Inspection management system, inspection management device, inspection management method, and program
The inspection management system addresses inefficient standard setting in intermediate processes by displaying inspection result charts, enhancing accuracy and reducing errors in production line inspections.
Patent Information
- Application Number
- JP2021007225
- Authority / Receiving Office
- JP · JP
- Patent Type
- Patents
- Current Assignee / Owner
- Filing Date
- 2021-01-20
- Publication Date
- 2025-09-09
- Estimated Expiration
- 2041-01-20
AI Technical Summary
Existing methods for setting inspection standards in intermediate processes of a production line are cumbersome and inefficient, leading to oversights and over-detection, with no clear method to minimize discrepancies between intermediate and final inspections.
An inspection management system that displays inspection result charts showing defects in final and intermediate inspections, allowing users to set accurate inspection standards by referring to the results of other intermediate inspections.
Enables efficient and accurate setting of inspection standards, reducing oversights and over-detection, thereby improving production efficiency and reducing re-inspection costs.
Smart Images

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Abstract
Description
[Technical Field]
[0001] The present invention relates to a technique for inspecting products on a product production line. [Background technology]
[0002] In product production lines, product inspection equipment is placed at the intermediate and final processes of the line to detect defects and sort out defective products, etc. For example, a production line for component-mounted boards generally includes the process of printing solder paste onto printed wiring boards (printing process), the process of mounting components onto the board with the solder paste printed on it (mounting process), and the process of heating the board after component mounting to solder the components to the board (reflow process), with inspections being carried out after each process.
[0003] For such inspections, it is necessary to set inspection standards for determining whether a product is good or bad and keep them in a state where the inspection equipment can refer to them. However, if the inspection standards are not appropriate, there will be oversights where products that are actually good are deemed defective during inspection, and oversights where products that are actually defective are deemed good.
[0004] Over-detection leads to a decrease in inspection efficiency, such as a decrease in yield and an increase in re-inspection costs, while oversight leads to a decrease in work efficiency in later processes, such as the need for repair work, or to the shipment of defective products. For this reason, it is desirable to minimize both over-detection and oversight. However, if inspection standards are tightened to reduce over-detection, over-detection will increase, and if inspection content is relaxed to reduce over-detection, over-detection will increase. Therefore, it is necessary to set appropriate inspection standards.
[0005] In the case of the component mounting board production line example mentioned above, the inspection carried out after the reflow process is an inspection to make a final pass / fail judgment on the product (hereafter referred to as final inspection), while the inspections carried out at each intermediate process before that (hereafter referred to as intermediate inspection) are generally carried out as part of process management. That is, intermediate products that do not meet the quality level set by each intermediate process (defective intermediate products) are discovered and prevented from being sent to subsequent processes, thereby improving the production efficiency of the entire line, or checking to see if any abnormalities have occurred in the process where the defective intermediate products were discovered.
[0006] To achieve this goal, it is sufficient to set inspection standards for each process (such as thresholds for determining whether an intermediate product passes or fails) in accordance with the quality level of the intermediate product desired by the user. For this reason, there is no clear method for determining inspection standards for intermediate inspections, and in reality, the standards are set either loosely or strictly depending on the user's preferences.
[0007] However, if an intermediate product that has the cause of being judged as defective in the final inspection is judged as a non-defective product in the intermediate inspection, it will worsen the work efficiency in the subsequent process. On the other hand, if an intermediate product that would be judged as a non-defective product in the final inspection is judged as a defective intermediate product in the intermediate inspection, the inspection efficiency will also worsen. For this reason, it is desirable to set inspection standards that minimize the discrepancy between the pass / fail judgment in the intermediate inspection and the pass / fail judgment in the final inspection. In the following, when there are multiple inspection processes, it is considered that a defective product that is judged as a non-defective product in all inspection processes before the final inspection is "overlooked," and a product that is judged as a non-defective product in the final inspection is "overlooked" if it is judged as a non-defective product in at least one inspection process before the final inspection. This is called "looking too far."
[0008] Conventionally, there have been no methods to support the optimization of the setting of inspection standards in such intermediate inspections. Techniques for this are known (for example, Patent Documents 1 to 4). For example, Patent Documents 1 and 2 disclose that when setting inspection standards for one intermediate inspection, a line indicating the inspection standard is displayed together with a histogram in which the number of pass / fail products after final inspection is tallied and displayed in different colors for each range of measurement values for the inspection item in the inspection. This allows a distinguishable display of how pass / fail products after final inspection are determined in the intermediate inspection process, allowing even inexperienced users to adopt the inspection standard with confidence.
[0009] If the inspection standards set in this way allow for the proper detection of defective products in the intermediate process, it will be possible to increase the rate of non-defective products by performing repairs and to prevent the disposal of products (for example, components or entire component-mounted boards) that would occur if defective products were mounted all the way to the final process.
[0010] Incidentally, from the perspective of preventing final oversights in a production line with multiple intermediate processes, it is possible to prevent oversights if defects can be detected in any of the multiple inspection processes and inspection items. In other words, defects that can be detected in an inspection item of one intermediate inspection do not necessarily need to be detected in the inspection items of other intermediate inspections. For this reason, when setting inspection standards for an inspection item of a certain intermediate inspection, if trying to detect all defects in that inspection item would result in a large number of oversights, it may be possible to relax the inspection standards and reduce oversights by referring to the results of inspection items of other intermediate inspections. [Prior art documents] [Patent documents]
[0011] [Patent Document 1] Japanese Patent Application Publication No. 2019-125693 [Patent Document 2] Japanese Patent Application Publication No. 2019-125694 [Patent Document 3] Japanese Patent Application Laid-Open No. 2007-43009 [Patent Document 4] Japanese Patent Application Laid-Open No. 2006-317266 Summary of the Invention [Problem to be solved by the invention]
[0012] However, with conventional technology, when setting the inspection items for one intermediate inspection, it was a very cumbersome task to refer to the inspection result information for the inspection items for other intermediate inspections each time, and this was an unrealistic approach.
[0013] The present invention has been made in consideration of the above-mentioned circumstances, and its object is to provide a technique that can efficiently and accurately set inspection standards for inspections in intermediate processes on a production line. [Means for solving the problem]
[0014] In order to achieve the above object, the present invention employs the following configuration: 1. An inspection management system for managing a final inspection of a finished product that has undergone a plurality of processes and a plurality of intermediate inspections that are carried out prior to the final inspection, in a production line for a product that has a plurality of processes and a plurality of manufacturing devices and inspection devices that correspond to the plurality of processes, a display means for displaying at least information relating to the intermediate inspection; an inspection content data acquisition means for acquiring inspection content data including inspection standards for each inspection item of each inspection of the product; an inspection result information acquisition means for acquiring information including the inspection results of the final inspection and the intermediate inspection; An inspection result chart is generated that shows, as information related to an inspection item of one of the intermediate inspections, whether or not the product determined to be defective in the final inspection is present, together with information that can identify whether or not the product determined to be defective in the final inspection is also determined to be defective in any of the other inspection items of the intermediate inspections. and an inspection content setting support means for creating the inspection content setting information and displaying it on the display means. The present invention is an inspection management system characterized by the above.
[0015] In the above, "final inspection" includes visual inspection by human eyes, and "intermediate inspection" includes both inspection of intermediate products that are less than the final product and inspection by inspection equipment conducted on final products before visual inspection. Furthermore, if a product has an assembly process and inspection is also conducted in that process, the inspection during assembly may be considered the final inspection, and the inspection before that may be considered the intermediate inspection. Furthermore, "inspection items in other intermediate inspections" includes not only inspection items in intermediate inspections in other processes, but also other inspection items in intermediate inspections in the same process.
[0016] In addition, in this specification, "inspection content" refers to the inspection items for each product, the inspection standards for those inspection items (e.g., pass / fail thresholds), and also the process of whether or not to check each item against the inspection standards (hereinafter also referred to as inspection ON / OFF). In addition, inspection content data includes both current inspection content and candidates for new inspection content. In this specification, the term "setting" is used to include changes as well. In addition, in this specification, the term "product" is used to include not only finished products but also so-called intermediate products.
[0017] With this system, the user can easily determine the inspection criteria for eliminating final defective products that should be eliminated in one intermediate inspection item by referring to the inspection result chart, while also referring to the results of other intermediate inspection items. This makes it possible to prevent a decrease in inspection accuracy due to overlooking and improve inspection efficiency.
[0018] The inspection result chart may also include an inspection reference line indicating at least the current inspection standard. This configuration allows the user to intuitively grasp the relationship between the inspection result information and the current inspection standard, making it easy to determine whether the inspection standard is correct or not.
[0019] The inspection result chart may also be a histogram. With this configuration, it is easy to determine whether the target intermediate inspection (or the target inspection item) is detecting final defective products and whether unnecessary defective judgments, such as non-defective products being judged as defective, are occurring. For example, by determining whether defects that could have been detected in intermediate inspections of other processes or other inspection items are being detected, or whether intermediate inspections of any process or inspection items are detecting defective products that result in a large number of unnecessary defective judgments, it is possible to determine whether waste is occurring in each inspection process.
[0020] The inspection result diagram may be a scatter diagram. With this configuration, it is possible to determine whether unnecessary defective products have been judged to be defective in the intermediate inspections to detect final defective products.
[0021] In addition, the inspection results diagram may be a diagram that shows, as information related to an inspection item of one of the intermediate inspections, the products that were judged to be good in the final inspection, the products that were judged to be defective in the final inspection, and the products that were judged to be defective in another inspection item of the intermediate inspection and also judged to be defective in the final inspection, each color-coded so that they can be distinguished from the other.
[0022] The inspection content setting support means may display the inspection result diagram on a screen when setting the inspection content of the intermediate inspection. With this configuration, it is possible to set the inspection content of the intermediate inspection while referring to the inspection result diagram of the target intermediate inspection, thereby enabling work to be performed efficiently.
[0023] The present invention also provides a management device for managing a final inspection of a finished product that has undergone a plurality of processes and a plurality of manufacturing devices and inspection devices corresponding to the plurality of processes, and a plurality of intermediate inspections that are carried out prior to the final inspection, in a production line for a product, the management device comprising: an inspection content data acquisition means for acquiring inspection content data including inspection standards for each inspection item of each inspection of the product; an inspection performance information acquisition means for acquiring information including the inspection results of the final inspection and the intermediate inspection; It can also be considered as an inspection management device having an inspection content setting support means for generating an inspection results diagram that shows, as information related to the inspection items of one of the intermediate inspections, whether or not there are any products that have been judged to be defective in the final inspection, together with information that can identify whether or not the products that have been judged to be defective in the final inspection have been judged to be defective in any of the inspection items of the other intermediate inspections.
[0024] The definitions of "final inspection," "intermediate inspection," and "other inspection items of the intermediate inspection" used here are the same as those described above.
[0025] The present invention also provides a method for managing a final inspection of a finished product that has undergone a plurality of processes and a plurality of manufacturing devices and inspection devices corresponding to the plurality of processes, and a plurality of intermediate inspections that are carried out prior to the final inspection, the method comprising: an inspection content data acquisition step of acquiring inspection content data including inspection standards for each inspection item of each inspection of the product; an inspection result information acquisition step of acquiring information including inspection results of the final inspection and the intermediate inspection; an inspection result diagram generating step of generating an inspection result diagram that indicates, as information related to an inspection item of one of the intermediate inspections, whether or not the product determined to be defective in the final inspection is present, together with information that can identify whether or not the product determined to be defective in the final inspection is also determined to be defective in any of the other inspection items of the intermediate inspections; It can also be understood as an inspection management method having an inspection result diagram output step of outputting the inspection result diagram generated in the inspection result diagram generating step.
[0026] The definitions of "final inspection," "intermediate inspection," and "other inspection items of the intermediate inspection" used here are the same as those described above.
[0027] The present invention can also be understood as a program for causing a computer to execute the above method, or a computer-readable recording medium on which such a program is non-temporarily recorded. Furthermore, the above configurations and processes can be combined to constitute the present invention as long as no technical contradiction occurs. [Effects of the Invention]
[0028] According to the present invention, it is possible to provide a technique that can efficiently and accurately set inspection standards for inspections in intermediate processes on a production line. [Brief explanation of the drawings]
[0029] [Figure 1] FIG. 1 is a schematic diagram of an inspection management system according to an application example. [Figure 2] FIG. 2 is a functional block diagram of an inspection management device according to an application example. [Figure 3] FIG. 3 is a diagram illustrating an example of an inspection result chart generated by the inspection management device according to the application example. [Figure 4] FIG. 4 is a diagram showing a schematic configuration of a production line according to the embodiment. [Figure 5] FIG. 5 is a functional block diagram of the inspection management device according to the embodiment. [Figure 6] FIG. 6 is a flowchart showing a process flow relating to the generation and display of an inspection result chart in the inspection management device according to the embodiment. [Figure 7] FIG. 7 is a diagram showing an example of an inspection result chart displayed on the display device according to the embodiment. [Figure 8] FIG. 8 is a diagram showing an example of an inspection result chart displayed on the display device according to the embodiment. DETAILED DESCRIPTION OF THE INVENTION
[0030] Hereinafter, embodiments of the present invention will be described with reference to the drawings. However, unless otherwise specified, the dimensions, materials, shapes, relative positions, etc. of the components described in each of the following examples are not intended to limit the scope of the present invention.
[0031] <Application example> The present invention can be applied, for example, as an inspection management system 9 as shown in Fig. 1. Fig. 1 is a schematic diagram of an inspection management system 9 in a surface mounting line for printed circuit boards according to this application example. As shown in Fig. 1, the surface mounting line according to this application example is provided with, in order from the upstream side, a solder printing device A1, a post-solder printing inspection device B1, a mounter A2, a post-mount inspection device B2, a reflow furnace A3, and a post-reflow inspection device B3.
[0032] The solder printing device A1 is a device that prints solder on the electrodes on a printed circuit board, the mounter A2 is a device that places electronic components to be mounted on the board on solder paste, and the reflow furnace A3 is a heating device that solders the electronic components onto the board.
[0033] Furthermore, inspection equipment B1, B2, and B3 inspect the condition of the board at the exit of each process and automatically detect defects or potential defects. Below, inspection by inspection equipment B1 will be referred to as post-printing inspection, inspection by inspection equipment B2 as post-mounting inspection, and inspection by inspection equipment B3 as post-reflow inspection.
[0034] The above-mentioned manufacturing devices A1, A2, and A3 and inspection devices B1, B2, and B3 are connected via a network such as a LAN to an inspection management device C. The inspection management device C is configured as a general-purpose computer system equipped with a CPU (processor), a main storage device (memory), an auxiliary storage device (hard disk, etc.), input devices (keyboard, mouse, controller, touch panel, etc.), output devices (display, printer, speaker, etc.), etc.
[0035] Fig. 2 shows a schematic block diagram of an examination management device C according to this application example. As shown in Fig. 2, the examination management device C has a control unit C1, an output unit C2 (e.g., a liquid crystal display), an input unit C3, and a memory unit C4. The control unit C1 further has, as functional modules, each of the following functional units: an examination content data acquisition unit C11, an examination result information acquisition unit C12, and an examination content setting support unit C13. Each functional unit may be realized, for example, by a CPU reading and executing a program stored in a memory device.
[0036] The inspection content data acquisition unit C11 acquires inspection content data including inspection criteria for each inspection item in each process. The inspection result information acquisition unit C12 acquires inspection result data including the results of each inspection from the inspection devices B1, B2, and B3. The inspection content setting support unit C13 generates an inspection results diagram based on the information acquired by the inspection content data acquisition unit C11 and the inspection result information acquisition unit C12, and displays it on the output unit C2 as part of the inspection content setting support screen. Here, the inspection results diagram is information related to the inspection items of one of the intermediate inspections, indicating whether or not the product was determined to be defective in the final inspection, and whether or not the product determined to be defective in the final inspection was defective in another of the intermediate inspections. It indicates whether any of the inspection items have been judged to be defective, along with identifiable information.
[0037] An example of an inspection result chart according to this application example is shown in Fig. 3. As shown in Fig. 3, the inspection result chart generated by the inspection content setting support unit C13 is a histogram that displays the number of non-defective products after reflow soldering and the number of actual defective products after reflow soldering for each predetermined interval of the measurement value of one inspection item (e.g., X-direction deviation) in one intermediate inspection (e.g., post-mount inspection). The histogram distinguishably displays the number of non-defective products after reflow soldering, the number of actual defective products after reflow soldering, and the number of products that were determined to be defective in another intermediate inspection (e.g., post-print inspection) and became actual defective after reflow soldering.
[0038] In the example of the inspection results chart in Figure 3, the bars that make up the histogram are displayed in different patterns (hatching, dots, filled in) depending on the difference in pass / fail judgment: actual failure after reflow, failure judgment in other inspection processes and actual failure after reflow, and pass inspection, making it possible to identify the difference in judgment at a glance. Such histograms are created for each inspection item in each intermediate inspection.
[0039] The method of indicating the difference between pass / fail judgments is not limited to this, and the display may be differentiated by differences in color, brightness, etc. Also, an inspection reference line indicating the currently set inspection standard may be displayed on the inspection result chart.
[0040] According to the inspection management system 9 described above, the user can efficiently set highly accurate inspection standards (i.e., minimize the number of actual defects and oversights after reflow) by checking the inspection content setting support screen.
[0041] <Embodiment> Next, an example of an embodiment of the present invention will be described in more detail.
[0042] (System Configuration) 4 is a diagram showing a schematic configuration example of a surface mounting line for printed circuit boards, which is the inspection management system 100 according to this embodiment. Surface Mount Technology (SMT) is a technique for soldering electronic components to the surface of a printed circuit board, and a surface mounting line mainly consists of three processes: solder printing, component mounting, and reflow (solder deposition).
[0043] As shown in Figure 4, the surface mounting line is equipped with the following manufacturing equipment, from upstream to downstream: a solder printing device X1, a mounter X2, and a reflow furnace X3. The solder printing device X1 uses screen printing to print solder paste onto the electrodes (called lands) on a printed circuit board. The mounter X2, also known as a chip mounter, picks up electronic components to be mounted on the board and places them on the solder paste at the appropriate locations. The reflow furnace X3 is a heating device that heats and melts the solder paste, then cools it to solder the electronic components onto the board. If there are a large number and types of electronic components to be mounted on the board, multiple mounters X2 may be installed on the surface mounting line.
[0044] Additionally, the surface mounting line is equipped with inspection devices Y1, Y2, Y3, and Y4 that inspect the condition of the boards at the exit of each process: solder printing, component mounting, and reflow, and automatically detect any defects or potential defects. Each inspection device not only automatically sorts non-defective products from defective ones, but also has the function of providing feedback to the operation of each manufacturing device based on the inspection results and their analysis (for example, by changing the mounting program).
[0045] The solder print inspection device Y1 is a device used to inspect the printed state of solder paste on boards removed from the solder printing device X1. The solder print inspection device Y1 measures the solder paste printed on the board in two or three dimensions and uses the measurement results to determine whether various inspection items are within normal values (tolerance ranges). Inspection items include, for example, the volume, area, height, positional deviation, and shape of the solder. An image sensor (camera) can be used for two-dimensional measurement of solder paste, while a laser displacement meter, phase shift method, spatial coding method, or light section method can be used for three-dimensional measurement.
[0046] The post-mount inspection system Y2 inspects the placement of electronic components on the board removed from the mounter X2. The post-mount inspection system Y2 performs two-dimensional and three-dimensional measurements of the components (which may be the component itself, electrodes, or other parts of the component) placed on the solder paste, and then uses the measurement results to determine whether various inspection items are within normal values (tolerances). Inspection items include, for example, component misalignment, angular (rotational) misalignment, missing components (no component), incorrect components (different components), incorrect polarity (different polarity of the electrodes on the component and board), upside-down components (components placed upside down), and component height. As with solder print inspection, image sensors (cameras) can be used for two-dimensional measurement of electronic components, while laser displacement meters, phase shifting, spatial encoding, and light-section methods can be used for three-dimensional measurement.
[0047] The visual inspection device Y3 inspects the quality of the soldering on boards removed from the reflow furnace X3. The visual inspection device Y3 measures the soldered portion after reflow in two or three dimensions and uses the measurement results to determine whether various inspection items are within normal values (tolerance ranges). Inspection items include the same items as component inspection, as well as the quality of the solder fillet shape. Solder shape measurement can be performed using the laser displacement meter, phase shift method, spatial coding method, light section method, and other methods, such as the color highlight method (a method in which red, green, and blue lights are directed at the solder surface at different angles of incidence, and the reflected light of each color is captured with a zenith camera to detect the three-dimensional shape of the solder as two-dimensional hue information).
[0048] The X-ray inspection device Y4 is a device for inspecting the state of soldering on a circuit board using X-ray images. For example, in the case of packaged components such as BGA (Ball Grid Array) and CSP (Chip Size Package) or multilayer circuit boards, the solder joints are hidden under the components or board, so the visual inspection device Y3 (i.e., visual images) cannot inspect the state of the solder. The X-ray inspection device Y4 is a device that compensates for such weaknesses of visual inspection. Inspection items of the X-ray inspection device Y4 include, for example, component misalignment, solder height, solder volume, solder ball diameter, back fillet length, and the quality of the solder joints. Note that the X-ray images may be X-ray transmission images or CT (Computed Tomography) images. Note that in the following description, the visual inspection device Y3 and the X-ray inspection device Y4 may be collectively referred to as post-reflow inspection devices.
[0049] In addition, each of the inspection devices Y1, Y2, Y3, and Y4 according to this embodiment may be provided with a display device for visually checking the product to be inspected, and the display device for visual inspection may be provided as a terminal separate from each inspection device.
[0050] In this embodiment, the board processed by the solder printing device X1 and the mounter X2 is an intermediate product, and the board carried out from the reflow furnace X3 is a finished product. Furthermore, the inspection performed by the post-solder printing inspection device Y1 and the component inspection device Y2 is an intermediate inspection, and the inspection performed by the visual inspection device Y3 and the X-ray inspection device Y4 is a final inspection. Hereinafter, the inspection performed by the post-solder printing inspection device Y1 may be referred to as a post-printing inspection, the inspection performed by the component inspection device Y2 as a post-mounting inspection, and the inspection performed by the visual inspection device Y3 and the X-ray inspection device Y4 as a post-reflow inspection.
[0051] (Inspection management device) The above-mentioned manufacturing equipment X1, X2, and X3 and inspection equipment Y1, Y2, Y3, and Y4 are connected to an inspection management apparatus 1 via a network (LAN). The inspection management apparatus 1 is a system responsible for managing and controlling the manufacturing equipment X1, X2, and X3 and the inspection equipment Y1, Y2, Y3, and Y4, and is configured by a general-purpose computer system including a CPU (processor), a main storage device (memory), an auxiliary storage device (hard disk, etc.), input devices (keyboard, mouse, controller, touch panel, etc.), a display device, etc., although not shown. The functions of the inspection management apparatus 1, which will be described later, are realized by the CPU reading and executing programs stored in the auxiliary storage device.
[0052] The inspection management apparatus 1 may be configured with one computer or multiple computers. Alternatively, all or part of the functions of the inspection management apparatus 1 may be implemented in a computer built into any of the manufacturing apparatuses X1, X2, and X3 or the inspection apparatuses Y1, Y2, Y3, and Y4. Alternatively, part of the functions of the inspection management apparatus 1 may be realized by a server on a network (such as a cloud server).
[0053] Fig. 5 shows a functional block diagram of the inspection management device 1 of this embodiment. As shown in Fig. 5, the inspection management device 1 has a control unit 10, an output unit 20, an input unit 30, and a memory unit 40, and the control unit 10 further has, as functional modules, an inspection content data acquisition unit 101, an inspection result information acquisition unit 102, an inspection content setting support unit 103, and an inspection standard calculation unit 104. Each functional module may be realized, for example, by a CPU reading and executing a program stored in a storage device such as a main storage device.
[0054] The output unit 20 is a means for outputting various information such as an examination content setting support screen described below, and is typically configured with a display device such as a liquid crystal display. When the output unit 20 is a display device, a user interface screen may be output to the output unit 20. The input unit 30 is an input means to the examination management device 1, and is typically configured with a keyboard, a mouse, a controller, a touch panel, etc.
[0055] The storage unit 40 is a storage device that stores various types of information such as test content data and test result data, which will be described later, and may be configured to include an external storage device such as a server.
[0056] Next, each functional block of the control unit 10 will be described. The inspection content data acquisition unit 101 acquires inspection content data including the inspection criteria for each inspection item in each process. Here, "inspection content" includes the inspection items for each product, the inspection criteria for the inspection items (e.g., a pass / fail judgment threshold), and also a process of whether or not to compare each item with the inspection criteria (hereinafter also referred to as inspection ON / OFF). The inspection content data also includes current inspection content and candidates for new inspection content. As will be described later, the inspection content data may be the inspection criteria values calculated by the inspection criteria calculation unit 104, or may be values input by the user via the input unit 30.
[0057] The inspection result information acquisition unit 102 acquires inspection result data including the results of each inspection (determination results of pass / fail) from the inspection devices Y1, Y2, Y3, and Y4. Furthermore, the inspection content setting support unit 103 generates an inspection performance chart based on the information acquired by the inspection content data acquisition unit 101 and the inspection result information acquisition unit 102, and displays it on the output unit 20 as part of the inspection content setting support screen.
[0058] The inspection standard calculation unit 104 calculates an inspection standard that is more appropriate than the current inspection standard for each inspection item in response to a user's instruction or automatically at a predetermined timing. Specifically, for example, the inspection standard that reduces oversights and / or oversights compared to the current inspection standard is calculated. It is advisable to set an appropriate inspection standard. The inspection standard can be calculated, for example, by performing a simulation inspection based on the current inspection standard and the inspection results from each of the inspection devices Y1, Y2, Y3, and Y4.
[0059] Next, a processing flow for displaying an inspection content setting support screen in the inspection management device 1 according to this embodiment will be described with reference to FIG. 6. In the inspection management device 1, the inspection content data acquisition unit 101 acquires inspection content data (S101), and the inspection result information acquisition unit 102 acquires inspection result data (S102), triggered by a user instruction, the arrival of a predetermined timing, or the like. Then, the inspection standard calculation unit 104 calculates optimized inspection standards for each inspection item based on the information acquired in steps S101 and S102 (step S103). Next, the inspection content setting support unit 103 generates an inspection result diagram based on the information acquired in steps S101 and S102 and the inspection standard calculated in step S103 (S104), and causes the output unit 20 to display the inspection content setting support screen including the inspection result diagram generated in step S104 (step S105), thereby completing the series of processes.
[0060] An example of the inspection content setting support screen in this embodiment is shown in FIG. 7. As shown in FIG. 7, the inspection content setting support screen displays a histogram as an inspection performance chart, which tally and display the number of post-reflow pass-by products and the number of post-reflow fail-by products for each predetermined interval of the measurement value of the inspection item for X-direction misalignment in the post-mount inspection. The histogram clearly shows the number of post-reflow pass-by products, the number of post-reflow fail-by products, and the number of products that were determined to be fail-by in other inspection items but were subsequently found to be post-reflow fail-by products. Furthermore, a current inspection reference line A indicating the current inspection standard and a post-optimization inspection reference line B indicating the optimized inspection standard calculated by the inspection standard calculation unit 104 are superimposed on the histogram.
[0061] Also, below the inspection results chart, the number of good products after reflow, the number of actual defects after reflow, and the number of products that were judged to be defective in other inspection items but became actual defects after reflow are displayed when the optimized inspection standards are used.
[0062] (Advantages of this embodiment) By displaying the above-described histogram (inspection performance chart) on the screen when setting the inspection contents, the user can easily compare the optimized inspection standards calculated by the inspection standard calculation unit 104 with the current inspection standards. Furthermore, the optimized inspection standards can easily determine whether the target intermediate inspection (or target inspection item) can properly detect actual defects after reflow soldering and whether unnecessary defective judgments are being made as a result. For example, by determining whether the optimized inspection standards are detecting defects that can be detected in intermediate inspections of other processes or other inspection items, or whether the intermediate inspections of any process or any inspection items are detecting defective products that result in many unnecessary defective judgments, the user can determine whether unnecessary defective judgments are being made.
[0063] To explain this more specifically based on the inspection performance chart shown in Figure 7, the current inspection standard (those to the left of the current inspection standard line A are judged as pass-through products) detects actual defects after reflow that can also be detected by other inspection items, and also results in overlooking, whereby pass-through products after reflow are judged as pass-through products. If this is changed to the optimized standard calculated by the inspection standard calculation unit 104 (those to the left of the optimized inspection standard line B are judged as pass-through products), the overlooking will be correctly judged as pass-through products. In this case, actual defects after reflow that were previously detected will be judged as pass-through products, but it can be understood that this will not ultimately result in an oversight, because they will be detected as pass-through products by other inspection items.
[0064] <Modification> In the above embodiment, the inspection result diagram is displayed as a histogram, but the inspection result diagram is not limited to the display format of a histogram. Fig. 8 shows another example of the inspection result diagram.
[0065] As shown in Figure 8, the inspection performance chart for this modification is a scatter plot in which the X-axis represents the measured values of the component X-direction misalignment inspection item in the post-printing inspection, and the Y-axis represents the measured values of the component X-direction misalignment inspection item in the post-reflow inspection. The scatter plot clearly shows the number of pass-through products after reflow, the number of actual failures after reflow, and the number of products that were judged as defective in other inspection items and subsequently became actual failures after reflow. The arrows marked R in the chart indicate the range of measured values that are judged as pass-through products in the post-reflow inspection, and the arrows marked P indicate the range of measured values that are judged as pass-through products in the post-printing inspection.
[0066] By displaying the inspection results chart as a scatter plot like this, it is possible to determine whether unnecessary defects are being judged in intermediate inspections in order to detect actual defects after reflow. It is also possible to determine whether actual defects after reflow are being detected by appropriately dividing the work among other processes and inspection items, or whether actual defects after reflow that do not need to be detected are being detected by the displayed processes and inspection items.
[0067] Note that a current inspection reference line indicating the current inspection standard and / or a post-optimization inspection reference line indicating the post-optimization inspection standard may also be displayed on the scatter diagram type inspection result chart.
[0068] Incidentally, when referring to a scatter plot, highly accurate inspection standards can be set for the inspection process and inspection items in question when the correlation between the measured values of the intermediate inspection and the post-reflow inspection is high in the scatter plot, and the actual post-reflow defects are plotted at the ends of each distribution according to the distribution.
[0069] On the other hand, if the correlation between the measured values of the intermediate inspection and the post-reflow inspection is low and the actual post-reflow defects are plotted outside the distribution, it will be impossible to accurately detect the actual post-reflow defects. In other words, it will not be possible to set appropriate inspection content by changing the inspection standards for the process or inspection item in question.
[0070] Specifically, as shown in the inspection results graph in Figure 8, for example, there are cases where many products are plotted in a position outside the range of pass-quality products on the Y axis (measured values from the post-reflow inspection) even though they are within the range of pass-quality products on the X axis (measured values from the post-print inspection). In such cases, if an attempt is made to eliminate actual post-reflow defects by adjusting the inspection standards for X-axis misalignment in the post-print inspection to be stricter, many over-detection errors will occur in the post-print inspection. Also, if there are many products that are plotted near the center on the Y axis even though they are outside the range of pass-quality products on the X axis, good products after reflow will be judged as defective in the post-print inspection, which will also result in an increase in over-detection errors.
[0071] From the above, it is possible to understand whether changing the inspection standards for the processes and inspection items for which inspection standards were set will contribute to improving inspection accuracy. Specifically, for example, if many of the components judged to be defective in the intermediate process have a sufficient margin for the inspection standards after reflow, it is preferable to consider optimizing the inspection standards for other processes and inspection items.
[0072] For example, in the inspection results diagram of Figure 8, many products are plotted outside the non-defective range on the X axis and within the non-defective range on the Y axis, but several products are also plotted within the non-defective range on the X axis and outside the non-defective range on the Y axis, which shows that proper pass / fail judgments are not being made. From the inspection results chart in 8, it can be seen that items plotted outside the non-defective range on the Y axis are defects that have been detected by other inspection items. This shows that adjusting the inspection standards for the currently referenced inspection items will not improve inspection accuracy, and that optimization of the inspection standards for other processes and inspection items should be considered. Note that if there are no other better processes or inspection items, it is acceptable to compromise and use the inspection standards in question based on factors such as the first-pass rate in intermediate inspections.
[0073] <Other> The above-described embodiments are merely illustrative of the present invention, and the present invention is not limited to the above-described specific embodiments. Various modifications of the present invention are possible within the scope of the technical concept thereof. For example, in the above-described embodiments, histograms and scatter plots are shown as examples of inspection performance charts, but the inspection performance charts may be displayed in other ways. For example, a stacked bar graph that clearly shows the number of non-defective products after final inspection, the number of final defects, and the number of products that were determined to be defective in other inspection items and were ultimately defective may be displayed by a predetermined item (e.g., time period).
[0074] The inspection content setting support unit may also generate both a histogram inspection result diagram and a scatter plot inspection result diagram (or an inspection result diagram in another display mode) and display them on the same screen. The inspection content setting support screen may also simultaneously display various information other than the inspection result diagram, such as a display related to component information and an input interface for inspection content.
[0075] In addition, in the above embodiment, the post-reflow inspection corresponds to the final inspection, and the post-printing inspection and / or post-mounting inspection corresponds to the intermediate inspection, but the inspection by the X-ray inspection device Y4 may be the final inspection, and the inspection by the visual inspection device Y3 may be included in the intermediate inspection. Also, the visual inspection of the product without an inspection device may be the final inspection, and the inspection performed by an inspection device prior to that may be the intermediate inspection. Furthermore, if inspection is also performed during product assembly, the inspection during assembly may be the final inspection, and the inspection performed prior to that may be the intermediate inspection.
[0076] In the above embodiment, the inspection content setting support unit is configured to output a screen including an inspection result diagram to a display device, but the present invention is not limited to this configuration. The inspection content setting support unit may simply generate data for displaying a screen including the inspection result diagram. The generated data may be transmitted to another device via a communication means or may be stored in a memory unit. In other words, the present invention is also applicable to information processing devices that do not have a display means.
[0077] Furthermore, in the above embodiment, a manufacturing line for component-mounted boards was used as an example, but the present invention can also be applied to manufacturing equipment for products other than component-mounted boards, as long as the production line is a product that has multiple intermediate processes.
[0078] <Additional Notes> One embodiment of the present invention comprises: In a production line for a product having a plurality of processes and having a plurality of manufacturing devices and inspection devices corresponding to the plurality of processes, an inspection management system (9; 100) is provided for managing a final inspection for inspecting a finished product that has gone through the plurality of processes and a plurality of intermediate inspections that are carried out prior to the final inspection, a display means (C2; 20) for displaying at least information relating to the intermediate inspection; an inspection content data acquisition means (C11; 101) for acquiring inspection content data including inspection standards for each inspection item of each inspection of the product; an inspection result information acquisition means (C12; 102) for acquiring information including the inspection results of the final inspection and the intermediate inspection; and an inspection content setting support means (C13; 103) for generating an inspection result diagram showing the presence or absence of the product determined to be defective in the final inspection as information related to the inspection items of the intermediate inspection, together with information that can identify whether the product determined to be defective in the final inspection has also been determined to be defective in any of the other inspection items of the intermediate inspection, and displaying the generated inspection result diagram on the display means. An inspection management system characterized by: is.
[0079] Another embodiment of the present invention is In a production line for a product having a plurality of processes and having a plurality of manufacturing devices and inspection devices corresponding to the plurality of processes, an inspection management device (C;1) is provided for managing a final inspection for inspecting a finished product that has gone through the plurality of processes and a plurality of intermediate inspections that are carried out prior to the final inspection, an inspection content data acquisition means (C11; 101) for acquiring inspection content data including inspection standards for each inspection item of each inspection of the product; an inspection result information acquisition means (C12; 102) for acquiring information including the inspection results of the final inspection and the intermediate inspection; and an inspection content setting support means (C13; 103) for generating an inspection result diagram showing the presence or absence of the product determined to be defective in the final inspection as information related to the inspection items of the intermediate inspection, together with information that can identify whether the product determined to be defective in the final inspection has also been determined to be defective in any of the other inspection items of the intermediate inspection. The present invention is an inspection management device characterized by the above.
[0080] Another embodiment of the present invention is A method for managing a final inspection of a finished product that has undergone a plurality of processes and a plurality of manufacturing devices and inspection devices corresponding to the plurality of processes, and a plurality of intermediate inspections that are carried out prior to the final inspection, the method comprising: an inspection content data acquisition step (S101) for acquiring inspection content data including inspection standards for each inspection item of each inspection of the product; an inspection result information acquisition step (S102) of acquiring information including the inspection results of the final inspection and the intermediate inspection; an inspection result diagram generation step (S104) for generating an inspection result diagram showing whether or not the product determined to be defective in the final inspection is present as information relating to the inspection content of the intermediate inspection, together with information that can identify whether or not the product determined to be defective in the final inspection is also determined to be defective in any of the other inspection items of the intermediate inspection; An inspection result diagram output step (S105) of outputting the inspection result diagram generated in the inspection result diagram generation step. The present invention is an inspection management method characterized by the above. [Explanation of symbols]
[0081] A1, X1... Solder printing device A2, X2 mounter A3, X3... Reflow oven B1, Y1... Post-solder printing inspection equipment B2, Y2...Post-mount inspection equipment B3: Post-reflow inspection equipment Y3: Visual inspection equipment Y4: X-ray inspection equipment C. 1. Inspection management device C1, 10... Control section C2, 20... Output section C3, 30... Input section C4, 40...Storage section
Claims
1. An inspection management system for managing a final inspection that inspects a finished product that has gone through a plurality of processes and an intermediate inspection that is carried out prior to the final inspection in a production line for a product that has a plurality of processes and a plurality of manufacturing devices and inspection devices corresponding to the plurality of processes, comprising: a display means for displaying at least information relating to the intermediate inspection; an inspection content data acquisition means for acquiring inspection content data including inspection standards for each inspection item of each inspection of the product; an inspection result information acquisition means for acquiring information including the inspection results of the final inspection and the intermediate inspection; and an inspection content setting support means for generating an inspection result diagram, which is a histogram or a scatter diagram, showing the presence or absence of the product determined to be defective in the final inspection as information related to an inspection item of one of the intermediate inspections, together with information that enables identification of whether the product determined to be defective in the final inspection has also been determined to be defective in any of the other inspection items of the intermediate inspections, and displaying the generated inspection result diagram on the display means. An inspection management system characterized by:
2. The inspection result chart includes at least an inspection reference line indicating a current inspection reference. The inspection management system according to claim 1 .
3. The inspection result diagram is a diagram showing, as information relating to an inspection item of one of the intermediate inspections, the products determined to be non-defective in the final inspection, the products determined to be defective in the final inspection, and the products determined to be defective in other inspection items of the intermediate inspection and also determined to be defective in the final inspection, each of which is color-coded so as to be distinguishable from the other.
3. The inspection management system according to claim 1 or 2.
4. the inspection content setting support means displays the inspection result diagram on a screen when setting the inspection content of the intermediate inspection. The inspection management system according to any one of claims 1 to 3.
5. An inspection management device for managing a final inspection that inspects a finished product that has gone through a plurality of processes and a plurality of intermediate inspections that are carried out prior to the final inspection, in a production line for a product that has a plurality of processes and a plurality of manufacturing devices and inspection devices corresponding to the plurality of processes, an inspection content data acquisition means for acquiring inspection content data including inspection standards for each inspection item of each inspection of the product; an inspection result information acquisition means for acquiring information including the inspection results of the final inspection and the intermediate inspection; and an inspection content setting support means for generating an inspection result chart, which is a histogram or a scatter diagram, showing the presence or absence of the product determined to be defective in the final inspection as information related to an inspection item of one of the intermediate inspections, together with information that can identify whether the product determined to be defective in the final inspection has also been determined to be defective in any of the other inspection items of the intermediate inspections. An inspection management device comprising:
6. A method for managing a final inspection of a finished product that has undergone a plurality of processes and a plurality of manufacturing devices and inspection devices corresponding to the plurality of processes, and a plurality of intermediate inspections that are carried out prior to the final inspection, the method comprising: an inspection content data acquisition step of acquiring inspection content data including inspection standards for each inspection item of each inspection of the product; an inspection result information acquisition step of acquiring information including inspection results of the final inspection and the intermediate inspection; an inspection result chart generating step of generating an inspection result chart, which is a histogram or a scatter diagram, showing the presence or absence of the product determined to be defective in the final inspection as information related to one of the inspection items of the intermediate inspection, together with information that can identify whether the product determined to be defective in the final inspection has also been determined to be defective in any of the other inspection items of the intermediate inspection; an inspection result diagram output step of outputting the inspection result diagram generated in the inspection result diagram generation step. An inspection management method comprising:
7. 7. A program for causing an information processing device to execute each step of the inspection management method according to claim 6.
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