Autosampler system with automated sample vessel cover removal and sample probe positioning

Abstract

Systems and methods for sample vessel cover removal and sample probe positioning are disclosed. In one example, an autosampler system includes a z-axis support rotatable about a z-axis of an autosampler deck, a sample probe support structure coupled to the z-axis support, the sample probe support structure configured to hold a sample probe for retrieving a fluid-containing sample held in a sample vessel supported by the autosampler deck, and a sample cap remover coupled to the z-axis support in an orientation rotationally offset from the z-axis relative to the sample probe support structure, the sample cap remover configured to lift a cap from a sample vessel to enable access to the interior of the sample vessel by a sample probe supported on the sample probe support structure.

Description

[Technical Field]

[0001] [CROSS-REFERENCE TO RELATED APPLICATIONS] This application is a continuation-in-part under 35 U.S.C. 35 §120 of U.S. Application No. 17 / 208,136, filed March 22, 2021, entitled "AUTOSAMPLER RAIL SYSTEM WITH MAGNETIC COUPLING FOR LINEAR MOTION," which claims the benefit under 35 U.S.C. 35 §119(e) of U.S. Provisional Application No. 62 / 992,334, filed March 20, 2020, entitled "AUTOSAMPLER RAIL SYSTEM WITH MAGNETIC COUPLING FOR LINEAR MOTION." This application also claims the benefit under 35 U.S.C. 35 §119(e) of U.S. Provisional Application No. 63 / 057,441, filed July 28, 2020, entitled "AUTOSAMPLER SYSTEM WITH AUTOMATED SAMPLE CONTAINER COVER REMOVAL AND SAMPLE PROBE POSITIONING." US Provisional Application Nos. 62 / 992,334 and 63 / 057,441, and US Application No. 17 / 208,136 are each incorporated herein by reference in their entirety. [Background technology]

[0002] In many laboratory environments, it is often necessary to analyze numerous chemical or biochemical samples located in individual sample containers. To streamline this process, sample manipulation is mechanized. This type of mechanized sampling is commonly referred to as autosampling and is performed using an automated sampling device, or autosampler. Summary of the Invention

[0003] An automated sampling device, or autosampler, can support a sample probe on a vertically extending rod, which moves the sample probe along or across one or more directions of movement. For example, the sample probe may be coupled to a vertically movable portion of the rod by a probe support arm (sample probe support structure) or other device that moves the probe vertically, thereby positioning the probe in and out of sample vessels (e.g., tubes or other vessels), wash vessels, standard chemical vessels, diluent vessels, etc. on the deck of the autosampler. In other situations, the rod may be rotated to facilitate movement of the probe in a horizontal plane, such as to position the probe over other sample vessels and other vessels disposed on the deck.

[0004] Autosamplers are used to automate the handling of multiple samples stored in sample containers, such as sample vials, sample tubes, and microtiter wells. When the system is programmed to introduce a sample probe into the sample containers, the sample containers may be supported by a sample rack on the autosampler deck, making various sample containers available to the sample probe. Autosamplers may include multiple metallic mechanical or structural parts that move relative to one another to facilitate one or more movements of the probe. As these parts begin to wear (e.g., through repeated friction-based interactions), metal particles can be released onto the autosampler deck or into containers positioned around the probe arm. For example, metal particles can be deposited directly within sample containers, on the probe, or in other containers used in the sample preparation process (e.g., wash containers, standard chemical containers, diluent containers, etc.), thereby introducing contaminants into samples or other fluids. Such contaminants can be detected by analytical instruments and can distort analytical measurements of samples or other fluids by providing unreliable or inaccurate data. Additionally, metallic mechanical and structural components may be exposed to harsh chemicals present on the autosampler deck, such as corrosive acids, which may promote the release of metal particles through the normal operation of the autosampler.

[0005] Holding samples awaiting processing by an autosampler can have potential negative consequences, such as sample loss, contamination risks, or other accuracy risks. The length of time a given sample is held in a sample container typically depends on the time required for the sample handling system to analyze all samples scheduled prior to the given sample. If the sample container is open to the surrounding environment (e.g., open-top), a particular sample may be adversely affected while awaiting analysis. For example, portions of the sample may evaporate or be lost to the surrounding environment. Contaminants may be introduced into the sample container through the opening. Different sample portions may chemically react, forming precipitates in parts of the system or in other sample containers. Alternatively, other results may adversely affect the accuracy of the analysis of the sample's composition. The effects of evaporation can particularly affect small samples, and even small losses of solvent or other liquid portions can result in significant variations in analytical precision.

[0006] Thus, systems and methods are disclosed for handling samples held in closed sample vessels by automatically removing the caps of the sample vessels and positioning a sample probe. In one embodiment, an autosampler system includes an automated sample cap remover and a probe support arm, configured to position the sample cap remover over the sample cap, temporarily or permanently remove the sample cap from the sample vessel, and position a sample probe held by the probe support arm within the sample vessel to retrieve (extract) a fluid-containing sample. The sample cap remover may be supported by a z-axis support that moves along a channel in the autosampler deck, thereby providing movement along the z-axis and rotational movement along the x-y plane. In an embodiment, the z-axis support is coupled to each of the sample cap remover and the probe support arm. For example, the sample cap remover may be rotationally offset from the probe support arm along the x-y plane so that when the sample cap remover supports a sample cap removed from a sample vessel, the sample cap does not intersect with the vertical axis of the sample probe (e.g., to avoid interfering with insertion of the sample probe into the sample vessel). Other configurations are contemplated, such as having the sample cap remover and sample probe aligned substantially vertically.

[0007] Systems and methods for preventing the release of metal particles from an autosampler that may be detected in a sample during sample analysis are also disclosed. In one embodiment, the system includes an inner shuttle magnetically coupled to an outer shuttle configured to support a sample probe. The inner shuttle is enclosed within a tube formed or coated with a chemically inert material (e.g., a fluoropolymer), and the outer shuttle is formed or coated with a chemically inert material (e.g., a fluoropolymer) to prevent exposure of the metal features to the external environment during operation of the autosampler. The inner shuttle moves within the tube, and this motion is transferred (transduced) via magnetic coupling to the outer shuttle and then to the probe support structure. In some embodiments, the tube has surface features (e.g., splines) on its outer periphery, and the outer shuttle has corresponding features on its inner periphery. The surface features of the tube and outer shuttle interact to transfer (transduce) rotational motion of the tube to the outer shuttle, which in turn is transferred (transduced) to the probe support structure. The autosampler facilitates multi-plane movement of the sample probe without the risk of exposing metal particles to sample vessels or other vessels placed on the deck of the autosampler.

[0008] In one aspect, the autosampler includes, but is not limited to, a z-axis support rotatable about the z-axis of the autosampler deck, a sample probe support structure coupled to the z-axis support, the sample probe support structure configured to hold a sample probe for recovering (extracting) a fluid-containing sample held in a sample vessel supported by the autosampler deck, and a sample cap remover coupled to the z-axis support in an orientation that is rotationally offset from the z-axis relative to the sample probe support structure, the sample cap remover configured to lift a cap from the sample vessel to enable access (reach) to the interior of the sample vessel by the sample probe supported on the sample probe support structure.

[0009] In one aspect, an autosampler system includes, but is not limited to, a z-axis support rotatable about the z-axis of an autosampler deck; a sample probe support structure coupled to the z-axis support, the sample probe support structure configured to hold a sample probe for recovering (extracting) a fluid-containing sample held in a sample vessel supported by the autosampler deck; and a sample cap remover coupled to the z-axis support, the sample cap remover including a clamp portion configured to engage with the outer peripheral surface of the z-axis support, a cover portion configured to cover at least a portion of the clamp portion, and a cap remover support arm extending from the cover portion, the cap remover support arm being rotationally offset and angled from the sample probe support structure in the x-y plane, the sample cap remover configured to lift a cap from the sample vessel to enable access to the interior of the sample vessel by the sample probe supported on the sample probe support structure. [Brief explanation of the drawings]

[0010] The detailed description will now be given with reference to the accompanying drawings, in which: In the following description and drawings, the use of the same reference numerals in different embodiments may indicate similar or identical items (elements).

[0011] [Figure 1A] FIG. 1 is an isometric view of an autosampler probe rail system for preventing metal particles that may be detected in a sample during sample analysis from being released from an autosampler, according to an exemplary embodiment of the present disclosure. [Figure 1B] FIG. 1B is an isometric view of the autosampler probe rail system of FIG. 1A with the autosampler support arm moved to a lower position along the z-axis. [Figure 1C]FIG. 1B is an isometric view of the autosampler probe rail system of FIG. 1A with the support arm rotated about the z-axis. [Figure 2] FIG. 1B is a cross-sectional side view of a portion of the autosampler probe rail system of FIG. 1A. [Figure 3] FIG. 1B is a partial isometric view showing the inner shuttle of the autosampler probe rail system of FIG. 1A. [Figure 4] 1B is a partial cross-sectional isometric view of the autosampler probe rail system of FIG. 1A showing magnets supported on the inner shuttle and magnets supported on the outer shuttle. FIG. [Figure 5] 1B is a partial cross-sectional side view of the autosampler probe rail system of FIG. 1A and the associated drive system. FIG. [Figure 6] FIG. 1B is a plan view of the autosampler probe rail system of FIG. 1A. [Figure 7] FIG. 1B is an isometric view of the support arm of the autosampler probe rail system of FIG. 1A. [Figure 8] FIG. 1B is a partial isometric view of the outer shuttle of the autosampler probe rail system of FIG. 1A according to an exemplary embodiment of the present disclosure. [Figure 9] FIG. 1 is an isometric view of an autosampler system with automated sample container cover removal and sample probe positioning according to an exemplary embodiment of the present disclosure. [Figure 10A] FIG. 10 is a plan view of the autosampler system of FIG. [Figure 10B] A schematic diagram showing multiple rails for positioning a sample probe and / or a container cover positioning element in an autosampler system in which sample container cover removal and sample probe positioning are automated, according to an exemplary embodiment of the present disclosure. [Figure 11] FIG. 10 is an isometric cross-sectional view of a sample cap remover of the autosampler system of FIG. 9 according to an exemplary embodiment of the present disclosure. [Figure 12A]FIG. 10 illustrates the autosampler system of FIG. 9 with a cover positioning tool positioned over a covered sample container, according to an exemplary embodiment of the present disclosure. [Figure 12B] FIG. 1 is a diagram of the autosampler system showing the cover positioning tool removing the cover from the sample vessel. [Figure 12C] FIG. 10 is a diagram of the autosampler system showing the cover positioning tool moving the cover off the vertical axis of the sample probe and the sample probe being introduced into the interior of the sample container. [Figure 12D] FIG. 10 is a diagram of the autosampler system showing the cover positioning tool positioned over a second covered sample vessel. DETAILED DESCRIPTION OF THE INVENTION

[0012] 1A-8, an autosampler probe rail system ("system 100") according to one embodiment of the present disclosure is shown. System 100 is intended to prevent metal particles from being released from an autosampler that would otherwise be detected in a sample during sample analysis. System 100 generally includes a probe support arm 102, an outer shuttle 104, an inner shuttle 106, and a z-axis support 108. The probe support arm (sample probe support structure) 102, the outer shuttle 104, and the z-axis support 108 each have a structure formed from or coated with a chemically inert material to prevent exposure of metal components to the environment external to system 100. This can prevent, for example, the introduction of metal contaminants into a sample container or other fluid container adjacent to the autosampler. For example, the chemically inert material can include, but is not limited to, a fluoropolymer, such as polytetrafluoroethylene (PTFE).

[0013] The probe support arm 102 includes a probe support 110. The probe support 110 holds a sample probe and associated tubing for drawing fluid from or introducing fluid into a sample vessel located adjacent to the system 100, such as on the deck of an autosampler system. The probe support arm 102 is coupled to the outer shuttle 104 (e.g., via a friction fit, a snap fit, or the like). At this coupling, the probe support arm 102 and the outer shuttle 104 each define an opening into which the upper portion 112 of the z-axis support 108 fits, thereby coupling the probe support arm 102 and the outer shuttle 104 to the z-axis support 108. For example, the upper portion 112 of the z-axis support 108 has a generally circular shape corresponding to the generally circular openings in the probe support arm 102 and the outer shuttle 104. Note that although a generally circular shape is shown here, any other shape may be utilized in the system 100, including, for example, a rectangular, triangular, irregular, or other shape. The probe support arm 102 may be held in place relative to the z-axis support 108 by a friction fit between the respective structures and a magnetic coupling between an outer shuttle 104 and an inner shuttle 106 disposed within the z-axis support 108. In embodiments, the probe support arm 102 and the outer shuttle 104, or portions thereof, may be formed as a unitary structure.

[0014] System 100 controls the positioning of a sample probe held on probe support arm 102 through controlled positioning of outer shuttle 104 and rotation of z-axis support 108. For example, FIG. 1B shows movement of outer shuttle 104 along z-axis support 108 (e.g., along z-axis 114). This movement of outer shuttle 104 moves probe support arm 102 through interaction between outer shuttle 104 and inner shuttle 106. FIG. 1C shows rotational movement of probe support arm 102 due to rotation of z-axis support 108, as described further herein.

[0015] Referring to FIG. 2, a cross-section of a system 100 according to an embodiment of the present disclosure is shown. As shown, the z-axis support 108 includes an outer tube 200 defining an interior space 202. The inner shuttle 106 is configured to affect vertical movement of the outer shuttle 104 by passing through the interior space 202. The system 100 can move the inner shuttle 106 within the tube 200 via various mechanisms, including, but not limited to, a linear actuator (e.g., a pneumatic actuator) with a push rod, a splined screw rail, or a combination thereof. In the illustrated example, the system 100 includes a splined screw rail 204 (e.g., as seen in FIGS. 2-5 ). The splined screw rail 204 includes a screw 206 disposed along the z-axis 114 and a structural rail 208 disposed around a portion of the screw 206. The structural rail 208 is fixedly attached to a base, and the screw 206 is rotatably coupled within the tube 200. For example, the system 100 may include a first drive (e.g., a pulley drive 500 shown in FIG. 5 ) that guides rotational movement of the screw 206 within the tube 200. The inner shuttle 106 has corresponding threads on its inner circumferential surface that mesh with the threads of the screw 206. When the screw 206 is rotationally driven, the inner shuttle 106 is moved vertically along the z-axis 114 within the tube 200 (e.g., through the interior space 202) via the interaction between the corresponding threads. Alternatively or additionally, the system 100 includes a pneumatic actuator for pushing the inner shuttle 106 vertically within the interior space 202. In some embodiments, the inner shuttle 106 defines one or more openings that correspond to the shape of the structural rails 208, allowing the structural rails 208 to pass through the openings in the inner shuttle 106 as the inner shuttle 106 is moved within the tube 200. For example, the inner shuttle 106 has a "C" shaped opening that fits over a "C" shaped structural rail 208, such as the embodiment shown in FIG.

[0016] The outer shuttle 104 and the inner shuttle 106 each have one or more magnets for magnetically coupling the shuttles to one another. As a result, when the inner shuttle 106 is driven along the z-axis 114 (e.g., by operation of the splined screw rail 204 and first drive unit, a pneumatic actuator, or the like), the outer shuttle 104 moves correspondingly vertically along the outer periphery of the z-axis support 108. For example, as shown, the inner shuttle 106 has two magnets 210 disposed within an outer structure 212 of the inner shuttle 106. The outer structure 212 may include, but is not limited to, a polyvinylidene fluoride (PVDF) material wrapped around a main structure 214 of the inner shuttle 106. In this embodiment, the main structure 214 has corresponding threads formed thereon to mate with the threads of the screw 206. In the illustrated example, the magnets 210 have a circular or ring-like shape with a central opening through which the structure of the splined screw rail 204 can pass. For example, the magnets 210 surround the z-axis 114 with the spline screw rails 204 passing through openings in the magnets 210. In the illustrated example, the inner shuttle 106 has spacer structures 216 positioned between the magnets 210. The outer structure 212 and the body structure 214 can compress each magnet 210 against the spacer structures 216 to control the separation (distance) between the magnets 210, e.g., to maintain a substantially uniform distance between the magnets 210 during operation of the system 100. The magnets 210 are aligned with like poles facing each other (e.g., with like poles facing (contacting) the spacer structures 216). For example, FIG. 2 shows the magnets 210 positioned with their north poles facing each other across the spacer structures 216 and their south poles pointing away from each other. Alternatively, the magnets 210 may be positioned with their south poles facing each other and their north poles pointing away from each other.

[0017] The outer shuttle 104 has corresponding magnets that interact with the magnets 210 of the inner shuttle 106. For example, as shown, the outer shuttle 104 has two corresponding magnets 218 held within a body structure 220. Similar to the inner shuttle 106, the outer shuttle 104 may have a spacer structure 222 disposed between the magnets 218 within the body structure 220. In this embodiment, the body structure 220 has an upper portion 224, a lower portion 226 coupled to the upper portion 224, and a cavity defined between the upper portion 224 and the lower portion 226 to accommodate the magnets 218 and the spacer structure 222. The upper portion 224 and the lower portion 226 may be secured to one another (e.g., by a snap fit) to position the magnets 218 relative to the spacer structure 222. The magnets 218 are aligned so that like poles face each other. The poles of the magnets 218 face the poles of the adjacent magnets 210 on the inner shuttle 106, and these facing poles are opposite to each other. For example, as shown in FIG. 2 , the north pole of the magnet 218 faces the south pole of the magnet 210 (e.g., across the tube 200), and the south pole of the magnet 218 faces the north pole of the magnet 210 (e.g., across the tube 200). With the opposite poles of the magnets 210 and 218 facing each other, a magnetic field couples the inner shuttle 106 to the outer shuttle 104, such that linear movement of the inner shuttle 106 causes corresponding linear movement of the outer shuttle 104. Note that in the illustrated example, the system 100 has two magnets for each of the outer shuttle 104 and the inner shuttle 106, but the system 100 is not limited to two magnets and may have fewer or more magnets for each shuttle (e.g., depending on the desired attractive force between the shuttles).

[0018] In this embodiment, the tube 200 has surface features formed on its outer periphery to facilitate rotational motion of the outer shuttle 104 when the tube 200 is rotated. For example, in the illustrated example, the tube 200 has a plurality of splines 300 oriented longitudinally along the outer periphery of the tube 200. The outer shuttle 104 has surface features on its inner periphery to interact with the surface features of the tube 200. For example, in the illustrated example, the outer shuttle 104 has corresponding splines 302 that fit into gaps between the splines 300 of the tube 200. The surface features of the tube 200 and the outer shuttle 104 interact to transfer (translate) the rotational motion of the tube 200 to the outer shuttle 104, which in turn transfers (translates) the rotational motion of the tube 200 to the probe support structure 102 to rotate the probe support arm 102 about the z-axis 114. In this embodiment, the tube 200 is rotated through operation of a second drive (e.g., pulley drive 502 shown in FIG. 5 ) to induce rotational motion of the tube 200. For example, the system 100 may include a bushing 504 coupled between a stationary drive base 506 and a rotary drive structure 508. The rotary drive structure 508 is coupled to the pulley drive 502 such that the tube 200 rotates about the z-axis 114 upon operation of the pulley drive 502. The tube 200 is coupled to the rotary drive structure 508 and rotates correspondingly with the rotary drive structure 508 upon operation of the pulley drive 502, thereby rotating the outer shuttle 104 through interaction of corresponding surface features (e.g., splines 300, 302), which in turn rotates the probe support structure 102.

[0019] The outer shuttle 104 may be placed on the z-axis support 108 by positioning the body structure 220 adjacent to the top 112 of the z-axis support 108. In this case, the end 228 of the body structure 220 housing the magnet 218 is positioned to correspond to the end 230 of the body structure 214 housing the magnet 210, thereby allowing the magnetic fields of the shuttles 104, 106 to interact with each other to magnetically couple the inner and outer shuttles 106, 104. The surface features of the outer shuttle 104 and the tube 200 (e.g., splines 302 and 300, respectively) allow the outer shuttle 104 to slide adjacent to one another such that the outer shuttle 104 is positioned below the z-axis support 108 until the magnet 218 couples to the magnet 210. In this embodiment, the system 100 includes a key structure for orienting the probe support structure 102 when mounted on the z-axis support 108, thereby providing a specific position for a probe held by the probe support structure 102, for example, for purposes of intermittent positioning via rotation of the tube 200. For example, in the example of FIG. 6 , the tube 200 is provided with a key structure 600 (e.g., a spline having a larger cross-section than the other splines 300), and the outer shuttle 104 is provided with a corresponding key structure 602 (e.g., an opening for receiving the key structure 600). The probe support structure 102 and the outer shuttle 104 also include corresponding key structures for providing a desired orientation of the probe support structure 102 relative to the tube 200. For example, in the illustrated example, the outer shuttle 104 includes a key structure 604, and the probe support structure 102 includes a corresponding key structure 606 (e.g., an opening for receiving the key structure 604). In this embodiment, the probe support structure 102 is removably coupled to the outer shuttle 104 such that another probe support structure 102 can be coupled to the outer shuttle 104. Alternatively or additionally, different outer shuttles may be disposed on the z-axis support 108 to accommodate different styles of probe support structures on the z-axis support (e.g., to facilitate septum-piercing probes, etc.).

[0020] 9-12D, system 100 includes an example configuration for processing a sample held in a closed sample container by automatically removing the cap of the sample container and positioning a sample probe to remove the sample from the sample container following cap removal, cap replacement, or cap reconfiguration. System 100 generally includes a z-axis support 900, a probe support arm (sample probe support structure) 902, and a sample cap remover 904. The system 100 coordinates the respective movements of the z-axis support 900, the sample cap remover 904, and the sample probe 906 held by the probe support arm 902 to position the sample cap remover 904 over a particular sample vessel having a cap (e.g., positioned on the deck 908 of the system 100) or other structure enclosing the sample within the sample vessel, remove the cap or otherwise modify the cap to allow access by the sample probe, introduce the sample probe into the interior of the sample to remove the sample, optionally replace the cap on the sample vessel, reposition the sample cap remover 904 to another sample vessel, and repeat the cap removal and sample removal procedure. For example, the sample cap remover 904 may comprise, but is not limited to, vacuum tweezers for removing the cap with vacuum pressure, a rotary gripping structure (e.g., for rotating the cap around the threads of the vessel), a rotary positioning mechanism (e.g., for repositioning the cap off the z-axis), a prong or forceps structure (e.g., for friction fitting around the periphery of the cap), or the like, or combinations thereof. An example process for removing and repositioning a sample cap for access to the interior of a sample vessel by the sample probe 906 is further described herein with reference to Figures 12A-12D.In the example, the z-axis support 900 and the probe support arm 902 correspond to the z-axis support 108 and the probe support arm 102 (e.g., to facilitate prevention of metal particle contamination), but the present disclosure is not limited to such a configuration, and the system 100 may include other configurations and structures of the z-axis support 900 and the probe support arm 902.

[0021] 9 and 10A, the probe support arm 902 and the sample cap remover 904 are supported on the same z-axis support 900 and can translate on the autosampler deck 908 via a channel 910 and rotate about the z-axis via motorized movement. In this example, the probe support arm 902 and the sample cap remover 904 are arranged in one or more non-parallel orientations, with the probe support arm 902 and the sample cap remover 904 rotationally offset from one another. For example, the probe support arm 902 and the sample cap remover 904 can be offset from one another along the xy plane by an angle (denoted as α in FIG. 10A). The angle can be selected based on the size of the cap to be removed by the sample cap remover 904. Thus, for example, when a cap is removed from a sample container, the z-axis support 900 is rotated about the z-axis to shift the cap along the x-y plane and position the sample probe 906 over the open end of the sample container with the cap positioned so that it does not intersect the vertical axis of the sample probe (e.g., so as not to interfere with the insertion of the sample probe into the sample container). In this embodiment, the angle from the z-axis in the x-y plane may be between about 5 degrees and about 90 degrees. For example, the angle from the z-axis in the x-y plane may be between about 10 degrees and about 35 degrees. A smaller angle may reduce the time it takes the system 100 to process a given sample, for example, by reducing the movements required to position the probe support arm 902 and the sample cap remover 904.

[0022] Instead of using a single z-axis support, the probe support arm 902 and the sample cap remover 904 may be supported on separate z-axis supports 900. For example, referring to FIG. 10B , the probe support arm 902 is supported by a first z-axis support 900A, and the sample cap remover 904 is supported by a second z-axis support 900B, facilitating uncapping of sample supports on a first portion 1000 of the deck 908. The first z-axis support 900A translates along a first channel 910A and rotates about its z-axis to position a sample probe over a sample vessel held on the first portion 1000 of the deck 908. The second z-axis support 900B translates along the second channel 910B and rotates about its z-axis to position the sample cap remover 904B over a sample vessel held on the first portion 1000 of the deck 908. In the illustrated example, a third z-axis support 900C is also provided. The third z-axis support 900C provides another sample cap remover 904C for facilitating the removal of caps from samples supported on the second portion 1002 of the deck 908. The third z-axis support 900C positions the sample cap remover 904C over a sample vessel held on the second portion 1002 of the deck 908 by translational movement along the third channel 910C and rotation about the z-axis of the third z-axis support 900C. In this embodiment, the second z-axis support 900B can rotate the probe support arm 902 completely around the z-axis to provide access by the sample probe 906, or by another part of the system 100, to sample vessels whose caps have been removed by the sample cap removers 904B, 904C.

[0023] 11 , in the illustrated embodiment, the sample cap remover 904 includes a vacuum tweezer structure 1100 supported by a cap remover support arm 1102. The cap remover support arm 1102 secures the vacuum tweezer structure 1100 relative to the z-axis support 900. The sample cap remover 904 may include a clamping portion 1104 that provides a friction fit around the outer periphery of the z-axis support 900 (e.g., via a clamp fastener 1106), thereby resisting vertical movement of the clamping portion 1104 on or rotational movement about the z-axis support 900. Rotational movement of the z-axis support 900 about the z-axis and translational movement along the channel 910 are transferred to the clamping portion 1104 via the connection between the clamping portion 1104 and the z-axis support 900. The sample cap remover 904 may also include a cover portion 1108 configured to cover at least a portion of the clamp portion 1104 (e.g., to prevent exposure of the clamp portion 1104 to an environment external to the system 100). The cap remover support arm 1102 extends from the cover portion 1108, thereby positioning the vacuum tweezer structure 1100 substantially distal from the clamp portion 1104 when the cover portion 1108 is positioned on the clamp portion 1104. In this embodiment, the cover portion 1108 rests on the clamp portion 1104 (e.g., a top of the cover portion 1108 is engageable with a top of the clamp portion 1104) while allowing vertical movement of the cover portion 1108 relative to the clamp portion 1104. This facilitates vertical removal of caps from respective sample vessels (e.g., during operation of the vacuum tweezer structure 1100 as described herein).

[0024] The sample cap remover 904 may be provided with one or more spaces through which a fluid tube can pass to introduce vacuum pressure, fluid pressure, or a combination thereof (which may be provided, for example, by the system 100 or external to the system) to portions of the sample cap remover 904. In this embodiment, the sample cap remover 904 is provided with a channel 1110 that runs through the cap remover support arm 1102. The channel 1110 couples to a vacuum tweezer port (vacuum port) 1112 of the vacuum tweezer structure 1100 to hold a vacuum line for supplying vacuum to the vacuum tweezer structure 1100 through the sample cap remover 904. The vacuum tweezer structure 1100 can then interact with (engage with) a cap held on a sample container, for example, by applying a vacuum to the vacuum tweezer port 1112 to remove the cap and then stopping the vacuum applied to the vacuum tweezer port 1112 to reposition the cap. In this embodiment, the sample cap remover (sample cover remover) 904 has a channel 1114 between the clamp portion 1104 and the cover portion 1108, the channel 1114 communicating with the channel 1110. As a result, the sample cap remover (sample cover remover) 904 supplies a vacuum line passing through the sample cap remover (sample cover remover) 904 to the vacuum tweezer structure 1100 via the channels 1110 and 1114. Alternatively or additionally, the sample cap remover 904 can hold the vacuum line, the fluid line, or a combination thereof within different portions of the body of the sample cap remover 904, on the surface of the sample cap remover, or a combination thereof.

[0025] In this embodiment, the sample cap remover 904 is provided with space for introducing one or more fluid lines that introduce pressurized fluid to the sample cap remover 904 for vertical movement of the cover portion 1108 relative to the clamp portion 1104. This facilitates removal and replacement of caps on sample vessels. For example, the sample cap remover 904 may be provided with a channel 1116 (e.g., through or defined by the clamp portion 1104). The channel 1116 introduces a fluid line through the sample cap remover 904 to a piston port 1118 coupled to a piston in the sample cap remover 904 (e.g., accommodated via one or more of the cover portion 1108 or the clamp portion 1104). In this example, the sample cap remover 904 maintains a raised position to position the vacuum tweezer structure 1100 elevated above the cap on the sample container (e.g., to prevent initial contact between the cap and the vacuum tweezer structure 1100 until the sample cap remover 904 is lowered). When air is applied to the piston port 1118 to lower the vacuum tweezer structure 1100 into contact with the cap, the piston can press the cover portion 1108 vertically downward against the clamp portion 1104. If no or insufficient fluid pressure is applied to the piston port 1118, for example, when a single-acting piston is included in the sample cap remover 904, a spring can bias the piston to the raised position. Alternatively, the piston can include a spring that biases the piston to the lowered position, with fluid pressure pushing the piston to lift the cover portion 1108 to the raised position upon application of air to the piston port 1118. In this embodiment, a dual acting piston may be utilized to bias the rest position of the sample cap remover via fluid pressure.

[0026] Vertical movement of the cover portion 1108 relative to the clamp portion 1104 can provide a distance to lift the cap from the sample vessel. This allows rotation of the sample cap remover 904 about the z-axis (e.g., via rotational movement of the z-axis support 900) without interference between the cap and the sample vessel, such as while the cap is being moved away from the sample vessel to provide access to the sample vessel for the sample probe 906. In this embodiment, the vertical distance to lift the cap from the sample vessel is about 5 mm to about 40 mm. However, the system 100 is not limited to such distances and may include vertical distances less than about 5 mm or greater than about 40 mm. Furthermore, while the system 100 is described as including a pneumatic piston that provides the above vertical movement, the system 100 is not limited to such a structure. For example, the system 100 may include additional or alternative structures to guide the vertical movement of the sample cap remover 904. In this case, the sample cap remover 904 comprises, but is not limited to, a shuttle within the z-axis support 900 that is magnetically coupled to the sample cap remover 904, a mechanical push rod, a linear drive, a magnetic coupling, a controllable electromagnetic coupling, etc.

[0027] 12A-12D, an example of the operation of system 100 is shown in which probe support arm 902 and sample cap remover 904 are fixed to a single z-axis support 900, and sample cap remover 904 has a pneumatic vacuum tweezer structure. System 100 is illustrated with multiple sample vessels, whose interior spaces are enclosed by caps placed over the top openings of the sample vessels. While the samples are awaiting processing by the system, the caps can serve multiple functions. For example, the caps can prevent contamination of the samples by preventing chemicals or objects from the environment from being introduced through the openings of the sample vessels (e.g., while the probe is being moved from vessel to vessel). The caps can also prevent evaporation of one or more sample components, such as solvent, sample matrix, or other components. Furthermore, the caps can prevent one portion of one sample from interacting (e.g., chemically reacting) with another portion of another sample. For example, the cap can prevent vapor from one container (e.g., holding ammonium hydroxide) from interacting with vapor from another container (e.g., holding hydrofluoric acid) and chemically reacting to form a solid precipitate (e.g., ammonium fluoride crystals) that could coat portions of system 100. In the illustrated example, the cap is held to the sample container by its own weight, although in some embodiments the cap may be held in place via one or more of threads, clips, gaskets, or other structures.

[0028] 12A, the system 100 positions the sample cap remover 904 over a first sample container 1200, which has a first cap 1202 disposed on top of it to isolate a fluid sample (fluid-containing sample) held within the first sample container 1200 from an external environment 1204. The sample cap remover 904 then removes the first cap 1202 from the top of the first sample container 1200 by vertically lifting the first cap 1202 along the z-axis (e.g., by pneumatic actuation of the sample cap remover 904), as shown in FIG. 12B. For example, the system 100 may apply a vacuum to the vacuum tweezer port 1112, introduce the tip of the vacuum tweezer structure 1100 into the cap, and apply a fluid to the piston port 1118 to grasp and lift the cap from the top of the sample container.

[0029] 12C , while the first cap 1202 is held by the sample cap remover 904, the sample cap remover 904 is rotated along the x-y plane to reposition the first cap 1202. For example, the z-axis support 900 rotates about the z-axis to reposition the end of the sample cap remover 904 while holding the first cap 1202 and moving the first cap 1202 away from the first sample vessel 1200 so that the first sample vessel 1200 is accessible to the sample probe 906. In embodiments in which the probe support arm 902 and the sample cap remover 904 are fixed to a single z-axis support 900, rotational movement of the z-axis support 900 can simultaneously move each of the probe support arm 902 and the sample cap remover 904 along the x-y plane. For example, when the first cap 1202 is removed from the first sample vessel 1200, the z-axis support 900 can position the end of the probe support arm 902 over the open vessel in preparation for introducing the sample probe 906 into the fluid sample (fluid-containing sample) in the first sample vessel 1200.

[0030] During rotation of the z-axis support 900 to position the sample probe 906, relative movement of the sample cap remover 904 with respect to the probe support arm 902 moves the sample cap remover 904 away from the first sample container 1200 so as to not obstruct access for the sample probe 906 to retrieve the sample. For example, as shown in FIG. 12C , the sample cap remover 904 is positioned away from the first sample container 1200, and the probe support arm is moved vertically along the z-axis support 900 to introduce the sample probe 906 into the first sample container 1200. The sample probe 906 then draws (aspirates) sample from the first sample container 1200 (e.g., via vacuum applied to the sample probe 906 by a pump or other vacuum source) and is removed from the first sample container 1200 (e.g., via vertical movement of the probe support arm 902). Optionally, system 100 can reposition the first cap 1202 to the first sample vessel 1200 (or sample cap storage location), for example, by rotating z-axis support 900 and releasing the vacuum on sample cap remover 904. Then, as shown in FIG. 12D , system 100 positions sample cap remover 904 over a second sample vessel 1210 and repeats the same process for another sample. In this example, system 100 may include a sample rack 1212 that elevates the bases of sample vessels to a particular height above deck 908. This can provide access (e.g., via a scanning device) to the undersides of sample vessels or otherwise hold the sample vessels in place above deck 908.

[0031] In this embodiment, the sample cap remover 904 may be substituted for, combined with, or in addition to, another structure utilized to access the interior of a sample container. For example, the system 100 may include a sample spiker (sample mixing device) with tubing or other fluid handling structure that allows chemicals to be introduced to the sample at specific times, such as chemicals configured to induce a chemical reaction with the sample at a known time prior to sample analysis.

[0032] [Conclusion] Although the above content has been described in terms specific to structural features and / or process operations, it should be understood that the content defined in the appended claims is not necessarily limited to the specific features or acts described above. Rather, the specific features or acts described above are merely disclosed as example forms of implementing the claims.

Claims

1. a z-axis support rotatable about the z-axis of the autosampler deck; a sample probe support structure coupled to the z-axis support, the sample probe support structure configured to hold a sample probe for retrieving a fluid-containing sample held in a sample vessel supported by the autosampler deck; a sample cap remover coupled to the z-axis support; the sample cap remover includes a clamp portion configured to engage an outer circumferential surface of the z-axis support, a cover portion configured to cover at least a portion of the clamp portion, and a cap remover support arm extending from the cover portion, the cap remover support arm being rotationally offset and angled from the sample probe support structure in the x-y plane; The sample cap remover is configured to lift a cap from the sample vessel to allow access to the interior of the sample vessel by the sample probe supported on the sample probe support structure.

2. 10. The autosampler system of claim 1, wherein the sample cap remover comprises a vacuum tweezer structure configured to remove the cap from the sample vessel upon application of a vacuum.

3. 3. The autosampler system of claim 2, wherein the sample cap remover is provided with a channel for receiving a vacuum line passing through the sample cap remover to connect to a vacuum port of the vacuum tweezer structure.

4. the cover portion is mountable on the clamp portion; and 2. The autosampler system according to claim 1, wherein the cover portion is movable relative to the clamp portion in the vertical direction.

5. The autosampler system of claim 4 , wherein the sample cap remover includes a piston configured to provide vertical relative movement of the cover portion with respect to the clamp portion.

6. 2. The autosampler system of claim 1, wherein the angle is from about 5 degrees to about 90 degrees.

7. an outer shuttle coupled to an outer periphery of the z-axis support; an inner shuttle linearly movable within the interior space of the z-axis support; the inner shuttle is magnetically coupled to the outer shuttle to transmit linear movement of the inner shuttle to the outer shuttle; 2. The autosampler system of claim 1, wherein the sample probe support structure is coupled to the outer shuttle so as to transmit linear movement of the outer shuttle to the sample probe support structure.

8. a z-axis support rotatable about the z-axis of the autosampler deck; a sample probe support structure coupled to the z-axis support, the sample probe support structure configured to hold a sample probe for retrieving a fluid-containing sample held in a sample vessel supported by the autosampler deck; a sample cap remover coupled to the z-axis support at an orientation that is rotationally offset from the z-axis relative to the sample probe support structure; the sample cap remover is configured to lift a cap from the sample vessel to allow access to the interior of the sample vessel by the sample probe supported on the sample probe support structure. the sample cap remover includes a cap remover support arm that is rotationally offset and angled from the sample probe support structure in the x-y plane; Autosampler system.

9. 9. The autosampler system of claim 8, wherein the sample cap remover includes a vacuum tweezer structure configured to remove the cap from the sample vessel upon application of a vacuum.

10. 10. The autosampler system of claim 9, wherein the sample cap remover is provided with a channel for receiving a vacuum line passing through the sample cap remover to connect to a vacuum port of the vacuum tweezer structure.

11. 9. The autosampler system of claim 8, wherein the angle is from about 5 degrees to about 90 degrees.

12. 9. The autosampler system of claim 8, wherein the angle is from about 10 degrees to about 35 degrees.

13. The autosampler system of claim 8 , wherein each of the sample probe support structure and the sample cap remover is directly coupled to the z-axis support.

14. an outer shuttle coupled to an outer periphery of the z-axis support; an inner shuttle linearly movable within the interior space of the z-axis support; 9. The autosampler system of claim 8, wherein the inner shuttle is magnetically coupled to the outer shuttle to transmit linear movement of the inner shuttle to the outer shuttle.

15. 15. The autosampler system of claim 14, wherein the sample probe support structure is coupled to the outer shuttle so as to transmit linear movement of the outer shuttle to the sample probe support structure.

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