Solid state circuit breaker for fast fault detection

Abstract

A fast fault detection system and method implementing a solid-state circuit breaker (SSCB) for use in a high‑voltage circuit protection system. The fast fault detection system implements: a solid-state circuit breaker (SSCB) connecting a power source to a load. The SSCB includes two switches in bi-directional configuration that are controlled using gate drive circuitry in one of: a conducting (ON) state, non-conducting (OFF) state and an "intermediate" conducting state between on and off states. The gate drivers operably connect to fault condition sensors including at least a direct current flow rate of change (di / dt) sensor, e.g., a Rogowski coil, configured in an instantaneous fault trip circuit. Based on signals from the di / dt sensor, the gate driver circuit implements a staged approach to place the switches in an INTERMEDIATE operating mode including an active impedance control of the switching transistors and then after an elapsed time, turns the switches OFF.

Description

(23-BAE-0490PCT) SOLID STATE CIRCUIT BREAKER FOR FAST FAULT DETECTION CROSS REFERENCE TO RELATED APPLICATIONS

[0001] The present application claims benefit of United States Provisional Application No. 63 / 662,674 filed on June 21, 2024, all of the contents and disclosure of which are incorporated herein by reference. BACKGROUND

[0002] This disclosure is directed to power control systems and devices generally, and more particularly to a solid-state circuit breaker device, system and method for controlling circuit breakers used to detect circuit faults and protect electronic circuits, devices and systems.

[0003] Design of high-voltage circuit interruption with electro-mechanical contactors is size, weight, performance and cost (i.e., SWAP-C) prohibitive. Further, the development and design of a multi-stage fault response circuit is SWAP-C prohibitive. SUMMARY

[0004] A fast fault circuit interruption system for an electronics system.

[0005] A fast fault circuit interruption system implementing a solid state circuit breaker device and method for fast fault detection. In an aspect, the fast fault circuit interruption system is employed in a vehicle such as an electrified aircraft or aerospace vehicle.

[0006] A fast fault circuit interruption system implementing a solid state circuit breaker device and method for fast fault detection that implements a multi-staged response where, in response to detecting a fast fault, the solid-state circuit breaker (SSCB) switching devices are initially placedin a SAFE operating mode and once a safe disconnect is complete, the SSCB switching devices are placed in an OFF state.

[0007] In an embodiment, the SSCB is a solid state circuit breaker connected between a DC power source and a load device, the SSCB can be bidirectional consisting of: a series-connected pair of solid-state switches on both the positive power rail and the negative rails, each switch having a source, gate and drain and a body-diode connected between the source and drain of each switch with diode cathode connected to the drain. The SSCB can also be unidirectional consisting of: a single solid-state switch on both the positive rail and the negative rails.

[0008] In an embodiment, the SSCB is a solid state circuit breaker connected between a DC power source and a load device includes a series connected direct di / dt sensing (DC current rate of change or derivative current) sensor with an instantaneous fault trip circuit integrated into the breaker design. In one aspect, the direct di / dt sensing device is a Rogowski coil, with analog / digital instantaneous fault trip circuitry.

[0009] A high-voltage ultra-fast circuit interruption system and method implements the SSCB, a controller, and a corresponding gate driver(s) responsive to sensors for providing fast fault detection for automatic circuit interruption, and gate voltage drive control for switching the SSCB transistors into successive ON / INTERMEDIATE / OFF or OFF / INTERMEDIATE / ON operating states.

[0010] A high-voltage ultra-fast circuit interruption system and method implements the SSCB, a controller, and a corresponding gate driver(s) responsive to sensors for providing automatic control for circuit interruption, and gate voltage drive control for providing active impedance control (i.e., linear-mode operation) in the ohmic-region / linear-mode of the SSCB transistors to provide an INTERMEDIATE operating state for load connect, load disconnect and pre-charge operations.

[0011] A high-voltage ultra-fast circuit interruption system and method implements the SSCB to provide a safe disconnect function, or a multi-stage load disconnect in SSCB standaloneoperation. In an aspect, a system controller operates a gate driver to command the high-resistance device INTERMEDIATE operating state until a transient response is suppressed before placing the device in an OFF state.

[0012] According to an aspect, there is provided a fast-fault detection circuit for a solid-state circuit breaker (SSCB) device. The fast-fault detection circuit comprises: a di / dt current rate of change detection circuit connected in series with a solid state circuit breaker device and the series connection of the di / dt current detection circuit and SSCB are connected between a high voltage DC power source and a load device, the di / dt current rate of change detection circuit detecting an instantaneous rate of change of a current flow through the SSCB device and generating a voltage signal proportional to the detected rate of change of the current flow; a comparator circuit operatively connected to the di / dt current rate of change detection circuit operable to compare the generated voltage signal against a pre-determined threshold voltage value and generating an instantaneous di / dt fault detection signal when the voltage signal corresponding to a rate of change of current flow exceeds the pre-determined threshold voltage value; and a control circuit associated with the SSCB device operable to configure the SSCB device to provide a high resistance, low current flow path through the SSCB in response to the generated instantaneous di / dt fault detection signal.

[0013] In a further embodiment, there is provided a method for detecting fast-faults in a solid- state circuit breaker (SSCB) device. The method comprises: detecting, using a di / dt current rate of change detection circuit, an instantaneous rate of change of current flow through an SSCB device and generating a voltage signal proportional to the instantaneous rate of change of current flow, the di / dt current rate of change detection circuit connected in series with the SSCB, and the series connection of the di / dt current rate of change detection circuit and the SSCB connecting an output terminal of a high voltage DC power source to an input terminal of a high voltage DC load device; comparing, using a comparator circuit operatively connected to the rate of change di / dt current rate of change detection circuit, the generated voltage signal against a pre- determined threshold voltage value, and generating an instantaneous di / dt fault detection signal when the voltage signal corresponding to a rate of change of current flow exceeds the pre- determined threshold voltage value; receiving, at a control circuit associated with the SSCBdevice, the instantaneous di / dt fault detection signal; and configuring, using the control circuit associated with the SSCB device, the SSCB device to provide a high resistance, low current flow path through the SSCB in response to the received instantaneous di / dt fault detection signal.

[0014] Further features as well as the structure and operation of various embodiments are described in detail below with reference to the accompanying drawings. In the drawings, like reference numbers indicate identical or functionally similar elements. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] FIG.1A depicts a bi-directional solid state circuit breaker for providing high-voltage circuit protection for an electronics system in a vehicle according to an embodiment of the disclosure;

[0016] FIG.1B depicts a uni-directional solid state circuit breaker for providing high-voltage circuit protection for an electronics system in a vehicle according to an embodiment of the disclosure;

[0017] FIG.2A is a block diagram depicting a fast fault detection method using an embodiment of the SSCB of FIGs.1A, 1B;

[0018] FIG.2B is a block diagram depicting operation of a critical fault response method using an embodiment of the SSCB of FIGs.1A, 1B;

[0019] FIG.2C is a block diagram depicting operation of a di / dt rate of current change fault detection method using an embodiment of the SSCB of FIGs.1A, 1B;

[0020] FIG.2D is a block diagram depicting operation of an overvoltage fault detection method using an embodiment of the SSCB of FIGs.1A, 1B;

[0021] FIG.2E is a block diagram depicting operation of an dv / dt fault detection method using an embodiment of the SSCB of FIGs.1A, 1B;

[0022] FIG.3 is a detailed embodiment of a fast di / dt (current rate of change) sensor circuit operating as an analog circuit to engage instantaneous fault trip response to the gate driver for controlling the switches of the solid state circuit breaker;

[0023] FIG.4 is a detailed circuit diagram of the current sensor circuit operating to measure the current flowing in the SSCB circuit conductor in the system of FIG.1A according to an embodiment;

[0024] FIG.5 is a detailed circuit diagram of a single gate driver driving a single transistor switch and including associated switch fault management circuit operating to generate gate drive signals to render multi-stage operation in accordance with an embodiment of the invention; and

[0025] FIG.6 is a diagram conceptually depicting the tripping characteristics of a high-voltage circuit interruption device such as mechanical breaker, high-speed fuses as compared to the solid-state circuit breaker of FIG.1A for multiple rated currents. DETAILED DESCRIPTION

[0026] The present disclosure is directed to a fast fault detection system and method implementing a solid-state circuit breaker (SSCB) for use in a high-voltage circuit protection system or circuit.

[0027] In a non-limiting, exemplary implementation, the solid-state circuit breaker is operable in conjunction with a power distribution management system (PDMS) which can be a line replaceable unit for a sustainable vehicle engine architecture compliant with the Revolutionary Innovation for Sustainable Engines (RISE) platform.

[0028] FIG.1A depicts a bi-directional solid state circuit breaker 20 adapted to provide fast fault detection for an electronics system 10. The electronics system includes, in a non-limiting embodiment, a high-voltage direct current (DC) power source 30 providing DC power to a high- voltage DC circuit load or load device 75. As shown in FIG.1A, the bi-directional SSCB 20 includes a series-connected pair of solid-state field-effect transistors (FET) switching devices (switches) on both the positive voltage rail and the negative voltage rails. One terminal of a first switch of the pair connects to a first terminal of the high-voltage direct current (DC) power source 30 via a current conductor 31 and a terminal of a second switch connects to a first terminal of the high-voltage circuit load 75 via a current conductor 74 to provide a high-voltage circuit protection along a first or positive DC rail circuit path 21 between the input source and load. A similarly configured bi-directional solid state circuit breaker 20' includes a series- connected pair of solid state FET switching devices with one terminal of a first switch of the pair connecting to a second terminal 76 of the high-voltage circuit load 75 via a current conductor 76 and one terminal of the second switch connecting to a second terminal of the high-voltage direct current (DC) power source 30 via a current conductor 29 to provide further high-voltage circuit protection for the electronics system 10 along a second or negative DC rail circuit path 22 between the load and source. Each switch device of a switch pair having a source, gate and drain and a body-diode connected between the source and drain of each switch with diode cathode connected to the drain.

[0029] As shown in FIG.1B, a uni-directional SSCB 80 including a single FET switch device is connected on one DC rail and a second FET switch device connected on the second DC rail can accomplish the same goal of high-voltage circuit protection.

[0030] In a non-limiting embodiment depicted in FIG.1A, the high-voltage power source 30 is an energy storage system (ESS) such as a DC power generator or one or more battery banks, battery packs or individual batteries such as Li-ion, lead-acid, or other battery types. In alternative embodiments, the one or more batteries may be combined with any other suitable energy storage devices, such as capacitors, ultracapacitors, supercapacitors, and the like. The circuit load can be any circuit or device requiring a high-voltage DC input. For non-limiting purposes of discussion, “high-voltage” can refer to a direct current (DC) voltage of greater than50 VDC, but could be 120 VDC, 200 VDC, 400 V DC, 800 V DC or greater. In an exemplary, non-limiting embodiment, electronic system 10 can be any high-voltage DC aircraft system and the circuit load 75 can be a bus bar or distribution bus, propulsion motors, electrified vehicles, maritime vehicles, turbines, avionic, equipment or any other high-voltage electrical system.

[0031] As shown in FIG.1A, the bi-directional SSCB 20 includes: a pair of solid-state switches 15A, 15B in a common-source connected configuration in which each solid state switch 15A, 15B consists of a planar, metal oxide semiconductor field effect transistor (MOSFET) switching device including a source (S), gate (G) and drain (D) terminals. As shown, in a non-limiting embodiment, the source terminal (S) of each solid state switch 15A, 15B of the pair are connected to provide a common source connection 25, however, a common-drain configuration can be implemented. In the embodiment depicted, the SSCB 20 switching transistors are connected in reverse configuration (Drain-Source) and (Source-Drain) rendering their operation bi-directional. As shown in FIG.1A, each MOSFET 15A, 15B includes a body diode 28 which is the parasitic device intrinsic to the MOSFET device’s structure and is connected in reverse configuration between the source terminal (S) and drain terminal (D) of each switch 15A, 15B with the diode cathode connected to the drain terminal (D) in each. It is understood that the SSCB 20 switching transistor is a MOSFET, however, can be a JFET or other FET-type device, and in other embodiments, can be a bipolar junction transistor (BJTs, IGBTs) or like semiconductor switching device.

[0032] Further, as shown in FIG.1A, connected to each respective gate terminal (G) of the common-source connected pair of solid-state MOSFET switches 15A, 15B is a respective gate driver circuit 60A, 60B. Gate driver circuit 60A is connected to and receives signals from the drain and / or source terminals of MOSFET 15A and provides an output conductor connected to the gate terminal of solid-state switch device 15A for outputting a control signal 61A used for adaptively controlling an impedance state of MOSFET 15A for load connect, load disconnect and pre-charging operations. Similarly, gate driver circuit 60B is connected to and receives signals from the drain and / or source terminals of MOSFET 15B and provides an output conductor connected to the gate terminal of solid-state switch device 15B for outputting a control signal 61B used for adaptively controlling an impedance state of MOSFET 15B for load connect,load disconnect and pre-charging operations. It is understood that an impedance state is alternately referred to as a resistance state that additionally takes into account any capacitance and inductance in the circuits, devices, and load. Thus, for each MOSFET switch 15A, 15B, based in part on voltages obtained at their respective gate, drain and source terminals, each of the gate driver circuit 60A, 60B is configured to apply a respective bias voltage VGS (control signals 61A, 61B, respectively) that is used to control the amount of current flow through a respective switch 15A, 15B, i.e., provide for active impedance control of the SSCB where the switching MOSFETs can operate in an ON (conducting) state, an OFF (non-conducting) state or an INTERMEDIATE (linear mode) state, i.e., operable in an ohmic-region of operation.

[0033] In an embodiment, the SSCB 20 achieves active impedance control by operating switches in the linear mode, e.g., for load connect, load pre-charging and load disconnect operations. More particularly, an applied VGS bias voltage 61A, 61B to a SSCB switch 15A, 15B can render the respective switches in a sequence of states, e.g., a completely open or non-conductive state, an “intermediate” or linearly resistive state that can limit current flow through the SSCB 20 and a completely closed, conductive state. For example, upon disconnecting a source or a load device (which command can originate by the PDMS), the SSCB can utilize a two-level turn off to minimize overshoot of any residual current. In an embodiment, a solid-state switching transistor can be an NPN-type semiconductor structure, where the voltage between the gate and source, i.e., VGSis equal to zero (i.e., VGS= 0), the voltage between the drain and source (VDS) is greater than the device’s pinch-off voltage !", i.e., VDS > !"; and where the current drawn at the drain terminal ID = IDSS (current, drain-to-source, saturated) is the current through the device when VGS = 0. In an embodiment, the NPN-type semiconductor structure results in zero current flow (ID = 0 amps) through the device when the device is at pinch-off, i.e., where VGS << !", where VDS < VBD where VBD is the body diode voltage drop.

[0034] As known, the size of the switching device determines the range of current and assumes a depletion-mode FET device that conducts until a negative voltage is applied to the gate relative to the source. In a transistor mode of operation based on different transistor parameter characteristics: where the VGS << V#there results a channel pinch-off (e.g., channel off or cutoff) region of operation where the device is characterized by a high impedance (e.g., > 10kOhm) and where no IDS current flows. In a “pre-charge” or INTERMEDIATE mode of operation, the transistors are controlled to operate in a current limiting (linear mode) or ohmic region governed by the relation VDS sat = VGS – VP with different current vs. voltage curves based on a value of VGS. In this INTERMEDIATE mode, impedance values can range from between 100 Ohms – 1kOhms. Additionally, in the saturation region of operation where the device is characterized by a low impedance (e.g., < 1 Ohm) there results in enabling a constant full current flow until a breakdown region is reached when VDS exceeds a certain threshold.

[0035] Respective gate driver circuits 60A, 60B are further operably connected to fast fault detection circuitry that operate to detect faulty operating conditions that can trigger SSCB operation. For example, gate driver circuit 60A further receives an input control signal 62 for further controlling the gate driver output control signal 61A based on control signals received from one or more fast fault detection and logic circuits; and similarly, gate driver circuit 60B further receives the input control signal 62 for further controlling the gate driver output control signal 61B based on control signals received from one or more fast fault detection and logic circuits. In an embodiment, these control signal 62 can control the respective gate driver to output a respective control signal 61A, 61B to render MOSFET switch 15A in either a completely “ON” or low-impedance (e.g., <1 Ohm) full current conducting (i.e., closed) state allowing an example current flow on the order of 100 Amps, or in an “OFF” or high-impedance (e.g., >10 kohm), non-current conducting (i.e., open circuit) state allowing only leakage current flow (e.g., on the order of less that 100 microamps), or in the linear-mode (ohmic region) “INTERMEDIATE” state (an ON state) however with higher impedance characteristics in the current flow path through the SSCB device. Utilizing the linear mode of the bidirectional switches in the SSCB, the higher resistance through the device acts as a snubber to suppress voltage transients.

[0036] In the MOSFET switching device configuration shown in FIG.1A, the circuit protection for the electronics system 10 facilitates energy flow that is bi-directional, i.e., the power source 30, in conjunction with the circuit load 75, operates in both charging and discharging scenarios along a corresponding circuit path 21, 22. Therefore, the system and method of circuit protection for electronics system 10 described herein may operate to improve balance for charging anddischarging current from the battery / battery pack(s), e.g., in response to unbalance current or thermal conditions. In the bi-directional embodiment, rather than a respective gate driver 60A, 60B assigned to each respective MOSFET switch 15A, 15B, there may be a single gate driver controlling both MOSFET switches of the pair.

[0037] With more particularity, as shown in FIG.1A, connecting the ‘load”-side in series with the drain terminal D of switch 15B of the SSCB is a direct di / dt (DC current rate of change) sensing device 50 and connected in series with the di / dt sensing device 50 is a current sense circuit device 35 for sensing the amount of current flow through the switches 15A, 15B and through positive rail circuit path 21 that is to be consumed by the load circuit 75. The sensed current flow value at current sense circuit device 35 is further output as sensed current signal 39 to an overcurrent (OC) fault detection circuit 36 which implements logic for detecting an over- current fault condition and asserting a corresponding OC fault condition signal 37 when a fault is detected. The current sense circuit device 35 provides a further current sense measurement signal 38 for receipt as an input to a local controller or processor circuit 100 for further processing where the controller 100 is a microprocessor with built-in logic that is local to the SSCBs 20, 20' and is shown linked via bus lines 120 to an external system controller such as the PDMS (not shown) via a communications interface 110. Processor 100 can include a digital to analog converter (DAC) in order to provide a gate driver signal suitable for adaptive impedance control rendering the SSCB switches in a particular state or configuration. For example, the linear mode of the bidirectional switches in the SSCB can be used upon fast detection of a fault. In an embodiment, the SSCB circuit 20 includes a positive conductor line 71 that connects the load- side current sense circuit 35 to a first terminal 74 of the output high-voltage circuit load 75 at circuit path 21. Similarly, the bi-directional SSCB circuit 20' includes a similar negative conductor line 72 connecting an output of a further current sense circuit 35' at the output of the series-connected pair of solid state FET switching devices 15A' and 15B' along a return circuit path 22 to a second terminal 76 of the output high-voltage circuit load 75 at return circuit path 22. In an optional embodiment, an optional common mode current sense circuit 80 is provided that is situated around the conductors and PCB wire traces and not in line with the conductors. The common mode sense circuit 80 detects signals that are common to both lines (in the same direction) to both circuit paths 21, 22 and minimizes the signals that are different. For example,if 10 amperes are present on conductor line 71 and the same 10 amperes returned on conductor line 72 those signals could cancel inside common mode current sense circuit 80. On the other hand, if 10 amperes was present on 71 and then due to a fault in the system those amperes returned via some other path to the source, the common mode current sense measures 10 amperes and inform the local control processor 100 via output line 82.

[0038] Further as shown in FIG.1A, disposed in parallel with the input power supply source 30 and connected at one end to the positive DC high-voltage rail terminal 31 and at a second end to a negative high-voltage rail terminal 29 is an input voltage sense circuit 40A for sensing a drain voltage “VD1” at the drain of the first MOSFET switch 15A; and similarly, disposed in parallel with both the optional common mode current sense circuit 80 and output high-voltage circuit load 75 and connected in between positive conductor line 71 and negative conductor line 72 is a load voltage sense circuit 40B for sensing a drain voltage “VD2” at the output of current sense circuit 35 connected in the series with the di / dt sensing circuit 50 and drain of the second MOSFET switch 15B. The input voltage sense circuit device 40A is configured for sensing the voltage VD1 across the power source at the input to the SSCB MOSFET switch 15A and the load voltage sense circuit device 40B is configured for sensing the voltage VD2 driving the load 75 at the output of the SSCB MOSFET switch 15B. The voltage difference between the measured voltages obtained by both voltage sense devices 40A, 40B is a differential voltage VDIFF, where VDIFF = |VD1- VD2|. Based on these sensed voltage values at circuit locations VD1and VD2of FIG.1A from respective voltage sensing circuit devices 40A, 40B, the total voltage across both SSCB MOSFET switches is easily obtained. These voltages are monitored to compute the differential voltage VDIFF which can be used for fast fault detecting purposes. In an embodiment, as shown in FIG.1A, the respective sensed voltage values VD1, VD2 from respective voltage sense circuit devices 40A, 40B are output as respective sensed voltage signals 43A, 43B for receipt at the local controller or processor 100 for computing the differential voltage VDIFF for various operations. The sensed voltage value from voltage sense circuit device 40A is also output as a sensed voltage signal 41A for receipt at an associated overvoltage (OV) fault detection circuit 42A, and similarly the sensed voltage value from load voltage sense circuit device 40B is also output as a sensed voltage signal 41B for receipt at an overvoltage (OV) fault detection circuit 42B. Both (OV) fault detection circuits 42A, 42B implement logicfor detecting an over-voltage fault condition and responsively assert a respective corresponding over-voltage fault condition signal 44A, 44B used for input to the local controller or processor 100. These signals 44A, 44B can be further processed by controller circuit 100 for comparison and as a potential result to responsively generate fault condition signal 47 for controlling both SSCB 20 and / or SSCB 20'. In an embodiment, OV fault detection circuit 42A compares the sensed rail voltages (i.e., voltage across the terminals of input power source 30) and OV fault detection circuit 42B compares the sensed voltage across the terminals of load circuit or device 75 against a respective, programmable voltage threshold (e.g., different voltage thresholds for on-state and off-state) over which is indicative of an overvoltage fault condition. The corresponding asserted over-voltage (OV) fault condition signals 44A, 44B are input to the controller circuit 100, e.g., in order to adaptively control SSCB operation. As further shown in FIG.1A, in an embodiment, the further sensed voltage values 43A, 43B from respective voltage sensing circuit devices 40A, 40B are input to the local controller or processor 100 for further processing, and output over voltage fault condition signals 44A, 44B are input to the local controller or processor 100 for further processing. As an example, the local controller 100 processes these over voltage fault condition signals and can adjust the sources of the system to re-establish bus regulation at an appropriate voltage. If that doesn’t work, the fault condition can drive the controller to open SSBs to prevent cascading damage, e.g., contain the overvoltage to a certain node.

[0039] Further, as shown in FIG.1A, connecting the drain terminal (D) of MOSFET switch 15B of the SSCB 20 to an input terminal of the current sense circuit 35 at first circuit path 21 is a DC $% current flow rate of change detector, i.e., $& current rate of change sensing circuit 50. The DC $% $% current flow rate of change sensed at $& current rate of change sensing circuit 50 is output as a $& $% current rate of change sense signal 51 for receipt at an over- $& fault detection circuit 52 $% implementing logic for detecting an excessive $& fault condition and asserting a respective $% $% corresponding over- $& fault condition signal 57 when an excessive $& current rate of change fault $% condition is detected for input to logic circuit 65. The over- $& fault detection circuit 52 can $% further output a corresponding over- $& fault condition signal 53 for receipt and further processingby the local controller or processor circuit 100. For example, local controller or microprocessor 100 can receive signal 53 to perform additional calculations, e.g. redundant fault detection, use the di / dt measurement and integrate it to obtain an alternate measurement, etc. $%

[0040] In an embodiment, the $& current rate of change sensing circuit 50 includes a Rogowski coil that is operable for direct contactless current measuring at the drain terminal output of $% switch 15B of the SSCB 20. It is understood that the circuit location of the $& current rate of change sensing circuit 50 and current sensing circuit 35 andconnected fault detection circuits can be interchanged while maintaining functionality as described. Further, it should be understood that the configuration of SSCB 20 may be modified to include one or both $% the current sensing and $& current rate of change sensing devices on the source side of the system 10 (i.e., connecting the first MOSFET 15A).

[0041] As shown in the embodiment of FIG.1A, the further logic circuit 65 consisting of an OR gate (or similar logic device) receives asserted OC (over-current) fault condition signal 37 from $% $% OC fault circuit 36, receives the asserted over- $& fault condition signal 57 from over- $& fault detection circuit 52 and further receives a fault / Open command (CMD) signal 47 that may be generated by the microprocessor 100. A further signal 46 is an analog cross-breaker signal linkage that allows the analog logic to check itself, e.g., check whether both sides have an overcurrent fault, i.e., check if one fault on the positive rail can be checked against a fault on the negative rail. Based on one or more asserted signals 37, 46, 47, 57, logic circuit 65 will responsively generate the gate driver control signal 62 for input to the respective gate drivers 60A, 60B used to control the OFF (open switch), the linearly resistive INTERMEDIATE state, or the ON (closed switch) state of respective MOSFET switches 15A, 15B of SSCB 20.

[0042] In the high-voltage circuit protection for the electronics system 10 as shown in FIG.1A for fast fault detection operations, the local controller or processor 100 receives and processes signals for generating the further control signal 46 that is also input to the logic circuit 65 and logic circuit 65' for controlling the SSCB state(s). In particular, controller or processor device 100 receives: the respective voltage sense signals VD143A, VD243B from respective voltagesensing circuit devices 40A, 40B, any OV (over-voltage) fault detection signal 44A, 44B from OV fault detection circuits 42A, 42B respectively, the measured current output signal 38 from current sense circuit 35, any asserted OC (over-current) fault detection signal 33 from OC fault $% $% detection circuit 36, and any asserted over- $& fault condition signal 53 from the over- $& fault detection circuit 52 and, in response, based on these received signals, implements logic for asserting the control signal 47 which is a command adapted to either open or close both MOSFET switches of SSCB 20 or render them in a linear-resistive INTERMEDIATE or pre- charge state.

[0043] As further shown in FIG.1A, communications interface 110 provides communications to / from an interface to another circuit or system that can issue a command to control operation of the SSCB 20. The electronics system 10 can include a data / address bus 120 in physical communication with the local controller or processor 100 to relay one or more external- generated command or control signals for receipt at the local controller 100. These externally- generated commands can be from an aircraft / aerospace vehicle subsystem(s) which can be processed by the logic invoked at the controller for further generating further output control signal 47 used to adaptively control the opening (OFF) or closing (ON) of the MOSFET switches or render the switches in the INTERMEDIATE (i.e., linear resistive) operating mode.

[0044] As further shown in FIG.1A, connecting across the terminals of the power supply source device 30 is a transient voltage suppressor (TVS) device, e.g., which can include a varactor or like transient voltage suppression device, circuit or system 73A and include additional connected TVS devices 73B, 73C each configured to connect a respective terminal of TVS device 73A to ground to further suppress transient spikes in the power electronics circuits, i.e., suppress any transient spikes of voltage or current of short duration (e.g., nanoseconds to milliseconds) which can be introduced into the system 10 such as by inductive load switching or faulty contacts in switches and connectors. Similarly, connecting across the terminals of the load circuit 75 is a further transient voltage suppressor device 73E and include additional connected TVS devices 73F, 73G each configured to connect a respective terminal of TVS device 73E to ground to further suppress transient spikes in the power electronics circuits, i.e., suppress any further transient spikes of voltage or current of short duration which can be introduced into the system10 such as by inductive load switching or faulty contacts in switches and connectors at the load. These TVS devices provide an over-voltage protection by clamping the voltage at a fixed voltage, e.g., while the over-voltage fault commands the gate driver to OPEN a switch.

[0045] As further shown in FIG.1A, in the embodiment of a bi-directional SSCB for electronics system 10, there is further configured a second SSCB 20' connected along the second negative- rail circuit path 22 of the electronics system 10. As shown in FIG.1A, the SSCB 20' connected to the opposing terminal 29 of the high-voltage DC source input 30 and terminal 76 of DC load circuit 75 along second path 22 includes identical elements that are configured identically as the SCCB 20 connected along first positive-rail circuit path 21 for providing similar bi-directional high-voltage DC circuit fault protection. For example, the SSCB circuit 20' thus includes series connected pair of MOSFET switches 15A', 15B' which, in a non-limiting embodiment, can be connected in a common-source configuration as shown, and includes similar associated sensing circuitry to control respective gate drivers 60A', 60B' used to control the pair of MOSFET switches 15A', 15B' to render them in an open (OFF), closed (ON) or a third impedance (INTERMEDIATE) state. As shown in FIG.1A, SSCB circuit 20' employs the input and load voltage sensing circuits 40A, 40B respectively, and corresponding connected OV fault detection circuits 42A, 42B which generate the respective OV fault condition signal 44A, 44B for receipt and processing at local controller or microprocessor 100. Additionally connected to the load-side in series with the drain terminal D of switch 15B' of the SSCB is a direct di / dt (DC current rate of change) sensing device 50' and connected in series with the di / dt sensing device 50' is a further current sense circuit device 35' for sensing the amount of current flow through the switches 15A', 15B' and through negative rail circuit path 22 that is connected to the load circuit 75 through common mode current sense circuit 80. Current sensing device 35' for sensing current input to the SSCB switches along the negative return path 22 generates a corresponding current measurement signal 38' for receipt and processing at the local controller 100 and further generates a corresponding current measurement signal 39' for receipt by a corresponding overcurrent fault circuit 36' that implements logic to detect an OC (overcurrent) fault and assert $% OC fault detection signals 33' and 37'. Similarly, the direct $& current rate of change sensing $% circuit 50' detects an instantaneous rate of change of current flow and outputs this value as$&$% current rate of change signal 51'. Sensed $& current rate of change signal 51' is received at a $% $% further over- $& current fault detection device 52' which generates corresponding over- $& current rate of change fault detection signals 53' and 57'. In an embodiment, a corresponding logic circuit 65' which can be an OR gate (or similar logic gate(s)) receives the asserted signals 37', 46, 47, 57' and logic circuit 65' processes these received signals and responsively generate the respective gate driver control signal 62' for input to the respective gate drivers 60A', 60B' used to control the OFF (open switch), linearly resistive INTERMEDIATE state, or the ON (closed switch) state of respective MOSFET switches 15A', 15B' of SSCB 20'. It should be understood that the $% configuration of SSCB 20' may be modified to include one or both the current sensing and $& current rate of change sensing devices on the source side of the system 10 (i.e., thefirst MOSFET 15A').

[0046] As further shown in FIG.1A, the local controller or processor device 100 is configured to further receive: respective voltage sense signals 43A', 43B' from the respective voltage sense circuits of SSCB 20, a measured current output signal 38' from the identical current sense circuit 35' of SSCB 20', an asserted OC (overcurrent) fault detection signal 33' from the identical OC $% fault detection circuit 36', an asserted $& current rate of change sense signal output 53' from the $% identical $& current sensing circuitand a common mode current sense circuit output 82 and, in on these received signals, implements logic for asserting the signals through communications interface 110. In an embodiment, the local controller 100 can send information to the comm interface via a signal path 120. The comm interface leads to the system controller, and the information contained in 120 can be voltage, current, fault status, and / or operational status (open / closed). The system controller on the other side of the comm interface may have its own reasoning for asserting a change of breaker state.

[0047] As before, the communications data / address bus 120 in physical communication with the local controller or processor 100 can further relay one or more external-generated command or control signals for receipt at the local controller 100. These external-generated command signals can be from an aircraft / aerospace vehicle subsystem(s) which can be processed by the logicinvoked at the controller for further generating output control signals used to adaptively control the opening (OFF) or closing (ON) of the MOSFET switches or render the switches in the INTERMEDIATE (i.e., resistive) operating mode.

[0048] FIG.1B depicts a SSCB circuit diagram 10' of an alternate embodiment which is identical to the SSCB circuit diagram embodiment 10 of FIG.1A, however configured for uni-directional circuit breaker operation. In particular, in the SSCB configuration of FIG.1B, instead of a series connected pair of SSCB MOSFET switching devices, there is only provided a single switch, e.g., MOSFET switch 15B in the first or positive voltage rail path 21 and only a single switch, e.g., MOSFET switch 15B' in the second or negative voltage rail path 22. Operation of the current $% sensing circuit, input voltage and load voltage sensing circuits, $& current rate of change sensing $% circuit, and respective over-voltage, over-current fault and over- $& fault condition sensing are identical in the alternate SSCB circuit 10' shown in FIG.1B.

[0049] As mentioned, each SSCB 20 / 20' is integrated into an electronic system of an aircraft / aerospace vehicle to provide overcurrent protection such as circuit interrupts when faults (e.g., short circuits, thermal overload, etc.) are present in the system 10 such as a system in the Revolutionary Innovation for Sustainable Engines (RISE) engine platform, e.g., for mobile or automotive, maritime vehicles, aircraft, aerospace vehicles, or for use in any high-voltage, high- current electronic system. Exemplary faults to be protected against include but are not limited to: an excessive di / dt, I2t fault, a line to line over current (e.g., positive rail to negative rail short), a line to ground over current (e.g., breakdown of insulation), an over temperature fault (e.g., at the power modules) or an over voltage fault. For example, if a short-circuit fault occurs at a connection to the power source battery / battery bank(s) 30, the SSCB(s) 20 / 20' may sense a current (such as by the current sensing circuit 35) that indicates a fault, and the corresponding OC fault detection circuit 36 identifies the current as a short-circuit fault. For example, in response to fast fault detection, the SSCB(s) 20 / 20' can turn off the solid state switches 15A, 15B / 15A', 15B' via the respective gate driver circuits 60A, 60B / 60A', 60B' associated therewith. In one embodiment, if a short-circuit fault occurs at the high-voltage DC load circuit 75, e.g., a high power short to a ground or to chassis or similar type short, the SSCB(s) 20 / 20' may sense an$% abnormal change in current flow, e.g., such as by the $& current rate of change sensing circuit, $% and the corresponding $& current rate of change circuit can identify the change in $% current as a short-circuit fault and in response, assert the $& fault condition signal 57 which can be used as a command to either open or close both MOSFET switches 15A, 15B via the respective corresponding gate driver circuits 60A, 60B of SSCB 20 or first render the switches 15A, 15B in a resistive state prior to turning them off (OPEN). In an embodiment, the SSCB devices 20 / 20' transition from an ON state to a linear (resistive) state to the OFF state with the linear state being of a short duration en-route to the OFF state, e.g., when clearing a fault. That is, in an embodiment, the gate driver circuits of the SSCB devices 20 / 20' are programmed to provide a multi-stage operation wherein from a closed conducting state, upon detecting an over- $% voltage, over-current or over- $& current rate of change fault, the gate drivers are configured to transit the SSCB MOSFET switches from the closed (conducting) state to a resistive state and then finally to an open (non-conducting) state.

[0050] More particularly, in an embodiment, the fault interruption process using the direct $% sensing of $& current rate of change sensing circuit 50 / 50' integrated within the SSCB 20 / 20' in the system 10 is fast, i.e., providing automatic circuit interruption by gate voltage control on the order of 50 ns - 1 micro-second (µs), thereby providing for instantaneous fault trip circuit protection. Further, the SSCB implementations according to embodiments herein do not require use of any conventional electro-mechanical switching, nor mechanical circuit breakers or contactors, nor conventional fuses. Further, no voltage clamping or snubber circuit device is series with the load circuit is required for fault protection; only aa parallel-connected TVS is provided for over-voltage protection.

[0051] FIG.2A is a block diagram depicting a fast fault detection method 200 using an embodiment of the SSCB 20, 20' of FIGs.1A, 1B. In an embodiment, the local controller or processor 100 or a remote system controller can run the fast fault detection method continuously while the electronic system is operated, or alternately, operations can be controlled via a control system, e.g., power distribution and monitoring system, via communications interface 110.

[0052] In an embodiment, initially, at 203, while the power is being supplied to a load with the SSCB in an ON and fully conducting state, the local controller or processor 100 runs a fast fault detect loop that includes running, in-parallel, concurrent processes including di / dt fast fault detection process 205, an overvoltage (OV) fault detection process 235, and a dv / dt voltage rate of change fault detection process 255. Respective outputs of the di / dt current rate of change fast fault detection process 205, the overvoltage (OV) fault detection process 235, and the dv / dt fault detection process 255 can indicate a detected fault, in which case, in an illustrative, non-limiting embodiment, the controller can assert a fault signal, e.g., logic “1” output signal, whereas no detected faults can be indicated as a logic “0” output signal. The outputs of each fault detect process 205, 235 and 255 is received at a logic processing block 208, e.g., implementing OR gate logic, which will trip further operations at 210 upon detection of a logic “1” output signal indicating a detected fault from any parallel-running fault detection processing block. At 210, a determination is made as to whether any detected fault(s) of the fault detecting processing blocks has detected the presence of a fast fault. As described herein, a fast fault is one that trips the SSCB virtually instantaneously, e.g., within a fast fault response time of less than one microsecond or ranging from between 50 nanoseconds to 1 microsecond. At 210, if there is no fault detected, then the process proceeds to 212 where a determination is made as to whether any LV (low voltage) power is present indicating that certain low voltage domain (e.g., digital) circuits that drive processing components using low-voltage signals are operating. If, at 212, it is determined that there is LV power present, then the process returns to 203 for a further iteration of the fast fault detect loop method. Otherwise, if at 212, it is determined that LV power domain signals are not present, then the process ends.

[0053] Returning to step 210, if it is determined that a fast fault is detected, then the process proceeds to 275 to perform a critical fault response method shown in FIG.2B. In an embodiment, the critical fault response method 275 of FIG.2B is a staged response, providing a INTERMEDIATE mode disconnect function including a multi-stage load disconnect upon detection of a fast fault. In this STAGED response, the controller commands the gate driver of the SSCB switching transistors to place the switching devices into a high-resistance device “INTERMEDIATE” operating state until a transient response is suppressed before placing theswitching devices in the OFF state. In the critical fault response method 275, at a first step 277, FIG.2B, the system local controller or processor 100 generates a gate driver circuit (GD1) command signal to place SSCB switching MOSFET 15A into the STAGED response. Similarly, at a further step 279, the system local controller or processor 100 generates a gate driver circuit (GD2) command signal to place SSCB switching MOSFET 15B into the STAGED response. In an embodiment, the staged response includes placing the SSCB 20, 20’ into an INTERMEDIATE operation mode where each switching MOSFET 15A, 15B is placed in the active impedance control (linear-mode operation) where the first FET and second FET provide a current-limiting linear resistive path through the SSCB. That is, the SSCB switching MOSFETs provide the linear resistive current flow path having an impedance value between an ON-state FET impedance value and an OFF-state FET impedance value. Continuing at 282, a pre- determined timer is elapsed to operate the gate driver operates in the SAFE operating mode. After a delay period where any transient response is suppressed, while in the SAFE operating mode, the process proceeds to 285 to sense the current through the current path through the SSCB 20 / 20’. Then, at 287, FIG.2B, a determination is made to determine whether the sensed current value is greater than a pre-determined current threshold value for the current system state. If the sensed current value is less than the pre-determined current threshold value, the process returns to 285 to sense the current through the current path through the SSCB 20 / 20’ while operating in the SAFE mode. The process steps 285 and 287 continue to keep monitoring the sensed current value flowing through the current path through the SSCB 20 / 20’ until such time it is detected at 287 that the sensed current value exceeds the pre-determined current threshold value. At such time the sensed current value flowing through the current path exceeds the pre-determined current threshold value, the process proceeds to 290 where the gate driver circuit (GD1) generates a command to place the switching MOSFET 15A in an opened (OFF- state) to prevent current flow through the SSCB; and similarly, at 292, the gate driver circuit (GD2) generates a command to place the switching MOSFET 15B in an opened (OFF-state) to prevent current flow through the SSCB and the critical fault process ends. Thus, once the safe disconnect is complete, the controller commands the gate driver circuits to set the device in the OFF state.

[0054] FIG.2C shows the di / dt current rate of change fault detect method performed at step 205 in the fast fault detection method 200 of FIG.2A. In an embodiment, at 217, the local controller or processor 100 runs a di / dt current rate of change fast fault detect loop and at 220, the local controller or processor 100 obtains a di / dt current sense measurement signal using the di / dt current rate of change sense circuit 50 of FIG.1A. Then, at 222, the over di / dt current rate of change fault detection circuit 52 applies the pre-determined amount of gain and implements comparator circuitry to determine, at 225, whether the obtained di / dt current rate of change sense measurement signal value (di / dt) is greater than a pre-determined over (di / dt) current rate of change threshold value. If at 225, it is determined that the obtained di / dt current rate of change sense measurement signal value does not exceed the pre-determined over (di / dt) current rate of change threshold value, i.e., there is no over di / dt current rate of change fault detected, then the process proceeds to 228 where a determination is made as to whether any LV (low voltage) power is present indicating that certain low voltage domain (e.g., digital) circuits that drive processing components using low-voltage signals are operating. If, at 228, it is determined that there is LV power present, then the process returns to 217 for a further iteration of the di / dt fast fault detect loop method. Otherwise, at 228, if it is determined that LV power domain signals are not present, then the process ends.

[0055] Returning to step 225, FIG.2C, if it is determined that a di / dt fast fault is detected, then the process proceeds to 230 where a di / dt fast fault detection signal is generated for receipt at logic gate at step 208, FIG.2A to initiate the critical fault response method 275 shown in FIG. 2B. The method then returns to 228 to detect whether the LV power is present where, in response, either a further iteration of the di / dt fault detect loop is conducted or the process ends.

[0056] FIG.2D shows the OV (over voltage) fault detect method performed at step 235 in the fast fault detection method 200 of FIG.2A. In an embodiment, at 237, the local controller or processor 100 runs an overvoltage fast fault detect loop and at 240, the local controller or processor 100 obtains a differential voltage (VDIFF) measurement value based on the sensed voltage signal VD1 obtained using the input voltage sense circuit 40A and the sensed load voltage signal VD2obtained using sense circuit 40B of FIG.1A. Continuing at 245, a determination is made whether the obtained VDIFF measurement value is greater than a pre-determined VDIFF threshold value (thresh (VDIFF)). If at 245, it is determined that the obtained VDIFF measurement value does not exceed the pre-determined VDIFF threshold value, i.e., there is no OV fault detected, then the process proceeds to 248 where a determination is made as to whether any LV (low voltage) power is present indicating that certain low voltage domain (e.g., digital) circuits that drive processing components using low-voltage signals are operating. If, at 248, it is determined that there is LV power present, then the process returns to 237 for a further iteration of the OV (over voltage) fault detect loop method. Otherwise, at 248, if it is determined that LV power domain signals are not present, then the process ends.

[0057] Returning to step 245, FIG.2D, if it is determined that an OV fast fault is detected, then the process proceeds to 250 where an OV fast fault detection signal is generated for receipt at logic gate at step 208, FIG.2A to initiate the critical fault response method 275 shown in FIG. 2B. The method then returns to 248 to detect whether the LV power is present where, in response, either a further iteration of the OV fault detect loop is conducted or the process ends.

[0058] FIG.2E shows the dv / dt fault detect method performed at step 255 in the fast fault detection method 200 of FIG.2A. In an embodiment, at 257, FIG.2E, the local controller or processor 100 runs a dv / dt fast fault detect loop and at 260, the local controller or processor 100 obtains a differential voltage (VDIFF) measurement value based on the sensed voltage signal VD1 obtained using the input voltage sense circuit 40A and the sensed load voltage signal VD2obtained using sense circuit 40B of FIG.1A. Continuing at 262, a derivative dv / dt value derived from the VDIFF value is obtained from a differentiator circuit. Then, at 265, a determination is made as to whether the derived corresponding dv / dt value obtained is greater than a corresponding pre-determined dv / dt threshold value (thresh dv / dt)). If at 265, it is determined that the derived corresponding dv / dt value does not exceed the pre-determined dv / dt threshold value, i.e., there is no dv / dt fast fault detected, then the process proceeds to 268 where a determination is made as to whether any LV (low voltage) power is present indicating that certain low voltage domain (e.g., digital) circuits that drive processing components using low- voltage signals are operating. If, at 268, it is determined that there is LV power present, then the process returns to 257 for a further iteration of the dv / dt fault detect loop method. Otherwise, at 268, if it is determined that LV power domain signals are not present, then the process ends.

[0059] Returning to step 265, FIG.2E, if it is determined that a dv / dt fast fault is detected, then the process proceeds to 270 where a dv / dt fast fault detection signal is generated for receipt at logic gate at step 208, FIG.2A to initiate the critical fault response method 275 shown in FIG. 2B. The method then returns to 268 to detect whether the LV power is present where, in response, either a further iteration of the OV fault detect loop is conducted or the process ends. $%

[0060] In an embodiment, in view of FIG.3, a fast $& current rate of change sensing circuit 50 consisting of a Rogowski coil 113 is situated at or proximate the conductor 77 of circuit path 21connecting the SSCB MOSFET switch 15B drain (D) output to the load device 75 of $% FIG.1A. In the embodiment depicted, the Rogowski coil provides a non-contacting direct $& DC current rate of change sensing measurement at the drain current output conductor 77 of the second MOSFET switch 15B of the SSCB 20 of FIG.1A, e.g., utilized for the SSCB measurements during fast fault detect looping operations of FIG.2A.

[0061] In an embodiment, as shown in FIG.3, the Rogowski coil 113 is a coreless helical coil or toroid of wire around but not contacting the conductor 77 being measured. In the embodiment shown, the circuit conductor 77 can be a connection to a terminal of a DC bus bar through which current from the source flows through SSCB 20 as current ID. The Rogowski coil 113 is a closed circuit outputting an EMF voltage between two terminals 152 where the EMF voltage (e.g., V_coil) is proportional to the rate of change of the magnetic flux, i.e., rate of change of current, running through the encircled conductor and provides a highly linear relationship between $% V_coil and While the system response time speed is limited by the speed of the analog circuitry and comparators), however the response time of the Rogowski coil is the speed of light rendering system detection speeds being fast (on the order of 106(MHz) or 10-9(ns)) to detect current minute changes (e.g., microamperes / sec).

[0062] In an embodiment, the Rogowski coil sensing circuit is modeled as a transformer with mutual inductance that responds to rates of change of the received MOSFET switch drain current ID. The coil 113 is further modeled as including a series inductor and resistor and provides anoutput voltage VRO corresponding to charge stored at a connected capacitor at the output of the coil. The Rogowski coil conductor geometry results in an induced voltage proportional to the rate of change of current (i.e., di / dt). This output voltage can be a differential signal fed directly fed as input to analog instrumentation having one or more components to as filtering, $% amplification, and a fast $& current rate of change fault detection circuit including a comparator circuit for comparing an output voltage signal against a threshold to detect an over-di / dt fault. When the coil output voltage signal exceeds a voltage threshold value Vth, a comparator will trip $% and assert a $& current fault signal 57 which is input to logic circuitry used to control the gate driver used to turn OFF the MOSFET switch(es) of SSCB 20.

[0063] FIG.3 is a detailed embodiment of a fast di / dt sensor circuit 50 operating as an analog circuit to engage instantaneous fault trip response to the gate driver for controlling the switches $% of solid state circuit breaker 20. As shown in FIG.3, the $& current rate of change sensing circuit sensor Rogowski coil 113 is used in a configuration to measure the rate of change of current on the order of MegaAmps / sec to detect abnormal rise in DC current at the output conductor of the SSCB 20 that feeds load circuit 75.

[0064] More particularly, the Rogowski coil 113 is used in the high-current DC voltage electronics system 10 and can be placed to encircle the DC current-carrying circuit conductor 77 $% that is the SSCB output current path feeding the load for direct $& fault detection. The coil 113 measures a differential voltage proportional to a rate of change of drain terminal current at MOSFET 15B and the voltage output of the coil terminals 152 is a low-level output signal that is input to a differential signal conditioning circuit 155 including balancing capacitors and operational amplifier stages. As shown in FIG.3, differential signal conditioning balancing $% circuit 155 includes charging capacitors providing a sensed low-level positive going $& signal V+ $% 161 and a sensed low-level negative going $& signal V- 162 which can be input to the controller or processor 100 for further recording or for further computing or processing. The low-level $% positive going $& signal V+ 161 output of the Rogowski coil 113 charges a first capacitor 158 and is further received as an input voltage to an instrumentation amplifier 160 while the low-level$% negative going $& signal V- 162 output of the Rogowski coil 113 charges a second capacitor 159 and is further received as a second input voltage to the instrumentation amplifier 160. In an embodiment, instrumentation amplifier 160 includes a configuration of operational amplifiers and resistors forming a buffered differential amplifier of high CMMR and a high input impedance. This circuit amplifier 160 configuration is able to obtain to amplify the low-level $% signals to provide a single output signal 154 that is a measure of and is proportional to the $& rate of change of the current sensed by the Rogowski coil 113. This output signal 154 isto a$% connected fault detection stage 190 including the $& current rate of change fault detection circuit for positive and / or negative slope detection. $%

[0065] As shown in FIG.3, the $& (current rate of change) fault detection stage 190 for detecting a fault condition at the SSCB output includes further analog signal conditioning circuitry including a pair of comparator circuits each respective circuit consisting of an operational amplifier 172, 174 configured as a comparator. In an embodiment, the analog circuitry of FIG.3 is configured to have a very small built-in processing delay (e.g., determined based on natural response times of gain op-amps, comparators, etc.) that provide a virtually instantaneous fault response time (such as 200 ns or 1 µs). Analog condition circuitry of fault detection stage 190 with the comparator 172 having a first negative terminal input receiving the single output signal 154 and the comparator 174 having a first positive terminal input receiving the single output signal 154. Each respective comparator 172, 174 is configured to receive a further different set threshold value at a second input thereof. When comparator circuit 172 is tripped, the output signal is a negative sloped output signal 181 and when comparator circuit 174 is tripped, the output signal is a positive sloped output signal 183. Depending on which comparator trips, either output signal 181, 183 is input to a fault detection comparator 192 which compares the output signal 181, 183 against a fault voltage reference signal level 194 set to indicate the presence of a $% $% $& current fault. The comparator 192 will assert and latch a $& current fault detection signal 157 when either the positive going or negative going output signal 181, 183 exceeds the fault voltage $% reference signal level 192. This $& current fault detection signal 157 corresponds to signal 57used control the gate driver circuits, e.g., to render the paired MOSFETs of SSCB in an OFF state.

[0066] As further shown in FIG.3, in an optional embodiment, the system 10 is able to reset the $% $& current rate of change fault detection circuit 152 by receiving a fault reset command signal 185, such as may be generated by the controller or processor and received at a latched fault signal resent transistor 187. In an embodiment, to reset the fault after gate-driver reset or switch state change, the system asserts a fault reset command signal 185 that turns on transistor 187 to pull the comparator voltage down to reset the fault detect comparator 192 and reset fault detect signal 157.

[0067] FIG.4 is a detailed circuit diagram of the current sensor circuit 35 operating to measure the current flowing in the SSCB circuit conductor 71 in the electronics system 10 of FIG.1A. In a non-limiting embodiment, the current sensor 35 is a contactless current measurement device such as a coreless current sensor that does not impede the current path, however it can be a shunt device or a transformer for sensing current. The current sensor 35 and associated signal conditioning circuitry 233 measures the magnetic field at the conductor and correlates the magnetic field strength to a voltage in a linear output. In an embodiment, a contactless current measurement device is situated at a surface of printed circuit board (not shown) and disposed in proximity (e.g., vertically above) but not touching conductor wire 71. In a non-limiting example, the contactless current measurement device is a high-bandwidth low noise current sensor in an integrated circuit. Alternately, a coreless current sensor may be implemented, e.g., a shunt or transformer, and a contactless- current sensing method may be implemented.

[0068] Returning to FIG.4, the contactless current measurement device 35 generates an output voltage signal 242 which is a correlated measurement of the sensed current that can be directly compared against a threshold value to detect an overcurrent fault. As shown in FIG.4, this output signal 242 can be output as a measured current signal for input to the controller or processor 100 for further recording or for further computing or processing. This output signal 242 is further input to a connected fault detection stage 291 including the OC fault detection circuit for over-current fault detection.

[0069] As shown in FIG.4, the current fault detection stage 291 for detecting an OC fault condition at the SSCB includes a comparator circuit consisting of an operational amplifier 272 configured as a comparator with the comparator 272 having a first negative terminal input receiving the single output signal 242. The comparator 272 is configured to receive a threshold value at a second input thereof which is a fault voltage reference signal 293 set at a voltage level to indicate the presence of an OC current fault condition. The comparator 272 will assert and latch an OC current fault detection signal 37 when the output signal 242 exceeds the fault voltage reference signal level 293. This OC over current fault detection signal 37 is used control the gate driver circuits, e.g., to render the paired MOSFETs of SSCB in an OFF state.

[0070] As further shown in FIG.4, in an optional embodiment, the electronics system 10 is able to reset the OC fault detection stage 291 by receiving a fault reset command signal 286, such as may be generated by the controller or processor and received at a latched fault signal resent transistor 288. In an embodiment, to reset the fault after gate-driver reset or switch state change, the system can further assert a fault reset command signal 286 that turns on transistor 288 to pull the comparator voltage down to reset the fault detect comparator 272 and reset OC fault detect signal 37.

[0071] In an embodiment, the current fault detection stage 291 of FIG.4 can be adapted as a voltage sense circuit 40A, 40B for sensing the MOSFET switch drain voltages VD1, VD2 used to compute the differential voltage across the SSCB.

[0072] FIG.5 is a detailed circuit diagram of a single gate driver driving a single transistor switch and including associated switch fault management circuit 300 operating to generate gate drive signals to render multi-stage operation, e.g., the OFF / ON states and the INTERMEDIATE resistive state of the MOSFET switch thereof SSCB 20 of FIG.1A. The gate driver 60 may integrate isolation functionality or a separate isolator stage may be used. For example, FIG.5 additionally depicts a signal isolator (high-voltage to low-voltage) circuit 320 that receives isolated voltage rails for digital controls and non-isolated voltage rails to drive the switch open or closed. Signal isolator circuit 320 can act as a buffer and passes signals between high-voltageand low-voltage sides that will be isolated, e.g., voltages, OV fault detection, etc.. Further, while the gate driver inputs are shown as a single-ended inputs, the gate driver circuit can be operable to require a differential input, or, inputs including pulse-width modified (PWM) signals, analog range signals, etc..

[0073] In a non-limiting, illustrative embodiment, the gate driver circuit is an isolated gate driver 60 driven by low-voltage signals in a low-voltage domain 301 and processing those signals to provide gate control voltage outputs for driving the solid state circuit breaker switches, e.g., a MOSFET 15, in a high-voltage domain 302. The low-voltage input signals include at least a drive input power signal (IN+) 312. Drive input power signal 312 is processed to generate a higher voltage drive output power signal 351. This drive output power signal 351 can be boosted by an optional booster circuit 350 that output commands powered by switches connected to V+ DRV and V- DRV switch gate drive voltages. These output drive signals are output as a gate- source signal along input conductor 361 to control the gate-source voltage of SSCB MOSFET switch 15 state into one of: the closed (ON) or fully conducting state to provide a full current conducting path through the SSCB, or depending upon the drive output power signal 351, the INTERMEDIATE state for placing the MOSFET switch in the linear region of operation to provide a resistive path to limit current through the SSCB.

[0074] In an embodiment, the source voltage 370 is the ground reference on the high-voltage for either unidirectional or bidirectional SSCB embodiments. In response to the receipt and processing of the drive output power signal, the booster stage 350 can generate a drive output return signal 352 which is received at the gate driver 60 which responsively generates a corresponding drive input return signal (IN-) 342 for further processing, e.g., by the controller or processor in the low voltage domain.

[0075] Further received at gate driver 60 is a drive reset signal 314 that is generated by the local controller processor (not shown) in order to return the MOSFET switch 15 into the opened (OFF) state to prevent current flow through the SSCB from a previously conducting, e.g., (ON) state.

[0076] Further, the gate driver circuit 60 can provide fault detect response on both low-voltage and high-voltage domains. For example, in an embodiment, received at the gate driver circuit 60 is one of: a respective asserted di / dt fault condition signal 157 or asserted OC fault condition $% signal 237 in response to a respective sensed $& current rate of change value or a sensed current value exceeding a rated threshold. Although not shown, gate driver can further receive a detected over-voltage (OV) fault command and / or an over-current, over-di / dt current rate of change fault conditions or any additional fault signal that can also be the cause of a fault response (e.g., a controller fault, temperature fault). The respective asserted fault detection signal 157, 37, is received at the isolated gate driver 60 of the switch fault management circuit 300. In response to receipt of either the asserted di / dt fault condition signal 157 or asserted OC fault condition signal 37 or OV fault condition signal (not shown), the isolated gate driver circuit 60 is responsively commanded to OPEN the attached switch and render the MOSFET switch in an OFF, high- resistance state thereby terminating / preventing current flow through the SSCB.

[0077] Further, as shown in FIG.5, the gate driver circuit 60 includes a switch to pull-down IN+ signal 312 to GND upon a fault detection. While the gate driver circuit embodiment has IN- signal 342 at GND already, this will cause the gate driver output signal 351 to command the MOSFET switch 15 OPEN. For example, fault detect signal 157, 237 can be received at a pull down transistor 325 which removes the drive input power signal 312 and render the MOSFET switch 15 into the opened (OFF) state to terminate any current flow through the SSCB. Further, the gate voltage drive output power input conductor 361 to the gate terminal line has a switch to pull-down VGS to a negative V- DRV voltage. This is a MOSFET or JFET switch pinch-off voltage, which OPENS the switch 15. Thus, simultaneously, the received fault detect signal 157, 37 can be received at the signal isolator 320 which responsively generates a corresponding fault detect signal 345 in the high-voltage domain 302 that is received at gate voltage pull down transistor 355 to a negative drive (pinch-off) voltage at conductor 361 and render the MOSFET switch 15 into the opened (OFF) state to terminate any current flow through the SSCB.

[0078] FIG.6 is a diagram 400 depicting the tripping characteristics of a high-voltage circuit interruption device such as mechanical breaker, high-speed fuses as compared to the solid-state circuit breaker of FIG.1A for multiple rated currents. For example, for certain rated currentsthrough a mechanical breaker, a typical fast fault response time 902 to thermally trip the mechanical circuit breaker can range from the millisecond to hundred of millisecond ranges, while a fast fault response time 905 to magnetically trip the mechanical circuit breaker can be less than 10s of milliseconds. Further shown in FIG.6, for certain rated currents through a high- speed fuse-type breaker, a typical fast fault response time 912 to thermally trip the high-speed fuse can range in the microsecond range up to a hundred microseconds. However, as shown in FIG.6, for certain rated currents through a high-speed solid-state circuit breaker such as shown in FIG.1A, a fast fault response time 915 to thermally trip the SSCB can be less than one microsecond and can range from between 50 nanoseconds to 1 microsecond. Thus FIG.6 shows the improvement of implementing the solid-state circuit breaker device in combination with the fast trip fault circuit that provides circuit protection orders of magnitude faster than the other traditional high-voltage protection devices.

[0079] As used herein, the term “processor” may include a single core processor, a multi-core processor, multiple processors located in a single device, or multiple processors in wired or wireless communication with each other and distributed over a network of devices, the Internet, or the cloud. Accordingly, as used herein, functions, features or instructions performed or configured to be performed by a “processor”, may include the performance of the functions, features or instructions by a single core processor, may include performance of the functions, features or instructions collectively or collaboratively by multiple cores of a multi-core processor, or may include performance of the functions, features or instructions collectively or collaboratively by multiple processors, where each processor or core is not required to perform every function, feature or instruction individually. For example, a single FPGA may be used or multiple FPGAs may be used to achieve the functions, features or instructions described herein.

[0080] In accordance with a first aspect, a fast-fault detection circuit for a solid-state circuit breaker (SSCB) device comprises: a di / dt current rate of change detection circuit connected in series with a solid state circuit breaker device and the series connection of the di / dt current detection circuit and SSCB are connected between a high voltage DC power source and a load device. The di / dt current rate of change detection circuit detecting an instantaneous rate of change of a current flow through the SSCB device and generating a voltage signal proportionalto the detected rate of change of the current flow. A comparator circuit operatively connected to the di / dt current rate of change detection circuit is operable to compare the generated voltage signal against a pre-determined threshold voltage value and generates an instantaneous di / dt fault detection signal when the voltage signal corresponding to a rate of change of current flow exceeds the pre-determined threshold voltage value. A control circuit associated with the SSCB device is operable to configure the SSCB device to provide a high resistance, low current flow path through the SSCB in response to the generated instantaneous di / dt fault detection signal.

[0081] In accordance with a second aspect, the fast-fault detection circuit according to the first aspect, wherein the SSCB device comprises a series connection of a first Field Effect Transistor (FET), the first FET including a gate, a drain and a source terminal and including a body diode in a first orientation, the drain terminal connecting to a terminal of the high voltage DC power source; and a second FET connected in-series to the first FET, the second FET including a gate, a drain and a source terminal and including a body diode in a second orientation.

[0082] In accordance with a third aspect, the fast-fault detection circuit according to the second aspect, wherein the source terminal of the first FET is electrically connected to the source terminal of the second FET.

[0083] In accordance with a fourth aspect, the fast-fault detection circuit according to the second aspect or the third aspect, wherein in response to the generated instantaneous di / dt fault detection signal, the control circuit configures the first FET and second FET in an active impedance control ohmic region linear-mode of operation to provide a current flow path having a resistance value between a fully ON-state FET resistance value and an OFF-state FET resistance value.

[0084] In accordance with a fifth aspect, the fast-fault detection circuit according to the second aspect or the third aspect or the fourth aspect, wherein after an elapsed time duration, the control circuit configures said first FET and second FET in an OFF state to prevent current flow through the SSCB.

[0085] In accordance with a sixth aspect, the fast-fault detection circuit according to the second aspect, or the third aspect or the fourth aspect or the fifth aspect, wherein the control circuit comprises: a gate driver circuit operatively connected to each said first FET and second FET operable to receive signals from said di / dt current rate of change detection circuit, and responsively apply a gate voltage to the gate terminal of the first FET and the gate terminal of said second FET to provide the active impedance control of said SSCB.

[0086] In accordance with a seventh aspect, the fast-fault detection circuit according to the second aspect, or the third aspect or the fourth aspect or the fifth aspect or the sixth aspect, wherein the di / dt current rate of change detection circuit comprises: a coreless Rogowski coil situated proximate the drain terminal of the second FET operable to detect an induced voltage proportional to a rate of change of the current flow through the drain terminal of the second FET, and the comparator circuit for comparing the induced voltage against a threshold to detect an over di / dt fault condition and asserting the instantaneous di / dt fault detection signal when the obtained voltage exceeds the threshold.

[0087] In accordance with an eighth aspect, the fast-fault detection circuit according to the second aspect, or the third aspect or the fourth aspect or the fifth aspect or the sixth aspect or the seventh aspect, further comprising: a common mode current sense circuit connected in parallel to the load device.

[0088] In accordance with a ninth aspect, a method for detecting fast faults in a solid-state circuit breaker (SSCB) device comprises: detecting, using a di / dt current rate of change detection circuit, an instantaneous rate of change of current flow through an SSCB device and generating a voltage signal proportional to the instantaneous rate of change of current flow, the di / dt current rate of change detection circuit connected in series with the SSCB, and the series connection of the di / dt current rate of change detection circuit and the SSCB connecting an output terminal of a high voltage DC power source to an input terminal of a high voltage DC load device. The method further compares, using a comparator circuit operatively connected to the rate of change di / dt detection circuit, the generated voltage signal against a pre-determined threshold voltage value, and generates an instantaneous di / dt fault detection signal when the voltage signalcorresponding to a rate of change of current flow exceeds the pre-determined threshold voltage value. A control circuit associated with the SSCB device receives the instantaneous di / dt fault detection signal; and configures the SSCB device to provide a high resistance, low current flow path through the SSCB in response to the received instantaneous di / dt fault detection signal.

[0089] In accordance with a tenth aspect, the method for detecting fast faults in a solid-state circuit breaker (SSCB) device according to the ninth aspect wherein the SSCB device comprises a series connection of a first Field Effect Transistor (FET), the first FET including a gate, a drain and a source terminal and including a body diode in a first orientation, the drain terminal connecting to a terminal of the high voltage DC power source; and a second FET connected in- series to the first FET, the second FET including a gate, a drain and a source terminal and including a body diode in a second orientation.

[0090] In accordance with an eleventh aspect, the method for detecting fast faults in a solid-state circuit breaker (SSCB) device according to the tenth aspect further comprising: configuring, in response to the generated instantaneous di / dt fault detection signal, the control circuit to place the first FET and second FET in an active impedance control ohmic region linear-mode of operation to provide a current flow path having a resistance value between a fully ON-state FET resistance value and an OFF-state FET resistance value.

[0091] In accordance with a twelfth aspect, the method for detecting fast faults in a solid-state circuit breaker (SSCB) device according to the eleventh aspect wherein after an elapsed time duration, the control circuit configuring the first FET and second FET in an OFF state to prevent current flow through the SSCB.

[0092] In accordance with a thirteenth aspect, the method for detecting fast faults in a solid-state circuit breaker (SSCB) device according to the eleventh aspect or twelfth aspect wherein the control circuit comprises a gate driver circuit operatively connected to the first FET and second FET for receiving the instantaneous di / dt fault detection signal, the method further comprising: responsively applying a gate voltage to the gate terminal of each the first FET and the gateterminal of the second FET to configure each the first FET and second FET into the linear-mode operation.

[0093] In accordance with a fourteenth aspect, the method for detecting fast faults in a solid-state circuit breaker (SSCB) device according to any one of the eleventh aspect or twelfth aspect or thirteenth aspect, further comprising: receiving, at the control circuit, an externally generated control signal for controlling the gate driver circuit to re-configure the SSCB device from the linear-mode of operation to one of: an ON-state or an OFF-state of operation, the ON-state of operation providing a low resistance, full current flow path through the SSCB; and the OFF-state of operation preventing a current flow through the SSCB.

[0094] As described herein, aspects of the present disclosure may include one or more electrical, pneumatic, hydraulic, or other similar secondary components and / or systems therein.

[0095] The present disclosure is therefore contemplated and will be understood to include any necessary operational components thereof. For example, electrical components will be understood to include any suitable and necessary wiring, fuses, or the like for normal operation thereof. Similarly, any pneumatic systems provided may include any secondary or peripheral components such as air hoses, compressors, valves, meters, or the like. It will be further understood that any connections between various components not explicitly described herein may be made through any suitable means including mechanical fasteners, or more permanent attachment means, such as welding or the like. Alternatively, where feasible and / or desirable, various components of the present disclosure may be integrally formed as a single unit.

[0096] Various inventive concepts may be embodied as one or more methods, of which an example has been provided. The acts performed as part of the method may be ordered in any suitable way. Accordingly, embodiments may be constructed in which acts are performed in an order different than illustrated, which may include performing some acts simultaneously, even though shown as sequential acts in illustrative embodiments.

[0097] While various inventive aspects have been described and illustrated herein, those ofordinary skill in the art will readily envision a variety of other means and / or structures for performing the function and / or obtaining the results and / or one or more of the advantages described herein, and each of such variations and / or modifications is deemed to be within the scope of the inventive aspects described herein. More generally, those skilled in the art will readily appreciate that all parameters, dimensions, materials, and configurations described herein are meant to be exemplary and that the actual parameters, dimensions, materials, and / or configurations will depend upon the specific application or applications for which the inventive teachings is / are used. Those skilled in the art will recognize or be able to ascertain using no more than routine experimentation, many equivalents to the specific inventive aspects described herein. It is, therefore, to be understood that the foregoing aspects are presented by way of example only and that, within the scope of the appended claims and equivalents thereto, inventive aspects may be practiced otherwise than as specifically described and claimed. Inventive aspects of the present disclosure are directed to each individual feature, system, article, material, kit, and / or method described herein. In addition, any combination of two or more such features, systems, articles, materials, kits, and / or methods, if such features, systems, articles, materials, kits, and / or methods are not mutually inconsistent, is included within the inventive scope of the present disclosure.

[0098] The above-described aspects of the disclosure can be implemented in any of numerous ways. For example, aspects of technology disclosed herein may be implemented using hardware, software, or a combination thereof. When implemented in software, the software code or instructions can be executed on any suitable processor or collection of processors, whether provided in a single computer or distributed among multiple computers. Furthermore, the instructions or software code can be stored in at least one non-transitory computer readable storage medium.

[0099] As used herein, the term “processor” may include a single core processor, a multi-core processor, multiple processors located in a single device, or multiple processors in wired or wireless communication with each other and distributed over a network of devices, the Internet, or the cloud. Accordingly, as used herein, functions, features or instructions performed or configured to be performed by a “processor”, may include the performance of the functions,features or instructions by a single core processor, may include performance of the functions, features or instructions collectively or collaboratively by multiple cores of a multi-core processor, or may include performance of the functions, features or instructions collectively or collaboratively by multiple processors, where each processor or core is not required to perform every function, feature or instruction individually. For example, a single FPGA may be used, or multiple FPGAs may be used to achieve the functions, features or instructions described herein.

[0100] The various methods or processes outlined herein may be coded as software / instructions that is executable on one or more processors that employ any one of a variety of operating systems or platforms. Additionally, such software may be written using any of a number of suitable programming languages and / or programming or scripting tools, and also may be compiled as executable machine language code or intermediate code that is executed on a framework or virtual machine.

[0101] In this respect, various inventive concepts may be embodied as a computer readable storage medium (or multiple computer readable storage media) (e.g., a computer memory, one or more floppy discs, compact discs, optical discs, magnetic tapes, flash memories, USB flash drives, SD cards, circuit configurations in Field Programmable Gate Arrays or other semiconductor devices, or other non-transitory medium or tangible computer storage medium) encoded with one or more programs that, when executed on one or more computers or other processors, perform methods that implement the various embodiments of the disclosure discussed above. The computer readable medium or media can be transportable, such that the program or programs stored thereon can be loaded onto one or more different computers or other processors to implement various aspects of the present disclosure as discussed above.

[0102] The terms “program” or “software” or “instructions” are used herein in a generic sense to refer to any type of computer code or set of computer-executable instructions that can be employed to program a computer or other processor to implement various aspects of embodiments as discussed above. Additionally, it should be appreciated that according to one aspect, one or more computer programs that when executed perform methods of the present disclosure need not reside on a single computer or processor, but may be distributed in a modularfashion amongst a number of different computers or processors to implement various aspects of the present disclosure.

[0103] Computer-executable instructions may be in many forms, such as program modules, executed by one or more computers or other devices. Generally, program modules include routines, programs, objects, components, data structures, etc. that perform particular tasks or implement particular abstract data types. Typically, the functionality of the program modules may be combined or distributed as desired in various embodiments. As such, one aspect or embodiment of the present disclosure may be a computer program product including least one non-transitory computer readable storage medium in operative communication with a processor, the storage medium having instructions stored thereon that, when executed by the processor, implement a method or process described herein, wherein the instructions comprise the steps to perform the method(s) or process(es) detailed herein.

[0104] Also, data structures may be stored in computer-readable media in any suitable form. For simplicity of illustration, data structures may be shown to have fields that are related through location in the data structure. Such relationships may likewise be achieved by assigning storage for the fields with locations in a computer-readable medium that convey relationship between the fields. However, any suitable mechanism may be used to establish a relationship between information in fields of a data structure, including through the use of pointers, tags or other mechanisms that establish relationship between data elements.

[0105] All definitions, as defined and used herein, should be understood to control over dictionary definitions, definitions in documents incorporated by reference, and / or ordinary meanings of the defined terms.

[0106] The articles “a” and “an,” as used herein in the specification and in the claims, unless clearly indicated to the contrary, should be understood to mean “at least one.” The phrase “and / or,” as used herein in the specification and in the claims (if at all), should be understood to mean “either or both” of the elements so conjoined, i.e., elements that are conjunctively present in some cases and disjunctively present in other cases. Multiple elements listed with “and / or”should be construed in the same fashion, i.e., “one or more” of the elements so conjoined. Other elements may optionally be present other than the elements specifically identified by the “and / or” clause, whether related or unrelated to those elements specifically identified. Thus, as a non- limiting example, a reference to “A and / or B”, when used in conjunction with open-ended language such as “comprising” can refer, in one embodiment, to A only (optionally including elements other than B); in another embodiment, to B only (optionally including elements other than A); in yet another embodiment, to both A and B (optionally including other elements); etc. As used herein in the specification and in the claims, “or” should be understood to have the same meaning as “and / or” as defined above. For example, when separating items in a list, “or” or “and / or” shall be interpreted as being inclusive, i.e., the inclusion of at least one, but also including more than one, of a number or list of elements, and, optionally, additional unlisted items. Only terms clearly indicated to the contrary, such as “only one of” or “exactly one of,” or, when used in the claims, “consisting of,” will refer to the inclusion of exactly one element of a number or list of elements. In general, the term “or” as used herein shall only be interpreted as indicating exclusive alternatives (i.e. “one or the other but not both”) when preceded by terms of exclusivity, such as “either,” “one of,” “only one of,” or “exactly one of.” “Consisting essentially of,” when used in the claims, shall have its ordinary meaning as used in the field of patent law.

[0107] As used herein in the specification and in the claims, the phrase “at least one,” in reference to a list of one or more elements, should be understood to mean at least one element selected from any one or more of the elements in the list of elements, but not necessarily including at least one of each and every element specifically listed within the list of elements and not excluding any combinations of elements in the list of elements. This definition also allows that elements may optionally be present other than the elements specifically identified within the list of elements to which the phrase “at least one” refers, whether related or unrelated to those elements specifically identified. Thus, as a non-limiting example, “at least one of A and B” (or, equivalently, “at least one of A or B,” or, equivalently “at least one of A and / or B”) can refer, in one embodiment, to at least one, optionally including more than one, A, with no B present (and optionally including elements other than B); in another embodiment, to at least one, optionally including more than one, B, with no A present (and optionally including elements other than A); in yet another embodiment, to at least one, optionally including more than one, A, and at leastone, optionally including more than one, B (and optionally including other elements); etc.

[0108] While components of the present disclosure are described herein in relation to each other, it is possible for one of the components disclosed herein to include inventive subject matter, if claimed alone or used alone. In keeping with the above example, if the disclosed embodiments teach the features of components A and B, then there may be inventive subject matter in the combination of A and B, A alone, or B alone, unless otherwise stated herein.

[0109] When a feature or element is herein referred to as being “on” another feature or element, it can be directly on the other feature or element or intervening features and / or elements may also be present. In contrast, when a feature or element is referred to as being “directly on” another feature or element, there are no intervening features or elements present. It will also be understood that, when a feature or element is referred to as being “connected”, “attached” or “coupled” to another feature or element, it can be directly connected, attached or coupled to the other feature or element or intervening features or elements may be present. In contrast, when a feature or element is referred to as being “directly connected”, “directly attached” or “directly coupled” to another feature or element, there are no intervening features or elements present. Although described or shown with respect to one embodiment, the features and elements so described or shown can apply to other embodiments. It will also be appreciated by those of skill in the art that references to a structure or feature that is disposed “adjacent” another feature may have portions that overlap or underlie the adjacent feature.

[0110] Although the terms “first” and “second” may be used herein to describe various features / elements, these features / elements should not be limited by these terms, unless the context indicates otherwise. These terms may be used to distinguish one feature / element from another feature / element. Thus, a first feature / element discussed herein could be termed a second feature / element, and similarly, a second feature / element discussed herein could be termed a first feature / element without departing from the teachings of the present invention.

[0111] If this specification states a component, feature, structure, or characteristic “may”, “might”, or “could” be included, that particular component, feature, structure, or characteristic isnot required to be included. If the specification or claim refers to “a” or “an” element, that does not mean there is only one of the element. If the specification or claims refer to “an additional” element, that does not preclude there being more than one of the additional element.

[0112] As used herein in the specification and claims, including as used in the examples and unless otherwise expressly specified, all numbers may be read as if prefaced by the word “about” or “approximately,” even if the term does not expressly appear. The phrase “about” or “approximately” may be used when describing magnitude and / or position to indicate that the value and / or position described is within a reasonable expected range of values and / or positions. For example, a numeric value may have a value that is + / −0.1% of the stated value (or range of values), + / −1% of the stated value (or range of values), + / −2% of the stated value (or range of values), + / −5% of the stated value (or range of values), + / −10% of the stated value (or range of values), etc. Any numerical range recited herein is intended to include all sub-ranges subsumed therein.

[0113] Additionally, the method of performing the present disclosure may occur in a sequence different than those described herein. Accordingly, no sequence of the method should be read as a limitation unless explicitly stated. It is recognizable that performing some of the steps of the method in a different order could achieve a similar result. Additionally, the features may be performed at the same time.

[0114] In the claims, as well as in the specification above, all transitional phrases such as “comprising,” “including,” “carrying,” “having,” “containing,” “involving,” “holding,” “composed of,” and the like are to be understood to be open-ended, i.e., to mean including but not limited to. Only the transitional phrases “consisting of” and “consisting essentially of” shall be closed or semi-closed transitional phrases, respectively, as set forth in the United States Patent Office Manual of Patent Examining Procedures.

[0115] To the extent that the present disclosure has utilized the term “invention” in various titles or sections of this specification, this term was included as required by the formatting requirements of word document submissions pursuant the guidelines / requirements of the UnitedStates Patent and Trademark Office and shall not, in any manner, be considered a disavowal of any subject matter.

[0116] In the foregoing description, certain terms have been used for brevity, clearness, and understanding. No unnecessary limitations are to be implied therefrom beyond the requirement of the prior art because such terms are used for descriptive purposes and are intended to be broadly construed.

[0117] Moreover, the description and illustration of various aspects of the disclosure are examples and the disclosure is not limited to the exact details shown or described. The terminology used herein is for the purpose of describing particular aspects only and is not intended to be limiting the scope of the disclosure and is not intended to be exhaustive. Many modifications and variations will be apparent to those of ordinary skill in the art without departing from the scope and spirit of the disclosure.

Claims

CLAIMS 1. A fast-fault detection circuit for a solid-state circuit breaker (SSCB) device, the fast-fault detection circuit comprising: a di / dt current rate of change detection circuit connected in series with a solid state circuit breaker device and the series connection of the di / dt current rate of change detection circuit and SSCB are connected between a high voltage DC power source and a load device, said di / dt current rate of change detection circuit detecting an instantaneous rate of change of a current flow through the SSCB device and generating a voltage signal proportional to the detected rate of change of the current flow; a comparator circuit operatively connected to the di / dt current rate of change detection circuit operable to compare the generated voltage signal against a pre-determined threshold voltage value and generating an instantaneous di / dt fault detection signal when the voltage signal corresponding to a rate of change of current flow exceeds the pre-determined threshold voltage value; and a control circuit associated with said SSCB device operable to configure said SSCB device to provide a high resistance, low current flow path through the SSCB in response to the generated instantaneous di / dt fault detection signal.

2. The fast-fault detection circuit as claimed in Claim 1, wherein said SSCB device comprises a series connection of a first Field Effect Transistor (FET), the first FET including a gate, a drain and a source terminal and including a body diode in a first orientation, the drain terminal connecting to a terminal of the high voltage DC power source; and a second FET connected in- series to the first FET, the second FET including a gate, a drain and a source terminal and including a body diode in a second orientation.

3. The fast-fault detection circuit as claimed in Claim 2, wherein the source terminal of the first FET is electrically connected to the source terminal of the second FET.

4. The fast-fault detection circuit as claimed in Claim 2 or Claim 3, wherein in response to the generated instantaneous di / dt fault detection signal, the control circuit configures said first FETand second FET in an active impedance control ohmic region linear-mode of operation to provide a current flow path having a resistance value between a fully ON-state FET resistance value and an OFF-state FET resistance value.

5. The fast-fault detection circuit as claimed in any one of Claims 2 to 4, wherein after an elapsed time duration, the control circuit configures said first FET and second FET in an OFF state to prevent current flow through the SSCB.

6. The fast-fault detection circuit as claimed in any one of Claims 2 to 5, wherein said control circuit comprises: a gate driver circuit operatively connected to each said first FET and second FET operable to receive signals from said di / dt current rate of change detection circuit, and responsively apply a gate voltage to the gate terminal of the first FET and the gate terminal of said second FET to provide the active impedance control of said SSCB.

7. The fast-fault detection circuit as claimed in any one of Claims 2 to 6, wherein the di / dt current rate of change detection circuit comprises: a coreless Rogowski coil situated proximate the drain terminal of said second FET operable to detect an induced voltage proportional to a rate of change of the current flow through the drain terminal of said second FET, and the comparator circuit for comparing the induced voltage against a threshold to detect an over di / dt fault condition and asserting the instantaneous di / dt fault detection signal when the obtained voltage exceeds the threshold.

8. The fast-fault detection circuit as claimed in any one of Claims 1 to 7, further comprising: a common mode current sense circuit connected in parallel to said load device.

9. A method for detecting fast faults in a solid-state circuit breaker (SSCB) device, the method comprising: detecting, using a di / dt current rate of change detection circuit, an instantaneous rate of change of current flow through an SSCB device and generating a voltage signal proportional tothe instantaneous rate of change of current flow, the di / dt current rate of change detection circuit connected in series with said SSCB, and the series connection of said di / dt current rate of change detection circuit and said SSCB connecting an output terminal of a high voltage DC power source to an input terminal of a high voltage DC load device; comparing, using a comparator circuit operatively connected to the rate of change di / dt detection circuit, the generated voltage signal against a pre-determined threshold voltage value, and generating an instantaneous di / dt fault detection signal when the voltage signal corresponding to a rate of change of current flow exceeds the pre-determined threshold voltage value; receiving, at a control circuit associated with said SSCB device, said instantaneous di / dt fault detection signal; and configuring, using the control circuit associated with said SSCB device, said SSCB device to provide a high resistance, low current flow path through the SSCB in response to the received instantaneous di / dt fault detection signal.

10. The method as claimed in Claim 9, wherein said SSCB device comprises a series connection of a first Field Effect Transistor (FET), the first FET including a gate, a drain and a source terminal and including a body diode in a first orientation, the drain terminal connecting to a terminal of the high voltage DC power source; and a second FET connected in-series to the first FET, the second FET including a gate, a drain and a source terminal and including a body diode in a second orientation.

11. The method as claimed in Claim 10, further comprising: configuring, in response to the generated instantaneous di / dt fault detection signal, the control circuit to place said first FET and second FET in an active impedance control ohmic region linear-mode of operation to provide a current flow path having a resistance value between a fully ON-state FET resistance value and an OFF-state FET resistance value.

12. The method as claimed in Claim 11, wherein after an elapsed time duration, the control circuit configuring said first FET and second FET in an OFF state to prevent current flow through the SSCB.

13. The method as claimed in Claim 11 or Claim 12, wherein the control circuit comprises a gate driver circuit operatively connected to said first FET and second FET for receiving said instantaneous di / dt fault detection signal, said method further comprising: responsively applying a gate voltage to the gate terminal of each said first FET and said gate terminal of said second FET to configure each said first FET and second FET into the linear-mode operation.

14. The method as claimed in any one of Claims 11 to 13, further comprising: receiving, at the control circuit, an externally generated control signal for controlling said gate driver circuit to re-configure said SSCB device from said linear-mode of operation to one of: an ON-state or an OFF-state of operation, said ON-state of operation providing a low resistance, full current flow path through the SSCB; and said OFF-state of operation preventing a current flow through the SSCB.

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