Removal device for a cell stack, and uses of said removal device

Abstract

In order to improve testing of cell stacks in the production of electrical energy stores, the invention provides a removal device (18) for removing a cell stack (16) held in a gripper (12), comprising: a first and a second plate-type element (32.1, 32.2) which are arranged opposite one another; and a coupling system (34) which releasably couples the first and second plate-type elements (32.1, 32.2) to one another in such a way that a distance between the first and second plate-type elements (32.1, 32.2) is adjustable and / or variable, wherein the plate-type elements (32.1, 32.2) are configured to receive the cell stack (16) between them and the coupling system (34) is configured to adjust the distance between the plate-type elements (32.1, 32.2) in such a way that the cell stack (16) is clamped between the plate-type elements (32.1, 32.2).

Description

[0001] Removal device for a cell stack and its uses

[0002] The invention relates to a removal device for removing a cell stack held in a gripper. The invention further relates to the use of such a removal device, as well as an arrangement and a testing device comprising such a removal device. Finally, the invention relates to a method for testing a cell stack.

[0003] Preferred embodiments of the invention are applicable in the field of cell stack manufacturing, in particular the large-scale industrial production of cell stacks for electrical energy storage devices, such as cell stacks for batteries, fuel cells or electrolyzers.

[0004] The following literature references are made for the technological background:

[0005] [1] WO 2023 / 072343

[0006] [2] EP 4 258 402 A1

[0007] [3] DE 10 2017 000 176 A1

[0008] [4] EP 4 002 533 B1

[0009] [1] and [2] relate to a method and a device for producing z-folded cell stacks for battery cells, wherein a separator track is folded in a z-shape around alternately stacked first and second cell components. The folding takes place when the respective cell component is fed by means of a folding element arranged to move with a respective gripper. Hold-down devices are provided to hold down the respective deposited repeating component. Further examples of devices and methods for forming stacks by depositing repeating components are shown in [3] and [4]. In these cases, stacks of fuel cells are formed by alternately depositing different repeating components. When creating stacks for electrical energy storage devices, such as...

[0010] Battery cells, fuel cells, or the like, are stacked as repeating components.

[0011] For example, when setting up a stacking device for stacking cell stacks, for quality control, and for process optimization, it is desirable to check the cell stacks, such as the correct arrangement and position of the repeating components. This presents a challenge with different stacking processes. For instance, with cell stacks produced by Z-folding, the repeating components are not fixed before the separator is folded, and after folding, a visual inspection of the wrapped anodes and cathodes (examples of repeating components) is no longer possible. Furthermore, transporting the unfixed cell stacks from a gripper to an external testing device or other station for examination is difficult.

[0012] The invention aims to improve the removal of cell stacks from a stacking device.

[0013] To solve this problem, the invention provides a sampling device according to claim 1. A use of such a sampling device, an arrangement and a testing device with such a sampling device, as well as a testing method for testing the cell stacks using the testing device, are the subject of the further independent claims.

[0014] Advantageous embodiments are the subject of the dependent claims.

[0015] According to a first aspect thereof, the invention provides a removal device for removing a cell stack held in a gripper, comprising: a first and a second plate-like element arranged opposite each other, and a coupling system that detachably couples the first and the second plate-like element to each other in such a way that a distance between the first and second plate-like element is adjustable and / or variable, wherein the plate-like elements are configured to receive the cell stack between them and the coupling system is configured to adjust the distance between the plate-like elements in such a way that the cell stack is clamped between the plate-like elements.

[0016] The feature that the distance between the first and second plate-like element is adjustable and / or variable also covers the fact that the plates are always used with the same distance, for example, for clamping cell stacks with the same stack height.

[0017] In some embodiments, the first and second plate-like elements are arranged opposite each other, essentially parallel and / or congruent. Congruent does not mean identical. Preferably, the plate-like elements overlap, and their sensing surfaces, with which they engage the cell stack, are of the same size and shape. However, the plate-like elements need not be identical.

[0018] In some embodiments, the cell stack is clamped between the plate-like elements by generating / applying a predetermined clamping force.

[0019] Some embodiments of the extraction device further feature a receiving interface for receiving the extraction device in a holder. In some embodiments, the holder is a holder in a measuring machine or testing device, or a holder for transporting the cell stack, for example to a more distant station or organization.

[0020] In some embodiments, the receiving interface is provided to have multiple receiving points. In some embodiments, the receiving interface is provided to have part of a releasable clamping device for clamping the removal device to the holder.

[0021] In some embodiments, the receiving interface is provided to have part of a Hirth toothing.

[0022] In some embodiments, the receiving interface is provided to have at least one ball locking pin.

[0023] In some embodiments, the mounting points are arranged centrally on each of the plate-like elements.

[0024] In some embodiments, the recording interface is provided to have a first to fifth recording point, of which the first to fourth recording points are arranged spanning a rectangle (oblong or in the form of a square) between them and the fifth recording point is arranged centrally between the first to fourth recording points.

[0025] In some embodiments, the plate-like elements are provided with recesses for receiving the gripper.

[0026] In some embodiments, the plate-like elements are provided with markings or reference surfaces for assigning the position of the removal device.

[0027] In some embodiments, the markings or reference surfaces are provided to include a reference coordinate system.

[0028] In some embodiments, the reference coordinate system is integrated into the plate-shaped elements, e.g., at the edge of plate bodies. In some embodiments, the reference coordinate system comprises several reference spheres, each of which is coupled and / or connected to the outer contour of the respective plate-like element by means of a shaft spaced apart from it.

[0029] In some embodiments, the reference coordinate system is provided to have several reference surfaces on the edges of the plate-like elements.

[0030] In some embodiments, the markings are provided to include embossing and / or raised areas in the plate-like elements.

[0031] According to a further aspect, the invention provides for the use of a removal device according to one of the preceding embodiments for removing a cell stack held in a gripper for testing the cell stack, wherein the plate-like elements i) are designed such that corners and / or side edges of the clamped cell stack are exposed and / or ii) are formed from a material through which the testing is carried out, and / or iii) have recesses for receiving the gripper.

[0032] In some embodiments, the materials for the plate-like elements are selected in such a way that it is possible to take images of the stack even without exposed areas. That is, if the plate-like elements are made entirely or at least partially of materials such as carbon, the plate-like elements can completely cover the stack and measurements (images) of the stack can still be taken.

[0033] According to a further aspect, the invention provides an arrangement with a removal device according to one of the preceding embodiments and i) a cell stack, wherein the plate-like elements are designed such that corners and / or side edges of the clamped cell stack are exposed, and / or ii) the gripper, wherein the plate-like elements have recesses for receiving the gripper.

[0034] In the aforementioned use and arrangement, the plate-like elements are designed according to i) in such a way that corners and / or side edges of the clamped cell stack are exposed, for example for detection by a measuring device of a measuring system for testing purposes.

[0035] In the aforementioned use and arrangement, the plate-like elements according to ii) have recesses designed to accommodate the gripper or parts of the gripper. This facilitates the removal of the cell stack from the gripper by the removal device and / or the transfer of the cell stack, e.g., after testing, from the removal device to the gripper.

[0036] According to another aspect, the invention provides a testing device for testing a cell stack, in particular (for testing) a layer arrangement, comprising: the sampling device according to one of the preceding embodiments, and a holder which is configured to position the sampling device in a measuring system.

[0037] According to a further aspect, the invention provides a method for testing a cell stack, comprising the following steps: a) providing a testing device according to one of the preceding embodiments for testing the cell stack, b) removing the cell stack held in a gripper by means of the removal device; c) picking up and positioning the removal device in the holder arranged in a measuring system; d) performing the corresponding test and / or measurement, e) removing the removal device from the holder, and f) transferring the cell stack to the gripper.

[0038] In some embodiments of the method, steps c) and / or d) are performed multiple times in different measuring systems and / or the same measuring system.

[0039] Some embodiments further include the step: g) Evaluating the test(s) performed to assess the layer arrangements in the cell stack under test.

[0040] The following section explains in more detail some advantages and benefits of preferred embodiments of the invention.

[0041] Some embodiments relate to a carrier for cell stacks. Some embodiments relate to an electrode stack carrier for battery cells.

[0042] In the production of cell stacks for energy storage devices such as batteries and fuel cells, quality testing of the cell stack is desirable. For example, some embodiments of the invention are used to test the stack quality during battery cell production. Advantages of exemplary embodiments of the invention are explained below using the example of such a battery cell stack quality test, but they can also be applied to other uses of the extraction device. Particularly preferred embodiments of the invention offer solutions to one or more of the challenges described below.

[0043] The stacking quality must be checked during the production of prismatic and / or pouch battery cells. To form battery cell stacks, electrodes in the form of anodes and cathodes are stacked as repeating components with a separator in between. Alternatively, single cells can be produced first and then stacked on top of each other. In some stacking processes, the stacks are subsequently wrapped with separator material.

[0044] The anode-cathode and separator-anode protrusions, as well as the positioning tolerance between the electrodes, are crucial for the proper functioning of the cells. During production, the electrodes and separator are not bonded together, and relative movement is undesirable but possible. Typically, the separator is larger than the anode, and vice versa. However, it is also conceivable that the cathode could be larger than the anode.

[0045] Once the stack is wrapped with the separator, the electrodes can no longer be visually inspected. For verification, a CT scan (computed tomography) is performed, for example. According to current technology, the separator is not visible in this scan, but its position is also relevant.

[0046] Various methods have become established on the market for testing stacking accuracy using CT scans. A distinction is made between testing laminated stacks (stacks that have been hot-pressed after production and in which the layers can no longer be manually shifted against each other) and non-laminated stacks (where there is still a risk of the layers shifting).

[0047] The testing procedure also differs between series production and commissioning.

[0048] A satisfactory inspection solution for serial production is not currently available on the market. In serial production, individual process steps or machining operations are sometimes linked using workpiece carriers. These are adapted to the requirements of CT inspection to a certain extent, but require highly specialized inline CT solutions and are precisely tailored to a specific format. Use in standard CT systems is often virtually impossible.

[0049] No solution is currently known for testing during commissioning. In practice, laminated stacks are removed from the system and inserted into CT scanners using makeshift solutions. Repeatable positioning is not possible because the known devices lack the accuracy to consistently insert the stack in exactly the same position. Therefore, each measurement must be set up anew.

[0050] For non-laminated stacks, there is the additional problem of shifting. Stacks can be removed from the system and carefully clamped or laid down, but this does not prevent the layers from shifting. Re-inserting the stack into the process in this way is not achieved for either stack type.

[0051] The separator cannot be detected using current technology. Approaches exist to detect the separator in each layer during stacking, for example, by using cameras and / or sensors to record and check the separator position during stacking. This is very complex and potentially inaccurate, and it also overlooks an influence later in the process. Therefore, adequate quality control of the workpiece cannot be achieved this way.

[0052] Another way to detect the separator is through optical inspection. The outer contour of the stack (and thus of the external separator) can be captured using methods such as fringe projection, laser triangulation, or other optical techniques. However, since the relationship to the adjacent electrode sheets, which are internal and therefore not optically detectable, is always of interest, this topic has received little attention in the past. Virtually no tests exist to date.

[0053] Particularly preferred embodiments of the invention aim to close this gap in the analysis. In some embodiments, the cell stack is removed from the (stack-producing) machine (e.g., stacking device, see, for example, [1] to [5]) in such a way that the stack is permanently subjected to a vertically acting clamping force, thus preventing unlaminated stacks from slipping. In some embodiments, laminated stacks are merely fixed in their position in the removal device.

[0054] In some embodiments, the removal position ensures that the stack can be inserted into a measuring machine with repeatable accuracy, so that only minimal, or even no, adjustments are necessary for data evaluation. Compared to current setups, this simplifies the analysis. In some embodiments, a test device (with a carrier / holder for the stack to be tested) is divided into a set of clamping plates (example of the first and second plate-like element) and a setup in the measuring device with a universal interface. This allows for a high degree of flexibility in terms of type, unlike current standard solutions, and enables stacks to be tested early in the commissioning process. This flexibility means, in particular, that the setup in the measuring device can be used with different sets of clamping plates (depending on the type and / or dimensions of the stack).

[0055] The stacks can also be returned to the system after the analysis has been carried out, thanks to the repeatable positioning of the clamping mechanism.

[0056] During handling, unlike manual removal, slippage of the layers is prevented in preferred embodiments of the invention, since a clamping force, particularly a defined one, can be set via the clamping plates, which remains essentially constant throughout the entire process. This cannot be guaranteed with manual removal and / or transport. The stack can then be released for further process analysis or even for further use.

[0057] In some embodiments of the invention, the clamping structure, i.e., the assembly with the clamping plates, provides sufficient rigidity to allow measurements from different systems to be combined. This rigidity ensures that the layers within the stack (when clamped in the structure) remain unchanged regardless of their position in space, for example, so that the corners of the layers do not sag when lying flat. In some embodiments, the rigidity comprises the inherent rigidity of the clamping structure and the support stiffness it provides to the clamped stack.

[0058] In some embodiments, a reference coordinate system, spanned, for example, by three spheres, is also provided at each corner. This allows data from different measurements, such as those based on computed tomography and optical topography, to be combined. High-resolution CT images from each corner (individual data sets) can also be related to each other via a reference measurement, which can be performed optically, e.g., using structured light projection, line triangulation, etc., or tactilely.

[0059] This enables the evaluation of the separator's position in relation to CT data of the electrodes, an evaluation that does not currently exist on the market. This means that measurement results used to determine the separator's position can be combined with measurement results used to determine the electrode positions, thus also enabling the determination of the separator's position relative to the electrodes.

[0060] A testing device for removing and inspecting cell stacks according to some embodiments of the invention essentially comprises two parts. In some embodiments, the main part is formed by a removal device – for example, in the form of a carrier / stack carrier / stack holder – which has a coordinated clamping plate system (with a first and second plate-like element designed for clamping, for example, two clamping plates). The clamping plate system is designed such that positioning in the production system and / or in the measuring system is repeatable, so that the position during component transfer is always consistent.

[0061] A clamping system, such as connections that allow the two clamping plates to be adjusted towards and away from each other, secures the stack within the clamping plates, thus permanently preventing slippage. When reinserted, the stack is therefore oriented identically to how it was removed.

[0062] In some embodiments, the interface is designed so that the clamping plates can be arranged in exactly the same position in any measuring device or measuring system in order to obtain images that can be combined with each other.

[0063] In some embodiments, the setup within the measuring device / equipment and the sampling device—particularly the receiving interface—are coordinated so that different stacks of the same type are always inserted into the measuring device / equipment in the same position. This type of repeatable positioning eliminates the need for manual adjustments to the measuring device / equipment. For example, the same corner of the stack (of the same type) is always located in the upper right area of ​​a measuring field of the measuring device. Thus, this corner is always picked up and / or measured by the measuring device / equipment. In some embodiments, an evaluation unit is configured so that minor inaccuracies and / or deviations are subsequently compensated for during evaluation using the reference coordinate system.

[0064] In other words, this type of repeatable positioning creates a way for the same areas / sections of different stacks of the same type to always be located in the same areas of the measuring field of the measuring device / equipment, thus eliminating the need to "search for the area of ​​the stack to be measured" and to manually adjust the measuring device to the position of the area / section of the stack to be measured (for the same stack type).

[0065] Another part of the testing device according to preferred embodiments is, for example, in the form of an adapter, i.e., a holding device – hereinafter referred to as a holder – which is arranged, for example, in the respective measuring device (or in a transport system). In some embodiments, the holder serves to accommodate the clamping plate system within the measuring machine. The adapter is tailored to the measuring machine; multiple adapters can be used with several measuring machines, but it offers a universal interface to the clamping plates. This achieves maximum format flexibility with minimal modification requirements. The stack, with its clamping plate system, can be inserted into the adapter in various orientations, so that, for example, the corners can be scanned separately in their optimal positions during CT scanning.

[0066] In some embodiments, the adapter and clamping plate system are designed to facilitate handling and prevent interference with the measurement. Positioning is indexed and repeatable in every orientation. This allows multiple stacks, as well as multiple corners of stacks, to be inserted into the measuring machine in the same orientation. Alignment and evaluation can therefore be automated.

[0067] In some embodiments, the ability to overlay or link individual data sets is achieved by means of the named reference coordinate systems – preferably arranged in each corner. These can be designed, for example, as spheres (e.g., 3 or more per corner for unambiguous orientation).

[0068] If the spheres are captured using a measurement method with a larger installation space (large-volume CT, fringe projection, optical triangulation, tactile) and measured relative to each other, a relationship between individual measurement data can be established. If the measurement data (e.g., fringe projection and CT) are available in comparable datasets, they can be superimposed and evaluated together / relatively in the evaluation software.

[0069] The stacking carrier / removal device according to some embodiments of the invention enables repeatable measurement and the digital superposition of multiple measurement methods. Furthermore, the system allows for high format flexibility and deployment early in the commissioning phase.

[0070] Permanent clamping and indexing allow cell stacks to be reintroduced into the (manufacturing) process after analysis.

[0071] Examples of implementation are explained in more detail below with reference to the accompanying drawings. These show:

[0072] Fig. 1 shows a schematic representation of an arrangement with a gripper of a production plant, a removal device for removing a cell stack from the gripper according to an embodiment of the invention, a removed cell stack and several measuring systems with measuring devices for checking the removed cell stack;

[0073] Fig. 2 shows a perspective view of a first embodiment of the extraction device, wherein the extraction device together with the cell stack taken up is shown from above;

[0074] Figs. 3-5 show different side views of the removal device from Fig. 2;

[0075] Figs. 6-7 show two further perspective views of the extraction device from different angles than Fig. 5 with a different cell stack;

[0076] Fig. 8 shows a top view of the extraction device of Figs. 6 and 7, wherein markings or reference surfaces for position assignment in a reference coordinate system are indicated at the corners of the extraction device by numbers 1 to 4;

[0077] Fig. 9 shows a bottom view of the removal device shown in Fig. 8 with the corresponding markings or reference surfaces; Fig. 10 shows a perspective view of a further embodiment of an arrangement with a gripper, for example a production plant for cell stacks, a removal device according to a further embodiment for removing a cell stack from the gripper and a removed cell stack according to a further embodiment;

[0078] Fig. 11 shows a perspective view of the sampling device of Fig. 10 together with a holder for a measuring device for checking the received cell stack, the holder being shown in exploded view in perspective view;

[0079] Fig. 12 shows a perspective, partly cutaway view of the sampling device held in the holder of the measuring device from Figs. 10 and 11;

[0080] Fig. 13 shows a perspective view of the measuring device with a probe and the holder, in which the sampling device with the cell stack according to Figs. 10 to 11 is included, during the testing of the cell stack using the measuring device;

[0081] Fig. 14 shows a perspective partial view of another embodiment of the removal device;

[0082] Fig. 15 shows a bottom view of a further embodiment of the extraction device, wherein markings or reference surfaces comparable to those in Figs. 8 and 9 are marked with corresponding numbers;

[0083] Fig. 16 shows a perspective view of the removal device according to the embodiment of Figs. 13 and 14;

[0084] Fig. 17 shows a perspective view of a holder for holding the removal device according to the embodiment of Figs. 13 to 15 in a measuring device, wherein part of the receiving interface of the removal device is already shown held in the holder;

[0085] Fig. 18 shows a central section through an upper part of the bracket of Fig. 16 and the part of the receiving interface held therein.

[0086] Figures 1 and 10 show different embodiments of an arrangement 10 with a gripper 12, a production plant 14 shown only schematically in Figure 14, a cell stack 16 produced in the production plant 14 and a removal device 18 for removing the cell stack 16 from the gripper 12.

[0087] Production plant 14, for example, is a production plant for batteries, fuel cells or other (electrical) energy sources with cell stacks 16 formed from repeating components. Production plant 14, for example, has a stacking device of the type known from references [1] to [4] for stacking repeating components to form a cell stack 16.

[0088] The following describes embodiments of the removal device, a test device 20 equipped with it, the arrangement 10, and a test method using the example of a cell stack 16 for a battery. The cell stack 16 comprises, for example, electrodes, in particular cathodes and anodes, as repeating components with a separator between them. The gripper 12 is provided at some point in the production plant 14 for handling the cell stack 16, wherein the cell stack 16 is clamped between jaws 22.1, 22.2 of the gripper 12. The cell stack 16 can be a laminated cell stack or an unlaminated cell stack 16.

[0089] As shown in Fig. 1 and Fig. 13, the sampling device 18 can be part of a test device 20, which is used to test the cell stack 16. The test device 20 has a holder 24 for holding the sampling device 18 in a defined position in a measuring device 26, 26.1, 26.2. The measuring device 26, 26.1, 26.2 can be part of a measuring system 28, which can also have several measuring devices 26.1, 26.2.

[0090] The measuring device 26, 26.1, 26.2 is designed for testing the cell stack 16, for example, the arrangement of the different layers of the cell stack 16. To be able to test, for example, both the arrangement of the electrode layers and the arrangement of a separator or the like, the measuring system 28 can have a first measuring device 26.1 and a second measuring device 26.2, which perform tests according to different physical principles. For example, testing is carried out using computed tomography and / or optical topography, for example, by means of structured light projection, line triangulation, or tactile testing.

[0091] In the example shown in Fig. 13, the measuring device 26, 26.1 is equipped with a probe 30 for a CT measurement. Fig. 1 also shows a second measuring device 26.2 with another probe 30.2 for performing a measurement according to a different principle (for example, optical topography).

[0092] The removal device 18, shown schematically in Fig. 1 and in different embodiments in Figs. 2 to 16, is designed for removing the cell stack 16 held in the gripper 12. The removal device 18 has a first plate-like element 32.1 and a second plate-like element 32.2, which are arranged opposite each other essentially parallel to and essentially congruent with each other. The plate-like elements 32.1 and 32.2 are designed, for example, as clamping plates; as shown in Fig. 16, they can each be configured differently from each other.

[0093] Furthermore, the removal device 18 has a coupling system 34 that detachably couples the first and second plate-like elements 32.1, 32.2 to each other such that the distance between the first and second plate-like elements is adjustable and / or variable. The coupling system 34 can be designed in different ways; for example, adjustable clamps or pincer-like elements, possibly with actuators, are conceivable. In the illustrated embodiments, the coupling system has several screw connectors 36. The number of screw connectors 36 can vary; for example, in a first embodiment shown in Figures 2 to 9, six screw connectors 36 are provided, while in the other illustrated embodiments, four screw connectors are provided.

[0094] To form the screw connectors 36, the first plate-like element 32.1 – for example, a lower clamping plate – has, for example, hexagonal recesses with nuts, while the second plate-like element 32.2 – for example, an upper clamping plate – is connected to the lower clamping plate by means of screws 40, which are screwed into the nuts. Instead of the recess with nut, the first plate-like element 32.1 can also have a threaded through-hole for receiving the associated screw.

[0095] The plate-like elements 32.1 , 32.2 are configured to accommodate the cell stack 16 between them, the coupling system 34 being configured to adjust the distance between the plate-like elements 32.1 , 32.2 such that the cell stack 16 is clamped between the plate-like elements.

[0096] In the illustrated embodiments, the removal device 18 further has a receiving interface 42 for receiving the removal device in the holder 24.

[0097] As indicated in Fig. 1, the receiving interface 42 and the holder 24 fit together in a defined manner, enabling a defined positioning of the removal device in the holder 24. The similar holder 24 can be a holder in a measuring machine, for example in the measuring devices 26, 26.1, 26.2, or a holder for transport, as indicated in Fig. 1 by the example of a transport device 44 designed as a robot arm.

[0098] The receiving interface 42 is provided with several receiving points 46.1-46.5 in a first embodiment of the removal device 18, which is shown in different representations in Figures 2 to 9, and in a second embodiment of the removal device, which is shown in Figures 10 to 12, but can also be configured differently. In an embodiment of the removal device 18 and the associated holder 24 of the test device 20 shown in Figures 13 to 17, the removal device 18 can be clamped to the holder 24 by means of a releasable clamping device 48, wherein the receiving interface 42 has a part - e.g. a receiving element 82 - of this clamping device 48.

[0099] In the first and second embodiments of the removal device, the receiving points 46.1-46.5 are arranged centrally on each of the plate-like elements 32.1, 32.2. In particular, the receiving interface 42 has a first to fifth receiving point 46.1-46.5. For example, the first to fourth receiving points 46.1-46.4 form a rectangle, in particular a square, and the fifth receiving point 46.5 is arranged centrally between the first to fourth receiving points 46.1-46.4.

[0100] As can be seen in particular from Figures 11 to 13, the removal device 18 can thus be attached in different predefined angled positions within the holder 24. For example, the holder 24 has a central retaining bolt 50 for receiving the central fifth receiving point 46.5 and an eccentrically designed further retaining bolt 52, which can optionally receive one of the first to fourth receiving points 46.1-46.4.

[0101] In this embodiment, the holder 24 has a retaining frame 54 with a fixed frame part 56 and a movable frame part 60 that can be moved towards and away from the fixed frame part 56 via an adjustment device 58. A central retaining bolt 50 and a further retaining bolt 52 are arranged opposite each other on the frame parts 56, so that the removal device 18 with the cell stack 16 between them can be clamped in place.

[0102] According to Figures 2, 6 to 9, 10 to 13 and 14 to 16, the plate-like elements 32.1, 32.2 have recesses 62.1, 62.2, 62.3 for receiving the gripper 12. In some embodiments, further recesses 62.3 are provided for the purpose of cell stack inspection.

[0103] As shown in Fig. 16, the recesses 62.1, 62.2 on the first and second plate-like elements 32.1, 32.2 can be configured differently. At least the recesses 62.1 on one of the plate-like elements 32.1, 32.2 are designed to be complementary to at least one of the jaws 22.1, 22.2 of the gripper 12, so that the removal device 18 can be positioned precisely on the gripper 12 to remove the cell stack 16. Additional positioning elements, such as a positioning bolt 64 shown in Fig. 16, can also be provided for the relative positioning of the gripper 12 and the removal device 18.

[0104] In the embodiments shown in the attached figures, the removal device 18 further has markings 66 or reference surfaces 68 for position assignment of the removal device 18.

[0105] The markings 66 or reference areas 68 include in particular a reference coordinate system.

[0106] In the embodiment shown in Figures 2 to 9, the markings 66 at each of the first to fourth corners 1-4 each have several reference spheres 70, each defining a reference coordinate system. In the embodiment shown in Figures 14 to 16, several reference surfaces 68 are provided at the corners 1-4, which are designed to define a reference coordinate system. The reference surfaces 68 are formed, for example, by embossing and / or elevations 74 on at least one of the plate-like elements 32.1, 32.2, in particular on its edges. As indicated in Figure 1, the removal device 18 is used to remove the cell stack 16 held in the gripper 12 for testing the cell stack 16.

[0107] As shown in the embodiments of Figures 1 to 13, the plate-like elements 32.1, 32.2 are designed such that corners and / or side edges of the clamped cell stack 16 are exposed. This allows CT or optical / tactile testing to be performed on the exposed corners or side edges of the cell stack 16. In some embodiments, the material of the plate-like elements 32.1, 32.2 is selected, at least in certain areas, to allow testing through the material. For example, the plate-like elements 32.1, 32.2 can be made, at least in certain areas, of carbon for CT testing or of a transparent material for optical testing. In such cases, cutouts for exposing the areas to be tested can be omitted.

[0108] The test device 20 shown in Figs. 1 and 13 has the removal device 18 and the holder 24, which is designed to position the removal device 18 for testing in the measuring system 28.

[0109] This allows a method for testing the cell stack 16 to be carried out with the following steps: a) providing the test device 20 for testing the cell stack 16; b) removing the cell stack 16 held in the gripper 12 by means of the removal device 18; c) picking up and positioning the removal device 18 in the holder 24 arranged in the measuring system 28; d) carrying out the corresponding test and / or measurement, as shown, for example, in Fig. 12; e) removing the removal device 18 from the holder 24; and f) transferring the cell stack 16 to the gripper 12. Steps c) and / or d) can be carried out multiple times in different measuring systems 28 or measuring devices 26.1, 26.2. By referencing with the markings 66 and / or reference surfaces 68, the data carried out in different measuring devices 26.1 , 26.2 can be correlated with each other.

[0110] By evaluating the tests performed, the arrangement of cells in the tested cell stack 16 can be assessed.

[0111] This allows quality checks to be carried out during the commissioning of the production plant and / or during regular inspections.

[0112] The function of the extraction device 18 is explained in more detail below using the example of the embodiment shown in Figs. 2 to 9 during such a test.

[0113] As shown in Fig. 1 or Fig. 10, a cell stack 16, for example designed as an electrode stack, is clamped in the production system 14. The cell stack 16 is typically fixed by a pair of jaws 22.1, 22.2 of a gripper 12. The plate-like elements 32.1, 32.2, designed, for example, as two clamping plates, have recesses 62.1, 62.2 with which they are fitted precisely onto the gripper 12, in particular onto the pair of jaws 22.1, 22.2. This means that the recesses 62.1, 62.2 are designed as a counter contour (complementary) to the pair of jaws 22.1, 22.2 of the gripper 12. It can therefore be said that the geometry and positioning of the recesses 62.1, 62.2 are matched to the geometry of the gripper 12.

[0114] The upper clamping plate – second plate-like element 32.2 – is connected to the lower clamping plate – first plate-like element 32.1 – by means of the screws 40, which are screwed into the nuts 38. The screws are tightened in a defined sequence with a defined torque to achieve a defined clamping force acting on the cell stack 16. As explained above, another clamping configuration is conceivable.

[0115] The jaw pair 22.1, 22.2 of the gripper 12 of the production system 14 is opened, and the cell stack 16, together with the plate-like elements 32.1, 32.2, can be removed manually or automatically. In addition to the recesses

[0116] 62.1 , 62.2 for positioning the gripper 12, additional recesses 62.3 are conceivable, for example to be able to recognize machine codes on the cell stack 16 or to be able to check further quality features (positioning of a separator edge, positioning of an adhesive tape, etc.).

[0117] The number of screw connectors 36 can vary depending on the stack design and, for example, the position of current collectors / surge tabs. Universal terminal block systems are also conceivable, in which not all holes are occupied by a screw in every stack type. An example of this is shown in Figures 6 to 8, where a different cell stack 16 is used than in Figures 2 to 5, and where only five of the six possible screws 40 are used.

[0118] Furthermore, for the unambiguous assignment of a numbering 1-4, the corners on the clamping plates can be located as plate-like elements 32.1, 32.2. Such a numbering – as shown in particular in Figures 8 and 9 as well as 14 and 15 – can be carried out in particular by at least one measuring machine – measuring device 26,

[0119] 26.1 , 26.2 - are recorded and are visible / recognizable in the illustrations that are generated based on the data recorded by the measuring machine.

[0120] In addition to the aforementioned features, the receiving interface 42 provides a means for receiving and indexing the plate-like elements 32.1, 32.2. The indexing – for example, realized by the first to fourth receiving points 46.1-46.4 – serves to precisely receive the removal device 18 in the holder 24, which is designed, for example, as an adapter, within the measuring system 28. Due to the position of the receiving points 46.1-46.5, the cell stacks can be received in the holder 24 in 90-degree increments, for example, in relation to the measuring system 28. In the exemplary embodiment with the first to fifth recording points 46.1-46.5, which span a rectangle, in particular a square, the middle recording point 46.5 is always predefined by the holder 24 in the respective measuring device 26, 26.1 , 26.2 and, according to the corner 1-4 to be measured, a further recording point 46.1-46.4 (first to fourth recording point) is additionally assigned.The receiving points 46.1-46.5 are specifically designed to be conical, i.e., self-centering.

[0121] Another embodiment of the recording interface 42, the separation from the holder 24, the indexing, and a different division of the recording steps is conceivable. Such an embodiment will be explained in more detail below with reference to the exemplary embodiment shown in Figures 14 to 18.

[0122] Furthermore, at least one of the plate-like elements 32.1, 32.2, and in particular each of the plate-like elements 32.1, 32.2, has markings 66 or reference surfaces 68 for defining a reference coordinate system. In the first embodiment, each plate-like element 32.1, 32.2 has ceramic reference spheres 70, which are connected to the clamping plate of the plate-like element 32.1, 32.2 by means of a carbon shaft. For example, three reference spheres 70 are placed at each corner 1-4, thus establishing a unique reference coordinate system. This serves to reference the corners 1-4 to each other and to reference various measurements to each other. Another embodiment, for example as straight lines, cuboids, or other shapes,

[0123] Geometric elements are conceivable, as is the placement of all references on only one of the plate-like elements 32.1 , 32.2; an example of this is shown in Figs. 13 to 15.

[0124] The selection of ceramic for the reference spheres 70 is based on its detection properties in both optical and radiographic measurement methods, while carbon is selected for the shafts due to its low absorption and scattering of X-rays. Of course, other materials are conceivable, for example, glass or ruby ​​spheres, or metal shafts. The plate-like elements 32.1, 32.2, in particular the bodies of clamping plates thereof, can be made of any suitable material. In some embodiments, they are made of a plastic – for example, produced by 3D printing – or of aluminum.

[0125] In the following, some variants of different features of the removal device 18 will be explained in more detail using the embodiment shown in Figs. 14 to 18.

[0126] In the third embodiment shown in these figures, instead of reference spheres on a shaft that define a coordinate system, pins or similar projections or ridges 74 integrated into the plate-like elements 32.1, 32.2 are used as reference elements. The coordinate system is created digitally based on these projections. The projections have three reference surfaces 68, which are measured to create the coordinate system. In some embodiments, these reference surfaces 68 are each at a 90-degree angle to one another. The size of the projections 74 and the manufacturing tolerances are not critical, since each plate-like element 32.1, 32.2 is assigned a serial number and each plate-like element 32.1, 32.2 is precisely measured beforehand. The projections 74 are identified, for example, by the numbering 1 to 4.

[0127] The holder 24, which is received in, or can be positioned in, the measuring device 26, 26.1, 26.2, has a ball lock pin 76 as a fastening element for detachably attaching the removal device 18 to the holder 24. Ball lock pins 76 are available on the market in various designs. They have several locking elements, in particular in the form of balls, which can be moved from a locked position, into which they are pre-tensioned, for example, by a spring or the like, to a release position by means of some actuating element 78. Thus, the ball lock pin 76 can be inserted by actuating the actuating element 78, and the part of the clamping device 48 formed at the receiving interface 42 can be connected to the holder 24.In addition, several locking bolts 80 are provided on the holder - for example arranged at a 90 degree angle to each other - which are designed to engage or lock into a corresponding counter-geometry in the receiving piece 82 (example of part of the clamping device 48 formed at the receiving interface 42) of the removal device 18.

[0128] The receiving element 82 is, for example, cylindrical in shape and is attached to one of the plate-like elements 32.1, 32.2 by several screws (for example, four screws). On an end face or circumferential region, the receiving element 82 has a ring-shaped geometry 84 with recesses 86 distributed around its circumference for the locking bolts 80. The locking bolts 80 can each engage in a recess 86 selected according to a desired angular position of the removal device 18. The precision for adjusting the position of the removal device 18 relative to the holder 24 in the measuring device 26, 26.1, 26.2 can be selected by the design of the ring-shaped geometry 84. For example, increments of approximately 5 degrees can be provided.

[0129] Additionally or alternatively, some embodiments also feature a Hirth toothed gear 88. As an alternative, the Hirth toothed gear 88 allows for very fine adjustment – ​​or coarser adjustment, depending on its design. Locking pins 80 are no longer required due to the inclined gearing. The Hirth toothed gear 88 can also be used for coarse pre-adjustment. Fine adjustment is achieved, for example, via a rotary table.

[0130] Reference symbol list:

[0131] 10 Arrangement

[0132] 12 grippers

[0133] 14 Production plant

[0134] 16 cell stacks

[0135] 18 Extraction device

[0136] 20 Testing equipment

[0137] 22.1 Back

[0138] 22.2 Back

[0139] 24 bracket

[0140] 26 Measuring device

[0141] 26.1 first measuring device

[0142] 26.2 second measuring device

[0143] 28 Measuring system

[0144] 30 probes for CT measurement

[0145] 30.2 additional probe

[0146] 32.1 first plate-like element

[0147] 32.2 second plate-like element

[0148] 34 Coupling system

[0149] 36 screw connectors

[0150] 38 Mother

[0151] 40 screws

[0152] 42 Recording interface

[0153] 44 Transport device

[0154] 46.1 - 46.5 first to fifth recording point

[0155] 48 Clamping device

[0156] 50 central retaining bolts

[0157] 52 additional retaining bolts

[0158] 54 mounting frames

[0159] 56 fixed frame part

[0160] 58 Adjustment device

[0161] 60 movable frame part

[0162] 62.1. 62.2 Recess

[0163] 64 Positioning bolts Marking Reference surface Reference ball Embossing Raised ball lock bolts

[0164] Actuating element, locking bolt, receiving piece, ring geometry, recess, Hirth toothing

Claims

Claims:

1. A removal device (18) for removing a cell stack (16) held in a gripper (12), comprising: a first and a second plate-like element (32.1, 32.2) arranged opposite each other, and a coupling system (34) which detachably couples the first and the second plate-like element (32.1, 32.2) to each other such that a distance between the first and second plate-like element (32.1, 32.2) is adjustable and / or variable, wherein the plate-like elements (32.1, 32.2) are configured to receive the cell stack (16) between them and the coupling system (34) is configured to adjust the distance between the plate-like elements (32.1, 32.2) such that the cell stack (16) is clamped between the plate-like elements (32.1, 32.2).

2. Removal device (18) according to claim 1, further comprising a receiving interface (42) for receiving the removal device (18) in a holder (24).

3. Removal device (18) according to claim 2, wherein the receiving interface (42) 3.1 has multiple recording points (46.1 - 46.5) and / or 3.2 includes a part of a releasable clamping device (48) for clamping the removal device (18) to the holder (24) and / or 3.3 has part of a Hirth toothing (88) and / or 3.4 has at least one ball locking pin (76).

4. Removal device (18) according to claim 3, alternative 3.1 , wherein 4.1 the recording points (46.1 - 46.5) are arranged centrally on each of the plate-like elements (32.1 , 32.) and / or 4.2 the recording interface (42) has a first to fifth recording point (46.1-46.5), of which the first to fourth recording points (46.1-46.4) are arranged spanning a rectangle between them and the fifth recording point (46.5) is arranged centrally between the first to fourth recording points (46.1-46.4).

5. Removal device (18) according to one of the preceding claims, wherein the plate-like elements (32.1 , 32.2) have recesses (62.1 , 62.2) for receiving the gripper (12).

6. Removal device (18) according to one of the preceding claims, wherein the plate-like elements (32.1 , 32.2) have markings (66) or reference surfaces (68) for position assignment of the removal device (18).

7. Removal device (18) according to claim 6, wherein the markings (66) or reference surfaces (68) comprise a reference coordinate system.

8. Extraction device (18) according to claim 7, wherein the reference coordinate system 8.1 has several reference spheres (70) which are each coupled and / or connected to an outer contour of the respective plate-like element (32.1 , 32.2) by means of a shaft spaced apart from this outer contour and / or 8.2 has several reference surfaces (68) at the edges of the plate-like elements (32.1 , 32.2).

9. Removal device (18) according to one of claims 6 to 8, wherein the markings (66) comprise embossings (72) and / or elevations (74) in the plate-like elements (32.1 , 32.2).

10. Use of a removal device (18) according to one of the preceding claims for removing a component in a gripper (12) held cell stack (16) for testing the cell stack (16), wherein the plate-like elements (32.1 , 32.2) 10.1 are designed such that corners and / or side edges of the clamped cell stack (16) are exposed and / or 10.2 are formed from a material through which the cell stack is tested, and / or 10.3 Recesses (62.1 , 62.2) for receiving the gripper (12) are provided.

11. Arrangement comprising a removal device (18) according to any one of claims 1 to 9 and 11.1 a cell stack (16), wherein the plate-like elements (32.1 , 32.2) are designed such that corners and / or side edges of the clamped cell stack (16) are exposed, and / or 11.2 the gripper (12), wherein the plate-like elements (32.1 , 32.2) have recesses (62.1 , 62.2) for receiving the gripper (12).

12. Testing device for testing a cell stack (16), in particular a layer arrangement, comprising: the sampling device (18) according to one of claims 1 to 9, and a holder (24) which is configured to position the sampling device (18) in a measuring system (28).

13. Method for testing a cell stack (16), comprising the following steps: a) providing a testing device (20) according to claim 12 for testing the cell stack (16), b) removing the cell stack (16) held in a gripper (12) by means of the removal device (18); c) picking up and positioning the removal device (18) in the holder (24) arranged in a measuring system (28); d) performing the corresponding test and / or measurement, e) removing the removal device (18) from the holder (24), and f) transferring the cell stack (16) to the gripper (12).

14. Method according to claim 13, wherein steps c) and / or d) are performed multiple times in different measuring systems (28) and / or the same measuring system (28).

15. Method according to claim 13 or 14, further comprising step g) evaluating the test(s) performed to assess the layer arrangements in the tested cell stack (16).

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