Fault information detection device, fault information detection method, and fault information detection program

The fault information detection device enhances fault detection accuracy by calculating vector representations and similarities, addressing the inefficiencies of conventional methods and ensuring user-intentioned fault identification.

JP7740495B2Active Publication Date: 2025-09-17NIPPON TELEGRAPH & TELEPHONE CORP
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Patent Information

Application Number
JP2024502760
Authority / Receiving Office
JP · JP
Patent Type
Patents
Current Assignee / Owner
Filing Date
2022-02-28
Publication Date
2025-09-17
Estimated Expiration
2042-02-28

AI Technical Summary

Technical Problem

Conventional fault detection methods in large systems take a long time due to the need to reduce the number of metrics, often leading to the loss of metrics relevant to the user's intended fault identification.

Method used

A fault information detection device that includes a data acquisition unit, metrics encoder, fault query encoder, and fault information detection unit to calculate vector representations and similarities, ensuring accurate fault detection that reflects the user's intentions.

Benefits of technology

Enables highly accurate fault detection by using trained models to determine the validity of output results, reflecting user intentions and improving detection speed.

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Abstract

A failure information detection device according to an embodiment of the present invention comprises: a data-obtaining unit that obtains a plurality of metrics including time-series data and metadata from a system to be monitored, and a failure query indicating a failure that a user desires to identify; a metric encoder that calculates a first vector representation of the plurality of metrics; a failure query encoder that calculates a second vector representation of the failure query; and a failure information detection unit that calculates a first similarity between the first vector representation and the second vector representation, and detects the occurrence of a failure in the metrics on the basis of the first similarity.
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Citation Information

Patent Citations

  • Trace information collection system, trace information collecting method and trace information collection program

    JP2006202076A

  • Answer sentence selection device, method, and program

    WO2020004401A1

  • Failure prediction using gradient-based sensor identification

    WO2020242553A1