Flicker value calculation and power supply harmonic analysis device, analytical device, and flicker value calculation and power supply harmonic analysis method

Abstract

To provide a flicker value calculation and power supply harmonic analysis device capable of estimating flicker values and power supply harmonic analysis results compliant with required standards while being connected to a commercial power supply.SOLUTION: A processor is configured to store a measured voltage and measured waveform thereof in a memory, extract voltage and current waveforms within a predetermined time range from the measured voltage and measured waveform thereof stored in the memory, perform a standard-compliant power supply harmonic calculation current conversion for converting the extracted voltage and current waveforms into voltage and current waveforms when connected to a power supply compliant with predetermined standards, analyze the power supply harmonic current from the converted current waveform, perform a standard-compliant flicker value calculation voltage conversion for converting the extracted voltage and current waveforms into voltage and current waveforms when connected to a power supply compliant with predetermined standards and a reference impedance network, calculate a flicker value from the converted voltage waveform, and output results of the power supply harmonic analysis and the calculated flicker value to an output interface.SELECTED DRAWING: Figure 1

Description

[Technical Field]

[0001] The present invention relates to a configuration of an inspection device and an inspection method for calculating flicker values ​​and analyzing power supply harmonics in electronic devices, and in particular to a technique that is effective when applied to large-scale medical analysis devices. [Background technology]

[0002] Large equipment such as medical analyzers must pass flicker and power supply harmonics regulation tests based on international standards.

[0003] Power sources and power distribution networks have some impedance, and if the current consumed by the load connected to them fluctuates, the power supply voltage also changes accordingly, so standards regulate voltage fluctuations (flicker).

[0004] In addition, power supply current often contains distortion components (harmonic components) that are different from sine waves, and these harmonic components can cause malfunctions in other equipment and overheating and burning of transformers and capacitors on the power distribution network, so there is a need to suppress these harmonic components as well.

[0005] Background art in this technical field includes, for example, technology such as that described in Patent Document 1. Patent Document 1 discloses "a flicker suppression device and a flicker suppression method that can stably and continuously suppress flicker even when resonance or the like occurs due to a variable load." [Prior art documents] [Patent documents]

[0006] [Patent Document 1] Japanese Patent Application Laid-Open No. 2007-282365 Summary of the Invention [Problem to be solved by the invention]

[0007] The above-mentioned flicker and power supply harmonic regulation tests require dedicated equipment such as a stabilized power supply, RIN (Reference Impedance Network), and flicker meter.

[0008] However, the medical analyzer to be tested, as well as the stabilized power supply, RIN, and flicker meter required for testing, are all relatively large devices, making them difficult to transport and difficult to conduct tests during development.

[0009] On the other hand, if testing is conducted after development, there is a possibility that failure of the test will require going back to the design stage, which can result in increased costs and delays in development.

[0010] The above-mentioned Patent Document 1 does not take such issues into consideration, and there is room for improvement.

[0011] Therefore, an object of the present invention is to provide a flicker value calculation and power supply harmonic analysis device that can be easily connected to equipment under development and that can estimate flicker value and power supply harmonic analysis results that comply with the required standards when connected to a commercial power source, as well as an analysis device and a flicker value calculation and power supply harmonic analysis method that use the same. [Means for solving the problem]

[0012] In order to solve the above problems, the present invention provides a flicker value calculation and power supply harmonic analysis device comprising: an input interface that receives measured voltages, measured currents, and measurement parameters; a storage device that stores a program including calculation contents and standard parameters; a processor that performs calculations; and an output interface that outputs flicker test results and harmonic current test results, wherein the processor stores the measured voltages and their measurement waveforms in a memory; extracts voltage and current waveforms within a predetermined time axis range from the measured voltages and their measurement waveforms stored in the memory; performs standard-compliant power supply harmonic calculation current conversion that converts the extracted voltage and current waveforms into voltage and current waveforms when connected to a power supply that complies with the predetermined standard; analyzes power supply harmonic currents from the converted current waveforms; performs standard-compliant flicker value calculation voltage conversion that converts the extracted voltage and current waveforms into voltage and current waveforms when connected to a power supply and reference impedance network that complies with the predetermined standard; calculates a flicker value from the converted voltage waveform; and outputs the results of the power supply harmonic analysis and the calculated flicker value to the output interface.

[0013] The present invention also provides an analysis device comprising a power supply receiving unit, an analysis device output interface, the above-mentioned flicker value calculation and power supply harmonic analysis device, and an analysis unit, wherein the flicker value calculation and power supply harmonic analysis device acquires the current and voltage of the power supply supplied from the power supply receiving unit to the analysis unit, and outputs the analysis results of the flicker value calculation and power supply harmonic analysis device to the analysis device output interface.

[0014] The present invention is also characterized by including the steps of: (a) measuring the voltage and current of power supplied from a power source to an electronic device, and storing the measured voltage and current and their measured waveforms in memory; (b) extracting voltage and current waveforms within a predetermined time axis range from the measured voltage and its measured waveform stored in the memory; (c) converting the voltage and current waveforms extracted in step (b) into voltage and current waveforms when connected to a power source that complies with a predetermined standard; (d) analyzing power supply harmonic current from the current waveform converted in step (c); (e) converting the voltage and current waveforms extracted in step (b) into voltage and current waveforms when connected to a power source and reference impedance network that complies with a predetermined standard; (f) calculating a flicker value from the voltage waveform converted in step (e); and (g) outputting the results of the power supply harmonic analysis analyzed in step (d) and the results of the flicker value calculated in step (f) to an output interface. [Effects of the Invention]

[0015] According to the present invention, it is possible to realize a flicker value calculation and power supply harmonic analysis device that can be easily connected to a device under development and that can estimate flicker value and power supply harmonic analysis results that comply with the required standards when connected to a commercial power source, as well as an analysis device and a flicker value calculation and power supply harmonic analysis method that use the same.

[0016] This makes it possible to estimate the flicker value and power supply harmonic regulation test results based on international standards, for example, during the development stage of a medical analysis device, preventing the need for design rework due to test failure.

[0017] Problems, configurations, and effects other than those described above will become apparent from the following description of the embodiments. [Brief explanation of the drawings]

[0018] [Figure 1] 1 is a diagram schematically illustrating the basic concept of the present invention. [Figure 2]1 is a functional block diagram showing a schematic configuration of a flicker value calculation and power supply harmonic analysis device according to a first embodiment of the present invention. [Figure 3] 3 is a flowchart showing the processing of the standard-compliant flicker value calculation voltage conversion unit 13 in FIG. 2. [Figure 4] 3 is a functional block diagram showing the configuration of a power supply harmonic calculation unit 11 in FIG. 2. FIG. [Figure 5] 5 is a diagram schematically illustrating the configuration and processing of a power supply voltage influence correction unit 19 in FIG. 4. FIG. [Figure 6] 5 is a diagram schematically illustrating the configuration and processing of a power supply harmonic supply capacity corrector 20 in FIG. 4. FIG. [Figure 7] FIG. 10 is a functional block diagram showing a schematic configuration of an analyzer according to a second embodiment of the present invention. [Figure 8] FIG. 10 is a functional block diagram showing a schematic configuration of an analyzer according to a third embodiment of the present invention. [Figure 9] 1A and 1B are diagrams schematically illustrating the effects of the present invention. DETAILED DESCRIPTION OF THE INVENTION

[0019] Hereinafter, an embodiment of the present invention will be described with reference to the drawings. In the drawings, the same components are designated by the same reference numerals, and detailed description of overlapping parts will be omitted. [Example]

[0020] First Embodiment A flicker value calculation and power supply harmonic analysis device and a flicker value calculation and power supply harmonic analysis method according to a first embodiment of the present invention will be described with reference to FIGS. 1 to 6 and 9. FIG.

[0021] First, the basic concept of the present invention will be explained using Fig. 1. Fig. 1 is a diagram schematically showing the basic concept of the present invention.

[0022] As shown in Figure 1, the flicker value calculation and power supply harmonic analysis device 1 of the present invention estimates standard-compliant flicker values ​​and power supply harmonics from the voltage and current of a test object (medical analysis device 2 in Figure 1) connected to the building power supply (commercial power supply) 3 at a development site.

[0023] In the example of Figure 1, a building power supply (commercial power supply) 3 and a terminal block 5 of the medical analysis device 2 are connected via a circuit breaker 4, and power (e.g., AC 200V) is supplied from the building power supply (commercial power supply) 3 to the medical analysis device 2.

[0024] A conventional data logger 7 is connected to a measurement point 6 installed on the power supply line from the building power supply (commercial power supply) 3 to the medical analysis device 2, and measures the voltage and current of the medical analysis device 2 under test. The measured voltage and current values ​​of the medical analysis device 2 are transmitted to the flicker value calculation and power supply harmonic analysis device 1.

[0025] Since compact and easy-to-carry data loggers are widely used, hereafter the voltage and current measurement system including the data logger 7 will also be referred to as the "simple measurement system (reference numeral 8)."

[0026] The flicker value calculation and power supply harmonic analysis device 1 of the present invention has a flicker simulation model that calculates a flicker value that complies with a predetermined standard (e.g., an international standard for medical analysis devices) based on input voltage and current values, and a power supply harmonic simulation model that analyzes power supply harmonics that complies with the predetermined standard.

[0027] In the flicker simulation model, based on the input voltage and current values, the voltage conversion model calculates the flicker meter input voltage in the standard-compliant power supply system from the measured values ​​of the simple measurement system 8.

[0028] The calculated flicker meter input voltage in the standard-compliant power supply system is then input into a known flicker value meter calculation model to calculate a standard-compliant flicker value.

[0029] In addition, in the power supply harmonic simulation model, based on the input voltage and current values, the current conversion model calculates the power supply harmonic meter input current in the standard-compliant power supply system from the measurement values ​​of the simple measurement system 8.

[0030] Then, the calculated power supply harmonic meter input current in the standard-compliant power supply system is input to a known power supply harmonic calculation model to calculate the standard-compliant power supply harmonics.

[0031] As described above, by using the voltage conversion model and current conversion model of the present invention to calculate standard-compliant flicker values ​​and standard-compliant power supply harmonics, it is possible to provide standard-compliant estimated values ​​of flicker and harmonics in real time during the development stage of electronic devices (e.g., medical analysis device 2), thereby shortening the development period.

[0032] Next, a flicker value calculation and power supply harmonic analysis device according to a first embodiment of the present invention will be described with reference to Fig. 2. Fig. 2 is a functional block diagram showing a schematic configuration of a flicker value calculation and power supply harmonic analysis device 1 of this embodiment, and shows an example in which the flicker simulation model and power supply harmonic simulation model of Fig. 1 are embodied.

[0033] As shown in Figure 2, the flicker value calculation and power supply harmonic analysis device 1 of this embodiment mainly comprises a power supply voltage and current waveform acquisition unit 9 that acquires power supply voltage and current waveforms from a simple measurement system 8 as needed; a standard parameter storage unit 12 in which various parameters of a predetermined standard (e.g., an international standard for medical analysis equipment) are stored in advance; a flicker value calculation unit 10 that estimates the flicker value of a target electronic device based on the voltage and current waveforms extracted by the power supply voltage and current waveform acquisition unit 9 and the information stored in the standard parameter storage unit 12; a power supply harmonic calculation unit 11 that estimates the power supply harmonics of the target electronic device based on the voltage and current waveforms extracted by the power supply voltage and current waveform acquisition unit 9 and the information stored in the standard parameter storage unit 12; and a result display unit 17 that displays the estimation results of the flicker value calculation unit 10 and the power supply harmonic calculation unit 11.

[0034] The flicker value calculation unit 10 includes a standard-compliant flicker value calculation voltage conversion unit 13 and a flicker value calculation unit 14 .

[0035] The voltage conversion unit 13 for calculating standard-compliant flicker values ​​performs voltage conversion for calculating standard-compliant flicker values, converting the voltage and current waveforms extracted by the power supply voltage and current waveform acquisition unit 9 into voltage and current waveforms when connected to a power supply and RIN (reference impedance network) that comply with a predetermined standard (e.g., an international standard for medical analysis equipment) stored in the standard parameter storage unit 12.

[0036] The flicker value calculation unit 14 estimates the flicker value of the target electronic device based on the result of the standard-compliant flicker value calculation voltage conversion unit 13.

[0037] The power supply harmonic calculation unit 11 has a standard-compliant power supply harmonic calculation current conversion unit 15 and a standard-compliant harmonic current calculation unit 16 .

[0038] The standard-compliant power supply harmonic calculation current conversion unit 15 performs standard-compliant power supply harmonic calculation current conversion, which converts the voltage and current waveforms extracted by the power supply voltage and current waveform acquisition unit 9 into voltage and current waveforms when connected to a power supply that complies with a specified standard (e.g., international standard for medical analysis equipment) stored in the standard parameter storage unit 12.

[0039] The standard-compliant harmonic current calculation unit 16 estimates the power supply harmonics of the target electronic device based on the result of the standard-compliant power supply harmonic calculation current conversion unit 15.

[0040] The flicker value calculation and power supply harmonic analysis device 1 of this embodiment is configured as described above, and can easily estimate the flicker value and power supply harmonics of a target electronic device all at once from voltage and current waveforms measured by a simplified measurement system 8 using a conventional data logger 7.

[0041] The processing in the standard-compliant flicker value calculation voltage converter 13 will be described in detail with reference to Fig. 3. Fig. 3 is a flowchart showing the processing in the standard-compliant flicker value calculation voltage converter 13 of Fig. 2.

[0042] As a prerequisite for the voltage conversion process in the standard-compliant flicker value calculation voltage conversion unit 13, the device impedance (Z dut ) time change and the equipment impedance (Z dut ) The time change is assumed to be the same.

[0043] In the standard-compliant flicker value calculation voltage conversion unit 13, first, when the voltage and current waveforms measured by the simple measurement system 8 are input (step S1), the active power and reactive power are calculated in step S2. In parallel with this, the current effective value I dut Calculate (real number).

[0044] Next, in step S4, the apparent power S (complex number) is calculated from the active power and reactive power calculated in step S2.

[0045] Next, in step S5, the effective current value I calculated in step S3 is dut (real number) and the apparent power S (complex number) calculated in step S4, the impedance Z of the target electronic device (medical analysis device) is calculated. dut Calculates time change (complex number).

[0046] Finally, in step S6, ZRIN and ZRIN are added to the ideal power supply voltage. dut The flicker meter input voltage (V in ) is calculated.

[0047] In addition, the flicker meter input voltage V in the formula of step S6 in , ideal power supply voltage E idal , device impedance Z dut , RIN impedance Z Rin1 ,Z Rin2 is as shown in the equivalent circuit in Figure 3.

[0048] The configuration and processing of the power supply harmonic calculation unit 11 will be described in detail with reference to Fig. 4. Fig. 4 is a functional block diagram showing the configuration of the power supply harmonic calculation unit 11 in Fig. 2.

[0049] The power supply voltage and current waveforms acquired by the power supply voltage and current waveform acquisition unit 9 from the simple measurement system 8 as needed are input to the standard-compliant power supply harmonic calculation current conversion unit 15 of the power supply harmonic calculation unit 11, where data (waveform) is extracted with the FFT window (fast Fourier transform and window processing) width in the FFT window data extraction unit 18. The number of extractions is set to a sufficient time length as specified in the standard.

[0050] The data (waveform) extracted by the FFT window data extracting unit 18 is input to the power supply voltage influence correcting unit 19, and correction is performed by the power supply voltage influence correcting unit 19. Details of this correction will be described later with reference to FIG.

[0051] The data (waveform) corrected by the power supply voltage influence correction unit 19 is input to the harmonic current calculation unit 31 of the standard-compliant harmonic current calculation unit 16, and the harmonic current calculation unit 31 calculates the power supply harmonics for each FFT window width.

[0052] The order of processing by the FFT window data extracting unit 18 and the power supply voltage influence correcting unit 19 is not limited.

[0053] The data (waveform) is then input to the harmonic current calculation unit 31 of the standard-compliant harmonic current calculation unit 16, and the harmonic current calculation unit 31 calculates the power supply harmonics at the cut-out time of the target electronic device based on the input data (waveform).

[0054] Thereafter, the power supply harmonics are input to the power supply harmonic supply capacity corrector 20, where power supply harmonic supply capacity corrector 20 performs power supply harmonic correction.

[0055] Thereafter, the data is input to a leveling processor 21, where leveling processing is performed. The data (waveform) that has been leveled in the leveling processor 21 is input to a pass / fail determination unit 22, where pass / fail determination is made by comparing it with a preset threshold value.

[0056] The order of the power supply harmonic supply capacity correction unit 20 and the leveling process 21 may be reversed.

[0057] The configuration and processing of the power supply voltage influence correction unit 19 will be described in detail with reference to Fig. 5. Fig. 5 is a diagram schematically showing the configuration and processing of the power supply voltage influence correction unit 19 in Fig. 4.

[0058] Power supplies must be designed and manufactured to meet certain standards (for example, international standards for medical analysis equipment). As shown in Figure 5, for example, the voltage must be within ±2%, the frequency within ±0.5%, and the phase difference within ±1.5°.

[0059] When the data (waveforms of measured current and voltage values) extracted by the FFT window data extracting unit 18 is input to the power supply voltage influence correcting unit 19, a correction coefficient is calculated in the correction coefficient calculating unit 23. This correction coefficient is calculated by dividing the effective voltage value by the standard voltage value.

[0060] Based on the correction coefficient calculated by the correction coefficient calculation unit 23, the voltage correction unit 24 calculates the correction current. This correction current is calculated by multiplying the input data (waveform of the current measurement value) by the correction coefficient calculated by the correction coefficient calculation unit 23.

[0061] The configuration and processing of the power supply harmonic supply capacity corrector 20 will be described in detail with reference to Fig. 6. Fig. 6 is a diagram schematically showing the configuration and processing of the power supply harmonic supply capacity corrector 20 of Fig. 4.

[0062] Power supplies are required to be designed and manufactured to meet specified standards (for example, international standards for medical analysis equipment). As shown in Figure 6, for example, the standard specifies that the third harmonic content should be 0.9% or less, the fifth harmonic content should be 0.4% or less, the seventh harmonic content should be 0.3% or less, the ninth harmonic content should be 0.2% or less, the second, fourth, sixth, eighth, and tenth harmonic content should be 0.2% or less, and the eleventh to fortieth harmonic content should be 0.1% or less.

[0063] The power supply harmonic supply capacity correction unit 20 calculates the voltage V measured without load. no , and the current and voltage V measured with a sufficient load full ,I full The source impedance Z is calculated from the voltage drop based on this. dut is the voltage measured without load, V no The voltage measured with a sufficient load from V full The current measured with a sufficient load, I full It is calculated by dividing by .

[0064] Thereafter, the harmonic current voltage drop rate is calculated based on the calculated power supply impedance Z, and then harmonic current correction is performed based on the calculated harmonic current voltage drop rate.

[0065] Here, the correction factor is the harmonic current I multiplied by the power supply impedance Z dut and the harmonic order n (n is an integer) multiplied by the voltage V measured with no load. no It is calculated by dividing by .

[0066] The flicker value calculation and power supply harmonic analysis device 1 shown in FIG. 2 can be realized by a hardware configuration including, for example, an input / output interface (I / O), a storage device (memory), and an arithmetic processing device (processor).

[0067] In this case, the input / output interface (I / O) receives the measured voltage and measured current extracted by the power supply voltage / current waveform acquisition unit 9 and the measurement parameters previously set in the memory device (standard parameter storage unit 12), the memory device stores a program including the calculation processing content and standard parameters in the arithmetic processing unit, the arithmetic processing unit executes the processes of the standard-compliant flicker value calculation voltage conversion unit 13, the flicker value calculation unit 14, the standard-compliant power supply harmonic calculation current conversion unit 15, and the standard-compliant harmonic current calculation unit 16, and outputs the flicker test results and harmonic current test results from the input / output interface (I / O).

[0068] As described above, the flicker value calculation and power supply harmonic analysis device 1 of this embodiment includes an input interface that receives measured voltages, measured currents, and measurement parameters, a storage device that stores a program including calculation details and standard parameters, a processor that performs calculations, and an output interface that outputs flicker test results and harmonic current test results. The processor stores the measured voltages and their measured waveforms in memory, extracts voltage and current waveforms within a predetermined time axis range from the measured voltages and their measured waveforms stored in memory, performs standard-compliant power supply harmonic calculation current conversion that converts the extracted voltage and current waveforms into voltage and current waveforms when connected to a power supply that complies with a predetermined standard, analyzes power supply harmonic currents from the converted current waveforms, and also performs standard-compliant flicker value calculation voltage conversion that converts the extracted voltage and current waveforms into voltage and current waveforms when connected to a power supply and RIN (reference impedance network) that complies with a predetermined standard, calculates a flicker value from the converted voltage waveform, and outputs the results of the power supply harmonic analysis and the calculated flicker value to the output interface.

[0069] According to this embodiment, the flicker value and power supply harmonics when connected to the stabilized power supply used in the test can be estimated from the current and voltage of the analysis target connected to the commercial power supply.

[0070] A specific example of the effect of the flicker value calculation and power supply harmonic analysis device 1 of the present invention will be described with reference to Fig. 9. Fig. 9 is a diagram schematically showing the effect of the present invention.

[0071] As shown in Figure 9, conventionally, to conduct flicker standard compliance tests, it is necessary to connect a stabilized power supply or RIN, but these test devices are relatively large and not easy to move, making it difficult to conduct tests during development. For this reason, flicker standard compliance tests are conducted after development, but if the product fails, countermeasures must be considered, which means going back to the design stage, which is time-consuming and costly.

[0072] Similarly, to conduct power supply harmonic compliance tests, it is necessary to connect a stabilized power supply, but stabilized power supplies are relatively large devices that are not easy to move, making it difficult to conduct tests during development. For this reason, power supply harmonic compliance tests are conducted after development, but if the test fails, countermeasures must be considered, and the product must be returned to the design stage, which is time-consuming and costly.

[0073] Therefore, by applying the flicker value calculation and power supply harmonic analysis device 1 of the present invention, it becomes possible to easily evaluate power supply fluctuations and power supply harmonics all at once at any timing during the development stage, and even if a test fails, countermeasures can be taken immediately.Furthermore, since failures do not generally occur in the power supply harmonic standard compliance test and the flicker standard compliance test, increases in development time and costs can be suppressed. [Example]

[0074] Second Embodiment A flicker value calculation and power supply harmonic analysis device and a flicker value calculation and power supply harmonic analysis method according to a second embodiment of the present invention will be described with reference to Fig. 7. Fig. 7 is a functional block diagram showing a schematic configuration of the analysis device of this embodiment.

[0075] In this embodiment, an analysis device 25 equipped with the flicker value calculation and power supply harmonic analysis device 1 of the present invention described in the first embodiment will be described.

[0076] As shown in FIG. 7, the analysis device 25 of this embodiment mainly comprises the flicker value calculation and power supply harmonic analysis device 1 described in the first embodiment, an analysis unit 26, a power supply receiving unit 27, and an output interface 28.

[0077] As explained in Example 1, the flicker value calculation and power supply harmonic analysis device 1 also has a result display unit 17 as a function (output interface) for notifying the user of the calculation results and analysis results, but the output interface 28 of the analysis device 25 may also serve as the result display unit 17, or the result display unit 17 and the output interface 28 may be provided separately. Hereinafter, when both the result display unit 17 and the output interface 28 are provided, the output interface 28 of the analysis device 25 will be referred to as the "output interface for the analysis device" in order to clearly distinguish it from the result display unit 17.

[0078] The analysis device 25 of this embodiment includes a power supply receiving unit 27, an analysis device output interface 28, the flicker value calculation and power supply harmonic analysis device 1 described in the first embodiment, and an analysis unit 26. The flicker value calculation and power supply harmonic analysis device 1 acquires the current and voltage of the power supply supplied from the power supply receiving unit 27 to the analysis unit 26, and outputs the analysis results of the flicker value calculation and power supply harmonic analysis device 1 to the analysis device output interface 28.

[0079] According to this embodiment, the flicker and power supply harmonics generated by the analyzer 25 can be acquired in real time during operation and displayed to the user, thereby making it possible to quantitatively reduce the impact on other devices. [Example]

[0080] Third Embodiment A flicker value calculation and power supply harmonic analysis device and a flicker value calculation and power supply harmonic analysis method according to a third embodiment of the present invention will be described with reference to Fig. 8. Fig. 8 is a functional block diagram showing a schematic configuration of the analysis device of this embodiment.

[0081] In this embodiment, a specific configuration example of the analysis unit 26 described in the second embodiment will be described.

[0082] 8, the analysis unit 26 of this embodiment includes a load 30 and a load control unit 29 that controls the load 30. The analysis unit 26 may include components other than the load 30 and the load control unit 29.

[0083] In the analysis device 25 of this embodiment, the analysis unit 26 includes at least a load 30 and a load control unit 29 that controls the load 30, and outputs the flicker value calculation and the analysis results of the power supply harmonic analysis device 1 to the analysis device output interface 28 and the load control unit 29, and changes the control of the load 30 by the load control unit 29 based on the flicker value calculation and the analysis results of the power supply harmonic analysis device 1.

[0084] According to this embodiment, the flicker and power supply harmonics generated by the analyzer 25 are acquired in real time during operation, and load control is performed, thereby making it possible to suppress the occurrence of flicker and power supply harmonics.

[0085] For example, if the medical analyzer 2 is equipped with at least two heaters 1 and 2, the flicker value will increase when heaters 1 and 2 are operating simultaneously. This can be detected and the control of heaters 1 and 2 can be changed to suppress the increase in the flicker value. In addition, the analyzer output interface 28 can notify the user as necessary.

[0086] The present invention is not limited to the above-described embodiments and includes various modifications. For example, the above-described embodiments have been described in detail to clearly explain the present invention, and the present invention is not necessarily limited to those including all of the described configurations. Furthermore, it is possible to replace part of the configuration of one embodiment with the configuration of another embodiment, or to add the configuration of another embodiment to the configuration of one embodiment. Furthermore, it is possible to add, delete, or replace part of the configuration of each embodiment with other configurations. [Explanation of symbols]

[0087] 1...Flicker value calculation and power supply harmonic analyzer 2…Medical analyzer 3…Building power supply (commercial power supply) 4... Circuit breaker 5...Terminal block 6...Measurement point 7...Data logger 8...Simple measurement system 9...Power supply voltage and current waveform acquisition section 10...Flicker value calculation section 11…Power harmonic calculation section 12...Standard parameter storage section 13...Voltage conversion section for calculating standard-compliant flicker values 14...Flicker value calculation section 15...Standard-compliant power supply harmonic calculation current conversion unit 16...Standard-compliant harmonic current calculation section 17...Result display section 18...FFT window data extraction section 19...Power supply voltage influence compensation section 20...Power harmonic supply ability correction section 21...Leveling processing unit 22... Pass / fail judgment section 23...Correction coefficient calculation unit 24...Voltage correction unit 25…Analyzer 26…Analysis Department 27...Power supply receiving section 28...(Analyzer) Output interface 29...Load control section 30...Load 31...Harmonic current calculation section.

Claims

1. an input interface for receiving the measurement voltage, measurement current, and measurement parameters; a storage device for storing a program including calculation processing details and standard parameters; a processor for performing arithmetic processing; an output interface for outputting the flicker test result and the harmonic current test result; A flicker value calculation and power supply harmonic analysis device comprising: The processor stores the measured voltage and its measured waveform in a memory; extracting voltage and current waveforms within a predetermined time axis range from the measured voltage and the measured waveform stored in the memory; A current conversion for standard-compliant power supply harmonic calculation is performed to convert the extracted voltage and current waveforms into voltage and current waveforms when connected to a power supply that complies with a predetermined standard; Analyzing power supply harmonic currents from the converted current waveform; performing a voltage conversion for calculating a standard-compliant flicker value, converting the extracted voltage and current waveforms into voltage and current waveforms when connected to a power supply and a reference impedance network that comply with the predetermined standard; Calculating a flicker value from the converted voltage waveform; The flicker value calculation and power supply harmonic analysis device is characterized in that the results of the power supply harmonic analysis and the calculated flicker value are output to the output interface.

2. A power supply receiving section; an output interface for an analytical device; The flicker value calculation and power supply harmonic analysis device according to claim 1; an analysis unit; An analytical device comprising: The flicker value calculation and power supply harmonic analysis device acquires the current and voltage of the power supply supplied from the power receiving unit to the analysis unit, An analysis device characterized in that the analysis results of the flicker value calculation and power supply harmonic analysis device are output to the analysis device output interface.

3. The analysis device according to claim 2, the analysis unit includes at least a load and a load control unit that controls the load; The flicker value calculation and the analysis results of the power supply harmonic analysis device are output to the analysis device output interface and the load control unit, The analysis device changes the control by the load control unit based on the results of the flicker value calculation and the analysis by the power supply harmonic analyzer.

4. A method for calculating flicker values ​​and analyzing power supply harmonics in electronic devices, including the following steps: (a) measuring the voltage and current of the power supplied from the power source to the electronic device, and storing the measured voltage and current and their measured waveforms in a memory; (b) extracting voltage and current waveforms within a predetermined time axis range from the measured voltage and its measured waveform stored in the memory; (c) converting the voltage and current waveforms extracted in the step (b) into voltage and current waveforms when connected to a power supply that complies with a predetermined standard; (d) analyzing power supply harmonic currents from the current waveform converted in the (c) step; (e) converting the voltage and current waveforms extracted in the (b) step into voltage and current waveforms when connected to a power supply and a reference impedance network that comply with a predetermined standard; (f) calculating a flicker value from the voltage waveform converted in the step (e); (g) A step of outputting the results of the power supply harmonic analysis performed in the step (d) and the results of the flicker value calculated in the step (f) to an output interface.

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