Spectroscopic analysis apparatus, spectroscopic analysis method, and spectroscopic analysis program

Abstract

To provide a spectroscopic analyzer, a spectroscopic analysis method, and a spectroscopic analysis program capable of performing stable measurement by correcting the fluctuation of a zero point in a state that a measurement sample is set as it is without replacing a blank solution, a reference sample or the like for periodically acquiring the zero point.SOLUTION: The spectroscopic analysis apparatus 1 includes a light source 11 that emits light including at least a first wavelength and a second wavelength, a spectroscope 12 that disperses the light emitted from the light source 11 into light of the first wavelength and light of the second wavelength, a detector 14 that detects the light of the first wavelength and the light of the second wavelength emitted from the spectroscope 12 and passing through a sample S, and a controller 16 that calculates a first absorbance of the sample S corresponding to the light of the first wavelength and a second absorbance of the sample S corresponding to the light of the second wavelength based on a detection result of the detector 14. The controller 16 calculates the corrected absorbance of the sample S corresponding to the light having the first wavelength by correcting the first absorbance using the second absorbance.SELECTED DRAWING: Figure 1

Description

[Technical Field]

[0001] The present invention relates to a spectroscopic analysis device, a spectroscopic analysis method, and a spectroscopic analysis program. [Background technology]

[0002] Spectroscopic analysis devices such as spectrophotometers and analytical fluorometers are devices that obtain a photometric value by obtaining in advance the amount of light incident on a sample to be measured and measuring the amount of reduction in the amount of incident light as transmittance or absorbance.

[0003] The zero point (origin) of the incident light amount in measurements with a spectrometer can fluctuate due to various factors. Factors that cause this fluctuation include fluctuations in the energy of the light source, changes in the optical path of the optical system (thermal expansion and contraction of the optical system base due to temperature, etc.), changes in the characteristics of optical elements such as mirrors and lenses, and changes in the detection efficiency of the detector. Factors also include changes in the environment surrounding the device. The longer a spectrometer is operated, the greater the impact of zero point fluctuations on measurements, so periodic zero point adjustment is necessary. [Prior art documents] [Patent documents]

[0004] [Patent Document 1] Japanese Patent Application Publication No. 10-104215 [Patent Document 2] Japanese Patent Application Publication No. 2019-020362 [Patent Document 3] Japanese Patent Application Laid-Open No. 2016-161455 Summary of the Invention [Problem to be solved by the invention]

[0005] In general, zero point adjustment is performed by measuring a reference sample, such as a solvent (a so-called blank solution) or a standard sample adjusted to a known concentration, between changes of the sample to be measured, and then using the measurement results of the reference sample. However, when the measurement sample needs to be measured continuously, such as when monitoring the measurement sample over a long period of time, there are cases where it is not possible to replace the measurement sample with a reference sample.

[0006] There are also double-beam instruments that measure not only the sample being measured but also a reference sample in parallel. However, in such instruments, the optical path through which light passes through the sample being measured and the optical path through which light passes through the reference sample are generally asymmetric, and if the measurement continues for a long period of time, the misalignment between the two optical paths can become significant, making it difficult to perform accurate measurements.

[0007] The present invention relates to a spectroscopic analysis device, a spectroscopic analysis method, and a spectroscopic analysis program that enable stable measurements by correcting zero point fluctuations while a measurement sample remains set, without the need to periodically replace blank solutions, reference samples, etc. for obtaining the zero point. [Means for solving the problem]

[0008] The present invention provides a light source that emits light including at least a first wavelength and a second wavelength; a spectroscope that separates the light emitted from the light source into light of a first wavelength and light of a second wavelength; a detector that detects the light of the first wavelength and the light of the second wavelength that have been emitted from the spectrometer and passed through a sample; a control unit that calculates a first absorbance of the sample corresponding to the light of the first wavelength and a second absorbance of the sample corresponding to the light of the second wavelength based on the detection result of the detector; Equipped with the control unit calculates a corrected absorbance of the sample corresponding to the light of the first wavelength by correcting the first absorbance using the second absorbance. A spectroscopic analysis device is provided.

[0009] The present invention provides Light including at least a first wavelength and a second wavelength is emitted from a light source; splitting the light emitted from the light source into light of a first wavelength and light of a second wavelength; detecting the light of the first wavelength and the light of the second wavelength that have passed through the sample; calculating a first absorbance of the sample corresponding to the light of the first wavelength and a second absorbance of the sample corresponding to the light of the second wavelength based on the detection result; correcting the first absorbance using the second absorbance to calculate a corrected absorbance of the sample corresponding to the light of the first wavelength; A method of spectroscopic analysis is provided.

[0010] The present invention provides emitting light including at least a first wavelength and a second wavelength from a light source; splitting the light emitted from the light source into light of a first wavelength and light of a second wavelength; detecting light at the first wavelength and light at the second wavelength that have passed through a sample; calculating a first absorbance of the sample corresponding to the light of the first wavelength and a second absorbance of the sample corresponding to the light of the second wavelength based on the detection result; calculating a corrected absorbance of the sample corresponding to the light of the first wavelength by correcting the first absorbance using the second absorbance; A spectroscopic analysis program is provided that causes a computer to execute the above. [Effects of the Invention]

[0011] According to the present invention, even when measuring the absorbance of a specific wavelength for a sample over a long period of time, the first absorbance at the specific wavelength can be corrected using the second absorbance at another wavelength, thereby performing zero-point adjustment and measuring the correct absorbance. [Brief explanation of the drawings]

[0012] [Figure 1]FIG. 1 is a block diagram of a spectroscopic analyzer according to one embodiment of the present invention. [Figure 2] FIG. 2 is an example of a graph of the absorption spectrum of a sample. [Figure 3] FIG. 3 is a graph showing the change in first absorbance over time for light of the dominant wavelength. [Figure 4] FIG. 4 is a graph showing the change in the second absorbance over time for light of the sub-wavelength. [Figure 5] FIG. 5 is a graph showing the change in absorbance over time after correction for light of the dominant wavelength. [Figure 6] FIG. 6 is a flowchart showing the procedure for carrying out a spectroscopic analysis method using a spectroscopic analyzer. DETAILED DESCRIPTION OF THE INVENTION

[0013] Hereinafter, preferred embodiments of the spectroscopic analyzer according to the present invention will be described in detail with reference to the drawings.

[0014] 1 is a block diagram of a spectroscopic analyzer according to one embodiment of the present invention. The spectroscopic analyzer 1 of this embodiment is, for example, a spectrophotometer that measures the transmittance or absorbance of a sample by irradiating the sample with light and detecting the light that has passed through the sample. The spectroscopic analyzer 1 includes a light source 11, a spectroscope 12, a sample cell 13A, a reference sample cell 13B, a detector 14, an A / D converter 15, a control unit 16, mirrors 17A and 17B, and an interface unit 20.

[0015] The light source 11 emits light including at least a dominant wavelength (first wavelength) and a sub-wavelength (second wavelength) described below. The light source 11 can emit, for example, white light that is a mixture of light of different wavelengths, and is configured by a gas discharge lamp, an LED (Light Emitting Diode), a laser, or the like.

[0016] The spectrometer 12 separates light incident from the light source 11 into light of predetermined wavelengths, here at least light of the dominant wavelength and light of the sub-wavelength, and emits the separated light into the sample cell 13A and the reference sample cell 13B. The spectrometer 12 has a diffraction grating, and by changing the angle of the diffraction grating per unit time, it is possible to extract light of various wavelengths.

[0017] The sample cell 13A contains the sample S to be measured. The sample S is, for example, a liquid, and the sample cell 13A is a box-shaped container that can contain this liquid. The reference sample cell 13B contains a reference sample R (air, blank solution, standard sample, etc.) to be referenced, and has a configuration similar to that of the sample cell 13A.

[0018] Detector 14 detects the light of the dominant wavelength and the light of the sub-wavelength that has passed through sample S in sample cell 13A, and also detects the light of the dominant wavelength and the light of the sub-wavelength that has passed through reference sample R in reference sample cell 13B. The light of the dominant wavelength and the light of the sub-wavelength that has passed through sample cell 13A are reflected by mirror 17A to reach detector 14, and the light of the dominant wavelength and the light of the sub-wavelength that have been separated by spectrometer 12 are reflected by mirror 17B to reach reference sample cell 13B.

[0019] The A / D converter 15 converts the analog data values ​​(analog intensities of light of the dominant wavelength and light of the sub-wavelength) detected and output by the detector 14 into digital data values. The control unit 16 is a processor that controls the overall operation of the spectroscopic analysis device 1, and includes an input / output unit that inputs and outputs data, a storage unit that stores data, predetermined programs, etc. The control unit 16 reads out the programs stored in the storage unit, executes the processing steps described below, and can also perform various calculations.

[0020] The interface unit 20 is a device that allows the user of the spectroscopic analysis device 1 to input operations into the spectroscopic analysis device 1 and to observe the processing results, and includes an operation unit 21 and a display device 22. The operation unit 21 is a device that allows the operator to input input signals necessary for processing by the control unit 16, and includes a keyboard, mouse, touch panel, etc. The display device 22 displays various analysis results processed by the control unit 16.

[0021] The zero point (origin) of the incident light intensity in a spectrometer measurement can fluctuate due to various factors, such as fluctuations in the spectrometer's characteristics and the surrounding environment, and therefore requires periodic zero-point adjustment. For example, in the case of a so-called single-beam spectrometer that does not use a reference sample R, unlike the spectrometer 1 in Figure 1, it is common to remove the sample to be measured and measure it using a reference sample between sample changes, and then use the measurement results from the reference sample to perform zero-point adjustment. However, in cases where the measurement sample needs to be measured continuously, such as when monitoring the measurement sample over a long period of time, there are cases where it is not possible to replace the measurement sample with a reference sample and measure it.

[0022] On the other hand, the spectroscopic analyzer 1 in Figure 1 is a double-beam type device that measures not only the sample S to be measured but also a reference sample R in parallel, and it is possible to perform zero point adjustment from the measurement results of the reference sample R.

[0023] However, the double-beam spectroscopic analyzer 1 has two mirrors 17A and 17B that reflect light. Typically, the installation locations of each mirror are different in terms of their relative positional relationship with other components, and the optical path from the spectrometer 12, passing through the sample cell 13A and mirror 17A, to the detector 14 is not symmetrical with the optical path from the spectrometer 12, passing through mirror 17B and the reference sample cell 13B, to the detector 14. This asymmetry between the two optical paths can increase the measurement deviation between the two optical paths during long-term measurements, making it difficult to perform accurate measurements.

[0024] Therefore, the spectroscopic analyzer 1 according to the embodiment measures the absorbance of light at a wavelength (dominant wavelength, first wavelength) at which the absorbance of the sample is originally desired (first absorbance), and measures the absorbance of light at another wavelength (subordinate wavelength, second wavelength) as a second absorbance. The spectroscopic analyzer 1 then corrects the first absorbance using this second absorbance, thereby calculating the corrected absorbance of the sample corresponding to the light at the wavelength originally desired. As a result, even when measuring the absorbance of a specific wavelength over a long period of time, the spectroscopic analyzer 1 according to the embodiment can perform zero-point adjustment and measure the correct absorbance by correcting the first absorbance at the specific wavelength using the second absorbance at another wavelength. The processing performed by the spectroscopic analyzer 1 will now be described in detail.

[0025] First, the user drives the spectrometer 1 to measure the absorption spectrum of the sample S. FIG. 2 is a graph showing an example of the absorption spectrum of the sample, which indicates the absorbance in a predetermined wavelength range (e.g., 200 nm to 800 nm). While the light source 11 is emitting light, the spectrometer 12 changes the angle of the diffraction grating to vary the extracted wavelength, and obtains the absorbance for each wavelength, thereby obtaining the absorption spectrum of FIG. 2. The absorption spectrum is measured the first time a specific sample is measured, and may be omitted from subsequent measurements of the same sample. The display device 22 may display the graph of FIG. 2.

[0026] Next, the user can refer to the obtained absorption spectrum, set the absorption wavelength at which the absorbance is desired to be obtained, in other words, the dominant wavelength (first wavelength), and input the dominant wavelength from the operation unit 21. The dominant wavelength does not necessarily have to be the apex (peak top) of the absorption spectrum, but is the wavelength at which the user wishes to focus their investigation. The control unit 16 may automatically determine the dominant wavelength based on the absorption spectrum. For example, the control unit 16 may automatically determine the wavelength at the apex of the absorption spectrum as the dominant wavelength.

[0027] Next, the user can refer to the obtained absorption spectrum, set a non-absorbing wavelength, in other words, a secondary wavelength (second wavelength), and input the secondary wavelength from the operation unit 21. The search for the secondary wavelength is performed either on the shorter or longer wavelength side of the dominant wavelength, and a wavelength showing an absorbance below a predetermined threshold is searched for as the secondary wavelength. In particular, the user can select a wavelength showing an absorbance closest to zero. However, the absorbance may be below zero (negative). Alternatively, the user may arbitrarily set the secondary wavelength taking into account the characteristics of the sample S. The control unit 16 may automatically determine the secondary wavelength based on the absorption spectrum. For example, the control unit 16 may automatically determine the wavelength showing an absorbance closest to zero as the secondary wavelength.

[0028] Once the control unit 16 obtains the dominant wavelength and the sub-wavelength through the above process, the spectrometer 1 begins a detailed search for the absorbance corresponding to each of the dominant wavelength light and the sub-wavelength light. The spectrometer 1 first continuously measures the absorbance of the sample S corresponding to the dominant wavelength light over a predetermined period of time. Based on the detection results from the detector 14, the control unit 16 calculates the first absorbance of the sample S corresponding to the dominant wavelength light, resulting in a graph showing the change in the first absorbance over time for the dominant wavelength light, as shown in FIG. 3. Note that the values ​​(vertical axis) in FIG. 3 are obtained by subtracting 0.9 from the absorbance obtained at a wavelength near 560 nm in FIG. 2 to more clearly illustrate the effect of correction using the values ​​in FIG. 4 (described later). However, the following description will be given assuming that the actual absorbance values ​​are shown.

[0029] Furthermore, the spectroscopic analyzer 1 continuously measures the absorbance of the sample S corresponding to the light of the sub-wavelength. Based on the detection result of the detector 14, the control unit 16 calculates the second absorbance of the sample S corresponding to the light of the sub-wavelength, and as a result, a graph showing the change in the second absorbance of the light of the sub-wavelength over time is obtained, as shown in Fig. 4. Figs. 3 and 4 show the change in absorbance up to 72 hours.

[0030] 3 and 4 are obtained, the control unit 16 calculates the corrected absorbance of the sample S corresponding to the light of the dominant wavelength by correcting the first absorbance of Fig. 3 using the second absorbance of Fig. 4. As a result, as shown in Fig. 5, the corrected absorbance over time for the light of the dominant wavelength can be calculated.

[0031] Specifically, the control unit 16 can calculate the absorbance shown in FIG. 5 by subtracting the second absorbance shown in FIG. 4 from the first absorbance shown in FIG. 3. That is, the correction formula is: absorbance at the dominant wavelength after correction = first absorbance at the dominant wavelength - second absorbance at the minor wavelength. This makes it easy to calculate the absorbance of the sample S by correcting the first absorbance. Note that, like FIG. 3, the values ​​(vertical axis) in FIG. 5 represent values ​​obtained by subtracting 0.9 from the actually obtained absorbance. Unlike the uncorrected graph of the first absorbance in FIG. 3, the graph in FIG. 5 shows the change in absorbance after the correction, allowing the user to accurately grasp the change in absorbance.

[0032] The spectroscopic analyzer 1 of this embodiment can calculate the corrected absorbance of the sample S corresponding to the dominant wavelength by correcting the first absorbance corresponding to the dominant wavelength using the second absorbance corresponding to the sub-wavelength. As a result, even when measuring the absorbance of a specific wavelength such as the dominant wavelength for the sample S over a long period of time, the first absorbance at the specific wavelength can be corrected using the second absorbance at another wavelength such as the sub-wavelength, thereby performing zero-point adjustment and measuring the correct absorbance.

[0033] In particular, the sub-wavelength can be determined to be the wavelength at which the second absorbance is closest to zero. The user may set the wavelength at which the absorbance is closest to zero as the sub-wavelength from the absorption spectrum of Fig. 2. The control unit 16 may also automatically set the sub-wavelength in the same manner.

[0034] Light at a wavelength where the absorbance is closest to zero is hardly absorbed by the sample S, and therefore is thought to have little relationship to changes in the concentration of the sample over time. In other words, such fluctuations in light are caused by the effects of fluctuations in the characteristics and / or environmental changes of the spectroscopic analyzer 1, and are caused by fluctuations in the amount of light before passing through the sample, and are thought to be common to fluctuations in the first absorbance. Therefore, by selecting the wavelength where the second absorbance is closest to zero as the wavelength of the second absorbance that corrects the first absorbance, it is possible to accurately perform zero-point adjustment and obtain the correct absorbance.

[0035] As described above, the control unit 16 can determine the dominant wavelength and the sub-wavelength based on the absorption spectrum of Fig. 2 that has been acquired in advance. This allows the dominant wavelength and the sub-wavelength to be determined automatically, thereby reducing the burden on the user. Of course, this does not prevent the user from determining the dominant wavelength and the sub-wavelength themselves.

[0036] 3 and 4, the spectroscopic analyzer 1 of this embodiment continuously detects light of the dominant wavelength and light of the sub-wavelength, and continuously acquires the first absorbance and the second absorbance, thereby enabling the absorbance of the sample S to be continuously measured.

[0037] However, the spectroscopic analyzer 1 may also detect light of the main wavelength continuously to continuously obtain the first absorbance, while periodically detecting light of the sub-wavelength to periodically obtain the second absorbance. This is because the second absorbance is a value for correcting the first absorbance and is not a value that is primarily intended to be obtained. This allows the absorbance of the sample S to be continuously measured while reducing the processing related to the calculation of the second absorbance by the control unit 16. Periodic acquisition means, for example, acquisition every 24 hours, but the time interval is not particularly limited.

[0038] Furthermore, the control unit 16 may estimate a rate of change of the second absorbance based on the change in the second absorbance over a predetermined time period and use this rate of change to correct the first absorbance. For example, the control unit 16 may directly acquire the second absorbance during a first period and calculate a slope corresponding to the change in the second absorbance during the first period. Then, during a second period following the first period, the control unit 16 may calculate the second absorbance during the second period using the calculated slope rather than directly acquiring the second absorbance. This allows the absorbance of the sample S to be continuously measured while reducing the processing performed by the control unit 16 related to the calculation of the second absorbance.

[0039] As described above, the spectroscopic analyzer 1 of this embodiment employs a so-called double beam system in which light is irradiated onto both the sample cell 13A and the reference sample cell 13B, and the spectrometer 12 also emits light of the dominant wavelength and light of the sub-wavelength onto the reference sample R in the reference sample cell 13B. The detector 14 detects the light of the dominant wavelength and the light of the sub-wavelength that have passed through the reference sample R. Therefore, based on the detection results of the detector 14, the control unit 16 can calculate a first absorbance of the reference sample R corresponding to the light of the dominant wavelength and a second absorbance of the reference sample R corresponding to the light of the sub-wavelength.

[0040] As a result, the spectroscopic analyzer 1 performs the same processing on the reference sample R as on the sample S to be measured, and therefore performs calculations on the reference sample R as well, thereby improving the accuracy of the measurement.

[0041] Although the spectroscopic analyzer 1 of this embodiment employs a double beam system, the process of the present invention can also be applied to a so-called single beam spectroscopic analyzer that does not use a reference sample R, and the reference sample cell 13B is not essential.

[0042] FIG. 6 is a flowchart showing the procedure for carrying out a spectroscopic analysis method using the spectroscopic analyzer 1 of this embodiment. In this explanation, measurement of the reference sample R in the reference sample cell 13B will be omitted. The user operates the operation unit 21 to set conditions for measuring the absorption spectrum of the sample (step S1). The conditions here include the measurement mode of the absorption spectrum, the wavelength band for measuring absorbance, etc. After setting the conditions, the user operates the operation unit 21 to instruct the start of measurement of the absorption spectrum, and the spectroscopic analyzer 1 starts measuring the absorption spectrum (step S2).

[0043] 2, the user checks the absorption spectrum displayed on the display device 22 and determines the dominant wavelength (step S3). The control unit 16 may automatically determine the dominant wavelength based on the absorption spectrum. Next, the user checks the absorption spectrum displayed on the display device 22 and determines the secondary wavelength (step S4). The control unit 16 may automatically determine the secondary wavelength based on the absorption spectrum.

[0044] Next, the user operates the operation unit 21 to set measurement conditions for the first absorbance at the dominant wavelength (step S5). The measurement conditions here include the measurement mode for the first absorbance, the time for measuring the first absorbance, etc. The user then operates the operation unit 21 to set measurement conditions for the second absorbance at the sub-wavelength (step S6). The measurement conditions here include the measurement mode for the second absorbance, the time for measuring the second absorbance, etc.

[0045] After setting the measurement conditions, the user operates the operation unit 21 to instruct the spectrometer 1 to start measuring the first absorbance and the second absorbance (step S7). After the measurements of the first and second absorbances as shown in Figures 3 and 4 are completed, the control unit 16 corrects the first absorbance by subtracting the second absorbance from the first absorbance, and calculates the final corrected absorbance (step S8).

[0046] Here, the features of the embodiments of the spectroscopic analysis device, the spectroscopic analysis method, and the spectroscopic analysis program according to the present invention will be briefly summarized and listed below in [1] to

[10] .

[0047] [1] A light source (light source 11) that emits light including at least a first wavelength and a second wavelength; a spectroscope (spectroscope 12) that separates the light emitted from the light source into light of a first wavelength and light of a second wavelength; a detector (detector 14) that detects the light of the first wavelength and the light of the second wavelength that have been emitted from the spectrometer and passed through a sample (sample S); a control unit (control unit 16) that calculates a first absorbance of the sample corresponding to the light of the first wavelength and a second absorbance of the sample corresponding to the light of the second wavelength based on the detection result of the detector; Equipped with the control unit calculates a corrected absorbance of the sample corresponding to the light of the first wavelength by correcting the first absorbance using the second absorbance. Spectroscopic analyzer (spectral analyzer 1).

[0048] This allows zero-point adjustment to be performed and correct absorbance to be measured by correcting the first absorbance at the specific wavelength using the second absorbance at another wavelength, even when measuring the absorbance at a specific wavelength for a sample over a long period of time.

[0049] [2] The control unit calculates the absorbance by subtracting the second absorbance from the first absorbance. The spectroscopic analyzer according to [1].

[0050] This makes it possible to easily calculate the absorbance of the sample by correcting the first absorbance.

[0051] [3] The second wavelength is a wavelength at which the second absorbance is closest to zero. The spectroscopic analyzer according to [2].

[0052] The wavelength of light at which the absorbance is closest to zero is hardly absorbed by the sample, and therefore is thought to have little relationship to changes in sample concentration over time. In other words, such fluctuations in light are due to fluctuations in the characteristics of the spectroscopic analyzer and / or environmental fluctuations, and are caused by fluctuations in the amount of light before passing through the sample, which is thought to be common to fluctuations in the first absorbance. Therefore, by selecting the wavelength at which the second absorbance is closest to zero as the wavelength at which the second absorbance is closest to zero to correct the first absorbance, accurate zero-point adjustment can be performed and the correct absorbance can be obtained.

[0053] [4] The control unit determines the first wavelength and the second wavelength based on a previously acquired absorption spectrum of the sample. The spectroscopic analyzer according to [1].

[0054] This allows the first wavelength and the second wavelength to be determined automatically, thereby reducing the burden on the user.

[0055] [5] successively acquiring the first absorbance and the second absorbance; The spectroscopic analyzer according to [1].

[0056] This allows the absorbance of the sample to be measured continuously.

[0057] [6] continuously acquiring the first absorbance and periodically acquiring the second absorbance; The spectroscopic analyzer according to [1].

[0058] This makes it possible to continuously measure the absorbance of the sample while reducing the amount of processing related to the calculation of the second absorbance.

[0059] [7] The control unit estimates a rate of change of the second absorbance based on a change in the second absorbance over a predetermined time period, and corrects the first absorbance using the rate of change. The spectroscopic analyzer according to [1].

[0060] This makes it possible to continuously measure the absorbance of the sample while reducing the amount of processing related to the calculation of the second absorbance.

[0061] [8] The spectrometer emits the light of the first wavelength and the light of the second wavelength to a reference sample; the detector detects the light at the first wavelength and the light at the second wavelength that have passed through the reference sample; the control unit calculates a first absorbance of the reference sample corresponding to the light of the first wavelength and a second absorbance of the reference sample corresponding to the light of the second wavelength based on the detection result of the detector. The spectroscopic analyzer according to [1].

[0062] This allows the reference sample to be processed in the same manner as the sample to be measured, and by performing calculations on the reference sample as well, the accuracy of the measurement can be improved.

[0063] [9] Light including at least a first wavelength and a second wavelength is emitted from a light source; splitting the light emitted from the light source into light of a first wavelength and light of a second wavelength; detecting the light of the first wavelength and the light of the second wavelength that have passed through the sample; calculating a first absorbance of the sample corresponding to the light of the first wavelength and a second absorbance of the sample corresponding to the light of the second wavelength based on the detection result; correcting the first absorbance using the second absorbance to calculate a corrected absorbance of the sample corresponding to the light of the first wavelength; Spectroscopic analysis method.

[0064] This allows zero-point adjustment to be performed and correct absorbance to be measured by correcting the first absorbance at the specific wavelength using the second absorbance at another wavelength, even when measuring the absorbance at a specific wavelength for a sample over a long period of time.

[0065]

[10] Emitting light including at least a first wavelength and a second wavelength from a light source; splitting the light emitted from the light source into light of a first wavelength and light of a second wavelength; detecting light at the first wavelength and light at the second wavelength that have passed through a sample; calculating a first absorbance of the sample corresponding to the light of the first wavelength and a second absorbance of the sample corresponding to the light of the second wavelength based on the detection result; calculating a corrected absorbance of the sample corresponding to the light of the first wavelength by correcting the first absorbance using the second absorbance; A spectroscopic analysis program that runs on a computer.

[0066] This allows zero-point adjustment to be performed and correct absorbance to be measured by correcting the first absorbance at the specific wavelength using the second absorbance at another wavelength, even when measuring the absorbance at a specific wavelength for a sample over a long period of time.

[0067] The present invention is not limited to the above-described embodiments, and can be appropriately modified, improved, etc. In addition, the material, shape, dimensions, numerical values, form, number, location, etc. of each component in the above-described embodiments are arbitrary and not limited as long as they can achieve the present invention. [Industrial Applicability]

[0068] The present invention is useful in the field of spectroscopic analysis, where measurements are carried out over long periods of time. [Explanation of symbols]

[0069] 1 Spectrometer 11 Light source 12 Spectrometer 13A Sample cell 13B Reference sample cell 14 Detector 15 A / D converter 16 Control Unit 17A Mirror 17B Mirror 20 Interface section 21 Control section 22 Display device R Reference Sample S sample

Claims

1. a light source that emits light including at least a first wavelength and a second wavelength; a spectroscope that separates the light emitted from the light source into light of a first wavelength and light of a second wavelength; a detector that detects the light of the first wavelength and the light of the second wavelength that have been emitted from the spectrometer and passed through a sample; a control unit that calculates a first absorbance of the sample corresponding to the light of the first wavelength and a second absorbance of the sample corresponding to the light of the second wavelength based on the detection result of the detector; Equipped with the control unit calculates a corrected absorbance of the sample corresponding to the light of the first wavelength by correcting the first absorbance using the second absorbance. Spectroscopic analyzer.

2. the control unit calculates the absorbance by subtracting the second absorbance from the first absorbance. The spectroscopic analyzer according to claim 1 .

3. the second wavelength is a wavelength at which the second absorbance is closest to zero; The spectroscopic analyzer according to claim 2 .

4. the control unit determines the first wavelength and the second wavelength based on an absorption spectrum of the sample acquired in advance. The spectroscopic analyzer according to claim 1 .

5. successively acquiring the first absorbance and the second absorbance; The spectroscopic analyzer according to claim 1 .

6. continuously acquiring the first absorbance and periodically acquiring the second absorbance; The spectroscopic analyzer according to claim 1 .

7. the control unit estimates a rate of change of the second absorbance based on a change in the second absorbance over a predetermined time period, and corrects the first absorbance using the rate of change. The spectroscopic analyzer according to claim 1 .

8. the spectrometer emits the light of the first wavelength and the light of the second wavelength onto a reference sample; the detector detects the light of the first wavelength and the light of the second wavelength that have passed through the reference sample; the control unit calculates a first absorbance of the reference sample corresponding to the light of the first wavelength and a second absorbance of the reference sample corresponding to the light of the second wavelength based on the detection result of the detector. The spectroscopic analyzer according to claim 1 .

9. Light including at least a first wavelength and a second wavelength is emitted from a light source; splitting the light emitted from the light source into light of a first wavelength and light of a second wavelength; detecting the light of the first wavelength and the light of the second wavelength that have passed through the sample; calculating a first absorbance of the sample corresponding to the light of the first wavelength and a second absorbance of the sample corresponding to the light of the second wavelength based on the detection result; correcting the first absorbance using the second absorbance to calculate a corrected absorbance of the sample corresponding to the light of the first wavelength; Spectroscopic analysis method.

10. emitting light including at least a first wavelength and a second wavelength from a light source; splitting the light emitted from the light source into light of a first wavelength and light of a second wavelength; detecting light at the first wavelength and light at the second wavelength that have passed through a sample; calculating a first absorbance of the sample corresponding to the light of the first wavelength and a second absorbance of the sample corresponding to the light of the second wavelength based on the detection result; calculating a corrected absorbance of the sample corresponding to the light of the first wavelength by correcting the first absorbance using the second absorbance; A spectroscopic analysis program that runs on a computer.

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