Automatic analysis device

Abstract

The present invention is configured as follows in order to provide an automatic analysis device which achieves high reliability by avoiding suction / discharge of a sample in an abnormal state.　The automatic analysis device comprises: a probe for dispensing a liquid; a probe movement mechanism that moves the probe; a jig for adjusting the position of the probe, the jig being disposed on a movement trajectory of the probe; and a sensor for detecting contact between the jig and the probe. The jig includes: a position adjustment space having a substantially cylindrical shape, for adjusting the position of the probe by moving the probe in a horizontal direction in a state in which the probe is inserted and detecting contact with the probe by the sensor; and a position adjustment tolerance confirmation space having a substantially cylindrical shape with a diameter that is smaller than that of the position adjustment space, for confirming a position tolerance of the probe on the basis of a detection result of the presence or absence of contact between the probe and the jig by the sensor when the probe is lowered.

Description

automatic analyzer

[0001] The present invention relates to an automatic analyzer.

[0002] Patent Document 1 describes a cylindrical positioning block that automatically returns (automatically adjusts) a probe that dispenses liquid in an automatic analyzer to its original position if it becomes misaligned. This block has two types of spaces: a cylindrical space for checking the position of the probe tip and a larger cylindrical space above the space for position adjustment.

[0003] Japanese Patent Application Laid-Open No. 2012-242106

[0004] In the automated analyzer described in Patent Document 1, even if the sample probe is deformed and significantly misaligned, the automatic adjustment process is completed as long as the probe can be inserted into the position confirmation space. As a result, the sample is aspirated and discharged in an abnormally deformed state of the probe, which may affect analytical performance. Furthermore, even if a fatal abnormality in the device operation occurs, such as deformation of the sampling arm or misalignment of the positioning block, the analysis operation is performed as long as the probe can be inserted into the position confirmation space, which could lead to malfunctions.

[0005] An object of the present invention is to provide a highly reliable automatic analyzer that can avoid aspirating and discharging a sample under abnormal conditions.

[0006] As an example for solving the above-mentioned problems, the present invention has the following configuration: An automatic analyzer including a probe for dispensing liquid, a probe movement mechanism for moving the probe, a jig arranged on the movement trajectory of the probe for adjusting the position of the probe, and a sensor for detecting contact between the jig and the probe, wherein the jig has a position adjustment space having a substantially cylindrical outer or inner diameter for adjusting the position of the probe by moving the probe horizontally and detecting contact with the probe by the sensor, and a position adjustment tolerance confirmation space having a substantially circular shape with a smaller circular diameter than the outer or inner diameter of the position adjustment space, for confirming the position tolerance of the probe based on the detection result of whether or not the probe is in contact with the jig by the sensor when the probe is lowered.

[0007] According to the present invention, it is possible to provide a highly reliable automatic analyzer by preventing the aspirating and discharging of a sample under abnormal conditions. Problems, configurations, and effects other than those described above will become clear from the description of the following embodiments.

[0008] FIG. 1 is a diagram showing the overall configuration of an automatic analyzer according to an embodiment. FIG. 2 is a diagram showing an example of the configuration of a dispensing drive mechanism. FIG. 3 is a diagram showing top and side views of a jig. FIG. 4 is a diagram explaining the steps of a positioning process in which the dispensing drive mechanism uses multiple contact points. FIG. 5 is a diagram showing a flowchart during analysis by the automatic analyzer. FIG. 6 is a diagram showing top and side views of a modified example of the jig 120. FIG. 7 is a diagram showing top and side views of a modified example of the jig 120. FIG. 8 is a diagram showing top and side views of a modified example of the jig 120. FIG. 9 is a diagram showing a modified example of the flowchart during analysis.

[0009] Hereinafter, an embodiment of the present invention will be described with reference to the drawings. Note that the embodiment of the present invention is not limited to the embodiment examples described below, and various modifications are possible within the scope of the technical concept.

[0010] 1 shows an example of the overall configuration of an automatic analyzer 101. The automatic analyzer includes a sample cup (also referred to as a "specimen container" or "specimen cup") 102 containing a sample (also referred to as a "specimen" or "sample"), a sample rack 103 on which a plurality of sample cups 102 are placed, a rack transport line (sometimes simply referred to as a transport line) 104 for transporting the sample rack 103, a reagent disk 106 containing reagent bottles 105, a cell (also referred to as a reaction container) 107 for mixing the sample and reagent to form a reaction liquid, a cell disk (also referred to as a reaction disk) 108 on which a plurality of cells 107 are arranged, a sample dispensing mechanism 109 that dispenses a predetermined amount of sample from the sample cup 102 into the cell 107, reagent dispensing mechanisms 110 and 111 that dispense a predetermined amount of reagent from the reagent bottle 105 into the cell 107, stirring mechanisms 114 and 115 that stir and mix the sample and reagent in the cell, and a mixing mechanism 116 for mixing the reaction liquid in the cell 107. The apparatus is equipped with a detection unit 112 that irradiates light and receives the resulting light, a washing unit 113 that washes the cell 107, washing mechanisms 116 and 117 that wash the reagent probes provided in the reagent dispensing mechanism, a washing mechanism 118 that washes the sample probe provided in the sample dispensing mechanism 109, an analysis module 119 for analyzing samples using a method different from the light intensity analysis used by the detection unit 112, a jig 120 that checks and adjusts the position of the sample dispensing mechanism 109, a control unit 121 that controls each part of the apparatus, a data storage unit 122 that stores various types of data, an input unit 123 that can input necessary data from the outside to the data storage unit 122, a measurement unit 124 that acquires information obtained from the detection unit 112 and the analysis module 119, an analysis unit 125 that calculates the amount of components in the sample from the information from the measurement unit 124, and an output unit 126 that can display data and output it to the outside.

[0011] The reagent disk 106 and the cell disk 108 are both disk-shaped and are rotated about a rotation axis. The reagent bottles 105 and the cells 107 are arranged at outer peripheries of the reagent disk 106 and the cell disk 108, respectively.

[0012] The configuration may also be such that the analysis module 119 is not present, or may include only the analysis module 119, the cleaning mechanism 118, the sample dispensing mechanism 109, the transport line 104, and the sample rack 103.

[0013] The amounts of components in a sample are analyzed according to the following procedure. Here, an example of an analysis method that does not use the analysis module 119 will be described. A predetermined amount of sample in the sample cup 102 is dispensed into a cell by the sample dispensing mechanism 109. Next, a predetermined amount of reagent in the reagent bottle 105 is dispensed into the cell 107 by the reagent dispensing mechanism 110 or 111. Next, the sample and reagent in the cell 107 are stirred using the stirring mechanism 114 or 115 to form a reaction liquid. If necessary, multiple reagents are additionally dispensed into the cell 107 by the reagent dispensing mechanism 110 or 111. During these dispensing operations, the sample cup 102, reagent bottle 105, and cell 107 are moved to their respective predetermined positions by transporting the sample rack 103 and rotating the reagent disk 106 and cell disk 108.

[0014] When the reaction is complete, the inside of the cell 107 is washed by the washing unit 113, and the next analysis is performed. The absorbance of the reaction solution is measured by the detection unit 112 and the measurement unit 124, and stored (memorized) as absorbance data in the data storage unit 122. The stored absorbance data is analyzed in the analysis unit 125 based on the calibration curve data and Lambert-Beer's law. This analysis makes it possible to analyze the amount of components contained in the sample. Data required for control and analysis of each unit is input from the input unit 123 to the data storage unit 122. Various data and analysis results are displayed and / or output by the output unit 126.

[0015] FIG. 2 shows an example of the configuration of the sample dispensing mechanism 109 used in this embodiment. In this embodiment, an arm 128 is attached to the upper end of a shaft 127 that can move up and down. A dispensing probe (also referred to as a "sample probe") 129 is attached to the arm 128 and extends downward (in the Z direction). The shaft 127 is connected to a shaft fixing base 150, allowing the arm 128 to rotate around the shaft 127 as a rotation axis, and further allowing the arm 128 to move up and down (as a result, the dispensing probe 129 can also rotate and move up and down). The shaft fixing base 150 is fixed to a stage 151 that moves in at least one axial direction. This allows the sample probe 129 to move in the X, Y, and Z directions. Note that other mechanisms may be used as long as they can move the sample probe 129 in the X, Y, and Z directions. The sample dispensing mechanism 109 is equipped with a contact sensor (not shown) that detects contact between the dispensing probe 129 and other components (other objects). The contact sensor can be of various types, such as capacitance type, optical type, or current measurement type, and these types can be used alone or in combination.

[0016] The process of checking and adjusting the position of the sample probe 129 in one embodiment of the present invention will be described with reference to Fig. 3. Fig. 3 is a top view and a side view of the jig 120. The jig 120 has a position adjustment margin confirmation space 131 and a position adjustment space 132, which are concentrically arranged.

[0017] In the position confirmation process, the sample probe 129 is first moved to the top of the jig 120 to confirm its current position. Specifically, the sample probe 129 is lowered toward the jig 120, and when a contact sensor detects that the sample probe 129 has contacted the jig 120, the descent of the sample probe 129 is immediately stopped. The amount of descent from the start of descent to contact can be calculated from the number of steps of a stepping motor mounted on the shaft fixing base 150 for moving the sample probe 129 up and down. Based on this amount of descent, it can be determined whether the sample probe 129 has contacted the position adjustment margin confirmation space 131 of the jig 120, the lower surface of the position adjustment space 132 (the upper surface of the jig 120 as viewed from the jig 120), or the outside of the jig 120 (e.g., the surface of the upper panel of the device). Through this position confirmation process, it can be determined in which space within the jig 120 the sample probe 129 has stopped.

[0018] 3 is used, the position confirmation process can be performed by determining whether the contact sensor is in contact with the jig 120. That is, by setting the maximum lowering position of the sample probe 129 above the bottom surface of the positioning tolerance confirmation space 131, if the sample probe 129 does not come into contact with anything when it is lowered toward the jig 120, it can be determined that the sample probe 129 is within the space (circle) of the positioning tolerance confirmation space 131. If the sample probe 129 is outside the space (circle) of the positioning tolerance confirmation space 131, for example, if it is in the positioning space 132, the sample probe 129 will come into contact with the jig 120 before reaching the maximum lowering position, and therefore it can be determined that the sample probe 129 is not within the space (circle) of the positioning tolerance confirmation space 131.

[0019] When the position confirmation process is performed based on the contact sensor not contacting the jig 120, it is possible to reduce the possibility that the tip of the sample probe 129 will come into contact with the jig 120 and the shape of the tip of the sample probe 129 will be deformed. Also, if liquid adheres to the tip of the sample probe 129, it is possible to prevent the jig 120 from becoming contaminated with the liquid. Normally, when the sample probe 129 comes into contact with another object, the tip of the sample probe 129 is retracted by a spring mechanism, so there is almost no possibility that the tip will be deformed even if it comes into contact with another object.

[0020] If the position of the sample probe 129 shifts significantly and it descends outside the outer periphery of the jig 120 (i.e., onto the upper panel of the automatic analyzer on which the jig is mounted), the sample probe 129 will descend to the surface of the upper panel without coming into contact with the jig 120 during its descent, and an obstacle sensor (crash sensor) mounted on the sample probe will detect that it has come into contact with an obstacle, causing the control unit to stop the descent of the probe. The processing that follows position confirmation differs depending on which space within the jig the sample probe 129 is positioned in.

[0021] If it is determined that the position is within the position adjustment margin confirmation space 131, a position adjustment process is executed.

[0022] The position adjustment process of the present invention will now be described in detail. To achieve the position adjustment process, the sample probe 129 provided in the sample dispensing mechanism 109 needs to have two degrees of freedom in the horizontal direction. To achieve this, for example, the arm 128 may have a hinged rotary joint midway, or the shaft fixing base 150 may be fixed to a stage 151 that moves in at least one axial direction, thereby ensuring two degrees of freedom in the horizontal direction.

[0023] Below, an example configuration will be described that combines the rotational movement θ of the shaft and the linear movement D of the stage 151 described in Figure 2. Figure 4 shows the position of the sample probe on the XY plane coordinate system. The position of the sample probe 129 changes due to the rotational movement θ and the linear movement D. At this time, the position (x, y) of the sample probe 129 on the XY plane coordinate system is expressed as in Equation 1 and Equation 2 using the length L from the shaft 127 to the sample probe 129.

[0024]

[0025]

[0026] Furthermore, the rotational movement θ and linear movement D can be calculated from the XY coordinates using the following equations 3 to 5.

[0027]

[0028]

[0029]

[0030] In the position adjustment process, first, the sample probe 129 is brought into contact with the inner wall of the position adjustment space 132 multiple times, and N contact points (x ｎ , y ｎ The adjusted center coordinate point Q(x After , y After ) and the radius r of a circle approximating the inner wall of the position adjustment space 132.

[0031]

[0032]

[0033]

[0034]

[0035] Next, the calculated adjusted central coordinate point Q(x After , y After ) into Equations 3 to 5, the center coordinates are calculated as the pre-adjustment center coordinate point P(x before , y before) to the adjusted central coordinate point Q(x After , y After ) can be calculated. As a result, the rotational movement θ and linear movement D of the center coordinates are updated to the newly calculated values, thereby realizing the position adjustment process.

[0036] If it is determined that the sample probe 129 is placed in the position adjustment space 132 or is present in a space outside of that, it is determined that the position of the sample probe 129 has shifted significantly from its previous position, and it is determined that there is a possibility that a serious abnormality has occurred in the operation of the device, and the operation of the device is stopped.

[0037] FIG. 5 is a flowchart showing the analysis performed by the automated analyzer. Starting from a standby state S101, an analysis preparation operation is initiated to check the operation of the reagent flow paths and various components (S102). During this operation, a position adjustment margin check S103 for the sample probe 129 is executed. If the position adjustment margin check S103 determines that the sample probe 129 is positioned within the position adjustment margin check space 131, the sample probe 129 is moved into the position adjustment space, and the sample probe position is adjusted (S104; see the description of FIG. 4 for the adjustment method), and then the analysis operation (S105) begins. However, if the sample probe 129 is determined to be positioned elsewhere, it is determined that the position of the sample probe 129 has significantly deviated from its previous position, which may indicate a serious abnormality in the device's operation. A display indicating that the device status or maintenance is required is displayed on the output unit S126 (S106), and the system returns to the standby state S101. Here, displaying a message on the output unit S126 is also referred to as "notifying," and the output unit S126 may also be referred to as the "notification unit."

[0038] 6 shows a top view and a side view of a modified example of the jig 120. The jig 120 has two position adjustment tolerance confirmation spaces 131 and 133 with different diameters. This structure makes it possible to set two thresholds when checking the tolerance, and to quantitatively evaluate the degree of misalignment.

[0039] This allows the determination of the position adjustment tolerance confirmation S103 to be made quantitatively, for example, by performing automatic adjustment when a small deviation occurs, or by checking the device status or performing maintenance when a large deviation occurs. It should be noted that there may be three or more position adjustment tolerance confirmation spaces. In the case of the jig 120 shown in Fig. 6, the position confirmation process can be performed by determining whether the contact sensor is in contact with the jig 120, as in the case of the jig 120 having the shape shown in Fig. 3.

[0040] FIG. 7 shows a top view and a side view of another modified jig 120. Unlike the jig shown in FIGS. 3 and 6 , the jig 120 shown in FIG. 7 is provided so as to protrude from the top panel of the automated analyzer. The position confirmation process when using the jig 120 shown in FIG. 7 is similar to that of the jig shown in FIGS. 3 and 6 . That is, the sample probe 129 is moved to the top of the jig 120 and then lowered toward the jig 120. If a contact sensor detects that the sample probe 129 has contacted the bottom surface of the positioning tolerance confirmation space 131 of the jig 120, it is determined that the sample probe 129 is located within the positioning adjustable range, and the process proceeds to a position adjustment step for the sample probe 129. If the sample probe 129 contacts the top surface of the jig 120 before contacting the bottom surface of the positioning tolerance confirmation space 131, or if it does not contact the jig 120 even after being lowered below the bottom surface of the positioning tolerance confirmation space 131, it is determined that the sample probe 129 is not located within the positioning adjustable range.

[0041] 3 and 6 are used, it is not possible to determine whether the sample probe 129 is within the position adjustment tolerance confirmation space 131 simply by the fact that the contact sensor does not come into contact with the jig 120. However, in an actual automated analyzer, even if the positional deviation of the sample probe 129 is large, it is often within the outer diameter (approximately 2 to 5 mm) of the jig 120 shown in FIG. 7. Therefore, when checking the positional deviation of the sample probe 129 in a regular check before starting analysis every day, even when the jig 120 shown in FIG. 7 is used, if the contact sensor does not come into contact with the jig 120, it may be determined that the sample probe 129 is not located within the position adjustment range, as in the case of using the jig 120 shaped as shown in FIGS. 3 and 6, and control may be exercised to proceed to the position adjustment step described below.

[0042] If it is determined that the sample probe 129 is located within the position adjustable range, the sample probe 129 is temporarily raised, rotated, and lowered to the position adjustment space 132, and then the position adjustment process is performed. The position adjustment process when using the jig 120 shown in Figure 7 is slightly different from the adjustment method when using the jig shown in Figures 3 and 6. That is, when performing position adjustment using the jig 120 shown in Figures 3 and 6, contact of the jig 120 with the inner circumferential surface of the position adjustment space 132 is detected, and position confirmation and position adjustment are performed. However, when using the jig 120 shown in Figure 7, contact of the sample probe 129 with the outer circumferential surface of the jig 120 is detected, and position confirmation and position adjustment are performed.

[0043] Specifically, the sample probe 129 contacts a position adjustment space 132 provided on the side of the jig 120 during the position adjustment process. This allows N contact points (xn, yn) to be calculated from the sensor information, and the adjusted central coordinate point Q can be determined by the position adjustment process described above. The jig 120 shown in FIG. 7 has a smaller outer diameter than the jigs shown in FIGS. 3 and 6 , thereby saving space within the device. Note that the terms "position adjustment space 132" and "space" are used in FIG. 7 to match the notations in FIGS. 3 and 6 and in the claims. However, as can be seen from the drawing, the "position adjustment space 132" refers to a virtual space outside the jig 120 above the top panel of the device, rather than a so-called "space" surrounded by a periphery as in FIGS. 3 and 6 . In Figure 7, the outer periphery of the position adjustment space 132 is shown as being separated by a dashed circle, but such dashed boundary does not actually exist and is shown to provide an indication of the size of the space for position adjustment space 132.

[0044] FIG. 8 shows a top view and a side view of another modified example of the jig 120. In the jig 120 of FIG. 8, the space above the protrusion on the top surface of the jig is allocated as the position adjustment tolerance confirmation space 131 (a virtual position adjustment tolerance confirmation space). As in FIG. 7, the outer side surface of the jig 120 is allocated as the virtual position adjustment space for the position adjustment space 132. The method for checking and adjusting the position of the sample probe 129 when using the jig 120 of FIG. 8 is the same as that shown in FIG. 7, and therefore a description thereof will be omitted. In addition to the effects of FIG. 7, the jig 120 of FIG. 8 has the advantage of being easy to clean even when dust or the like accumulates, since the jig 120 of FIG. 8 does not have any recesses.

[0045] 9 shows a top view and a side view of a further modified example of the jig 120. The jig 120 is cylindrical, and the space above the top surface of the jig is allocated as a position adjustment margin confirmation space 131 (a virtual position adjustment margin confirmation space). As in FIG. 7, the outer side surface of the jig 120 is allocated as a virtual position adjustment space 132. This structure makes it possible to design the jig with a smaller diameter than the jig 120 in FIG. 7, thereby enabling further space savings within the apparatus.

[0046] Fig. 10 shows a modified example of the flowchart for analysis shown in Fig. 5. If the position adjustment margin confirmation S103 determines that the margin is insufficient (NG in Fig. 7), and the system returns to the standby state as shown in Fig. 5 each time, the analysis will be interrupted each time, which may cause problems with the analysis.

[0047] 10 shows an embodiment in which, even if the position adjustment tolerance check S103 determines that the tolerance is insufficient (NG in FIG. 7), if the degree of misalignment is small, it is determined that there will be no problem with the current analysis, and automatic position adjustment is executed (S104), and the analysis operation is carried out. In this embodiment, a case in which the degree of misalignment is small is assumed to be when the sample probe 129 comes into contact with the jig in the position adjustment space (S107).

[0048] If the answer in S107 is YES and automatic position adjustment is performed, it may be necessary to perform quality control, such as measuring a quality control sample, before starting the analysis operation after the position adjustment. This makes it possible to perform the analysis after confirming that there is no impact on the analytical performance.

[0049] If the result of S107 is NO, maintenance is recommended (S106) as in FIG. 5, and the process returns to the standby state (S101).

[0050] In S107, the answer is set to YES if the jig is contacted within the position adjustment space, but it can also be set to YES if the top surface of the jig is contacted (in this case, the answer is NO only if the top panel of the automatic analyzer is contacted).

[0051] Furthermore, if the jig comes into contact with the position adjustment space and the answer is YES in S107, there is a possibility that an abnormality has occurred, so by notifying the equipment operator of this, the user can check the equipment status and perform maintenance at the appropriate time, thereby avoiding unexpected downtime.

[0052] The present invention is not limited to the above-described exemplary embodiments, and various modifications are possible. For example, the above-described exemplary embodiments have been described in detail to clearly explain the present invention, and are not necessarily limited to those including all of the described configurations. Furthermore, it is possible to replace a portion of one exemplary embodiment with a configuration of another exemplary embodiment, or to add a configuration of another exemplary embodiment to a configuration of one exemplary embodiment. Furthermore, it is also possible to add, delete, or replace a portion of the configuration of each exemplary embodiment with another configuration.

[0053] 101 Automatic analyzer, 102 Sample cup, 103 Sample rack, 104 Rack transport line, 105 Reagent bottle, 106 Reagent disk, 107 Cell, 108 Cell disk, 109 Sample dispensing mechanism, 110 Reagent dispensing mechanism, 111 Reagent dispensing mechanism, 112 Detection unit, 113 Cleaning unit, 114 Stirring mechanism, 115 Stirring mechanism, 116 Cleaning mechanism, 117 Cleaning mechanism, 118 Cleaning mechanism, 119 Analysis module, 120 Jig, 121 Control unit, 122 Data storage unit, 123 Input unit, 124 Measurement unit, 125 Analysis unit, 126 Output unit, 127 Shaft, 128 Arm, 129 Sample probe, 131 Position adjustment tolerance confirmation space, 132 Position adjustment space, 150 Shaft fixing base, 151 Stage.

Claims

1. An automatic analyzer comprising: a probe for dispensing liquid; a probe movement mechanism for moving the probe; a jig arranged on the movement trajectory of the probe for adjusting the position of the probe; and a sensor for detecting contact between the jig and the probe, wherein the jig has a position adjustment space having a substantially cylindrical outer or inner diameter for moving the probe horizontally and adjusting the position of the probe by detecting contact with the probe by the sensor; and a position adjustment tolerance confirmation space having a substantially circular shape, the diameter of the substantially circular shape being smaller than the outer or inner diameter of the position adjustment space, and for confirming the position tolerance of the probe based on the detection result of the sensor of whether or not the probe is in contact with the jig when the probe is lowered.

2. An automatic analyzer comprising: a probe for dispensing liquid; a probe movement mechanism for moving the probe; a jig arranged on the movement trajectory of the probe for adjusting the position of the probe; and a sensor for detecting contact between the jig and the probe, wherein the jig has a position adjustment space having a substantially cylindrical shape for moving the probe horizontally while the probe is inserted and adjusting the position of the probe by detecting contact with the probe by the sensor; and a position adjustment tolerance confirmation space having a substantially cylindrical shape and a smaller diameter than the substantially cylindrical position adjustment space, for confirming the position tolerance of the probe based on the detection result of the sensor of whether or not the probe is in contact with the jig when the probe is lowered.

3. An automatic analyzer comprising: a probe for dispensing liquid; a probe movement mechanism for moving the probe; a jig arranged on the movement trajectory of the probe for adjusting the position of the probe; and a sensor for detecting contact between the jig and the probe, wherein the jig has a position adjustment space having an outer diameter of a substantially cylindrical shape for moving the probe horizontally and adjusting the position of the probe by detecting contact with the probe by the sensor; and a position adjustment tolerance confirmation space having a bottom surface of a substantially circular shape, the diameter of the substantially circular shape being smaller than the outer diameter of the position adjustment space, and for confirming the position tolerance of the probe based on the detection result of the sensor of whether or not the probe is in contact with the jig when the probe is lowered.

4. An automatic analyzer according to claim 1 or 2, characterized in that the position adjustment space and the position adjustment tolerance confirmation space are arranged in a substantially concentric manner, and the position adjustment space is arranged above the position adjustment tolerance confirmation space.

5. An automatic analyzer according to claim 2, wherein the space for checking the position adjustment tolerance comprises at least two cylinders of different diameters arranged in a substantially concentric pattern.

6. An automatic analyzer according to claim 1 or 2, characterized in that it comprises a control unit which, when lowering the probe, sets the maximum lowering position of the probe above the bottom surface of the space for confirming position adjustment tolerance, and if the probe does not come into contact with the jig when lowered to the maximum lowering position, determines that the probe is within the space for confirming position adjustment tolerance.

7. An automatic analyzer according to claim 1 or 2, characterized in that it comprises a control unit that, when the sensor detects contact between the probe and the jig within the position adjustment tolerance confirmation space when the probe is lowered, moves the probe into the position adjustment space and controls the position of the probe within the position adjustment space.

8. An automatic analyzer according to claim 1 or 2, characterized in that it comprises a control unit that controls the analysis operation using the probe to be interrupted if the sensor does not detect contact between the probe and the jig within the space for confirming position adjustment tolerance when the probe is lowered.

9. An automatic analyzer according to claim 2, characterized in that it comprises a control unit that controls the probe to adjust its position within the position adjustment space if it comes into contact with the jig within the position adjustment space, even if the sensor does not detect contact between the probe and the jig within the position adjustment tolerance confirmation space when the probe is lowered.

10. An automatic analyzer according to claim 2, further comprising an alarm unit which, when the sensor detects contact with the jig when the probe is lowered, notifies the user whether the probe has contacted the jig within the position adjustment space, within the position adjustment tolerance confirmation space, or on the top surface of the jig.

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