Distance image acquisition device and distance image acquisition method
The device calculates distances by considering the mixing ratio of direct and indirect light, addressing inaccuracies in conventional methods and enhancing measurement precision through advanced processing techniques.
JP7868490B2Active Publication Date: 2026-06-02TOPPAN HOLDINGS INC
Patent Information
- Authority / Receiving Office
- JP · JP
- Patent Type
- Patents
- Current Assignee / Owner
- TOPPAN HOLDINGS INC
- Filing Date
- 2022-11-30
- Publication Date
- 2026-06-02
AI Technical Summary
Technical Problem
Conventional distance image capturing devices fail to account for the mixing ratio of direct and indirect light in multi-path responses, leading to inaccurate distance measurements.
Method used
A distance image capturing device and method that calculates distances based on the relative timing and intensity of direct and indirect light using a pixel with multiple charge storage units and a processing unit that determines the appropriate distance based on the mixing ratio, employing techniques such as weighted averages and least squares methods.
Benefits of technology
Enables accurate distance measurements by accounting for the mixing ratio of direct and indirect light, improving measurement precision and reducing noise interference.
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Abstract
To perform measurement according to a mixing ratio of a direct wave and an indirect wave.SOLUTION: A distance image pickup device includes a distance image processing unit which performs multiple measurements with mutually-different relative timing relations between irradiation timing and accumulation timing, calculates a first distance being the smaller distance of the two distances, a second distance being the larger distance of the two distances, first light intensity being the light intensity corresponding to the first distance and second light intensity being the light intensity corresponding to the second distance for the two distances corresponding to two light paths that have arrived by being reflected on a subject on the basis of the tendency of feature amounts according to the charge amount accumulated in each of the multiple measurements, and calculates the distance to the subject on the basis of the first distance, the second distance, the first light intensity, and the second light intensity.SELECTED DRAWING: Figure 1
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