X-ray analysis device and control method for x-ray analysis device

Abstract

In the present invention, a new analysis process generated after an analysis schedule is defined is preferentially performed. A control device (80) controls an analysis device (10) on the basis of the analysis schedule (160). The analysis schedule defines a first analysis process among a plurality of analysis processes, and a second analysis process to be executed subsequent to the first analysis process. The control device (80) updates the analysis schedule (160) so as to execute a new analysis process between the first analysis process and the second analysis process.

Description

X-ray analysis apparatus and method for controlling X-ray analysis apparatus

[0001] The present disclosure relates to an X-ray analysis apparatus and a control method for an X-ray analysis apparatus.

[0002] For example, Japanese Patent Laid-Open No. 2021-135160 (Patent Document 1) discloses an energy dispersive X-ray spectroscopy (EDX) fluorescent X-ray analyzer (hereinafter also simply referred to as "X-ray analyzer").

[0003] This X-ray analysis apparatus includes a sample tray, a transport device, and a measurement device. The sample tray includes a plurality of (e.g., 48) sample cells for accommodating samples. The transport device transports the sample cells containing the samples one by one to the measurement device based on a predetermined sequence (hereinafter also referred to as an "analysis schedule"), and the measurement device analyzes the samples. In this way, the X-ray analysis apparatus performs multiple analysis processes based on the analysis schedule.

[0004] Japanese Patent Application Laid-Open No. 2021-135160

[0005] As described above, the X-ray analysis apparatus executes the analysis processes multiple times based on the analysis schedule. Here, after the analysis schedule is set, for example, a new analysis process that requires urgency may arise, and in such a case, it is desirable to have the X-ray analysis apparatus execute the new analysis process with priority.

[0006] The object of the present disclosure has been made to solve such problems, and is to provide an X-ray analysis apparatus and a control method for an X-ray analysis apparatus that can give priority to executing new analysis processes that occur after an analysis schedule has been defined.

[0007] The X-ray analysis apparatus of the present disclosure includes an analysis apparatus, a storage device, and a control device. The analysis apparatus performs an analysis process on a sample in an analysis chamber. The storage device stores an analysis schedule that defines the order of multiple analysis processes to be performed by the analysis apparatus. The control device controls the analysis apparatus based on the analysis schedule. The analysis schedule includes multiple analysis processes, including a first analysis process and a second analysis process to be performed after the first analysis process. The control device updates the analysis schedule so that a new analysis process is performed between the first analysis process and the second analysis process.

[0008] A control method disclosed herein is a method for controlling an X-ray analysis apparatus. The control method includes determining an analysis schedule that defines an order of a plurality of analysis processes to be performed by the X-ray analysis apparatus. The plurality of analysis processes include a first analysis process and a second analysis process to be performed after the first analysis process. The control method further includes updating the analysis schedule so that a new analysis process is performed between the first analysis process and the second analysis process.

[0009] According to the X-ray analysis apparatus and the control method for the X-ray analysis apparatus of the present disclosure, it is possible to give priority to the execution of new analysis processes that occur after the analysis schedule has been defined.

[0010] 1 is a diagram illustrating an example of an X-ray analysis apparatus according to the present embodiment; FIG. 2 is a diagram illustrating an example of an X-ray analysis apparatus according to the present embodiment; FIG. 3 is a diagram illustrating a hardware configuration of an analysis apparatus and an information processing apparatus; FIG. 4 is a diagram illustrating an example of the configuration of a measurement apparatus; FIG. 5 is a functional block diagram of a control apparatus; FIG. 6 is a diagram for explaining updating of an analysis schedule; FIG. 7 is a diagram illustrating an example of the concepts of a batch queue and a batch table; FIG. 8 is an example of an analysis schedule update screen; FIG. 9 is an example of an analysis schedule update screen; FIG. 10 is an example of an analysis schedule update screen; FIG. 11 is an example of an analysis schedule update screen; FIG. 12 is a flowchart illustrating a part of processing executed by the X-ray analysis apparatus; FIG. 13 is a subroutine of analysis schedule update processing.

[0011] DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. In the drawings, the same or corresponding parts are designated by the same reference numerals and their description will not be repeated.

[0012] 1 and 2 show an example of an X-ray fluorescence analyzer (hereinafter also referred to as "X-ray analyzer 1") according to the present embodiment. Note that, in this embodiment, an example will be described in which the concept of the present embodiment is applied to an X-ray analyzer of the energy dispersive type (EDX), but the concept may also be applied to other X-ray analyzers (for example, wavelength-dispersive X-ray spectrometry (WDX)).

[0013] The X-ray analysis apparatus 1 includes an analysis device 10 and an information processing device 90 connected to the analysis device 10. FIG. 1 is a diagram showing a state in which a part of the housing of the analysis device 10 is transparent. FIG. 2 is a diagram showing a state in which the housing of the analysis device 10 is not transparent. In FIG. 1, the height direction of the analysis device 10 is shown as the Z axis, and the depth direction is shown as the Y axis. The axis perpendicular to the Z axis and the Y axis is the X axis. The X axis direction is also the width direction of the analysis device 10.

[0014] 1 and 2, a notebook computer is shown as the information processing device 90. However, the information processing device 90 may also be a desktop computer, a tablet terminal, a smartphone, etc. The analytical device 10 analyzes the sample by irradiating the surface of the sample with X-rays and detecting fluorescent X-rays emitted from the surface.

[0015] The analytical device 10 includes a measuring device 20, a mounting unit 31, a retracting unit 60, a transport device 70, and a control device 80. The analytical device 10 also includes a plurality of sample trays and a plurality of locking devices. In this embodiment, the analytical device 10 includes sample trays 30a to 30d and locking devices 33a to 33d.

[0016] Hereinafter, the sample trays 30a to 30d will also be collectively referred to as "sample trays 30." The sample tray 30 corresponds to the "arrangement body" of the present disclosure. Furthermore, the locking devices 33a to 33d will also be collectively referred to as "locking devices 33."

[0017] The sample tray 30 is placed on the placement section 31. Each of the sample trays 30a to 30d can be independently pulled out by the user (see FIG. 2). The state in which the sample tray 30 is pulled out is also referred to as the "pulled out state," and the state in which the sample tray 30 is stored in the analyzer 10 is also referred to as the "stored state." When the sample tray 30 is in the pulled out state, the sample tray 30 is exposed to the outside of the analyzer 10. In the example of FIG. 2, the sample trays 30a to 30c are in the stored state, and the sample tray 30d is in the pulled out state.

[0018] The locking device 33 includes a protrusion that can move in the X-axis direction. The sample tray 30 is also formed with a recess that can engage with the protrusion. In FIG. 2 , a recess 33x is shown as a recess formed on the sample tray 30d. When the sample tray 30 is in the stored state, the locking device 33 is in a "locked state" when the protrusion moves and engages with the recess. When the protrusion is not engaged with the recess, the locking device is in an "unlocked state." The transition from the locked state to the unlocked state is also referred to as "releasing the lock." When the sample tray 30 is in the stored state and the locking device 33 corresponding to the sample tray 30 is in the locked state, the user cannot pull out the sample tray 30.

[0019] The sample container 40 placed on the sample tray 30 is a container for containing a sample. The sample container 40 is, for example, a milky white container with a transparent film provided on the analysis surface that is irradiated with X-rays. The top of the sample container 40 is open, and the inside of the sample container 40 is an unsealed space. The sample container 40 can contain a wide variety of samples, such as solid samples, powder samples, and liquid samples.

[0020] In this embodiment, the sample container 40 is detachable from the sample tray 30. The user pulls out the sample tray 30, removes the sample container 40 from the sample tray 30, and places the sample into the sample container 40. This allows the user to place the sample container 40 in a desired position and place the sample therein, thereby reducing the burden on the user of placing the sample into the sample container 40. The sample container 40 and the sample tray 30 may be integrated. The user then places the sample container 40 containing the sample on the sample tray 30 and stores the sample tray 30 in the analyzer 10 (places the sample tray 30 in the stored state).

[0021] The transport device 70 is controlled by the control device 80. The transport device 70 selects one sample container 40 from a plurality of sample containers 40 placed on the sample tray 30 based on an analysis schedule described below. The transport device 70 transports the selected sample container 40 (hereinafter also referred to as the "target container") to the measurement device 20. The transport device 70 includes an arm 51, a plurality of claws 52, and a drive source (not shown). The drive source is, for example, a motor. The arm 51 can be moved in the X-axis, Y-axis, and Z-axis directions by the drive source. The sample container 40 is gripped by four claws 52 provided at the tip 53 of the arm 51.

[0022] The following describes in detail the transportation of the sample container 40. The control device 80 moves the arm 51 so that the tip 53 of the arm 51 is positioned above the target container. When the tip 53 of the arm 51 reaches above the target container, the control device 80 lowers the arm 51 and grips the target container with the claws 52.

[0023] Next, the control device 80 raises the arm 51 to a predetermined position. Once the arm 51 has risen to the predetermined position, the control device 80 moves the arm 51 so that the tip 53 of the arm 51 is positioned above the measuring device 20. Once the tip 53 of the arm 51 reaches above the measuring device 20, the control device 80 opens the opening / closing lid 24 of the measuring device 20 and lowers the arm 51. Once the bottom surface of the sample container 40 reaches the measuring device 20, the control device 80 spreads the claws 52 and places the sample container 40 in the measuring device 20. Through this process, the control device 80 transports the target sample container 40 to the measuring device 20. The sample in the transported sample container 40 is analyzed by the measuring device 20. Details of this analysis will be described later.

[0024] When the analysis of the sample by the measuring device 20 is completed, the transport device 70 transports the sample container 40 in the measuring device 20 to the original sample tray 30 or the evacuation section 60. Specifically, if the target container can be returned to its original position in the original sample tray 30, the transport device 70 returns the target container to its original position in the original sample tray 30. On the other hand, if the target container cannot be returned to its original position in the original sample tray 30, the transport device 70 transports the target container to the evacuation section 60.

[0025] The control device 80 also locks a sample tray in use using the locking device 33. Here, a sample tray in use is, for example, a sample tray that is in a storage state and on which a sample container 40 (target container) to be transported by the transport device 70 is placed. For example, in the example of Figure 1, the sample tray 30a is the sample tray in use, and the control device 80 locks the sample tray 30a using the locking device 33a.

[0026] If the lock on a sample tray in use is released, the sample tray can be pulled out by the user. Therefore, if the arm 51 descends while the sample tray is pulled out, problems such as being unable to grip the intended sample container 40 may occur. Therefore, in this embodiment, the sample tray (sample tray in use) on which the sample container 40 to be transported by the transport device 70 is placed is locked. This prevents the above-mentioned problems.

[0027] Furthermore, as will be described later, the X-ray analysis apparatus 1 can update the analysis schedule to accommodate a new analysis process with a high degree of urgency. For example, even if the sample tray 30a is locked, the other sample trays 30b to 30d are unlocked. Therefore, the user can pull out one of the other sample trays 30b to 30d and place a sample to be used in a new analysis process (hereinafter also referred to as a "new sample").

[0028] 3 is a diagram showing the hardware configuration of the analysis device 10 and the information processing device 90. As described above, the analysis device 10 includes the control device 80, the measurement device 20, the transport device 70, and the locking devices 33a to 33d.

[0029] The control device 80 includes a CPU (Central Processing Unit) 81 , a ROM (Read Only Memory) 82 , a RAM (Random Access Memory) 83 , a communication interface 84 , a memory 85 , and an I / O (Input / Output) interface 86 .

[0030] The CPU 81 performs overall control of the entire analyzer 10. The CPU 81 loads a program stored in the ROM 82 into the RAM 83 and executes it. The ROM 82 stores a program that describes the processing procedures of the control device 80. The RAM 83 serves as a work area when the CPU 81 executes a program, and temporarily stores the program, data used when the program is executed, and the like.

[0031] The communication interface 84 is an interface for communicating with the information processing device 90. The memory 85 stores the analysis results, the analysis schedule (described later), and the like. The I / O interface 86 is an interface for input to or output from the control device 80. The I / O interface 86 is connected to the measuring device 20, the transport device 70, and the locking devices 33a to 33d. The control device 80 can control the measuring device 20, the transport device 70, and the locking devices 33a to 33d via the I / O interface 86.

[0032] The information processing device 90 includes a control device 95, a communication interface 94, a memory 98, an input device 96, and a display device 97. The control device 95 includes a CPU 91, a ROM 92, and a RAM 93.

[0033] The CPU 91 performs overall control of the entire information processing device 90. The CPU 91 loads a program stored in the ROM 92 into the RAM 93 and executes it. The ROM 92 stores a program that describes the processing procedures of the information processing device 90. The RAM 93 serves as a working area when the CPU 91 executes a program, and temporarily stores the program, data used to execute the program, and the like.

[0034] The communication interface 94 is an interface for communicating with the analysis device 10. The memory 98 stores various information.

[0035] The input device 96 accepts input of user instructions. The user instructions are, for example, instructions to update the analysis schedule, which will be described later. The input device 96 is, for example, a keyboard, a mouse, or a touch panel. The display device 97 displays, for example, various screens.

[0036] [Measuring Apparatus] Figure 4 is a diagram showing an example of the configuration of the measuring apparatus 20. The measuring apparatus 20 includes a housing 102, a housing 112, a sample stage 104, an exhaust device 130, an air supply device 132, and a switching valve 134. The housing 102 is installed on the upper surface of the sample stage 104, and the housing 102 and the sample stage 104 form a first chamber 106. The housing 112 is installed on the lower surface of the sample stage 104, and the housing 112 and the sample stage 104 form a second chamber 114. The analysis chamber 135 is composed of the first chamber 106 and the second chamber 114. The analysis chamber 135 is airtightly enclosed by the housings 102 and 112, and the first chamber 106 and the second chamber 114 are in communication with each other via a communication passage 110 provided in the sample stage 104.

[0037] An opening 108 is formed in the sample stage 104, and a sample container 40 is placed on the sample stage 104 so as to cover the opening 108. The sample container 40 is placed on the sample stage 104 so that the measurement position of the sample in the sample container 40 is exposed to the second chamber 114 at the opening 108 during measurement. An opening 22 is formed in the housing 102 above the opening 108 where the sample container 40 is placed, and an open / close lid 24 is provided on the opening 22. The open / close lid 24 is in an open state when the sample container 40 is carried into or out of the first chamber 106, and is in a closed state during measurement. The open / close lid 24 is configured to maintain airtightness within the first chamber 106 and the second chamber 114 when closed.

[0038] Furthermore, by closing the opening / closing lid 24, leakage of X-rays within the analysis chamber 135 can be prevented. The second chamber 114 is equipped with an X-ray tube 116 and a detector 126 housed in a housing 112. The X-ray tube 116 irradiates primary X-rays toward the bottom surface (analysis surface) of the sample container 40. The X-ray tube 116 includes a filament and a target, and generates X-rays from the target by accelerating thermoelectrons generated from the filament with a high voltage and causing them to collide with the target. The primary X-rays emitted by the X-ray tube 116 are irradiated onto the measurement position of the sample in the sample container 40 through an opening 108.

[0039] When X-rays are irradiated from the X-ray tube 116 onto the sample in the sample container 40, fluorescent X-rays are generated from the sample due to the photoelectric effect. Each element in the sample has its own specific energy. Therefore, the X-ray analyzer 1 can perform qualitative analysis of the elements contained in the sample by detecting the energy of the fluorescent X-rays with the detector 126. The X-ray analyzer 1 can also perform quantitative analysis of the elements contained in the sample by measuring the intensity of the fluorescent X-rays. The detector 126 is, for example, configured by a semiconductor detector including a Si element. Note that the detector 126 may also be configured by a semiconductor detector including an element in which a Si element is doped with a Li element.

[0040] The second chamber 114 is provided with a shutter 118, a primary X-ray filter 120, and a collimator 122. The shutter 118, the primary X-ray filter 120, and the collimator 122 are configured to be slidable by a drive mechanism 124 in a direction perpendicular to the optical path of the primary X-rays.

[0041] The shutter 118 is made of an X-ray absorbing material such as lead, and can be inserted into the optical path of the primary X-rays to block the primary X-rays as needed. The primary X-ray filter 120 is made of a metal foil selected according to the purpose, and attenuates background components of the primary X-rays emitted from the X-ray tube 116 to improve the S / N ratio of required characteristic X-rays. Note that in an actual device, multiple primary X-ray filters 120 made of different types of metal are used, and a primary X-ray filter 120 selected according to the purpose is inserted into the optical path of the primary X-rays by a drive mechanism 124.

[0042] The collimator 122 is an aperture with a circular opening in the center, and determines the size of the primary X-ray beam irradiated onto the sample. The collimator 122 is made of an X-ray absorbing material, such as lead or brass. In an actual device, multiple collimators 122 with different opening diameters are arranged side by side in a direction perpendicular to the optical path of the primary X-rays, and a collimator 122 selected according to the purpose is inserted into the optical path of the primary X-rays by a drive mechanism 124.

[0043] The exhaust device 130 is a device for exhausting the atmosphere inside the first chamber 106 and the second chamber 114, and is configured to include, for example, an exhaust pump, an on-off valve, a pressure control valve, a pressure gauge, etc. The exhaust device 130 is controlled by the control device 80 in accordance with the analysis parameters, and can create a vacuum atmosphere (for example, 30 Pa or less) inside the chamber by exhausting the air inside the chamber through the vent 128 and the switching valve 134.

[0044] The gas supply device 132 is a device for supplying atmospheric air or helium gas into the first chamber 106 and the second chamber 114, and is configured to include, for example, an air supply pump, an on-off valve, a pressure gauge, etc. The gas supply device 132 is controlled by the control device 80 in accordance with the analysis parameters. If the chamber is in a vacuum atmosphere when the atmospheric atmosphere is set, the gas supply device 132 supplies atmospheric air to the chamber through the switching valve 134 and the vent port 128. If the helium atmosphere is set, the gas supply device 132 supplies a helium atmosphere to the chamber through the switching valve 134 and the vent port 128.

[0045] The switching valve 134 is controlled by the control device 80. When the exhaust device 130 is exhausting, the switching valve 134 connects the exhaust device 130 to the vent port 128 and blocks the inflow of gas from the air supply device 132. When the air supply device 132 is supplying air, the switching valve 134 connects the air supply device 132 to the vent port 128 and blocks the discharge of gas to the exhaust device 130.

[0046] In this example, the vent 128 is provided around the detector 126, but the configuration of the vent 128 is not limited to this.

[0047] When measuring a sample, the control device 80 first controls the atmosphere in the analysis chamber 135 of the measurement device 20 in accordance with the analysis parameters of the target container. The analysis parameters are set in advance by the user, for example. The analysis parameters are set by the user using the input device 96 for each sample container 40 placed on the sample tray 30 (see FIG. 1 ). Specifically, the control device 80 controls the atmosphere in the second chamber 114 to be either an air atmosphere, a vacuum atmosphere, or a helium atmosphere in accordance with the analysis parameters.

[0048] Once the atmosphere in the second chamber 114 has been adjusted, the control device 80 starts measurement by the measurement device 20 in accordance with the analysis parameters of the target container. Specifically, the control device 80 controls the tube voltage, tube current, and irradiation time of the X-ray tube 116 in accordance with the analysis parameters, and also drives the shutter 118, primary X-ray filter 120, and collimator 122.

[0049] Next, the control device 80 performs an analysis (qualitative analysis, quantitative analysis) of the various elements contained in the sample in the target container based on the spectrum of the secondary X-rays (fluorescent X-rays) detected by the detector 126, and stores the analysis results in memory 85.

[0050] [Functional Block Diagram of Control Device] Fig. 5 is a functional block diagram of the control device 80. The control device 80 has an input unit 152, a control unit 154, an output unit 156, and a storage unit 158. The storage unit 158 ​​corresponds to the memory 85 in Fig. 3 .

[0051] The input unit 152 receives input information input by a user to the input device 96. The input unit 152 outputs the received input information to the control unit 154. The control unit 154 executes control in accordance with the input information. For example, the control unit 154 executes control of the analyzer 10 and display control of the display device 97.

[0052] The control unit 154 generates an analysis control signal and outputs the analysis control signal from the output unit 156 to the analysis device 10. The analysis device 10 performs analysis processing based on the received analysis control signal. The control unit 154 also generates a display control signal and outputs the generated display control signal to the display device 97 via the output unit 156. The display device 97 displays an image based on the display control signal.

[0053] The X-ray analysis apparatus 1 of this embodiment can execute multiple analysis processes. The user can then determine an "analysis schedule 160" that defines the order of the multiple analysis processes. The user sets the analysis schedule 160 using a predetermined setting screen displayed on the display device 97. The analysis schedule 160 defined by the user is stored in the storage unit 158. The control unit 154 executes the multiple analysis processes in the order defined in the analysis schedule 160.

[0054] [Updating the Analysis Schedule] Next, updating the analysis schedule 160 will be described. Generally, in daily analysis work, when multiple samples are measured according to a previously created analysis schedule, interrupt analysis is not necessary. However, after setting the analysis schedule, the user may want the X-ray analyzer 1 to execute a new analysis process that requires urgent execution as a priority. This may be the case, for example, when various products (e.g., pharmaceuticals, chemical products, and electrical and electronic products) are found to be defective and the user wants to perform an analysis to investigate the defect in the defective product.

[0055] In this embodiment, the control unit 154 updates the analysis schedule 160 by interrupting a newly occurring analysis process that is to be executed with priority among a plurality of analysis processes that have already been set.

[0056] Fig. 6 is a diagram for explaining the update of the analysis schedule 160. The upper diagram of Fig. 6 shows the analysis schedule 160 before the update. The lower diagram of Fig. 6 shows the analysis schedule 160A after the update.

[0057] The analysis schedule 160 in the upper diagram of Fig. 6 defines the order of multiple analysis processes. Then, as shown in the lower diagram of Fig. 6, a new analysis process is inserted between an arbitrary analysis process and the analysis process following the arbitrary analysis process, as a result of an operation by the user or the like. In this embodiment, the arbitrary analysis process is also referred to as a "first analysis process," and the "analysis process following the arbitrary analysis process" is also referred to as a "second analysis process." In this embodiment, the control unit 154 (see Fig. 5) updates the analysis schedule 160 in response to an update instruction from the user via the input device 96.

[0058] As described above, the X-ray analysis apparatus 1 updates the analysis schedule 160 so that the analysis apparatus 10 executes a new analysis process between the first analysis process and the second analysis process (see FIG. 6 ). Therefore, for example, the X-ray analysis apparatus 1 can execute an analysis process requiring urgency with priority over the second analysis process. Furthermore, even when an analysis schedule for multiple analysis processes is set, the X-ray analysis apparatus 1 allows the user to prioritize the analysis process requiring urgency without waiting for the completion of the consecutive analysis processes, thereby saving time. Furthermore, the user does not need to purchase another X-ray analysis apparatus for interruption, and can flexibly execute an analysis process requiring urgency with a single X-ray analysis apparatus 1.

[0059] Furthermore, the X-ray analysis apparatus 1 may manage the analysis schedule 160 using a batch table and a batch queue. Fig. 7 is a diagram showing an example of the concepts of a batch queue and a batch table. The batch table is information that defines an analysis schedule for multiple analytical processes on a sample. The batch queue is information that defines the order of multiple batch tables.

[0060] 7, a first batch table, a second batch table, a third batch table, and a fourth batch table are defined in one batch queue, and it is also defined that the analysis processing is to be executed in the order of the first batch table, the second batch table, the third batch table, and the fourth batch table.

[0061] The first batch table defines an analysis schedule for multiple unknown sample analyses. The first batch table defines three analysis processes: Unknown Sample Analysis 1-1, Unknown Sample Analysis 1-2, and Unknown Sample Analysis 1-3. An unknown sample is a sample whose components, etc., are unknown. Each of the three unknown sample analyses analyzes a different sample. That is, three samples are used in the three unknown sample analyses. Each of the three unknown sample analyses is an independent analysis process. Therefore, in this embodiment, they are also referred to as "independent analysis processes." The X-ray analysis apparatus 1 can insert a new analysis process between two independent analysis processes (first analysis process and second analysis process). For example, Unknown Sample Analysis 1-1 can be designated the first analysis process and Unknown Sample Analysis 1-2 can be designated the second analysis process, and a new analysis process can be inserted between Unknown Sample Analysis 1-1 and Unknown Sample Analysis 1-2.

[0062] The second batch table defines an analysis schedule for a repeat analysis in which an analytical process is repeatedly performed on a sample while the sample remains in the analysis chamber 135. In the example of FIG. 7, three analytical processes are defined: Repeat Analysis 2-1, Repeat Analysis 2-2, and Repeat Analysis 2-3. In a repeat analysis, the same unknown sample is subjected to an analytical process multiple times, and a value based on the analytical values ​​obtained from the multiple analytical processes is output as the analytical result of the unknown sample. The analytical result is, for example, the average value of the analytical values ​​obtained from the multiple analytical processes.

[0063] If a new analysis process is performed between multiple analyses, the accuracy of the "value based on the provisional analysis results of multiple analyses" may decrease. The reason for this decrease in accuracy is that if a new analysis process is performed between multiple analyses, the sample that was previously placed (the sample that is the target of multiple analyses) will be replaced with the sample that is the target of the new analysis process. When the sample is replaced, the atmosphere inside the analysis chamber 135 may change. Therefore, the multiple analyses may be performed in different atmospheres, which may decrease the accuracy of the "value based on the provisional analysis results of multiple analyses."

[0064] Therefore, the X-ray analysis apparatus 1 of this embodiment prohibits a new analysis process from being inserted between multiple analyses (repeated analyses). This makes it possible to prevent a decrease in the accuracy of the "value based on multiple provisional analysis results." The multiple analyses are also collectively referred to as the "first process."

[0065] The third batch table specifies multiple standard sample analyses (three in FIG. 7): Standard Sample Analysis 3-1, Standard Sample Analysis 3-2, and Standard Sample Analysis 3-3. Standard sample analysis is, for example, a process of creating a calibration curve by performing multiple analytical processes on the same known sample. A known sample is a sample whose components to be analyzed are known.

[0066] If a new analysis process is performed between multiple standard sample analyses, the accuracy of the calibration curve may be reduced for the reasons described above. Therefore, the X-ray analysis apparatus 1 of this embodiment prohibits a new analysis process from being performed between multiple standard sample analyses (prohibits updating of the analysis schedule). This prevents the accuracy of the calibration curve from being reduced. The multiple standard sample analyses are also collectively referred to as the "second process."

[0067] The fourth batch table defines multiple (three in FIG. 7 ) controlled sample analyses: controlled sample analysis 4-1, controlled sample analysis 4-2, and controlled sample analysis 4-4. A controlled sample analysis is, for example, a process of calibrating the X-ray analyzer 1 by performing multiple analytical processes on the same known sample.

[0068] If a new analysis process is performed between multiple control sample analyses, the accuracy of the calibration may decrease for the reasons described above. Therefore, the X-ray analysis apparatus 1 of this embodiment prohibits a new analysis process from being performed between multiple control sample analyses (prohibits updating of the analysis schedule). This prevents the accuracy of the calibration from decreasing. The multiple control sample analyses are also collectively referred to as the "third process."

[0069] The first, second, and third processes are also collectively referred to as "continuous analysis processes." A continuous analysis process is a process that is made up of multiple analysis processes. A continuous analysis process is a process that produces an effect through the multiple analysis processes. Therefore, when the first and second analysis processes are included in the continuous analysis process, the control device 80 prohibits updating the analysis schedule 160 in such a way that a new analysis process is executed between the first and second analysis processes.

[0070] Therefore, the X-ray analysis apparatus 1 can appropriately execute the continuous analysis process without impairing the effects of the continuous analysis process. In this case, the control device 80 updates the analysis schedule 160 so that a new analysis process is executed after the continuous analysis process. Therefore, the X-ray analysis apparatus 1 can execute the new analysis process after the continuous analysis process.

[0071] [Analysis Schedule Update Screen] The user can update the analysis schedule 160 using the analysis schedule update screen. Figures 8 to 11 show examples of the analysis schedule update screen. This update screen is displayed in the display area 97A of the display device 97 when the user performs a predetermined operation on the input device 96. The example of Figure 8 shows a screen of an analysis schedule that has already been set by the user.

[0072] In the example of FIG. 8 , an item image 250, a first image 251, a second image 252, a pointer image 254, an add button 256, and an OK button 258 are shown. When an analysis schedule for N (N is an integer equal to or greater than 2) analysis processes is set, the display device 97 displays N analysis images corresponding to the N analysis processes. The display device 97 also displays the N analysis images in a manner that allows the user to recognize the order of the N analysis processes. For example, the display device 97 displays the analysis images from top to bottom based on the order of the N analysis processes. For example, the analysis image corresponding to the first analysis process of the N analysis processes is displayed immediately below the item image 250 and at the top of the N analysis images. The analysis image corresponding to the last analysis process of the N analysis processes is displayed at the bottom of the N analysis images.

[0073] 8, a first image 251 and a second image 252 are shown as the N analysis images, and the remaining analysis images are not described. The first image 251 is an image corresponding to the first analysis process (see FIG. 6). The second image 252 is an image corresponding to the second analysis process (see FIG. 6). Furthermore, because the second image 252 is displayed below the first image 251, the user can recognize that the second analysis process corresponding to the second image 252 will be executed after the first analysis process corresponding to the first image 251.

[0074] The item image 250 is an image showing the items of the analysis parameters. The analysis parameters include, for example, the sample number, tray number, sample name, analysis conditions, and other information. The sample number indicates the number of the sample to be analyzed. The tray number is a number that identifies each of the sample trays 30a to 30d. The sample name indicates the name of the sample to be analyzed. The analysis conditions indicate the analysis conditions for the sample to be analyzed. The other information includes, for example, information indicating the measurement atmosphere. The user inputs these analysis parameters when setting an analysis schedule. The user can also move the pointer image 254 within the display area 97A by operating the mouse.

[0075] The first image 251 indicates that the sample number is A1, the tray number is B1, the sample name is C1, the analysis conditions are D1, and other information is E1 for the first analysis process corresponding to the first image 251. The second image 252 indicates that the sample number is A2, the tray number is B2, the sample name is C2, the analysis conditions are D2, and other information is E2 for the second analysis process corresponding to the second image 252.

[0076] Next, a description will be given of an operation performed by a user to insert a new analysis process between a first analysis process and a second analysis process. As shown in FIG. 9 , the user specifies a display area of ​​the analysis image corresponding to the analysis process that immediately precedes the desired new analysis process. In this embodiment, since the immediately preceding analysis process is the first analysis process, the user specifies the first image 251 corresponding to the first analysis process. This specification is achieved, for example, by aligning the pointer image 254 with the first image 251 and clicking it. In the specified state in which the first image 251 has been specified, the first image 251 is displayed in bold. In this specified state, the user operates the add button 256. The specified area is also referred to as a "specific display area."

[0077] The display device 97 then displays a third image 253 corresponding to the new analytical process, as shown in FIG. 10 . At this point, each analytical parameter in the third image 253 is blank. The user then inputs analytical parameters to be used for the new analytical process in the blank areas of the third image 253. The display device 97 then displays the analytical parameters to be used for the new analytical process, as shown in FIG. 11 . In the example of FIG. 11 , the third image 253 indicates that the sample number for the new analytical process is A3, the tray number is B3, the sample name is C3, the analytical conditions are D3, and other information is E3. Once the analytical parameters for the new analytical process have been input and the user operates the OK button 258, the control device 80 updates the analysis schedule so that the new analytical process is executed. Operating the OK button 258 also constitutes an input of an update command by the user.

[0078] 8 to 11 , the display device 97 displays the first image 251 and the second image 252 in a manner that allows the user to recognize the order of the first analysis process and the second analysis process. The control device 80 then updates the analysis schedule 160 when the user designates a specific display area within the display area of ​​the display device 97. Therefore, the user can update the analysis schedule 160 while visually checking the first image 251 and the second image 252.

[0079] In this embodiment, the specific display area is the display area of ​​the first image 251. Therefore, by specifying the first image 251, the user can update the analysis schedule 160 so that a new analysis process is executed after the first analysis process corresponding to the first image 251. Therefore, the user can intuitively update the analysis schedule 160.

[0080] Alternatively, the specific display area may be another display area. For example, the specific display area may be the display area of ​​the second image 252. In this case, the user can update the analysis schedule 160 by specifying the display area of ​​the second image 252 so that a new analysis process is executed before the second analysis process corresponding to the second image 252. This allows the user to intuitively update the analysis schedule 160.

[0081] Furthermore, when the user specifies a specific display area, the display device 97 displays a third image 253 corresponding to a new analysis process. Therefore, by visually checking the third image 253, the user can recognize that "the analysis schedule 160 has been updated so that a new analysis process will be executed."

[0082] Furthermore, the display device 97 displays the first image 251, the second image 252, and the third image 253 in a manner that allows the user to recognize that the first analysis process, the new analysis process, and the second analysis process will be executed in this order. Therefore, by viewing the first image 251, the second image 252, and the third image 253, the user can recognize that the new analysis process will be executed between the first analysis process and the second analysis process.

[0083] The analysis schedule update screen may be configured so that the user can edit the analysis schedule as needed. Editing includes deleting analysis processes defined in the analysis schedule and changing the order of the analysis processes defined in the analysis schedule. The analysis schedule may be updated by temporarily suspending multiple analysis processes defined in the analysis schedule before the update. The analysis schedule may also be updated without being temporarily suspended.

[0084] [Loading of a New Sample] Next, loading of a new sample (a sample to be used in a new analytical process) will be described. Loading of a new sample may be performed before or after updating the analysis schedule.

[0085] In this embodiment, the sample container 40 containing the sample to be used in the analysis process specified in the analysis schedule before the update corresponds to the "first sample chamber" in the present disclosure. Also, the sample container 40 containing the new sample corresponds to the "second sample chamber" in the present disclosure. The sample tray in which the first sample chamber is formed corresponds to the "first arrangement" in the present disclosure. The sample tray in which the second sample chamber is formed corresponds to the "second arrangement" in the present disclosure.

[0086] In this embodiment, the first arrangement corresponds to the sample tray 30a, and the first sample chamber corresponds to the "sample container 40 that is placed on the sample tray 30a and contains the sample to be used in the analysis process specified in the analysis schedule before the update."

[0087] The second arrangement corresponds to the sample trays 30b to 30d, and the second sample chamber corresponds to "a sample container 40 placed on any of the sample trays 30b to 30d."

[0088] The control device 80 locks the sample tray (sample tray 30a) in use with the locking device. This prevents the sample tray from being pulled out. Therefore, the X-ray analysis device 1 prevents problems caused by attempting to transport samples from the sample tray 30a while the sample tray 30a is exposed to the outside.

[0089] On the other hand, even if sample tray 30a is in use, the control device 80 releases the locks of the unused sample trays (sample trays 30b to 30d) by the locking devices. This allows the sample trays to be pulled out. Therefore, the user can place new samples by pulling out sample trays 30b to 30d without waiting for the sample tray 30a to finish using it.

[0090] The locking device for the sample tray in use (sample tray 30a) is also referred to as the "first locking device," and the locking devices for the unused sample trays (sample trays 30b to 30d) are also referred to as the "second locking device."

[0091] Furthermore, the user can place a new sample by pulling out any of the sample trays 30b to 30d and exposing the sample tray to the outside, thereby reducing the burden on the user of storing a new sample.

[0092] Furthermore, the control device 80 allows any of the unlocked sample trays 30b to 30d to be pulled out while the measurement device 20 is analyzing the sample, that is, while the opening / closing lid 24 is closed, so that the user can place a new sample on the sample tray without X-ray leakage.

[0093] 12 shows an example of a tray screen displayed by the display device 97. This tray screen is displayed in the display area 97A of the display device 97 when the user performs a predetermined operation on the input device 96.

[0094] On this tray screen, tray images 260a, 260b, 260c, and 260d corresponding to sample tray 30a, sample tray 30b, sample tray 30c, and sample tray 30d, respectively, are displayed. Tray images 260a, 260b, 260c, and 260d are also collectively referred to as "tray images 260."

[0095] Each tray image 260 includes 12 circle images, each corresponding to one sample container 40. As also shown in the explanatory image 275, hatched circle images indicate that the tray is in use, and unhatched circle images indicate that the tray is available for use.

[0096] In this embodiment, the sample tray 30a is in use. Therefore, on the display device 97, the circle image 271 of the tray image 260a corresponding to the sample tray 30a is hatched. On the display device 97, the circle images 272 of the tray images 260b to 260d corresponding to the sample trays 30b to 30d are not hatched.

[0097] Furthermore, the display device 97 displays a lock image in association with the tray image 260. The lock image includes a locked image 281 indicating that the tray is locked, and an unlocked image 282 indicating that the tray is not locked.

[0098] 12, the display device 97 displays a locked image 281 in association with the tray image 260a, and an unlocked image 282 in association with the tray images 260b to 260d.

[0099] In this way, the display device 97 displays a tray image 260a and a tray image 260b. The tray image 260a corresponds to the sample tray 30a (first sample chamber), and the tray images 260b to 260d correspond to the sample trays 30b to 30d (second sample chambers), respectively. Therefore, by visually checking the tray image 260, the user can recognize the sample tray in which to place a new sample.

[0100] [Flowchart] Fig. 13 is a flowchart showing part of the processing executed by the X-ray analysis apparatus 1. In step S2, the X-ray analysis apparatus 1 determines an analysis schedule based on a user's input. Next, in step S4, the X-ray analysis apparatus 1 executes processing to update the analysis schedule. After determining the analysis schedule in step S2, the X-ray analysis apparatus 1 executes processing in step S4 while simultaneously executing analysis processing based on the analysis schedule. When all analysis processing in the analysis schedule set by the user has been completed, the processing in Fig. 13 ends.

[0101] 14 shows a subroutine of the analysis schedule update process in step S4. First, in step S42, the X-ray analysis apparatus 1 determines whether or not an update instruction has been input by the user. If an update instruction has not been input by the user (NO in step S42), the analysis schedule update process ends. If an update instruction has been input by the user (YES in step S42), the process proceeds to step S44.

[0102] In step S44, the X-ray analysis apparatus 1 determines whether the first analysis process and the second analysis process (see FIG. 6) into which the new analysis process is to be interrupted are included in the continuous analysis process (see FIG. 7).

[0103] If the first analysis process and the second analysis process are included in the continuous analysis process (YES in step S44), in step S46, the X-ray analysis apparatus 1 updates the analysis schedule so that the new analysis process is executed after the continuous analysis process, and the schedule update process then ends.

[0104] If the first analysis process and the second analysis process are not included in the continuous analysis process (YES in step S44), the process proceeds to step S48. If the first analysis process and the second analysis process are not included in the continuous analysis process, this is because the first analysis process and the second analysis process are the independent analysis processes described above. In step S48, the X-ray analysis apparatus 1 determines whether the second analysis process is being prepared.

[0105] Next, the meaning of "the second analysis process is in preparation" will be explained. When the X-ray analysis apparatus 1 executes an analysis process defined in the analysis schedule, it queues data corresponding to the analysis process and executes the analysis process corresponding to the data by retrieving the data from the queue. When data corresponding to the second analysis process is queued, it is determined that the second analysis process is in preparation. Note that the definition of "whether the second analysis process is in preparation" may be different.

[0106] If the second analysis process is being prepared (YES in step S48), the X-ray analysis apparatus 1 updates the analysis schedule in step S50 so that the new analysis process will be executed after the second analysis process. If the second analysis process is not being prepared (NO in step S48), the X-ray analysis apparatus 1 updates the analysis schedule in step S52 so that the new analysis process will be executed before the second analysis process.

[0107] In this way, when an update instruction is received (YES in step S42), the X-ray analysis apparatus 1 determines whether to execute the second analysis process or the new analysis process first, and can therefore flexibly determine the execution order of the second analysis process and the new analysis process.

[0108] Furthermore, if the preparation process for the second analysis process has not been executed (NO in step S48), the X-ray analysis apparatus 1 determines in step S52 to execute a new analysis process before the second analysis process.

[0109] Furthermore, if a preparatory process for a second analysis process has been executed but a new analysis process is executed before the second analysis process, it will be necessary to erase the preparatory process (delete the data corresponding to the second analysis process stored in the queue), which will impose a burden on the control device 80.

[0110] Therefore, if the preparatory process for the second analysis process is being performed (YES in step S48), the X-ray analysis apparatus 1 determines in step S50 to execute a new analysis process after the second analysis process. Although this determination goes against the user's will, the X-ray analysis apparatus 1 can reduce the burden on the control device 80, such as by deleting the preparatory process.

[0111] [Modifications] (1) In the above embodiment, the configuration has been described in which the update instruction is input by the user. However, the update instruction may be input to the X-ray analysis apparatus 1 from another device. The other device is, for example, a determination device disposed outside the X-ray analysis apparatus 1. The determination device determines the validity of the analysis result output by the X-ray analysis apparatus 1. If the determination device determines that the analysis result is invalid, the determination device outputs an update instruction to the X-ray analysis apparatus 1 to interrupt a new analysis process to redo the analysis. When the X-ray analysis apparatus 1 receives the input of the update instruction, it updates the analysis schedule.

[0112] When the X-ray analysis apparatus 1 analyzes a sample related to the pharmaceutical field, the sample is analyzed using validated procedures and conditions. Therefore, it may not be desirable for the determination apparatus to determine the analysis results of a sample related to the pharmaceutical field. Therefore, it is preferable that the field to which the determination apparatus is applied is a field other than the pharmaceutical field (for example, a field for detecting the presence or absence of pollution).

[0113] (2) In the above embodiment, the new analysis process is a single analysis process. However, the new analysis process may be two or more analysis processes.

[0114] (3) In the above embodiment, a configuration has been described in which, when the first analysis process and the second analysis process are included in the continuous analysis process, the analysis schedule is updated so that the new analysis process is executed after the continuous analysis process, as shown in steps S44 and S46 in Fig. 14. However, even when the first analysis process and the second analysis process are included in the continuous analysis process, the X-ray analysis apparatus 1 may update the analysis schedule so that the new analysis process is executed between the first analysis process and the second analysis process.

[0115] Aspects It will be understood by those skilled in the art that the exemplary embodiments described above are examples of the following aspects.

[0116] (Item 1) An X-ray analysis apparatus according to the present disclosure includes an analysis apparatus, a storage device, and a control device. The analysis apparatus performs an analysis process on a sample in an analysis chamber. The storage device stores an analysis schedule that defines the order of multiple analysis processes to be performed by the analysis apparatus. The control device controls the analysis apparatus based on the analysis schedule. The multiple analysis processes include a first analysis process and a second analysis process that is performed after the first analysis process. The control device updates the analysis schedule so that a new analysis process is performed between the first analysis process and the second analysis process.

[0117] With this configuration, the control device updates the analysis schedule so that the analysis device executes a new analysis process between the first analysis process and the second analysis process, thereby enabling, for example, an analysis process that requires urgency to be executed with priority over the second analysis process.

[0118] (2) In the X-ray analysis apparatus according to the first aspect, the analysis apparatus executes a continuous analysis process consisting of a plurality of analysis processes, and when the continuous analysis process includes a first analysis process and a second analysis process, the control device prohibits updating of the analysis schedule such that a new analysis process is executed between the first analysis process and the second analysis process.

[0119] With this configuration, the execution of a new analysis process between the first analysis process and the second analysis process that constitute the continuous analysis process is prohibited, so that the continuous analysis process can be executed appropriately without impairing the functions provided by the continuous analysis process.

[0120] (Item 3) In the X-ray analysis apparatus according to item 2, the control device updates the analysis schedule so that a new analysis process is executed after the continuous analysis process.

[0121] With this configuration, a new analysis process can be executed after the successive analysis processes.

[0122] (4) In the X-ray analysis device according to claim 2 or 3, the continuous analysis process includes at least one of a first process, a second process, and a third process. The first process is a process of executing a provisional analysis process multiple times on an unknown sample and outputting an analysis result for the unknown sample based on the provisional analysis results of the multiple times. The second process is a process of creating a calibration curve by executing a provisional analysis process multiple times on a known sample. The third process is a process of calibrating the X-ray analysis device by executing a provisional analysis process multiple times on a known sample.

[0123] According to this configuration, the first to third processes can be executed appropriately.

[0124] (Item 5) The X-ray analysis apparatus according to any one of Items 1 to 4, further comprising a first sample chamber for accommodating a sample on which a first analysis process is to be performed, and a second sample chamber for accommodating a sample on which a new analysis process is to be performed, The sample on which the new analysis process is to be performed is accommodated in the second sample chamber even if the first sample chamber is in use.

[0125] This configuration allows the sample chamber to be separated from the sample chamber for the first analysis process already scheduled in the analysis schedule, allowing the user to place the sample for the new analysis process in the second sample chamber without waiting for the first sample chamber to finish being used.

[0126] (Item 6) The X-ray analysis apparatus according to item 5, further comprising a first drawer-type arrangement body in which a first sample chamber is formed, and a second drawer-type arrangement body in which a second sample chamber is formed. With the second arrangement body drawn out, a sample for which a new analysis process is to be performed is accommodated in the second sample chamber.

[0127] With this configuration, even if the first sample chamber is in use, the user can expose the second sample chamber to the outside and place a sample for a new analysis process in the second sample chamber, thereby reducing the burden on the user to place a sample in the second sample chamber.

[0128] (Item 7) The X-ray analysis apparatus according to item 6, further comprising an openable / closable lid. When the lid is in a closed state, leakage of X-rays from the analysis chamber is prevented. When the lid is in a closed state, the second arrangement is withdrawn.

[0129] With this configuration, X-ray leakage is prevented when the lid is closed, so the user can safely pull out the second arrangement and place the sample on which a new analysis process will be performed in the second arrangement.

[0130] (Item 8) An X-ray analysis apparatus according to any one of items 5 to 7, further comprising a transport device that transports the sample contained in the first sample chamber and the sample contained in the second sample chamber to the analysis chamber, a first locking device that prohibits a sample from being placed in the first sample chamber, and a second locking device that prohibits a sample from being placed in the second sample chamber, and the control device locks the first sample chamber with the first locking device when the first sample chamber is in use and unlocks the second locking device.

[0131] With this configuration, while the transport device is transporting the sample contained in the first sample chamber to the analysis chamber, a first lock is executed to lock the first sample chamber so that it is not exposed to the outside. This prevents problems that may occur when attempting to transport the sample in the first sample chamber while the first sample chamber is exposed to the outside. Furthermore, the second lock is released, allowing the second sample chamber to be exposed to the outside, allowing the user to place a sample for a new analysis process in the second sample chamber.

[0132] (Item 9) The X-ray analysis apparatus according to any one of Items 1 to 8, further comprising a display device. The display device displays a first image corresponding to the first analysis process and a second image corresponding to the second analysis process in a manner that allows a user to recognize the order. The control device updates the analysis schedule when the user designates a specific display area within the display area of ​​the display device.

[0133] With this configuration, the user can update the analysis schedule by designating the specific display area while viewing the first image and the second image.

[0134] (Item 10) In the X-ray analysis apparatus according to item 9, the display device displays the second image below the first image in a display area of ​​the display device. The specific display area is the display area of ​​the first image or the display area of ​​the second image.

[0135] With this configuration, the user can update the analysis schedule by specifying the display area of ​​the first image or the display area of ​​the second image, so that a new analysis process is executed between the first analysis process corresponding to the first image and the second analysis process corresponding to the second image, thereby allowing the user to intuitively update the analysis schedule.

[0136] (Item 11) In the X-ray analysis apparatus according to item 9 or 10, the display device displays a third image corresponding to a new analysis process when a user specifies the specific display region.

[0137] With this configuration, the user can recognize that the analysis schedule has been updated by visually checking the third image.

[0138] (Clause 12) In the X-ray analysis apparatus described in Clause 11, the display device displays the first image, the second image, and the third image in a manner that allows the user to recognize that the first analysis process, the new analysis process, and the second analysis process are executed in that order.

[0139] With this configuration, the user can recognize that a new analysis process will be executed between the first analysis process and the second analysis process by visually checking the first image, the second image, and the third image.

[0140] (Item 13) The X-ray analysis apparatus according to any one of Items 5 to 8, further comprising a display device that displays an image corresponding to the first sample chamber and an image corresponding to the second sample chamber.

[0141] With this configuration, the user can recognize the sample chamber in which the sample to be subjected to the new analysis process should be placed.

[0142] (Item 14) In an X-ray analysis apparatus described in any one of items 1 to 13, when the control device receives an input of an update instruction, if preparatory processing for the second analysis processing is being performed, the control device decides to perform a new analysis processing after the second analysis processing, and if preparatory processing is not being performed, the control device decides to perform a new analysis processing before the second analysis processing.

[0143] This configuration can prevent the absurdity of a new analysis process being executed despite the fact that preparation processing for the second analysis process is being executed.

[0144] (15) In the X-ray analysis apparatus according to any one of the first to fourteenth aspects, the control device updates the analysis schedule in response to an update instruction input by a user.

[0145] With this configuration, the analysis schedule can be updated at a timing desired by the user.

[0146] (Item 16) A control method of the present disclosure is a method for controlling an X-ray analysis apparatus. The control method includes determining an analysis schedule that defines an order of multiple analysis processes to be performed by the X-ray analysis apparatus. The multiple analysis processes include a first analysis process and a second analysis process to be performed after the first analysis process. The control method further includes updating the analysis schedule so that a new analysis process is performed between the first analysis process and the second analysis process.

[0147] With this configuration, the control device updates the analysis schedule so that the analysis device executes a new analysis process between the first analysis process and the second analysis process, thereby enabling, for example, an analysis process that requires urgency to be executed with priority over the second analysis process.

[0148] It should be noted that, with regard to the above-mentioned embodiments and modified examples, it has been planned from the beginning of the application that the configurations described in the embodiments may be appropriately combined, including combinations not mentioned in the specification, within the scope that does not cause inconvenience or contradiction.

[0149] The embodiments disclosed herein should be considered to be illustrative in all respects and not restrictive. The scope of the present invention is defined by the claims, not by the above description, and is intended to include all modifications within the meaning and scope of the claims.

[0150] 1 X-ray analysis apparatus, 10 analysis apparatus, 20 measurement apparatus, 24 opening and closing lid, 30 sample tray, 33 locking device, 40 sample container, 70 transport device, 80 control device, 90 information processing device, 96 input device, 97 display device, 97A display area, 104 sample stage, 106 first chamber, 110 communication passage, 114 second chamber, 152 input unit, 154 control unit, 156 output unit, 158 memory unit, 160 analysis schedule, 250 parameter image, 251 first image, 252 second image, 253 third image, 254 pointer image, 256 add button, 258 OK button, 260 tray image, 275 explanation image, 281 lock image, 282 unlock image.

Claims

1. An X-ray analysis apparatus, an analytical device that performs analytical processing of the sample in the analytical room; a storage device that stores an analysis schedule that defines the order of a plurality of analysis processes to be performed by the analysis device; a control device that controls the analysis device based on the analysis schedule, the plurality of analysis processes include a first analysis process and a second analysis process that is executed subsequent to the first analysis process; the control device updates the analysis schedule so that a new analysis process is executed between the first analysis process and the second analysis process; The X-ray analysis apparatus further comprises: a first sample chamber for accommodating a sample on which the first analytical process is to be performed; a second sample chamber for accommodating a sample on which the new analytical process is to be performed; a first arrangement body of a drawer type in which the first sample chamber is formed; a second arrangement body of a drawer type in which the second sample chamber is formed; an openable and closable lid; The sample on which the new analytical process is to be performed is accommodated in the second sample chamber even if the first sample chamber is in use, With the second arrangement body pulled out, a sample on which the new analytical process is to be performed is accommodated in the second sample chamber; When the lid is in a closed state, leakage of X-rays from within the analysis chamber is prevented, The X-ray analysis apparatus, wherein the second arrangement is withdrawn when the lid is in the closed state.

2. An X-ray analysis apparatus, an analytical device that performs analytical processing of the sample in the analytical room; a storage device that stores an analysis schedule that defines the order of a plurality of analysis processes to be performed by the analysis device; a control device that controls the analysis device based on the analysis schedule, the plurality of analysis processes include a first analysis process and a second analysis process that is executed subsequent to the first analysis process; the control device updates the analysis schedule so that a new analysis process is executed between the first analysis process and the second analysis process; The X-ray analysis apparatus further comprises: a first sample chamber for accommodating a sample on which the first analytical process is to be performed; a second sample chamber for accommodating a sample on which the new analytical process is to be performed; a transport device that transports the sample accommodated in the first sample chamber and the sample accommodated in the second sample chamber to the analysis chamber; a first locking device that prohibits a sample from being placed in the first sample chamber; a second locking device that prohibits a sample from being placed in the second sample chamber; The sample on which the new analytical process is to be performed is accommodated in the second sample chamber even if the first sample chamber is in use, The control device locks the first sample chamber with the first locking device and unlocks the second locking device when the first sample chamber is in use.

3. the analysis device performs a continuous analysis process consisting of multiple analysis processes; 3. The X-ray analysis apparatus according to claim 1, wherein the control device prohibits updating of the analysis schedule such that a new analysis process is executed between the first analysis process and the second analysis process when the first analysis process and the second analysis process are included in the consecutive analysis process.

4. The X-ray analysis apparatus according to claim 3 , wherein the control device updates the analysis schedule so that the new analysis process is executed after the continuous analysis process.

5. the continuous analysis process includes at least one process of a first process, a second process, and a third process; the first process is a process of executing the provisional analysis process multiple times on an unknown sample and outputting an analysis result of the unknown sample based on the provisional analysis results of the multiple times; the second process is a process of creating a calibration curve by performing the provisional analysis process multiple times on known samples, The X-ray analysis apparatus according to claim 3 , wherein the third process is a process for calibrating the X-ray analysis apparatus by performing the provisional analysis process a plurality of times on known samples.

6. The X-ray analysis apparatus further includes a display device, the display device displays a first image corresponding to the first analysis process and a second image corresponding to the second analysis process in a manner that allows a user to recognize the order; 3. The X-ray analysis apparatus according to claim 1, wherein the control device updates the analysis schedule in response to a user designating a specific display area within the display area of ​​the display device.

7. the display device displays the second image below the first image in a display area of ​​the display device; The X-ray analysis apparatus according to claim 6 , wherein the specific display area is a display area of ​​the first image or a display area of ​​the second image.

8. The X-ray analysis apparatus according to claim 6 , wherein the display device displays a third image corresponding to the new analysis process when the specific display area is designated by a user.

9. 9. The X-ray analysis apparatus according to claim 8, wherein the display device displays the first image, the second image, and the third image in a manner that allows a user to recognize that the first analysis process, the new analysis process, and the second analysis process are executed in this order.

10. The X-ray analysis apparatus further includes a display device, The X-ray analysis apparatus according to claim 1 , wherein the display device displays an image corresponding to the first sample chamber and an image corresponding to the second sample chamber.

11. When the control device receives an input of an update instruction, If a preparatory process for the second analysis process has been performed, it is determined that the new analysis process will be performed after the second analysis process; 3. The X-ray analysis apparatus according to claim 1, wherein if the preparatory processing has not been performed, it is determined that the new analysis processing is to be performed before the second analysis processing.

12. 3. The X-ray analysis apparatus according to claim 1, wherein the control device updates the analysis schedule in response to an update instruction input by a user.

13. A method for controlling an X-ray analysis apparatus that performs an analysis process on a sample in an analysis room, comprising: determining an analysis schedule that defines the order of a plurality of analysis processes to be performed by the X-ray analysis apparatus; the plurality of analysis processes include a first analysis process and a second analysis process that is executed subsequent to the first analysis process; The control method further includes updating the analysis schedule so that a new analysis process is executed between the first analysis process and the second analysis process; The X-ray analysis device a first sample chamber for accommodating a sample on which the first analytical process is to be performed; a second sample chamber for accommodating a sample on which the new analytical process is to be performed; a first arrangement body of a drawer type in which the first sample chamber is formed; a second arrangement body of a drawer type in which the second sample chamber is formed; An openable and closable lid, The sample on which the new analytical process is to be performed is accommodated in the second sample chamber even if the first sample chamber is in use, With the second arrangement body pulled out, a sample on which the new analytical process is to be performed is accommodated in the second sample chamber; When the lid is in a closed state, leakage of X-rays from within the analysis chamber is prevented, A control method in which the second arrangement is pulled out when the lid is in the closed state.

14. A method for controlling an X-ray analysis apparatus that performs an analysis process on a sample in an analysis room, comprising: determining an analysis schedule that defines the order of a plurality of analysis processes to be performed by the X-ray analysis apparatus; the plurality of analysis processes include a first analysis process and a second analysis process that is executed subsequent to the first analysis process; The control method further includes updating the analysis schedule so that a new analysis process is executed between the first analysis process and the second analysis process; The X-ray analysis apparatus further comprises: a first sample chamber for accommodating a sample on which the first analytical process is to be performed; a second sample chamber for accommodating a sample on which the new analytical process is to be performed; a transport device that transports the sample accommodated in the first sample chamber and the sample accommodated in the second sample chamber to the analysis chamber; a first locking device that prohibits a sample from being placed in the first sample chamber; a second locking device that prohibits a sample from being placed in the second sample chamber; The sample on which the new analytical process is to be performed is accommodated in the second sample chamber even if the first sample chamber is in use, The control method further comprises locking the first sample chamber with the first locking device and unlocking the second locking device when the first sample chamber is in use.