Measuring device for x-ray emission spectrochemical analysis

USD1116883SActive Publication Date: 2026-03-10RIGAKU CORP
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Patent Information

Authority / Receiving Office
US · United States
Patent Type
Designs(United States)
Current Assignee / Owner
Filing Date
2024-11-27
Publication Date
2026-03-10

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Description

[0001] 1. Measuring device for x-ray emission spectrochemical analysis

[0002] 1.1 : Front perspective view

[0003] 1.2 : Back perspective view

[0004] 1.3 : Front

[0005] 1.4 : Top plan view

[0006] 1.5 : Back

[0007] 1.6 : Left

[0008] 1.7 : Right

[0009] 1.8 : Bottom

[0010] 1.9 : Front reference view showing a transparent part

[0011] 1.10 : Front reference view showing a translucent part

[0012] 1.11 : Reference view showing a usage state

Claims

The ornamental design for measuring device for x-ray emission spectrochemical analysis as shown.

Citation Information

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