Ion source and mass spectrometer including the same

The ion source with a separated atomizer and charge supply unit stabilizes ion generation and introduction in liquid chromatograph mass spectrometers, addressing dilution and sensitivity issues while reducing maintenance, by using a heating and mixing chamber with positive pressure and auxiliary gas control.

US12640356B2Active Publication Date: 2026-05-26HITACHI HIGH TECH CORP
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Patent Information

Authority / Receiving Office
US · United States
Patent Type
Patents(United States)
Current Assignee / Owner
Filing Date
2021-12-06
Publication Date
2026-05-26

AI Technical Summary

Technical Problem

Existing liquid chromatograph mass spectrometers face issues with sample dilution and sensitivity loss due to high-speed atomized gas flows, leading to unstable ion generation and introduction, particularly in APCI and ESI methods, which require frequent maintenance of needle electrodes and atomizers.

Method used

An ion source comprising an atomizer, a heating and mixing chamber, and a charge supply unit with positive pressure, where vaporized samples and seed ions are mixed without direct contact, and an auxiliary gas adjusts the gas flow rate to stabilize ionization, reducing contamination and environmental influences.

Benefits of technology

Stabilizes ion generation and introduction, improving measurement stability and reducing maintenance needs by separating atomization and charge supply functions, thus enhancing sensitivity and reproducibility.

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Abstract

An ion source includes: an atomizer configured to continuously introduce a liquid sample and atomize the liquid sample; a heating and mixing chamber configured to vaporize the atomized liquid sample; and a charge supply unit configured to ionize the vaporized liquid sample. The charge supply unit has a positive pressure with respect to the heating and mixing chamber. The vaporized liquid sample and a gaseous seed ion supplied from the charge supply unit are mixed in the heating and mixing chamber. An auxiliary gas for adjusting a gas flow rate in the heating and mixing chamber can be introduced into the heating and mixing chamber. The heating and mixing chamber has a chamber outlet configured to introduce the ionized liquid sample into a mass spectrometer. The chamber outlet is connected to a first pore of the mass spectrometer.
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Citation Information

Patent Citations

  • Direct sample analysis ion source

    CN103797559A

  • Multiple sample introduction mass spectrometry

    JP2001516140A

  • Mass spectrometer equipped with soft ionization glow discharge and regulator

    JP2013541130A

  • Soft Ionization Based on Modulated Glow Discharge Method for Quantitative Analysis

    JP2017527078A

  • Multiple sample introduction mass spectrometry

    US20010013579A1