Irradiance measurement device with microstructures

Microstructures on irradiance measurement devices, created using lasers, address soiling issues by reducing dirt and rain droplet accumulation, enhancing hydrophobic or hydrophilic properties to maintain accuracy and reduce cleaning needs.

WO2025224505A1PCT designated stage Publication Date: 2025-10-30KIPP & ZONEN BV
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Patent Information

Application Number
PCT/IB2025/000184
Authority / Receiving Office
WO · WO
Patent Type
Applications
Current Assignee / Owner
Priority Date
2024-04-26
Filing Date
2025-04-28
Publication Date
2025-10-30

AI Technical Summary

Technical Problem

Irradiance measurement devices, such as pyranometers, suffer from soiling issues that affect their accuracy in high irradiance regions, necessitating frequent and costly cleaning methods that are difficult to implement, especially in remote sites.

Method used

The implementation of microstructures on the dome or other parts of the irradiance measurement devices, created using a laser or other methods, to reduce soiling and prevent the accumulation of dirt and rain droplets, enhancing hydrophobic or hydrophilic properties as needed.

Benefits of technology

The microstructures effectively minimize soiling, reducing the need for frequent cleaning and maintaining accurate irradiance measurements while complying with ISO standards, thus lowering maintenance costs and improving device performance.

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Abstract

An irradiance measurement device, with at least one sensor configured to measure irradiance and a body within which the at least one sensor is provided. At least part of a surface of the body and / or of at least part of a surface of the at least one sensor is provided with at least one microstructure, thus forming a microstructured surface.
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Description

IRRADIANCE MEASUREMENT DEVICE WITH MICROSTRUCTURES

[0001] This application claims priority to U.S. provisional patent application No. 63 / 639,175, filed April 26, 2024, the disclosure of which is incorporated by reference it its entirety.BACKGROUND

[0002] Irradiance measurement devices, including pyranometers, pyrheliometers and pyrgeometers, are often used to measure solar irradiance on a plane surface. Such devices are often used at photovoltaic plants in order to measure an incoming irradiance. By measuring the irradiance a performance ratio of the plant can be calculated.

[0003] These devices include a radiation detector and often have structures that allow some incoming radiation to pass through, generally aid in controlling the spectral response of the instrument, and protect the sensor in the irradiance measurement device from environmental factors.

[0004] In some environments, including high irradiance regions, the irradiance measurement devices are subject to soiling, particularly on the dome or other part of the body. Soiling adversely affects the ability of the irradiance measurement device to accurately measure the irradiance, and thus, systems and methods to reduce or eliminate soiling are needed.

[0005] The International Electrotechnical Commission (TEC) has issued standards specific for cleaning irradiance sensors. IEC 61724-1 reads that the effects of soiling accumulation on irradiance sensors shall be mitigated, and for typical sensors and installations, weekly cleaning is required. However, the same standard indicates that when technology is employed that mitigates or corrects the sensor soiling equivalently to weekly cleaning or otherwise detects soiling so that cleaning can be scheduled, less frequent cleaning is necessary.

[0006] Some employed systems for weekly cleaning (or greater, in some environments) involves wiping of the dome, often glass, or creating an airflow using a ventilation unit or otherwise blowing pressurized air or water to clean the surface. Such cleaning, particularly in remote sites, is difficult and costly.

[0007] Other systems involve utilizing a coating on the dome, though the often dome-shaped surface and required optical properties of the dome limit viable options or otherwise reduce the utility of the dome itself.

[0008] Still other systems attempt to measure soiling and either correct irradiance measurements to account for the soiling or otherwise to determine when an amount of soiling reaches a threshold. However, measuring soiling and correcting for it is generally difficult given the difficult interplay between an amount of absorbed and scattered light due to soiling and the resulting irradiance loss.SUMMARY

[0009] In some embodiments, a dome of an irradiance device is provided with microstructures in order to provide a desired quality to some structure (e.g., a part of the body or of the sensor) of an irradiance measurement device. Doing so may, among other things described in more detail herein, reduce the amount of dirt and general soiling of the structure, and can, in some cases, avoid unduly accumulating rain droplets, which can be particularly desirable in certain climates.

[0010] Such microstructures may be generated using a laser source that can have certain variables set in order to impart a predetermined and desired microstructure type and / or pattern to the requisite structure.

[0011] In some embodiments, an irradiance measurement device is provided. The device includes at least one sensor configured to measure irradiance and a body within which the at least one sensor is provided. At least part of a surface of the body and / or of at least partof a surface of the at least one sensor is provided with at least one microstructure, thus forming a microstructured surface.

[0012] In some embodiments, a method for imparting a microstructured surface to an irradiance measurement device is provided. The method includes setting at least one parameter of a laser device to manufacture microstructures, orienting a radiation-transparent portion of the irradiance measurement device to a first position, and laser treating the portion to introduce microstructures to a surface of the portion. The microstructures impart a quality to the portion.BRIEF DESCRIPTION OF THE DRAWINGS

[0013] Fig. 1 shows a pyranometer with a soiled surface.

[0014] Fig. 2A shows an irradiance device according to some embodiments.

[0015] Fig. 2B shows an exploded view of a part of the irradiance device of Fig. 2 A.

[0016] Figs. 3 A-3F show examples of patterning of a laser to impart microstructures according to some embodiments.

[0017] Fig. 4 shows an irradiance device according to some embodiments.

[0018] Fig. 5 shows the irradiance device of Fig. 4 mounted to a tracker.

[0019] Fig. 6 shows a meniscus portion of an irradiance device according to some embodiments.

[0020] Fig. 7 shows an irradiance device including the meniscus portion of Fig. 6.

[0021] Fig. 8 shows a method of imparting microstructures to an irradiance measurement device according to some embodiments.DETAILED DESCRIPTION OF EMBODIMENTS

[0022] In the following description, numerous details are set forth to provide an understanding of the present disclosure. However, it may be understood by those skilled in the art that the methods of the present disclosure may be practiced without these details and that numerous variations or modifications from the described embodiments may be possible.

[0023] At the outset, it should be noted that in the development of any such actual embodiment, numerous implementation-specific decisions may be made to achieve the developer's specific goals, such as compliance with system related and business related constraints, which will vary from one implementation to another. Moreover, it will be appreciated that such a development effort might be complex and time consuming but would nevertheless be a routine undertaking for those of ordinary skill in the art having the benefit of this disclosure. In addition, the device and method described herein can also comprise some components other than those cited. In the summary and this detailed description, each numerical value should be read once as modified by the term "about" (unless already expressly so modified), and then read again as not so modified unless otherwise indicated in context. Also, in the summary and this detailed description, it should be understood that a range listed or described as being useful, suitable, or the like, is intended to include support for any conceivable sub-range within the range at least because every point within the range, including the end points, is to be considered as having been stated. For example, "a range of from 1 to 10" is to be read as indicating each possible number along the continuum between about 1 and about 10. Furthermore, the subject matter of this application illustratively disclosed herein suitably may be practiced in the absence of any element(s) that are not specifically disclosed herein. Aspects of the present disclosure are described above with reference to flowchart illustrations and block diagrams of methods and apparatuses according to embodiments of the disclosure. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented various parts of the system and / or method.

[0024] Unless explicitly indicated, the features described herein with respect to any particular embodiment are also employable, and should be considered described and enabled, with respect to any other described embodiment. For example, unless indicated to the contrary, each feature identified with respect to Fig. 2 can be incorporated into theconfigurations described in both Fig. 4 and Fig. 6. The method of Fig. 8 can be employed with respect to any disclosed embodiment. For the sake of clarity, the laser patterning configurations described with respect to Figs. 3 A-3F can be fully incorporated and utilized in each of the irradiance devices described in the instant application.

[0025] As used herein, the term "irradiance device" generally refers to any device that can measure solar irradiance or another type of irradiance. While pyranometers, pyrheliometers and pyrgeometers are exemplary irradiance devices as described in more detail herein, the term irradiance device is not so limited, and other devices such as radiometers are also within the scope of this disclosure.

[0026] As used herein, the term "microstructure" relates to a structure imparted to a surface, the structure being on a scale that affects the surface tension of any of a liquid, for example water, atmospheric aerosols, or molecules including dust particles or any particle that can exhibit a soiling effect on the surface. The microstructures may have particular dimensions, for example, a measurable extent of a particular kind, including one or more of a peak-to-peak distance between microstructures (breadth), a length, a depth or height, and may be constructed of a repeating pattern or superpositions of repeating patterns, as well as a dimension, for example a width or a breadth, of non-periodic functions. While not necessarily limited, in some embodiments, the microstructures may have an average breadth dimension of about Inm to about 1 mm, or of 0.1 to 150 microns, or from 0.5 to 50 microns, or from about 1 to about 25 microns.

[0027] Further, the microstructure as defined herein is a structure that changes, particularly increases, a surface roughness of the non-microstructured surface in a way where the microstructures have a larger dimension than the composite structures of the surface itself. Further, the microstructures may be provided in any configuration, for example, any or more of lines, dots, grooves, protrusions, combinations of these configurations, and otherconfigurations, including structure combinations with different frequencies and / or periodicities.

[0028] The term "microtreatment" as used herein relates to the treatment being applied to the surface in order to provide the microstructures to the surface.

[0029] As used herein, the term "coating" is a covering applied to the surface of an object or substrate, and may be decorative, functional or both. The coatings may be in the form of liquids, gases or solids (e.g., powder).

[0030] As used herein, the term "soil" or "soiling" refer to, for example, sand particles, particles of other composition, dew drops, snow, rain or any precipitation, bird droppings, pollen, moss, lichen and other organic contamination, soot and other industrial pollutants, aerosol and other particles that dirty or otherwise obscure the surface more so than if the soiled particles were not present.

[0031] Referring to Fig. 1, a graphical representation of a dome 10 of an irradiance measurement device 1 is shown. The dome 10 includes a substantial amount of soiling 10A. Embodiments of the instant application, referring to Figs. 2-8, may have an advantageous effect of reducing the amount of soiling 10A that adheres to the dome 10 during a predetermined period, even in certain regions prone to soiling.

[0032] Fig. 2 shows an irradiance measurement device 1 according to some embodiments. In the embodiment shown in Fig. 2, the irradiance measurement device 1 is represented as a pyranometer, though other types of irradiance measurement devices, including pyrheliometers, pyrgeometers and radiometers (e.g., an outdoor UV radiometer) are within the scope of this disclosure. A pyranometer measures solar irradiance on a planar surface and can measure solar radiation flux density from the hemisphere above. Generally, the pyranometer will measure the flux density within a wavelength range of about 0.3 microns to about 3 microns.

[0033] As shown in Fig. 2, the irradiance measurement device 1 includes a body portion 20. The body portion 20 is a portion of the irradiance measurement device 1 inside which a sensor 25, for example a thermopile sensor, is housed. The body 20 may include a housing, but more generally also may include any component of the irradiance measurement device 1 that is not the sensor 25, particularly the thermopile sensor, itself. The thermopile sensor may be provided within a cavity 35 of the body 20, the cavity bounded by a rim 30 and a longitudinal axis or central axis Y of the irradiance measurement device 1 extending therethrough. The irradiance measurement device 1 may include a level such as a bubble level 40 that may aid in calibrating the device and ensuring that the device is appropriately leveled in order to more accurately measure solar irradiance.

[0034] The pyranometer may, utilizing the sensor 25, measure a broad band of solar radiation flux density from a large field of view angle. In certain pyranometers, such as those with a dome similar to the dome 10 of Fig. 2, the field of view may be at or up to 180°.

[0035] The dome 10, as a nonlimiting example of a radiation-transparent portion as described herein, may limit a spectral response to a certain wavelength, for example below 3,000 nm, or below 2,800 nm, while still preserving the 180° field of view. A radiation- transparent portion may be a portion that allows at least a part of radiation coming from an outside (e.g., the sun or the like) to be passed into the irradiance measurement device, for example toward an included sensor. In some embodiments, the radiation-transparent portion may filter at least some of the radiation (e.g., allowing only certain wavelengths to pass).

[0036] The dome 10 may also be provided to shield the sensor from convection, and / or to provide a radiation shield, either alone or in conjunction with a dome structure. The dome 10 may connect to the body portion 20 directly or indirectly, for example by being placed atop the rim 30. In some embodiments, an additional sun shield, which may be part of the body 20 and also may be removable, can be employed.

[0037] In some embodiments, the sensor 25 may be located beneath a black coating surface and can be heated by radiation absorbed from a black coating. The pyranometer housing may serve as a heat-sink that protects the passive junctions of the sensor from solar radiation, which prevents or reduces impairment of the measurement capabilities.

[0038] In some embodiments, the dome 10 may be a glass structure, including quartz, fused silica, or a fused quartz, but it may also be another type of radiation-transparent portion that can impart some or all of the qualities of the dome 10 described above.

[0039] As shown in Fig. 2A, the dome 10, for example an exterior surface 11 A of the dome 10, is provided with one or more microstructures 12. The microstructures 12 as shown in Fig. 2 exhibit repeated group of dots configurations, though this is merely intended to be representative. Depending on the desired qualities that the microstructures are to impart, the configuration of microstructures 12 may be in a random configuration, in repeated linear configurations with certain spacing, in dot configuration, or in some other configuration.

[0040] In embodiments, the microstructures 12 are imparted to at least a part of the exterior surface 11 A of the dome 10 by way of a microstructure imparting device, for example a laser. Figs. 3A-3F show characteristics of lasers that may be utilized to impart desired microstructures 12 to the dome 10. In other embodiments, other microstructure imparting devices such as 3-D printing or chemical etching may be used to impart the microstructures 12 onto the exterior surface 11 A. The following description uses a laser as an exemplary microstructure imparting device, but the other microstructure imparting devices may be used in a similar manner.

[0041] Further, while the description heretofore relates to treatments of the dome 10, such disclosure is not so limiting. Indeed, microstructures 12 can be imparted by the same or similar treatments to any part of the body 20, wherein the body is defined as any part of the irradiance measurement device 1 other than the sensor 25, and thus includes, for example, additional optical elements such as those shown in Fig. 2B, including an optical filter 24, adiffusor (white diffusor) 23, or a black absorber, or a sun shield. Further, the microstructures 12 can also be imparted to any part of the sensor 25 that can receive such a treatment.

[0042] The laser treatment as described herein may be done on a curved surface, including that of a dome 10, using multi-axis motive methods to manipulate the dome to the desired locations with respect to the laser source.

[0043] In embodiments, one or more parameters of the laser source can be configured to provide an appropriate microstructure characteristic to the dome 10. In embodiments, one or more of a wavelength, dot size, and pattern can be set, by a user, by a computer program, or a combination, in order to impart features that will avail as microstructures on the dome 10. Characteristics of the microstructures 12 may include a size of the microstructures 12, a shape of the microstructures 12, a spacing between adjacent ones of the microstructures 12, and other characteristics that can be imparted by manipulating a laser treatment. In embodiments, when the laser is provided so as to establish a small periodicity and thus adjacent microstructures are closer to each other (a spacing between adjacent ones is relatively less), a hydrophobic quantity may be imparted to the dome 10. That is, the microstructures in this configuration may make the portion of the dome 10 having these microstructures 12 be more hydrophobic than the portion of the dome 10 would be without such microstructures (e.g., than a commensurate surface would be without the microstructures). Such a quality may provide the anti-soiling effect that can be exhibited to the dome. Further, when the laser is provided so as to establish a large periodicity and thus adjacent microstructures are farther to each other (a spacing between adjacent ones is relatively more), a hydrophilic quantity may be imparted to the dome 10. That is, the microstructures in this configuration may make the portion of the dome 10 having these microstructures be more hydrophilic than the portion of the dome 10 would be without such microstructures.

[0044] In some embodiments, the one or more parameters of the laser source can be manipulated to enable the microstructures to exhibit any of the following characteristics to the treated surface of the dome 10 or any other surface of the body portion 20 and / or the sensor 25, including: a dust-repellent quality to any of the dome 10, the body portion 20, and / or a sun shield provided as part of the body portion 20; a dew repellent quality; a low emissivity effect (an effect that is transparent in optical characteristics but reflecting within the infrared spectrum); spectral transmission qualities, for example allowing for spectral transmission of a dome 10 and thus reducing or eliminating the need for an optical filter 24; an anti -refl ection coating; a patterning of a black absorber structure; and a patterning of the white diffusor 23.

[0045] In some embodiments, the microstructures that can be made will have a peak-to-peak dimension from about 1 to about 50 microns, or about 10 to about 30 microns, or about 20 microns. In situations where the microstructures are groove structures or protrusions, they may have comparable dimensions, as measured from outermost part of the external surface, as appropriate. The wavelength imparted may be an ultraviolet wavelength, an infrared wavelength, or within the visible light spectrum.

[0046] In embodiments, the pattern and / or other parameter chosen will be such to impart a non-soiling or lotus effect, and / or to create a desired spectral transmission effect that the dome 10 can provide. That is, the microstructures may be hydrophobic, hydrophilic, ultra hydrophobic, or ultrahydrophilic depending on a desired effect.

[0047] As shown in Fig. 3 A, a laser device can be set to create a sine wave / peak function with a strong aspect ratio in order to achieve a desired contact angle of water andultimately to supply a resistance to soiling. Fig. 3B shows a three-dimensional version of the function of Fig. 3 A.

[0048] As shown in Fig. 3A and Fig. 3B, the function is generally sinusoidal in nature and thus can have a particular periodicity. In some embodiments, the laser may be set to a periodicity of greater than 15 microns, and in some embodiments far greater than 15 microns, for example, 30 microns, 50 microns, or 100 microns, in order to tune the contact angle of the laser to the dome and to ultimately impart a hydrophilic quality to the dome 10.

[0049] In some embodiments, the periodicity may be made below 15 microns, for example, less than 15 microns, or less than 10 microns, or less than 1 micron, in order to tune the contact angle of the laser to the dome and to ultimately impart a hydrophobic quality to the dome 10.

[0050] In some embodiments, the laser may be set to impart microstructures 12 of different qualities and / or quantities depending on the location of the dome 10 to be treated. In some examples, there may be a variation in patterning of the microstructures 12 on the top of the dome 10 as compared to the sides of the dome 10, which can further improve the antisoiling properties of the dome. For example, the top of the dome 10 may be provided with microstructures 12 in order to impart a hydrophobic quality to the top of the dome 10, while the sides of the dome 10 may be provided with microstructures 12 to impart a hydrophilic quality to the sides of the dome 10. In some embodiments, the opposite configuration may occur, and in still other embodiments, only one of the top or the sides of the dome 10 is provided with microstructures 12, while the other part(s) are left untreated.

[0051] In still other embodiments, microstructures 12 may be imparted only to a part, and not an entirety, of the exterior surface 11 A of the dome 10. That is, only some of the exterior surface 11 A may be treated so as to form microstructures. This may be only the top, only the sides, or only some other portion or portions of the exterior surface 11 A, while the other portions of the exterior surface 11 A remain untreated and thus without microstructures.In still other embodiments, the exterior surface 11 A may or may not be provided with the microstructures 12, and the interior surface 1 IB may be provided with the microstructures 12. This may, for example, reduce the likelihood of scratches on the interior surface 1 IB or dust contamination during assembly.

[0052] Figs. 3C and 3D show a linear and three-dimensional configuration of a sine wave / peak function with multiple frequencies in the same direction. This setting of a parameter of the laser may allow for certain predefined characteristics of the microstructures to be imparted. Such a parameter may improve the dust repellant property of the surface treated with the microstructures 12.

[0053] Figs. 3E and 3F show configurations of peaks (Fig. 3E) and holes (Fig. 3F) of the sine function and variations thereto in order to impart desired microstructure characteristics to the dome 10. This shows, for example, the dimensionality of the patterning to be three-dimensional and may have a periodicity equal in both the x and y directions.

[0054] In embodiments, the microstructures 12 can be provided to the exterior surface 110 of the dome 10 in order to achieve anti-soiling or anti-dew properties, while still achieving the spectral flatness required of an irradiance device, for example the flatness required by ISO standard IS09060:2018. This can advantageously be achieved while still limiting the size of a spectral error and while still achieving the necessarily direction response required from the irradiance device. In embodiments where dew and / or rain is reduced on the surface of the dome 10, rime and frost may consequently be reduced, which is advantageous in particular environments such as deserts and very cold environments. For example, the embodiments described herein may allow for sufficient compliance with the IEC 61724-1 standard, which indicates that the effects of dew and frost accumulation on irradiance sensors shall be mitigated for locations where dew or frost is expected during mode than 2% of annual Global Horizontal Irradiance (GHI) hours.

[0055] In some embodiments, the laser may be configured so as to create a predefined pattern of microstructures 12 that have an average peak to valley inclination of at least 30 degrees, or at least 45 degrees, or at least 70 degrees, or at least 80 degrees. A traditional polished dome, on the contrary, has a lower average inclination angle and cannot achieve the required spectral flatness and the anti-soiling properties achieved by the instant embodiments.

[0056] The laser-treated dome 10 may further achieve a microstructured surface that can have a pre-defined pattern, which cannot be achieved by traditional polished transparent surfaces. Further, the microstructured surface of the dome 10 of the instant embodiments may also achieve a higher height in structuring than of a traditional polished dome. Still further, the laser-treated and microstructured dome 10 may allow for a compensation for the spectral effect of the dome, a diffuser and a thermopile absorber.

[0057] In some embodiments, an anti-reflective coating can be added either in addition to or in lieu of the imparted microstructures. This anti-reflective coating may be used to enhance the performance of the irradiance measurement device by making the device spectrally flat by compensating for Fresnel reflections. Still further, a laser pattern can be used to create an optical filter on the surface of the dome 10, which may reduce negative effects on sensitivity from Fresnel-induced variations. Such configurations can also improve the spectral range of the irradiance measurement device.

[0058] The irradiance measurement device may also include a black absorber or black coating surface, which may be created by patterning a solid carbon, or some other black, spectrally flat material, disk using the laser. This can be done advantageously to avoid a labor-intensive process of spray painting a black coating surface. Such black absorber may be done in a way to mimic the grain structure of paint through a laser patterning process, so as to create a comparable anti-glare effect as a spray-painted black coating by a less labor intensive process.

[0059] The dome 10 may also be provided with an anti-reflective coating, for example a chemical vapor deposition (CVD) coating, which may further improve anti-soiling effects while still complying with ISO standards for appropriate spectral flatness. Such a CVD coating may be used in concert with the laser treatment and microstructures described herein.

[0060] Another example of an irradiance measurement device is shown as a pyrheliometer 1 A with reference to Figs. 4 and 5. The pyrheliometer 1 A functions similarly to the pyranometer of Figs. 2 and 3, but provides for an approximately 5° field of view and measures direct beam solar irradiance through a window portion 100 and to a thermopile sensor disposed within a cavity 35 A, similar to that of the pyranometer. In the embodiments of Figs. 4 and 5, the window portion 100 of the pyrheliometer 1A and / or the body 20 and / or sensor within the housing may be treated similarly to the dome 10 of Figs. 2 and 3, and may thus have microstructures 120 provided thereon. The microstructures 120 may be provided similarly and structured similarly to the microstructures 12 described with reference to Figs. 2 and 3.

[0061] In embodiments and as shown in Fig. 5, the pyrheliometer may be mounted on a tracker 50 in order to be properly positioned to detect and measure the solar irradiance through the window portion 100.

[0062] In addition to the benefits achieved by the irradiance measurement device described with reference to Figs. 2 and 3, the irradiance measurement device of Figs. 4 and 5 may further reduce man hours of cleaning and the difficulties of cleaning a small window housed within the protruding outer walls surrounding the pyrheliometer.

[0063] Fig. 6 shows an irradiance measurement device represented as a pyrgeometer IB. The pyrgeometer IB may measure near-surface infrared (IR) radiation and not necessarily solar radiation. The pyrgeometer includes a thermopile sensor sensitive to radiation within a certain range, for example from 200 nm to 100 microns. The pyrgeometerincludes a meniscus portion 15 with both a dome portion 10 and window portion 100. In this case, the dome portion 10 and / or window portion 100 may be made of a material such as silicon. The dome portion 10 and / or window portion 100 may have a transmittance, for example between 4.5 and 50 microns, eliminating or reducing solar shortwave radiation. Microstructures 120 may similarly be provided on the window portion 100, the body 20, or a sensor in a manner similar to those described with reference to Figs. 2-5. Further, in some embodiments, the window portion 100 is a flat window portion that is not part of a meniscus.

[0064] As shown in Fig. 7, the pyrgeometer IB includes a bubble level 40 similar to that shown in the pyranometer in Fig 2, to aid in leveling the pyrgeometer to ensure that the solar irradiance can be properly measured. The pyrgeometer IB also includes feet 21 to aid in positioning and manipulation of the device.

[0065] Within the scope of this disclosure is a pyranometer (e.g., one as shown with reference to Figs. 2 and 3) or other irradiance measurement device that has a non-dome shape, for example one a meniscus shape as in the pyrgeometer of Figs. 6 and 7, or any shape that is less curved than the full dome shape shown in Figs. 2 and 3. In this case, the dome shape may be generally ellipsoid and have a lower height relative to its base, which may allow for a robotic cleaner to more easily reach and clean an entirety of the dome, and reduce the likelihood of breakage when cleaned by a robotic cleaner. Further in some embodiments, either in addition to or instead of the microstructure treatment described herein, a spectrally flat dome surface treatment may be provided in order to prevent soiling. This may reduce the likelihood that the subsequent or prior treatments (e.g., to impart microstructures) do not unduly affect the spectral flatness characteristics necessary in solar irradiance devices. In some embodiments, this surface treatment may be in lieu of, or include, an additional filter.

[0066] In some embodiments, an optimized nanostructure can be provided. Such a structure can block IR radiation and thereby reduce an unwanted zero offset caused by IR emission.

[0067] Further, while the disclosure above includes descriptions of an irradiance measurement device having microstructures 12, further within the scope of this disclosure is any individual part of the irradiance measurement device, including parts described herein or any other part to be manufactured or included as part of an irradiance measurement device, having microstructures 12. That is, it is within the scope of this disclosure to have a part provided with microstructures 12, where the part may ultimately be included as a part of an irradiance measurement device.

[0068] While described in some detail heretofore, Fig. 8 shows a method of imparting microstructures to a portion of an irradiance measurement device, for example the dome 10 of Figs. 2 and 3, the window of Figs. 4 and 5, any or both of the dome 10 and window portion 100 of Figs. 6 and 7, and any combination thereto, or to any portion of the body 20 or sensor 25 described with respect to any of the above Figures. In a step 801, a parameter of a microstructure-imparting device is set. The parameter may be preset, set by a user from one or more preset options, set iteratively by a user, or may be determined by a software processor that has learned characteristics of the target area, for example using machine learning. The microstructure-imparting device may be a laser or any other device capable of imparting microstructures or nanostructures to a portion made of glass, silicon, or another material.

[0069] In a step 802, the method includes orienting the portion to a first position. By setting the portion to an initial position, accurate and appropriate treatment of the microstructures may be achieved.

[0070] In a step 803, the method includes laser treating the portion to introduce microstructures to a surface of the portion. The laser treatment may be any or all of the treatments described with reference to Figures 2-8. Additionally, the method could instead employ a treatment that is done by a different microstructure-imparting device (e.g., not a laser), as described heretofore.

[0071] In some embodiments, a step 804, which may be done during the step 803 of treating, involves moving the portion from a first position to a different second position. The portion may be moved manually by a human either independently or by use of a machine, or may be moved automatically by a machine operating based upon programming. Having the portion moved, for example by multi-axis motive methods, can manipulate the portion to a desired location with respect to the laser source, which can improve the ability to microtreat a surface, particularly a curved surface. While step 804 indicates movement from one position to a second position, the portion can be further moved numerous times during the treatment in order to allow for the most efficient and precise treatment of the portion.

[0072] The flowcharts in the Figures illustrate the architecture, functionality, and operation of possible implementations of apparatuses and methods according to various embodiments of the present disclosure. In this regard, each block in the flowchart may represent a module, segment, or portion the method or apparatus, and the functions noted in the block may occur out of the order noted in the Figures. For example, two blocks shown in succession may, in fact, be executed substantially concurrently, or the blocks may sometimes be executed in the reverse order, depending upon the functionality involved.

[0073] Although the preceding description has been described herein with reference to particular means, materials and embodiments, it is not intended to be limited to the particulars disclosed herein; rather, it extends to all functionally equivalent structures, methods and uses, such are within the scope of the appended claims.

Claims

WHAT IS CLAIMED IS1. An irradiance measurement device, comprising: at least one sensor configured to measure irradiance; and a body within which the at least one sensor is provided, wherein at least part of a surface of the body and / or of at least part of a surface of the at least one sensor is provided with at least one microstructure.

2. The irradiance measurement device according to claim 1, wherein the body includes a radiation-transparent portion through which at least a part of radiation passes, and a surface of the radiation-transparent portion is provided with the at least one microstructure.

3. The irradiance measurement device according to claims 1 or 2, wherein the body further comprises at least one optical element, and the at least one optical element is provided with the at least one microstructure.

4. The irradiance measurement device according to any of claims 1-3, wherein the at least one microstructure exhibits a hydrophobic quality to a microstructured surface having the at least one microstructure as compared to a commensurate surface without microstructures.

5. The irradiance measurement device according to any of claims 1-4, wherein the at least one microstructure exhibits a hydrophilic quality to the microstructured surface as compared to a commensurate surface without microstructures.

6. The irradiance measurement device according to any of claims 1-5, wherein the at least one microstructure exhibits a dust-repellent effect to the microstructured surface as compared to a commensurate surface without microstructures.

7. The irradiance measurement device according to any of claims 1-6, wherein the at least one microstructure exhibits a dew-repellent effect to the microstructured surface as compared to a commensurate surface without microstructures.

8. The irradiance measurement device according to any of claims 2-7, wherein the radiation-transparent portion has a domed configuration.

9. The irradiance measurement device according to any of claims 2-8, wherein the radiation-transparent portion includes a window portion.

10. The irradiance measurement device according to any of claims 2-9, further comprising a plurality of microstructures, wherein a first portion of the radiation-transparent portion has a first spacing between adjacent microstructures, and at least one side portion of the radiation-transparent portion has a second spacing between adjacent microstructures different from the first spacing.

11. The irradiance measurement device according to any of claims 2-10, wherein the radiation-transparent portion comprises glass.

12. The irradiance measurement device according to any of claims 1-11, wherein an average breadth of the microstructures is from 1 nanometer to 1 millimeter.

13. The irradiance measurement device according to any of claims 1-12, wherein the microstructures have a predetermined pattern with an average peak-to-valley inclination of at least 45 degrees.

14. The irradiance measurement device according to any of claims 1-13, wherein the irradiance measurement device is at least one of a pyranometer, a pyrheliometer and a pyrgeometer.

15. The irradiance measurement device according to any of claims 1-14, further comprising an anti -reflective coating on at least a portion of the body.

16. A method for imparting microstructures to an irradiance measurement device, the method comprising: setting at least one parameter of a microstructure-imparting device; orienting a portion of the irradiance measurement device to a first position; and treating the portion to introduce microstructures to a surface of the portion,wherein the microstructures impart a quality to the portion based upon the set parameter.

17. The method according to claim 16, further comprising moving the portion from the first position to a second position during the treating step.

18. The method according to claim 16 or claim 17, wherein the portion is a radiation-transparent portion.

19. A part of an irradiance measurement device, wherein the part comprises a surface, and the surface comprises at least one microstructure.

20. An irradiance measurement device comprising the part according to claim 19.

Citation Information

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