Sample preparation system for optically identifying a fabricated disk

Abstract

The present invention relates to a sample preparation system comprising a surface selection module for identifying one or more preparation disks having a preparation surface, the surface selection module comprising a support system having three or more shelves, such as five or more shelves, each arranged to support a preparation disk having a preparation surface, and for each shelf, the surface selection module comprising a reflecting surface arranged to direct electromagnetic waves reflected from a characteristic identification mark of the preparation disk to a sensing position located outside the support system, the surface selection module further comprising an optical sensor arranged to sense the characteristic identification mark at the sensing position and to provide an identification output accordingly, the sample preparation system further comprising a machining unit comprising a support mechanism having a planar support surface on which the preparation disk may be held by a fixing mechanism at a predetermined position during sample preparation, a transfer unit for transferring a preparation disk having a preparation surface from the support system to the planar support surface of the machining unit, and a control unit arranged to control the transfer unit in response to the identification output, the present invention further relates to a preparation disk, and a method for identifying one or more preparation disks. TIFF2025517605000002.tif66170

Description

Technical Field

[0001] The present invention relates to a sample preparation system comprising a surface selection module for identifying one or more production disks for a machining unit, wherein the surface selection module utilizes optical identification of the production surface. The present invention further relates to a method for identifying one or more production disks based on optical identification.

Background Art

[0002] Background Materialography generally relates to an investigative process for examining the microstructure of any solid material and providing a qualitative and / or quantitative description of its properties. Materialographic sample preparation generally involves the process of preparing a material sample prior to the examination and analysis of the prepared sample. Materialographic sample preparation generally aims to fully reveal the true properties of the sample, whether the sample is metal, ceramic, sintered carbide, mineral, polymer, or any other arbitrary solid material. As part of the preparation process for exposing a truthful representation of the sample's structure, grinding means are typically used to polish and finish the surface of the sample.

[0003] The grinding means includes a production surface such as a grinding disk having a functional surface that provides polishing / finishing when in contact with the sample and when moving relative to the sample surface. The selection of the type of production surface varies depending on the selection of the sample material for which they are intended. To obtain satisfactory results, it is typically necessary to process materials such as soft, hard, ductile, brittle, homogeneous, and inhomogeneous in different ways. Further, the sample may need to go through multiple grinding steps, typically realized by successive stages in which the invasive nature of the grinding means is gradually reduced by the involvement of different production surfaces.

[0004] For proper preparation and further for increased reproducibility, the sequence of grinding steps needs to be based on a systematic approach and preferably precisely controlled.

Summary of the Invention

[0005] Brief Description of the Invention A surface selection module for improving the identification of a production disk having a production surface, which has the potential to enable more efficient and precise selection of the production surface applied in a histological grinding process. It is an object of the present invention to provide a sample preparation system comprising such a surface selection module. Furthermore, it is also an object of the present invention to provide an identification means that has very little impact on the functionality of the production surface.

[0006] It is also a further object of the present invention to provide a sample preparation system for such identification that is simple and compact and has the potential to be easily modified to suit the installation environment.

[0007] Therefore, the present invention relates to a sample preparation system comprising a surface selection module for identifying one or more production disks having a production surface for histological sample preparation. The surface selection module comprises a support system having three or more shelves, such as five or more shelves, each arranged to support a production disk having a production surface. For each shelf, the surface selection module comprises a reflecting surface arranged to direct electromagnetic waves reflected from the characteristic identification mark of the production disk to a sensing position located outside the support system. The surface selection module further comprises an optical sensor arranged to sense the characteristic identification mark at the sensing position and provide an identification output accordingly. The sample preparation system further comprises a machining unit comprising a support mechanism having a planar support surface on which the production disk may be held by a fixing mechanism at a predetermined position during sample preparation, a transfer unit for transferring the production disk having a production surface from the support system to the planar support surface of the machining unit, and a control unit arranged to control the transfer unit in response to the identification output.

[0008] According to the present invention, it is possible to identify the type of the production disk and its position within the support system. The present invention provides the advantage of increasing the efficiency in the production process of histological samples, as the identification, and thus the selection and mounting, of individual production disks becomes more time-efficient and / or less error-prone. According to the present invention, the production disks do not need to be placed on pre-assigned shelves and can be placed on any shelf and identified by the system. This reduces the risk of accidentally selecting the production disks and may further enable a more automated process.

[0009] The system provides a sensing position outside the support system, for example outside the space between the shelves, so that the support system does not need to have a place for the optical sensor and a more compact and space-saving support system is possible. A reflecting surface may be used to determine and correct the position of the sensing position and thereby provide an optical path suitable for the space in which the surface selection module is placed. This further enables the use of an optional single optical sensor to identify multiple individual production surfaces separated within different shelves. The present invention may provide a more compact and simple solution that provides a less restrictive and more flexible setup for detecting the characteristic identification marks.

[0010] The production disks may preferably be consumables suitable for machining the samples, and such machining may be part of a histological production process. Generally, histology is considered as an investigative method of materials science that includes the optical inspection of fine structures, and its goal is to qualitatively and / or quantitatively describe the fine structures. The purpose of applying the production disks is preferably to produce the samples so that they are suitable for such fine structure analysis.

[0011] Generally, the basic process of mechanical sample preparation is to remove material from the surface in a progressively finer process using abrasive particles to reach the required or acceptable result. The progressively finer process is typically provided by sequentially applying different preparation disks. The preparation process used is thought to create a small number of artifacts, but in practice, it enables the analysis of the microstructure of the sample in a satisfactory manner. The goal of preparation is generally that the structural elements of the sample are retained, and the sample surface should generally be clean, flat, highly reflective, and free of scratches. Mechanisms such as polishing and lapping are used to achieve these goals.

[0012] In one or more aspects, the preparation disk may be preferably plate-shaped, such as a polishing sheet or a lapping cloth. The preparation disk may have two opposite main surfaces, one of which is the working surface. The working surface may comprise polishing means and / or lapping means, such as fixed abrasive particles, for example diamond particles or silicon carbide. Such a preparation disk may be, for example, a polishing disk. Alternatively or additionally, the working surface may provide a surface that is directed towards the sample during machining, with an abrasive agent provided between the sample and the working surface, such as a diamond suspension. Such a preparation disk may be a lapping cloth.

[0013] In one or more aspects, the type of preparation disk may be characterized by the application area it is designed for. For example, the application area may be defined by the sample, such as the material and / or hardness of the sample, and / or by the steps within the grinding sequence of the preparation process. The type of working surface may vary in terms of material, hardness, resilience, grit size, grit pattern, and / or grit type.

[0014] The control unit may preferably be able to distinguish between preparation disks of different types from the identification output.

[0015] As an advantage, the identification output provided by the optical sensor based on the reading of the characteristic identification mark enables differentiation between available production disks, thereby enabling correct selection of the correct type of production disk for the selected purpose.

[0016] In one or more aspects, the control unit is arranged to identify the position of the specific production disk type required for the selected production process based on one or more identification outputs. In one or more aspects, the control unit is arranged to identify whether the support system accommodates a specific production disk type.

[0017] In one or more aspects, for each detected production disk, the identification output contains information regarding the production disk type and an identifier of the shelf on which each detected production disk is placed.

[0018] The control unit may also be arranged to control, based on the identification output, from which shelf the transfer unit transfers the production disk.

[0019] The control unit may be arranged to automatically control the transfer unit in response to the identification output such that, for example, the transfer unit is controlled to perform a selection operation from the support system and transfer the selected production disk to the machining unit. The selection operation performed may be based on a pre-assigned material histological production process and / or based on an input from the user to the control unit, such as, for example, before sensing of the production disk by an optical sensor.

[0020] Accordingly, the sample preparation system may enable or provide for automatic loading and unloading of the production disk, such as loading and unloading into and out of a machining unit for preparing histological samples. Manual loading has the disadvantage that the production disk may be accidentally inserted into the machine being used. This can potentially damage the machining unit, the sample being prepared, and / or the production disk itself.

[0021] In one or more aspects, the transfer unit is arranged to transfer a production disk having a production surface from a support system to a planar support surface of a machining unit.

[0022] In one or more aspects, the transfer unit may comprise any suitable means for displacing the production disk onto and from a shelf of the support system. The transfer unit may comprise, for example, robotic means. Further, it is preferred that the transfer unit is configured to place the production disk within the machining unit, such as on a support mechanism having a planar support surface.

[0023] In one or more aspects, the control unit is arranged to convert an identification output into an ID signal, which may be communicated to the transfer unit and used as a control signal.

[0024] Alternatively or additionally, the control unit may comprise means for communicating the ID signal to a user of the sample preparation system, such as by displaying the ID signal on a display means, and / or to a data storage for storing the ID signal. The control unit may preferably be arranged to provide the ID signal based on an identification output containing information regarding the identified production disk type and the associated assigned shelf.

[0025] In one or more embodiments, the control unit may be arranged to provide an ID signal to a user of the sample preparation system based on an identification output such as a shelf number and a related production disk type. The control unit may be arranged to inform the user whether the required production disk is accommodated in the support system.

[0026] In one or more embodiments, the control unit may be arranged to determine, based on an identification output, that the positioning of the production disk on the shelf is incorrect and / or that the production disk on the shelf is missing. This may be provided based on the fact that the identification reading by the optical sensor is partial and / or missing. The control unit may further provide a signal to the user of the sample preparation system, for example via display means, indicating that the production disk is incorrectly placed on the shelf or is missing. For example, the ID signal may contain an indication of whether the shelf holds the correct production disk and / or may be provided as a linguistic or visual signal provided, for example, by display means.

[0027] Alternatively or additionally, the control unit may be arranged to store the ID signal in a data storage that may be provided as a look-up table at the time of production disk selection. The look-up table may be updated based on the received identification output, for example with a shelf number and a related production disk type.

[0028] In one or more embodiments, the surface selection module may be arranged to collect data related to the production disk, such as tracking the age and / or usage time of the production disk, and the data may be used to provide an indication of whether the production disk needs to be discarded and / or replaced. This indication may be communicated to the user by the control unit and the display means.

[0029] In one or more embodiments, the fabrication disk is held by a support system such that the characteristic identification mark is optically exposed so as to be optically perceivable. The shelf may hold the fabrication disk by means of a frame or arm, or using any suitable technique (such as suction, clamping, electromagnetic holder, etc.). In one or more embodiments, the shelf is arranged to support the fabrication disk at the edge of the fabrication disk, preferably by contact with its back surface.

[0030] In one or more embodiments, the support system may provide storage of the fabrication disk between uses, and / or the support system may be part of a machining unit, i.e., a grinding and / or polishing machine.

[0031] In one or more embodiments, the support system comprises positioning means for correctly positioning the fabrication surface in order to enable detection and identification of the fabrication surface by an optical sensor. This may be provided, for example, by the shelf cavity shape fitting the fabrication disk shape, e.g., its outer peripheral shape (width / diameter). In one or more embodiments, each shelf may be arranged to support a single fabrication disk to be identified.

[0032] In one or more embodiments, the support system is arranged to store a plurality of fabrication disks such that at least two of the plurality of fabrication disks are fabrication disks of different types, e.g., whose fabrication surfaces are composed of different materials.

[0033] The support system may comprise a plurality of shelves arranged in a stack configuration.

[0034] The shelves may be arranged in a column on top of each other. Since the optical sensor is arranged outside the shelf, each shelf may be placed close to each other.

[0035] Furthermore, the shelves may preferably be arranged such that when each shelf contains the production disks, the distance between adjacent production disks is less than 85 mm, such as less than 75 mm or less than 65 mm.

[0036] As an advantage, this enables an optimized amount of production surface to be held by the storage system, providing a more compact solution.

[0037] In one or more embodiments, the electromagnetic wave is reflected from the characteristic identification mark, and the reflecting surface provides a path for the electromagnetic wave extending from the characteristic identification mark to the optical sensor such that the optical sensor can capture the electromagnetic wave traveling along the path. In one or more embodiments, the path is a free space path.

[0038] The reflecting surface may be any surface that reflects electromagnetic waves, particularly electromagnetic waves in the IR or visible range. The reflecting surface has reflection characteristics suitable for adequately detecting the characteristic identification mark for identification purposes. In one or more embodiments, a plurality of reflecting surfaces may be provided for each shelf.

[0039] In one or more embodiments, the sensing position is the position of the optical sensor that can detect the identification mark indicating the characteristic. The sensing position may be the intersection between the optical path from the characteristic identification mark reflected by the reflecting surface and the optical sensor. The optical path and / or the optical sensor may be movable, for example, by a transposition system (described in more detail later), whereby a single optical sensor may be arranged to be positioned at several sensing positions. For example, the optical sensor may be transposable along a path on which a number of sensing positions are defined. Alternatively, the sensing position may be the position occupied by the optical sensor at a fixed position. In one or more embodiments, a single sensing position may be provided for each shelf.

[0040] In one or more embodiments, the characteristic identification mark varies depending on the type of the production disk. The optical sensor is preferably arranged to capture the differences in the different characteristic identification marks. Thus, the optical sensor is preferably arranged to provide a separate identification output for each individual production disk type.

[0041] In one or more embodiments, the characteristic identification mark is a surface identification mark. The characteristic identification mark may be a code represented by, for example, an image, a pattern, a color, or a character, or any combination thereof.

[0042] The characteristic identification mark is preferably an image provided on the surface of the production disk, such as a two-dimensional code.

[0043] Advantageously, such an image may be sufficient for the identification purposes of the present invention and further enables maintaining a substantially uniform thickness of the production surface.

[0044] In one or more embodiments, the characteristic identification mark is a data matrix (DM) code, a quick response (QR) code, or a bar code, etc. The data matrix code may be based on the international standard ISO / IEC 16022. The QR code may be based on the international standard ISO / IEC 18004. The bar code may be based on the international standard ISO / IEC 15415 or ISO / IEC 15416.

[0045] In one or more embodiments, the image may extend parallel to the main extent of the production disk, such as the main back or the main front of the production disk.

[0046] For a preferred production disk, the characteristic identification mark protrudes less than 0.2 mm, such as less than 0.1 mm, from the surface of the production disk on which the characteristic identification mark is provided.

[0047] To ensure smooth operation and obtain high-precision and high-quality polishing / grinding, strict geometric requirements for the production disk may be necessary. Next, the flatness of the production disk provides the processing result of a very flat sample surface, which may enable shortening of the production time. Preferably, the presence of the characteristic identification mark has little or no effect on the uniformity in the thickness of the production disk.

[0048] In one or more aspects, the characteristic identification mark protrudes less than 0.18 mm, such as less than 0.15 mm, less than 0.12 mm, less than 0.09 mm, or less than 0.07 mm, from the surface of the production disk on which the mark is provided.

[0049] Advantageously, such small protrusions may have little effect on the functionality and quality of the production disk in terms of the polishing / grinding effect.

[0050] In one or more aspects, the characteristic identification mark protrudes less than 0.05 mm, such as less than 0.04 mm, less than 0.03 mm, less than 0.02 mm, or less than 0.01 mm, from the surface of the production disk on which the mark is provided.

[0051] Advantageously, such small protrusions may have very little or no effect on the functionality and quality of the production disk in terms of the polishing / grinding effect.

[0052] In one or more aspects, the protrusion provided by the identification mark can generally be measured perpendicular to the main surface of the disk on which or in which the identification mark is located.

[0053] In one or more aspects, the characteristic identification mark may be provided on the production disk by adhesion.

[0054] In one or more aspects, the characteristic identification mark may be etched or engraved into the surface, such as to provide a character or pattern.

[0055] The characteristic identification mark is preferably provided on the back surface of the fabricated disk, opposite to the fabricated surface.

[0056] Advantageously, this enables the fabricated surface to be less affected by the identifier.

[0057] In one or more aspects, the characteristic identification mark is provided on the fabricated surface of the fabricated disk, such as within or on the fabricated surface. The fabricated surface may generally be the front surface of the fabricated disk.

[0058] In one or more aspects, the characteristic identification mark is provided by the fabricated surface. Advantageously, this eliminates the need to add an identification mark to the fabricated disk, and instead, the inherent characteristics of the fabricated disk may be used for identification. The characteristic identification mark may be provided by a structure such as a polishing pattern or a honing pattern of the fabricated surface, such as a pattern providing the grinding structure of the fabricated surface of a polishing disk. The pattern may be any pattern suitable for the fabricated surface, such as a hexagonal or circular pattern of dots, or other patterns.

[0059] In one or more aspects, the optical sensor is configured to detect any of the types of identification marks described above, such as a code or pattern, and provide an identification output accordingly. For example, the optical sensor may be provided by a color sensor, a code scanner, and / or a camera.

[0060] It is advantageous that the optical sensor (5) is an image sensor.

[0061] The image sensor may be, for example, a charge-coupled device (CCD) or an active pixel (CMOS) sensor. The image sensor may be part of an electronic imaging device, such as a camera.

[0062] In one or more embodiments, the optical sensor is configured to detect infrared wavelengths, such as near-infrared wavelengths, and / or visible wavelengths.

[0063] The sample preparation system may further comprise a light source arranged to illuminate the characteristic identification mark when the preparation disk is supported by the support system.

[0064] The illumination may be provided by any wavelength or wavelength range configured such that an optical sensor, such as an image sensor, can capture it. In one or more embodiments, the characteristic identification mark is illuminated by a wavelength outside the visible spectrum, such as a near-infrared wavelength. Advantageously, this allows the illumination to be substantially invisible to the user of the sample preparation system.

[0065] In one or more embodiments, the machining unit comprises a support mechanism comprising a planar support surface rotatably arranged such that a preparation disk mounted on the support surface can provide a polishing function and / or a honing function by rotation of the support surface.

[0066] The mentioned fixing mechanism may, in a preferred embodiment, include magnetic means in the support mechanism and in the preparation disk, where the preparation disk is held in a predetermined position on the planar support surface due to the mutual magnetic attraction between the support mechanism and the preparation disk.

[0067] In one or more embodiments, the support mechanism may comprise a planar support surface having a permanent magnet designed to provide a magnetic attraction force to the fabrication disk, which may be provided by a ferromagnetic material such as a metal backing on its back surface, for example. The planar support surface is preferably suitable for supporting fabrication disks having various fabrication surfaces.

[0068] Alternatively or additionally, the fixing mechanism may include suction means arranged to provide a low-pressure area in contact with the fabrication disk, where the fabrication disk is held in a predetermined position on the planar support surface due to the low-pressure area.

[0069] In one or more embodiments, the low-pressure area is sealed from outside the suction area upon contact with the fabrication surface such that a low-pressure area is provided by sucking air out of the suction area. The low-pressure area generally has a lower pressure than the pressure outside the suction area, which is generally at atmospheric pressure for the purposes of the present invention.

[0070] Advantageously, the suction means and the magnetic means provide a suitable fixation of the fabrication disk with respect to the rotating means of the machining unit such that they can provide grinding / polishing as part of a materials histological fabrication process. In addition, the suction means and the magnetic means provide a uniform fixation of the fabrication disk, enabling the fabrication surface to be exposed. Furthermore, those means can maintain the flatness of the fabrication disk.

[0071] The reflective surface may be attached to the support system and may be arranged to be above or below the fabrication disk when the fabrication disk is supported by the support system.

[0072] In one or more aspects, most or each of the reflecting surfaces are arranged within a cavity provided in a partition structure that separates the shelves of the support system. The partition structure may preferably be opaque. The cavity may comprise an inclined surface oriented towards the sensing position. The partition structure may be arranged to optically separate the reflecting surfaces associated with different shelves of the sample preparation system, for example to provide an optical shield between the reflecting surfaces. The main extent of the partition structure may be approximately equal to or greater than the main extent of the production disk when arranged within adjacent shelves, or may be approximately equal to or greater than the main extent of the adjacent shelves.

[0073] The reflecting surface is preferably arranged to provide a reflection angle for electromagnetic waves of 40 - 85 degrees, such as 50 - 80 degrees or 60 - 70 degrees.

[0074] Advantageously, due to the larger reflection angle, the distance provided between adjacent production disks within the support system can be smaller. In one or more aspects, the reflection angle is measured between the surface normal and the reflected ray provided by the electromagnetic wave in the direction towards the optical sensor, where the surface normal is defined by a line perpendicular to the point of incidence on the reflecting surface.

[0075] In one or more aspects, the reflection angle is at least 50 degrees, such as at least 60 degrees, at least 70 degrees, at least 80 degrees. In one or more aspects, the reflection angle is at least 55 degrees, preferably at least 60 degrees, and more preferably at least 65 degrees.

[0076] The sample preparation system may comprise a displacement system arranged to provide a mutual displacement between the optical sensor and the support system.

[0077] The transposition system enables the use of a smaller number of optical sensors, such as one, within a module so as to save components for the module and enable the module to be produced at a lower cost. The transposition system may comprise any suitable means for providing transposition, such as a guide rail with a robot and / or drive means for moving the optical sensor and / or support system along the guide rail.

[0078] In one or more embodiments, an optical sensor is attached to the transposition system and arranged to be transposed between sensing parts by the transposition system.

[0079] In one or more embodiments, a support system is attached to the transposition system and arranged to be transposed by the transposition system between support system positions where the optical sensor is in a sensing position.

[0080] In one or more embodiments, the sample preparation system is arranged to provide a sensing position for each shelf. For example, the transposition system may be configured to be movable between predetermined sensing positions and / or support system positions.

[0081] Also disclosed herein is a preparation disk for histological sample preparation, comprising a first major surface with a preparation surface and a second major surface with a characteristic identification mark.

[0082] The fabricated disk is preferably suitable for being identified by a surface selection module according to the first aspect of the present invention. The characteristic identification mark may be configured to be identified by a sample fabrication system according to the first aspect of the present invention. The fabrication surface may comprise any of the features associated therewith as described with respect to the first aspect of the present invention. The characteristic identification mark may be of any type described with respect to the first aspect of the present invention, such as a 2D image. In one or more embodiments, the characteristic identification mark is a code such as a DM code, a QR code, or a barcode attached to the main back surface of the fabricated disk. Preferably, the identification mark protrudes less than 0.2 mm from the surface of the fabricated disk on which the characteristic identification mark is provided.

[0083] The fabricated disk is preferably arranged to be removably supported on a support mechanism of a machining unit. The attachment between the support mechanism and the fabricated disk may be provided by any suitable fixing mechanism, such as magnetic means.

[0084] Also disclosed herein is a sample fabrication system as disclosed herein comprising a plurality of such fabricated disks.

[0085] According to a further aspect of the present invention, the present invention relates to a method of identifying one or more fabricated disks for materials histology sample fabrication, the method comprising providing a support system having three or more shelves and one or more fabricated disks each having a fabrication surface, the fabricated disks being distributed within the shelves, providing an optical sensor in a sensing position, wherein an electromagnetic wave from a characteristic identification mark of one of the fabricated disks is provided at the sensing position by reflecting the electromagnetic wave using a reflecting surface, detecting the characteristic identification mark by the optical sensor and providing an identification output accordingly, the identification output containing data about the identified fabricated disk and the shelf associated therewith. Based on the identification output, controlling the selection of the production disk by the transfer unit controlled by the control unit, and placing the selected production disk into the machining unit using the transfer unit are included.

[0086] In one or more embodiments, the method may be performed by a sample preparation system according to the present invention.

[0087] In one or more embodiments, the steps may be provided in the sequence listed above. In one or more embodiments, the steps prior to the step of controlling the selection of the production disk performed by the transfer unit may be repeated until all available production disks are identified or until the required production disks are identified.

[0088] In one or more embodiments, the control of the selection of the production disk may be provided as an input by the user to the control unit or may be based on a predefined material histological production process. The predefined material histological production process may involve a number of production disks sequentially placed in the processing unit and sequentially applied to the sample.

[0089] In one or more embodiments, the method may comprise selecting a histopathological preparation process involving one or more preparation disks and providing this selection as an input to a control unit. The selection may involve defining a histopathological preparation process or selecting a pre-defined process stored in the data storage of the control unit. This selection may be provided before or during any of the steps listed above, for example, before providing the optical sensor within the sensing position (and preferably before subsequent steps of the method), but preferably after providing a shelf for accommodating the disk, or before controlling the transfer unit (and preferably before subsequent steps of the method), but preferably after detecting one or more characteristic identification marks.

[0090] In one or more embodiments, for example, a transfer unit based on the first aspect of the present invention may be provided for transferring a preparation disk between a support system and a machining unit.

[0091] In one or more embodiments, the machining unit may be a grinding machine and / or a polishing machine for histopathological preparation. The processing unit may comprise a support mechanism as described based on the first aspect of the present invention.

[0092] In one embodiment, a control unit based on the first aspect of the present invention may be arranged to manage the selection of the preparation disk and optionally further monitor the age and / or use of the preparation disk. In one or more embodiments, the control unit may be arranged to control the transfer unit and / or the machining unit based on an identification output.

Brief Description of the Drawings

[0093] Aspects of the present disclosure will be described below with reference to the drawings.

Figure 1

Figure 2

Figure 3

Figure 4

Figure 5

Figure 6

Figure 7

Figure 8

Mode for Carrying Out the Invention

[0094] Detailed Description of the Invention Figs. 1 to 8 show a sample production system 1 or a part thereof according to various aspects of the present invention.

[0095] FIG. 1 shows a surface selection module 1a according to various aspects of the present invention as viewed from the side. The side may be covered with a cover to shield the components inside the module 1a under normal circumstances. The surface selection module 1a comprises a support system 3 that provides a stack of horizontally stacked shelves 3a, and the production disk 2 may be placed in a substantially horizontal orientation within the shelves 3a, which is illustrated in the top two shelves 3a each accommodating the production disk 2.

[0096] In one or more embodiments, the characteristic identification mark 6 may be a data matrix code, and the optical sensor 5 may be a data matrix code scanner such as a camera 5a configured to provide an identification output based on the sensed data matrix code.

[0097] In FIG. 1, the support system 3 includes a cavity 12 with a reflective surface for each shelf 3a provided therein such that a camera 5a equipped with an optical sensor 5 can sense the lower surface of the fabricated disk regardless of on which shelf 3a the disk 2 is located. In this embodiment, the camera 5a is arranged to be movable substantially in the vertical direction so that all fabricated disks 2 distributed between the shelves 3a can be identified using one camera. The cavity 12 and the reflection of the sensed electromagnetic wave (i.e., image) by the reflective surface allow the shelves 3a to be arranged close to each other, enabling the distance D defined between adjacent fabricated disks 2 when arranged as adjacent shelves 3a to be less than 70 mm, for example 60 - 70 mm.

[0098] Figure 2 shows a partial view of the shelf 3a of the support system 3 based on Figure 1 and the optical sensor 5 as seen in perspective. The shelf 3a comprises a partition structure 13 that essentially functions as the bottom plate of the shelf in this embodiment. The partition structure 13 has a cavity 12, which, in this embodiment, is shaped with a tapered surface between the surfaces extending in the plane of the partition structure 13 towards the reflecting surface 8 located within the cavity 12. The camera 5a is arranged slightly tilted towards the cavity 12. As seen in the figure, the shelf 3a further comprises a support edge 3b on which the production disk 2 is placed. Additionally, the shelf 3a may optionally comprise positioning means 3c that define an area where the production disk may be placed when placed within the shelf 3a so that it can be identified. In this embodiment, the positioning means 3c is provided by a partial periphery for surrounding and may optionally be the butting portion of the periphery of the production disk.

[0099] Figure 3 shows a cross-sectional view of the shelf of Figure 2. As seen in Figure 3, the cavity 12 is arranged to have a space for the optical path 14 established between the optical sensor 5 of the camera 5a and the characteristic identification mark 6 of the production disk 2 located within the shelf 3a and supported by the support edge 3b. It can be seen that the optical path changes direction by being reflected by the reflecting surface 8.

[0100] Figure 4 shows a simplified view of the optical path 14, the optical sensor 5, the reflecting surface 8, and the characteristic identification mark 6 of the setup shown in Figure 3. As seen in Figure 4, in order to provide a relatively large reflection angle α_r to reduce the vertical extent of the necessary free space for the optical path 14 established between the optical sensor 5 and the characteristic identification mark 6, it is desirable. The reflection angle α_r is defined between the surface normal SN extending perpendicular to the reflecting surface 8 at the point of incidence of the electromagnetic wave line in the direction from the characteristic identification mark 6 to the optical sensor 5. In this embodiment, the reflection angle α_r is 60 - 70 degrees.

[0101] In one or more embodiments, there may be a light source (not shown) for illuminating the identification mark 6 so as to be more easily sensed by the optical sensor 5. Such a light source may be a near-infrared light source. The light source may be located close to or near the optical sensor 5, and a reflecting surface 8 may be utilized to illuminate the characteristic identification mark 6. In one or more embodiments, the characteristic identification mark 6 is a passive identification mark, and the detected electromagnetic wave may be reflected from the characteristic identification mark, such as providing an image of the characteristic identification mark by the optical sensor 5.

[0102] Figs. 5 and 6 show a front view (Fig. 5) and a rear view (Fig. 6) of the production disk 2 of the present invention. The production disk 2 may be in the shape of a plate in the sense that its width and length (or diameter) are much larger than its thickness. The production disk 2 is configured to be identifiable by the sample production system 1 of the present invention, for example, as shown in Figs. 7 and 8. Fig. 5 shows the front surface 2a of the production disk 2 having a production surface 2_ps configured to produce a sample for histological examination. In this embodiment, the production surface 2_ps is designed to polish the sample and has a pattern of grinding means for providing such polishing when in contact with the sample. Fig. 6 shows the rear surface 2b of the production disk 2, which is the main surface arranged on the side opposite to the production surface 2_ps. The rear surface 2b preferably has a characteristic identification mark 6 placed at the center on the rear surface 2b. The characteristic identification mark 6 may preferably be printed or adhered on the rear surface 2b.

[0103] Optionally, the rear surface 2b may be a metal surface such as a ferromagnetic metal surface. For example, the production disk 2 may be a flexible plate, such as a flexible steel plate, which makes positioning, extraction, and storage easier. Alternatively or additionally, the characteristic identification mark 6 may be repeated or placed at other locations on the production disk 2.

[0104] Figures 7 and 8 show two different aspects of the sample preparation system 1 according to the present invention. In Figure 7, the sample preparation system 1 comprises a displacement means 4 arranged to displace an optical sensor and an associated camera 5a between sensing positions 7 in a direction of movement MD which is preferably substantially vertical. In Figure 8, the sample preparation system 1 comprises a displacement means 4 arranged to displace a support system 3, and thus a shelf 3a, in order to align the sensing position with the optical sensor 5 of the camera 5a. The direction of movement MD of the support system 3 may preferably be substantially vertical.

[0105] In Figures 7 and 8, the sensing positions 7 generally define positions where a characteristic identification mark 6 is visible to the camera 5 and detectable by the optical sensor 5a. Any intersection of the optical sensor 5 with the illustrated optical path 14 may provide a sensing position.

[0106] In Figures 7 and 8, the camera 5a is arranged to sense a characteristic identification mark from a preparation disk located on the shelf 3a and provide a corresponding identification output to a control unit 9, which in turn is arranged to control the selection of the preparation disk 2 from the shelf 3a by a transfer unit 11. The transfer unit 11 is arranged to pick a specific preparation disk from the designated shelf 3a and place it within a machining unit 15 based on a control signal from the control unit 9. The transfer unit 11 is preferably arranged to place the preparation disk on a planar support surface 16a of a support mechanism 16 of the machining unit 15.

[0107] The machining unit 15 may be further supplied with a sample, for example, within a sample holder, and the machining unit 15 may be arranged to grind (polish or lap) the surface of the sample by pressing the preparation surface of the preparation disk on the planar support surface 16a against the sample surface.

[0108] Fabrication by grinding may be provided by moving the fabrication surface relative to the sample surface, for example, with the fabrication surface rotating about an axis perpendicular to the major surface of the disk, such as the fabrication surface.

[0109] For example, a method of identifying one or more fabrication disks for materials histology sample fabrication using the system 1 according to FIG. 7 or 8 may include the following method steps: A. Providing a support system 3 having three or more shelves and one or more fabrication disks each having a fabrication surface, the fabrication disks being distributed within the shelf 3a; B. Providing an optical sensor 5 within a sensing position 7, preferably an electromagnetic wave from a characteristic identification mark of one of the fabrication disks reflected from a reflecting surface 8, which is preferably a reflecting surface provided below the fabrication disk, such as a reflected image, being provided at the sensing position 7; C. Detecting the characteristic identification mark by the optical sensor 5 and providing an identification output accordingly, the identification output containing data about the identified fabrication disk and the associated shelf 3a; D. Controlling the selection of the fabrication disk by controlling the transfer unit 11 by a control unit 9 based on the identification output; and E. Placing the selected fabrication disk into the machining unit 15 using the transfer unit 11.

[0110] The various stages may be provided in the sequences listed above. Stages A to C may be repeated until all available production disks are identified or until the required production disks are identified. The method may comprise the stage of selecting a predefined histological production process involving one or more production disks and providing this selection as an input to the control unit 9. This selection may be provided before or between any of the stages A to E listed above, for example before stage A or B, but preferably after stage A if it is before stage B, or this selection may be provided before stage D but preferably after stage C.

[0111] The stage of providing a support system 3 having three or more shelves and one or more production disks each having a production surface, wherein the production disks are distributed within the shelf 3a, is preferably provided as part of the method or may be provided before the execution of the method by distributing one or more production disks within the shelf 3a of the support system 3 such that each of the filled shelves 3a has a single production surface. The support system 3 may provide disk storage before, after or during the execution of the method.

[0112] Reference list 1 Sample production system 1a Surface selection module 2 Production disk 2_ps Production surface 2a Front surface 2b Back surface 3 Support system 3a Shelf 3b Support edge 3c Positioning means 4 Transposition system 5 Optical sensor 5a Camera 6 Trait identification mark 7 Sensing position 8 Reflective surface 9 Control Unit 10 Functional Surface 11 Transfer Unit 12 Cavity 13 Partition Structure 14 Optical Path 15 Machining Unit 16 Support Mechanism 16a Planar Support Surface α_r Reflection Angle D Distance between Adjacent Fabricated Disks MD Direction of Movement SN Surface Normal

Claims

1. A sample preparation system (1) comprising a surface selection module (1a) for identifying one or more preparation disks (2) having a preparation surface (2_ps) for materialographic sample preparation, the surface selection module (1a) comprising a support system (3) having three or more shelves (3a), such as five or more shelves (3a), each arranged to support a preparation disk (2) having a preparation surface (2_ps), for each shelf (3a), the surface selection module (1a) comprising a reflecting surface (8) arranged to direct electromagnetic waves reflected from a characteristic identification mark (6) of the preparation disk (2) to a sensing position (7) located outside the support system (3), the surface selection module (1a) further comprising - an optical sensor (5) arranged to sense the characteristic identification mark (6) at the sensing position (7) and provide an identification output accordingly, the sample preparation system (1) further comprising - a machining unit (15) comprising a support mechanism (16) having a planar support surface (16a) on which the preparation disk (2) may be held by a fixing mechanism at a predetermined position during sample preparation, - a transfer unit (11) for transferring a preparation disk (2) having a preparation surface (2_ps) from the support system (3) to the planar support surface (16a) of the machining unit (15), - a control unit (9) arranged to control the transfer unit (11) in response to the identification output, the sample preparation system (1) according to claim 1, further comprising the sample preparation system (1) according to claim 1, further comprising the sample preparation system (1) according to claim 1, further comprising

2. The sample preparation system (1) according to claim 1, wherein the control unit (9) is arranged to distinguish between preparation disks (2) of different preparation disk types from the identification output.

3. The sample preparation system (1) according to any one of claims 1 to 2, wherein the control unit (9) is arranged to control from which shelf (3a) the transfer unit (11) transfers the preparation disk (2) based on the identification output.

4. The sample preparation system (1) according to any one of the preceding claims, wherein the support system (3) comprises a plurality of shelves (3a) arranged in a stack configuration.

5. The sample preparation system (1) according to claim 4, wherein when each shelf (3a) houses the preparation disk (2), the shelf (3a) is arranged such that the distance (D) between adjacent preparation disks (2) is less than 85 mm, such as less than 75 mm or less than 65 mm.

6. The sample preparation system (1) according to any one of the preceding claims, wherein the characteristic identification mark (6) is an image provided on the surface (2_ps) of the preparation disk, such as a two-dimensional (2D) code.

7. The sample preparation system (1) according to any one of the preceding claims, wherein the characteristic identification mark (6) protrudes less than 0.2 mm, such as less than 0.1 mm, from the surface of the preparation disk (2) on which the characteristic identification mark is provided.

8. The sample preparation system (1) according to any one of the preceding claims, wherein the characteristic identification mark (6) is provided on the back surface of the preparation disk (2) opposite to the preparation surface (2_ps).

9. The sample preparation system (1) according to any one of the preceding claims, wherein the optical sensor (5) is an image sensor.

10. The sample preparation system (1) according to any one of the preceding claims, further comprising a light source arranged to illuminate the characteristic identification mark (6) when the preparation disk (2) is supported by the support system (3).

11. The sample preparation system (1) according to any one of the preceding claims, wherein the fixing mechanism includes magnetic means in the support mechanism (16) and in the preparation disk (2), and the preparation disk (2) is held at a predetermined position on the planar support surface (16a) due to the mutual magnetic attraction between the support mechanism (16) and the preparation disk (2).

12. The sample preparation system (1) according to any one of the preceding claims, wherein the fixing mechanism includes suction means arranged to provide a low-pressure region in contact with the preparation disk (2), and the preparation disk (2) is held at a predetermined position on the planar support surface (16a) due to the low-pressure region.

13. The sample preparation system (1) according to any one of the preceding claims, wherein the reflecting surface (8) is arranged to be above or below the preparation disk (2) when attached to and supported by the support system (3).

14. The sample preparation system (1) according to any one of the preceding claims, wherein the reflecting surface (8) is arranged to provide a reflection angle (α_r) of the electromagnetic wave of 40 to 85 degrees, such as 50 to 80 degrees or 60 to 70 degrees.

15. The sample preparation system (1) according to any one of the preceding claims, comprising a displacement system (4) arranged to provide a mutual displacement between the optical sensor (5) and the support system (3).

16. A method for identifying one or more preparation disks (2) for histological sample preparation, comprising: - providing a support system (3) having three or more shelves and one or more preparation disks (2) each having a preparation surface (2_ps), the preparation disks (2) being distributed within the shelves (3a); - providing an optical sensor (5) within a sensing position (7), wherein an electromagnetic wave from a characteristic identification mark (6) of one of the preparation disks is provided at the sensing position (7) by reflecting the electromagnetic wave using a reflecting surface (8); - detecting the characteristic identification mark (6) by the optical sensor (5) and providing an identification output accordingly, the identification output containing data about the identified preparation disk (2) and the associated shelf (3a); - controlling the selection of a preparation disk (2) by a transfer unit (11) controlled by a control unit (9) based on the identification output; and - placing the selected preparation disk (2) into a machining unit (15) using the transfer unit (11). The method as described above.

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