Advanced modular test bench for industry

Abstract

An Advanced Modular Test Bench for Industry (100) comprising a Compartment (110) that acts as the structural framework housing the internal components, a Cover (120) that secures the components inside the enclosure, a Connection Board (130) that facilitates the interconnection of modules and devices under test (DUT), a Visual Interface (140) that provides an interactive interface for test programming and real-time data visualization, a plurality of Test Terminals (150) that allow direct connection of devices under test (DUT), Switches (160) that provide manual control over critical test bench functions, a Control Base (200) that supports electronic components, a Power Supply (220), and Control Terminals (230) that enable the connection between control elements, test terminals (150), and switches (160).

Description

[0001] Advanced Modular Test Bench for Industry

[0002] FIELD OF THE INVENTION

[0003] This invention belongs to the technical field of diagnostic and evaluation systems for electronic and electrical components, with a particular focus on industrial applications, including the automotive sector. The invention specifically relates to a test bench system that integrates measurement and control capabilities into a modular and configurable platform. This allows for easy adaptation and reconfiguration to meet a wide range of industry-specific testing requirements, thereby optimizing the efficiency and effectiveness of testing and diagnostic processes.

[0004] OBJECTIVE OF THE INVENTION

[0005] The objective of this invention is to provide a modular test bench system that offers a comprehensive and flexible solution for the evaluation and diagnosis of electrical and electronic components in a variety of industrial applications. It seeks to overcome the limitations of conventional testing systems by integrating multiple measurement and control functionalities into a single platform that can be easily reconfigured to adapt to different testing needs.

[0006] Among the specific objectives of this invention are facilitating the rapid configuration and reconfiguration of the test system to accommodate a wide range of component types and test specifications, significantly reducing downtime between tests; improving the accuracy and reliability of tests through a platform that integrates advanced measurement and control technologies, allowing for a detailed evaluation of the components under test; offering an intuitive user interface and an improved operational experience, enabling users to select, configure, and execute tests efficiently without requiring specialized programming knowledge; increasing the versatility of the test bench so that it can be used in various industrial environments, including but not limited to the automotive sector, consumer electronics, and the manufacturing of electronic equipment; and to provide a cost-effective solution for companies seeking to implement high-quality testing and diagnostic practices without the need to invest in multiple specialized testing devices. In summary, this invention aims to establish a new standard in modular test bench systems, standing out for its adaptability, operational efficiency, and ability to seamlessly integrate into different industrial workflows.

[0007] BACKGROUND OF THE INVENTION

[0008] Test benches are essential equipment in the industry for evaluating the performance, durability, and safety of electrical and electronic components. These devices allow the simulation of operating conditions under which components or systems are examined to verify their compliance with technical specifications or quality standards. Traditionally, test benches have been designed and built for specific applications, meaning that their configuration, instrumentation, and software are dedicated to particular product or component tests.

[0009] This specialization has led to two main limitations. First, the need to develop and acquire different test benches for various types of tests or products increases operational and capital costs significantly for companies. Second, the rigidity of these specialized systems limits their ability to adapt to new testing requirements or the evolution of component technologies, which can result in the premature obsolescence of testing equipment.

[0010] In response to these limitations, there has been growing interest in developing more flexible and modular test bench systems. However, achieving an effective balance between flexibility, the ability to integrate multiple functionalities, and ease of use remains a significant challenge. Many existing solutions offer a certain degree of modularity but frequently require compromises in terms of operational complexity, implementation costs, or limitations in customization and expansion capabilities.

[0011] Therefore, there is a clear need in the industry for a test bench system that not only addresses these challenges by offering a truly modular and configurable platform but also integrates technological advancements to facilitate more efficient, precise, and adaptable testing in response to the rapid changes in component technology. The evolution of test benches towards more integrated and versatile systems is crucial to support the development and quality assurance of innovative products across a wide range of industrial sectors.

[0012] Among the relevant documents in the field of test benches is patent CN105892439A, titled "Test Bench for the Electrical Control System of a Packaging Box Cutting Machine." This invention describes a test bench specifically designed to evaluate the electrical control system of a packaging box cutting machine. The system is based on a modular design that utilizes an OMRON C200H PLC, buttons, an indicator lamp, and a display instrument. It incorporates modules for handling digital and analog signals, allowing for independent testing and acceptance examinations without the need to connect the electrical control system to a complete device via cable. This modular configuration facilitates adaptation to workload demands and improves work efficiency.

[0013] However, despite its modular design and focus on work efficiency, the system described in CN105892439A is limited to specific applications related to packaging box cutting machines. Additionally, its reliance on a specific PLC and its dedicated configuration for electrical control system testing do not encompass the breadth and flexibility required to adapt to a variety of electrical and electronic components across multiple industries.

[0014] Furthermore, the "Advanced Modular Test Bench for Industry" is built on the foundation of a multicore CPU with at least three dedicated cores, each responsible for specific tasks that ensure the reliability and precision of test operations. With capabilities that go beyond those of a traditional test system, as described in CN105892439A, our test bench is capable of handling a broader range of signals and protocols such as SPI, Serial, I2S, CAN, LIN, FlexRay, and I / O buses, thus providing a comprehensive solution that adapts to the dynamic needs of different devices and electronic components.

[0015] In contrast, our invention proposes an "Advanced Modular Test Bench for Industry" that overcomes these limitations by offering a highly adaptable and configurable testing platform, not restricted to a specific type of machine or component. Our solution integrates a wide range of measurement and control functionalities, including but not limited to multimeters, ammeters, frequency generators, and control units, all within a single platform. Additionally, our system promotes advanced interaction through modern user interfaces and allows for easy reconfiguration and expansion via modular components and embedded software. This facilitates its application across a much broader range of industrial contexts, offering a more versatile and efficient solution for current testing and diagnostic needs.

[0016] Another relevant document in the field of test benches is patent CN 110580036, which describes an "IPCU test bench." This document discloses a system designed to evaluate the Interface of Unit Process Control (IPCU), consisting of a host, a cabinet, a control box, and a load simulation box. The main innovation lies in its ability to perform automated IPCU tests, controlled by an upper-level computer program, facilitating realtime communication between the host, the control box, and the load box. It stands out for its predefined testing methodology, which enables the automatic execution of all IPCU testing elements, including mechanical and electrical inspections, power consumption analysis, serial interfaces, and over-temperature control.

[0017] However, this invention focuses primarily on the evaluation of IPCUs, with a specific design that limits its application to this type of device. The structure and functionality of the system are highly specialized, which could restrict its adaptability to other testing applications outside the specific scope of IPCUs. Additionally, it does not mention the use of a multicore architecture in the CPU or the management of multiple communication protocols simultaneously, elements that are essential for flexibility and scalability in modern test benches.

[0018] In contrast, our invention, the "Advanced Modular Test Bench for Industry," significantly expands the versatility of the test bench concept. With a multicore CPU that assigns specific functions to each core, our solution effectively and reliably manages multiple parallel tasks, ensuring data integrity and operational efficiency. The individual cores are specialized in handling the user interface, managing I / O ports, and facilitating communication through buses or protocols such as CAN, LIN, and FlexRay, as well as other automotive buses. This multicore architecture allows our test bench to dynamically adapt to a wide range of industrial applications and is not limited to IPCU evaluation.

[0019] In contrast, our invention, the "Advanced Modular Test Bench for Industry," overcomes these limitations by providing a broader and more adaptable solution. Our system is not restricted to evaluating a specific type of device such as IPCUs but instead offers a versatile and configurable platform capable of adapting to a variety of electrical and electronic components across multiple industries. We incorporate a much wider range of measurement and control functionalities, supported by a modular architecture that enables easy reconfiguration and expansion. This ensures that our system can meet the evolving testing and evaluation needs across various industrial contexts, marking a significant advancement over the more specialized test systems described in documents such as CN 110580036.

[0020] Within the context of innovations in the field of test benches, the document CN211123143U, titled "CPU Sheet Test Bench for Control Box," is relevant. This invention proposes a system focused on evaluating CPU boards of control boxes, highlighting its structure, which includes a cabinet, a test cable, a test unit, and a power supply. The main advantage lies in its ability to efficiently and accurately test CPU boards through a conveniently designed operation interface, improving detection accuracy and reducing the time and effort required in the process. Through the integration of an optical code input circuit and a circuit advanced input, the test bench facilitates detailed and precise detection, allowing for an in-depth analysis of the technical performance of CPU boards.

[0021] However, the specific focus of this utility model on CPU boards for control boxes suggests a more limited application compared to broader testing needs in the industrial sector. While this invention significantly improves the detection process for its specific application field, it may not offer the necessary flexibility to address a wider variety of electrical and electronic components.

[0022] On the other hand, our "Advanced Modular Test Bench for Industry" is built on an advanced architecture, with a multicore CPU that enables efficient task distribution and ensures reliability in data processing. Each CPU core specializes in critical functions such as user interface management, reading analog and digital inputs, and handling data acquisition and transmission through multiple communication protocols and buses. This architecture provides significant versatility, enabling the system to perform complex simulations and manage a variety of essential electronic tests across different industrial sectors, not limited solely to control box component testing. Likewise, the proposed "Advanced Modular Test Bench for Industry" is presented as a comprehensive and versatile solution, overcoming the limitations of more specialized systems such as the one described in CN211123143U. Our system is not restricted to evaluating specific components; rather, it is designed to adapt to a broad spectrum of tests for different components and industrial devices. This is achieved through its modular and configurable design, which allows not only for precise and efficient testing in various applications but also for rapid adaptation to new testing requirements, making it an invaluable tool for quality assurance and product development across multiple industries.

[0023] Another relevant precedent in the field of test benches is document CN212229484U, which presents a "multifunctional general-type ECU test bench." This utility model reveals a system designed to test electronic control units (ECUs) for automobiles, highlighting its ability to adapt to ECUs of different models thanks to its adjustable structure. The system includes a frame with guide rails for ECU installation, allowing adjustments to accommodate different ECU sizes and configurations, and a monitoring module to evaluate voltage and other critical electrical parameters of the ECUs. This test bench also incorporates measures for the physical and electromagnetic protection of ECUs, as well as the standard management of these devices during testing.

[0024] Despite the innovations that CN212229484U provides in terms of flexibility and functionality for ECU testing, this system remains relatively focused on a specific range of electronic components within the automotive sector, particularly on the rails used in the bench for component placement. Its specialized design for ECUs, although advanced, may not cover the diversity of testing required in other industrial contexts or for other types of electrical and electronic devices beyond automobiles.

[0025] In contrast, our system, the "Advanced Modular Test Bench for Industry," stands out for its integrated approach and advanced multicore architecture. Each CPU core is dedicated to specific functions, such as coordinating the visual interface, managing inputs / outputs, and handling communications through protocols such as SPI, Serial, I2S, CAN, LIN, and FlexRay. This enables efficient multitasking and the execution of sequential simulations, as well as adaptation to different testing environments and technological requirements, without being restricted to automotive ECUs. Likewise, the invention called "Advanced Modular Test Bench for Industry" extends testing capabilities beyond ECUs and the automotive sector, offering a more comprehensive solution. Our system is not only capable of adjusting to different devices as the CN212229484U system does, but it also incorporates a much broader range of testing functionalities, including but not limited to, the evaluation of electrical and electronic devices in various industrial applications. The versatility of our system allows it to be used in a much wider range of contexts, making it possible to conduct tests on telecommunications, aerospace devices, and many others, providing thus providing a valuable tool for innovation and quality assurance across a wide variety of industries.

[0026] TECHNICAL PROBLEM TO BE SOLVED

[0027] In the electronics and component testing industry, one of the most significant technical problems is the lack of flexibility and adaptability of test benches to accommodate a wide range of devices and communication standards that evolve rapidly. Existing test systems are often limited by closed and specialized architectures, designed for specific applications or particular components such as automotive ECUs (Electronic Control Units), without the ability to efficiently adjust to different protocols or device configurations. This problem manifests in several critical aspects:

[0028] Excessive Specialization: Current test benches often require dedicated configurations for each type of device, leading to significant investments in multiple test systems, increasing operational and capital costs for companies.

[0029] Premature Obsolescence: The rapid evolution of technologies and communication protocols causes test benches to become obsolete quickly, limiting their long-term usefulness and forcing frequent equipment renewal.

[0030] Operational Complexity: Many test systems require highly specialized personnel for their operation due to the complexity of test configuration and management, which increases dependence on experts and the likelihood of errors. Inability to Multitask: The need to perform multiple tests simultaneously, as required in high-speed production and development environments, is a capability that conventional test systems often cannot efficiently satisfy.

[0031] Limited Integration and Communication: The integration of various communication protocols, such as CAN, LIN, and FlexRay, and the coordination between multiple tasks and tests represent a challenge that not all test systems can handle without compromising the precision and reliability of the results.

[0032] The proposed invention aims to overcome these technical problems by providing an integrated and modular solution that can be quickly configured to adapt to a variety of devices and standards. With the introduction of a test bench featuring a multicore CPU and advanced architecture, the goal is to solve the need for a system capable of performing multiple tests in a reliable, updatable, and cost-effective manner, reducing obsolescence and dependence on highly specialized personnel.

[0033] BRIEF DESCRIPTION OF THE FIGURES

[0034] Figure 1. Shows a front perspective view of an Advanced Modular Test Bench for Industry (100) in an open state.

[0035] Figure 2. Shows a top view of an Advanced Modular Test Bench for Industry (100) without the cover (120).

[0036] Figure 3. Shows a perspective view of the control system (20).

[0037] Figure 4. Shows an external perspective view of one embodiment of the Advanced Modular Test Bench for Industry (100) with the cover (120) closed.

[0038] Figure 5. Shows a rear view of one embodiment of the Advanced Modular Test Bench for Industry (100) with the cover (120) closed.

[0039] Figure 6. Shows a block diagram of the electronic communication of the Advanced Modular Test Bench for Industry (100). Figure 7. Shows the view of one embodiment of the control board (210) of the Advanced Modular Test Bench for Industry (100).

[0040] Figure 8. Shows the view of one embodiment of the control board (210) of the Advanced Modular Test Bench for Industry (100).

[0041] Figure 9. Shows the view of one embodiment of the control board (210) of the Advanced Modular Test Bench for Industry (100).

[0042] The following is a list of the parts indicated in the figures:

[0043] - Advanced Modular Test Bench for Industry (100).

[0044] - Compartment (110).

[0045] - Cover (120).

[0046] - Connection board (130).

[0047] - Visual interface (140).

[0048] - Test terminals (150).

[0049] - Switches (160).

[0050] - Support posts (170).

[0051] - Control base (200).

[0052] - Control board (210).

[0053] - Power supply (220).

[0054] - Control terminals (230).

[0055] - Board 1 (301).

[0056] - Board 2 (302).

[0057] - Board 3 (303).

[0058] - Board n (304n).

[0059] - AC Input (310).

[0060] - CPU (320).

[0061] - Expansion bus (330).

[0062] DETAILED DESCRIPTION OF THE INVENTION This descriptive chapter details the design and characteristics of the Advanced Modular Test Bench for Industry (100), illustrated in Figures 1 to 5. The provided description is offered as an example of the invention’s implementation, in order to facilitate the understanding of its structure and operation. It is important to highlight that this description does not seek to limit the scope of the invention to the specifically mentioned embodiments. On the contrary, it is considered that variations and alternative design embodiments that remain within the fundamental principles of the invention likewise fall under the scope of protection defined by the claims.

[0063] The present invention, referred to as the Advanced Modular Test Bench for Industry (100), emerges as a comprehensive solution designed to overcome contemporary challenges in electronic testing. Distinguished by its versatility and adaptability, this system is meticulously configured to accommodate a vast range of devices and communication standards, covering everything from individual components to complex integrated systems. Thanks to its modular nature, the test bench can operate in various modes, such as automated sequential testing, evaluations under specific stress conditions, and simulations of real operational environments, thereby providing comprehensive coverage for each testing requirement.

[0064] The Advanced Modular Test Bench for Industry (100) comprises several key components, each designed to significantly contribute to the overall efficiency of the test bench. It includes a Compartment (110), which acts as the structural frame that houses and protects internal components, designed to withstand the rigorous conditions of industrial testing environments; a Cover (120) that secures the components within the enclosure, offering easy access for configuration and maintenance of the equipment; a Connection Board (130) that facilitates the interconnection of modules and devices under test (DUT), serving as the central hub for test configuration; a Visual Interface (140) that provides an interactive interface for test programming and real-time data visualization, enhancing user experience; a plurality of Test Terminals (150) that allow the direct connection of DUTs, adapting to a wide range of configurations and technical requirements; Switches (160) that provide manual control over critical test bench functions, facilitating intuitive system operation; a Control Base (200) located inside the enclosure (110) as a support for electronic components and the control system; a Control Board (210), which serves as the brain of the test bench, where said control board (210), mounted on the control base (200), directs all electronic operations and data processing; and a Power Supply (220), which provides adjustable electrical energy to the various system components, ensuring versatility in execution of tests; Control Terminals (230), which allow the connection between control elements with the test terminals (150) and switches (160).

[0065] Each of these components has been meticulously designed to ensure that the Advanced Modular Test Bench for Industry (100) not only meets current demands for electronic testing but also anticipates future needs, thereby demonstrating an unwavering commitment to innovation and quality in the field of industrial testing.

[0066] The Compartment (110), which constitutes the main chassis of the test bench, has been meticulously designed to fulfill several essential functional roles, both protective and structural. Manufactured from high-strength metal alloys or advanced polymers, this compartment (110) not only withstands physical impacts from daily use in industrial environments but also provides an effective barrier against electromagnetic interference, thereby safeguarding the integrity of the delicate electronic components housed within. With optimized dimensions to balance robustness and portability, the compartment (110) features an exterior surface treated with anti-corrosive coatings and thermal insulators, ensuring extended durability and safe operation under various environmental conditions.

[0067] In terms of function, the compartment (110) acts as the physical enclosure for the test bench and its components while also facilitating organization and ergonomic access to internal components and expansion modules. Through modular doors and panels that can be configured according to each user's specific needs, the design of the compartment (110) enables quick maintenance, updates, or hardware configurations without the need for specialized tools. The integrated locking and anchoring systems ensure that all elements remain secure during transport or operation.

[0068] The interaction and coupling of the compartment (110) with the other elements of the test bench have been optimized to promote efficient signal integration among the components. The internal supports and sliding rails allow for the installation and precise adjustment of the control board (210), the power supply (220), and other modules, ensuring uninterrupted electrical and data connectivity. The strategically placed openings in the enclosure provide access points for the test terminals (150) and user interfaces such as the visual interface (140), facilitating operation and monitoring.

[0069] Additionally, the compartment (110) is designed to accommodate variants and configurations that adapt to different testing scales and technical requirements. These variants may include configurations with greater resistance to extreme conditions, such as exposure to liquids or environments with high dust concentrations. Likewise, configurations integrating advanced cooling systems for high-power applications are considered, as well as compact versions for portable applications or limited space environments. Each variant maintains compatibility with the test bench component ecosystem, ensuring that system expansion and customization are simple and accessible tasks.

[0070] The cover (120) plays a vital role in the protection and functionality of the Advanced Modular Test Bench for Industry (100), not only as a physical barrier but also as an interactive element. Built from highly durable materials such as advanced polymer composites or metal alloys, the cover is designed to withstand the demands of industrial use and effectively protect the internal components of the test bench from physical damage, dust contamination, and liquid exposure.

[0071] A distinctive feature of the cover (120) is the incorporation of the visual interface (140), which serves as the main user interface. This visual interface (140) can be mounted on the exterior of the cover for operations where the test bench remains closed, allowing the user to interact with the system and monitor tests without opening the equipment. Alternatively, in configurations where the test bench is preferred or required to operate with the cover open, the screen can be positioned on the interior part of the cover, ensuring that the interface is protected during transport or when not in use but remains accessible and fully functional during testing operations.

[0072] The design of the cover (120) and its mounting system has been meticulously conceived to ensure seamless integration with the enclosure (110) of the test bench. The flexible coupling mechanisms, such as pivoting hinges or sliding systems, facilitate the adjustment of the cover according to the desired operating mode, whether for a closed operation with external access to the visual interface (140) or for an open configuration with the visual interface (140) accessible from the interior. This versatility reinforces the synergy between the cover and other components, such as the connection board and power sources, by maintaining uninterrupted access to system functionality regardless of the configuration.

[0073] Recognizing the diversity of application environments and user preferences, the cover (120) can be presented in different configurations, including options with transparent viewing windows to monitor the status of internal components without opening the test bench, as well as versions with different ventilation schemes to optimize heat dissipation. For intensive use environments or high-security applications, reinforced covers are available, featuring elements such as security locks or materials resistant to fire and chemical products. Each variant is designed to maintain compatibility with the general modular design of the test bench, allowing for updates or customizations based on operational needs.

[0074] The connection board (130), strategically located at the upper internal part of the enclosure (110) of the Advanced Modular Test Bench for Industry (100), serves as the core of electrical integration and distribution within the system. The connection board (130) is mounted on support posts (170), carefully distributed inside the enclosure to provide optimal stability and elevation, ensuring that the board remains in its ideal position for accessibility and functionality.

[0075] The connection board (130) is made from highly durable materials and designed to withstand the rigorous demands of the testing environment. The connection board (130) features an organized surface that houses multiple zones for the insertion and mounting of Switches (160) and Test Terminals (150), each placed at specific points on the board to maximize operational efficiency and ease of use. The support posts (170) not only physically elevate the board within the enclosure (110) but also facilitate cable management and proper ventilation beneath it.

[0076] The primary function of the connection board (130) is to serve as the central platform where both the Switches (160) and the Test Terminals (150) are mounted and connected. This design ensures that all components relevant to the operation of the test bench are conveniently located and accessible from the upper part of the enclosure (110), simplifying both the test configuration and the user’s interaction with the system.

[0077] By being positioned and secured on the support posts (170), the connection board (130) integrates with the internal structure of the enclosure (110), offering a centralized connection point for other electronic components and modules of the test bench. This configuration optimizes the space inside the enclosure, allowing unobstructed access to the test terminals (150) and the Switches (160), as well as facilitating the implementation of updates or modifications to the system.

[0078] Adapting to the specific needs of different test applications, the connection board (130) is available in various configurations that offer different layouts and connection capacities. Some variants may include additional features such as specialized mounting zones for expansion modules or designated areas for integrating wireless technology. Regardless of the variant, each configuration maintains compatibility with the set of support posts (170) to ensure seamless installation and configuration within the enclosure (110).

[0079] The visual interface (140) serves as the primary window through which users interact with the system. This device is characterized by its high-resolution display panel, capable of presenting sharp text and detailed graphics, facilitating a clear interpretation of test results and system parameters in real time. Physically, the screen is encapsulated within a sturdy frame designed to withstand the demands of the industrial environment, featuring a durable touchscreen that efficiently responds to touch, enabling intuitive and direct interaction with the system.

[0080] The visual interface (140) functions as the command center, where users can program test sequences, configure specific parameters of the device under test, and visualize data in real time or analytical results. Its graphical interface is customizable, offering the flexibility to adapt to the specific needs of each user or test. Additionally, the visual interface (140) can display alerts and status notifications to keep the operator informed about test progress or potential system issues. Depending on the configuration of the Advanced Modular Test Bench for Industry (100), the visual interface (140) can be mounted on the exterior part of the cover (120) for operations with the test bench closed or on the interior part when used with the cover open. This versatility ensures that the screen is always positioned ergonomically, optimizing user interaction regardless of the chosen operating mode. The visual interface (140) is electronically connected to the control board (210), ensuring smooth and uninterrupted communication with the test bench’s electronic control system.

[0081] The visual interface (140) is available in various configurations to meet a wide range of operational requirements and visualization preferences. These configurations may vary in screen size, resolution, and touch input capabilities, ranging from basic screens for simple functionalities to more advanced models with multitouch and high-definition capabilities for complex applications. That is, the visual interface (140) can be an HMI, LCD screen, or another type of touch screen. Some configurations may include preprogrammed interfaces for specific applications or support for multiple languages, enhancing accessibility and usability across different regions and industrial sectors.

[0082] The test terminals (150) represent a critical interface within the test bench, designed to facilitate direct interaction between the test system and the devices under test (DUT). These test terminals (150) are made from high-quality conductive materials, ensuring a reliable and durable electrical connection. The primary function of the test terminals (150) is to provide electrical connection points for the devices under test (DUT), supporting a variety of test configurations, from voltage and current measurements to more complex digital signal and communication tests. They are designed to minimize contact resistance and offer optimal electromechanical compatibility with a wide range of devices and test cables.

[0083] The test terminals (150) are strategically located on the connection board (130) and, in some configurations, extended to the lateral walls of the enclosure (110). The test terminals (150) integrate seamlessly into the overall design of the test bench. This arrangement ensures that the terminals are easily accessible, both for the initial configuration of tests and for quick adjustments or modifications during testing operations. Their design facilitates a direct and efficient connection with other critical system components, such as the power supply (220) for electrical power and the control board (210) for test data management.

[0084] The test terminals (150) can be presented in various configurations and modalities to accommodate different types of tests and devices. The number of terminals may vary widely, offering configurations ranging from a few terminals to several dozen, depending on the specific test requirements. Additionally, the type of connection available in these terminals ranges from basic clip and screw connections to more advanced systems such as BNC, USB, Ethernet connectors, and specific connectors for communication buses such as CAN or LIN. This enables the execution of a broad range of tests, from simple electrical measurements to data analysis and complex signal processing in various industries. In certain configurations, the terminals may be designed for quick connection using snap-in systems or magnetic connectors, reducing preparation time for testing. For specialized applications, terminals can be provided with specific features such as increased resistance to heat or corrosion, or adaptations for high-frequency or high- electrical-noise environments.

[0085] The switches (160) are crucial components of the Advanced Modular Test Bench for Industry (100), providing users with precise and direct manual control over operations. The switches (160) can vary in shape and size, ranging from discrete buttons to robust levers and push buttons, each selected to provide the best user experience based on the specific action they control. The switches (160) facilitate activation and deactivation of signals for the devices under test (DUT), allowing users to verify the correct operation of these devices by activating specific test sequences or simulating operational conditions.

[0086] Although predominantly located on the connection board (130) for smooth integration with the central electronic system, the switches (160) can also be positioned on the lateral walls of the enclosure (110) in certain configurations of the test bench. This placement ensures that the switches are easily accessible regardless of the system configuration or workspace layout. Their integration with the control board (210) and other electronic components ensures that the signals generated by the switches are efficiently processed, allowing for immediate and reliable interaction with the devices under test (DUT). Y1

[0087] The number and type of switches (160) can vary widely depending on the specific configuration of the test bench. Options include, but are not limited to, toggle switches for binary on / off controls, push buttons for temporary or sequential commands, and dials or potentiometers for fine parameter adjustments. Additionally, some variants are designed with special features such as water and dust resistance for use in harsh environments or backlighting to facilitate operation in low-light conditions. In specialized configurations of the test bench, the switches (160) may incorporate advanced functionalities, such as password protection for critical controls or wireless connectivity for remote control, further expanding the testing possibilities and system capabilities. Regardless of the variant, all switches are designed to integrate seamlessly into the test bench ecosystem, ensuring consistent functionality and an optimized user experience.

[0088] The control base (200) constitutes the core upon which the central electronic system of the Advanced Modular Test Bench for Industry (100) is structured. The control base (200) is designed as a rigid and durable platform installed in the lower part of the enclosure (110) and supported by the mounting posts (170). The primary purpose of the control base (200) is to serve as the platform for housing and mounting the essential electronic components of the test bench, such as the Control Board (210), the Power Supply (220), and the Control Terminals (230). Additionally, it is designed and manufactured from materials that dissipate the heat generated by the electronic components, keeping the system in optimal operating conditions.

[0089] The control base (200) is firmly secured at the bottom of the enclosure (110) through an anchoring system that ensures stability and resistance to vibrations or unintentional movements. The support posts (170) incorporated into the base provide additional mounting points for the installation of the Connection Board (130), ensuring that all electronic components interconnect cohesively within the test bench.

[0090] The power supply (220) is a vital component that functions as the energy core of the test bench, ensuring the constant and regulated delivery of electrical power to various components and systems. The primary function of the power supply (220) is to provide a stable and reliable electrical supply to all components of the test bench, from the control board (210) to the test terminals (150). Capable of generating multiple voltage and current outputs, it is designed to meet the specific requirements of a wide variety of devices under test (DUT), ranging from low voltages for sensitive circuits to higher levels for power testing. Its precise regulation avoids overvoltage and fluctuations, protecting sensitive components and ensuring consistent test results.

[0091] The power supply (220) is firmly anchored to the control base (200) in a position that maximizes cable efficiency to other electronic components within the compartment (110). The power supply (220) is available in various configurations to accommodate different testing requirements and operational environments.

[0092] The Advanced Modular Test Bench for Industry (100) includes at least one power supply (220); however, this supply can be either internal or external.

[0093] These configurations vary in output capacity, number of power channels, and advanced features such as programmability, user interfaces enhanced, and remote connectivity options. Some configurations may offer adjustable voltage outputs with greater precision, programmable controls for sequencing power events, or compatibility with industryspecific testing standards.

[0094] Within the assembly of the Advanced Modular Test Bench for Industry (100), the control terminals (230) are distinguished by their functionality and their mounting on adjustable rails. These control terminals (230) are designed to efficiently manage the variety of cables that connect the control board (210) with interactive and operational elements such as switches (160), test terminals (150), and the visual interface (140). The essential function of the control terminals (230) is to channel wiring in an orderly and secure manner from the control board to the critical components of the test bench, ensuring precise interaction between user commands and the devices under test (DUT). Being mounted on adjustable rails, the terminals offer adaptability, allowing users to reconfigure cable layout and connection point placement according to the specific needs of each test.

[0095] The control board (210) represents the epicenter of the test bench, integrating technological sophistication and electronic innovation into a single essential component. Physically, the board is characterized by its design, incorporating advanced integrated circuits, high-speed multicore processors, and a variety of interfaces for communication with other system components. The control board (210) is responsible for executing the test software, managing all operations within the test bench, from initiating test sequences to data collection and analysis. Based on the detailed analysis of the invention and the revised block diagram, this board incorporates a multicore system that enables efficient multitasking, dedicating specific cores to critical tasks such as user interface management, signal processing, and device communication. Its advanced architecture facilitates the integration of various communication protocols, ensuring compatibility and flexibility for working with a wide range of devices under test (DUT).

[0096] As the system’s operational brain, the control board (210) interconnects with all components of the test bench. It is directly attached to the control base (200), from where it establishes communication links with the power supply (220) to manage the system’s energy needs, the control terminals (230) for cable organization, and the visual interface (140), which serves as the main interface for users. This integrated approach ensures that instructions and data flow cohesively throughout the system, optimizing test execution and user experience.

[0097] The Advanced Modular Test Bench for Industry (100) integrates a complex electronic system designed to provide precision testing and efficient management of multiple devices. The electronic architecture is centered around a multicore CPU (320) responsible for executing the test software and coordinating the operations of the bench.

[0098] The CPU (320) is established as the brain of the Advanced Modular Test Bench for Industry (100), an advanced processing unit designed to be the system’s primary controller. This central unit is a high-performance multicore microprocessor housed in a hardware module mounted on the control base (200). The CPU (320) is responsible for executing all test software instructions and managing the control logic for all connected devices and modules. The CPU (320) performs multiple critical roles within the system. First, it manages power distribution from the power supplies to the various electronic components, dynamically adjusting voltages according to the requirements of each test or component. Second, it serves as the central point for data exchange, interpreting input / output signals and coordinating communication through an expansion card bus (301 , 302, 303, 304). The CPU (320) also processes user interactions with the visual interface (140), translating touch and visual inputs into executable commands.

[0099] The CPU (320) connects with the power supplies (220), which provide the different voltage levels required for its operation and that of the peripherals. Through the expansion card bus (330), it maintains a connection with dedicated cards for signal management and specific communications. The visual interface (140) is powered directly by the CPU (320), ensuring that the visualization and control of the interface remain responsive and updated in real time.

[0100] The variations of the CPU (320) may differ in processing capacity, number of cores, and connectivity features. Some versions may include a CPU (320) with a higher clock speed or specialized technologies for graphics processing or real-time data analysis. In terms of operation, the CPU (320) can function in standard modes for general testing or in enhanced modes that utilize parallel programming to increase the efficiency of complex tests. Additionally, some configurations may support firmware updates to introduce new functionalities or enhance existing ones without requiring hardware modifications.

[0101] The multicore architecture of the CPU (320) is a distinctive feature of the test bench, enabling efficient parallel process management. Each core is optimized to handle specific tasks, contributing to the system’s overall responsiveness and agility.

[0102] The specialized functions of the cores are described as follows:

[0103] Core 0: Acts as the coordinator of the visual interface (140), interpreting and executing user inputs. This core manages the graphical interface, activates test programs, and makes operational decisions based on programmed logic and user interactions.

[0104] Core 1 : Specialized in data acquisition, this core manages ADCs (Analog-to-Digital Converters) and DAQ (Data Acquisition Systems), ensuring that analog and digital input measurements are precise and reliable. Core 2: Handles data communication through specialized protocols such as CAN, LIN, and FlexRay. It controls data flow and synchronization, which is essential for testing and diagnostics in sectors such as automotive.

[0105] Core n: Provides a platform for scalability, allowing for future updates or transitions to real-time operating systems (RTOS), adapting the test bench to new requirements and technologies.

[0106] The different cores of the CPU (320) maintain a synergistic relationship with all elements of the test bench. Core 0 works in close collaboration with the visual interface (140), while Core 1 interacts directly with the connection board (130) for signal processing. Core 2 coordinates with the expansion cards (301 , 302, 303, 304) dedicated to vehicular communication. Each core receives and sends signals to its corresponding components to perform tasks with precise communication.

[0107] The multicore CPU (320) can come in different configurations to adapt to a range of applications, from standard test benches to highly complex versions that require multiple specialized processing cores. Specific configurations may be designed for industries with unique needs, such as aerospace or telecommunications, where protocols and processing requirements can differ significantly from automotive standards.

[0108] The test bench’s communication and protocol suite is a complex network designed to ensure a precise and efficient flow of information between the CPU (320) and the system modules. This network is fundamental to the overall functionality of the test bench, enabling a wide variety of operations and compatibility with an extensive range of devices and standards. Below are the communication protocols applicable to the interaction between test bench elements and the devices under test (DUT):

[0109] SPI (Serial Peripheral Interface): This protocol is vital for fast, full-duplex, and reliable communication with peripheral devices. SPI is commonly used to interface with components that require real-time data exchange, such as high-speed sensors or flash memory. Serial Communication: This includes protocols such as RS-232 and UART, which are the cornerstone of communication in many electronic devices. This form of communication is crucial for sending and receiving data sequentially through a simple transmission line, enabling interoperability between different electronic components.

[0110] I2S (Inter-IC Sound): This protocol specializes in connecting digital audio devices, such as DACs and ADCs, and is essential in applications where audio quality and integrity are critical.

[0111] Digital I / O Lines: These configurable digital inputs and outputs are fundamental for higher low-level control of devices and actuators, as well as for sensor data collection and module communication.

[0112] Each communication protocol has a specific function within the test bench ecosystem. The CPU (320) utilizes these protocols to send instructions to the expansion cards (301 , 302, 303, 304), receive data from input / output modules, and control the operations of connected devices. The efficiency of these protocols ensures that the CPU (320) can perform multiple simultaneous tasks without errors, which is crucial for real-time analysis and diagnostics of devices under test (DUT). The modularity of the communication protocols means that the test bench can adapt to emerging technologies over time. For example, variations in the communication architecture could include additional protocols such as Ethernet for network connectivity, USB for broader integration with consumer devices, or Bluetooth and Wi-Fi for wireless testing. These configurations enable the test bench to stay up to date with the latest technological trends and standards, ensuring its longevity and relevance in the market.

[0113] The Advanced Modular Test Bench for Industry (100) includes at least one expansion card (301 , 302, 303, 304), which consists of modular elements that add specialized functions to the test bench, enhancing its versatility and ability to interact with a wide range of device technologies and protocols:

[0114] Expansion Card 1 (301): This card is equipped with specific hardware and firmware to facilitate communication with standard automotive buses such as CAN, LIN, and FlexRay, which are critical for testing modern vehicle electronics. Expansion Card 2 (302): This card focuses on general input / output functionality, converting analog signals into digital ones using ADCs and capturing data complex with DAQ systems. This is essential for tests that require precision in signal sampling and data acquisition.

[0115] Expansion Card 3 (303) and Expansion Card n (304): These cards provide additional support for other automotive buses and are adapted for specific applications, allowing customization and compliance with emerging protocols and standards in the automotive industry.

[0116] The expansion cards (301 , 302, 303, 304) integrate seamlessly with the central architecture of the test bench. Through the expansion card bus (301 , 302, 303, 304), they communicate with the CPU (320), which coordinates their operations and manages data transfer between the cards and other components, such as the test terminals (150) and the visual interface (140). This close relationship ensures that the functionalities added by the cards are accessible and fully functional within the test bench ecosystem. Likewise, the functions of the expansion cards (301 , 302, 303, 304), as seen in Figure 7, show that the expansion bus comprises n expansion cards (304), while in Figure 9, a single expansion card is shown carrying out processing and communication functions. The functions of the expansion cards (301 , 302, 303, 304) are interchangeable with each other, depending on the specific needs required for the implementation of this patent.

Claims

CLAIMS1. An Advanced Modular Test Bench for Industry (100) comprising a Compartment (110) that acts as the structural framework housing the internal components, a Cover (120) that secures the components inside the enclosure, a Connection Board (130) that facilitates the interconnection of modules and devices under test (DUT), a Visual Interface (140) that provides an interactive interface for test programming and real-time data visualization, a plurality of Test Terminals (150) that allow direct connection of devices under test (DUT), Switches (160) that provide manual control over critical test bench functions, a Control Base (200) that supports electronic components, a Power Supply (220) that delivers adjustable electrical power to various system components, and Control Terminals (230) that enable the connection between control elements, test terminals (150), and switches (160), characterized by: the cover (120) includes a visual interface (140); the connection board (130) is positioned in the upper internal part of the enclosure (110); the connection board (130) is mounted on support posts (170), which are distributed inside the enclosure to provide optimal stability and elevation; the connection board (130) has a surface with multiple zones for the insertion and mounting of Switches (160) and Test Terminals (150); the test terminals (150) are located on the surface of the connection board (130); the switches (160) are located on the connection board (130) to enable smooth integration with the central electronic system; the control base (200) consists of a rigid and durable platform, installed at the bottom of the enclosure (110) and supported by mounting posts (170); the Control Board (210), the Power Supply (220), and the Control Terminals (230) are mounted on the Control Base (200); the Control Terminals (230) are mounted on adjustable rails that allow users to reconfigure the cable layout and the positioning of connection points according to the specific needs of each test.

2. An Electronic System for an Advanced Modular Test Bench for Industry (100), comprising a system configured to accommodate a wide range of devices andcommunication standards, covering everything from individual components to complex integrated systems, characterized by: the visual interface (140) serves as the command center where users can program test sequences, configure specific parameters for the device under test, and visualize real-time data or analytical results. Additionally, the visual interface (140) is electronically connected to the control board (210), ensuring smooth and uninterrupted communication with the test bench’s electronic core; the switches (160) facilitate the activation and deactivation of signals for the devices under test (DUT) and are connected to the control board (210) to ensure that the signals they generate are effectively processed; the control board (210) runs the test software, managing all operations within the test bench, from initiating test sequences to data collection and analysis; the control board (210) includes a multicore CPU (320) that interprets input / output signals from the test bench and coordinates communication through a card bus comprising at least one expansion card (301 , 302, 303, 304). Additionally, the CPU (320) also processes user interactions with the visual interface (140), translating touch and visual inputs into executable commands; the multicore CPU (320) includes an expansion card bus (330) for connecting dedicated cards for signal and communication management; the multicore CPU (320) includes a Core 0 that acts as the coordinator of the visual interface (140), interpreting and executing user inputs. This core manages the visual interface (140), activates test programs, and makes operational decisions based on programmed logic and user interactions; the multicore CPU (320) includes a Core 1 that manages ADCs (Analog-to-Digital Converters) and DAQ (Data Acquisition Systems), ensuring that analog and digital input measurements are precise and reliable; the multicore CPU (320) includes a Core 2 responsible for data communication through specialized protocols such as CAN, LIN, and FlexRay, and controls data flow and synchronization; the expansion card bus (330) includes an Expansion Card 1 (301) equipped with hardware and firmware to facilitate communication with standard automotive buses such as CAN, LIN, and FlexRay, for testing modern vehicle electronics;the expansion card bus (330) includes an Expansion Card 2 (302), which enables the conversion of analog signals into digital signals using ADCs and captures complex data with DAQ systems; the expansion card bus (330) includes an Expansion Card 3 (303) and an Expansion Card n (304), which provide additional support for other automotive buses and are adapted for specific applications, allowing customization and compliance with emerging protocols and standards in the automotive industry.

3. The Advanced Modular Test Bench for Industry (100), as claimed in claim 1 , characterized by the fact that the cover (120) includes flexible coupling mechanisms, such as pivoting hinges or sliding systems, facilitating the adjustment of the cover according to the desired operating mode, whether for a closed operation with external access to the visual interface (140) or for an open configuration with the visual interface (140) accessible from the interior.

4. The Advanced Modular Test Bench for Industry (100), as claimed in claim 1 , characterized by the fact that the cover (120) is available in different configurations, including options with transparent viewing windows to monitor the status of internal components without opening the bench, as well as versions with different ventilation schemes to optimize heat dissipation.

5. The Advanced Modular Test Bench for Industry (100), as claimed in claim 1 , characterized by the fact that the cover (120) includes reinforced features such as security locks or materials resistant to fire and chemical products.

6. The Advanced Modular Test Bench for Industry (100), as claimed in claim 1 , characterized by the fact that the connection board (130) includes specialized mounting zones for expansion modules and for the integration of wireless technology.

7. The Advanced Modular Test Bench for Industry (100), as claimed in claim 1 , characterized by the fact that the visual interface (140) can display alerts and status notifications to keep the operator informed about the progress of the tests or potential system issues.

8. The Advanced Modular Test Bench for Industry (100), as claimed in claim 1 , characterized by the fact that the visual interface (140) can be mounted on the exterior of the cover (120) for operations with the bench closed or on the interior when used with the cover open.

9. The Advanced Modular Test Bench for Industry (100), as claimed in claim 1 , characterized by the fact that the visual interface (140) may vary in screen size, resolution, and touch input capabilities, ranging from basic screens for simple functionalities to advanced models with multitouch capabilities and high definition for more complex applications, meaning that the visual interface (140) can be an HMI, an LCD screen, or another type of touch display.

10. The Advanced Modular Test Bench for Industry (100), as claimed in claim 1 , characterized by the fact that the test terminals (150) can be positioned on the lateral walls of the enclosure (110), on the connection board (130), and on the cover (120).

11. The Advanced Modular Test Bench for Industry (100), as claimed in claim 1 , characterized by the fact that the test terminals (150) and their available connection types range from basic clip and screw connections to more advanced systems such as BNC, USB, Ethernet connectors, and specific connectors for communication buses such as CAN or LIN.

12. The Advanced Modular Test Bench for Industry (100), as claimed in claim 1 , characterized by the fact that the test terminals (150) can be designed to facilitate quick connections using snap-in systems or magnetic connectors. Additionally, terminals with specific features can be provided, such as increased resistance to heat or corrosion or adaptations for high-frequency or high-electrical-noise environments.

13. The Advanced Modular Test Bench for Industry (100), as claimed in claim 1 , characterized by the fact that the switches (160) may vary in shape and size, ranging from discrete buttons to robust levers and push buttons.

14. The Advanced Modular Test Bench for Industry (100), as claimed in claim 1 , characterized by the fact that the switches (160) may also be located on the lateral walls of the enclosure (110) in certain configurations of the test bench.

15. The Advanced Modular Test Bench for Industry (100), as claimed in claim 1 , characterized by the fact that the number and type of switches (160) may vary widely depending on the specific configuration of the test bench, including but not limited to toggle switches for binary on / off controls, push buttons for temporary or sequential commands, and dials or potentiometers for fine parameter adjustments.

16. The Advanced Modular Test Bench for Industry (100), as claimed in claim 1 , characterized by the fact that the control base (200) is firmly secured at the bottom of the enclosure (110) using an anchoring system that ensures stability and resistance to vibrations or unintentional movements.

17. The Advanced Modular Test Bench for Industry (100), as claimed in claim 1 , characterized by the fact that the Advanced Modular Test Bench for Industry (100) includes at least one power supply (220), which may be either internal or external.

18. The Electronic System for the Advanced Modular Test Bench for Industry (100), as claimed in claim 2, characterized by the fact that the multicore CPU (320) includes a plurality of core X, providing a scalable platform that allows future updates or transitions to real-time operating systems (RTOS), adapting the test bench to new requirements and technologies.

19. The Electronic System for the Advanced Modular Test Bench for Industry (100), as claimed in claim 2, characterized by the fact that the CPU (320) utilizes various communication protocols, such as SPI (Serial Peripheral Interface), Serial Communication, and I2S (Inter-IC Sound), to send instructions to the expansion cards (301 , 302, 303, 304), receive data from input / output modules, and control the operations of the connected devices.

20. The Electronic System for the Advanced Modular Test Bench for Industry (100), as claimed in claim 2, characterized by the fact that the CPU (320) may vary inprocessing capacity, number of cores, and connectivity features, where some versions may include a CPU (320) with a higher clock speed or specialized technologies for graphics processing or real-time data analysis.

21. The Electronic System for the Advanced Modular Test Bench for Industry (100), as claimed in claim 2, characterized by the fact that expansion card 1 (301) is equipped with specific hardware and firmware to facilitate communication with standard automotive buses such as CAN, LIN, and FlexRay, which are critical for testing modern vehicle electronics.

22. The Electronic System for the Advanced Modular Test Bench for Industry (100), as claimed in claim 2, characterized by the fact that expansion card 2 (302) converts analog signals into digital signals using ADCs and captures data complex data with DAQ systems. This is essential for tests requiring precision in signal sampling and data acquisition.

23. The Electronic System for the Advanced Modular Test Bench for Industry (100), as claimed in claim 2, characterized by the fact that expansion card 3 (303) and expansion card n (304) provide additional support for other automotive buses and are adapted for specific applications, allowing customization and compliance with emerging protocols and standards in the automotive industry.

24. The Electronic System for the Advanced Modular Test Bench for Industry (100), as claimed in claim 2, characterized by the fact that the functions of the expansion cards (301 , 302, 303, 304) are interchangeable with each other, depending on the specific needs required for the implementation of this patent.

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