X-ray inspection apparatus

The X-ray inspection device simplifies control unit configuration by integrating data from both X-ray and item detection units, allowing efficient and synchronized generation of X-ray inspection images for quality determination.

JP2026014745APending Publication Date: 2026-01-29ISHIDA CO LTD
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Patent Information

Application Number
JP2024116165
Authority / Receiving Office
JP · JP
Patent Type
Applications
Current Assignee / Owner
Filing Date
2024-07-19
Publication Date
2026-01-29

AI Technical Summary

Technical Problem

Conventional X-ray inspection devices face complexity in control unit configuration due to the need for multiple processes involving object and X-ray detection results, making it difficult to determine the quality of objects with high detection levels.

Method used

The X-ray inspection device integrates a first control unit that acquires data from both X-ray and item detection units, generating inspection data that associates detection timing with X-ray results, allowing the second control unit to simplify the process of generating an X-ray inspection image and determining quality based on this data.

Benefits of technology

This configuration simplifies the control unit's complexity by enabling efficient generation of X-ray inspection images and accurate quality determination, even when using an item detection unit, while ensuring synchronized timing between detection results.

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Abstract

To provide an X-ray inspection device capable of simplifying the configuration of a control part for inspecting the quality of an article even when generating an X-ray inspection image based on the detection of an article detection part.SOLUTION: The X-ray inspection device 1 includes a conveyance unit 5, an article detection unit 9 configured to detect an article G, an X-ray irradiation unit 6, an X-ray detection unit 7, a first control unit 10 configured to generate first date D1 for generating an X-ray inspection image based on a detection result of an X-ray detected by the X-ray detection unit 7, and a second control unit 20 configured to determine quality of the article G based on the X-ray inspection image. The first control unit 10 acquires, in addition to the first data-item D1, a second data-item D2 that is information about a result of detection by the article-detecting portion 9, and generates a data-item D1 for inspection that includes a first area R1 for storing the first data-item D2 and a second area R2 for storing the second data-item D3. The second control unit 20 generates an X-ray inspection image based on the inspection image D3 generated by the first control unit 10.SELECTED DRAWING: Figure 3
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Description

[Technical Field]

[0001] One aspect of the present invention relates to an X-ray inspection apparatus. [Background technology]

[0002] There is known an X-ray inspection device that irradiates an object conveyed to an inspection area by a conveying unit with X-rays and detects the transmission state of the X-rays in an X-ray detection unit to determine whether the object contains foreign matter or whether the object has cracks or chips. Such an X-ray inspection device is equipped with a control unit (second control unit) that generates an X-ray inspection image based on the detection results of the X-rays detected by the X-ray detection unit and inspects the quality of the object. Here, in conventional X-ray inspection devices, when the detection level of X-rays detected by the X-ray detection unit becomes low, the control unit determines that the object to be inspected is passing through the inspection area and starts generating an X-ray inspection image. However, it may be difficult to determine, for example, that an object with a high detection level (low X-ray absorption) is passing through the inspection area based only on information about the detection level of X-rays.

[0003] To solve this problem, for example, the X-ray inspection device described in Patent Document 1 is provided with an article detection unit such as a photosensor, and determines whether an article to be inspected is passing through the inspection area based on the detection result from the article detection unit. In the X-ray inspection device described in Patent Document 1, the control unit generates an X-ray inspection image when it is determined that an article is passing through the inspection area based on the detection result sent from the X-ray detection unit. [Prior art documents] [Patent documents]

[0004] [Patent Document 1] Japanese Patent Application Laid-Open No. 2009-264837 Summary of the Invention [Problem to be solved by the invention]

[0005] However, the control unit of the above-mentioned conventional X-ray inspection device needs to perform multiple processes, such as a process of receiving both the object detection result sent from the object detection unit and the X-ray detection result (X-ray detection level) obtained from the X-ray detection unit, a process of correlating the object detection timing with the X-ray detection result, a process of generating an X-ray inspection image from data generated based on this process, and a process of inspecting the quality of the object based on the X-ray inspection image, etc. This makes the configuration of the control unit that inspects the quality of the object complex.

[0006] Therefore, an object of one aspect of the present invention is to provide an X-ray inspection device that can simplify the configuration of the control unit that inspects the quality of an item, even when an X-ray inspection image is generated based on detection by the item detection unit. [Means for solving the problem]

[0007] (1) An X-ray inspection device according to one aspect of the present invention comprises a conveying unit that conveys an item, an item detection unit that detects the item being conveyed by the conveying unit, an X-ray irradiation unit that irradiates the item with X-rays, an X-ray detection unit that detects the X-rays, a first control unit that generates first data for generating an X-ray inspection image based on the detection results of the X-rays detected by the X-ray detection unit, and a second control unit that controls the conveying unit and the X-ray irradiation unit and determines whether the item is good or bad based on the X-ray inspection image, wherein the first control unit acquires second data that is information regarding the detection results by the item detection unit in addition to the first data, and generates inspection data that includes a first area that stores the first data and a second area that stores the second data, and the second control unit generates an X-ray inspection image based on the inspection data generated by the first control unit.

[0008] In an X-ray inspection apparatus with this configuration, the first control unit, which acquires first data for generating an X-ray inspection image based on the detection results of X-rays detected by the X-ray detection unit, receives second data, which is information regarding the detection results by the item detection unit, in addition to the first data. Furthermore, the first control unit generates inspection data that associates the detection timing of the item with the detection results of X-rays acquired by the X-ray detection unit. As a result, the second control unit only needs to perform a process of generating an X-ray inspection image based on the inspection data and a process of determining whether the item is good or bad based on the X-ray inspection image. This allows the configuration of the control unit (second control unit) that inspects the quality of the item to be simplified even when an X-ray inspection image is generated based on detection by the item detection unit.

[0009] (2) In the X-ray inspection apparatus described above in (1), the first control unit may acquire the second data by receiving the second data transmitted from the article detection unit. In this configuration, the first control unit can easily acquire the second data.

[0010] (3) In the X-ray inspection device described in (1) or (2) above, the second control unit may generate an X-ray inspection image based on the first data when the second data of the inspection data transmitted from the first control unit is information indicating that an object has been detected by the object detection unit. With this configuration, an X-ray inspection image consisting of the minimum amount of data required can be generated.

[0011] (3) In any one of the X-ray inspection devices (1) to (3) above, the article detection unit may be configured to be able to detect the presence or absence of articles in each of a plurality of regions divided in a width direction perpendicular to the article transport direction. With this configuration, for example, even when articles are transported in a state where multiple articles are arranged in the width direction, the transport state of the articles can be accurately detected and an image appropriate for performing inspection can be generated. [Effects of the Invention]

[0012] According to one aspect of the present invention, even when an X-ray inspection image is generated based on detection by an article detection unit, the configuration of a control unit that inspects the quality of an article can be simplified. [Brief explanation of the drawings]

[0013] [Figure 1] FIG. 1 is a configuration diagram of an X-ray inspection apparatus according to an embodiment. [Figure 2] FIG. 2 is a schematic diagram showing the internal configuration of the shielding box shown in FIG. [Figure 3] FIG. 3 is a block diagram of an X-ray inspection apparatus according to one embodiment. [Figure 4] FIG. 4 is a block diagram showing a functional configuration of the second control unit of FIG. [Figure 5] FIG. 5 is a diagram illustrating an example of the configuration of data output from the first control unit to the second control unit. [Figure 6] FIG. 6 is a diagram schematically showing the configuration of test data generated by the first control unit according to a modified example and how the test data is acquired. [Figure 7] 7(A) to 7(C) are examples of X-ray inspection images generated by an X-ray inspection apparatus according to a modified example. DETAILED DESCRIPTION OF THE INVENTION

[0014] An X-ray inspection apparatus 1 according to one embodiment will be described below with reference to the drawings. In the description of the drawings, the same elements are given the same reference numerals, and duplicated description will be omitted.

[0015] 1, the X-ray inspection apparatus 1 includes an apparatus main body 2, support legs 3, a shielding box 4, a conveying unit 5, an X-ray irradiation unit 6, an X-ray detection unit 7, an article detection unit 9, a display operation unit 8, a first control unit 10, and a second control unit 20. The X-ray inspection apparatus 1 generates an X-ray transmission image of the article G while conveying the article G, and inspects the article G based on the X-ray transmission image. The article G before inspection is carried into the X-ray inspection apparatus 1 by a carry-in conveyor 51. The article G after inspection is carried out of the X-ray inspection apparatus 1 by a carry-out conveyor 52.

[0016] The device main body 2 houses the second control unit 20 and the like. The support legs 3 support the device main body 2. The shielding box 4 is provided on the device main body 2. The shielding box 4 is a housing that prevents leakage of X-rays (electromagnetic waves) to the outside. Inside the shielding box 4 is provided an inspection room R where inspection of items G is carried out using X-rays. The shielding box 4 is formed with an entrance 4a and an exit 4b. Items G before inspection are carried into the inspection room R from the entrance 4a on the carry-in conveyor 51. After inspection, the items G are carried out from the inspection room R to the exit conveyor 52 via the exit 4b.

[0017] The conveying unit 5 is a member that conveys the article G, and is disposed so as to penetrate the center of the shielding box 4. The conveying unit 5 conveys the article G in the conveying direction A from the entrance 4a through the inspection room R to the exit 4b. The speed (conveying speed) at which the article G is conveyed by the conveying unit 5 is set, for example, by the second control unit 20. The conveying unit 5 is, for example, a belt conveyor stretched between the entrance 4a and the exit 4b. Note that the conveying unit 5 may protrude outward beyond the entrance 4a and the exit 4b.

[0018] As shown in Figures 1 and 2, the X-ray irradiation unit 6 is an electromagnetic wave irradiation unit located within the shielding box 4, and irradiates the object G transported by the transport unit 5 with X-rays. The X-rays include X-rays in various energy ranges, from low energy (long wavelength) to high energy (short wavelength). Therefore, the X-ray irradiation unit 6 irradiates the object G transported by the transport unit 5 with X-rays in multiple energy ranges. Note that the terms "low" and "high" in the above-mentioned terms "low energy" and "high energy" indicate relatively "low" and "high" within the multiple energy ranges irradiated by the X-ray irradiation unit 6, and do not indicate a specific range. Furthermore, the power (particularly, current) supplied to the X-ray irradiation unit 6 can be changed manually or automatically. By changing the power, the output of the X-rays irradiated to the object G can be changed. This allows X-rays with an appropriate intensity to be irradiated to the object G.

[0019] The X-ray detection unit 7 detects electromagnetic waves. The X-ray detection unit 7 is disposed inside the shielding box 4 at a position facing the X-ray irradiation unit 6 in the vertical direction. The transport unit 5 is positioned between the X-ray detection unit 7 and the X-ray irradiation unit 6 in the vertical direction. The X-ray detection unit 7 has a plurality of detection elements 7A arranged at least in a width direction perpendicular to (intersecting with) the transport direction A of the transport unit 5.

[0020] The X-ray detection unit 7 outputs data (hereinafter also referred to as "detection value") corresponding to the X-ray dose detected in each detection element 7A to the first control unit 10. The X-ray detection unit 7 may be a direct conversion type detection unit capable of detecting X-rays by a photon counting method. In this case, electron-hole pairs are generated in each detection element 7A when, for example, an X-ray photon reaches the element. Photon counting (photon counting) is performed based on the energy (photon energy) obtained at this time. The counting process is performed by, for example, the first control unit 10.

[0021] The detection elements 7A of the X-ray detection unit 7 may be, for example, a sensor (multi-energy sensor) that detects X-rays in each of a plurality of energy ranges that pass through the article G. For example, each detection element 7A of the X-ray detection unit 7 may classify the photon energy of the detected X-rays into two or more energy ranges based on an arbitrary threshold. In this case, the X-ray detection unit 7 becomes capable of photon counting in each energy range. The arbitrary threshold is, for example, one or more values ​​(unit: keV) set by the second control unit 20. The arbitrary threshold may be set, for example, by the method described in JP 2023-132587 A, or may be set using a bright level.

[0022] The X-ray detection unit 7 may be provided with, for example, a detection element 7A for each of a plurality of energy ranges of X-rays that pass through the article G. For example, a detection element 7A dedicated to the low energy band that detects X-rays in the low energy band irradiated by the X-ray irradiator 6, and a detection element 7A dedicated to the high energy band that detects X-rays in the high energy band may be provided. Furthermore, the X-ray detection unit 7 may be a time delay integration sensor (TDI sensor) having a plurality of detection elements 7A arranged in both the conveying direction A of the conveyor 5 and in the width direction perpendicular to the conveying direction A.

[0023] The article detection unit 9 detects the article G conveyed by the conveying unit 5. In this embodiment, the article detection unit 9 is a photoelectric sensor. A light-emitting unit 9A and a light-receiving unit 9B constituting the photoelectric sensor are arranged to face each other in the width direction of the conveying unit 5. The light-receiving unit 9B detects the amount of light received from the light-emitting unit 9A toward the light-receiving unit 9B and transmits the detected amount to the first control unit 10. Note that instead of a photoelectric sensor, the article detection unit 9 may employ an ultrasonic sensor, a capacitance-type proximity sensor, a laser-type displacement sensor, or an imaging device such as a camera. In this embodiment, the article detection unit 9 is arranged upstream of the positions where the X-ray irradiation unit 6 and the X-ray detection unit 7 are arranged in the conveying direction of the conveying unit 5. More specifically, the article detection unit 9 is arranged near the inlet 4a of the shielding box 4 (for example, slightly inside the outlet 4b of the shielding box 4).

[0024] The first control unit 10 generates first data D1 for generating an X-ray inspection image based on the detection results of X-rays detected by the X-ray detection unit 7. The first data D1 generated by the first control unit 10 may be raw data detected by the X-ray detection unit 7, or may be processed data obtained by processing the raw data by the first control unit 10. For example, if the X-ray detection unit 7 is a line sensor arranged in one direction, the first data D1 may be generated based on a plurality of detection values ​​(raw data) detected by each of a plurality of detection elements 7A arranged in a row. For example, if the X-ray detection unit 7 is a TDI sensor, the first data D1 may be generated based on the detection value (raw data) of each of the detection elements 7A arranged in a row in the transport direction A, or the first data D1 may be generated based on an integrated value (processed data) of the detection values ​​of each of the detection elements 7A arranged in a row in the transport direction A.

[0025] The first control unit 10 acquires second data D2, which is information relating to the detection result by the item detection unit 9. The first control unit 10 acquires the second data D2 by receiving the second data D2 transmitted from the item detection unit 9. For example, the second data D2 is information "1" that is output when an item G transported by the transport unit 5 is detected by the item detection unit 9, and information "0" that is output when the item G is not detected by the item detection unit 9. The first control unit 10 generates inspection data D3 that includes a data area (first area) R1 that stores the first data D1, and a header area (second area) R2 that stores the second data D2 (see FIG. 5).

[0026] When an article G is detected by the article detection unit 9, the first control unit 10 calculates the time (adjustment time) required for the article G to travel from the detection position of the article detection unit 9 to the X-ray irradiation area of ​​the X-ray irradiation unit 6, based on the conveying speed of the conveying unit 5. After receiving the detection result from the article detection unit 9 as second data D2, the first control unit 10 associates the detection value received from the X-ray detection unit 7 when the adjustment time has elapsed with the second data D2 as first data D1. As shown in FIG. 3 , the first control unit 10 generates inspection data D3 by associating the first data D1 with the second data D2. The first control unit 10 transmits the inspection data D3 generated in this manner to the second control unit 20.

[0027] The first control unit 10 is composed of a CPU (Central Processing Unit), ROM (Read Only Memory), RAM (Random Access Memory), FPGA (Field Programmable Gate Array), etc. The first control unit 10 may be unitized together with the X-ray detection unit 7 in the same housing. Furthermore, the X-ray detection unit 7 and the first control unit 10 may be arranged on the same board.

[0028] As shown in FIG. 1, the display operation unit 8 is provided in the device main body 2. The display operation unit 8 displays various information and accepts input operations of various conditions from the outside. The display operation unit 8 is, for example, a liquid crystal display, and displays an operation screen as a touch panel. In this case, the operator can input various conditions via the display operation unit 8. For example, the operator can set the transport speed of the transport unit 5, the power (at least one of current and voltage) supplied to the X-ray irradiation unit 6, etc. via the display operation unit 8. The input operations accepted by the display operation unit 8 are output to the transport unit 5, the X-ray detection unit 7, the second control unit 20, etc.

[0029] The second control unit 20 is disposed inside the device main body 2. The second control unit 20 controls the operation of each unit of the X-ray inspection device 1. For example, the second control unit 20 controls the conveying unit 5 and the X-ray irradiation unit 6, and determines whether the item G is good or bad based on the generated X-ray inspection image. The second control unit 20 is composed of a CPU (Central Processing Unit), ROM (Read Only Memory), RAM (Random Access Memory), etc. The ROM stores a program for controlling the X-ray inspection device 1, the operating mode of the X-ray inspection device 1, etc.

[0030] As shown in FIG. 4, the second control unit 20 includes a receiving unit 21, an image generating unit 22, an inspecting unit 23, a determining unit 24, an output unit 25, and a recording unit 26.

[0031] The receiving unit 21 receives an input operation accepted by the display operation unit 8. The receiving unit 21 receives, for example, the conveying speed of the conveying unit 5 set via the display operation unit 8. The receiving unit 21 also receives inspection data D3 output from the first control unit 10. The receiving unit 21 transmits the inspection data D3 to the image generation unit 22.

[0032] The image generation unit 22 is mainly composed of, for example, a GPU (Graphics Processing Unit) and generates an image based on the first data D1 included in the inspection data D3. For example, the image generation unit 22 renders the first data D1 included in the inspection data D3 into a two-dimensional image in memory. The memory in which the two-dimensional image is rendered may be, for example, a memory included in the GPU, but is not limited to this. The image generation unit 22, for example, reads out the detection results output from at least some of the multiple detection elements 7A included in the X-ray detection unit 7 at a predetermined readout interval to generate an X-ray inspection image used for inspecting the item G. The image generation unit 22 may generate an X-ray inspection image by generating multiple time delay integrated images generated in a similar manner. For example, the image generation unit 22 may generate a plurality of transmission images for each of the multiple energy regions and generate one or more difference images from the multiple transmission images to generate an X-ray inspection image.

[0033] If the second data D2 of the inspection data D3 sent from the first control unit 10 is information indicating that there has been detection by the item detection unit 9, i.e., if the header region R2 contains "1," which is information indicating that there has been detection by the item detection unit 9, the image generation unit 22 generates an X-ray inspection image based on the first data D1 contained in the data region R1 stored in association with the header region R2. In other words, even if the image generation unit 22 receives inspection data D3 from the first control unit 10, if the header region R2 of the received inspection data D3 does not contain "1," which is information indicating that there has been detection by the item detection unit 9, the inspection data D3 is not used for forming an image or is discarded.

[0034] The image generation unit 22 may use, for example, an image processing algorithm or a program automatically set by machine learning. The image processing algorithm is composed of one image processing filter or a combination of multiple image processing filters. At least one of the multiple image processing algorithms can be automatically generated from multiple image processing filters based on the specifications of the X-ray inspection apparatus 1, the inspection conditions, etc., by employing a genetic algorithm (GA), which is a method that applies the mechanisms of heredity and evolution in the biological world. At least some of the multiple image processing algorithms can also be appropriately set by an operator via the display operation unit 8. The program automatically set by machine learning is a predictive model (trained model) generated by machine learning, and is an inference program incorporating parameters obtained as a result of machine learning (trained parameters). Examples of machine learning used for the trained model include neural networks, support vector machines, and genetic algorithms.

[0035] The inspection unit 23 inspects the item G based on the image generated by the image generation unit 22. For example, the inspection unit 23 inspects the item G using the multiple transmission images, the differential image, etc. The inspection unit 23 may inspect the item G based on both the differential image and the transmission image. The item G may be inspected based on the transmission image, etc. while the differential image is being generated by the image generation unit 22. The inspection unit 23 inspects the item G for, for example, the presence or absence of foreign matter, cracks, chips, etc., but is not limited to this. When the item G is wrapped in a sheet-like packaging material, the inspection unit 23 may also inspect for tears in the packaging material, poor sealing of the packaging material (seal bite), etc. When the item G is contained in a package, the inspection unit 23 may perform a foreign matter check, a missing item check, a number of items contained, a hollow check, etc., within the package. The inspection unit 23 transmits the inspection results of the item G to the determination unit 24 and the recording unit 26.

[0036] The determination unit 24 determines whether the item G is good or bad based on the inspection results received from the inspection unit 23. For example, the determination unit 24 determines whether there is any foreign matter in the item G, whether there is any crack or chip in the item G, etc. The determination unit 24 transmits the determination results to the output unit 25 and the recording unit 26.

[0037] The output unit 25 outputs the determination result of the determination unit 24 to at least one of a portion of the X-ray inspection apparatus 1 other than the second control unit 20 and a device different from the X-ray inspection apparatus 1. This allows at least one of the X-ray inspection apparatus 1 and a device different from the X-ray inspection apparatus 1 (for example, a sorting device arranged downstream of the X-ray inspection apparatus 1) to perform an operation when the item G is a defective product. Other examples of the device different from the X-ray inspection apparatus 1 include an input conveyor 51, an output conveyor 52, an alarm device, etc.

[0038] The recording unit 26 records signals, data, etc. generated by the second control unit 20. For example, the recording unit 26 records the detection results transmitted from the receiving unit 21, image data transmitted from the image generating unit 22, data related to the inspection results transmitted from the inspecting unit 23, and data related to the judgment results transmitted from the judging unit 24.

[0039] The effects of the X-ray inspection apparatus 1 of the above embodiment will be described. In a conventional X-ray inspection apparatus equipped with an article detection unit 9, the control unit generates an X-ray inspection image when it is determined that an article is passing through the inspection area based on the detection results transmitted from the X-ray detection unit. However, the control unit of the above conventional X-ray inspection apparatus must perform multiple processes, such as receiving both the article detection results transmitted from the article detection unit and the X-ray detection results (X-ray detection level) obtained from the X-ray detection unit, associating the article detection timing with the X-ray detection results, generating an X-ray inspection image from data generated based on this process, and inspecting the quality of the article based on the X-ray inspection image. This results in a complex configuration for the control unit that inspects the quality of the article.

[0040] In contrast to such conventional X-ray inspection apparatuses, in the X-ray inspection apparatus 1 of the above embodiment, the first control unit 10 acquires first data D1 for generating an X-ray inspection image based on the detection results of X-rays detected by the X-ray detection unit 7, and also receives second data D2, which is information regarding the detection results by the article detection unit 9, in addition to the first data D1. Furthermore, the first control unit 10 generates inspection data D3 that associates the detection timing of the article G with the detection results of the X-rays acquired by the X-ray detection unit 7. As a result, the second control unit 20 only needs to perform a process of generating an X-ray inspection image based on the inspection data D3 and a process of determining the quality of the article based on the X-ray inspection image. This makes it possible to simplify the configuration of the second control unit 20 that inspects the quality of the article G even when an X-ray inspection image is generated based on detection by the article detection unit 9.

[0041] Furthermore, in the conventional X-ray inspection apparatus described above, the detection result of the article G (second data D2) is transmitted from the article detection unit 9 to the second control unit 20, and the detection value (first data D1) by the detection element 7A is transmitted to the second control unit 20 via the first control unit 10. Therefore, unlike the X-ray inspection apparatus 1 of the above embodiment, the first data D1 and the second data D2 are associated by the second control unit 20, rather than by the first control unit 10. In this case, when synchronizing the timing between the X-ray detection result and the article detection result, it is necessary to consider not only the time (adjustment time) it takes from the detection position by the article detection unit 9 to the X-ray irradiation area by the X-ray irradiation unit 6, but also communication delay time between the first control unit 10 and the second control unit 20. Therefore, it becomes difficult for the second control unit 20 to synchronize the timing between the X-ray detection result and the article detection result. If this timing is misaligned, there is a risk that the image will not be appropriate for performing inspection.

[0042] In this regard, in the X-ray inspection apparatus 1 of the above embodiment, the first control unit 10 acquires both the first data D1 and the second data D2. Furthermore, when associating the first data D1 with the second data D2, the first control unit 10 only needs to consider the above-mentioned adjustment time (no need to consider communication delay time), so it is easier to match (synchronize) the timing between the X-ray detection results and the object detection results compared to conventional X-ray inspection apparatuses. Therefore, it becomes possible to appropriately generate X-ray inspection images for performing inspection.

[0043] In the X-ray inspection apparatus 1 of the above embodiment, the first control unit 10 acquires the second data D2 by receiving the second data D2 transmitted from the article detection unit 9. In this configuration, the first control unit 10 can easily acquire the second data D2.

[0044] In the X-ray inspection apparatus 1 of the above embodiment, the second control unit 20 generates an X-ray inspection image based on the first data D1 when the second data D2 of the inspection data D3 sent from the first control unit 10 is information indicating that there has been detection by the item detection unit 9. This configuration makes it possible to generate an X-ray inspection image consisting of the minimum necessary amount of data. In other words, when acquiring the item G to be inspected, it is possible to avoid forming images that are not included in the item G before or after it in the conveying direction A.

[0045] Although one embodiment has been described above, one aspect of the present invention is not limited to the above embodiment, and various modifications are possible without departing from the spirit of the invention.

[0046] (Variation 1) In the X-ray inspection apparatus 1 of the above embodiment, an example has been described in which the article detection unit 9 is configured to be able to detect the presence or absence of an article G in the entire widthwise region, in other words, an example has been described in which the article detection unit 9 is able to detect the article G being transported by the transport unit 5 but is unable to determine where in the widthwise direction the article G is being transported. However, this is not limiting. For example, the article detection unit 9 may be configured to be able to detect the presence or absence of an article G in each of a plurality of regions divided in the widthwise direction in the transport unit 5. For example, in the case where two article detection units 9, 9 are provided to detect an article G being transported to a first region A1 and a second region A2 divided in the widthwise direction in the transport unit 5, the presence or absence of an article G in the first region A1 and the second region A2 can be detected.

[0047] Here, we will mainly use Figures 6 and 7 to explain the inspection data D3A generated by the first control unit 10 in an X-ray inspection device 1 related to variant example 1, in which two item detection units 9, 9 are provided to detect items G transported to a first area A1 and a second area A2 that are divided into two in the width direction in the transport unit 5. We will also explain how an X-ray inspection image is generated when three items G1 to G3 are transported.

[0048] FIG. 6 shows the configuration of the inspection data D3A generated by the first control unit 10 according to the first modification. In FIG. 6, the inspection data D3A are arranged chronologically from top to bottom, with the oldest inspection data D3A listed first. The squares in the first area A1 and the second area A2 indicate areas in which the detection values ​​D11 and D12 obtainable from one detection element 7A are stored. FIG. 6 also shows a schematic diagram of how the inspection data D3A is obtained. Specifically, it shows an image of data acquisition by the article detection unit 9 and the detection elements 7A when articles G1 to G3 are transported. Note that the number of detection elements 7A and the size relationship between the detection elements 7A and the articles G1 to G3 shown in FIGS. 6 and 7 do not necessarily match those of the X-ray inspection apparatus 1 according to the first modification.

[0049] In the X-ray inspection apparatus 1 according to the first modification, the first control unit 10 generates inspection data D3A. Specifically, the first control unit 10 generates inspection data D3A including a data region R1 for storing first data D1A and a header region R2 for storing second data D2A, similar to the inspection data D3 generated by the first control unit 10 of the X-ray inspection apparatus 1 in the above embodiment.

[0050] The first data D1A includes a detection value D11 detected by the detection element 7A arranged in the first region A1 and a detection value D12 detected by the detection element 7A arranged in the second region A2. The second data D2A includes information D21 regarding the presence or absence of an item G transported through the first region A1 and information D22 regarding the presence or absence of an item G transported through the second region A2. The second data D2A is information "1" that is output when an item G transported by the transport unit 5 is detected by the item detection unit 9, and information "0" that is output when an item G is not detected by the item detection unit 9.

[0051] The second control unit 20 forms an X-ray inspection image based on the inspection data D3A as shown in FIG. 6. The second control unit 20 generates an X-ray inspection image for each divided area (first area A1 and second area A2). Specifically, when generating an X-ray inspection image of an item G being transported to the first area A1, the second control unit 20 generates the X-ray inspection image based on the detection value D11 detected by the detection element 7A arranged in the first area A1, which is included in the first data D1A, when information D21 regarding the presence or absence of an item G being transported through the first area A1, which is included in the second data D2A, is "1". The X-ray inspection images of items G1 and G3 generated in this manner are shown in FIGS. 7(A) and 7(C).

[0052] Furthermore, when generating an X-ray inspection image of the article G being transported to the second area A2, the second control unit 20 generates the X-ray inspection image based on the detection value D12 detected by the detection element 7A arranged in the second area A2, which is included in the first data D1A, when the information D22 regarding the presence or absence of the article G being transported through the second area A2, which is included in the second data D2A, is "1." The X-ray inspection image of the article G2 generated in this manner is shown in FIG. 7(B).

[0053] In the configuration of the above variant example 1, even when items G are transported in a state where multiple items are arranged in the width direction, the transport state of the items G can be accurately detected and an appropriate X-ray inspection image can be generated for performing the inspection.

[0054] (Other variations) In the above embodiment and modified example, an example has been described in which the article detection unit 9 is arranged upstream of the positions at which the X-ray irradiator 6 and the X-ray detector 7 are arranged in the conveying direction A of the conveying unit 5, but the article detection unit 9 may be arranged at the same position as the X-ray irradiator 6 and the X-ray detector 7, or may be arranged downstream of the positions at which the X-ray irradiator 6 and the X-ray detector 7 are arranged. In this case as well, the first control unit 10 may associate the second data D2 with the first data D1 to generate the inspection data D3, taking into account the time (adjustment time) from when the article G reaches the X-ray irradiation area by the X-ray irradiator 6 to when the article G is detected by the article detection unit 9.

[0055] In the above embodiment and modified example, an example has been described in which the first control unit 10 associates the second data D2 of the detection result received from the article detection unit 9 with the first data D1 of the detection value received from the X-ray detection unit 7, taking into account the time (adjustment time) until the article G is detected by the article detection unit 9. However, the second control unit 20, rather than the first control unit 10, may take into account the adjustment time and generate an X-ray inspection image based on the first data D1 and the second data D2 to inspect the article G. Even in this case, there is no need to take into account communication delay times between the first control unit 10 and the second control unit 20, etc.

[0056] In the above embodiment, an example was given in which the area for storing the second data D2 (D2A) is stored as the header area R2 of the inspection data D3, but it may also be configured to be stored in the area of ​​the data area R1 as long as it is associated with the area in which the data area R1 is stored. [Explanation of symbols]

[0057] 1...X-ray inspection device, 5...transport unit, 6...X-ray irradiation unit, 7...X-ray detection unit, 7A...detection element, 8...display operation unit, 9...item detection unit, 10...first control unit, 20...second control unit, A1...first area, A2...second area, D1, D1A...first data, D2, D2A...second data, D3, D3A...inspection data, G, G1 to G3...items, R1...data area (first area), R2...header area (second area).

Claims

1. a conveying unit that conveys the article; an article detection unit that detects the article being transported by the transport unit; an X-ray irradiation unit that irradiates the object with X-rays; an X-ray detection unit that detects the X-rays; a first control unit that generates first data for generating an X-ray inspection image based on a detection result of the X-rays detected by the X-ray detection unit; a second control unit that controls the conveying unit and the X-ray irradiation unit and determines whether the article is good or bad based on the X-ray inspection image, the first control unit acquires second data, which is information regarding a detection result by the object detection unit, in addition to the first data, and generates inspection data including a first area for storing the first data and a second area for storing the second data; The second control unit generates the X-ray inspection image based on the inspection data generated by the first control unit.

2. The X-ray inspection apparatus according to claim 1 , wherein the first control unit acquires the second data by receiving the second data transmitted from the object detection unit.

3. 3. The X-ray inspection device according to claim 1, wherein the second control unit generates the X-ray inspection image based on the first data when the second data of the inspection data transmitted from the first control unit is information indicating that detection has been performed by the object detection unit.

4. 3. The X-ray inspection apparatus according to claim 1, wherein the object detector is configured to be able to detect the presence or absence of the object in each of a plurality of regions divided in a width direction perpendicular to the direction of transport of the object.

Citation Information

Patent Citations

  • X-ray inspection device

    JP2009264837A