Multilayer ceramic electronic components
By integrating a segregation of rare earth elements and magnesium at the interface of dielectric and internal electrode layers, the delamination issue is mitigated, enhancing the reliability and capacitance of multilayer ceramic components.
JP2026091044APending Publication Date: 2026-06-03TAIYO YUDEN KK
Patent Information
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- TAIYO YUDEN KK
- Filing Date
- 2024-11-22
- Publication Date
- 2026-06-03
AI Technical Summary
Technical Problem
Delamination occurs between the dielectric layer and internal electrode layer in multilayer ceramic electronic components during the sintering process, leading to reliability issues.
Method used
Incorporating a segregation containing a first and second rare earth element, along with magnesium, at the interface between the dielectric and internal electrode layers, which improves bonding and suppresses delamination by reducing oxide ion defects and grain growth.
Benefits of technology
The solution enhances the bonding between the dielectric and internal electrode layers, improving the reliability and capacitance of the multilayer ceramic components by stabilizing the interface and reducing pores.
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Smart Images
Figure 2026091044000001_ABST
Abstract
The present invention provides multilayer ceramic electronic components that can suppress delamination. [Solution] The multilayer ceramic electronic component comprises a dielectric layer 11 having a main phase and segregated material 40 containing a first rare earth element, a second rare earth element, and magnesium; a plurality of internal electrode layers 12 provided sandwiching the dielectric layer; and external electrodes 20a, 20b electrically connected to the internal electrode layers 12.
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