Secondary battery stacking apparatus and control method thereof

Abstract

In order to achieve the objective described above, an embodiment of the present invention may provide a secondary battery stacking apparatus and stacking method for manufacturing an electrode assembly product by stacking a second semi-finished product on a first semi-finished product stacked on a pallet. Although stacking must be performed such that the center of the second semi-finished product coincides with the center of the first semi-finished product, it is not easy to calculate the actual center value of the first semi-finished product when shape disturbances occur at both ends of the first semi-finished product. The present embodiment may provide a stacking apparatus and a stacking method whereby stacking can be performed by calculating the center value of a first semi-finished product in a diagonal line manner rather than a conventional vertical line manner.

Description

Secondary battery stacking device and control method thereof

[0001] The present invention relates to a secondary battery stacking device for manufacturing a secondary battery cell by stacking electrodes, and to an electrode stacking device and a control method thereof that can improve stacking accuracy by correcting measurement disturbance of electrodes that are stacking targets.

[0002] This application claims the benefit of priority to Republic of Korea Patent Application No. 10-2024-0009589, filed January 22, 2024, the entire contents of which are incorporated herein by reference.

[0003] Rechargeable secondary batteries have recently been widely used in a variety of devices. They are particularly attracting attention as an eco-friendly energy source that can reduce air pollution, particularly in vehicles powered by fossil fuels.

[0004] Secondary batteries can be classified into lithium-ion batteries, lithium-ion polymer batteries, etc. depending on the composition of the electrodes and electrolyte, and can be classified into square batteries, pouch-type batteries, and cylindrical batteries depending on the shape of the battery case.

[0005] The electrode assembly built into the battery case is a power generation element capable of charging and discharging, consisting of a positive electrode, a negative electrode, and a separator interposed between the positive and negative electrodes. The electrode assembly can be classified into a jelly roll type in which a separator is interposed between long sheet-shaped positive and negative electrodes coated with active materials, and a stack type in which multiple positive and negative electrodes are sequentially stacked in a state described in the separator.

[0006] In the case of a stacked secondary battery, it can be manufactured by stacking individual positive electrodes, negative electrodes, and separators one by one, or it can be manufactured by stacking semi-finished cells.

[0007] Semi-finished products can be formed by stacking a separator, anode, separator, and cathode, and these can be called monocells. Semi-finished products can be formed by stacking a separator, anode, and separator, and these can be called half-cells. Monocells can be formed by stacking a separator, cathode, separator, and anode, and half-cells can be formed by stacking a separator, cathode, and separator. Of course, the stacking order and number of layers in semi-finished products can vary.

[0008] After a plurality of semi-finished products, which are monocells, are laminated, a semi-finished product, which is a half-cell, is laminated at the end to manufacture a final finished product, which is an electrode assembly. The thickness of the electrode assembly can be determined depending on the number of laminated monocells.

[0009] Monocells and halfcells can be referred to as first and second semi-finished products, respectively, and a state in which multiple monocells are stacked can also be referred to as a first semi-finished product.

[0010] Fig. 1 illustrates a mono-cell (20), which is an example of a semi-finished product, stacked in multiple pieces and placed on a pallet (10), and Fig. 2 illustrates a half-cell (30), which is an example of a semi-finished product.

[0011] The pallet (10) includes a plurality of supports (11), and an empty space (12) is formed between the supports (11). Using this empty space, a P&P (pick and place) device can move the electrode assembly and tape the outer surface of the electrode assembly.

[0012] In a state where multiple monocells (20) are stacked, both ends of the monocells (20) are positioned on supports (11) located at both ends, and the positive electrode lead (22) and the negative electrode lead (21) can be removed from the supports (11) located at both ends. In a state where multiple monocells (20) are stacked, only the positive electrode (24) and the separator (25) can be seen on a flat surface.

[0013] When multiple monocells (20) are supported, the monocells (20) can ideally be horizontal as shown in Fig. 1(b).

[0014] By additionally loading the half-cell (30) illustrated in FIG. 2 while the mono-cell (20) is loaded, the loading process for manufacturing the electrode assembly can be completed. At this time, the loading accuracy of the mono-cell (20) and the half-cell (30) is very important. That is, ideally, the half-cell should be loaded so as to match the mono-cell (20), and in particular, the centers of the mono-cell (20) and the half-cell (30) should be loaded so as to match.

[0015] To this end, first, the center position value (x, y, θ) or deviation of the monocell (20) on the xy plane can be measured through vision.

[0016] As shown in Fig. 3, the intersection point can be calculated by generating and calculating a virtual straight line of the ROI (region of interest) reference points of the long side (up and down horizontal side) and the short side (left and right vertical side) on the image acquired through vision.

[0017] For example, to calculate the upper left corner point (A), first, a straight line (XT) on the upper long side is calculated and created using the positions of the ROI reference points (XUL, XUR) on the upper long side. Then, a straight line (YL) on the left short side is calculated and created using the positions of the ROI reference points (YLT, YLB) on the left short side. Finally, the intersection point of the XL line and the YL line is calculated. At this time, the calculated intersection point can be said to be the upper left corner point (A).

[0018] By calculating the upper right corner point (B), the lower left corner point (C), and the lower right corner point (D) in the same way, the datum of the monocell (20) having four vertices in total can be obtained.

[0019] The center position value (x, y, θ) or the deviation value from the center position of the monocell (20) can be calculated and measured through the four corner points.

[0020] Using the center position value or the deviation value of the center position of the monocell (20), the half-cell (30) can be loaded on top of the monocell (20) to complete the loading for manufacturing the electrode assembly.

[0021] However, when calculating the center position of the monocell (20) in this way, there is a problem in that it does not sufficiently reflect shape disturbances such as lifting or bending at both ends of the stacked monocell (20). This is because lifting or bending (bending upward or downward) at both ends of the monocell (20) occurs in the z-direction gravity direction, and when calculating the intersection of straight lines on the xy plane, there is a high possibility that an unexpected error will occur.

[0022] Due to shape disturbance, the center position of the monocell (20) cannot be accurately calculated, which may result in a full-width defect due to an angle distortion, and this may cause a defect in the outermost electrode to break.

[0023] Therefore, it is necessary to find a way to minimize defects that appear in finished products due to errors caused by shape disturbance during the loading process of semi-finished products.

[0024] The purpose of the present invention is to provide a stacking device and a stacking method capable of performing accurate stacking.

[0025] Through one embodiment of the present invention, it is intended to provide a stacking device and method capable of effectively compensating for shape disturbance of a semi-finished product transported and waiting for loading.

[0026] Through one embodiment of the present invention, it is intended to provide a stacking device and method capable of effectively measuring the datum of a semi-finished product even when the shape and support position of the pallet on which the semi-finished product is supported are different.

[0027] Through one embodiment of the present invention, it is intended to provide a stacking device and method capable of accurately calculating the center value of a semi-finished product by effectively compensating for shape disturbance caused by bending or breaking at both ends of the semi-finished product.

[0028] Through one embodiment of the present invention, it is intended to provide a stacking device and method capable of measuring the datum of a semi-finished product through four virtual corner points that serve as datum references using a diagonal angle.

[0029] Through one embodiment of the present invention, it is intended to provide a stacking device and method that can immediately and effectively respond to a tendency for stacking errors by re-measuring the datum of a finished product after stacking and automatically correcting the offset of the stacking device.

[0030] In order to achieve the above-described purpose, according to one embodiment of the present invention, a secondary battery stacking device and stacking method for manufacturing an electrode assembly product by stacking a second semi-finished product on a first semi-finished product stacked on a pallet can be provided.

[0031] Although stacking must be performed so that the center of the second semi-finished product coincides with the center of the first semi-finished product, it is not easy to calculate the actual center value of the first semi-finished product when shape disturbance occurs at both ends of the first semi-finished product.

[0032] In this embodiment, a stacking device and a stacking method can be provided in which stacking can be performed by calculating the center value of the first semi-finished product in a diagonal manner rather than calculating the center value of the first semi-finished product in a conventional vertical manner.

[0033] To achieve the aforementioned purpose, according to one embodiment of the present invention, a secondary battery stacking method can be provided for manufacturing a finished electrode assembly by stacking a second semi-finished product on a first semi-finished product. Here, the first semi-finished product can be formed by stacking the same semi-finished product multiple times, and the second semi-finished product is finally stacked, thereby completing the stacking or stacking process and manufacturing the electrode assembly.

[0034] In order to achieve the above-mentioned object, according to one embodiment of the present invention, a stacking device and a stacking method may be provided, including a pallet that does not support both ends of a first semi-finished product cell of a rectangular shape and supports a central portion, and a first vision device that generates a plane image from an upper portion of the first semi-finished product supported on the pallet, and a controller that calculates the center position and the warp angle of the first semi-finished product cell using the angles of virtual diagonals generated at each of the inner sides of four corners in the plane image to correct shape disturbance of the first semi-finished product. A process of performing an intermediate calculation process for finally calculating the center position and the warp angle of the first semi-finished product cell through the plane image may include a process of measuring a datum of the first semi-finished product and a process of processing the datum.

[0035] According to one embodiment of the present invention, a secondary battery stacking method can be provided, including: a step of measuring a datum of a first semi-finished product through an image acquired through a first vision device; a step of measuring a datum of a second semi-finished product through an image acquired through a second vision device; and a step of calculating a correction position using the datum of the first semi-finished product and the datum of the second semi-finished product, and then stacking the second semi-finished product on the first semi-finished product through a stacking device, wherein, in order to correct a shape disturbance of the first semi-finished product when measuring the datum of the first semi-finished product, a virtual corner position for the first semi-finished product is calculated using a virtual diagonal angle generated on the inside of the corner on the image of the first semi-finished product.

[0036] The above virtual diagonal line can be created by connecting reference points on each of the two intersecting straight lines forming the corner on the image of the first semi-finished product.

[0037] Here, the virtual oblique angle may be the angle (β) between the oblique line and the y-axis (vertical line). Of course, the virtual oblique angle may also be the angle between the oblique line and the x-axis (horizontal line). If no deflection occurs in the z-axis direction at one end of the first semi-finished product, the virtual oblique angle (β) has a fixed value. However, as the deflection increases, the deviation of the oblique angle from the fixed value increases.

[0038] Therefore, the deflection angle can be calculated using the calculated oblique angle (β). Through this, the corner points in the ideal plane state, i.e., the state before deflection occurs, can be calculated and derived.

[0039] By deriving the remaining three corner points in the same way, the datum of the first semi-finished product can be measured through a total of four corner points.

[0040] The above shape disturbance may be due to bending or sagging of the first semi-finished product.

[0041] Through the datum of the first semi-finished product, the center value of the first semi-finished product can be calculated as the x value, y value, and twist angle θ value on the xy plane.

[0042] Here, the coordinates of the four corner points, the center coordinate, and the misalignment angle of the first semi-finished product in its ideal flat state can be referred to as the datum of the first semi-finished product. Of course, the intermediate values ​​used to derive this information can also be referred to as the datum of the first semi-finished product.

[0043] It is preferable that the process of measuring the datum of the above first semi-finished product be visually displayed through a display.

[0044] The image of the first semi-finished product and the virtual diagonal line on the image can be displayed through the display. Furthermore, the virtual diagonal angle can be displayed. This allows the measured corner values ​​to be displayed. It is desirable that a virtual diagonal line be displayed for each of the four corners, thereby visually representing the datum measurement process of the first semi-finished product.

[0045] After laminating the second semi-finished product, a step of measuring the datum of the second semi-finished product through an image acquired through the first vision device may be further performed.

[0046] The center value of the first semi-finished product is calculated before the second semi-finished product is laminated. Ideally, the center value of the laminated second semi-finished product should match the center value of the first semi-finished product after lamination. Therefore, the deviation between the center value of the second semi-finished product after lamination and the center value of the first semi-finished product before lamination can be obtained. The deviation can be obtained each time the datum of the second semi-finished product after lamination is measured. After the deviations are obtained a preset number of times, their moving average can be calculated. In other words, the trend of the deviation can be identified, and the offset of the loading device can be automatically compensated using the deviation trend.

[0047] That is, a step of automatically correcting the offset of the loading device can be performed using the datum of the second semi-finished product that is re-measured after lamination. In addition, it is preferable that the automatic offset correction be performed using a moving average obtained through multiple measurements of the datum of the second semi-finished product.

[0048] When measuring the datum of the second semi-finished product, the corner position of the second semi-finished product can be calculated using a virtual intersecting straight line formed at the corner portion on the image of the second semi-finished product.

[0049] The datum measurement method of the second semi-finished product before lamination and the datum measurement method of the second semi-finished product after lamination may be the same. However, these measurement methods may differ from the datum measurement method of the first semi-finished product.

[0050] In order to achieve the above-described purpose, according to one embodiment of the present invention, in a secondary battery stacking device and stacking method for manufacturing an electrode assembly product by stacking a second semi-finished product on a first semi-finished product stacked on a pallet, a secondary battery stacking device and stacking method for automatically correcting an offset of a stacking device stacking the second semi-finished product can be provided.

[0051] According to this embodiment, the datum of the second semi-finished product can be measured after laminating the second semi-finished product. Using this, the difference between the center value information of the actually laminated second semi-finished product and the center value reflecting the current offset can be calculated. In other words, the offset error may appear as a certain trend. And, this difference must be additionally corrected for each lamination of the second semi-finished product. Therefore, it is desirable to update the current offset to reduce the offset error appearing as a trend. In other words, it is desirable to perform automatic offset correction rather than manual offset manipulation. Therefore, it is possible to minimize the size of the additionally corrected value when laminating the second semi-finished product. This enables more accurate lamination. This is because the accuracy of error correction at a small offset value is higher than that of error correction at a large offset value.

[0052] In order to achieve the above-described purpose, according to one embodiment of the present invention, there is provided a secondary battery stacking device for manufacturing a finished electrode assembly by stacking a second semi-finished product on a first semi-finished product, the secondary battery stacking device comprising: a loading station to which a first semi-finished product placed on a pallet is transferred and positioned; a first vision device provided at the loading station and configured to generate an image of the first semi-finished product in order to measure a datum of the first semi-finished product; a stacking device configured to stack the second semi-finished product on the first semi-finished product; and a main controller configured to measure the datum of the first semi-finished product through the image of the first semi-finished product, wherein the main controller is characterized in that, in order to correct a shape disturbance of the first semi-finished product, a virtual corner position for the first semi-finished product is calculated by using a virtual diagonal angle generated on the inside of the corner on the image of the first semi-finished product, and the datum is measured.

[0053] The above main controller may be provided in the form of a PC or an HMI, and may be equipped with software for calculating datums through images.

[0054] The above virtual diagonal line can be created by connecting reference points on each of the two intersecting straight lines forming the corner on the image of the first semi-finished product.

[0055] The above datum can be measured by calculating the positions of the four corners.

[0056] The above shape disturbance may be due to bending or sagging of the first semi-finished product.

[0057] The above main controller can calculate the center value of the first semi-finished product as an x ​​value, a y value, and a twist angle θ value on the xy plane through the datum of the first semi-finished product.

[0058] The above pallet includes a plurality of supports on which the first semi-finished product is placed and supported, and the plurality of supports can support the first semi-finished product except for both ends of the first semi-finished product. That is, both ends of the first semi-finished product are floating in the air, and only the central portion can be supported by the plurality of supports.

[0059] A loading station where the second semi-finished product waits for lamination; and a second vision device provided in the loading station and generating an image of the second semi-finished product to measure a datum of the second semi-finished product may be included.

[0060] It is preferable that the main controller measures the datum of the second semi-finished product, and the loading device stacks the first semi-finished product and the second semi-finished product so that the center value of the second semi-finished product matches the center value of the second semi-finished product.

[0061] The above loading device can absorb the upper surface of the second semi-finished product and move it to the upper surface of the first semi-finished product, and then load the second semi-finished product on the upper surface of the first semi-finished product.

[0062] The first vision device can generate an image of the second semi-finished product in order to re-measure the position of the second semi-finished product after laminating the second semi-finished product.

[0063] It is preferable that the above main controller automatically corrects the offset of the loading device through the re-measured mounting position of the second semi-finished product.

[0064] The present invention can provide a stacking device and a stacking method capable of performing accurate stacking.

[0065] Through one embodiment of the present invention, a stacking device and method capable of effectively compensating for shape disturbance of a semi-finished product transported and waiting for loading can be provided.

[0066] Through one embodiment of the present invention, a stacking device and method capable of effectively measuring the datum of a semi-finished product can be provided even if the shape and support position of the pallet on which the semi-finished product is supported are different.

[0067] Through one embodiment of the present invention, a stacking device and method can be provided that can accurately calculate the center value of a semi-finished product by effectively compensating for shape disturbance caused by bending or bending at both ends of the semi-finished product.

[0068] Through one embodiment of the present invention, a stacking device and method can be provided that can measure the datum of a semi-finished product through four virtual corner points that serve as datum references using a diagonal angle.

[0069] Through one embodiment of the present invention, a stacking device and method can be provided that can immediately and effectively respond to a stacking error having a tendency by re-measuring the datum of a finished product after stacking and automatically correcting the offset of the stacking device.

[0070] Figure 1 is a plan view showing the first semi-finished product being placed and supported on a pallet.

[0071] Figure 2 is a plan view of the second semi-finished product,

[0072] Figure 3 schematically illustrates a first method for measuring a datum through an image of a first semi-finished product.

[0073] Figure 4 is a plan view showing the relationship of the settling and support positions between the first semi-finished product and the pallet applicable to one embodiment of the present invention;

[0074] Figure 5 schematically illustrates a second method for measuring a datum through an image of a first semi-finished product.

[0075] FIG. 6 illustrates an example of a stacking device according to one embodiment of the present invention.

[0076] Figure 7 illustrates an example of a stacking method according to one embodiment of the present invention.

[0077] Hereinafter, a stacking device and a stacking method according to an embodiment of the present invention will be described in detail with reference to the attached drawings.

[0078] Fig. 4 illustrates a mono-cell (20), which is an example of a semi-finished product, stacked and placed on a pallet (10). To distinguish it from the half-cell described later, the mono-cell may be referred to as a first semi-finished product and the half-cell may be referred to as a second semi-finished product.

[0079] The manner in which monocells (20) of the same size are placed on the same pallet (10) may vary. For example, as illustrated in FIG. 1, both ends of the monocell (20) may be placed on the support (11), and as illustrated in FIG. 4, both ends of the monocell (20) may not be placed on the support (11).

[0080] That is, the number of supports (11) and the positions of the supports (11) supporting the monocell (20) can vary. This means that the position of the portion that does not support the monocell (20) can vary due to the space (12) formed between the supports (11).

[0081] The above pallet (10) supports the stacked monocell (20), and additionally stacks half-cells (30) on the stacked monocell (20), so that the pallet (10) supports the electrode assembly. Thereafter, the outer surface of the electrode assembly, after the stacking is completed, can be taped with a separator. Accordingly, the taping position can be determined depending on the position of the space (12).

[0082] Meanwhile, in the present embodiment, the pallet (10) is provided with a plurality of supports (11) in the width direction for monocells (20), and a space (12), i.e., an empty gap, may exist between the supports. Stacking of a plurality of monocells (20) can be performed on the pallet (10), and the pallet (10) can be transported to sequentially perform detailed processes of the stacking process.

[0083] For example, multiple monocells can be stacked on a pallet at a specific location. This process is called a lamination process. The pallet is then transported to a location where halfcells are stacked, where they are ultimately stacked on top of the monocells. This process is called a stacking process. After the stacking process is complete, the pallet can be transported for taping and inspection.

[0084] When the monocell (20) is installed and transported in the form shown in Fig. 4, taping may be possible near the two-end electrodes (21, 22). Conversely, when the monocell (20) is installed and transported in the form shown in Fig. 1, taping is not easy near the two-end electrodes (21, 22).

[0085] Therefore, the position at which the pallet (10) supports the monocell (20) may vary for various reasons, such as ease of taping or installation of the P&P device.

[0086] The electrode stacking device and control method according to the present embodiment can be said to be very effective, especially when both ends of a semi-finished product or a finished product cell are transported without being supported on a pallet.

[0087] When a monocell (20) is supported in the form illustrated in Fig. 4, both ends of the monocell (20) have no support points, so they may sag downward due to their own weight. Fig. 4(b) exaggerates the sag at one end of the monocell (20). When viewing a semi-finished product or a finished product from the side, it can be seen that sagging may occur at the end portion.

[0088] Before the half-cell (30) is finally loaded, a plurality of monocells (20) may be sequentially loaded and transported. The positive electrode, negative electrode, and separator are formed in the form of very thin films. In addition, active materials are coated on both sides of the positive and negative electrodes. Therefore, when a plurality of monocells (20) are stacked and both ends of the monocells are not supported, the ends of the monocells (20) may sag due to their own weight. In particular, as the length of both ends of the monocells floating in the air increases, the amount of sag and the sag angle may become larger.

[0089] The inventors of the present invention were able to confirm that, when such sagging occurs, there is a high possibility of measurement disturbance occurring with the intersection point calculation method described through Fig. 3 (hereinafter referred to as the "vertical line method"), and thus, the full-width defect rate increases. This means that the existing vertical line method cannot effectively measure the z-axis direction deformation at both ends of the electrode assembly. In particular, when there is a high possibility of sagging occurring in the z-axis direction due to the both ends of the monocell (20) not being supported, it can be expected that a significant portion of the defect rate is due to measurement disturbance by the existing vertical line method.

[0090] If bending occurs at both ends of the monocell (20), it can be expected that the left-right width will be slightly reduced in the image on the xy plane. In addition, if the bending amount is different at both ends of the monocell (20), it can be expected that the center of the measured monocell may be shifted to the left or right using the existing vertical line method. In addition, if the bending amount is different at the upper and lower ends of one end of the monocell (20), it can be expected that distortion will occur at the center of the measured monocell using the standard vertical line method.

[0091] Accordingly, the inventor of the present invention sought a method for accurately measuring the center of the monocell (20) even when bending occurs at both ends of the monocell (20). In the process of this search, the inventor was able to notice that the angle of the diagonal line at the corner portion on the ideal xy plane can vary depending on the amount of bending.

[0092] Hereinafter, with reference to FIG. 5, a method for measuring an intersection point that can be applied to one embodiment of the present invention will be described in detail.

[0093] As illustrated in Fig. 5, if no sagging occurs at both ends of the monocell (20), the angle of the diagonal lines (OL1 to OL4) near the intersection point does not change. For example, the angle of the diagonal line formed by the XUL point and the YLT point, which are ROI reference points, is fixed. Here, the method for generating the ROI reference point may be the same as in the vertical line method.

[0094] For example, if the angle of these diagonals is 45 degrees, the intersection point, i.e. the corner point, can be calculated using trigonometric functions.

[0095] In the ROI reference point illustrated in Fig. 3, the angle (the angle) formed by the diagonal line connecting the reference point YLT and the reference point XUL and the YL line has a fixed value when there is no sag. However, as the sag at both ends of the monocell (20) increases, the reference point YLT moves to the right, and as a result, the angle of the angle of the angle of the angle of the angle of the line of the angle of the XT line increases. When the angle of the angle of the angle of the angle of the angle of the angle of the angle of the XT line increases, the angle of ... XT line increases as the sag increases.

[0096] Here, the correlation between the change in the deflection angle or deflection displacement and the change in the oblique angle can be utilized. It can be seen that as the deflection angle increases, the oblique angle can vary to have a greater deviation from the fixed value. Therefore, for example, the deflection angle can be calculated using the angle between the oblique line formed by the XUL point and the YLT point, which are the ROI reference points, and the YL straight line, that is, the oblique angle (β), and the corrected virtual corner point, that is, the edge value, can be calculated using the deflection angle. Therefore, since this intersection point measurement method is a method that utilizes an oblique line, unlike the conventional vertical line method, it can be called an oblique line method.

[0097] Here, the corrected virtual edge value may be the edge value when the monocell in a sagging state is converted to a flat state. In other words, the actual edge position in a monocell in a state without sagging can be calculated.

[0098] The calculation of these corner values ​​can be performed at all four corners. Therefore, after the corner values ​​are calculated at all four corners, the center value of the monocell (20) can be measured or calculated. Here, the center value of the monocell can include the coordinates of the center point and the angle of deviation in the XY plane.

[0099] Hereinafter, a stacking device and a control method according to an embodiment of the present invention will be described in detail with reference to FIGS. 6 and 7.

[0100] The stacking device (100) may include an LMS device. The monocell (20) loaded through the LMS (linear moving system) device, i.e., the linear moving device (110), may be moved (S10) to the loading station (102). Here, the loading of the monocell may be performed through another device and then transferred to the stacking device. Of course, the stacking device may include a monocell loading device, and the monocell (20) loaded through the monocell loading device may be placed on a pallet and moved to the loading station (102) through the linear moving device. In addition to the monocell (20) loaded at the loading station (102), a half-cell (30) may be loaded to complete the loading.

[0101] This stacking device (100) supplies (S11) the half-cell (30) to the loading position in order to load the half-cell (30). For this purpose, a linear movement device (110) may be provided. The linear movement device (111) for moving the mono-cell (20) and the linear movement device (112) for moving the half-cell (30) may be distinguished.

[0102] The present stacking device (100) may include a device for stacking a separator, an anode, and a separator to manufacture a half-cell (30), and after manufacturing the half-cell (30), it may be moved to a position for loading the half-cell (30), i.e., a loading station (103). Of course, after manufacturing the half-cell (30), it may be transported to the present stacking device through another device.

[0103] The half-cell (30) can be loaded into the loading station (103) and prepared for loading. Loading of the half-cell (30) can be performed through the half-cell loading device (140). The half-cell loading device (140) can hold and move the half-cell (30) located at the loading station (103). The half-cell loading device (150) can move the half-cell by absorbing the upper part of the half-cell.

[0104] In order to precisely load a half-cell (30) in addition to a loaded mono-cell (20), the center value of the current mono-cell (20) and the center value of the half-cell (30) must be measured. This is because it is desirable to load the half-cell (30) so that the center value exactly matches the center value of the mono-cell (20). Here, the center value may mean x, y, and θ values.

[0105] For loading (S20) of a half-cell (30), mono-cell measurement (S21) can be performed first. An xy-plane image of the mono-cell (20) can be generated through a vision (120) equipped in the loading station (102). Four virtual corner values ​​are calculated through the generated image, and the center value of the mono-cell (20) can be calculated through this. It is preferable that this calculation method utilize the aforementioned diagonal method.

[0106] For loading (S20) of a half-cell (30), half-cell measurement (S22) can be performed. An xy-plane image of the half-cell (30) can be generated through a vision (130) equipped in the loading station (103). The center value of the half-cell (30) can be calculated through the generated image. This calculation method can utilize the oblique line method or the vertical line method described above.

[0107] When the measurement of the monocell (20) and halfcell (30) is completed, the loading step (S20) can be completed by performing the halfcell loading (S23) after calculating the correction position.

[0108] Half-cell loading (S23) can be performed through a half-cell loading device (140). The half-cell loading device (130) can be equipped to move in the xyz axes, i.e. in three dimensions, to load the half-cell. During the process of moving and loading the half-cell (30) through the half-cell loading device (140), a new half-cell (30) can be introduced into the loading station (103).

[0109] Through the measurement of the monocell (20), the error value for the center value of the monocell (20) can be calculated, and through the measurement of the half-cell (30), the error value for the center value of the monocell (20) can be calculated. That is, the monocell (20) and the half-cell (30) each have a reference center value, and through actual measurement, a center value having an error from the reference center value is measured. At this time, the deviation between the reference center value and the measured center value can be referred to as an error value.

[0110] The half-cell can be loaded by reflecting the error value for the reference center value of the monocell (20) and the error value for the reference center value of the half-cell (30). That is, the half-cell (30) can be loaded by reflecting the correction position.

[0111] When the loading of the half-cell (30) is completed, the loaded electrode assembly (50) can be transferred to the next process via the linear moving device (111). The next process may be a taping process for wrapping the outer surface of the electrode assembly (50) with a separator, as described above.

[0112] Meanwhile, the half-cell loading device (130) has been described as loading half-cells after calculating the compensation position. Despite this compensation position calculation, loading defects may occur. That is, electrode breakage defects due to full-width defects may occur, and such defects can be confirmed in the finished product.

[0113] Afterwards, the operator can manually adjust the offset by operating the manual offset operator. That is, the compensation position can be calculated by reflecting the offset value input by the operator, and the half-cell loading device (130) can load the half-cell based on this. Of course, the half-cell can also be loaded by reflecting the offset value at the calculated compensation position. The offset value can have an x ​​value, a y value, and a θ value.

[0114] However, when manually manipulating offset values, it takes a very long time to confirm whether the manipulation is appropriate. This is because, after loading is performed using a new offset, the accuracy of the loading must be confirmed after completing multiple processes. For example, after both the taping process and the electrode tab welding process are completed, the finished electrode assembly must be checked for loading errors or the appropriate offset. In other words, a very long lead time exists to confirm the appropriateness of the manual offset manipulation.

[0115] To solve this problem, according to the present embodiment, immediate and effective offset correction can be performed by re-measuring the position of the half cell (30) (S30).

[0116] Specifically, when the stacking of the half-cell (30) on the mono-cell (20) is completed, the half-cell (30) is positioned on the upper surface of the electrode assembly. At this time, the datum of the half-cell (30) can be re-measured through the first vision device (120). If the center value of the mono-cell (20) before loading and the center value of the half-cell (30) after loading are identical, it can be known that the loading was performed very accurately. In other words, this means that the current offset is accurate.

[0117] However, errors may occur due to the characteristics of the loading device (140), and these errors may appear as a certain trend.

[0118] For example, if the error tends to be (20, 20, 4) when the (x, y, θ) offset is set to (10, 10, 2), then an additional error correction of (10, 10, 2) must be performed each time a half-cell is loaded. Therefore, if the offset is corrected to (20, 20, 4), the additional error correction can be eliminated or minimized each time a half-cell is loaded.

[0119] Therefore, it is desirable that the offset of the loading device be automatically corrected by repeating re-measurement (S30) of the half-cell (30) position. For example, a moving average of error values ​​obtained through approximately 30 re-measurements can be obtained, and this moving average can be reflected in the offset.

[0120] Of course, the number of half-cell re-measurements performed for automatic offset correction can be set differently.

[0121] Meanwhile, the main controller (101) that controls the stacking device according to the present embodiment may be implemented in the form of a PC or HMI. In this case, it is preferable that a display be provided and an image for datum measurement be displayed through the display.

[0122] Furthermore, the datum measurement process can be additionally displayed on the displayed image. For example, virtual straight lines or diagonal lines for calculating corner points can be additionally created and displayed on the image, and the coordinates of the corner points or the center value of the datum can be displayed numerically.

[0123] Through this, you can intuitively confirm that the loading process is being performed accurately.

[0124] As mentioned above, different datum measurement methods can be used depending on the support positions of the monocell and pallet. Therefore, it is desirable to provide a datum measurement method selectable through an HMI. Furthermore, it is desirable to provide a method for offset compensation selectable through the HMI. For example, it is desirable to allow the operator to select between manual offset compensation and automatic offset compensation through the HMI.

[0125] As described in the detailed description of the invention.

Claims

1. In a secondary battery stacking method for manufacturing a finished electrode assembly product by stacking a second semi-finished product on a first semi-finished product, A step of measuring the datum of the first semi-finished product through an image acquired through the first vision device; A step of measuring the datum of the second semi-finished product through an image acquired through a second vision device; and A step of stacking the second semi-finished product on the first semi-finished product through a loading device after calculating the correction position using the datum of the first semi-finished product and the datum of the second semi-finished product, A secondary battery stacking method characterized in that, in order to correct shape disturbance of the first semi-finished product during datum measurement of the first semi-finished product, a virtual corner position for the first semi-finished product is calculated using a virtual diagonal angle generated on the inside of the corner on the image of the first semi-finished product.

2. In paragraph 1, A secondary battery stacking method characterized in that the above virtual diagonal line is generated by connecting reference points on each of two intersecting straight lines forming the corner on the image of the first semi-finished product.

3. In paragraph 2, A secondary battery stacking device characterized in that the datum of the first semi-finished product is measured by calculating the positions of four corners.

4. In paragraph 3, A secondary battery stacking method characterized in that the above shape disturbance is caused by bending or sagging of the first semi-finished product.

5. In paragraph 4, A secondary battery stacking method characterized in that the center value of the first semi-finished product is calculated as an x value, a y value, and a twist angle θ value on the xy plane through the datum of the first semi-finished product.

6. In paragraph 1, A secondary battery stacking method characterized in that the datum measurement process of the first semi-finished product is visually displayed by displaying an image of the first semi-finished product and the virtual straight line on the image through a display.

7. In paragraph 1, A secondary battery stacking method characterized by including a step of measuring a datum of the second semi-finished product through an image acquired through the first vision device after stacking the second semi-finished product.

8. In paragraph 7, A secondary battery stacking method characterized by including a step of automatically correcting the offset of the loading device using the datum of the second semi-finished product.

9. In paragraph 8, A secondary battery stacking method characterized in that the above-mentioned automatic offset correction is performed using a moving average through multiple measurements of the datum of the second semi-finished product.

10. In paragraph 1, A secondary battery stacking method characterized in that, when measuring the datum of the second semi-finished product, the corner position for the second semi-finished product is calculated using a virtual intersecting straight line formed at the corner portion on the image of the second semi-finished product.

11. In a secondary battery stacking device that manufactures a finished electrode assembly by stacking a second semi-finished product on a first semi-finished product, A loading station where the first semi-finished product placed on a pallet is transferred and positioned; A first vision device provided in the above loading station and generating an image of the first semi-finished product to measure a datum of the first semi-finished product; A laminating device for laminating the second semi-finished product on the first semi-finished product; and It includes a main controller that measures the datum of the first semi-finished product through the image of the first semi-finished product, A secondary battery stacking device characterized in that the main controller measures the datum by calculating a virtual corner position for the first semi-finished product using a virtual diagonal angle generated on the inside of a corner on an image of the first semi-finished product in order to correct a shape disturbance of the first semi-finished product.

12. In paragraph 11, A secondary battery stacking device characterized in that the above virtual diagonal line is generated by connecting reference points on each of two intersecting straight lines forming the corner on the image of the first semi-finished product.

13. In paragraph 12, The above datum is a secondary battery stacking device characterized in that the positions of four corners are calculated and measured.

14. In paragraph 13, A secondary battery stacking device characterized in that the above shape disturbance is caused by bending or sagging of the first semi-finished product.

15. In paragraph 14, A secondary battery stacking device characterized in that the main controller calculates the center value of the first semi-finished product as an x value, a y value, and a twist angle θ value on the xy plane through the datum of the first semi-finished product.

16. In paragraph 11, A secondary battery stacking device, characterized in that the pallet includes a plurality of supports on which the first semi-finished product is placed and supported, and the plurality of supports support the first semi-finished product except for both ends of the first semi-finished product.

17. In paragraph 11, A loading station where the second semi-finished product is waiting for lamination; and A secondary battery stacking device, characterized in that it comprises a second vision device provided in the loading station and generating an image of the second semi-finished product to measure the datum of the second semi-finished product.

18. In paragraph 17, The above main controller measures the datum of the second semi-finished product, A secondary battery stacking device characterized in that the above-mentioned loading device stacks the second semi-finished product so that the center value of the second semi-finished product and the center value of the second semi-finished product coincide using the datum of the first semi-finished product and the datum of the second semi-finished product.

19. In paragraph 18, A secondary battery stacking device characterized in that the first vision device generates an image of the second semi-finished product in order to re-measure the mounting position of the second semi-finished product after stacking the second semi-finished product.

20. In paragraph 19, A secondary battery stacking device characterized in that the main controller automatically corrects the offset of the loading device through the re-measured mounting position of the second semi-finished product.

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