Inspection socket

Abstract

We provide inspection sockets with high contact reliability. [Solution] The inspection socket comprises a housing and a plurality of pins supported by the housing. Each pin has a first end provided at one end in a first direction and a second end provided at the other end in the first direction. The plurality of pins include pins 1 to 6. Pins 1 and 2 and pins 3 and 4 are spaced apart in a second direction. Pin 5 is located between pins 1 and 2 in the second direction, and pin 6 is located between pins 3 and 4 in the second direction. In the third direction, pins 1 and 3, pins 2 and 4, and pins 5 and 6 are arranged side by side. The second ends of pins 1 and 3 are in different positions in the second direction, the second ends of pins 2 and 4 are in different positions in the second direction, and the second ends of pins 5 and 6 are in different positions in the second direction.

Description

Technical Field

[0006] , , , , ,

[0001] The present disclosure relates to an inspection socket.

Background Art

[0002] Patent Document 1 describes an inspection jig used for conducting continuity inspections and characteristic measurements of electronic modules.

Prior Art Documents

Patent Documents

[0003]

Patent Document 1

Summary of the Invention

Problems to be Solved by the Invention

[0004] An inspection socket including the inspection jig of Patent Document 1 has a plurality of probe pins. Each probe pin is arranged side by side at intervals and is housed in a housing in a state of being electrically independent of each other. However, when the intervals between the terminals of the contact object (e.g., connector) of the inspection socket are narrow, it is necessary to narrow the intervals between the probe pins that contact each terminal. When the intervals between the probe pins are narrow, contact failures may occur during inspection.

[0005] An object of the present disclosure is to provide an inspection socket with high contact reliability.

Means for Solving the Problems

[0006] An inspection socket according to one aspect of the present disclosure includes a housing, and a plurality of pins each supported by the housing, each of the plurality of pins has a first end provided at one end in a first direction and capable of contacting another member, and a second end provided at the other end in the first direction and capable of contacting another member. The aforementioned plurality of pins include a first pin, a second pin, a third pin, a fourth pin, a fifth pin, and a sixth pin, The first pin and the second pin are arranged with a gap between them in a second direction intersecting the first direction. The third and fourth pins are arranged with a gap between them in the second direction. The fifth pin is located between the first pin and the second pin in the second direction. The sixth pin is located between the third pin and the fourth pin in the second direction. In the third direction intersecting the first and second directions, the first pin and the third pin are arranged side by side. In the third direction, the second pin and the fourth pin are arranged side by side. In the third direction, the fifth pin and the sixth pin are arranged side by side. The second end of the first pin and the second end of the third pin are in different positions in the second direction. The second end of the second pin and the second end of the fourth pin are in different positions in the second direction. The second end of the fifth pin and the second end of the sixth pin are in different positions in the second direction. [Effects of the Invention]

[0007] According to this disclosure, a highly reliable contact inspection socket can be provided. [Brief explanation of the drawing]

[0008] [Figure 1] A perspective view showing an inspection socket in one implementation state of this disclosure. [Figure 2] Figure 1 shows an exploded perspective view of the inspection socket. [Figure 3] Perspective view of the probe pin. [Figure 4] Plan view of the probe pin and the object being contacted. [Figure 5] Cross-sectional view along line AA in Figure 4. [Figure 6] Cross-sectional view taken along line B-B of FIG. 4. [Figure 7] Cross-sectional view showing a first modified example of the probe pin of FIG. 5. [Figure 8] Cross-sectional view showing a first modified example of the probe pin of FIG. 6. [Figure 9] Cross-sectional view showing a second modified example of the probe pin of FIG. 5. [Figure 10] Cross-sectional view showing a second modified example of the probe pin of FIG. 6. [Figure 11] Perspective view showing an inspection socket in another implementation state of the present disclosure. [Figure 12] Exploded perspective view of the inspection socket of FIG. 11. [Figure 13] Perspective view of the probe pin and the intermediate probe pin. [[ID=z3]] [Figure 14] Front view of the probe pin and the intermediate probe pin. [Figure 15] Front view of the second intermediate probe pin [Figure 16] Front view of the modified example of the probe pin and the intermediate probe pin. [Figure 17] Front view of the modified example of the probe pin and the intermediate probe pin. [Figure 18] Front view of the modified example of the probe pin and the intermediate probe pin. [Figure 19] Perspective view of the modified example of the probe pin. [Figure 20] Front view of the modified example of the probe pin. [Figure 21] Front view of the modified example of the probe pin and the intermediate probe pin. [Figure 22] Front view of the modified example of the probe pin and the intermediate probe pin. [Figure 23] Front view of the modified example of the probe pin and the intermediate probe pin. [Figure 24] Enlarged view of the portion surrounded by the dashed line in FIG. 4. [Figure 25] Enlarged view of the portion surrounded by the dashed line in FIG. 9. [Figure 26] Enlarged view of the portion surrounded by the dashed line in FIG. 14. [Figure 27]Enlarged view of the area enclosed by the dashed line in Figure 21. [Figure 28] An enlarged view of the area enclosed by the dashed line in Figure 22. [Figure 29] Front view of the modified probe pin and intermediate probe pin. [Figure 30] Front view of the modified probe pin and intermediate probe pin. [Figure 31] Front view of the modified probe pin and intermediate probe pin. [Figure 32] Front view of the modified probe pin and intermediate probe pin. [Figure 33] A graph showing the results of the voltage withstand test. [Modes for carrying out the invention]

[0009] An example of this disclosure is described below with reference to the accompanying drawings. The following description is essentially illustrative and is not intended to limit this disclosure, its applications, or its uses. The drawings are schematic, and the proportions of the dimensions, etc., do not necessarily correspond to reality. In addition, the following description uses terms that indicate a specific direction or position (for example, terms including "up," "down," "right," "left," "front," and "back") as needed. However, the use of terms that indicate a specific direction or position is for the purpose of facilitating the understanding of this disclosure with reference to the drawings, and the meaning of those terms does not limit the technical scope of this disclosure.

[0010] An inspection socket 1 in one embodiment of the present disclosure, as shown in Figures 1 and 2, comprises housings 2, 3, 4, 5, and 6, and a plurality of probe pins 7 housed inside the housings 2, 3, 4, 5, and 6. Each probe pin 7 is an example of a pin, for example, formed of a conductive material and having a plate shape.

[0011] As shown in Figure 2, the housing 2 has through holes 2A and 2B that penetrate the housing 2 in the vertical direction (for example, the Z direction shown in each figure). The vertical direction and the Z direction are examples of first directions. In this embodiment, in the vertical direction, the side where the housing 2 is located is upward, and the side where the housing 6 is located is downward.

[0012] Housing 3 has a base portion 31 and a projection portion 32 that protrudes upward from the base portion 31. Here, "protruding upward" means "protruding in the direction from housing 6 to housing 2 along the first direction." The projection portion 32 has a recessed portion 3A that is recessed downward. Here, "recessed downward" means "recessed in the direction from housing 2 to housing 6 along the first direction." The projection portion 32 has a plurality of through holes 3B in the bottom surface 31B that constitutes the recess 31A, which penetrate the projection portion 32 in the vertical direction. Each of the plurality of through holes 3B corresponds to each of the plurality of probe pins 7.

[0013] The housing 4 has through holes 4A and 4B that penetrate the housing 4 in the vertical direction.

[0014] As shown in Figure 2, the housing 5 holds multiple probe pins 7 aligned along the Y direction.

[0015] The housing 6 has a pin 61 that protrudes upward and a recess 6A that is recessed downward from the top surface (in other words, the outer surface of the housing 6 that faces the housing 4). The housing 6 has a plurality of through holes 6B that penetrate the housing 6 vertically in the bottom surface that constitutes the recess 6A. Each of the plurality of through holes 6B corresponds to each of the plurality of probe pins 7.

[0016] The lower part of the housing 5 that holds the probe pins 7 is housed in the recess 6A of the housing 6. The lower part of the housing 5 is the portion of the housing 5 that is closer to the housing 6 in the first direction. At this time, the second ends 121, 122, 752, 762 (see Figure 3) of each probe pin 7 are exposed to the outside of the inspection socket 1 through the through hole 6B.

[0017] Housings 2, 3, and 4 are assembled above housing 6, which houses housing 5. Housings 2, 3, and 4 are assembled to housing 6 from below in the order of housing 4, 3, and 2.

[0018] The pin 61 of housing 6 passes through the through hole 4B of housing 4 and the through hole 2B of housing 2. This positions housings 2 and 4 relative to housing 6.

[0019] The protrusion 32 of the housing 3 penetrates the through-hole 2A of the housing 2 from below. As a result, the protrusion 32 is exposed to the outside of the inspection socket 1, and the housing 3 is positioned relative to the housing 2.

[0020] The first connection portion 11 of each probe pin 7 (see Figures 5 and 6) passes through the through hole 4A of the housing 4 from below. The first ends 111, 751, and 761 of each probe pin 7 (see Figure 3) are exposed to the outside of the inspection socket 1 through the through hole 3B of the housing 3.

[0021] The inspection socket 1 is connected to an inspection device (not shown), and the object to be contacted 8 (see Figures 4, 5, and 6) is connected to the inspection socket 1. In the above connection state, continuity between the object to be contacted 8 and the inspection device is inspected.

[0022] The inspection socket 1 is placed on a substrate of the inspection device. As a result, the second ends 121, 122, 752, and 762 (see Figure 3) of each probe pin 7, which are exposed to the outside of the inspection socket 1 through the through holes 6B, are electrically connected to conductive pads formed on the substrate. The conductive pads formed on the substrate are an example of other components that can contact the second ends.

[0023] The contact object 8 shown in Figures 4, 5, and 6 is fitted into the recess 3A of the housing 3. As shown in Figures 5 and 6, the contact object 8 has a plurality of terminals 81. When the contact object 8 is fitted into the recess 3A of the housing 3, each terminal 81 is electrically connected to the first ends 111, 751, 761 (see Figure 3) of each probe pin 7 exposed to the outside of the inspection socket 1 through the through hole 3B. The contact object 8 is an example of other members that can be contacted at the first ends.

[0024] As shown in Figures 3 and 4, the probe pin 7 comprises a first probe pin 71, a second probe pin 72, a third probe pin 73, a fourth probe pin 74, a fifth probe pin 75, and a sixth probe pin 76. The first probe pin 71 is an example of a first pin. The second probe pin 72 is an example of a second pin. The third probe pin 73 is an example of a third pin. The fourth probe pin 74 is an example of a fourth pin. At least one of each of the first probe pin 71, the second probe pin 72, the third probe pin 73, the fourth probe pin 74, the fifth probe pin 75, and the sixth probe pin 76 is provided. In this embodiment, the probe pin 7 comprises 13 first probe pins 71, 13 second probe pins 72, 13 third probe pins 73, 13 fourth probe pins 74, 2 fifth probe pins 75, and 2 sixth probe pins 76.

[0025] In this embodiment, the first probe pin 71, the second probe pin 72, the third probe pin 73, and the fourth probe pin 74 are signal terminals, and the fifth probe pin 75 and the sixth probe pin 76 are power terminals or ground terminals. However, the types of each probe pin are not limited to these.

[0026] Each of the first probe pins 71, second probe pin 72, third probe pin 73, fourth probe pin 74, fifth probe pin 75, and sixth probe pin 76 is spaced apart. In other words, each of the first probe pins 71, second probe pin 72, third probe pin 73, fourth probe pin 74, fifth probe pin 75, and sixth probe pin 76 is electrically insulated from one another.

[0027] The first probe pin 71, the third probe pin 73, and the fifth probe pin 75 are spaced apart along the front-to-back direction (for example, the Y direction shown in each figure) that intersects (orthogonal in this embodiment) with the vertical direction of the inspection socket 1. The front-to-back direction and the Y direction are the thickness directions of the probe pins 7, and are an example of a third direction. The first probe pin 71 and the third probe pin 73 are arranged alternately in the front-to-back direction.

[0028] The two fifth probe pins 75 sandwich the thirteen first probe pins 71 and the thirteen third probe pins 73 in the front-to-back direction. In other words, the two fifth probe pins 75 are positioned at the foremost and rearmost positions among the first probe pins 71, the third probe pins 73, and the fifth probe pins 75.

[0029] The second probe pin 72, the fourth probe pin 74, and the sixth probe pin 76 are spaced apart along the front-to-back direction of the inspection socket 1. The second probe pin 72 and the fourth probe pin 74 are arranged alternately in the front-to-back direction.

[0030] The two sixth probe pins 76 are positioned in the front-to-back direction, sandwiching the 13 second probe pins 72 and the 13 fourth probe pins 74. In other words, the two sixth probe pins 76 are located at the foremost and rearmost positions among the second probe pins 72, the fourth probe pins 74, and the sixth probe pins 76.

[0031] As shown in Figure 5, each first probe pin 71 and each second probe pin 72 are positioned opposite each other with a gap in the left-right direction (for example, the X direction shown in each figure) which intersects both the vertical and front-back directions (orthogonal to both the vertical and front-back directions in this embodiment). The left-right direction and the X direction are examples of second directions.

[0032] As shown in Figure 6, the third probe pins 73 and the fourth probe pins 74 are positioned opposite each other with a gap between them in the left-right direction.

[0033] In this embodiment, the first probe pin 71 and the fourth probe pin 74 have the same configuration (in other words, the same size and shape). The fourth probe pin 74 is the first probe pin 71 positioned in the opposite direction in the left-right direction.

[0034] In this embodiment, the second probe pin 72 and the third probe pin 73 have the same configuration (in other words, the same size and shape). The third probe pin 73 is the second probe pin 72 positioned in the opposite direction in the left-right direction.

[0035] Therefore, in this embodiment, instead of having four types of probe pins 7 with different configurations, the inspection socket 1 has two types of probe pins 7. One of the two types of probe pins 7 is probe pins 71 and 74, and the other of the two types of probe pins 7 is probe pins 72 and 73.

[0036] As shown in Figure 3, the fifth probe pins 75 and the sixth probe pins 76 are positioned opposite each other with a gap between them in the left-right direction.

[0037] In this embodiment, the fifth probe pin 75 and the sixth probe pin 76 have the same configuration (in other words, the same size and shape). In this embodiment, the fifth probe pin 75 and the sixth probe pin 76 are arranged in opposite directions in the left-right direction. The fifth probe pin 75 and the sixth probe pin 76 are arranged symmetrically with respect to a virtual line L1 extending vertically between the fifth probe pin 75 and the sixth probe pin 76.

[0038] The configuration of each probe pin 7 will be described below. In this embodiment, each first probe pin 71, each second probe pin 72, each third probe pin 73, each fourth probe pin 74, each probe pin 75, and each probe pin 76 have generally the same configuration. Therefore, the configuration of the first probe pin 71 will be described below, and the descriptions of the configurations of the other probe pins will be omitted in principle. In each figure, common features of the configuration are denoted by the same reference numerals. However, configurations of other probe pins that differ from the first probe pin 71 will be described. In the following description, "left" and "right" in the left-right direction have the following meanings. That is, in the first probe pin 71 and the third probe pin 73, the side with the curved portion 133 is "left," and the side opposite the curved portion 133 is "right." On the other hand, for the second probe pin 72 and the fourth probe pin 74, in the left-right direction, the side opposite the curved portion 133 is "left," and the side with the curved portion 133 is "right."

[0039] As shown in Figure 5, the first probe pin 71 comprises a first connecting portion 11, a second connecting portion 12, and an elastic portion 13. The first connecting portion 11 is connected to a first end 13A, which is one of the two ends of the elastic portion 13 in the vertical direction (in this embodiment, the upper end of the elastic portion 13). In other words, the lower end of the first connecting portion 11 (in this embodiment, the end closer to the elastic portion 13 in the vertical direction) is connected to the upper end of the elastic portion 13. The second connecting portion 12 is connected to a second end 13B, which is the other of the two ends of the elastic portion 13 in the vertical direction (in this embodiment, the lower end of the elastic portion 13). In other words, the upper end of the second connecting portion 12 (in this embodiment, the end closer to the elastic portion 13 in the vertical direction) is connected to the lower end of the elastic portion 13.

[0040] The first connection portion 11 includes a first end portion 111 provided at the upper end of the first connection portion 11 (in this embodiment, the end furthest from the second connection portion 12 in the vertical direction). The second connection portion 12 includes a second end portion 121 provided at the lower end of the second connection portion 12 (in this embodiment, the end furthest from the first connection portion 11 in the vertical direction). In other words, the first probe pin 71 includes a first end portion 111 provided at one end in the vertical direction (the upper end in this embodiment) and a second end portion 121 provided at the other end in the vertical direction (the lower end in this embodiment).

[0041] The elastic portion 13 has a first portion 131, a second portion 132, and a curved portion 133. The first portion 131 and the second portion 132 are examples of first extensions. The curved portion 133 is an example of a second extension. The number of first extensions and second extensions is not limited to the number shown in Figure 5. The elastic portion 13 includes a plurality of first extensions and at least one second extension. In this embodiment, the first extensions only need to extend in the left-right direction and are not limited to a straight shape. For example, they may have a meandering shape. The second extensions are not limited to a curved shape and may have a bent shape, for example.

[0042] The first part 131 extends from the first end 13A in the left-right direction. The second part 132 extends from the second end 13B in the left-right direction. The second part 132 extends to the same side as the first part 131 in the left-right direction. In the example shown in Figure 5, the first part 131 extends to the left from the first end 13A, and the second part 132 extends to the left from the second end 13B.

[0043] The curved portion 133 has a curved shape. The curved portion 133 connects the ends of two vertically adjacent first portions 131 and second portions 132. The curved portion 133 connects the end of the first portion 131 furthest from the first end 13A (for example, the left end in Figure 5) and the end of the second portion 132 furthest from the second end 13B (the left end in Figure 5).

[0044] The first end 13A and the second end 13B, which are both ends of the elastic portion 13, are connected to the first connecting portion 11 and the second connecting portion 12 from the same side (the left side in this embodiment) in the left-right direction. In other words, the elastic portion 13 is located on the same side (the left side in this embodiment) as one side (the left side in this embodiment) of the first connecting portion 11 in the left-right direction.

[0045] The vertical length L2 between the end 11A to which the first end 13A of the first connecting portion 11 is connected and the end 12A to which the second end 13B of the second connecting portion 12 is connected is longer than the inner diameter R1 of the curve of the elastic portion 13. In this embodiment, the end 11A is the lower end of the first connecting portion 11, and the end 12A is the upper end of the second connecting portion 12. Also in this embodiment, the inner diameter R1 of the curve of the elastic portion 13 is the inner diameter R1 of the curved portion 133.

[0046] The elastic portion 13 comprises a plurality of elongated plate portions 134 (in this embodiment, three elongated plate portions 134A, 134B, and 134C). Each elongated plate portion 134A, 134B, and 134C extends over a first portion 131, a second portion 132, and a curved portion 133.

[0047] Each of the long plate sections 134A, 134B, and 134C extends along the longitudinal direction of the elastic section 13. The longitudinal direction of the elastic section 13 is the direction in which the elastic section 13 extends from the first section 131 through the curved section 133 to the second section 132. In other words, the longitudinal direction of the elastic section 13 is the left-right direction in the first section 131 and the second section 132, and the direction along the curved shape in the curved section 133.

[0048] Each of the long plate sections 134A, 134B, and 134C is arranged in a line with spacing along the width direction of the elastic section 13. The width direction of the elastic section 13 is perpendicular to both the front-to-back direction (the thickness direction of the probe pin 7 in this embodiment) and the length direction of the elastic section 13.

[0049] The multiple long plate sections 134 are longer in the width direction the further they are located on the outside of the curved shape of the curved section 133. In this embodiment, the long plate section 134A is longer in the width direction than the long plate section 134B, and the long plate section 134B is longer in the width direction than the long plate section 134C.

[0050] The second part 132 extends upward as it moves to the right on the plane of Figure 5. In other words, the second part 132 extends so that it approaches the first end 13A in the vertical direction as it approaches the second end 13B in the horizontal direction. That is, the surfaces that make up the radial inner edge and the surfaces that make up the outer edge of the second part 132 are inclined surfaces that are inclined with respect to the horizontal direction.

[0051] The upper edge 12B of the second connection portion 12 extends downward as the plane of the paper in Figure 5 moves to the right. In other words, the edge 12B of the second connection portion 12 on the side of the first connection portion 11 in the vertical direction (the upper side in this embodiment) extends away from the first connection portion 11 in the vertical direction as it moves away from the elastic portion 13 in the horizontal direction. In other words, the edge 12B is an inclined surface that is inclined with respect to the horizontal direction. The edge 12B may also extend along the horizontal direction. As shown in Figure 3, the edges 12B of the fifth probe pin 75 and the sixth probe pin 76 extend along the horizontal direction.

[0052] As shown in Figure 5, the first end portion 111 is protruding and extends upward from the upper end of the first connecting portion 11 (in this embodiment, in the direction away from the second connecting portion 12 in the first direction). The first end portion 111 comprises an inclined surface 111A and a projection 111B.

[0053] The inclined surface 111A is located on one side of the first end portion 111 in the left-right direction. The inclined surface 111A is inclined in the vertical direction such that it moves away from the center line C as it moves away from the elastic portion 13. The center line C is a line that passes through the center of the first connecting portion 11 in the left-right direction and extends in the vertical direction.

[0054] The projection 111B protrudes upward (in this embodiment, in the direction away from the second connecting portion 12 in the first direction). The projection 111B faces the inclined surface 111A with a gap between them in the left-right direction. The protruding tip of the projection 111B (the upper end in this embodiment) is located below the upper end of the inclined surface 111A and above the lower end of the inclined surface 111A. In other words, in the first direction, the protruding tip of the projection 111B is located between the end of the inclined surface 111A that is farther from the elastic portion 13 and the end that is closer to it.

[0055] The terminal 81 of the object to be contacted 8 can make contact with the inclined surface 111A and the projection 111B. When the object to be contacted 8 is fitted into the recess 3A of the housing 3, the terminal 81 has a U-shaped portion in a side view along the front-rear direction. That is, the terminal 81 has a downwardly convex curved portion at its tip. The inclined surface 111A contacts the curved portion of the terminal 81 from one side in the left-right direction.

[0056] In this embodiment, the first end portion 111 has only one inclined surface that can contact the object to be contacted 8. In other words, in this embodiment, the only inclined surface on the first end portion 111 that can contact the object to be contacted 8 is the inclined surface 111A.

[0057] The second end portion 121 is protruding and extends downward from the lower end of the second connecting portion 12 (in this embodiment, in the direction away from the first connecting portion 11 in the first direction). The second end portion 121 has a notch 121C. The notch 121C is cut out from the lower surface of the second end portion 121 upward (in this embodiment, toward the first connecting portion 11 in the first direction).

[0058] The second connecting portion 12 has a notch 12C. The notch 12C is provided between the second end portion 121 and the second portion 132 of the elastic portion 13. The notch 12C is cut out from the left-right end of the second connecting portion 12 along the left-right direction.

[0059] The first probe pin 71, the second probe pin 72, the third probe pin 73, and the fourth probe pin 74 differ in their orientation, configuration, and other aspects. These differences are described in detail below.

[0060] As shown in Figure 5, the first probe pin 71 and the second probe pin 72 are positioned opposite each other in the left-right direction so that their elastic portions 13 face outward in the left-right direction. As shown in Figure 6, the third probe pin 73 and the fourth probe pin 74 are positioned opposite each other in the left-right direction so that their elastic portions 13 face outward in the left-right direction.

[0061] As shown in Figures 5 and 6, the inclined surfaces 111A of the first probe pin 71 and the fourth probe pin 74 are located on the side of the curved portion 133 of the elastic portion 13 at the first end 111 in the left-right direction. The inclined surfaces 111A of the first probe pin 71 and the fourth probe pin 74 face away from the curved portion 133 of the elastic portion 13 in the left-right direction. The projections 111B of the first probe pin 71 and the fourth probe pin 74 are located on the side of the curved portion 133 of the elastic portion 13 relative to the inclined surface 111A in the left-right direction.

[0062] The inclined surface 111A of the first probe pin 71 is located on the left side of the first end 111 in the plane of Figure 5, extends downwards as it moves to the right, and points to the upper right. The projection 111B of the first probe pin 71 is located to the right of the inclined surface 111A of the first probe pin 71 in the plane of Figure 5. The inclined surface 111A of the fourth probe pin 74 is located on the right side of the first end 111 in the plane of Figure 6, extends downwards as it moves to the left, and points to the upper left. The projection 111B of the fourth probe pin 74 is located to the left of the inclined surface 111A of the fourth probe pin 74 in the plane of Figure 6.

[0063] As shown in Figures 5 and 6, the inclined surfaces 111A of the second probe pin 72 and the third probe pin 73 are located on the opposite side of the elastic portion 13 at the first end 111 in the left-right direction. The inclined surfaces 111A of the second probe pin 72 and the third probe pin 73 face the curved portion 133 side of the elastic portion 13 in the left-right direction. The projections 111B of the second probe pin 72 and the third probe pin 73 are located on the elastic portion 13 side relative to the inclined surface 111A in the left-right direction.

[0064] The inclined surface 111A of the second probe pin 72 is located to the left of the first end 111 on the plane of Figure 5, extends downwards as it moves to the right, and points to the upper right. The projection 111B of the second probe pin 72 is located to the right of the inclined surface 111A of the second probe pin 72 on the plane of Figure 5. The inclined surface 111A of the third probe pin 73 is located to the right of the first end 111 on the plane of Figure 6, extends downwards as it moves to the left, and points to the upper left. The projection 111B of the third probe pin 73 is located to the left of the inclined surface 111A of the third probe pin 73 on the plane of Figure 6.

[0065] As shown in Figure 5, the inclined surface 111A of the first end 111 of the first probe pin 71 and the inclined surface 111A of the first end 111 of the second probe pin 72 face the same side in the left-right direction (to the right in this embodiment). As shown in Figure 6, the inclined surface 111A of the first end 111 of the third probe pin 73 and the inclined surface 111A of the first end 111 of the fourth probe pin 74 face the same side in the left-right direction (to the left in this embodiment).

[0066] Furthermore, as shown in Figures 5 and 6, the inclined surface 111A of the first end 111 of the first probe pin 71 (see Figure 5) and the inclined surface 111A of the first end 111 of the third probe pin 73 (see Figure 6) face opposite directions in the left-right direction. The inclined surface 111A of the first end 111 of the second probe pin 72 (see Figure 5) and the inclined surface 111A of the first end 111 of the fourth probe pin 74 (see Figure 6) face opposite directions in the left-right direction.

[0067] Furthermore, when viewed along the front-to-back direction, the inclined surface 111A of the first end 111 of the first probe pin 71 and the inclined surface 111A of the first end 111 of the third probe pin 73 face each other in the left-to-right direction. When viewed along the front-to-back direction, the inclined surface 111A of the first end 111 of the second probe pin 72 and the inclined surface 111A of the first end 111 of the fourth probe pin 74 face each other in the left-to-right direction.

[0068] The first probe pin 71 and the fourth probe pin 74 are provided with a second end 121 and a notch 12C. The second probe pin 72 and the third probe pin 73 are provided with a second end 122 instead of a second end 121. The second end 122 does not have a notch 12C. The second end 122 differs from the second end 121 in that it does not have a notch 121C.

[0069] In the first probe pin 71 and the fourth probe pin 74, the second end 121 is positioned away from the first end 111 when viewed along the vertical direction. In the first probe pin 71 and the fourth probe pin 74, the second end 121 is positioned away from the inclined surface 111A when viewed along the vertical direction. In the first probe pin 71 and the fourth probe pin 74, the portion of the second connection part 12 including the second end 121 overlaps with the elastic part 13 when viewed along the vertical direction. In other words, in the first probe pin 71 and the fourth probe pin 74, in the left-right direction, at least a portion of the portion of the second connection part 12 including the second end 121 is in the same position as at least a portion of the elastic part 13. Also, in the first probe pin 71 and the fourth probe pin 74, the elastic part 13 and the second end 121 are located on the same side in the left-right direction with respect to the first connection part 11.

[0070] In the second probe pin 72 and the third probe pin 73, when viewed along the vertical direction, the second end 122 and the first end 111 are in positions where at least a portion of each other overlaps. That is, in the second probe pin 72 and the third probe pin 73, in the left-right direction, at least a portion of the second end 122 is in the same position as at least a portion of the first end 111. Also, in the second probe pin 72 and the third probe pin 73, the first end 111 and the second end 122 are located on the same side in the left-right direction with respect to the elastic portion 13. In the second probe pin 72 and the third probe pin 73, when viewed along the vertical direction, the second end 122 and the inclined surface 111A are in positions where at least a portion of each other overlaps. That is, in the second probe pin 72 and the third probe pin 73, in the left-right direction, at least a portion of the second end 122 is in the same position as at least a portion of the inclined surface 111A. Furthermore, in the case of the second probe pin 72 and the third probe pin 73, the inclined surface 111A and the second end portion 122 are located on the same side in the left-right direction with respect to the elastic portion 13.

[0071] As shown in Figure 5, the inclined surface 111A is provided on the left side of the first end 111 for the first probe pin 71 and the second probe pin 72. As shown in Figure 6, the inclined surface 111A is provided on the right side of the first end 111 for the third probe pin 73 and the fourth probe pin 74. The left side in Figures 5 and 6 (and Figures 7 to 10 described later) is an example of one side in the left-right direction, and the right side in Figures 5 and 6 (and Figures 7 to 10 described later) is an example of the other side in the left-right direction.

[0072] As shown in Figures 5 and 6, the second end 121 of the first probe pin 71 is located to the left of the second end 122 of the third probe pin 73. In other words, when viewed along the front-to-back direction, the second end 121 of the first probe pin 71 does not overlap with the second end 122 of the third probe pin 73. That is, in the left-to-right direction, the second end 121 of the first probe pin 71 is in a different position from the second end 122 of the third probe pin 73. However, when viewed along the front-to-back direction, the second end 121 of the first probe pin 71 may overlap only a portion of the second end 122 of the third probe pin 73. In other words, in the left-to-right direction, the second end 121 of the first probe pin 71 may be in a partially identical position to the second end 122 of the third probe pin 73.

[0073] The second end 122 of the second probe pin 72 is located to the left of the second end 121 of the fourth probe pin 74. In other words, when viewed along the front-to-back direction, the second end 122 of the second probe pin 72 does not overlap with the second end 121 of the fourth probe pin 74. That is, in the left-to-right direction, the second end 122 of the second probe pin 72 is in a different position from the second end 121 of the fourth probe pin 74. However, when viewed along the front-to-back direction, the second end 122 of the second probe pin 72 may overlap only a portion of the second end 121 of the fourth probe pin 74. In other words, in the left-to-right direction, the second end 122 of the second probe pin 72 may be in a partially identical position to the second end 121 of the fourth probe pin 74.

[0074] As mentioned above, in the first probe pin 71 and the second probe pin 72, the inclined surface 111A is provided on the left side of the first end 111. Also, the second end 121 of the first probe pin 71 is located to the left of the second end 122 of the third probe pin 73, and the second end 122 of the second probe pin 72 is located to the left of the second end 121 of the fourth probe pin 74. In other words, the inclined surface 111A of the first end 111 of the first probe pin 71 is located on the left side in the left-right direction, which is the side of the first end 111 of the first probe pin 71 that is positioned relative to the second end 122 of the third probe pin 73. Furthermore, the inclined surface 111A of the first end 111 of the second probe pin 72 is located on the left side in the left-right direction, which is the side of the first end 111 of the second probe pin 72 that the second end 122 of the second probe pin 72 is positioned relative to the second end 121 of the fourth probe pin 74.

[0075] As mentioned above, in the third probe pin 73 and the fourth probe pin 74, the inclined surface 111A is provided on the right side of the first end 111. Also, the second end 122 of the third probe pin 73 is located to the right of the second end 121 of the first probe pin 71, and the second end 121 of the fourth probe pin 74 is located to the right of the second end 122 of the second probe pin 72. In other words, the inclined surface 111A of the first end 111 of the third probe pin 73 is located on the right side of the first end 111 of the third probe pin 73, in the left-right direction, which is the side where the second end 122 of the third probe pin 73 is located relative to the second end 121 of the first probe pin 71. Furthermore, the inclined surface 111A of the first end 111 of the fourth probe pin 74 is located on the right side of the first end 111 of the fourth probe pin 74 in the left-right direction, which is the side where the second end 121 of the fourth probe pin 74 is positioned relative to the second end 122 of the second probe pin 72.

[0076] The first probe pin 71, the second probe pin 72, the third probe pin 73, and the fourth probe pin 74 can provide the following effects.

[0077] In the first probe pin 71, the second probe pin 72, the third probe pin 73, and the fourth probe pin 74, the length L2 along the vertical direction between end 11A and end 12A is longer than the inner diameter R1 of the curve of the elastic portion 13. The edge 12B of the second connecting portion 12 on the first connecting portion 11 side in the vertical direction extends so that it moves away from the elastic portion 13 in the left-right direction and away from the first connecting portion 11 in the vertical direction. Therefore, the vertical stroke of the elastic portion 13 can be increased in the first probe pin 71, the second probe pin 72, the third probe pin 73, and the fourth probe pin 74. As a result, the contact reliability of the probe pins 7 can be improved.

[0078] The second portion 132 extends so that it approaches the second end 13B in the left-right direction and approaches the first end 13A in the up-down direction. Therefore, the portion occupied by the elastic part 13 can be reduced in each probe pin 7.

[0079] The elastic section 13 comprises a plurality of elongated plate sections 134. The elongated plate sections 134 are longer in the width direction the further they are located on the outside of the curved shape of the curved section 133. This makes the elastic section 13 more flexible.

[0080] The first end portion 111 has an inclined surface 111A that can contact the object to be contacted 8. For example, if the terminal 81 of the object to be contacted 8 has a curved portion at its tip, the inclined surface 111A will contact the curved portion of the terminal 81 from one side in the left-right direction. If only one side of the curved portion of the terminal 81 is gold-plated and the other side is tin-plated, the inclined surface 111A can be brought into contact with the gold-plated portion.

[0081] The first end portion 111 is equipped with a projection 111B in addition to the inclined surface 111A. Therefore, the first end portion 111 can make contact with the object 8 at multiple points.

[0082] The first probe pin 71 and the fourth probe pin 74 can provide the following effects.

[0083] When viewed along the vertical direction, the second ends 121 of the first probe pin 71 and the fourth probe pin 74 are located away from the inclined surface 111A. Therefore, in a configuration in which the first probe pin 71 and the third probe pin 73 are arranged side by side in the front-to-back direction, the left-to-right positions of the second end 121 of the first probe pin 71 and the second end 122 of the third probe pin 73 can be set to different positions. Similarly, in a configuration in which the fourth probe pin 74 and the second probe pin 72 are arranged side by side in the front-to-back direction, the left-to-right positions of the second end 121 of the fourth probe pin 74 and the second end 122 of the second probe pin 72 can be set to different positions.

[0084] The second connecting portion 12 of the first probe pin 71 and the fourth probe pin 74 has a notch 12C. This allows the second end portion 121 to bend in the vertical direction.

[0085] The second probe pin 72 and the third probe pin 73 can provide the following effects.

[0086] When viewed along the vertical direction, at least a portion of the second end 122 of the second probe pin 72 and the third probe pin 73 overlaps with at least a portion of the inclined surface 111A. Therefore, in a configuration in which the second probe pin 72 and the fourth probe pin 74 are arranged side by side in the front-to-back direction, the left-to-right positions of the second end 122 of the second probe pin 72 and the second end 121 of the fourth probe pin 74 can be set to different positions. Similarly, in a configuration in which the third probe pin 73 and the first probe pin 71 are arranged side by side in the front-to-back direction, the left-to-right positions of the second end 122 of the third probe pin 73 and the second end 121 of the first probe pin 71 can be set to different positions.

[0087] Inspection socket 1 can provide the following benefits:

[0088] The second end 121 of the first probe pin 71 is located to the left of the second end 122 of the third probe pin 73, and the second end 122 of the second probe pin 72 is located to the left of the second end 121 of the fourth probe pin 74. With this configuration, when the first probe pins 71 and the third probe pins 73 are arranged alternately in the front-to-back direction, the pitch between two adjacent second ends in the front-to-back direction can be increased. This will be described in detail below. If the left-to-right positions of the second end 121 of the first probe pin 71 and the second end 122 of the third probe pin 73 are the same, then the second ends 121 and 122 of the first probe pins 71 and the third probe pins 73, when arranged alternately in the front-to-back direction, will be adjacent to each other in the front-to-back direction. On the other hand, if the second end 121 of the first probe pin 71 is located to the left of the second end 122 of the third probe pin 73, the second ends 121 and 122 of the first probe pin 71 and third probe pin 73, which are arranged alternately in the front-to-back direction, will not be adjacent to each other in the front-to-back direction. In this case, the second ends 121 and 121 of the two first probe pins 71 will be adjacent to each other in the front-to-back direction. In other words, the pitch between two adjacent second ends becomes larger because the third probe pin 73 is not located between the two first probe pins 71. Similarly, if the second probe pin 72 and fourth probe pin 74 are arranged alternately in the front-to-back direction, the pitch between two adjacent second ends in the front-to-back direction can also be increased. As a result, the contact reliability of the inspection socket 1 can be improved.

[0089] If the spacing between the probe pins is narrow, the spacing between the pads on the substrate on which the inspection socket is mounted will also be narrow, which may make it difficult to form each pad. In the inspection socket 1 of this embodiment, as described above, the pitch between two adjacent second ends in the front-to-back direction can be increased. This allows for a wider spacing between the pads on the substrate, making it easier to form each pad.

[0090] When viewed along the vertical direction, the first end 111 of the first probe pin 71 and the fourth probe pin 74 are located away from the second end 121. When viewed along the vertical direction, the first end 111 and the second end 122 of the second probe pin 72 and the third probe pin 73 are located in overlapping positions. As a result, when the first probe pin 71 and the third probe pin 73 are arranged alternately in the front-to-back direction, the left-to-right positions of the second end 121 of the first probe pin 71 and the second end 122 of the third probe pin 73 can be set to be different. Also, when the second probe pin 72 and the fourth probe pin 74 are arranged alternately in the front-to-back direction, the left-to-right positions of the second end 122 of the second probe pin 72 and the second end 121 of the fourth probe pin 74 can be set to be different.

[0091] The third probe pin 73 has the same configuration as the second probe pin 72, but is positioned in the opposite direction to the second probe pin 72 in the left-right direction. The fourth probe pin 74 has the same configuration as the first probe pin 71, but is positioned in the opposite direction to the first probe pin 71 in the left-right direction. This reduces the number of types of probe pins that the inspection socket 1 can have.

[0092] The inclined surfaces 111A of the first probe pin 71 and the second probe pin 72, which are positioned opposite each other in the left-right direction, face the same side in the left-right direction. The inclined surfaces 111A of the third probe pin 73 and the fourth probe pin 74, which are positioned opposite each other in the left-right direction, face the same side in the left-right direction. This allows the inclined surfaces 111A of two probe pins positioned opposite each other in the left-right direction to contact the object 8 from the same side in the left-right direction.

[0093] The inclined surfaces 111A of the first probe pin 71 and the third probe pin 73, which are arranged side by side in the front-to-back direction, face opposite directions in the left-to-right direction. The inclined surfaces 111A of the second probe pin 72 and the fourth probe pin 74, which are arranged side by side in the front-to-back direction, face opposite directions in the left-to-right direction. This allows the inclined surfaces 111A of two probe pins arranged side by side in the front-to-back direction to contact the object 8 from opposite sides in the left-to-right direction.

[0094] Viewed along the front-to-back direction, the inclined surfaces 111A of the first probe pin 71 and the third probe pin 73, which are arranged side by side in the front-to-back direction, face each other in the left-to-right direction. Viewed along the front-to-back direction, the inclined surfaces 111A of the second probe pin 72 and the fourth probe pin 74, which are arranged side by side in the front-to-back direction, face each other in the left-to-right direction. This allows the inclined surface 111A of each probe pin to contact the object 8 from the outside in the left-to-right direction.

[0095] Each of the first probe pins 71, 72, 73, and 74 has only one inclined surface 111A that can contact the object to be contacted 8. If the first end 111 had two inclined surfaces that could contact the object to be contacted 8, the object to be contacted 8 would be pressed against one inclined surface, increasing the likelihood that it would move away from the other inclined surface. However, this configuration reduces the possibility of the inclined surface 111A not contacting a desired position on the object to be contacted 8.

[0096] The inspection socket 1 can also be configured as follows:

[0097] In the embodiment described above, a configuration is described in which the inspection socket 1 is equipped with two types of probe pins 7. One of the two types of probe pins 7 is a first probe pin 71 and a fourth probe pin 74, which have the same configuration as each other. The other of the two types of probe pins 7 is a second probe pin 72 and a third probe pin 73, which have the same configuration as each other. However, the types of probe pins 7 equipped in the inspection socket 1 are not limited to two types.

[0098] Figures 7 and 8 show a configuration in which the inspection socket 1 is equipped with four types of probe pins 7. In Figures 7 and 8, parts with the same configuration as the probe pins shown in Figures 5 and 6 are denoted by the same reference numerals and their descriptions are omitted. In the configuration shown in Figures 7 and 8, the first probe pin 71, the second probe pin 72, the third probe pin 73, and the fourth probe pin 74 each have second ends with different configurations. Specifically, the first probe pin 71 has a second end 123, the second probe pin 72 has a second end 124, the third probe pin 73 has a second end 125, and the fourth probe pin 74 has a second end 126. The second ends 123, 124, 125, and 126 differ in the number of notches they have. The second end 123 has three notches, the second end 124 has two notches, the second end 125 has no notches, and the second end 126 has one notch.

[0099] In the embodiment described above, a configuration was described in which the first end portion 111 has only one inclined surface 111A that can contact the object to be contacted 8. However, the first end portion 111 may have multiple inclined surfaces.

[0100] Figures 9 and 10 show a configuration in which the first end 111 has two inclined surfaces (inclined surface 111A and a second inclined surface 111C). In Figures 9 and 10, parts with the same configuration as the probe pins shown in Figures 5 and 6 are denoted by the same reference numerals and their descriptions are omitted. In the configuration shown in Figures 9 and 10, the first end 111 of each probe pin 7 has an inclined surface 111A in addition to a second inclined surface 111C. The second inclined surface 111C is opposite to the inclined surface 111A in the left-right direction. The inclined surface 111C is inclined in the opposite direction to the inclined surface 111A, which is opposite to it in the left-right direction. For example, if the inclined surface 111A is inclined to face upwards to the right, the second inclined surface 111C is inclined to face upwards to the left. The terminal 81 of the object to be contacted 8 can contact the second inclined surface 111C, just as it can contact the inclined surface 111A. The inclined surface 111A contacts the curved portion of the terminal 81 from one side in the left-right direction. On the other hand, the second inclined surface 111C contacts the curved portion of the terminal 81 from the other side in the left-right direction.

[0101] Housings 2, 3, 4, 5, and 6 can be arbitrarily modified in shape and configuration according to the design of the inspection socket 1, etc. For example, the shape of housings 2, 3, 4, 5, and 6 is not limited to a roughly rectangular prism shape, but may also be a roughly cylindrical shape, or a roughly polygonal shape other than a roughly rectangular prism shape. Housing 10 is not limited to being composed of five members, but may also be composed of one member, or a number of members other than five.

[0102] The number of probe pins 7 on the inspection socket 1 can be arbitrarily changed depending on the design of the inspection socket 1.

[0103] For example, in the configuration shown in Figures 3 and 4, the probe pin 7 comprises 13 first probe pins 71, 13 second probe pins 72, 13 third probe pins 73, 13 fourth probe pins 74, 2 fifth probe pins 75, and 2 sixth probe pins 76. Here, a pair of probe pins 71 and 72 facing each other in the left-right direction and a pair of probe pins 73 and 74 facing each other in the left-right direction are arranged in a front-back direction to form one probe tweezers set. In this case, in the configuration shown in Figures 3 and 4, 13 probe tweezers are arranged in the front-back direction. With this arrangement, when viewed along the vertical direction, the left-right positions of adjacent second ends 121 and 122 are different. The number of probe tweezers arranged in the front-back direction may be other than 13.

[0104] Furthermore, for example, the probe pin 7 may have additional probe pins between the pair of probe pins 71, 72 and the pair of probe pins 73, 74 in the left-right direction. For example, as shown in Figure 13, the probe pin 7 may have a pair of intermediate probe pins 77, 78 (in other words, a first intermediate probe pin 77 and a second intermediate probe pin 78) between the pair of probe pins 71, 72 and the pair of probe pins 73, 74 in the left-right direction. In other words, the probe pin 7 has a row of pairs of probe pins 71, 72, a row of pairs of probe pins 73, 74, and a row of pairs of intermediate probe pins 77, 78. The first intermediate probe pin 77 is an example of a fifth pin. The second intermediate probe pin 78 is an example of a sixth pin.

[0105] In the following description, commonalities with the previously described embodiments are denoted by the same reference numerals, and their explanations are generally omitted, although they will be explained as necessary.

[0106] Figure 11 is a perspective view showing an inspection socket in another embodiment of the present disclosure. Figure 12 is an exploded perspective view of the inspection socket of Figure 11.

[0107] The inspection socket 1 shown in Figure 1 corresponds to a contact target 8 having two rows of terminals 81. On the other hand, the inspection socket 1A shown in Figures 11 and 12 corresponds to a contact target having three rows of terminals 81. Therefore, the inspection socket 1A has one row of through holes 3C between two rows of through holes 3B.

[0108] Figure 13 is a perspective view of the probe pins and intermediate probe pins. As shown in Figure 13, the probe pins 7 include a first probe pin 71, a second probe pin 72, a third probe pin 73, a fourth probe pin 74, a fifth probe pin 75, a sixth probe pin 76, a first intermediate probe pin 77, and a second intermediate probe pin 78. The probe pins 71 to 78 are spaced apart from each other. In Figures 13 and later, the fifth probe pin 75 and the sixth probe pin 76 are not shown.

[0109] The first intermediate probe pin 77 and the second intermediate probe pin 78 are signal terminals, but are not limited to signal terminals.

[0110] The first intermediate probe pin 77 and the second intermediate probe pin 78 have generally the same configuration as the first to fourth probe pins 71, 72, 73, and 74, but differ in their configurations as described below.

[0111] Figure 14 is a front view of the probe pin and intermediate probe pin. As shown in Figures 13 and 14, the first intermediate probe pin 77 is positioned between the first probe pin 71 and the second probe pin 72 in the left-right direction. The second intermediate probe pin 78 is positioned between the third probe pin 73 and the fourth probe pin 74 in the left-right direction.

[0112] In the left-right direction, the distance between the first intermediate probe pin 77 and the second intermediate probe pin 78 and the first probe pin 71 and the third probe pin 73 is the same as the distance between the first intermediate probe pin 77 and the second intermediate probe pin 78 and the second probe pin 72 and the fourth probe pin 74. However, these distances may differ from each other.

[0113] The first intermediate probe pin 77 and the second intermediate probe pin 78 are arranged alternately in the front-to-back direction.

[0114] Figure 15 is a front view of the second intermediate probe pin. As shown in Figures 14 and 15, the first intermediate probe pin 77 and the second intermediate probe pin 78 have some structural differences from each other.

[0115] The orientation of the first end 111 of the first intermediate probe pin 77 is the same as that of the first probe pin 71 and the second probe pin 72. The orientation of the first end 111 of the second intermediate probe pin 78 is the same as that of the third probe pin 73 and the fourth probe pin 74. In other words, in the left-right direction, the first end 111 of the first intermediate probe pin 77 is oriented in the opposite direction to that of the first end 111 of the second intermediate probe pin 78.

[0116] When viewed along the front-to-back direction, the second end 121 of the first intermediate probe pin 77 and the second end 122 of the second intermediate probe pin 78 are in different positions. With this configuration, when the first intermediate probe pin 77 and the second intermediate probe pin 78 are arranged alternately in the front-to-back direction, the pitch between two adjacent second ends in the front-to-back direction can be increased.

[0117] The first intermediate probe pin 77 and the second intermediate probe pin 78 are equipped with an elastic portion 14. The length of the elastic portion 14 in the left-right direction is shorter than the length of the elastic portion 13 in the left-right direction. This is because, in this embodiment, it is difficult to place an elastic portion that is long in the left-right direction in the narrow space between the pair of probe pins 71, 72 and the pair of probe pins 73, 74. In other words, the length of the elastic portion 13 of the first to fourth probe pins 71 to 74, which are located on the outside in the left-right direction, is longer in the left-right direction than the length of the elastic portion 14 of the first and second intermediate probe pins 77, 78, which are located in the center in the left-right direction. Therefore, the first to fourth probe pins 71 to 74 can have lower resistance than the first and second intermediate probe pins 77, 78, allowing them to carry a larger current and improving high-frequency characteristics.

[0118] As shown in Figure 14, the width W1 of the elastic part 14 is smaller than the width W2 of the elastic part 13. Widths W1 and W2 are the lengths in the width direction of the elastic parts 14 and 13, respectively. The width direction is perpendicular to both the front-rear direction and the extending direction in which the elastic part 13 extends. In other words, the elastic parts 14 of the first intermediate probe pin 77 and the second intermediate probe pin 78 are narrower than the elastic parts 13 of the first probe pin 71, the second probe pin 72, the third probe pin 73, and the fourth probe pin 74. With this configuration, when the spring constant of the elastic part 13 is smaller than the spring constant of the elastic part 14, the spring constant of the elastic part 14 can be brought closer to the spring constant of the elastic part 13 by narrowing the width of the elastic part 14 to reduce the spring constant of the elastic part 14.

[0119] The elastic portion 14 has a plurality of first portions 141 and a plurality of curved portions 143. In the configuration shown in Figures 14 and 15, the elastic portion 14 has 12 first portions 141 and 11 curved portions 143. A first portion 141 is an example of a first extension. A curved portion 143 is an example of a second extension. The number of first and second extensions is not limited to the numbers shown in Figures 14 and 15, respectively. The elastic portion 14 includes a plurality of first extensions and at least one second extension.

[0120] The aforementioned elastic portion 13 has one curved portion 133. On the other hand, the elastic portion 14 has multiple (11 in Figures 14 and 15) curved portions 143. In other words, the number of second extensions of the first intermediate probe pin 77 and the second intermediate probe pin 78 is greater than the number of second extensions of the first probe pin 71, the second probe pin 72, the third probe pin 73, and the fourth probe pin 74. With this configuration, if the spring constant of the elastic portion 13 is smaller than the spring constant of the elastic portion 14, the spring constant of the elastic portion 14 can be brought closer to the spring constant of the elastic portion 13 by increasing the number of second extensions of the elastic portion 14 and thus reducing the spring constant of the elastic portion 14.

[0121] In other words, the elastic portion 14 is shorter in the left-right direction than the elastic portion 13, which reduces the amount of deflection. This reduction is compensated for by having multiple curved portions 143, thereby achieving a reduction in the amount of deflection equivalent to that of the elastic portion 13.

[0122] Multiple first parts 141 are arranged with spacing between them in the vertical direction. Each of the multiple first parts 141 extends along the horizontal direction. Each of the multiple curved parts 143 is curved in shape.

[0123] Each of the multiple curved sections 143 connects the ends of two vertically adjacent first sections 141. Some of the multiple curved sections 143 connect one end (the left end in Figure 14) of two first sections 141. The other curved sections 143 connect the other ends (the right end in Figure 14) of two first sections 141. The curved sections 143 that connect one end of two first sections 141 and the curved sections 143 that connect the other ends of two first sections 141 are arranged alternately along the vertical direction.

[0124] As a result of the above configuration, the elastic portion 14 has a meandering shape that extends along the vertical direction.

[0125] The elastic section 14 comprises a plurality of elongated plate sections 144 (two elongated plate sections 144A and 144B in the configuration shown in Figure 14). Each elongated plate section 144A and 144B extends from the first section 141 to the curved section 143. Each elongated plate section 144A and 144B is arranged side by side with spacing between them along the width direction of the elastic section 14. Each elongated plate section 144A and 144B has the same width, but may have different widths.

[0126] In the configuration shown in Figure 14, the first probe pin 71 and the fourth probe pin 74 have the same configuration (in other words, the same size and shape). The fourth probe pin 74 is positioned opposite to the first probe pin 71 in the left-right direction. The second probe pin 72 and the third probe pin 73 have the same configuration (in other words, the same size and shape). The third probe pin 73 is positioned opposite to the second probe pin 72 in the left-right direction. The first intermediate probe pin 77 and the second intermediate probe pin 78 have the same configuration (in other words, the same size and shape). The first intermediate probe pin 77 is positioned opposite to the second intermediate probe pin 78 in the left-right direction. This configuration reduces the number of types of probe pins 7 that the inspection socket 1A has.

[0127] In the configurations shown in Figures 11 to 14, the inspection socket 1A corresponds to an object to be contacted that has three rows of terminals 81. However, the inspection socket 1A may also correspond to an object to be contacted that has four or more rows of terminals 81.

[0128] Figure 16 is a front view of a modified probe pin and intermediate probe pin. For example, as shown in Figure 16, the probe pin 7 may have two rows of pairs of intermediate probe pins 77, 78. In this case, the inspection socket corresponds to an object to be contacted having four rows of terminals 81.

[0129] Figure 17 is a front view of a modified probe pin and intermediate probe pin. As shown in Figure 17, the probe pin 7 may have a pair of intermediate probe pins 77 and 78 instead of a pair of probe pins 71 and 72 and a pair of probe pins 73 and 74. In this case, the probe pin 7 has three or more rows (three rows in Figure 17) of pairs of intermediate probe pins 77 and 78. In Figure 17, the three first intermediate probe pins 77 are an example of the first pin, fifth pin, and second pin from left to right, and the three second intermediate probe pins 78 are an example of the third pin, sixth pin, and fourth pin from left to right.

[0130] As described above, the configurations shown in Figures 7 to 10 were explained as modified versions of the configurations shown in Figures 5 and 6. These modified versions can also be applied to the configurations shown in Figures 11 and beyond.

[0131] Figure 18 is a front view of a modified probe pin and an intermediate probe pin. For example, as shown in Figure 18, the first intermediate probe pin 77 and the second intermediate probe pin 78 may have a second inclined surface 111C.

[0132] In the configuration shown in Figure 14, the first intermediate probe pin 77 and the second intermediate probe pin 78 have different configurations, but they may also have the same configuration.

[0133] Figure 19 is a perspective view of a modified probe pin. Figure 20 is a front view of the modified probe pin. In the configuration shown in Figures 19 and 20, all of the multiple probe pins 7 are probe pins 79. As a result, only probe pins 79 are shown in Figures 19 and 20.

[0134] In the configurations shown in Figures 19 and 20, all probe pins 79 have the same configuration. Probe pins 791, 792, 793, 794, 795, and 796 shown in Figure 20 correspond to probe pins 71, 72, 73, 74, 77, and 78 shown in Figure 14, respectively. The relative positions of probe pins 791, 792, 793, 794, 795, and 796 are the same as the relative positions of probe pins 71, 72, 73, 74, 77, and 78. Probe pin 791 is an example of the first pin. Probe pin 792 is an example of the second pin. Probe pin 793 is an example of the third pin. Probe pin 794 is an example of the fourth pin. Probe pin 795 is an example of the fifth pin. Probe pin 796 is an example of the sixth pin.

[0135] As shown in Figure 20, probe pins 791, 795, and 792 are arranged in the opposite direction to probe pins 793, 796, and 794 in the left-right direction. With this configuration, the number of probe pins 7 in the inspection socket 1A can be reduced to one type.

[0136] As shown in Figure 21, the multiple probe pins 7 may include a first pin 71A, a second pin 72A, a third pin 73A, a fourth pin 74A, a fifth pin 77A, and a sixth pin 78A. The first pin 71A, the second pin 72A, the third pin 73A, the fourth pin 74A, the fifth pin 77A, and the sixth pin 78A correspond to the probe pins 71, 72, 73, 74, 77, and 78 shown in Figure 14, respectively. The relative positions of the first pin 71A, the second pin 72A, the third pin 73A, the fourth pin 74A, the fifth pin 77A, and the sixth pin 78A are the same as the relative positions of the probe pins 71, 72, 73, 74, 77, and 78.

[0137] Each of the multiple probe pins 7 has a first end 111. The first pin 71A and the fourth pin 74A each have a second end 121. The second pin 72A, the third pin 73A, the fifth pin 77A, and the sixth pin 78A each have a second end 122. The first end 111 may have different shapes in each figure, but its function of being able to contact other members remains the same. Similarly, the second ends 121 and 122 may have different shapes in each figure, but their function of being able to contact other members remains the same.

[0138] The elastic portion 15 of the first pin 71A, second pin 72A, third pin 73A, fourth pin 74A, fifth pin 77A, and sixth pin 78A has a curved and meandering shape. The elastic portion 15 has a plurality of first extensions 151 and a plurality of second extensions 153. The plurality of first extensions 151 extend along the left-right direction and are spaced apart from each other in the vertical direction. The plurality of second extensions 153 extend along the vertical direction. Each of the plurality of second extensions 153 connects the ends of two first extensions 151 that are adjacent in the vertical direction. Some of the plurality of second extensions 153 connect one end (left end in Figure 21) of two first extensions 151. Except for some of the plurality of second extensions 153, they connect the other ends (right end in Figure 21) of two first extensions 151. The second extension portion 153 connecting one end of the two first extension portions 151 and the second extension portion 153 connecting the other ends of the two first extension portions 151 are arranged alternately along the vertical direction. The elastic portion 15 is bent at the boundary between the first extension portion 151 and the second extension portion 153.

[0139] The first pin 71A, the second pin 72A, the third pin 73A, the fourth pin 74A, the fifth pin 77A, and the sixth pin 78A each have the same configuration. Each of the first pin 71A, the second pin 72A, the third pin 73A, the fourth pin 74A, the fifth pin 77A, and the sixth pin 78A has seven second extensions 153. In other words, the number of second extensions 153 is the same for each of the first pin 71A, the second pin 72A, the third pin 73A, the fourth pin 74A, the fifth pin 77A, and the sixth pin 78A. The lengths of each of the first pin 71A, the second pin 72A, the third pin 73A, the fourth pin 74A, the fifth pin 77A, and the sixth pin 78A are approximately the same. The widths of the first pin 71A, second pin 72A, third pin 73A, fourth pin 74A, fifth pin 77A, and sixth pin 78A, i.e., the width W3, are approximately the same. The width direction is perpendicular to both the front-to-back direction and the extension direction in which the elastic part 13 extends. With this configuration, the spring constants of the elastic parts of multiple probe pins 7 can be made nearly identical.

[0140] The first connection portion 11 of each of the first pin 71A, second pin 72A, third pin 73A, fourth pin 74A, fifth pin 77A, and sixth pin 78A is connected to the elastic portion 15. The first connection portion 11 includes a first end portion 111 at the end furthest from the elastic portion 15 in the vertical direction.

[0141] The first connecting portion 11 of the fifth pin 77A and the sixth pin 78A is connected to the central part of the elastic portion 15 in the left-right direction. With this configuration, the left-right positions of the first end portions 111 of the fifth pin 77A and the sixth pin 78A can be made the same.

[0142] The first connecting portions 11 of the first pin 71A, the second pin 72A, the third pin 73A, and the fourth pin 74A are connected to the ends of the elastic portion 15 in the left-right direction. For the first pin 71A and the second pin 72A, the first connecting portion 11 is connected to the end of the elastic portion 15 in the left-right direction that is on the side of the fifth pin 77A. For the third pin 73A and the fourth pin 74A, the first connecting portion 11 is connected to the end of the elastic portion 15 in the left-right direction that is on the side of the sixth pin 78A. With this configuration, the distance between two adjacent first ends 111 in the left-right direction can be reduced.

[0143] The first end 111 has a recess 112 containing two inclined surfaces 111A and 111C, similar to the configuration shown in Figures 9 and 10. The first end 111 is symmetrical with respect to the center line CL when viewed along the front-to-back direction. The center line CL is an imaginary line that passes through the center of the first end 111 in the left-to-right direction and extends along the up-to-down direction. This configuration reduces the number of probe pins 7 that the inspection socket 1A has.

[0144] In the configuration shown in Figure 21, the first pin 71A and the fourth pin 74A have the same configuration (in other words, the same size and shape). The fourth pin 74A is positioned opposite to the first pin 71A in the left-right direction. The second pin 72A and the third pin 73A have the same configuration (in other words, the same size and shape). The third pin 73A is positioned opposite to the second pin 72A in the left-right direction. The fifth pin 77A and the sixth pin 78A have the same configuration (in other words, the same size and shape). The sixth pin 78A is positioned opposite to the fifth pin 77A in the left-right direction.

[0145] The probe pin 7 can have various configurations other than the one shown in Figure 21. For example, the probe pin 7 may have the configurations shown in Figures 22 and 23.

[0146] The probe pins 7 shown in Figure 22 include pins 71B, 72B, 73B, 74B, 77B, and 78B instead of pins 71A, 72A, 73A, 74A, 77A, and 78A. Pins 71B, 72B, 73B, 74B, 77B, and 78B include the elastic portion 14 shown in Figure 14 instead of the elastic portion 15.

[0147] The probe pin 7 shown in Figure 22 differs from the probe pin 7 shown in Figure 21 in the configuration of its first end 111. The first end 111 shown in Figure 22 has a recess 112A at the bottom of the recess 112 that is further recessed in the vertical direction. The first end 111 shown in Figure 22, like the first end 111 shown in Figure 21, is symmetrical with respect to the center line CL when viewed along the front-to-back direction. The second ends 121 and 122 of the probe pin 7 shown in Figure 22 have the same configuration as the probe pin 7 shown in Figure 21.

[0148] The probe pins 7 shown in Figure 23 include pins 71C, 72C, 73C, 74C, 77C, and 78C instead of pins 71A, 72A, 73A, 74A, 77A, and 78A. Pins 71C, 72C, 73C, 74C, 77C, and 78C also include an elastic portion 16 instead of an elastic portion 15.

[0149] The elastic portion 16 has a plurality of first extending portions 161 and a plurality of second extending portions 163. The plurality of first extending portions 161 extend along the left-right direction and are spaced apart from each other in the vertical direction. The plurality of second extending portions 163 are curved. Each of the plurality of second extending portions 163 connects both ends of two vertically adjacent first extending portions 151. Thus, an annular portion is formed by two adjacent first extending portions 161 and two second extending portions 163 connecting both ends of these two first extending portions 161. The elastic portion 16 has a shape in which these annular portions are arranged vertically.

[0150] The probe pin 7 shown in Figure 23 has a different shape for its second end 121 compared to the probe pin 7 shown in Figure 21. In the probe pin 7 shown in Figure 22, all probe pins have the same shape for their second end 121. The first end 111 of the probe pin 7 shown in Figure 23 has the same configuration as the probe pin 7 shown in Figure 21.

[0151] The probe pin 7 shown in Figure 29 differs from the probe pin 7 shown in Figures 21 and 22 in the number of first and second extended portions of the elastic part. Each of the probe pins 7 shown in Figure 29 has two first extended portions 141 and one second extended portion 143. In the probe pin 7 shown in Figure 29, the first pin 71D, second pin 72D, third pin 73D, fourth pin 74D, fifth pin 77D, and sixth pin 78D are all configured the same as in the probe pin 7 shown in Figure 21.

[0152] As shown in Figures 9, 10, 18, 21-23, and 30-32, each of the multiple probe pins 7 has a first end 111 that is recessed vertically toward the end 11A, and a recess 112. With this configuration, the object to be contacted 8 can be contacted on both sides of the recess 112 in the left-right direction, that is, multi-point contact is possible. As a result, even if the thickness of the probe pin 7 (in other words, the length of the probe pin 7 in the front-rear direction) is thin, the contact area between the probe pin 7 and the object to be contacted 8 can be increased.

[0153] The recesses 112 shown in the figures above include a first inclined surface 111A and a second inclined surface 111C. The first inclined surface 111A and the second inclined surface 111C are opposite each other in the left-right direction. As the first inclined surface 111A and the second inclined surface 111C approach the second ends 121 and 122 in the vertical direction, that is, as they move downward, they move closer to each other in the left-right direction. With this configuration, the object to be contacted 8 can be brought into contact with both the first inclined surface 111A and the second inclined surface 111C.

[0154] The recess 112 does not necessarily include the inclined surfaces 111A and 111C. For example, the recess 112 may include a pair of sides extending in the vertical direction and a bottom surface extending in the horizontal direction that connects the pair of sides.

[0155] In the recess 112 shown in Figures 9, 10, 18, 21-23, and 30-32, the length of each of the multiple probe pins 7 along the front-rear direction is less than or equal to the longer of the lengths along the left-right direction between the bottom position of the recess 112 and the right end (one end position in the left-right direction) and the left end (the other end position) of the first end 111. As shown in Figure 24, the length of each of the multiple probe pins 7 along the front-rear direction is the thickness T of the probe pin 7. The bottom position is the position in the recess 112 closest to the other end of the probe pin 7 in the vertical direction (in this embodiment, the lower end of the probe pin 7). In other words, in this embodiment, the bottom position is the lowest position of the recess 112.

[0156] For example, in each of the multiple probe pins 7 shown in Figure 9, as shown in Figure 25, the length L3 along the left-right direction between the bottom position 1121 of the recess 112 and the right end 1111 of the first end 111 is longer than the length L4 along the left-right direction between the bottom position 1121 of the recess 112 and the left end 1112 of the first end 111. Therefore, the thickness T of the probe pin 7 is less than or equal to the length L3. Preferably, the thickness T is less than or equal to the length L4.

[0157] For example, in each of the multiple probe pins 7 shown in Figure 14, as shown in Figure 26, the length L3 along the left-right direction between the bottom position 1131 of the recess 113 and the right end 1111 of the first end 111 is longer than the length L4 along the left-right direction between the bottom position 1131 of the recess 113 and the left end 1112 of the first end 111. Therefore, the thickness T of the probe pin 7 is less than or equal to the length L3. Preferably, the thickness T is less than or equal to the length L4.

[0158] For example, in each of the multiple probe pins 7 shown in Figure 21, as shown in Figure 27, the length L3 along the left-right direction between the bottom position 1121 of the recess 112 and the right end 1111 of the first end 111 is equal to the length L4 along the left-right direction between the bottom position 1121 of the recess 112 and the left end 1112 of the first end 111. Therefore, the thickness T of the probe pin 7 is less than or equal to the length L3 and less than or equal to the length L4. The above-described relationship between each length and thickness is also the same for the probe pin 7 shown in Figure 30, which has the same configuration as the first end 111 in Figure 21, and the probe pin 7 shown in Figure 32, which has substantially the same configuration as the first end 111 in Figure 21.

[0159] For example, in each of the multiple probe pins 7 shown in Figure 22, the bottom position of the recess 112 is the bottom position of the recess 112A within the recess 112. In each of the multiple probe pins 7 shown in Figure 22, as shown in Figure 28, the length L3 along the left-right direction between the bottom position 112Aa of the recess 112A and the right end 1111 of the first end 111 is equal to the length L4 along the left-right direction between the bottom position 112Aa of the recess 112A and the left end 1112 of the first end 111. Therefore, the thickness T of the probe pin 7 is less than or equal to the length L3 and less than or equal to the length L4. The above-mentioned relationship between each length and thickness is also the same for the probe pin 7 shown in Figure 31, which has the same configuration as the first end 111 in Figure 22.

[0160] As shown in Figure 24, the length of each of the multiple probe pins 7 along the front-to-back direction, that is, the thickness T of each of the multiple probe pins 7, is less than half the distance between two adjacent probe pins 7 in the front-to-back direction. With this configuration, the thickness T can be made thin. With this configuration, the possibility of the probe pins 7 coming into contact with the insulator between adjacent terminals 81 on the object to be contacted 8 can be reduced.

[0161] In this embodiment, the distance between two adjacent probe pins 7 in the front-to-back direction is the distance between the center positions of the two probe pins 7 in the front-to-back direction, that is, the pitch G1 between the two adjacent probe pins 7 in the front-to-back direction. In other words, the thickness T is less than or equal to half (G1 / 2) of the pitch G1 between the two adjacent probe pins 7 in the front-to-back direction. With this configuration, the thickness T can be made thin.

[0162] The distance between two adjacent probe pins 7 in the front-to-back direction is not limited to the pitch G1. For example, the distance between two adjacent probe pins 7 in the front-to-back direction may be the shortest distance G2 between the opposing surfaces 7A and 7B of the two adjacent probe pins in the front-to-back direction. In this case, the thickness T is less than or equal to half of the shortest distance G2 (G1 / 2). This configuration allows for a thinner thickness T.

[0163] In this embodiment, the minimum value of the shortest distance G2 is 0.05 mm, and the maximum value of the shortest distance G2 is 0.2 mm. Figure 33 shows the results of the withstand voltage test. The withstand voltage test is performed, for example, as follows: A voltage is applied between two adjacent probe pins 7 held in the housing 5, and the voltage at which the two probe pins 7 are short-circuited, i.e., when dielectric breakdown occurs, is measured as the withstand voltage. In Figure 33, the horizontal axis represents the value of the shortest distance G2 between two adjacent probe pins 7, and the vertical axis represents the withstand voltage corresponding to the shortest distance G2. As shown in Figure 33, a withstand voltage of 250 V or more can be ensured by having a shortest distance G2 of 0.05 mm or more. When the shortest distance G2 is 0.2 mm or less, the distance between adjacent probe pins 7 in the front-to-back direction is small. Therefore, the configuration of this disclosure, in which the first and second ends of adjacent probe pins 7 in the front-to-back direction are provided at different positions in the left-to-right direction, is a preferred application example.

[0164] Having described in detail various embodiments of this disclosure with reference to the drawings above, we will now conclude by describing various aspects of this disclosure. Reference numerals are also included in the following description as an example.

[0165] The inspection socket 1 in the first aspect of this disclosure is Housing 5 and It comprises a first probe pin 71, a second probe pin 72, a third probe pin 73, and a fourth probe pin 74, each having a first end 111 provided at one end in the first direction and second ends 121 and 122 provided at the other end in the first direction, and each being supported by the housing 5. The first probe pin 71 and the second probe pin 72 are positioned opposite each other with a gap between them in a second direction intersecting the first direction. The third probe pin 73 and the fourth probe pin 74 are arranged opposite each other with a gap between them in the second direction. In a third direction intersecting the first and second directions, the first probe pin 71 and the third probe pin 73 are arranged side by side. In the third direction, the second probe pin 72 and the fourth probe pin 74 are arranged side by side. Each of the first probe pins 71, 72, 73, and 74 has a first end 111 that can contact the object to be contacted 8, The second end 121 of the first probe pin 71 is located on one side in the second direction relative to the second end 122 of the third probe pin 73. The second end 122 of the second probe pin 72 is located on one side in the second direction relative to the second end 121 of the fourth probe pin 74.

[0166] The inspection socket 1 of the second aspect of this disclosure is, in the inspection socket 1 of the first aspect, Viewed along the first direction, the first end 111 of the first probe pin 71 is located away from the second end 121 of the first probe pin 71. Viewed along the first direction, the first end 111 of the fourth probe pin 74 is located away from the second end 121 of the fourth probe pin 74. Viewed along the first direction, the first end 111 of the second probe pin 72 and the second end 122 of the second probe pin 72 are in positions that overlap each other. Viewed along the first direction, the first end 111 of the third probe pin 73 and the second end 122 of the third probe pin 73 are in positions that overlap each other.

[0167] The inspection socket 1 of the third aspect of this disclosure is, in the inspection socket 1 of the first or second aspect, The third probe pin 73 has the same configuration as the second probe pin 72 and is arranged in the opposite direction to the second probe pin 72 in the second direction. The fourth probe pin 74 has the same configuration as the first probe pin 71, but is arranged in the opposite direction to the first probe pin 71 in the second direction.

[0168] The inspection socket 1 of the fourth aspect of this disclosure is, in any one of the inspection sockets 1 of the first to third aspects, The inclined surface 111A of the first end 111 of the first probe pin 71 and the inclined surface 111A of the first end 111 of the second probe pin 72 face the same side in the second direction. The inclined surface 111A of the first end 111 of the third probe pin 73 and the inclined surface 111A of the first end 111 of the fourth probe pin 74 face the same side in the second direction.

[0169] The inspection socket 1 of the fifth aspect of this disclosure is the same as the inspection socket 1 of the fourth aspect, The inclined surface 111A of the first end 111 of the first probe pin 71 and the inclined surface 111A of the first end 111 of the third probe pin 73 face opposite directions in the second direction. The inclined surface 111A of the first end 111 of the second probe pin 72 and the inclined surface 111A of the first end 111 of the fourth probe pin 74 face opposite directions in the second direction.

[0170] The inspection socket 1 of the sixth aspect of this disclosure is the same as the inspection socket 1 of the fifth aspect, Viewed along the third direction, the inclined surface 111A of the first end 111 of the first probe pin 71 and the inclined surface 111A of the first end 111 of the third probe pin 73 face each other in the second direction. Viewed along the third direction, the inclined surface 111A of the first end 111 of the second probe pin 72 and the inclined surface 111A of the first end 111 of the fourth probe pin 74 face each other in the second direction.

[0171] The inspection socket 1 of the seventh aspect of this disclosure is, in any one of the inspection sockets 1 of the first to sixth aspects, Each of the first probe pins 71, 72, 73, and 74 has only one inclined surface 111A that can contact the object to be contacted 8.

[0172] The inspection socket 1 of the eighth aspect of this disclosure is, in any one of the inspection sockets 1 of the first to seventh aspects, The inclined surface 111A of the first end 111 of the first probe pin 71 is located in the second direction on the side of the first end 111 of the first probe pin 71 where the second end 121 of the first probe pin 71 is positioned relative to the second end 122 of the third probe pin 73. The inclined surface 111A of the first end 111 of the second probe pin 72 is located in the second direction on the side of the first end 111 of the second probe pin 72 where the second end 122 of the second probe pin 72 is positioned relative to the second end 121 of the fourth probe pin 74. The inclined surface 111A of the first end 111 of the third probe pin 73 is located in the second direction on the side of the first end 111 of the third probe pin 73 where the second end 122 of the third probe pin 73 is positioned relative to the second end 121 of the first probe pin 71. The inclined surface 111A of the first end 111 of the fourth probe pin 74 is located in the second direction on the side of the first end 111 of the fourth probe pin 74 where the second end 121 of the fourth probe pin 74 is positioned relative to the second end 122 of the second probe pin 72.

[0173] The inspection socket 1A in the ninth aspect of this disclosure is Housing 4 and Each comprises a plurality of probe pins 7 supported by the housing 4, Each of the plurality of probe pins 7 is A first end portion 111 is provided at one end in the first direction and is capable of contacting the object to be contacted 8, It has second ends 121, 122 provided at the other end in the first direction and capable of contacting other members, The aforementioned plurality of probe pins 7 include a first pin 71, a second pin 72, a third pin 73, a fourth pin 74, a fifth pin 77, and a sixth pin 78. The first pin 71 and the second pin 72 are spaced apart in a second direction intersecting the first direction. The third pin 73 and the fourth pin 74 are arranged with a gap between them in the second direction. The fifth pin 77 is located between the first pin 71 and the second pin 72 in the second direction. The sixth pin 78 is located between the third pin 73 and the fourth pin 74 in the second direction. In a third direction intersecting the first and second directions, the first pin 71 and the third pin 73 are arranged side by side. In the third direction, the second pin 72 and the fourth pin 74 are arranged side by side. In the third direction, the fifth pin 77 and the sixth pin 78 are arranged side by side. The second end 121 of the first pin 71 and the second end 122 of the third pin 73 are located at different positions in the second direction. The second end 122 of the second pin 72 and the second end 121 of the fourth pin 74 are located in different positions in the second direction. The second end 122 of the fifth pin 77 and the second end 122 of the sixth pin 78 are located at different positions in the second direction.

[0174] The inspection socket 1A of the tenth aspect of this disclosure is, in the case of the inspection socket 1A of the ninth aspect, The first end portion 111 is symmetrical with respect to a center line CL that passes through the center of the first end portion 111 in the second direction and extends along the first direction, when viewed along the third direction.

[0175] The inspection socket 1A of the 11th aspect of this disclosure is the same as the inspection socket 1A of the 9th or 10th aspect, Each of the plurality of probe pins 7 has an elastic portion 14, The elastic portion 14 is A plurality of first parts 141, each extending along the second direction and spaced apart from one another in the first direction, It includes at least one curved portion 143 connected to the ends of two adjacent first portions 141, In each of the plurality of probe pins 7, the number of curved portions 143 is the same, the length of the curved portions 143 along the extending direction is approximately the same, and the length of the curved portions 143 in the width direction perpendicular to the extending direction is approximately the same.

[0176] The inspection socket 1A of the 12th aspect of this disclosure is an inspection socket 1A of any one of the 9th to 11th aspects, Each of the plurality of probe pins 7 is Elastic part 14 and It has a first connecting portion 11 connected to the elastic portion 14, The first connecting portion 11 includes the first end portion 111 at the end furthest from the elastic portion 14 in the first direction, The first connecting portion 11 of the fifth pin 77 and the sixth pin 78 is connected to the central portion of the elastic portion 14 in the second direction.

[0177] The inspection socket 1A of the 13th aspect of this disclosure is the same as the inspection socket 1A of the 12th aspect, In the first pin 71 and the second pin 72, the first connecting portion 11 is connected to the end of the elastic portion 14 on the fifth pin 77 side in the second direction. In the third pin 73 and the fourth pin 74, the first connecting portion 11 is connected to the end of the elastic portion 14 on the sixth pin 78 side in the second direction.

[0178] The inspection socket 1A of the 14th aspect of this disclosure is an inspection socket 1A of any one of the 9th to 13th aspects, Each of the plurality of probe pins 7 has elastic portions 13, 14, The elastic parts 13 and 14 are A plurality of first parts 131, 141, each extending along the second direction and spaced apart from each other in the first direction, It includes at least one curved portion 133, 143 connected to the ends of two adjacent first portions 141, The elastic portions 13 of the first pin 71, the second pin 72, the third pin 73, and the fourth pin 74 are longer in the second direction than the elastic portions 14 of the fifth pin 77 and the sixth pin 78.

[0179] The inspection socket 1A of the 15th aspect of this disclosure is the same as the inspection socket 1A of the 14th aspect, The elastic portions 14 of the fifth pin 77 and the sixth pin 78 are narrower than the elastic portions 13 of the first pin 71, the second pin 72, the third pin 73, and the fourth pin 74.

[0180] The inspection socket 1A of the 16th aspect of this disclosure is the same as the inspection socket 1A of the 14th or 15th aspect, The number of curved portions 143 on each of the fifth pin 77 and the sixth pin 78 is greater than the number of curved portions 133 on each of the first pin 71, the second pin 72, the third pin 73, and the fourth pin 74.

[0181] The inspection socket 1A of the 17th aspect of this disclosure is an inspection socket 1A of any one of the 9th to 16th aspects, The third pin 73 has the same configuration as the second pin 72 and is arranged in the opposite direction to the second pin 72 in the second direction. The fourth pin 74 has the same configuration as the first pin 71, but is arranged in the opposite direction to the first pin 71 in the second direction.

[0182] The inspection socket 1A of the 18th aspect of this disclosure is, in any one of the inspection sockets 1A of the 9th to 11th aspects, The aforementioned multiple probe pins 7 have the same configuration, The first pin 71, the fifth pin 77, and the second pin 72 are arranged in opposite directions to the third pin 73, the sixth pin 78, and the fourth pin 74 in the second direction.

[0183] The inspection socket 1 in the 19th aspect of this disclosure is Housing 2 and Each comprises a plurality of probe pins 7 supported by the housing 2, Each of the plurality of probe pins 7 is A first end portion 111 is provided at one end in the first direction and is capable of contacting the object to be contacted 8, It has second ends 121, 122 provided at the other end in the first direction and capable of contacting other members, The aforementioned plurality of pins include a first pin 71, a second pin 72, a third pin 73, and a fourth pin 74. The first pin 71 and the second pin are spaced apart in a second direction intersecting the first direction. The third pin 73 and the fourth pin 74 are arranged with a gap between them in the second direction. In a third direction intersecting the first and second directions, the first pin 71 and the third pin 73 are arranged side by side. In the third direction, the second pin 72 and the fourth pin 74 are arranged side by side. Each of the plurality of probe pins 7 has a first end 111 which has a recess 112. The length of the probe pin 7 along the third direction is less than or equal to the longer of the length of the bottom position 1121 closest to the other end of the recess 112 in the first direction, and the length of the first end 111 along the second direction between one end and the other end. The length of the probe pin 7 along the third direction is less than or equal to half the distance between two adjacent probe pins 7 in the third direction. Inspection socket.

[0184] The inspection socket 1 of the 20th aspect of this disclosure is the same as the inspection socket 1 of the 19th aspect, The recess 112 includes a first inclined surface 111A and a second inclined surface 111C. The first inclined surface 111A and the second inclined surface 111C face each other in the second direction, and move closer to each other in the second direction as they approach the second ends 121 and 122 in the first direction.

[0185] The inspection socket 1 of the 21st aspect of this disclosure is the same as the inspection socket 1 of the 19th or 20th aspect, The distance between the probe pins 7 is the pitch G1 between two adjacent probe pins 7 in the third direction.

[0186] The inspection socket 1 of the 22nd aspect of this disclosure is the same as the inspection socket 1 of the 19th or 20th aspect, The distance between the probe pins 7 is the shortest distance G2 between the opposing surfaces 7A and 7B of two adjacent probe pins 7 in the third direction.

[0187] While this disclosure is adequately described in relation to preferred embodiments with reference to the accompanying drawings, various variations and modifications will be obvious to those skilled in the art. Such variations and modifications should be understood to be included within the scope of this disclosure as defined by the attached claims. [Industrial applicability]

[0188] The inspection socket of this disclosure can be applied to inspection equipment used for inspecting electronic modules, such as optical modules. [Explanation of Symbols]

[0189] 1 Inspection socket 2, 3, 4, 5, 6 Housing 11. First connection section 11A end 12. Second connection section 12A end 12C Notch 13 Elastic part 131 Part 1 132 Part 2 133 Curved section 134 Long plate section 13A 1st end 13B 2nd end 71 First probe pin 72 Second probe pin 73 Third probe pin 74. Fourth probe pin 111 First end 111A Slope 111B Protrusion 121, 122 Second end

Claims

1. Housing and Each comprises a plurality of pins supported by the housing, Each of the aforementioned plurality of pins is A first end is provided at one end in the first direction and is capable of contacting other members, It has a second end provided at the other end in the first direction and capable of contacting other members, The aforementioned plurality of pins include a first pin, a second pin, a third pin, a fourth pin, a fifth pin, and a sixth pin, The first pin and the second pin are arranged with a gap between them in a second direction intersecting the first direction. The third and fourth pins are arranged with a gap between them in the second direction. The fifth pin is located between the first pin and the second pin in the second direction. The sixth pin is located between the third pin and the fourth pin in the second direction. In a third direction intersecting the first and second directions, the first pin and the third pin are arranged side by side. In the third direction, the second pin and the fourth pin are arranged side by side. In the third direction, the fifth pin and the sixth pin are arranged side by side. The second end of the first pin and the second end of the third pin are in different positions in the second direction. The second end of the second pin and the second end of the fourth pin are in different positions in the second direction. The second end of the fifth pin and the second end of the sixth pin are in different positions in the second direction. Inspection socket.

2. The first end has a shape that is symmetrical with respect to a center line that passes through the center of the first end in the second direction and extends along the first direction, when viewed along the third direction. The inspection socket according to claim 1.

3. Each of the aforementioned plurality of pins has an elastic portion, The elastic portion is A plurality of first extending portions, each extending along the second direction and spaced apart from one another in the first direction, It includes at least one second extension connected to the ends of two adjacent first extensions, In each of the plurality of pins, the number of the second extended portion is the same, the length of the second extended portion along the extending direction is substantially the same, and the length of the second extended portion in the width direction perpendicular to the extending direction is substantially the same. The inspection socket according to claim 1 or 2.

4. Each of the aforementioned plurality of pins is Elastic part, It has a first connecting portion connected to the elastic portion, The first connecting portion includes the first end at the end furthest from the elastic portion in the first direction, The first connecting portion of the fifth pin and the sixth pin is connected to the central portion of the elastic part in the second direction. The inspection socket according to claim 1 or 2.

5. In the first pin and the second pin, the first connecting portion is connected to the end of the elastic portion on the fifth pin side in the second direction. In the third and fourth pins, the first connecting portion is connected to the end of the elastic portion on the sixth pin side in the second direction. The inspection socket according to claim 4.

6. Each of the aforementioned plurality of pins has an elastic portion, The elastic portion is A plurality of first extending portions, each extending along the second direction and spaced apart from one another in the first direction, It includes at least one second extension connected to the ends of two adjacent first extensions, The elastic portions of the first pin, the second pin, the third pin, and the fourth pin are longer in the second direction than the elastic portions of the fifth pin and the sixth pin. The inspection socket according to claim 1 or 2.

7. The elastic portions of the fifth and sixth pins are narrower than the elastic portions of the first, second, third, and fourth pins. The inspection socket according to claim 6.

8. The number of second extensions on each of the fifth and sixth pins is greater than the number of second extensions on each of the first, second, third, and fourth pins. The inspection socket according to claim 6.

9. The third pin has the same configuration as the second pin and is arranged in the opposite direction to the second pin in the second direction. The fourth pin has the same configuration as the first pin and is arranged in the opposite direction to the first pin in the second direction. The inspection socket according to claim 1 or 2.

10. The aforementioned multiple pins have the same configuration, The first pin, the fifth pin, and the second pin are arranged in opposite directions to the third pin, the sixth pin, and the fourth pin in the second direction. The inspection socket according to claim 1 or 2.

11. Housing and Each comprises a plurality of pins supported by the housing, Each of the aforementioned plurality of pins is A first end is provided at one end in the first direction and is capable of contacting other members, It has a second end provided at the other end in the first direction and capable of contacting other members, The aforementioned plurality of pins include a first pin, a second pin, a third pin, and a fourth pin, The first pin and the second pin are arranged with a gap between them in a second direction intersecting the first direction. The third and fourth pins are arranged with a gap between them in the second direction. In a third direction intersecting the first and second directions, the first pin and the third pin are arranged side by side. In the third direction, the second pin and the fourth pin are arranged side by side. Each of the aforementioned plurality of pins has a first end having a recess, The length of the pin along the third direction is less than or equal to the longer of the length between the bottom position in the recess closest to the other end in the first direction and the length along the second direction between one end and the other end of the first end in the second direction. The length of the pin along the third direction is less than or equal to half the distance between two adjacent pins in the third direction. Inspection socket.

12. The recess includes a first inclined surface and a second inclined surface, The first inclined surface and the second inclined surface face each other in the second direction, and approach each other in the second direction as they approach the second end in the first direction. The inspection socket according to claim 11.

13. The distance between the pins is the pitch between two adjacent pins in the third direction. The inspection socket according to claim 11.

14. The distance between the pins is the shortest distance between the opposing faces of two adjacent pins in the third direction. The inspection socket according to claim 11.

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