Mu-on inspection device and mu-on inspection method

Abstract

To accurately determine the installation position of a muon track detector.SOLUTION: A muon inspection device 10 for evaluating a property of a measurement target 1 using a muon μ includes a muon track detector 11 installed below or beside the measurement target 1 and configured to measure the muon μ passing through the measurement target 1 to detect a muon track, a guide 12 fixedly installed at a measurement site, and a contact part 13 provided in the muon track detector 11 and serving as a setting means for installing the muon track detector 11 at a set position based on the guide 12.SELECTED DRAWING: Figure 1

Description

[Technical Field]

[0001] FIELD Embodiments of the present invention relate to a muon inspection apparatus and a muon inspection method. [Background technology]

[0002] Conventionally, methods used to survey underground conditions from above ground include ground-penetrating radar, resistivity tomography, and seismic tomography. Ground-penetrating radar is practically unsuitable for detection at depths of more than 5m due to the scattering and absorption of electromagnetic waves underground. Furthermore, resistivity tomography and seismic tomography require the excavation of numerous boreholes. With either measurement method, the number of measurement points available is limited in urban areas where there are many above-ground structures and underground buried objects, making it difficult to cover the entire target area.

[0003] Meanwhile, a known technique for imaging the inside of measurement targets, such as underground water veins, is a radiography technique that uses charged particles such as cosmic ray muons. Cosmic ray muons (hereafter referred to as "muons") have a stronger penetrating power than X-rays and other radiation, and pass through materials while gradually losing energy. Therefore, the properties of the measurement target can be estimated from the distribution of the direction of arrival of muons and their changes over time.

[0004] Charged particles such as muons that originate in space have extremely high energy and penetrating power, and are therefore used as an imaging method for large structures such as volcanoes and pyramids. Other proposed methods include installing a muon track detector in a tunnel to measure changes in muon flux due to the thickness of the earth cover to detect underground properties, and performing tomography analysis by measuring the angular distribution of muons with a muon track detector installed underground. Large structures such as buildings are also targets for muon measurement. [Prior art documents] [Patent documents]

[0005] [Patent Document 1] Japanese Patent Application Laid-Open No. 2010-271059 [Patent Document 2] Japanese Patent Application Laid-Open No. 2002-106291 [Patent Document 3] Japanese Patent Application Laid-Open No. 2011-202356 [Patent Document 4] International Publication No. 2011 / 058911 [Non-patent literature]

[0006] [Non-Patent Document 1] EP George, Commonwealth Engineer, 455 (July 1, 1955). Summary of the Invention [Problem to be solved by the invention]

[0007] However, when repeating the above-mentioned muon measurements multiple times over a long period of time, the reproducibility of the installation position and gradient of the muon track detector becomes an issue. While a method using the Global Positioning System (GPS) could be considered for determining the installation position, this is inappropriate because muon detection is carried out in places where radio waves cannot reach, such as underground or indoors. Furthermore, muon track detectors tend to become larger in size in order to increase the number of measurements. Therefore, the challenge is to install large muon track detectors accurately in the same position and orientation, while still being able to work efficiently.

[0008] The embodiments of the present invention have been made in consideration of the above circumstances, and have an object to provide a muon inspection device that can accurately determine the installation position of a muon trajectory detector.

[0009] Another object of the embodiments of the present invention is to provide a muon inspection device and a muon inspection method that can three-dimensionally evaluate the properties of a measurement target.

[0010] It is still another object of the embodiments of the present invention to provide a muon inspection device and a muon inspection method that are capable of evaluating changes over time in the properties of a measurement target. [Means for solving the problem]

[0011] A muon inspection device in an embodiment of the present invention is a muon inspection device that evaluates the properties of a measurement object using muons, and is characterized by comprising a muon trajectory detector that is installed below or to the side of the measurement object and measures muons passing through the measurement object to detect muon trajectories, a guide that is fixedly installed at the measurement site, and setting means that is provided on the muon trajectory detector and sets the muon trajectory detector at a set position based on the guide.

[0012] A muon inspection method in an embodiment of the present invention is a muon inspection method for evaluating the properties of a measurement object using muons, characterized in that the muon inspection device described in the embodiment is prepared, and when muon trajectory detectors are installed at at least two set positions by a setting means to measure muons and detect muon trajectories, the properties of the measurement object are evaluated three-dimensionally based on analysis data of the muons and the distance between the installation positions of the muon trajectory detectors.

[0013] A muon inspection method in an embodiment of the present invention is a muon inspection method for evaluating the properties of a measurement object using muons, characterized in that the muon inspection apparatus described in the embodiment is prepared, a muon trajectory detector is set at a set position by a setting means, muons are measured at different times, and muon trajectories are detected, and then changes over time in the properties of the measurement object are evaluated based on the muon analysis data, the muon measurement times, and the installation position of the muon trajectory detector. [Effects of the Invention]

[0014] According to the embodiment of the present invention, the installation position of the muon trajectory detector can be determined with high accuracy. [Brief explanation of the drawings]

[0015] [Figure 1] FIG. 1 is a perspective view showing a schematic configuration of a muon inspection device according to a first embodiment. [Figure 2] FIG. 2 is a front view showing the muon inspection device of FIG. 1. [Figure 3] FIG. 2 is a front view showing a muon inspection device according to a modified example of the first embodiment. [Figure 4] FIG. 10 is a perspective view showing a schematic configuration of a muon inspection device according to a second embodiment. [Figure 5] FIG. 10 is a perspective view showing the schematic configuration of a muon inspection device according to a third embodiment. [Figure 6] FIG. 10 is a perspective view showing a schematic configuration of a muon inspection device according to a fourth embodiment. [Figure 7] 7 is a graph showing the evaluation results obtained by the muon inspection device of FIG. 6. DETAILED DESCRIPTION OF THE INVENTION

[0016] Hereinafter, an embodiment of the present invention will be described with reference to the drawings. [A] First embodiment (Figs. 1 to 3) Fig. 1 is a perspective view showing a schematic configuration of a muon inspection device according to a first embodiment. Fig. 2 is a front view showing the muon inspection device of Fig. 1. The muon inspection device 10 shown in Figs. 1 and 2 measures muons μ, which are charged particles passing through a measurement target 1, and evaluates the properties of the measurement target 1 from the direction and amount of the muons μ coming from the measurement target 1. The muon inspection device 10 includes a muon trajectory detector 11, a guide 12, a contact unit 13 (Fig. 2) and a relative position measurement unit 14 (Fig. 3) as setting means, a moving mechanism 15, and a fixing mechanism 16 as fixing means. Here, the measurement target 1 is the ground or a large structure such as a building.

[0017] The muon trajectory detector 11 is installed below or to the side of the measurement target 1 and detects muon trajectories by measuring muons μ passing through the measurement target 1 within the measurement region P. The muon trajectory detector 11 can be any device capable of measuring muons, which are charged particles, on a particle-by-particle basis. It can be configured by stacking muon detectors, such as drift tube detectors using ionized gas, multi-wire detectors, GEM (Gas Electron Multiplier) detectors (gas detectors), scintillation detectors, silicon detectors, or photographic plates. This muon trajectory detector 11 has at least two layers of layered detection surfaces, on which the above-mentioned muon detectors are arranged in a row. The muon trajectory detector 11 can be any detection device or has any external shape; in particular, a device that can identify the position in two orthogonal directions with a single muon trajectory detector 11 is applicable.

[0018] The guide 12 is fixedly installed at the measurement site of muon μ and may be, for example, a rail-shaped guide 12R (Fig. 1 and Fig. 2) or a line-shaped guide 12L (Fig. 3) as a marker applied (painted) to the surface of the measurement site. These guides 12 (12R, 12L) may or may not have coordinate information such as a scale attached to them.

[0019] The rail-shaped guide 12R is placed below the muon trajectory detector 11, but it may also be placed above the muon trajectory detector 11 to suspend the muon trajectory detector 11. Furthermore, the line-shaped guide 12L may be installed on the ceiling above the muon trajectory detector 11 or on a wall surface on the side, as shown in FIG.

[0020] As shown in FIGS. 2 and 3, the moving mechanism 15 is a wheel (for example, a drive wheel), and moves the muon trajectory detector 11 by being attached to the muon trajectory detector 11 and grounded at the measurement site.

[0021] 2, the contact portion 13 is provided on the muon trajectory detector 11 and contacts the guide 12R to restrict the position of the muon trajectory detector 11 in the width direction W of the muon trajectory detector 11 relative to the guide 12R. This makes it possible for the contact portion 13 to install the muon trajectory detector 11 at a set position in the longitudinal direction of the guide 12R. At this time, if coordinate information such as a scale is attached to the guide 12R, the muon trajectory detector 11 is moved in the longitudinal direction of the guide 12R based on the coordinate information of the guide 12R, and installed at the set position.

[0022] In addition, the contact portion 13 may be composed of a wheel (e.g., a drive wheel) that comes into contact with the guide 12R and rolls, thereby moving the muon trajectory detector 11 in the longitudinal direction of the guide 12R together with or in place of the moving mechanism 15.

[0023] 3, the relative position measurement unit 14 is provided in the muon trajectory detector 11, and by measuring the relative position of the muon trajectory detector 11 with respect to the guide 12L, it ensures that the muon trajectory detector 11 is positioned opposite the guide 12L (for example, directly above it). This makes it possible for the relative position measurement unit 14 to install the muon trajectory detector 11 at a set position in the longitudinal direction of the guide 12L. At this time, if coordinate information such as a scale is attached to the guide 12L, the muon trajectory detector 11 is moved in the longitudinal direction of the guide 12L based on the coordinate information of the guide 12L, and installed at the set position.

[0024] When the guide 12L is installed at the measurement site below the muon trajectory detector 11, the relative position measurement unit 14 is provided on the underside of the muon trajectory detector 11. When the guide 12L is installed on the ceiling above the muon trajectory detector 11, the relative position measurement unit 14 is provided on the top surface of the muon trajectory detector 11, and when the guide 12L is installed on a wall surface to the side of the muon trajectory detector 11.

[0025] If coordinate information is not attached to the guides 12R and 12L, a movement amount calculation unit 17 (FIG. 2) as a movement amount calculation means provided in the muon trajectory detector 11 calculates the movement amount of the muon trajectory detector 11 in the longitudinal direction of the guides 12R and 12L based on measurements from devices such as encoders provided in the movement mechanism 15, the contact unit 13, or the relative position measurement unit 14. Based on the movement amount of the muon trajectory detector 11 calculated by this movement amount calculation unit 17, the muon trajectory detector 11 is installed at a set position.

[0026] The fixing mechanism 16 is installed, for example, below the muon trajectory detector 11, and fixes the muon trajectory detector 11 to the measurement site. When the fixing mechanism 16 is configured as legs that can be jacked up, it becomes possible to adjust the height and inclination of the muon trajectory detector 11.

[0027] When installing the muon trajectory detector 11 in the muon inspection device 10 configured as described above, if the current installation position of the muon trajectory detector 11 is outside the tolerance range of the preset setting position, causing a difference, the muon trajectory detector 11 is moved in the longitudinal direction of the guides 12 (12R, 12L) to eliminate the difference, and then the installation position of the muon trajectory detector 11 is reconfirmed. By repeating this process, the installation position of the muon trajectory detector 11 is positioned within the tolerance range of the setting position of the muon trajectory detector 11.

[0028] As configured as above, the first embodiment provides the following effects (1) and (2). (1) The setting means (contact unit 13, relative position measurement unit 14) provided in the muon trajectory detector 11 functions to set the muon trajectory detector 11 within the allowable range of the set position based on the guides 12 (12R, 12L) fixedly installed at the muon μ measurement site, so that the installation position of the large and heavy muon trajectory detector 11 can be determined with high precision at the set position. As a result, even when the muon trajectory detector 11 is installed each time a measurement is performed over a long period of time using the muon trajectory detector 11, and measurements of muons μ are repeated using the muon trajectory detector 11 at each installation position, the reproducibility of the measurement conditions can be guaranteed.

[0029] (2) The fixing mechanism 16 provided on the muon trajectory detector 11 fixes and positions the muon trajectory detector 11 at the measurement site of muons μ, so that muons μ can be measured and the muon trajectory can be detected without causing positional deviation in the muon trajectory detector 11. Furthermore, if this fixing mechanism 16 has a jack-up function, the height and gradient of the muon trajectory detector 11 can be adjusted.

[0030] [B] Second embodiment (Fig. 4) 4 is a perspective view showing the schematic configuration of a muon inspection device according to the second embodiment. In this second embodiment, parts that are similar to those in the first embodiment are given the same reference numerals as in the first embodiment, and descriptions thereof will be simplified or omitted.

[0031] The muon inspection device 20 of this second embodiment differs from the first embodiment in that it is configured with a plurality of guides 21 (e.g., guides 21A, 21B) discretely arranged at positions away from the muon trajectory detector 11, and a relative position measurement unit 22 as a setting means for installing the muon trajectory detector 11 at a set position.

[0032] The guide 21 has coordinate information for the muon μ measurement site and is configured with a point marker or a marker such as a QR code (registered trademark). The relative position measurement unit 22 is disposed in the muon trajectory detector 11 and is configured with a laser rangefinder, a camera, or the like. The relative position measurement unit 22 measures the relative position of the relative position measurement unit 22 with respect to two or more guides 21. That is, the relative position measurement unit 22 measures the distance (e.g., distances Ka, Kb) and angle θ between the relative position measurement unit 22 and multiple guides 21 (e.g., guides 21A, 21B), and measures the relative position of the relative position measurement unit 22 with respect to the guides 21 (21A, 21B) by triangulation or the like. The installation position of the muon trajectory detector 11, which is equivalent to the position of the relative position measurement unit 22, can be determined from the relative position of the relative position measurement unit 22 with respect to the guides 21 (21A, 21B) and the coordinate information of the guides 21 (21A, 21B).

[0033] If the current installation position of the muon trajectory detector 11 is outside the allowable range of the preset setting position, causing a difference, the muon trajectory detector 11 is moved to eliminate the difference, and the installation position of the muon trajectory detector 11 is measured and calculated again using the relative position measurement unit 22 and the guide 21. By repeating this process, the installation position of the muon trajectory detector 11 is positioned within the allowable range of the setting position of the muon trajectory detector 11.

[0034] Note that, when coordinate information is not attached to the guide 21 (e.g., guides 21A and 21B), a movement amount calculation unit 23, which is installed in the muon trajectory detector 11 and serves as movement amount calculation means connected to the relative position measurement unit 22, calculates the movement amount S of the muon trajectory detector 11. That is, before the muon trajectory detector 11 moves, the relative position measurement unit 22 measures the relative position of the relative position measurement unit 22 with respect to the guide 21 (e.g., guides 21A and 21B) using the distance (e.g., distances Ka and Kb) and angle θ between the relative position measurement unit 22 and the multiple guides 21 (e.g., guides 21A and 21B). Next, after the muon trajectory detector 11 moves, the relative position measurement unit 22 measures the relative position of the relative position measurement unit 22 with respect to the guide 21 (e.g., guides 21A and 21B) using the distance (e.g., distances Ka' and Kb') and angle θ' between the relative position measurement unit 22 and the multiple guides 21 (e.g., guides 21A and 21B). The movement amount calculation unit 23 calculates the movement amount S of the muon trajectory detector 11 based on the relative positions before and after the movement described above. The movement amount S of the muon trajectory detector 11 calculated by this movement amount calculation unit 23 is used to install the muon trajectory detector 11 at a set position.

[0035] As configured as above, the second embodiment also provides the same advantages as the advantages (1) and (2) of the first embodiment.

[0036] [C] Third embodiment (Fig. 5) 5 is a perspective view showing the schematic configuration of a muon inspection device according to the third embodiment. In this third embodiment, parts that are similar to those in the first embodiment are given the same reference numerals as in the first embodiment, and descriptions thereof will be simplified or omitted.

[0037] The muon inspection device 30 of the third embodiment uses the muon inspection device 10 of the first embodiment or the muon inspection device 20 of the second embodiment, and is further configured to include a position information acquisition unit 31 as position information acquisition means, an analysis data acquisition unit 32 as analysis data acquisition means, and an evaluation unit 33 as evaluation means. The muon inspection device 30 measures muons μ by installing the muon trajectory detector 11 at at least two set positions by setting means (contact unit 13, relative position measurement unit 14, relative position measurement unit 22) and, when the muon trajectory is detected, three-dimensionally evaluates the properties (position, shape, density, etc.) of the measurement target 1 based on the analysis data of the muons μ (e.g., field of view angles θa, θb, amount of incident muons) and the distance L between the installation positions of the muon trajectory detector 11 (e.g., installation positions Ma, Mb).

[0038] That is, when the muon trajectory detector 11 is installed at at least two set positions by the contact unit 13, relative position measurement unit 14, and relative position measurement unit 22 as setting means, the position information acquisition unit 31 acquires and saves information relating to the installation positions (for example, installation positions Ma and Mb) of this muon trajectory detector 11. These at least two installation positions may be the case when one muon trajectory detector 11 is moved and installed, or when multiple muon trajectory detectors 11 are installed at their respective installation positions.

[0039] When the muon trajectory detector 11 measures muons μ that have passed through, for example, an abnormal location G of the measurement object 1 at at least two installation positions (for example, installation positions Ma and Mb) and detects a muon trajectory, the analysis data acquisition unit 32 analyzes the data of the muons μ at each installation position (for example, installation positions Ma and Mb) and acquires and stores analysis data (for example, field of view angles θa, θb, and amount of muons arriving).

[0040] The evaluation unit 33 first calculates the distance between the installation positions of the muon trajectory detector 11 (for example, the distance L between the installation positions Ma and Mb) acquired by the position information acquisition unit 31. Next, the evaluation unit 33 evaluates the three-dimensional properties (position, shape, density, etc.) of an abnormality portion G of the measurement target 1 present in the parallax measurement region Q, including the vertical direction (depth direction) of this abnormality portion G, based on the analysis data of muons μ (for example, the field of view angles θa, θb, and the amount of incoming muons) acquired by the analysis data acquisition unit 32 and the distance between the installation positions of the muon trajectory detector 11 (for example, the distance L between the installation positions Ma and Mb). Here, the parallax measurement region Q is a region where the measurement region P of the muon trajectory detector 11 overlaps at each installation position of the muon trajectory detector 11 (for example, the installation positions Ma and Mb).

[0041] As configured as above, the third embodiment provides the following effect (3) in addition to the effects (1) and (2) of the first embodiment.

[0042] (3) When muon trajectory detectors 11 are installed in at least two locations to measure muons μ and detect muon trajectories, the position information acquisition unit 31 acquires the installation positions of each muon trajectory detector 11, the analysis data acquisition unit 32 finds and acquires analysis data of the muons μ (for example, field of view angles θa, θb, and the amount of incoming muons), and the evaluation unit 33 three-dimensionally evaluates the properties (position, shape, density, etc.) of the measurement target 1, including the abnormality location G, based on the distance L between the installation positions of the muon trajectory detectors 11 and the analysis data of the muons μ. Therefore, the properties of the measurement target 1, such as a large-scale structure, can be three-dimensionally evaluated and managed.

[0043] [D] Fourth embodiment (Figs. 6 and 7) 6 is a perspective view showing the schematic configuration of a muon inspection device according to the fourth embodiment. In this fourth embodiment, parts that are similar to those in the first embodiment are given the same reference numerals as in the first embodiment, and descriptions thereof will be simplified or omitted.

[0044] The muon inspection device 40 of the fourth embodiment uses the muon inspection device 10 of the first embodiment or the muon inspection device 20 of the second embodiment, and is further configured to include a position information acquisition unit 41 as position information acquisition means, an analysis data / time information acquisition unit 42 as analysis data / time information acquisition means, and an evaluation unit 43 as evaluation means. Then, when the muon trajectory detector 11 is set at a set position by the setting means (contact unit 13, relative position measurement unit 14, relative position measurement unit 22) and measures muons μ at different times to detect muon trajectories, the muon inspection device 40 evaluates the changes over time in the properties (position, shape, density, etc.) of the measurement object 1 based on the analysis data of the muons μ (e.g., field of view angle θ1, field of view angle θ2, amount of muons incident) and the measurement time of the muons μ (e.g., measurement times t1, t2; t1≠t2), and the installation position of the muon trajectory detector 11 that measured the muons μ (e.g., installation positions N1, N2; N1=N2 or N1≠N2).

[0045] In other words, the position information acquisition unit 41 acquires information about the installation position (e.g., installation positions N1, N2) of the muon trajectory detector 11 when the muon trajectory detector 11 is installed at a set position by the setting means (contact unit 13, relative position measurement unit 14, relative position measurement unit 22) to measure muons μ. The above-mentioned installation positions (e.g., installation positions N1, N2) may be the same position or different positions. In the case of different positions, one muon trajectory detector 11 is moved and installed at a different position, or multiple muon trajectory detectors 11 are installed at their respective installation positions.

[0046] Assume that a work event such as repair work is carried out at work event location J of measurement target 1, such as a large-scale structure, at time t. First, at a time before this time t (e.g., measurement time t1), the muon trajectory detector 11 measures muons μ that have passed through work event location J of measurement target 1 at its installation position (e.g., installation position N1) in a measurement region P that includes work event location J of measurement target 1, and detects a muon trajectory. The analysis data and time information acquisition unit 42 analyzes the data of muons μ measured and detected at its installation position (e.g., installation position N1) at this measurement time (e.g., measurement time t1), and acquires and stores this analysis data (field of view angle θ1, amount of incoming muons) together with the measurement time of muons μ (e.g., measurement time t1).

[0047] Next, at a time (e.g., measurement time t2) after the time t when the work event was carried out, when the muon trajectory detector 11 measures a muon μ that passed through the work event location J of the measurement object 1 at its installation position (e.g., installation position N1 or N2) and detects a muon trajectory in a measurement region P including the work event location J of the measurement object 1, the analysis data / time information acquisition unit 42 analyzes the data of the muon μ measured and detected at the installation position (e.g., installation position N1 or N2) at this measurement time (e.g., measurement time t2), and acquires and stores this analysis data (field of view angle θ2, amount of incoming muons) together with the measurement time of the muon μ (e.g., measurement time t2).

[0048] The evaluation unit 43 evaluates the time change in the properties (position, shape, density, etc.) of the work event location J of the measurement object 1 contained in the measurement region P of the muon trajectory detector 11 based on the analysis data of muons μ (field of view angles θ1, θ2, amount of incoming muons) and the measurement time of muons μ (e.g., measurement times t1, t2) measured by the analysis data and time information acquisition unit 42, and the installation position of the muon trajectory detector 11 (e.g., installation position N1 or N2) acquired by the position information acquisition unit 41. For example, as shown in FIG. 7, if the analysis value for the density of the work event location J of the measurement object 1 at measurement time t1 before the work is performed deviates from the expected value at measurement time t2 after the work is performed, the evaluation unit 43 evaluates that a density abnormality has occurred at the work event location J of the measurement object 1.

[0049] As configured as above, the fourth embodiment provides the same effects as the effects (1) and (2) of the first embodiment, as well as the following effects (4) and (5).

[0050] (4) When the muon trajectory detector 11 is installed at a set position and measures muons μ at different measurement times (e.g., measurement times t1 and t2) at that installation position (e.g., installation position N1 or N2) and detects a muon trajectory, the position information acquisition unit 41 acquires the installation position of the muon trajectory detector 11 (e.g., installation position N1 or N2), and the analysis data of the muons μ (field of view angles θ1 and θ2, amount of incoming muons) are calculated by the analysis data / time information acquisition unit 42 and acquired together with the measurement times of the muons μ (measurement times t1 and t2). Based on this analysis data of the muons μ, the measurement times, and the installation position of the muon trajectory detector 11, the evaluation unit 43 evaluates the temporal changes in the properties (position, shape, density, etc.) of the measurement target 1. This makes it possible to identify unexpected changes in the properties of the measurement target 1 caused by work events. Therefore, the properties of the measurement target 1 can be managed chronologically over a long period of time.

[0051] (5) When the installation positions of the muon trajectory detectors 11 that measure muons μ are acquired differently by the position information acquisition unit 41 (for example, installation positions N1 and N2), the evaluation unit 43 first calculates the distance between the installation positions of the muon trajectory detectors 11, and then evaluates the time changes in the three-dimensional properties (position, shape, density, etc.) of the measurement target 1 based on this distance between the installation positions, the analysis data of muons μ (field of view angles θ1, θ2, amount of incoming muons) and the measurement times of muons μ (for example, measurement times t1, t2) acquired by the analysis data and time information acquisition unit 42. Therefore, the properties of the measurement target 1, such as a large-scale structure, can be managed three-dimensionally and chronologically.

[0052] Although several embodiments of the present invention have been described above, these embodiments are presented as examples and are not intended to limit the scope of the invention. These embodiments can be implemented in various other forms, and various omissions, substitutions, changes, and combinations can be made without departing from the spirit of the invention. Furthermore, such substitutions, changes, and combinations are included in the scope and spirit of the invention, and are also included in the inventions and their equivalents as set forth in the claims. [Explanation of symbols]

[0053] 1... measurement object, 10... muon inspection device, 11... muon trajectory detector, 12, 12R, 12L... guide, 13... contact part (setting means), 14... relative position measurement part (setting means), 16... fixing mechanism (fixing means), 17... movement amount calculation part (movement amount calculation means), 20... muon inspection device, 21, 21A, 21B... guide, 22... relative position measurement part (setting means), 23... movement amount calculation part (movement amount calculation means), 30... muon inspection device, 3 1...position information acquisition unit (position information acquisition means), 32...analysis data acquisition unit (analysis data acquisition means), 33...evaluation unit (evaluation means), 40...muon inspection device, 41...position information acquisition unit (position information acquisition means), 42...analysis data / time information acquisition unit (analysis data / time information acquisition means), 43...evaluation unit (evaluation means), μ...muon, L...distance, Ma, Mb...installation position, N1, N2...installation position, S...movement amount, t1, t2...measurement time.

Claims

1. A muon inspection device that evaluates properties of a measurement target using muons, a muon trajectory detector that is installed below or to the side of the measurement target and measures muons passing through the measurement target to detect muon trajectories; A guide fixedly installed at the measurement site, and setting means provided in the muon trajectory detector for setting the muon trajectory detector at a setting position based on the guide.

2. 2. The muon inspection device according to claim 1, wherein the setting means is a contact portion that is provided on the muon trajectory detector and that contacts a guide to restrict the position of the muon trajectory detector relative to the guide.

3. 2. The muon inspection device according to claim 1, wherein the setting means is a relative position measurement unit that is provided in the muon trajectory detector and that measures the relative position of the muon trajectory detector with respect to the guide.

4. 2. The muon inspection device according to claim 1, wherein the muon trajectory detector is provided with a movement amount calculation means for calculating a movement amount of the muon trajectory detector.

5. 2. The muon inspection device according to claim 1, wherein the muon trajectory detector is provided with a fixing means for fixing and positioning the muon trajectory detector at a measurement site.

6. a position information acquiring means for acquiring information on the installation positions of the muon trajectory detector when the muon trajectory detector is installed at at least two set positions by a setting means; an analysis data acquisition means for analyzing and acquiring muon data when the muon trajectory detector measures muons from a measurement target at at least two installation positions and detects muon trajectories; 6. The muon inspection device according to claim 1, further comprising an evaluation means for three-dimensionally evaluating properties of the measurement target based on the muon analysis data acquired by the analysis data acquisition means and the distance between the installation positions of the muon trajectory detectors acquired by the position information acquisition means.

7. a position information acquiring means for acquiring information on the installation position of the muon trajectory detector when the muon trajectory detector is installed at a set position by a setting means; analysis data and time information acquisition means for analyzing muon data when the muon trajectory detector measures muons from a measurement target at different times at an installation position and detects muon trajectories, and acquiring this analysis data together with the muon measurement time; 6. The muon inspection device according to claim 1, further comprising an evaluation means for evaluating a change over time in properties of the measurement object based on the muon analysis data and muon measurement time acquired by the analysis data and time information acquisition means, and the installation position of the muon trajectory detector acquired by the position information acquisition means.

8. A muon inspection method for evaluating properties of a measurement target using muons, comprising: A muon inspection device according to any one of claims 1 to 5 is provided, A muon inspection method characterized in that when a muon trajectory detector is installed at at least two set positions by a setting means to measure muons and detect muon trajectories, the properties of the measurement object are evaluated three-dimensionally based on the analysis data of the muons and the distance between the installation positions of the muon trajectory detectors.

9. A muon inspection method for evaluating properties of a measurement target using muons, comprising: A muon inspection device according to any one of claims 1 to 5 is provided, A muon inspection method characterized in that when a muon trajectory detector is set at a set position by a setting means and measures muons at different times to detect muon trajectories, the method evaluates changes over time in the properties of an object to be measured based on the analysis data of the muons, the measurement times of the muons, and the installation position of the muon trajectory detector.

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