Method for determining a usability of a measuring device for a machine system by means of an electronic computing device, computer program product, computer-readable storage medium and electronic computing device

Abstract

The invention relates to a method for determining a usability of a measuring device (26) for a machine system (20) by means of an electronic computing device (10), comprising the steps of: providing a digital reference model (12) for a reference measuring device (14) of a reference machine system (16) by means of the electronic computing device (10); specifying a digital model (18) of the machine system (20) by means of the electronic computing device (10); specifying an accuracy value (22) to be maintained for the measuring device (26) by means of the electronic computing device (10); determining an accuracy value (24) for the digital model (18) on the basis of the digital reference model (12) by means of the electronic computing device (10); and determining the usability of the measuring device (26) on the basis of the specified accuracy value (22) and the determined accuracy value (24) by means of the electronic computing device (10). The invention also relates to a computer program product, a computer-readable storage medium and an electronic computer unit (10).

Description

[0001] Description

[0002] Method for determining the applicability of a measuring device for a machine system by means of an electronic computing device, computer program product, computer-readable storage medium and electronic computing device

[0003] The invention relates to a method for determining the applicability of a measuring device for a machine system by means of an electronic computing device according to the applicable patent claim 1. Furthermore, the invention relates to a corresponding computer program product, a corresponding computer-readable storage medium and a corresponding electronic computing device.

[0004] For diagnostic monitoring of rotating components, such as motors, gears, or pumps in trains, power plants, or sewage treatment plants, it is necessary to parameterize an analysis function so that the sensor system used can record and report the condition of the component with high accuracy and precision. Parameterization requires detailed information, such as bearing type, number of balls, number of teeth on the gear, or similar, which is currently only partially available digitally. Data sheets usually exist that provide information about the product. Based on this information, the algorithms and evaluation methods are parameterized locally, for example, theoretically calculating the rollover frequency of the bearing, setting a digital filter, and a threshold value to be monitored. The effort required for monitoring individual components is manageable.From the perspective of plant operators and component manufacturers, it is an insurmountable challenge to parameterize all systems for accurate and precise condition diagnosis.

[0005] A supporting digital image of the products, including all subcomponents, does not exist across the entire product range—for example, over 30,000 variants of geared motors with different couplings, bearing types, keys, motor housing mass and thus stiffness, material parameters, and operating parameters such as speed or load. This means that not all components and their conditions can be monitored diagnostically, as this requires accurate and precise recording of the measured values.

[0006] Sensor systems already exist for monitoring purposes, often parameterized for a specific product or product group, for example, with a small number of variants. This means that special frequency bands or characteristic value methods are selected for the component to be monitored, for example, one characteristic for a first agitator and one characteristic for a second agitator. The parameterization and verification of the parameterized methods using a system test bench, especially for a small number of samples, is carried out by people or manually. Furthermore, the individual components can also be monitored using a data-driven approach. This means that the status quo is recorded, and then any deviation from the installed state – ideally from the healthy state – is detected, known as anomaly detection. If the healthy state is unknown, a relative comparison with sister machines is carried out.An absolute statement about the condition is not possible. It is also possible to train the algorithms using a learning process. However, this requires a large training data set of the healthy and faulty states, which is not possible due to the large number of product variants. This means that only systems exist that focus on the most likely fault scenarios. Furthermore, the sensor systems used, for example, only measure at standardized measuring positions. The peripherals or material characteristics of the components to be monitored are not included in the evaluation; only the performance of, for example, the motors or pumps is considered.

[0007] The object of the present invention is to provide a method, a computer program product, a computer-readable storage medium and an electronic computing device by means of which it can be determined whether a measuring device is applicable to a specific machine system.

[0008] This object is achieved by a method, a computer program product, a computer-readable storage medium, and an electronic computing device according to the independent patent claims. Advantageous embodiments are specified in the subclaims.

[0009] One aspect of the invention relates to a method for determining the applicability of a measuring device for a machine system using an electronic computing device. A digital reference model for a reference measuring device of a reference machine system is provided using the electronic computing device. A digital model of the machine system is specified using the electronic computing device. An accuracy value to be maintained for the measuring device is specified using the electronic computing device. An accuracy value for the digital model is determined using the electronic computing device as a function of the digital reference model, and the applicability of the measuring device is determined using the electronic computing device as a function of the specified accuracy value and the determined accuracy value.

[0010] This makes it possible to check whether the measuring device which was used, for example, in the reference machine system can also be used for a machine system which differs from the reference machine system.

[0011] In particular, the method makes it possible to parameterize a corresponding measuring device that can be used for individual installations, but also has a high level of measurement accuracy and precision for a wide variety of products and applications.

[0012] In particular, this makes it possible to provide a data-based diagnosis, similar to that described in the machinery standard DIN ISO 20816, for example. However, the measuring device can also be mounted at different locations within the machine system to be monitored, since, for example, the transmission of a signal, such as structure-borne sound, from the damage location to the measurement location is taken into account in the diagnostic signal using stored transfer functions. This enables an absolute statement about the damage and thus a prediction of the remaining service life. With standardized solutions, the remaining service life can only be predicted with greater inaccuracy.

[0013] Furthermore, the digital image of individual components stored in a database can offer the additional advantage of taking into account a wide range of products and applications. Every uncertainty of the individual parameters is taken into account, allowing the overall uncertainty of the sensor system or measuring device to be calculated with high precision.

[0014] In other words, it is intended that, based on a reference machine system, a corresponding uncertainty or measurement inaccuracy for the specific machine system can be predicted for a reference measuring device. On the basis of a machine system actually to be used, it is then checked whether the sensor system or the measuring device for the reference machine system can also be used for the actual machine system. For this purpose, it is particularly intended that a digital model for the machine system is created and a measurement inaccuracy or an accuracy value is generated for the measuring device depending on the specified machine system. For this purpose, for example, corresponding differences between the machine system and the reference machine system can be determined, and on this basis the measuring device can then be simulated.If, for example, the measurement accuracy exceeds a threshold value, it can be assumed that the measuring device is not suitable for the machine system. It can then be provided, for example, that a corresponding warning signal is generated so that a user is informed that the measuring device cannot be used for the machine system. For this purpose, a control signal can also be generated, for example to use or create a new reference model so that a new comparison can be carried out. For example, it can then be provided that, depending on the comparison, a search is carried out for a further reference model or a further measuring device, which enables the measuring device to be used accordingly within the specified accuracy value.

[0015] For example, it can be provided that in the event of non-applicability, a control signal is implemented to generate a new reference model taking into account a new measuring device.

[0016] According to an advantageous embodiment, at least one parameter is specified for the machine system, and the digital reference model is adapted to the digital model depending on the parameter. For example, it can be compared that a machine with a first power is provided in the reference model, while another machine with a second power is provided in the machine system. In this case, the power forms the parameter. The reference model can then be adapted accordingly depending on this parameter. The reference model can thus be adapted to the digital model by making appropriate adaptations to the machine's power. The reference model can thus be compared with the digital model. It can then be checked whether the measuring device is suitable for performing a corresponding measurement within the accuracy specification.

[0017] It is also advantageous if the type of damage to a particular component of the machine system is taken into account when determining the accuracy value. For this purpose, a corresponding damage signal can be generated, for example. This can be done based on metrological investigations on test benches, the adoption of measurement results from previous damage scenarios, or through a mathematical description of the damage and derived uncertainties with regard to components. In other words, a healthy state can be provided within the digital model. Furthermore, different damage signals can be provided for different components. Based on these different damage signals, the accuracy value can then be reliably determined.

[0018] A further advantageous embodiment provides that, to determine the accuracy value, the positioning of the measuring device relative to a respective component of the machine system is taken into account. For example, it can be considered whether the measuring device is arranged on a motor housing or on an adjacent housing. In particular, different structure-borne sound signals can be recorded differently. This makes it possible to reliably determine whether the measuring device is usable based on different positioning.

[0019] In particular, it can be provided that a transfer function is determined from the component to the measuring device. To determine the transfer function, for example, a modal analysis and an evaluation of the transfer function between the source of damage and the measurement position, particularly within the reference machine system, can be performed. A simulation of the transfer function can then also be performed using multiphysics software. Parameterization of the simulation model based on information about mass, stiffness, damping, and geometries can also be performed to determine the transfer function.

[0020] Furthermore, it has proven advantageous if a periphery of the machine system is taken into account when determining the accuracy value. For this purpose, it can be provided, for example, that the information from sister installations is used accordingly and that the measurement data is transferred to the target installation. In this case, a modal analysis can also be carried out and the transfer function between the components and the periphery, in particular the reference machine system, can be evaluated. Furthermore, the use of defined foundations and the adoption of the influencing factors from a type measurement, for example the measurement of the defined foundation and the adoption of the metrological properties for the digital image, can be carried out. It is also advantageous if a warning message is generated if it is determined that the measuring device cannot be used.For example, the warning message can be displayed on an output device, such as a screen, of the electronic computing device. This way, a user who wishes to determine the applicability can be informed that the measuring device is not applicable and, for example, conduct a further applicability analysis. This can prevent inapplicable measuring devices from being used for the machine system.

[0021] It is also advantageous if, when a measurement device is determined to be inapplicable, a suitable measurement device is suggested. For example, the appropriate measurement device can then be searched for automatically. In particular, several iterative searches can be performed until a suitable measurement device is found. Thus, a suitable measurement device for the machine system can be found automatically.

[0022] It has also proven advantageous to suggest a different reference model when determining that a measuring device is not applicable. For example, the reference model may be unsuitable for the machine system. In this case, it can be provided that a large number of digital reference models are made available, for example, within a database. If the measurement device is not applicable, the various digital reference models can be reliably simulated with the different measuring devices until a suitable digital reference model is found to verify applicability.

[0023] A further advantageous embodiment provides that the digital reference model is specified based on a component list of the machine system. For example, the machine system can have different components. The component list essentially includes every individual component for the machine system. The digital reference model is then selected and specified accordingly based on the component list. This makes it possible to provide a highly reliable digital reference model, on the basis of which it can in turn be reliably determined whether a corresponding measuring device is applicable. It can also be provided that physical properties and / or chemical properties and / or thermal properties are taken into account in the component list. In particular, the corresponding properties are stored in the component list.This means that the different properties of the components can also be taken into account and it can be reliably determined whether the measuring device is applicable or not.

[0024] It is also advantageous if the accuracy value to be maintained is specified by recording an input from a person. For example, an end user can specify a corresponding accuracy value. A person can then enter the corresponding accuracy value via an input device on the electronic computing device; for example, an accuracy of at least 95 percent is desired. A simulation is now carried out to determine whether the measuring device can maintain the accuracy value of 95 percent. If the accuracy value is maintained, the corresponding measuring device can be provided for the machine system. If, for example, the accuracy value cannot be maintained, a new measuring device can be provided or a new reference model can be used so that the required accuracy value is reliably maintained.

[0025] The method presented is, in particular, a computer-implemented method. Therefore, a further aspect of the invention relates to a computer program product with program code means that, when the program code means are processed by the electronic computing device, cause an electronic computing device to perform a method according to the preceding aspect.

[0026] A further aspect of the invention therefore also relates to a computer-readable storage medium with at least one computer program product according to the preceding aspect.

[0027] Furthermore, the invention also relates to an electronic computing device for determining the applicability of a measuring device for a machine system, wherein the electronic computing device is designed to carry out a method according to the preceding aspect. In particular, the method is carried out by means of the electronic computing device. Advantageous embodiments of the method are to be regarded as advantageous embodiments of the computer program product, the computer-readable storage medium, and the electronic computing device. For this purpose, the electronic computing device has, in particular, material features to enable the execution of corresponding method steps.

[0028] A computing unit / electronic computing device can be understood, in particular, as a data processing device that contains a processing circuit. The computing unit can therefore, in particular, process data to perform computing operations. This may also include operations for performing indexed access to a data structure, for example, a look-up table (LUT).

[0029] The computing unit may, in particular, contain one or more computers, one or more microcontrollers, and / or one or more integrated circuits, for example one or more application-specific integrated circuits (ASICs), one or more field-programmable gate arrays (FPGAs), and / or one or more single-chip systems (SoCs). The computing unit may also contain one or more processors, for example one or more microprocessors, one or more central processing units (CPUs), one or more graphics processing units (GPUs), and / or one or more signal processors, in particular one or more digital signal processors (DSPs). The computing unit may also include a physical or virtual network of computers or other of the aforementioned units.

[0030] In various embodiments, the computing unit includes one or more hardware and / or software interfaces and / or one or more memory units.

[0031] A memory unit can be a volatile data memory, for example a dynamic random access memory (DRAM) or a static random access memory (SRAM), or a non-volatile data memory, for example a read-only memory (ROM), a programmable read-only memory (PROM), an erasable programmable read-only memory (EPROM), an electrically erasable programmable read-only memory (EEPROM), a flash memory or flash EEPROM, a ferroelectric random access memory (FRAM), a magnetoresistive random access memory,MRAM (magnetoresistive random access memory) or phase-change random access memory (PCRAM).

[0032] For use cases or application situations that may arise during the method and which are not explicitly described here, it may be provided that, in accordance with the method, an error message and / or a request to enter user feedback is issued and / or a default setting and / or a predetermined initial state is set.

[0033] Regardless of the grammatical gender of a particular term, persons with male, female or other gender identities are included.

[0034] Further features and combinations of features of the invention will become apparent from the figures and their description, as well as from the claims. In particular, further embodiments of the invention do not necessarily have to contain all features of one of the claims. Further embodiments of the invention may have features or combinations of features not mentioned in the claims.

[0035] Showing:

[0036] FIG 1 shows a schematic block diagram according to an embodiment of the method; and

[0037] FIG 2 shows a schematic diagram according to an embodiment of the method.

[0038] The invention is explained in more detail below using specific exemplary embodiments and associated schematic drawings. In the figures, identical or functionally equivalent elements may be provided with the same reference numerals. The description of identical or functionally equivalent elements may not necessarily be repeated for different figures. FIG. 1 shows a schematic block diagram according to one embodiment of an electronic computing device 10 for implementing a corresponding method.

[0039] In the present exemplary embodiment, a digital reference model 12 for a reference measuring device 14 of a reference machine system 16 is shown. A digital model 18 of a machine system 20 is also shown. An accuracy value 22 to be maintained is also shown. Furthermore, an accuracy value 24 to be determined is shown. The measuring devices can, for example, have one or more sensors.

[0040] In particular, FIG. 1 thus shows an embodiment of the method for determining the applicability of a measuring device for the machine system 20 by means of the electronic computing device 10. The digital reference model 12 for the reference measuring device 14 of the reference machine system 16 is provided. The digital model 18 of the machine system 20 is specified. The accuracy value 22 to be maintained for the measuring device 26 is specified by means of the electronic computing device 10. The accuracy value 24 for the digital model 18 is determined as a function of the digital reference model 12 by means of the electronic computing device 10, and the applicability of the measuring device 26 is determined as a function of the specified accuracy value 22 and the determined accuracy value 24 by means of the electronic computing device 10.

[0041] In particular, it can be provided that at least one parameter 28 is specified for the machine system 18 and the digital reference model 12 is adapted to the digital model 18 as a function of the parameter 28.

[0042] Furthermore, it can be provided that a type of damage to a respective component of the machine system 18 is taken into account to determine the accuracy value 24. Furthermore, a positioning of the measuring device 26 relative to a respective component of the machine system 18 can be taken into account to determine the accuracy value 24. Furthermore, it can be provided that a transfer function from the component to the measuring device 26 is determined for this purpose. Furthermore, a periphery of the machine system 18 can be taken into account when determining the accuracy value 24.

[0043] It can also be provided that a warning message is generated if the measuring device 26 is determined to be inapplicable. Furthermore, if the measuring device 26 is determined to be inapplicable, a suitable measuring device can be suggested. Furthermore, if the measuring device 26 is determined to be inapplicable, a different digital reference model can be suggested.

[0044] It can also be provided that the digital reference model 12 is specified based on a component list of the machine system 18. Furthermore, physical properties and / or chemical properties and / or thermal properties can be taken into account in the component list.

[0045] In particular, FIG. 1 shows the electronic computing device 10, which can be parameterized in such a way that the measuring device 26 can be used for individual installations, but in particular also for a wide variety of products and applications, a high measurement accuracy and precision can be provided.

[0046] In particular, it is provided that a digital image of the system components of the machine system 18, including all subcomponents, and the storage of important information for diagnosis, such as the type of components (e.g., bearings or shafts), component structure, material, thermal properties, component version, manufacturer, and batch, or the like, is known. Each machine system 18 is uniquely identifiable, for example, via a corresponding serial number. The information stored in the digital image is read out by scanning, for example, or manually. Based on this information, standardized methods such as Fourier or envelope analysis are automatically parameterized. These methods are then used for condition diagnosis and display the result in a manner similar to the machine standard DIN ISO 20816.

[0047] The digital image of the system components, including all subcomponents and information regarding structure, material, etc., is initially created using a reference machine system 12, for example, a selected engine with transmission and peripherals combination, and simulated using a suitable simulation environment. The simulation results, for example, the transfer function between location A and location B, are validated and verified using measurement technology on a real setup that corresponds to the reference system.

[0048] If a measuring device is used to monitor the reference machine system 12, its accuracy is determined by the accuracy and precision of the individual pieces of information from the reference system and the sensor system. Accuracy is influenced by the systematic error, i.e., the deviation of the mean value (F) from the true value. Random errors influence this precision (Δy). The smaller the scatter of the measured data around the mean value, the greater the precision of the sensor information. The accuracy of the sensor information can then be described as follows:

[0049] Y = Y + Ay

[0050] Examples of parameters that contribute to the systematic or random uncertainty of the sensor information include the generation of the structure-borne sound signal of a component under investigation, the transfer function, i.e. the transmission path signal origin and measurement option, the signal processing, the periphery and mounting of the sensor, system boundaries and environmental conditions as well as the reference measurement technology.

[0051] The system parameters of the measuring device 26, as well as the signal processing parameters and the uncertainty of the reference measurement technology, can be determined during development and based on an analysis of the measurement uncertainty budget, for example, according to the Guide for Uncertainty Measurement. The contributing uncertainties can be determined, for example, by calibration, by specifying uncertainties in data sheets, or by calibration certificates.

[0052] The additional uncertainties arising from the product and application diversity of the components to be monitored include, for example, the influence of the damage signal from the faulty component or subcomponent on the sensor signal. For example, bearing damage will initially be noticeable through vibration, and later also through thermal effects. This can influence the accuracy of the measuring device 26. Furthermore, the transfer function between the source of damage and the measuring position, for example, motor mass and stiffness, can influence the transfer behavior and thereby amplify or weaken the actual damage signal. This then results in an incorrectly perceived vibration velocity or acceleration as the vibration response of the system. Furthermore, the periphery, i.e., the area of ​​application of the components, can also contribute to generating uncertainties.For example, the hard or soft coupling of the components to the foundation can influence the vibration signals. The uncertainties and the mathematical description of each subcomponent of the reference system or the reference machine system 12, categorized by type, are stored in a database. The parameters for communicating systematic errors and the parameters required for diagnosis, for example, for bearing-specific procedures such as rollover frequencies, are also stored there. Based on the unique identification of the components to be monitored, the stored parameters and functions are read from the database and used to parameterize the mathematical diagnostic procedure. The sensor system reproduces the state of the reference system with the appropriate accuracy.

[0053] If, for example, the motor of the reference machine system 12 is replaced with another motor, for example with a different mass, the achieved measurement accuracy of the sensor system / measuring device 26 with respect to the reference machine system 12 changes. This is illustrated, for example, in FIG. 2. FIG. 2 shows the reference machine system 12, a first machine system 20, and a second machine system 30. In FIG. 2, the abscissa shows, in particular, the difference with respect to the parameter 28, and the ordinate shows the corresponding accuracy 32.

[0054] FIG. 2 thus shows an exemplary visualization of the dependencies of the measurement uncertainties of the measuring devices 26 for a geared motor mass that differs from the reference machine system 12. For the reference machine system 12, a so-called error bar is shown, in particular, which indicates the uncertainty of the reference machine system 12. The point, for example, represents the mean value of the uncertainty, while the two error bars represent the evenly distributed error band around the mean value, the so-called scatter. A change in the mass of an exemplary motor-gearbox-peripheral arrangement compared to the reference machine system 12 causes a reduction in accuracy, as shown, for example, by the first machine system 20 and the second machine system 30.

[0055] In the present case, it is shown in particular that the first machine system 20 is still above the required accuracy value 22, while the second machine system 30 is outside this threshold. Thus, for example, it can be provided that the measuring device 26 can still be used for the first machine system 20, while the measuring device 26 can no longer be used for the second machine system 30. In particular, the uncertainties shown in FIG. 2 demonstrate the potential use of the measuring device 26 as a diagnostic system, which is particularly important and must therefore be characterized accordingly for diagnostic use. The evaluation of these uncertainties, in particular the damage signal, the transfer function, and the peripherals, relative to the reference machine system 12, can be determined using various methods.The damage signal can be determined by metrological investigations on test benches, by adopting measurement results from previous damage scenarios, and by mathematically describing the damage and deriving the uncertainties related to the components. The transfer function can be determined by performing a modal analysis and evaluating the transfer function between the damage source and the measurement position, particularly in the reference machine system 12. Furthermore, a simulation of the transfer function can be performed using multiphysics software. Furthermore, a parameterization of the simulation model can be realized based on information about, for example, mass, stiffness, damping, and geometries. The uncertainty related to the periphery can be determined by using sister installations and transferring the measurement data to the target installation.Furthermore, a modal analysis and the evaluation transfer function between the components and the peripherals can be performed, particularly with respect to the reference machine system 12. Furthermore, the use of, for example, defined foundations and the adoption of influencing factors from a standard measurement, for example, the measurement of a defined foundation and the adoption of the metrological properties for the digital image, can be determined accordingly.

[0056] Depending on the accuracy requirements and the influence of the respective parameter on the variables to be evaluated, the reference machine system 12 can be used with its parameters. If the accuracy deviates too significantly from the reference machine system 12, the inaccuracy is recalculated using the methods mentioned above, and the resulting variables are used to compensate for the systematic errors in the parameterization of the diagnostic procedure.

Claims

Patent claims 1. A method for determining the applicability of a measuring device (26) for a machine system (20) by means of an electronic computing device (10), comprising the steps: - providing a digital reference model (12) for a reference measuring device (14) of a reference machine system (16) by means of the electronic computing device (10); - specifying a digital model (18) of the machine system (20) by means of the electronic computing device (10); - specifying an accuracy value (22) to be maintained for the measuring device (26) by means of the electronic computing device (10); - determining an accuracy value (24) for the digital model (18) as a function of the digital reference model (12) by means of the electronic computing device (10); and - Determining the applicability of the measuring device (26) as a function of the predetermined accuracy value (22) and the determined accuracy value (24) by means of the electronic computing device (10).

2. Method according to claim 1, characterized in that at least one parameter (28) is specified for the machine system (20) and the digital reference model (12) is adapted to the digital model (18) as a function of the parameter (28).

3. Method according to claim 1 or 2, characterized in that for determining the accuracy value (24) a type of damage of a respective component of the machine system (20) is taken into account.

4. Method according to one of the preceding claims, characterized in that for determining the accuracy value (24) a positioning of the measuring device (26) relative to a respective component of the machine system (20) is taken into account.

5. Method according to claim 4, characterized in that a transfer function is determined from the component to the measuring device (26).

6. Method according to one of the preceding claims, characterized in that a periphery of the machine system (20) is taken into account when determining the accuracy value (24).

7. Method according to one of the preceding claims, characterized in that when a determination of non-applicability of the measuring device (26) is made, a warning message is generated.

8. Method according to one of the preceding claims, characterized in that when determining that the measuring device (26) is not suitable, a suitable measuring device is proposed.

9. Method according to one of the preceding claims, characterized in that when determining a non-applicability of the measuring device (26), another digital reference model is proposed.

10. Method according to one of the preceding claims, characterized in that the digital reference model (12) is specified on the basis of a component list of the machine system (20).

11. Method according to claim 10, characterized in that physical properties and / or chemical properties and / or thermal properties are taken into account in the component list.

12. Computer program product with program code means which cause an electronic computing device (10) to carry out a method according to one of claims 1 to 11 when the program code means are processed by the electronic computing device (10).

13. A computer-readable storage medium comprising at least one computer program product according to claim 12.

14. Electronic computing device (10) for determining an applicability of a measuring device (26) for a machine system (20), wherein the electronic computing device (10) is designed to carry out a method according to one of claims 1 to 13.

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