Test device and system for terminal card reader, and electronic device

Abstract

The present application can be used in the technical field of terminal card readers, and provides a test device and system for a terminal card reader, and an electronic device. The test device for a terminal card reader comprises: a main control module, used for supporting multiple terminal card readers to concurrently access multiple integrated circuit (IC) cards; multiple card reading modules connected to the main control module, each card reading module receiving at least one IC card, and being used for providing a contact-type card reading function and a non-contact-type card reading function; multiple simulated IC card modules, each simulated IC card module being separately connected to one terminal card reader and the main control module, and the multiple simulated IC card modules being used for interacting with the multiple card reading modules, respectively, by means of the main control module, so as to concurrently access multiple IC cards.

Description

Test device and system for terminal card reader, and electronic device

[0001] The present application claims priority to the Chinese patent application No. 202410444150.5, filed on April 12, 2024, and entitled "Test device and system for terminal card reader, and electronic device", the content of which is incorporated herein by reference in its entirety. TECHNICAL FIELD

[0002] The present application belongs to the technical field of terminal card readers, and more particularly relates to a test device and system for a terminal card reader, and an electronic device. BACKGROUND

[0003] With the development of the card payment industry, a cloud automatic test platform provides an intelligent and fully automatic test solution for terminal card readers (such as POS machines), which can replace manual payment operations and meet laboratory deployment and automatic cloud test requirements.

[0004] However, the existing test solution needs to test each terminal card reader one by one, and a set of integrated circuit (IC) cards needs to be configured for contact card readers and non-contact card readers respectively, which has a high deployment cost and a low degree of automation. SUMMARY

[0005] The embodiments of the present application aim to provide a test device and system for a terminal card reader, and an electronic device, and solve the technical problem of a high deployment cost and a low degree of automation of the existing test device in the related art.

[0006] To achieve the above-mentioned purpose, according to a first aspect of the present application, a test device for a terminal card reader is provided, which comprises:

[0007] a master control module configured to support concurrent access of multiple terminal card readers to multiple integrated circuit (IC) cards, wherein the types of the IC cards include a contact IC card, a non-contact IC card, and a two-in-one IC card, and the two-in-one IC card integrates the contact IC card and the non-contact IC card;

[0008] a plurality of card reading modules connected to the master control module, each of the card reading modules is plugged with at least one IC card, and is configured to provide contact card reading and non-contact card reading functions;

[0009] a plurality of simulated IC card modules, each of the simulated IC card modules is connected to one terminal card reader and the master control module, and the plurality of simulated IC card modules are configured to interact with the plurality of card reading modules through the master control module to concurrently access multiple IC cards.

[0010] Optionally, in a possible implementation of the first aspect, the analog IC card module comprises:

[0011] a plurality of analog contact IC card modules, each of the analog contact IC card modules being plugged into a card slot of the terminal card reader, and the plurality of analog contact IC card modules being respectively interacted with the plurality of card reading modules through the master module to concurrently access a plurality of contact IC cards;

[0012] a plurality of analog non-contact IC card modules, each of the analog non-contact IC card modules being arranged in a non-contact card reading area of the terminal card reader, and the plurality of analog non-contact IC card modules being respectively interacted with the plurality of card reading modules through the master module to concurrently access a plurality of non-contact IC cards.

[0013] It should be understood that the plurality of analog contact IC card modules are respectively interacted with the plurality of card reading modules through the master module to concurrently access a plurality of contact IC cards, including a single contact IC card or a contact IC card integrated in a two-in-one IC card.

[0014] Similarly, the plurality of analog non-contact IC card modules are respectively interacted with the plurality of card reading modules through the master module to concurrently access a plurality of non-contact IC cards, including a single non-contact IC card or a non-contact IC card integrated in a two-in-one IC card.

[0015] For example, each card reading module in the present application can plug in at least one IC card, and can provide contact card reading function and non-contact card reading function, so that two sets of functionally independent card reading modules are not required, and contact IC cards corresponding to the contact card reading module and non-contact IC cards corresponding to the non-contact card reading module are not required to be respectively configured.

[0016] In addition, the terminal card reader is respectively provided with a card slot and a non-contact card reading area, the card slot is used to plug in an analog contact IC card module, the analog contact IC card module is respectively interacted with the card reading module through the master module to concurrently access a plurality of contact IC cards, and the non-contact card reading area is used to arrange an analog non-contact IC card module, the analog non-contact IC card module is interacted with the card reading module through the master module to concurrently access a plurality of non-contact IC cards.

[0017] Optionally, in a possible implementation of the first aspect, the test device of the terminal card reader further comprises:

[0018] a communication module, comprising a universal serial bus interface and a local area network interface, and being configured to communicate with the host computer by using the universal serial bus interface and / or the local area network interface.

[0019] Optionally, in a possible implementation of the first aspect, in the case that multiple terminal card readers concurrently access multiple contact IC cards, the test device of the terminal card reader further comprises:

[0020] a switching module, connected with the master module, the multiple card reading modules and the multiple analog contact IC card modules respectively, configured to build a smart card interface (SCI) channel between the multiple analog contact IC card modules and the multiple card reading modules, and switch the SCI signals of the multiple analog contact IC card modules to the multiple card reading modules through the SCI channel.

[0021] Optionally, in a possible implementation of the first aspect, the test device of the terminal card reader further comprises a general-purpose input / output (GPIO) port, configured to establish a connection between the master module and the switching module.

[0022] The master module is further configured to control the switching module to build the multiple SCI channels through the GPIO.

[0023] Optionally, in a possible implementation of the first aspect, the SCI channel comprises a first SCI channel and a second SCI channel, the first SCI channel connects the multiple analog contact IC card modules and the switching module, and the second SCI channel connects the multiple card reading modules and the switching module.

[0024] The master module is further configured to introduce the SCI signals of the multiple analog contact IC card modules into the switching module through the first SCI channel, and control the switching module to switch the SCI signals of the multiple analog contact IC card modules to the multiple card reading modules through the second SCI channel.

[0025] Optionally, in a possible implementation of the first aspect, in the case that multiple terminal card readers concurrently access multiple contactless IC cards, the master module is further configured to create multiple independent control threads, and each control thread is configured to control one analog contactless IC card module and one card reading module to interact with each other.

[0026] It can be understood that the independence between the control threads is reflected in synchronization and mutual exclusion. For example, thread A controls an analog contactless IC card module B to access a card reading module C, at this time, it is necessary to determine whether there is another thread E controlling its corresponding analog contactless IC card module F to access the card reading module C, if not, thread A can control the analog contactless IC card module B to access the card reading module C.

[0027] Optionally, in a possible implementation manner of the first aspect, each of the analog IC card modules is internally provided with an analog card chip.

[0028] The analog card chip is configured to send terminal information of the terminal card reader to the master module, and convert contactless IC card data read by the master module from the card reading module into contactless IC card signals, and convert contact IC card data read by the master module from the card reading module into contact IC card signals, and send the contactless IC card signals and the contact IC card signals to the terminal card reader.

[0029] Optionally, in a possible implementation manner of the first aspect, each of the card reading modules is internally provided with a card reading chip; the card reading chip is configured to perform corresponding card reading operations according to a working mode corresponding to a card slot of the card reading module, wherein the working mode includes a contact card reading mode and a contactless card reading mode.

[0030] In each of the card reading modules, in the contact card reading mode, the card reading chip is powered by a power supply voltage of a second SCI channel, and power supply to a contactless radio frequency antenna is turned off; in the contactless card reading mode, the card reading chip is powered by the radio frequency antenna, and power supply of the SCI channel is turned off.

[0031] According to a second aspect of the present application, a terminal card reader test system is provided, the terminal card reader test system comprising:

[0032] a plurality of terminal card readers and a plurality of integrated circuit (IC) cards.

[0033] Any of the terminal card reader test devices is configured to support concurrent access of the plurality of terminal card readers to the plurality of IC cards, and perform test operations in a process of concurrent access of the plurality of terminal card readers to the plurality of IC cards.

[0034] The second aspect and any of the implementation manners of the second aspect correspond to the first aspect and any of the implementation manners of the first aspect respectively. The technical effects of the second aspect and any of the implementation manners of the second aspect can be referred to the technical effects of the first aspect and any of the implementation manners of the first aspect, which will not be described herein.

[0035] In a third aspect, an electronic device is provided, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to control the terminal card reader test device to perform test operations.

[0036] It can be understood that the beneficial effects of the second aspect to the third aspect can be referred to the related description in the first aspect, which will not be repeated here.

[0037] Compared with the related art, the beneficial effects of the embodiments of the present application are that: the test equipment of the terminal card reader comprises: a master control module, configured to support concurrent access of multiple terminal card readers to multiple integrated circuit (IC) cards, wherein the types of the IC cards include: a contact type IC card, a non-contact type IC card, and a two-in-one IC card, and the two-in-one IC card is integrated with the contact type IC card and the non-contact type IC card; multiple card reading modules, connected with the master control module, wherein each card reading module is plugged with at least one IC card, and is configured to provide a contact type card reading function and a non-contact type card reading function; and multiple analog IC card modules, each of which is connected with a terminal card reader and the master control module, and the multiple analog IC card modules are configured to interact with the multiple card reading modules through the master control module to concurrently access the multiple IC cards.

[0038] In the present application, each card reading module is plugged with at least one IC card, and can provide the contact type card reading function and the non-contact type card reading function, so that two sets of functionally independent card reading modules do not need to be arranged, and the contact type IC cards and the non-contact type IC cards do not need to be respectively arranged for the contact type card reading module and the non-contact type card reading module. By using the test equipment of the terminal card reader provided in the present application, the technical problem of high deployment cost and low automation degree of the existing test equipment in the related art can be solved. BRIEF DESCRIPTION OF DRAWINGS

[0039] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed in the embodiments or related technical descriptions will be briefly introduced below. Obviously, the drawings in the following description are only some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative labor.

[0040] FIG. 1 is a schematic diagram of a framework of a test equipment of a terminal card reader according to an embodiment of the present application;

[0041] FIG. 2 is a schematic diagram of an optional test equipment of a terminal card reader according to an embodiment of the present application;

[0042] FIG. 3 is a schematic diagram of a framework of an optional test equipment of a terminal card reader according to an embodiment of the present application;

[0043] FIG. 4 is a schematic diagram of a framework of another optional test equipment of a terminal card reader according to an embodiment of the present application;

[0044] FIG. 5 is a schematic diagram of an implementation of concurrent access of multiple contact type IC cards by a terminal card reader according to an embodiment of the present application;

[0045] FIG. 6 is an implementation schematic diagram of an optional terminal card reader concurrent access to multiple non-contact IC cards according to an embodiment of the present application;

[0046] FIG. 7 is a structural schematic diagram of an optional electronic device according to an embodiment of the present application. DETAILED DESCRIPTION

[0047] In the following description, specific details are set forth, such as particular system configurations, techniques, etc., in order to provide a thorough understanding of embodiments of the present application. However, persons skilled in the art will understand that embodiments of the present application can be practiced without these specific details. In other instances, well-known structures, devices, circuits, and methods have not been described in detail in order to avoid obscuring the description of embodiments of the present application.

[0048] It should be understood that the term "comprises" as used in this specification and the appended claims indicates the presence of the described features, integers, steps, operations, elements, and / or components, but does not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and / or groups thereof.

[0049] It should also be understood that the term "and / or" as used in this specification and the appended claims, means any one of the associated listed items, or any combination of one or more of the associated listed items.

[0050] As used in this specification and the appended claims, the term "if" can be interpreted as meaning "when" or "upon" or "in response to determining" or "in response to detecting," depending on the context. Similarly, the phrase "if it is determined" or "if [a described condition or event] is detected" can be interpreted to mean "upon determining" or "in response to determining" or "upon detecting [the described condition or event]" or "in response to detecting [the described condition or event]," depending on the context.

[0051] In addition, in the description of the specification and the appended claims, the terms "first", "second", "third", etc. are only used to distinguish descriptions, and cannot be understood as indicating or implying relative importance.

[0052] Reference throughout this application to "one embodiment" or "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment is included in at least one embodiment. Thus, the appearances of the phrase "in one embodiment" or "in an embodiment" in various places throughout this specification are not necessarily all referring to the same embodiment, but can refer to one or more but not all embodiments. The terms "including," "comprising," "carrying," "having," "containing," and variations thereof are meant to encompass the item listed thereafter, but do not exclude additional, unrecited items. Unless otherwise noted, the use of the negative "does not" or "does not" to describe a process or method step means that such step can not be performed, or that such step can be performed.

[0053] First, some terms in the embodiments of the present application are explained to facilitate understanding by those skilled in the art.

[0054] The Chinese name of the multifunctional terminal card reader POS (Point of sales) means "sales point", and the full name is sales point information management system, also known as card reader, which is a terminal card reader with bar code or OCR code technology, and has cash or barter amount of cash register function.

[0055] The POS machine is a multifunctional terminal. When it is installed in the credit card special merchant and the acceptance network and connected with the computer network, it can realize automatic transfer of electronic funds. It has the functions of supporting consumption, pre-authorization, balance inquiry and transfer, and is safe, fast and reliable to use.

[0056] Universal Serial Bus (USB) is a serial bus standard and a technical specification for input and output interfaces, which is widely used in personal computers and mobile devices and other information communication products, and is extended to photographic equipment, digital television (set-top box), game consoles and other related fields.

[0057] The local area network interface (LAN) is mainly used for the connection between the router and the local area network. Since the types of local area networks are also diverse, the types of local area network interfaces of routers may also be diverse. Different network devices have different interface types.

[0058] General-purpose input / output (GPIO), its pin can be used by user from program control freely, PIN foot can be used as general input (GPI) or general output (GPO) or general input and output (GPIO) according to the actual consideration, since a pin can be used for input, output or other special functions, there are registers to select these functions. For input, the high and low of the pin potential can be determined by reading a certain register; for output, the pin can output high or low potential by writing a certain register; for other special functions, there are other registers to control them.

[0059] The above is a brief introduction to the terms related to the embodiments of the present application, which will not be described below.

[0060] The embodiments of the present application provide an embodiment of a terminal card reader test device, and FIG. 1 is a framework schematic diagram of a terminal card reader test device provided by the embodiments of the present application. Referring to FIG. 1, the terminal card reader test device includes:

[0061] The master control module 10 is configured to support concurrent access of multiple integrated circuit (IC) cards by multiple terminal card readers (such as POS terminal a, POS terminal b, …, POS terminal n in FIG. 1).

[0062] Optionally, the types of the IC cards include a contact IC card, a non-contact IC card, and a two-in-one IC card, and the two-in-one IC card integrates the contact IC card and the non-contact IC card.

[0063] The multiple card reading modules (specifically, 20a, 20b, …, 20n in FIG. 1) are connected to the master control module, each of the card reading modules is plugged with at least one IC card, and each of the card reading modules is configured to provide a contact card reading function and a non-contact card reading function.

[0064] The multiple analog IC card modules are connected to the master control module and the multiple terminal card readers respectively, and the multiple analog IC card modules are configured to interact with the multiple card reading modules through the master control module to concurrently access the multiple IC cards.

[0065] In the present application, each of the card reading modules is plugged with at least one IC card, and each of the card reading modules can provide the contact card reading function and the non-contact card reading function, so that two sets of card reading modules with independent functions do not need to be arranged, and the contact IC cards and the non-contact IC cards do not need to be arranged respectively for the contact card reading modules and the non-contact card reading modules. The terminal card reader test device provided by the present application can solve the technical problems of high deployment cost and low automation degree of the existing test device in the related art.

[0066] Optionally, in a possible implementation of the first aspect, the analog IC card module comprises:

[0067] a plurality of analog contact IC card modules (specifically, 30a, 30b, …, 30n in FIG. 1), connected with the master control module, each of the analog contact IC card modules being plugged into a card slot of a terminal card reader, and the plurality of analog contact IC card modules interacting with the plurality of card reading modules through the master control module to concurrently access a plurality of contact IC cards.

[0068] a plurality of analog contactless IC card modules (specifically, 40a, 40b, …, 40n in FIG. 1), connected with the master control module, each of the analog contactless IC card modules being arranged in a contactless card reading area of a terminal card reader, and the plurality of analog contactless IC card modules interacting with the plurality of card reading modules through the master control module to concurrently access a plurality of contactless IC cards.

[0069] It should be understood that the plurality of analog contact IC card modules interact with the plurality of card reading modules through the master control module to concurrently access a plurality of contact IC cards, including a single contact IC card or a contact IC card integrated in a two-in-one IC card.

[0070] Similarly, the plurality of analog contactless IC card modules interact with the plurality of card reading modules through the master control module to concurrently access a plurality of contactless IC cards, including a single contactless IC card or a contactless IC card integrated in a two-in-one IC card.

[0071] Optionally, in the examples of the present application, the two-in-one IC card can simply integrate the contactless and contact functions in one IC card, i.e., there are two independent IC card systems on the IC card. Alternatively, the contactless and contact functions can be completely integrated, i.e., there is only one IC card system on the IC card.

[0072] For example, during the testing of a plurality of terminal card readers, each card reading module in the present application is plugged with at least one IC card, which can provide both contact and contactless card reading functions, so that it is not necessary to set two sets of functionally independent card reading modules, nor is it necessary to separately configure a contact IC card for the contact card reading module and a contactless IC card for the contactless card reading module.

[0073] It should be noted that, in the examples of the present application, if the IC card plugged into the card reading module is a contact IC card, the card reading module (also referred to as a card reader) only enables the contact card reading function; if the IC card plugged into the card reading module is a contactless IC card, the card reading module (also referred to as a card reader) only enables the contactless card reading function.

[0074] In an example, if the IC card plugged into the card slot of the card reading module is a two-in-one IC card, the card reading module will only enable the corresponding card reading function according to the setting of the host computer. For example, if the host computer sets the working mode of the card slot of the card reading module 20a to the contact card reading mode, the non-contact card reading function of the card slot will be closed, for example, powered off; similarly, if the host computer sets the working mode of the card slot of the card reading module 20b to the non-contact card reading mode, the contact card reading function of the card slot will be closed.

[0075] In an example, if the IC card plugged into the card slot of the card reading module is a two-in-one IC card, the card reading module will only enable the corresponding card reading function according to the setting of the host computer. For example, if the host computer sets the working mode of the card slot of the card reading module 20a to the contact card reading mode, the non-contact card reading function of the card slot will be closed, for example, powered off; similarly, if the host computer sets the working mode of the card slot of the card reading module 20b to the non-contact card reading mode, the contact card reading function of the card slot will be closed.

[0076] In an example, if the IC card plugged into the card slot of the card reading module is a two-in-one IC card, the card reading module will only enable the corresponding card reading function according to the setting of the host computer. For example, if the host computer sets the working mode of the card slot of the card reading module 20a to the contact card reading mode, the non-contact card reading function of the card slot will be closed, for example, powered off; similarly, if the host computer sets the working mode of the card slot of the card reading module 20b to the non-contact card reading mode, the contact card reading function of the card slot will be closed.

[0077] In an example, if the IC card plugged into the card slot of the card reading module is a two-in-one IC card, the card reading module will only enable the corresponding card reading function according to the setting of the host computer. For example, if the host computer sets the working mode of the card slot of the card reading module 20a to the contact card reading mode, the non-contact card reading function of the card slot will be closed, for example, powered off; similarly, if the host computer sets the working mode of the card slot of the card reading module 20b to the non-contact card reading mode, the contact card reading function of the card slot will be closed.

[0078] In an example, if the IC card plugged into the card slot of the card reading module is a two-in-one IC card, the card reading module will only enable the corresponding card reading function according to the setting of the host computer. For example, if the host computer sets the working mode of the card slot of the card reading module 20a to the contact card reading mode, the non-contact card reading function of the card slot will be closed, for example, powered off; similarly, if the host computer sets the working mode of the card slot of the card reading module 20b to the non-contact card reading mode, the contact card reading function of the card slot will be closed.

[0079] The embodiments of the present application can perform automatic testing on multiple POS terminals and multiple IC cards, for example, but not limited to, as shown in the front view of the test equipment in FIG. 2, an optional test equipment includes: a power interface, a switch button, a USB port, a LAN port, interfaces of multiple simulated contact IC card modules, and interfaces of simulated non-contact IC card modules.

[0080] It should be understood that in the examples of the present application, the terminal card reader, i.e. the POS machine, is specifically connected to the test device through the interfaces of the plurality of analog contact-type IC card modules and the interfaces of the plurality of analog non-contact-type IC card modules.

[0081] In an example, the plurality of card reading modules in the test device correspond to the card slot, which is not limited to the eight card slots schematically shown in the front view of FIG. 2, and eight identical card slots are arranged opposite to the eight card slots, i.e. there are sixteen card slots in the example. It should be understood that according to the specific application requirements, more or fewer card slots can also be arranged as needed. Specifically, one socket is arranged in each card slot, and the socket can be used to insert an IC card. Thus, as shown in FIG. 2, the test device can access sixteen IC cards when performing one test, and one POS machine can access one IC card, five POS machines can simultaneously access five IC cards, and so on, thereby further improving the test efficiency of the test device on the terminal card reader.

[0082] Moreover, in the examples of the present application, the card reading module with both contact-type reading function and non-contact-type reading function is adopted, and the IC card to be tested can be a contact-type IC card, a non-contact-type IC card, or a contact-type and non-contact-type two-in-one IC card, thereby saving the test cost.

[0083] Optionally, in a possible implementation manner, the test device of the terminal card reader further includes:

[0084] The communication module includes a universal serial bus interface (i.e. USB port) and a local area network interface (i.e. LAN port), and is used to communicate with the host computer through the universal serial bus interface and / or the local area network interface.

[0085] For example, the host computer is used to control a plurality of POS terminals to simultaneously interact with a plurality of IC cards.

[0086] In the examples of the present application, the communication module 50 is additionally provided with the LAN port in addition to the previous USB port, allowing the device to be more flexible in networking, such as being connected to a router or a cloud server, which provides more possibilities for remote control and data transmission.

[0087] By way of example but not limitation, FIG. 3 is a schematic diagram of a frame of an optional test device of a terminal card reader according to an embodiment of the present application. As shown in FIG. 3, the communication module 50 can also communicate with the host computer through the universal serial bus interface (i.e. USB port), and communicate with the router through the local area network interface (i.e. LAN port).

[0088] In an example, the communication module is further configured to download programs, such as downloading firmware programs of the testing device to perform firmware upgrade. The communication module can also download application programs, and different testing requirements can be programmed to control the testing device to perform testing, and different customers can also program different application programs to control the testing device to perform testing.

[0089] In an example, the communication module is further configured to receive switching instructions and report testing logs, and the LAN port can be connected to a router to form a network.

[0090] Optionally, the host computer can be a computer, and can also be other electronic devices, for example, a POS machine with a USB port or a LAN port can be used as the host computer to export testing logs. For another example, the testing device can be connected to a cloud server, and the cloud server can be used as the host computer to remotely control the testing operation process.

[0091] Optionally, the communication module can provide solutions for communications on the testing device, including wireless local area networks (WLAN) (such as Wi-Fi network), Bluetooth, Zigbee, mobile communication network, global navigation satellite system (GNSS), frequency modulation (FM), near field communication (NFC), infrared technology (IR), and the like.

[0092] The communication module can be one or more devices integrated with at least one communication processing module. The communication module can include an antenna, which can be an array element or an antenna array including a plurality of array elements. The communication module can receive electromagnetic waves through the antenna, frequency modulate and filter the electromagnetic wave signals, and send the processed signals to the processor.

[0093] The communication module can also receive signals to be sent from the processor, frequency modulate and amplify the signals, and radiate the signals out as electromagnetic waves through the antenna.

[0094] Optionally, in a possible implementation manner, FIG. 4 is a schematic block diagram of another optional testing device of a terminal card reader according to an embodiment of the present application, please refer to FIG. 4, the testing device of the terminal card reader further includes:

[0095] The switching module 70 is connected with the master control module, the plurality of card reading modules and the plurality of analog contact IC card modules respectively. The switching module 70 is used to build the smart card interface SCI channel between the plurality of analog contact IC card modules and the plurality of card reading modules in the case that a plurality of terminal card readers concurrently access a plurality of contact IC cards, and switch the smart card interface SCI signals of the plurality of analog contact IC card modules to the plurality of card reading modules through the SCI channel.

[0096] Optionally, in a possible implementation manner, as shown in FIG. 4, the test device of the terminal card reader further includes:

[0097] The general-purpose input / output port GPIO is used to build the connection between the master control module and the switching module.

[0098] The master control module 10 is further used to control the switching module to build a plurality of SCI channels through the GPIO.

[0099] FIG. 5 is an implementation schematic diagram of a possible terminal card reader concurrently accessing a plurality of contact IC cards according to an embodiment of the present application. As shown in FIG. 5, the working process of the analog contact IC card module and the card reading module is as follows:

[0100] In an example, the communication between the plurality of POS terminals and the plurality of IC cards is performed through the SCI channel composed of four signal lines of CVCC (VCC is a commonly used power supply indication on a circuit, and CVCC is specifically used for the VCC of the IC card), RST, IO and CLK.

[0101] The analog contact IC card is plugged into the IC card slot of the POS terminal, and the real card is plugged into the card reading module. The master control module 10 controls the switching module 70 through the general-purpose input / output port GPIO to build the SCI channel of the analog contact IC card module and the card reading module.

[0102] In an example, by reasonably configuring the GPIO, a maximum of 5 SCI channels can be built, so that a maximum of 5 POS terminals can simultaneously access 5 contact IC cards.

[0103] For example, assuming there are 16 IC cards, according to the binary mode of modern electronic technology, it can be converted into a 4-digit number to indicate, that is, 4 GPIO ports are configured to set 16 IC cards to high and low levels 0 and 1. It should be understood that the configured GPIO port is used to control the corresponding card reading module, that is, it takes effect on the card reading module, for example, the GPIO port corresponding to the card reading module 20a is 0000, the GPIO port corresponding to the card reading module 20b is 0001, the GPIO port corresponding to the card reading module 20c is 0010, and the GPIO port corresponding to the card reading module 20d is 0011, and so on (wherein, 20c and 20d are not shown in the drawings, and are the same as or similar to the card reading module 20a).

[0104] For example, if the SCI channel between the analog contact IC card module 30b and the card reading module 20b is built, the GPIO port corresponding to the card reading module 20b is configured as 0001; then, if the SCI channel between the analog contact IC card module 30b and the card reading module 20d is built, the GPIO port corresponding to the card reading module 20d is configured as 0011.

[0105] Optionally, in a possible implementation manner, as shown in FIG. 4, the above SCI channel includes:

[0106] The first SCI channel (i.e., SCI1 in FIG. 4) and the second SCI channel (i.e., SCI2 in FIG. 4), the first SCI channel is connected to the plurality of analog contact IC card modules and the switching module, and the second SCI channel is connected to the plurality of card reading modules and the switching module.

[0107] The host module 10 is further configured to introduce the smart card interface SCI signals of the plurality of analog contact IC card modules to the switching module 70 through the first SCI channel (i.e., SCI1 in FIG. 4), and control the switching module 70 to switch the SCI signals of the plurality of analog contact IC card modules to the plurality of card reading modules through the second SCI channel (i.e., SCI2 in FIG. 4).

[0108] Optionally, in a possible implementation manner, in the case that a plurality of terminal card readers access a plurality of non-contact IC cards concurrently, the host module is further configured to create a plurality of independent control threads, and each control thread is configured to control data interaction between one analog non-contact IC card module and one card reading module.

[0109] It can be understood that the independence between the control threads is reflected in synchronization and mutual exclusion, so as to ensure that only one control thread can control a specific analog non-contact IC card module to access a card reading module at the same time.

[0110] For example, control thread X controls the simulation of the non-contact IC card module Y to access the card reader module C. At this time, it is necessary to determine whether there is another thread E controlling the corresponding simulation of the non-contact IC card module F to access the card reader module C. If not, control thread X can control the simulation of the non-contact IC card module Y to access the card reader module C.

[0111] By creating multiple independent control threads, each thread controls a POS machine to interact with a non-contact IC card. In this way, multi-threading technology can be used to achieve concurrent card reading operations of multiple POS machines and multiple non-contact IC cards, significantly improving the efficiency of development and testing.

[0112] It should be understood that different contact IC cards or different non-contact IC cards can be individually completed for card reading and individually switched. Taking the contact IC card as an example, different SCI channels are independent of each other, and the software logic is synchronous and mutually exclusive.

[0113] It should be further noted that, taking the non-contact IC card as an example, when the card reading operation of the five IC cards is completed, switching can be performed to achieve concurrent card reading of five non-contact IC cards by five POS machines. If the card reading speeds of the five POS machines are inconsistent, switching does not need to wait for all operations to be completed together, because each card reading operation is an independent thread and can be individually completed for card reading and switching.

[0114] With this design of the embodiment of the application, multiple POS machines can simultaneously interact with multiple non-contact IC cards without interfering with each other, improving the testing efficiency and response capability. The independence of each thread also means that the card reading speed difference of different POS machines can be flexibly handled, and switching can be performed without waiting for all operations to be completed synchronously, thereby optimizing the overall workflow.

[0115] Optionally, in a possible implementation, each of the above-mentioned simulation IC card modules is internally provided with a simulation card chip, which can be a simulation card chip internally provided in the simulation non-contact IC card module. The simulation card chip is configured to send terminal information of the terminal card reader to the master control module, and convert non-contact IC card data read by the master control module from the card reader module into non-contact IC card signals, and convert contact IC card data read by the master control module from the card reader module into contact IC card signals. The non-contact IC card signals and the contact IC card signals are sent to the terminal card reader.

[0116] Optionally, in a possible implementation, each of the above card reading modules is internally provided with a card reading chip; the card reading chip is configured to perform a corresponding card reading operation according to a working mode corresponding to the card slot of the card reading module, and the working mode includes a contact card reading mode and a non-contact card reading mode. For example, in the non-contact card reading mode, the card reading module reads non-contact IC card data; and in the contact card reading mode, the card reading module reads contact IC card data.

[0117] The master module is further configured to control power-on and power-off of the plurality of card reading modules. In each of the card reading modules, in the contact card reading mode, the card reading chip is powered by a power supply voltage of the second SCI channel, and power supply to the non-contact radio frequency antenna is turned off; and in the non-contact card reading mode, the card reading chip is powered by the radio frequency antenna, and power supply to the SCI channel is turned off.

[0118] In the example, the plurality of card reading modules are integrated with the contact card reading function and the non-contact card reading function, the card reading chip in the card reading module performs a corresponding card reading operation according to a working mode corresponding to the card slot of the card reading module, and different IC cards do not need to be prepared for the two different tests, thereby saving the cost of a set of test cards.

[0119] For example, in the example, before the test, the working mode corresponding to the card slot is set by the host computer or the software program, for example, set to the non-contact card reading mode (RF mode) or the contact card reading mode (IC mode).

[0120] During the test, in the case where the test personnel set the working mode corresponding to the card slot to the contact card reading mode, the card reading chip is powered by the VCC of the SCI interface, and the power supply of the radio frequency antenna is turned off. In the case where the test personnel set the working mode corresponding to the card slot to the non-contact card reading mode, the power supply of the VCC of the SCI interface is turned off, and the power supply of the radio frequency antenna is turned on, and the card reading chip is powered by the radio frequency antenna.

[0121] Each card slot is independent, and after each card reading chip completes the last card reading, the working mode of the card slot can be reset. For example, the card slot is inserted with a two-in-one IC card, the card slot can be first set to the contact card reading mode, after the contact IC card reading is completed, the working mode of the card slot can be set to the non-contact card reading mode, for example, the radio frequency RF mode, and then the card reading chip corresponding to the card slot continues to read the non-contact IC card.

[0122] FIG. 6 is an implementation schematic diagram of a terminal card reader provided in an embodiment of the present application for concurrent access to a plurality of non-contact IC cards. As shown in FIG. 6, the working process of the simulation non-contact IC card module and the card reading module is as follows:

[0123] The analog non-contact IC card module exchanges data with the POS machine by simulating the analog card chip contained in the analog non-contact IC card. The module sends information of the POS machine to the main control module through a serial port (such as serial port A1, serial port A2, …, serial port A5 in FIG. 6).

[0124] The card reading module reads the card information of the non-contact IC card through the card reading chip contained in the card reading module, and sends the card information to the main control module through a serial port (such as serial port B1, serial port B2, …, serial port B16 in FIG. 6).

[0125] The main control module receives the non-contact IC card information from the card reading module and sends it to the corresponding analog non-contact IC card module, thereby realizing the information exchange between the POS machine and the non-contact IC card.

[0126] It should be noted that the above FIG. 1-FIG. 5 do not constitute a structural limitation of the test equipment of the terminal card reader, and can include more or fewer components than those shown, or combine certain components, or different components, for example, the test equipment can also include a display screen, an indicator light, a control (such as a button), etc.

[0127] According to an embodiment of the present application, a test system of a terminal card reader is provided, and the test system of the terminal card reader comprises:

[0128] A plurality of terminal card readers and a plurality of integrated circuit (IC) cards.

[0129] Any one of the above terminal card reader test equipment is used to support concurrent access of a plurality of terminal card readers to a plurality of IC cards, and perform a test operation during the concurrent access of the plurality of terminal card readers to the plurality of IC cards.

[0130] Corresponding to the above terminal card reader test equipment, the technical effects of any one of the implementation manners of the test system of the terminal card reader can be referred to the technical effects of any one of the implementation manners of the terminal card reader test equipment, which will not be described here.

[0131] According to an embodiment of the present application, an electronic device is also provided, and FIG. 7 is a structural schematic diagram of an electronic device according to an embodiment of the present application. As shown in FIG. 7, the electronic device 600 of the embodiment comprises at least one processor 60 (only one processor is shown in FIG. 7), a memory 61, and a computer program 62 stored in the memory 61 and executable on the at least one processor 60, wherein the processor 60 executes the computer program 62 to control any one of the above terminal card reader test equipment to perform a test operation.

[0132] The processor can include one or more of a central processor, an application processor (AP), a baseband processor, and the like. The processor can be the nerve center and command center of the wireless router. The processor can generate operation control signals according to instruction opcodes and timing signals, and complete the control of fetching and executing instructions. The memory can be used to store computer executable program codes, and the executable program codes include instructions. The processor executes various functional applications and data processing of the network device by running the instructions stored in the memory. The memory can include a program storage area and a data storage area, such as a data area for storing a sound signal to be played, and the like. For example, the memory can be a double data rate synchronous dynamic random access memory (DDR) or a flash memory (Flash), and the like.

[0133] The electronic device 600 described above can be a desktop computer, a notebook computer, a palm computer, a cloud server, and the like. The electronic device can include, but is not limited to, a processor 60 and a memory 61. Those skilled in the art can understand that FIG. 7 is only an example of the electronic device 600, and does not constitute a limitation on the electronic device 600, and can include more or fewer components than those shown, or combine certain components, or different components, for example, can also include an input / output device, a network access device, and the like.

[0134] The processor 60 referred to can be a central processing unit (CPU), and the processor 60 can also be other general-purpose processors, digital signal processors (DSPs), application specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs) or other programmable logic devices, discrete gates or transistor logic components, discrete hardware components, and the like. The general-purpose processor can be a microprocessor or the processor can also be any conventional processor.

[0135] The memory 61 may, in some embodiments, be an internal storage unit of the electronic device 600, such as a hard disk or an internal memory of the electronic device 600. The memory 61 may, in other embodiments, also be an external storage device of the electronic device 600, such as a plug-in hard disk, a smart media card (SMC), a secure digital (SD) card, a flash card, or the like, equipped on the electronic device 600. Further, the memory 61 may, in some embodiments, include both an internal storage unit and an external storage device of the electronic device 600. The memory 61 is used to store an operating system, application programs, a boot loader, data, and other programs, such as program codes of the computer program, and the like. The memory 61 may, in some embodiments, also be used to temporarily store data that has been output or is to be output.

[0136] It should be noted that the information interaction and execution process between the above apparatuses / units are based on the same concept as the method embodiments of the present application, and the specific functions and technical effects thereof can be referred to the method embodiments part, which will not be repeated here.

[0137] Those skilled in the art can clearly understand that, for the convenience and brevity of description, only the above-mentioned division of functional units and modules is taken as an example for illustration, and in actual application, the above-mentioned functions can be completed by different functional units and modules according to needs, that is, the internal structure of the apparatus is divided into different functional units or modules to complete all or part of the above-described functions. Each functional unit and module in the embodiments can be integrated in one processing unit, or each unit can exist physically independently, or two or more units can be integrated in one unit, and the integrated unit can be realized in the form of hardware or in the form of software functional unit. In addition, the specific names of each functional unit and module are only for easy distinction, and do not limit the protection scope of the present application. The specific working process of the units and modules in the system can be referred to the corresponding process in the foregoing method embodiments, which will not be repeated here.

[0138] The integrated units described above, if implemented in the form of software function units and sold or used as independent products, can be stored in a computer readable storage medium. Based on such understanding, the present application implements all or part of the processes in the above-mentioned embodiment methods, which can be completed by instructing relevant hardware through a computer program. The above-mentioned computer program can be stored in a computer readable storage medium, and the computer program can implement the steps of each method embodiment described above when executed by a processor. The computer program includes computer program code, which can be in the form of source code, object code, executable files or some intermediate forms. The computer readable medium can at least include any entity or device capable of carrying the computer program code to the photographing device / electronic device, recording medium, computer memory, read-only memory (ROM), random access memory (RAM), electrical carrier signal, telecommunication signal and software distribution medium. For example, U disk, mobile hard disk, magnetic disk or optical disk, etc. In some jurisdictions, according to legislation and patent practice, the computer readable medium can not be an electrical carrier signal and a telecommunication signal.

[0139] In the above embodiments, the description of each embodiment has its own focus, and the parts not described or recorded in detail in a certain embodiment can be referred to the relevant description of other embodiments.

[0140] Those skilled in the art can appreciate that the units and algorithm steps of the examples described in combination with the embodiments disclosed herein can be realized by electronic hardware or a combination of computer software and electronic hardware. Whether the functions are realized in hardware or software depends on the specific application and design constraints of the technical solution. Professional technicians can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of the present application.

[0141] In the embodiments provided by the present application, it should be understood that the disclosed apparatus / network device and method can be implemented in other ways. For example, the above-described apparatus / network device embodiments are merely schematic, for example, the division of the modules or units is only a logical function division, and actual implementation can have another division manner, for example, a plurality of units or components can be combined or integrated into another system, or some features can be ignored or not executed. In addition, the coupling or direct coupling or communication connection between the displayed or discussed each other can be indirect coupling or communication connection through some interfaces, devices or units, and can be electrical, mechanical or other forms.

[0142] The units described as separate components may or may not be physically separate, and the components displayed as units may or may not be physical units, that is, may be located in one place, or may also be distributed to multiple network units. Part or all of the units can be selected to achieve the purpose of the embodiment scheme according to actual needs.

[0143] The above embodiments are only used to illustrate the technical solutions of the present application, but not limit them; although the present application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that the technical solutions recorded in the foregoing embodiments can still be modified, or some technical features can be replaced by equivalents; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present application, and should be included in the protection scope of the present application.

Claims

1. A test device for a terminal card reader, wherein: The test equipment of the terminal card reader includes: A main control module, configured to support multiple terminal card readers to concurrently access multiple integrated circuit IC cards, wherein the types of the IC cards include: contact IC cards, contactless IC cards, and two-in-one IC cards, wherein the two-in-one IC card integrates a contact IC card and a contactless IC card; A plurality of card reading modules are connected to the main control module, each of the card reading modules is plugged into at least one IC card, and is used to provide contact card reading function and contactless card reading function; Multiple simulated IC card modules, each of which is connected to one of the terminal card readers and the main control module. The multiple simulated IC card modules are used to interact with multiple card reader modules through the main control module to concurrently access multiple IC cards.

2. The terminal card reader testing device according to claim 1, wherein: The test equipment of the terminal card reader also includes: The communication module includes a universal serial bus interface and a local area network interface, and is used to communicate with a host computer using the universal serial bus interface and / or the local area network interface.

3. The terminal card reader testing device according to claim 1, wherein: The simulated IC card module includes: a simulated contact IC card module. In the case where multiple terminal card readers concurrently access multiple contact IC cards, the test equipment of the terminal card reader further includes: The switching module is respectively connected to the main control module, multiple card reading modules, and multiple analog contact IC card modules, and is used to build a smart card interface SCI channel between the multiple analog contact IC card modules and the multiple card reading modules, and switch the smart card interface SCI signals of the multiple analog contact IC card modules to the multiple card reading modules through the SCI channel.

4. The terminal card reader testing device according to claim 3, wherein: The test equipment of the terminal card reader also includes: A general purpose input / output port GPIO, used to establish a connection between the main control module and the switching module; The main control module is further used to control the switching module to build multiple SCI channels through the GPIO.

5. The terminal card reader testing device according to claim 3, wherein: The SCI channel includes: a first SCI channel and a second SCI channel, the first SCI channel connects the plurality of analog contact IC card modules and the switching module, and the second SCI channel connects the plurality of card reading modules and the switching module; The main control module is also used to introduce the smart card interface SCI signals of the multiple analog contact IC card modules into the switching module through the first SCI channel, and control the switching module to switch the SCI signals of the multiple analog contact IC card modules to the multiple card reading modules through the second SCI channel.

6. The terminal card reader testing device according to claim 1, wherein: The simulated IC card module includes: a simulated contactless IC card module; In the case where multiple terminal card readers concurrently access multiple contactless IC cards, the main control module is further used to create multiple independent control threads, each of which is used to control one of the simulated contactless IC card modules and one of the card reader modules to perform data interaction.

7. The terminal card reader testing device according to claim 1, wherein: Each of the analog IC card modules has an internal analog card chip; The analog card chip is used to send the terminal information of the terminal card reader to the main control module; and convert the contactless IC card data read by the main control module from the card reader module into a contactless IC card signal, and convert the contact IC card data read by the main control module from the card reader module into a contact IC card signal; and send the contactless IC card signal and the contact IC card signal to the terminal card reader.

8. The terminal card reader testing device according to claim 1, wherein: Each of the card reading modules has a built-in card reading chip; the card reading chip is used to perform a corresponding card reading operation according to the working mode corresponding to the card insertion slot of the card reading module, wherein the working mode includes a contact card reading mode and a contactless card reading mode; In each of the card reading modules, in the contact card reading mode, the card reading chip is powered by the power supply voltage of the second SCI channel, and the power supply to the contactless RF antenna is turned off; in the contactless card reading mode, the RF antenna is used to power the card reading chip, and the power supply to the SCI channel is turned off.

9. A terminal card reader testing system, wherein: The terminal card reader test system includes: A plurality of terminal card readers and a plurality of integrated circuit IC cards; The test device for the terminal card reader according to any one of claims 1 to 8 is used to support multiple terminal card readers to concurrently access the multiple integrated circuit IC cards, and to perform test operations during the process of multiple terminal card readers concurrently accessing the multiple IC cards.

10. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein: When the processor executes the computer program, it controls the test device of the terminal card reader according to any one of claims 1 to 8 to perform a test operation.

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