for measurement, it becomes possible to analyze and measure the characteristics of the first derivative of the input. For example, in measurements using a ramp pulse modulated wave, it is possible to add analysis parameters for analysis from the time domain, which is expected to enable theoretical and experimental analysis of the characteristics when a modulated wave is input, which was not possible with conventional analysis methods.

[0043] 16(a), 16(b), and 16(c) are explanatory diagrams showing an example of the time change in frequency, the time change in amplitude, and the waveform of a generalized ramp pulse modulated wave that can be used in the measurement device 10 according to the embodiment. The ramp pulse modulated wave used in the measurement device 10 of this embodiment is determined by the variables shown in the diagrams, specifically the following five variables: fc: Carrier frequency of the ramp pulse modulated wave Pfin: Terminal power of the ramp pulse portion of the ramp pulse modulated wave Pst: Starting power of the ramp pulse part of the ramp pulse modulated wave (≠ Pfin) D: Duty ratio of the time DT of the ramp pulse portion to the repetition period T of the ramp pulse modulated wave T: Repetition period T of the ramp pulse portion of the ramp pulse modulated wave

[0044] The control unit 150 (see FIG. 2) of the measurement device 10 controls at least one of the five variables described above as a control variable, and by changing the value of the control variable, it can control the setting of the ramp pulse modulated wave input to the DUT to change. This control can improve the measurement accuracy of the DUT characteristics (for example, frequency characteristics).

[0045] FIG. 17(a) is an explanatory diagram showing an example of the waveform of a ramp pulse modulated wave input to a DUP in a measurement device according to an embodiment. FIG. 17(b) is an explanatory diagram showing an example of the waveform of the output of a DUT when two types of ramp pulse modulated waves with different repetition frequencies shown in FIG. 17(a) are input. For example, when the transient response of the DUT is affected, changing the repetition period T of the ramp pulse portion of the ramp pulse modulated wave shown in FIG. 17(a) changes the output waveform of the DUT as shown in FIG. 7(b). That is, by changing the repetition period T of the ramp pulse portion of the ramp pulse modulated wave, the DUT output waveform C301 when the repetition period T is short differs significantly from the DUT output waveform C302 when the repetition period T is short. On the other hand, when the transient response of the DUT is not affected, the output waveform of the DUT remains the same even if the value of the repetition period T and other variables are changed. In this way, the modulation effect of the modulated wave input to the DUT can be estimated and measured based on the change in the output waveform of the DUT associated with the control variable.

[0046] Note that machine learning and a trained model may be used for the estimation of characteristics in this embodiment. Specifically, a trained model may be constructed using training data that links together the input of a ramp pulse modulated wave supplied from the measurement device 10 to the DUT 30, the output from the DUP 30 to which the signal of the ramp pulse modulated wave has been supplied, and information on characteristics (e.g., frequency characteristics) actually measured for the DUT 30. The input of the ramp pulse modulated wave to the DUT 30, the output from the DUP 30 to which the signal of the ramp pulse modulated wave has been supplied, etc. may then be input to the trained model, which may then output an estimated result of the characteristics (e.g., frequency characteristics) of the DUT 30.

[0047] As described above, according to this embodiment, it is possible to estimate characteristics (e.g., frequency characteristics, operating characteristics, etc.) including the transient response when a sinusoidal signal with realistic transient changes is input to a DUT (device under test) 30.

[0048] Furthermore, the present invention can provide a measuring device that can estimate characteristics, including transient responses, when a sinusoidal signal with realistic transient changes is input to the object being measured, thereby contributing to the achievement of Goal 9 of the Sustainable Development Goals (SDGs), which is to "build resilient infrastructure, promote inclusive and sustainable industrialization, and promote innovation and resilience."

[0049] It should be noted that the process steps and components of the measurement devices and systems described herein can be implemented by various means. For example, these steps and components may be implemented in hardware, firmware, software, or a combination thereof.

[0050] For hardware implementations, the processing units or other means used to implement the above steps and components in an entity (e.g., a measurement device, an amplifier, a transmitter, a receiver, a transceiver, a rectifier in a powered device) may be implemented in one or more application specific integrated circuits (ASICs), digital signal processors (DSPs), digital signal processors (DSPDs), programmable logic devices (PLDs), field programmable gate arrays (FPGAs), processors, controllers, microcontrollers, microprocessors, electronic devices, other electronic units designed to perform the functions described herein, computers, or combinations thereof.

[0051] Furthermore, with regard to firmware and / or software implementations, the means, such as a processing unit, used to realize the above components may be implemented with a program (e.g., code, such as procedures, functions, modules, instructions, etc.) that performs the functions described herein. In general, any computer / processor-readable medium tangibly embodying firmware and / or software code may be used to implement the means, such as a processing unit, used to realize the above steps and components described herein. For example, the firmware and / or software code may be stored in a memory and executed by a computer or processor, such as in a controller. The memory may be implemented within the computer or processor or external to the processor. Furthermore, the firmware and / or software code may be stored in a computer- or processor-readable medium, such as random access memory (RAM), read-only memory (ROM), non-volatile random access memory (NVRAM), programmable read-only memory (PROM), electrically erasable programmable read-only memory (EEPROM), flash memory, floppy disk, compact disk (CD), digital versatile disk (DVD), magnetic or optical data storage device, etc. The code may be executed by one or more computers or processors and may cause the computers or processors to perform certain aspects of the functionality described herein.

[0052] The medium may be a non-transitory recording medium. The program code may be in any format as long as it can be read and executed by a computer, processor, or other device or machine. For example, the program code may be in any of source code, object code, and binary code, or may be a mixture of two or more of these codes.

[0053] Moreover, the description of the embodiments disclosed herein is provided to enable any person skilled in the art to make or use the present disclosure. Various modifications to the present disclosure will be readily apparent to those skilled in the art, and the general principles defined herein may be applied to other variations without departing from the spirit or scope of the present disclosure. Thus, the present disclosure is not intended to be limited to the examples and designs described herein, but is to be accorded the widest scope consistent with the principles and novel features disclosed herein. [Explanation of symbols]

[0054] 10: Measuring equipment 30: Object under test (DUT) 110: Modulation wave generation unit 120: Output section 130: Input section 140: characteristic estimation unit 150: Control unit 160: Characteristic output section 210: Cable 220: Cable 300: Main unit 310: Input port 320: Output port 330: Auxiliary port

Claims

1. A measurement apparatus for measuring characteristics of an object to be measured, a modulated wave generating unit that generates a ramp pulse modulated wave by modulating a carrier wave consisting of a sine wave with a ramp pulse wave; an output unit that outputs the ramp pulse modulated wave generated by the modulated wave generating unit toward an object under test; an input section to which an output signal from the device under test to which the ramp pulse modulated wave signal is supplied is input; a characteristic estimating unit that estimates a characteristic of the device under test based on the ramp pulse modulated wave signal output from the output unit and an output signal from the device under test input to the input unit; A measuring device comprising:

2. 2. The measuring device of claim 1, the modulated wave generating unit changes the frequency of the carrier wave in the ramp pulse modulated wave continuously or stepwise; The measurement apparatus, wherein the characteristic estimating section estimates the frequency characteristics of the device under test.

3. 2. The measuring device of claim 1, a control unit that controls the modulated wave generating unit to change at least one of the frequency fc of the carrier wave, the terminal power Pfin of the ramp pulse portion of the ramp pulse modulated wave, the starting power Pst (≠Pfin) of the ramp pulse portion of the ramp pulse modulated wave, the duty ratio D, which is the time occupied by the ramp pulse portion relative to the repetition period of the ramp pulse modulated wave, and the repetition period T of the ramp pulse portion in the ramp pulse modulated wave.

4. 4. The measuring device according to claim 1, A measuring apparatus characterized in that the object to be measured is a device, apparatus, equipment, or circuit that uses a modulated wave obtained by modulating a carrier wave.

5. A measurement method for measuring a characteristic of an object to be measured, comprising: generating a ramp pulse modulated wave by modulating a carrier wave consisting of a sine wave with a ramp pulse wave; outputting the ramp pulse modulated wave signal and supplying it to an object to be measured; Estimating characteristics of the device under test based on the ramp pulse modulated wave signal supplied to the device under test and an output signal from the device under test to which the ramp pulse modulated wave signal is supplied; A measuring method comprising:

6. 6. The measurement method of claim 5, changing the frequency of the carrier wave in the ramp pulse modulated wave continuously or stepwise; estimating a frequency characteristic of the device under test; A measuring method comprising:

7. 6. The measurement method of claim 5, changing at least one of the frequency fc of the carrier wave, the terminal power Pfin of the ramp pulse portion of the ramp pulse modulated wave, the starting power Pst (≠Pfin) of the ramp pulse portion of the ramp pulse modulated wave, the duty ratio D of the time occupied by the ramp pulse portion relative to the repetition period of the ramp pulse modulated wave, and the repetition period T of the ramp pulse portion in the ramp pulse modulated wave; A measuring method comprising:

8. 8. The measurement method according to claim 5, A measuring method characterized in that the object to be measured is a device, apparatus, equipment, or circuit that uses a modulated wave obtained by modulating a carrier wave.

9. A program executed by a computer or processor provided in a measurement device that measures characteristics of an object to be measured, program code for generating a ramp pulse modulated wave by modulating a carrier wave consisting of a sine wave with a ramp pulse wave; program code for outputting the ramp pulse modulated wave signal and supplying it to an object under test; program code for estimating characteristics of the device under test based on the ramp pulse modulated wave signal supplied to the device under test and an output signal from the device under test to which the ramp pulse modulated wave signal is supplied; A program comprising:

10. In the program of claim 9, program code for continuously or stepwise changing the frequency of the carrier wave in the ramp pulse modulated wave; program code for estimating the frequency characteristics of the device under test; A program comprising:

11. In the program of claim 9, A program characterized by including program code for changing at least one of the frequency fc of the carrier wave, the terminal power Pfin of the ramp pulse portion of the ramp pulse modulated wave, the starting power Pst (≠Pfin) of the ramp pulse portion of the ramp pulse modulated wave, the duty ratio D which is the time occupied by the ramp pulse portion relative to the repetition period of the ramp pulse modulated wave, and the repetition period T of the ramp pulse portion in the ramp pulse modulated wave.

12. In any one of claims 9 to 11, The program is characterized in that the object to be measured is a device, apparatus, equipment, or circuit that uses a modulated wave obtained by modulating a carrier wave.

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