Seed trait estimation device, seed trait estimation model generation device, seed trait estimation method, seed trait estimation model generation method, and program

A seed trait estimation model using multi-wavelength images and machine learning addresses the inefficiencies of traditional seed testing methods by accurately estimating seed traits without destroying the seeds, enhancing quality inspection processes.

JP7875528B2Active Publication Date: 2026-06-18SHIGA UNIVERSITY +1
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Patent Information

Authority / Receiving Office
JP · JP
Patent Type
Patents
Current Assignee / Owner
SHIGA UNIVERSITY
Filing Date
2022-07-01
Publication Date
2026-06-18

AI Technical Summary

⚠Technical Problem

Existing methods for seed trait estimation, such as germination, genetic purity, and contamination testing, destroy the seeds and cannot be used for quality inspection of seeds as they are, leading to inefficiencies in quality inspection processes.

⚗Method used

A seed trait estimation model is generated using multi-wavelength images of seeds and associated seed trait data through machine learning, enabling accurate estimation of seed traits without destroying the seeds.

🎯Benefits of technology

The model allows for precise estimation of seed traits like germination and contamination, improving the efficiency and accuracy of quality inspection without damaging the seeds.

✦ Generated by Eureka AI based on patent content.

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Abstract

To provide a seed trait estimation device and a seed trait estimation method which can be used to estimate seed traits.SOLUTION: A seed trait estimation device 3 disclosed herein includes a first acquisition unit 31 that acquires a multiwavelength image in which one or more seeds are captured, and an estimation unit 32 that uses a first seed trait estimation model to estimate the traits of one or more pixels constituting a seed in the multiwavelength image, thereby estimating the seed traits.SELECTED DRAWING: Figure 1
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