Device socket under test and method for testing a device under test

Abstract

An embodiment according to the present invention includes a device under test socket for testing a device under test. The device under test socket has a base structure and a lid. The lid is configured to be securable to the base structure by rotation of the lid. The lid is configured to push a pusher toward the device under test portion of the base structure. Furthermore, a central portion of the lid is open and / or includes a low-dielectric constant material. Furthermore, an embodiment includes a method for testing a device under test.

Description

[Technical Field]

[0001] SUMMARY OF THE INVENTION An embodiment of the present invention relates to a device under test socket and a method for testing a device under test.

[0002] SUMMARY OF THE INVENTION An embodiment according to the present invention relates to an ATE (Automated Test Equipment) sliding lid socket for far-field OTA (Over The Air) testing. [Background technology]

[0003] Background of the Invention Device testing is an important part of modern manufacturing and development procedures for electronic devices. Therefore, it is necessary to test a large number of devices in a way that ensures definitive test results. Therefore, disturbances to the test results caused by the test environment should be minimized as much as possible. On the other hand, to achieve reasonable test throughput, each test equipment must be configured to allow for rapid exchange of the device under test (DUT) while still performing the test in a robust and reliable manner.

[0004] For device testing, the physical interface between the device under test and the test equipment (e.g., automatic test equipment) may be a device under test socket, where the device under test is physically placed and which provides electrical contact points for performing the test. Furthermore, especially in OTA testing (e.g., of the antenna characteristics of the DUT), the socket can have a significant impact on the results obtained.

[0005] It would therefore be desirable to have a device under test socket concept and a method for testing DUTs using such a socket that allows a better compromise between robustness and accuracy and test complexity and speed, for example with regard to continuous replacement of DUTs to be tested.

[0006] This is achieved by the subject matter of the independent claims of the present application. Further embodiments of the invention are defined by the subject matter of the dependent claims of the present application. Summary of the Invention [Means for solving the problem]

[0007] One embodiment of the present invention includes a device under test socket for testing (e.g., for holding and / or contacting) a device under test (e.g., a device under test including one or more antenna structures). The device under test socket has a base structure (e.g., including a device under test pocket for mechanically centering the device under test) and a lid. The lid is configured to be securable (e.g., removably and securable) to the base structure by rotation of the lid (e.g., about an axis extending through the device under test pocket) (e.g., rotation of the lid relative to the base structure). Further, the lid is configured to push a pusher (e.g., a low dielectric constant structure, e.g., an ``electromagnetically transparent'' structure or a substantially ``electromagnetically transparent structure'', e.g., a structure made of Evonik® HF71 material, e.g., a rigid foam or closed-cell rigid foam or a structure made of closed-cell rigid foam based on polymethacrylimide chemistry) towards the device under test portion of the base structure (e.g., towards the device under test pocket of the base structure (here, e.g., the pusher may or may not be part of the lid) to press the device under test into the device under test pocket and / or to ensure reliable electrical contact between the device under test and one or more electrical contact points (e.g., provided in the device under test pocket)).

[0008] Furthermore, when the lid is secured to the base structure, a central portion of the lid, e.g., opposite the device under test portion / device under test pocket, is open and / or has a low dielectric constant material (e.g., a material having a relative dielectric constant of less than 1.2), allowing for substantially undistorted transmission of electromagnetic waves, e.g., for frequencies in the microwave frequency range of 1 GHz to 1000 GHz.

[0009] The main idea of ​​the embodiments is to provide a device under test socket having two main elements (i.e., a base structure and a lid) such that a device under test can be placed in the space between (e.g., closed by) the base structure and the lid (e.g., in a closed state of the socket, e.g., when the lid is attached to the base structure).

[0010] The inventors have recognized that such a lid can provide the functionality of a removable cover, e.g., a cap, where on the one hand the lid can be easily removed to replace the DUT, and on the other hand when in a closed position (e.g., when the lid is attached to the base structure) the DUT is firmly held in a test position.

[0011] In particular, the inventors have recognized that fastening by rotational movement can be performed quickly, allowing for fast replacement of the DUT. Furthermore, for example, the lid is configured to push a pusher (e.g., acting as an adapter) between the lid and the DUT toward the device under test portion (e.g., during a rotational movement to be mounted on the base structure) to enable the above-described fastening of the DUT for testing. This allows a force to be applied to the DUT, thus ensuring good electrical contact between the DUT and the test equipment. Different pushers can be provided for different devices under test as desired.

[0012] Furthermore, to provide a good compromise between rapid interchangeability of the above-described device and robustness of the test as well as accuracy of the test, the inventors have recognized that the center portion of the lid may be open and / or may have or be made of a low dielectric constant material, thus having a low effect on the signal radiated or emitted by the DUT (e.g., as measured for test).

[0013] According to one embodiment of the present invention, the device under test socket includes a pusher configured to push the device under test toward (e.g., into) the device under test pocket. The pusher may include a low-dielectric constant material (e.g., a material having a relative dielectric constant of 1.2 or less). The lid may be configured to push the pusher toward the device under test pocket, e.g., to ensure reliable electrical contact between the device under test and one or more electrical contact points (e.g., provided within the device under test pocket). Optionally, the pusher may or may not be part of the lid.

[0014] The pusher can function as an adapter or adapter device to transfer motion, e.g., based on rotation of the lid, toward the DUT so that the DUT can be pressed against the contact area to provide good electrical contact. A pusher including a low dielectric constant material can maintain low disturbance of signals (e.g., OTA) emitted from the DUT.

[0015] According to one embodiment of the present invention, the pusher is made at least substantially from a material having a dielectric constant of 1.2 or less, and the inventors have recognized that the use of such a material can result in low signal interference, particularly for OTA antenna testing.

[0016] According to one embodiment of the present invention, the pusher is at least substantially made of a rigid foam material, such as a closed-cell rigid foam material or a closed-cell rigid foam material based on polymethacrylimide chemistry, such as Evonik HF71 material. This allows for convenient manufacturing of such pushers individually adapted for different DUTs (e.g., DUTs with different geometries). Therefore, a good fit between the base structure, DUT, pusher, and lid can be achieved, providing a precisely adapted pusher for robust testing.

[0017] According to one embodiment of the present invention, the material of the pusher has a tensile modulus greater than 80 MPa, so the pusher has sufficient rigidity to allow good contact and fixation of the DUT within the socket.

[0018] According to one embodiment of the present invention, the tensile modulus of the material of the pusher is ten times smaller than the tensile modulus of the material of the lid.

[0019] According to one embodiment of the present invention, the base structure includes a relief configured to receive and optionally center the pusher, which may provide good fixturing of the base structure, DUT, pusher, and lid for robust testing.

[0020] According to one embodiment of the present invention, the lid and pusher are configured to be separate parts of the device under test socket, allowing for easy replacement of DUT-specific pushers and even replacing worn pushers without having to replace the entire socket.

[0021] According to one embodiment of the present invention, the pusher is attached to the lid (e.g., attached using glue, or screwing, or any other connecting or bonding technique) to form a single part ("single part"), e.g., such that a single mechanical part with the lid and pusher can be manually secured to the base structure by rotation, and / or such that the pusher rotates with it, e.g., when the lid is rotated to secure it to the base structure. This allows the socket to be made up of fewer parts and allows for quick replacement of the DUT.

[0022] According to one embodiment of the present invention, the pusher is mechanically coupled to the lid in a floating manner (e.g., coupled in a rotatable manner so that the pusher can move and / or rotate relative to the lid, and / or, e.g., a single mechanical component having the lid and the pusher forms a single component (single piece) so that it can be manually secured to the base structure by rotating the lid, and / or, e.g., when the lid is rotated to secure the lid to the base structure, the pusher does not rotate with the lid but is inserted and guided into a pocket of the device under test). Thus, by way of example, rotation of the lid may reduce the distance between the lid and the device under test. The pusher is, for example, provided in a central position between the lid and the device under test, and the pusher does not rotate due to the floating coupling and moves and / or applies force only in a vertical direction towards / to the DUT (e.g., perpendicular to the rotation plane of the rotational movement of the lid, e.g., normal to the rotation). Additionally, relative movement between the pusher and the DUT may be reduced (e.g., compared to a pusher that rotates with the lid), which can protect the DUT (e.g., particularly an unpackaged DUT). As an example, the pusher and lid can be coupled to transfer only translational forces to the DUT, and no torque.

[0023] According to one embodiment of the present invention, the pusher is configured to be manually inserted into the removed portion of the base structure and optionally centered and / or aligned in the removed portion of the base structure. Additionally, the pusher may be configured to be pushed toward the pocket of the device under test by a force from the lid when the lid is secured (e.g., removably secured) to the base structure by rotation of the lid. This allows for easy assembly of the socket in a short time.

[0024] According to one embodiment of the present invention, a protector structure is attached to the pusher in the area where the pusher abuts the lid, for example, with the protector structure sandwiched therebetween. Furthermore, the protector structure may be provided between the pusher and the lid, for example, in the area where the lid exerts a force toward the device under test pocket. The protector structure may be constructed, for example, of an abrasion-resistant material. The protector may reduce wear on the pusher, for example, due to the relative rotational movement of the lid and the pusher.

[0025] According to an embodiment of the present invention, the protector structure is attached to the top surface of the pusher facing away from the device under test pocket. The protector structure is provided in an outer region of the top surface of the pusher, leaving the central region of the top surface of the pusher free. Therefore, interference with signals radiated from the DUT can be reduced.

[0026] According to one embodiment of the present invention, the material of the protector structure has higher mechanical stability (e.g., higher tensile modulus, preferably higher than 3500 MPa, and / or higher wear resistance) than the material of the pusher, and / or the material of the protector structure has a relative dielectric constant of 2 or higher (e.g., preferably 3.5 or lower). Thus, the protector can be robust and wear-resistant while only interfering with the test signal in a very limited way.

[0027] According to one embodiment of the present invention, the cross-sectional area of ​​the pusher increases, for example, continuously or stepwise, in a direction from the device under test pocket toward the lid, for example, when viewed in a plane parallel to the face of the device under test or when viewed in a plane parallel to a major surface of the base structure, which may allow for easy insertion and / or centering of the pusher within the socket.

[0028] According to one embodiment of the invention, the cross-sectional area of ​​the pusher in the vicinity of the lid, e.g., when viewed in a plane parallel to the plane of the device under test, is at least twice as large as the cross-sectional area of ​​the pusher in the vicinity of the device under test pocket, which allows for particularly easy insertion and / or centering of the pusher in the socket.

[0029] According to one embodiment of the present invention, the pusher has a round cross section in the vicinity of the lid and / or the pusher has a round cross section in the vicinity of the device under test pocket, while for example the device under test pocket has a rectangular shape, which makes the insertion and / or centering of the pusher in the socket particularly easy.

[0030] According to one embodiment of the present invention, the shape of the pusher is adapted to the shape of the device pocket under test, e.g., in the vicinity of the device pocket under test, such that the periphery of the pusher is at least approximately parallel to the periphery of the device pocket under test, e.g., with a gap therebetween, which can provide a good and tight fit and centering for robust and accurate DUT testing.

[0031] According to one embodiment of the present invention, the pusher (e.g., a narrow portion of the pusher) is configured to reach into (and optionally push the pusher toward) the device under test pocket when the lid is attached to the base structure. For example, the portion of the pusher that does not reach into the device under test pocket may be wider (e.g., have at least twice the cross-sectional area) compared to the portion of the pusher that reaches into the device under test pocket. Alternatively, the pusher is configured to not enter (and optionally push the pusher toward) the device under test pocket when the lid is attached to the base structure, e.g., not reach the device under test pocket. Thus, embodiments may enable device testing scenarios with and without a DUT in the recessed area to be addressed.

[0032] According to one embodiment of the present invention, the pusher is configured to cover the device under test, for example, when the device under test is placed in the device under test pocket, and to cover the area surrounding the device under test, to avoid the formation of a cavity, for example, the same size as the antenna array of the DUT, thereby avoiding unwanted resonances.

[0033] According to one embodiment of the present invention, the lid has a (e.g., mechanically rigid) support structure that is, for example, preferably open on its inside and that (e.g., completely) surrounds the location of the device under test (e.g., the device under test pocket) when viewed in a projection perpendicular to the plane in which the support structure is provided when the lid is secured to the base, or when viewed in a projection perpendicular to the plane of the device under test (e.g., the plane in which the device under test or one or more antennas of the device under test are provided when the device under test is inserted into the device under test pocket) when the lid is secured to the base. For example, the support structure has an opening or a low-dielectric constant material in a central region.For example, the opening or low dielectric constant material in the central region of the support structure may be larger than the device pocket under test, or for example, the extension of the opening or low dielectric constant material in the central region of the support structure in two perpendicular directions (e.g., two directions in a plane in which the support structure is provided) may be at least 50% larger than the corresponding extensions of the device pocket under test (e.g., the same two directions), or for example, the extension of the opening or low dielectric constant material in the central region of the support structure in two perpendicular directions (e.g., two directions in a plane in which the support structure is provided) may be at least 100% larger than the corresponding extensions of the device pocket under test (e.g., the same two directions), or for example, the opening or low dielectric constant material in the central region of the support structure may be larger than the corresponding extensions of the device pocket under test (e.g., the same two directions) in such a way that the cone beam radiation emitted from the center of the device pocket under test does not extend beyond the support structure. The opening or low dielectric constant material in the central region is large (where the axis of the cone beam is perpendicular to the plane of the device under test and the opening angle of the cone beam is equal to 30 degrees), or, for example, the opening is adapted so that the distance of the inner boundary of the opening from a line (perpendicular to the plane on which the support structure is provided and extending through the center of the device under test pocket) is greater than or equal to the distance of the center of the device under test pocket from the plane on which the support structure is provided, or, for example, the low dielectric constant material in the central region of the support structure is adapted so that the minimum distance of the outer boundary of the low dielectric constant material in the central region of the support structure from a line (perpendicular to the plane on which the support structure is provided and extending through the center of the device under test pocket) is greater than or equal to the distance of the center of the device under test pocket from the plane on which the support structure is provided.

[0034] According to one embodiment of the present invention, the support structure includes a material having a relative dielectric constant of 2 to 3.5, which can reduce disturbances in test results, for example, in OTA tests.

[0035] According to one embodiment of the present invention, the support structure is made, for example, at least substantially, of polyetheretherketone (PEEK), the inventors having recognized that such a material is suitable for providing a good compromise between a good dielectric constant and a good tensile modulus.

[0036] According to one embodiment of the present invention, the support structure has a substantially rectangular perimeter, and the support structure has an opening in a central (e.g., inner) region with a rounded perimeter (e.g., a round opening, or a rectangular opening where the corners of the rectangle are rounded with a radius that is greater than 1 / 4 of the side length).

[0037] According to one embodiment of the present invention, a plurality of hooks (e.g., at least three hooks, or at least four hooks) are provided on the lid or on a support structure for the lid (e.g., attached to the support structure or integrally fabricated therewith). Furthermore, the hooks on the lid or the support structure may be adapted to engage with respective mating hooks (e.g., at least three hooks, or at least four hooks) on the base structure (e.g., attached to the base structure or integrally fabricated therewith). Optionally, the hooks may be made of a material having a dielectric constant of 2 to 3.5. Optionally, by way of example, the hooks may be made of the same material as the support structure for the lid. Another optional feature is that the hooks may be made of PEEK. The inventors recognized that using multiple hooks can provide a simple, fast, and robust method for attaching a lid to a base structure.

[0038] According to one embodiment of the present invention, hooks (e.g., hooks on the lid or support structure and / or hooks on the base structure) are provided in the area of ​​the device under test socket near the pusher, which allows for low design complexity and low signal disturbance during testing.

[0039] According to one embodiment of the present invention, the hooks (e.g., the hooks on the lid or support structure and / or the hooks on the base structure) are L-shaped, which allows for easy attachment and detachment of the lid and base structure.

[0040] According to one embodiment of the present invention, the first portions of the hooks on the base structure are configured to hold the second portions of the hooks on the base structure at a distance from a surface (e.g., a major surface) of the base structure. The first portions of the hooks on the base structure may, for example, extend substantially perpendicular to the major surface of the base structure (e.g., with a tolerance of ±5 degrees). Furthermore, the inner surfaces of the second portions of the hooks on the base structure (e.g., spaced from the major surface of the base structure by the first portions) may be configured to allow the hooks on the lid or support structure to engage with the inner surfaces of the second portions of the hooks on the base structure (e.g., the second portions of the hooks on the base structure). Optionally, the hooks on the lid or support structure may move into the distance between the major surface of the base structure and their inner surfaces, for example, when the lid is rotated.

[0041] According to one embodiment of the present invention, a first portion of each hook on the lid or (e.g., on the lid) support structure is configured to hold a second portion of each hook on the lid or (e.g., on the lid) support structure at a distance from a surface (e.g., a major surface) of the lid or (e.g., on the lid) support structure. Optionally, the first portion of each hook on the support structure may, for example, extend substantially perpendicular to the major surface of the support structure (e.g., within a tolerance of ±5 degrees). Furthermore, an inner surface of each second portion of each hook on the lid or support structure (e.g., spaced from the major surface of the lid or the major surface of the support structure by the respective first portion) may be configured to engage with an inner surface of a respective hook on the base structure, and may, for example, be configured to move into a space between the major surface of the base structure and the inner surface of each hook on the base structure when the lid is rotated. Optionally, the inner surface of each second portion of each hook provided on the base structure may, for example, extend substantially parallel (eg, within a tolerance of ±5 degrees) to the major surface of the base structure.

[0042] This provides a precisely defined spatial test configuration for the DUT.

[0043] According to one embodiment of the present invention, the hooks (e.g., hooks on the lid or support structure and / or hooks on the base structure) are configured to secure the lid by friction or a snap-in feature that is releasable by manual rotation of the lid, allowing for quick and easy replacement of the DUT.

[0044] One embodiment of the present invention includes a method for testing a device under test. The method includes inserting the device under test into a test socket (e.g., a device under test pocket of the test socket). The device under test socket has, for example, a base structure as follows: The device under test socket has a device under test pocket (e.g., for mechanically centering the device under test) and a lid. A central portion of the lid (e.g., facing the device under test portion / device under test pocket when the lid is secured to the base structure) is open (e.g., to allow substantially undistorted transmission of electromagnetic waves for frequencies in the microwave frequency range of 1 GHz to 1000 GHz) and / or includes a low-dielectric-constant material (e.g., having a dielectric constant of 1.2 or less).

[0045] The method further includes securing (e.g., removably securing) the lid to the base structure by rotating, e.g., manually rotating the lid (e.g., about an axis extending through the device under test and / or by rotation, e.g., relative to the base structure). The lid pushes a pusher (e.g., a low-dielectric constant structure, e.g., an “electromagnetically transparent” structure or a substantially “electromagnetically transparent structure,” e.g., a structure made of Evonik HF71 material, e.g., a structure made of rigid foam, or a structure made of closed-cell rigid foam, or a structure made of closed-cell rigid foam based on polymethacrylimide chemistry) toward the device under test portion of the base structure (e.g., toward the device under test pocket of the base structure, e.g., to push the device under test into the device under test pocket and / or to ensure reliable electrical contact between the device under test and one or more electrical contact points (e.g., electrical contacts provided in the device under test pocket)). Optionally, the pusher may or may not be part of the lid.

[0046] According to one embodiment, the method includes performing an OTA test of a device under test, wherein wireless transmission between the device under test (e.g., pushed into a device under test pocket by a pusher) and a test antenna is performed through a central portion of the lid that is open and / or has a low-dielectric-constant material and the pusher.

[0047] The above-described method can be implemented based on the same considerations as the device socket under test described above. However, the method can be implemented with all the features and functions described with respect to the device socket under test. The same applies in reverse to the features of each method with respect to the device socket under test described above. [Brief explanation of the drawings]

[0048] The drawings are not necessarily to scale, emphasis instead generally being placed upon illustrating the principles of the invention. In the following description, various embodiments of the invention are described with reference to the following drawings: [Figure 1] FIG. 1 is a schematic diagram of a device under test socket according to an embodiment of the present invention. [Figure 2] FIG. 2 is a schematic 3D rendering of a device under test socket according to an embodiment of the present invention. [Figure 3A] FIG. 3A shows a compression screw clamshell lid socket. [Figure 3B] FIG. 3B shows a lever / cam lid socket. [Figure 4] Figure 4 is a diagram of an automated test equipment with a load board installed and a far-field engineering socket attached to the load board. [Figure 5] FIG. 5 is a diagram of a far-field engineering socket. [Figure 6] FIG. 6 is a schematic exploded view of a device under test socket according to the embodiment. [Figure 7] FIG. 7 is a schematic diagram of a pusher according to an embodiment. [Figure 8A]8A-8D are schematic diagrams of a device under test socket in which the lid is rotated to secure the lid to the base structure, according to an embodiment. [Figure 8B] 8A-8D are schematic diagrams of a device under test socket in which the lid is rotated to secure the lid to the base structure, according to an embodiment. [Figure 8C] 8A-8D are schematic diagrams of a device under test socket in which the lid is rotated to secure the lid to the base structure, according to an embodiment. [Figure 8D] 8A-8D are schematic diagrams of a device under test socket in which the lid is rotated to secure the lid to the base structure, according to an embodiment. [Figure 9A] FIG. 9A is a schematic diagram of a device under test socket in contact, according to an embodiment of the present invention. [Figure 9B] FIG. 9B is a schematic diagram of a device under test socket in a free state, according to an embodiment of the present invention. [Figure 10A] 10A-10C show simulation results of a socketless far-field OTA test according to an embodiment of the present invention. [Figure 10B] 10A-10C show simulation results of a socketless far-field OTA test according to an embodiment of the present invention. [Figure 10C] 10A-10C show simulation results of a socketless far-field OTA test according to an embodiment of the present invention. [Figure 11A] 11A-11C show simulation results of far-field OTA testing with a simple lidded socket, according to an embodiment of the present invention. [Figure 11B] 11A-11C show simulation results of far-field OTA testing with a simple lidded socket, according to an embodiment of the present invention. [Figure 11C] 11A-11C show simulation results of far-field OTA testing with a simple lidded socket, according to an embodiment of the present invention. [Figure 12A]12A-12D show simulation results of far-field OTA testing with a socket with a rotating lid, according to an embodiment of the present invention. [Figure 12B] 12A-12D show simulation results of far-field OTA testing with a socket with a rotating lid, according to an embodiment of the present invention. [Figure 12C] 12A-12D show simulation results of far-field OTA testing with a socket with a rotating lid, according to an embodiment of the present invention. [Figure 12D] 12A-12D show simulation results of far-field OTA testing with a socket with a rotating lid, according to an embodiment of the present invention. [Figure 13A] 13A to 13C are diagrams showing an example of an assembly process for a socket for a device under test according to one embodiment. [Figure 13B] 13A to 13C are diagrams showing an example of an assembly process for a socket for a device under test according to one embodiment. [Figure 13C] 13A to 13C are diagrams showing an example of an assembly process for a socket for a device under test according to one embodiment. DETAILED DESCRIPTION OF THE INVENTION

[0049] Detailed Description of the Embodiments In the following description, like or equivalent elements or elements having like or equivalent functions are designated with like or equivalent reference numerals even if they appear in different figures.

[0050] In the following description, numerous details are set forth to provide a more thorough explanation of embodiments of the present invention. However, it will be apparent to those skilled in the art that embodiments of the present invention may be practiced without these specific details. In other instances, well-known structures and devices are shown in block diagram form, rather than in detail, in order to avoid obscuring embodiments of the present invention. Furthermore, features of different embodiments described hereinafter may be combined with each other unless otherwise noted.

[0051] FIG. 1 is a schematic diagram of a device under test socket according to an embodiment of the present invention. FIG. 1 shows a device under test socket 100 having a base structure 110 and a lid 120. Additionally, a pusher 130 and a device under test 140 are shown. As an optional example, the device under test socket 100 is shown mounted on a load board surface 150 having a recessed contact area 160 that includes, for example, contact pins (e.g., pogo pins or contact pads) for the device under test 140. Optionally, however, the surface 150 shown in FIG. 1 may be part of the base structure 110. As such, the base structure 110 has a recessed contact area 160 that may optionally form or be part of a device under test pocket 170.

[0052] The lid 120 is configured to be securable to the base structure 110 by rotation of the lid 120. Thus, by way of example, the base structure 110 and the lid 120 have interlocking portions 115. By way of example, the base structure 110 and the lid 120 may have interlocking teeth, hooks, and / or threads. Interlocking via friction is also possible.

[0053] Furthermore, the lid 120 is configured to push the pusher 130 toward the device under test portion of the base structure 110. In the example shown in FIG. 1 , the device under test portion of the base structure 110 may be a central portion of the base structure 110. When tested, the device under test is provided at the central portion of the base structure 110 or in a projection of the central portion of the base structure 110. As an example, in the arrangement of FIG. 1 , the device under test portion is recessed to form a device under test pocket 170. In other words, as an optional function, the lid 120 is configured to push the pusher 130 toward the device under test pocket 170. As an example, based on a rotational movement of the lid 120 to attach or mount the lid 120 to the base structure 110, the distance between the lid 110 and the device under test may be reduced so as to push the pusher 130 against or press the pusher 130 toward the device under test 140 a. Therefore, good contact between the device under test 140 and the contact area 160 can be provided.

[0054] Additionally, as an optional feature, central portion 122 of lid 120 is open. Optionally, portion 122 may be constructed of a low dielectric constant material, which may allow for substantially undistorted transmission of the OTA signals of device under test 140 during testing.

[0055] 1, the base structure 110 has a removal portion 112 configured to receive the pusher 130. The removal portion may be provided as a space between the lid 120 and the device under test 110. Optionally, the shapes of the pusher 130 and the removal portion 112 may correspond to one another, for example, to provide a compact and close fit for the pusher 130.

[0056] Optionally, the device under test socket 100 may include a pusher 130. For example, as shown in FIG. 1 , the lid 120 and the pusher 130 may be two separate components. In such a configuration, the pusher 130 may remain in position during testing via frictional force between the lid 120 and the pusher 130. This force may be provided based on tension caused by the mounting of the lid 120 and the base structure 110 using the interlocking portion 115. Thus, optionally, the pusher 130 may be mechanically coupled to the lid 120 in a floating manner.

[0057] Accordingly, as an optional feature, the lid 120 and the pusher 130 may be configured to be separate components of the device under test socket 100. Thus, assembly of the device under test socket 100 includes, for example, manually or automatically inserting the pusher 130 into the removed portion 112 of the base structure. As previously described, the lid 120 may then be attached, mounted, or secured to the base structure 110 by a rotational movement. For example, threads may be used to reduce the distance between the lid 120 and the base structure 110 as the lid is rotated. Alternatively, the lid may be pushed downward and then rotated to secure, for example, with interlocking teeth. This allows a force from the lid 120 to move, push, or compress the pusher 130 toward the device under test pocket 170 (e.g., a recessed area) when the lid is rotated to secure the lid to the base structure 110.

[0058] Optionally, the lid 120 and the pusher 130 may be configured to be fixedly attached to one another, for example, via any type of bonding material, such as, for example, screws or adhesive. Additionally, an interlocking mechanism between the lid 120 and the pusher 130 is also possible.

[0059] Additionally, the pusher 130 may optionally include a low-dielectric-constant material to reduce interference with the OTA signal of the device under test 140 during testing. Thus, by way of example, the pusher may include or be made of a material having a relative dielectric constant of 1.2 or less. Optionally, the pusher 130 may be made of a hard foam material. As another optional feature, the pusher material may have a tensile modulus greater than 80 MPa. In particular, with respect to the tensile modulus, the tensile modulus of the pusher 130 material may optionally be less than one-tenth the tensile modulus of the lid 120 material.

[0060] 1, the cross-sectional area of ​​the pusher 130 widens in a direction from the device under test pocket 170 toward the lid 120. This may facilitate engagement and insertion of the pusher into the removal portion 112. By way of example, the pusher 130 may have an inverted pyramid shape and / or a cone shape. By way of example, the cross-sectional area of ​​the pusher 130 near the lid 120 may be at least two times larger than the cross-sectional area of ​​the pusher 130 near the device under test pocket 170. Optionally, the pusher may have a round cross-section near the lid 120 and / or a round cross-section near the device under test pocket 170. As shown in FIG. 1, the shape of the pusher 130 may therefore be adapted to the shape of the device under test pocket 170 near the device under test pocket 170.

[0061] Reference will now be made to Figure 2 of the patent proposal, which is a schematic 3D rendering of a device under test socket according to an embodiment of the present invention. The device under test socket 200 comprises a lid 220 and a base structure 210.

[0062] As an example, the lid 220 has a hook 224 that is attached to a main portion 226 of the lid 220 (e.g., a support structure) via a screw 280. It should be noted that the hook 224 and main portion 226 may be made in a single piece, for example, via a 3D printing, molding, and / or casting process. As discussed in the context of FIG. 1, the lid 220 has an optional feature of an aperture (e.g., hole 222).

[0063] 2 further illustrates, in a transparent manner, the pusher 230 and an optional protector structure 232 attached to the pusher 230 in the area where the pusher abuts the lid. The protector structure 232 is provided between the pusher 230 and the lid 220. The protector structure 232 can buffer the force and / or torque exerted by the lid 220 on the pusher 230. Furthermore, particularly if the lid 220 and the pusher 230 are separate components, the protector structure 232 can reduce wear on the pusher 230 due to repeated rotational forces from the lid 220 to the pusher 230, for example, when the lid 220 is mounted to the base structure 210.

[0064] 2, as an optional feature, the protector structure 232 may be attached to the top surface of the pusher 230 facing away from the device under test pocket 270. The protector structure 232 is provided on an outer region of the top surface of the pusher 230, leaving a central region of the top surface of the pusher 230 free. The device under test pocket 270 is visible through the pusher 230, which is shown as transparent in FIG.

[0065] The base structure has hooks 214 that mate with hooks 224, together forming interlocking portion 215 of device under test socket 200. By way of example, base structure has a first layer 216 that forms hooks 214, and a second layer 218. First layer 216 and second layer 218 are attached to one another using screws 280. Again, it should be noted that base portion 210 may be a single piece, e.g., molded, cast, or printed, and / or the layers may be attached in any other manner, such as by bonding with an adhesive. By way of example, layer 218 may have an opening for hook 214. However, hook 224 may be part of layer 218. Furthermore, hook 224 may be a separate piece that is attached to either layer 216, 218, e.g., using screws.

[0066] Optionally, the material of the protector structure 232 has a higher mechanical stability than the material of the pusher 230 and / or the material of the protector structure 232 has a relative dielectric constant of 2 or greater.

[0067] 2, optionally, first portions 214a of the hooks 214 provided on the base structure 210 may be configured to space second portions 214b of the hooks 214 from the surface of the base structure. Inner surfaces 214b of the second portions of the hooks 214 provided on the base structure may be configured to engage with the inner surfaces of the hooks 224.

[0068] Vice versa, as an optional feature, each first portion 224a of each hook 224 provided on the lid 120, or more specifically on the support structure 226 in this embodiment, is configured to maintain each second portion 224b of each hook 224 at a distance from the surface of the lid or support structure. Each inner surface 224B of each second portion of each hook 224 is configured to engage with each inner surface 214B of each hook 214 provided on the base structure 210.

[0069] As an optional feature, the hooks 214, 224 may be configured to secure the lid 220 by friction or by a snap-in feature that is releasable by manual rotation of the lid (see, eg, FIG. 8).

[0070] Referring again to FIG. 2, it should be noted that the present patent application proposes a manual socket (e.g., 200) for OTA (Over the Air) ATE testing, for example, during the engineering stage, where the DUT is manually inserted into the socket.

[0071] In OTA testing, the top cover (eg, 220) of the socket can be very important in some cases to avoid obstructing the beam emanating from the DUT antenna array.

[0072] Also, when manually testing a large number of DUTs, a socket (eg, 200) is desirable to facilitate DUT replacement.

[0073] An example of a proposed socket design is shown in Figure 2 and described in more detail below. According to one aspect, the lid (e.g., 220) is designed for easy removal and is characterized by its design for optimal performance, for example, for OTA testing.

[0074] For a better understanding of the embodiments, reference is made to the background of the patent proposal business.

[0075] The OTA socket may be platform independent, meaning that it can be used on different platforms, for example. The designs presented in this patent application may be used on customer OTA beta sites.

[0076] With respect to embodiments, it should be noted that typical current engineering socket options have shortcomings in OTA far-field testing.

[0077] First, refer to Figure 3A, which is a photograph of a clamshell-style lid with compression screws (www.ironwoodelectronics.com / products / lid-tool-socket-accessories).

[0078] A typical engineering socket for non-OTA applications (e.g., FIG. 3A) has an easy-to-open lid and, for example, a compression screw to press the device into the electrical contacts of the socket. For OTA applications, the lid and compression screw are found to be in the path of the antenna beam.

[0079] Second, refer to Figure 3B, which is a picture of a lever / cam-style lid socket (www.zaxeu.com / test-socket-based-elastomeric-matrix-connectors).

[0080] One traditional socket that seems suitable for far-field OTA is the lever / cam-lid socket shown in Figure 3B, which has an open area for the antenna beam above the top of the DUT. Because many components are in the beam path, many are made of metal, and the socket opening is the same size as the antenna array, these sockets have resonances at some frequencies. This has proven to cause many problems.

[0081] For far-field OTA testing, please refer to Figures 4 and 5. Figure 4 shows an automated test equipment 400 equipped with a load board 410, which is equipped with a far-field engineering socket 420. Figure 4 therefore shows the far-field engineering setup. Furthermore, the automated test equipment 400 includes a measurement antenna 430. Figure 5 shows the far-field engineering socket.

[0082] Figures 4 and 5 show a simple OTA far-field engineering socket 420 currently in use. The white pusher material (e.g., 422) is made of an electromagnetically transparent material (e.g., HF71). There is a ring (e.g., 424) made of PEEK (plastic) that provides some rigidity. The lid is secured with four screws 440. This socket performs well for OTA far-field testing, but replacing the DUT is tedious because four screws must be manually removed and installed.

[0083] As an example, an inventive method for testing a device under test can be implemented using an inventive device under test socket with the setup shown in FIG. 4. Thus, a DUT can be inserted into the socket, and the lid can be secured to the base structure by rotating the lid. The lid presses the pusher toward the device under test portion of the base structure. Optionally, OTA testing of the device under test can be performed. Wireless transmission between the device under test and a test antenna (e.g., 430) occurs through the open central portion of the lid and / or the central portion of the lid including the low-dielectric constant material and the pusher.

[0084] Next, reference is made to FIG. 6 and FIG. 2 for the design of the OTA sliding lid socket of the proposed ATE according to the embodiment.

[0085] 6 is a schematic exploded view of a device under test socket according to an embodiment. FIG. 6 shows a device under test socket 600 including a base structure 610 (optionally having a removal portion 612 for a pusher 630) and a lid 620 (optionally having an open central portion 622 and a support structure 626), as well as the pusher 630 and a protector structure 632, which may have the same or corresponding features as the respective elements in FIG. 1 and / or FIG. 2.

[0086] As an optional feature, the lid may be constructed of or made of, for example, PEEK having a dielectric constant (<3.5) and / or a tensile modulus (>3500 MPa). Each hook 624 and protector structure 632 may likewise be constructed of or made of PEEK.

[0087] As previously described, the protector structure may be attached (e.g., mounted, glued, or screwed) to the pusher 630, particularly to the top surface (e.g., facing the lid 620 away from the DUT) so as to be provided at the end and / or edge regions of the top surface of the pusher 630, leaving the central region of the top surface of the pusher 630 free.

[0088] Again, by way of example, base structure 610 has a first layer 616 and a second layer 618. By way of example, layer 616 may be configured to form an electrical socket 617. The hook bases that form the hooks of base structure 610 may be part of layers 616, 618 or may be separate elements. The hook bases may be constructed of or made from PEEK.

[0089] 6, the pusher 630 may be implemented, for example, as Evonik HF 71. Optionally, the pusher material may or should have, for example, a dielectric constant <1.2 and / or a tensile modulus >80 MPa.

[0090] As shown in FIG. 6, the base structure 610 may form a device pocket 670 in which a DUT (eg, an Antenna in Package (AiP) 640 of the DUT) may be placed.

[0091] For example, the socket design (e.g., 200, 600) does not require manual screwing, and the DUT (e.g., 640) can be very easily replaced by simply rotating the lid (e.g., 220, 620).

[0092] For example, optionally, the lid design (e.g., 220, 620) is purposefully made so that the low dielectric constant material covers not only the DUT (e.g., 640) but also the area surrounding it to avoid the formation of a cavity as large as the DUT antenna array.

[0093] For example, optional PEEK lids and hooks (eg, 214, 224, 624, 619) provide mechanical rigidity but are kept a sufficient distance from the DUT antenna array to avoid in-band resonances with, for example, the antenna beam.

[0094] For example, the usage process may involve first inserting the DUT (e.g., 640) into the electrical socket (e.g., pocket 270, 670), then placing the pusher (e.g., 230, 630) with the protector (e.g., 232, 632) on top in the correct orientation, and finally inserting and rotating the lid (e.g., 220, 620) so that the DUT and the electrical socket (e.g., 120, 610) make good electrical contact.

[0095] An example of a process for closing the lid of a socket is now described with reference to Figure 8. Figures 8A-8D are schematic diagrams of a device under test socket rotated so that the lid is secured to the base structure, according to an embodiment.

[0096] FIG. 8A shows the device under test socket 200 in a first state in which the lid 220 is not attached to the base structure 110. As shown in FIG. 8A, the protector structure 232 and the lid 220 may be misaligned in this position. As shown in FIG. 8B, the lid 220 may then be rotated so that the hooks 224 and 214 engage. FIGS. 8C and 8D show the socket in an interlocked state. Furthermore, in the interlocked state, the protector structure 242 and the lid 220 may be aligned such that the opening in the lid 220 and the surface of the pusher 230 not covered by the protector structure 232 are aligned.

[0097] Possible variations of the OTA socket are described below, and reference is now made to Fig. 7, which is a schematic diagram of a pusher according to an embodiment. In the example of Fig. 7, the cross-sectional area of ​​the pusher 730 increases in the direction from the device under test pocket toward the lid.

[0098] Optionally, a socket variant may incorporate an integrated pusher and lid. This may require a complex mechanical design with additional components. This complex design may impact the performance of the DUT antenna array. An example of a high-level concept for such a socket is further described below, e.g., with reference to FIG. 7.

[0099] Also, optionally, a round pusher can be used, for example, if there is sufficient margin between the DUT antenna array and the DUT package and the device is square, in which case the lid can be a single part.

[0100] Also, for example, if the DUT is flatter (or the same height) or slightly taller than the socket pocket, a large round pusher can be used even if the device is rectangular. In some cases, such socket pockets are not reliable for handler integration.

[0101] Reference is now made to Figures 9A and 9B, which are schematic diagrams of a device under test socket in contact (Figure 9A) and in a free state (Figure 9B) according to an embodiment of the present invention.

[0102] 9A and 9B show a device under test socket comprising a base structure 910 with hooks 914 (optionally having a removal portion 912 for a pusher 930) and a lid 920 with hooks 924 and pusher 930. The hooks 914, 924 may form an interlocking portion 915. Thus, elements corresponding to elements as described in the context of FIGS. 1, 2, 6, 7 and 8 may have the same or corresponding details and / or functionality.

[0103] As an example, the pusher 930 is fixedly attached to the lid 920 using a screw 940. The screw 940 may be composed of, or optionally made of, PEEK. In other words, the additional screw 940 may be configured to capture the pusher 930.

[0104] 9A shows the device under test socket in contact. A lid 920 is attached to a base 910. A pusher 930 can push the device under test 140 into a pocket 170 to provide good contact with the contact area 160 for testing the device under test.

[0105] 9, the pusher 930 can optionally be configured to conform to the shape of the device under test pocket 170 in the vicinity of the device under test pocket. Thus, the pusher 930 can reach into the device under test pocket when the lid 920 is attached to the base structure. Note that alternatively, the pusher 930 can be configured not to enter the device under test pocket when the lid 920 is attached to the base structure 910.

[0106] In a configuration such as that shown in FIG. 9A, as an optional feature, the pusher covers the device under test 140 and the area surrounding the device under test.

[0107] 9B shows the device under test socket 900 in its free state. The lid 920 is detached from the base structure 910. The pusher 930 is lifted along with the lid 920 using a screw 940. By way of example, the lid 920 includes a floating feature for the pusher 930, as the pusher fits into the pocket 170 of the socket.

[0108] Reference is now made to Figures 10, 11 and 12, which show simulation results for far-field OTA testing without a socket (Figure 10), with a simple lidded socket (Figure 11), and with a rotating lidded socket according to an embodiment of the present invention (Figure 12).

[0109] Figure 10A shows a schematic plot of the far field of a device under test on a socketless load board 1000 at a frequency of 28 GHz. Figure 10C shows a side view of the schematic plot of the far field shown in Figure 10A. Figure 10B shows a schematic plot of the main lobe magnitude in dBi over different frequencies for the setup shown in Figure 10A.

[0110] Figure 11A shows a schematic plot of the far field of a device under test on a simple lidded socket 1100 at a frequency of 28 GHz. Figure 11C is a side view of the schematic plot of the far field shown in Figure 11A. Figure 11B shows a schematic plot of the main lobe magnitude in dBi over different frequencies for the setup shown in Figure 11A.

[0111] FIG. 12A shows a schematic plot of the far field of a device under test on a rotating lid socket 1200 at a frequency of 28 GHz. FIG. 12C shows a side view of the schematic plot of the far field shown in FIG. 12A. FIG. 12B shows a schematic plot of the main lobe magnitude in dBi over different frequencies for the setup shown in FIG. 12A. FIG. 12D is an enlarged version of FIG. 12C. As shown in FIG. 12C, the rotating lid socket 1200 according to one embodiment comprises a lid 1220 and a base structure 110. Additionally, a pusher 1230 and a protector structure 1232 are shown.

[0112] As can be seen from Figures 10, 11 and 12, making the socket more complex always has an impact on the beamforming performance, but in ATE tests according to embodiments the results are still good as shown in the examples.

[0113] In other words, a device under test socket according to an embodiment (eg, as shown in FIG. 12) can provide a good compromise between ease of use (eg, regarding easy DUT replacement) and interference on the antenna beam.

[0114] Furthermore, FIGS. 13A-13C illustrate an example of an assembly process for a prototype of a device under test socket according to one embodiment.

[0115] 13A shows a device under test socket 1300 in an exploded state. As an optional feature, a lid 1320 has a plurality of L-shaped hooks 1324. As shown in FIG. 13A, as an optional feature, the lid 1320 may have a support structure 1326 and an opening 1322. Furthermore, the plurality of hooks 1324 are provided on the lid 1320, or more precisely, on the support structure 1326 of the lid.

[0116] Additionally, as an optional feature, the hooks are adapted to engage with respective mating hooks 1314 provided on a base structure 1310 (which optionally has a relief portion 1312 for a pusher 1330).

[0117] As an optional feature, the support structure 1326 may include a material having a dielectric constant between 2 and 3.5. Additionally, optionally, the support structure may be made of polyetheretherketone (PEEK).

[0118] As shown, as another optional feature, the support structure 1326 has a substantially rectangular perimeter and an opening 1322 having a rounded perimeter in a central region.

[0119] Additionally, as an optional feature, the base structure 1310 has a recessed area 1370 that forms a device under test pocket, within which an optional DUT contact area 1360 is provided for providing electrical contact to the DUT for testing.

[0120] As an optional feature, a protector structure 1332 is attached to the pusher 1330. The pusher is shown upside down in Figure 13A. The pusher has a stepped pyramid shape so that the smaller end of the pusher 1330 can apply a force to the DUT when seated in a recess 1370 (e.g., a DUT pocket).

[0121] 13B shows an example of a first assembly step, in which pusher 1330 is provided on base structure 1310. As shown, hook 1334 (and therefore closed hook 1324) is provided in the area of ​​the device under test socket beside pusher 1330.

[0122] As shown in FIGS. 13A and 13B, the pusher 1330 is structured with distinct portions that correspond to recessed areas of the base structure 1310, which can allow for easy attachment and centering of the pusher 1330 to the base structure 1310 (see, for example, arrow 1390).

[0123] The closed and / or fully assembled state of the device under test socket 1300 is shown in Figure 13C. As an optional feature, as can be seen in Figures 13A, 13B, and 13C, the lid 1320 optionally has a support structure 1326 that surrounds the device under test position 1370 when viewed in a projection perpendicular to the plane in which the support structure is provided when the lid is secured to the base, or when viewed in a projection perpendicular to the plane of the device under test when the lid is secured to the base.

[0124] Different inventive embodiments and aspects are described herein, for example, in sections relating to "Patent Proposal," "Proposed ATE OTA Sliding Lid Socket Design," "Socket Lid Closing Process," "Possible OTA Socket Variations," "Examples," and "Simulation Results." Further embodiments are also defined by the appended claims.

[0125] It should be noted that any embodiment as defined by the claims may be optionally supplemented by any details (features and functionality and details) described in this specification (e.g., in the above sections or any other sections).

[0126] Furthermore, the embodiments described in the above chapters and / or subchapters can be used individually and optionally supplemented by any feature of other chapters or subchapters or by any feature included in the claims.

[0127] It should also be noted that the individual aspects described herein can be used individually or in combination, and thus details can be added to each of the individual aspects described above without adding details to another one of the aspects described above.

[0128] It should also be noted that this disclosure explicitly or implicitly describes features that can be used in an automatic test equipment or automatic test system, and therefore any of the features described herein can be used in the context of an automatic test equipment or automatic test system.

[0129] Furthermore, features and functionality disclosed herein with respect to a method can also be used in an apparatus (configured to perform such functionality). Furthermore, features and functionality disclosed herein with respect to an apparatus can also be used in the corresponding method. In other words, the methods disclosed herein can be optionally supplemented by any of the features and functionality described with respect to the apparatus.

[0130] Although some aspects have been described in the context of an apparatus, it will be apparent that these aspects also represent a description of a corresponding method, where a block or apparatus corresponds to a method step or feature of a method step, and similarly, aspects described in the context of a method step also represent a description of a corresponding block or item or feature of a corresponding apparatus.

[0131] Depending on particular implementation requirements, embodiments of the present invention can be implemented in hardware or software using a digital storage medium, such as a floppy disk, DVD, CD, ROM, PROM, EPROM, EEPROM or FLASH memory, having electronically readable control signals stored thereon, which cooperates (or is capable of cooperating) with a programmable computer system so that the respective methods are performed.

[0132] Some embodiments of the present invention comprise a data carrier having electronically readable control signals, which can cooperate with a programmable computer system to perform one of the methods described herein.

[0133] Generally, embodiments of the present invention may be implemented as a computer program product having program code operable to perform one of the methods when the computer program product is run on a computer. The program code may for example be stored on a machine readable carrier.

[0134] Other embodiments comprise the computer program for performing one of the methods described herein, stored on a machine readable carrier.

[0135] In other words, an embodiment of the inventive method is, therefore, a computer program comprising a program code for performing one of the methods described herein when the computer program runs on a computer.

[0136] A further embodiment of the inventive method is, therefore, a data carrier (or digital storage medium, or computer readable medium) having recorded thereon a computer program for performing one of the methods described herein.

[0137] A further embodiment of the inventive method is, therefore, a data stream or a sequence of signals representing the computer program for performing one of the methods described herein, The data stream or the sequence of signals can be adapted to be transferred via a data communication connection (e.g. the Internet).

[0138] A further embodiment comprises a processing means (for example a computer), or a programmable logic device configured to or adapted to perform one of the methods described herein.

[0139] A further embodiment comprises a computer having installed thereon the computer program for performing one of the methods described herein.

[0140] In some embodiments, a programmable logic device (e.g., a field programmable gate array) may be used to perform some or all of the functionality of the methods described herein. In some embodiments, a field programmable gate array may cooperate with a microprocessor to perform one of the methods described herein. In general, the methods are preferably performed by any hardware apparatus.

[0141] The above-described embodiments merely illustrate the principles of the present invention. It is understood that modifications and variations of the arrangements and details described herein will be apparent to those skilled in the art. It is therefore intended to be limited only by the scope of the following claims, and not by the specific details presented in the description and explanation of the embodiments herein.

Claims

1. A device under test socket for testing a device under test, comprising: a base structure; a lid; the lid is configured to be securable to the base structure by rotation of the lid; the lid is configured to push a pusher toward a device under test portion of the base structure; a central portion of the lid being open and / or having a low dielectric constant material; Device under test socket.

2. the device under test socket has a pusher configured to push the device under test toward a device under test pocket; the pusher comprises a low dielectric constant material; the lid is configured to push the pusher toward the device under test pocket.

2. The device under test socket according to claim 1.

3. the pusher is made of a material having a relative dielectric constant of 1.2 or less; 3. The device under test socket according to claim 1.

4. The pusher is made of a hard foam material.

4. The device under test socket according to claim 1.

5. the material of the pusher has a tensile modulus greater than 80 MPa; 5. The device under test socket according to claim 1.

6. The tensile modulus of the material of the pusher is less than one-tenth of the tensile modulus of the material of the lid; 6. The device under test socket according to claim 1.

7. the base structure includes a removal portion configured to receive the pusher; 7. The device under test socket according to claim 1.

8. the lid and the pusher are configured to be separate parts of the device under test socket; 8. The device under test socket according to claim 1.

9. The pusher is attached to the lid.

8. The device under test socket according to claim 1.

10. The pusher is mechanically coupled to the lid in a floating manner.

8. The device under test socket according to claim 1.

11. the pusher is configured to be manually inserted into the removal portion of the base structure; the pusher is configured to be pushed toward the device under test pocket by a force from the lid when the lid is fixed to the base structure by rotation of the lid.

11. The device under test socket according to claim 1.

12. a protector structure attached to the pusher in a region where the pusher is adjacent to the lid; The protector structure is provided between the pusher and the lid.

12. The device under test socket according to claim 1.

13. a protector structure attached to a top surface of the pusher facing away from the device under test pocket; The protector structure is provided on an outer region of the upper surface of the pusher, leaving a central region of the upper surface of the pusher open.

13. The device under test socket according to claim 1.

14. the material of the protector structure comprises a higher mechanical stability than the material of the pusher; and / or The material of the protector structure has a relative dielectric constant of 2 or more.

14. The device under test socket according to claim 11.

15. a cross-sectional area of ​​the pusher expanding in a direction from the device under test pocket toward the lid; 15. The device under test socket according to claim 1.

16. a cross-sectional area of ​​the pusher adjacent the lid that is at least twice as large as a cross-sectional area of ​​the pusher adjacent the device under test pocket; 16. The device under test socket according to claim 1.

17. the pusher has a rounded cross section adjacent the lid, and / or the pusher has a rounded cross section adjacent the device under test pocket; 17. A device under test socket according to any one of claims 1 to 16.

18. the pusher has a shape that conforms to the shape of the device under test pocket in the vicinity of the device under test pocket; 17. A device under test socket according to any one of claims 1 to 16.

19. the pusher is configured to reach into the device under test pocket when the lid is attached to the base structure; or the pusher is configured to prevent the lid from entering the device under test pocket when the lid is attached to the base structure.

19. A device under test socket according to any one of claims 1 to 18.

20. the pusher is configured to cover the device under test and to cover an area surrounding the device under test; 20. A device under test socket according to any one of claims 1 to 19.

21. the lid has a support structure that surrounds the location of the device under test when viewed in a projection perpendicular to a plane on which the support structure is provided when the lid is fixed to the base, or when viewed in a projection perpendicular to a plane of the device under test when the lid is fixed to the base; 21. The device under test socket according to claim 1.

22. the support structure comprises a material having a dielectric constant of 2 to 3.5; 22. The device under test socket of claim 21.

23. The support structure is made of polyetheretherketone (PEEK).

23. A device under test socket according to any one of claims 20 to 22.

24. the support structure has a substantially rectangular periphery; the support structure has an opening in a central region with a rounded periphery; 24. A device under test socket according to any one of claims 20 to 23.

25. a plurality of hooks are provided on the lid or on a support structure for the lid; the hooks on the lid or the support structure are adapted to engage with respective mating hooks on the base structure; 25. A device under test socket according to any one of claims 1 to 24.

26. the hook is provided in a region of the device under test socket adjacent to the pusher; 26. The device under test socket of claim 25.

27. The hook is L-shaped.

27. A device under test socket according to claim 25 or 26.

28. a first portion of each of the hooks on the base structure configured to hold a second portion of each of the hooks on the base structure spaced apart from a surface of the base structure; an inner surface of each of the second portions of the hooks on the base structure configured to allow a hook on the lid or the support structure to engage with the inner surface; 28. A device under test socket according to any one of claims 25 to 27.

29. a first portion of each hook on the lid or the support structure configured to hold a second portion of each hook on the lid or the support structure spaced apart from a surface of the lid or the support structure; an inner surface of each of the second portions of the hooks on the lid or the support structure configured to engage with an inner surface of each of the hooks on the base structure; 29. A device under test socket according to any one of claims 25 to 28.

30. the hook is configured to secure the lid by friction or by a snap-in function that is releasable by manual rotation of the lid; 30. A device under test socket according to any one of claims 25 to 29.

31. 1. A method for testing a device under test, comprising: The method comprises: inserting the device under test into a device under test socket having a base structure and a lid; and securing the lid to the base structure by rotating the lid; a central portion of the lid being open and / or having a low dielectric constant material; the lid pushes a pusher toward the device under test portion of the base structure; method.

32. The method includes performing an OTA test of the device under test; wireless transmission between the device under test and a test antenna is performed through the central portion of the lid and the pusher; the central portion is open and / or has a low dielectric constant material; 32. The method of claim 31 .

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