Test terminal for testing electronic components

Abstract

A test terminal (1) for testing electronic components (2, 2a) has at least one gripping device (3) with at least two grippers (5) which are movably mounted in an insulating body (4), wherein each of the grippers (5) comprises gripper ends (9), and the grippers (5) can be moved from a rest position (I) into a working position (II) in the longitudinal direction (LR) of the insulating body (4) by means of a pressure body (6). The test terminal (1) has a spring (7) which presses the grippers (5) of the gripping device (3) into the rest position (I), and the grippers (5) of the gripping device (3) can be moved into the working position (II) against the spring force of the spring (7). In the rest position (I), in which the gripper ends (9) lie substantially one above the other, the gripping device (3) is closed in order to be inserted into a bore (11) of a printed circuit board (2a), and the grippers (5) of the gripping device (3) are pressed into the closed rest position (I) by means of the spring force of the spring (7). In the working position (II), in which the gripper ends (9) are at least partially spread apart, the gripping device (3) is at least partially open in order to electrically contact the bore (11) from the inside by means of the gripper ends (9).

Description

[0001] Test clamp for testing electronic components

[0002] The present invention relates to a test clamp for testing electronic components, wherein the test clamp comprises at least one gripping device with at least two grippers displaceably mounted in an insulating body. The grippers each comprise gripper ends. The grippers are movable from a rest position to a working position by means of a pressure body in a longitudinal direction of the insulating body. The test clamp comprises a spring that presses the grippers of the gripping device into the rest position. The grippers of the gripping device can be moved into the working position against a spring force of the spring.

[0003] DE 19969 50 U discloses a test clamp in which wires with claw-like ends are slidably guided in an insulated tube. In a resting state, the claws are retracted into the interior of the tube and pressed together. Using an actuating head, the wires can be pushed out of the front end of the tube against the force of a spring, thereby opening it up. The wires thus form a gripping device by which another wire can be grasped from the outside. The test clamp also includes a connection for a measuring cable, which is in a conductive connection with the claws. This makes it possible to perform electrical tests on components.

[0004] DE 149 04 89 A1 also discloses a test clamp in which two wires are slidably mounted in an insulating body and can be moved against the force of a spring. The wires thus also form a gripping device and can be either spread apart or overlapped when moved. The ends of the wires are said to have molded extensions or projections that, when opened, form guides to facilitate gripping a wire. A connection for a measuring cable is also provided here for electrical testing.

[0005] The object of the present invention is to propose a test terminal which enables convenient and safe contacting of components to be tested.

[0006] The problem is solved by a test terminal with the features of patent claim 1.

[0007] A test clamp for testing electronic components comprises at least one gripping device with at least two grippers displaceably mounted in an insulating body. The grippers each comprise gripper ends. The grippers can be moved from a rest position to a working position by means of a pressure body in a longitudinal direction of the insulating body. The test clamp has a spring that presses the grippers of the gripping device into the rest position. The grippers of the gripping device can be moved into the working position against the spring force of the spring.

[0008] In the test terminal, it is proposed that the gripping device for insertion into a hole in a printed circuit board be closed in the rest position, with the gripper ends lying substantially one above the other, and with the grippers of the gripping device being pressed into the closed rest position by the spring force of the spring. For electrical contact with the hole from the inside using the gripper ends, the gripping device is at least partially open in the working position, with the gripper ends at least partially spread apart.

[0009] Unlike prior art gripping devices, in which a wire or contact pin is always contacted from the outside by means of the gripping device's clamp, the gripping device according to the invention now makes it possible to electrically contact a hole in a circuit board directly from the inside of the hole using the gripping device without soldering on contact pins. To do this, the gripper ends, which are in the closed rest position and lie one above the other in this position and take up only a small amount of space, are inserted into the hole. The gripper ends can then be spread apart by moving them into the at least partially open working position, in order to establish electrical contact between the gripper ends and the hole. In other words, the holes can be electrically contacted directly using the gripping device.The tests and measurements can then be performed directly with the grippers in the working position, i.e., in the spread-open position. This significantly simplifies the testing of electronic circuits, as the process of soldering contact pins to electrically connect the holes can be completely eliminated. The test clamp is safe to use and easy to operate.

[0010] According to a particularly advantageous embodiment of the test clamp, the grippers can be locked at least in the open working position, in particular by means of a locking device in the working position, in order to fix the grippers electrically conductively within the bore against the spring force. This allows the grippers to be fixed securely and electrically conductively directly within the bore in a particularly advantageous manner. The locking device prevents unwanted retraction of the grippers by the spring. In contrast, conventional test clamps of the prior art are merely opened or spread apart to encompass a wire or a contact pin, which requires the prior soldering of contact pins. However, the measurements are then carried out with the grippers in the closed or almost closed position.

[0011] Furthermore, a second embodiment of a test clamp for testing electronic components is proposed, which comprises at least one gripping device with at least two grippers displaceably mounted in an insulating body, wherein the grippers each comprise gripper ends and wherein the grippers are movable by means of a pressure body in a longitudinal direction of the insulating body from a closed rest position, in which the gripper ends lie substantially one above the other, into an open working position, in which the gripper ends are spread apart. The grippers can be locked in the working position and / or in the rest position. The grippers can thereby be fixed in the working position and / or in the rest position, which facilitates handling of the test clamp.For example, the gripper ends can be secured against accidental slipping when they are in the open working position and contacting an element to be tested, such as a contact pin or a hole in a circuit board. This is particularly advantageous when the grippers are moved into the working position against the force of a spring. It should be noted that the working position does not necessarily correspond to a fully spread position of the gripper ends. The gripper ends can also be only partially spread in the working position.

[0012] Furthermore, in both designs, the gripper ends can also be locked in the rest position, where they lie essentially flat against one another and require only a small amount of space. This can be advantageous, for example, if the gripper ends are not fully retracted into the insulating body in the rest position or if, for example, in the second design, the grippers are pushed from the rest position into the working position by the force of a spring. For example, particularly in the first design, locking the grippers in the rest position can facilitate threading the gripper tip into a hole in a circuit board.

[0013] "Locking" refers to a fixation that must be actively released or unfastened. Locking can also be achieved, for example, by connecting the pressure body and the insulating body with a thread or other locking device.

[0014] In particular, it is advantageous if the grippers can be locked in the working position and / or in the rest position by means of a locking device. It is particularly advantageous if the grippers can be locked in the working position by means of the locking device.

[0015] For example, in the second embodiment, the grippers are fixed in an open working position by the locking device, making it easier to grasp a thicker wire or another electronic component to be tested. As soon as the wire or component is grasped, the locking device can be released, whereby the gripper closes due to the spring force and grasps the wire or component. The grippers are then urged towards the rest position by the spring. The tests and measurements are then carried out with the locking device released. The gripping of wires or contact pins can be made easier by the locking device, since it is necessary to constantly actuate the pressure piece while picking up the components to be tested. This makes it easier to operate the test clamp. However, it is also possible in this case, for example,For boards, it is necessary to solder contact pins in order to grasp them with the gripping device of the test clamp.

[0016] It is advantageous, particularly in the first embodiment, if the insulating body can be moved counter to the spring force in the direction of the pressure piece in order to move the grippers of the gripping device from the rest position to the working position. In this way, after the hole has been contacted by the grippers of the gripping device, the position of the gripping device can be kept constant while the grippers are moved into the working position. In other words, the gripping device remains in electrical contact with the hole because only the insulating body is moved relative to the pressure piece. In contrast, in prior art gripping devices, the position of the insulating body is kept constant and the grippers of the gripping device are actuated together with an actuating piece. Thus, in the prior art, contact with the electronic component to be tested can be lost simply due to the stroke of the gripping device.

[0017] It is particularly advantageous if the grippers are made of spring steel. Due to the spring action of the spring steel, the gripper ends are further spread apart in the working position, which further improves the electrical contact.

[0018] Furthermore, it is advantageous if the gripper ends each have a contact area for the hole in a circuit board. By forming a defined contact area at the gripper ends, the grippers can be fixed particularly well in the hole in a circuit board by means of the locking device. The contact area preferably has a maximum length of 1.8 mm, more preferably a maximum length of 1.7 mm. This enables common circuit boards with a thickness of, for example, 1.55 mm - 1.6 mm to be contacted well. However, other dimensions of the contact area are also conceivable. For example, for thicker circuit boards the contact area can also have a maximum length of 2.6 mm or 3.5 mm. Contacting a hole in a circuit board from the inside using the grippers of a test terminal is not possible with previous test terminals of the prior art and has not been known to date.A test clamp with grippers having such a contact area therefore also has independent inventive significance.

[0019] The following embodiments of grippers or gripper ends, which correspond to claims 5-8, also allow or facilitate contacting a hole in a printed circuit board from the inside and therefore have inventive significance. It is also advantageous if the gripper ends, in the rest position, extend essentially parallel to the longitudinal direction of the insulating body and preferably lie parallel to one another. They thus take up minimal space in the rest position, which, for example, enables the gripper ends to be pulled into the insulating body or threaded into a hole in a printed circuit board.

[0020] It is also advantageous if the gripper ends each have a contact shoulder, which interacts with a mouth opening of the insulating body in the rest position and holds the gripper ends in the rest position against the spring force. The contact shoulder prevents the gripper ends from being retracted too far into the insulating body by the spring, which would make threading them into a hole in a circuit board more difficult.

[0021] It is also advantageous if the gripper ends each have an outward-facing extension, particularly one that protrudes at right angles from the gripper ends. These extensions can engage behind the back of the circuit board in the working position, thus helping to ensure that the gripping device is securely fixed within the hole in the circuit board.

[0022] It is also advantageous if the extensions of the gripper ends form a gripper tip with a maximum width of 1 mm, preferably 0.8 mm, in the rest position. Typical printed circuit board holes have a diameter of approximately 1 mm, so the gripper tip formed by the two extensions of the gripper ends can still be easily inserted into the hole with these dimensions.

[0023] Accordingly, it is advantageous if the extensions each have a length of less than 5 mm, preferably less than 4 mm, and particularly preferably less than 3.5 mm. The gripper tip formed by the extensions of the two gripper ends thus has the aforementioned width of less than 1 mm. Nevertheless, the two extensions are long enough to grip behind the rear of the circuit board, thereby ensuring a positive fit of the test terminal in the circuit board hole.

[0024] It is also particularly advantageous if the opening direction of the gripper tip extends in the width direction of the test terminal. This facilitates the design of the test terminal as a multiple terminal or the assembly of several test terminals.

[0025] It is also advantageous if the locking device is designed as a latching device and, in particular, includes a spring-loaded latching hook that interacts with a latching shoulder. This allows the locking device to be conveniently actuated and reliably secures the grippers in the working position. The locking device can be actuated particularly advantageously at the same time as the pressure body is actuated, thus transferring the grippers to the working position.

[0026] It is advantageous if the spring-loaded locking hook is arranged on the insulating body and the locking shoulder is arranged on the pressure body. This ensures that the locking device is well protected and, at the same time, does not hinder the operation of the test clamp. However, a reverse arrangement with the locking shoulder on the insulating body and the locking hook on the base body is also conceivable.

[0027] It is also advantageous if the locking device further comprises a release device for releasing the locking mechanism. The release device enables convenient and ergonomic one-handed operation when releasing the locking device. This eliminates the need to release the locking device itself, for example, by manually bending the spring-loaded locking hook. It is also advantageous if the release device comprises a release means, preferably a release lever, with the release lever preferably being arranged on the pressure body. The release device can thus be conveniently actuated with one hand, for example, using the thumb.

[0028] However, the release mechanism does not necessarily have to be designed as a release lever. A release button is also conceivable. It is also possible for the release button to simultaneously form the locking mechanism. The locking mechanism could, for example, also comprise a spring-loaded button arranged on the insulating body and interacting with a recess in the pressure piece. In the working position, in which the locking mechanism is activated, the spring-loaded button penetrates the recess in the pressure piece. By pressing the spring-loaded button, which thereby simultaneously forms the release mechanism, the button is pushed back out of the recess in the pressure piece, thereby releasing the locking mechanism.

[0029] It is also advantageous if the width of the gripper tip extends in the same width direction as the insulating body and / or the pressure body. This allows for the arrangement of several test clamps next to each other or the simultaneous contacting of several holes with several test clamps.

[0030] It also offers advantages if the test terminal is designed as a single terminal with a maximum height of 2.54 mm. On common circuit boards, the hole spacing is usually 2.54 mm. This makes it possible to contact two adjacent holes with two test terminals arranged side by side.

[0031] It is also advantageous if the test terminal has at least one connecting device for connecting to at least one other test terminal. This also facilitates contacting multiple adjacent holes, whereby the aforementioned maximum height of 2.54 mm also allows contacting of holes directly adjacent to one another. This simplifies handling of the multiple test terminals, as they can be operated together thanks to the connecting device.

[0032] Preferably, the connecting device is arranged on the pressure body, as this usually offers more space for arranging a connecting device. However, it is also conceivable to arrange the connecting device on the insulating body.

[0033] It is also advantageous if the connecting device includes at least one plug-in pin designed to interact with a socket of another test terminal. The plug-in pin and the socket are preferably arranged on two opposite sides of the base body of a test terminal. Thus, each test terminal can be connected to additional test terminals on both sides.

[0034] According to another embodiment, the connecting device includes at least one guide element that can be inserted into a guide groove of another test terminal. The guide element and the guide groove are also preferably arranged on two opposite sides of the pressure piece.

[0035] According to a further embodiment, it is advantageous if the connecting device is designed as a locking device. This can, for example, also include a spring-loaded locking hook and a locking shoulder.

[0036] According to another advantageous development, the test terminal is designed as a multiple terminal and has several gripping devices arranged side by side, which can be operated together. This makes handling of the test terminal easier than with several individual terminals. For example, a multiple terminal can contain 2, 4, 6, or 8 gripping devices. Preferably, the multiple terminal has a common insulating body and / or a common pressure body for the multiple gripping devices. This also makes it easier to accommodate the multiple gripping devices in a confined space.

[0037] It is also advantageous if the gripping devices of the multiple terminal block are spaced at a distance of 2.4 mm - 2.6 mm, especially 2.54 mm. This also enables simultaneous contact with several adjacent holes on a circuit board.

[0038] Further advantages of the invention are described in the following exemplary embodiments. They show:

[0039] Figure 1 is a schematic, sectional view of a test terminal according to a second embodiment in a rest position,

[0040] Figure 2 is a schematic, sectional view of the test terminal of Figure 1 in a working position,

[0041] Figure 3 is a schematic detailed view of the grippers of a test clamp according to a first embodiment in a working position,

[0042] Figure 4 is a schematic, fragmentary view of a test terminal according to a first embodiment in a working position,

[0043] Figure 5 is a schematic, broken-away view of a test terminal according to an alternative first embodiment in a working position, Figure 6 is a schematic, sectional view of a test terminal according to the alternative first embodiment in a working position,

[0044] Figure 7 is a schematic, sectional view of the test terminal of Figure 6 in a rest position,

[0045] Figure 8 is a schematic, sectional view of a locking device of a test terminal with a release device,

[0046] Figure 9 is a schematic, sectional view of a locking device of a test terminal with a release device according to a further embodiment,

[0047] Figure 10a is a schematic side view of two test terminals designed as individual terminals with a connecting device,

[0048] Figure 10b is a schematic side view of the two test terminals of Figure 10a in a connected state,

[0049] Figure 11 is a schematic side view of two test terminals designed as individual terminals with a connecting device according to a further embodiment,

[0050] Figure 12 is a schematic side view of a test terminal designed as a multiple terminal according to a first embodiment,

[0051] Figure 13 is a schematic side view of a test terminal designed as a multiple terminal according to a further embodiment,

[0052] Figure 14 is a perspective view of an insulating body of a test terminal with a connecting device, Figure 15 is a perspective view of a pressure body of a test terminal with a connecting device,

[0053] Figure 16 is a perspective view of a contact plate, and

[0054] Figure 17 is a schematic, fragmentary view of a gripper.

[0055] In the following description of the exemplary embodiments, identical features or features that are at least comparable in their design and / or mode of operation are provided with the same reference numerals. Furthermore, these features are only explained in detail when they are first mentioned, while the following exemplary embodiments only address the differences from the previously described exemplary embodiments. Furthermore, for reasons of clarity, often only one or a few of several identical components or features are labeled.

[0056] Figure 1 shows a schematic, sectional view of a test clamp 1 according to a second embodiment in a rest position I. The test clamp 1 has, in a manner known per se, two grippers 5 which are mounted in an insulating body 4 so as to be displaceable along a longitudinal direction LR of the test clamp 1. The direction of displacement of the grippers 5 thus defines the longitudinal direction LR of the test clamp 1. The grippers are likewise formed in a manner known per se from a wire or spring strip steel and each have gripper ends 9 and form a gripping device 3. The gripper ends 9 are formed by an end-side fold or an end-side shoulder of the grippers 5 and run at least partially at an angle to the grippers 5, which otherwise extend essentially in the longitudinal direction LR. The grippers 5 are connected to a pressure body 6 via a holder 27. F 1 .In order to actuate the test clamp 1 and to move the grippers 5 from the rest position I shown here to the working position II shown in Figure 2, pressure is exerted on the pressure body 6 in the direction of the arrow in a likewise known manner, whereby the two grippers 5 are pushed out of an opening 13 of the insulating body 4 in the direction of the arrow against the force of the spring 7. The test clamp 1 is well suited for one-handed operation, with the index finger and middle finger supporting themselves on the insulating body 4 and thus the pressure body 6 can be actuated with the thumb. The support area for the index and middle fingers, not shown here, extends in the present example in the width direction BR, which extends perpendicular to the longitudinal direction LR and which also indicates the direction of the larger dimensions of the test clamp 1. In contrast to the illustration shown, a round design of the test clamp 1 would also be possible in principle.

[0057] In the rest position I shown here, the two gripper ends 9 lie essentially one above the other and, at least in the present example, are retracted into the insulating body 4. The two gripper ends 9 together form a gripper tip 15 at their frontmost end facing away from the holder 27.

[0058] The test terminal 1 further comprises a locking device 8, which in this case is designed as a latching device 25 and includes a resilient latching hook 16 and a latching shoulder 17. In this case, the latching shoulder 17 is fixed, but it could also be resilient. According to the present example, the resilient latching hook 16 is arranged on the insulating piece, and the latching shoulder 17 is arranged on the pressure body 6.

[0059] Figure 2 now shows the test clamp 1 of Figure 1 in working position II. As can be seen, the gripping device 3 is open in working position II, i.e., the gripper ends 9 are spread apart in the open working position II. By actuating the pressure body 6 in the longitudinal direction LR, the locking device 8 is also actuated at the same time, causing the spring-loaded latching hook 16 to slide over the latching shoulder 17 and come into contact behind it. The grippers 5 or the gripping device 3 are thus fixed in the open working position II, so that the test clamp 1 can be handled without the pressure body 6 having to be further actuated by the operator.

[0060] The test terminal 1 shown in Figures 1 and 2, however, is only suitable for gripping a wire or contact pin. This means that this test terminal 1 can only be used if contact pins have previously been soldered to the circuit board 2a. In contrast, the test terminals 1 shown in the following figures have the great advantage that they can be inserted directly into a hole 11 of a circuit board 2a and can directly electrically contact the hole 11. This eliminates the need to solder contact pins to the circuit board 2a, which represents a significant labor saving and time-saving measure.

[0061] Figure 3 now shows a schematic representation of two grippers 5 in a working position II, which can be used in a particularly advantageous manner for contacting a bore 11 (see Figure 4) of a printed circuit board 2a (see Figure 4) in a test terminal of the first embodiment. This embodiment of the grippers 5 therefore has independent inventive significance, which also applies to the embodiment in Figure 4. As already described, the gripper ends 9 are also angled, at least in part, relative to the extension of the grippers 5 according to the illustration shown here. The gripper ends 9 have a contact area 10 for the bore 11 of a printed circuit board 2a. This allows electrical contact to be made with the bore 11 in a favorable manner. In order to reliably and securely fix the gripping device 3 or the test terminal 1 in the bore 11, the gripper ends 9 each have a radially outward-pointing extension 14.

[0062] Furthermore, according to the present illustration, the gripper ends 9 also have a contact shoulder 12, which in the rest position I interacts with the mouth opening 13 of the insulating body 4 and thereby holds the gripper ends 9 in the rest position I. The grippers 5 are preferably designed to be resilient, at least in the region of the gripper ends 9. The gripper ends 9 are thus held under pretension in the rest position I (not shown here) and, due to the resilient design, are automatically pushed apart in the working position II shown here. The functioning of a test clamp 1 with grippers 5 designed in this way is explained below with reference to Figure 5.

[0063] Figure 5 shows a schematic, fragmentary view of a test terminal 1 according to a first embodiment with grippers 5 in a working position II. As can be seen, the contact area 10 lies closely against the inner groove of the bore 11 (see Figure 3), thereby establishing an electrical contact. At the same time, the extensions 14 also extend behind the rear side of the circuit board 2a, whereby the test terminal 1 or the gripping device 23 is positively secured to the bore 11 of the circuit board 2a.

[0064] Figure 4, in contrast, shows only a slightly modified version of a test terminal 1 according to a first embodiment, which is also shown in a schematic, sectioned, and broken-away view. The test terminal 1 and the grippers 5 are also in working position II. However, unlike the version in Figure 5, the gripper ends 9 shown here do not have extensions 14. By means of the contact area 10, the grippers 5 are nevertheless securely arranged in the bore 11 of the circuit board 2a.

[0065] Figure 4 also shows the length L1 of the contact area 10. This is preferably somewhat greater than the thickness of the circuit board 2a and, for example, for conventional circuit boards 2a with a thickness of 1.6 mm, has a length L1 of a maximum of 1.8 mm. This naturally also applies to the embodiment according to Figure 5. In contrast, Figure 5 shows a length L2 of an extension 14. The length L2 is preferably less than 0.5 mm in order to enable problem-free threading into the hole 11 of the circuit board 2a. A length L2 of, for example, 0.3 mm or 0.35 mm is also sufficient to securely grip the rear of the circuit board 2a.

[0066] The functioning of the locking device 8 of the test terminal 1 according to the first embodiment (Fig. 4) as well as of the test terminal 1 according to the first, alternative embodiment (Fig. 5) is also described below with reference to Figures 6 and 7.

[0067] Figure 6 shows a schematic, sectional view of a test clamp 1 with grippers 5 according to Figure 3 in a working position II, in which the gripper ends 9 are spread apart. As can be seen, the locking device 8 is actuated, so that the grippers 5 are fixed in the working position 2.

[0068] In contrast, Figure 7 shows the test terminal 1 of Figure 6 in the rest position I. As can be seen, the gripper ends 9, or more precisely, the contact area 10 of the gripper ends 9, extend essentially parallel to the longitudinal direction LR of the test terminal 1. As a result, the two extensions 14, which are not labeled here for reasons of clarity, protrude approximately at right angles from the gripper ends 9, at least according to the present example. It is understood that angles deviating from 90° are also possible, as long as secure gripping behind the circuit board 2a is enabled. The extensions 14 thus form a gripper tip 15 which has a maximum width B1 of 1 mm or less. This makes it possible to insert the test terminal 1 with the grippers 5 in the rest position I into the bore 11 of a circuit board 2a in order to contact it from the inside.Furthermore, it can be seen that the contact shoulders 12, which are also not labeled here for reasons of clarity, are supported on the mouth region 13 of the insulating body 4. This prevents, on the one hand, the gripper ends 9 from being pulled further into the insulating body 4 by the spring 7 in the rest position. The grippers 5 or the gripper ends 9 are thus also fixed in the rest position I. On the other hand, the contact shoulders 12 also simultaneously hold the contact regions 10 essentially in the longitudinal direction LR and parallel to one another.

[0069] The locking device 8 is not activated in the rest position I shown here. Now, as also shown in Figure 7, the gripper ends 9 have been inserted into the bore 11, the grippers 5 can be transferred into the working position II shown in Figure 6 by applying pressure in the direction of the arrow to the pressure body 6, whereby the locking device 8 is also actuated at the same time.

[0070] Figure 8 shows a schematic, sectional view of a locking device 8 of a test terminal 1 with a release device 18. The release device 18 includes a release lever 19, which in this case is also arranged on the pressure body 6. As can be seen, the locking device 8 can be released by pressing on the pressure-piece-side end of the release lever 19, by lifting the resilient latching hook 16 from the latching shoulder 17. An advantage of this design is that the release device 18 also allows one-handed operation, for example, with the thumb.

[0071] Figure 9, in contrast, shows another embodiment of a release device 18. Shown again is a schematic, sectional view of a locking device 8 of a test terminal 1. The present release device 18 also includes a release lever 19. However, this is not arranged on the pressure body 6, but on the insulating body 4. The release lever 19 is a radially outward-pointing extension of the insulating body 4. This can, for example, be moved under with the thumb or pressed upwards in order to release the locking hook 16 from the locking shoulder 17.

[0072] Figure 10a also shows a schematic side view of two test terminals 1 designed as individual terminals with a connecting device 20. By means of the connecting device 20, two or more individual terminals can be connected, whereby the individual terminals are arranged next to one another in a very small space and thus also adjacent holes 11 of a printed circuit board 2a (not shown here) can be contacted. The connecting device 20 in the present case contains two plug pins 21 arranged in the region of a side surface 28 of the pressure body 6. These can interact with plug sockets 22, also arranged in the region of a side surface 28 of the pressure body 6 of another test terminal 1. The second test terminal 1, shown on the right in the image, is provided with a cutout to expose the plug sockets 22.

[0073] Figure 10b shows a schematic side view of the two test terminals 1 of Figure 10a in a state connected by means of the connecting device 20. As can be seen, the two test terminals 1 shown and connected to each other thus form a unit, whereby the test terminals 1 can also be operated together. The test terminals 1 preferably have at least one, but preferably two, plug-in pins 21 on one of their side surfaces 28 and at least one, but preferably two plug-in sockets 22 on the opposite side surface 28. This allows each test terminal 1 to be connected to another test terminal 1 on both sides.

[0074] Figure 10b also shows an overall height H of the test terminal 1. In order to be able to contact directly adjacent holes 11 of a printed circuit board 2a, it is advantageous if the overall height H is a maximum of 2.54 mm. The gripping devices 3 of the test terminals 1, which are not visible here, therefore have a distance A (see Figure 11) of approximately 2.54 mm, which corresponds to the distance between the holes 11 of common printed circuit boards 2a. In order not to exceed the overall height of 2.54 mm even with the grippers in the working position, it is advantageous if the opening direction of the grippers 5 extends in the width direction BR of the individual test terminal 1, as shown in Figures 6 and 7. If the grippers 9 are made of spring steel together with the holder 27, this can be achieved, for example, by rotating the grippers 9 by 90° relative to the holder 27.

[0075] Figure 11 shows a schematic side view of two test terminals 1 designed as individual terminals with a connecting device 20 according to a further embodiment. The connecting device 20 includes a guide element 23, which in this case is also arranged in the region of a side surface 28 and interacts with a guide groove 24 of another test terminal 1.

[0076] It is understood that in this embodiment, the test terminals 1 can also have a guide element 23 on one of their side surfaces 28 and a guide groove 24 on the other, opposite side surface 28. This again makes it possible to connect each test terminal 1 on both sides to another test terminal 1. This also applies to the following versions of test terminals in Figures 12 and 13.

[0077] Figure 12 also shows a schematic side view of a test terminal 1 designed as a multiple terminal 26 according to a first embodiment. The present multiple terminal 26 has a common pressure body 6 for the multiple gripping devices 3. The gripping devices 3 can be actuated jointly by means of the common pressure body 6. However, the individual gripping devices 3 are arranged in separate insulating bodies 4. The distance A between the gripping devices 3 arranged next to one another in the test terminal 1 is preferably again approximately 2.54 mm to enable contacting of directly adjacent bores 11.

[0078] Figure 13, in contrast, shows a schematic side view of a test clamp 1 designed as a multiple terminal 26 according to another embodiment. In contrast to the embodiment shown in Figure 12, the test clamp 1 has not only a common pressure body 6, but also a common insulating body 4 for the multiple gripping devices 3.

[0079] Figure 14 shows a perspective view of a test terminal 1 with a connecting device 20. In this case, only the insulating body 4 of the test terminal 1 is shown. The test terminal 1 is also designed to be connected to another test terminal 1 to form a multiple terminal and for this purpose has a connecting device 20. The connecting device 20 includes two dovetail-like guides arranged on the insulating body 4 of the test terminal 1, which engage in grooves (not shown here) of another test terminal 1. The test terminal 1 also has a stop 29, which is guided in a recess 30 of the associated pressure body 6 (see Figure 15) and corresponds or interacts with a stop 29 of the pressure body 6. This can prevent the connecting devices 20 of the interconnected test terminals 1 from being accidentally released when the test terminals 1 are actuated.

[0080] Furthermore, Figure 14 also shows the locking device 8 (the lower of the two locking devices 8), by means of which the grippers 5 (not shown here) can be locked in the open working position I (not visible here). The test clamp 1 shown here has a second locking device 8, which holds the test clamp 1 together in the rest position II (not visible here) or, after assembly of the test clamp 1, holds the interconnected parts of the test clamp 1, in particular the pressure body 6 and the insulating body 4, together.

[0081] Furthermore, a receptacle 31 is formed on the test terminal 1, which accommodates one or more contact plates 32 (see Figure 16) and positions them during assembly. This further simplifies the assembly of the test terminal 1.

[0082] Figure 15 shows a perspective view of the corresponding pressure body 6, which has a recess 30 with a stop 29 for the stop 29 of the insulating body 4. Furthermore, the pressure body 6 has internally located locking shoulders 17 for locking hooks 16 of the locking devices shown in Figure 14.

[0083] Figure 16 shows a perspective view of a contact plate 32, which electrically contacts one of the grippers 5 (see Figure 17) and is arranged inside the test terminal 1. The contact plate 32 also functions as a holder 27 for the gripper 5. With its lower region 33, such a contact plate 32 can be placed in the recess 30 of the insulating body 4 (see Figure 14) and can be correctly positioned during assembly. This facilitates the assembly of the test terminal 1. The contact plate 32 has a guide pin 34, which can engage in a recess 36 of a gripper 5, shown broken away in Figure 17. The gripper ends 9 are not shown. Furthermore, the contact plate 32 has a tab 35, which serves to connect to another contact plate 32, which contacts the second gripper 5 of the gripping device 3 (not shown here).

[0084] Figure 17 is a schematic, fragmentary view of a gripper 5 which, as described above, has a recess 36 for the engagement of a guide pin 34 of a contact plate 32. By designing a contact plate 32 and a gripper 5 as shown in Figures 16 and 17, it is possible to pre-assemble the two grippers 5 with the contact plates 32 into a unit and insert them into the insulating body 4 (see Figure 14). After inserting the spring 7 (not shown here), all that remains is to put the pressure body 6 (see Figure 15) on and press it slightly against the insulating body 4 until the second locking device 8 (see Figure 14) clicks into place. In this embodiment, too, the spring is preferably arranged between the insulating body 4 and a holder 27, here the contact plate 32, of the gripper 5.The design of the test terminal 1 according to Figures 14 to 17 not only facilitates the assembly of the test terminal 1, but also provides a secure electrical contact of the grippers 5 via the contact plates 32.

[0085] The design of a test clamp 1 according to Figures 14 to 17 is also advantageous regardless of the design and linkage of the grippers 5 and regardless of a locking device. It can also be advantageously used with prior art test clamps and therefore has independent inventive significance.

[0086] The present invention is not limited to the illustrated and described embodiments. Modifications within the scope of the claims are also possible.

[0087] List of reference symbols

[0088] 1 test terminal

[0089] 2 electronic components

[0090] 2a circuit board

[0091] 3 gripping device

[0092] 4 insulating bodies

[0093] 5 grippers

[0094] 6 pressure hulls

[0095] 7 spring

[0096] 8 locking device

[0097] 9 Gripper end

[0098] 10 Investment area

[0099] 11 Hole

[0100] 12 Investment shoulder

[0101] 13 Mouth opening

[0102] 14 Extension

[0103] 15 Gripper tip

[0104] 16 locking hooks

[0105] 17 locking shoulder

[0106] 18 Release device

[0107] 19 Release lever

[0108] 20 connecting device

[0109] 21 plug pin

[0110] 22 socket

[0111] 23 Guide element

[0112] 24 guide groove

[0113] 25 locking device

[0114] 26 multiple terminal

[0115] 27 holders

[0116] 28 Side surface 29 Stop

[0117] 30 recess

[0118] 31 recording

[0119] 32 Contact plate

[0120] 33 lower area

[0121] 34 guide pins

[0122] 35 tab

[0123] 36 recess

[0124] I Resting position

[0125] II Working position

[0126] L1 Length of the installation area

[0127] L2 Length of the process

[0128] B1 Width of the gripper tip

[0129] LR longitudinal direction

[0130] BR latitude direction

[0131] A distance

[0132] H Height

Claims

a t e n t a n s p r ü c h e 1. Test clamp (1) for testing electronic components (2, 2a), wherein the test clamp (1) has at least one gripping device (3) with at least two grippers (5) displaceably mounted in an insulating body (4), wherein the grippers (5) each comprise gripper ends (9), wherein the grippers (5) are movable by means of a pressure body (6) in a longitudinal direction (LR) of the insulating body (4) from a rest position (I) to a working position (II), wherein the test clamp (1) has a spring (7) which presses the grippers (5) of the gripping device (3) into the rest position (I), and wherein the grippers (5) of the gripping device (3) are movable into the working position (II) against a spring force of the spring (7), characterized in that the gripping device (3) is closed in the rest position (I) for insertion into a bore (11) of a printed circuit board (2a),wherein the gripper ends (9) lie substantially one above the other and wherein the grippers (5) of the gripping device (3) are pressed into the closed rest position (I) by the spring force of the spring (7), and that the gripping device (3) is at least partially open in the working position (II) for electrically contacting the bore (11) from the inside by means of the gripper ends (9), wherein the gripper ends (9) are at least partially spread apart.

2. Test terminal (1) according to the preceding claim, characterized in that the grippers (5) can be locked at least in the open working position (II), in particular by means of a locking device (8) in the working position (II) in order to fix the grippers (5) in an electrically conductive manner within the bore (2a) against the spring force.

3. Test terminal (1) for testing electronic components (2, 2a), wherein the test terminal (1) has at least one gripping device (3) with at least two grippers (5) displaceably mounted in an insulating body (4), wherein the grippers (5) each comprise gripper ends (9), wherein the grippers (5) are movable by means of a pressure body (6) in a longitudinal direction (LR) of the insulating body (4) from a closed rest position (I), in which the gripper ends (9) lie substantially one above the other, into an open working position (II), in which the gripper ends (9) are spread apart, characterized in that the grippers (5) are lockable in the working position (II) and / or in the rest position (I), in particular can be locked in the working position (II) by means of a locking device (8).

4. Test clamp (1) according to one of the preceding claims, characterized in that for moving the grippers (5) of the gripping device (3) from the rest position (I) to the working position (II) of the insulating bodies (4) can be moved against the spring force in the direction of the pressure piece (6).

5. Test terminal (1) according to one of the preceding claims, characterized in that the gripper ends (9) each have a contact area (10) for the bore (11) of the printed circuit board (2a), wherein the contact area (10) preferably has a length (L1) of a maximum of 1.8 mm, preferably a maximum of 1.7 mm.

6. Test terminal (1) according to one of the preceding claims, characterized in that the gripper ends (9), in particular the contact area (10) of the gripper ends (9), extend in the rest position (I) substantially parallel to the longitudinal direction (LR) of the insulating body (4) and preferably lie parallel one above the other.

7. Test terminal (1) according to one of the preceding claims, characterized in that the gripper ends (9) each have a contact shoulder (12) which, in the rest position (I), cooperates with an opening (13) of the insulating body (4) and holds the gripper ends (9) in the rest position (I) against the spring force.

8. Test terminal (1) according to one of the preceding claims, characterized in that the gripper ends (9) each have an outwardly pointing extension (14), in particular projecting at right angles from the gripper ends (9), wherein preferably the extensions (14) of the gripper ends (9) in the rest position (I) a gripper tip (15) with a maximum width (B1) of 1 mm, preferably with a maximum width (B1) of 0.8 mm.

9. Test terminal (1) according to one of the preceding claims, characterized in that the locking device (8) is designed as a latching device (25) and in particular includes a resilient latching hook (16) which interacts with a latching shoulder (17), wherein preferably the resilient latching hook (16) is arranged on the insulating body (4) and the latching shoulder (17) is arranged on the pressure body (6).

10. Test terminal (1) according to one of the preceding claims, characterized in that the locking device (8) further comprises a release device (18) for releasing the locking device (8).

11. Test terminal (1) according to one of the preceding claims, characterized in that the release device (18) has a release means, preferably a release lever (19), wherein the release lever (19) is preferably arranged on the pressure body (6).

12. Test terminal (1) according to one of the preceding claims, characterized in that the width (B1) of the gripper tip (15) extends in a width direction (BR) of the insulating body (4) and / or the pressure body (6).

13. Test terminal (1) according to one of the preceding claims, characterized in that the test terminal (1) is designed as a single terminal and has a maximum height (H) of 2.54 mm.

14. Test terminal (1) according to one of the preceding claims, characterized in that the test terminal (1) has at least one connecting device (20) for connection to at least one further test terminal (1), wherein the connecting device (20) is preferably arranged on the pressure body (6).

15. Test terminal (1) according to one of the preceding claims, characterized in that the test terminal (1) is designed as a multiple terminal (26) and has a plurality of gripping devices (3) arranged next to one another, which can be actuated together, wherein preferably the multiple terminal (26) has a common insulating body (4) and / or a common pressure body (6) for the plurality of gripping devices (3).

16. Test terminal (1) according to one of the preceding claims, characterized in that the gripping devices (3) of the multiple terminal (26) each have a distance (A) of 2.4 mm - 2.6 mm, in particular of 2.54 mm.

Images