A test terminal (1) for testing electronic components (2, 2a) has at least one gripping device (3) with at least two
grippers (5) which are movably mounted in an insulating body (4), wherein each of the
grippers (5) comprises gripper ends (9), and the
grippers (5) can be moved from a
rest position (I) into a working position (II) in the longitudinal direction (LR) of the insulating body (4) by means of a pressure body (6). The test terminal (1) has a spring (7) which presses the grippers (5) of the gripping device (3) into the
rest position (I), and the grippers (5) of the gripping device (3) can be moved into the working position (II) against the
spring force of the spring (7). In the
rest position (I), in which the gripper ends (9) lie substantially one above the other, the gripping device (3) is closed in order to be inserted into a bore (11) of a
printed circuit board (2a), and the grippers (5) of the gripping device (3) are pressed into the closed rest position (I) by means of the
spring force of the spring (7). In the working position (II), in which the gripper ends (9) are at least partially spread apart, the gripping device (3) is at least partially open in order to electrically contact the bore (11) from the inside by means of the gripper ends (9).