Probe pins and sockets
JP2026093799APending Publication Date: 2026-06-09OMRON CORP
Patent Information
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- OMRON CORP
- Filing Date
- 2024-11-28
- Publication Date
- 2026-06-09
AI Technical Summary
Benefits of technology
【0008】 本開示によれば、第1弾性部が弾性変形する第1方向に交差する第2方向から接触可能なプローブピン、および、このプローブピンを備えたソケットを実現できる。
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Smart Images
Figure 2026093799000001_ABST
Abstract
To provide a probe pin that can be contacted from a second direction intersecting the first direction in which the first elastic portion elastically deforms. [Solution] The probe pin comprises a first elastic portion configured to be elastically deformable in a first direction, a first contact portion, and a second contact portion. The first contact portion has a second elastic portion configured to be elastically deformable in a second direction intersecting the first direction, and is connected to one end of the first elastic portion in the first direction. The second contact portion is connected to the other end of the first elastic portion in the first direction, which is located opposite to the other end. The first contact portion has a first contact point configured to contact along the second direction, and is positioned to overlap with the first elastic portion of the second elastic portion when viewed along the first direction. The second contact portion has a second contact point configured to contact along the first direction.
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