Semiconductor equipment

JP2026104926APending Publication Date: 2026-06-25SEMICON ENERGY LAB CO LTD
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Patent Information

Application Number
JP2026065510
Authority / Receiving Office
JP · JP
Patent Type
Applications
Current Assignee / Owner
Priority Date
2012-11-16
Filing Date
2026-04-13
Publication Date
2026-06-25

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Benefits of technology

【0018】 本発明の一態様により、酸化物膜及び酸化物半導体膜を含む多層膜を用いることで、ト ランジスタに安定した電気特性を付与することができる。

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Abstract

To impart stable electrical characteristics to transistors using oxide semiconductor films. To impart excellent electrical properties to transistors using a synthetic semiconductor film. To provide a highly reliable semiconductor device with a tactile function. [Solution] A multilayer film in which an oxide semiconductor film and an oxide film are stacked, a gate electrode, and a gate Regarding a transistor having an insulating film, the multilayer film has the gate insulating film through which the gate electrical The electrode is superimposed on the multilayer film, and the multilayer film is formed by the lower surface of the oxide semiconductor film and the side surface of the oxide semiconductor film. The shape has an angle 1 and a second angle formed by the bottom surface of the oxide film and the side surface of the oxide film. Furthermore, the first angle is smaller and more acute than the second angle. A semiconductor device is fabricated using this method.
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Citation Information

Patent Citations

  • Image display

    JP2006165528A

  • Semiconductor integrated device

    US20120032730A1