Defect identification method and system for electrochromic device, and medium

Abstract

The present application belongs to the technical field of device testing. Provided are a defect identification method and defect identification system for an electrochromic device, and a computer-readable storage medium. The defect identification method comprises: firstly, determining at least one of a charging voltage and a discharging voltage for an electrochromic device, and at least one of a charging duration and a discharging duration for the electrochromic device; then, using the charging voltage to perform charging processing on the electrochromic device within the charging duration, or using the discharging voltage to perform discharging processing on the electrochromic device within the discharging duration; and finally, during the charging processing or after the charging processing has been completed, or during the discharging processing or after the discharging processing has been completed, detecting whether the electrochromic device has a predetermined defect. Thus, a device defect can be detected within a short period of time, such that a defective electrochromic device is prevented from being put on the market and used, thereby avoiding the occurrence of problems such as a reduction in the aesthetics, an insufficient service life, or poor reliability of the electrochromic device caused by the defect during use.

Description

A method, system and medium for identifying defects of electrochromic devices

[0001] CROSS-REFERENCE TO RELATED APPLICATIONS

[0002] This application claims priority to the Chinese patent application with application number 202311762637.X filed with the China Patent Office on December 20, 2023, entitled “A defect identification method, system and medium for an electrochromic device”, the entire contents of which are incorporated by reference into this application. Technical Field

[0003] The present application belongs to the field of device detection technology, and in particular relates to a defect recognition method, a defect recognition system, and a computer-readable storage medium for an electrochromic device. Background Art

[0004] An electrochromic device typically includes a first substrate layer, a first conductive layer, an electrochromic medium layer, a second conductive layer, and a second substrate layer stacked in sequence. By applying a voltage to the first conductive layer and the second conductive layer, a potential difference is formed on both sides of the electrochromic medium layer, thereby driving the ions or electrons in the electrochromic medium to undergo an embedding or de-embedding reaction, for example, causing the electrochromic material in the electrochromic medium layer to undergo an oxidation-reduction reaction, so that the electrochromic device appears to have a change in transmittance or color.

[0005] The manufacturing process of electrochromic devices is usually relatively complicated, and some subtle defects that are visible or invisible to the naked eye may easily appear during the manufacturing process. If they are not discovered in time and put on the market (especially for devices with some defects that are invisible to the naked eye), then during long-term charging and discharging use, the defects will be gradually magnified, thereby forming obvious defects that are visible to the naked eye and difficult to accept, such as obvious color blocks, stripes and color spots, which affect the comfort of use of the electrochromic device. In serious cases, it may even affect the service life and reliability of the device.

[0006] Summary of the Invention

[0007] To this end, the present application provides a defect identification method, a defect identification system and a computer-readable storage medium for an electrochromic device, which aim to promptly detect defective electrochromic devices and prevent them from being put into use on the market, thereby avoiding the occurrence of problems such as reduced aesthetics, insufficient service life or poor reliability of the electrochromic device due to the defects during use.

[0008] A first aspect of the present application provides a defect identification method for an electrochromic device, the defect identification method comprising: determining at least one of a charging voltage and a discharging voltage of the electrochromic device, and determining at least one of a charging time and a discharging time of the electrochromic device; charging the electrochromic device using the charging voltage within the charging time, and / or discharging the electrochromic device using the discharging voltage within the discharging time; and, during the charging process or after the charging process is completed, detecting whether the electrochromic device has a predetermined defect; and / or, during the discharging process or after the discharging process is completed, detecting whether the electrochromic device has a predetermined defect.

[0009] In the first aspect of the present application, by charging the electrochromic device within the charging time, or / and discharging it within the discharging time, and detecting whether the electrochromic device has predetermined defects during or after the charging and discharging process, it is possible to promptly identify whether the electrochromic device has defects before it is put on the market, especially to identify some defects that are invisible to the naked eye before the charging and discharging process (initial state), thereby effectively preventing defective electrochromic devices from being put on the market, and thus effectively avoiding the occurrence of problems such as reduced aesthetics, insufficient service life or poor reliability during use due to defects in the electrochromic device.

[0010] Optionally, determining at least one of the charge voltage and discharge voltage of the electrochromic device includes: obtaining at least one of the maximum charge voltage and the maximum discharge voltage of the electrochromic device, determining the charge voltage of the electrochromic device based on the maximum charge voltage, and / or determining the discharge voltage of the electrochromic device based on the maximum discharge voltage. Generally, the maximum charge voltage is greater than the normal charge voltage of the electrochromic device but less than the charge voltage that will cause irreversible damage to the device, and the maximum discharge voltage is greater than the normal discharge voltage of the electrochromic device but less than the discharge voltage that will cause irreversible damage to the device. Therefore, determining the charge voltage and / or discharge voltage of the electrochromic device under the test environment based on the maximum charge voltage and / or the maximum discharge voltage can improve the efficiency of the defect identification method test process while avoiding irreversible damage to the electrochromic device.

[0011] Optionally, determining the charging voltage of the electrochromic device based on the maximum charging voltage includes: determining the maximum charging voltage as the charging voltage of the electrochromic device; or obtaining a first preset voltage difference, calculating the sum of the maximum charging voltage and the first preset voltage difference as a charging overload voltage, and determining the charging overload voltage as the charging voltage of the electrochromic device. Generally, the maximum charging voltage is greater than the normal charging voltage of the electrochromic device but less than the charging voltage that would cause irreversible damage to the device. Determining the maximum charging voltage as the charging voltage of the electrochromic device, i.e., charging the electrochromic device with a higher charging voltage, can increase the shrinkage and expansion rate of the electrode material of the electrochromic device. During the charging process, the electrode material of the electrochromic device undergoes a rapid change process, amplifying the difference in the interfacial impedance of the electrochromic device, thereby intercepting devices with poor appearance during the production testing process. Furthermore, the entire defect detection process falls within the voltage window of reversible reaction, without causing permanent damage to the electrode material or irreversibly affecting the life of the device. Alternatively, a charging overload voltage is used as the charging voltage during the charging process of the electrochromic device. Since its voltage value is larger than the maximum charging voltage, the efficiency of the charging process can be further improved, the process of defect identification of the electrochromic device can be accelerated, and the testing efficiency can be improved.

[0012] Optionally, determining the discharge voltage of the electrochromic device based on the maximum discharge voltage includes: determining the maximum discharge voltage as the discharge voltage of the electrochromic device; or obtaining a second preset voltage difference, calculating the sum of the maximum discharge voltage and the second preset voltage difference as a discharge overload voltage, and determining the discharge overload voltage as the discharge voltage of the electrochromic device. Generally, the maximum discharge voltage is greater than the normal discharge voltage of the electrochromic device but less than the discharge voltage that causes irreversible damage to the device. Determining the maximum discharge voltage as the discharge voltage of the electrochromic device, i.e., using a higher discharge voltage to discharge the electrochromic device, can increase the shrinkage and expansion rate of the electrode material of the electrochromic device. During the discharge process, the electrode material of the electrochromic device undergoes a rapid change process, amplifying the difference in the interfacial impedance of the electrochromic device, thereby intercepting devices with poor appearance during the production testing process. Furthermore, the entire defect detection process falls within the voltage window of the reversible reaction, without causing permanent damage to the electrode material or irreversibly affecting the life of the device. Alternatively, a discharge overload voltage is used as the discharge voltage during the discharge treatment of the electrochromic device. Since its voltage value is larger than the maximum discharge voltage, the efficiency of the discharge treatment can be further improved, the process of defect identification of the electrochromic device can be accelerated, and the test efficiency can be improved.

[0013] Optionally, the first preset voltage difference is between 0.1V and 1.0V. Preferably, the first preset voltage difference is between 0.2V and 0.8V. When the first preset voltage difference is too small, the charging overload voltage calculated therefrom is also too small, which may result in an insignificant increase in the speed of the electrochromic device during the charging process, an insignificant acceleration effect on the defect identification method, and an insignificant improvement in test efficiency. When the first preset voltage difference is too large, the charging overload voltage calculated therefrom is also too large, even exceeding the charging voltage that will cause irreversible damage to the electrochromic device. If the electrochromic device is charged with this excessively large charging overload voltage, it is likely to cause irreversible damage to the electrochromic device, which is detrimental to the test results. Moreover, if the electrochromic device itself does not have defects, it may suffer more serious damage after the test is completed, resulting in a loss-making result. Therefore, limiting the value of the first preset voltage difference within a certain range can ensure that the value of the charging overload voltage calculated thereby is within a relatively normal range, that is, neither too large nor too small, which can not only improve the charging efficiency, but also ensure that no irreversible damage is caused to the electrochromic device, thereby improving the efficiency and reliability of the defect identification test method.

[0014] Optionally, the second preset voltage difference is between 0.1V and 1.0V. Preferably, the second preset voltage difference is between 0.2V and 0.8V. When the second preset voltage difference is too small, the discharge overload voltage calculated therefrom is also too small, which may result in an insignificant increase in the speed of the electrochromic device during the discharge process, an insignificant acceleration effect on the defect identification method, and an insignificant improvement in test efficiency. When the second preset voltage difference is too large, the discharge overload voltage calculated therefrom is also too large, even exceeding the discharge voltage value that will cause irreversible damage to the electrochromic device. If the electrochromic device is discharged using this excessively large discharge overload voltage, irreversible damage to the electrochromic device is likely to be caused, which is detrimental to the test results. Moreover, if the electrochromic device itself does not have defects, it may suffer more serious damage after the test is completed, resulting in a loss-making result. Therefore, limiting the value of the second preset voltage difference to a certain range can ensure that the value of the discharge overload voltage calculated thereby is within a relatively normal range, that is, neither too large nor too small, which can not only improve the discharge efficiency, but also ensure that no irreversible damage is caused to the electrochromic device, thereby improving the efficiency and reliability of the defect identification test method.

[0015] Optionally, obtaining at least one of the maximum charge voltage and the maximum discharge voltage of the electrochromic device includes obtaining a CV curve of the electrochromic device and determining at least one of the maximum charge voltage and the maximum discharge voltage of the electrochromic device based on the CV curve. Thus, the maximum charge voltage and / or the maximum discharge voltage of the electrochromic device can be determined based on the detected CV curve of the electrochromic device, thereby simplifying the process of determining the maximum charge voltage or the maximum discharge voltage and improving the efficiency of the electrochromic device defect identification method.

[0016] Optionally, determining at least one of the maximum charge voltage and the maximum discharge voltage of the electrochromic device according to the CV curve includes: determining a voltage corresponding to a reversible oxidation peak in the CV curve as the maximum charge voltage, and / or determining a voltage corresponding to a reversible reduction peak in the CV curve as the maximum discharge voltage; or;

[0017] Determining the voltage corresponding to the point where the absolute value of the positive current in the CV curve is the largest as the maximum charge voltage, and / or determining the voltage corresponding to the point where the absolute value of the negative current in the CV curve is the largest as the maximum discharge voltage; or;

[0018] The voltage corresponding to the slope reversal point of the positive current curve in the CV curve is determined as the maximum charge voltage, and / or the voltage corresponding to the slope reversal point of the negative current curve in the CV curve is determined as the maximum discharge voltage.

[0019] Therefore, by directly obtaining the CV curve of the electrochromic device and identifying the reversible oxidation peak and / or reduction peak from the CV curve, or identifying the point where the absolute value of the positive current is the largest and / or the point where the absolute value of the negative current is the largest, or identifying the slope reversal point of the positive current curve and / or the slope reversal point of the negative current curve as the maximum charging voltage and / or the maximum discharging voltage, the process of determining the maximum charging voltage or the maximum discharging voltage can be simplified, and the determination process can be further standardized, thereby improving the efficiency and reliability of the device defect identification method.

[0020] Optionally, before using the charging voltage to charge the electrochromic device within the charging time; and / or using the discharging voltage to discharge the electrochromic device within the discharging time, it also includes: detecting the initial open circuit voltage of the electrochromic device; when the initial open circuit voltage is less than 0, using the charging voltage to charge the electrochromic device within the charging time; and / or, when the initial open circuit voltage is greater than 0, using the discharging voltage to discharge the electrochromic device within the discharging time; and / or, when the initial open circuit voltage is equal to 0, using the charging voltage to charge the electrochromic device within the charging time, or using the discharging voltage to discharge the electrochromic device within the discharging time. In this case, by detecting the initial open circuit voltage of the electrochromic device and determining whether to charge or discharge the electrochromic device based on its magnitude relationship with 0, that is, when the initial open circuit voltage is less than 0, only the device is charged, or, when the test includes both charging and discharging, the device is charged first; when the initial open circuit voltage is greater than 0, only the device is discharged, or, when the test includes both charging and discharging, the device is discharged first. In this way, it is possible to avoid the over-discharge phenomenon of the device caused by only discharging the electrochromic device when the initial open circuit voltage is less than 0, or discharging the device first, and also to avoid the over-charge phenomenon of the device caused by only charging the electrochromic device when the initial open circuit voltage is greater than 0, or charging the electrochromic device first, and thus more effectively preventing the electrochromic device from being overcharged or over-discharged during the charging and discharging process, thereby affecting the service life of the device, and improving the reliability and stability of the defect identification method. In addition, when the initial open-circuit voltage detected is 0, charging or discharging can be selected according to actual needs to perform the defect identification test, thereby improving the applicability of the defect identification method.

[0021] Optionally, the number of charging treatments for the electrochromic device is at least two, and a discharge treatment is performed between two adjacent charging treatments; or / and, the number of discharge treatments for the electrochromic device is at least two, and a charging treatment is performed between two adjacent discharge treatments. Thus, the electrochromic device can be subjected to more than two discharge treatments, or more than two discharge treatments, or more than two charging treatments and more than two discharge treatments simultaneously. That is, through multiple charge and discharge treatments, the shrinkage and expansion rate of the electrode material of the electrochromic device can be further improved, and the difference in the interfacial impedance of the electrochromic device can be further amplified, so as to better detect whether the electrochromic device has defects and better intercept devices with poor appearance in the production test process; and, in the defect detection process of multiple charge and discharge treatments, the entire defect detection process falls within the voltage window of the reversible reaction, will not cause permanent damage to the electrode material, and will not bring irreversible effects on the life of the device. In addition, the charge treatment between two adjacent discharge treatments, or the discharge treatment between two adjacent charge treatments, can provide detection conditions for the next discharge treatment or charge treatment.

[0022] Optionally, determining at least one of the charge time and discharge time of the electrochromic device includes: obtaining at least one of the maximum charge time and the maximum discharge time of the electrochromic device, determining the charge time of the electrochromic device based on the maximum charge time, and / or determining the discharge time of the electrochromic device based on the maximum discharge time. Generally, the maximum charge time is greater than the normal charge time of the electrochromic device but less than the charge time that will cause overcharge damage to the device, and the maximum discharge time is greater than the normal discharge time of the electrochromic device but less than the discharge time that will cause overdischarge damage to the device. Therefore, based on the maximum charge time and / or maximum discharge time, determining the charge time and / or discharge time of the electrochromic device under the test environment can improve the efficiency of the defect identification method test process while avoiding irreversible damage to the electrochromic device caused by overcharging or overdischarging.

[0023] Optionally, determining the charging time of the electrochromic device based on the maximum charging time includes: determining the maximum charging time as the charging time of the electrochromic device; or, obtaining a first preset time difference, calculating the difference between the maximum charging time and the first preset time difference as the normal charging time, and determining the normal charging time as the charging time of the electrochromic device; or, obtaining a second preset time difference, calculating the sum of the maximum charging time and the second preset time difference as the overload charging time, and determining the overload charging time as the charging time of the electrochromic device. In general, the maximum charging time is greater than the normal charging time of the electrochromic device but less than the charging time that will cause overcharge damage to the device. The maximum charging time is determined as the charging time of the electrochromic device, that is, using a longer charging time to charge the electrochromic device can extend the shrinkage and expansion time of the electrode material of the electrochromic device, thereby better identifying defective electrochromic devices and intercepting devices with poor appearance in the production test process. Moreover, the entire defect detection process falls within the time window of the reversible reaction and will not cause permanent damage to the electrode material caused by overcharging, nor will it have an irreversible impact on the life of the device. Alternatively, the charging overload time is used as the charging time in the charging process of the electrochromic device, thereby further extending the charging process time and improving the effectiveness of the defect identification process for the electrochromic device. In addition, when a normal charging time that is shorter than the maximum charging time is used as the charging time, the charging process time can be shortened to further improve the efficiency of the defect identification process. In particular, when an overload charging voltage is used to charge the electrochromic device so that its charging time is equal to the normal charging time, the charging processing time can be further shortened, and the efficiency of the device defect identification process can be further improved.

[0024] Optionally, determining the discharge duration of the electrochromic device based on the maximum discharge duration includes: determining the maximum discharge duration as the discharge duration of the electrochromic device; or, obtaining a third preset time difference, calculating the difference between the maximum discharge duration and the third preset time difference as a normal discharge duration, and determining the normal discharge duration as the discharge duration of the electrochromic device; or, obtaining a fourth preset time difference, calculating the sum of the maximum discharge duration and the fourth preset time difference as an overload discharge duration, and determining the overload discharge duration as the discharge duration of the electrochromic device. In general, the maximum discharge duration is greater than the normal discharge duration of the electrochromic device but less than the discharge duration that will cause over-discharge damage to the device. The maximum discharge duration is determined as the discharge duration of the electrochromic device, that is, using a longer discharge duration to discharge the electrochromic device can extend the shrinkage and expansion time of the electrode material of the electrochromic device, thereby better identifying defective electrochromic devices and intercepting devices with poor appearance in the production test process. Moreover, the entire defect detection process falls within the time window of the reversible reaction and will not cause permanent damage to the electrode material caused by over-discharge, nor will it have an irreversible impact on the life of the device. Alternatively, the discharge overload duration is used as the discharge duration during the discharge treatment process of the electrochromic device, thereby further extending the discharge treatment time and improving the effectiveness of the defect identification process for the electrochromic device. In addition, when a normal discharge duration that is shorter than the maximum discharge duration is used as the discharge duration, the discharge treatment time can be shortened to further improve the efficiency of the defect identification process. In particular, when an overload discharge voltage is used to discharge the electrochromic device so that its discharge time is equal to the normal discharge time, the discharge processing time can be further shortened, and the efficiency of the device defect identification process can be further improved.

[0025] Optionally, the ratio of the first preset time difference to the maximum charging duration is 1% to 100%, and / or the ratio of the second preset time difference to the maximum charging duration is 1% to 200%. Generally speaking, when the maximum charging time value is determined, the smaller the ratio of the first preset time difference to the maximum charging time, the smaller the value of the first preset time difference. Therefore, the normal charging time calculated by the difference between the maximum charging time and the first preset time difference is larger. When the ratio of the first preset time difference to the maximum charging time is larger, the calculated normal charging time is smaller. When the normal charging time is used as the charging time of the electrochromic device, if the value is too small, the charging processing time of the electrochromic device will be too short, and the possible defects will not be fully exposed. If the value is too large, the charging processing time will be extended, which is not conducive to the test efficiency of the defect identification method. Therefore, limiting the value of the ratio of the first preset time difference to the maximum charging time to a certain range can not only ensure that the possible defects of the electrochromic device can have sufficient time to be exposed, but also improve the test efficiency of the defect identification method. In addition, when the maximum charging time value is determined, the smaller the ratio of the second preset time difference to the maximum charging time, the smaller the value of the second preset time difference. Therefore, the overload charging time calculated by the sum of the maximum charging time and the second preset time difference is smaller. When the ratio of the second preset time difference to the maximum charging time is larger, the calculated overload charging time is larger. When the overload charging time is used as the charging time of the electrochromic device, if the value is too small, the charging processing time of the electrochromic device will not be long enough, and its possible defects will not be fully exposed. If the value is too large, the charging processing time will be extended, and there will be a risk of overcharging the electrochromic device, thereby causing irreversible damage to the electrochromic device. Therefore, limiting the value of the ratio of the second preset time difference to the maximum charging time to a certain range can not only ensure that the possible defects of the electrochromic device can have sufficient time to be exposed, but also prevent the electrochromic device from being overcharged, thereby ensuring the effectiveness and reliability of the defect identification method.

[0026] Optionally, the ratio of the third preset time difference to the maximum discharge duration is 1% to 100%, and / or the ratio of the fourth preset time difference to the maximum discharge duration is 1% to 200%. Generally speaking, when the maximum discharge duration value is determined, the smaller the ratio of the third preset time difference to the maximum discharge duration, the smaller the value of the third preset time difference. Therefore, the normal discharge duration calculated by the difference between the maximum discharge duration and the third preset time difference is larger. When the ratio of the third preset time difference to the maximum discharge duration is larger, the calculated normal discharge duration is smaller. When the normal discharge duration is used as the discharge duration of the electrochromic device, if the value is too small, the discharge treatment time of the electrochromic device will be too short, and the possible defects will not be fully exposed. If the value is too large, the discharge treatment time will be extended, which is not conducive to the test efficiency of the defect identification method. Therefore, limiting the value of the ratio of the third preset time difference to the maximum discharge duration to a certain range can not only ensure that the possible defects of the electrochromic device can have sufficient time to be exposed, but also improve the test efficiency of the defect identification method. In addition, when the maximum discharge time value is determined, the smaller the ratio of the fourth preset time difference to the maximum discharge time value, the smaller the value of the fourth preset time difference value. Therefore, the overload discharge time calculated by the sum of the maximum discharge time value and the fourth preset time difference value is smaller. When the ratio of the fourth preset time difference to the maximum discharge time value is larger, the calculated overload discharge time is larger. When the overload discharge time value is used as the discharge time value of the electrochromic device, if the value is too small, the discharge treatment time of the electrochromic device will not be long enough, and the possible defects of the electrochromic device will not be fully exposed. If the value is too large, the discharge treatment time will be extended, and there will be a risk of over-discharging the electrochromic device, thereby causing irreversible damage to the electrochromic device. Therefore, limiting the value of the ratio of the fourth preset time difference to the maximum discharge time value to a certain range can not only ensure that the possible defects of the electrochromic device can have sufficient time to be exposed, but also prevent the electrochromic device from being overcharged, thereby ensuring the effectiveness and reliability of the defect identification method.

[0027] Optionally, obtaining at least one of the maximum charge time and the maximum discharge time of the electrochromic device includes obtaining a CV curve of the electrochromic device and determining at least one of the maximum charge time and the maximum discharge time of the electrochromic device based on the CV curve. Thus, the maximum charge time and / or the maximum discharge time of the electrochromic device can be determined based on the detected CV curve of the electrochromic device, thereby simplifying the process of determining the maximum charge time or the maximum discharge time and improving the efficiency of the electrochromic device defect identification method.

[0028] Optionally, determining at least one of the maximum charging time and the maximum discharging time of the electrochromic device based on the CV curve includes: determining that the difference between the voltage corresponding to the reversible oxidation peak in the CV curve and the voltage corresponding to the first preset slope of the positive current curve slope is a first voltage interval △V1; obtaining the scanning speed f of the electrochromic device in the process of scanning to obtain the CV curve, and calculating the maximum charging time T1=△V1 / f based on the first voltage interval and the scanning speed; and / or determining that the difference between the voltage corresponding to the reversible reduction peak in the CV curve and the voltage corresponding to the second preset slope of the negative current curve slope is a second voltage interval △V2; obtaining the scanning speed f of the electrochromic device in the process of scanning to obtain the CV curve, and calculating the maximum discharge time T2=△V2 / f based on the second voltage interval and the scanning speed. Therefore, by directly obtaining the CV curve of the electrochromic device, identifying the voltage corresponding to the reversible oxidation peak and / or reduction peak from the CV curve, and identifying the voltage corresponding to the first preset slope of the positive current curve slope and / or the voltage corresponding to the second preset slope of the negative current curve slope, the maximum charging time and / or the maximum discharging time are obtained by calculating the ratio of the voltage difference to the scanning speed. This can simplify the process of determining the maximum charging time or the maximum discharging time, and further standardize the determination process, thereby improving the efficiency and reliability of the device defect identification method.

[0029] Optionally, the absolute value of the first preset slope is less than 0.5, and / or the absolute value of the second preset slope is less than 0.5. Preferably, the first preset slope is equal to 0.5, and / or the second preset slope is equal to 0. Thus, appropriate values ​​for the first preset slope and / or the second preset slope can be set according to actual needs, thereby making the electrochromic device defect identification method more applicable.

[0030] Optionally, obtaining at least one of the maximum charging time and the maximum discharging time of the electrochromic device includes: obtaining a first current-time curve during the charging process of the electrochromic device, and determining the maximum charging time of the electrochromic device based on the first current-time curve; and / or obtaining a second current-time curve during the discharging process of the electrochromic device, and determining the maximum discharging time of the electrochromic device based on the second current-time curve. Thus, the maximum charging time and / or the maximum discharging time can be determined based on the detected current-time curve, thereby simplifying the process of determining the maximum charging time and / or the maximum discharging time, and improving the efficiency of the defect identification method for the electrochromic device.

[0031] Optionally, determining the maximum charging time of the electrochromic device based on the first current-time curve includes: determining the time corresponding to when the current in the first current-time curve is less than a first preset current value as the maximum charging time; or determining the time corresponding to when the slope of the first current-time curve reaches a third preset slope as the maximum charging time. In this way, the current value or curve slope in the current-time curve can be directly obtained, and the time corresponding to when the current value is less than the first preset current value can be identified as the maximum charging time, or the time corresponding to when the slope of the curve is the third preset slope can be identified as the maximum charging time. This can further simplify the process of determining the maximum charging time and make the determination process more standardized, thereby improving the efficiency and reliability of the defect identification method for electrochromic devices.

[0032] Optionally, the first preset current value is less than or equal to 40mA, and / or the absolute value of the third preset slope is less than 0.1. Thus, different preset current values ​​can be selected as the basis for determining the maximum charging time, depending on the structure or material of the electrochromic device itself. This not only meets the application requirements of different devices, but also makes the ultimately determined maximum charging time more reliable, facilitating more thorough subsequent charging processing and improving the reliability of the test results of the defect identification method. Furthermore, an appropriate value for the third preset slope can be set based on actual needs, thereby making the defect identification method for electrochromic devices more applicable.

[0033] Optionally, determining the maximum discharge duration of the electrochromic device based on the second current-time curve includes: determining the time corresponding to when the current in the second current-time curve is less than a second preset current value as the maximum discharge duration; or determining the time corresponding to when the slope of the second current-time curve reaches a fourth preset slope as the maximum discharge duration. In this way, the current value or curve slope in the current-time curve can be directly obtained, and the time corresponding to when the current value is less than the second preset current value can be identified as the maximum discharge duration, or the time corresponding to when the slope of the curve is the fourth preset slope can be identified as the maximum discharge duration. This can further simplify the process of determining the maximum discharge duration and make its determination process more standardized, thereby improving the efficiency and reliability of the defect identification method for electrochromic devices.

[0034] Optionally, the second preset current value is less than or equal to 40mA, and / or the absolute value of the fourth preset slope is less than 0.1. Thus, different preset current values ​​can be selected as the basis for determining the maximum discharge duration, depending on the structure or material of the electrochromic device itself. This not only meets the application requirements of different devices, but also makes the ultimately determined maximum discharge duration more reliable, facilitating more thorough subsequent discharge processing and improving the reliability of the test results of the defect identification method. Furthermore, an appropriate value for the fourth preset slope can be set based on actual needs, thereby making the defect identification method for electrochromic devices more applicable.

[0035] The second aspect of the present application also provides a defect identification system for an electrochromic device, comprising: a processor for determining at least one of a charging voltage and a discharging voltage of the electrochromic device, and determining at least one of a charging time and a discharging time of the electrochromic device; a driver for charging the electrochromic device using the charging voltage within the charging time, and / or discharging the electrochromic device using the discharging voltage within the discharging time; and a detector for detecting whether the electrochromic device has a predetermined defect during or after the charging process; and / or detecting whether the electrochromic device has a predetermined defect during or after the discharging process.

[0036] In the second aspect of the present application, the driver causes the electrochromic device to be charged within the charging time, or / and, causes the electrochromic device to be discharged within the discharging time, and during the charging and discharging process or after the charging and discharging process is completed, the detector detects whether the electrochromic device has predetermined defects. This can timely identify whether the electrochromic device has defects before it is put on the market, especially identify some defects that are invisible to the naked eye before the charging and discharging process (initial state), thereby effectively preventing defective electrochromic devices from being put on the market, and thus effectively avoiding the occurrence of problems such as reduced aesthetics, insufficient service life or poor reliability during use due to defects in the electrochromic device.

[0037] Optionally, the processor is specifically configured to: obtain at least one of a maximum charging voltage and a maximum discharging voltage of the electrochromic device, determine the charging voltage of the electrochromic device based on the maximum charging voltage, and / or determine the discharging voltage of the electrochromic device based on the maximum discharging voltage. Generally, the maximum charging voltage is greater than the normal charging voltage of the electrochromic device but less than the charging voltage that will cause irreversible damage to the device, and the maximum discharging voltage is greater than the normal discharging voltage of the electrochromic device but less than the discharging voltage that will cause irreversible damage to the device. Thus, by determining the charging voltage and / or discharging voltage of the electrochromic device under the test environment based on the maximum charging voltage and / or the maximum discharging voltage, the efficiency of the defect identification method test process can be improved while also avoiding irreversible damage to the electrochromic device.

[0038] Optionally, the processor is specifically configured to: determine the maximum charging voltage as the charging voltage of the electrochromic device; or obtain a first preset voltage difference, calculate the sum of the maximum charging voltage and the first preset voltage difference as a charging overload voltage, and determine the charging overload voltage as the charging voltage of the electrochromic device. Generally, the maximum charging voltage is greater than the normal charging voltage of the electrochromic device but less than the charging voltage that would cause irreversible damage to the device. Determining the maximum charging voltage as the charging voltage of the electrochromic device, i.e., charging the electrochromic device with a higher charging voltage, can increase the shrinkage and expansion rate of the electrode material of the electrochromic device. During the charging process, the electrode material of the electrochromic device undergoes a rapid change process, amplifying the difference in the interfacial impedance of the electrochromic device, thereby intercepting devices with poor appearance during the production testing process. Furthermore, the entire defect detection process falls within the voltage window of the reversible reaction, without causing permanent damage to the electrode material or irreversibly affecting the life of the device. Alternatively, a charging overload voltage is used as the charging voltage during the charging process of the electrochromic device. Since its voltage value is larger than the maximum charging voltage, the efficiency of the charging process can be further improved, the process of defect identification of the electrochromic device can be accelerated, and the testing efficiency can be improved.

[0039] Optionally, the processor is specifically configured to: determine the maximum discharge voltage as the discharge voltage of the electrochromic device; or obtain a second preset voltage difference, calculate the sum of the maximum discharge voltage and the second preset voltage difference as a discharge overload voltage, and determine the discharge overload voltage as the discharge voltage of the electrochromic device. Generally, the maximum discharge voltage is greater than the normal discharge voltage of the electrochromic device but less than the discharge voltage that would cause irreversible damage to the device. Determining the maximum discharge voltage as the discharge voltage of the electrochromic device, i.e., using a higher discharge voltage to discharge the electrochromic device can increase the shrinkage and expansion rate of the electrode material of the electrochromic device. During the discharge process, the electrode material of the electrochromic device undergoes a rapid change process, amplifying the difference in the interfacial impedance of the electrochromic device, thereby intercepting devices with poor appearance during the production test process. Furthermore, the entire defect detection process falls within the voltage window of the reversible reaction, without causing permanent damage to the electrode material or irreversibly affecting the life of the device. Alternatively, a discharge overload voltage is used as the discharge voltage during the discharge treatment of the electrochromic device. Since its voltage value is larger than the maximum discharge voltage, the efficiency of the discharge treatment can be further improved, the process of defect identification of the electrochromic device can be accelerated, and the test efficiency can be improved.

[0040] Optionally, the first preset voltage difference is between 0.1V and 1.0V. Preferably, the first preset voltage difference is between 0.2V and 0.8V. When the first preset voltage difference is too small, the charging overload voltage calculated therefrom is also too small, which may result in an insignificant increase in the speed of the electrochromic device during the charging process, an insignificant acceleration effect on the defect identification method, and an insignificant improvement in test efficiency. When the first preset voltage difference is too large, the charging overload voltage calculated therefrom is also too large, even exceeding the charging voltage that will cause irreversible damage to the electrochromic device. If the electrochromic device is charged with this excessively large charging overload voltage, it is likely to cause irreversible damage to the electrochromic device, which is detrimental to the test results. Moreover, if the electrochromic device itself does not have defects, it may suffer more serious damage after the test is completed, resulting in a loss-making result. Therefore, limiting the value of the first preset voltage difference within a certain range can ensure that the value of the charging overload voltage calculated thereby is within a relatively normal range, that is, neither too large nor too small, which can not only improve the charging efficiency, but also ensure that no irreversible damage is caused to the electrochromic device, thereby improving the efficiency and reliability of the defect identification test method.

[0041] Optionally, the second preset voltage difference is between 0.1V and 1.0V. Preferably, the second preset voltage difference is between 0.2V and 0.8V. When the second preset voltage difference is too small, the discharge overload voltage calculated therefrom is also too small, which may result in an insignificant increase in the speed of the electrochromic device during the discharge process, an insignificant acceleration effect on the defect identification method, and an insignificant improvement in test efficiency. When the second preset voltage difference is too large, the discharge overload voltage calculated therefrom is also too large, even exceeding the discharge voltage value that will cause irreversible damage to the electrochromic device. If the electrochromic device is discharged using this excessively large discharge overload voltage, irreversible damage to the electrochromic device is likely to be caused, which is detrimental to the test results. Moreover, if the electrochromic device itself does not have defects, it may suffer more serious damage after the test is completed, resulting in a loss-making result. Therefore, limiting the value of the second preset voltage difference to a certain range can ensure that the value of the discharge overload voltage calculated thereby is within a relatively normal range, that is, neither too large nor too small, which can not only improve the discharge efficiency, but also ensure that no irreversible damage is caused to the electrochromic device, thereby improving the efficiency and reliability of the defect identification test method.

[0042] Optionally, the processor is specifically configured to obtain a CV curve of the electrochromic device and determine at least one of a maximum charge voltage and a maximum discharge voltage of the electrochromic device based on the CV curve. Thus, the maximum charge voltage and / or maximum discharge voltage of the electrochromic device can be determined based on the detected CV curve of the electrochromic device, thereby simplifying the process of determining the maximum charge voltage or maximum discharge voltage and improving the efficiency of the electrochromic device defect identification method.

[0043] Optionally, the processor is specifically configured to: determine a voltage corresponding to a reversible oxidation peak in the CV curve as the maximum charge voltage, and / or determine a voltage corresponding to a reversible reduction peak in the CV curve as the maximum discharge voltage; or;

[0044] Determining the voltage corresponding to the point where the absolute value of the positive current in the CV curve is the largest as the maximum charge voltage, and / or determining the voltage corresponding to the point where the absolute value of the negative current in the CV curve is the largest as the maximum discharge voltage; or;

[0045] The voltage corresponding to the slope reversal point of the positive current curve in the CV curve is determined as the maximum charge voltage, and / or the voltage corresponding to the slope reversal point of the negative current curve in the CV curve is determined as the maximum discharge voltage.

[0046] Therefore, by directly obtaining the CV curve of the electrochromic device and identifying the reversible oxidation peak and / or reduction peak from the CV curve, or identifying the point where the absolute value of the positive current is the largest and / or the point where the absolute value of the negative current is the largest, or identifying the slope reversal point of the positive current curve and / or the slope reversal point of the negative current curve as the maximum charging voltage and / or the maximum discharging voltage, the process of determining the maximum charging voltage or the maximum discharging voltage can be simplified, and the determination process can be further standardized, thereby improving the efficiency and reliability of the device defect identification method.

[0047] Optionally, the processor is also used to: detect the initial open circuit voltage of the electrochromic device; the driver is specifically used to: when the initial open circuit voltage is less than 0, use the charging voltage to charge the electrochromic device within the charging time; and / or, when the initial open circuit voltage is greater than 0, use the discharge voltage to discharge the electrochromic device within the discharge time; and / or, when the initial open circuit voltage is equal to 0, use the charging voltage to charge the electrochromic device within the charging time, or use the discharge voltage to discharge the electrochromic device within the discharge time. In this case, the processor detects the initial open-circuit voltage of the electrochromic device and determines whether to control the driver to charge or discharge the electrochromic device based on its relationship with 0, that is, when the initial open-circuit voltage is less than 0, the driver only charges the device, or, when the test includes both charging and discharging, the driver first charges the device; when the initial open-circuit voltage is greater than 0, the driver only discharges the device, or, when the test includes both charging and discharging, the driver first discharges the device. In this way, it is possible to avoid the over-discharge phenomenon of the device caused by only discharging the electrochromic device when the initial open-circuit voltage of the electrochromic device is less than 0, or discharging the device first, and also to avoid the over-charge phenomenon of the device caused by only charging the electrochromic device when the initial open-circuit voltage of the electrochromic device is greater than 0, or charging the device first, and thus more effectively preventing the electrochromic device from being overcharged or over-discharged during the charging and discharging process, thereby affecting the service life of the device, and improving the reliability and stability of the defect identification method. In addition, when the initial open-circuit voltage detected is 0, charging or discharging can be selected according to actual needs to perform the defect identification test, thereby improving the applicability of the defect identification method.

[0048] Optionally, the number of charging treatments for the electrochromic device is at least two, and a discharge treatment is performed between two adjacent charging treatments; or / and, the number of discharge treatments for the electrochromic device is at least two, and a charging treatment is performed between two adjacent discharge treatments. Thus, the electrochromic device can be subjected to more than two discharge treatments, or more than two discharge treatments, or more than two charging treatments and more than two discharge treatments simultaneously. That is, through multiple charge and discharge treatments, the shrinkage and expansion rate of the electrode material of the electrochromic device can be further improved, and the difference in the interfacial impedance of the electrochromic device can be further amplified, so as to better detect whether the electrochromic device has defects and better intercept devices with poor appearance in the production test process; and, in the defect detection process of multiple charge and discharge treatments, the entire defect detection process falls within the voltage window of the reversible reaction, will not cause permanent damage to the electrode material, and will not bring irreversible effects on the life of the device. In addition, the charge treatment between two adjacent discharge treatments, or the discharge treatment between two adjacent charge treatments, can provide detection conditions for the next discharge treatment or charge treatment.

[0049] Optionally, the processor is specifically configured to: obtain at least one of the maximum charging time and the maximum discharging time of the electrochromic device, determine the charging time of the electrochromic device based on the maximum charging time, and / or determine the discharging time of the electrochromic device based on the maximum discharging time. Generally, the maximum charging time is greater than the normal charging time of the electrochromic device but less than the charging time that will cause overcharging damage to the device, and the maximum discharging time is greater than the normal discharging time of the electrochromic device but less than the discharging time that will cause overdischarging damage to the device. Thus, the processor determines the charging time and / or discharging time of the electrochromic device under the test environment based on the maximum charging time and / or the maximum discharging time, which can improve the efficiency of the defect identification method test process while avoiding irreversible damage to the electrochromic device caused by overcharging or overdischarging.

[0050] Optionally, the processor is specifically used to: determine that the maximum charging time is the charging time of the electrochromic device; or, obtain a first preset time difference, calculate the difference between the maximum charging time and the first preset time difference as the normal charging time, and determine the normal charging time as the charging time of the electrochromic device; or, obtain a second preset time difference, calculate the sum of the maximum charging time and the second preset time difference as the overload charging time, and determine the overload charging time as the charging time of the electrochromic device. Generally, the maximum charging time is greater than the normal charging time of the electrochromic device but less than the charging time that will cause overcharging damage to the device. The processor determines the maximum charging time as the charging time of the electrochromic device, that is, controls the driver to use a longer charging time to charge the electrochromic device. This can extend the contraction and expansion time of the electrode material of the electrochromic device, thereby better identifying defective electrochromic devices and intercepting devices with poor appearance during the production test process. Moreover, the entire defect detection process falls within the time window of the reversible reaction and will not cause permanent damage to the electrode material caused by overcharging, nor will it have an irreversible impact on the life of the device. Alternatively, the processor uses the charging overload time as the charging time during the charging process of the electrochromic device, thereby further extending the charging process time and improving the effectiveness of the defect identification process for the electrochromic device. In addition, when a normal charging time that is shorter than the maximum charging time is used as the charging time, the charging process time can be shortened to further improve the efficiency of the defect identification process. In particular, when an overload charging voltage is used to charge the electrochromic device so that its charging time is equal to the normal charging time, the charging processing time can be further shortened, and the efficiency of the device defect identification process can be further improved.

[0051] Optionally, the processor is specifically used to: determine that the maximum discharge duration is the discharge duration of the electrochromic device; or, obtain a third preset time difference, calculate the difference between the maximum discharge duration and the third preset time difference as the normal discharge duration, and determine that the normal discharge duration is the discharge duration of the electrochromic device; or, obtain a fourth preset time difference, calculate the sum of the maximum discharge duration and the fourth preset time difference as the overload discharge duration, and determine that the overload discharge duration is the discharge duration of the electrochromic device. Generally, the maximum discharge duration is greater than the normal discharge duration of the electrochromic device but less than the discharge duration that would cause over-discharge damage to the device. The processor determines the maximum discharge duration as the discharge duration of the electrochromic device, that is, controls the driver to use a longer discharge duration to discharge the electrochromic device. This can extend the contraction and expansion time of the electrode material of the electrochromic device, thereby better identifying defective electrochromic devices and intercepting devices with poor appearance during the production test process. Moreover, the entire defect detection process falls within the time window of the reversible reaction and will not cause permanent damage to the electrode material caused by over-discharge, nor will it have an irreversible impact on the life of the device. Alternatively, the discharge overload duration is used as the discharge duration during the discharge treatment of the electrochromic device, thereby further extending the discharge treatment time and improving the effectiveness of the defect identification process for the electrochromic device. In addition, when a normal discharge duration that is shorter than the maximum discharge duration is used as the discharge duration, the discharge treatment time can be shortened, further improving the efficiency of the defect identification process. In particular, when an overload discharge voltage is used to discharge the electrochromic device so that its discharge time is equal to the normal discharge time, the discharge processing time can be further shortened, and the efficiency of the device defect identification process can be further improved.

[0052] Optionally, the ratio of the first preset time difference to the maximum charging duration is 1% to 100%, and / or the ratio of the second preset time difference to the maximum charging duration is 1% to 200%. Generally speaking, when the maximum charging time value is determined, the smaller the ratio of the first preset time difference to the maximum charging time, the smaller the value of the first preset time difference. Therefore, the normal charging time calculated by the difference between the maximum charging time and the first preset time difference is larger. When the ratio of the first preset time difference to the maximum charging time is larger, the calculated normal charging time is smaller. When the normal charging time is used as the charging time of the electrochromic device, if the value is too small, the charging processing time of the electrochromic device will be too short, and the possible defects will not be fully exposed. If the value is too large, the charging processing time will be extended, which is not conducive to the test efficiency of the defect identification method. Therefore, limiting the value of the ratio of the first preset time difference to the maximum charging time to a certain range can not only ensure that the possible defects of the electrochromic device can have sufficient time to be exposed, but also improve the test efficiency of the defect identification method. In addition, when the maximum charging time value is determined, the smaller the ratio of the second preset time difference to the maximum charging time, the smaller the value of the second preset time difference. Therefore, the overload charging time calculated by the sum of the maximum charging time and the second preset time difference is smaller. When the ratio of the second preset time difference to the maximum charging time is larger, the calculated overload charging time is larger. When the overload charging time is used as the charging time of the electrochromic device, if the value is too small, the charging processing time of the electrochromic device will not be long enough, and its possible defects will not be fully exposed. If the value is too large, the charging processing time will be extended, and there will be a risk of overcharging the electrochromic device, thereby causing irreversible damage to the electrochromic device. Therefore, limiting the value of the ratio of the second preset time difference to the maximum charging time to a certain range can not only ensure that the possible defects of the electrochromic device can have sufficient time to be exposed, but also prevent the electrochromic device from being overcharged, thereby ensuring the effectiveness and reliability of the defect identification method.

[0053] Optionally, the ratio of the third preset time difference to the maximum discharge duration is 1% to 100%, and / or the ratio of the fourth preset time difference to the maximum discharge duration is 1% to 200%. Generally speaking, when the maximum discharge duration value is determined, the smaller the ratio of the third preset time difference to the maximum discharge duration, the smaller the value of the third preset time difference. Therefore, the normal discharge duration calculated by the difference between the maximum discharge duration and the third preset time difference is larger. When the ratio of the third preset time difference to the maximum discharge duration is larger, the calculated normal discharge duration is smaller. When the normal discharge duration is used as the discharge duration of the electrochromic device, if the value is too small, the discharge treatment time of the electrochromic device will be too short, and the possible defects will not be fully exposed. If the value is too large, the discharge treatment time will be extended, which is not conducive to the test efficiency of the defect identification method. Therefore, limiting the value of the ratio of the third preset time difference to the maximum discharge duration to a certain range can not only ensure that the possible defects of the electrochromic device can have sufficient time to be exposed, but also improve the test efficiency of the defect identification method. In addition, when the maximum discharge time value is determined, the smaller the ratio of the fourth preset time difference to the maximum discharge time value, the smaller the value of the fourth preset time difference value. Therefore, the overload discharge time calculated by the sum of the maximum discharge time value and the fourth preset time difference value is smaller. When the ratio of the fourth preset time difference to the maximum discharge time value is larger, the calculated overload discharge time is larger. When the overload discharge time value is used as the discharge time value of the electrochromic device, if the value is too small, the discharge treatment time of the electrochromic device will not be long enough, and the possible defects of the electrochromic device will not be fully exposed. If the value is too large, the discharge treatment time will be extended, and there will be a risk of over-discharging the electrochromic device, thereby causing irreversible damage to the electrochromic device. Therefore, limiting the value of the ratio of the fourth preset time difference to the maximum discharge time value to a certain range can not only ensure that the possible defects of the electrochromic device can have sufficient time to be exposed, but also prevent the electrochromic device from being overcharged, thereby ensuring the effectiveness and reliability of the defect identification method.

[0054] Optionally, the processor is specifically configured to obtain a CV curve of the electrochromic device and determine at least one of a maximum charge duration and a maximum discharge duration of the electrochromic device based on the CV curve. Thus, the processor can determine the maximum charge duration and / or maximum discharge duration based on the detected CV curve of the electrochromic device, thereby simplifying the process of determining the maximum charge duration or maximum discharge duration and improving the efficiency of the electrochromic device defect identification method.

[0055] Optionally, the processor is specifically used to: determine that the difference between the voltage corresponding to the reversible oxidation peak in the CV curve and the voltage corresponding to the first preset slope of the positive current curve slope is a first voltage interval △V1; obtain the scanning speed f of the electrochromic device in the process of scanning to obtain the CV curve, and calculate the maximum charging time T1 = △V1 / f based on the first voltage interval and the scanning speed; and / or determine that the difference between the voltage corresponding to the reversible reduction peak in the CV curve and the voltage corresponding to the second preset slope of the negative current curve slope is a second voltage interval △V2; obtain the scanning speed f of the electrochromic device in the process of scanning to obtain the CV curve, and calculate the maximum discharge time T2 = △V2 / f based on the second voltage interval and the scanning speed. Therefore, the processor directly obtains the CV curve of the electrochromic device, identifies the voltage corresponding to the reversible oxidation peak and / or reduction peak from the CV curve, and identifies the voltage corresponding to the first preset slope of the positive current curve slope and / or the voltage corresponding to the second preset slope of the negative current curve slope, and obtains the maximum charging time and / or maximum discharging time by calculating the ratio of the voltage difference to the scanning speed. This can simplify the determination process of the maximum charging time or the maximum discharging time, and further standardize the determination process, thereby improving the efficiency and reliability of the device defect identification method.

[0056] Optionally, the absolute value of the first preset slope is less than 0.5, and / or the absolute value of the second preset slope is less than 0.5. Preferably, the first preset slope is equal to 0.5, and / or the second preset slope is equal to 0. Thus, appropriate values ​​for the first preset slope and / or the second preset slope can be set according to actual needs, thereby making the electrochromic device defect identification method more applicable.

[0057] Optionally, the processor is specifically configured to: obtain a first current-time curve during the charging process of the electrochromic device, and determine the maximum charging time of the electrochromic device based on the first current-time curve; and / or obtain a second current-time curve during the discharging process of the electrochromic device, and determine the maximum discharge time of the electrochromic device based on the second current-time curve. Thus, the processor can determine the maximum charging time and / or maximum discharge time of the electrochromic device based on the detected current-time curve, thereby simplifying the process of determining the maximum charging time and / or maximum discharge time, and improving the efficiency of the electrochromic device defect identification method.

[0058] Optionally, the processor is specifically configured to: determine the time corresponding to when the current in the first current-time curve is less than a first preset current value as the maximum charging time; or determine the time corresponding to when the slope of the first current-time curve reaches a third preset slope as the maximum charging time. Thus, the processor can directly obtain the current value or curve slope from the current-time curve and identify the time corresponding to when the current value is less than the first preset current value as the maximum charging time, or identify the time corresponding to when the slope of the curve is the third preset slope as the maximum charging time. This can further simplify and standardize the process of determining the maximum charging time, thereby improving the efficiency and reliability of the defect identification method for electrochromic devices.

[0059] Optionally, the first preset current value is less than or equal to 40mA, and / or the absolute value of the third preset slope is less than 0.1. Thus, different preset current values ​​can be selected as the basis for determining the maximum charging time, depending on the structure or material of the electrochromic device itself. This not only meets the application requirements of different devices, but also makes the ultimately determined maximum charging time more reliable, facilitating more thorough subsequent charging processing and improving the reliability of the test results of the defect identification method. Furthermore, an appropriate value for the third preset slope can be set based on actual needs, thereby making the defect identification method for electrochromic devices more applicable.

[0060] Optionally, the processor is specifically configured to: determine the time corresponding to when the current in the second current-time curve is less than a second preset current value as the maximum discharge duration; or determine the time corresponding to when the slope of the second current-time curve reaches a fourth preset slope as the maximum discharge duration. Thus, the processor can directly obtain the current value or curve slope from the current-time curve and identify the time corresponding to when the current value is less than the second preset current value as the maximum discharge duration, or identify the time corresponding to when the slope of the curve is the fourth preset slope as the maximum discharge duration. This can further simplify and standardize the process of determining the maximum discharge duration, thereby improving the efficiency and reliability of the defect identification method for electrochromic devices.

[0061] Optionally, the second preset current value is less than or equal to 40mA, and / or the absolute value of the fourth preset slope is less than 0.1. Thus, different preset current values ​​can be selected as the basis for determining the maximum discharge duration, depending on the structure or material of the electrochromic device itself. This not only meets the application requirements of different devices, but also makes the ultimately determined maximum discharge duration more reliable, facilitating more thorough subsequent discharge processing and improving the reliability of the test results of the defect identification method. Furthermore, an appropriate value for the fourth preset slope can be set based on actual needs, thereby making the defect identification method for electrochromic devices more applicable.

[0062] The third aspect of the present application further provides a computer-readable storage medium storing a computer program, wherein when the computer program is executed by a processor, the method for identifying defects in an electrochromic device as described in any one of the above items is implemented. In the third aspect of the present application, by subjecting the electrochromic device to a charge process within a charge time period, or / and subjecting it to a discharge process within a discharge time period, and detecting whether the electrochromic device has a predetermined defect during or after the charge and discharge process, it is possible to promptly identify whether the electrochromic device has a defect before it is put on the market, especially to identify some defects that are invisible to the naked eye before the charge and discharge process (initial state), thereby effectively preventing defective electrochromic devices from being put on the market, and thus effectively avoiding the occurrence of problems such as reduced aesthetics, insufficient service life, or poor reliability during use due to defects in the electrochromic device. BRIEF DESCRIPTION OF THE DRAWINGS

[0063] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following briefly introduces the drawings required for use in the embodiments or descriptions of the prior art. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0064] FIG1 is a schematic diagram of a first flow chart of a defect identification method for an electrochromic device provided in an embodiment of the present application;

[0065] FIG2 is a second flow chart of a defect identification method for an electrochromic device provided in an embodiment of the present application;

[0066] FIG3 is a schematic diagram of a CV curve of an electrochromic device provided in an embodiment of the present application;

[0067] FIG4 is a second schematic diagram of a CV curve of an electrochromic device provided in an embodiment of the present application;

[0068] FIG5 is a schematic diagram of a current-time curve of an electrochromic device provided in an embodiment of the present application;

[0069] FIG6 is a third schematic diagram of a CV curve of an electrochromic device provided in an embodiment of the present application;

[0070] FIG7 is a schematic diagram of a defect identification system provided in an embodiment of the present application. DETAILED DESCRIPTION

[0071] In order to make the technical problems, technical solutions and beneficial effects to be solved by this application more clearly understood, this application is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain this application and are not intended to limit this application.

[0072] The following explains the terms that may appear in the embodiments of the present application.

[0073] In the embodiments of this application, the term "and / or" describes the relationship between associated objects, indicating that three possible relationships exist. For example, A and / or B can represent: A exists alone, A and B exist simultaneously, and B exists alone. A and B can be singular or plural. The character " / " generally indicates that the associated objects are in an "or" relationship.

[0074] In the embodiments of the present application, "at least one" refers to one or more, "more than one" refers to two or more; "at least one of..." or similar expressions refer to any combination of these items, including any combination of a single or multiple types. For example, "at least one selected from a, b, or c" or "at least one selected from a, b, and c" can all represent: a, b, c, ab (i.e., a and b), ac, bc, or abc, where a, b, and c can be single or multiple.

[0075] In the embodiments of the present application, the terms "first," "second," "third," and similar expressions are used only for descriptive purposes to distinguish objects, such as substances, from one another, and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. For example, without departing from the scope of the embodiments of the present application, the first XX can also be referred to as the second XX, and similarly, the second XX can also be referred to as the first XX. Thus, features defined as "first," "second," or "third" can explicitly or implicitly include one or more of such features.

[0076] In the embodiments of the present application, the terms "including", "having" and their cognates are intended only to indicate specific features, numbers, steps, operations, elements, components or combinations of the foregoing items, and should not be understood as first excluding the existence of one or more other features, numbers, steps, operations, elements, components or combinations of the foregoing items or the possibility of adding one or more features, numbers, steps, operations, elements, components or combinations of the foregoing items.

[0077] In the embodiments of the present application, the term "CV curve" refers to a voltage-current curve obtained by adjusting the voltage at the two electrodes of the electrochromic device through cyclic voltammetry (CV) and testing the current response at the two electrodes of the electrochromic device, with voltage as the horizontal axis and current as the vertical axis, where C represents current and V represents voltage.

[0078] It should be understood that in the various embodiments of the present application, the size of the serial number of each process does not mean the order of execution. Some or all steps can be executed in parallel or sequentially. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present application.

[0079] The technical solutions of the embodiments of the present application will be described below with reference to the accompanying drawings.

[0080] An electrochromic device typically includes a first substrate layer, a first conductive layer, an electrochromic medium layer, a second conductive layer, and a second substrate layer stacked in sequence. A voltage is applied to the first and second conductive layers, thereby forming a potential difference across the electrochromic medium layer to drive ions or electrons in the electrochromic medium to undergo an intercalation or deintercalation reaction. For example, this causes the electrochromic material in the electrochromic medium layer to undergo an oxidation-reduction reaction, resulting in a change in the light transmittance or color of the electrochromic device. The electrochromic medium layer includes a liquid, gel, or solid electrochromic medium. For example, the electrochromic medium layer may include a three-layer stack of an electrochromic material layer, an electrolyte layer, and an ion storage layer. It may also include a liquid crystal layer or a polymer liquid crystal layer.

[0081] The manufacturing process of electrochromic devices is usually relatively complex, and some subtle defects that are visible or invisible to the naked eye may easily appear during the manufacturing process. If they are not discovered in time and are put on the market, the defects will be gradually magnified during long-term charging and discharging use, thereby forming obvious defects that are visible to the naked eye and difficult to accept, such as obvious color blocks, stripes and color spots, which affect the comfort of use of the electrochromic device and, in serious cases, even affect the service life and reliability of the device.

[0082] Taking an electrochromic device comprising three stacked layers, namely, an electrochromic material layer, an electrolyte layer, and an ion storage layer, as an example, in the initial state, the electrochromic device has good contact between its electrode materials (such as the electrochromic material layer and the ion storage layer) and the electrolyte layer, and the interface impedance is small, so that the overall color change of the device is relatively uniform, and it is difficult to find defects, especially some defects that are invisible to the naked eye in the initial state; and as the number of times the electrochromic device is used increases, the electrode material will expand or shrink in volume as the redox reaction proceeds, and the electrolyte and the electrode material will be repeatedly subjected to stress, resulting in an increase in interface impedance, especially in places with initial defects. This difference will be amplified, thereby becoming a weak point of failure, and ultimately causing the defects to become more and more obvious, forming visible poor appearance that affects the aesthetics of the device, such as color blocks, stripes, color spots, etc., and in serious cases, it will also affect the service life and reliability of the device.

[0083] In order to solve the above problems, an embodiment of the present application provides a defect identification method for an electrochromic device. Referring to Figure 1, the defect identification method in the embodiment of the present application may include: step S100, determining at least one of the charging voltage and the discharging voltage of the electrochromic device, and determining at least one of the charging time and the discharging time of the electrochromic device; step S200, using the charging voltage to charge the electrochromic device within the charging time, and / or, using the discharging voltage to discharge the electrochromic device within the discharging time; step S300, during the charging process or after the charging process is completed, detecting whether the electrochromic device has a predetermined defect; and / or, during the discharging process or after the discharging process is completed, detecting whether the electrochromic device has a predetermined defect.

[0084] In an embodiment of the present application, by charging the electrochromic device within the charging time, or / and discharging the electrochromic device within the discharging time, and detecting whether the electrochromic device has predetermined defects during or after the charging and discharging process, it is possible to promptly identify whether the electrochromic device has defects before it is put on the market, especially to identify some defects that are invisible to the naked eye before the charging and discharging process (initial state), thereby effectively preventing defective electrochromic devices from being put on the market, and thus effectively avoiding the occurrence of problems such as reduced aesthetics, insufficient service life or poor reliability during use due to defects in the electrochromic device.

[0085] In step S100, at least one of the charging voltage and the discharging voltage of the electrochromic device is determined, and at least one of the charging duration and the discharging duration of the electrochromic device is determined. In some embodiments, the charging voltage and / or the discharging voltage of the electrochromic device may be determined first, and then the charging duration and / or the discharging duration are determined. In other embodiments, the charging duration and / or the discharging duration of the electrochromic device may be determined first, and then the charging voltage and / or the discharging voltage are determined. In yet other embodiments, the charging and / or discharging voltage of the electrochromic device, as well as the charging duration and / or the discharging duration, may be determined simultaneously.

[0086] In some embodiments, by performing charge and discharge tests on the electrochromic device, the charging voltage, charging time, and the relationship between the charging voltage and charging time of the electrochromic device can be determined. The discharge voltage, discharge time, and the relationship between the discharge voltage and discharge time of the electrochromic device can also be determined.

[0087] For example, cyclic voltammetry (CV) can be used to adjust the voltage across the electrodes of an electrochromic device and measure the current response across the electrodes to produce a voltage-current curve, or CV curve. Based on the CV curve, the maximum operating voltage of the electrochromic device can be determined, and the charge voltage, charge duration, discharge voltage, and discharge duration of the electrochromic device can be determined based on the maximum operating voltage.

[0088] The CV curve is a curve with potential as the horizontal coordinate and current as the vertical coordinate. It usually consists of two parts: forward scan and reverse scan. Forward scan refers to starting from an initial potential and gradually increasing the potential to a termination potential; reverse scan refers to starting from the termination potential and gradually decreasing the potential to the initial potential. During the forward scan and reverse scan process, if an oxidation or reduction reaction occurs on the electrode, a peak will appear on the CV curve. The position of the peak indicates the potential at which the reaction occurs, and the height of the peak indicates the intensity of the reaction. For example, the redox voltage of the electrochromic device is obtained based on the CV curve. The positive current curve in the CV curve is the oxidation curve, and the negative current curve in the CV curve is the reduction curve. The voltage corresponding to the maximum current in the CV curve (oxidation peak in the oxidation curve) is confirmed as the maximum charge voltage, and the voltage corresponding to the minimum current in the CV curve (reduction peak in the reduction curve) is confirmed as the maximum discharge voltage.

[0089] In some embodiments, the overload voltage of the electrochromic device is slightly higher than the redox voltage of the electrode material of the electrochromic device. Under this overload voltage, the electrochromic device will not produce side reactions that cause material failure in the electrochromic device.

[0090] In step S200, the electrochromic device is charged with a charging voltage within a charging time, and / or the electrochromic device is discharged with a discharging voltage within a discharging time; and, in step S300, during or after the charging process, the electrochromic device is detected to determine whether a predetermined defect exists; and / or during or after the discharging process, the electrochromic device is detected to determine whether a predetermined defect exists.

[0091] In some embodiments, the electrochromic device may be charged using a charging voltage for a charging duration, and the electrochromic device may be detected during or after the charging process to determine whether a predetermined defect exists. That is, in step S200, the electrochromic device may be charged using a charging voltage for a charging duration. Accordingly, in step S300, the electrochromic device may be detected during or after the charging process to determine whether a predetermined defect exists.

[0092] In other embodiments, the electrochromic device may be discharged using a discharge voltage for a discharge duration, and the electrochromic device may be inspected for predetermined defects during or after the discharge process. That is, in step S200, the electrochromic device may be discharged using a discharge voltage for a discharge duration. Accordingly, in step S300, the electrochromic device may be inspected for predetermined defects during or after the discharge process.

[0093] In some other embodiments, the electrochromic device may be charged using a charging voltage for a charging time, and then discharged using a discharging voltage for a discharging time. During the charging process, during the discharging process, or after the discharging process is completed, the electrochromic device may be detected for a predetermined defect. That is, in step S200, the electrochromic device may be charged using a charging voltage for a charging time, and discharged using a discharging voltage for a discharging time. Accordingly, in step S300, the electrochromic device may be detected for a predetermined defect during the charging process, during the discharging process, or after the discharging process is completed.

[0094] In some other embodiments, the electrochromic device may be first discharged using a discharge voltage for a discharge duration, and then charged using a charge voltage for a charge duration. During the discharge process, during the charge process, or after the charge process is complete, the electrochromic device may be detected for a predetermined defect. That is, in step S200, the electrochromic device may be discharged using a discharge voltage for a discharge duration, and charged using a charge voltage for a charge duration. Accordingly, in step S300, the electrochromic device may be detected for a predetermined defect during the discharge process, during the charge process, or after the charge process is complete.

[0095] In step S100, it may specifically include: obtaining at least one of the maximum charging voltage and the maximum discharging voltage of the electrochromic device, determining the charging voltage of the electrochromic device according to the maximum charging voltage, and / or determining the discharge voltage of the electrochromic device according to the maximum discharging voltage.

[0096] In some embodiments, step S100 may specifically include: obtaining the maximum charging voltage of the electrochromic device, and determining the charging voltage of the electrochromic device based on the maximum charging voltage. In other embodiments, step S100 may specifically include: obtaining the maximum discharge voltage of the electrochromic device, and determining the discharge voltage of the electrochromic device based on the maximum discharge voltage. In still other embodiments, step S100 may specifically include: obtaining the maximum charging voltage and maximum discharge voltage of the electrochromic device, determining the charging voltage of the electrochromic device based on the maximum charging voltage, and determining the discharge voltage of the electrochromic device based on the maximum discharge voltage.

[0097] Generally, the maximum charge voltage is greater than the normal charge voltage of the electrochromic device but less than the charge voltage that would cause irreversible damage to the device. The maximum discharge voltage is greater than the normal discharge voltage of the electrochromic device but less than the discharge voltage that would cause irreversible damage to the device. Therefore, determining the charge voltage and / or discharge voltage of the electrochromic device under test conditions based on this maximum charge voltage and / or maximum discharge voltage can improve the efficiency of the defect identification method test process while also preventing irreversible damage to the electrochromic device.

[0098] In some embodiments, step S100 may include: determining that the maximum charging voltage is the charging voltage of the electrochromic device. Generally, the maximum charging voltage is greater than the normal charging voltage of the electrochromic device but less than the charging voltage that will cause irreversible damage to the device. Therefore, by determining the maximum charging voltage as the charging voltage of the electrochromic device, that is, using a higher charging voltage to charge the electrochromic device, the shrinkage and expansion rate of the electrode material of the electrochromic device can be increased. During the charging process, the electrode material of the electrochromic device is in a rapid change process, and the difference in the interface impedance of the electrochromic device will be amplified, thereby intercepting devices with poor appearance in the production test process. In addition, the entire defect detection process is within the voltage window of the reversible reaction, and will not cause permanent damage to the electrode material, nor will it have an irreversible effect on the life of the device.

[0099] In some embodiments, step S100 may include obtaining a first preset voltage difference, calculating the sum of the maximum charging voltage and the first preset voltage difference as a charging overload voltage, and determining the charging overload voltage as the charging voltage of the electrochromic device. Thus, by adding the first preset voltage difference to the maximum charging voltage to determine the charging overload voltage, and using the charging overload voltage as the charging voltage of the electrochromic device under the test environment, the charging voltage is further increased, thereby improving charging efficiency, accelerating the process of identifying defects in the electrochromic device, and improving testing efficiency.

[0100] In some embodiments, the first preset voltage difference is between 0.1V and 1.0V. In other embodiments, the first preset voltage difference is between 0.2V and 0.8V. Examples include 0.3V, 0.4V, 0.5V, 0.6V, and 0.7V. When the first preset voltage difference is too small, the calculated charging overload voltage is also too small, resulting in a negligible increase in the speed of the electrochromic device during the charging process, a negligible acceleration effect on the defect identification method, and a negligible improvement in test efficiency. When the first preset voltage difference is too large, the calculated charging overload voltage is also too large, even exceeding the charging voltage that would cause irreversible damage to the electrochromic device. If the electrochromic device is charged with this excessively large charging overload voltage, irreversible damage to the electrochromic device is likely to occur, adversely affecting the test results. Furthermore, if the electrochromic device does not already have defects, it may suffer even more severe damage after the test is completed, resulting in a loss-making outcome. Therefore, limiting the value of the first preset voltage difference within a certain range can ensure that the value of the charging overload voltage calculated thereby is within a relatively normal range, that is, neither too large nor too small, which can not only improve the charging efficiency, but also ensure that no irreversible damage is caused to the electrochromic device, thereby improving the efficiency and reliability of the defect identification test method.

[0101] In some embodiments, step S100 may include: determining that the maximum discharge voltage is the discharge voltage of the electrochromic device. Generally, the maximum discharge voltage is greater than the normal discharge voltage of the electrochromic device but less than the discharge voltage that will cause irreversible damage to the device. Therefore, by determining the maximum discharge voltage as the discharge voltage of the electrochromic device, that is, using a higher discharge voltage to discharge the electrochromic device, the shrinkage and expansion rate of the electrode material of the electrochromic device can be increased. During the discharge treatment, the electrode material of the electrochromic device is in a rapid change process, and the difference in the interface impedance of the electrochromic device will be amplified, thereby intercepting devices with poor appearance in the production test process. In addition, the entire defect detection process is within the voltage window of the reversible reaction, and will not cause permanent damage to the electrode material, nor will it have an irreversible impact on the life of the device.

[0102] In some embodiments, step S100 may include obtaining a second preset voltage difference, calculating the sum of the maximum discharge voltage and the second preset voltage difference as a discharge overload voltage, and determining the discharge overload voltage as the discharge voltage of the electrochromic device. Thus, by adding the second preset voltage difference to the maximum discharge voltage to determine the discharge overload voltage, and using the discharge overload voltage as the discharge voltage of the electrochromic device under the test environment, the discharge voltage is further increased, thereby improving the efficiency of the discharge process, accelerating the process of identifying defects in the electrochromic device, and improving testing efficiency.

[0103] In some embodiments, the second preset voltage difference is between 0.1V and 1.0V. In other embodiments, the second preset voltage difference is between 0.2V and 0.8V. Examples include 0.3V, 0.4V, 0.5V, 0.6V, and 0.7V. When the second preset voltage difference is too small, the discharge overload voltage calculated therefrom is also too small, resulting in an insignificant increase in the speed of the electrochromic device during the discharge process, an insignificant acceleration effect on the defect identification method, and an insignificant improvement in test efficiency. When the second preset voltage difference is too large, the discharge overload voltage calculated therefrom is also too large, even exceeding the discharge voltage that would cause irreversible damage to the electrochromic device. If the electrochromic device is discharged using this excessively large discharge overload voltage, irreversible damage to the electrochromic device is likely to occur, adversely affecting the test results. Furthermore, if the electrochromic device does not already have defects, it may suffer even more severe damage after the test is completed, resulting in a loss-making outcome. Therefore, limiting the value of the second preset voltage difference to a certain range can ensure that the value of the discharge overload voltage calculated thereby is within a relatively normal range, that is, neither too large nor too small, which can not only improve the discharge efficiency, but also ensure that no irreversible damage is caused to the electrochromic device, thereby improving the efficiency and reliability of the defect identification test method.

[0104] In some embodiments, step S100 may include: obtaining a CV curve of the electrochromic device, and determining at least one of a maximum charge voltage and a maximum discharge voltage of the electrochromic device based on the CV curve. That is, in step S100, in some embodiments, the CV curve of the electrochromic device may be obtained, and the maximum charge voltage of the electrochromic device may be determined based on the CV curve; in other embodiments, the CV curve of the electrochromic device may be obtained, and the maximum discharge voltage of the electrochromic device may be determined based on the CV curve; in yet other embodiments, the CV curve of the electrochromic device may be obtained, and the maximum charge voltage and maximum discharge voltage of the electrochromic device may be determined based on the CV curve. Thus, the maximum charge voltage and / or maximum discharge voltage of the electrochromic device may be determined based on the detected CV curve of the electrochromic device, thereby simplifying the process of determining the maximum charge voltage or maximum discharge voltage and improving the efficiency of the electrochromic device defect identification method.

[0105] In some embodiments, in step S100, it may include: determining the voltage corresponding to the reversible oxidation peak in the CV curve as the maximum charge voltage, and / or determining the voltage corresponding to the reversible reduction peak in the CV curve as the maximum discharge voltage. In the CV curve of the electrochromic device, its positive current curve is the oxidation curve, and the negative current curve in the CV curve is the reduction curve. The voltage corresponding to the maximum current in the CV curve (oxidation peak in the oxidation curve) is confirmed as the maximum charge voltage, and the voltage corresponding to the minimum current in the CV curve (reduction peak in the reduction curve) is confirmed as the maximum discharge voltage. Among them, the reversible oxidation peak refers to the oxidation peak that appears in the CV curve and the corresponding reduction peak also exists. If an oxidation peak appears and there is no corresponding reduction peak, it is considered to be an irreversible oxidation peak; similarly, the reversible reduction peak refers to the reduction peak that appears in the CV curve and there is also an oxidation peak. If a reduction peak appears and there is no corresponding oxidation peak, it is considered to be an irreversible reduction peak.

[0106] In some embodiments, step S100 may include: determining the voltage corresponding to the point where the absolute value of the positive current in the CV curve is the largest as the maximum charging voltage, and / or determining the voltage corresponding to the point where the absolute value of the negative current in the CV curve is the largest as the maximum discharging voltage.

[0107] In some embodiments, step S100 may include determining the voltage corresponding to the slope reversal point of the positive current curve in the CV curve as the maximum charge voltage, and / or determining the voltage corresponding to the slope reversal point of the negative current curve in the CV curve as the maximum discharge voltage. The slope reversal point refers to the point where the slope changes from a positive value to a negative value, or the point where the slope changes from a negative value to a positive value.

[0108] In the embodiment of the present application, the voltage corresponding to the reversible oxidation peak in the CV curve may be the voltage corresponding to when the absolute value of the positive current is maximum, or the voltage corresponding to the slope reversal point of the positive current curve; similarly, the voltage corresponding to the reversible reduction peak in the CV curve may be the voltage corresponding to when the absolute value of the negative current is maximum, or the voltage corresponding to the slope reversal point of the negative current curve.

[0109] Taking a single-electron electrochromic device as an example, FIG3 shows a CV curve of a single-electron electrochromic device. The voltage (0.25V) corresponding to the oxidation peak 101 in the positive current curve can be determined as the maximum charge voltage of the electrochromic device, and the voltage (0.12V) corresponding to the reduction peak 102 in the negative current curve can be determined as the maximum discharge voltage of the electrochromic device. As shown in FIG3 , the position corresponding to the oxidation peak 101 is also the position where the absolute value of the positive current is the largest, and is also the inversion point where the slope of the positive current curve changes from positive to negative; the position corresponding to the reduction peak 102 is also the position where the absolute value of the negative current is the largest, and is also the inversion point where the slope of the negative current curve changes from negative to positive.

[0110] In other embodiments, when there are more than two reversible oxidation peaks in the CV curve, the maximum value of the corresponding voltage is determined as the maximum charge voltage, and / or, when there are more than two reversible reduction peaks in the CV curve, the maximum value of the corresponding voltage is determined as the maximum discharge voltage. Here, the so-called maximum voltage refers to the value at which the absolute value of the voltage corresponding to the oxidation peak or reduction peak is the largest. Similarly, when there are more than two slope reversal points in the positive current curve of the CV curve, the maximum value of the voltage corresponding to the slope reversal point is determined as the maximum charge voltage, and / or, when there are more than two slope reversal points in the negative current curve of the CV curve, the value at which the absolute value of the voltage corresponding to the slope reversal point is the largest is determined as the maximum discharge voltage.

[0111] Taking a multi-electron electrochromic device as an example, as shown in Figure 4, which is a CV curve diagram of the multi-electron electrochromic device, the scanning direction is forward scanning. The lower current curve in the CV curve is the oxidation reaction curve, and the upper current curve is the reduction reaction curve. Therefore, the lower curve peak in the CV curve in Figure 4 is the oxidation peak, and the upper curve peak is the reduction peak. The oxidation voltage corresponding to the oxidation peak 222 can be directly read as 2.0V, the oxidation voltage corresponding to the oxidation peak 221 is 1.3V, the reduction voltage corresponding to the reduction peak 211 is 2.2V, and the reduction voltage corresponding to the reduction peak 212 is 2.7V. The maximum charging voltage of the multi-electron electrochromic device is determined according to the maximum value of the absolute value of the current in the peak point in the oxidation reaction curve, and the maximum discharge voltage of the multi-electron electrochromic device is determined according to the maximum value of the absolute value of the current in the peak point in the reduction reaction curve. Combined with Figure 4, the maximum charging voltage of the multi-electron electrochromic device in Figure 4 is 1.3V, and the maximum discharge voltage of the multi-electron electrochromic device is 2.7V.

[0112] As described above, by directly obtaining the CV curve of the electrochromic device and identifying the reversible oxidation peak and / or reduction peak from the CV curve, or identifying the point where the absolute value of the positive current is the largest and / or the point where the absolute value of the negative current is the largest, or identifying the slope reversal point of the positive current curve and / or the slope reversal point of the negative current curve as the maximum charging voltage and / or the maximum discharge voltage, the process of determining the maximum charging voltage or the maximum discharge voltage can be simplified, and the determination process can be further standardized, thereby improving the efficiency and reliability of the device defect identification method.

[0113] In some embodiments, referring to FIG2 , step S400 may be further included before step S200: detecting the initial open circuit voltage of the electrochromic device; when the initial open circuit voltage is less than 0, charging the electrochromic device within the charging time using a charging voltage; and / or, when the initial open circuit voltage is greater than 0, discharging the electrochromic device within the discharging time using a discharging voltage; and / or, when the initial open circuit voltage is equal to 0, charging the electrochromic device within the charging time using a charging voltage, or discharging the electrochromic device within the discharging time using a discharging voltage.

[0114] In some embodiments, step S400 may include detecting an initial open-circuit voltage of the electrochromic device. The initial open-circuit voltage refers to the open-circuit voltage of the electrochromic device detected before testing, i.e., before the charging or discharging process described in step S200.

[0115] In some embodiments, step S400 may also include: determining the difference between the initial open circuit voltage and 0; when the initial open circuit voltage is less than 0, charging the electrochromic device with a charging voltage within the charging time; or, when the initial open circuit voltage is greater than 0, discharging the electrochromic device with a discharging voltage within the discharging time.

[0116] In other embodiments, step S400 may include determining the magnitude of the initial open circuit voltage relative to 0. When the initial open circuit voltage is less than 0, charging the electrochromic device with a charging voltage for a charging duration. Furthermore, when the initial open circuit voltage is greater than 0, discharging the electrochromic device with a discharging voltage for a discharging duration. Specifically, when the electrochromic device is tested and includes both one or more charging and one or more discharging processes, whether to charge or discharge the electrochromic device first may be determined based on the magnitude relationship between the initial open circuit voltage and 0.

[0117] In some other embodiments, step S400 may further include: determining that when the initial open-circuit voltage is equal to 0, charging the electrochromic device with a charging voltage for a charging time period, or discharging the electrochromic device with a discharging voltage for a discharging time period. Specifically, when the detected initial open-circuit voltage is 0, charging or discharging can be performed based on actual needs to perform the defect identification test, thereby improving the applicability of the defect identification method.

[0118] In this case, by detecting the initial open circuit voltage of the electrochromic device and determining whether to charge or discharge the electrochromic device based on its magnitude relationship with 0, that is, when the initial open circuit voltage is less than 0, only the device is charged, or, when the test includes both charging and discharging, the device is charged first; when the initial open circuit voltage is greater than 0, only the device is discharged, or, when the test includes both charging and discharging, the device is discharged first. In this way, it is possible to avoid the over-discharge phenomenon of the device caused by only discharging the electrochromic device when the initial open circuit voltage is less than 0, or discharging the device first, and also to avoid the over-charge phenomenon of the device caused by only charging the electrochromic device when the initial open circuit voltage is greater than 0, or charging the electrochromic device first, and thus more effectively preventing the electrochromic device from being overcharged or over-discharged during the charging and discharging process, thereby affecting the service life of the device, and improving the reliability and stability of the defect identification method.

[0119] In some embodiments, in step S200, the number of charging processes for the electrochromic device may be at least two, and a discharge process may be performed between two adjacent charging processes. For example, when the number of charging processes is two, the electrochromic device may first be charged, then discharged, and then charged for a second time; when the number of charging processes is three, the electrochromic device may first be charged, then discharged, then charged for a second time, then discharged for a second time, and finally charged for a third time; when the number of charging processes is more, the order of charging and discharging processes for the electrochromic device may be similar.

[0120] In some embodiments, in step S200, the number of discharge processes performed on the electrochromic device may be at least two, and a charge process may be performed between two adjacent discharge processes. For example, when the number of discharge processes is two, the electrochromic device may first be subjected to a first discharge process, then a charge process, and then a second discharge process; when the number of discharge processes is three, the electrochromic device may first be subjected to a first discharge process, then a first charge process, then a second discharge process, then a second charge process, and finally a third discharge process; when the number of discharge processes is more, the order of charge and discharge processes for the electrochromic device may be similar.

[0121] In some embodiments, in step S200, the number of times the electrochromic device is charged can be at least two, and a discharge process is performed between two adjacent charge processes. Alternatively, the number of times the electrochromic device is discharged can be at least two, and a charge process is performed between two adjacent discharge processes. For example, when the number of times the charge process and the discharge process are both two, the electrochromic device can first be discharged, then charged, then discharged, and then charged. Alternatively, the electrochromic device can first be charged, then discharged, then charged, and then discharged.

[0122] In this embodiment, the electrochromic device can be subjected to more than two discharge treatments, or more than two discharge treatments, or more than two charge treatments and more than two discharge treatments simultaneously. That is, multiple charge and discharge treatments can further increase the shrinkage and expansion rate of the electrode material of the electrochromic device, further amplify the difference in the interface impedance of the electrochromic device, thereby better detecting whether the electrochromic device has defects and better intercepting devices with poor appearance in the production test process; and, during the defect detection process of multiple charge and discharge treatments, the entire defect detection process falls within the voltage window of the reversible reaction, will not cause permanent damage to the electrode material, and will not have an irreversible impact on the life of the device. In addition, charging treatment is performed between two adjacent discharge treatments, or discharging treatment is performed between two adjacent charge treatments, which can provide detection conditions for the next discharge treatment or charge treatment.

[0123] In some embodiments, step S100 may include: obtaining at least one of the maximum charging time and the maximum discharging time of the electrochromic device, determining the charging time of the electrochromic device according to the maximum charging time, or determining the discharging time of the electrochromic device according to the maximum discharging time.

[0124] In some embodiments, step S100 may include: obtaining at least one of a maximum charging time and a maximum discharging time of the electrochromic device, determining a discharge time of the electrochromic device based on the maximum discharge time, and determining a discharge time of the electrochromic device based on the maximum discharge time.

[0125] Generally, the maximum charge duration is greater than the normal charge duration of the electrochromic device but less than the charge duration that would cause damage to the device due to overcharge, and the maximum discharge duration is greater than the normal discharge duration of the electrochromic device but less than the discharge duration that would cause damage to the device due to overdischarge. Therefore, based on this maximum charge duration and / or maximum discharge duration, determining the charge duration and / or discharge duration of the electrochromic device under the test environment can improve the efficiency of the defect identification method test process while also avoiding irreversible damage to the electrochromic device caused by overcharging or overdischarging.

[0126] In some embodiments, step S100 may include determining that the maximum charging time is the charging time of the electrochromic device. Generally, the maximum charging time is greater than the normal charging time of the electrochromic device but less than the charging time that would cause overcharging damage to the device. Determining the maximum charging time as the charging time of the electrochromic device, that is, charging the electrochromic device with a longer charging time, can extend the contraction and expansion time of the electrode material of the electrochromic device, thereby better identifying defective electrochromic devices and intercepting devices with poor appearance during the production test process. In addition, the entire defect detection process falls within the time window of reversible reactions, and will not cause permanent damage to the electrode material due to overcharging, nor will it have an irreversible impact on the life of the device.

[0127] In some embodiments, step S100 may include obtaining a first preset time difference, calculating the difference between the maximum charging duration and the first preset time difference as the normal charging duration, and determining the normal charging duration as the charging duration of the electrochromic device. Because the normal charging duration is relatively shorter, using the normal charging duration as the charging duration of the electrochromic device can shorten the charging process time, thereby further improving the efficiency of the defect identification process. In particular, when the electrochromic device is charged using an overload charging voltage so that the charging duration is equal to the normal charging duration, the charging process time can be further shortened, further improving the efficiency of the device defect identification process.

[0128] In some embodiments, the ratio of the first preset time difference to the maximum charging duration is between 1% and 100%. In other embodiments, the ratio of the first preset time difference to the maximum charging duration is between 10% and 80%. In still other embodiments, the ratio of the first preset time difference to the maximum charging duration is between 20% and 50%. Here, the ratio of the first preset time difference to the maximum charging duration refers to the value obtained by dividing the first preset time difference by the maximum charging duration, that is, the value obtained by dividing the first preset time difference by the maximum charging duration. Generally speaking, when the maximum charging time value is determined, the smaller the ratio of the first preset time difference to the maximum charging time, the smaller the value of the first preset time difference. Therefore, the normal charging time calculated by the difference between the maximum charging time and the first preset time difference is larger. When the ratio of the first preset time difference to the maximum charging time is larger, the calculated normal charging time is smaller. When the normal charging time is used as the charging time of the electrochromic device, if the value is too small, the charging processing time of the electrochromic device will be too short, and the possible defects will not be fully exposed. If the value is too large, the charging processing time will be extended, which is not conducive to the test efficiency of the defect identification method. Therefore, limiting the value of the ratio of the first preset time difference to the maximum charging time to a certain range can not only ensure that the possible defects of the electrochromic device can have sufficient time to be exposed, but also improve the test efficiency of the defect identification method.

[0129] In some embodiments, step S100 may include: obtaining a second preset time difference, calculating the sum of the maximum charging time and the second preset time difference as the overload charging time, and determining the overload charging time as the charging time of the electrochromic device. Because the overload charging time is greater, the overload charging time is determined as the charging time of the electrochromic device. That is, charging the electrochromic device with a longer charging time can further extend the contraction and expansion time of the electrode material of the electrochromic device, thereby better identifying defective electrochromic devices and intercepting devices with poor appearance in the production test process. In addition, the entire defect detection process falls within the time window of the reversible reaction and will not cause permanent damage to the electrode material due to overcharging, nor will it have an irreversible impact on the life of the device.

[0130] In some embodiments, the ratio of the second preset time difference to the maximum charging duration is between 1% and 200%. In other embodiments, the ratio of the second preset time difference to the maximum charging duration is between 10% and 100%. In still other embodiments, the ratio of the second preset time difference to the maximum charging duration is between 20% and 80%. Here, the ratio of the second preset time difference to the maximum charging duration refers to the value obtained by dividing the second preset time difference by the maximum charging duration, that is, the value obtained by dividing the second preset time difference by the maximum charging duration. Generally speaking, when the maximum charging time value is determined, the smaller the ratio of the second preset time difference to the maximum charging time, the smaller the value of the second preset time difference. Therefore, the overload charging time calculated by the sum of the maximum charging time and the second preset time difference is smaller. When the ratio of the second preset time difference to the maximum charging time is larger, the calculated overload charging time is larger. When the overload charging time is used as the charging time of the electrochromic device, if the value is too small, the charging processing time of the electrochromic device will not be long enough, and its possible defects will not be fully exposed. If the value is too large, the charging processing time will be extended, and there will be a risk of overcharging the electrochromic device, thereby causing irreversible damage to the electrochromic device. Therefore, limiting the value of the ratio of the second preset time difference to the maximum charging time to a certain range can not only ensure that the possible defects of the electrochromic device can have sufficient time to be exposed, but also prevent the electrochromic device from being overcharged, thereby ensuring the effectiveness and reliability of the defect identification method.

[0131] In some embodiments, step S100 may include determining that the maximum discharge duration is the discharge duration of the electrochromic device. Generally, the maximum discharge duration is greater than the normal discharge duration of the electrochromic device but less than the discharge duration that would cause over-discharge damage to the device. Determining the maximum discharge duration as the discharge duration of the electrochromic device, i.e., using a longer discharge duration to discharge the electrochromic device, can extend the contraction and expansion time of the electrode material of the electrochromic device, thereby better identifying defective electrochromic devices and intercepting devices with poor appearance during the production test process. Furthermore, the entire defect detection process falls within the time window of a reversible reaction, and will not cause permanent damage to the electrode material due to over-discharge, nor will it have an irreversible impact on the life of the device.

[0132] In some embodiments, step S100 may include obtaining a third preset time difference, calculating the difference between the maximum discharge duration and the third preset time difference as a normal discharge duration, and determining the normal discharge duration as the discharge duration of the electrochromic device. Because the normal discharge duration is relatively shorter, using this normal discharge duration as the discharge duration of the electrochromic device can shorten the discharge processing time, further improving the efficiency of the defect detection process. In particular, when the electrochromic device is discharged using an overload discharge voltage so that the discharge duration is equal to the normal discharge duration, the discharge processing time can be further shortened, further improving the efficiency of the device defect detection process.

[0133] In some embodiments, the ratio of the third preset time difference to the maximum discharge duration is between 1% and 100%. In other embodiments, the ratio of the third preset time difference to the maximum discharge duration is between 10% and 80%. In still other embodiments, the ratio of the third preset time difference to the maximum discharge duration is between 20% and 50%. Here, the ratio of the third preset time difference to the maximum discharge duration refers to the value obtained by dividing the third preset time difference by the maximum discharge duration, that is, the value obtained by dividing the third preset time difference by the maximum discharge duration. Generally speaking, when the maximum discharge duration value is determined, the smaller the ratio of the third preset time difference to the maximum discharge duration, the smaller the value of the third preset time difference. Therefore, the normal discharge duration calculated by the difference between the maximum discharge duration and the third preset time difference is larger. When the ratio of the third preset time difference to the maximum discharge duration is larger, the calculated normal discharge duration is smaller. When the normal discharge duration is used as the discharge duration of the electrochromic device, if the value is too small, the discharge treatment time of the electrochromic device will be too short, and the possible defects will not be fully exposed. If the value is too large, the discharge treatment time will be extended, which is not conducive to the test efficiency of the defect identification method. Therefore, limiting the value of the ratio of the third preset time difference to the maximum discharge duration to a certain range can not only ensure that the possible defects of the electrochromic device can have sufficient time to be exposed, but also improve the test efficiency of the defect identification method.

[0134] In some embodiments, step S100 may include: obtaining a fourth preset time difference, calculating the sum of the maximum discharge duration and the fourth preset time difference as the overload discharge duration, and determining the overload discharge duration as the discharge duration of the electrochromic device. Because the overload discharge duration is greater, the overload discharge duration is determined as the discharge duration of the electrochromic device. That is, a longer discharge duration is used to discharge the electrochromic device, which can further extend the contraction and expansion time of the electrode material of the electrochromic device, thereby better identifying defective electrochromic devices and intercepting devices with poor appearance during the production test process. In addition, the entire defect detection process falls within the time window of the reversible reaction and will not cause permanent damage to the electrode material due to overdischarge, nor will it have an irreversible impact on the life of the device.

[0135] In one embodiment, the ratio of the fourth preset time difference to the maximum discharge duration is between 1% and 200%. In other embodiments, the ratio of the fourth preset time difference to the maximum discharge duration is between 10% and 100%. In still other embodiments, the ratio of the fourth preset time difference to the maximum discharge duration is between 20% and 80%. Here, the ratio of the fourth preset time difference to the maximum discharge duration refers to the value obtained by dividing the fourth preset time difference by the maximum discharge duration, that is, the value obtained by dividing the fourth preset time difference by the maximum discharge duration. Generally, when the maximum discharge duration value is determined, the smaller the ratio of the fourth preset time difference to the maximum discharge duration, the smaller the value of the fourth preset time difference. Therefore, the overload discharge duration calculated by the sum of the maximum discharge duration and the fourth preset time difference is smaller. When the ratio of the fourth preset time difference to the maximum discharge duration is larger, the calculated overload discharge duration is larger. When the overload discharge duration is used as the discharge duration of the electrochromic device, if the value is too small, the discharge treatment time of the electrochromic device will not be long enough, and its possible defects will not be fully exposed. If the value is too large, the discharge treatment time will be extended, and there will be a risk of over-discharging the electrochromic device, thereby causing irreversible damage to the electrochromic device. Therefore, limiting the value of the ratio of the fourth preset time difference to the maximum discharge duration to a certain range can not only ensure that the possible defects of the electrochromic device can be exposed in sufficient time, but also prevent the electrochromic device from being overcharged, thereby ensuring the effectiveness and reliability of the defect identification method.

[0136] FIG5 is a schematic diagram of a current-time curve of an electrochromic device. Taking the current-time curve of the electrochromic device in FIG5 during the discharge process as an example, according to the current-time curve in FIG5 , it can be seen that the discharge current of the electrochromic device begins to approach 0 at about 40 seconds (s), the slope of the curve slows down at 60s, and approaches 0 at the 90s limit, and the slope of the curve between 90s and 100s tends to be flat. Therefore, it can be determined that its maximum discharge duration can be 90s. Of course, according to the needs of actual conditions, the time corresponding to when the discharge current begins to approach 0, such as 40s, can also be determined as the maximum discharge duration; the time corresponding to when the slope of the curve obviously changes and slows down, such as 60s, can also be determined as the maximum discharge duration; that is, any time corresponding to after 40s can be determined as the maximum discharge duration.

[0137] In some embodiments, the fourth preset time difference may be, for example, 20 seconds, and the overload discharge duration calculated thereby may be 60 seconds, 80 seconds, or 110 seconds, etc.

[0138] In some embodiments, obtaining at least one of the maximum charge time and the maximum discharge time of the electrochromic device in step S100 may include obtaining a CV curve of the electrochromic device and determining at least one of the maximum charge time and the maximum discharge time of the electrochromic device based on the CV curve. Thus, the maximum charge time and / or the maximum discharge time of the electrochromic device can be determined based on the detected CV curve of the electrochromic device, thereby simplifying the process of determining the maximum charge time or the maximum discharge time and improving the efficiency of the electrochromic device defect identification method.

[0139] In some embodiments, step S100 may include: determining a first voltage interval ΔV1 as the difference between the voltage corresponding to the reversible oxidation peak in the CV curve and the voltage corresponding to the slope of the positive current curve reaching a first preset slope; obtaining a scanning speed f of the electrochromic device during the process of scanning to obtain the CV curve, and calculating a maximum charging time T1 = ΔV1 / f based on the first voltage interval and the scanning speed. Thus, by directly obtaining the CV curve of the electrochromic device, identifying the voltage corresponding to the reversible oxidation peak from the CV curve, and identifying the voltage corresponding to the slope of the positive current curve reaching the first preset slope, and calculating the maximum charging time by calculating the ratio of the voltage difference between the two and the scanning speed, the process of determining the maximum charging time can be simplified and further standardized, thereby improving the efficiency and reliability of the device defect identification method.

[0140] In some embodiments, the absolute value of the first preset slope may be less than 0.5. In other embodiments, the absolute value of the first preset slope may be less than 0.1. In still other embodiments, the absolute value of the first preset slope may approach 0, for example, infinitely close to 0. In still other embodiments, the absolute value of the first preset slope may be equal to 0. Thus, an appropriate value of the first preset slope may be set according to actual needs, thereby making the defect identification method for the electrochromic device more applicable.

[0141] In some embodiments, step S100 may include: determining a second voltage interval ΔV2 as the difference between the voltage corresponding to the reversible reduction peak in the CV curve and the voltage corresponding to the second preset slope of the negative current curve; obtaining a scanning speed f of the electrochromic device during the scanning process to obtain the CV curve, and calculating a maximum discharge duration T2 = ΔV2 / f based on the second voltage interval and the scanning speed. Thus, by directly obtaining the CV curve of the electrochromic device, identifying the voltage corresponding to the reversible reduction peak from the CV curve, and identifying the voltage corresponding to the second preset slope of the negative current curve, and calculating the maximum discharge duration by calculating the ratio of the voltage difference between the two to the scanning speed, the process of determining the maximum discharge duration can be simplified and further standardized, thereby improving the efficiency and reliability of the device defect identification method.

[0142] In some embodiments, the absolute value of the second preset slope is less than 0.5. In other embodiments, the absolute value of the second preset slope may be less than 0.1. In still other embodiments, the absolute value of the second preset slope may approach 0, for example, infinitely close to 0. In still other embodiments, the absolute value of the second preset slope may be equal to 0. Thus, an appropriate value of the second preset slope may be set according to actual needs, thereby making the defect identification method for the electrochromic device more applicable.

[0143] Taking the CV curve in Figure 6 as an example, the CV curve 311 and the CV curve 321 in Figure 6 are CV curves of two electrochromic devices, respectively. In conjunction with Figure 6, for the CV curve 311, starting from the potential of -2.5V corresponding to its oxidation peak 312, to the potential corresponding to the position 313 where the slope of the current curve is close to 0 is -2V, then the voltage interval is (2.5V-2V)=0.5V, the scanning speed of the CV curve 311 is 10mV / s, and the calculated overload duration can be 0.5V / (0.01V / s)=50s. For the CV curve 321, starting from the point position -2.45 corresponding to its oxidation peak 322, to the voltage corresponding to the position 323 where the slope of its current curve is close to 0 is -2V, then the voltage interval is 2.45V-2V=0.45V, the scanning speed of the CV curve 321 is 100mV / s, and the calculated overload duration can be 4.5s.

[0144] In some embodiments, in step S100, obtaining at least one of a maximum charging time and a maximum discharging time of the electrochromic device includes obtaining a first current-time curve during the charging process of the electrochromic device, and determining the maximum charging time of the electrochromic device based on the first current-time curve. Thus, the maximum charging time can be determined based on the detected current-time curve, thereby simplifying the process of determining the maximum charging time and improving the efficiency of the electrochromic device defect identification method.

[0145] In some embodiments, determining the maximum charging time of the electrochromic device based on the first current-time curve in step S100 may include determining the time corresponding to when the current in the first current-time curve is less than a first preset current value as the maximum charging time. This allows the current value in the current-time curve to be directly obtained, and the time corresponding to when the current value is less than the first preset current value to be identified as the maximum charging time. This further simplifies and standardizes the process of determining the maximum charging time, thereby improving the efficiency and reliability of the electrochromic device defect identification method.

[0146] In some embodiments, determining the maximum charging time of the electrochromic device based on the first current-time curve in step S100 may include determining the time corresponding to when the slope of the first current-time curve reaches a third predetermined slope as the maximum charging time. This allows the current-time curve to be directly acquired, and the time corresponding to when the slope of the curve reaches the third predetermined slope to be identified as the maximum charging time. This further simplifies and standardizes the process of determining the maximum charging time, thereby improving the efficiency and reliability of the electrochromic device defect identification method.

[0147] In some embodiments, the first preset current value may be less than or equal to 40mA. In other embodiments, the first preset current value may be less than or equal to 20mA. In other embodiments, the first preset current value may be less than or equal to 10mA. Thus, different preset current values ​​can be selected as the basis for determining the maximum charging time according to the structure or material of the electrochromic device itself, which can not only meet the application requirements of different devices, but also make the final maximum charging time more reliable, which is conducive to making subsequent charging processing more sufficient, thereby improving the reliability of the test results of the defect identification method.

[0148] In some embodiments, the absolute value of the third preset slope may be less than 0.5. In other embodiments, the absolute value of the third preset slope may be less than 0.1. In still other embodiments, the absolute value of the third preset slope may approach 0, for example, infinitely close to 0. In still other embodiments, the absolute value of the third preset slope may be equal to 0. Thus, an appropriate value of the third preset slope may be set according to actual needs, thereby making the defect identification method for the electrochromic device more applicable.

[0149] In some embodiments, in step S100, obtaining at least one of the maximum charge duration and the maximum discharge duration of the electrochromic device may include obtaining a second current-time curve during the discharge process of the electrochromic device, and determining the maximum discharge duration of the electrochromic device based on the second current-time curve. Thus, the maximum discharge duration can be determined based on the detected current-time curve, thereby simplifying the process of determining the maximum discharge duration and improving the efficiency of the electrochromic device defect identification method.

[0150] In some embodiments, determining the maximum discharge duration of the electrochromic device based on the second current-time curve in step S100 may include determining the time corresponding to when the current in the second current-time curve is less than a second preset current value as the maximum discharge duration. This allows the current value in the current-time curve to be directly obtained, and the time corresponding to when the current value is less than the second preset current value to be identified as the maximum discharge duration. This further simplifies and standardizes the process of determining the maximum discharge duration, thereby improving the efficiency and reliability of the electrochromic device defect identification method.

[0151] In some embodiments, determining the maximum discharge duration of the electrochromic device based on the second current-time curve in step S100 may include determining the time corresponding to when the slope of the second current-time curve reaches a fourth predetermined slope as the maximum discharge duration. This allows the current-time curve to be directly acquired, and the time corresponding to when the slope of the curve reaches the fourth predetermined slope to be identified as the maximum discharge duration. This further simplifies and standardizes the process of determining the maximum discharge duration, thereby improving the efficiency and reliability of the electrochromic device defect identification method.

[0152] In some embodiments, the second preset current value may be less than or equal to 40 mA. In other embodiments, the second preset current value may be less than or equal to 20 mA. In other embodiments, the second preset current value may be less than or equal to 10 mA. Thus, different preset current values ​​can be selected as the basis for determining the maximum discharge duration according to the structure or material of the electrochromic device itself. This can not only meet the application requirements of different devices, but also make the final maximum discharge duration more reliable, which is conducive to making subsequent discharge processing more sufficient, thereby improving the reliability of the test results of the defect identification method.

[0153] In some embodiments, the absolute value of the fourth preset slope may be less than 0.5. In other embodiments, the absolute value of the fourth preset slope may be less than 0.1. In still other embodiments, the absolute value of the fourth preset slope may approach 0, for example, infinitely close to 0. In still other embodiments, the absolute value of the fourth preset slope may be equal to 0. Thus, an appropriate value of the fourth preset slope may be set according to actual needs, thereby making the defect identification method for the electrochromic device more applicable.

[0154] In an embodiment of the present application, step S300 includes detecting whether the electrochromic device has a predetermined defect, wherein the specific type of the predetermined defect is not particularly limited and can be any defect different from a conventional defect-free electrochromic device. In some embodiments, the predetermined defect may include poor appearance of the electrochromic device, such as at least one of color blocks, stripes, and color spots appearing during or after the color change process. In other embodiments, the predetermined defect may also include uneven color change of the electrochromic device, such as some parts changing color faster and some parts changing color slower during the color change process, or the color or transmittance of the entire electrochromic device is uneven after the color change is completed. In yet other embodiments, the predetermined defect may also include no color change, floating color, flowery color, etc. Therefore, different predetermined defects can be determined according to the needs of the actual situation so that the device after testing can meet the needs of the actual situation.

[0155] In the embodiments of the present application, in step S300, the method for detecting whether the electrochromic device has the predetermined defect is not particularly limited. In some embodiments, manual detection can be performed. In other embodiments, instrument detection can be performed, for example, by receiving an image or video of the electrochromic device during or after color change, and determining whether the predetermined defect exists through comparative analysis.

[0156] FIG7 is a schematic diagram of the structure of a defect recognition system provided in an embodiment of the present application. As shown in FIG7 , the defect recognition system 7 may include: a processor 70 , a driver 71 , and a detector 72 .

[0157] Processor 70 is used to determine at least one of a charging voltage and a discharging voltage of the electrochromic device, and processor 70 also needs to determine at least one of a charging time and a discharging time of the electrochromic device. Driver 71 uses the charging voltage to charge the electrochromic device within the charging time, and / or, driver 71 uses the discharging voltage to discharge the electrochromic device within the discharging time. Detector 72 is used to detect whether the electrochromic device has a predetermined defect during or after the charging process; and / or, detector 72 is used to detect whether the electrochromic device has a predetermined defect during or after the discharging process.

[0158] In an embodiment of the present application, the driver 71 is used to charge the electrochromic device within the charging time, or / and discharge the electrochromic device within the discharging time, and during the charging and discharging process or after the charging and discharging process is completed, the detector 72 detects whether the electrochromic device has predetermined defects. This allows timely identification of defects in the electrochromic device before it is put on the market, especially identification of some defects that are invisible to the naked eye before the charging and discharging process (initial state), thereby effectively preventing defective electrochromic devices from being put on the market. This effectively avoids the occurrence of problems such as reduced aesthetics, insufficient service life, or poor reliability during use due to defects in the electrochromic device.

[0159] In some embodiments, the processor 70 may first determine the charge voltage and / or discharge voltage of the electrochromic device, and then determine the charge duration and / or discharge time. In other embodiments, the charge duration and / or discharge time of the electrochromic device may first be determined, and then the charge voltage and / or discharge voltage may be determined. In still other embodiments, the processor 70 may simultaneously determine the charge and / or discharge voltage, as well as the charge duration and / or discharge time of the electrochromic device.

[0160] In some embodiments, the electrochromic device is subjected to charge and discharge tests by the driver 71, and then the processor 70 determines the charging voltage, charging time, and the relationship between the charging voltage and charging time of the electrochromic device. The processor 70 can also determine the discharge voltage, discharge time, and the relationship between the discharge voltage and discharge time of the electrochromic device.

[0161] In some embodiments, the driver 71 may also use a charging voltage to charge the electrochromic device within the charging time, and the detector 72 may detect whether the electrochromic device has a predetermined defect during or after the charging process.

[0162] In other embodiments, the driver 71 performs discharge treatment on the electrochromic device using a discharge voltage within a discharge time, and the detector 72 detects whether the electrochromic device has a predetermined defect during or after the discharge treatment.

[0163] In some other embodiments, the electrochromic device can be first charged by the driver 71 using a charging voltage within a charging time, and then discharged by a discharging voltage within a discharging time. During the charging process, the discharging process, or after the discharge process, the detector 72 detects whether the electrochromic device has a predetermined defect.

[0164] In some other embodiments, the driver 71 can first use a discharge voltage to discharge the electrochromic device within a discharge time, and then use a charging voltage to charge the electrochromic device within a charging time. During the discharge process, the charging process, or after the charging process is completed, the detector 72 can detect whether the electrochromic device has a predetermined defect.

[0165] In some embodiments, the processor 70 can obtain at least one of the maximum charging voltage and the maximum discharging voltage of the electrochromic device, determine the charging voltage of the electrochromic device based on the maximum charging voltage, and / or, the processor 70 can determine the discharge voltage of the electrochromic device based on the maximum discharging voltage.

[0166] In some embodiments, the processor 70 may obtain the maximum charge voltage of the electrochromic device and determine the charge voltage of the electrochromic device based on the maximum charge voltage. In other embodiments, the processor 70 may obtain the maximum discharge voltage of the electrochromic device and determine the discharge voltage of the electrochromic device based on the maximum discharge voltage. In yet other embodiments, the processor 70 may obtain the maximum charge voltage and maximum discharge voltage of the electrochromic device and determine the charge voltage of the electrochromic device based on the maximum charge voltage, and determine the discharge voltage of the electrochromic device based on the maximum discharge voltage. Generally, the maximum charge voltage is greater than the normal charge voltage of the electrochromic device but less than the charge voltage that will cause irreversible damage to the device, and the maximum discharge voltage is greater than the normal discharge voltage of the electrochromic device but less than the discharge voltage that will cause irreversible damage to the device. Thus, the processor determines the charge voltage and / or discharge voltage of the electrochromic device under the test environment based on the maximum charge voltage and / or maximum discharge voltage, which can improve the efficiency of the defect identification method test process while avoiding irreversible damage to the electrochromic device.

[0167] In some embodiments, the processor 70 may determine the maximum charging voltage to be the charging voltage of the electrochromic device. Generally, the maximum charging voltage is greater than the normal charging voltage of the electrochromic device but less than the charging voltage that would cause irreversible damage to the device. The processor determines the maximum charging voltage as the charging voltage of the electrochromic device. This means that charging the electrochromic device with a higher charging voltage can increase the shrinkage and expansion rate of the electrode material of the electrochromic device. During the process of the driver charging the electrochromic device, the electrode material of the electrochromic device undergoes a rapid change process, amplifying the differences in the interfacial impedance of the electrochromic device. This allows devices with poor appearance to be intercepted during the production test process. Furthermore, the entire defect detection process falls within the voltage window of a reversible reaction, preventing permanent damage to the electrode material and irreversible impact on the device lifespan.

[0168] In some embodiments, the processor 70 may obtain a first preset voltage difference, calculate the sum of the maximum charging voltage and the first preset voltage difference as the charging overload voltage, and determine the charging overload voltage as the charging voltage of the electrochromic device. Thus, by adding the first preset voltage difference to the maximum charging voltage to determine the charging overload voltage, and using the charging overload voltage as the charging voltage of the electrochromic device under the test environment, the charging voltage value is further increased, thereby improving the efficiency of the charging process, accelerating the process of identifying defects in the electrochromic device, and improving testing efficiency.

[0169] In some embodiments, the processor 70 may determine the maximum discharge voltage to be the discharge voltage of the electrochromic device. Generally, the maximum discharge voltage is greater than the normal discharge voltage of the electrochromic device but less than the discharge voltage that would cause irreversible damage to the device. The processor determines the maximum discharge voltage to be the discharge voltage of the electrochromic device. Even when a higher discharge voltage is used to discharge the electrochromic device, the shrinkage and expansion rate of the electrode material of the electrochromic device can be increased. During the driver's discharge process of the electrochromic device, the electrode material of the electrochromic device undergoes a rapid change process, amplifying the difference in the interfacial impedance of the electrochromic device, thereby intercepting devices with poor appearance during the production test process. Furthermore, the entire defect detection process falls within the voltage window of the reversible reaction, without causing permanent damage to the electrode material or irreversibly affecting the life of the device.

[0170] In some embodiments, the processor 70 may obtain a second preset voltage difference, calculate the sum of the maximum discharge voltage and the second preset voltage difference as the discharge overload voltage, and determine the discharge overload voltage as the discharge voltage of the electrochromic device. Thus, by adding the second preset voltage difference to the maximum discharge voltage to determine the discharge overload voltage, and using the discharge overload voltage as the discharge voltage of the electrochromic device under the test environment, the discharge voltage is further increased, thereby improving the efficiency of the discharge process, accelerating the process of identifying defects in the electrochromic device, and improving testing efficiency.

[0171] In some embodiments, the processor 70 may obtain a CV curve of the electrochromic device and determine at least one of a maximum charge voltage and a maximum discharge voltage of the electrochromic device based on the CV curve. That is, in some embodiments, the processor 70 may obtain a CV curve of the electrochromic device and determine the maximum charge voltage of the electrochromic device based on the CV curve; in other embodiments, the processor 70 may obtain a CV curve of the electrochromic device and determine the maximum discharge voltage of the electrochromic device based on the CV curve; in yet other embodiments, the processor 70 may obtain a CV curve of the electrochromic device and determine the maximum charge voltage and maximum discharge voltage of the electrochromic device based on the CV curve. Thus, the processor 70 may determine the maximum charge voltage and / or maximum discharge voltage of the electrochromic device based on the detected CV curve of the electrochromic device, thereby simplifying the process of determining the maximum charge voltage or maximum discharge voltage and improving the efficiency of the electrochromic device defect identification method.

[0172] In some embodiments, the processor 70 determines the voltage corresponding to the reversible oxidation peak in the CV curve as the maximum charge voltage, and / or the processor 70 determines the voltage corresponding to the reversible reduction peak in the CV curve as the maximum discharge voltage.

[0173] In some embodiments, the processor 70 may determine the voltage corresponding to the point where the absolute value of the positive current in the CV curve is the largest as the maximum charging voltage, and / or, the processor 70 may determine the voltage corresponding to the point where the absolute value of the negative current in the CV curve is the largest as the maximum discharging voltage.

[0174] In some embodiments, the processor 70 may determine the voltage corresponding to the slope reversal point of the positive current curve in the CV curve as the maximum charge voltage, and / or the processor 70 may determine the voltage corresponding to the slope reversal point of the negative current curve in the CV curve as the maximum discharge voltage. The slope reversal point refers to the point where the slope changes from a positive value to a negative value, or the point where the slope changes from a negative value to a positive value.

[0175] In the embodiment of the present application, the voltage corresponding to the reversible oxidation peak in the CV curve may be the voltage corresponding to when the absolute value of the positive current is maximum, or the voltage corresponding to the slope reversal point of the positive current curve; similarly, the voltage corresponding to the reversible reduction peak in the CV curve may be the voltage corresponding to when the absolute value of the negative current is maximum, or the voltage corresponding to the slope reversal point of the negative current curve.

[0176] In some embodiments, the processor 70 can detect the initial open circuit voltage of the electrochromic device; when the initial open circuit voltage is less than 0, the driver 71 can use the charging voltage to charge the electrochromic device within the charging time; and / or, when the initial open circuit voltage is greater than 0, the driver 71 can use the discharging voltage to discharge the electrochromic device within the discharging time; and / or, when the initial open circuit voltage is equal to 0, the driver 71 can use the charging voltage to charge the electrochromic device within the charging time, or use the discharging voltage to discharge the electrochromic device within the discharging time. In this case, the processor detects the initial open-circuit voltage of the electrochromic device and determines whether to control the driver to charge or discharge the electrochromic device based on its relationship with 0, that is, when the initial open-circuit voltage is less than 0, the driver only charges the device, or, when the test includes both charging and discharging, the driver first charges the device; when the initial open-circuit voltage is greater than 0, the driver only discharges the device, or, when the test includes both charging and discharging, the driver first discharges the device. In this way, it is possible to avoid the over-discharge phenomenon of the device caused by only discharging the electrochromic device when the initial open-circuit voltage of the electrochromic device is less than 0, or discharging the device first, and also to avoid the over-charge phenomenon of the device caused by only charging the electrochromic device when the initial open-circuit voltage of the electrochromic device is greater than 0, or charging the device first, and thus more effectively preventing the electrochromic device from being overcharged or over-discharged during the charging and discharging process, thereby affecting the service life of the device, and improving the reliability and stability of the defect identification method. In addition, when the initial open-circuit voltage detected is 0, charging or discharging can be selected according to actual needs to perform the defect identification test, thereby improving the applicability of the defect identification method.

[0177] In some embodiments, the processor 70 can determine the size of the initial open circuit voltage and 0. When the initial open circuit voltage is less than 0, the driver 71 uses the charging voltage to charge the electrochromic device within the charging time, or when the initial open circuit voltage is greater than 0, the driver 71 uses the discharging voltage to discharge the electrochromic device within the discharging time.

[0178] In some embodiments, the processor 70 can determine the magnitude of the initial open-circuit voltage relative to 0. When the initial open-circuit voltage is less than 0, the driver 71 uses the charging voltage to charge the electrochromic device for the charging duration. Furthermore, when the initial open-circuit voltage is greater than 0, the driver 71 uses the discharging voltage to discharge the electrochromic device for the discharging duration. That is, when the process of testing the electrochromic device includes both one or more charging processes and one or more discharging processes, the processor 70 can determine whether to control the driver to charge the electrochromic device first or to discharge the electrochromic device first based on the magnitude relationship between the initial open-circuit voltage and 0.

[0179] In yet other embodiments, the processor 70 may further determine whether, when the initial open-circuit voltage is equal to 0, the driver 71 uses the charging voltage to charge the electrochromic device for the charging duration, or whether the driver 71 uses the discharging voltage to discharge the electrochromic device for the discharging duration. Specifically, when the detected initial open-circuit voltage is 0, the processor 70 may, based on actual needs, select and control the driver 71 to perform charging or discharging to perform the defect identification test, thereby improving the applicability of the defect identification method.

[0180] In some embodiments, the processor 70 may be a computer or a computer system including an electrochemical workstation. For example, when the processor 70 is a computer system including an electrochemical workstation, the electrochemical workstation may be used to scan a CV curve when the electrochromic device is powered on, and the computer may determine the charge / discharge time and charge / discharge voltage of the electrochromic device based on the CV curve.

[0181] In this embodiment, the processor 70 can adjust the voltage at the two electrodes of the electrochromic device through cyclic voltammetry (CV) to measure the current response at the two electrodes of the electrochromic device, thereby obtaining a CV curve. Based on the CV curve, the maximum operating voltage of the electrochromic device can be determined, and the charging voltage, charging time, discharge voltage, and discharge time of the electrochromic device can be determined based on the maximum operating voltage of the electrochromic device.

[0182] In some embodiments, the driver 71 may be a power meter or a circulation cabinet, etc. The driver 71 charges or discharges the electrochromic device according to the driving information (charging and discharging time, charging and discharging voltage, etc.) provided by the processor 70 .

[0183] In this embodiment, the driver 71 can generate a corresponding voltage according to the driving information (charging and discharging time, charging and discharging voltage, etc.) provided by the processor 70 to charge or discharge the electrochromic device within a preset time.

[0184] In some embodiments, the detector 72 can be a transmittance meter or a camera-viewer-computer system, and the detector 72 can be used to detect whether the electrochromic device has a predetermined defect during the process of charging or discharging the electrochromic device.

[0185] In some embodiments, the detector 72 can also detect whether the electrochromic device has a predetermined defect after the electrochromic device is charged or discharged.

[0186] In this embodiment, the driver 71 can use the charging voltage to charge the electrochromic device within the charging time, and the detector 72 can detect whether the electrochromic device has a predetermined defect during the charging process or after the charging process is completed. The driver 71 uses the charging voltage to charge the electrochromic device within the charging time, which can avoid the problem of requiring a long cycle charge and discharge test or insufficient charge and discharge time resulting in defects not being identified due to charging and discharging only according to the conventional working voltage, thereby improving the product quality control capability.

[0187] In some embodiments, the defect identification system may include a robotic arm, a conveyor belt, a wiring harness, an electrochemical workstation, a host, a storage table, a film viewing light, and a camera, wherein the electrochemical workstation can be used as part of the processor 70 to perform CV curve scanning on the electrochromic device, and the host, camera, and film viewing light can be used as part of the detector 72 to detect whether the electrochromic device has predetermined defects.

[0188] In this embodiment, a robotic arm can be used to transfer an electrochromic device, placing the electrochromic device on a positioner on a conveyor belt. The positioner on the conveyor belt secures the electrochromic device, and the electrochromic device then moves along the conveyor belt, with the movement distance being the sum of the size of the electrochromic device and the distance between the devices. Because the conveyor belt is equipped with a positioner, the wiring harness can be opened and closed at a fixed time to connect the electrochromic device to the electrochemical workstation and fixed according to the actual position of the device electrodes, so that the time of the electrochromic device's rise and fall coincides with the time of the conveyor belt's transmission and stop. The conveyor belt's stop time can be determined based on the time the electrochromic device is powered on. When the conveyor belt stops, the electrochromic device is powered on to perform CV curve scanning and defect detection during the charge and discharge process.

[0189] In some embodiments, the electrochemical workstation may be a multi-channel electrochemical workstation that can simultaneously perform CV curve scanning on multiple electrochromic devices.

[0190] In some embodiments, after the harness is connected to the electrochromic device and the electrochemical workstation, CV scanning is started, and scanning parameters (such as scanning voltage and scanning time, etc.) can be set according to the product parameters of the electrochromic device.

[0191] In some embodiments, the processor 70 may scan the CV curve according to the identification of the electrochromic device (eg, a QR code or a contactless IC) and the scanning parameters corresponding to the identification, and save the scanned data to the host.

[0192] In some embodiments, the host can also serve as part of the processor 70. The host can obtain the CV curve output by the electrochemical workstation and determine at least one of the charging voltage and the discharging voltage of the electrochromic device based on the CV curve. It can also determine at least one of the charging time and the discharging time of the electrochromic device based on the CV curve. The voltage corresponding to the current peak in the CV curve is determined as the maximum operating voltage. For example, the CV curve is composed of a positive current curve and a negative current curve. The positive current curve represents the current effect on the electrode of the electrochromic device during the oxidation reaction, and the negative current curve represents the current effect on the electrode of the electrochromic device during the reduction reaction. The voltage corresponding to the oxidation peak on the positive current curve in the CV curve is determined as the maximum charging voltage, and the voltage corresponding to the reduction peak on the negative current curve in the CV curve is determined as the maximum discharge voltage.

[0193] In some embodiments, the driver 71 may perform at least two charging processes on the electrochromic device, and a discharge process may be performed between two adjacent charging processes. For example, when the number of charging processes is two, the driver 71 may first perform a first charging process on the electrochromic device, then a discharge process, and then a second charging process; when the number of charging processes is three, the driver 71 may first perform a first charging process on the electrochromic device, then a first discharge process, then a second charging process, then a second discharge process, and finally a third charging process; when the number of charging processes is more, the driver 71 performs the charging and discharging processes on the electrochromic device in the same order as above.

[0194] In some embodiments, the driver 71 may perform at least two discharge processes on the electrochromic device, and a charging process may be performed between two adjacent discharge processes. For example, when the number of discharge processes is two, the driver 71 may first perform a first discharge process on the electrochromic device, then a charging process, and then a second discharge process; when the number of discharge processes is three, the driver 71 may first perform a first discharge process on the electrochromic device, then a first charging process, then a second discharge process, then a second charging process, and finally a third discharge process; when the number of discharge processes is more, the order of charging and discharging processes on the electrochromic device is similar.

[0195] In some embodiments, the driver 71 may charge the electrochromic device at least twice, with a discharge process occurring between the two adjacent charge processes, and discharge the electrochromic device at least twice, with a charge process occurring between the two adjacent discharge processes. For example, when the number of charge processes and discharge processes is two, the driver 71 may first discharge the electrochromic device, then charge it, then discharge it, and then charge it again. Alternatively, the driver 71 may first charge the electrochromic device, then discharge it, then charge it again, and then discharge it again.

[0196] In this embodiment, the driver 71 can perform more than two discharge processes on the electrochromic device, or perform more than two discharge processes, or perform more than two charge processes and more than two discharge processes simultaneously. That is, through multiple charge and discharge processes, the shrinkage and expansion rate of the electrode material of the electrochromic device can be further improved, and the difference in the interface impedance of the electrochromic device can be further amplified, so as to better detect whether the electrochromic device has defects and better intercept devices with poor appearance in the production test process; and, in the defect detection process of multiple charge and discharge processes, the entire defect detection process is within the voltage window of the reversible reaction, and will not cause permanent damage to the electrode material, nor will it have an irreversible effect on the life of the device. In addition, charging is performed between two adjacent discharge processes, or discharging is performed between two adjacent charge processes, which can provide detection conditions for the next discharge process or charging process.

[0197] In some embodiments, the STEP function of the electrochemical workstation or the processor 70 (host) can be used to connect the driver 71 (circulation cabinet) and use the charging voltage, discharging voltage, charging time and discharging time determined in the above embodiments to perform a charge and discharge cycle on the electrochromic device to be tested. The number of charge and discharge cycles is at least 2 times. If the initial open-circuit voltage of the electrochromic device is greater than 0V, the discharge operation is first performed on the electrochromic device to be tested. If the initial open-circuit voltage of the electrochromic device is less than or equal to 0V, the charging operation is first performed on the electrochromic device to be tested.

[0198] In some embodiments, when the number of charge and discharge cycles is greater than 1, a camera is used to take a projection photo of the electrochromic device to be tested, wherein the electrochromic device to be tested can be placed on a storage table, and then a viewing light (different colors of viewing lights can be prepared for different device colors) is used to shine on the electrochromic device to be tested, leaving a projection on the whiteboard below the electrochromic device to be tested, and then the projection photo is taken by the camera.

[0199] The host obtains the projected photo, calculates the brightness and darkness of the projected photo, marks the places with large contrast differences, and compares them with the data of the appearance limit sample. If the contrast difference and the area corresponding to the contrast higher than the standard value are both smaller than the limit sample data, the electrochromic device to be tested is determined to meet the test conditions and is sent to the good product channel; otherwise, the electrochromic device to be tested is determined to be a defective sample, an alarm is issued, and the device is sent to the defective product channel.

[0200] In some embodiments, the processor 70 can obtain at least one of the maximum charging time and the maximum discharging time of the electrochromic device, determine the charging time of the electrochromic device based on the maximum charging time, or determine the discharging time of the electrochromic device based on the maximum discharging time.

[0201] In some embodiments, the processor 70 can obtain at least one of the maximum charging time and the maximum discharging time of the electrochromic device, determine the discharge time of the electrochromic device based on the maximum discharging time, and determine the discharge time of the electrochromic device based on the maximum discharging time.

[0202] Generally, the maximum charge duration is greater than the normal charge duration of the electrochromic device but less than the charge duration that would cause damage to the device due to overcharge, and the maximum discharge duration is greater than the normal discharge duration of the electrochromic device but less than the discharge duration that would cause damage to the device due to overdischarge. Therefore, the processor determines the charge duration and / or discharge duration of the electrochromic device under the test environment based on the maximum charge duration and / or maximum discharge duration, which can improve the efficiency of the defect identification method test process while avoiding irreversible damage to the electrochromic device caused by overcharging or overdischarging.

[0203] In some embodiments, the processor 70 may determine the maximum charging time to be the charging time of the electrochromic device. Generally, the maximum charging time is greater than the normal charging time of the electrochromic device but less than the charging time that would cause overcharging damage to the device. The processor determines the maximum charging time to be the charging time of the electrochromic device, i.e., controls the driver to charge the electrochromic device with a longer charging time, which can extend the contraction and expansion time of the electrode material of the electrochromic device, thereby better identifying defective electrochromic devices and intercepting devices with poor appearance during the production test process. Moreover, the entire defect detection process falls within the time window of reversible reactions, and will not cause permanent damage to the electrode material due to overcharging, nor will it have an irreversible impact on the life of the device.

[0204] In some embodiments, the processor 70 can obtain a first preset time difference, calculate the difference between the maximum charging duration and the first preset time difference as the normal charging duration, and determine the normal charging duration as the charging duration of the electrochromic device. Because the normal charging duration is relatively shorter, the processor uses the normal charging duration as the charging duration of the electrochromic device, which can shorten the charging process time and further improve the efficiency of the defect identification process. In particular, when the electrochromic device is charged with an overload charging voltage so that its charging duration is equal to the normal charging duration, the charging process time can be further shortened, further improving the efficiency of the device defect identification process.

[0205] In some embodiments, the processor 70 can obtain a second preset time difference, calculate the sum of the maximum charging duration and the second preset time difference as the overload charging duration, and determine the overload charging duration as the charging duration of the electrochromic device. Because the overload charging duration is greater, the processor determines the overload charging duration as the charging duration of the electrochromic device, i.e., controls the driver to use a longer charging duration to charge the electrochromic device, which can further extend the contraction and expansion time of the electrode material of the electrochromic device, thereby better identifying defective electrochromic devices and intercepting devices with poor appearance during the production test process. Moreover, the entire defect detection process falls within the time window of the reversible reaction and will not cause permanent damage to the electrode material due to overcharging, nor will it have an irreversible impact on the life of the device.

[0206] In some embodiments, the processor 70 may determine the maximum discharge duration to be the discharge duration of the electrochromic device. Generally, the maximum discharge duration is greater than the normal discharge duration of the electrochromic device but less than the discharge duration that would cause over-discharge damage to the device. The processor determines the maximum discharge duration to be the discharge duration of the electrochromic device, i.e., controls the driver to discharge the electrochromic device using a longer discharge duration. This can extend the contraction and expansion time of the electrode material of the electrochromic device, thereby better identifying defective electrochromic devices and intercepting devices with poor appearance during the production test process. Furthermore, the entire defect detection process falls within the time window of a reversible reaction, and will not cause permanent damage to the electrode material due to over-discharge, nor will it have an irreversible impact on the life of the device.

[0207] In some embodiments, the processor 70 can obtain a third preset time difference, calculate the difference between the maximum discharge duration and the third preset time difference as the normal discharge duration, and determine the normal discharge duration as the discharge duration of the electrochromic device. Because the normal discharge duration is relatively shorter, the processor uses the normal discharge duration as the discharge duration of the electrochromic device, which can shorten the discharge processing time and further improve the efficiency of the defect identification process. In particular, when the electrochromic device is discharged using an overload discharge voltage so that its discharge duration is equal to the normal discharge duration, the discharge processing time can be further shortened, further improving the efficiency of the device defect identification process.

[0208] In some embodiments, the processor 70 can obtain a fourth preset time difference, calculate the sum of the maximum discharge duration and the fourth preset time difference as the overload discharge duration, and determine the overload discharge duration as the discharge duration of the electrochromic device. Because the overload discharge duration is greater, the processor determines the overload discharge duration as the discharge duration of the electrochromic device, i.e., controls the driver to use a longer discharge duration to discharge the electrochromic device, which can further extend the contraction and expansion time of the electrode material of the electrochromic device, thereby better identifying defective electrochromic devices and intercepting devices with poor appearance during the production test process. Moreover, the entire defect detection process falls within the time window of the reversible reaction and will not cause permanent damage to the electrode material due to overdischarge, nor will it have an irreversible impact on the life of the device.

[0209] In some embodiments, the processor 70 may obtain a CV curve of the electrochromic device and determine at least one of a maximum charge duration and a maximum discharge duration of the electrochromic device based on the CV curve. Thus, the processor may determine the maximum charge duration and / or maximum discharge duration based on the detected CV curve of the electrochromic device, thereby simplifying the process of determining the maximum charge duration or maximum discharge duration and improving the efficiency of the electrochromic device defect identification method.

[0210] In some embodiments, the processor 70 may determine that the difference between the voltage corresponding to the reversible oxidation peak in the CV curve and the voltage corresponding to the first preset slope of the positive current curve is a first voltage interval ΔV1; obtain the scanning speed f of the electrochromic device during the scanning process to obtain the CV curve, and calculate the maximum charging time T1 = ΔV1 / f based on the first voltage interval and the scanning speed. Thus, the processor directly obtains the CV curve of the electrochromic device, identifies the voltage corresponding to the reversible oxidation peak from the CV curve, and identifies the voltage corresponding to the first preset slope of the positive current curve. The maximum charging time is calculated by calculating the ratio of the voltage difference between the two and the scanning speed. This simplifies the process of determining the maximum charging time and further standardizes the determination process, thereby improving the efficiency and reliability of the device defect identification method.

[0211] In some embodiments, the processor 70 may determine that the difference between the voltage corresponding to the reversible reduction peak in the CV curve and the voltage corresponding to the second preset slope of the negative current curve is a second voltage interval ΔV2; obtain the scanning speed f of the electrochromic device during the scanning process to obtain the CV curve, and calculate the maximum discharge time T2 = ΔV2 / f based on the second voltage interval and the scanning speed. Thus, the processor directly obtains the CV curve of the electrochromic device, identifies the voltage corresponding to the reversible reduction peak from the CV curve, and identifies the voltage corresponding to the second preset slope of the negative current curve. The maximum discharge time is obtained by calculating the ratio of the voltage difference between the two and the scanning speed. This simplifies the process of determining the maximum discharge time and further standardizes the determination process, thereby improving the efficiency and reliability of the device defect identification method.

[0212] In some embodiments, the processor 70 may obtain a first current-time curve during the charging process of the electrochromic device and determine the maximum charging time of the electrochromic device based on the first current-time curve. Thus, the processor may determine the maximum charging time of the electrochromic device based on the detected current-time curve, thereby simplifying the process of determining the maximum charging time and improving the efficiency of the electrochromic device defect identification method.

[0213] In some embodiments, the processor 70 can determine the maximum charging duration as the time corresponding to when the current in the first current-time curve is less than a first preset current value. Thus, the processor can directly obtain the current value in the current-time curve and identify the time corresponding to when the current value is less than the first preset current value as the maximum charging duration. This can further simplify and standardize the process of determining the maximum charging duration, thereby improving the efficiency and reliability of the electrochromic device defect identification method.

[0214] In some embodiments, the processor 70 can determine the time corresponding to when the slope of the first current-time curve reaches a third predetermined slope as the maximum charging time. Thus, the processor can directly obtain the current-time curve and identify the time corresponding to when the slope of the curve reaches the third predetermined slope as the maximum charging time. This can further simplify and standardize the process of determining the maximum charging time, thereby improving the efficiency and reliability of the electrochromic device defect identification method.

[0215] In some embodiments, the processor 70 can obtain a second current-time curve during the discharge process of the electrochromic device and determine the maximum discharge duration of the electrochromic device based on the second current-time curve. Thus, the processor can determine the maximum discharge duration of the electrochromic device based on the detected current-time curve, thereby simplifying the process of determining the maximum discharge duration and improving the efficiency of the electrochromic device defect identification method.

[0216] In some embodiments, the processor 70 can determine the time corresponding to when the current in the second current-time curve is less than a second preset current value as the maximum discharge duration. Thus, the processor can directly obtain the current value in the current-time curve and identify the time corresponding to when the current value is less than the second preset current value as the maximum discharge duration. This can further simplify and standardize the process of determining the maximum discharge duration, thereby improving the efficiency and reliability of the defect identification method for electrochromic devices.

[0217] In some embodiments, the processor 70 can determine the time corresponding to when the slope of the second current-time curve reaches a fourth preset slope as the maximum discharge duration. Thus, the processor can directly obtain the current-time curve and identify the time corresponding to when the slope of the curve reaches the fourth preset slope as the maximum discharge duration. This can further simplify and standardize the process of determining the maximum discharge duration, thereby improving the efficiency and reliability of the electrochromic device defect identification method.

[0218] In some embodiments, the detector 72 can detect whether the electrochromic device has a predetermined defect, wherein the specific type of the predetermined defect is not particularly limited and can be any defect different from a conventional defect-free electrochromic device. In some embodiments, the predetermined defect may include a poor appearance of the electrochromic device, such as at least one of color blocks, stripes, and color spots appearing during or after the color change process. In other embodiments, the predetermined defect may also include uneven color change of the electrochromic device, such as some places changing color faster and some places changing color slower during the color change process, or after the color change is completed, the color or transmittance of the entire electrochromic device is uneven. In yet other embodiments, the predetermined defect may also include no color change, floating color, flowery color, etc. Therefore, different predetermined defects can be determined according to the needs of the actual situation so that the device after testing can meet the needs of the actual situation.

[0219] In the embodiments of the present application, the method by which the detector 72 can detect whether the electrochromic device has a predetermined defect is not particularly limited. In some embodiments, manual detection can be performed. In other embodiments, instrument detection can be performed, for example, by receiving an image or video of the electrochromic device during or after color change, and determining whether the predetermined defect exists through comparative analysis.

[0220] In some embodiments, the processor 70 may be configured to implement step S100 in the above embodiment.

[0221] In some embodiments, the driver 71 may be used to implement step S200 in the above embodiment.

[0222] In some embodiments, the detector 72 can be used to implement step S300 in the above embodiment.

[0223] It should be understood that the description of the defect identification system embodiment corresponds to the description of the method embodiment. Therefore, for matters not described in detail, reference can be made to the method embodiment above. For the sake of brevity, they will not be repeated here.

[0224] In some embodiments, processor 70 can be a computing device such as a desktop computer, laptop, PDA, or cloud server. The defect identification system may include, but is not limited to, processor 70 and driver 71. Those skilled in the art will appreciate that FIG7 is merely an example of defect identification system 7 and does not limit the defect identification system 7. The system may include more or fewer components than shown, or a combination of certain components, or different components. For example, it may also include input / output devices, network access devices, etc.

[0225] The processor 70 may also include a central processing unit (CPU), and may also be other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general-purpose processor may be a microprocessor or any conventional processor.

[0226] An embodiment of the present application also provides a computer-readable storage medium, which stores a computer program. When the computer program is executed by an operator, it can implement the steps in the above-mentioned method embodiments, such as step S100, step S200, step S300 and step S400.

[0227] In the embodiments of the present application, the type of computer-readable storage medium is not particularly limited. In some embodiments, the computer-readable storage medium may include: a USB flash drive, a mobile hard drive, a read-only memory (ROM), a random access memory (RAM), a magnetic disk, or an optical disk, etc., various media that can store program code.

[0228] In the embodiments of the present application, the type of the computing unit is not particularly limited. In some embodiments, the computing unit may include a controller, a mobile phone, a computer, or other intelligent devices.

[0229] The above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. These modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit of the technical solutions of the embodiments of the present application, and should all be included in the scope of protection of the present application.

Claims

1. A defect identification method for an electrochromic device, characterized in that: The defect identification method comprises: Determining at least one of a charging voltage and a discharging voltage of an electrochromic device, and determining at least one of a charging time and a discharging time of the electrochromic device; The electrochromic device is charged by the charging voltage within the charging time, and / or the electrochromic device is discharged by the discharging voltage within the discharging time; and, During the charging process or after the charging process is completed, the electrochromic device is detected to determine whether it has a predetermined defect; and / or during the discharging process or after the discharging process is completed, the electrochromic device is detected to determine whether it has a predetermined defect.

2. The defect identification method according to claim 1, characterized in that: The determining of at least one of a charging voltage and a discharging voltage of the electrochromic device comprises: Obtain at least one of a maximum charging voltage and a maximum discharging voltage of the electrochromic device, determine the charging voltage of the electrochromic device according to the maximum charging voltage, and / or determine the discharging voltage of the electrochromic device according to the maximum discharging voltage.

3. The defect identification method according to claim 2, characterized in that: Determining the charging voltage of the electrochromic device according to the maximum charging voltage includes: determining the maximum charging voltage as the charging voltage of the electrochromic device; or, A first preset voltage difference is obtained, a sum of the maximum charging voltage and the first preset voltage difference is calculated as a charging overload voltage, and the charging overload voltage is determined to be the charging voltage of the electrochromic device.

4. The defect identification method according to claim 2, characterized in that: Determining the discharge voltage of the electrochromic device according to the maximum discharge voltage includes: determining the maximum discharge voltage as the discharge voltage of the electrochromic device; or, A second preset voltage difference is obtained, a sum of the maximum discharge voltage and the second preset voltage difference is calculated as a discharge overload voltage, and the discharge overload voltage is determined to be the discharge voltage of the electrochromic device.

5. The defect identification method according to claim 3, characterized in that: The first preset voltage difference has a value ranging from 0.1V to 1.0V.

6. The defect identification method according to claim 4, characterized in that: The second preset voltage difference is in the range of 0.1V to 1.0V.

7. The defect identification method according to claim 2, characterized in that: The obtaining at least one of the maximum charging voltage and the maximum discharging voltage of the electrochromic device comprises: A CV curve of the electrochromic device is obtained, and at least one of a maximum charging voltage and a maximum discharging voltage of the electrochromic device is determined according to the CV curve.

8. The defect identification method according to claim 7, characterized in that: Determining at least one of a maximum charging voltage and a maximum discharging voltage of the electrochromic device according to the CV curve comprises: Determine the voltage corresponding to the reversible oxidation peak in the CV curve as the maximum charge voltage, and / or determine the voltage corresponding to the reversible reduction peak in the CV curve as the maximum discharge voltage; or, The voltage corresponding to the point where the absolute value of the positive current in the CV curve is the largest is determined as the maximum charging voltage, and / or the voltage corresponding to the point where the absolute value of the negative current in the CV curve is the largest is determined as the maximum discharging voltage; or, The voltage corresponding to the slope reversal point of the positive current curve in the CV curve is determined as the maximum charging voltage, and / or the voltage corresponding to the slope reversal point of the negative current curve in the CV curve is determined as the maximum discharging voltage.

9. The defect identification method according to claim 1 or 2, characterized in that: The electrochromic device is charged by the charging voltage within the charging time; And / or, before the electrochromic device is discharged by using the discharge voltage within the discharge time, the method further comprises: detecting an initial open circuit voltage of the electrochromic device; When the initial open circuit voltage is less than 0, the electrochromic device is charged using the charging voltage within the charging time; and / or, When the initial open circuit voltage is greater than 0, the electrochromic device is discharged using the discharge voltage within the discharge time; and / or, When the initial open circuit voltage is equal to 0, the electrochromic device is charged with the charging voltage within the charging time, or the electrochromic device is discharged with the discharging voltage within the discharging time.

10. The defect identification method according to claim 1 or 2, characterized in that: The number of times of charging treatment on the electrochromic device is at least two times, and a discharge treatment is performed between two adjacent charging treatments; or / and, The number of discharge treatments on the electrochromic device is at least two, and a charge treatment is performed between two adjacent discharge treatments.

11. The defect identification method according to claim 1 or 2, characterized in that: The determining at least one of a charging time and a discharging time of the electrochromic device comprises: Obtain at least one of a maximum charging time and a maximum discharging time of the electrochromic device, determine the charging time of the electrochromic device according to the maximum charging time, and / or determine the discharging time of the electrochromic device according to the maximum discharging time.

12. The defect identification method according to claim 11, characterized in that: Determining the charging time of the electrochromic device according to the maximum charging time includes: Determine the maximum charging time as the charging time of the electrochromic device; or, Obtaining a first preset time difference, calculating the difference between the maximum charging time and the first preset time difference as a normal charging time, and determining the normal charging time as the charging time of the electrochromic device; or, A second preset time difference is obtained, the sum of the maximum charging duration and the second preset time difference is calculated as the overload charging duration, and the overload charging duration is determined as the charging duration of the electrochromic device.

13. The defect identification method according to claim 11, characterized in that: Determining the discharge duration of the electrochromic device according to the maximum discharge duration includes: Determining the maximum discharge duration as the discharge duration of the electrochromic device; or, Obtaining a third preset time difference, calculating the difference between the maximum discharge duration and the third preset time difference as a normal discharge duration, and determining the normal discharge duration as the discharge duration of the electrochromic device; or, A fourth preset time difference is obtained, a sum of the maximum discharge duration and the fourth preset time difference is calculated as an overload discharge duration, and the overload discharge duration is determined as the discharge duration of the electrochromic device.

14. The defect identification method according to claim 12, characterized in that: The ratio of the first preset time difference to the maximum charging duration is between 1% and 100%, and / or the ratio of the second preset time difference to the maximum charging duration is between 1% and 200%.

15. The defect identification method according to claim 13, characterized in that: The ratio of the third preset time difference to the maximum discharge duration is between 1% and 100%, and / or the ratio of the fourth preset time difference to the maximum discharge duration is between 1% and 200%.

16. The defect identification method according to claim 11, characterized in that: The obtaining at least one of a maximum charging time and a maximum discharging time of the electrochromic device comprises: A CV curve of the electrochromic device is obtained, and at least one of a maximum charging time and a maximum discharging time of the electrochromic device is determined according to the CV curve.

17. The defect identification method according to claim 16, characterized in that: Determining at least one of a maximum charging time and a maximum discharging time of the electrochromic device according to the CV curve includes: Determine that the difference between the voltage corresponding to the reversible oxidation peak in the CV curve and the voltage corresponding to the slope of the positive current curve reaching a first preset slope is a first voltage interval △V1; obtain the scanning speed f of the electrochromic device in the process of scanning to obtain the CV curve, and calculate the maximum charging time T1=△V1 / f according to the first voltage interval and the scanning speed; and / or, Determine that the difference between the voltage corresponding to the reversible reduction peak in the CV curve and the voltage corresponding to the second preset slope of the negative current curve is a second voltage interval △V2; obtain the scanning speed f of the electrochromic device in the process of scanning to obtain the CV curve, and calculate the maximum discharge time T2=△V2 / f based on the second voltage interval and the scanning speed.

18. The defect identification method according to claim 17, characterized in that: The absolute value of the first preset slope is less than 0.5, and / or the absolute value of the second preset slope is less than 0.

5.

19. The defect identification method according to claim 11, characterized in that: The obtaining at least one of a maximum charging time and a maximum discharging time of the electrochromic device comprises: Acquiring a first current-time curve during the charging process of the electrochromic device, and determining a maximum charging time of the electrochromic device according to the first current-time curve; and / or, A second current-time curve during the discharge process of the electrochromic device is obtained, and a maximum discharge time of the electrochromic device is determined according to the second current-time curve.

20. The defect identification method according to claim 19, characterized in that: Determining the maximum charging time of the electrochromic device according to the first current-time curve includes: Determine the time corresponding to when the current in the first current-time curve is less than the first preset current value as the maximum charging time; or, The time corresponding to when the slope of the first current-time curve reaches a third preset slope is determined as the maximum charging time.

21. The defect identification method according to claim 20, characterized in that: The first preset current value is less than or equal to 40 mA, and / or the absolute value of the third preset slope is less than 0.

1.

22. The defect identification method according to claim 19, characterized in that: The step of determining the maximum discharge duration of the electrochromic device according to the second current-time curve comprises: Determine the time corresponding to when the current in the second current-time curve is less than the second preset current value as the maximum discharge duration; or, The time corresponding to when the slope of the second current-time curve reaches a fourth preset slope is determined as the maximum discharge duration.

23. The defect identification method according to claim 22, characterized in that: The second preset current value is less than or equal to 40 mA, and / or the absolute value of the fourth preset slope is less than 0.

1.

24. A defect recognition system for an electrochromic device, characterized in that: include: A processor, configured to determine at least one of a charging voltage and a discharging voltage of the electrochromic device, and to determine at least one of a charging duration and a discharging duration of the electrochromic device; A driver, configured to charge the electrochromic device using the charging voltage within the charging duration, and / or to discharge the electrochromic device using the discharging voltage within the discharging duration; as well as, A detector is used to detect whether the electrochromic device has a predetermined defect during or after the charging process; and / or to detect whether the electrochromic device has a predetermined defect during or after the discharging process.

25. The defect recognition system according to claim 24, characterized in that: The processor is specifically used for: Obtain at least one of a maximum charging voltage and a maximum discharging voltage of the electrochromic device, determine the charging voltage of the electrochromic device according to the maximum charging voltage, and / or determine the discharging voltage of the electrochromic device according to the maximum discharging voltage.

26. The defect recognition system according to claim 25, characterized in that: The processor is specifically used for: determining the maximum charging voltage as the charging voltage of the electrochromic device; or, A first preset voltage difference is obtained, a sum of the maximum charging voltage and the first preset voltage difference is calculated as a charging overload voltage, and the charging overload voltage is determined to be the charging voltage of the electrochromic device.

27. The defect identification system according to claim 25, characterized in that: The processor is specifically used for: determining the maximum discharge voltage as the discharge voltage of the electrochromic device; or, A second preset voltage difference is obtained, a sum of the maximum discharge voltage and the second preset voltage difference is calculated as a discharge overload voltage, and the discharge overload voltage is determined to be the discharge voltage of the electrochromic device.

28. The defect identification system according to claim 26, characterized in that: The first preset voltage difference has a value ranging from 0.1V to 1.0V.

29. The defect identification system according to claim 27, characterized in that: The second preset voltage difference is in the range of 0.1V to 1.0V.

30. The defect identification system according to claim 25, characterized in that: The processor is specifically used for: A CV curve of the electrochromic device is obtained, and at least one of a maximum charging voltage and a maximum discharging voltage of the electrochromic device is determined according to the CV curve.

31. The defect identification system according to claim 30, characterized in that: The processor is specifically used for: Determining a voltage corresponding to a reversible oxidation peak in the CV curve as the maximum charge voltage, and / or determining a voltage corresponding to a reversible reduction peak in the CV curve as the maximum discharge voltage; or, Determine the voltage corresponding to the point where the absolute value of the positive current in the CV curve is the largest as the maximum charging voltage, and / or determine the voltage corresponding to the point where the absolute value of the negative current in the CV curve is the largest as the maximum discharging voltage; or, The voltage corresponding to the slope reversal point of the positive current curve in the CV curve is determined as the maximum charging voltage, and / or the voltage corresponding to the slope reversal point of the negative current curve in the CV curve is determined as the maximum discharging voltage.

32. The defect recognition system according to claim 24 or 25, characterized in that: The processor is further configured to: detecting an initial open circuit voltage of the electrochromic device; The driver is specifically used for: When the initial open circuit voltage is less than 0, the electrochromic device is charged using the charging voltage within the charging time; and / or, When the initial open circuit voltage is greater than 0, the electrochromic device is discharged using the discharge voltage within the discharge time; and / or, When the initial open circuit voltage is equal to 0, the electrochromic device is charged with the charging voltage within the charging time, or the electrochromic device is discharged with the discharging voltage within the discharging time.

33. The defect recognition system according to claim 24 or 25, characterized in that: The number of times of charging treatment on the electrochromic device is at least two times, and a discharge treatment is performed between two adjacent charging treatments; or / and, The number of discharge treatments on the electrochromic device is at least two, and a charge treatment is performed between two adjacent discharge treatments.

34. The defect recognition system according to claim 24 or 25, characterized in that: The processor is specifically used for: Obtain at least one of a maximum charging time and a maximum discharging time of the electrochromic device, determine the charging time of the electrochromic device according to the maximum charging time, and / or determine the discharging time of the electrochromic device according to the maximum discharging time.

35. The defect identification system according to claim 34, characterized in that: The processor is specifically used for: Determine the maximum charging time as the charging time of the electrochromic device; or, Obtaining a first preset time difference, calculating the difference between the maximum charging time and the first preset time difference as a normal charging time, and determining the normal charging time as the charging time of the electrochromic device; or, A second preset time difference is obtained, the sum of the maximum charging duration and the second preset time difference is calculated as the overload charging duration, and the overload charging duration is determined as the charging duration of the electrochromic device.

36. The defect identification system according to claim 34, characterized in that: The processor is specifically used for: Determining the maximum discharge duration as the discharge duration of the electrochromic device; or, Obtaining a third preset time difference, calculating the difference between the maximum discharge duration and the third preset time difference as a normal discharge duration, and determining the normal discharge duration as the discharge duration of the electrochromic device; or, A fourth preset time difference is obtained, a sum of the maximum discharge duration and the fourth preset time difference is calculated as an overload discharge duration, and the overload discharge duration is determined as the discharge duration of the electrochromic device.

37. The defect identification system according to claim 35, characterized in that: The ratio of the first preset time difference to the maximum charging duration is between 1% and 100%, and / or the ratio of the second preset time difference to the maximum charging duration is between 1% and 200%.

38. The defect identification system according to claim 36, characterized in that: The ratio of the third preset time difference to the maximum discharge duration is between 1% and 100%, and / or the ratio of the fourth preset time difference to the maximum discharge duration is between 1% and 200%.

39. The defect identification system according to claim 34, characterized in that: The processor is specifically used for: A CV curve of the electrochromic device is obtained, and at least one of a maximum charging time and a maximum discharging time of the electrochromic device is determined according to the CV curve.

40. The defect identification system according to claim 39, characterized in that: The processor is specifically used for: Determine that the difference between the voltage corresponding to the reversible oxidation peak in the CV curve and the voltage corresponding to the slope of the positive current curve reaching a first preset slope is a first voltage interval △V1; obtain the scanning speed f of the electrochromic device in the process of scanning to obtain the CV curve, and calculate the maximum charging time T1=△V1 / f according to the first voltage interval and the scanning speed; and / or, Determine that the difference between the voltage corresponding to the reversible reduction peak in the CV curve and the voltage corresponding to the second preset slope of the negative current curve is a second voltage interval △V2; obtain the scanning speed f of the electrochromic device in the process of scanning to obtain the CV curve, and calculate the maximum discharge time T2=△V2 / f based on the second voltage interval and the scanning speed.

41. The defect identification system according to claim 40, characterized in that: The absolute value of the first preset slope is less than 0.5, and / or the absolute value of the second preset slope is less than 0.

5.

42. The defect identification system according to claim 34, characterized in that: The processor is specifically used for: Acquiring a first current-time curve during the charging process of the electrochromic device, and determining a maximum charging time of the electrochromic device according to the first current-time curve; and / or, A second current-time curve during the discharge process of the electrochromic device is obtained, and a maximum discharge time of the electrochromic device is determined according to the second current-time curve.

43. The defect identification system according to claim 42, characterized in that: The processor is specifically used for: Determine the time corresponding to when the current in the first current-time curve is less than the first preset current value as the maximum charging time; or, The time corresponding to when the slope of the first current-time curve reaches a third preset slope is determined as the maximum charging time.

44. The defect identification system according to claim 43, characterized in that: The first preset current value is less than or equal to 40 mA, and / or the absolute value of the third preset slope is less than 0.

1.

45. The defect identification system according to claim 42, characterized in that: The processor is specifically used for: Determine the time corresponding to when the current in the second current-time curve is less than the second preset current value as the maximum discharge duration; or, The time corresponding to when the slope of the second current-time curve reaches a fourth preset slope is determined as the maximum discharge duration.

46. ​​The defect identification system according to claim 45, characterized in that: The second preset current value is less than or equal to 40 mA, and / or the absolute value of the fourth preset slope is less than 0.

1.

47. A computer-readable storage medium storing a computer program, characterized in that: When the computer program is executed by a processor, the defect identification method of the electrochromic device according to any one of claims 1 to 23 is implemented.

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