Identification system, identification method, and program

Abstract

In order to enable monitoring of a stationary structure, this identification system comprises: an acquisition means that, on the basis of laser light illuminated onto respective positions in a space of interest including the stationary structure, and reflected light of the laser light, acquires position information corresponding to the respective positions and wavelength information based on the wavelength of the reflected light reflected at the respective positions; an identification means that identifies an abnormal location among the positions where an abnormality with respect to the stationary structure is occurring, on the basis of the wavelength information; and a monitoring means that monitors the abnormal location.

Description

[Technical Field]

[0001] The invention relates to a particular system that allows for example the monitoring of stationary structures. [Background technology]

[0002] Techniques for monitoring structures using LiDAR (Light Detection and Ranging) are known. For example, the technique described in Patent Document 1 uses LiDAR to detect the vibration velocity of the structure, thereby detecting whether or not an abnormality has occurred in the structure. Note that the technique described in Patent Document 2 is also known as a related technique. Furthermore, the technique described in Patent Document 3 is also known as another related technique. [Prior art documents] [Patent documents]

[0003] [Patent Document 1] Japanese Patent Application Laid-Open No. 2001-215148 [Patent Document 2] Japanese Patent Application Laid-Open No. 2003-505676 [Patent Document 3] Japanese Patent Application Publication No. 11-002680 Summary of the Invention [Problem to be solved by the invention]

[0004] Generally, an abnormality in a part of a structure that should be stationary (hereinafter referred to as a "stationary structure") can cause that part to move. For example, a part of the surface material of a stationary structure can peel off, causing the peeled surface material to hang down and sway. In monitoring a stationary structure, it is necessary not only to detect the occurrence of such an abnormality but also to identify the location where the abnormality is occurring (hereinafter referred to as the "abnormality occurrence location").

[0005] However, the technology described in Patent Document 1 merely detects whether an abnormality has occurred in a structure, and does not have a means for identifying the location where the abnormality has occurred. Therefore, it is difficult to identify the location where the abnormality has occurred with the technology described in Patent Document 1. As a result, there is a problem in that it is difficult to monitor the location where the abnormality has occurred, for example.

[0006] In view of the above-mentioned problems, an object of the present invention is to identify an abnormality location where an abnormality has occurred in a stationary structure. [Means for solving the problem]

[0007] The present invention provides a specific system, comprising: an acquisition means for acquiring position information corresponding to each position in a target space including a stationary structure based on laser light irradiated at each position and reflected light of the laser light, and wavelength information based on the wavelength of the reflected light reflected at each position; a specifying means for specifying an abnormality location where an abnormality has occurred in the stationary structure among the locations based on the wavelength information; a monitoring means for monitoring the abnormal portion; Equipped with.

[0008] The present invention provides an identification method, comprising: acquiring position information corresponding to each position and wavelength information based on the wavelength of the reflected light reflected at each position based on the laser light irradiated at each position in the target space including the stationary structure and the reflected light of the laser light; Identifying an abnormality location where an abnormality has occurred in the stationary structure among the locations based on the wavelength information; The abnormal location is monitored.

[0009] The present invention also provides a storage medium, a process of acquiring position information corresponding to each position and wavelength information based on the wavelength of the reflected light reflected at each position, based on laser light irradiated at each position in a target space including a stationary structure and reflected light of the laser light; A process of identifying an abnormality location where an abnormality has occurred in the stationary structure among the locations based on the wavelength information; a process of monitoring the abnormality location; The information processing device stores a program for causing the information processing device to execute the above. [Effects of the Invention]

[0010] According to the present invention, it is possible to provide an identification system or the like that can identify an abnormality location where an abnormality has occurred in a stationary structure. [Brief explanation of the drawings]

[0011] [Figure 1] 1 is a block diagram showing an example of the configuration of a specific system according to a first exemplary embodiment of the present invention. [Figure 2] FIG. 2 is a diagram for explaining details of a specific system according to the first embodiment of the present invention. [Figure 3] FIG. 2 is a diagram for explaining details of a specific system according to the first embodiment of the present invention. [Figure 4] FIG. 2 is a diagram for explaining details of a specific system according to the first embodiment of the present invention. [Figure 5] 4 is a flowchart showing an example of the operation of the identification system in the first exemplary embodiment of the present invention. [Figure 6] FIG. 10 is a block diagram showing an example of the configuration of a specific system according to a second exemplary embodiment of the present invention. [Figure 7] 10 is a flowchart showing an example of the operation of the identification system according to the second exemplary embodiment of the present invention. [Figure 8] FIG. 1 is a diagram illustrating an example of an information processing device that realizes a specific system or the like in the first and second embodiments of the present invention. DETAILED DESCRIPTION OF THE INVENTION

[0012] First Embodiment The identification system 1 in the first embodiment will be described with reference to Fig. 1, Fig. 2, Fig. 3, Fig. 4, and Fig. 5. Fig. 1 is a block diagram showing an example of the configuration of the identification system 1. Figs. 2, 3, and 4 are diagrams for explaining the details of the identification system 1. Fig. 5 is a flowchart for explaining an example of the operation of the identification system 1.

[0013] The configuration of the identification system 1 will be described. The identification system 1 includes a light source unit 10 and an identification device 20. Although the light source unit 10 and the identification device 20 are shown as separate units in FIG. 1, they may be integrated. The light source unit 10 and the identification device 20 are capable of communicating with each other.

[0014] The light source unit 10 includes a light irradiating means 11 and a light receiving means 13 .

[0015] The light irradiation means 11 irradiates a light irradiation region 300 including a target space 200 in which a stationary structure 400 is placed with laser light. Specifically, the laser light is pulsed laser light. For example, as shown in FIGS. 2, 3, and 4, the light irradiation means 11 irradiates laser light from an optical input / output terminal OI provided in the light source unit 10. As a result, the irradiated laser light propagates along an optical path OP and is incident on a reflection point RP of an object present in the target space 200. The optical path OP is a line segment connecting the optical input / output terminal OI and the reflection point RP. Here, the target space is a land including a stationary structure 400 such as a building. The stationary structure 400 may be a steel tower, a bridge, a utility pole, or the like.

[0016] Furthermore, the light receiving means 13 receives the laser light reflected by the stationary structure 400 in the target space 200. Hereinafter, "laser light reflected by the stationary structure 400 in the target space 200" will be referred to as "reflected laser light." For example, in the examples of FIGS. 2, 3, and 4, the light receiving means 13 receives the laser light reflected from the reflection point RP of the stationary structure 400 via the optical path OP and the optical input / output terminal OI. Furthermore, by changing the direction in which the light source unit 10 irradiates the laser light as described below, the light receiving means 13 can receive reflected laser light from different reflection points RP.

[0017] Next, a description will be given of the identifying device 20. The identifying device 20 includes an acquiring means 21, an identifying means 22, a three-dimensional model generating means 23, and a monitoring means 24.

[0018] The acquisition means 21 will now be described. The acquisition means 21 acquires position information corresponding to each position where the laser light is irradiated, based on the laser light and the reflected laser light. Furthermore, the acquisition means 21 acquires wavelength information corresponding to the wavelength of the reflected laser light reflected at each position where the laser light is irradiated, based on the reflected laser light. The reflected laser light here refers to the reflected light of the laser light irradiated at each position in the target space 200 including the stationary structure 400.

[0019] Here, the positional information will be explained using Figures 2, 3, and 4. Figure 2 shows the positional relationship between the light source unit 10 and the target space 200 using the x-axis, y-axis, and z-axis. Figure 3 shows the positional relationship between the light source unit 10 and the target space 200 using the z-axis and a-axis. The a-axis is obtained by orthogonally projecting the optical path OP onto the xy plane.

[0020] By tilting the light source unit 10 along the α direction (the vertical direction relative to the xy plane) shown in Fig. 2, the light irradiation means 11 can irradiate the laser light at an arbitrary angle θ1, as shown in Fig. 3. For example, the angle θ1 is the angle formed by a line extending vertically downward from the optical input / output terminal OI of the laser light and the optical path OP, as shown in Fig. 3. The acquisition means 21 can detect the angle θ1 using a gyro sensor (not shown) or the like.

[0021] The acquisition means 21 obtains the length of the optical path OP from the time from when the laser light is emitted by the light irradiation means 11 to when the reflected laser light is received by the light receiving means 13. Hereinafter, the "time until the reflected laser light is received by the light receiving means 13" will be referred to as "time t." Specifically, the length of the optical path OP is obtained by multiplying time t by the speed of light and dividing the result by 2. The acquisition means 21 can calculate the difference (H1 in FIG. 3) between the z coordinate of the optical input / output terminal OI of the laser light and the z coordinate of the reflection point RP of the laser light by multiplying the length of the optical path OP by cos θ1. In this way, the acquisition means 21 obtains the relative position of the reflection point RP on the z axis with respect to the optical input / output terminal OI.

[0022] Furthermore, the obtaining means 21 calculates the length of a line segment D1 of the optical path OP projected onto the xy plane by multiplying the length of the optical path OP by sin θ1. As shown in Fig. 4, the line segment D1 is a line segment that connects the optical input / output terminal OI of the laser beam to the reflection point RP on the xy plane.

[0023] By tilting the light source unit 10 along the β direction (a direction parallel to the xy plane) shown in FIG. 2, the light irradiation means 11 can irradiate laser light at an arbitrary angle θ2. For example, as shown in FIG. 4, the angle θ2 is the angle formed by a reference line L set on the xy plane and an optical path OP. In the example shown in FIG. 4, the reference line L is one of the sides that form the periphery of the target space 200. The acquisition means 21 can detect the angle θ2 using a gyro sensor (not shown) or the like.

[0024] The acquisition means 21 obtains the difference (D2 in FIG. 4) between the x coordinate of the optical input / output terminal OI and the x coordinate of the reflection point RP by multiplying the length of the line segment D1 by sin θ2. The acquisition means 21 also obtains the difference (D3 in FIG. 4) between the y coordinate of the optical input / output terminal OI and the y coordinate of the reflection point RP by multiplying the length of the line segment D1 by cos θ2. In this way, the acquisition means 21 obtains the relative position on the x axis and the relative position on the y axis of the reflection point RP with respect to the optical input / output terminal OI. The acquisition means 21 stores the obtained relative positions on each axis in association with the angle θ1 and the angle θ2.

[0025] By changing at least one of the angles θ1 and θ2, the light source unit 10 causes the laser light to be incident on reflection points RP at different positions. The light source unit 10 irradiates laser light according to a plurality of predetermined angles θ1 and a plurality of predetermined angles θ2, and receives reflected laser light from a plurality of reflection points RP in the light irradiation area 300. This allows the acquisition unit 21 to acquire the relative position on each axis for each of the plurality of reflection points RP in the target space 200. The acquisition unit 21 acquires the relative position on each axis for each of the reflection points RP acquired as described above as position information. Note that the acquisition unit 21 may convert the relative position into an absolute position using a predetermined reference point and acquire the absolute position as position information.

[0026] Next, wavelength information will be described. Wavelength information is information indicating the difference between the wavelength of the laser light and the wavelength of the reflected laser light. When the laser light is incident on a moving reflection point RP, the wavelength of the reflected laser light changes due to the Doppler effect. In other words, wavelength information is information indicating the amount of wavelength shift due to the Doppler effect.

[0027] The light receiving means 13 detects the wavelength of the reflected laser light by coherently detecting the reflected laser light using a local light having the same wavelength as the laser light. When the light receiving means 13 receives the reflected light from the reflection point RP, it notifies the acquisition means 21 of the wavelength of the reflected light. The acquisition means 21 also stores in advance the wavelength of the laser light irradiated by the light irradiating means 11. This allows the acquisition means 21 to acquire wavelength information corresponding to the wavelength of the reflected light. The acquisition means 21 outputs the acquired position information and wavelength information to the identification means 22.

[0028] The identifying means 22 identifies an abnormality location where an abnormality has occurred in the stationary structure from among the locations corresponding to the location information, based on the wavelength information.

[0029] Specifically, the identification means 22 identifies, among the positions according to the position information, a position at which reflected light having a wavelength that is different from the wavelength of the laser light by more than a threshold value as an abnormality location where an abnormality has occurred in the stationary structure 400. Generally, when damage occurs in a stationary structure 400 such as a steel tower, the damaged area is likely to sway due to wind or vibration. For this reason, the wavelength of light reflected at the damaged area changes due to the Doppler effect. Therefore, the identification means 22 can identify, as an abnormality location where an abnormality has occurred in the stationary structure 400, a position at which reflected light having a wavelength that is different from the wavelength of the laser light by more than a threshold value. The identification means 22 outputs information indicating the position of the abnormality location to an external device such as a display, a speaker, or another information processing device.

[0030] Furthermore, the identification means 22 may identify whether a position is an abnormal location based on wavelength information corresponding to the wavelength of reflected light reflected at the same position at different times. Specifically, the acquisition means 21 acquires first wavelength information. Here, the first wavelength information is wavelength information corresponding to the wavelength of reflected light reflected at a first position among the positions. Furthermore, the acquisition means 21 acquires second wavelength information. Here, the second wavelength information is wavelength information corresponding to the wavelength of reflected light reflected at the first position after acquiring the first wavelength information. Thereafter, the identification means 22 identifies whether the first position is an abnormal location based on the difference between the first wavelength information and the second wavelength information.

[0031] Both the first wavelength information and the second wavelength information indicate the amount of wavelength shift due to the Doppler effect. That is, the difference between the first wavelength information and the second wavelength information indicates the amount of change in the amount of wavelength shift due to the Doppler effect. The identifying means 22 can detect a change in the moving speed at the first position based on the difference between the first wavelength information and the second wavelength information. As described above, when damage occurs to a stationary structure 400 such as a steel tower, the damaged area is prone to shaking due to wind and vibration. Therefore, the amount of wavelength shift due to the Doppler effect in light reflected at the damaged area is different from the light reflected at the same area before the damage occurred. Therefore, for example, if the amount of change in the amount of wavelength shift exceeds a threshold, the identifying means 22 can identify the position where the laser light is reflected as an abnormal area based on wavelength information (amount of wavelength shift) corresponding to the wavelength of reflected light reflected at the same location at a different time.

[0032] The three-dimensional model generating means 23 may generate a three-dimensional model of the target space 200 using the position information. A three-dimensional model is a collection of points whose positions are uniquely determined by x-axis coordinates, y-axis coordinates, and z-axis coordinates. The three-dimensional model is, for example, a three-dimensional point cloud model. The three-dimensional model generating means 23 generates a model showing the shape of the stationary structure 400 in the target space 200 by plotting multiple reflection points RP on the three-dimensional model based on the relative positions of the reflection points RP with respect to the optical input / output terminal O1. The relative positions of the reflection points RP with respect to the optical input / output terminal O1 are acquired by the acquiring means 21.

[0033] The monitoring means 24 monitors the abnormal location identified by the identification means 22. Specifically, for example, the 3D model generation means 23 continuously executes a process of generating point cloud data. The monitoring means 24 generates a 3D model of the stationary structure 400 using the generated point cloud data. That is, the 3D model is generated in so-called "real time." The monitoring means 24 displays an image including the generated 3D model on a display (not shown). This realizes monitoring of the stationary structure 400.

[0034] At this time, the monitoring means 24 makes the appearance (e.g., color) of the portion of the three-dimensional model corresponding to the location where the abnormality has occurred different from the appearance (e.g., color) of other portions of the three-dimensional model. This allows for intensive monitoring of the location where the abnormality has occurred in monitoring the stationary structure 400. As a result, accurate monitoring of the location where the abnormality has occurred is achieved.

[0035] The 3D model generating means 23 may continuously measure the moving speed in addition to continuously generating the point cloud data. The moving speed is calculated from the wavelength shift due to the Doppler effect. Based on the results of this measurement, the monitoring means 24 may vary the appearance (e.g., color) of the abnormality location in the 3D model depending on the moving speed of the corresponding point in the point cloud data. This allows for more detailed monitoring of the abnormality location.

[0036] In the above example, the monitoring means 24 monitors abnormal locations using point cloud data, but the monitoring means 24 may also perform monitoring using a method that does not use point cloud data. Specifically, the monitoring means 24 may perform monitoring by continuously extracting, to the outside, only the position information identified as an abnormal location from the position information corresponding to each point in the target space 200.

[0037] Next, an example of the operation of the identification system 1 will be described with reference to FIG.

[0038] The light source unit 10 adjusts the irradiation angle of the laser light (S101). For example, the light source unit 10 adjusts the angle θ1 shown in Fig. 3 and the angle θ2 shown in Fig. 4 to predetermined angles.

[0039] The light irradiation means 11 of the light source unit 10 irradiates a laser beam (S102). As a result, the laser beam is reflected at a reflection point RP of the stationary structure 400.

[0040] The light receiving means 13 of the light source unit 10 receives the reflected laser light (S103). At this time, the time t from when the laser light is emitted until the reflected laser light is received is stored in association with the irradiation angle of the laser light in a memory (not shown) provided in the identification device 20. At this time, the light source unit 10 stores the intensity of the reflected laser light in addition to the time t.

[0041] The light source unit 10 determines whether or not the laser light is irradiated within a predetermined angle range (S104).

[0042] If the laser beam is not irradiated within the predetermined angle range (No in S104), the light source unit 10 adjusts the irradiation angle of the laser beam (S101). For example, the light source unit 10 changes at least one of the angle θ1 shown in FIG. 3 and the angle θ2 shown in FIG. 4.

[0043] If the laser light is irradiated within a predetermined angle range (Yes in S104), the acquisition means 21 acquires, based on the reflected laser light, position information corresponding to each position where the laser light is irradiated and wavelength information based on the wavelength of the reflected light reflected at each position (S105).

[0044] The three-dimensional model generating means 23 generates a three-dimensional model of the target space 200 using the position information (S106). The identifying means 22 identifies an abnormal location in the target space 200 where an abnormality has occurred in the stationary structure 400 based on the position information and wavelength information (S107). The monitoring means 24 monitors the abnormal location (S108).

[0045] The identification system 1 has been described above. In the identification system 1, the acquisition means 21 acquires position information corresponding to each position and wavelength information based on the wavelength of the reflected light reflected at each position, based on the reflected light of the laser light irradiated at each position within the target space 200 including the stationary structure 400. Furthermore, the identification means 22 identifies an abnormality location where an abnormality has occurred in the stationary structure 400 among the positions irradiated with the laser light, based on the wavelength information. Furthermore, the monitoring means 24 monitors the abnormality location. As described above, the identification system 1 can identify the location where an abnormality has occurred in the stationary structure. As a result, the identification system 1 can realize monitoring of the location where an abnormality has occurred in the stationary structure.

[0046] A first modified example of the identification system 1 according to the first embodiment will be described. The first modified example of the identification system 1, like the identification system 1, includes a light source unit 10 and an identification device 20. The light source unit 10 includes a light irradiation means 11 and a light receiving means 13. The identification device 20 includes an acquisition means 21, an identification means 22, a three-dimensional model generation means 23, and a monitoring means 24.

[0047] The first variant of the identification system 1 differs from the identification system 1 in that the identification means 22 performs additional processing. In the first variant, the identification means 22 identifies that there is a possibility of an intruder entering the stationary structure.

[0048] Specifically, as described above, the identification means 22 identifies a specific position within the target space 200 as an abnormal location. Hereinafter, the "specific position within the target space 200" will be referred to as the "second position." After identifying the second position as an abnormal location, the identification means 22 identifies a position within the target area that is adjacent to the second position as an abnormal location. Hereinafter, the "position within the target area that is adjacent to the second position" will be referred to as the "third position." In this case, the identification means 22 identifies that there is a risk of an intruder entering the stationary structure 400.

[0049] For example, by repeating the process of S107 described above, the identification means 22 may identify the second position as an abnormal location and then identify the third position as an abnormal location. In this case, the identification means 22 compares the second position with the third position. Then, if the distance between the second position and the third position is equal to or less than a predetermined value, the identification means 22 determines that there is a possibility of an intruder entering the stationary structure 400.

[0050] If an intruder is present in the stationary structure 400, the intruder is likely to be moving within the target space 200. In this case, the intruder is present as a moving object at adjacent positions at different times. The identification means 22 can identify the position where the moving object is present as an abnormal location using wavelength information based on the wavelength of the reflected light. Therefore, when the identification means 22 identifies a second position and a third position, which are located within a predetermined distance from each other, as abnormal locations at different times, it can identify that there is a possibility that an intruder may be present in the stationary structure 400.

[0051] A second modified example of the identification system 1 according to the first embodiment will now be described. Like the identification system 1, the second modified example of the identification system 1 includes a light source unit 10 and an identification device 20. The light source unit 10 includes a light irradiation means 11 and a light receiving means 13. The identification device 20 includes an acquisition means 21, an identification means 22, a three-dimensional model generation means 23, and a monitoring means 24.

[0052] The second variant of the identification system 1 differs from the identification system 1 in that the identification means 22 performs additional processing. In the second variant, the identification means 22 identifies the presence of something approaching a stationary structure.

[0053] Specifically, as described above, the identification means 22 identifies a specific position within the target space 200 as an abnormal location. Hereinafter, the "specific position within the target space 200" will be referred to as the "fourth position." After identifying the fourth position as an abnormal location, the identification means 22 identifies a position closer to the stationary structure 400 than the fourth position as an abnormal location. Hereinafter, the "position closer to the stationary structure 400 than the fourth position after identifying the fourth position as an abnormal location" will be referred to as the "fifth position." In this case, the identification means 22 identifies that there is something approaching the stationary structure 400.

[0054] For example, by repeating the process of S107 described above, the identification means 22 identifies the fourth position as an abnormal location and then identifies the fifth position as an abnormal location. In this case, the identification means 22 compares the distance from the fourth position to the position of the stationary structure 400 with the distance from the fifth position to the position of the stationary structure 400. Then, if the distance from the fifth position to the position of the stationary structure 400 is shorter, the identification means 22 identifies that there is something approaching the stationary structure 400. It is assumed that the position of the stationary structure 400 is provided to the identification system 1 in advance by a user or the like.

[0055] If there is an object (such as a vehicle) approaching the stationary structure 400, it is highly likely that the approaching object is moving within the target space 200 in a direction approaching the stationary structure 400. Therefore, if the identification means 22 identifies the fourth position as an abnormal location and then identifies a fifth position, which is closer to the position of the stationary structure 400 than the fourth position, as an abnormal location, it can identify that there is an object approaching the stationary structure 400.

[0056] A third modified example of the identification system 1 according to the first embodiment will now be described. Like the identification system 1, the third modified example of the identification system 1 includes a light source unit 10 and an identification device 20. The light source unit 10 includes a light irradiation means 11 and a light receiving means 13. The identification device 20 includes an acquisition means 21, an identification means 22, a three-dimensional model generation means 23, and a monitoring means 24.

[0057] The third variant of the identification system 1 differs from the identification system 1 in that the identification means 22 performs additional processing. In the third variant, the identification means 22 identifies that an abnormality has continuously occurred in a stationary structure.

[0058] Specifically, the identification means 22 identifies a specific position within the target space 200 as an abnormal location. Hereinafter, the "specific position within the target space 200" will be referred to as the "sixth position." After identifying the sixth position as an abnormal location, the identification means 22 again identifies the sixth position as an abnormal location. In this case, it is identified that an abnormality is continuously occurring in the stationary structure 400 at the sixth position. <Second embodiment> The identification system 2 according to the second embodiment will be described with reference to Fig. 6 and Fig. 7. Fig. 6 is a block diagram showing an example of the configuration of the identification system 2. Fig. 7 is a flowchart showing an example of the operation of the identification system 2.

[0059] 6, the identifying system 2 includes an acquisition unit 21, an identification unit 22, and a monitoring unit 24. The aforementioned light source unit 10 (not shown) is provided outside the identifying system 2 and is capable of communicating with the identifying system 2. The acquisition unit 21, the identification unit 22, and the monitoring unit 24 of the identifying system 2 may have the same functions and connection relationships as the acquisition unit 21, the identification unit 22, and the monitoring unit 24 of the identifying system 1.

[0060] The acquisition means 21 acquires position information corresponding to each position based on the reflected light of the laser light irradiated at each position in the target space including the stationary structure. The acquisition means 21 also acquires wavelength information based on the wavelength of the reflected light reflected at each position.

[0061] The identifying means 22 identifies an abnormality location where an abnormality has occurred with respect to the stationary structure among the locations based on the wavelength information. Furthermore, the monitoring means 24 monitors the abnormality location identified by the identifying means 22.

[0062] Next, an operation example of the identification system 2 will be described with reference to Fig. 7. The operation example below corresponds to an identification method. A storage medium may store a program for causing an information processing device to execute each process of the operation example below.

[0063] The acquisition means 21 acquires position information corresponding to each position in the target space and wavelength information based on the wavelength of the light reflected at each position (S201).

[0064] The identifying means 22 identifies, from among the positions, an abnormality location where an abnormality has occurred with respect to the stationary structure, based on the wavelength information (S202).

[0065] The monitoring means 24 monitors the abnormality location (S203).

[0066] The identification system 2 has been described above. In the identification system 2, the acquisition means 21 acquires position information corresponding to each position and wavelength information based on the wavelength of the reflected light reflected at each position, based on the reflected light of the laser light irradiated at each position within the target space including the stationary structure. Furthermore, the identification means 22 identifies, based on the wavelength information, an abnormal location where an abnormality has occurred in the stationary structure among the positions irradiated with the laser light. Furthermore, the monitoring means 24 monitors the abnormal location.

[0067] Generally, when damage occurs to a stationary structure such as a steel tower, the damaged area is prone to shaking due to wind or vibration. As a result, the wavelength of light reflected at the damaged area changes due to the Doppler effect. Therefore, the identification means 22 can identify the abnormal area in the stationary structure 400 where an abnormality has occurred, based on wavelength information based on the wavelength of the light reflected at each position. As described above, the identification system 2 can identify the area in the stationary structure where an abnormality has occurred. As a result, the identification system 2 can realize monitoring of the area in the stationary structure where an abnormality has occurred.

[0068] Furthermore, some or all of the components of each device or system are realized by any combination of an information processing device 2000 and a program, as shown in Fig. 8. Fig. 8 is a diagram showing an example of an information processing device that realizes specific systems 1, 2, etc. The information processing device 2000 includes, as an example, the following configuration.

[0069] ·CPU(Central Processing Unit)2001 ROM (Read Only Memory) 2002 ·RAM(Random Access Memory)2003 Program 2004 loaded into RAM 2003 A storage device 2005 for storing a program 2004 A drive device 2007 that reads and writes the recording medium 2006 ·Communication interface 2008 connecting to communication network 2009 Input / output interface for data input / output 2010 Bus 2011 connecting each component Each component of each device in each embodiment is realized by the CPU 2001 acquiring and executing a program 2004 that realizes the function of that component. The program 2004 that realizes the function of each component of each device is stored in advance in, for example, the storage device 2005 or the RAM 2003, and is read out by the CPU 2001 as needed. The program 2004 may be supplied to the CPU 2001 via the communication network 2009, or may be stored in advance in the recording medium 2006, and the drive device 2007 may read out the program and supply it to the CPU 2001.

[0070] There are various variations in the method of realizing each device. For example, each device may be realized by any combination of a separate information processing device 2000 and a program for each component. Furthermore, multiple components included in each device may be realized by any combination of a single information processing device 2000 and a program.

[0071] In addition, some or all of the components of each device may be realized by general-purpose or dedicated circuits including a processor, etc., or a combination of these. These may be configured by a single chip, or by multiple chips connected via a bus. Some or all of the components of each device may be realized by a combination of the above-mentioned circuits, etc., and a program.

[0072] When some or all of the components of each device are realized by multiple information processing devices, circuits, etc., the multiple information processing devices, circuits, etc. may be centrally or decentralized. For example, the information processing devices, circuits, etc. may be realized as a client-server system, a cloud computing system, or the like, in a form in which each device is connected via a communication network.

[0073] A part or all of the above-described embodiments can be described as, but not limited to, the following supplementary notes.

[0074] Although the present invention has been described above with reference to the embodiments, the present invention is not limited to the above embodiments. Various modifications that can be understood by those skilled in the art can be made to the configuration and details of the present invention within the scope of the present invention. [Explanation of symbols]

[0075] 1, 2 Specific system 10 Light source section 11 Light irradiation means 13 Light receiving means 20 Specific equipment 21 Acquisition method 22 Specific means 23 3D model generation means 2001 CPU 2002 ROM 2003 RAM 2004 Program 2005 storage device 2007 Drive Unit 2008 Communication Interface 2009 Communication Network 2010 Input / Output Interface 2011 Bus connecting each component

Claims

1. an acquisition means for acquiring position information corresponding to each position in a target space including a stationary structure based on laser light irradiated at each position and reflected light of the laser light, and wavelength information based on the wavelength of the reflected light reflected at the position; a specifying means for specifying an abnormality location where an abnormality has occurred in the stationary structure among the locations based on the wavelength information; a monitoring means for monitoring the abnormal portion; Equipped with The acquisition means acquiring first wavelength information that is wavelength information based on the wavelength of the reflected light reflected at a first position among the positions in the target space; After acquiring the first wavelength information, acquire second wavelength information that is the wavelength information based on the wavelength of the reflected light reflected at the first position; the identifying means identifies whether the first position is the abnormal location based on a difference between the first wavelength information and the second wavelength information. Specific system.

2. The identification system according to claim 1 , further comprising a three-dimensional model generation means for generating a three-dimensional model showing the shape of the stationary structure in the target space using the position information.

3. The identification system according to claim 1 or 2, wherein the acquisition unit acquires the wavelength information according to a difference between the wavelength of the reflected light and the wavelength of the laser light.

4. The identification means identifying a second position among the positions in the target space as the abnormal location; After identifying the second position as the abnormal location, identify a third position adjacent to the second position among positions in the target space as the abnormal location; Identifying the possible presence of an intruder in said stationary structure The identification system according to any one of claims 1 to 3.

5. The identification means identifying a fourth position among the positions in the target space as the abnormal location; After identifying the fourth position as the abnormal location, identifying a fifth position as the abnormal location, the fifth position being closer to the position of the stationary structure than the fourth position; Identifying the presence of an approach to the stationary structure The identification system according to any one of claims 1 to 3.

6. The identification means identifying a sixth position among the positions in the target space as the abnormal location; After identifying the sixth position as the abnormality location, again identify the sixth position as the abnormality location, Identifying that the anomaly at the sixth location continues to occur The identification system according to any one of claims 1 to 3.

7. acquiring position information corresponding to each position in a target space including a stationary structure based on laser light irradiated at each position and reflected light of the laser light, and wavelength information based on the wavelength of the reflected light reflected at the position; Identifying an abnormality location where an abnormality has occurred in the stationary structure among the locations based on the wavelength information; Monitor the abnormal location 1. A method of identification, comprising: The acquiring of the wavelength information includes: acquiring first wavelength information that is wavelength information based on the wavelength of the reflected light reflected at a first position among the positions in the target space; After acquiring the first wavelength information, second wavelength information is acquired, which is the wavelength information based on the wavelength of the reflected light reflected at the first position. This includes: and identifying the abnormality location includes identifying whether the first position is the abnormality location based on a difference between the first wavelength information and the second wavelength information. Specific method.

8. a process of acquiring position information corresponding to each position in a target space including a stationary structure based on laser light irradiated at the position and reflected light of the laser light, and wavelength information based on the wavelength of the reflected light reflected at the position; A process of identifying an abnormality location where an abnormality has occurred in the stationary structure among the locations based on the wavelength information; a process of monitoring the abnormality location; A program for causing an information processing device to execute the above, The process of acquiring wavelength information includes: acquiring first wavelength information that is wavelength information based on the wavelength of the reflected light reflected at a first position among the positions in the target space; After acquiring the first wavelength information, second wavelength information is acquired, which is the wavelength information based on the wavelength of the reflected light reflected at the first position. Processing includes: the process of identifying the abnormal location includes a process of identifying whether the first position is the abnormal location based on a difference between the first wavelength information and the second wavelength information. program.

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