CCD-based detection method and detection system

Abstract

The present disclosure provides a CCD-based detection method and detection system. The detection method is used for detecting a current collector. The detection method comprises: performing CCD detection on a sample to be tested to obtain CCD detection data; obtaining data of a defect point on the basis of the CCD detection data; constructing a heat map on the basis of the data of the defect point; on the basis of the distribution of the heat map, determining whether the height of the defect point is greater than a threshold; and marking the defect point on the basis that the height of the defect point is greater than the threshold. In the CCD-based detection method of the present disclosure, by generating the heat map on the basis of the CCD detection data, the degree of defect of the defect point, i.e., the height of a protrusion or the depth of a dent, can be visually seen, so as to determine whether the defect point meets a standard. In the CCD-based detection method of the present disclosure, defect points that do not meet the standard can be quickly identified on the basis of the CCD detection data, without destroying the appearance of a composite current collector; and the detection cost is reduced, the detection efficiency is improved, and the height of the defect points can be changed by means of a preset threshold, so that the application range is wider.

Description

CCD-based detection method and detection system

[0001] This application is based on the Chinese application CN application number 202410828628.4, application date June 25, 2024, and claims priority thereto, the disclosure of which is incorporated herein in its entirety. TECHNICAL FIELD

[0002] The present disclosure relates to the technical field of batteries, in particular, to a CCD-based detection method and detection system. BACKGROUND

[0003] With the rapid development of new energy lithium batteries, new type of lithium battery current collector composite aluminum foil and copper foil appear, using PVD physical vapor deposition method, composite aluminum / copper current collector can be obtained. Unlike traditional packaging industry, in the process of evaporating composite current collector, the amount of metal wire melting and evaporation per unit time increases by several times, which causes metal splashing phenomenon and appearance defects of the product.

[0004] The defect height of the composite current collector is too high, which will cause the scraping and breaking of the downstream battery coating process, affecting the production efficiency of the battery; a small amount of defect height sampling test can be realized by scanning electron microscope, but there is no effective means for full inspection test of the defect height of the composite current collector. SUMMARY

[0005] The purpose of the present disclosure is to provide a CCD-based detection method and detection system, which can solve at least one of the above technical problems. The specific scheme is as follows:

[0006] According to the specific embodiment of the present disclosure, in one aspect, the present disclosure provides a CCD-based detection method for detecting current collector, the CCD-based detection method comprising: performing CCD detection on the sample to be detected to obtain CCD detection data; obtaining defect point data based on the CCD detection data; constructing a heat map based on the defect point data; determining whether the height of the defect point is greater than a threshold value in the distribution of the heat map; marking the defect point based on the height of the defect point being greater than the threshold value.

[0007] In an optional embodiment, the heat map along a first axis in a first direction is the lateral detection width of the CCD, and the heat map along a second axis in a second direction is the longitudinal detection length of the CCD; wherein the first direction is substantially perpendicular to the second direction.

[0008] In an optional embodiment, the heat map is grid-shaped, and the heat map comprises a plurality of the first axes and the second axes; wherein the plurality of the first axes are arranged equidistantly, and the plurality of the second axes are arranged equidistantly.

[0009] In an optional embodiment, the interval of the first axes is 0.1-10 mm.

[0010] In an optional embodiment, the interval of the second axes is 1-300 mm.

[0011] In an optional embodiment, the number of the unit cells formed by the plurality of the first axes and the plurality of the second axes is 1-1000.

[0012] In an optional embodiment, the height of the defect point comprises an absolute value of height data of a convex point or an absolute value of depth data of a concave point.

[0013] In an optional embodiment, the threshold value is 50-120 pm.

[0014] In an optional embodiment, the CCD-based detection method further comprises setting a calibration color; and the determining, based on the distribution of the heat map, whether the height of the defect point is greater than the threshold value comprises determining, based on the distribution of the heat map, a defect point with color brightness higher than calibration color brightness.

[0015] In an optional embodiment, the setting of the calibration color comprises performing CCD detection on a calibration point of a calibration sample to obtain CCD calibration data; and constructing a calibration heat map based on the CCD calibration data to obtain a calibration color; wherein the calibration point is a defect point with a defect height equal to the threshold value.

[0016] According to the specific embodiments of the present disclosure, in another aspect, the present disclosure provides a CCD-based detection system for detecting a current collector, which is configured to perform the detection method according to any one of the above technical solutions.

[0017] Compared with the prior art, the above-mentioned solutions of the embodiments of the present disclosure have at least the following beneficial effects:

[0018] The CCD-based detection method of the present disclosure can intuitively determine the defect degree of a defect point, i.e., the height of a convex point or the depth of a concave point, by generating a heat map from CCD detection data, so as to determine whether the defect point meets the standard. The CCD-based detection method of the present disclosure relies on CCD detection data to quickly identify defect points that do not meet the standard, without damaging the appearance of the composite current collector. The detection cost is reduced, and the detection efficiency is improved. The height of a defect point can be changed by a pre-set threshold value, so that the application range is wider. BRIEF DESCRIPTION OF DRAWINGS

[0019] FIG. 1 shows a flow chart of a CCD-based detection method according to an embodiment of the present disclosure.

[0020] FIG. 2 shows a flow chart of a CCD-based detection method according to another embodiment of the present disclosure. DETAILED DESCRIPTION

[0021] For the purposes of the present disclosure, the term "comprising" is intended to mean that the compositions and methods include the recited steps or options, but not excluding others. It is intended to cover the compositions and methods "comprising" the recited steps or options, "consisting of" the recited steps or options, and "consisting essentially of" the recited steps or options. The term "consisting essentially of" is intended to mean the compositions and methods include the recited steps or options, plus trace amounts of unrecited steps or options. The term "consisting of" is intended to mean the compositions and methods include only the recited steps or options. It is intended that the specification and examples be considered exemplary only, with the true scope of the disclosure being indicated by the following claims.

[0022] The terminology used in the present disclosure is merely for the purpose of describing particular embodiments and is not intended to be limiting of the present disclosure. As used in the description of the embodiments of the present disclosure and the appended claims, the singular forms "a", "an" and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. It will also be understood that the term "and / or" as used herein refers to and encompasses any and all possible combinations of one or more of the associated listed items.

[0023] It should be understood that the term "and / or" as used herein is merely an associative relationship of the associated objects, and means that there can be three relationships, for example, A and / or B, which means that there are three cases of A alone, A and B together, and B alone. In addition, the character " / " herein generally means that the front and rear associated objects are in an "or" relationship.

[0024] It should be understood that although the terms first, second, third, etc. can be used in the embodiments of the present disclosure to describe various structures, these structures should not be limited to these terms. These terms are only used to distinguish different structures. For example, without departing from the scope of the embodiments of the present disclosure, the first component can also be referred to as the second component, and similarly, the second component can also be referred to as the first component.

[0025] Depending on the context, the word "if" as used herein can be interpreted to mean "when" or "while" or "in response to the determination" or "in response to the occurrence." Similarly, the phrase "if it is determined" or "if [a stated condition or event] is detected" can be interpreted to mean "upon determining" or "in response to determining" or "upon detecting [the stated condition or event]" or "in response to detecting [the stated condition or event]."

[0026] It is also to be noted that the terms "comprising", "containing", or any other similar term as used herein are intended to encompass the inclusion of one or more elements, steps, or components, but not exclude the presence of other elements, steps, or components. In an embodiment, the term "comprising" is used in the sense of "including" rather than "consisting of".

[0027] CCD is the abbreviation of Charge-coupled Device, which means a light-sensing coupling component, also known as a charge-coupled device; CCD detection is to detect the appearance of an object through a CCD component.

[0028] In order to solve at least one of the above-mentioned technical problems, the present disclosure provides a CCD-based detection method and a detection system, the CCD-based detection method is used for detecting a current collector, and the CCD-based detection method can include: performing CCD detection on a sample to be detected to obtain CCD detection data; obtaining defect point data based on the CCD detection data; constructing a heat map based on the defect point data; determining whether the height of the defect point is greater than a threshold value based on the distribution of the heat map; and marking the defect point based on the height of the defect point being greater than the threshold value. The CCD-based detection method of the present disclosure can intuitively see the defect degree of the defect point, i.e., the height of the protrusion or the depth of the depression, by generating a heat map from the CCD detection data, so as to determine whether the defect point meets the standard. Moreover, the present disclosure can visually see the height of the defect point (the height of the protrusion or the depth of the depression) in the heat map by setting the threshold value, and can determine the defect point that does not meet the standard by comparing the threshold value.

[0029] The optional embodiments of the present disclosure will be described in detail below with reference to the accompanying drawings.

[0030] FIG. 1 shows a flowchart of a CCD-based detection method according to an embodiment of the present disclosure. As shown in FIG. 1, according to the specific embodiments of the present disclosure, on one hand, a CCD-based detection method is provided, which is used for detecting a current collector, and the CCD-based detection method can at least include the following steps:

[0031] S100, performing CCD detection on a sample to be detected to obtain CCD detection data.

[0032] S200, obtaining defect point data based on the CCD detection data.

[0033] S300, constructing a heat map based on the defect point data.

[0034] S400, judging whether the height of the defect point is greater than a threshold value according to the distribution of the heat map.

[0035] S500, marking the defect point according to the height of the defect point being greater than the threshold value.

[0036] The CCD-based detection method of the present disclosure can intuitively see the defect degree of the defect point, i.e. the height of the protrusion or the depth of the depression, by generating a heat map from the CCD detection data, so as to judge whether the defect point meets the standard. The CCD-based detection method of the present disclosure relies on the CCD detection data to quickly identify the defect point that does not meet the standard, while not damaging the appearance of the composite current collector; reduces the detection cost and improves the detection efficiency. The height of the defect point can be changed by a pre-set threshold value, so that the application range is wider.

[0037] It should be noted that the height of the defect point not only includes the depth of the depression, but also includes the height of the protrusion. Through analysis of the heat map, the height data of the defect point can be obtained. The data can be compared with the threshold value; or the threshold value can be set to a certain range to judge whether the height data of the defect point is within the threshold value range, for example: the threshold value is -80-80 μm, when the defect point is a depression, the height data of the defect point is -100 μm, which exceeds the range of the threshold value, and it is determined that the defect does not meet the standard; when the defect point is a protrusion, the height data of the defect point is 100 μm, which exceeds the range of the threshold value, and it is determined that the defect does not meet the standard; similarly, when the defect point is a depression, the height data of the defect point is -30 μm, which does not exceed the range of the threshold value, and it is determined that the defect meets the standard; when the defect point is a protrusion, the height data of the defect point is 40 μm, which does not exceed the range of the threshold value, and it is determined that the defect meets the standard.

[0038] In step S100, the CCD detection data at least includes coordinate data and heat data. The coordinate data can determine the position of the defect point, and the heat data provides data support for constructing the heat map in step S300.

[0039] In step S200, the defect point data of the sample to be detected can be obtained by CCD detection, which at least includes coordinate data and heat data of the defect point.

[0040] In step S300, the heat map is constructed by the coordinate data and heat data of the defect point in the CCD detection data.

[0041] In step S400, in a general heat map analysis, the higher the color brightness, the more data or the more concentrated data, and in the present disclosure, the height of the defect point can be analyzed by the brightness of the color. The first axis of the heat map in the first direction is the transverse detection width of the CCD, and the second axis of the heat map in the second direction is the longitudinal detection length of the CCD; wherein the first direction is substantially perpendicular to the second direction. The heat map is grid-shaped, and the heat map includes a plurality of first axes and a plurality of second axes; wherein the plurality of first axes are equidistantly arranged, and the plurality of second axes are equidistantly arranged. The interval of the first axis is 0.1-10 mm; the interval of the second axis is 1-300 mm. The number of primitive squares formed by the plurality of first axes and the plurality of second axes is 1-1000. By setting the heat map to have an interval of the first axis of 0.1-10 mm, an interval of the second axis of 1-300 mm, and a number of primitive squares of 1-1000, the squares occupied by different defects can be visualized, which facilitates visual observation, and whether the defect point meets the standard can be distinguished by the naked eye, thereby achieving the effect of early warning.

[0042] In step S500, the defect point with a height greater than the threshold value is a defect point that does not meet the standard. Specifically, the threshold value can be regarded as a standard for meeting the standard, and the threshold value can be set according to actual needs.

[0043] FIG. 2 shows a flowchart of a CCD-based detection method according to another embodiment of the present disclosure. As shown in FIG. 2, the CCD-based detection method can further include at least:

[0044] S600, setting a calibration color.

[0045] Under the premise of step S600, step S400 includes:

[0046] S410, determining a defect point with color brightness higher than the calibration color brightness from the distribution of the heat map.

[0047] Under the premise of step S600, step S500 includes:

[0048] S510, marking the defect point based on the defect point with color brightness higher than the calibration color brightness.

[0049] The step S600 can include:

[0050] S610, performing CCD detection on a calibration point of a calibration sample to obtain CCD calibration data; the calibration point is a defect point with a defect height of the threshold value.

[0051] S620, constructing a calibration heat map based on the CCD calibration data to obtain a calibration color.

[0052] In some embodiments, the constructing the heat map based on the defect point data can include that a first axis of the heat map along a first direction is a lateral detection width of the CCD, and a second axis of the heat map along a second direction is a longitudinal detection length of the CCD. In an optional embodiment, the first direction is substantially perpendicular to the second direction.

[0053] In some embodiments, the heat map is grid-shaped, and the heat map can include a plurality of the first axes and the second axes. In an optional embodiment, the plurality of the first axes are equidistantly arranged, and the plurality of the second axes are equidistantly arranged.

[0054] In some embodiments, a spacing of the first axis is 0.1-10 mm. In an optional embodiment, a spacing of the second axis is 1-300 mm.

[0055] In some embodiments, a cell grid value formed by the plurality of the first axes and the plurality of the second axes is 1-1000.

[0056] In some embodiments, the height of the defect point can include an absolute value of the height data of a convex point or an absolute value of the depth data of a concave point. The height of the defect point can be compared with the threshold value, and in some embodiments, the threshold value is 50-120 μm. The height of the defect point can also set the threshold value as a certain range to determine whether the height data of the defect point is within the threshold value range.

[0057] In some embodiments, the CCD-based detection method can further include setting a calibration color, and the determining, based on the distribution of the heat map, whether the height of the defect point is greater than the threshold value can include determining, based on the distribution of the heat map, a defect point with color brightness higher than the calibration color brightness. In an optional embodiment, the setting of the calibration color can include performing CCD detection on a calibration point of a calibration sample to obtain CCD calibration data, and constructing a calibration heat map based on the CCD calibration data to obtain a calibration color, wherein the calibration point is a defect point with a defect height of the threshold value.

[0058] According to the specific embodiments of the present disclosure, in another aspect, a CCD-based detection system for detecting a current collector is provided, and the detection system is used to perform the detection method as described in any one of the above embodiments.

[0059] The disclosure aims to protect a CCD-based detection method and a detection system, the CCD-based detection method is used for detecting a current collector, and the CCD-based detection method can include: performing CCD detection on a sample to be detected to obtain CCD detection data; obtaining defect point data based on the CCD detection data; constructing a heat map based on the defect point data; determining whether the height of the defect point is greater than a threshold value based on the distribution of the heat map; and marking the defect point based on the height of the defect point being greater than the threshold value. The CCD-based detection method of the disclosure can visually see the defect degree of the defect point, i.e., the height of the protrusion or the depth of the depression, by generating a heat map from the CCD detection data, so as to determine whether the defect point meets the standard. Moreover, the disclosure sets the threshold value, so that the height of the defect point (the height of the protrusion or the depth of the depression) can be visually seen in the heat map, and the defect point that does not meet the standard can be determined by comparing with the threshold value. The disclosed CCD-based detection method relies on CCD detection data to quickly identify the defect point that does not meet the standard, without damaging the appearance of the composite current collector; reduces the detection cost and improves the detection efficiency; the height of the defect point can be changed by a pre-set threshold value, so that the application range is wider.

[0060] Finally, it should be noted that: the embodiments in the specification are described in a progressive manner, and each embodiment focuses on the differences from other embodiments. The same or similar parts of each embodiment can be referred to each other. For the system or device disclosed in the embodiments, since it corresponds to the method disclosed in the embodiments, the description is relatively simple, and the relevant parts can be referred to the method part.

[0061] The above embodiments are only used to illustrate the technical solutions of the disclosure, rather than limit them; although the disclosure has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that the technical solutions recorded in the foregoing embodiments can be modified, or some technical features can be replaced by equivalents; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the disclosure.

Claims

1. A CCD-based detection method for detecting current collectors, characterized in that, include: The sample to be tested is subjected to CCD detection to obtain CCD detection data; Data on defect points are obtained based on the CCD detection data; A heat map is constructed based on the data from the aforementioned defect points; The distribution of the heat map is used to determine whether the height of the defect point is greater than a threshold. The defect point is marked based on the fact that its height is greater than a threshold.

2. The CCD-based detection method according to claim 1, characterized in that, The construction of the heatmap based on the defect point data includes: The first axis of the heatmap along the first direction is the lateral detection width of the CCD, and the second axis of the heatmap along the second direction is the longitudinal detection length of the CCD. The first direction is approximately perpendicular to the second direction.

3. The CCD-based detection method according to claim 2, characterized in that, The heat map is grid-shaped and includes multiple first axes and second axes; Among them, multiple first axes are arranged at equal intervals, and multiple second axes are arranged at equal intervals.

4. The CCD-based detection method according to claim 3, characterized in that, The spacing of the first shaft is 0.1-10 mm; and / or The spacing of the second axis is 1-300mm.

5. The CCD-based detection method according to claim 3, characterized in that, The primitive squares formed by the intersection of multiple first axes and multiple second axes have values ​​ranging from 1 to 1000.

6. The CCD-based detection method according to claim 1, characterized in that, The height of the defect point includes: The absolute value of the height of the protrusion or the absolute value of the depth of the concave point.

7. The CCD-based detection method according to claim 6, characterized in that, The threshold is 50-120 μm.

8. The CCD-based detection method according to any one of claims 1-7, characterized in that, Also includes: Set the calibration color; Determining whether the height of the defect point is greater than the threshold based on the distribution of the heat map includes: determining, based on the distribution of the heat map, defect points whose color brightness is higher than the calibrated color brightness.

9. The CCD-based detection method according to claim 8, characterized in that, The setting of the calibration color includes: CCD detection was performed on the calibration points of the calibration sample to obtain CCD calibration data; A calibration heatmap is constructed based on the CCD calibration data to obtain the calibration color; The calibration point is a defect point whose defect height is the threshold value.

10. A CCD-based detection system for detecting current collectors, characterized in that, The detection system is used to perform the detection method as described in any one of claims 1-9.

Images