Flaw detection device
The flaw detection device enhances accuracy and mobility by using a probe with multiple coils, a digital cable, and a multiplexer to switch coil excitation timing, addressing noise issues in conventional systems and enabling efficient remote operation.
Patent Information
- Application Number
- JP2021062226
- Authority / Receiving Office
- JP · JP
- Patent Type
- Patents
- Current Assignee / Owner
- Filing Date
- 2021-03-31
- Publication Date
- 2025-01-10
- Estimated Expiration
- 2041-03-31
AI Technical Summary
Conventional flaw detection systems in nuclear power plants face reduced accuracy due to noise susceptibility in long analog cables connecting the probe and flaw detector.
A flaw detection device utilizing a probe with multiple coils, a data processing unit, and a digital cable (LAN cable) connected to a controller, incorporating a multiplexer to switch coil excitation timing and a PoE injector for power supply, reducing noise interference and enabling accurate flaw detection.
The device achieves higher accuracy in flaw detection by minimizing noise interference and allowing for a more compact, flexible, and cost-effective setup, suitable for remote operation using a robot arm.
Smart Images

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Abstract
Description
[Technical field]
[0001] The present disclosure relates to a flaw detection device. [Background technology]
[0002] In nuclear power plants, the reactor vessel (RV) may deteriorate or become damaged over time.
[0003] Therefore, a technology for detecting such deterioration or damage is required. As an example of such a technology, an inspection probe described in the following Patent Document 1 is known. This inspection probe includes a flaw detection coil, a coil holding part for holding the coil, and a cable connected to the coil holding part. By scanning the inspection target part with this probe, it is possible to detect the location of the deterioration part or the occurrence of the damage. Specifically, an eddy current is generated by passing a current through the coil, and multiple magnetic fluxes are generated from the coil. If deterioration or damage exists, these magnetic fluxes are disturbed. By detecting this disturbance in the magnetic flux with a flaw detector provided separately from the probe, it is possible to identify the location of the deterioration part or the occurrence of the damage. [Prior art documents] [Patent documents]
[0004] [Patent Document 1] JP 2000-28584 A Summary of the Invention [Problem to be solved by the invention]
[0005] Conventionally, the probe and the flaw detector were generally placed far apart and connected by a long analog cable. However, analog cables have the problem that they are prone to picking up noise. As a result, there is a risk that the accuracy of the flaw detection work will decrease.
[0006] The present disclosure has been made to solve the above-mentioned problems, and aims to provide a flaw detection device capable of performing flaw detection work with higher accuracy. [Means for solving the problem]
[0007] In order to solve the above problems, the flaw detection device according to the present disclosure includes a flaw detection device main body having a probe having a plurality of coils and a data processing unit that processes the amount of change in magnetic flux generated by the coils, and a controller that is connected to the flaw detection device main body by a digital cable and receives digital data sent from the data processing unit, the digital cable being a LAN cable, and further including a power supply unit that supplies power to the flaw detection device main body via the digital cable, the power supply unit being a PoE injector. The magnetic flux sensor further includes a multiplexer that is provided between the coils and the data processing unit and sequentially switches the timing of exciting the coils, and the data processing unit includes only one transceiver that processes a signal based on the amount of change in magnetic flux of each of the coils input via the multiplexer. . Effect of the Invention
[0008] According to the present disclosure, it is possible to provide a flaw detection device capable of performing flaw detection work with higher accuracy. [Brief description of the drawings]
[0009] [Figure 1] 1 is a schematic diagram showing a configuration of a flaw detection device according to an embodiment of the present disclosure. [Diagram 2] 2 is a schematic diagram showing the configuration of a probe and a data processing unit according to the present disclosure. FIG. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS
[0010] (Configuration of flaw detection equipment) A flaw detection device 100 according to an embodiment of the present disclosure will be described below with reference to Fig. 1 and Fig. 2. The flaw detection device 100 is used to perform flaw detection inspection of, for example, a reactor vessel, piping, and other structural components of a nuclear power plant.
[0011] As shown in FIG. 1, the flaw detection device 100 includes a flaw detection device main body 10, a controller 3, a PoE injector 4, a power supply unit 5, an analog cable 6, and a digital cable 7.
[0012] The flaw detector main body 10 has a probe 1 and a data processing unit 2. The probe 1 is a member placed in a part to be inspected. As shown in Fig. 2, the probe 1 has a plurality of coils 11 and a multiplexer 12. When the coils 11 are excited, an eddy current is generated around the probe 1, and a magnetic flux is also generated. The multiplexer 12 is provided to switch the timing for exciting the plurality of coils 11.
[0013] The data processing unit 2 is connected to the multiplexer 12 by an analog cable 6. The analog signal (analog signal related to the amount of change in magnetic flux) sent from the multiplexer 12 is converted into a digital signal by the data processing unit 2. The data processing unit 2 has only one transmitting / receiving unit 21. The transmitting / receiving unit 21 receives the analog signal related to the amount of change in magnetic flux and performs digital conversion.
[0014] The data processing unit 2 is connected to the controller 3 by a digital cable 7 (for example, a LAN cable). The controller 3 is a terminal that analyzes the data digitally converted by the data processing unit 2 and sends a signal for exciting the coil 11.
[0015] A PoE injector 4 is provided midway along the digital cable 7. Furthermore, a power supply unit 5 is connected to this PoE injector 4. Specifically, a power storage device such as a battery or an AC 100V is preferably used as the power supply unit 5. Power supplied from the power supply unit 5 is conducted onto the digital cable 7 via the PoE injector 4. Furthermore, power is supplied to the probe 1 and the data processing unit 2 through the digital cable 7.
[0016] The flaw detection device 100 configured as above is desirably configured so that flaw detection work can be performed remotely, for example, by attaching the probe 1 to the tip of a robot arm and the data processing unit 2 to the base of the robot arm.
[0017] (Action and effect) Next, the operation of the flaw detector 100 will be described. When using the flaw detector 100, first, the probe 1 is caused to scan the surface of an object such as a reactor vessel or piping, while detecting the location of deteriorated parts or damage. Specifically, an eddy current is generated by passing electricity through the coil 11, and magnetic flux is generated from the coil 11. If deterioration or damage is present, disturbances occur in these magnetic fluxes. This disturbance in magnetic flux is detected by a data processing unit 2 provided separately from the probe 1, and the controller 3 records and analyzes the data, thereby making it possible to identify the location of deteriorated parts or damage.
[0018] Conventionally, the probe 1 and the data processor 2 are generally placed far away from each other and connected by a long analog cable. However, analog cables have a problem in that they are susceptible to noise. As a result, there is a risk that the accuracy of the flaw detection work will decrease.
[0019] However, according to the above configuration, the flaw detector body 10 and the controller 3 are connected by a digital cable 7. This reduces the possibility of noise being superimposed compared to when they are connected by an analog cable, for example. This makes it possible to perform flaw detection work with higher accuracy.
[0020] According to the above configuration, the multiplexer 12 sequentially switches the timing of exciting the multiple coils 11, and the amount of change in the magnetic flux of these coils 11 can be collectively processed by a single transceiver 21. This makes it possible to reduce the size and size of the data processor 2 compared to a configuration in which a transceiver 21 is provided for each coil 11. As a result, it becomes possible to increase the mobility of the flaw detector 100. More specifically, as described above, it becomes possible to attach the data processor 2 to the base of the robot arm. This also makes it possible to shorten the length of the analog cable 6 connecting the probe 1 and the data processor 2. As a result, it becomes possible to further reduce the possibility of noise being superimposed.
[0021] Furthermore, according to the above configuration, since a LAN cable, which is an existing standard, is used as the digital cable 7, the flaw detection device 100 can be constructed more inexpensively, and the LAN cable is more advantageous than other wiring materials in terms of availability.
[0022] According to the above configuration, the PoE injector 4 supplies power to the flaw detection device main body 10 via the digital cable 7. This eliminates the need to connect another power supply device or another cable dedicated to power supply. As a result, the flaw detection device 100 is lighter in weight, making it possible to handle the flaw detection device more flexibly.
[0023] The embodiment of the present disclosure has been described above. However, various changes and modifications can be made to the above configuration without departing from the gist of the present disclosure.
[0024] <Additional Notes> The flaw detection device 100 described in each embodiment can be understood, for example, as follows.
[0025] (1) A flaw detection device 100 according to a first embodiment includes a flaw detection device main body 10 having a probe 1 having a plurality of coils 11 and a data processing unit 2 that processes the amount of change in magnetic flux generated by the coils 11, and a controller 3 that is connected to the flaw detection device main body 10 by a digital cable 7 and receives as input digital data sent from the data processing unit 2.
[0026] According to the above configuration, the flaw detector body 10 and the controller 3 are connected by the digital cable 7. This can reduce the possibility of noise being superimposed, compared to when the two are connected by an analog cable, for example.
[0027] (2) The flaw detection device 100 of the second embodiment further has a multiplexer 12 provided between the multiple coils 11 and the data processing unit 2, which switches the timing of exciting the multiple coils 11, and the data processing unit 2 has only one transceiver unit 21 that processes the signal input from the multiplexer 12.
[0028] According to the above configuration, the multiplexer 12 sequentially switches the timing of exciting the multiple coils 11, and the amounts of change in magnetic flux of these coils 11 can be collectively processed by a single transceiver 21. This makes it possible to keep the dimensions and size of the data processing unit 2 small compared to a configuration in which a transceiver 21 is provided for each coil 11.
[0029] (3) In the flaw detector 100 according to the third aspect, the digital cable 7 is a LAN cable.
[0030] According to the above configuration, since a LAN cable, which is an existing standard, is used as the digital cable 7, the flaw detector can be constructed at a lower cost and is more advantageous in terms of availability than other wiring materials.
[0031] (4) The flaw detection device 100 according to the fourth aspect further includes a power supply unit 5 that supplies power to the flaw detection device main body 10 via the digital cable 7 .
[0032] According to the above configuration, power is supplied to the flaw detection device main body 10 via the digital cable 7. This eliminates the need to connect another power supply device or another cable dedicated to power supply. As a result, the flaw detection device 100 is lighter in weight, making it possible to handle the flaw detection device 100 more flexibly. [Explanation of symbols]
[0033] 100 Flaw detection equipment 1 Probe 2 Data Processing Section 3. Controller 4 PoE Injectors 5 Power supply unit 6 Analog Cable 7 Digital Cable 10 Flaw detection device body 11 Coil 12 Multiplexer 21 Transmitter / receiver
Claims
[Claim 1] A flaw detection device body having a probe having a plurality of coils and a data processing unit for processing the amount of change in magnetic flux generated by the coils; a controller connected to the flaw detection device body via a digital cable and receiving the digital data from the data processing unit; Equipped with the digital cable is a LAN cable, Further, a power supply unit is provided which supplies power to the flaw detection device body via the digital cable, the power supply unit is a PoE injector, A multiplexer is provided between the coils and the data processing unit, and sequentially switches the timing of exciting the coils. The data processing unit is a flaw detection device having only one transceiver unit that processes a signal based on the amount of change in magnetic flux of each of the coils input via the multiplexer.
Citation Information
Patent Citations
Sensor and apparatus for flaw detection of metal pipe
JP1997329585A
Eddy current flaw detection probe
JP1998123098A
Probe for capillary inspection
JP2000028584A
Underground pipe inspection probe
JP2002535617A
In-tube inspection apparatus and in-tube inspection method
JP2003005093A