Measurement path planning device, measurement path planning system, method, and program

Abstract

To provide a measurement path planning device capable of planning a measurement path by easily setting the orientation of a probe.SOLUTION: A measurement path planning device includes: a measurement target definition section 231 that defines a shape of a measurement target space including a workpiece to be measured and an obstacle; a measurement orientation determination section 232 that determines orientation of a probe with respect to a first measurement point and a second measurement point that do not interfere with the obstacle when the first measurement point and the second measurement point set in the measurement target space are sequentially measured; and a path planning section 234 that plans a measurement path of the probe between the first measurement point and the second measurement point.SELECTED DRAWING: Figure 2

Description

[Technical Field]

[0001] The present disclosure relates to a measurement path planning device, a measurement path planning system, a method, and a program. [Background technology]

[0002] As design using 3D computer-aided design (CAD) has become widespread, CAT (Computer-Aided Testing), which plans inspections of product dimensions, shape, characteristics, performance, etc., is increasingly using 3D product data designed using 3D CAD to create measurement path plans. In many cases, product dimensions, shape, characteristics, performance, etc. are inspected by contacting a measurement probe with predetermined measurement points on the product. Therefore, a measurer creates a measurement path plan by setting the probe's movement path from the current measurement point to the next measurement point on the product's 3D data. However, because the probe movement path is set based on the measurer's experience, the length of the measurement path often varies from measurer to measurer, even when planning a measurement path for the same product. Therefore, for example, Patent Document 1 discloses a technology for planning a measurement path by defining an offset area offset a predetermined distance outward from the outer surface of the product to be measured and moving the probe along the offset area. [Prior art documents] [Patent documents]

[0003] [Patent Document 1] Patent No. 3989108 Summary of the Invention [Problem to be solved by the invention]

[0004] The technology disclosed in Patent Document 1 defines an offset area that is offset a predetermined distance outward from the outer surface of the product to be measured. If the product to be measured is a single workpiece, there are no obstacles within the offset area that could interfere with the probe, so the measurement path can be planned by simply moving the probe along the offset area. However, if the product to be measured has mounting parts, wiring, equipment, etc., on the workpiece, these mounting parts, wiring, equipment, etc. will exist as obstacles within the offset area defined on the outer surface of the workpiece. In this case, simply moving the probe along the offset area may result in interference with the obstacles during the probe's movement. Therefore, the probe's orientation must be controlled to avoid interference with obstacles during the probe's movement.

[0005] There are two ways to control the probe's attitude: one is to keep the probe fixed at a certain attitude, and the other is to have the user manually specify the probe's attitude for each measurement point. However, when planning a path with the probe fixed at a certain attitude, if the fixed attitude at a certain measurement point would cause interference with an obstacle, the system may plan a measurement path that does not include that point. Furthermore, when the user manually specifies the probe's attitude for each measurement point, the user must consider the probe's attitude for each measurement point, which is time-consuming.

[0006] The present disclosure has been made to solve the above-mentioned problems, and aims to provide a measurement path planning device, a measurement path planning system, a method, and a program that can easily set the probe attitude and plan a measurement path. [Means for solving the problem]

[0007] In order to achieve the above-mentioned object, the measurement path planning device of the present disclosure includes a measurement object definition unit that defines the shape of a measurement object space including a workpiece to be measured and obstacles, a measurement attitude determination unit that determines a probe attitude that does not interfere with obstacles relative to a first measurement point and a second measurement point set in the measurement object space when measuring the first measurement point and a second measurement point set in the measurement object space in sequence, and a path planning unit that plans a measurement path of the probe between the first measurement point and the second measurement point. [Effects of the Invention]

[0008] According to the present disclosure, it is possible to determine the orientation of the probe so that it does not interfere with obstacles, and therefore it is possible to easily set the orientation of the probe and plan a measurement path. [Brief explanation of the drawings]

[0009] [Figure 1] FIG. 1 is a diagram illustrating a configuration of a measurement path planning system according to a first embodiment of the present disclosure. [Figure 2] FIG. 2 is a diagram showing the configuration of a control unit of the measurement path planning device shown in FIG. 1. [Figure 3] FIG. 2 is a diagram showing an example of the hardware configuration of the measurement path planning device shown in FIG. 1. [Figure 4] 1A and 1B are diagrams showing an outline of a probe according to a first embodiment, in which FIG. 1A shows the probe before changing its attitude, and FIG. 1B shows the probe after changing its attitude. [Figure 5] FIG. 1 is a diagram illustrating an overview of a first measurement target space according to a first embodiment; [Figure 6] A diagram showing the probe operating range for the measurement points shown in Figure 5. [Figure 7] 6A and 6B are diagrams showing angles of the probe working range relative to the measurement points shown in FIG. 5, where (A) is a diagram showing the angle of the probe working range at the first measurement point, (B) is a diagram showing the angle of the probe working range at the second measurement point, and (C) is a diagram showing the angle of the probe working range at the third measurement point. [Figure 8] A diagram showing the common operating range of the probes shown in Figure 7. [Figure 9]FIG. 1 is a diagram illustrating an overview of a second measurement target space according to the first embodiment; [Figure 10] A diagram showing the working range of the probe for the measurement points shown in Figure 9. [Figure 11] 10A and 10B are diagrams showing angles of the probe working range relative to the measurement points shown in FIG. 9, where (A) is a diagram showing the angle of the probe working range at the fourth measurement point, (B) is a diagram showing the angle of the probe working range at the fifth measurement point, and (C) is a diagram showing the angle of the probe working range at the sixth measurement point. [Figure 12] A diagram showing the common operating range of the probes shown in Figure 11. [Figure 13] FIG. 10 is a diagram showing an example of a combination of a probe attitude change pattern and an evaluation index according to the first embodiment; [Figure 14] 1 is a flowchart of a measurement path planning process according to the first embodiment; [Figure 15] 1 is a flowchart of an attitude determination process according to the first embodiment; [Figure 16] FIG. 10 is a diagram illustrating an overview of measurement points in a measurement target space according to a second embodiment. [Figure 17] FIG. 17 is a diagram for explaining the movement path of the probe relative to the measurement points shown in FIG. 16; [Figure 18] 17 is a diagram showing the state after changing the attitude of the probe relative to the measurement point shown in FIG. 16. [Figure 19] FIG. 19 shows the state of the probe after changing its attitude relative to the measurement point shown in FIG. 18. [Figure 20] FIG. 20 is a diagram showing a state in which the tip of the probe reaches the measurement point shown in FIG. 19 . [Figure 21] 10 is a flowchart of a measurement path planning process when determining a path search attitude according to a second embodiment. [Figure 22] Flowchart of path search attitude determination processing according to the fourth embodiment DETAILED DESCRIPTION OF THE INVENTION

[0010] (Embodiment 1) Hereinafter, a measurement path planning system 100 including a measurement path planning device 2 according to a first embodiment of the present disclosure will be described with reference to the drawings. Note that the same or equivalent parts are denoted by the same reference numerals.

[0011] The measurement path planning device 2 is a device that can determine an orientation that can avoid interference with obstacles according to the positional relationship between the obstacles and the measurement points in the measurement space by recognizing the measurement target space including the measurement points on the product, and can therefore plan a measurement path that does not cause the probe to interfere with obstacles. Also, the measurement path planning system 100 is a system that includes the measurement path planning device 2.

[0012] 1 includes an input / output device 1 that inputs and outputs various data used in measurement path planning, and a measurement path planning device 2 that plans a measurement path on a product. The input / output device 1 includes a three-dimensional measuring device 11 that measures the product, a three-dimensional CAD 12 that has various data on the shapes of the workpieces, obstacles, and product installation table that make up the product, and a three-dimensional scanner 13, a display device 14 that displays the various data, and an input operation device 15 for inputting various data and instructions from the person making the measurements.

[0013] The three-dimensional measuring device 11 is equipped with a measuring device including a probe for measuring a product. The three-dimensional measuring device 11 outputs various data, such as the movable range of the measuring device and probe information and position, to the measurement path planning device 2. After measuring the product, the three-dimensional measuring device 11 outputs the product measurement data to the measurement path planning device 2. The three-dimensional CAD 12 and the three-dimensional scanner 13 have data on the shapes of the workpiece, obstacles, and product installation table that make up the product. The three-dimensional CAD 12 can also design the shape of the product, including the workpiece and various parts, and generate three-dimensional data. The three-dimensional scanner 13 can also read the actual shapes of the workpiece, various parts, etc., and generate scan data. The three-dimensional measuring device 11 is an example of a measuring device within the scope of the claims. The three-dimensional measuring device 11, the three-dimensional CAD 12, and the three-dimensional scanner 13 are also examples of a shape data creation device within the scope of the claims.

[0014] The display device 14 displays a display screen including various data, instructions, etc. input by the measurer. The display device 14 includes a display device and a display controller that outputs a video signal to cause the display device to display display data including characters and images. The display device 14 can be configured using, for example, an LCD (Liquid Crystal Display) or an organic EL (Electroluminescence) monitor. The display controller can be configured using, for example, a video signal output device such as a video card, a GPU (Graphics Processing Unit), or a graphics board. The input operation device 15 accepts input of data on the shapes of workpieces, obstacles, and product installation tables that constitute the product, as well as instructions, from the measurer using the measurement path planning system 100. The input operation device 15 can be configured using, for example, a keyboard, a mouse, a touch panel, etc.

[0015] The measurement path planning device 2 includes an input / output processing unit 21 that transmits and receives various data transmitted from the input / output device 1, a memory unit 22 that stores various data and programs, and a control unit 23 that executes various functions of the measurement path planning device 2. The input / output processing unit 21 acquires various data, such as the movable range of the measuring device and probe information and position, as well as measurement data of the product to be measured, from the three-dimensional measuring device 11. The input / output processing unit 21 also acquires data on the shapes of the workpiece, obstacles, and product installation table that constitute the product from the three-dimensional CAD 12 and the three-dimensional scanner 13. The input / output processing unit 21 transmits the various data acquired from the three-dimensional measuring device 11, the three-dimensional CAD 12, and the three-dimensional scanner 13 to the memory unit 22 for storage. The input / output processing unit 21 also acquires various stored data of the three-dimensional measuring device 11, the three-dimensional CAD 12, etc. from the memory unit 22 and transmits it to the control unit 23.

[0016] Storage unit 22 stores various data received from input / output processing unit 21 and acquired by input / output processing unit 21 from three-dimensional measuring device 11, three-dimensional CAD 12, etc. Storage unit 22 also stores programs for executing various functions of control unit 23.

[0017] 2, the control unit 23 includes a measurement object definition unit 231 that defines the shape of the measurement object space including the workpiece to be measured and obstacles, a measurement attitude determination unit 232 that determines the attitude of the probe 3, an attitude change unit 233 that changes the attitude of the probe 3, and a path planning unit 234 that plans the measurement path of the probe 3. The measurement object definition unit 231 defines the shapes of the workpiece constituting the product and obstacles placed on the workpiece in three dimensions using various data from the three-dimensional measuring device 11, the three-dimensional CAD 12, etc. received from the memory unit 22 via the input / output processing unit 21. The measurement object definition unit 231 also defines the attitude of the probe 3 according to the positions of the measurement points on the product and the attitude information determined by the measurement attitude determination unit 232.

[0018] The measurement attitude determination unit 232 determines the attitude of the probe 3 with respect to the position of the measurement point on the product defined by the measurement target definition unit 231. The measurement attitude determination unit 232 transmits attitude information of the determined attitude of the probe 3 to the measurement target definition unit 231. The attitude change unit 233 changes the attitude of the probe 3 according to the attitude defined by the measurement target definition unit 231.

[0019] The path planning unit 234 plans a measurement path from the movement path of the probe 3 on the product. The path planning unit 234 also sequentially transmits the status of the measurement path being planned and the planned results of the measurement path to the input / output device 1 via the input / output processing unit 21 shown in Fig. 1 and displays them on the display device 14 of the input / output device 1. This allows the measurer to sequentially recognize the planned status and planned results of the measurement path.

[0020] Each of the functions of the control unit 23 described above is a function realized by software. In the first embodiment, the software that executes the processing for realizing each function of the control unit 23 is a measurement path planning processing program. An example of the hardware configuration of the measurement path planning device 2 for executing the measurement path planning processing program is shown in FIG.

[0021] The measurement path planning device 2 includes a connection device 201 for connecting to the input / output device 1, a storage device 202 for storing various programs and various data, a memory 203 for expanding the various programs, and a processor 204 for executing the various programs. The connection device 201, the storage device 202, the memory 203, and the processor 204 are interconnected via a data bus 205.

[0022] The connection device 201 is a connection port that can be connected to the input / output device 1. The connection device 201 can be configured using various ports that can connect devices, such as a USB (Universal Serial Bus) port or an IEEE1394 port. The connection device 201 also functions as the input / output processing unit 21 of the measurement path planning device 2 shown in FIG. 1. The storage device 202 stores various programs to be executed by the processor 204 and display data such as images and characters to be displayed on the display device 14 of the input / output device 1 shown in FIG. 1. The storage device 202 can be configured using a storage device such as an HDD (Hard Disk Drive) or SSD (Solid State Drive). The storage device 202 also functions as the storage unit 22 of the measurement path planning device 2 shown in FIG. 1.

[0023] The memory 203 is a device for expanding the various programs stored in the storage device 202. The memory 203 can be configured using, for example, a storage element and a storage medium such as a random access memory (RAM) or a volatile or non-volatile semiconductor memory such as a flash memory. The processor 204 reads the various programs stored in the storage device 202, expands them in the memory 203, and executes them. The processor 204 can be configured using, for example, a processing device such as a central processing unit (CPU) or a micro-processing unit (MPU).

[0024] Next, the procedure for planning a measurement path in the first embodiment will be described below with reference to FIGS. 4 to 13. Note that, for convenience, the following is shown in two-dimensional space, but the principle is the same even in three-dimensional space. First, FIG. 4 shows an overview of the probe 3 that measures measurement points on a product, and FIG. 4(A) shows the probe 3 before changing its attitude. The probe 3 includes a probe main body 31, which is the main body of the probe 3, a probe part 32 for measuring the measurement points, and a probe tip 33 that comes into contact with the measurement point S. The probe part 32 of the probe 3 extends horizontally from one side of the probe main body 31. It is assumed that the attitude of the probe 3 shown in FIG. 4(A) before change by the attitude change part 233 is defined.

[0025] The attitude of the probe 3 is changed by the attitude change unit 233. The attitude of the probe 3 changed by the attitude change unit 233 is an attitude defined by the measurement target definition unit 231 in accordance with the attitude information determined by the measurement attitude determination unit 232. For example, the attitude change unit 233 changes the probe part 32 of the probe 3 from the state shown in Fig. 4(A) to the state shown in Fig. 4(B) in which the probe part 32 extends horizontally from one corner of the probe main body part 31.

[0026] Next, FIG. 5 shows an overview of the first measurement space 4, which includes a measurement point S on the product. The first measurement space 4 includes a workpiece 40 that constitutes the product, a first obstacle 41, such as an attachment part, wiring, or device, arranged on the workpiece 40, and a first measurement point S1, a second measurement point S2, and a third measurement point S3 to be measured by the probe 3. Note that the measurement point S includes the first measurement point S1, the second measurement point S2, and the third measurement point S3. For ease of understanding, in FIG. 5, the workpiece 40 is shown as a white square, the first obstacle 41 is shown as a shaded square, and the first measurement point S1, the second measurement point S2, and the third measurement point S3 are shown as black squares. The probe 3 moves along a path that does not interfere with the first obstacle 41. For this reason, the probe 3 moves over the white squares representing the workpiece 40. In the first embodiment, the measurer measures the first measurement point S1, the second measurement point S2, and the third measurement point S3 in this order.

[0027] The routes from the first measurement point S1 to the second measurement point S2 and from the second measurement point S2 to the third measurement point S3 can be determined by the route planning unit 234 included in the control unit 23 shown in FIG. 2 using a route planning algorithm such as the A* (A Star) search algorithm or the RRT (Rapidly-exploring Random Tree). The A* search algorithm can determine the shortest route, but has the disadvantage of being slower in calculation speed than the RRT. Furthermore, the RRT has a relatively fast calculation speed even in three-dimensional space, but has the disadvantage that the planned route is not necessarily the shortest route.

[0028] The orientation of the probe 3 along the path from the first measurement point S1 to the third measurement point S3 can be determined by the following procedure. FIG. 6 is a diagram showing the operating range of the probe 3 relative to the first measurement point S1, the second measurement point S2, and the third measurement point S3. First, when the probe tip 33 of the probe 3 is brought into contact with the first measurement point S1 at an angle arbitrarily changed within a range of 0 to 180 degrees, a range on a circumference is formed with the first measurement point S1 as the starting point. In this case, if the range in which the probe 3 does not interfere with the first obstacle 41 is determined, the first operating range r1 indicated by the dotted line in FIG. 6 can be determined. Therefore, it is conceivable to operate the probe 3 within the first operating range r1.

[0029] Similarly, when the probe tip 33 of the probe 3 is brought into contact with the second measurement point S2 within a range of 0 to 180 degrees, it is possible to determine a range on a circumference starting from the second measurement point S2 within which the probe 3 does not interfere with the first obstacle 41, for example, a second operating range r2 indicated by a dotted line in Fig. 6. Therefore, it is conceivable to operate the probe 3 within the second operating range r2.

[0030] Furthermore, when the probe tip 33 of the probe 3 is brought into contact with the third measurement point S3 within a range of 0 to 180 degrees, it is possible to determine a range on a circumference starting from the third measurement point S3 where the probe 3 does not interfere with the first obstacle 41 and where it is not difficult to measure with the probe 3, such as the third operating range r3 indicated by the dotted line in Fig. 6. Therefore, it is conceivable to operate the probe 3 within the third operating range r3.

[0031] As shown in Fig. 6, the first to third operation ranges r1 to r3 are sector-shaped ranges starting from the first to third measurement points S1 to S3, respectively. Fig. 7 is a diagram showing the angles of the first to third operation ranges r1 to r3. Fig. 7(A) is a diagram showing the angle of the first operation range r1, Fig. 7(B) is a diagram showing the angle of the second operation range r2, and Fig. 7(C) is a diagram showing the angle of the third operation range r3.

[0032] For example, in Fig. 7(A), the angle of the first operating range r1 is 0 to 170 degrees from the starting point of the solid arrow. In Fig. 7(B), the angle of the second operating range r2 is 0 to 45 degrees from the starting point of the solid arrow. In Fig. 7(C), the angle of the third operating range r3 is 30 to 90 degrees from the starting point of the solid arrow.

[0033] When the first operation range r1 to the third operation range r3 are overlapped, they all overlap within a range of 30 to 45 degrees as shown in Fig. 8. The range in which the first operation range r1 to the third operation range r3 all overlap is the range in which the probe 3 can measure the first measurement point S1, the second measurement point S2, and the third measurement point S3 without interfering with the first obstacle 41, when the probe 3 is oriented at an angle within this range. Hereinafter, the range in which the first operation range r1 to the third operation range r3 all overlap is referred to as the first common operation range R1.

[0034] However, depending on the position of the measurement point S on the workpiece 40, it may be possible that the entire operating range of the probe 3 does not overlap. How to determine the angle set as the attitude of the probe 3 in such a case will be described below with reference to Figs. 9 to 12.

[0035] FIG. 9 shows an overview of a second measurement space 5 including a measurement point S on a product. The second measurement space 5 includes a workpiece 50 constituting the product, a second obstacle 51 such as an attachment, wiring, or device arranged on the workpiece 50, and a fourth measurement point S4, a fifth measurement point S5, and a sixth measurement point S6 to be measured by the probe 3. The measurement points S include the fourth measurement point S4, the fifth measurement point S5, and the sixth measurement point S6. For ease of understanding, in FIG. 9, the workpiece 50 is represented by a white square, the second obstacle 51 is represented by a hatched square, and the fourth measurement point S4, the fifth measurement point S5, and the sixth measurement point S6 are represented by black squares. The probe 3 moves along a path that does not interfere with the second obstacle 51. Therefore, the probe 3 moves over the white squares representing the workpiece 50. In the first embodiment, the measurer measures the fourth measurement point S4, the fifth measurement point S5, and the sixth measurement point S6 in that order.

[0036] The routes from the fourth measurement point S4 to the fifth measurement point S5 and from the fifth measurement point S5 to the sixth measurement point S6 can be determined by the route planning unit 234 included in the control unit 23 shown in Figure 2 using a route planning algorithm such as the A* (A Star) search algorithm or RRT (Rapidly-exploring Random Tree).

[0037] The orientation of the probe 3 along the path from the fourth measurement point S4 to the sixth measurement point S6 can be determined by the following procedure. FIG. 10 is a diagram showing the operating range of the probe 3 relative to the fourth measurement point S4, the fifth measurement point S5, and the sixth measurement point S6. First, when the probe tip 33 of the probe 3 is brought into contact with the fourth measurement point S4 at an angle arbitrarily changed within a range of 0 to 180 degrees, a range on a circumference is formed starting from the fourth measurement point S4. In this case, if the range in which the probe 3 does not interfere with the second obstacle 51 is determined, a fourth operating range r4 indicated by the dotted line in FIG. 10 can be determined. Therefore, it is conceivable to operate the probe 3 within the fourth operating range r4.

[0038] Similarly, when the probe tip 33 of the probe 3 is brought into contact with the fifth measurement point S5 within a range of 0 to 180 degrees, it is possible to determine a range on a circumference starting from the fifth measurement point S5 within which the probe 3 does not interfere with the second obstacle 51, for example, a fifth operating range r5 indicated by a dotted line in Fig. 10. Therefore, it is conceivable to operate the probe 3 within the fifth operating range r5.

[0039] Furthermore, when the probe tip 33 of the probe 3 is brought into contact with the sixth measurement point S6 within a range of 0 to 180 degrees, a range can be determined on a circumference starting from the sixth measurement point S6 within which the probe 3 does not interfere with the second obstacle 51 and within which measurement by the probe 3 is not difficult, such as a sixth operating range r6 indicated by a dotted line in Fig. 10. Therefore, it is conceivable to operate the probe 3 within the sixth operating range r6.

[0040] As shown in Fig. 10, the fourth operation range r4 to the sixth operation range r6 are sector-shaped ranges starting from the fourth measurement point S4 to the sixth measurement point S6, respectively. Fig. 11 is a diagram showing the angles of the fourth operation range r4 to the sixth operation range r6. Fig. 11(A) is a diagram showing the angle of the fourth operation range r4, Fig. 11(B) is a diagram showing the angle of the fifth operation range r5, and Fig. 11(C) is a diagram showing the angle of the sixth operation range r6.

[0041] For example, in Fig. 11(A), the angle of the fourth operating range r4 is 0 to 170 degrees from the starting point of the solid arrow. In Fig. 11(B), the angle of the fifth operating range r5 is 0 to 45 degrees from the starting point of the solid arrow. In Fig. 11(C), the angle of the sixth operating range r6 is 135 to 170 degrees from the starting point of the solid arrow.

[0042] When the fourth operating range r4 to the sixth operating range r6 are overlapped, the fourth operating range r4 and the fifth operating range r5 overlap in the range of 0 to 45 degrees, and the fourth operating range r4 and the sixth operating range r6 overlap in the range of 135 to 170 degrees, as shown in Figure 12. Hereinafter, the range where the fourth operating range r4 and the fifth operating range r5 overlap is referred to as the second common operating range R2. Furthermore, the range where the fourth operating range r4 and the sixth operating range r6 overlap is referred to as the third common operating range R3.

[0043] In this case, since there is no range that satisfies all of the fourth operation range r4 to the sixth operation range r6, the attitude angle of the probe 3 is divided for each measurement point S. For example, in case 1, the attitude angle of the probe 3 at the fourth measurement point S4 and the fifth measurement point S5 is set to an angle within the second common operation range R2, and the attitude angle of the probe 3 at the sixth measurement point S6 is set to an angle within the sixth operation range r6. In case 2, the attitude angle of the probe 3 at the fourth measurement point S4 and the fifth measurement point S5 is set to an angle within the third common operation range R3, and the attitude angle of the probe 3 at the fifth measurement point S5 is set to an angle within the fifth operation range r5.

[0044] Alternatively, in Case 3, the second common operating range R2 and the third common operating range R3 may not be used, and the probe 3 attitude angle may be set within the fourth operating range r4 at the fourth measurement point S4, the fifth operating range r5 at the fifth measurement point S5, and the sixth operating range r6 at the sixth measurement point S6. However, depending on the selected probe 3 attitude angle, measurements may be performed in three different attitude patterns, involving two attitude changes: one when moving from the fourth measurement point S4 to the fifth measurement point S5 and one when moving from the fifth measurement point S5 to the sixth measurement point S6. For example, the probe 3 attitude angle may be set to 90 degrees in the fourth operating range r4 at the fourth measurement point S4, 45 degrees in the fifth operating range r5 at the fifth measurement point S5, and 170 degrees in the sixth operating range r6 at the sixth measurement point S6. In this case, the attitude angle must be set for each change in the probe 3 attitude, requiring additional work by the measurer.

[0045] 13 shows an example of a combination of evaluation indices and patterns of changing the attitude of the probe 3. The pattern of changing the attitude of the probe 3 includes an operating range, which is a combination of the angles of the attitude of the probe 3 for each measurement point S, and measurement orders 1 to 3, which are the measurement orders of the measurement points S. The operating range includes a second common operating range R2 and a third common operating range R3. The evaluation indices include the number of times the attitude of the probe 3 is changed, the distance from the initial position to the position of the measurement point in measurement order 1, and the distance from the current measurement point to the next measurement point.

[0046] The man-hours required for measurement using the probe 3 vary depending on the operating range, which is the combination of the angle of the attitude of the probe 3 for each measurement point S, and the combination of measurement orders 1 to 3, which are the measurement order of the measurement points S. Therefore, as a method for evaluating the man-hours required for measurement using the probe 3, the evaluation results are given such that a lower number of attitude changes and the movement distance of the probe 3, which are evaluation indices, are given a higher evaluation, and the number of the best pattern is adopted.

[0047] The movement distance of the probe 3 is the sum of the distance from the initial position to the position of measurement point S in measurement order 1 and the distance from the current measurement point S to the next measurement point S. The distance from the initial position to the position of measurement point S in measurement order 1 is the distance from the initial position of the probe tip 33 of the probe 3 to the position of measurement point S in measurement order 1. Note that, depending on the initial attitude of the probe 3, the attitude may be changed when measuring the position of measurement point S in measurement order 1, but here it is assumed that there is no need to change the attitude at the initial position of the probe 3. Note that a weighting coefficient may be set for each evaluation index to produce a composite evaluation result.

[0048] For example, in the "pattern" shown in FIG. 13, if the number is "1," the operating range is "Case 1," measurement order 1 is the "fourth measurement point" S4, measurement order 2 is the "fifth measurement point" S5, and measurement order 3 is the "sixth measurement point" S6, the probe 3 will move from the fourth measurement point S4 around the second obstacle 51 toward the fifth measurement point S5, then turn around from the fifth measurement point S5 along the second obstacle 51, and move toward the sixth measurement point S6, as shown in FIG. 9. Here, the initial posture of the probe 3 is a posture that allows it to measure the fourth measurement point S4 and the fifth measurement point S5. In this case, the probe 3 performs measurements at the fourth measurement point S4 and the fifth measurement point S5 without changing its posture angle.

[0049] Furthermore, while moving from the fifth measurement point S5 to the sixth measurement point S6, the probe 3 changes its posture to an angle that allows it to measure the sixth measurement point S6. Therefore, for the "pattern" number "1" shown in FIG. 13, the number of posture changes in the "evaluation index" is "1." Furthermore, the distance "2" to measurement sequence 1 of the "evaluation index" and the distance "10" to the next measurement point are the amount of movement of the probe 3 on the workpiece 50, and are calculated based on the shape of the workpiece 50 defined by the measurement target definition unit 231 included in the control unit 23 of the measurement path planning device 2 shown in FIG. 2. The evaluation result of the "evaluation index" is "1," indicating that the numerical values ​​for the number of posture changes and the movement distance of the probe 3 are lower than those of the other "pattern" numbers and are highly evaluated.

[0050] Next, the flow of operations for planning a measurement route in the measurement route planning device 2 will be described below with reference to the flowchart of the measurement route planning process shown in Fig. 14. The measurement route planning process is stored as a measurement route planning process program in the storage device 202 shown in Fig. 3. When it is time to plan a measurement route, the person making the measurement inputs a start instruction from the input operation device 15 of the input / output device 1 shown in Fig. 1. For example, the person making the measurement selects an icon, button, etc. displayed on the screen of the display device 14 of the input / output device 1 shown in Fig. 1 using the input operation device 15. As a result, the processor 204 of the measurement route planning device 2 shown in Fig. 3 reads the measurement route planning process program stored in the storage device 202 into the memory 203 and executes it.

[0051] The measurement object definition unit 231 of the control unit 23 shown in FIG. 2 defines the shape of the first measurement object space 4 or the second measurement object space 5 to be measured (step S101). For example, the measurement object definition unit 231 of the control unit 23 defines the shapes of the workpiece 40 constituting the product and the first obstacle 41 such as attachment parts, wiring, and equipment arranged on the workpiece 40, which are included in the first measurement object space 4 shown in FIG. 5. Alternatively, the measurement object definition unit 231 defines the shapes of the workpiece 50 constituting the product and the second obstacle 51 such as attachment parts, wiring, and equipment arranged on the workpiece 50, which are included in the second measurement object space 5 shown in FIG. 9. The shapes of the workpiece 40 and the first obstacle 41 or the workpiece 50 and the second obstacle 51 are defined based on, for example, various data acquired from the three-dimensional measuring device 11, the three-dimensional CAD 12, and the three-dimensional scanner 13, which are stored in the memory unit 22 shown in FIG. 1.

[0052] The measurement target definition unit 231 of the control unit 23 defines a measurement point S to be measured (step S102). For example, the measurement target definition unit 231 of the control unit 23 defines a first measurement point S1, a second measurement point S2, and a third measurement point S3 shown in Fig. 5 as measurement positions in the first measurement target space 4 defined in step S101. Alternatively, the measurement target definition unit 231 defines a fourth measurement point S4, a fifth measurement point S5, and a sixth measurement point S6 shown in Fig. 9 as measurement positions in the second measurement target space 5 defined in step S101.

[0053] The path planning unit 234 of the control unit 23 shown in Fig. 2 displays the first measurement target space 4 or the second measurement target space 5 and the measurement point S on the display device 14 of the input / output device 1 shown in Fig. 1 (step S103). For example, the path planning unit 234 of the control unit 23 displays the first measurement target space 4 including the first measurement point S1, the second measurement point S2, and the third measurement point S3 shown in Fig. 5 on the display device 14 of the input / output device 1. Alternatively, the path planning unit 234 of the control unit 23 displays the second measurement target space 5 including the fourth measurement point S4, the fifth measurement point S5, and the sixth measurement point S6 shown in Fig. 9 on the display device 14 of the input / output device 1.

[0054] The measurement attitude determination unit 232 of the control unit 23 shown in FIG. 2 executes attitude determination processing (step S104). The operational flow of the attitude determination processing will be described below with reference to the flowchart shown in FIG. 15. The measurement attitude determination unit 232 acquires a measurement point S to be measured (step S201). For example, the measurement attitude determination unit 232 acquires a first measurement point S1, a second measurement point S2, and a third measurement point S3 in the first measurement target space 4 defined in step S101 of the flowchart of the measurement path planning processing in FIG. 14. Alternatively, the measurement attitude determination unit 232 acquires a fourth measurement point S4, a fifth measurement point S5, and a sixth measurement point S6 in the second measurement target space 5 defined in step S101.

[0055] The measurement attitude determination unit 232 acquires the operation range of the probe 3 at the measurement point S (step S202). For example, the measurement attitude determination unit 232 acquires a first operation range r1, which is the operation range of the probe 3 at the first measurement point S1 shown in Fig. 6. Alternatively, the measurement attitude determination unit 232 acquires a fourth operation range r4, which is the operation range of the probe 3 at the fourth measurement point S4 shown in Fig. 10.

[0056] The measurement posture determination unit 232 determines whether or not there is an operating range of the probe 3 at the measurement point S (step S203). For example, if there is no operating range of the probe 3 at the first measurement point S1 shown in FIG. 6 or the fourth measurement point S4 shown in FIG. 10 (step S203; NO), the measurement posture determination unit 232 determines that the first measurement point S1 or the fourth measurement point S4 is an unmeasurable measurement point S and excludes it from the measurement points S to be measured (step S204). Furthermore, if there is an operating range of the probe 3 at the first measurement point S1 or the fourth measurement point S4 shown in FIG. 6 (step S203; YES), the measurement posture determination unit 232 determines whether or not there is another measurement point S to be measured (step S205).

[0057] If there are other measurement points S to be measured (step S205; YES), the measurement posture determination unit 232 returns to step S201 and executes the steps from step S201 onwards. For example, if there are a second measurement point S2 and a third measurement point S3 in addition to the first measurement point S1 as shown in Fig. 6, or if there are a fifth measurement point S5 and a sixth measurement point S6 in addition to the fourth measurement point S4 as shown in Fig. 10, the measurement posture determination unit 232 returns to step S201 and executes the steps from step S201 onwards.

[0058] If there are no other measurement points S to be measured (step S205; NO), the measurement posture determination unit 232 determines whether or not there is a common operating range (step S206). For example, it is assumed that there is no common operating range for the first operating range r1 to the third operating range r3 shown in FIG. 6 or the fourth operating range r4 to the sixth operating range r6 shown in FIG. 10 (step S206; NO). In this case, the measurement posture determination unit 232 determines the operating range for each measurement point S (step S207). For example, the measurement posture determination unit 232 determines the first operating range r1 to the sixth operating range r6 for the first measurement point S1 to the sixth measurement point S6, respectively. At this time, the first operating range r1 to the sixth operating range r6 may be determined for the first measurement point S1 to the sixth measurement point S6, respectively, based on the pattern of change in the posture of the probe 3 and the combination of the evaluation indexes shown in FIG. 13.

[0059] Furthermore, for example, if there is a first common operating range R1 as shown in FIG. 8 for the first operating range r1 to the third operating range r3 shown in FIG. 6, or if there is a second common operating range R2 and a third common operating range R3 for the fourth operating range r4 to the sixth operating range r6 shown in FIG. 12 (step S206; YES), the measurement posture determination unit 232 determines whether the common operating range satisfies all operating ranges (step S208).

[0060] For example, as shown in FIG. 8, the first common operating range R1 is a common range that satisfies all of the first operating range r1 to the third operating range r3. Therefore, since the first common operating range R1 satisfies all of the first operating range r1 to the third operating range r3 (step S208; YES), the measurement attitude determination unit 232 determines a single first common operating range R1 (step S209). Also, for example, as shown in FIG. 12, the second common operating range R2 and the third common operating range R3 are common ranges of the fourth operating range r4 and the fifth operating range r5, or the fourth operating range r4 and the sixth operating range r6. Therefore, since the second common operating range R2 and the third common operating range R3 are not common operating ranges that satisfy all of the fourth operating range r4 to the sixth operating range r6 (step S208; NO), the measurement attitude determination unit 232 determines multiple second common operating ranges R2 and the third common operating range R3 (step S210). The measurement attitude determination unit 232 ends the measurement attitude determination process.

[0061] Returning to FIG. 14, the path planning unit 234 of the control unit 23 plans a path for measuring the measurement point S of the measurement target (step S105). For example, the measurement targets are the first measurement point S1, the second measurement point S2, and the third measurement point S3 of the workpiece 40 that constitutes the product and is included in the first measurement target space 4 shown in FIG. 5. In this case, the path planning unit 234 of the control unit 23 plans a path for measuring the first measurement point S1, the second measurement point S2, and the third measurement point S3 of the workpiece 40 using the probe 3 whose attitude angle has been changed by the attitude change unit 233 to fall within the operating range set in step S104. The path planning unit 234 of the control unit 23 ends the measurement path planning process.

[0062] Thereafter, the path planning unit 234 of the control unit 23 transmits data of the measurement path planned in the measurement path planning process to the three-dimensional measuring device 11 of the input / output device 1 via the input / output processing unit 21 shown in Fig. 1. The three-dimensional measuring device 11 measures the product based on the received measurement path data.

[0063] As described above, according to the first embodiment, the measurement attitude determination unit 232 included in the control unit 23 of the measurement path planning device 2 can determine the attitude of the probe 3 that does not interfere with obstacles, making it possible to plan a measurement path that does not interfere with obstacles for the probe 3. This makes it possible to plan a measurement path by simply controlling the attitude of the probe 3.

[0064] (Embodiment 2) In the first embodiment, the angle of the attitude of the probe 3 at each measurement point S of the measurement target is determined by calculating the operating range and common operating range of the probe 3 at each measurement point S. In the second embodiment, a path from an arbitrary measurement point S to the next measurement point S' is searched for, and the attitude of the probe 3 when it finally reaches the next measurement point S' is determined as the attitude of the probe 3.

[0065] The procedure for determining the attitude angle of the probe 3 in the second embodiment will be described below with reference to FIGS. 16 to 20. FIG. 16 shows an overview of a third measurement space 6 including a measurement point S on a product. The third measurement space 6 includes a workpiece 60 constituting the product, a third obstacle 61, a fourth obstacle 62, and a fifth obstacle 63, such as mounting parts, wiring, and equipment, arranged on the workpiece 60, and a seventh measurement point S7 and an eighth measurement point S8 measured by the probe 3. Note that the measurement point S includes the seventh measurement point S7 and the eighth measurement point S8. In FIG. 16, for ease of understanding, the workpiece 60 is shown as a white square, the third obstacle 61, the fourth obstacle 62, and the fifth obstacle 63 are shown as hatched squares, and the seventh measurement point S7 and the eighth measurement point S8 are shown as black squares. The probe 3 moves along a path that does not interfere with the third obstacle 61, the fourth obstacle 62, and the fifth obstacle 63. For this reason, the probe 3 moves over the white squares that represent the workpiece 60.

[0066] In the second embodiment, measurements are made in the order of the seventh measurement point S7 and the eighth measurement point S8. Since the eighth measurement point S8 is located on the fourth obstacle 62, when the probe 3 moves from the seventh measurement point S7 to the eighth measurement point S8, the probe 3 moves from the seventh measurement point S7 around the fourth obstacle 62 and then moves toward the eighth measurement point S8, as shown by the dotted line in Fig. 16. The route from the seventh measurement point S7 to the eighth measurement point S8 can be determined by the route planning unit 234 included in the control unit 23 of the measurement route planning device 2 shown in Fig. 2 using a route planning algorithm such as the A* (A Star) search algorithm or RRT.

[0067] FIG. 17 is a diagram illustrating the movement path of the probe 3. When the probe 3 moves from the seventh measurement point S7 to the eighth measurement point S8 after measuring the seventh measurement point S7, it moves from the seventh measurement point S7 to the eighth measurement point S8 via the shortest route. Specifically, after measuring the seventh measurement point S7, the probe 3 moves horizontally with the fourth obstacle 62 toward the eighth measurement point S8, as shown in FIG. 17, and then descends along the fourth obstacle 62 until the probe 3 comes into contact with the fifth obstacle 63. Here, the movement path is shown by a hatched square. The position of the probe tip 33 when the probe 3 comes into contact with the fifth obstacle 63 is defined as the first passing point P1.

[0068] The seventh operating range r7 shown in FIG. 17 is a range in which the probe portion 32 of the probe 3 can rotate. As shown in FIG. 18, the probe portion 32 of the probe 3 rotates along the seventh operating range r7 in the direction of the arrow until it comes close to contacting the fifth obstacle 63. After the rotation of the probe portion 32 of the probe 3, as shown in FIG. 19, the probe 3 is moved in the direction of the arrow toward the fourth obstacle 62, and the probe tip 33 comes into contact with the fourth obstacle 62. In this state, the probe portion 32 of the probe 3 does not interfere with the fifth obstacle 63. Thereafter, the probe portion 32 of the probe 3 repeats rotation and horizontal movement along the seventh operating range r7 until the probe tip 33 of the probe 3 reaches the eighth measurement point S8 as shown in FIG. 20.

[0069] The measurement attitude determination unit 232 included in the control unit 23 of the measurement path planning device 2 shown in FIG. 20, the angle of the attitude of the probe 3 when the probe tip 33 of the probe 3 reaches the eighth measurement point S8 is acquired. The measurement attitude determination unit 232 of the control unit 23 sets the acquired angle as the angle of the attitude of the probe 3 and plans a path.

[0070] Next, the flow of operations for planning a measurement path during route search in the measurement path planning device 2 will be described below with reference to the flowchart of the measurement path planning process when determining the path search attitude shown in Fig. 21. The measurement path planning process when determining the path search attitude is stored in the storage device 202 shown in Fig. 3 as a measurement path planning processing program when determining the path search attitude. The person measuring inputs a start instruction from the input operation device 15 of the input / output device 1 shown in Fig. 1 when deciding on a measurement point. For example, the person measuring selects an icon, button, etc. displayed on the screen of the display device 14 of the input / output device 1 shown in Fig. 1 using the input operation device 15 of the input / output device 1. As a result, the processor 204 of the measurement path planning device 2 shown in Fig. 3 reads the measurement path planning processing program when determining the path search attitude stored in the storage device 202 into the memory 203 and executes it.

[0071] The measurement object definition unit 231 of the control unit 23 shown in Fig. 2 defines the shape of the third measurement space 6 to be measured, which is shown in Fig. 16 (step S301). For example, the measurement object definition unit 231 of the control unit 23 defines the shapes of a workpiece 60 constituting a product, and a third obstacle 61, a fourth obstacle 62, and a fifth obstacle 63, such as mounting parts, wiring, and equipment, arranged on the workpiece 60, which are included in the third measurement space 6 shown in Fig. 16. The shapes of the workpiece 60 and the third obstacle 61 to the fifth obstacle 63 are defined based on various data acquired from the three-dimensional measuring device 11, the three-dimensional CAD 12, and the three-dimensional scanner 13, which are stored in the memory unit 22 shown in Fig. 1, for example.

[0072] The measurement target definition unit 231 of the control unit 23 defines a measurement point S to be measured (step S302). For example, after measuring the seventh measurement point S7 shown in FIG. 16, the measurement target definition unit 231 defines an eighth measurement point S8. The path planning unit 234 of the control unit 23 shown in FIG. 2 displays the third measurement target space 6 and the measurement point S on the display device 14 of the input / output device 1 shown in FIG. 1 (step S303). For example, after measuring the seventh measurement point S7 shown in FIG. 16, the path planning unit 234 of the control unit 23 displays the third measurement target space 6 including the eighth measurement point S8 on the display device 14 of the input / output device 1.

[0073] The measurement attitude determination unit 232 of the control unit 23 shown in Fig. 2 executes a route search attitude determination process (step S304). The operational flow of the route search attitude determination process will be described below with reference to the flowchart shown in Fig. 22. The measurement attitude determination unit 232 acquires the current measurement point S to be measured (step S401). For example, the measurement attitude determination unit 232 acquires the seventh measurement point S7 in the third measurement target space 6 defined in step S301 of the flowchart of the measurement path planning process when determining the route search attitude in Fig. 21.

[0074] The measurement attitude determination unit 232 acquires the next measurement point S to be measured (step S402). For example, the measurement attitude determination unit 232 acquires the eighth measurement point S8 in the third measurement target space 6 defined in step S301 of the flowchart of the measurement path planning process when determining the path search attitude in FIG. 21. The measurement attitude determination unit 232 executes a path search from the current measurement point S to the next measurement point S (step S403). In detail, the measurement attitude determination unit 232 executes a path search from the seventh measurement point S7 to the eighth measurement point S8, as shown in FIG. 7.

[0075] The measurement attitude determination unit 232 determines whether the probe 3 interferes with an obstacle (step S404). For example, after measuring the seventh measurement point S7, the probe 3 moves horizontally toward the eighth measurement point S8 along the fourth obstacle 62, as shown in FIG. 17, and then descends along the fourth obstacle 62 until the probe 3 comes into contact with the fifth obstacle 63. In this case, the probe tip 33 of the probe 3 is in contact with, or interfering with, the fifth obstacle 63 (step S404; YES), so the measurement attitude determination unit 232 changes the attitude of the probe 3 (step S405). For example, as shown in FIG. 18, the measurement attitude determination unit 232 rotates the probe part 32 of the probe 3 in the direction of the arrow along the seventh operating range r7 until it comes into contact with the fifth obstacle 63. This changes the attitude of the probe 3. The measurement attitude determination unit 232 returns to step S403 and executes step S403 and subsequent steps.

[0076] Furthermore, if the probe 3 is not interfering with an obstacle (step S404; NO), the measurement attitude determination unit 232 determines whether or not there is a next measurement point S' to be measured (step S406). If there is a next measurement point S' to be measured (step S406; YES), the measurement attitude determination unit 232 returns to step S401 and executes step S401 and subsequent steps. If there is no next measurement point S' to be measured (step S405; NO), the measurement attitude determination unit 232 acquires the attitude of the probe 3 (step S407). For example, the angle of the attitude of the probe 3 when the probe tip 33 of the probe 3 reaches the eighth measurement point S8 shown in FIG. 20 is acquired. The measurement attitude determination unit 232 ends the path search attitude determination process.

[0077] Returning to FIG. 21, the path planning unit 234 of the control unit 23 plans a path for measuring the measurement point S of the measurement target (step S305). For example, the seventh measurement point S7 and the eighth measurement point S8 on the workpiece 60 included in the third measurement target space 6 shown in FIG. 16 are assumed to be the measurement targets. In this case, the path planning unit 234 of the control unit 23 plans a path for measuring the seventh measurement point S7 and the eighth measurement point S8 on the workpiece 60 using the probe 3 whose attitude angle has been changed by the attitude change unit 233 to the angle acquired in step S304. The path planning unit 234 of the control unit 23 ends the measurement path planning process.

[0078] Thereafter, the path planning unit 234 of the control unit 23 transmits data of the measurement path planned in the measurement path planning process to the three-dimensional measuring device 11 of the input / output device 1 via the input / output processing unit 21 shown in Fig. 1. The three-dimensional measuring device 11 measures the product based on the received measurement path data.

[0079] As described above, in the second embodiment, the path from an arbitrary measurement point S to the next measurement point S' is searched for, and the attitude when the next measurement point S' is finally reached can be set as the attitude of the probe 3. Therefore, the attitude of the probe 3 can be set in consideration of the measurement path of the measurement object.

[0080] (Variation 1) In the first and second embodiments described above, the route planning unit 234 of the control unit 23 shown in FIG. 2 is capable of determining routes between measurement points S using a route planning algorithm such as the A* (A Star) search algorithm or RRT. However, the present invention is not limited to this, and any method or algorithm that can determine routes between measurement points may be used. Furthermore, routes between measurement points S may be determined using machine learning.

[0081] (Variation 2) In the above-described first and second embodiments, the input / output device 1 shown in Fig. 1 is provided with the display device 14 that displays various data, and the input operation device 15 for inputting various data and instructions from the measurer. However, the present invention is not limited to this, and the measurement path planning device 2 may be provided with the display device 14 and the input operation device 15. Furthermore, the display device 14 and the input operation device 15 may be separate from the input / output device 1. In this case, the operation input terminal and the display data output terminal of the input / output device 1 correspond to the display device 14 and the input operation device 15 in the present application, respectively.

[0082] (Variation 3) In the first embodiment described above, in order to recognize the first operation range r1 to the third operation range r3, which are the operation ranges of the probe 3 for the first measurement point S1 to the third measurement point S3, respectively, the angle of the probe 3 is changed arbitrarily within the range of 0 to 180 degrees, starting from the first measurement point S1 to the third measurement point S3. However, if the probe 3 is operated at an arbitrary angle within the range of 0 to 180 degrees, it may take a long time to process. For this reason, the angle at which the probe 3 is operated, i.e., the posture pattern of the probe 3, may be set in advance to determine whether measurement is possible.

[0083] For example, in the first operating range r1 shown in Fig. 6, the probe 3 is set to have orientation patterns of 0 degrees, 45 degrees, 90 degrees, 135 degrees, and 180 degrees, starting from the first measurement point S1. In this case, at 180 degrees, the probe 3 interferes with the first obstacle 41. Therefore, it can be determined that the orientations of the probe 3 that allow measurement are 0 degrees, 45 degrees, 90 degrees, and 135 degrees.

[0084] To set the attitude pattern of the probe 3, for example, the user inputs the attitude pattern of the probe 3 from the input operation device 15 of the input / output device 1 shown in FIG. 1 and stores it in the memory unit 22 of the measurement path planning device 2. When determining the operating range of the probe 3 at each measurement point, the control unit 23 of the measurement path planning device 2 acquires the attitude pattern stored in the memory unit 22. The control unit 23 of the measurement path planning device 2 determines whether measurement is possible for the acquired attitude pattern and returns the determination result to the memory unit 22.

[0085] Furthermore, the accuracy of a measuring device is generally affected by the temperature and humidity at the time of measurement. For this reason, the measuring device may be configured with patterns of possible postures in advance, and calibration may be performed to evaluate and correct the current accuracy of the patterned postures when performing measurements.

[0086] (Variation 4) In the above-described second embodiment, in step S305 of the flowchart of the measurement path planning process when determining the path search attitude shown in Fig. 21, the path planning unit 234 of the control unit 23 plans a path for measuring the measurement point S of the measurement object. However, without being limited to this, it is also possible to use the path for measuring the measurement point S of the measurement object, which was searched for in step S403 of the flowchart of the path search attitude determination process shown in Fig. 22.

[0087] Furthermore, in the first and second embodiments of the present disclosure, the measurement path planning device 2 can be realized as a dedicated system. However, it can also be realized using a normal computer system without using a dedicated system. For example, a program for realizing each function of the measurement path planning device 2 described above may be stored and distributed on a computer-readable recording medium such as a CD-ROM (Compact Disc Read Only Memory) or a DVD-ROM (Digital Versatile Disc Read Only Memory), and a computer that can realize each of the above-mentioned functions may be configured by installing this program on a computer. Furthermore, if each function is realized by sharing the work between an OS (Operating System) and an application, or by cooperation between an OS and an application, only the application may be stored on the recording medium.

[0088] The technical scope of the present disclosure is not limited by the above-described embodiments and modifications, and the present disclosure can be freely applied, modified, or improved within the scope of the technical ideas described in the claims.

[0089] Various aspects of the present disclosure are summarized below as appendices.

[0090] (Appendix 1) a measurement object definition unit that defines the shape of a measurement object space including a workpiece and obstacles to be measured; a measurement attitude determination unit that, when sequentially measuring a first measurement point and a second measurement point set in the measurement target space, determines an attitude of the probe with respect to the first measurement point and the second measurement point so as not to interfere with the obstacle; a path planning unit that plans a measurement path of the probe between the first measurement point and the second measurement point; Equipped with Measurement path planning device. (Appendix 2) the measurement attitude determination unit determines a common operating range that is a range including a first operating range that is an operating range of the probe relative to the first measurement point and a second operating range that is an operating range of the probe relative to the second measurement point, and determines the attitude of the probe based on the common operating range. 2. The measurement path planning device of claim 1. (Appendix 3) the measurement attitude determination unit determines the attitude of the probe when the probe reaches the second measurement point as the attitude of the probe. 3. The measurement path planning device of claim 1 or 2. (Appendix 4) further comprising a posture changer that changes the posture of the probe to the posture determined by the measurement posture determiner; 4. A measurement path planning device according to any one of claims 1 to 3. (Appendix 5) a shape data creation device that creates data on the shapes of the workpiece and obstacles to be measured; a measurement object definition unit that defines the shape of a measurement object space including a workpiece and obstacles to be measured; a measurement attitude determination unit that, when sequentially measuring a first measurement point and a second measurement point set in the measurement target space, determines an attitude of the probe with respect to the first measurement point and the second measurement point so as not to interfere with the obstacle; a path planning unit that plans a measurement path of the probe between the first measurement point and the second measurement point; a measurement path planning device comprising: A measurement path planning system comprising: (Appendix 6) a measurement device that acquires a measurement path of the probe between the first measurement point and the second measurement point, which is planned by the path planning unit of the measurement path planning device, and performs measurements of the first measurement point and the second measurement point based on the measurement path of the probe. 6. The measurement path planning system of claim 5. (Appendix 7) A method performed by a measurement path planning device, comprising: Define the shape of the measurement target space including the workpiece and obstacles to be measured; determining a probe attitude that does not interfere with the obstacle with respect to the first measurement point and the second measurement point when sequentially measuring the first measurement point and the second measurement point set in the measurement target space; planning a measurement path of the probe between the first measurement point and the second measurement point; method. (Appendix 8) On the computer, A process for defining the shape of the measurement space including the workpiece and obstacles to be measured; a process of determining a probe orientation that does not interfere with the obstacle with respect to the first measurement point and the second measurement point when sequentially measuring the first measurement point and the second measurement point set in the measurement target space; planning a measurement path of the probe between the first measurement point and the second measurement point; A program to execute. [Explanation of symbols]

[0091] 1 Input / output device, 2 Measurement path planning device, 3 Probe, 4 First measurement object space, 5 Second measurement object space, 6 Third measurement object space, 11 Three-dimensional measuring device, 13 Three-dimensional scanner, 14 Display device, 15 Input operation device, 21 Input / output processing unit, 22 Memory unit, 23 Control unit, 31 Probe main body, 32 Probe unit, 33 Probe tip, 40, 50, 60 Workpiece, 41 First obstacle, 51 Second obstacle, 61 Third obstacle, 62 Fourth obstacle, 63 Fifth obstacle, 100 Measurement path planning system, 201 Connection device, 202 Memory device, 203 Memory, 204 Processor, 205 Data bus, 231 Measurement object definition unit, 232 Measurement attitude determination unit, 233 Attitude change unit, 234 Path planning unit

Claims

1. a measurement object definition unit that defines the shape of a measurement object space including a workpiece and obstacles to be measured; a measurement attitude determination unit that, when sequentially measuring a first measurement point and a second measurement point set in the measurement target space, determines an attitude of the probe with respect to the first measurement point and the second measurement point so as not to interfere with the obstacle; a path planning unit that plans a measurement path of the probe between the first measurement point and the second measurement point; Equipped with Measurement path planning device.

2. the measurement attitude determination unit determines a common operating range that is a range including a first operating range that is an operating range of the probe relative to the first measurement point and a second operating range that is an operating range of the probe relative to the second measurement point, and determines the attitude of the probe based on the common operating range. The measurement path planning device according to claim 1 .

3. the measurement attitude determination unit determines the attitude of the probe when the probe reaches the second measurement point as the attitude of the probe; The measurement path planning device according to claim 1 .

4. further comprising a posture changer that changes the posture of the probe to the posture determined by the measurement posture determiner; 4. A measurement path planning device according to claim 1.

5. a shape data creation device that creates data on the shapes of the workpiece and obstacles to be measured; a measurement object definition unit that defines the shape of a measurement object space including a workpiece and obstacles to be measured; a measurement attitude determination unit that, when sequentially measuring a first measurement point and a second measurement point set in the measurement target space, determines an attitude of the probe with respect to the first measurement point and the second measurement point so as not to interfere with the obstacle; a path planning unit that plans a measurement path of the probe between the first measurement point and the second measurement point; a measurement path planning device comprising: A measurement path planning system comprising:

6. a measurement device that acquires a measurement path of the probe between the first measurement point and the second measurement point, which is planned by the path planning unit of the measurement path planning device, and performs measurements of the first measurement point and the second measurement point based on the measurement path of the probe. The measurement path planning system of claim 5 .

7. A method performed by a measurement path planning device, comprising: Define the shape of the measurement target space including the workpiece and obstacles to be measured; determining a probe attitude that does not interfere with the obstacle with respect to the first measurement point and the second measurement point when sequentially measuring the first measurement point and the second measurement point set in the measurement target space; planning a measurement path of the probe between the first measurement point and the second measurement point; method.

8. On the computer, A process for defining the shape of the measurement space including the workpiece and obstacles to be measured; a process of determining a probe orientation that does not interfere with the obstacle with respect to a first measurement point and a second measurement point set in the measurement target space when the first measurement point and the second measurement point are measured in sequence; planning a measurement path of the probe between the first measurement point and the second measurement point; A program to execute.

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