Parts sorting device

Abstract

Provided is a component sorting device that improves component sorting accuracy. A component sorting device 1 comprises: a linear feeder 10 that conveys components; a turntable 20 that conveys the components conveyed by the linear feeder 10; an imaging device 30 that images an outer surface of the components on the turntable 20; a measurement device 40 that measures characteristics of the components on the linear feeder 10; and a scanning-sorting controller 80 that performs appearance scanning of the components on the basis of imaging results from the imaging device 30, and that sorts superior components on the basis of appearance scanning results. The linear feeder 10, which is subjected to measurement of characteristics by the measurement device 40, conveys the components while electrostatically adsorbing the components, and the scanning-sorting controller 80 performs characteristics scanning of the components on the basis of measurement results from the measurement device 40, and also sorts non-defective components on the basis of characteristics scanning results.

Description

[Technical Field]

[0001] The present invention relates to a parts selection device. [Background technology]

[0002] There is a device that sorts out good and bad surface-mount electronic components (also called chip components) such as multilayer ceramic capacitors. Patent Document 1 discloses an appearance inspection device as such a component sorting device. The appearance inspection device disclosed in Patent Document 1 includes a linear feeder that transports electronic components, a turntable that transports the electronic components transported by the linear feeder, and an imaging device that captures images of the electronic components on the turntable, and performs an appearance inspection of the electronic components while transporting them. This allows good and bad products to be sorted and discharged.

[0003] Furthermore, in the visual inspection device disclosed in Patent Document 1, the electronic components are charged by being transported by vibration in a linear feeder, and the electronic components are electrostatically attracted to a turntable by static electricity and transported. [Prior art documents] [Patent documents]

[0004] [Patent Document 1] Japanese Patent Application Laid-Open No. 2017-44579 Summary of the Invention [Problem to be solved by the invention]

[0005] Such component sorting devices often inspect and sort different types of electronic components for each production lot. For example, surface-mount electronic components can have different characteristics even if they are the same size. More specifically, multilayer ceramic capacitors can have different capacitances even if they are the same size.

[0006] Furthermore, with such component sorting devices, electronic components from the previous lot may remain on the linear feeder or turntable. In such cases, if the types of electronic components in the current lot are different from those in the previous lot, there is a possibility that electronic components of a different type from the previous lot may be mixed in with the electronic components in the current lot. If electronic components of the same size but different characteristics are mixed in like this, the sorting accuracy will decrease even if the accuracy of the visual inspection is high.

[0007] An object of the present invention is to provide a parts selection device that improves the accuracy of parts selection. [Means for solving the problem]

[0008] A parts sorting device according to the present invention inspects parts as they are conveyed, selects non-defective parts, and stores them in cases, and includes: a linear feeder that conveys the parts; a turntable that conveys the parts conveyed by the linear feeder, the turntable rotating at a rotation speed of 10,000 rpm or more; multiple imaging devices that capture images of multiple outer surfaces of the parts on the turntable; a measuring device that measures characteristics of the parts on the linear feeder or the turntable; and an inspection and sorting controller that performs a visual inspection of the parts based on the image capture results from the imaging devices and selects the non-defective parts based on the results of the visual inspection. The linear feeder or the turntable, whose characteristics are measured by the measuring device, conveys the parts while electrostatically attracting them, and the inspection and sorting controller inspects the characteristics of the parts based on the measurement results from the measuring device and further selects the non-defective parts based on the results of the characteristic inspection. [Effects of the Invention]

[0009] According to the present invention, it is possible to improve the accuracy of component selection in a component selection device. [Brief explanation of the drawings]

[0010] [Figure 1A]1 is a schematic plan view of an example of a component selection device according to an embodiment of the present invention, viewed from above; [Figure 1B] FIG. 10 is a schematic plan view of another example of the component selection device according to the present embodiment, as viewed from above. [Figure 2] 2 is a schematic plan view showing an enlarged view of a portion II in the part selecting device shown in FIG. 1A or FIG. 1B. [Figure 3A] 1B is a schematic side view of the part selecting device shown in FIG. 1A as seen from the side, and is a schematic side view in which a portion II is enlarged. [Figure 3B] 1C is a schematic side view of the part selecting device shown in FIG. 1B as seen from the side, and is a schematic side view in which a portion II is enlarged. [Figure 4] 4 is a cross-sectional view taken along line IV-IV of the component selecting device shown in FIG. 1A or FIG. 1B. [Figure 5] FIG. 2 is a schematic perspective view of the exterior of the component. [Figure 6] FIG. 2 is a schematic perspective view of the exterior of the case. DETAILED DESCRIPTION OF THE INVENTION

[0011] An example of an embodiment of the present invention will be described below with reference to the accompanying drawings, in which the same or equivalent parts are designated by the same reference numerals.

[0012] FIG. 1A is a schematic plan view of an example of a component selection device according to this embodiment, as seen from above, and FIG. 1B is a schematic plan view of another example of a component selection device according to this embodiment, as seen from above. FIG. 2 is a schematic plan view of an enlarged portion II of the component selection device shown in FIG. 1A or FIG. 1B. FIG. 3A is a schematic side view of the component selection device shown in FIG. 1A, as seen from the side, with the portion II enlarged. FIG. 3B is a schematic side view of the component selection device shown in FIG. 1B, as seen from the side, with the portion II enlarged. FIG. 4 is a cross-sectional view of the component selection device shown in FIG. 1A or FIG. 1B, taken along line IV-IV. Note that an XY Cartesian coordinate system is shown in FIGS. 1A to 4.

[0013] 1A, 2, 3A, and 4 is an apparatus that inspects a plurality of electronic components 3 while sequentially conveying them, selects non-defective components, and stores them in a case 5. The component selection apparatus 1 includes a linear feeder 10, a turntable 20, a plurality of imaging devices 30, a measuring device 40, a first discharge mechanism 50, a second discharge mechanism 60, a first counter 71, a second counter 72, a third counter 73, a fourth counter 74, and an inspection and selection controller 80.

[0014] The electronic component 3 is a surface-mount electronic component (also referred to as a chip component) such as a multilayer ceramic capacitor. As shown in Fig. 5, the electronic component 3 includes a laminate 3a in which multiple dielectric layers made of ceramic material and one or multiple conductor layers are stacked, and two external electrodes 3b disposed on each of the two end faces of the laminate 3a. The laminate 3a, i.e., the electronic component 3, is shaped like a rectangular parallelepiped and has two main surfaces TS1 and TS2 that face each other in the stacking direction, two side surfaces WS1 and WS2 that face each other in a width direction that intersects the stacking direction, and two end surfaces LS1 and LS2 that face each other in a length direction that intersects the stacking direction and the width direction.

[0015] 6, the case 5 is a box-shaped case that houses a plurality of electronic components 3 therein. The case 5 has only one opening 5a that can be opened when receiving or removing the electronic components 3 and can be closed when storing the electronic components 3.

[0016] 1A, 2, and 3A, the linear feeder 10 sequentially conveys a plurality of electronic components 3 in a linear manner. The linear feeder 10 may include a charging portion on the upstream side and an electrostatic attraction portion on the downstream side.

[0017] The linear feeder 10 is preferably made of a material such as SUS. The linear feeder 10 is also preferably inclined relative to the horizontal plane. This allows the electronic components 3 to be charged by conveying them by vibration in the charging portion upstream of the linear feeder 10.

[0018] 1A and 3A, an electrostatic suction mechanism 12 is preferably provided below the electrostatic suction portion on the downstream side of the linear feeder 10. This allows the electronic components 3 to be electrostatically attracted and transported in the electrostatic suction portion on the downstream side of the linear feeder 10.

[0019] 1B and 3B, the linear feeder 10 does not necessarily have to be provided with the electrostatic adsorption mechanism 12. In other words, the entire linear feeder 10 from the upstream side to the downstream side may be the above-described charged portion.

[0020] The turntable 20 sequentially rotates and conveys the plurality of electronic components 3 conveyed by the linear feeder 10. As shown in FIGS. 1A and 2, the turntable 20 has a guide mechanism 22 on the upstream side, which guides the electronic components 3 from the linear feeder 10 to a rotary conveyance locus 21. The turntable 20 conveys the electronic components 3 along the rotary conveyance locus 21.

[0021] 3A, an electrostatic chucking mechanism 24 is preferably provided below the turntable 20. This allows the electronic components 3 to be electrostatically attracted and transported.

[0022] The conveying speed of the turntable 20 is faster than the conveying speed of the linear feeder 10. The rotation speed of the turntable 20 is preferably 10,000 rpm or more. This allows the electronic components 3 to be spaced apart, as shown in FIGS. 2 and 3A, and enables visual inspection of the end face sides of the electronic components 3. Note that the rotation speed does not have to be 10,000 rpm or more, and may be 9,000 rpm or more, or 8,000 rpm or more. In this case, the size of the electronic components 3 is approximately 0.25 mm ±10% in the length direction and 0.125 mm ±13% in the width direction and thickness direction.

[0023] The turntable 20 is made of a transparent material such as glass or resin, which allows for visual inspection of the back surface of the electronic component 3.

[0024] 1A, the imaging device 30 is, for example, a camera. Six imaging devices 30 are provided along the rotational transfer path 21 of the turntable 20. The six imaging devices 30 capture images of six outer surfaces of the electronic component 3 on the turntable 20, namely, two main surfaces TS1 and TS2, two side surfaces WS1 and WS2, and two end surfaces LS1 and LS2, respectively.

[0025] The measuring device 40 includes, for example, a pair of probes for contacting the external electrodes of the electronic component 3, and measures the electrical characteristics of the electronic component 3. As shown in FIG. 1A, the measuring device 40 may be provided in an electrostatic suction portion downstream of the linear feeder 10. Alternatively, as shown in FIG. 1B, the measuring device 40 may be provided along the rotational conveyance path 21 of the turntable 20. In this case, as described above and as shown in FIG. 3B, the linear feeder 10 does not need to be provided with the electrostatic suction mechanism 12. The measuring device 40 measures the electrical characteristics of the electronic component 3 on the linear feeder 10 or the turntable 20. For example, if the electronic component 3 is a multilayer ceramic capacitor, the measuring device 40 measures the capacitance of the electronic component 3.

[0026] As described above, the electrostatic adsorption portion or turntable 20 downstream of the linear feeder 10, where the electrical characteristics are measured by the measuring device 40, transports the electronic components 3 while electrostatically adsorbing them. This makes it possible to improve the accuracy of measuring the electrical characteristics.

[0027] 1A and 4, the first discharge mechanism 50 discharges non-defective products that have been selected by the inspection and sorting controller 80 (described later) based on the results of the appearance inspection and the electrical property inspection, from the turntable 20 and stores them in the case 5. The method for discharging non-defective products by the first discharge mechanism 50 is not particularly limited, but examples include air blowing, air suction, physical contact extrusion, etc. For example, when a non-defective product is transported, the first discharge mechanism 50, in accordance with a command from the inspection and sorting controller 80, blows air onto the non-defective product on the turntable 20, thereby taking the non-defective product from the turntable 20 inside.

[0028] The first ejection mechanism 50 has a tubular member 52. The tubular member 52 is a tubular member having a circular or polygonal cross section, and extends from the turntable 20 to the entrance / exit of the case 5. As a result, the tubular member 52 guides the non-defective electronic components 3 ejected from the turntable 20 to the entrance / exit 5a of the case 5.

[0029] The second discharge mechanism 60 discharges defective products that have been selected by the inspection and sorting controller 80 (described later) based on the results of the appearance inspection or the electrical property inspection, from the turntable 20 and collects them in a collection box (not shown). The method of discharging defective products by the second discharge mechanism 60 may be the same as the method of discharging non-defective products by the first discharge mechanism 50. For example, when a defective product is transported, the second discharge mechanism 60, in accordance with a command from the inspection and sorting controller 80, blows air onto the defective product on the turntable 20, thereby taking the defective product from the turntable 20 into itself.

[0030] Similarly to the first discharge mechanism 50, the second discharge mechanism 60 has a tubular member that guides the defective products discharged from the turntable 20 to a collection box (not shown). The second discharge mechanism 60 is preferably provided upstream of the first discharge mechanism 50.

[0031] 1A and 4, the first counter 71 counts the number of non-defective products discharged from the turntable 20 by the first discharge mechanism 50. The first counter 71 is provided downstream of the first discharge mechanism 50, i.e., immediately before the case 5. This allows the number of non-defective products housed in the case 5 to be accurately counted. The first counter 71 may also be provided upstream of the first discharge mechanism 50. This makes it possible to confirm that electronic components 3 remain in the first discharge mechanism 50 when the count numbers of the two first counters 71 differ.

[0032] The first counter 71 may be, but is not limited to, a camera, an optical sensor, an eddy current sensor, or the like. The eddy current sensor may be a known eddy current sensor or eddy current displacement sensor. For example, a high-frequency signal is supplied from a resonant circuit to a sensor coil, which generates a high-frequency magnetic field. When an electronic component containing metal approaches this magnetic field, an eddy current is generated in the metal of the electronic component, causing a change in the impedance of the sensor coil. This changes the voltage of the resonant circuit. The passage of electronic components can be counted by detecting this voltage change using a detection circuit.

[0033] The second counter 72 counts the number of defective products (not shown) that are discharged from the turntable 20 by the second discharge mechanism 60. The second counter 72 may be the same as the first counter 71.

[0034] The third counter 73 counts the number of remaining products remaining on the linear feeder 10 and the turntable 20 after the first discharge mechanism 50 has discharged the non-defective products and the second discharge mechanism 60 has discharged the defective products. The third counter 73 is not particularly limited, but may be a camera or a known line sensor. For example, in the case of a camera, the third counter 73 may be placed at any position on the turntable 20 and count the remaining products collected by the cleaning function on the linear feeder 10 and the turntable 20. The collected remaining products are collected in a collection box (not shown).

[0035] The fourth counter 74 is disposed relatively upstream of the linear feeder 10 and counts the input electronic components 3. The fourth counter 74 is not particularly limited, but may be a camera or the like.

[0036] The inspection and selection controller 80 controls the entire component selection device 1. Specifically, the inspection and selection controller 80 performs an appearance inspection of the electronic components 3 based on the imaging results from the imaging device 30, and selects good and bad components based on the results of the appearance inspection. The inspection and selection controller 80 also performs an electrical characteristic inspection (also called verification) of the electronic components 3 based on the measurement results from the measuring device 40, and further selects good and bad components based on the results of the electrical characteristic inspection.

[0037] The inspection and sorting controller 80 also controls the discharge of non-defective products by the first discharge mechanism 50. For example, the inspection and sorting controller 80 calculates the timing to discharge non-defective products from the first discharge mechanism 50 based on information such as the conveying speed of the linear feeder 10, the conveying speed (or the rotation speed, and the length or radius of the rotational conveying trajectory) of the turntable 20, the position of the measuring device 40 on the linear feeder 10 or the turntable 20, and the position of the imaging device 30 on the turntable 20, and issues a command to the first discharge mechanism 50.

[0038] Furthermore, the inspection and sorting controller 80 controls the discharge of defective products by the second discharge mechanism 60. For example, the inspection and sorting controller 80 calculates the timing to discharge defective products from the second discharge mechanism 60 based on information such as the conveying speed of the linear feeder 10, the conveying speed (or the rotation speed, and the length or radius of the rotational conveying trajectory) of the turntable 20, the position of the measuring device 40 on the linear feeder 10 or the turntable 20, and the position of the imaging device 30 on the turntable 20, and issues a command to the second discharge mechanism 60.

[0039] In addition, the inspection and sorting controller 80 confirms whether the parts sorting is normal or abnormal based on the number of good products counted by the first counter 71, the number of defective products counted by the second counter 72, and the number of remaining products counted by the third counter 73. For example, if the total number of counted good products, defective products, and remaining products differs from the number of visual inspections or the number of electrical characteristic inspections, the inspection and sorting controller 80 may determine that there is an abnormality in the device and issue an alarm indicating the abnormality. Alternatively, if the total number of counted good products, defective products, and remaining products differs from the input number counted by the fourth counter 74, the inspection and sorting controller 80 may determine that there is an abnormality in the device and issue an alarm indicating the abnormality.

[0040] The inspection and sorting controller 80 is configured with an arithmetic processor such as a DSP (Digital Signal Processor) or an FPGA (Field-Programmable Gate Array). The various functions of the inspection and sorting controller 80 are realized by executing predetermined software (programs) stored in a storage unit, for example. The various functions of the inspection and sorting controller 80 may be realized by a combination of hardware and software, or may be realized only by hardware (electronic circuits).

[0041] The storage unit in the inspection and sorting controller 80 is a rewritable memory such as an EEPROM. The storage unit stores predetermined software (programs) for executing various functions of the sorting controller. The storage unit also stores various setting values input from, for example, an external device. The various setting values include information regarding the conveying speed of the linear feeder 10, the conveying speed of the turntable 20 (or the rotation speed and the length or radius of the rotational conveying path), the position of the imaging device 30, the position of the measuring device 40, the position of the first discharge mechanism 50, and the position of the second discharge mechanism 60, as well as criteria for determining whether a product is good or bad.

[0042] As described above, the component selection device 1 of this embodiment includes the linear feeder 10 that transports the electronic components 3, the transparent turntable 20 that transports the electronic components 3, six imaging devices 30 that capture images of the six outer surfaces of the electronic components 3 on the turntable 20, and the inspection and selection controller 80 that performs a visual inspection of the electronic components 3 based on the imaging results from the imaging devices 30 and selects non-defective components based on the results of the visual inspection. This makes it possible to perform a visual inspection of a plurality of electronic components 3 while transporting them, and to select non-defective components and store them in the cases 5.

[0043] Such component sorting devices may inspect and sort different types of electronic components for each production lot. For example, surface-mount electronic components may have different characteristics even if they are the same size. More specifically, multilayer ceramic capacitors may have different capacitances even if they are the same size.

[0044] Furthermore, with such component sorting devices, electronic components from the previous lot may remain on the linear feeder or turntable. In such cases, if the types of electronic components in the current lot are different from those in the previous lot, there is a possibility that electronic components of a different type from the previous lot may be mixed in with the electronic components in the current lot. If electronic components of the same size but different characteristics are mixed in like this, the sorting accuracy will decrease even if the accuracy of the visual inspection is high.

[0045] In this regard, the component selection device 1 of this embodiment further includes a measuring device 40 that measures the electrical characteristics of the electronic components 3 on the linear feeder 10 or the turntable 20, and the inspection and selection controller 80 inspects the electrical characteristics of the electronic components 3 based on the measurement results from the measuring device 40, and further selects non-defective components based on the results of the electrical characteristic inspection. As a result, even if electronic components of a different type from the previous lot remain on the linear feeder or turntable, etc. and get mixed in with the electronic components of the current lot, electronic components of the same size but different characteristics can be selected as defective based on the results of the electrical characteristic inspection, thereby improving the accuracy of component selection.

[0046] Note that the selection of good and bad products based on detailed electrical characteristic specifications is carried out separately, for example, after manufacturing and before inputting the products into this device. The above-mentioned electrical characteristic test is a simple electrical characteristic test aimed at sorting out electronic components of the same size but different characteristics from the previous lot that have been mixed in with the electronic components of the current lot when electronic components from the previous lot remain on a linear feeder or turntable, etc.

[0047] The measuring device 40 may be provided on the linear feeder 10 side. In this case, even if the rotation speed of the turntable 20 is as high as 10,000 rpm or more in order to shorten the inspection and sorting time, the electrical characteristics inspection becomes easy. Alternatively, the measuring device 40 may be provided on the turntable 20 side. In this case, it becomes easier to calculate the timing for ejecting a non-defective or defective product.

[0048] Furthermore, according to the component selection device 1 of this embodiment, the linear feeder 10 or the turntable 20, on which the measuring device 40 measures the electrical characteristics, transports the electronic components 3 while electrostatically adsorbing them. This can improve the accuracy of the electrical characteristic inspection.

[0049] Furthermore, the component selection device 1 of this embodiment further includes a first counter 71 that counts the number of non-defective components discharged by the first discharge mechanism 50, a second counter 72 that counts the number of defective components discharged by the second discharge mechanism 60, and a third counter 73 that counts the number of remaining components on the linear feeder 10 and the turntable 20 after the first discharge mechanism 50 and the second discharge mechanism 60 have discharged the non-defective components. The inspection and selection controller 80 checks whether the component selection is normal or abnormal based on the number of non-defective components counted by the first counter 71, the number of defective components counted by the second counter 72, and the number of remaining components counted by the third counter 73. This allows for the detection of component selection abnormalities, such as a mismatch between the number of output and input electronic components, for each processing lot, preventing electronic components from being mixed in with the electronic components of the next processing lot. This further improves the accuracy of component selection.

[0050] Although the embodiments of the present invention have been described above, the present invention is not limited to the above-described embodiments and various modifications and variations are possible. In the above-described embodiments, an embodiment including a second discharge mechanism 60 that discharges defective products from the turntable 20 has been described as an example. However, the present invention is not limited to this, and may be embodied in a manner that does not include the second discharge mechanism 60. In this case, the component selection device 1 may discharge defective products from the turntable 20 immediately after imaging and visual inspection by the imaging device 30. Furthermore, the component selection device 1 may discharge defective products from the linear feeder 10 or the turntable 20 immediately after measurement and electrical characteristic inspection by the measuring device 40. In this case, a defective product collection function may be provided along the entire outer periphery of the turntable 20 and / or along the entire side of the linear feeder 10.

[0051] In the above-described embodiment, the inspection and sorting controller 80 has a function of performing a visual inspection of electronic components based on the image capture results from the imaging device 30. However, the present invention is not limited to this, and each imaging device 30 may have a visual inspection function. Furthermore, each imaging device 30 may have a function of immediately ejecting defective products from the turntable 20 after visual inspection, as in the above-described modified example.

[0052] In the above-described embodiment, the inspection and sorting controller 80 has a function of inspecting the electrical characteristics of electronic components based on the measurement results from the measuring device 40. However, the present invention is not limited to this, and the measuring device 40 may have an electrical characteristic inspection function. Furthermore, each measuring device 40 may have a function of immediately ejecting defective products from the linear feeder 10 or the turntable 20 after the electrical characteristic inspection, as in the above-described modified example.

[0053] In the above-described embodiment, the measuring device 40 measures the electrical characteristics of the electronic component 3. However, the present invention is not limited to this, and the measuring device 40 can also be applied to a configuration in which it measures various characteristics other than electrical characteristics. In this case, the inspection and selection controller 80 performs various characteristic inspections of the electronic component 3 based on the measurement results from the measuring device 40, and selects good products and defective products based on the results of these characteristic inspections. [Explanation of symbols]

[0054] 1. Parts sorting device 3. Electronic Components 5 cases 5a Entrance / exit 10 Linear Feeder 12 Electrostatic adsorption mechanism 20 Turntable 21 Rotational transport path 22 Guide mechanism 24 Electrostatic adsorption mechanism 30 Imaging Device 40 Measuring Devices 50 1st ejection mechanism 52 Tubular member 60 Second ejection mechanism 71 First Counter 72 Second Counter 73 Third Counter 74 4th Counter 80 Inspection and sorting controller

Claims

1. A parts sorting device that inspects parts while transporting them, selects non-defective parts, and stores them in cases, a linear feeder for conveying the parts; a turntable that conveys and rotates the parts conveyed by the linear feeder; a plurality of imaging devices for respectively capturing images of a plurality of outer surfaces of the component on the turntable; a measuring device for measuring a characteristic of the part on the linear feeder or on the turntable; an inspection and sorting controller that performs an appearance inspection of the component based on the imaging result from the imaging device, performs a characteristic inspection of the component based on the measurement result from the measuring device, and sorts out the non-defective component based on the results of the appearance inspection and the characteristic inspection; a first ejection mechanism that ejects the non-defective product selected by the inspection / sorting controller based on the results of the appearance inspection and the characteristics inspection from the turntable and stores the non-defective product in the case; a second discharge mechanism that discharges, from the turntable, defective products that have been selected by the inspection / sorting controller based on the results of the appearance inspection or the characteristics inspection; a first counter that counts the number of non-defective products discharged by the first discharge mechanism; a second counter that counts the defective products discharged by the second discharge mechanism; a third counter that counts the number of remaining products remaining on the linear feeder and the turntable after the first discharge mechanism has discharged the non-defective products and the second discharge mechanism has discharged the defective products; Equipped with the linear feeder or the turntable, on which the characteristics are measured by the measuring device, transports the component while electrostatically attracting it; the inspection and sorting controller confirms whether the parts sorting is normal or abnormal based on the number of non-defective products counted by the first counter, the number of defective products counted by the second counter, and the number of remaining products counted by the third counter. Parts sorting device.

2. 2. The component sorting device of claim 1, wherein the first counter includes a camera.

3. 2. The component sorting apparatus of claim 1, wherein the first counter includes an eddy current sensor.

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