Automated Component Testing

Abstract

Automated component testing includes booting a component under test in a first operating environment, running one or more test patterns on the component through the first operating environment, performing a comparison of one or more observed characteristics associated with the one or more test patterns to one or more predicted characteristics, and altering one or more operating parameters of a central processing unit of the component based on the comparison.

Description

[Background technology]

[0001] The performance of the central processing unit components differs from that of the test environment due to differences in the environment and aging of the components. Therefore, when a component is placed in an environment different from the test environment due to aging, the capability of the component changes. [Brief description of the drawings]

[0002] [Figure 1] FIG. 2 is a block diagram of an example computer for automated component testing, according to some embodiments. [Diagram 2] 1 is a flowchart of an example method for automated component testing, according to some embodiments. [Diagram 3] 1 is a flowchart of an example method for automated component testing, according to some embodiments. [Figure 4] 1 is a flowchart of an example method for automated component testing, according to some embodiments. [Diagram 5] 1 is a flowchart of an example method for automated component testing, according to some embodiments. [Figure 6] 1 is a flowchart of an example method for automated component testing, according to some embodiments. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0003] In some embodiments, a method for automated component testing includes booting a component under test in a first operating environment, running one or more test patterns on the component via the first operating environment, performing a comparison between one or more observed characteristics associated with the one or more test patterns and one or more predicted characteristics, and altering one or more operating parameters of a central processing unit of the component based on the comparison.

[0004] In some embodiments, the method includes providing the one or more observed characteristics to one or more of a basic input / output system (BIOS) or a system management unit. In some embodiments, modifying one or more operating parameters of the central processing unit includes applying an offset or modification to a voltage frequency curve. In some embodiments, the one or more observed characteristics include a fault condition and modifying the one or more operating parameters includes one or more operating parameters to avoid the fault condition. In some embodiments, the method includes booting the component in a second operating environment. In some embodiments, the second operating environment includes an operating system. In some embodiments, booting in the first operating environment includes loading the first operating environment from a basic input / output system read only memory (BIOS ROM).

[0005] In some embodiments, an apparatus for automated component testing performs steps including booting a component under test in a first operating environment, running one or more test patterns on the component via the first operating environment, performing a comparison between one or more observed characteristics associated with the one or more test patterns and one or more predicted characteristics, and altering one or more operating parameters of a central processing unit of the component based on the comparison.

[0006] In some embodiments, the step includes providing the one or more observed characteristics to one or more of a basic input / output system (BIOS) or a system management unit. In some embodiments, modifying one or more operating parameters of the central processing unit includes applying an offset or modification to a voltage frequency curve. In some embodiments, the one or more observed characteristics include a fault condition and modifying the one or more operating parameters includes one or more operating parameters to avoid the fault condition. In some embodiments, the step includes booting the component in a second operating environment. In some embodiments, the second operating environment includes an operating system. In some embodiments, booting in the first operating environment includes loading the first operating environment from a basic input / output system read only memory (BIOS ROM).

[0007] In some embodiments, a computer program product for automated component testing, disposed on a computer readable medium, includes computer program instructions that, when executed, cause a computer to perform steps including booting a component under test in a first operating environment, running one or more test patterns on the component via the first operating environment, performing a comparison between one or more observed characteristics associated with the one or more test patterns and one or more predicted characteristics, and altering one or more operating parameters of a central processing unit of the component based on the comparison.

[0008] In some embodiments, the step includes providing the one or more observed characteristics to one or more of a basic input / output system (BIOS) or a system management unit. In some embodiments, modifying one or more operating parameters of the central processing unit includes applying an offset or modification to a voltage frequency curve. In some embodiments, the one or more observed characteristics include a fault condition and modifying the one or more operating parameters includes one or more operating parameters to avoid the fault condition. In some embodiments, the step includes booting the component in a second operating environment. In some embodiments, the second operating environment includes an operating system. In some embodiments, booting in the first operating environment includes loading the first operating environment from a basic input / output system read only memory (BIOS ROM).

[0009] Automated component testing according to the present disclosure is generally performed on a computer, i.e., an automated computing device. For further explanation, FIGURE 1 illustrates a block diagram of an automated computing device including an exemplary computer 100 configured for automated component testing according to an embodiment of the present invention. The computer 100 of FIGURE 1 includes at least one computer processor 102 or "CPU" and random access memory 104 (RAM) connected to the processor 102 and other components of the computer 100 via a high speed memory bus 106 and a bus adapter 108.

[0010] Stored in RAM 104 is an operating system 110. Operating systems useful in computers configured for automated component testing include UNIX, Linux, Microsoft Windows, and others as would occur to one of ordinary skill in the art. Although the operating system 110 in the example of FIG. 1 is shown in RAM 104, many components of such software are typically also stored in non-volatile memory, such as, for example, a data storage device 112, such as a disk drive. Also stored in RAM are test modules 114 for automated component testing according to certain embodiments.

[0011] 1 includes a disk drive adapter 116 coupled to processor 102 and other components of computer 100 via expansion bus 118 and bus adapter 108. Disk drive adapter 116 connects non-volatile data storage to computer 100 in the form of data storage device 112. Disk drive adapters useful in computers configured for automated component testing include Integrated Drive Electronics (IDE) adapters, Small Computer System Interface (SCSI) adapters, and others as would occur to one of ordinary skill in the art. In some embodiments, non-volatile computer memory is implemented as optical disk drives, Electrically Erasable Programmable Read Only Memory (so-called "EEPROM" or "Flash" memory), RAM drives, and the like, as would occur to one of ordinary skill in the art.

[0012] The example computer 100 of Figure 1 includes one or more input / output (I / O) adapters 120. The I / O adapters implement user-oriented input / output, for example, via software drivers and computer hardware for controlling output to a display device, such as a computer display screen, and user input from user input devices 122, such as a keyboard and mouse. The example computer 100 of Figure 1 includes a video adapter 124, which is an example of an I / O adapter designed specifically for graphics output to a display device 126, such as a display screen or computer monitor. The video adapter 124 is connected to the processor 102 via a high-speed video bus 128, the bus adapter 108, and a frontside bus 130, which is also a high-speed bus.

[0013] The example computer 100 of Figure 1 includes a communications adapter 132 for data communications with other computers and with a data communications network. Such data communications may be performed serially, via an RS-232 connection, via an external bus such as a Universal Serial Bus (USB), via a data communications network such as an IP data communications network, and / or in other manners as would occur to one skilled in the art. The communications adapter implements a hardware level of data communications through which one computer sends data communications to another computer, either directly or via a data communications network. Examples of communications adapters useful in computers configured for automated component testing include modems for wired dial-up communications, Ethernet (IEEE 802.3) adapters for wired data communications, and 802.11 adapters for wireless data communications.

[0014] For further explanation, FIG. 2 shows a flow chart illustrating an exemplary method for automated component testing that includes booting (202) a component under test (e.g., computer 100 or a component of computer 100) in a first operating environment (e.g., by test module 114). Test module 114 is loaded and executed as part of the boot process of computer 100. The first operating environment comprises a micro-operating system or bootable operating environment separate from main operating system 110 of computer 100. Thus, the first operating environment is booted before main operating system 110 as the same part. In some embodiments, the first operating environment is a dedicated micro-operating system or lightweight operating system for performing test operations on computer 100, as described below. In an embodiment, the first operating environment is booted (202) in response to a selection or confirmation from a user. For example, a user interface presents the user with an option to boot (202) in the first operating environment before booting into a second operating environment, such as main operating system 100. In an embodiment, the first operating environment 202 is loaded from a read-only memory or other non-volatile storage device on a motherboard or other hardware component separate from a disk or mass storage device.

[0015] The method of FIG. 2 also includes executing (204) one or more test patterns on the components through the first operating environment. The one or more test patterns test the performance of one or more components of the computer 100 under varying configurations or operating settings. For example, the one or more test patterns include stress tests designed to test whether one or more components will fail under a particular configuration or operating setting. Examples of such configurations or operating settings include clock speeds (e.g., frequencies), voltages, etc. Examples of components targeted by the one or more test patterns include individual cores of the processor 102, data fabric, caches, memories, etc. In some embodiments, the one or more test patterns correspond to test patterns used to test a particular component (e.g., the processor 102) during development or manufacturing to ensure that the given component can operate under “worst case scenario” conditions, such as predetermined temperature conditions, or under a particular stress test. In some embodiments, the one or more test patterns are automatically selected for execution. In other embodiments, the one or more test patterns are selected for execution from a plurality of test patterns in response to user input, in response to a predetermined scheduling or ordering of test pattern execution, or based on other criteria.

[0016] The method of FIG. 2 also includes performing a comparison (206) of one or more observed characteristics associated with the one or more test patterns to one or more predicted characteristics. The performance of the component varies over time as the component ages and as the computer 100 in which the component is installed operates in an environment different from the environment in which the component was originally tested. Thus, the one or more predicted characteristics correspond to predicted performance metrics when executing the one or more test patterns. For example, the one or more predicted characteristics include metrics related to the execution of the one or more test patterns as a whole (e.g., total time to execute a given test pattern or multiple test patterns, whether a test pattern failed to execute, which actions caused a particular test pattern to fail, etc.). As another example, the one or more predicted characteristics include metrics related to the performance of a particular component (e.g., observed frequency or voltage of a given core, whether a particular component failed, which test pattern or action caused a particular component to fail, etc.).

[0017] The one or more observed characteristics are a sampling or observation that corresponds to the one or more predicted characteristics as observed during or after execution of the one or more test patterns. The one or more observed characteristics are then compared to the one or more predicted characteristics to determine how the actual performance of the component differs from the observed performance of the component. The comparison thus identifies differences, including differences in execution time for one or more of the test patterns, differences in operating voltage for one or more cores at particular points during execution of the test patterns, differences in temperature conditions, differences in whether and / or where a failure condition was entered for a particular component or test pattern, etc.

[0018] The method of FIG. 2 also includes modifying one or more operating parameters of a central processing unit (e.g., processor 100) of the component based on the comparison. In some embodiments, modifying the one or more operating parameters includes applying an offset or modification to a voltage-frequency curve of a particular core. The voltage-frequency curve is represented as a graph with one axis corresponding to the voltage of the core and another axis corresponding to the frequency of the core, with temperature providing a third axis. Thus, the voltage-frequency curve indicates the frequency (e.g., maximum frequency) at which the core can operate for a given voltage and temperature. Thus, applying an offset to the voltage-frequency curve includes increasing or decreasing one or more points on the voltage-frequency curve by a particular value. In other embodiments, modifying the one or more operating parameters includes applying an offset to a margin of the voltage-frequency curve. The frequency curve includes minimum and maximum values ​​for voltage and frequency across temperature. Those minimum and maximum values ​​are the margin of the voltage-frequency curve. Applying an offset to the margin of the voltage-frequency curve includes increasing or decreasing the minimum or maximum allowable voltage and / or frequency for a given core.

[0019] Modifying 208 one or more operating parameters includes determining one or more modifications to apply. In an embodiment, the observed difference corresponds to a predetermined modification to apply. For example, a predetermined offset is applied to the voltage frequency curve when the execution time for a particular test drops below the predicted execution time by an amount above a threshold. As another example, a predetermined offset is applied to the voltage frequency curve when a predicted fault condition is not entered. In other embodiments, the modification is programmatically calculated based on the comparison. For example, the difference between the one or more characteristics is provided as an input to a function or algorithm that calculates the one or more modifications to apply.

[0020] In some embodiments, if the observed characteristic is an observed fault condition, one or more operating parameters are altered to exclude a particular configuration of the component during the fault condition. For example, if a particular voltage, voltage / frequency, or voltage / frequency / temperature combination of a core causes an error, the core is altered to avoid the particular voltage, voltage / frequency, or voltage / frequency / temperature combination.

[0021] In an embodiment, the test module 114 facilitates transmission of one or more changes to one or more observed characteristics and / or operating parameters to a server or other entity. For example, data indicative of one or more changes to one or more observed characteristics and / or operating parameters is stored in non-volatile memory. The data is then accessed by an application executing in the main operating system and transmitted to the server or other entity.

[0022] After modifying 208 one or more operating parameters, the test module 114 may resume the boot process of the computer 100. For example, the test module 114 may cause the computer 100 to boot into the primary operating system for operation.

[0023] For further explanation, FIG. 3 shows a flowchart illustrating an exemplary method for automated component testing that includes booting (202) a component under test in a first operating environment (e.g., by test module 114), running one or more test patterns on the component via the first operating environment (204), performing a comparison (206) between one or more observed characteristics associated with the one or more test patterns and one or more predicted characteristics, and altering (208) one or more operating parameters of a central processing unit of the component based on the comparison.

[0024] The method of FIG. 3 differs from FIG. 2 in that the method of FIG. 3 includes providing (302) one or more observed characteristics 306 to a basic input / output system (BIOS) 308 (e.g., by a first operating environment 304). For example, the first operating environment 304 stores data indicative of the one or more observed characteristics 306 in a non-volatile memory accessible to the basic input / output system (BIOS) 308. As another example, the first operating environment 302 provides the one or more observed characteristics 306 as arguments or parameters to the basic input / output system (BIOS) 308. Having provided (302) the one or more observed characteristics 306, the basic input / output system (BIOS) 308 performs (206) a comparison between the one or more observed characteristics 306 and one or more predicted characteristics and alters (208) one or more operating parameters based on the comparison.

[0025] For further explanation, FIG. 4 shows a flowchart illustrating an exemplary method for automated component testing that includes booting (202) a component under test in a first operating environment (e.g., by test module 114), running one or more test patterns on the component via the first operating environment (204), performing a comparison (206) between one or more observed characteristics associated with the one or more test patterns and one or more predicted characteristics, and altering (208) one or more operating parameters of a central processing unit of the component based on the comparison.

[0026] The method of FIG. 4 differs from FIG. 2 in that the method of FIG. 4 includes providing (402) one or more observed characteristics 406 to a system management unit (SMU) 408 (e.g., by a first operating environment 404). For example, the first operating environment 404 stores data indicative of the one or more observed characteristics 406 in a non-volatile memory accessible to the system management unit (SMU) 408. As another example, the first operating environment 402 provides the one or more observed characteristics 406 as arguments or parameters to a function of the system management unit (SMU) 408. Having provided (402) the one or more observed characteristics 406, the system management unit (SMU) 408 performs (206) a comparison between the one or more observed characteristics 406 and one or more predicted characteristics and alters (208) one or more operating parameters based on the comparison.

[0027] For further explanation, FIG. 5 shows a flowchart illustrating an exemplary method for automated component testing that includes booting (202) a component under test in a first operating environment (e.g., by test module 114), running one or more test patterns on the component via the first operating environment (204), performing a comparison (206) between one or more observed characteristics associated with the one or more test patterns and one or more predicted characteristics, and altering (208) one or more operating parameters of a central processing unit of the component based on the comparison.

[0028] The method of Figure 5 differs from Figure 2 in that the method of Figure 5 includes booting (502) the component in a second operating environment. For example, the second operating environment includes an operating system 110 (e.g., the main operating system 110 of the computer 100). Thus, after modifying (208) one or more operating parameters, the test module 114 automatically initiates the boot 502 of the main operating system 110 for the user.

[0029] For further explanation, FIG. 6 shows a flowchart illustrating an exemplary method for automated component testing that includes booting (202) a component under test in a first operating environment (e.g., by test module 114), running one or more test patterns on the component via the first operating environment (204), performing a comparison (206) between one or more observed characteristics associated with the one or more test patterns and one or more predicted characteristics, and altering (208) one or more operating parameters of a central processing unit of the component based on the comparison.

[0030] The method of Figure 6 differs from Figure 2 in that booting with the first operating environment (202) includes loading (602) the first operating environment from a basic input / output system read-only memory (BIOS ROM). The boot operation of computer 100 causes the first operating environment to be loaded (602) from the basic input / output system read-only memory (BIOS ROM) into random access memory (RAM) for execution. This distinguishes the first operating environment from other operating systems that are stored on a disk or other mass storage device prior to execution. This allows the first operating environment to be pre-installed on a motherboard or other hardware component during manufacture.

[0031] In view of the above discussion, the reader will understand that advantages of automated component testing according to embodiments of the present disclosure include: Improving the performance of computing systems by automatically testing hardware components over time; Improving the performance of a computing system by automatically reconfiguring and tuning hardware components over time as performance changes; will recognize that this includes

[0032] Exemplary embodiments of the present disclosure are described primarily in the context of a fully functional computer system for automated component testing. However, the skilled reader will recognize that the present disclosure may also be embodied in a computer program product disposed on a computer-readable storage medium for use with any suitable data processing system. Such a computer-readable storage medium may be any storage medium for machine-readable information, including magnetic, optical, or other suitable media. Examples of such media include magnetic disks in hard drives or diskettes, compact disks for optical drives, magnetic tapes, and others as would occur to one skilled in the art. A skilled reader will immediately recognize that any computer system with suitable programming means is capable of executing the steps of the methods of the present disclosure embodied in a computer program product. A skilled reader will also recognize that, although some of the exemplary embodiments described herein are adapted to software installed and executed on computer hardware, alternative embodiments implemented as firmware or as hardware are nevertheless well within the scope of the present disclosure.

[0033] The present disclosure may be a system, a method, and / or a computer program product. The computer program product may include a computer-readable storage medium(s) having computer-readable program instructions thereon for causing a processor to execute aspects of the present disclosure.

[0034] A computer readable storage medium may be a tangible device capable of holding and storing instructions for use by an instruction execution device. A computer readable storage medium may be, for example, but not limited to, an electronic storage device, a magnetic storage device, an optical storage device, an electromagnetic storage device, a semiconductor storage device, or any suitable combination thereof. A non-exhaustive list of more specific examples of computer readable storage media includes the following: portable computer diskettes, hard disks, random access memories (RAM), read-only memories (ROM), erasable programmable read-only memories (EPROM or flash memory), static random access memories (SRAM), portable compact disk read-only memories (CD-ROM), digital versatile disks (DVD), memory sticks, floppy disks, mechanically encoded devices such as punch cards or ridge structures in a groove with instructions recorded on them, and any suitable combination of the above. As used herein, computer-readable storage media should not be interpreted as transitory signals, such as electric waves or other freely propagating electromagnetic waves, electromagnetic waves propagating through a waveguide or other transmission medium (e.g., light pulses passing through a fiber optic cable), or electrical signals transmitted over electrical wires.

[0035] The computer-readable program instructions described herein can be downloaded from a computer-readable storage medium to each computing / processing device or to an external computer or storage device via a network (e.g., the Internet, a local area network, a wide area network, and / or a wireless network). The network can include copper transmission cables, optical transmission fiber, wireless transmission, routers, firewalls, switches, gateway computers, and / or edge servers. A network adapter card or network interface of each computing / processing device receives the computer-readable program instructions from the network and transfers the computer-readable program instructions for storage in a computer-readable storage medium within the respective computing / processing device.

[0036] The computer readable program instructions for carrying out the operations of the present disclosure may be either assembler instructions, instruction set architecture (ISA) instructions, machine language instructions, machine dependent instructions, microcode, firmware instructions, state setting data, or source or object code written in any combination of one or more programming languages, including object oriented programming languages ​​such as Smalltalk, C++, and the like, and conventional procedural programming languages ​​such as the "C" programming language or similar programming languages. The computer readable program instructions may be executed entirely on the user's computer, partially on the user's computer, as a standalone software package, partially on the user's computer, partially on a remote computer, or entirely on a remote computer or server. In the latter scenario, the remote computer may be connected to the user's computer via any type of network, including a local area network (LAN) or wide area network (WAN), or may be connected to an external computer (e.g., via the Internet using an Internet Service Provider). In some embodiments, electronic circuitry including, for example, a programmable logic circuit, a field programmable gate array (FPGA), or a programmable logic array (PLA), can execute computer readable program instructions by utilizing state information of the computer readable program instructions to personalize the electronic circuitry to implement aspects of the present disclosure.

[0037] Aspects of the present disclosure are described herein with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems) and computer program products according to embodiments of the present disclosure. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer readable program instructions.

[0038] These computer readable program instructions may be provided to a processor of a general purpose computer, special purpose computer, or other programmable data processing apparatus to produce a machine such that the instructions, executed by the processor of the computer or other programmable data processing apparatus, generate means for performing the functions / acts specified in one or more blocks of the flowcharts and / or block diagrams. These computer readable program instructions may also be stored on a computer readable storage medium having instructions stored therein that may direct a computer, programmable data processing apparatus, and / or other device to function in a particular manner, such as including an article of manufacture containing instructions that implement aspects of the functions / acts specified in one or more blocks of the flowcharts and / or block diagrams.

[0039] Furthermore, computer-readable program instructions can be loaded into a computer, other programmable data processing apparatus, or other device to execute a series of operational steps on the computer, other programmable data processing apparatus, or other device to create a computer-implemented process such that the instructions executing on the computer, other programmable data processing apparatus, or other device perform the functions / acts specified in one or more blocks of the flowcharts and / or block diagrams.

[0040] The flowcharts and block diagrams in the figures illustrate the architecture, functionality, and operation of possible implementations of systems, methods, and computer program products according to various embodiments of the present disclosure. In this regard, each block in the flowcharts or block diagrams may represent a module, segment, or portion of instructions, including one or more executable instructions for implementing a particular logical function(s). In some alternative implementations, the functions shown in the blocks may occur out of the order shown in the figures. For example, two blocks shown in succession may in fact be executed substantially simultaneously, or the blocks may be executed in the reverse order, depending on the functionality involved. It should also be noted that each block of the block diagrams and / or flowchart diagrams, and combinations of blocks in the block diagrams and / or flowchart diagrams, may be implemented by special-purpose hardware-based systems that perform the specified functions or acts, or a combination of special-purpose hardware and computer instructions.

[0041] From the above description, it will be understood that modifications and changes may be made in various embodiments of the present disclosure. The descriptions herein are for illustrative purposes only and should not be construed in a limiting sense. The scope of the present disclosure is limited only by the language of the following claims.

Claims

1. 1. A method for automated component testing, comprising: booting a computing system with a first operating system of a plurality of operating systems; executing one or more test patterns on a component under test within the computing system in the first operating system state; performing a comparison between one or more observed characteristics and one or more predicted characteristics associated with the one or more test patterns; modifying one or more operating parameters of a central processing unit of the computing system based on the comparison; and booting the computing system with a second operating system of the plurality of operating systems. method.

2. providing the one or more observed characteristics to one or more of a basic input / output system (BIOS) or a system management unit.

2. The method of claim 1.

3. modifying the one or more operating parameters of the central processing unit includes applying an offset or modification to a voltage frequency curve.

2. The method of claim 1.

4. the one or more observed characteristics include a fault condition; and modifying the one or more operating parameters includes modifying the one or more operating parameters to avoid the fault condition.

2. The method of claim 1.

5. The method of claim 1, wherein the first operating system includes a micro-operating system separate from a primary operating system.

2. The method of claim 1.

6. The method of claim 1, wherein the second operating system comprises a primary operating system.

2. The method of claim 1.

7. booting the first operating system includes loading the first operating system from a basic input / output system read-only memory (BIOS ROM); 2. The method of claim 1.

8. 1. An apparatus for automated component testing comprising: A processor; a computer memory operatively connected to said processor, said computer memory including computer program instructions executable by said processor; The computer program instructions, when executed by the processor, booting a computing system with a first operating system of a plurality of operating systems; executing one or more test patterns on a component under test within the computing system in the first operating system state; performing a comparison between one or more observed characteristics and one or more predicted characteristics associated with the one or more test patterns; modifying one or more operating parameters of a central processing unit of the computing system based on the comparison; and booting the computing system with a second operating system of the plurality of operating systems; causing the processor to execute Device.

9. The computer program instructions, when executed by the processor, causing the processor to provide the one or more observed characteristics to one or more of a basic input / output system (BIOS) or a system management unit.

9. The apparatus of claim 8.

10. modifying the one or more operating parameters of the central processing unit includes applying an offset or modification to a voltage frequency curve.

9. The apparatus of claim 8.

11. the one or more observed characteristics include a fault condition; and modifying the one or more operating parameters includes modifying the one or more operating parameters to avoid the fault condition.

9. The apparatus of claim 8.

12. The method of claim 11, wherein the first operating system is a micro-operating system separate from a primary operating system.

9. The apparatus of claim 8.

13. The method of claim 12, wherein the second operating system is a primary operating system.

9. The apparatus of claim 8.

14. booting the first operating system includes loading the first operating system from a basic input / output system read-only memory (BIOS ROM); 9. The apparatus of claim 8.

Images