Facility Inspection Support System, Facility Inspection Support Method, and Facility Inspection Support Program

Abstract

A facility inspection assistance system 50 is provided with: an acquisition unit 51 which acquires abnormality occurrence information 600 representing an abnormality occurrence status regarding each of a plurality of facilities 60; a determination unit 52 which determines priorities 521 regarding the inspection of the facilities 60 on the basis of the abnormality occurrence information 600 and attributes 520 of the facilities; and a generation unit 53 which generates inspection work information 530 representing inspection work for the facilities 60 on the basis of the priorities 521 and the attributes 520 of the facilities. Thus the facility inspection assistance system 50 achieves the determination of inspection work based on appropriate response policies for failures occurring in the facilities 60.

Description

Technical Field

[0001] The present invention relates to a facility inspection support system, a facility inspection support method, and a recording medium storing a facility inspection support program.

Background Art

[0002] For example, when a failure occurs in social infrastructure such as power facilities, it may have a great impact on people's lives. Therefore, there is an increasing expectation for a technology that can appropriately show the situation of the occurred failure to the facility manager or the like so that the occurred failure can be dealt with quickly and appropriately.

[0003] As a technology related to such a technology, Patent Document 1 discloses a display device configured to be communicable with a data storage device capable of storing data representing the state of a plant device detected by a detection device and the rank of the state of the plant device based on the data. When communicating with the data storage device, this display device displays, in a list, information regarding a plurality of arbitrarily selected detection devices and the rank. And this display device displays the position of the detection device on a map image showing the plant.

[0004] Further, Patent Document 2 discloses a monitoring device that switches and inputs monitoring images by a plurality of infrared cameras, detects an abnormality by performing image processing on the monitoring images, and displays the detection content. This monitoring device displays a live image by a plurality of infrared cameras or an image processed for abnormality detection, and at that time, displays graphic information such as a map or a sketch showing a map including the monitoring range side by side. And this monitoring device overlays and displays a mark such that the detection item and the location can be known at the time of an abnormality on the graphic information, and enlarges and displays the portion of the graphic information where the mark is displayed in response to a magnification instruction.

Prior Art Documents

Patent Documents

[0005] [Patent Document 1] Japanese Patent Application Laid-Open No. 2017-167761 [Patent Document 2] Japanese Patent Application Laid-Open No. 06-028132 [Summary of the Invention] [Problems to be Solved by the Invention]

[0006] For example, when a failure occurs in a plurality of facilities that make up social infrastructure, it is required to minimize the impact on people's lives by performing efficient responses (inspections and repair work) among limited human resources. And the response policy for the failure that occurs in the facility is usually determined manually. However, due to a mistake in judgment by the facility manager who determined the response policy for the failure, inappropriate responses may be made to the failure, resulting in a great impact on people's lives. As an example of an inappropriate response to a failure, for example, in the inspection work indicated by the response policy, the priority of inspecting the facility may not be optimal, such as a delay in inspecting a facility that has a large impact (high importance) on people's lives. Although the above-mentioned Patent Documents 1 and 2 can be expected to show the situation of the failure that occurred in the facility to some extent, they cannot solve the problem of determining the inspection work of the facility based on an appropriate response policy.

[0007] The main object of the present invention is to provide an equipment inspection support system or the like that realizes determining an inspection work based on an appropriate response policy for a failure that occurs in the equipment. [Means for Solving the Problems]

[0008] An equipment inspection support system according to an aspect of the present invention includes an acquisition means for acquiring abnormality occurrence information representing the occurrence situation of abnormalities regarding each of a plurality of pieces of equipment, a determination means for determining the priority regarding the inspection of the equipment based on the abnormality occurrence information and the attributes of the equipment, and a generation means for generating inspection work information representing the inspection work of the equipment based on the priority and the attributes of the equipment.

[0009] In another aspect for achieving the above object, a facility inspection support method according to an aspect of the present invention includes an information processing apparatus acquiring abnormality occurrence information representing the occurrence status of abnormalities regarding each of a plurality of facilities, determining a priority regarding the inspection of the facilities based on the abnormality occurrence information and the attributes of the facilities, and generating inspection work information representing the inspection work of the facilities based on the priority and the attributes of the facilities.

[0010] Furthermore, in a further aspect for achieving the above object, a facility inspection support program according to an aspect of the present invention is a program for causing a computer to execute an acquisition process of acquiring abnormality occurrence information representing the occurrence status of abnormalities regarding each of a plurality of facilities, a determination process of determining a priority regarding the inspection of the facilities based on the abnormality occurrence information and the attributes of the facilities, and a generation process of generating inspection work information representing the inspection work of the facilities based on the priority and the attributes of the facilities.

[0011] Furthermore, the present invention can also be realized by a computer-readable non-volatile recording medium storing such a facility inspection support program (computer program).

Advantages of the Invention

[0012] According to the present invention, a facility inspection support system or the like that realizes determining an inspection work based on an appropriate countermeasure policy for a failure occurring in a facility can be obtained.

Brief Description of the Drawings

[0013]

Figure 1

Figure 2

Figure 3

Figure 4

Figure 5

Figure 6

Figure 7

Figure 8

[0014] Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.

[0015] <First Embodiment> FIG. 29 is a block diagram showing the configuration of an equipment inspection support system 1 according to a first embodiment of the present invention. The equipment inspection support system 1 according to the present embodiment is a system that supports determining an inspection operation based on an appropriate countermeasure policy for a failure that has occurred in a plurality of pieces of equipment 40. The equipment 40 is, for example, power equipment or communication equipment that constitutes social infrastructure.

[0016] The equipment inspection support system 1 generally includes an equipment inspection support apparatus 10, an equipment diagnosis apparatus 20, and a management terminal apparatus 30.

[0017] The equipment diagnosis device 20 is communicably connected to the equipment inspection support device 10 via a communication network such as the Internet. The equipment diagnosis device 20 is an information processing device that acquires information representing the states of a plurality of pieces of equipment 40 and diagnoses whether an abnormality (failure) has occurred in the equipment 40 based on the acquired information.

[0018] The information representing the states of the plurality of pieces of equipment 40 is, for example, an image obtained by imaging the equipment 40, or recorded data obtained by recording the sound generated from the equipment 40, or measurement data obtained by measuring the state of the equipment 40 with a sensor (measuring device). The measurement data is, for example, the temperature at a predetermined location of the equipment 40, or the current or voltage in an electric circuit included in the equipment 40. The equipment diagnosis device 20 can acquire this information representing the state of the equipment 40 from a camera that images the equipment 40, or a microphone that inputs the sound generated from the equipment 40, or a sensor that measures the state of the equipment 40, etc., via the communication network.

[0019] The equipment diagnosis device 20 determines whether an abnormality has occurred in the equipment 40 based on the information representing the state of the equipment 40 acquired as described above and a predetermined diagnosis criterion. Since a well-known technique can be applied to the method of determining whether an abnormality has occurred in the equipment 40 by the equipment diagnosis device 20, the detailed description thereof is omitted in this embodiment. The equipment diagnosis device 20 transmits the information representing the state of the equipment 40, including the determination result of whether an abnormality has occurred in the equipment 40, to the equipment inspection support device 10. Note that the functions of the equipment diagnosis device 20 may be implemented in the equipment inspection support device 10.

[0020] The management terminal device 30 is an information processing device such as a personal computer, and is communicably connected to the facility inspection support device 10. The management terminal device 30 is used as a user interface, for example, when a user (such as an administrator or worker of the facility 40) inputs information to the facility inspection support device 10, or when the user checks the content of the information output from the facility inspection support device 10. The management terminal device 30 includes a display screen 31 for displaying the information input to the facility inspection support device 10 or the information output from the facility inspection support device 10.

[0021] The facility inspection support device 10 is an information processing device such as a server, and specifically, is a device such as the information processing device 900 illustrated in FIG. 8 described later. The facility inspection support device 10 includes an acquisition unit 11, a determination unit 12, a generation unit 13, a display control unit 14, and a storage unit 15. The acquisition unit 11, the determination unit 12, the generation unit 13, and the display control unit 14 are examples of an acquisition means, a determination means, a generation means, and a display control means, respectively.

[0022] The storage unit 15 is a non-volatile storage device such as a RAM (Random Access Memory) 903 or a hard disk 904 illustrated in FIG. 8, for example. The storage unit 15 stores facility attribute information 151, abnormality occurrence information 152, and inspection work information 155, which will be described later.

[0023] The acquisition unit 11 acquires, from the facility diagnosis device 20, information representing the state of the facility 40 and abnormality occurrence information 152 representing the determination result as to whether an abnormality has occurred in the facility 40. The acquisition unit 11 stores the acquired abnormality occurrence information 152 in the storage unit 15. The abnormality occurrence information 152 includes a captured image 153 and measurement data 154.

[0024] The captured image 153 is an image of the facility 40 captured by, for example, a visible light camera or an infrared camera. The captured image 153 includes the result of determining whether an abnormality has occurred on the surface of the facility 40 by analyzing the image of the facility 40. More specifically, the captured image 153 represents the occurrence of scratches or cracks on the surface of the facility 40. The captured image 153 alternatively represents the state of adhesion of liquids such as oil or water on the surface of the facility 40. The type of liquid adhering to the surface of the facility 40 can be determined from captured images using infrared rays of a plurality of wavelengths, for example, by utilizing the differences in the absorption characteristics of infrared rays of different wavelengths for different types of liquids.

[0025] The measurement data 154 is, for example, recording data obtained by recording the sound generated from the facility 40 using a microphone. The measurement data 154 is alternatively, for example, measurement data obtained by measuring the state of the facility 40 (e.g., the temperature at a predetermined location, or the current or voltage in an electric circuit included in the facility 40) using a sensor (measurement device). The measurement data 154 includes the result of determining whether abnormal noise is generated from the facility 40 by analyzing the above-described recording data. The measurement data 154 alternatively includes the result of determining whether the facility 40 is in an abnormal state by analyzing the measurement data regarding temperature, current, voltage, etc.

[0026] The determination unit 12 determines the priority for inspecting each individual facility 40 based on the abnormality occurrence information 152 and the facility attribute information 151. That is, the determination unit 12 determines the priority using the abnormality occurrence information 152, the facility attribute information 151, and a criterion as described later for determining the priority.

[0027] The facility attribute information 151 is information representing the attributes of each individual facility 40, and is, for example, information created in advance by the administrator of the facility 40 or the like and stored in the storage unit 15.

[0028] The equipment attribute information 151 represents, as an attribute of the equipment 40, for example, the location where the equipment 40 is installed. The location where the equipment 40 is installed can be represented, for example, by latitude and longitude. The equipment attribute information 151 may also include characteristics of the location where the equipment 40 is installed. The characteristics of the location include, for example, characteristics related to the terrain such as being along a river or a coast, or being in the mountains, or the firmness of the ground. The characteristics of the location may alternatively include characteristics related to the use such as whether it is a densely populated residential area, whether it is adjacent to farmland, or whether it is an industrial area.

[0029] The equipment attribute information 151 represents, as an attribute of the equipment 40, or for example, the importance of the equipment 40 in people's lives. The importance of the equipment 40 is, for example, the degree of influence that a certain equipment 40 with a failure has on people's living environment. For example, if the area where a power outage may occur is wider when a failure occurs in a certain equipment 40, it can be said that the importance of that equipment 40 is higher. Or for example, when a liquid used by a certain equipment 40 leaks due to damage to the surface of the equipment 40, the higher the toxicity of the liquid and the larger the population near the equipment 40, the higher the importance of that equipment 40 can be said.

[0030] For example, regarding a certain equipment 40, assume that the abnormal occurrence information 152 indicates an abnormality in the power distribution system such as a transformer, and the equipment attribute information 151 indicates that the importance of that equipment 40 is high (for example, there is a possibility of a widespread power outage due to a failure of that equipment 40). In this case, the determination unit 12 sets a high priority for inspecting that equipment 40.

[0031] Or for example, regarding a certain equipment 40, assume that the abnormal occurrence information 152 indicates that a non-toxic liquid such as water is leaking, and the equipment attribute information 151 indicates that the importance of that equipment 40 is low (for example, even if the function of that equipment 40 stops, there is a low possibility of a serious event such as a power outage). In this case, the determination unit 12 sets a low priority for inspecting that equipment 40.

[0032] Further, the determination unit 12 may calculate an abnormality rate representing the degree of abnormality from the difference between the state of the facility 40 indicated by the abnormality occurrence information 152 and the state of the facility 40 during normal operation, and determine the priority for inspecting the facility 40 described above based on the calculated abnormality rate. That is, the higher the abnormality rate, the higher the determination unit 12 sets the priority for inspecting the facility 40.

[0033] For example, for a certain facility 40, the determination unit 12 calculates the abnormality rate from the difference between the temperature of a predetermined location indicated by the abnormality occurrence information 152 and the temperature of the predetermined location when the facility 40 is operating normally. However, it is assumed that the temperature of the predetermined location when the facility 40 is operating normally is included in the facility attribute information 151.

[0034] Alternatively, for example, for a certain facility 40, the determination unit 12 calculates the abnormality rate from the difference between the current or voltage in the electrical circuit of the facility 40 indicated by the abnormality occurrence information 152 and the current or voltage in the electrical circuit when the facility 40 is operating normally. However, it is assumed that the current or voltage in the electrical circuit when the facility 40 is operating normally is included in the facility attribute information 151.

[0035] The determination unit 12 may calculate the above-described abnormality rate, for example, as a ratio to a predetermined reference value of the above-described difference. The reference value is, for example, a value preset by the administrator of the facility 40 or the like and is included in the facility attribute information 151. The reference value may be, for example, a value that can be regarded as the facility 40 operating normally (it cannot be determined that a failure has occurred in the facility 40), and may be a value indicating the allowable range of the state of the facility 40.

[0036] For example, when a certain facility 40 is operating normally, assume that the temperature at a predetermined location of the facility 40 is around 30 degrees. Then, based on the air temperature at the installation location of the facility 40 and the load situation of the operation of the facility 40, etc., it is assumed that the facility 40 is operating normally within an allowable range where the temperature at the said predetermined location is up to 40 degrees. And when the temperature at the said predetermined location reaches 40 degrees or more, it can be considered that a failure has occurred in the facility 40. In this case, when the temperature at the predetermined location of the facility 40 indicated by the abnormality occurrence information 152 is 40 degrees or more, the determination unit 12 calculates the abnormality rate of the facility 40 as 100%. Also in the case of this example, when the temperature at the predetermined location of the facility 40 is 30 degrees and 35 degrees, the determination unit 12 calculates the abnormality rates of the facility 40 as 0% and 50% respectively. Incidentally, when the temperature at the predetermined location of the facility 40 is 30 degrees or less, since there is no abnormal heat generation at the predetermined location of the facility 40, the determination unit 12 may calculate the abnormality rate as 0%. The determination unit 12 may, alternatively, for example, calculate the abnormality rate based on the area where oil leakage, cracking, etc. have occurred in the facility 40. More specifically, the determination unit 12 may calculate the abnormality rate based on the ratio of the detected area to the maximum allowable area regarding oil leakage and cracking.

[0037] The determination unit 12 may also adjust the above-mentioned abnormality rate based on the degree of influence of the failed facility 40 on people's living environment. For example, in the above example, the determination unit 12 may make the calculation criteria for the abnormality rate stricter as the importance of the facility 40 is higher (the influence on the living environment is greater), and make the calculation criteria for the abnormality rate looser as the importance of the facility 40 is lower. More specifically, for example, when the importance of the facility 40 is high, the determination unit 12 calculates the abnormality rate as 100% when the temperature at the said predetermined location indicated by the abnormality occurrence information 152 is 35 degrees or more, and when the importance of the facility 40 is low, the determination unit 12 calculates the abnormality rate as 100% when the temperature at the said predetermined location indicated by the abnormality occurrence information 152 is 45 degrees or more.

[0038] The generation unit 13 generates inspection work information 155 representing the inspection work of the individual facilities 40 based on the priority of inspecting the individual facilities 40 determined by the determination unit 12 and the facility attribute information 151. That is, the generation unit 13 generates the inspection work information 155 using the priority and the facility attribute information 151 and the criteria as described below for generating the inspection work information 155. The inspection work information includes an inspection route 156 and inspection items 157. Details of the method by which the generation unit 13 generates the inspection work information 155 will be described later.

[0039] The display control unit 14 displays the abnormality occurrence information 152 acquired by the acquisition unit 11, the abnormality rate calculated by the determination unit 12, and the inspection work information 155 generated by the generation unit 13 on the display screen 31 of the management terminal device 30. Note that the management terminal device 30 is an example of a display device.

[0040] FIG. 2 is a diagram illustrating a mode in which the display control unit 14 according to the present embodiment displays the abnormality occurrence information 152 and the inspection work information 155 on the display screen 31. As illustrated in FIG. 2, the display screen 31 includes a facility name display window 311, a measurement data display window 312, an abnormality rate display window 313, an imaging image display window 314, an inspection route display window 315, and an inspection item display window 316. Note that the mode in which the display control unit 14 displays on the display screen 31 is not limited to the mode illustrated in FIG. 2. The display control unit 14 may display, for example, at least any one of the plurality of windows described above on the display screen 31, or may display information different from the information displayed in the above-described windows on the display screen 31.

[0041] The display control unit 14 displays the name of the facility 40 to be the target for displaying information in the measurement data display window 312, the abnormality rate display window 313, and the imaging image display window 314 in the facility name display window 311. Note that the abnormality occurrence information 152 includes an identifier of the facility 40 in which an abnormality has occurred, and the facility attribute information 151 includes the name of the facility 40 for each such identifier.

[0042] The display control unit 14 displays the measurement data 154 related to the facility 40 whose name is displayed in the facility name display window 311 in the measurement data display window 312. In the example shown in FIG. 2, the display control unit 14 is displaying a graph representing the measurement data 154. The display control unit 14 may display, for example, a graph representing the temporal change of the temperature at a predetermined location of the facility 40, or a graph representing the temporal change of the current or voltage in the electric circuit provided in the facility 40, in the measurement data display window 312. Alternatively, the display control unit 14 may display, for example, a graph representing the luminance value of the imaging image with respect to the wavelength component such as infrared rays obtained by imaging the facility 40, in the measurement data display window 312.

[0043] The display control unit 14 may display a sentence or a table representing the measurement data 154 in the measurement data display window 312. Alternatively, the display control unit 14 may also display the analysis result of the measurement data 154 in the measurement data display window 312.

[0044] The display control unit 14 displays the abnormality rate related to the facility 40 calculated by the determination unit 12 as described above in the abnormality rate display window 313. In the example shown in FIG. 2, the display control unit 14 is displaying the abnormality rates related to two items, item A and item B, by a graph and numerical values. However, item A and item B represent the items for detecting abnormalities in the facility 40, and specifically, for example, they represent temperature, current, voltage, the occurrence status of scratches or cracks, the adhesion status of liquids, the occurrence status of abnormal noises, etc. Note that the items related to the abnormality rate to be displayed in the abnormality rate display window 313 by the display control unit 14 are not limited to two.

[0045] The display control unit 14 displays the imaging image 153 in the imaging image display window 314. In the example shown in FIG. 2, the display control unit 14 is displaying the imaging image 153 of the facility 40 with scratches or cracks on its surface. The display control unit 14 may also display the analysis result of the imaging image 153 in the imaging image display window 314.

[0046] The display control unit 14 displays the above-described abnormality occurrence information 152 and the like to be displayed on the facility name display window 311, the measurement data display window 312, the abnormality rate display window 313, and the captured image display window 314 while switching in order from the facility 40 with the highest priority determined by the determination unit 12 as described above. For example, the display control unit 14 displays the above-described abnormality occurrence information 152 and the like related to a certain facility 40 for a predetermined time, and then switches to and displays the abnormality occurrence information 152 and the like related to the next facility 40.

[0047] The display control unit 14 displays the inspection route 156 generated by the generation unit 13 on the inspection route display window 315 in the display screen 31.

[0048] FIG. 3 is a diagram showing a first example of a mode in which the display control unit 14 according to the present embodiment displays the inspection route 156 on the inspection route display window 315. The inspection route 156 in the example shown in FIG. 3 represents an inspection route for the facility 40 in a relatively narrow area such as an urban area. In this case, the facility 40 is, for example, a power facility such as a transformer installed on a utility pole or the like, or a communication facility such as a base station or the like.

[0049] In the inspection route 156 illustrated in FIG. 3, "◎", "〇", and "△" represent the facilities 40 whose priorities for inspection are determined by the determination unit 12 to be "high", "medium", and "low" in order. In the example shown in FIG. 3, there are 4, 5, and 8 facilities 40 whose priorities for inspection are determined to be "high", "medium", and "low" in order.

[0050] In this case, for example, the generation unit 13 determines that the four facilities 40 with a "high" priority for inspection are the targets for inspection by the operator, and excludes the other facilities 40 with "medium" and "low" priorities from the targets for inspection by the operator. Then, the generation unit 13 generates the inspection route 156 so that the facilities 40 to be inspected can be inspected most efficiently. More specifically, the inspection route 156 represents, for example, the shortest route when the operator tours the facilities 40 to be inspected.

[0051] Based on the map information representing the locations of the four facilities 40 with a "high" priority for inspection and the roads near the facilities 40 indicated by the facility attribute information 151, the generation unit 13 generates an inspection route 156 using, for example, an algorithm for solving the traveling salesman problem. However, it is assumed that the map information is stored in the storage unit 15.

[0052] For example, when there is a facility with a "medium" priority on the shortest path when the worker tours the facilities with a "high" priority for inspection, the generation unit 13 may generate an inspection route 156 indicating that the facility with a "medium" priority is also inspected together.

[0053] FIG. 4 is a diagram showing a second example of a mode in which the display control unit 14 according to the present embodiment displays the inspection route 156 in the inspection route display window 315. The inspection route 156 in the example shown in FIG. 4 represents an inspection route for the facilities 40 in an area wider than the area shown in FIG. 3. In this case, the facility 40 is, for example, a substation facility or the like.

[0054] In the example shown in FIG. 4, there are 5, 9, and 10 facilities 40 determined to have "high", "medium", and "low" priorities for inspection, respectively. In the example shown in FIG. 4, the determination unit 12 sets the priority higher as the facility 40 is closer to the sea and as the facility 40 is closer to the river. The reason is that the closer the facility 40 is to the sea or the river, the greater the impact on the living environment of water pollution through the sea or the river caused by substances leaking due to the occurrence of obstacles. Also, the closer the facility 40 is to the sea or the river, the more likely it is to be affected by water disasters such as flooding.

[0055] Similar to the case of the example shown in FIG. 3, the generation unit 13 generates an inspection route 156 based on the locations of the five facilities 40 with a "high" priority for inspection indicated by the facility attribute information 151 and the map information near the facilities 40.

[0056] The display control unit 14 displays the inspection items 157 generated by the generation unit 13 in the inspection item display window 316 on the display screen 31.

[0057] FIG. 5 is a diagram illustrating a mode in which the display control unit 14 according to the present embodiment displays the inspection item 157 in the inspection item display window 316. The inspection item 157 in the example shown in FIG. 5 indicates the names of four facilities 40 with high priority to be inspected and the inspection items for each of those facilities 40 when the inspection route 156 is the example shown in FIG. 3.

[0058] The generation unit 13 generates the inspection item 157 regarding each facility 40 based on the abnormality occurrence information 152. In the example shown in FIG. 5, the inspection item 157 indicates, as the inspection item for "Facility #0001", "the state of cracks and oil leakage on the surface of the facility" and "the heat generation location". In this case, the generation unit 13 generates the inspection item 157 of the above content based on the abnormality occurrence information 152 indicating that cracks, oil leakage, and temperature abnormality have occurred on the surface of the facility in "Facility #0001".

[0059] Also, in the example shown in FIG. 5, the inspection item 157 indicates, as the inspection item for "Facility #0032", "the presence or absence of foreign matter adhesion to the electric circuit" and "the occurrence of cable disconnection". In this case, the generation unit 13 refers to the abnormality occurrence information 152 indicating that an abnormality in the current or voltage of the electric circuit has occurred in "Facility #0032". The generation unit 13 also refers to the facility attribute information 151 indicating that an abnormality in the current or voltage of the electric circuit may occur due to foreign matter adhesion to the electric circuit or cable disconnection. Then, the generation unit 13 generates the inspection item 157 of the above content based on the abnormality occurrence information 152 and the facility attribute information 151. Thus, for example, when the facility attribute information 151 includes information indicating the association between the abnormality that has occurred in the facility 40 and the event considered to be the cause of the abnormality, the generation unit 13 may generate the inspection item 157 indicating more detailed content based on the facility attribute information 151.

[0060] Further, when multiple items of abnormalities occur in a certain facility 40, the generation unit 13 may generate the inspection items 157 only for the items that meet the criteria regarding importance (high importance), and not generate the inspection items 157 for the items that do not meet the criteria (low importance). However, the items with high importance are, for example, items that lead to events with a great impact on the living environment such as power outages or environmental pollution. More specifically, for example, in a certain facility 40, if voltage abnormality is a factor causing a power outage and temperature abnormality is not a factor causing a power outage, the generation unit 13 may generate the inspection items 157 only for the voltage abnormality.

[0061] Next, with reference to the flowchart of FIG. 6, the operation (processing) of the facility inspection support system 1 according to the present embodiment will be described in detail.

[0062] The acquisition unit 11 acquires the abnormality occurrence information 152 regarding each of the plurality of facilities 40 from the facility diagnostic device 20 (step S101). The determination unit 12 calculates the abnormality rate regarding each of the facilities 40 based on the facility attribute information 151 and the abnormality occurrence information 152 (step S102). The determination unit 12 determines the priority for inspecting each of the facilities 40 based on the calculated abnormality rate (step S103).

[0063] The generation unit 13 generates the inspection route 156 for the worker to patrol based on the priority for inspecting each of the facilities 40 determined by the determination unit 12 and the positions of the individual facilities 40 indicated by the facility attribute information 151 (step S104). The generation unit 13 generates the inspection items 157 regarding each of the facilities 40 to be inspected based on the abnormality occurrence information 152 (step S105).

[0064] The display control unit 14 displays, on the display screen 31, the facility name display window 311, the measurement data display window 312, the abnormality rate display window 313, and the captured image display window 314, the name, measurement data 154, abnormality rate, and captured image 153 for each facility 40, in order from the facility 40 with the highest priority, while switching at a predetermined time interval (step S106). The display control unit 14 displays the inspection route 156 and inspection items 157 generated by the generation unit 13 on the inspection route display window 315 and the inspection item display window 316 on the display screen 31 (step S107), and the overall process ends.

[0065] The facility inspection support system 1 according to the present embodiment can determine an inspection work based on an appropriate countermeasure policy for a failure occurring in a facility. The reason is that the facility inspection support system 1 determines the priority regarding the inspection of the facility 40 based on the abnormality occurrence information 152 and the facility attribute information 151 regarding each of the plurality of facilities 40, and generates the inspection work information 155 based on the determined priority and the facility attribute information 151.

[0066] Hereinafter, the effects achieved by the facility inspection support system 1 according to the present embodiment will be described in detail.

[0067] For example, when a failure occurs in a plurality of facilities constituting social infrastructure, it is required to minimize the impact on people's lives by taking efficient countermeasures with limited human resources. And the countermeasure policy for a failure occurring in a facility is usually determined manually. However, due to a judgment error of the facility administrator who determined the countermeasure policy for the failure, an inappropriate countermeasure may be taken for the failure, resulting in a great impact on people's lives. As an example of an inappropriate countermeasure for a failure, for example, in the inspection work indicated by the countermeasure policy, the priority of inspecting a facility may not be optimal, such as a delay in inspecting a facility with a large impact (high importance) on people's lives. That is, when a failure occurs in a facility, it is an issue to support the determination of the inspection work of the facility based on an appropriate countermeasure policy.

[0068] In response to such problems, the facility inspection support system 1 according to the present embodiment includes an acquisition unit 11, a determination unit 12, and a generation unit 13, and operates as described above with reference to FIGS. 1 to 6. That is, the acquisition unit 11 acquires abnormality occurrence information 152 representing the occurrence status of abnormalities regarding each of a plurality of facilities 40. The determination unit 12 determines the priority regarding the inspection of the facilities based on the abnormality occurrence information 152 and the facility attribute information 151. Then, the generation unit 13 generates inspection work information 155 representing the inspection work of the facilities based on the priority and the facility attribute information 151.

[0069] That is, the facility inspection support system 1 according to the present embodiment determines the priority for inspecting the facility 40 based on the occurrence status of abnormalities in the facility 40 and the degree of influence on people's lives of the facility 40, etc., and determines the inspection work information 155 based on the priority and the position of the facility 40, etc. Thereby, the facility inspection support system 1 according to the present embodiment can determine an inspection work based on an appropriate countermeasure policy for the failure that has occurred in the facility 40.

[0070] Further, the facility inspection support system 1 according to the present embodiment calculates an abnormality rate based on the difference between the state of the facility 40 represented by the abnormality occurrence information 152 and the state of the facility 40 when it is normal, and the degree of influence that the facility 40 where the failure has occurred has on the living environment. Then, the facility inspection support system 1 determines the priority for inspecting the facility 40 based on the calculated abnormality rate. Thereby, the facility inspection support system 1 can more appropriately determine the inspection work for the facility 40.

[0071] Further, as illustrated in FIGS. 2 to 5, the facility inspection support system 1 according to the present embodiment displays the abnormality occurrence information 152, the inspection work information 155, and the abnormality rate on the display screen 31. Then, the facility inspection support system 1 switches and displays the abnormality occurrence information 152 and the abnormality rate in order from the facility 40 with the highest inspection priority on the display screen 31. Thereby, the facility inspection support system 1 can assist the administrator or worker of the facility 40 to appropriately recognize the situation of the facility 40 where the abnormality has occurred based on its importance.

[0072] In addition, considering the impact of the failure of the facility 40 on environmental pollution, the facility inspection support system 1 according to the present embodiment sets a higher priority for inspection as the facility 40 is closer to the sea and as the facility 40 is closer to the river. Further, the facility inspection support system 1 sets a higher priority for inspection as the area affected by the failure of the facility 40 is larger. Thereby, the facility inspection support system 1 can determine the inspection work so as to minimize the impact on people's lives as much as possible.

[0073] In addition, the facility inspection support system 1 according to the present embodiment generates an inspection route 156 representing the shortest route for the worker to patrol the facilities 40 that need to be inspected. Thereby, the facility inspection support system 1 can support the efficient inspection work of the facilities 40 with limited human resources.

[0074] In addition, when a plurality of abnormalities occur in the facility 40, the facility inspection support system 1 according to the present embodiment includes inspection items 157 related to the abnormalities whose degree of influence on the living environment meets the standard in the inspection work information 155. That is, the facility inspection support system 1 does not include inspection items 157 related to abnormalities whose degree of influence on the living environment does not meet the standard (that is, whose importance is low) in the inspection work information 155. Thereby, the facility inspection support system 1 narrows down the inspection items to those with high importance, so that it can support the efficient inspection work of the facilities 40 with limited human resources.

[0075] In addition, the facility inspection support system 1 according to the present embodiment generates inspection items 157 based on facility attribute information 151 indicating the association between the abnormalities occurring in the facility 40, the causes of the abnormalities, and the events considered to be the causes. Thereby, the facility inspection support system 1 can support the accurate inspection work of the facilities 40.

[0076] <Second Embodiment> FIG. 7 is a block diagram showing the configuration of an equipment inspection support system 50 according to a second embodiment of the present invention. The equipment inspection support system 50 includes an acquisition unit 51, a determination unit 52, and a generation unit 53. However, the acquisition unit 51, the determination unit 52, and the generation unit 53 are examples of an acquisition means, a determination means, and a generation means, respectively, in that order.

[0077] The acquisition unit 51 acquires abnormality occurrence information 600 representing the occurrence status of abnormalities regarding each of a plurality of pieces of equipment 60. However, the equipment 60 is, for example, the same power equipment or communication equipment as the equipment 40 according to the first embodiment, and the abnormality occurrence information 600 is, for example, the same information as the abnormality occurrence information 152 according to the first embodiment. The acquisition unit 51 may acquire the abnormality occurrence information 600 via a device such as the equipment diagnostic device 20 in the same manner as the acquisition unit 11 according to the first embodiment.

[0078] The determination unit 52 determines a priority 521 regarding the inspection of the equipment based on the abnormality occurrence information 600 and the attributes 520 of the equipment. The attributes 520 of the equipment are, for example, the same information as the equipment attribute information 151 according to the first embodiment. The determination unit 52 determines the priority 521 in the same manner as the determination unit 12 according to the first embodiment.

[0079] The generation unit 53 generates inspection work information 530 representing the inspection work of the equipment based on the priority 521 and the attributes 520 of the equipment. The inspection work information 530 is, for example, the same information as the inspection work information 155 according to the first embodiment, and may include information such as the inspection route 156 and the inspection items 157 according to the first embodiment.

[0080] The equipment inspection support system 50 according to the present embodiment can determine an inspection work based on an appropriate countermeasure policy for a failure that has occurred in the equipment. The reason is that the equipment inspection support system 50 determines the priority 521 regarding the inspection of the equipment 60 based on the abnormality occurrence information 600 regarding each of the plurality of pieces of equipment 60 and the attributes 520 of the equipment, and generates the inspection work information 530 based on the determined priority 521 and the attributes 520 of the equipment.

[0081] <Hardware Configuration Example> In each of the above-described embodiments, each part in the facility inspection support device 10 shown in FIG. 1 and the facility inspection support system 50 shown in FIG. 7 can be realized by dedicated HW (Hardware) (electronic circuit). Further, in FIGS. 1 and 7, at least the following configurations can be regarded as functional (processing) units (software modules) of a software program. · Acquisition units 11 and 51, · Determination units 12 and 52, · Generation units 13 and 53, · Display control unit 14, · Storage control function in the storage unit 15.

[0082] However, the division of each part shown in these drawings is a configuration for convenience of explanation, and various configurations can be assumed in implementation. An example of the hardware environment in this case will be described with reference to FIG. 8.

[0083] FIG. 8 is a diagram exemplarily explaining the configuration of an information processing device 900 (computer) capable of executing the facility inspection support device 10 according to the first embodiment of the present invention or the facility inspection support system 50 according to the second embodiment. That is, FIG. 8 shows the configuration of a computer (information processing device) capable of realizing the facility inspection support device 10 shown in FIG. 1 and the facility inspection support system 50 shown in FIG. 7, and represents a hardware environment capable of realizing each function in the above-described embodiments.

[0084] The information processing device 900 shown in FIG. 8 includes the following as components, but may not include some of the following components. · CPU (Central_Processing_Unit) 901, · ROM (Read_Only_Memory) 902, · RAM (Random_Access_Memory) 903, · Hard disk (storage device) 904, · Communication interface with an external device 905, · Bus 906 (communication line), ·A reader / writer 908 capable of reading and writing data stored in a recording medium 907 such as a CD-ROM (Compact Disc Read Only Memory), ·Input / output interfaces 909 such as monitors, speakers, and keyboards.

[0085] That is, the information processing apparatus 900 including the above components is a general computer in which these components are connected via a bus 906. The information processing apparatus 900 may include a plurality of CPUs 901, or may include a CPU 901 configured by a multi-core. The information processing apparatus 900 may include a GPU (Graphical Processing Unit) (not shown) in addition to the CPU 901.

[0086] And, the present invention described by taking the above-described embodiment as an example supplies a computer program capable of realizing the following functions to the information processing apparatus 900 shown in FIG. 8. The functions are the above-described configurations in the block configuration diagrams (FIGS. 1 and 7) referred to in the description of the embodiment, or the functions of the flowchart (FIG. 6). The present invention is then achieved by reading the computer program into the CPU 901 of the hardware, interpreting, and executing it. Further, the computer program supplied into the apparatus may be stored in a readable and writable volatile memory (RAM 903), or a non-volatile storage device such as a ROM 902 or a hard disk 904.

[0087] Also, in the above case, a general procedure at present can be adopted as a method for supplying the computer program into the hardware. Examples of the procedure include a method of installing it into the apparatus via various recording media 907 such as a CD-ROM, and a method of downloading it from the outside via a communication line such as the Internet. And, in such a case, the present invention can be regarded as being constituted by the code constituting such a computer program or the recording medium 907 storing the code.

[0088] The present invention has been described above by taking the above-described embodiments as exemplary examples. However, the present invention is not limited to the above-described embodiments. That is, within the scope of the present invention, various aspects understandable by those skilled in the art can be applied.

[0089] In addition, some or all of each of the above-described embodiments may be described as follows in the appended claims. However, the present invention exemplified by each of the above-described embodiments is not limited to the following.

[0090] (Appended Claim 1) An acquisition means for acquiring abnormality occurrence information representing the occurrence status of abnormalities related to each of a plurality of facilities; A determination means for determining the priority regarding the inspection of the facility based on the abnormality occurrence information and the attribute of the facility; A generation means for generating inspection work information representing the inspection work of the facility based on the priority and the attribute of the facility; A facility inspection support system comprising:

[0091] (Appended Claim 2) The determination means calculates an abnormality rate from the difference between the state of the facility represented by the abnormality occurrence information and the state of the facility in a normal state, and determines the priority based on the abnormality rate. The facility inspection support system according to Appended Claim 1.

[0092] (Appended Claim 3) The determination means calculates the abnormality rate based on the degree of influence of the facility in an abnormal state on the living environment. The facility inspection support system according to Appended Claim 2.

[0093] (Appended Claim 4) Further comprising a display control means for displaying at least any one of the abnormality occurrence information, the inspection work information, and the abnormality rate on a display device. The facility inspection support system according to Appended Claim 2 or Appended Claim 3.

[0094] (Appended Claim 5) The display control means sequentially switches the abnormality occurrence information from the facilities with higher priority and displays it on the display device. The facility inspection support system according to Supplementary Note 4.

[0095] (Supplementary Note 6) The abnormality occurrence information includes an image obtained by imaging the facility and an analysis result of the image. The facility inspection support system according to any one of Supplementary Notes 1 to 5.

[0096] (Supplementary Note 7) The abnormality occurrence information includes measurement data related to the state of the facility and an analysis result of the measurement data. The facility inspection support system according to any one of Supplementary Notes 1 to 6.

[0097] (Supplementary Note 8) The attributes of the facility include the importance of the facility and the location of the facility. The facility inspection support system according to any one of Supplementary Notes 1 to 7.

[0098] (Supplementary Note 9) The inspection work information represents the shortest route for the worker to patrol the facilities that require inspection. The facility inspection support system according to Supplementary Note 8.

[0099] (Supplementary Note 10) The inspection work information represents the necessity or non-necessity of inspection by the worker for each individual facility. The facility inspection support system according to Supplementary Note 8 or 9.

[0100] (Supplementary Note 11) The determination means sets the priority higher as the facility is closer to the sea and as the facility is closer to the river. The facility inspection support system according to any one of Supplementary Notes 8 to 10.

[0101] (Supplementary Note 12) The determination means sets the priority higher as the area affected by the failure of the facility is wider. The facility inspection support system according to any one of Appendices 8 to 11.

[0102] (Appendix 13) The generation means generates the inspection work information representing the inspection items for each of the facilities based on the abnormality occurrence information. The facility inspection support system according to any one of Appendices 1 to 12.

[0103] (Appendix 14) When a plurality of abnormalities have occurred in the facility, the generation means generates the inspection work information representing the inspection items for the abnormality whose degree of influence on the living environment meets the standard. The facility inspection support system according to Appendix 13.

[0104] (Appendix 15) The generation means generates the inspection work information based on the attribute of the facility indicating the association between the abnormality that has occurred in the facility and the cause of the abnormality and the event considered to be the cause. The facility inspection support system according to Appendix 13 or Appendix 14.

[0105] (Appendix 16) By an information processing device Obtain abnormality occurrence information representing the occurrence status of abnormalities for each of a plurality of facilities Based on the abnormality occurrence information and the attribute of the facility, determine the priority regarding the inspection of the facility Based on the priority and the attribute of the facility, generate inspection work information representing the inspection work of the facility Facility inspection support method.

[0106] (Appendix 17) An acquisition process for acquiring abnormality occurrence information representing the occurrence status of abnormalities for each of a plurality of facilities A determination process for determining the priority regarding the inspection of the facility based on the abnormality occurrence information and the attribute of the facility A generation process that generates inspection work information representing the inspection work of the facility based on the priority and the attributes of the facility; A recording medium storing a facility inspection support program for causing a computer to execute the above.

Explanation of Signs

[0107] 1 Facility Inspection Support System 10 Facility Inspection Support Device 11 Acquisition Unit 12 Decision Unit 13 Generation Unit 14 Display Control Unit 15 Storage Unit 151 Facility Attribute Information 152 Abnormality Occurrence Information 153 Captured Image 154 Measurement Data 155 Inspection Work Information 156 Inspection Route 157 Inspection Item 20 Facility Diagnostic Device 30 Management Terminal Device 31 Display Screen 311 Facility Name Display Window 312 Measurement Data Display Window 313 Abnormality Rate Display Window 314 Captured Image Display Window 315 Inspection Route Display Window 316 Inspection Item Display Window 40 Facility 50 Facility Inspection Support System 51 Acquisition Unit 52 Decision Unit 520 Attributes of the Facility 521 Priority 53 Generation Unit 530 Inspection Work Information 60 Facility 600 Abnormality Occurrence Information 900 Information Processing Device 901 CPU 902 ROM 903 RAM 904 Hard Disk (Memory Device) 905 Communication Interface 906 Bus 907 Recording Medium 908 Reader / Writer 909 Input / Output Interface

Claims

1. An acquisition means for acquiring abnormality occurrence information representing the occurrence status of abnormalities related to each of a plurality of facilities; A priority determination means for determining the priority regarding the inspection of the facility based on the abnormality occurrence information and the attributes of the facility; An inspection facility determination means for determining the facility to be inspected based on the priority; A generation means for generating inspection work information including an inspection route that is the shortest route for touring a plurality of the facilities determined to be inspection targets, which is information representing the inspection work of the facilities; Comprising; The generation means adds a facility on the shortest route among the facilities not determined to be inspection targets to the inspection targets and generates the inspection route, an equipment inspection support system.

2. The priority determination means calculates an abnormality rate from the difference between the state of the facility represented by the abnormality occurrence information and the state of the facility in a normal state, and determines the priority based on the abnormality rate. The equipment inspection support system according to claim 1.

3. The priority determination means calculates the abnormality rate based on the degree of influence of the facility in an abnormal state on the living environment. The equipment inspection support system according to claim 2.

4. Further comprising a display control means for displaying the abnormality occurrence information, the inspection work information, and the abnormality rate on a display device. The equipment inspection support system according to claim 2 or claim 3.

5. The display control means switches and displays the abnormality occurrence information on the display device in order from the facility with the highest priority. The equipment inspection support system according to claim 4.

6. The abnormality occurrence information includes an image of the facility and an analysis result of the image. The equipment inspection support system according to any one of claims 1 to 5.

7. The abnormality occurrence information includes measurement data regarding the state of the facility and an analysis result of the measurement data. The equipment inspection support system according to any one of claims 1 to 6.

8. The attributes of the facility include the importance of the facility and the location of the facility. The priority is determined in three levels according to the height. The inspection facility determination means determines the facility with the highest level of the priority as the inspection target. The generation means adds a facility that is on the shortest route among the facilities not determined to be inspection targets and has the second highest level of the priority to the inspection targets and generates the inspection route. The equipment inspection support system according to any one of claims 1 to 7.

9. An information processing apparatus acquires abnormality occurrence information indicating the occurrence status of abnormalities for each of a plurality of pieces of equipment, determines a priority regarding inspection of the equipment based on the abnormality occurrence information and the attributes of the equipment, determines the equipment to be inspected based on the priority, determines a shortest path for patrolling the plurality of pieces of equipment determined to be inspection targets, adds, to the inspection targets, the equipment that is on the shortest path among the equipment not determined to be inspection targets, generates inspection work information including an inspection path that is a shortest path for patrolling the plurality of pieces of equipment determined to be inspection targets, the inspection work information being information representing the inspection work of the equipment. An equipment inspection support method.

10. an acquisition process of acquiring abnormality occurrence information indicating the occurrence status of abnormalities for each of a plurality of pieces of equipment; a priority determination process of determining a priority regarding inspection of the equipment based on the abnormality occurrence information and the attributes of the equipment; an inspection equipment determination process of determining the equipment to be inspected based on the priority; a generation process of generating inspection work information including an inspection path that is a shortest path for patrolling the plurality of pieces of equipment determined to be inspection targets, the inspection work information being information representing the inspection work of the equipment; causes a computer to execute In the generation process, among the equipment not determined to be inspection targets, the equipment on the shortest path is added to the inspection targets to generate the inspection path. An equipment inspection support program.

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