Bending stiffness measuring device

The bending stiffness measuring device uses ultrasonic and electromagnetic induction with near-infrared spectrometry to calculate stiffness without size processing, enhancing accuracy and applicability in printing and design.

JP7790046B2Active Publication Date: 2025-12-23FUJIFILM BUSINESS INNOVATION CORP
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Patent Information

Application Number
JP2021124699
Authority / Receiving Office
JP · JP
Patent Type
Patents
Current Assignee / Owner
Filing Date
2021-07-29
Publication Date
2025-12-23
Estimated Expiration
2041-07-29

AI Technical Summary

Technical Problem

Conventional devices for measuring the bending stiffness of paper require the paper to be processed to a predetermined size, limiting their applicability and efficiency.

Method used

A bending stiffness measuring device utilizing an ultrasonic device, electromagnetic induction device, and near-infrared spectrometer to measure the bending stiffness without processing the paper into a predetermined size, incorporating a derivation unit to calculate stiffness using basis weight, thickness, moisture content, and ash content.

Benefits of technology

Enables accurate measurement of bending stiffness without size processing, improving accuracy and efficiency by deriving stiffness from multiple parameters without moving devices, and allowing immediate utilization in printing and design processes.

✦ Generated by Eureka AI based on patent content.

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Abstract

To provide a bending rigidity measurement device that can measure the bending rigidity of a piece of paper without processing the paper to a determined size.SOLUTION: The bending rigidity measurement device includes: an ultrasonic wave device having an oscillation unit for oscillating an ultrasonic wave to a piece of paper and an oscillation reception unit for receiving an ultrasonic wave that has passed through the paper; an electromagnetic induction device having an electromagnetic induction unit located near the paper across a space; a light emitting unit for emitting a near-infrared light to the paper; and a light reception unit for receiving the near-infrared light which has passed through the paper.SELECTED DRAWING: Figure 1
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Description

[Technical Field]

[0001] The present invention relates to a bending stiffness measuring device for measuring the bending stiffness of paper. [Background technology]

[0002] Patent Document 1 describes a paper or sheet quality measuring device that can measure the basis weight, coating amount, moisture content, ash content, etc. of paper using light in the near-infrared region. [Prior art documents] [Patent documents]

[0003] [Patent Document 1] Japanese Patent Application Publication No. 11-237377 Summary of the Invention [Problem to be solved by the invention]

[0004] Conventionally, devices for measuring the bending stiffness of paper required the paper to be processed to a predetermined size.

[0005] An object of the present invention is to measure the bending stiffness of paper without processing the paper into a predetermined size. [Means for solving the problem]

[0006] A bending stiffness measuring device according to a first aspect of the present invention is characterized by comprising an ultrasonic device having an oscillator that emits ultrasonic waves toward a sheet of paper and a receiver that receives the ultrasonic waves that have passed through the sheet of paper; an electromagnetic induction device having an electromagnetic induction unit that generates electromagnetic induction in the sheet of paper; and a near-infrared spectrometer that has an emitter that emits near-infrared light toward the sheet of paper and a receiver that receives the near-infrared light that has passed through the sheet of paper.

[0007] A bending stiffness measuring device according to a second aspect of the present invention is characterized in that, in the bending stiffness measuring device described in the first aspect, it is provided with a derivation unit that derives the bending stiffness of the paper using the measurement results of the ultrasonic device, the measurement results of the electromagnetic induction device obtained by moving the electromagnetic induction unit close to and away from the paper, and the measurement results of the near-infrared spectrometer.

[0008] A bending stiffness measuring device according to a third aspect of the present invention is the bending stiffness measuring device according to the second aspect, characterized in that the derivation unit derives the bending stiffness of the paper using the basis weight of the paper obtained from the measurement results of the ultrasonic device, the thickness of the paper obtained from the measurement results of the electromagnetic induction device, and the moisture content and ash content of the paper obtained from the measurement results of the near-infrared spectrometer.

[0009] A bending stiffness measuring device according to a fourth aspect of the present invention is the bending stiffness measuring device according to any one of the first to third aspects, characterized in that the ultrasonic device, the electromagnetic induction device, and the near-infrared spectroscopy device are arranged so as to face a paper sheet attached to the device body.

[0010] A bending stiffness measuring device according to a fifth aspect of the present invention is characterized by including an acquisition unit that acquires the basis weight of a paper sheet, another acquisition unit that acquires the thickness of the paper sheet, and a near-infrared spectrometer having an emission unit that emits near-infrared light toward the paper sheet, and a light receiving unit that receives the near-infrared light that has passed through the paper sheet.

[0011] A bending stiffness measuring device according to a sixth aspect of the present invention is characterized in that, in the bending stiffness measuring device described in the fifth aspect, it further comprises a derivation unit that derives the bending stiffness of the paper using the basis weight of the paper acquired by the acquisition unit, the thickness of the paper acquired by the other acquisition unit, and the measurement results of the near-infrared spectrometer.

[0012] A bending stiffness measuring device according to a seventh aspect of the present invention is the bending stiffness measuring device according to the sixth aspect, characterized in that the derivation unit derives the bending stiffness of the paper using the basis weight of the paper, the thickness of the paper, and the moisture content and ash content of the paper obtained from the measurement results of the near-infrared spectrometer.

[0013] An eighth aspect of the present invention is a bending stiffness measuring device according to any one of the third aspect, the second aspect, the fourth aspect which cites the third aspect, or the seventh aspect, characterized in that, when the bending stiffness of the paper is K, the thickness of the paper is T, the basis weight of the paper is B, the moisture content of the paper is W, the ash content of the paper is A, and a, b, and c are predetermined constants, the derivation unit derives the bending stiffness of the paper using the following formula (Z): K=T 3 ×(a B / T+b W / B+c A / B) (Z) [Effects of the Invention]

[0014] The bending stiffness measuring device according to the first aspect of the present invention can measure the bending stiffness of a sheet of paper without processing the sheet of paper into a predetermined size.

[0015] The bending stiffness measuring device according to the second aspect of the present invention can improve the accuracy of the bending stiffness of the paper that is derived compared to a case where the measurement results of the near-infrared spectrometer are not used.

[0016] In the bending stiffness measuring device according to the third aspect of the present invention, the accuracy of the bending stiffness of the paper that is derived can be improved compared to when the moisture content and ash content are not used.

[0017] In the bending stiffness measuring device according to the fourth aspect of the present invention, the bending stiffness of the paper can be derived without moving each device.

[0018] The bending stiffness measuring device according to the fifth aspect of the present invention can measure the bending stiffness of a sheet of paper without processing the sheet of paper into a predetermined size.

[0019] In the bending stiffness measuring device according to the sixth aspect of the present invention, the accuracy of the bending stiffness of the paper that is derived can be improved compared to when the measurement results of the near-infrared spectrometer are not used.

[0020] In the bending stiffness measuring device according to the seventh aspect of the present invention, the accuracy of the derived bending stiffness can be improved compared to when the moisture content and ash content are not used.

[0021] The bending stiffness measuring device according to the eighth aspect of the present invention can derive the bending stiffness of the paper unambiguously. [Brief explanation of the drawings]

[0022] [Figure 1] 1 is a schematic diagram showing the configuration of a bending stiffness measuring device according to a first embodiment of the present invention. [Figure 2] 1 is a configuration diagram showing a near-infrared spectrometer of a bending stiffness measuring device according to a first embodiment of the present invention. [Figure 3] 3 is a diagram showing the intensity distribution of light measured by a near-infrared spectrometer of the bending stiffness measurement device according to the first embodiment of the present invention. [Figure 4] 1 is a configuration diagram showing an ultrasonic device of a bending stiffness measuring device according to a first embodiment of the present invention. [Figure 5] 1 is a schematic diagram showing a state in which ultrasonic waves emitted by an ultrasonic device of the bending stiffness measuring device according to the first embodiment of the present invention pass through a sheet of paper. FIG. [Figure 6] 1A and 1B are diagrams illustrating the configuration of an electromagnetic induction device of a bending stiffness measuring device according to a first embodiment of the present invention. [Figure 7] FIG. 2 is a control block diagram showing a control unit of the bending stiffness measuring device according to the first embodiment of the present invention. [Figure 8] 3 is a flow chart showing the control of each device by a control unit of the bending stiffness measuring device according to the first embodiment of the present invention. FIG. [Figure 9] 1A, 1B, and 1C are graphs showing a scatter diagram of bending stiffness derived by a bending stiffness measurement device according to a comparative example to the first embodiment of the present invention, and a scatter diagram of bending stiffness derived by the bending stiffness measurement device according to the first embodiment of the present invention. [Figure 10] FIG. 4 is a schematic diagram showing the configuration of a bending stiffness measuring device according to a second embodiment of the present invention. [Figure 11]FIG. 6 is a control block diagram showing a control unit of a bending stiffness measuring device according to a second embodiment of the present invention. [Figure 12] FIG. 10 is a schematic diagram showing the configuration of a bending stiffness measuring device according to a third embodiment of the present invention. [Figure 13] FIG. 10 is a control block diagram showing a control unit of a bending stiffness measuring device according to a fourth embodiment of the present invention. DETAILED DESCRIPTION OF THE INVENTION

[0023] First Embodiment An example of a bending stiffness measuring device according to a first embodiment of the present invention will be described with reference to Figures 1 to 9. Note that arrow H shown in each figure indicates the vertical direction, i.e., the up-down direction of the device, and arrow W indicates the horizontal direction, i.e., the width direction of the device.

[0024] (Overall configuration of bending stiffness measuring device 10) 1, the bending stiffness measuring device 10 is a device for measuring the bending stiffness of a sheet of paper P, which is a member to be measured, and as shown in Fig. 1, it comprises a device main body 10a, a near-infrared spectrometer 20, an ultrasonic device 30, and an electromagnetic induction device 40. The bending stiffness measuring device 10 further comprises a mounting unit 60 to which the sheet of paper P is attached, a control unit 80 that controls each device, and a derivation unit 90 that derives the bending stiffness of the sheet of paper P. The near-infrared spectrometer 20, the ultrasonic device 30, and the electromagnetic induction device 40 are arranged in this order from one side (left side in the figure) to the other side (right side in the figure) in the width direction of the device.

[0025] Here, paper P is made by agglutinating plant fibers and other fibers. The bending rigidity of paper P refers to the resistance of paper P to bending deformation, and the greater the bending rigidity value, the more difficult it is to deform compared to a smaller value. Note that bending rigidity is sometimes expressed as bending stiffness.

[0026] [Near infrared spectrometer 20] As shown in FIG. 2, the near-infrared spectroscopic device 20 (hereinafter referred to as "spectroscopic device 20") includes a light-emitting unit 22 arranged above a sheet of paper P whose surface faces vertically, and a light-receiving unit 26 arranged below the sheet of paper P.

[0027] The light-emitting unit 22 emits near-infrared light toward the paper P. The light-receiving unit 26 is a near-infrared spectroscopic sensor that receives light that has passed through the paper P, separates the received light into wavelengths, and measures the intensity distribution (spectrum) of the light absorbed by the paper P.

[0028] In this configuration, the light receiving unit 26 measures the intensity distribution of light absorbed by the paper P for each wavelength, as shown in the graph in FIG. 3. The vertical axis of the graph in FIG. 3 is absorbance, which indicates the degree to which the intensity is weakened when the near-infrared light passes through the paper P. The horizontal axis of the graph is wavelength. Here, the wavelength of the specific absorption band of moisture contained in the paper P is 1940 [nm], and the wavelength of the specific absorption band of ash is 2300 [nm]. Then, the light receiving unit 26 uses a pre-stored conversion table to obtain the moisture content from the absorbance at a wavelength of 1940 [nm], and the ash content from the absorbance at a wavelength of 2300 [nm].

[0029] [Ultrasonic device 30] As shown in FIG. 4, the ultrasonic device 30 includes an oscillator 32 arranged above a sheet of paper P whose surface faces vertically, and an oscillator 36 arranged below the sheet of paper P.

[0030] The oscillation section 32 is an ultrasonic oscillator, and is configured to intermittently oscillate ultrasonic waves toward the paper P. The oscillation receiving section 36 is configured to receive the ultrasonic waves that have passed through the paper P.

[0031] In this configuration, the ultrasonic waves oscillated by the oscillating unit 32 are absorbed by the paper P and attenuated as they pass through the paper P, as shown in Fig. 5. The receiving unit 36 ​​receives the attenuated ultrasonic waves and measures the attenuation rate of the ultrasonic waves.

[0032] Furthermore, the receiving unit 36 ​​acquires the amplitude of the ultrasonic waves that have passed through the paper P using the attenuation rate of the ultrasonic waves and the distance (d in FIG. 4) between the oscillator 32 and the receiving unit 36. Then, the receiving unit 36 ​​acquires the basis weight of the paper P from the amplitude of the ultrasonic waves that have passed through the paper P using a conversion table stored in advance. Note that the greater the basis weight, the smaller the amplitude of the ultrasonic waves that have passed through the paper P compared to when the basis weight is small.

[0033] [Electromagnetic induction device 40] As shown in Figures 6(A) and (B), the electromagnetic induction device 40 includes an electromagnetic induction section 42 arranged above a sheet of paper P whose surface faces vertically, a support section 52 that supports the sheet of paper P from below, and a moving section 54 that moves the electromagnetic induction section 42 up and down.

[0034] -Electromagnetic induction section 42- The electromagnetic induction unit 42 includes a magnetic core 44 extending in the vertical direction, a primary coil unit 46, and a secondary coil unit 48.

[0035] The magnetic core 44 extends vertically, has a cylindrical shape with spherical ends, and is made of a magnetic metal.

[0036] The primary coil section 46 includes a coil section 46a wound around the upper portion of the magnetic core 44 and a power supply 46b that applies a voltage to the coil section 46a. The secondary coil section 48 includes a coil section 48a wound around the lower portion of the magnetic core 44 and a voltmeter 48b that measures the voltage generated in the coil section 48a.

[0037] -Support part 52, moving part 54- The support unit 52 has a contact surface 52a that comes into contact with the paper surface of the paper P and is made of a magnetic metal. The moving unit 54 is formed by combining known mechanical components and moves the electromagnetic induction unit 42 toward and away from the paper P. Specifically, the moving unit 44 moves the electromagnetic induction unit 42 between a separated position (see FIG. 6(A)) where the electromagnetic induction unit 42 is separated from the paper P and a close position (see FIG. 6(B)) where the electromagnetic induction unit 42 is close to the paper P. This allows the electromagnetic induction unit 42 to be located at the close position or the separated position. In this embodiment, as an example, the electromagnetic induction unit 42 moves within a range of 3.0 mm or less relative to the paper P. The electromagnetic induction unit 42 may come into contact with the paper P when close to the paper P.

[0038] In this configuration, a voltage is applied to the coil portion 46a by the power supply 46b of the electromagnetic induction unit 42, which is located at the separated position as shown in FIG. 6A. This generates a magnetic field around the magnetic core 44 (see the dotted line in the figure). Furthermore, the moving unit 54 moves the electromagnetic induction unit 42, which is located at the separated position, to the close position as shown in FIG. 6B. This causes the magnetic field around the magnetic core 44 to fluctuate, changing the voltage generated in the coil portion 48a. The change in the voltage generated in the coil portion 48a is then measured by the voltmeter 48b.

[0039] 7 derives the thickness of the paper P from the change in voltage measured by the voltmeter 48b. Specifically, the deriving unit 90 derives the thickness of the paper P from the change in voltage using a pre-stored conversion table. Note that the thicker the paper P, the smaller the change in voltage compared to when the paper P is thin.

[0040] [Mounting portion 60] 1, the mounting unit 60 includes a mounting member 62 arranged on one side of the spectrometer 20, the ultrasonic device 30, and the electromagnetic induction device 40 in the device width direction, and a mounting member 68 arranged on the other side. The mounting members 62 and 68 are configured to sandwich the paper P so that the paper surface faces up and down. In this manner, the paper P is mounted on the mounting unit 60.

[0041] [Control unit 80, derivation unit 90] 7, the control unit 80 controls each device. The output unit 90 derives the bending stiffness of the paper P from the measurement results of each device. The configurations of the control unit 80 and the output unit 90 will be described below together with the operation of the bending stiffness measuring device 10.

[0042] (Function of bending stiffness measuring device 10) Next, the operation of bending stiffness measuring apparatus 10 will be described with reference to the flow diagram shown in Fig. 8. When bending stiffness measuring apparatus 10 is in a non-operating state, electromagnetic induction unit 42 is located at the separated position as shown in Fig. 6(A). The operation described below is performed by control unit 80 controlling each device.

[0043] First, when a user attaches a sheet of paper P to the attachment portion 60 of the bending stiffness measuring device 10 and instructs the bending stiffness measuring device 10 to measure the sheet of paper P, in step S100, the light-emitting portion 22 of the spectroscopic device 20 shown in Figure 2 emits near-infrared light toward the sheet of paper P.

[0044] Furthermore, in step S200, the light receiving unit 26 receives the light that has passed through the paper P, separates the received light into wavelengths, and measures the intensity distribution (spectrum) of the light absorbed by the paper P, as shown in Fig. 3. Furthermore, the light receiving unit 26 obtains the amount of moisture and the amount of ash contained in the paper P from the measurement results. Specifically, the light receiving unit 26 obtains the amount of moisture from the absorbance at a wavelength of 1940 [nm] and the amount of ash from the absorbance at a wavelength of 2300 [nm] using a conversion table stored in advance.

[0045] Furthermore, in step S300, the oscillator 32 of the ultrasonic device 30 shown in FIG.

[0046] Also, in step S400, the receiving unit 36 ​​receives the ultrasonic waves that have attenuated after passing through the paper P, and measures the attenuation rate of the ultrasonic waves. Furthermore, the receiving unit 36 ​​obtains the amplitude of the ultrasonic waves that have passed through the paper P, using the attenuation rate of the ultrasonic waves and the distance (d in FIG. 4) between the oscillator 32 and the receiving unit 36. Furthermore, the receiving unit 36 ​​obtains the basis weight of the paper P from the amplitude of the ultrasonic waves that have passed through the paper P, using a conversion table stored in advance.

[0047] Furthermore, in step S500, a voltage is applied to the coil portion 46a by the power supply 46b of the electromagnetic induction portion 42 disposed at the separated position shown in Fig. 6(A). This generates a magnetic field (see the dashed line in the figure) around the magnetic core 44. Furthermore, the moving portion 54 moves the electromagnetic induction portion 42 disposed at the separated position to the close position as shown in Figs. 6(A) and 6(B).

[0048] This causes a change in the voltage of the current flowing through the coil portion 48a due to fluctuations in the magnetic field generated around the magnetic core 44. The change in the voltage of the current flowing through the coil portion 48a is measured by the voltmeter 48b.

[0049] Furthermore, in step S600, the derivation unit 90 derives the thickness of the paper P from the change in voltage measured by the voltmeter 48b. Specifically, the derivation unit 90 derives the thickness of the paper P from the amount of change in voltage using a pre-stored conversion table.

[0050] In step S700, the deriving unit 90 derives the bending stiffness of the paper sheet P from the moisture content, ash content, basis weight, and thickness of the paper sheet P.

[0051] Specifically, the derivation unit 90 derives the bending rigidity of the paper P by substituting each value into the following equations (1) to (4). Note that a, b, and c are constants obtained from the value of the bending rigidity of the paper P measured by a conventional measuring device. Specifically, multiple types of paper P are cut, and the cut paper P is attached to a conventional measuring device to measure the bending rigidity. Furthermore, the moisture content, ash content, basis weight, and thickness of the paper P whose bending rigidity has been measured are obtained using the procedure described above. Then, the value of the bending rigidity measured by the conventional measuring device and the obtained moisture content, ash content, basis weight, and thickness are respectively substituted into equation (4). The values ​​of a, b, and c are then obtained. Equation (4) is an example of equation (Z).

[0052] As a conventional measuring device, a bending stiffness tester No. 2048-BF manufactured by Kumagai Riki Kogyo Co., Ltd. was used.

[0053] Basis weight [g / m 2 ) ÷ Thickness (m) = Density (1) Moisture content [g / m 2 ] ÷ Basis weight [g / m 2 ]=moisture content································· Formula (2) Ash content〔g / m 2 ] ÷ Basis weight [g / m 2 ] = ash content...Equation (3) Thickness 3 ×(a×density+b×moisture content+c×ash content)=bending rigidity...Equation (4)

[0054] In this way, in formula (4), "a × density + b × moisture content + c × ash content" is used as Young's modulus. This is based on the idea that the density, moisture content, and ash content of paper P contribute to the Young's modulus of paper P.

[0055] (Comparison with a bending stiffness measuring device according to a comparative embodiment) Next, the bending stiffness of the paper P derived by the bending stiffness measuring device of the first comparative embodiment, the bending stiffness of the paper P derived by the bending stiffness measuring device of the second comparative embodiment, and the bending stiffness of the paper P derived by the bending stiffness measuring device 10 of this first embodiment are compared.

[0056] [First comparative example of bending stiffness measuring device] First, we will explain the bending stiffness of the paper P derived by the bending stiffness measuring device of the first comparative embodiment. The bending stiffness measuring device of the first comparative embodiment derives the bending stiffness from only the thickness of the paper P. In other words, the bending stiffness of the paper P is derived by setting the constants a, b, and c in the above-mentioned equation (4) to 0.

[0057] 9(A) shows the bending stiffness of paper P calculated by the bending stiffness measuring device of the first comparative embodiment in the form of a scatter diagram graph. The horizontal axis represents the true value of bending stiffness, and the vertical axis represents the value of bending stiffness calculated by the bending stiffness measuring device of the first comparative embodiment. Note that the true value of bending stiffness on the horizontal axis is the value of bending stiffness of paper P measured by a conventional measuring device.

[0058] The bending stiffness of the paper P calculated by the bending stiffness measuring device of the first comparative embodiment varies greatly from the regression line, as shown in FIG. 9(A).

[0059] [Second comparative example of bending stiffness measuring device] Next, we will explain the bending stiffness of the paper P derived by the bending stiffness measuring device of the second comparative embodiment. The bending stiffness measuring device of the second comparative embodiment derives the bending stiffness from only the thickness, basis weight, and moisture content of the paper P. In other words, the bending stiffness is derived by setting c in the above-mentioned equation (4) to 0.

[0060] 9(B) shows the bending stiffness of the paper P calculated by the bending stiffness measuring device according to the second comparative embodiment in a scatter diagram graph. The horizontal axis represents the true value of the bending stiffness, and the vertical axis represents the value of the bending stiffness calculated by the bending stiffness measuring device according to the second comparative embodiment.

[0061] As shown in FIG. 9B, the bending stiffness of the paper P calculated by the bending stiffness measuring device of the second comparative embodiment varies with respect to the regression line.

[0062] [Bending stiffness measuring device 10 of the first embodiment] Next, we will explain the bending stiffness of the paper P calculated by the bending stiffness measuring device 10 of the first embodiment. As described above, the bending stiffness measuring device 10 of the first embodiment calculates the bending stiffness from the thickness, basis weight, moisture content, and ash content of the paper P.

[0063] 9(C) shows a scatter diagram graph of the bending stiffness of the paper P calculated by the bending stiffness measuring device 10 according to the first embodiment. The horizontal axis represents the true value of the bending stiffness, and the vertical axis represents the value of the bending stiffness calculated by the bending stiffness measuring device 10.

[0064] As shown in Figure 9(C), the bending stiffness of paper P derived by the bending stiffness measuring device 10 has less variation with respect to the regression line compared to the bending stiffness derived by the bending stiffness measuring devices of the first and second comparative forms.

[0065] (summary) As described above, in the bending stiffness measuring device 10, the bending stiffness of the paper sheet P is measured without processing the paper sheet P into a predetermined size.

[0066] Furthermore, the bending stiffness measuring device 10 measures the bending stiffness of the paper P without processing the paper P, thereby deriving the bending stiffness of the paper P immediately before forming an image on the paper P. Furthermore, by deriving the bending stiffness of the paper P immediately before forming an image on the paper P, it can be utilized in controlling printing conditions and design tests, and reflected in highly reliable designs.

[0067] Furthermore, the bending stiffness measuring device 10 obtains the basis weight of the paper P from the amplitude of the ultrasonic waves that have passed through the paper P. This improves the accuracy of the derived bending stiffness of the paper P compared to when a catalog value is used as the basis weight of the paper P.

[0068] In addition, in the bending stiffness measuring device 10, the spectroscopic device 20, the ultrasonic device 30, and the electromagnetic induction device 40 are aligned horizontally so that each parameter of the paper P can be measured at that position. This allows the basis weight, thickness, moisture content, and ash content of the paper P to be measured without moving each device.

[0069] Furthermore, the bending stiffness measuring device 10 derives the bending stiffness of the paper P from the thickness, basis weight, moisture content, and ash content of the paper P. Therefore, the accuracy of the derived bending stiffness is improved compared to when the bending stiffness of the paper P is derived using the bending stiffness measuring devices of the first and second comparative embodiments.

[0070] Second Embodiment An example of a bending stiffness measuring device according to a second embodiment of the present invention will be described with reference to Figures 10 and 11. Note that the second embodiment will be described mainly in terms of the differences from the first embodiment.

[0071] 10, bending stiffness measuring device 110 of the second embodiment includes device main body 110a, spectroscopic device 20, input unit 130 that allows the user to input the basis weight of paper P, and input unit 140 that allows the user to input the thickness of paper P. Furthermore, bending stiffness measuring device 110 includes mounting unit 60 to which paper P is attached, control unit 180 that controls spectroscopic device 20, and derivation unit 190 that derives the bending stiffness of paper P. Input unit 130 is an example of an acquisition unit, and input unit 140 is an example of another acquisition unit.

[0072] [Control unit 180, derivation unit 190] 11, the control unit 180 controls the spectroscopic device 20. The derivation unit 190 derives the bending stiffness of the paper P using the basis weight input to the input unit 130, the thickness input to the input unit 140, and the moisture content and ash content acquired by the light receiving unit 26 of the spectroscopic device 20.

[0073] The control unit 180 includes a CPU (Central Processing Unit), a ROM (Read Only Memory), a RAM (Random Access Memory), a storage, and a communication interface (I / F). Each component is connected to each other via a bus so that they can communicate with each other.

[0074] [Action, Summary] As described above, bending stiffness measuring device 110 does not use an ultrasonic device or an electromagnetic induction device, and therefore the device can be made smaller than when an ultrasonic device or an electromagnetic induction device is used.

[0075] Other functions are the same as those that occur when the bending stiffness measuring device 10 of the first embodiment includes the ultrasonic device 30 and the electromagnetic induction device 40.

[0076] <Third embodiment> An example of a bending stiffness measuring device according to a third embodiment of the present invention will be described with reference to Figures 12 and 13. Note that the third embodiment will be described mainly in terms of the differences from the first embodiment.

[0077] 12, bending stiffness measuring device 210 of the third embodiment includes device main body 210a, spectrometer 20, ultrasonic device 30, and electromagnetic induction device 40. Furthermore, bending stiffness measuring device 210 includes transport unit 260 that transports attached paper P, control unit 280 that controls each device, and deriving unit 90 that derives the bending stiffness of paper P.

[0078] [Transportation section 260] As shown in FIG. 12, the conveying section 260 includes a sending section 262 arranged on one side of the spectroscopic device 20, the ultrasonic device 30, and the electromagnetic induction device 40 in the device width direction, and a receiving section 268 arranged on the other side.

[0079] The sending section 262 includes a pair of roll sections 264 that sandwich the paper P so that the paper surface faces up and down. The receiving section 268 includes a pair of roll sections 272 that sandwich the paper P so that the paper surface faces up and down, and a drive section 274 that applies a rotational force to the roll sections 272.

[0080] [Control unit 280] The control unit 280 controls the drive unit 274 of the transport unit 260 as shown in FIG.

[0081] In this configuration, the control unit 280 controls the drive unit 274 to transport the paper P from one side to the other in the device width direction. Then, the portion of the paper P through which the near-infrared light emitted by the light-emitting unit 22 of the spectroscopic device 20 passes, the portion of the paper P through which the ultrasonic waves oscillated by the oscillator 32 of the ultrasonic device 30 pass, and the portion of the paper P adjacent to the electromagnetic induction unit 42 are made similar. Here, making the portions of the paper P similar means that the center of the ultrasonic waves passes within a circle with a radius of 20 mm centered on the portion of the paper P through which the near-infrared light emitted by the light-emitting unit 22 passes, and the center of the electromagnetic induction unit 42 is adjacent.

[0082] [Action, Summary] As described above, in the bending stiffness measuring device 210, the paper P is moved so that the portions of the paper P measured by each device are the same. This improves the accuracy of the derived bending stiffness of the paper P compared to when the portions of the paper P measured by each device are different.

[0083] Other operations are the same as those of the bending stiffness measuring device 10 of the first embodiment.

[0084] Although the present invention has been described in detail with respect to a specific embodiment, it is clear to those skilled in the art that the present invention is not limited to such an embodiment and that various other embodiments are possible within the scope of the present invention. For example, in the first embodiment, the spectroscopic device 20, the ultrasonic device 30, and the electromagnetic induction device 40 measure the parameters of the paper P in this order, but they may be measured in a different order.

[0085] Furthermore, in the first embodiment, the spectroscopic device 20, the ultrasonic device 30, and the electromagnetic induction device 40 measure the parameters of the paper P in this order, but each device may measure the paper P at the same time. This shortens the time required to derive the bending stiffness from measuring the parameters of the paper P compared to when each device measures the parameters of the paper P in order.

[0086] In the second embodiment, the bending stiffness measuring device 110 obtains the basis weight from the basis weight input to the input unit 130, and obtains the thickness of the paper P from the thickness input to the input unit 140. However, for example, the user may input the product number of the paper P to the bending stiffness measuring device, which may then obtain the basis weight and thickness of the paper P.

[0087] In the second embodiment, the bending stiffness measuring device 110 obtains the basis weight from the basis weight input to the input unit 130, and obtains the thickness of the paper P from the thickness input to the input unit 140. However, for example, the bending stiffness measuring device may obtain the basis weight and thickness of the paper P through communication or the like.

[0088] Furthermore, in the above third embodiment, the paper P was moved relative to the spectroscopic device 20, the ultrasonic device 30, and the electromagnetic induction device 40, but the spectroscopic device 20, the ultrasonic device 30, and the electromagnetic induction device 40 may be moved relative to the paper P, or both the paper P and the spectroscopic device 20, the ultrasonic device 30, and the electromagnetic induction device 40 may be moved.

[0089] In addition, in the above-described embodiments, the lead-out units 90 and 190 are provided separately from the control units 80, 180 and 280, but the lead-out units may be provided within the control units.

[0090] Furthermore, in the above embodiment, the light emitting unit 22 of the spectrometer 20 emits near-infrared light, but it is sufficient that the light emitting unit 22 emits near-infrared light, and may also emit light of other wavelengths. [Explanation of symbols]

[0091] 10. Bending stiffness measuring device 10a Device body 20 Spectrometer 22 Light-emitting part 26 Light receiving part 30 Ultrasonic device 32 Oscillator 36 Receiver section 40 Electromagnetic induction device 42 Electromagnetic induction section 80 Control Unit 90 Derivation part 110 Bending stiffness measuring device 110a Device body 130 input unit (an example of an acquisition unit) 140 Input unit (an example of another acquisition unit) 180 Control Unit 190 Derivation part 210 Bending stiffness measuring device 210a Device body 280 Control Unit

Claims

1. an ultrasonic device having an oscillator that emits ultrasonic waves toward the paper and an oscillator that receives the ultrasonic waves that have passed through the paper; an electromagnetic induction device having an electromagnetic induction unit that generates electromagnetic induction on the paper; a near-infrared spectroscopic device having a light-emitting unit that emits near-infrared light toward the paper and a light-receiving unit that receives the near-infrared light that has passed through the paper; a derivation unit that derives the bending stiffness of the paper using the measurement results of the ultrasonic device, the measurement results of the electromagnetic induction device obtained by moving the electromagnetic induction unit close to and away from the paper, and the measurement results of the near-infrared spectrometer, The derivation unit uses the basis weight of the paper obtained from the measurement results of the ultrasonic device, the thickness of the paper obtained from the measurement results of the electromagnetic induction device, and the moisture content and ash content of the paper obtained from the measurement results of the near-infrared spectrometer, When the bending stiffness of the paper is K, the thickness of the paper is T, the basis weight of the paper is B, the moisture content of the paper is W, the ash content of the paper is A, and a, b, and c are predetermined constants, the deriving unit derives the bending stiffness of the paper using the following formula: Bending stiffness measuring device. K=T 3 × (a・B / T+b・W / B+c・A / B)・・・(Z)

2. The ultrasonic device, the electromagnetic induction device, and the near-infrared spectroscopy device are arranged to face the paper attached to the device body. The bending stiffness measuring device according to claim 1 .

3. An acquisition unit that acquires the basis weight of paper; Another acquisition unit that acquires the thickness of the paper; a near-infrared spectroscopic device having a light-emitting unit that emits near-infrared light toward the paper and a light-receiving unit that receives the near-infrared light that has passed through the paper; a derivation unit that derives bending stiffness of the paper using the basis weight of the paper acquired by the acquisition unit, the thickness of the paper acquired by the other acquisition unit, and the measurement results of the near-infrared spectrometer, The derivation unit uses the basis weight of the paper, the thickness of the paper, and the moisture content and ash content of the paper acquired from the measurement results of the near-infrared spectrometer, When the bending stiffness of the paper is K, the thickness of the paper is T, the basis weight of the paper is B, the moisture content of the paper is W, the ash content of the paper is A, and a, b, and c are predetermined constants, the deriving unit derives the bending stiffness of the paper using the following formula: Bending stiffness measuring device. K=T 3 × (a・B / T+b・W / B+c・A / B)・・・(Z)

Citation Information

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