Fluid composition sensor device and method of use thereof

Abstract

To provide devices and methods for collecting and characterizing particles suspended within fluid.SOLUTION: A device for detecting fluid particles and their characteristics may comprise a fluid composition sensor configured to receive a volume of fluid. The fluid composition sensor has a collection media housing configured to receive a portion of collection media, a pump for moving the volume of fluid over the collection media housing, an imaging device configured to capture an image of particles on the collection media, and particle matter mass concentration calculation circuitry configured to calculate a total particle matter mass. The particle matter mass concentration calculation circuitry is connected with the imaging device and the pump. The particle matter mass concentration calculation circuitry is configured to adjust the volume of fluid moving over the collection media housing.SELECTED DRAWING: Figure 1

Description

Background Art

[0001] Sensors and devices may be used to characterize various aspects of fluids in a variety of applications. As a mere example, sensor devices may be used to monitor air conditions such as monitoring and characterizing the particulate content of an air flow. However, existing fluid sensor devices have limited functionality in providing data indicative of specific characteristics of the fluid, such as the unique identity and concentration of individual particles contained within the fluid flow. Fluid sensor devices may use holographic imaging methods to characterize the identity and concentration of particulate matter collected by inertial impaction. It is desirable to improve various aspects of particle sampling and analysis. In general, fluid sampling devices may advantageously utilize a sampling medium that enables rapid and / or simplified continuous sampling of particles. In devices that utilize holographic imaging (such as lensless holography) for in situ particle analysis, it is desirable to avoid optical reflection and scattering in order to achieve optimal image quality.

[0002] Therefore, there is a need for an improved fluid sensor device that is capable of reducing optical interference in inertial impaction sampling methods and / or of analyzing multiple samples from one or more impaction collection media.

Summary of the Invention

[0003] Various embodiments described herein relate to apparatus and methods for collecting and characterizing particles suspended in a fluid. Various embodiments relate to apparatus for detecting fluid particle properties, the apparatus for detecting fluid particle properties comprising: a housing configured to support a collection medium for capturing one or more particles of a plurality of particles in a fluid volume passing through at least a portion of the housing; a pump for moving the fluid volume through at least a portion of the housing and across at least a portion of the collection medium; an imaging device configured to capture an image of at least a portion of the one or more particles captured by the collection medium; and a controller including a particulate matter mass concentration calculation circuit configured to determine one or more particle loading conditions of at least a portion of the one or more particles captured by the collection medium, at least in part on the image captured by the imaging device, the controller configured to adjust the operation of the pump at least in part on at least one of the one or more particle loading conditions of at least a portion of the one or more particles captured by the collection medium.

[0004] In various embodiments, the controller may be configured to stop the pump operation when the particulate matter mass concentration calculation circuit determines that a predetermined total particulate matter mass threshold has been reached. In various embodiments, determining one or more particle loading conditions may include determining a first particle loading condition for a first image and determining a second particle loading condition for a second image. In various embodiments, determining one or more particle loading conditions may include comparing the first particle loading condition with the second particle loading condition. In certain embodiments, determining one or more particle loading conditions may further include calculating the difference between the first particle loading condition and the second particle loading condition. In certain embodiments, the particulate matter mass concentration calculation circuit may be configured to stop the pump when a predetermined difference between the first particle loading condition and the second particle loading condition is calculated.

[0005] In various embodiments, the controller may be configured to change the operation of the pump when the particulate matter mass concentration calculation circuit determines that a predetermined difference has been calculated under the first particle loading condition and the second particle loading condition. In various embodiments, determining one or more particle loading conditions may include identifying one or more particle clusters in an image captured by an imaging device. In various embodiments, the imaging device may be configured to capture images at set time intervals. In various embodiments, the imaging device may be configured to capture an image at the start of fluid flow of a fluid volume passing through at least a portion of the housing. In certain embodiments, determining one or more particle loading conditions may include determining whether the start of fluid flow of a fluid volume causes a spike in one or more particle loading conditions.

[0006] In various embodiments, determining one or more particle loading conditions may include calculating the particulate matter mass of at least a portion of one or more particles captured by the collection medium based at least partially on the total light intensity across the image of one or more particles. In certain embodiments, the controller may be configured to stop the pump operation when the particulate matter mass concentration calculation circuit determines that the total light intensity detected in the image has fallen below a threshold. In certain embodiments, the controller may be configured to adjust the pump operation when the particulate matter mass concentration calculation circuit determines that the total light intensity detected in the image has fallen below a threshold. In various embodiments, determining one or more particle loading conditions may include determining the volume of fluid that has flowed through at least a portion of the housing over a specified time interval. In certain embodiments, the volume of fluid that has flowed through the housing over a specified time interval may be determined at least partially on the pump operating time and the pump flow rate.

[0007] Various embodiments relate to a method for detecting fluid particle characteristics, the method comprising: directing the flow of a fluid volume toward a collection medium; receiving one or more particles from a plurality of particles in the fluid volume on the collection medium; capturing an image of one or more of the plurality of particles received by the collection medium; determining one or more particle loading conditions of at least a portion of the plurality of particles received by the collection medium, at least partially based on the image of one or more particles; and adjusting the fluid volume flowing toward the collection medium.

[0008] In various embodiments, determining one or more particle loading conditions may include determining the total particulate matter mass by a particulate matter mass concentration calculation circuit of a controller configured to adjust the volume of fluid flowing toward the collection medium. In various embodiments, the method may further include adjusting the volume of fluid flowing toward the collection medium through the particulate matter mass concentration calculation circuit when at least a threshold difference is detected between a first particle loading condition and a second particle loading condition, the first particle loading condition being determined for a first image, and the second particle loading condition being determined for a second image captured after the first image. In various embodiments, the method may further include adjusting the volume of fluid flowing toward the collection medium when the particulate matter mass concentration calculation circuit determines that the total light intensity detected in the image is below a threshold. [Brief explanation of the drawing]

[0009] Here, refer to the attached drawings, which are not necessarily drawn to scale.

[0010] [Figure 1] This is a schematic diagram illustrating exemplary fluid sensors according to various embodiments.

[0011] [Figure 2] This is a cross-sectional view of an exemplary fluid sensor described herein.

[0012] [Figure 3]Schematic diagram of an exemplary device for implementing various embodiments of the present disclosure.

[0013] [Figure 4] Flow diagram of an exemplary method for detecting fluid particle characteristics of a fluid according to an embodiment of the present disclosure.

[0014] [Figure 5] Diagram of an exemplary device according to various embodiments described herein.

[0015] [Figure 6] Diagram of a collection media assembly according to one embodiment described herein.

[0016] [Figure 7A] Various diagrams of a collection media assembly according to one embodiment described herein. [Figure 7B] Various diagrams of a collection media assembly according to one embodiment described herein.

[0017] [Figure 8A] Various diagrams of a collection media assembly according to one embodiment described herein. [Figure 8B] Various diagrams of a collection media assembly according to one embodiment described herein.

[0018] [Figure 9A] Various diagrams of a collection media assembly according to various embodiments described herein. [Figure 9B] Various diagrams of a collection media assembly according to various embodiments described herein.

[0019] [Figure 10] Top view of a collection media assembly according to an exemplary embodiment described herein.

[0020] [Figure 11]Top view of a collection media assembly according to an exemplary embodiment described herein.

[0021] [Figure 12] Top view of a collection media assembly according to an exemplary embodiment described herein.

[0022] [Figure 13] Cross-sectional view of an apparatus according to an exemplary embodiment described herein.

[0023] [Figure 14A] Diagram of an exemplary apparatus according to various embodiments described herein. [Figure 14B] Diagram of an exemplary apparatus according to various embodiments described herein.

[0024] [Figure 15] Cross-sectional view of an exemplary apparatus according to an embodiment described herein.

[0025] [Figure 16] Cross-sectional view of an exemplary apparatus according to an embodiment described herein.

[0026] [Figure 17] Cross-sectional view of an exemplary apparatus according to an embodiment described herein.

[0027] [Figure 18A] Schematic diagram of an exemplary apparatus according to various embodiments described herein. [Figure 18B] Schematic diagram of an exemplary apparatus according to various embodiments described herein. [Figure 18C] Schematic diagram of an exemplary apparatus according to various embodiments described herein. [Figure 18D] Schematic diagram of an exemplary apparatus according to various embodiments described herein.

[0028] [Figure 19A] This is a perspective view of an exemplary apparatus according to various embodiments. [Figure 19B] This is a perspective view of an exemplary apparatus according to various embodiments. [Figure 19C] This is a perspective view of an exemplary apparatus according to various embodiments.

[0029] [Figure 20A] These are various diagrams of exemplary devices in various embodiments. [Figure 20B] These are various diagrams of exemplary devices in various embodiments. [Modes for carrying out the invention]

[0030] This disclosure provides a more complete description of various embodiments with reference to the accompanying drawings. While several embodiments are shown and described herein, it should be understood that not all embodiments are shown and described. Indeed, embodiments may take many different forms, and therefore this disclosure should not be construed as being limited to the embodiments described herein. Rather, these embodiments are provided to satisfy the applicable legal requirements of this disclosure. Similar figures refer to similar elements throughout.

[0031] First, while exemplary implementations of one or more embodiments are shown below, it should be understood that the disclosed assemblies, systems, and methods may be carried out using any number of techniques, whether currently known or not. This disclosure should not be limited in any way to the exemplary implementations, drawings, and techniques illustrated below, and may be modified within the entire scope of the appended claims and their equivalents. While dimensional values ​​for various elements are disclosed, the drawings may not be to scale.

[0032] As used herein, the terms “example” or “exemplary” are intended to mean “serving as an example, case, or illustration.” Any implementation described herein as “example” or “exemplary embodiment” is not necessarily inferior or advantageous to other implementations. As used herein, “fluid” may be embodied as a gas, liquid, or combination of gas and liquid in a single flow. Accordingly, the term “fluid” encompasses a variety of fluid materials, including but not limited to liquids and / or gases (e.g., air, oil, etc.). Accordingly, the various embodiments relate to fluid detection systems, such as gas detection systems (e.g., certain embodiments are specifically configured for operation using air, other embodiments are configured for operation using other gases such as inert gases, volatile gases, etc.) and liquid detection systems. overview

[0033] This specification describes apparatus configured to characterize and monitor particulate matter within a fluid volume. The apparatus discussed herein may be configured to quantify and classify particles within a fluid volume, at least in part, based on imaging of particles received by a fluid composition sensor's collection medium. Furthermore, the apparatus discussed herein may be configured to characterize the particle composition within a fluid volume by directly identifying the particle size and particle type of each particle received by the fluid composition sensor's collection medium. The apparatus described herein may be configured to detect changes in the particle composition within a fluid volume over time and / or changes with position by directly measuring the particle size and particle type.

[0034] Furthermore, the apparatus described herein may be configured to produce a clear optical output to the image captured by the fluid composition sensor imaging device. The apparatus herein may include an impactor nozzle configured to minimize the reflection of a portion of the light rays emitted from the illumination source. The apparatus herein may include an impactor nozzle configured to minimize imaging distortion caused by divergent light rays emitted from the illumination source entering its sidewalls and reflecting toward the imaging device. For example, such an apparatus configuration can reduce noise that may degrade the ability of the fluid composition sensor to identify, distinguish, and / or analyze individual particles of one or more particles placed in the collection medium by minimizing the scattering of the resulting light rays with the impactor nozzle. The apparatus may also be configured to avoid degradation of the ability of the fluid composition sensor to reconstruct an image of one or more of the captured particles, which may degrade the sensor performance with respect to classifying one or more particles using machine learning.

[0035] Furthermore, the apparatus described herein may be configured to enhance the reliability of the apparatus and user satisfaction by utilizing a replaceable collection medium in combination with a fluid composition sensor. According to certain embodiments discussed herein, the collection medium used to collect particles from the fluid volume in the fluid composition sensor may be automatically replaced (within the fluid collection location) when it is determined that a predetermined sample fluid volume or number of sample particles has passed through the apparatus. By minimizing intermittent user interaction with the collection medium, the apparatus described herein can expedite the sample collection process, reduce the physical work required of the user, facilitate the automation of measurements, and minimize apparatus failures caused by misalignment during user-defined reconfiguration of one or more apparatus components.

[0036] In various embodiments, a fluid composition sensor comprising a controller (e.g., particulate matter mass concentration calculation circuit 208) configured to calculate the total particulate matter mass of multiple particles received from within a fluid volume by a collection medium, and to characterize the spatial arrangement of the multiple particles to identify one or more particle configurations known to adversely affect the sensor accuracy and / or sensor effectiveness (e.g., lifetime) over time, such as particle clustering, spikes, particle contact, particle overlap, and / or a collection medium "covered" by particles, can help prevent sensor inaccuracies caused by overloading a depleted and / or damaged collection medium due to particle loading conditions that the sensor cannot accurately determine and / or identify. Such exemplary configurations prevent overuse of the fluid composition sensor by substantially minimizing the number of retests required to obtain accurate data by defining operating parameters configured to substantially autonomously limit the operation of the sensor when the presence of one or more of the particle loading conditions that induce the aforementioned errors is identified. The lifespan of the device can be extended by dynamically monitoring the loading conditions of multiple particles received by the collection medium and optimizing the operating parameters to selectively limit the device's operating time. Furthermore, the device described herein can further simplify the calculation of the operating run time required for the fluid composition sensor, which is necessary for a sample of particles sufficient to provide one or more statistically significant measurements. Fluid composition sensor

[0037] The device 10 may include a fluid composition sensor 100 configured to receive a fluid volume flowing through it. Specifically, the device 10 may be configured to receive a volume of a gas, such as air, flowing through it. In various embodiments, the fluid composition sensor 100 may be further configured to capture an image of one or more particles from a plurality of particles present in the received fluid volume. As shown in Figure 1, the fluid composition sensor 100 may include a housing 101, an impactor nozzle 104, a collection medium 106, a substrate 108 that is at least partially transparent, and an imaging device 110. In some embodiments, the fluid composition sensor 100 may further include a power supply 114 configured to power the fluid composition sensor 100, and a fan or pump 112 configured to draw the fluid volume into the fluid composition sensor 100 and pass it through. In various embodiments, the fan or pump 112 is calibrated so that the flow rate of the fluid moving through the device is known / determined, at least in part based on the operating characteristics of the fan or pump 112 (e.g., operating power). In various embodiments, the fluid composition sensor 100 may include a lens-free microscope, such as one described in International Publication No. 2018 / 165590, which is incorporated in whole herein by reference. In various embodiments, the lens-free microscope may capture particle images of one or more particles among a plurality of particles received by the collection medium 106, as described herein, by utilizing one or more techniques, such as lensless holography. Alternatively, the fluid composition sensor 100 may include a lens-based imaging device or any other device configured to capture images that may be analyzed by the device described herein to determine the particle size or other particle characteristics of one or more particles captured by the collection medium 106. In various embodiments, the lens-based imaging device may capture particle images of one or more particles among a plurality of particles 120 received by the collection medium 106, as described herein, by utilizing one or more imaging techniques, such as optical microscopy.In various embodiments, the optical microscopy method may include light transmitted through or reflected from the collection medium 106 and / or a plurality of particles 120 arranged in the collection medium 106, passing through one or more lenses to magnify and capture an image of one or more of the plurality of particles 120 in the collection medium 106. As described herein, the fluid composition sensor 100 may be electronically and communicatively connected to the controller 200.

[0038] In various embodiments, as shown in Figures 1 and 2, the impactor nozzle 104 may be configured to direct the flow of the fluid volume received by the fluid composition sensor 100 in a flow direction 130 that is at least substantially perpendicular to and toward the receiving surface of the collection medium 106. In various embodiments, the collection medium 106 may be embodied as part of a collection medium assembly. For example, the collection medium assembly may be embodied as a replaceable slide (as shown in Figures 5 to 8B), with a replaceable collection medium 106 disposed inside the slide. In other embodiments, the entire replaceable slide may be disposable, and the collection medium 106 may be permanently fixed within the slide. However, in other embodiments, the collection medium assembly may comprise a collection medium tape 106 (for example, the collection medium tape may be embodied as an elongated collection medium 106 that can be moved through the fluid composition sensor 100 so that a new (e.g., unused) portion of the collection medium tape can be exposed to the fluid flowing through the impactor nozzle 104). As yet another example, the collection medium 106 may be positioned on and / or as part of a rotatable disk, and as a result, the collection medium 106 may be rotated relative to the fluid composition sensor 100 so that a new (e.g., unused) portion of the collection medium disk can be exposed to the fluid flowing through the impactor nozzle 104. It should be understood that the collection medium 106 may be embodied in any of the various forms. In yet another embodiment, the collection medium 106 may be permanently fixed within the composition sensor 100 so that the entire composition sensor 100 can be discarded once the collection medium 106 is sufficiently filled with particles from the fluid flowing through the composition sensor 100. The collection medium 106 may be configured to accept one or more particles from a plurality of particles 120 through interaction with the fluid volume. In various embodiments, the collection medium 106 may include a receiving surface 105, a back surface 107, and a thickness defined by the distance between the receiving surface 105 and the back surface 107. In various embodiments, the thickness of the collection medium 106 may be at least substantially about 10 to about 1000 micrometers (e.g., 100 micrometers).In various embodiments, the collecting medium 106 may contain a material suitable for stopping one or more of the multiple particles 120 moving toward the receiving surface 105 at a certain speed before the particles reach the back surface 107, such that one or more of the multiple particles 120 are positioned within the collecting medium at a certain distance along the thickness of the collecting medium 106. For example, in various embodiments, the collecting medium may contain an adhesive (i.e., tacky) material such as a gel. In various embodiments, the fluid composition sensor 100 may include a transparent substrate 108 positioned at least substantially adjacent to (e.g., directly fixed to) the back surface 107 of the collecting medium 106. In various embodiments, the collecting medium assembly may further include the transparent substrate 108. Furthermore, in various embodiments such that the collecting medium assembly is embodied as a slide, the collecting medium assembly may include a collecting medium housing 113 which may define a handle 109. In various embodiments, the collecting medium housing 113 may be configured to receive and fix at least a portion of the collecting medium 106 and / or the substrate 108. In various embodiments, the collection medium housing 113 may be configured to be at least partially removable within the fluid composition sensor 100 so that the collection medium 106 is positioned within a fluid channel of a fluid volume moving in the flow direction 130. In various embodiments, the collection medium housing 113 may be configured to have at least one opening positioned adjacent to at least a portion of the collection medium 106 so that one or more particles of a plurality of particles present in the fluid volume can adhere to the receiving surface 105 of the collection medium 106.

[0039] In various embodiments, the collection medium housing 113 may define a handle 109. In various embodiments, as shown in Figure 5, the handle 109 may be configured to facilitate access to the collection medium 106 and / or housing 113, for example, to allow removal and / or replacement of the collection medium 106 from the fluid composition sensor 100. As described above, the collection medium 106 may be configured (or embodied) for use with, for example, a slide, tape, disk, or any other suitable mechanism configured to facilitate the transport of the collection medium 106.

[0040] In various embodiments, for example, as the number of particles collected in the collection medium 106 increases, the device 10 may suffer a decrease in accuracy over time (and consequently, the physical properties of the collection medium 106 change as a result of the increasing number of particles present in the collection medium 106). Therefore, one or more components of the collection medium assembly, as described herein, may be interchangeable. In various embodiments, replacing one or more components of the collection medium assembly may include removing one or more components from the fluid composition sensor 100 and replacing one or more components of the collection medium assembly with one or more substantially similar components. Alternatively, in various embodiments, replacing one or more components of the collection medium assembly may include cleaning, repositioning, and / or modifying one or more components of the collection medium assembly to reduce the number of particles present in the portion of the collection medium 106 exposed to the airflow within the composition sensor 100. In a non-limiting example, in various embodiments in which the collection medium assembly may include adhesive tape, at least a portion of the tape may be removed so as to be positioned beneath at least a portion of the removed tape and to expose a new portion of the tape corresponding to at least a portion of the removed tape. In a further non-limiting example, in various embodiments in which the collection medium assembly may include a disk, the disk may be configured to be washed so that the properties of the disk may be at least substantially the same as those of a new disk. In various embodiments, the fluid composition sensor 100 may be configured to be partially or entirely replaceable and / or disposable.

[0041] In various embodiments, the fluid composition sensor 100 may include an imaging device 110 configured to capture images of one or more particles among a plurality of particles 120 received by the collection medium 106. In various embodiments, the imaging device 110 may be positioned at least substantially adjacent to the back surface 107 of the transparent substrate 108 (e.g., in contact with the back surface 107 of the transparent substrate 108 or at a certain distance from the back surface 107) so that the imaging device 110 can effectively capture images of one or more particles captured in the collection medium 106. In various embodiments, the fluid composition sensor 100 may have a designated field of view for simultaneously, permanently and / or temporarily capturing images of a plurality of particles among the plurality of particles. The collection medium 106 may be at least partially within the field of view of the imaging device 110 so that the plurality of particles 120 captured by the collection medium 106 are visible to the imaging device 110. As shown in Figure 2, the imaging device 110 may be positioned below the transparent substrate 108 relative to the collection medium 106. For example, the imaging device 110 may be positioned about 100 micrometers to about 5 mm (e.g., 1 mm) away from the transparent substrate 108. Alternatively, the imaging device 110 may be positioned above the transparent substrate 108 with respect to the collection medium 106.

[0042] In various embodiments, the imaging device 110 may be configured to capture images of one or more particles among a plurality of particles 120 received by the collection medium 106 using one or more imaging techniques, such as lensless holography. In various embodiments where the imaging device is configured to utilize lensless holography, the imaging device may generate images of one or more particles received by the collection medium 106 on a computer by digitally reconstructing one or more microscopic images of the particles received by the collection medium 106 without the use of lenses. Alternatively and / or additionally, the imaging device 110 may utilize optical microscopy to capture images of one or more particles among a plurality of particles 120 received by the collection medium 106. For example, in various embodiments, as described herein, the images captured by the exemplary imaging device may include two-dimensional images (e.g., photographs of at least a portion of the collection medium) and / or three-dimensional images (e.g., three-dimensional digital reconstructions of at least a portion of the particles captured in the collection medium). In some embodiments, the fluid composition sensor 100 may be configured to simultaneously capture images of one or more particles in the collection medium 106. For example, the fluid composition sensor 100 may have a designated field of view for simultaneously and permanently / temporarily capturing images of some of a plurality of particles, as described herein. In various embodiments, one or more images captured by the fluid composition sensor 100 may be transmitted to at least the controller 200. In various embodiments, the imaging device 110 may be configured to capture one or more images at a first time and a second time, where the first time represents the start of analysis by the device 10 of one or more particles 120 captured by the collection medium 106, and the second time is after the first time.In such a configuration, the device may distinguish between particles present in the collection medium 106 at the start of particle analysis and particles newly received by the collection medium 106 by comparing the respective particle images captured in the first and second time periods and identifying any particles from the second captured particle image that were not captured in the first captured particle image.

[0043] In various embodiments, the fluid composition sensor 100 may be connected to a power supply 114 configured to receive power and supply power to the fluid composition sensor 100. In non-limiting examples, the power supply 114 may comprise one or more batteries, one or more capacitors, one or more constant power supply units (e.g., wall outlets), etc. In some embodiments, the power supply 114 may comprise an external power supply located outside the fluid composition sensor 100 and configured to supply AC or DC power to the fluid composition sensor 100. Furthermore, in some embodiments, as shown in Figure 1, the power supply 114 may comprise an internal power supply, such as one or more batteries, located inside the fluid composition sensor 100. In various embodiments, the power supply 114 may be connected to a controller 200 to enable the distribution of power to the fluid composition sensor 100 through the controller.

[0044] Figures 6 to 8B show various exemplary embodiments of a collection medium assembly as described herein. As shown in Figures 6 to 8B, the collection medium assembly may comprise a collection medium 106 positioned on a replaceable slide, a collection medium housing 113 configured to secure the replaceable slide, and therefore the collection medium 106 in the slide, and a handle 109. In various embodiments, the collection medium 106 may be configured to be mounted on a transparent substrate 108, which may further be located within the collection medium housing 113. In various embodiments, the replaceable slide may define the transparent substrate 108. As shown in Figure 6, the collection medium housing 113 may comprise a tab adjacent to at least a portion of an opening configured to receive the replaceable slide via a hinged connection that allows the replaceable slide to snap into a desired position. The collection medium 106 may be configured to be replaceable. This is because the collection medium 106 may be removed from the collection medium housing 113 by pulling away a replaceable slide from its fixed position within the collection medium housing 113, and subsequently replaced with a different collection medium 106 (e.g., a new collection medium 106). In various embodiments, the collection medium housing 113 may be removed from the fluid composition sensor 100 by, for example, user interaction with a handle 109.

[0045] As shown in Figures 7A and 7B, the collection medium housing 113 may have a slot along at least one side having dimensions corresponding to the cross-section of a replaceable slide, so that the housing 113 may be configured to receive the replaceable slide, together with the collection medium 106 placed on the slide, through the slot. The collection medium 106 may be configured to be replaceable so that the collection medium 106 can be removed from the collection medium housing 113 and subsequently replaced with a different collection medium 106 by sliding the replaceable slide through the slot from its fixed position in the collection medium housing 113. The collection medium housing 113 may be removed from the fluid composition sensor 100, for example, by user interaction with a handle 109.

[0046] As shown in Figures 8A and 8B, the collection medium housing 113 may have a removable surface, so the housing 113 may be configured to receive a replaceable slide when the removable surface is in a detached configuration, and to fix the replaceable slide in a desired position when the removable surface is in an assembled configuration. The collection medium 106 may be configured to be replaceable because the collection medium 106 may be removed from the collection medium housing 113 by separating the removable surface of the collection medium housing 113, retrieving the replaceable slide from its fixed position within the collection medium housing 113, and subsequently replacing it with a different collection medium 106. The collection medium housing 113 may be removed from the fluid composition sensor 100, for example, by user interaction with the handle 109.

[0047] Figures 9A and 9B are various diagrams of collection medium assemblies according to various embodiments described herein. As shown in Figures 9A and 9B, the collection medium assembly 150 may comprise at least one collection medium 106 disposed on a transparent substrate 108, at least one orifice 111 extending through the transparent substrate 108, and an air seal engagement portion 115A surrounding the collection medium 106, at least one orifice 111, and the transparent substrate 108. In various embodiments, the transparent substrate 108 may be defined by interchangeable slides as described herein. In various embodiments, at least one orifice 111 may be positioned at least substantially adjacent to at least one collection medium 106. For example, as shown in Figures 9A and 9B, at least one orifice 111 may comprise a plurality of orifices (e.g., two orifices located on either side of the collection center 106) disposed around the transparent substrate 108 to allow a fluid volume to flow through the transparent substrate 108. In various embodiments, the air seal engagement portion 115A may define at least a portion of the outer periphery of the collection medium assembly 150, such as a portion of the collection medium assembly 150 that surrounds one of the at least one collection medium 106 and the corresponding at least one orifice 111. In various embodiments, the air seal engagement portion 115A may be used to prevent or limit the exposure of adjacent or nearby collection medium sections 106 to the fluid being sampled. In certain embodiments, the air seal engagement portion 115A may be embodied as a rigid, at least substantially smooth component configured to interact with a gasket (or other flexible sealing component) of the air seal component of the device as discussed herein. As another example, the air seal engagement portion 115A may comprise one or more flexible components (e.g., elastic gaskets) configured to interact with corresponding components of the air seal component of the device to form at least a substantially fluid-tight seal between them.For example, the air seal engagement portion 115A may be configured to receive and / or engage the air seal components of the fluid composition sensor such that at least substantially all of the fluid volume flowing through the fluid composition sensor flows through at least one orifice 111 surrounded by at least one seal engagement portion 115A. As shown in Figure 9A, the air seal engagement portion 115A may include a portion of the surface of the transparent substrate 108. In various embodiments, as described herein, the air seal engagement portion 115A may comprise a plurality of air seal engagement portions, each of which may correspond to a corresponding collection medium 106 of at least one collection medium and at least one corresponding orifice 111.

[0048] Figure 9B shows a cross-sectional view of an exemplary collection medium assembly according to one embodiment described herein. As shown, the collection medium assembly 150 may include a collection medium housing 113. In various embodiments, the collection medium housing 113 may be configured to at least partially enclose the transparent substrate 108 so as to embody the outer frame of the collection medium assembly 106. In various embodiments, as described herein, at least one seal engagement portion of the collection medium assembly 150 may include a portion of the collection medium housing 113. In various embodiments, the collection medium housing 113 may be configured to facilitate the collective storage (e.g., stacking) of each of a plurality of collection medium assemblies 150 and subsequent discharge to the internal sensor portion of the fluid composition sensor. For example, as described herein, each collection medium housing 113 of a plurality of collection medium assemblies 150 may be configured to receive force from one or more components (e.g., actuator elements) of the exemplary apparatus described herein so that each collection medium assembly 150 can be sequentially and continuously fed from the storage position to the internal sensor portion of the fluid composition sensor.

[0049] Figures 10 to 12 show various collection medium assemblies according to exemplary embodiments described herein. Figure 10 shows a top view of a plurality of collection medium assemblies arranged on a rotatable disk according to one exemplary embodiment. In various embodiments, the plurality of collection medium assemblies 150 may be arranged on a rotatable disk which may be rotatable about an axis so that the plurality of collection medium assemblies 150 (e.g., including a plurality of collection mediums 106) can move relative to the internal sensor portion of the housing of the fluid composition sensor. As described herein, the rotatable disk may be configured such that the plurality of collection mediums 106 can move (e.g., rotate) relative to the fluid composition sensor so that new (e.g., unused) collection mediums 106 of the plurality of collection medium assemblies 150 can be exposed to the fluid volume flowing through the impactor nozzle.

[0050] In various embodiments, the rotatable disk may comprise multiple disk portions that are coplanar and concentric, each disk portion including a part of the rotatable disk on which one or more of a plurality of collection medium assemblies 150 can be placed. For example, as shown in Figure 10, the rotatable disk may comprise a first disk portion 108A and a second disk portion 108B, on which a plurality of collection medium assemblies 150 reside. Each disk portion may be at least partially defined by a corresponding radial distance between the disk portion of the rotatable disk and its central axis, the radial distances corresponding to each disk portion having distinct values ​​so that the plurality of disk portions can define a plurality of peripheral layers extending radially outward from the central axis of the rotatable disk. The plurality of disk portions may be configured to increase the capacity of the rotatable disk with respect to the number of collection mediums 106 placed on the rotatable disk. In various embodiments, as described herein, the exemplary apparatus described herein may be configured such that a rotatable disk rotates and / or moves linearly (e.g., radially with respect to the disk) with respect to the fluid composition sensor, so that unused collection media 106 of a plurality of collection media assemblies 150 are positioned at least substantially adjacent to the outlet of the impactor nozzle of the fluid composition sensor.

[0051] As described herein, each of the multiple collection media 106 of the multiple collection media assemblies 150 may be arranged on a transparent substrate. In various embodiments, at least a portion of the rotatable disk on which the multiple collection media 106 are arranged may include a transparent substrate, but opaque or translucent materials may be used to define the portion of the disk between the included collection media assemblies 150. For example, in various embodiments, the entire rotatable disk may include a transparent substrate. Furthermore, in various embodiments, the rotatable disk may be provided with one or more alignment keys 151 configured to assist in manually and / or mechanically positioning and / or aligning the collection media 106 arranged on the rotatable disk so that a fluid volume flowing through a fluid composition sensor (e.g., through an impactor nozzle) can pass across the surface of the collection media 106. The rotatable disk may be provided with a plurality of orifices corresponding to at least one orifice 111 of each of the multiple collection media assemblies 150, configured so that a fluid volume can flow through therein. In various embodiments, each of the multiple collection medium assemblies 150 may include an air seal engagement portion 115A that surrounds one of the multiple collection mediums 106 and at least one orifice 111 positioned adjacent thereto. In such a configuration, as described herein, the fluid volume flowing through the sensor can pass across the surface of the collection medium 106 surrounded by the air seal engagement portion 115A that engages with the air seal component of the fluid composition sensor. For example, the collection medium 106 surrounded by the air seal engagement portion 115A that engages with the air seal component of the fluid composition sensor may be fluidically isolated from each of the other collection mediums among the multiple collection mediums arranged on the rotatable disk.

[0052] Figure 11 shows a top view of a plurality of collection medium assemblies arranged on an alignment plate according to an exemplary embodiment. In various embodiments, the plurality of collection medium assemblies 150 may be arranged on an alignment plate that may be movable along a plane so that the plurality of collection medium assemblies 150 (e.g., including a plurality of collection mediums 106) can move relative to the internal sensor portion of the housing of the fluid composition sensor. The alignment plate may be configured such that the plurality of collection mediums 106 can move (e.g., linearly shift) along at least two directional axes (e.g., the x and y axes which are coplane) relative to the fluid composition sensor so that new (e.g., unused) collection mediums 106 of the plurality of collection medium assemblies 150 can be exposed to the fluid volume flowing through the impactor nozzle. As shown in Figure 11, in various embodiments, the plurality of collection medium assemblies 150 arranged on the alignment plate may be arranged to define an array including a plurality of rows and columns.

[0053] As described herein, each of the multiple collection media 106 of the multiple collection media assemblies 150 may be arranged on a transparent substrate. In various embodiments, at least a portion of the alignment plate on which the multiple collection media 106 are arranged may comprise a transparent substrate. For example, in various embodiments, the entire alignment plate may comprise a transparent substrate (however, in certain embodiments, the portion of the alignment plate between the collection media assemblies may comprise an opaque or translucent material). Furthermore, in various embodiments, the alignment plate may comprise one or more alignment keys 151 configured to assist in manually and / or mechanically positioning and / or aligning the collection media 106 arranged on the alignment plate in such a position that a fluid volume flowing through a fluid composition sensor (e.g., through an impactor nozzle) can pass across the surface of the collection media 106. In various embodiments, one or more alignment keys 151 may be arranged along the alignment plate to correspond to specific rows and columns of an array defined by the multiple collection media assemblies 150.

[0054] The alignment plate may further comprise a plurality of orifices corresponding to at least one orifice of each of a plurality of collection medium assemblies 150, through which a fluid volume can flow. In various embodiments, each of the plurality of collection medium assemblies 150 may comprise an air seal engagement portion that surrounds one of a plurality of collection mediums 106 and at least one orifice 111 positioned adjacent thereto. In such a configuration, as described herein, the fluid volume flowing through the sensor can pass across the surface of the collection medium 106 surrounded by the air seal engagement portion 115A that engages with the air seal component of the fluid composition sensor. For example, the collection medium 106 surrounded by the air seal engagement portion that engages with the air seal component of the fluid composition sensor may be fluidically isolated from each of the other collection mediums among the plurality of collection mediums arranged on the alignment plate.

[0055] Figure 12 shows a top view of a plurality of collection medium assemblies arranged on an alignment tape according to an exemplary embodiment. In various embodiments, the plurality of collection medium assemblies 150 may be arranged on an alignment plate that is movable in a direction at least substantially parallel to a linear axis extending along the length of the alignment tape, so that the plurality of collection medium assemblies 150 (e.g., including a plurality of collection mediums 106) arranged on the alignment plate can move relative to the internal sensor portion of the housing of the fluid composition sensor. The alignment tape may be configured such that the plurality of collection mediums 106 can move (e.g., linearly shift) relative to the fluid composition sensor so that new (e.g., unused) collection mediums 106 of the plurality of collection medium assemblies 150 can be exposed to the fluid volume flowing through the impactor nozzle. As shown in Figure 12, in various embodiments, the plurality of collection medium assemblies 150 arranged on the alignment tape may be arranged to define a row of collection medium assemblies 150 extending along the length of the alignment tape.

[0056] In various embodiments, at least a portion of the alignment tape on which the multiple collection media 106 are arranged may comprise a transparent substrate 108. For example, in various embodiments, the entire alignment tape may comprise a transparent substrate 108 (however, it should be understood that portions of the alignment tape between the collection media assemblies 150 may comprise an opaque or translucent material). Furthermore, in various embodiments, the alignment tape may comprise one or more alignment keys 151 configured to assist in manually and / or mechanically positioning and / or aligning the collection media 106 placed on the alignment tape in such a position that a fluid volume flowing through a fluid composition sensor (e.g., through an impactor nozzle) can pass across the surface of the collection media 106. In various embodiments, one or more alignment keys 151 may be arranged along the alignment tape to correspond to a particular collection media assembly 150 in a column defined by the multiple collection media assemblies 150.

[0057] The alignment tape may further comprise a plurality of orifices corresponding to at least one orifice of each of a plurality of collection medium assemblies 150, through which a fluid volume can flow. In various embodiments, each of the plurality of collection medium assemblies 150 may comprise an air seal engagement portion surrounding one of a plurality of collection mediums 106 and at least one orifice positioned adjacent thereto. In such a configuration, as described herein, the fluid volume flowing through the sensor can pass across the surface of the collection medium 106 surrounded by the air seal engagement portion 115A that engages with the air seal component of the fluid composition sensor. For example, the collection medium 106 surrounded by the air seal engagement portion that engages with the air seal component of the fluid composition sensor may be fluidically isolated from each of the other collection mediums among the plurality of collection mediums arranged on the alignment tape. As described herein, in various embodiments, the alignment tape may comprise a non-rigid material (e.g., flexible, bendable, foldable, etc.). For example, each of the multiple collection medium assemblies 150 may be separated by a fold line, and an alignment tape may be folded along this line. In various embodiments, the non-rigid material of the alignment tape may facilitate compact storage of the multiple collection medium assemblies 150, thereby increasing the capacity of the fluid composition sensor.

[0058] Figure 13 is a cross-sectional view of an exemplary apparatus according to one embodiment described herein. Specifically, Figure 13 shows an exemplary collection medium assembly storage chamber 160 configured to accommodate at least a portion of a plurality of collection media. As described herein, in various embodiments, the exemplary collection medium assembly 150 may be configured to facilitate the collective storage (e.g., stacking) of each of the plurality of collection medium assemblies 150 and subsequent discharge to the internal sensor portion of the fluid composition sensor. As shown in Figure 13, the plurality of exemplary collection medium assemblies 150 may be arranged within the collection medium assembly storage chamber 160. In various embodiments, the collection medium assembly storage chamber 160 may store a plurality of unused collection medium assemblies before each of the plurality of collection medium assemblies is sequentially used for particle collection in the fluid composition sensor. The collection medium assembly storage chamber 160 may be configured to avoid contamination of the corresponding collection medium 106 by minimizing, at least substantially, the exposure of each of the collection medium assemblies 150 stored therein to the surrounding environment.

[0059] As described herein, the collection medium assembly storage chamber 160 may be further configured to sequentially and continuously feed each of the multiple collection medium assemblies 150 stored therein to the internal sensor portion of the fluid composition sensor. In various embodiments, the collection medium assembly storage chamber 160 may include an actuator element 161 configured to selectively apply force to one of the multiple collection mediums stored in the collection medium assembly storage chamber so as to move the collection medium assembly 150 from the collection medium assembly storage chamber 160 to the internal sensor portion of the fluid composition sensor. For example, the actuator element 161 may be configured to move from a compressed position to an extended position as shown in Figure 13. The actuator element 161 may be configured to apply force to the collection medium assembly 150 as the actuator element 161 moves from the compressed position to the extended position. In various embodiments, the force applied to the collecting medium assembly 150 as the actuator element 161 moves from a compressed position to an extended position may move the position of the collecting medium assembly such that, when the actuator element 161 is in the extended position, the collecting medium assembly 150 may be in a receptive position within the internal sensor portion of the fluid composition sensor. In various embodiments, the receptive position may be defined by the arrangement of the collecting medium assembly 150 within the internal sensor portion of the fluid composition sensor, and the corresponding collecting medium 106 is positioned so that the fluid volume flowing through the fluid composition sensor (e.g., through the impactor nozzle) can pass across the surface of the collecting medium. In various embodiments, the actuator element 161 may be configured to extend from the compressed position to the extended position (e.g., to position the collecting medium assembly 150 in the receptive position) and then return from the extended position to the compressed position. Furthermore, in various embodiments, the actuator element 161 may include a gear drive mechanism and / or a lever arm mechanism which can be configured to operate according to one or more embodiments described herein.

[0060] As shown in the figure, the collection medium assembly storage chamber 160 may have a discharge opening 162 in one or more walls of the chamber, the discharge opening 162 configured to allow one or more collection medium assemblies 150 stored in the collection medium assembly storage chamber 160 to pass through the discharge opening 162 when one or more of the collection medium assemblies 150 are supplied to the internal part of the fluid composition sensor. In various embodiments, the discharge opening 162 may have a discharge door that can be selectively opened and closed to facilitate the selective discharge of the collection medium assemblies 150. For example, in the exemplary embodiment shown in Figure 13, the actuator element 161 may be configured to apply a lateral (e.g., horizontal) force to a collection medium assembly 150 positioned in a loading position (e.g., on top of a stack of collection medium assemblies) so that the collection medium assembly 150 is discharged from the collection medium assembly storage chamber 160 through the discharge opening 162. As described herein, the collecting medium assembly storage chamber 160 may be positioned close to the housing of the fluid composition sensor such that the housing is configured to receive at least a portion of the collecting medium assembly 150 discharged from the collecting medium assembly storage chamber 160 by extension of an actuator element 161 that moves the position of the collecting medium assembly 150 through a discharge opening. Thus, the discharge opening 162 may be at least substantially coplanar with the internal sensor portion (e.g., the position of the collecting medium assembly 150 when used to collect airflow particles). As described above, the collecting medium assembly storage chamber 160 may be configured to discharge the collecting medium assembly 150 through the discharge opening 162 (e.g., using the actuator element 161) so that the collecting medium assembly 150 is delivered to a receiving position within the internal sensor portion of the fluid composition sensor.

[0061] As described herein, the collection medium assembly storage chamber 160 may be configured to accommodate a plurality of collection medium assemblies 150 within the chamber so that the plurality of collection medium assemblies 150 can be sequentially and continuously fed from a storage position to a receiving position within the internal sensor portion of the fluid composition sensor. For example, the collection medium assembly storage chamber 160 may define a loading position located in close proximity to the actuator element 161 and / or the discharge opening 162, and / or located at least substantially coplanar, and the collection medium assembly 150 located at the loading position may be the next collection medium assembly 150 to be fed to the fluid composition sensor (for example, chronologically earlier than each of the other collection medium assemblies stored in the collection medium assembly storage chamber 160) among the plurality of collection medium assemblies 150 arranged in the collection medium assembly storage chamber 160. As shown in Figure 13, the plurality of collection medium assemblies 150 stored in the collection medium assembly storage chamber 160 may be arranged in a stacked manner. As shown in the figure, the loading position may include a position close to the actuator element 161 and / or the discharge opening 162 (e.g., the top of the stack). In various embodiments, the collecting medium assembly storage chamber 160 may include a loading element 163 configured to hold a plurality of collecting medium assemblies 150 located within the collecting medium assembly storage chamber 160 such that when a first collecting medium assembly is discharged, a second collecting medium is moved to a loading position within the collecting medium assembly storage chamber 160. For example, the loading element 163 may include a plate to which a biasing force can be applied to transmit a corresponding loading force to one or more of the plurality of collecting medium assemblies 150. In such an exemplary case, the biasing force may be applied to the bottom surface of the loading element 163 (e.g., by a spring) to push the next collecting medium assembly 150 in the stack to the loading position.In various embodiments, the biasing force applied to the loading element 163, and / or the loading force applied from the loading element 163 to one or more of the collection medium assemblies 150, may be either a constant force or an intermittent force selectively applied between subsequent discharges of the collection medium assemblies 150 to arrange the collection medium assemblies so that at least one collection medium assembly 150 is in the loaded position.

[0062] Figures 14A and 14B show exemplary apparatus according to various embodiments. As described herein, the fluid composition sensor may comprise a housing 101, an illumination source 116, an impactor nozzle 104, at least one collection medium 106 disposed on a transparent substrate 108, and an imaging device 110. In various embodiments, the fluid composition sensor may be configured to receive a fluid volume within an internal sensor portion of the housing 101. The impactor nozzle 104 may be configured to direct the flow of at least a portion of the fluid volume received by the fluid composition sensor 100 in a flow direction 130 that is at least substantially perpendicular to and toward the receiving surface of the collection medium 106.

[0063] As described herein, the impactor nozzle 104 may be located within an internal sensor portion of the housing 101 and may comprise a nozzle inlet configured to receive at least a portion of the fluid volume received by the fluid composition sensor, a nozzle outlet, and a plurality of side walls extending between the nozzle inlet and the nozzle outlet. Each of the plurality of side walls of the impactor nozzle may comprise an inner side wall and an outer side wall. In various embodiments, the nozzle inlet may comprise a nozzle inlet cross-sectional area at least partially defined by the outer circumference formed by each of the inner side walls of the plurality of side walls at the nozzle inlet. Similarly, the nozzle outlet may comprise a nozzle outlet cross-sectional area at least partially defined by the outer circumference formed by each of the inner side walls of the plurality of side walls at the nozzle outlet. In various embodiments, the impactor nozzle 104 may further comprise a central nozzle axis extending perpendicularly between the nozzle inlet and the nozzle outlet.

[0064] In various embodiments, the impactor nozzle 104 may comprise a first nozzle portion and a second nozzle portion, both of which may be at least partially defined by a plurality of sidewall portions of the impactor nozzle 104. The first nozzle portion may comprise a portion of the impactor nozzle 104 that is at least partially defined by at least one tapered inner sidewall extending between the nozzle inlet and the intermediate nozzle position. The second nozzle portion may comprise a portion of the impactor nozzle 104 that is at least partially defined by at least one inner sidewall extending between the intermediate nozzle position and the nozzle outlet. As described herein, the intermediate nozzle position may include the intermediate nozzle cross-sectional area and may be defined by a plane positioned perpendicular to the central axis of the impactor nozzle 104 between the first nozzle portion and the second nozzle portion. In various embodiments, the first nozzle portion may be configured such that the nozzle inlet cross-sectional area is greater than the intermediate nozzle cross-sectional width. Furthermore, as will be described in more detail herein, the second nozzle portion may be configured such that the nozzle outlet cross-sectional area is larger, smaller, or at least substantially the same as the intermediate nozzle cross-sectional area. For example, as shown in Figure 14, the impactor nozzle 104 is configured such that the nozzle outlet cross-sectional area and the intermediate nozzle cross-sectional area are substantially the same.

[0065] As described herein, the impactor nozzle 104 may receive at least a portion of the fluid volume received by the fluid composition sensor 100, and may be configured to direct the fluid volume in a flow direction 130 that is at least substantially perpendicular to and toward the receiving surface of the collection medium 106. For example, the flow direction 130 may be at least substantially aligned with and / or parallel to the central nozzle axis of the impactor nozzle 104. The collection medium 106 may be configured to receive one or more particles of a plurality of particles 120 in the fluid volume through interaction with the fluid volume directed from the impactor nozzle 104. As described herein, the collection medium 106 may be a component of a collection medium assembly, which may further comprise a transparent substrate 108 and at least one orifice 111. As described herein, at least one orifice 111 may be configured to allow at least a portion of the fluid volume to pass through the transparent substrate 108 and proceed in the flow direction 130 through the internal sensor portion.

[0066] In various embodiments, the fluid composition sensor may further comprise one or more air seal components 115B configured to engage with one or more corresponding air seal engagement portions 115A of the collecting medium assembly located within the internal sensor portion of the housing. As described herein, one or more air seal components 115B may be configured to surround at least the collecting medium 106 and the corresponding at least one orifice 111, so as to fluidly isolate the collecting assembly 106 from the surrounding environment, so that at least substantially all of the fluid volume flowing through the fluid composition sensor flows through at least one orifice 111.

[0067] As described herein, the fluid composition sensor may include an illumination source 116 configured to emit one or more rays. In various embodiments, the illumination source 116 may be a laser, lamp, light-emitting diode (LED), etc., capable of operating in conjunction with one or more lenses collectively configured to produce rays (e.g., ultraviolet, visible, infrared, or polychromatic light) that can be emitted toward the collection medium 106, as described in further detail herein. In some embodiments, the illumination source 116 may be lens-free, for example, when the fluid composition sensor is configured to perform lensless holography, as described herein. For example, as shown in Figure 14B, the illumination source may be configured to emit one or more rays in the emission direction 131 such that the rays engage with the collection medium 106 and illuminate one or more particles arranged in the collection medium 106. Furthermore, as described herein, the fluid composition sensor may further include an imaging device 110 configured to capture an image of one or more particles among a plurality of particles 120 received by the collection medium 106. In various embodiments, the imaging device 110 may be positioned at least substantially adjacent to the transparent substrate 108 (e.g., in contact with the transparent substrate 108 or at a certain distance from the transparent substrate 108) so that the imaging device 110 can effectively capture images of one or more particles captured in the collection medium 106. The collection medium 106 may be at least partially within the field of view of the imaging device 110 so that the plurality of particles 120 captured by the collection medium 106 are visible to the imaging device 110. In various embodiments, the imaging device 110 may be configured to capture images of one or more of the plurality of particles 120 received by the collection medium 106 using one or more imaging techniques, such as lensless holography or optical microscopy.

[0068] As described herein, in various embodiments, the fluid composition sensor may be configured between an open housing configuration and a closed configuration. Specifically, Figure 14A shows a cross-sectional view of an exemplary fluid composition sensor in a closed configuration. The fluid composition sensor in a closed housing configuration may be at least partially defined by the engagement of at least one air seal component 115A with an air seal engagement portion of the collection medium assembly. As described herein, such engagement by the fluid composition sensor in a closed configuration may provide a fixed seal surrounding at least the collection medium 106 and one or more corresponding orifices 111 so as to isolate the collection medium 106 and one or more corresponding orifices 111 from the ambient fluid volume, thereby minimizing unwanted contamination of adjacent sections of the collection medium 106.

[0069] Figure 14B shows a cross-sectional view of an exemplary fluid composition sensor in an open configuration. In various embodiments, a fluid composition sensor in an open housing configuration may be configured to allow the collection medium assembly to be reconfigured relative to at least one portion of the internal sensor portion of the housing 101. In various embodiments where the fluid composition sensor is in an open configuration, a collection medium assembly, including the collection medium 106 located within the internal sensor portion of the fluid composition sensor, may be reconfigured so that the collection medium 106 can be removed from the internal sensor portion. For example, the collection medium assembly may be removed from the internal sensor portion and transported to an exemplary secondary position. In addition, when the fluid composition sensor is in an open configuration, a collection medium assembly, including the collection medium 106, located outside the housing 101, may be reconfigured so that the collection medium 106 can be received within the internal sensor portion of the housing 101. For example, the collection medium assembly may be rotated and / or shifted relative to the internal sensor portion so that the collection medium 106 is positioned at least substantially adjacent to the nozzle outlet of the impactor nozzle 104. With respect to the various exemplary embodiments described herein, the internal sensor portion of the fluid composition sensor is shown to have a physical opening so that one or more components of the fluid composition sensor located within the internal sensor portion of the housing can be exposed to the ambient fluid volume; however, it should be understood that in various embodiments, it may remain at least substantially isolated from the ambient environment in an open configuration to avoid sensor contamination.

[0070] Figures 15 to 17 show various cross-sectional views of exemplary apparatus according to embodiments described herein. Specifically, Figure 15 shows a cross-sectional view of an exemplary fluid composition sensor in an open configuration, the exemplary fluid composition sensor comprising a plurality of collection medium assemblies 150 arranged on an alignment plate. For example, the plurality of collection medium assemblies 150 arranged on the alignment plate may be arranged to define an array including a plurality of rows and / or columns. As described herein, the fluid composition sensor may be configured such that the alignment plate is movable in a plurality of directions along a cross-section so that the plurality of collection medium assemblies 150 (e.g., including a plurality of collection mediums 106) arranged on the alignment plate can move relative to the internal sensor portion of the housing 101 when the fluid composition sensor is in an open configuration. The alignment plate may be configured such that the plurality of collection mediums 106 can move relative to the housing 101 (e.g., linearly shift and / or rotate) so that new (e.g., unused) collection mediums 106 of the plurality of collection medium assemblies 150 can be exposed to the fluid volume flowing through the impactor nozzle 104. As described herein, when the unused collection medium 106 is placed at a desired position at least substantially adjacent to the nozzle outlet of the impactor nozzle 104, the fluid composition sensor is reconfigured into a closed configuration, thereby fixing the position of the collection medium 106 relative to the nozzle outlet.

[0071] Figure 16 shows a cross-sectional view of an exemplary fluid composition sensor in an open configuration, the exemplary fluid composition sensor comprising a plurality of independent collection medium assemblies 150, each collection medium assembly 150 configured to be sequentially arranged within the internal sensor portion of the fluid composition sensor. In various embodiments, the fluid composition sensor may include one or more collection medium assembly storage chambers configured to store at least a portion of the plurality of collection medium assemblies. Furthermore, in various embodiments, each of the at least one collection medium assembly storage chamber may be configured to discharge one or more of the plurality of collection medium assemblies 150 into and / or receive them from the housing 101. For example, as shown, the fluid composition sensor may include a first collection medium assembly storage chamber 160 and a second collection medium assembly storage chamber 164.

[0072] As shown in Figure 16, each of the multiple collection medium assemblies 150 comprises a collection medium disposed on a transparent substrate, a plurality of orifices disposed adjacent to the corresponding collection medium and extending through the transparent substrate 108, an air seal engagement portion, and a collection medium housing (e.g., a frame element). As described herein, in various embodiments, each of the multiple collection medium assemblies 150 may be configured to facilitate the collective storage of the multiple collection medium assemblies 150 in a collection medium assembly storage chamber. For example, as shown, at least a portion of the multiple collection medium assemblies 150 may be organized in a stacked configuration to minimize unwanted contamination of the collection medium by physical engagement between the collection medium and one or more components of adjacent collection medium assemblies (e.g., corresponding collection medium housings), and the corresponding collection medium housings may be stacked relative to each other.

[0073] In various embodiments, the first collection medium assembly storage chamber 160 may store a plurality of unused collection medium assemblies before each collection medium assembly is used for particle collection within the fluid composition sensor. For example, the first collection medium assembly storage chamber 160 may be configured such that a plurality of collection medium assemblies 150 are sequentially and continuously fed from the first collection medium assembly storage chamber 160 to the internal sensor portion of the fluid composition sensor. In various embodiments, the collection medium assembly storage chamber 160 may include an actuator element 161 configured to selectively apply force to one of a plurality of collection mediums stored within the first collection medium assembly storage chamber 160 (e.g., in a loading position) in order to move the collection medium assembly 150 from the collection medium assembly storage chamber 160 toward the internal sensor portion of the housing 101 of the fluid composition sensor (e.g., to align with the impactor nozzle 104). For example, in the exemplary embodiment shown in Figure 16, the actuator element 161 of the first collection medium assembly storage chamber 160 may be configured to apply a lateral force to the collection medium assembly 150, which is positioned in a loading position (e.g., on top of a stack of collection medium assemblies), so as to discharge the collection medium assembly 150 from the first collection medium assembly storage chamber 160 into the internal sensor portion of the fluid composition sensor. As described herein, the first collection medium assembly storage chamber 160 may be positioned close to the housing of the fluid composition sensor so that the housing can be configured to receive the collection medium assembly 150 discharged from the collection medium assembly storage chamber 160.

[0074] In various embodiments, the fluid composition sensor may include a second collection medium assembly storage chamber 164 configured to store a plurality of used collection medium assemblies 150 discharged from the fluid composition sensor housing (for example, a collection medium assembly 150 located within the internal sensor portion and comprising a collection medium 106 including a surface through which a fluid volume has passed, such that one or more particles from at least one fluid volume are contained therein). For example, the second collection medium assembly storage chamber 164 may be configured to receive a plurality of collection assemblies 150 that are sequentially and continuously fed from the internal sensor portion of the fluid composition sensor to the second collection medium assembly storage chamber 168. The second collection medium assembly storage chamber 164 may have receiving openings in one or more walls of the chamber, which are configured to allow one or more collection medium assemblies 150 discharged from the housing to pass through the receiving openings so that one or more collection medium assemblies 150 can be fed from the internal portion of the fluid composition sensor to the second collection medium assembly storage chamber 164. In various embodiments, the receiving opening may be equipped with a receiving door that can be selectively opened and closed to facilitate the selective reception of the collection medium assembly 150.

[0075] As described herein, the fluid composition sensor may be configured to discharge the used collection medium 106 and reintroduce the unused collection medium 106 to the inner sensor portion when it determines that at least substantially the entire volume of the sample fluid has passed across the surface of the collection medium 106. In various embodiments, the fluid composition sensor may be configured to receive an unused collection medium assembly 150 (e.g., unused collection medium 106) from a first collection medium assembly storage chamber 160 and to feed the used collection medium 106 to a second collection medium assembly storage chamber 164 at either substantially the same time (e.g., simultaneously) or at different time points (e.g., sequentially).

[0076] Figure 17 shows a cross-sectional view of an exemplary fluid composition sensor in an open configuration, the exemplary fluid composition sensor comprising a plurality of collection medium assemblies 150 arranged on an alignment tape. As shown in Figure 17, the plurality of collection medium assemblies 150 arranged on the alignment tape may be arranged to define a row of collection medium assemblies 150 extending along the length of the alignment tape. In various embodiments, the alignment tape may be movable in a direction at least substantially parallel to a linear axis extending along the length of the alignment tape, so that the plurality of collection medium assemblies 150 (e.g., including a plurality of collection mediums 106) arranged on the alignment tape can move relative to the internal sensor portion of the housing of the fluid composition sensor. In various embodiments, at least a portion of the alignment tape may be wound around both a first alignment tape spool 165A and a second alignment tape spool 165B, and these alignment tape spools may be arranged collectively so that at least a portion of the alignment tape can extend between them. The first alignment tape spool 165A and the second alignment tape spool 165B may be further configured such that at least one collection medium assembly 150 can be positioned on at least a portion of the alignment tape extending between them. For example, the fluid composition sensor may be configured such that the collection medium assembly 150 positioned on at least a portion of the alignment tape extending between the first alignment tape spool 165A and the second alignment tape spool 165B can be positioned within an internal sensor portion at least substantially adjacent to the nozzle outlet of the impactor nozzle 104.

[0077] In various embodiments where the fluid composition sensor is in an open configuration, as illustrated, the alignment tape may be configured such that the multiple collection media 106 can move relative to the fluid composition sensor housing (e.g., linearly shift) so that new (e.g., unused) collection media 106 of the multiple collection media assemblies 150 can be exposed to the fluid volume flowing through the impactor nozzle 104. For example, the alignment tape may be configured to move relative to the fluid composition sensor housing at least in part on the rotation of the first alignment tape spool 165A and the second alignment tape spool 165B. The first alignment tape spool 165A and the second alignment tape spool 165B may be configured to rotate in sync (e.g., at the same speed and in the same direction of rotation) so that the portion of the alignment tape extending between them maintains a configuration where one or more collection media 106 placed on it are at least substantially perpendicular to the central axis of the impactor nozzle 104.

[0078] Figures 18A to 18D are schematic diagrams of exemplary apparatus according to various embodiments described herein. Specifically, Figures 18A to 18D schematically show exemplary apparatus having various impactor nozzle configurations according to various embodiments described herein. As described herein, the fluid composition sensor may comprise an illumination source 116, an impactor nozzle 104, a collection medium 106 disposed on a transparent substrate 108, and an imaging device 110. In various embodiments, the fluid composition sensor may be configured to receive a fluid volume containing a plurality of particles. The fluid composition sensor may be further configured to facilitate engagement between the fluid volume and the collection medium 106 by utilizing the impactor nozzle 104 to orient the fluid volume toward the receiving surface of the collection medium 106 in a flow direction at least substantially perpendicular to the collection medium 106, so that at least a portion of the plurality of particles in the fluid volume can be disposed in the collection medium 106.

[0079] As described herein, the impactor nozzle 104 may include a nozzle inlet configured to receive at least a portion of the fluid volume received by a fluid composition sensor, a nozzle outlet, and a plurality of side walls extending between the nozzle inlet and the nozzle outlet. Each of the plurality of side walls of the impactor nozzle may include an inner side wall 104A and an outer side wall 104B. In various embodiments, the nozzle inlet may have a nozzle inlet cross-sectional area at least partially defined by the outer circumference formed by each of the inner side walls 104A of the plurality of side walls at the nozzle inlet. Similarly, the nozzle outlet may have a nozzle outlet cross-sectional area at least partially defined by the outer circumference formed by each of the inner side walls 104A of the plurality of side walls at the nozzle outlet. In various embodiments, the impactor nozzle 104 may further define a central nozzle axis extending perpendicularly between the nozzle inlet and the nozzle outlet.

[0080] As shown in Figure 18A, the impactor nozzle 104 may comprise a first nozzle portion 104C and a second nozzle portion 104D, both of which may be at least partially defined by a plurality of sidewall portions of the impactor nozzle 104. The first nozzle portion 104C may comprise a portion of the impactor nozzle 104 that is at least partially defined by at least one tapered inner sidewall extending between the nozzle inlet and the intermediate nozzle position 104E. The second nozzle portion 104D may comprise a portion of the impactor nozzle 104 that is at least partially defined by at least a portion of one or more inner sidewalls 104A extending between the intermediate nozzle position 104E and the nozzle outlet. As described herein, the intermediate nozzle position 104E may include an intermediate nozzle cross-sectional area and may be defined by a plane disposed between the first nozzle portion 104C and the second nozzle portion 104D at least substantially perpendicular to the central axis of the impactor nozzle 104. In various embodiments, the first nozzle section 104C may have a tapered shape in which the nozzle inlet cross-sectional area is larger than the intermediate nozzle cross-sectional area. Furthermore, in various embodiments, the second nozzle section may be configured such that the nozzle outlet cross-sectional area is larger than, smaller than, or at least substantially the same as, the intermediate nozzle cross-sectional area. For example, as shown in Figure 18A, the impactor nozzle 104 is configured such that the nozzle outlet cross-sectional area and the intermediate nozzle cross-sectional area are substantially the same size. As described, the variable cross-sectional areas of the various sections of the impactor nozzle 104 may be configured to increase the velocity of the fluid volume flowing through the nozzle (e.g., the multiple particles in the nozzle) so that at least a portion of the multiple particles in the fluid volume have enough momentum to collide with the collection medium 106 and be placed in the collection medium 106, thereby inducing laminar flow.

[0081] In various embodiments, the illumination source 116 may be a laser, lamp, light-emitting diode (LED), etc., capable of generating one or more rays 300 (e.g., ultraviolet light, visible light, infrared light, or polychromatic light) that can be emitted toward the collection medium 106. For example, the illumination source 116 may be configured to emit one or more rays 300 in the emission direction such that the rays engage with the collection medium 106 and illuminate one or more particles arranged in the collection medium 106. Furthermore, as described herein, the imaging device 110 of the fluid composition sensor may be configured to utilize one or more rays 300 to capture an image of one or more of the plurality of particles 120 received by the collection medium 106 using one or more imaging techniques, such as in situ imaging (e.g., lensless holography).

[0082] In various embodiments, the fluid composition sensor may be configured such that one or more illumination sources 116 are positioned relative to the central nozzle axis of the impactor nozzle 104. For example, as shown in Figures 18A to 18D, the fluid composition sensor may be configured such that the illumination source 116 is at least substantially aligned with the central nozzle axis of the impactor nozzle 104. In such a configuration, the illumination source 116 emits one or more rays 300 in an emission direction that extends at least substantially the same as the direction of the central nozzle axis, so that at least a portion of one or more rays 300 may extend through both the nozzle inlet and nozzle outlet of the impactor nozzle 104 to illuminate one or more particles placed in the collection medium 106. In various embodiments, as one or more rays 300 extend away from the illumination source 116 toward the collection medium 106 in the emission direction, one or more rays 300 may spontaneously diverge from the emission direction, so that one or more rays 300 can define a ray emission angle. In such cases, one or more rays may collectively embody a conical ray that is at least partially defined by its outer edge, the cross-sectional area of ​​which increases as the ray extends toward the collecting medium 106 (e.g., along the central axis of the nozzle 104). In various embodiments, the ray angle may correspond to the angle measured between the original emission direction of the ray (e.g., the central axis of the impactor nozzle 104) and the outer edge of one or more rays (e.g., divergent rays).

[0083] As shown in Figure 18A, the divergent ray 300 (including one or more rays) may comprise an outer edge and an internal ray portion 301 defined by a portion of the divergent ray inside the outer edge. For example, the divergent ray 300 emitted from the illumination source 116 may be at least partially defined by the outer edge 310. Furthermore, the divergent ray 300 may be further defined at least partially by an outer ray angle 311 corresponding to a divergence angle measured at the outer edge 310 (for example, an angle measured between the outer edge 310 and the central axis of the impactor nozzle 104). For example, in various embodiments, at least a portion of the divergent ray 300 may be constrained by the intermediate nozzle position 104E.

[0084] In various embodiments, at least a portion of the inner portion 301 of the divergent ray 300 may have a ray angle small enough to be emitted from the illumination source 116 and travel along the emission path to the collecting medium 106 without substantially engaging with the side wall of the impactor nozzle 104. For example, the impactor nozzle 104 may be configured such that a portion of the inner portion 301 of the divergent ray 300, defined by the intermediate edge 320 and the intermediate ray angle 321, can extend between the illumination source 116 and the collecting medium 106 through both the nozzle inlet and nozzle outlet without substantially engaging with the internal side wall 104A of the impactor nozzle 104.

[0085] Furthermore, in various embodiments, the impactor nozzle 104 may be configured such that at least a portion of the divergent rays 300 traveling through the interior of the impactor nozzle 104 can be incident on one or more of the inner side walls 104A. In such cases, the portion of the divergent rays incident on the inner side walls 104A can be reflected and / or scattered by the inner side walls 104A. For example, as shown, a portion of the inner portion 301 of the divergent rays 300, defined by a ray angle greater than the intermediate ray angle 321 (e.g., the outer ray angle 321) and extending radially between the intermediate edge 320 and the outer edge 310, can be incident on the inner side walls 104A of the impactor nozzle 104. Thus, a reflected portion 322 of the divergent rays 300 can be generated. As shown, the reflected portion 322 may correspond to the portion of the inner portion 301 of the divergent rays 300 that is incident on the inner side wall of the second nozzle portion 104D. For example, when the reflective portion 322 engages with the inner side wall 104A, it may be redirected through the nozzle exit to move in a reflection direction substantially different from the emission direction defined in the illumination source 116 by one or more rays corresponding to the reflective portion 322. In various embodiments, at least a portion of the reflective portion 322 of the divergent ray 300 may travel and illuminate the collection medium 106 and / or the imaging device 110. In such cases, the reflective portion 322 of the divergent ray 300 may affect the performance of the imaging device 110 and cause optical interference, which may manifest, for example, as spatial fluctuations in the apparent illumination intensity captured by the imaging device 110. In various embodiments, the reflective portion 322 may generate image noise that can at least partially obscure one or more features of one or more particles placed in the collection medium 106, as described herein.

[0086] Figures 18B to 18C schematically illustrate exemplary apparatuses comprising various impactor nozzle configurations according to various embodiments described herein. Specifically, Figures 18B to 18C schematically illustrate exemplary apparatus comprising an impactor nozzle 104 configured to avoid the generation of reflected ray portions as described herein, which are caused by a portion of divergent rays 300 entering the sidewall of the impactor nozzle 104. As shown, the impactor nozzle 104 may be configured such that the second nozzle portion 104D may have at least one tapered inner sidewall extending between the intermediate nozzle position 104E and the nozzle exit. For example, as shown in Figure 18B, the inner sidewall 104A in the second portion of the impactor nozzle 104 may have a tapered shape at least partially defined by a taper angle 143A such that the nozzle exit cross-sectional area of ​​the impactor nozzle 104 is larger than the intermediate nozzle cross-sectional area. In various embodiments, the taper angle 143 of the second nozzle portion may correspond to at least one ray emission angle (e.g., an outer ray emission angle 311) of the divergent rays 300 emitted from the illumination source 116. For example, the taper angle 143 of the second nozzle portion may be at least the same magnitude as the outer ray emission angle 311 corresponding to the outer ray 310 as described herein, and therefore at least the same magnitude as each of the ray emission angles corresponding to one or more rays defined by the divergent rays 300. In such exemplary configurations of the impactor nozzle 104, the inner wall 104A of the second nozzle portion of the impactor nozzle 104 can avoid interference with the outer edge 310 of the divergent rays 300, thereby avoiding the generation of reflected ray portions as described herein.

[0087] As shown in Figure 18C, in various embodiments, the taper angle 143A may reflect differences in the configuration of the illustrated internal sidewall 104A and an exemplary internal sidewall having a straight configuration (for example, as shown in Figure 18A, where the nozzle outlet cross-sectional area and the intermediate nozzle cross-sectional width are at least substantially similar). In various embodiments, the taper angle 143A may be small enough to minimize its effect on the velocity and / or laminar flow of the exemplary fluid volume flowing therein, as described herein. For example, the taper angle 143A may be at least substantially 1 to 10 degrees (e.g., 2 to 5 degrees), at least in part based on the configuration of the illumination source 116. In various embodiments, the taper angle 143A may be at least in part defined by the intermediate nozzle cross-sectional width and the distance between the illumination source 116 and the intermediate nozzle position. For example, in various embodiments, the taper angle Q143A may be defined by the following formula:

number

[0088] Furthermore, while various exemplary embodiments described herein are shown to have straight (e.g., straight) sidewalls, it should be understood that in various embodiments, one or more of the sidewalls of the impactor nozzle 104 may have at least a partially curved configuration. For example, as shown in Figures 18B to 18C, the transition between the first nozzle portion and the second nozzle portion (e.g., around the intermediate nozzle position) may define a radius of curvature. As another example, the inner wall 104A of the impactor nozzle 104 may be at least partially curved so that some of the divergent rays 200 do not enter the sidewall 104A.

[0089] Figure 18D schematically shows an exemplary apparatus comprising an impactor nozzle configuration according to various embodiments described herein. Specifically, Figure 18D schematically shows an exemplary apparatus comprising an impactor nozzle 104 configured to avoid the generation of reflected ray portions as described herein, which are caused by a portion of the divergent rays 300 entering the side walls of the impactor nozzle 104. As shown, the impactor nozzle 104 may be configured such that a second nozzle portion extending between the intermediate nozzle position and the nozzle exit has a straight shape, and the nozzle exit cross-sectional area and the intermediate nozzle cross-sectional width are at least substantially the same. For example, each of the internal side walls 104A on either side of the central nozzle axis of the impactor nozzle may be defined to be at least substantially parallel such that the taper angle 143 of the second nozzle portion can be at least substantially zero.

[0090] In various embodiments, to avoid interference with the divergent rays 300 (e.g., with the outer edge 310), at least a portion of one or more of the multiple sidewalls of the impactor nozzle may be laterally moved outward (e.g., away from the central nozzle axis) to increase the nozzle outlet cross-sectional area and / or intermediate cross-sectional area. Displacing at least a portion of one or more of the multiple sidewalls may effectively widen the second nozzle portion, thereby allowing the divergent rays 300 to pass through the impactor nozzle 104 without interfering with one or more of the internal sidewalls 104A. As described herein, in such embodiments, the nozzle sidewalls may be moved outward (e.g., away from the central nozzle axis) for the purpose of particle analysis (e.g., image acquisition), or inward (e.g., towards the central nozzle axis) for the purpose of particle collection (e.g., control of fluid flow toward the collection medium 106).

[0091] As shown in Figure 18D, the portion of one or more of the multiple side walls defining the nozzle outlet may be displaced by a first side wall displacement distance 144A in the direction away from the central axis of the nozzle. In various embodiments, one or more of the multiple side walls may be displaced by a different distance in the direction away from the central axis, for example, a second side wall displacement distance 144B. Alternatively or additionally, in various embodiments, one or more of the multiple side walls may be displaced by substantially the same distance in the direction away from the central axis of the nozzle, for example, such that the first side wall displacement distance 144A and the second side wall displacement distance 144B are at least substantially the same. In various embodiments, one or more of the side wall displacement distances 144A, 144B may at least partially correspond to the outer ray emission angle 311 of the divergent rays 300 emitted from the illumination source 116. For example, in various embodiments, one or more of the sidewall displacement distances 144A and 144B may be defined at least partially by the outlet nozzle dimensions, the distance between the illumination source 116 and the nozzle outlet, and the divergence angle of the illumination beam(s).

[0092] In various embodiments, as described herein, the fluid composition sensor may include an exemplary impactor nozzle 104 which can be selectively configured between a first nozzle configuration and a second nozzle configuration. For example, in various embodiments, the first nozzle configuration may correspond to a particle collection function of the fluid composition sensor, and the second nozzle configuration may correspond to a particle analysis function of the fluid composition sensor. As described herein, the particle collection function of the fluid composition sensor may correspond to the fluid composition sensor receiving a fluid volume containing a plurality of particles and using the impactor nozzle 104 to direct the fluid volume toward the receiving surface of the collection medium 106 in a flow direction at least substantially perpendicular to the collection medium 106, so that at least a portion of the plurality of particles in the fluid volume can be disposed in the collection medium 106. For example, to realize the particle collection function, the impactor nozzle 104 may be configured such that its nozzle outlet is positioned at least substantially adjacent to the collection medium 106. Furthermore, as described herein, the particle analysis function of the fluid composition sensor may correspond to the fluid composition sensor capturing an image of one or more particles received by the collection medium 106 and determining at least one particle characteristic of the fluid volume received by the fluid composition sensor based at least in part on the image. For example, to realize the particle analysis function of the fluid composition sensor, the illumination source 116 may be configured to emit one or more rays of light to engage with the collection medium 106 and illuminate one or more particles received by the collection medium 106, as described herein. As described herein, in various embodiments, the fluid composition sensor may be configured to determine and / or identify one or more particle loading conditions in the collection medium 106 based at least in part on one or more detected characteristics of one or more emitted rays of light emitted from an exemplary illumination source 116.As a non-limiting example, a fluid composition sensor (e.g., controller 200) may be configured to determine one or more particle loading conditions in the collection medium 106 at least partially based on the total light intensity of at least a portion of the collection medium 106 within the field of view of the imaging device, and at least a portion of the collection medium 106 is illuminated by one or more rays emitted from an illumination source 116.

[0093] As described herein, in various embodiments, the particle collection function and particle analysis function of the fluid composition sensor may be performed sequentially, such that the fluid composition sensor may be configured to initiate the particle analysis function when it determines that the entire volume of the sample fluid has passed across the surface of the collection medium 106 and therefore the need for the particle collection function of the fluid composition sensor has ceased, at least temporarily. In various embodiments, the apparatus 10 may include a controller 200, which is described in further detail herein, and the controller is configured to generate and / or transmit one or more signals configured to terminate the particle collection operation of the fluid composition sensor 110 by stopping the operation of the pump 112 of the sensor 110 (for example, by adjusting the pump 112 from an "on" operation configuration to an "off" configuration), at least in part based on the detection by the controller 200 of one or more particle load conditions in the collection medium 106. For example, the controller 200 may be configured to generate and / or transmit one or more signals configured to terminate the particle collection operation of the fluid composition sensor 110 by stopping the operation of the pump 112 of the sensor 110 (for example, by adjusting the pump 112 from an "on" operation configuration to an "off" configuration) based on the determination that the detected total light intensity of the collection medium is below a predetermined light intensity threshold. In various embodiments, the particle loading conditions may be defined at least in part by the spatial arrangement of multiple particles placed in the collection medium (e.g., particle clustering, spikes, particle contact, particle overlap, etc.), the percentage of particle coverage, the average grayscale of all pixels in the captured image, the mass of particulate matter, the total light intensity, the amount of particles collected, the calculated particle density, etc.

[0094] Accordingly, in various embodiments, the fluid composition sensor may be configured to selectively switch between a first nozzle configuration corresponding to a particle collection function and a second nozzle configuration corresponding to a particle analysis function. For example, in one exemplary embodiment, the first nozzle configuration may be embodied by the exemplary nozzle configuration shown in Figure 18A, which is described in more detail herein. The variable cross-sectional areas of various sections of the impactor nozzle 104 and the minimized nozzle outlet cross-sectional area may be configured to increase the velocity of the fluid volume flowing through the nozzle and induce laminar flow so that at least a portion of the multiple particles in the fluid volume can be disposed in the collection medium 106 upon collision with the collection medium 106. Furthermore, in one exemplary embodiment, the second nozzle configuration may be embodied by the exemplary nozzle configuration shown in Figure 18D, which is described in more detail herein. In this case, the particle analysis function of the fluid composition sensor may be realized by the emission of one or more rays (e.g., divergent rays 300) from the illumination source 116, and the impactor nozzle 104 in the second nozzle configuration can avoid the generation of reflected / scattered ray portions caused by a portion of the divergent rays 300 entering the sidewalls of the impactor nozzle 104, as described herein. To avoid interference with the divergent rays 300 (e.g., outer edge portion 310), at least a portion of one or more of the multiple sidewalls of the impactor nozzle 104 may be moved laterally away from the central nozzle axis to increase the nozzle exit cross-sectional area and / or intermediate cross-sectional area. Displacing at least a portion of one or more of the multiple sidewalls may widen at least a portion of the impactor nozzle 104, allowing the divergent rays 300 to pass through the impactor nozzle 104 without interfering with one or more of the internal sidewalls 104A.

[0095] In various embodiments, the impactor nozzle 104 may be selectively configured between a first nozzle configuration and a second nozzle configuration, at least partially based on either applying a force and / or removing an applied force. For example, in various embodiments, the fluid composition sensor may be configured to switch the impactor nozzle 104 from a first nozzle configuration to a second nozzle configuration by applying a force outward (e.g., away from the central nozzle axis) to one or more of the multiple side walls of the impactor nozzle 104, thereby displacing at least a portion of the side wall by a first side wall displacement distance 144A in the corresponding outward direction. In such a case, the fluid composition sensor may be configured to selectively return the impactor nozzle 104 from the second nozzle configuration to the first nozzle configuration by removing the outward force applied to one or more of the multiple side walls of the impactor nozzle 104, or by applying an equal force inward (e.g., in the opposite direction to the outward direction).

[0096] Alternatively, in various embodiments, the fluid composition sensor may be configured to switch the impactor nozzle 104 from a first nozzle configuration to a second nozzle configuration by removing an inward force (for example, toward the central nozzle axis) applied to one or more of the side walls of the impactor nozzle 104, thereby displacing at least a portion of the side wall by a first side wall displacement distance 144A in an outward direction substantially opposite to at least the inward direction. In such a case, the fluid composition sensor may be configured to selectively return the impactor nozzle 104 from the second nozzle configuration to the first nozzle configuration by reapplying an inward force to one or more of the side walls of the impactor nozzle 104, thereby retracting at least a portion of the side wall by the first side wall displacement distance 144A in the corresponding inward direction.

[0097] Furthermore, in various embodiments, the impactor nozzle 104 in the second nozzle may be at least partially defined by a central nozzle axis reconfigured around the fluid composition sensor housing with respect to the position of the central nozzle axis defined by the exemplary impactor nozzle of the first nozzle configuration. For example, the entire impactor nozzle 104 may be rotated, shifted, etc., to the second nozzle position as the center of the fluid composition sensor housing, so that the impactor nozzle 104 of the second nozzle configuration can avoid the generation of reflected light portions caused by a portion of divergent light rays 300 entering the impactor nozzle 104.

[0098] Figures 19A to 19C show perspective views of exemplary apparatus according to various embodiments. Specifically, Figures 19A to 19C show exemplary impactor nozzle configurations according to various embodiments described herein. In various embodiments, the impactor nozzle 104 may comprise a plurality of nozzle components (e.g., two components, three components, five components, etc.) that can be joined at least partially to collectively define the impactor nozzle 104. As shown in Figure 19A, the impactor nozzle 104 may comprise two nozzle components, namely a first nozzle component 141 and a second nozzle component 142. In various embodiments, the first nozzle component 141 and the second nozzle component 142 may embody two distinct components of the impactor nozzle 104, and these two distinct components may each be joined at least partially by corresponding components so as to collectively define the impactor nozzle 104. As illustrated and described herein, an exemplary impactor nozzle 104 defined by a first nozzle component 141 and a second nozzle component 142 may comprise a nozzle inlet, a nozzle outlet, and a plurality of side walls extending between the nozzle inlet and the nozzle outlet. Each of the plurality of side walls of the impactor nozzle may comprise an inner side wall and an outer side wall. In various embodiments, the nozzle inlet may comprise a nozzle inlet cross-sectional area at least partially defined by the outer circumference formed by each of the inner side walls of the plurality of side walls at the nozzle inlet. Similarly, the nozzle outlet may comprise a nozzle outlet cross-sectional area at least partially defined by the outer circumference formed by each of the inner side walls of the plurality of side walls at the nozzle outlet. In various embodiments, the impactor nozzle 104 may further comprise a central nozzle axis extending perpendicularly between the nozzle inlet and the nozzle outlet. Furthermore, as shown in Figure 19A, the first nozzle component 141 and the second nozzle component 142 may be configured such that the impactor nozzle 104 comprises a first nozzle portion, a second nozzle portion, and an intermediate nozzle position located between them.The first nozzle component 141 and the second nozzle component 142 may be configured such that the first and second nozzle portions of the impactor nozzle 104 are configured according to various exemplary embodiments described in further detail herein. In various embodiments, the first nozzle component 141 and the second nozzle component 142 may have different properties, such as material composition.

[0099] Figure 19B shows a perspective view of an exemplary first nozzle portion 141 according to various embodiments. In various embodiments, the first nozzle portion 141 may include a first nozzle portion inlet and an upper portion defining one or more first nozzle portion sidewalls. In various embodiments, one or more first nozzle portion sidewalls may define at least a portion of a plurality of sidewalls of the impactor nozzle 104. As shown, the first nozzle portion 141 includes two first nozzle portion sidewalls 141A, 141B.

[0100] Figure 19C shows a perspective view of an exemplary second nozzle portion 141 according to various embodiments. In various embodiments, the second nozzle portion 142 may include an upper portion defining a second nozzle portion inlet and one or more second nozzle portion sidewalls. In various embodiments, one or more second nozzle portion sidewalls may define at least a portion of a plurality of sidewalls of the impactor nozzle 104. As shown, the second nozzle portion 142 includes two second nozzle portion sidewalls 142A, 142B.

[0101] In various embodiments, as described herein, the first nozzle component 141 and the second nozzle component 142 may comprise corresponding elements that can be joined together to collectively define the impactor nozzle 104. For example, the upper parts of the first nozzle component 141 and the second nozzle component 142 may be configured to engage with each other in a stacked configuration. The respective upper parts may be at least substantially aligned to at least partially collectively define the nozzle inlet of the impactor nozzle 104. Furthermore, in various embodiments, one or more sidewalls of both the first nozzle component 141 and the second nozzle component 142 may be configured to engage with each other to define multiple sidewalls of the impactor nozzle 104. For example, as shown, the first nozzle component 141 is configured such that two first nozzle component sidewalls 141A, 141B and two second nozzle component sidewalls 142A, 142B engage with the second nozzle component 142 to collectively define multiple sidewalls of the impactor nozzle 104. The two first nozzle component sidewalls 141A, 141B and the two second nozzle component sidewalls 142A, 142B may be arranged to collectively define the first nozzle portion, the second nozzle portion, and the nozzle outlet.

[0102] Figures 20A to 20B show exemplary impactor nozzle configurations according to various embodiments described herein. Specifically, Figures 20A to 20B show exemplary impactor nozzle configurations in which one or more of a plurality of sidewalls can be selectively reconfigured. In various embodiments, as described herein, the exemplary impactor nozzle may be selectively reconfigured (for example, from a first nozzle configuration to a second nozzle configuration) at least partially based on one or more environmental conditions. For example, in the exemplary embodiment described herein with reference to Figure 18D, the impactor nozzle 104 may be selectively reconfigured from a first nozzle configuration to a second nozzle configuration by moving at least one portion of one or more of the plurality of sidewalls of the impactor nozzle laterally outward (for example, away from the central nozzle axis) to increase the nozzle outlet cross-sectional area and / or intermediate cross-sectional area, thereby effectively widening at least a portion of the impactor nozzle 104.

[0103] As shown in Figure 20A, the impactor nozzle 104 may be configured such that at least a portion of each of the two first nozzle component sidewalls 141A, 141B and the two second nozzle component sidewalls 142A, 142B, which collectively define the plurality of sidewalls of the impactor nozzle 104, can be independently movable with respect to the central nozzle axis of the impactor nozzle 104. As shown in the figure, each of the plurality of sidewalls of the exemplary impactor nozzle 104 (e.g., the two first nozzle component sidewalls 141A, 141B and the two second nozzle component sidewalls 142A, 142B) is laterally displaced outward.

[0104] Figure 20B shows a top cross-sectional view of an exemplary impactor nozzle 104, at least partially defined by its nozzle configuration, in which multiple sidewalls are laterally displaced outward, away from the central nozzle axis 104F. Each of the multiple sidewalls of the impactor nozzle 104 may move at least substantially independently of each of the other sidewalls of the multiple sidewalls. For example, as shown, the configuration of the first nozzle component sidewall 141A may define a first sidewall displacement distance 144A, the first sidewall displacement distance 144A extending outward from the central nozzle axis 104F. Furthermore, as shown, the configuration of the first nozzle component sidewall 141B may define a second sidewall displacement distance 144B, the second sidewall displacement distance 144B extending outward from the central nozzle axis 104F. As shown in the figure, the configuration of the second nozzle component side wall 142A may define a third side wall displacement distance 145A, the third side wall displacement distance 145A extending outward from the central nozzle axis 104F. In addition, as shown in the figure, the configuration of the second nozzle component side wall 142B may define a fourth side wall displacement distance 145B, the fourth side wall displacement distance 145B extending outward from the central nozzle axis 104F. In various embodiments, the side wall displacement distances 144A, 144B, 145A, and 145B may include either the same distance or different distances. Particle penetration depth

[0105] As discussed herein, each of one or more of the plurality of particles 120 may have one or more particle properties, such as particle size, particle mass, particle density, particle velocity (e.g., particle linear velocity), particle cross-sectional area, and particle shape. In various embodiments, the particle size may be approximated based on the particle diameter. In various embodiments, the particle velocity may be approximated at least in part based on a known flow rate of the fluid moving through the apparatus 10. In various embodiments, a particle moving at a certain particle velocity in the airflow direction 130 toward the collection medium 106 may further have particle momentum, which may be influenced at least in part by one or more particle properties. When the particle is at the receiving surface 105 of the collection medium 106, the particle may have an initial momentum. The depth to which the particle is subsequently embedded in the collection medium (i.e., particle embedding depth 121) is at least in part directly related to the particle's initial momentum. In various embodiments, the particle embedding depth 121 may be related to the particle size, particle mass, and particle velocity.

[0106] As shown in Figure 2, each particle of the multiple particles 120 in the collection medium 106 may further define both the embedding depth 121 and the focal depth 122. In various embodiments, the particle embedding depth 121 may include the distance between the receiving surface 105 of the collection medium 106 and the position where the particle is stationary within the collection medium 106. As described herein, the particle may move through the receiving surface 105 in the airflow direction 130 at a certain velocity and remain in the collection medium 106 before reaching the back surface 107. The depth to which the particle is embedded in the collection medium 106 may define the particle embedding depth 121. The particle embedding depth 121 may correlate with at least the initial momentum of the particle at the receiving surface 105 of the collection medium, which should be dissipated by the collection medium 106. In various embodiments, the particle embedding depth 121 may be influenced by the type of collection medium, particle shape (e.g., particle cross-sectional area, particle orientation), ambient temperature, and / or ambient humidity. In various embodiments, for example, a compensation factor may be applied to the estimated particle mass to account for the particle cross-sectional area, because a larger particle cross-sectional area reduces the particle embedment depth by dispersing kinetic energy more quickly within the collection medium. In various embodiments, a compensation factor may be applied to the estimated particle mass to account for ambient temperature and / or ambient humidity, because both ambient temperature and ambient humidity may affect the particle embedment depth by either increasing or decreasing the resistance the particles experience from the collection medium, thereby affecting the particle embedment depth. In various embodiments, ambient temperature and humidity may be measured by either the apparatus or one or more remote sensors configured to transmit temperature and humidity data to the apparatus.

[0107] In various embodiments, the embedment depth 121 of one or more of the plurality of particles 120 may be determined by the controller 200 based at least in part on the depth of focus 122. In various embodiments, the embedment depth 121 of a particle in the collection medium 106 may be calculated by subtracting the measured depth of focus 122 of the particle from the sum of the thickness of the collection medium, the thickness of the transparent substrate, and the distance between the transparent substrate 108 and the imaging device 110. In various embodiments, the depth of focus 122 of the particle may include the distance between the imaging device 110 and the position where the particle is stationary in the collection medium 106. In various embodiments, as shown in Figure 2, the depth of focus 122 of a particle in the collection medium 106 may include the sum of the distance between the position where the particle is stationary in the collection medium 106 and the back surface 107 of the collection medium 106, the thickness of the transparent substrate 108, and the distance between the transparent substrate 108 and the imaging device 110. In various embodiments, the depth of focus 122 of one or more of the multiple particles 120 may be determined by the controller 200 using one or more imaging techniques, such as a computational technique (e.g., angular spectral propagation, ASP) or a mechanical technique (e.g., optomechanical adjustment). In various embodiments, the optomechanical adjustment may include mechanical adjustment of one or more components of the lens-based imaging device 110 to optimize the particle image. In various embodiments, the determination of the depth of focus may further include collecting data corresponding to the adjustment of one or more components of the imaging device. controller

[0108] As shown in Figures 1 to 3, the apparatus 10 may include a controller 200 configured to determine the particle embedding depth 121 of one or more particles among a plurality of particles 120 in the collection medium 106, and to determine the approximate collective mass of the plurality of particles present in the fluid volume, at least partially based on the particle embedding depth 121 of one or more particles among the plurality of particles 120. As shown in Figure 3, the controller 200 may include a memory 201, a processor 202, an input / output circuit 203, a communication circuit 205, an imaging device data repository 107, a collection medium characteristics database 204, a particle imaging circuit 206, a particle type identification circuit 207, a particle mass concentration calculation circuit 208, and a fluid composition sensor configuration circuit 209. The controller 200 may be configured to perform the operations described herein. Components are described with respect to functional limitations, but it should be understood that a particular implementation will necessarily involve the use of certain hardware. It should also be understood that certain components of the components described herein may have similar or common hardware. For example, since both sets of circuits perform their respective functions by utilizing the same processor, network interface, storage medium, etc., there is no need for redundant hardware for each set of circuits. Therefore, when the term “circuit” is used herein in relation to the components of the controller 200, it should be understood to include specific hardware configured to perform the functions associated with the particular circuit described herein.

[0109] The term “circuit” should be broadly understood to include hardware, and in some embodiments, software for configuring the hardware. For example, in some embodiments, the “circuit” may include processing circuits, storage media, network interfaces, input / output devices, etc. In some embodiments, other elements of the controller 200 may provide or complement the functionality of a particular circuit. For example, the processor 202 may provide processing functions, the memory 201 may provide storage functions, the communication circuit 205 may provide network interface functions, and so on.

[0110] In some embodiments, the processor 202 (and / or a coprocessor or any other processing circuit assisting the processor or otherwise associated with the processor) may communicate with the memory 201 via a bus for passing information between components of the device. The memory 201 may be non-temporary and may include, for example, one or more volatile and / or non-volatile memories. For example, the memory 201 may be an electronic storage device (e.g., a computer-readable storage medium). In various embodiments, the memory 201 may be configured to store information, data, content, applications, instructions, etc., to enable the device to perform various functions according to exemplary embodiments of the present disclosure. It will be understood that the memory 201 may be configured to store, partially or whole, any electronic information, data, data structures, embodiments, examples, figures, processes, operations, techniques, algorithms, instructions, systems, devices, methods, lookup tables, or computer program products described herein, or any combination thereof. As a non-limiting example, the memory 201 may be configured to store particle size data, particle type data, particle embedding depth data, particle image data, particle shape data, particle cross-sectional area data, particle mass data, particle density data, and particulate matter mass concentration data associated with fluid volume. In various embodiments, the memory may be further configured to store one or more particle embedding depth-momentum lookup tables.

[0111] The processor 202 may be embodied in several different ways, for example, by including one or more processing units configured to operate independently. Additionally or alternatively, the processor may include one or more processors configured in tandem via a bus to enable independent execution of instructions, pipelines, and / or multithreads. The use of the term “processing circuit” may be understood to include single-core processors, multi-core processors, multiple processors within a device, and / or remote processors or “cloud” processors.

[0112] In exemplary embodiments, the processor 202 may be configured to execute instructions stored in memory 201 or instructions that are otherwise accessible to the processor. Alternatively or additionally, the processor may be configured to perform hardcoded functions. Thus, whether configured by hardware methods, software methods, or a combination thereof, the processor may represent entities (e.g., physically embodied in the circuit) that can perform the operations according to embodiments of the present disclosure while configured accordingly. Alternatively, as another example, if the processor is embodied as an executable of software instructions, the instructions may specifically configure the processor to perform the algorithms and / or operations described herein when the instructions are executed.

[0113] In some embodiments, the controller 200 may include an input-output circuit 203 which may then communicate with a processor 202 to provide output to the user, and in some embodiments may receive input such as commands provided by the user. The input-output circuit 203 may include a user interface such as a graphical user interface (GUI), and may include a display which may include a web user interface, GUI application, mobile application, client device, or any other suitable hardware or software. In some embodiments, the input-output circuit 203 may also include a display device, a display screen, a touchscreen, a touch area, soft keys, a keyboard, a mouse, a microphone or other user input elements, a speaker (e.g., a buzzer), a light-emitting device (e.g., a red light-emitting diode (LED), a green LED, a blue LED, a white LED, an infrared (IR) LED, an ultraviolet (UV) LED, or a combination thereof), or other input-output mechanisms. The processor 202, the input-output circuit 203 (which may utilize processing circuits), or both may be configured to control one or more functions of one or more user interface elements via computer executable program code instructions (e.g., software, firmware) stored in a non-temporary computer-readable storage medium (e.g., memory 201). The input-output circuit 203 is optional, and in some embodiments, the controller 200 may not include an input-output circuit. For example, if the controller 200 does not interact directly with the user, the controller 200 may generate user interface data for display by one or more other devices, and one or more users may interact directly with those devices and transmit the generated user interface data to one or more of those devices.For example, the controller 200 may use a user interface circuit to generate user interface data for display on one or more display devices and transmit the generated user interface data to those display devices.

[0114] The communication circuit 205 may be a device or circuit embodied in either hardware or a combination of hardware and software configured to receive and / or transmit data to a network and / or any other device, circuit, or module communicating with the device 200. For example, the communication circuit 205 may be configured to communicate with one or more computing devices via a wired (e.g., USB) or wireless (e.g., Bluetooth, Wi-Fi, cellular, etc.) communication protocol.

[0115] In various embodiments, the processor 202 may be configured to communicate with the particle imaging circuit 206. The particle imaging circuit 206 may be a device or circuit embodied in either hardware or a combination of hardware and software configured to receive, process, generate, and / or transmit data such as images captured by the imaging device 110. In various embodiments, the particle imaging circuit 206 may be configured to analyze one or more images captured by the imaging device 110 of the fluid composition sensor 100 to determine which of the plurality of particles 120 present in the collection medium 106 have been newly received by the collection medium 106 during the new particle analysis. The particle imaging circuit 206 may receive first captured particle images and second captured particle images from the imaging device, respectively, captured at first time and second time, where first time represents the start of analysis by the device 10 of one or more of the plurality of particles 120 captured by the collection medium 106, and second time is after first time (occurs after first time). In such a configuration, the device may be configured to distinguish between particles present in the collection medium 106 at the start of particle analysis and newly received particles by the collection medium 106 by comparing the respective particle images captured in a first time and a second time, and identifying any particles from the second captured particle image that were not captured in the first captured particle image. In various embodiments, the particle imaging circuit 206 may be further configured to analyze one or more images captured by the imaging device 110 of the fluid composition sensor 100 to determine the size of one or more particles among a plurality of particles 120 in the collection medium 106. In various embodiments, the particle size may be defined by the cross-sectional area of ​​the particle. In various embodiments, the particle imaging circuit 206 may be configured to determine the particle size of particles having any of a variety of particle sizes. For example, the particle imaging circuit 206 may be configured to determine the particle size of particles having a diameter of about 0.3 to about 100 micrometers (e.g., 2.5 micrometers), and thus a size category to which the particle may be associated, such as PM10, PM4, PM2.5, or PM1.In various embodiments, the controller and / or particle imaging circuit 206 may be further configured to analyze one or more images captured by the imaging device 110 of the fluid composition sensor 100 to determine the shape of each of one or more particles among a plurality of particles 120 in the collection medium 106. In various embodiments, the particle shape may be defined at least partially by the particle cross-sectional area. The particle imaging circuit 206 may be further configured to determine the particle embedment depth 121 of each of one or more particles among the plurality of particles 120 in the collection medium 106 using one or more imaging techniques. The particle imaging circuit 206 may be configured to execute instructions stored in memory 201 for performing one or more imaging techniques, for example. In various embodiments, one or more imaging techniques may include one or more computational methods such as angular spectral propagation (ASP). In other embodiments, optomechanical adjustment may be used as the imaging technique. In various embodiments, the particle imaging circuit 206 may use one or more imaging techniques to determine the depth of focus 122 for each of one or more particles among a plurality of particles 120 in the collection medium. Once the depth of focus for each of one or more particles is determined, the particle imaging circuit 206 may be configured to calculate the embedding depth 121 of each of one or more of the multiple particles 120 in the collection medium 106 using known dimensions of the fluid composition sensor 100, such as the thickness of the collection medium and the distance between the transparent substrate 108 and the imaging device 110. In various embodiments, for example, the embedding depth 121 of a particle in the collection medium 106 may be calculated by subtracting the measured depth of focus 122 of the particle from the sum of the thickness of the collection medium, the thickness of the transparent substrate, and the distance between the transparent substrate 108 and the imaging device 110. The particle imaging circuit 206 may transmit and / or receive data from the imaging device data repository 107. In various embodiments, the particle imaging circuit 206 may be configured to determine the embedding depth of a particle using one or more machine learning techniques.In various embodiments, one or more machine learning techniques used by the particle imaging circuit 206 to determine the particle embedding depth may include using deep supervised learning with one or more labeled datasets of one or more known particle characteristics, such as particle type, particle velocity, particle size, particle shape, and / or any other data generated, transmitted, and / or received by the controller 200, to estimate the particle embedding depth.

[0116] In various embodiments, the processor 202 may be configured to communicate with a particle type identification circuit 207. The particle type identification circuit 207 may be a device or circuit embodied in either hardware or a combination of hardware and software configured to identify the particle type and / or particle species of one or more particles among a plurality of particles 120 received by the collection medium 106. In various embodiments, the plurality of particles 120 in the fluid volume may include one or more particles from a variety of particle types, such as bacteria, pollen, spores, mold, biological particles, soot, inorganic particles, and organic particles. In various embodiments, the particle type identification circuit 207 may use one or more machine learning techniques to determine the particle type and / or particle species of each of the one or more particles among the plurality of particles 120 received by the collection medium 106. In various embodiments, one or more machine learning techniques used by the particle type identification circuit 207 to determine the particle type and / or particle species of one or more of the plurality of particles 120 may include analyzing images captured by the imaging device 110, particle size data, particle shape data, and / or any other data generated, transmitted, and / or received by the controller 200. In various embodiments, the particle type identification circuit 207 may transmit and / or receive data from the imaging device data repository 107. Furthermore, in various embodiments, the particle type identification circuit 207 may be configured to receive determined initial particle velocity data corresponding to one or more of the plurality of particles 120 received by the collection medium 106 from the particulate matter mass concentration calculation circuit 208. In various embodiments, the particle type identification circuit 207 may be configured to compare the determined initial particle velocity for a particle with the particle velocity of the particle approximated at least partially based on a known flow rate of the fluid moving through the fluid composition sensor 100, and to generate velocity comparison data associated with the particle.In various embodiments, the particle type identification circuit 207 may be configured to perform a feedback loop, and one or more velocity comparison data associated with one or more particles among a plurality of particles 120 received by the collection medium 106 may define one or more inputs to a machine learning model to increase the machine learning rate associated with one or more machine learning techniques, as described herein.

[0117] In various embodiments, the apparatus 10 may be configured with or communicate with a collection medium characteristics database 204. The collection medium characteristics database 204 may be stored at least partially in the system's memory 201. In some embodiments, the collection medium characteristics database 204 may be located far from the apparatus 10 but connected to it. The collection medium characteristics database 204 may include information such as one or more particle embedding depth-momentum relationship lookup tables. In various embodiments, the particle embedding depth-momentum relationship lookup table may include a data matrix used to define the relationship between particle embedding depth and particle initial momentum (i.e., the momentum of a particle at the receiving surface 105 of the collection medium 106, where the particle is received at the receiving surface 105 by the collection medium 106 as described herein) for a particular collection medium type. Various particle embedding depth-momentum relationship lookup tables may include data matrices used to define the relationship between particle embedding depth and particle initial momentum for various collection medium types.

[0118] The particulate matter mass concentration calculation circuit 208 may be a device or circuit embodied in either hardware or a combination of hardware and software configured to determine the particulate matter mass concentration in a fluid volume. In various embodiments, the particulate matter mass concentration calculation circuit 208 may be configured to determine the particulate matter mass concentration in a fluid volume based on the approximate collective mass of a plurality of particles present in the fluid volume. In various embodiments, the particulate matter mass concentration calculation circuit 208 may be configured to determine the approximate collective mass of a plurality of particles present in a fluid volume based on the collective mass of a plurality of particles 120 received by the collection medium 106. In various embodiments, the particulate matter mass concentration calculation circuit 208 may be configured to determine the collective mass of a plurality of particles 120 received by the collection medium 106 based on the respective estimated mass of each of the particles 120. In various embodiments, the particulate matter mass concentration calculation circuit 208 may be configured to estimate the respective mass of each of the plurality of particles 120 based at least in part on the respective determined embedment depth of each of the particles.

[0119] In various embodiments, the particulate matter mass concentration calculation circuit 208 may be configured to estimate the mass of a particle among a plurality of particles 120 by retrieving particle-specific data such as particle size data, particle shape data (e.g., particle cross-sectional area data, particle orientation data), and particle embedding depth, and to determine the initial momentum of the particle before it is received by the collection medium 106 based on data in a particle embedding depth-momentum lookup table that correlates the particle embedding depth to the initial momentum of the particle for a given type of collection medium 106. Using the known relationship between momentum, velocity, and mass, where the momentum of a particle is equal to the mass of the particle multiplied by the velocity of the particle, and a known velocity of the particle, i.e., a controlled value based on the airflow velocity in the apparatus 10, the particulate matter mass concentration calculation circuit 208 may be configured to determine the estimated mass of the particle.

[0120] In various embodiments, the particulate matter mass concentration calculation circuit 208 may be configured to determine the estimated mass of particles using one or more machine learning techniques. In various embodiments, the one or more machine learning techniques used by the particulate matter mass concentration calculation circuit 208 to determine the particle mass of particles may include using supervised deep learning with one or more labeled datasets of one or more known particle characteristics, such as particle type, particle velocity, particle embedding depth, various particle weight measurements, and / or any other data generated, transmitted, and / or received by the controller 200, in order to estimate the particle mass. In various embodiments, the particulate matter mass concentration calculation circuit 208 may be configured to apply one or more compensation coefficients to the determined particle mass using one or more machine learning techniques.

[0121] Furthermore, in various embodiments, the particulate matter mass concentration calculation circuit 208 may be configured to determine the estimated density of particles based at least partially on one or more of the following: particle embedding depth, estimated particle mass, particle shape, particle type, and particle size data. In various embodiments, the particulate matter mass concentration calculation circuit 208 may be configured to determine the estimated mass and / or estimated density of each of the multiple particles 120 received by the collection medium 106. In various embodiments, the particulate matter mass concentration calculation circuit 208 may be configured to apply one or more compensation factors to the estimated mass of particles to take into account one or both of the particle conditions related to the particles and the ambient conditions related to the surrounding environment. In various embodiments, for example, the particulate matter mass concentration calculation circuit 208 may be configured to apply appropriate compensation factors based at least partially on the particle cross-sectional area, ambient temperature, and / or ambient humidity. In various embodiments, the particulate matter mass concentration calculation circuit 208 may be configured to determine the estimated collective mass of the multiple particles 120 received by the collection medium 106 based on the estimated mass of each of the multiple particles 120 received by the collection medium 106. In various embodiments, the particulate matter mass concentration calculation circuit 208 may be configured to determine the approximate collective mass of a plurality of particles present in the fluid volume based on the determined collective mass of a plurality of particles 120 received by the collection medium 106. In various embodiments, the particulate matter mass concentration calculation circuit 208 may be configured to determine the particulate matter mass concentration in the fluid volume based on the approximate collective mass of a plurality of particles present in the fluid volume. In various embodiments, the particulate matter mass concentration calculation circuit 208 may be configured to apply one or more scale factors to the determined particulate matter mass concentration in the fluid volume to account for experimental inefficiencies such as particle collection efficiency and detection probability factors. In various embodiments, appropriate scale factors may be determined based on empirical data.

[0122] Furthermore, the particulate matter mass concentration calculation circuit 208 may be configured to determine when it is necessary to replace the collection medium 106. For example, in various embodiments, the particulate matter mass concentration calculation circuit 208 may be configured to determine when a threshold time has elapsed since the collection medium 106 was last replaced, when the number of particles present in the collection medium 106 exceeds a predetermined threshold number of particles, and / or when the percentage of particle coverage in the field of view exceeds a threshold particle coverage percentage.

[0123] In various embodiments, the apparatus 10 may be configured to determine the amount of time for which the apparatus 10 (e.g., pump 112) should be maintained in operation by drawing fluid through the apparatus 10 such that at least a predetermined fluid volume is directed toward the collection medium 106 (e.g., passing across the surface). The predetermined fluid volume may be defined by a threshold fluid volume (e.g., minimum fluid volume, maximum fluid volume), or an acceptable range of fluid volume (e.g., between the minimum and maximum fluid volumes). In certain embodiments, the fluid volume passing through the apparatus 10 may be measured (e.g., by a fluid flow sensor), while in other embodiments, the fluid volume passing through the apparatus 10 may be estimated (e.g., based on a known fluid flow rate) while the pump is in operation and for the duration of the operation. For example, in various embodiments, the particulate matter mass concentration calculation circuit 208 may be configured to generate and / or transmit one or more signals to cause the fluid composition sensor 110 to initiate particle collection operation, as described herein, and the sensor 110 may receive a fluid volume containing the plurality of particles such that at least a portion of the plurality of particles in the fluid volume may be placed in and / or within the collection medium 106, and facilitate the engagement of the collection medium 106 by the received fluid volume. For example, in various embodiments, the particulate matter mass concentration calculation circuit 208 may be configured to transmit one or more signals to transition the pump 112 from an "off" configuration to an "on" operating configuration. Conversely, in various embodiments, the particulate matter mass concentration calculation circuit 208 may be configured to transmit one or more signals to transition the pump 112 from an "on" operating configuration to an "off" configuration. As a non-limiting example, the particulate matter mass concentration calculation circuit 208 may be configured to transmit one or more signals to transition the pump 112 from an "on" operating configuration to an "off" configuration, at least partially based on a determination that a threshold time has elapsed and / or a determination that a threshold fluid volume has been received by the fluid composition sensor 110 during the operating state.In various embodiments, such determination may be made by a particulate matter mass concentration calculation circuit 208, at least in part, based on data collected by a fluid flow sensor of a fluid composition sensor 110, which is configured to detect the flow rate of the fluid volume passing through at least a portion of the sensor 110. In various embodiments, the fan or pump 112 is calibrated so that the flow rate of the fluid moving through the device is known / determined, at least in part, based on the operating characteristics of the fan or pump 112 (e.g., operating power).

[0124] In some embodiments, the apparatus 10 includes a fluid composition sensor 110 configured to receive a fluid volume, having a housing for a collection medium 106 configured to receive and fix at least a portion of the collection medium 106 for receiving one or more particles from a plurality of particles in the fluid volume; a pump 112 for moving the fluid volume over the housing of the collection medium 106; an imaging device 110 configured to capture an image of at least a portion of one or more particles from a plurality of particles received by at least one collection medium 106; and a particulate matter mass concentration calculation circuit 208 connected to the imaging device 110 and the pump 112. The particulate matter mass concentration calculation circuit 208 is configured to calculate the total particulate matter mass of one or more particles from a plurality of particles received by at least one collection medium 106 based on the image. The particulate matter mass concentration calculation circuit 208 is configured to adjust the fluid volume moving over the housing of the collection medium 106.

[0125] In various embodiments, as described herein, the particle mass concentration calculation circuit 208 may be configured to adjust the operation of the fluid composition sensor 110 by adjusting one or more operating characteristics of the fluid composition sensor 110 (e.g., pump on / off configuration, pump volumetric flow rate, etc.). For example, the particle mass concentration calculation circuit 208 may be configured to adjust the operation of the pump 112 of the fluid composition sensor 110 by adjusting one or more operating characteristics of the pump 112 (e.g., stopping it) before the collection medium 106 captures an amount of particles that would reduce the measurement accuracy of subsequently captured particles (e.g., the collection medium is so full of particles that newly captured particles cannot be identified and / or their edges cannot be accurately positioned). For example, a fluid composition sensor 110 configured to receive a fluid volume containing multiple particles, with at least a portion of the particles positioned on and / or within the collection medium 106, and to determine at least one of particulate matter mass, particle coverage percentage, and / or any other particle loading conditions defined by the multiple particles positioned in the collection medium 106, as described herein, may suffer increased inaccuracies due to measurement errors resulting from the physical saturation and / or degradation of the collection medium over time due to the long-term collection of multiple particles. In various embodiments, particle loading conditions as described herein may be defined at least in part by the spatial arrangement of the multiple particles positioned in the collection medium (e.g., particle clustering, spikes, particle contact, particle overlap, etc.), particle coverage percentage, average grayscale of all pixels in the captured image, particulate matter mass, total light intensity, amount of collected particles, calculated particle density, etc.

[0126] For example, an increase in the frequency and / or degree of the inaccuracy of the sensor described above may correspond to an increase in the amount of particles collected in the collection medium 106 (and consequently, the physical properties of the collection medium 106 will change as a result of the increase in the number of particles placed in the collection medium). Therefore, in various embodiments, one or more components of the collection medium assembly as described herein (e.g., the collection medium 106) may be interchangeable, so that the first collection medium may be used to receive a first plurality of particles from a first fluid volume, be removed from the sensor 110 and replaced with a second collection medium, which may then be used to receive a second plurality of particles from a second fluid volume received by the sensor 110 after the first collection medium has been removed from the sensor. In such exemplary cases, the decrease in sensor accuracy caused by measurement errors resulting from the physical saturation and / or degradation of the collection medium over time can be prevented by replacing the at least partially consumed collection medium with at least substantially new medium containing fewer (e.g., zero) particles originating from the fluid volume received by the sensor 110 that engages with the fluid volume.

[0127] In some embodiments, as described herein, the particle mass concentration calculation circuit 208 may be configured to determine the time at which a plurality of particles received by the collection medium 106 are arranged such that at least two of the particles are unevenly spaced, in contact, clustered, and / or overlapping with each other. For example, two of the plurality of particles or particles may be aligned in a straight line with respect to the imaging device in an exemplary case, in which case the first particle engages with the collection medium at a first time and at a first position around the receiving surface, and the second particle subsequently engages with the collection medium at a second time, which is chronologically after the first time, and at the first position around the receiving surface, so that at least a portion of the second particle overlaps with at least a portion of the first particle from the viewpoint of the imaging device. In such exemplary cases, positioning a second particle above a first particle, as described, may prevent the entirety of the first particle from being captured in an image taken by the exemplary imaging device, and thus may prevent the controller 200 from accurately analyzing the first particle in accordance with one or more operations described herein. In such exemplary cases, the controller may be configured to determine that a first portion of a plurality of particles in a first portion of the collection medium exhibits a first aggregate particle density that is at least substantially different from a second aggregate particle density of a second portion of a plurality of particles in a second portion of the collection medium, where the aggregate particle density may be defined by the number of particles of a plurality of particles in a given surface area defining a portion of the collection medium. In some embodiments, the device 10 (e.g., the controller 200 associated with the imaging device) may be configured to actively monitor the spacing between particles in order to maximize the operational efficiency of the device 10 and / or to determine the position of particles on the collection medium 106.

[0128] In various embodiments, the controller 200 (e.g., a particulate matter mass concentration calculation circuit 208) may be configured to calculate the particulate matter mass by calculating the total particulate matter mass using at least an image, or by determining the amount of light extending through the collection medium 106. In some embodiments, the particle mass concentration calculation circuit 208 cooperates with the particle imaging circuit 206 to determine and / or characterize the spatial arrangement of one or more particles within the field of view of an imaging device, such as the spacing between particles. For example, in various embodiments, as described herein, the images captured by the exemplary imaging device may include a two-dimensional image (e.g., a photograph of at least a portion of the collection medium) and / or a three-dimensional image (e.g., a three-dimensional digital reconstruction of at least a portion of the particles captured in the collection medium, at least in part, based on the two-dimensional position of the detected particles and the depth of focus associated with each of the multiple particles, which can indicate the distance from the imaging device and thus the three-dimensional position of each of the multiple particles). Therefore, in various embodiments, the particle mass concentration calculation circuit 208 may be configured to characterize the distance between two of the multiple captured particles by the image as the distance between the two particles, where the distance between the two particles is defined by one or more of the x component (e.g., the difference in their respective corresponding x coordinates), the y component (e.g., the difference in their respective corresponding y coordinates), and the z component (e.g., the difference in their respective corresponding z coordinates, which may be determined by the depth of field relative to the imaging device).

[0129] As described herein, the particle mass density calculation circuit 208 may be configured to calculate the percentage of particle coverage of the collection medium within the field of view, and further, it may determine that the calculated percentage of particle coverage is greater than the percentage of threshold particle coverage. In some embodiments, the particle mass density calculation circuit 208 may be configured to calculate the percentage of particle coverage of the collection medium 106 based at least in part on a determined percentage of the image covered by particles (e.g., a percentage of the field of view of the imaging device). For example, in various embodiments, a portion of the collection medium may be covered by particles, such that the particles are arranged in the collection medium and the cross-sectional area of ​​the particles is located between the imaging device and at least a portion of the thickness of the collection medium, so that the particles at least partially divide the line of view between the imaging device and at least a portion of the thickness of the collection medium. In a non-limiting example, a plurality of particles received by the collection medium may collectively cover at least a portion of the collection medium. As described herein, the particle mass concentration calculation circuit 208 may be configured to calculate the percentage of particle coverage of the collection medium, at least in part, based on a comparison between the total surface area of ​​the collection medium (e.g., the receiving surface) and the surface area of ​​the collection medium covered by multiple particles. In various embodiments, the particle mass concentration calculation circuit 208 may be configured to determine if the percentage of particle coverage of the collection medium is greater than a predetermined threshold. In non-limiting examples, in various embodiments, the predetermined threshold for the percentage of particle coverage may be at least about 0.01% to 99.9%. In such exemplary cases, the particle mass concentration calculation circuit 208 may be configured to identify the collection medium as "covered" and, accordingly, generate one or more signals configured to adjust the operation of the fluid composition sensor to facilitate the replacement of the covered collection medium. In non-limiting exemplary embodiments, the predetermined threshold for the percentage of particle coverage may be less than 1% in exemplary cases where, in detection, the controller 200 is configured to detect the presence of a single particle, for example, in a situation relating to a "cleanroom" application.

[0130] In some embodiments, the particle mass concentration calculation circuit 208 may be configured to determine, at least partially, on one or more images of the collection medium 106, whether at least a portion of the plurality of particles received by the fluid composition sensor 110 are clustered in the collection medium 106. In various embodiments, the particle mass concentration calculation circuit 208 may be configured to determine that the plurality of particles received by the fluid composition sensor 110 are clustered, in which the boundaries of the plurality of particles at least substantially overlap or are separated by a distance less than a clustering threshold distance defining the individual clusters, and the plurality of clusters (each containing a plurality of particles with overlapping boundaries) are separated by a distance such that the individual clusters are separated and distinct from one another, and the first portion of the collection medium exhibits a first particle coverage rate as described above, which is disproportionate to the second particle coverage rate detected in the second portion of the collection medium. For example, in some embodiments, the particle mass concentration calculation circuit 208 may be configured to determine whether particles are clustered by calculating the average distance between particles in at least a portion of the particles. In some embodiments, the particle mass concentration calculation circuit 208 is configured to determine that at least a portion of the particles received by the fluid composition sensor 110 are clustered, at least in part, based on the determination that the calculated average distance between particles in the collection medium 106 shown in the image is below a predetermined distance. For example, in some embodiments, the particle mass concentration calculation circuit 208 is configured to determine when a certain percentage of the inter-particle distance falls below a predetermined distance. In some embodiments, the particle mass concentration calculation circuit 208 is configured to cause the fluid composition sensor 110 to adjust the volume of fluid flowing over the collection medium 106 (for example, by transmitting one or more signals), such as by stopping the pump 112. In some embodiments, the particle mass concentration calculation circuit 208 is configured to provide a signal when it is determined that particles are clustered. In some embodiments, the signal is connected to a display device.In some embodiments, the signal provided by the particle mass concentration calculation circuit 208 may provide a warning that can diagnose the presence of non-uniform airflow within the apparatus 10.

[0131] In various embodiments, the particulate matter mass concentration calculation circuit 208 may be configured to adjust the operation of the fluid composition sensor 110's pump 112 (e.g., on / off configuration, volumetric flow rate, etc.) at least partially based on the determination that the total particulate matter mass has reached a predetermined threshold. For example, the particulate matter mass concentration calculation circuit 208 may be configured to transmit one or more signals that directly or indirectly stop the operation of the pump 112 when it determines that the total particulate matter mass has reached a predetermined threshold.

[0132] In non-limiting examples, in various embodiments, the particulate matter mass concentration calculation circuit 208 may receive first captured particle images and second captured particle images captured at first and second times, respectively, from the imaging device of the apparatus 10, where first time represents the start of analysis by the apparatus 10 of one or more particles from a plurality of particles 120 captured by the collection medium 106, and second time is the time following (occurring after) first time. In various embodiments, the particulate matter mass concentration calculation circuit 208 is configured to determine a first particle loading condition corresponding to the first image and a second particle loading condition corresponding to the second image. In various embodiments, the particulate matter mass concentration calculation circuit 208 is configured to compare a first total particulate matter mass with a second total particulate matter mass. In various embodiments, the particulate matter mass concentration calculation circuit 208 is configured to calculate the difference between the first total particulate matter mass and the second total particulate matter mass. For example, the particulate matter mass concentration calculation circuit 208 may be configured to calculate the difference between the first total particulate matter mass and the second total particulate matter mass by identifying any particles that were not captured in the first captured particle image from the second captured particle image. In various embodiments, the particulate matter mass concentration calculation circuit 208 may be configured to adjust one or more operating characteristics (e.g., on / off configuration, volumetric flow rate, etc.) of the pump 112 of the fluid composition sensor 110 based at least in part on the determination that the calculated difference between the first total particulate matter mass and the second total particulate matter mass is greater than a predetermined difference. For example, in various embodiments, the particulate matter mass concentration calculation circuit 208 may be configured to stop the pump 112 when a predetermined difference between the first total particulate matter mass and the second total particulate matter mass is calculated. In some embodiments, the particle mass concentration calculation circuit 208 is configured to determine the density of particle concentration in the collection medium 106 based at least in part on the captured particle image. For example, the particle mass concentration calculation circuit 208 may be configured to compare the calculated particle density with one or more stored particle density thresholds and, accordingly, adjust one or more operating characteristics of the pump 112 based on the determination that the calculated particle density is greater than the particle density threshold.Additionally, or alternatively, the particle mass concentration calculation circuit 208 may be configured to adjust one or more operating characteristics of the pump 112 based on the determination that the calculated particle density is less than a particle density threshold.

[0133] In various embodiments, as described herein, the particulate matter mass concentration calculation circuit 208 is configured to determine whether the total particulate matter mass is clustered. In various embodiments, the imaging device 110 is configured to capture images at set intervals. In various embodiments, the imaging device 110 is configured to capture images when a fluid volume begins to flow over the housing of the collection medium 106. In various embodiments, the particulate matter mass concentration calculation circuit 208 is configured to determine whether the start of the fluid volume flow causes a spike in one or more particle loading conditions, such as particulate matter mass. In various embodiments, a spike in a particle loading condition may be defined as a rapid increase in a particle loading condition over time, such as a rapid increase in particulate matter mass. As a non-limiting exemplary example, a spike may be defined as an increase rate in one or more particle loading conditions that exceeds a specified threshold, such as an increase rate in particulate matter mass that is determined to exceed a predetermined rate of increase in particulate matter mass. In some embodiments, the particulate matter mass concentration calculation circuit 208 is configured to calculate the rate of increase over time in particulate matter mass, such as the rate of increase in particulate matter mass calculated in continuous measurement. In some embodiments, the particulate matter mass concentration calculation circuit 208 is configured to provide a signal indicating that the rate of increase over time under one or more particle loading conditions is above or below a predetermined threshold. In a non-limiting exemplary embodiment, spike detection by the controller, as defined herein, may correspond, for example, to a determination that the imaging device, collection medium, illumination source, and / or any other component of the fluid composition sensor 110 may be contaminated at the start of the particle collection operation, and / or a determination that the device 10 needs to be recalibrated.

[0134] In various embodiments, the particulate matter mass concentration calculation circuit 208 may be configured to calculate the total particulate matter mass of one or more particles among a plurality of particles received by at least one collection medium 106, at least in part on determining the total light intensity across an image captured by the imaging device, as described herein. In various embodiments, the total light intensity may correspond to a measurement at least in part on an imaging device, such as a charge-coupled device (CCD) image sensor. In a non-limiting exemplary case, the total light intensity may be measured at least in part on the average bit count of each pixel associated with the imaging device, and / or on an image produced by the imaging device. For example, an exemplary calculation of the total light intensity may be performed as a function of time while the device 10 (e.g., controller 200) is measuring one or more raw signals from each pixel in a CCD array corresponding to the imaging device. In various embodiments, the total light intensity depicted in the image of the collection medium 106 and the plurality of particles received therein may be at least partially based on the type of particles associated with at least a portion of the plurality of particles captured in the collection medium, the average refractive index, the opacity of the particles at an optimal source wavelength (e.g., 850 nm), etc. As a non-limiting exemplary example, the total light intensity may be at least substantially inversely proportional to the particle concentration and / or particulate mass of the plurality of particles captured in the image (e.g., within the field of view of the collection medium 106 and the imaging device). In various embodiments, the particulate mass concentration calculation circuit 208 may be configured to adjust the operation of the pump 112 of the fluid composition sensor 110 (e.g., on / off configuration, volumetric flow rate, etc.) at least partially based on the determination that the calculated total light intensity is below a predetermined threshold. For example, in various embodiments, the particulate mass concentration calculation circuit 208 may be configured to generate one or more signals configured to stop the pump 112 from operating (e.g., transition from an "on" operation configuration to an "off" configuration) when it is determined that the total light intensity across the image is below a predetermined intensity threshold.

[0135] In various embodiments, the particulate matter mass concentration calculation circuit 208 is configured to determine the total light intensity over the entire image captured by the imaging device, the image depicting at least a portion of the collection medium using grayscale. In such exemplary cases, the image depicting the collection medium using grayscale may include one or more of the particles arranged on the collection medium, represented by indicators such as one or more areas of a relatively dark color (for example, relative to the collection medium), so as to distinguish the collection medium from one or more particles arranged thereon. In various embodiments, the size, shape, color, etc., of one or more indicators corresponding to the particles arranged on the collection medium may vary proportionally, at least in part, based on the collective mass, density, size, etc., of the corresponding one or more particles. As a non-limiting example, in some embodiments, the particulate matter mass concentration calculation circuit 208 may be configured to determine the particle coverage rate based at least in part on the number of one or more dark spots present in the exemplary grayscale image of the collection medium and / or the coverage rate (for example, relative to the portion of the collection medium depicted in the grayscale image). The calculated total light intensity is below a predetermined threshold. In some embodiments, the particulate matter mass concentration calculation circuit 208 may be configured to adjust one or more operating characteristics of the pump 112 of the fluid composition sensor 110 (e.g., on / off configuration, volumetric flow rate, etc.) based at least in part on the number of one or more dark spots present in an exemplary grayscale image of the collection medium and / or the percentage of coverage (e.g., relative to the portion of the collection medium depicted in the grayscale image), and a determination that the calculated total light intensity is below a predetermined threshold.

[0136] Various embodiments relate to a method for detecting fluid particle properties, the method comprising: directing a fluid volume toward a collection medium 106; receiving one or more particles from a plurality of particles in the fluid volume on the collection medium 106; capturing an image of one or more of the plurality of particles received by the collection medium 106; determining the total particulate matter mass of one or more of the plurality of particles received by at least one collection medium 106 based on the image of the particles; and adjusting the fluid volume.

[0137] In various embodiments, the total particulate matter mass is determined by a particulate matter mass concentration calculation circuit 208, which is configured to work with a controller to adjust the fluid volume passing over the collection medium 106 and / or through the housing of the device 10. In various embodiments, the particulate matter mass concentration calculation circuit 208 is configured to adjust the fluid volume passing over the housing of the collection medium 106 when a predetermined difference between a first total particulate matter mass and a second total particulate matter mass is calculated. In various embodiments, the particulate matter mass concentration calculation circuit 208 is configured to adjust the fluid volume passing over the housing of the collection medium 106 when the total light intensity across the image falls to a predetermined threshold. In various embodiments, the pump 112 continues to draw air through the device 10 as long as the intensity picture or light scale is above a predetermined threshold.

[0138] In various embodiments, one or more predetermined thresholds, such as a particle coverage threshold, a particle separation threshold, or a light intensity threshold, may be received by the fluid composition sensor 110 (e.g., controller 200) as user input provided via a user interface. For example, in some embodiments, the user input received by the controller 200 may be transmitted to a particulate matter mass concentration calculation circuit 208, which may include the fluid and / or material being sampled. In such exemplary cases, the particulate matter mass concentration calculation circuit 208 may be configured to identify the corresponding predetermined threshold based at least partially on one or more lookup tables stored in memory 202 and associated with the fluid and / or material selected by the user. In an exemplary, non-limiting example, the particulate matter mass concentration calculation circuit 208 may be configured to receive a signal corresponding to a user selection of a material such as silica dust, which may be at least partially transparent to the wavelength of exemplary light emitted from an illumination source in the exemplary fluid composition sensor, as described herein. In such exemplary cases, the particulate matter mass concentration calculation circuit 208 may use data stored in memory (e.g., a lookup table) to determine the corresponding light intensity threshold. In various embodiments, the light intensity threshold determined for at least partially transparent silica dust material may vary from (e.g., less than) the light intensity threshold for opaque material, at least partially based on the contrast between the coated and uncoated portions of the collection medium, as described herein. In a further non-limiting example, the light intensity threshold determined for opaque material such as volcanic ash or fire soot may vary from (e.g., greater than) the light intensity threshold for at least partially transparent material, at least partially based on the contrast between the coated and uncoated portions of the collection medium.

[0139] In various embodiments, a fluid composition sensor comprising a controller (e.g., particulate matter mass concentration calculation circuit 208) configured to calculate the total particulate matter mass of multiple particles received from within a fluid volume by a collection medium, and to characterize the spatial arrangement of the multiple particles to identify one or more particle configurations known to adversely affect the sensor accuracy and / or sensor effectiveness (e.g., lifetime) over time, such as particle clustering, spikes, particle contact, particle overlap, and / or a collection medium "covered" by particles, can help prevent sensor inaccuracies caused by overloading a depleted and / or damaged collection medium due to particle loading conditions that the sensor cannot accurately determine and / or identify. Such exemplary configurations prevent overuse of the fluid composition sensor by substantially minimizing the number of retests required to obtain accurate data by defining operating parameters configured to substantially autonomously limit the operation of the sensor when the presence of one or more of the particle loading conditions that induce the aforementioned errors is identified. The lifespan of the device can be extended by dynamically monitoring the loading conditions of multiple particles received by the collection medium and optimizing the operating parameters to selectively limit the operating time of the device. Furthermore, the device described herein can further simplify the calculation of the operating run time required for the fluid composition sensor needed for a particle sample to provide one or more statistically significant measurements.

[0140] Furthermore, in various embodiments, the particulate matter mass concentration calculation circuit 208 may be configured to determine the initial particle velocity of one or more particles among a plurality of particles 120 received by the collection medium 106, at least in part, based on the determined particle mass of the particles, where the initial particle velocity is the velocity of the particles at the receiving surface 105 of the collection medium 106. In various embodiments, the particulate matter mass concentration calculation circuit 208 may be configured to transmit the determined initial particle velocity data corresponding to one or more particles among the plurality of particles 120 received by the collection medium 106 to the particle type identification circuit 207.

[0141] The fluid composition sensor configuration circuit 209 may be an apparatus or circuit embodied as either hardware or a combination of hardware and software configured to control the selective configuration of one or more selectively configurable components of the fluid composition sensor. In various embodiments, the fluid composition sensor configuration circuit 209 may configure the fluid composition sensor between an open configuration and a closed configuration, as described herein. Furthermore, in various embodiments, the fluid composition sensor configuration circuit 209 may facilitate the automatic reconfiguration of one or more collection medium assemblies, as described herein. In various embodiments, the fluid composition sensor configuration circuit 209 may selectively configure the discharge door and / or reception door of one or more collection medium assembly storage chambers of the fluid composition sensor between an open configuration and a closed configuration. Furthermore, in various embodiments, the fluid composition sensor configuration circuit 209 may be configured to selectively configure the impactor nozzle of the fluid composition sensor between a first nozzle configuration and a second nozzle configuration. For example, the fluid composition sensor configuration circuit 209 may switch the impactor nozzle between a first nozzle configuration corresponding to the particle collection function of the fluid composition sensor and a second nozzle configuration corresponding to the particle analysis function of the fluid composition sensor, as described herein.

[0142] In various embodiments, the apparatus 10 may be configured with or communicate with the imaging device data repository 107. The imaging device data repository 107 may be stored, at least partially, in the system's memory 201. In some embodiments, the imaging device data repository 107 may be located far from the apparatus 10 but connected to the apparatus 10. The imaging device data repository 107 may contain information such as images related to one or more potential components of a fluid. In some embodiments, other similar reference databases communicating with the imaging device data repository 107 and / or the apparatus 10 may contain non-image information used to identify particles (for example, in the case of fluorescent particles, a spectrometer may be used by a fluid composition sensor 100 as discussed herein, and the apparatus 10 may receive spectral information to identify and / or classify the particles). Furthermore, in some embodiments, the device 10 may use machine learning to identify and / or classify particles, such that the device 10 can initially use a reference database, such as the imaging device data repository 107, to train the device 10, and thereafter identify and / or classify particles without referring to the imaging device data repository 107 or other reference databases (for example, the system may not have to actively communicate with the imaging device data repository 107 during normal operation). method

[0143] Figure 4 shows a block diagram of an exemplary method 400 for detecting fluid particle properties according to some embodiments discussed herein.

[0144] In block 402, one or more of the plurality of particles may be received by the collecting medium through the fluid volume. The plurality of particles may be received by the collecting medium from the fluid volume containing the plurality of particles. In various embodiments, the plurality of particles received by the collecting medium may represent a plurality of particles present in the fluid volume. In various embodiments, the fluid composition sensor may include a collecting medium and may be configured to orient at least a portion of the fluid volume in a direction perpendicular to the receiving surface of the collecting medium so that the fluid volume can interact with the collecting medium.

[0145] Furthermore, in block 404, an image of one or more particles from among the multiple particles received by the collection medium is captured. In various embodiments, the image of one or more particles from among the multiple particles received by the collection medium may be captured by an imaging device. In various embodiments, the imaging device may be configured to capture both an image of one or more particles from among the multiple particles present in the collection medium at the start of particle analysis and an image of one or more particles from among the multiple particles present in the collection medium at the end of particle analysis. The images may be compared to determine which of the multiple particles present in the collection medium was received by the collection medium during particle analysis. In various embodiments, the imaging device may be positioned in a fluid composition sensor close to the collection medium so that one or more particles from among the multiple particles received by the collection medium are within a specified field of view of the imaging device. In various embodiments, the image of one or more particles from among the multiple particles received by the collection medium may be captured using one or more imaging techniques, such as lensless holography or optical microscopy. In various embodiments, the particle image may include holographic image reconstruction.

[0146] In block 406, the particle embedding depth of one or more of the multiple particles in the collection medium is determined. The particle embedding depth of a particle received by the collection medium may be defined by the depth to which the particle is embedded in the collection medium. In various embodiments, the particle embedding depth of one or more of the multiple particles in the collection medium may be determined using an image captured by the imaging device. In various embodiments, the particle embedding depth of one or more of the multiple particles in the collection medium may be determined based on a measured depth of focus, the distance between the imaging device and the transparent substrate, the thickness of the transparent substrate, and the thickness of the collection medium, where the depth of focus is the distance between the imaging device and the particle. The depth of focus of a particle may be defined as the distance between the imaging device and the particle. In various embodiments, the depth of focus of one or more of the multiple particles received by the collection medium may be determined using one or more imaging techniques, such as computational methods (e.g., angular spectral propagation) and / or mechanical methods (e.g., optomechanical adjustment). In various embodiments, the embedding depth of one or more particles among a plurality of particles in the collection medium may be calculated by subtracting the measured depth of focus of each particle from the sum of the collection medium thickness, the transparent substrate thickness, and the distance between the transparent substrate and the imaging device.

[0147] In block 408, the approximate collective mass of multiple particles present in the fluid volume is determined at least in part on the particle embedding depth of one or more of the multiple particles. In various embodiments, the correspondingly determined particle embedding depth of each particle may be used to estimate the corresponding mass of each of the multiple particles. In various embodiments, the initial momentum of each particle before it is received by the collection medium may be determined using particle embedding depth data and measured particle size data, based on data in a particle embedding depth-momentum lookup table that correlates the particle embedding depth to the initial momentum of particles of a given collection medium type. The estimated mass of each particle may be determined using the known relationship between momentum, velocity, and mass, where the momentum of a particle is equal to the mass of the particle multiplied by the velocity of the particle, and a known velocity of each particle, i.e., a controlled value based on the airflow velocity of the fluid volume. In various embodiments, one or more compensation coefficients may be applied to the estimated mass of each particle to account for one or both of the particle conditions related to the particle and the ambient conditions related to the surrounding environment. In various embodiments, for example, a suitable compensation factor may be applied based at least partially on the particle cross-sectional area, ambient temperature, and / or ambient humidity. In various embodiments, the collective mass of a plurality of particles received by the collection medium may be determined using the respective estimated mass of each of the plurality of particles. In various embodiments, the determined collective mass of the plurality of particles received by the collection medium may be used to approximate the collective mass of the plurality of particles present in the fluid volume. In various embodiments, the approximate collective mass of the plurality of particles present in the fluid volume may be used to estimate the particulate matter mass concentration in the fluid volume. In various embodiments, one or more scale factors may be applied to the determined particulate matter mass concentration in the fluid volume to account for experimental inefficiencies such as particle collection efficiency and detection probability factors. In various embodiments, a suitable scale factor may be determined based on empirical data.

[0148] In block 410, the compensation factor may be applied to the approximate collective mass of multiple particles present in the fluid volume, based at least partially on one or more of the particle cross-sectional area, ambient temperature, and ambient humidity. In various embodiments, the compensation factor may be applied to the estimated mass of each particle to account for one or both of the particle conditions related to the particle and the ambient conditions related to the surrounding environment. In various embodiments, for example, the compensation factor may be applied to the estimated mass of a particle to account for the particle cross-sectional area, because a larger particle cross-sectional area reduces the particle embedment depth by dispersing kinetic energy more quickly within the collection medium. In various embodiments, the compensation factor may be applied to the estimated mass of a particle to account for ambient temperature and / or ambient humidity, because both ambient temperature and ambient humidity affect the viscosity of the collection medium and therefore affect the particle embedment depth. In various embodiments, the ambient temperature and humidity may be measured by the apparatus or by one or more remote sensors configured to transmit temperature and humidity data to the apparatus.

[0149] In block 412, the particle size of one or more particles among the multiple particles received by the collection medium may be determined. In various embodiments, the particle size of one or more particles may be determined based on the captured particle image. In various embodiments, the particle size of particles having a diameter of about 0.3 to about 100 micrometers (e.g., 2.5 micrometers), and a size category such as PM10, PM4, PM2.5, or PM1 may be determined. In various embodiments, the particle size data may include particle cross-sectional area data.

[0150] In block 414, the particle type of one or more particles among a plurality of particles received by the collection medium may be determined using one or more machine learning techniques. In various embodiments, the one or more machine learning techniques used to determine the particle type of one or more particles among a plurality of particles may include analyzing captured particle images, particle size data, and / or any other data related to one or more particles. In some embodiments, the machine learning techniques may be used to identify and / or classify particles. In various embodiments, a machine learning device may first be trained using a reference image database containing various particle data, and then the machine learning device may be used to identify and / or classify particles without referring to the image database or other reference databases.

[0151] In block 416, the particle density of one or more particles among the multiple particles received by the collection medium may be determined at least partially on the particle embedding depth of each of the one or more particles. In various embodiments, the particle density of a particle may be determined at least partially on one or more of the particle embedding depth, estimated particle mass, particle type, and particle size data.

[0152] In various embodiments, the methods described herein may further include replacing the collection medium as described herein. In various embodiments, the collection medium may be replaced based on one or more parameters, such as elapsed time, the number of particles received, and / or the percentage of particle coverage in the field of view. conclusion

[0153] Many modifications and other embodiments having a teaching benefit as shown in the above description and the associated drawings will be conceivable to those skilled in the art of the Disclosure. Therefore, it should be understood that this Disclosure is not limited to the specific embodiments disclosed, and that modifications and other embodiments are intended to be included within the scope of the appended claims. Certain terms are used herein, but they are used in a general and descriptive sense only and not for limiting purposes.

Claims

1. A device for detecting fluid particle characteristics, A fluid composition sensor, A housing, configured to support a collection medium for capturing one or more particles from a plurality of particles in a fluid volume passing through at least a portion of the housing, A pump for moving the fluid volume so as to pass through at least a portion of the housing and across at least a portion of the collection medium, An imaging device configured to capture an image of at least a portion of one or more particles captured by the collection medium, A fluid composition sensor includes a controller which includes a particulate matter mass concentration calculation circuit configured to determine one or more particle loading conditions for at least a portion of the one or more particles captured by the collection medium, based at least partially on the image captured by the imaging device, The device wherein the controller is configured to adjust the operation of the pump at least partially based on at least one of the one or more particle loading conditions of at least a portion of the one or more particles captured by the collecting medium, the one or more particle loading conditions corresponding to the particulate matter mass of the one or more particles captured by the collecting medium.

2. The apparatus according to claim 1, wherein determining one or more particle loading conditions includes determining a first particle loading condition for a first image and determining a second particle loading condition for a second image.

3. A method for detecting fluid particle characteristics, Directing the fluid volume flow toward the collection medium, One or more particles from the plurality of particles in the fluid volume are received by the collection medium, Capture an image of one or more of the plurality of particles received by the collection medium, Determining one or more particle loading conditions for at least a portion of one or more particles among the plurality of particles received by the collection medium, based at least partially on the image of the one or more particles, A method comprising adjusting the volume of the fluid flowing toward the collection medium, wherein the one or more particle loading conditions correspond to the particulate matter mass of the one or more particles captured by the collection medium.

Images