Beam prediction performance monitoring method and terminals
By reporting relevant information when beam prediction performance events meet preset conditions, the problem of high performance monitoring overhead is solved, and more efficient performance monitoring is achieved.
Patent Information
- Application Number
- PCT/CN2025/112508
- Authority / Receiving Office
- WO · WO
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2024-08-05
- Filing Date
- 2025-08-04
- Publication Date
- 2026-02-12
AI Technical Summary
In practical applications, when using simulated performance metrics to monitor the performance of AI units, the terminal needs to periodically report the performance monitoring results, resulting in a large performance monitoring overhead. Furthermore, existing technologies fail to effectively consider the resources used in actual beam management, leading to incomplete performance monitoring.
Define beam prediction performance events and report relevant information only when preset conditions are met, including accuracy events, beam quality difference events, etc., to reduce unnecessary performance monitoring reports.
By reducing the frequency of performance monitoring reports, performance monitoring overhead is reduced, more timely and effective information is provided, and performance monitoring efficiency is improved.
Smart Images

Figure CN2025112508_12022026_PF_FP_ABST
Abstract
Description
Beam prediction performance monitoring method and terminal
[0001] Cross-reference to Related Applications
[0002] The present application is based on the Chinese patent application No. 202411066485.4, filed on August 5, 2024, and claims the priority of the Chinese patent application No. 202411066485.4, the whole content of which is incorporated herein by reference. TECHNICAL FIELD
[0003] The present application relates to the field of communication technology, in particular to a beam prediction performance monitoring method and a terminal. BACKGROUND
[0004] Currently, in the simulation design, the performance of the simulation or the performance of the artificial intelligent (AI) unit is determined by using the simulation performance index. However, in the actual application, if the similar performance index is also used to reflect the performance of the AI unit, the terminal needs to periodically report the result of each performance monitoring or the corresponding performance index, which will increase the overhead caused by the performance monitoring. SUMMARY
[0005] The embodiments of the present application provide a beam prediction performance monitoring method and a terminal, which can solve the problem of large performance monitoring overhead in the related art.
[0006] In a first aspect, a method for monitoring performance of beam prediction is provided, which is performed by a terminal and includes: reporting first information by the terminal when a beam prediction performance event meets a first preset condition, the first information being information related to the beam prediction performance event; the beam prediction performance event including at least one of: a first accuracy event, the first accuracy event occurring when a first accuracy indicator meets a second preset condition, the first accuracy indicator being used to indicate a beam prediction accuracy counted within a preset time window, a preset number or a preset period; a second accuracy event, the second accuracy event occurring when a second accuracy indicator meets a third preset condition, the second accuracy indicator being used to indicate a consistency or an order consistency or a matching degree between measured beam information and predicted beam information; a beam quality difference event, the beam quality difference event occurring when a beam quality difference indicator meets a fourth preset condition, the beam quality difference indicator including a difference between beam quality information of different beam information or a difference between different beam quality information of the same beam information; the beam prediction performance event meeting the first preset condition including at least one of: a number of occurrences of the beam prediction performance event reaching a preset number; a number of consecutive occurrences of the beam prediction performance event reaching a preset number; a number of occurrences of the beam prediction performance event within a preset time window reaching a preset number; a number of consecutive occurrences of the beam prediction performance event within a preset time window reaching a preset number.
[0007] In a second aspect, a beam prediction performance monitoring apparatus is provided, comprising: a sending module configured to report first information when a beam prediction performance event meets a first preset condition, the first information being information related to the beam prediction performance event; the beam prediction performance event comprising at least one of: a first accuracy event, the first accuracy event occurring when a first accuracy indicator meets a second preset condition, the first accuracy indicator being used to indicate a beam prediction accuracy counted within a preset time window, a preset number or a preset period; a second accuracy event, the second accuracy event occurring when a second accuracy indicator meets a third preset condition, the second accuracy indicator being used to indicate a consistency or an order consistency or a matching degree between measured beam information and predicted beam information; a beam quality difference event, the beam quality difference event occurring when a beam quality difference indicator meets a fourth preset condition, the beam quality difference indicator comprising a difference between beam quality information of different beam information or a difference between different beam quality information of the same beam information; the beam prediction performance event meeting the first preset condition comprising at least one of: a number of occurrences of the beam prediction performance event reaching a preset number; a number of consecutive occurrences of the beam prediction performance event reaching a preset number; a number of occurrences of the beam prediction performance event within a preset time window reaching a preset number; a number of consecutive occurrences of the beam prediction performance event within a preset time window reaching a preset number.
[0008] In a third aspect, a beam prediction performance monitoring apparatus is provided, the apparatus being configured to perform the steps of the method according to the first aspect.
[0009] In a fourth aspect, a terminal is provided, comprising a processor and a memory, the memory storing a program or instructions executable on the processor, the program or instructions being executed by the processor to implement the steps of the method according to the first aspect.
[0010] In a fifth aspect, a terminal is provided, including a processor and a communication interface, wherein the communication interface is configured to report first information when a beam prediction performance event satisfies a first preset condition, the first information being information related to the beam prediction performance event; the beam prediction performance event includes at least one of the following: a first accuracy event, the first accuracy event occurring when a first accuracy indicator satisfies a second preset condition, the first accuracy indicator being used to indicate a beam prediction accuracy counted within a preset time window, a preset number or a preset period; a second accuracy event, the second accuracy event occurring when a second accuracy indicator satisfies a third preset condition, the second accuracy indicator being used to indicate a consistency or a consistency of order or a matching degree between measured beam information and predicted beam information; a beam quality difference event, the beam quality difference event occurring when a beam quality difference indicator satisfies a fourth preset condition, the beam quality difference indicator including a difference between beam quality information of different beam information, or a difference between different beam quality information of the same beam information; the beam prediction performance event satisfying the first preset condition includes at least one of the following: a number of occurrences of the beam prediction performance event reaches a preset number; a number of consecutive occurrences of the beam prediction performance event reaches a preset number; a number of occurrences of the beam prediction performance event within a preset time window reaches a preset number; a number of consecutive occurrences of the beam prediction performance event within a preset time window reaches a preset number.
[0011] In a sixth aspect, a readable storage medium is provided, the readable storage medium storing a program or instructions, the program or instructions being executed by a processor to implement the steps of the method according to the first aspect.
[0012] In a seventh aspect, a wireless communication system is provided, including a terminal and a network side device, the terminal being configured to execute the steps of the method according to the first aspect.
[0013] In an eighth aspect, a chip is provided, the chip including a processor and a communication interface, the communication interface being coupled to the processor, the processor being configured to run a program or instructions to implement the method according to the first aspect.
[0014] In a ninth aspect, a computer program / program product is provided, the computer program / program product being stored in a storage medium, the computer program / program product being executed by at least one processor to implement the steps of the beam prediction performance monitoring method according to the first aspect.
[0015] In the embodiments of the present application, a beam prediction performance event is defined, and information related to the beam prediction performance event is reported only when the beam prediction performance event meets a first preset condition, so that more timely and effective information can be provided for the network, while avoiding frequent reporting of performance monitoring results or corresponding performance indicators, thereby reducing the overhead caused by performance monitoring and improving the efficiency of performance monitoring. BRIEF DESCRIPTION OF DRAWINGS
[0016] FIG. 1 is a block diagram of a wireless communication system to which embodiments of the present application can be applied;
[0017] FIG. 2 is a schematic diagram of beam prediction using an AI method in the related art;
[0018] FIG. 3 is another schematic diagram of beam prediction using an AI method in the related art;
[0019] FIG. 4 is a flowchart of a beam prediction performance monitoring method according to an embodiment of the present application;
[0020] FIG. 5 is a structural diagram of a beam prediction performance monitoring apparatus according to an embodiment of the present application;
[0021] FIG. 6 is a structural diagram of a communication device according to an embodiment of the present application;
[0022] FIG. 7 is a hardware structural diagram of a terminal according to an embodiment of the present application. DETAILED DESCRIPTION
[0023] The technical solutions in the embodiments of the present application will be clearly described below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only some of the embodiments of the present application, rather than all the embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art belong to the scope of protection of the present application.
[0024] The terms "first", "second", and the like in the specification are used to distinguish between similar objects, and are not used to describe a particular sequential or chronological order. It should be understood that the terms so used are interchangeable under appropriate circumstances and that the embodiments of the present application are capable of functioning in other sequences than the one described herein, and that the terms "first", "second" distinguish objects of a class, and do not limit the number of objects, for example, the first object can be one or more. In addition, "or" in the present application means at least one of the connected objects. For example, the protection scope of "A or B" at least covers three schemes, namely, scheme one: including A and not including B; scheme two: including B and not including A; scheme three: including A and B. In addition, the terms "A and / or B", "at least one of A and B", "at least one of A or B" also at least cover the above three schemes respectively. The character " / " generally represents that the objects before and after are in an "or" relationship.
[0025] The term "indication" in the present application can be a direct indication (or explicit indication) or an indirect indication (or implicit indication). Among them, the direct indication can be understood as the sender explicitly informing the receiver of the specific information, the operation to be performed or the requested result, etc. in the sent indication; the indirect indication can be understood as the receiver determining the corresponding information according to the indication sent by the sender, or judging and determining the operation to be performed or the requested result according to the judgment result.
[0026] It is worth noting that the technology described in the embodiments of the present application is not limited to Long Term Evolution (LTE) / LTE-Advanced (LTE-A) systems, but can also be used in other wireless communication systems, such as Code Division Multiple Access (CDMA), Time Division Multiple Access (TDMA), Frequency Division Multiple Access (FDMA), Orthogonal Frequency Division Multiple Access (OFDMA), Single-carrier Frequency-Division Multiple Access (SC-FDMA) or other systems. The terms "system" and "network" in the embodiments of the present application are often used interchangeably, and the described technology can be used in the above-mentioned systems and radio technologies, as well as in other systems and radio technologies. The following description describes a New Radio (NR) system for example purposes, and NR terminology is used in most of the following description, but these technologies can also be applied to systems other than NR systems, such as 6th Generation (6G) communication systems. th
[0027] FIG. 1 shows a block diagram of a wireless communication system to which embodiments of the present application can be applied. The wireless communication system includes a terminal 11 and a network-side device 12. The terminal 11 can also be referred to as a user equipment (UE). The terminal 11 can be a terminal-side device such as a mobile phone, a tablet personal computer, a laptop computer, a notebook computer, a personal digital assistant, a palm computer, a netbook, an ultra-mobile personal computer (UMPC), a mobile Internet device (MID), an augmented reality (AR) device, a virtual reality (VR) device, a robot, a wearable device, a flight vehicle, a vehicle user equipment (VUE), a shipboard device, a pedestrian user equipment (PUE), a smart home (a home device with a wireless communication function such as a refrigerator, a television, a washing machine, or furniture), a game console, a personal computer (PC), a kiosk, or a self-service machine. The wearable device includes a smart watch, a smart bracelet, a smart earphone, smart glasses, smart jewelry (a smart bracelet, a smart necklace, a smart ring, a smart necklace, a smart anklet, a smart necklace, and the like), a smart wristband, smart clothing, and the like. The vehicle-mounted device can also be referred to as a vehicle-mounted terminal, a vehicle-mounted controller, a vehicle-mounted module, a vehicle-mounted component, a vehicle-mounted chip, or a vehicle-mounted unit. It should be noted that the specific type of the terminal 11 is not limited in the embodiments of the present application. The network-side device 12 can include an access network device or a core network device. The access network device can also be referred to as a radio access network (RAN) device, a radio access network function, or a radio access network unit. The access network device can include a base station, a wireless local area network (WLAN) access point (AP), or a wireless fidelity (WiFi) node.The base station can be referred to as a Node B (NB), an evolved Node B (eNB), a next generation Node B (gNB), a New Radio Node B (NR Node B), an access point, a relay station (RBS), a serving base station (SBS), a base transceiver station (BTS), a radio base station, a radio transceiver, a basic service set (BSS), an extended service set (ESS), a home Node B (HNB), a home evolved Node B, a transmit / receive point (TRP), or some other suitable terminology in the art, and is not limited to a particular technical terminology, provided that the same technical effect is achieved. It should be noted that in the embodiments of the present application, only the base station in the NR system is taken as an example for introduction, and the specific type of the base station is not limited.
[0028] The core network device can also be referred to as a core network node, a core network function, or a core network network element, etc., which includes but is not limited to at least one of the following: a mobility management entity (MME), an access and mobility management function (AMF), a session management function (SMF), a user plane function (UPF), a policy control function (PCF), a policy and charging rules function (PCRF), an edge application server discovery function (EASDF), a unified data management (UDM), a unified data repository (UDR), a home subscriber server (HSS), a centralized network configuration (CNC), a network repository function (NRF), a network exposure function (NEF), a local NEF (L-NEF), a binding support function (BSF), an application function (AF), a location management function (LMF), a gateway mobile location center (GMLC), a network data analytics function (NWDAF), etc. It should be noted that only the core network device in the NR system is taken as an example for introduction in the embodiments of the present application, and the specific type of the core network device is not limited. If the name of the core network device mentioned in the embodiments of the present application changes in the subsequent protocol version (for example, 6G), it is also within the protection scope of the present application.
[0029] Optionally, the core network device can be implemented by one or more function modules in one device, or can be implemented by multiple devices together, and the embodiments of the present application do not make a specific limitation here. It can be understood that the above function modules can be network elements in a hardware device, can be software function modules running on a special hardware, or can be virtualized function modules instantiated on a platform (for example, a cloud platform).
[0030] Firstly, the related technologies involved in the embodiments of the present application are introduced.
[0031] 1. Using AI method for beam prediction
[0032] FIG. 2 is one of the schematic diagrams of using AI method for beam prediction in the related art, in which the RSRP of part of beam pairs is used as input, and the output of the AI unit is the RSRP result of all beam pairs. The beam pair is composed of a transmitting beam and a receiving beam. The number of inputs of the AI unit is the number of selected part of beam pairs, and the number of outputs is the number of all beam pairs.
[0033] FIG. 3 is another schematic diagram of using AI method for beam prediction in the related art, in which the association information is used to enhance the beam prediction performance. The association information is added to the input side, which is generally the angle related information corresponding to the selected beam pair for input, beam ID information, etc. Therefore, the number of inputs of this AI unit is still related to the number of selected part of beam pairs, and the number of outputs is still equal to the number of all beam pairs.
[0034] In the related art, the resource list related to the input of the AI unit is called Set B, which can also be called the second list. The list related to the output of the AI unit is called Set A, which can also be called the first list. The AI unit determines the prediction result according to the first list, and the first list can be a resource list or an ID or index list without real measurement meaning. The specific form is not limited here.
[0035] 2. Beam measurement and reporting
[0036] The analog beamforming is full-bandwidth transmission, and each polarization direction array element on each high-frequency antenna array panel can only transmit analog beams in a time-division multiplexing manner. The analog beamforming weight is realized by adjusting the parameters of the radio frequency front end phase shifter and other devices.
[0037] Currently, the training of analog beamforming vectors is usually performed in a polling manner, that is, the elements of each antenna panel in each polarization direction send training signals (i.e., candidate beamforming vectors) in turn at a predetermined time in a time-division multiplexing manner. After measurement, the terminal feeds back a beam report to the network side, which uses the training signal to implement analog beam transmission when transmitting services next time. The content of the beam report usually includes the optimal transmission beam identifier and the measured received power of each transmission beam.
[0038] When performing beam measurement, the network configures a reference signal resource set (RS resource set) including at least one reference signal resource, such as a synchronization signal block (SSB) resource or a channel state information reference signal (CSI-RS) resource. The UE measures the layer 1 reference signal received power (L1-RSRP) and the layer 1 signal-to-noise and interference ratio (L1-SINR) of each reference signal resource, and reports the optimal at least one measurement result to the network. The reported content includes a synchronization signal block resource indicator (SSB RI) or a channel state information reference signal resource indicator (CRI), and L1-RSRP / L1-SINR. The report content reflects at least one optimal beam and its quality, which is used by the network to determine the beam for transmitting channels or signals to the UE.
[0039] When the terminal feedback report only contains one L1-RSRP, a 7-bit quantization method is used, with a quantization step of 1 dB and a quantization range of -140 dBm to -44 dBm. When the terminal feedback report contains multiple L1-RSRPs or group-based beam reporting is enabled, the strongest RSRP is quantized using a 7-bit quantization method, and the remaining RSRPs are quantized using a 4-bit differential quantization method with a quantization step of 2 dB.
[0040] The AI unit described in the present application can also be referred to as an AI model, an AI structure, etc., or the AI unit can be a processing unit capable of implementing specific algorithms, formulas, processing flows, capabilities, etc. related to AI, or the AI unit can be a processing method, algorithm, function, module or unit for a specific data set, or the AI unit can be a processing method, algorithm, function, module or unit running on AI-related hardware such as a Graphics Processing Unit (GPU), Neural Processing Unit (NPU), Tensor Processing Unit (TPU), Application-Specific Integrated Circuit (ASIC), etc. The present application does not make specific limitations on this. Optionally, the specific data set includes input and / or output of the AI unit.
[0041] Optionally, the identification of the AI unit can be an AI model identification, an AI structure identification, an AI algorithm identification, or an identification of a specific data set associated with the AI unit, or an identification of a specific scene, environment, channel feature, device related to AI, or an identification of a function, feature, capability or module related to AI. The present application does not make specific limitations on this.
[0042] Optionally, the model input or output includes at least one of the following: a reference signal, a signal carried by a channel, channel state information, beam information, channel prediction information, interference information, positioning information, trajectory information, designated prediction information and management information, and at least one of control signaling.
[0043] The model function includes at least one of the following:
[0044] a) Reference signal processing, including signal detection, filtering, equalization, etc. Including DeModulation Reference Signal (DMRS), Sounding Reference Signal (SRS), SSB, CSI-RS, One-Tone Reference Signal (1TRS), Positioning Reference Signal (PRS), Phase Tracking Reference Signal (PTRS), etc.
[0045] b) Channel signal transmission / reception / demodulation / transmission. Including Physical Downlink Control Channel (PDCCH), Physical Downlink Shared Channel (PDSCH), Physical Uplink Control Channel (PUCCH), Physical Uplink Shared Channel (PUSCH), Physical Random Access Channel (PRACH), Physical Broadcast Channel (PBCH), etc.
[0046] c) Channel state information acquisition. Including
[0047] i. Channel state information feedback. Including channel related information, channel matrix related information, channel feature information, channel matrix feature information, precoding indication (PMI), rank indication (RI), channel rank indication (CRI), channel quality indication (CQI), layer indication (LI), etc.
[0048] ii. Frequency Division Duplex (FDD) uplink and downlink partial reciprocity. For FDD system, according to the partial reciprocity, the base station can inform the UE of the angle information and time delay information through the method of CSI-RS precoding or direct indication according to the uplink channel acquisition angle and time delay information, and the UE reports according to the indication of the base station or selects and reports within the indication range of the base station, thereby reducing the calculation amount of the UE and the overhead of channel state information (CSI) reporting.
[0049] d) Beam management. Including beam measurement, beam reporting, beam prediction, beam failure detection, beam failure recovery, new beam indication in beam failure recovery.
[0050] e) Channel prediction. Including channel state information prediction, beam prediction.
[0051] f) Channel / source coding and decoding. Such as channel encoding, channel decoding, source encoding, source decoding, joint source and channel encoding, joint source and channel decoding.
[0052] g) Interference mitigation. Including intra-cell interference, inter-cell interference, out-of-band interference, intermodulation interference, etc.
[0053] h) Positioning. The estimated specific position (including horizontal position and or vertical position) of the UE or future possible trajectory, or information assisting the position estimation or trajectory estimation, through reference signals (e.g. SRS).
[0054] i) Prediction and management of higher layer traffic and parameters. Including throughput, required packet size, traffic demand, moving speed, noise information, etc.
[0055] j) Analysis of control signaling. Such as related signaling of power control, related signaling of beam management.
[0056] The AI unit includes at least one of the following: a first AI unit used by the communication device (terminal, network side), a reference AI unit of a second AI unit used by the communication device (terminal, network side), a third AI unit used by the terminal, network side device or test device in testing, and a reference AI unit of a fourth AI unit used by the terminal, network side device or test device in testing.
[0057] Beam reporting or feedback reporting in this scheme is not limited to L1 layer signaling bearing, but also contains using high layer signaling, data face, etc. Mode bearing signaling for feeding back beam information.
[0058] In the embodiments of the present application, the beam information includes at least one of the following: beam ID information, beam angle information, beam gain information, beam width information, expectation information, and beam quality information.
[0059] The beam ID information is used to indicate the identity of the beam. It includes but is not limited to at least one of the following: transmit beam ID, receive beam ID, beam ID, reference signal set ID corresponding to the beam, reference signal resource ID corresponding to the beam, unique random ID, additional AI network processing encoded value, beam angle information, resource set index information, resource index information, resource ID, resource set ID, CRI, SSB RI, transmission configuration indication (TCI) state, etc.
[0060] The beam angle information is used to indicate the angle information corresponding to the beam. It includes but is not limited to at least one of the following: angle information, transmit angle information, and receive angle information.
[0061] The angle information is related information used for indicating an angle or an identity, for example, an angle, a radian, an index coding value, an ID value, a coding value processed by an additional AI unit, and the like.
[0062] The beam quality information includes, but is not limited to, at least one of the following types: L1-SINR, L1-RSRP, Layer 1 Reference Signal Received Quality (L1-RSRQ), Layer 3 signal-to-noise and interference ratio (L3-SINR), Layer 3 Reference Signal Received Power (L3-RSRP), Layer 3 Reference Signal Received Quality (L3-RSRQ), probability-related information, confidence-related information, and the like; wherein the probability-related information is used for indicating that one beam information is an optimal beam, a suboptimal beam, a top-k optimal beam, or a probability of the beam information; and the confidence-related information is used for indicating a degree of credibility of one beam information.
[0063] Optionally, the probability-related information or the confidence-related information can be obtained through a model output, or can be determined according to a result of the model output, which is not limited herein.
[0064] Optionally, the first accuracy rate indicator is used for determining a statistical accuracy rate within a certain time window / quantity / period.
[0065] Optionally, the beam quality difference indicator is a statistical difference mean value within a certain time window / quantity / period.
[0066] For example, the L1-RSRP difference of 1 / 1 predicted beam is used for indicating a difference between beam quality information corresponding to one selected beam information in the predicted beam information and beam quality information corresponding to one selected beam information in the measured beam information.
[0067] In the embodiments of the present application, top-1 represents one designated beam information, or one selected beam information, or the first one of beam information with the largest beam quality.
[0068] Top-k represents k designated beam information, or k selected beam information, or the first k of beam information with the largest beam quality.
[0069] By analogy, top-N represents N beam information specified, or N selected beam information, or the first N beam information with the largest beam quality information.
[0070] Optionally, the one selected beam information in the predicted beam information can refer to top-1 predicted beam information.
[0071] Optionally, the k selected beam information in the predicted beam information can refer to top-k predicted beam information.
[0072] Optionally, the one selected beam information in the measured beam information can refer to top-1 measured beam information.
[0073] Optionally, the k selected beam information in the measured beam information can refer to top-k measured beam information.
[0074] Optionally, the 1 / 1 beam accuracy can be referred to as top-1 beam accuracy. The 1 / k beam accuracy can be referred to as top-1 / k beam accuracy. The k / 1 beam accuracy can be referred to as top-k / 1 beam accuracy. The 1 / 1 beam accuracy with 1 dB margin can be referred to as top-1 beam accuracy with 1 dB margin. The 1 / k beam accuracy with 1 dB margin can be referred to as top-1 / k beam accuracy with 1 dB margin. The k / 1 beam accuracy with 1 dB margin can be referred to as top-k / 1 beam accuracy with 1 dB margin.
[0075] Currently, in simulation design, the performance of simulation or the performance of an AI unit is determined by using a simulation performance indicator. However, in actual application, if similar performance indicators are used to reflect the performance of the AI unit, the terminal needs to periodically report the performance monitoring result or the corresponding performance indicator each time, which will increase the overhead caused by performance monitoring. In addition, the performance indicators in the related art do not consider the beam information corresponding to the resources being used or activated in actual beam management, which will also cause incomplete performance monitoring.
[0076] The beam prediction performance monitoring method and the terminal provided in the embodiments of the present application will be described in detail in combination with the accompanying drawings, some embodiments, and application scenarios.
[0077] FIG. 4 is a flowchart of a beam prediction performance monitoring method provided in the embodiments of the present application. As shown in FIG. 4, the beam prediction performance monitoring method comprises the following steps.
[0078] In step 400, the terminal reports first information related to the beam prediction performance event when a first preset condition of the beam prediction performance event is met.
[0079] The beam prediction performance event includes at least one of the following:
[0080] A first accuracy event, the first accuracy event occurs when a first accuracy indicator meets a second preset condition, the first accuracy indicator is used to indicate a statistical beam prediction accuracy within a preset time window or a preset number or a preset period;
[0081] A second accuracy event, the second accuracy event occurs when a second accuracy indicator meets a third preset condition, the second accuracy indicator is used to indicate the consistency or the order consistency or the matching degree between the measured beam information and the predicted beam information;
[0082] A beam quality difference event, the beam quality difference event occurs when a beam quality difference indicator meets a fourth preset condition, the beam quality difference indicator includes a difference between beam quality information of different beam information, or a difference between different beam quality information of the same beam information.
[0083] Optionally, the beam quality difference indicator is used to indicate an average difference between the predicted beam information corresponding to the beam quality information and the beam information obtained by measurement within a preset time window or a preset number or a preset period.
[0084] Optionally, the beam quality difference indicator is used to indicate a difference between the predicted beam information corresponding to the beam quality information and the beam information obtained by measurement.
[0085] Optionally, the beam prediction performance event meeting the first preset condition includes at least one of the following:
[0086] The number of times of occurrence of the beam prediction performance event reaches a preset number of times;
[0087] The number of consecutive occurrences of the beam prediction performance event reaches a preset number of times;
[0088] Within a preset time window, the number of times of occurrence of the beam prediction performance event reaches a preset number of times;
[0089] Within a preset time window, the number of consecutive occurrences of the beam prediction performance event reaches a preset number of times.
[0090] Optionally, the preset number of times, or the preset time window can be determined by at least one of the following: protocol agreement, network configuration and terminal reporting.
[0091] Optionally, the time window includes at least one of the following: a reference time node, a time unit length, and a time window length.
[0092] The beam prediction performance monitoring method provided by the embodiments of the present application defines a beam prediction performance event, and only in the case where the beam prediction performance event meets a first preset condition, information related to the beam prediction performance event is reported, which can provide more timely and effective information for the network, avoid frequent reporting of performance monitoring results or corresponding performance indicators, reduce the overhead caused by performance monitoring, and improve the efficiency of performance monitoring.
[0093] In some embodiments, the first accuracy indicator includes at least one of the following types:
[0094] The first accuracy indicator type 1 is 1 / 1 beam accuracy, which is used to indicate the probability that one selected beam information in the predicted beam information and one selected beam information obtained by measurement are consistent or inconsistent within a preset time window or a preset number or a preset period.
[0095] The first accuracy indicator type 2 is 1 / k beam accuracy, which is used to indicate the probability that one selected beam information in the predicted beam information belongs to or does not belong to k selected beam information in the beam information obtained by measurement within a preset time window or a preset number or a preset period.
[0096] The first accuracy indicator type 3 is k / 1 beam accuracy, which is used to indicate the probability that k selected beam information in the predicted beam information contains or does not contain one selected beam information in the beam information obtained by measurement within a preset time window or a preset number or a preset period.
[0097] The first accuracy indicator type 4 is 1 / 1 beam accuracy with 1 dB margin, which is used to indicate the probability that the difference between the beam quality information corresponding to one selected beam information in the predicted beam information and the beam quality information corresponding to one selected beam information in the beam information obtained by measurement is less than or equal to or greater than or equal to 1 dB within a preset time window or a preset number or a preset period.
[0098] The first accuracy indicator type 5 is 1 / k beam accuracy with 1 dB margin, which is used to indicate the probability that the minimum value of the difference between the beam quality information corresponding to one selected beam information in the predicted beam information and the beam quality information corresponding to k selected beam information in the beam information obtained by measurement is less than or equal to or greater than or equal to 1 dB within a preset time window or a preset number or a preset period.
[0099] The first accuracy indicator type 6 is a k / 1 beam accuracy with 1 dB margin, which is used to indicate a probability that a minimum difference between beam quality information corresponding to k selected beam information in predicted beam information and beam quality information corresponding to 1 selected beam information in measured beam information is less than or greater than or equal to 1 dB within a preset time window or a preset number or a preset period.
[0100] wherein k is a positive integer greater than 1.
[0101] It should be noted that the first accuracy indicator is used to indicate a beam prediction accuracy within a preset time window or a preset number or a preset period.
[0102] The probability can also be referred to as a ratio.
[0103] In some embodiments, the first accuracy indicator satisfies the second preset condition includes at least one of the following:
[0104] The first accuracy indicator type x is less than or equal to a threshold value corresponding to the first accuracy indicator type x;
[0105] The first accuracy indicator type x is greater than or equal to a threshold value corresponding to the first accuracy indicator type x;
[0106] wherein x is any value from 1 to 6.
[0107] For example, if the 1 / 1 beam accuracy is used to indicate a probability that 1 selected beam information in predicted beam information and 1 selected beam information in measured beam information are consistent within a preset time window or a preset number or a preset period, the first accuracy indicator satisfies the second preset condition includes: the 1 / 1 beam accuracy is greater than or equal to a threshold value corresponding to the 1 / 1 beam accuracy, that is, when the 1 / 1 beam accuracy is greater than or equal to the threshold value corresponding to the 1 / 1 beam accuracy, the first accuracy event occurs.
[0108] For example, if the 1 / 1 beam accuracy is used to indicate a probability that 1 selected beam information in predicted beam information and 1 selected beam information in measured beam information are inconsistent within a preset time window or a preset number or a preset period, the first accuracy indicator satisfies the second preset condition includes: the 1 / 1 beam accuracy is less than or equal to a threshold value corresponding to the 1 / 1 beam accuracy, that is, when the 1 / 1 beam accuracy is less than or equal to the threshold value corresponding to the 1 / 1 beam accuracy, the first accuracy event occurs.
[0109] In some embodiments, the first accuracy event includes at least one of the following types:
[0110] The first accuracy event type 1: the 1 / 1 beam accuracy meets a second preset condition;
[0111] The first accuracy event type 2: the 1 / k beam accuracy meets the second preset condition;
[0112] The first accuracy event type 3: the k / 1 beam accuracy meets the second preset condition;
[0113] The first accuracy event type 4: the 1 / 1 beam accuracy with 1 dB margin meets the second preset condition;
[0114] The first accuracy event type 5: the 1 / k beam accuracy with 1 dB margin meets the second preset condition;
[0115] The first accuracy event type 6: the k / 1 beam accuracy with 1 dB margin meets the second preset condition.
[0116] The method for monitoring the beam prediction performance provided by the embodiments of the present application defines the first accuracy event and the first accuracy index. In the case that the first accuracy event meets the first preset condition, the information related to the first accuracy event is reported. This can provide more timely and effective information for the network, avoid frequent reporting of the performance monitoring results or the corresponding performance index, reduce the overhead caused by the performance monitoring, and improve the efficiency of the performance monitoring.
[0117] In some embodiments, the second preset conditions corresponding to the first accuracy event types are the same or different, and / or the second preset conditions corresponding to the first accuracy event types are determined by at least one of network configuration, protocol agreement and terminal reporting.
[0118] Optionally, the threshold values corresponding to the first accuracy index types are the same or different, and / or the threshold values corresponding to the first accuracy index types are determined by at least one of network configuration, protocol agreement and terminal reporting.
[0119] It can be understood that if the first accuracy index type x is less than or equal to the threshold value corresponding to the first accuracy index type x, the first accuracy event type x occurs, where x is any value in 1 to 6.
[0120] Optionally, if the beam prediction performance event is the first accuracy event, the beam prediction performance event meets the first preset condition, including at least one of the following:
[0121] The number of occurrences of the first accuracy event type x reaches a first preset number;
[0122] The number of consecutive occurrences of the first accuracy event type x reaches a first preset number;
[0123] The first accuracy event type x occurs a first preset number of times within a first time window;
[0124] The first accuracy event type x occurs a first preset number of times within a first time window.
[0125] Optionally, the first preset number or the first time window can be determined by at least one of the following: agreement, network configuration, and terminal reporting.
[0126] In some embodiments, if the first accuracy event type x meets a first preset condition, the first information reported by the terminal includes at least one of the following:
[0127] The first accuracy indicator type x;
[0128] The first accuracy event type x;
[0129] The number of times the first accuracy event type x occurs.
[0130] For example, for the first accuracy event or the first accuracy indicator, the first preset number is equal to 1. For example, when the 1 / 1 beam accuracy is less than or equal to the corresponding 1 / 1 beam accuracy threshold value, the first accuracy event type 1 occurs, reaches the first preset number, and the terminal reports at least one of the following: the first accuracy indicator type 1, the first accuracy event type 1, and the number of times the first accuracy event type 1 occurs.
[0131] For example, when the first accuracy indicator type 2 is less than or equal to the corresponding first accuracy indicator type 2 threshold value, the terminal reports the first accuracy indicator type 2.
[0132] Optionally, terminal reporting can be understood as triggering reporting.
[0133] Optionally, the content reported by the terminal is determined by network configuration. For example, when the first accuracy indicator type x is configured in the first accuracy event type x, when the first accuracy event x occurs, the terminal reports the first accuracy indicator type x.
[0134] In some embodiments, if the first accuracy event type x meets a first preset condition, and the first accuracy event x is associated with one or more target beam prediction performance events or target beam prediction performance indicators, wherein the type of the target beam prediction performance event is different from the type of the beam prediction performance event, i.e., the target beam prediction performance event is a first accuracy event type y, any second accuracy event type, or any beam quality difference event type. The target beam prediction performance indicator is the beam prediction performance indicator corresponding to the target beam prediction performance event.
[0135] For example, the target beam prediction performance event is the first accuracy event type y, and the target beam prediction performance indicator is the first accuracy indicator type y, and the value of y is different from the value of x. The first information reported by the terminal includes at least one of the following: the first accuracy indicator type x; the first accuracy event type x; the number of occurrences of the first accuracy event type x; the first accuracy indicator type y; the first accuracy event type y; and the number of occurrences of the first accuracy event type y.
[0136] For example, if the first accuracy event type x is associated with the first accuracy indicator type y1 or the first accuracy event type y1, and the first accuracy indicator type y2 or the first accuracy event type y2, the terminal simultaneously reports the associated first accuracy indicator type y1 or the first accuracy event type y1, and the first accuracy indicator type y2 or the first accuracy event type y2.
[0137] For example, when the first accuracy indicator type 1 is less than or equal to the corresponding first accuracy indicator type 1 threshold value, the terminal triggers to report the first accuracy indicator type 1, and reports the first accuracy indicator type 2. The first accuracy indicator type 2 is a relaxed limit compared with the first accuracy indicator type 1, so when the first accuracy indicator type 1 is lower than the threshold value, the first accuracy indicator type 2 is also likely to be lower than the threshold value. At this time, if the terminal only reports the first accuracy indicator type 1, the network cannot know whether the first accuracy indicator type 2 is still in a good range or has also approached the corresponding threshold value. Therefore, through the above method, the network can obtain more information to help timely beam management.
[0138] For example, the target beam prediction performance event is the second accuracy event type y1, and the target beam prediction performance indicator is the second accuracy indicator type y1. If the first accuracy event type x satisfies the first preset condition, the first information reported by the terminal includes at least one of the following: the first accuracy indicator type x; the first accuracy event type x; the number of occurrences of the first accuracy event type x; the second accuracy indicator type y1; the second accuracy event type y1; and the number of occurrences of the second accuracy event type y1.
[0139] For example, if the first accuracy event type x is associated with the second accuracy indicator type y1 or the second accuracy event type y1, and the beam quality difference indicator type y2 or the beam quality difference event type y2, and x < y1 < y2, the first information reported by the terminal includes at least one of the following: the first accuracy indicator type x; the first accuracy event type x; the number of occurrences of the first accuracy event type x; the second accuracy indicator type y1; the second accuracy event type y1; the number of occurrences of the second accuracy event type y1; the beam quality difference indicator type y2; the beam quality difference event type y2; and the number of occurrences of the beam quality difference event type y2.
[0140] The method for monitoring beam prediction performance provided by the embodiments of the present application can report information related to the target beam prediction performance event or the target beam prediction performance indicator associated with the first accuracy event in addition to the information related to the first accuracy event when the first accuracy event meets the first preset condition, so that the network can obtain more information and perform beam management in a timely manner to improve communication performance.
[0141] In some embodiments, if the first accuracy event type x meets the first preset condition, and the first accuracy event x is associated with one or more target beam prediction performance events or target beam prediction performance indicators, and the activated target beam prediction performance event or the activated target beam prediction performance indicator is determined according to network configuration,
[0142] wherein the type of the target beam prediction performance event is different from the type of the beam prediction performance event, the target beam prediction performance indicator is a beam prediction performance indicator corresponding to the target beam prediction performance event, for example, the target beam prediction performance event is the first accuracy event type y1 and y2, the target beam prediction performance indicator is the first accuracy indicator type y1 and y2, the values of y1, y2, and x are all different, and the network indicates that the first accuracy event type y1 or the first accuracy indicator type y1 is activated through a Medium Access Control Control Element (MAC CE) or Downlink Control Information (DCI), the first information reported by the terminal includes at least one of the following:
[0143] the first accuracy event type x;
[0144] the number of occurrences of the first accuracy event type x;
[0145] the first accuracy indicator type x corresponding to the first accuracy event type x;
[0146] the activated first accuracy event type y1;
[0147] a number of times the activated first accuracy event type y1 occurs;
[0148] the activated first accuracy indicator type y1.
[0149] Optionally, if the first accuracy indicator type x is associated with multiple first accuracy indicator types y or first accuracy event types y, the association can be activated by a MAC CE or a DCI, and only the activated first accuracy indicator types y or first accuracy event types y are reported.
[0150] In some embodiments, the method further comprises:
[0151] In a case where the first accuracy event type x does not satisfy the first preset condition, and the first accuracy indicator type y associated with the first accuracy event type x satisfies a threshold value corresponding to the first accuracy indicator type y, or the first accuracy event type y associated with the first accuracy event type x satisfies the first preset condition, the terminal reports second information, and the second information comprises at least one of the following:
[0152] the first accuracy event type y;
[0153] a number of times the first accuracy event type y occurs;
[0154] the first accuracy indicator type y;
[0155] The first accuracy indicator type y is a beam prediction performance indicator corresponding to the first accuracy event type y, and the value of y is different from the value of x.
[0156] In an embodiment, the first accuracy event type x does not satisfy the first preset condition, the first accuracy event type x is associated with a first accuracy event type y1 and a second accuracy event type y2, if the first accuracy event type y1 satisfies the first preset condition, the terminal does not report the second accuracy event type y2, or the terminal does not report the second accuracy indicator type y2, or the terminal reports at least one of the following: the first accuracy event type y1; a number of times the first accuracy event type y1 occurs; and the first accuracy indicator type y1.
[0157] Optionally, the first accuracy event type y1 satisfying the first preset condition comprises:
[0158] a number of times the first accuracy event type y1 occurs reaches a first preset number;
[0159] The number of consecutive occurrences of the first accuracy event type y1 reaches a first preset number;
[0160] The number of occurrences of the first accuracy event type y1 reaches a first preset number within a first time window;
[0161] The number of consecutive occurrences of the first accuracy event type y1 reaches a first preset number within a first time window.
[0162] In some embodiments, the first accuracy indicator type x or the first accuracy event type x is associated with the first accuracy indicator type y, or the association method of the first accuracy indicator type x or the first accuracy event type x with the first accuracy event type y includes at least one of the following:
[0163] Configured in the same EventTriggerConfig;
[0164] Configured in the same eventID;
[0165] The first accuracy indicator type y is configured in the first accuracy indicator type x;
[0166] The first accuracy event type y is configured in the first accuracy indicator type x;
[0167] The first accuracy indicator type y is configured in the first accuracy event type x;
[0168] The first accuracy event type y is configured in the first accuracy event type x;
[0169] The first accuracy indicator type x is configured in the first accuracy event type x;
[0170] The first accuracy indicator type y is configured in the first accuracy event type y;
[0171] Configure the association information.
[0172] Optionally, the first accuracy event type corresponding to the first accuracy indicator type can be determined by at least one of network configuration, protocol agreement or terminal reporting. For example, the first accuracy event type x can be associated with the first accuracy indicator type y, or the first accuracy event type x is associated with the first accuracy indicator type x according to the protocol agreement.
[0173] In some embodiments, the second accuracy indicator includes at least one of the following types:
[0174] The second accuracy indicator type 1 is used to indicate that k2 selected beam information in the obtained beam information by measurement and k1 selected beam information in the predicted beam information are consistent or inconsistent;
[0175] Optionally, the consistency here refers to that k2 selected pieces of beam information in the beam information obtained by measurement and k1 selected pieces of beam information in the predicted beam information are completely identical or partially identical.
[0176] The second accuracy rate index type 2 is used to indicate whether the order of k2 selected pieces of beam information in the beam information obtained by measurement and the order of k1 selected pieces of beam information in the predicted beam information are consistent or inconsistent.
[0177] The second accuracy rate index type 3 is used to indicate the matching degree of the order of k2 selected pieces of beam information in the beam information obtained by measurement and the order of k1 selected pieces of beam information in the predicted beam information.
[0178] The second accuracy rate index type 4 is used to indicate whether the order of k1 selected pieces of beam information in the predicted beam information and the order of k1 selected pieces of beam information in the predicted beam information corresponding to the beam information obtained by measurement are consistent or inconsistent.
[0179] The second accuracy rate index type 5 is used to indicate the matching degree of the order of k1 selected pieces of beam information in the predicted beam information and the order of k1 selected pieces of beam information in the predicted beam information corresponding to the beam information obtained by measurement.
[0180] The beam information obtained by measurement corresponding to the k1 selected pieces of beam information in the predicted beam information is obtained by the terminal receiving a measurement resource list transmitted using the k1 selected pieces of beam information in the predicted beam information.
[0181] k1 and k2 are different, and k1 and k2 are positive integers greater than 1.
[0182] It can be understood that the beam information obtained by measurement corresponding to the k1 selected pieces of beam information in the predicted beam information refers to that the k1 selected pieces of beam information in the predicted beam information are associated to a measurement resource list, and the terminal receives a measurement resource list transmitted using the k1 selected pieces of beam information in the predicted beam information, so as to obtain the beam information obtained by measurement corresponding to the k1 selected pieces of beam information in the predicted beam information.
[0183] In some embodiments, the second accuracy rate event includes at least one of the following types:
[0184] The second accuracy rate event type 1 is that the number of times that k2 selected pieces of beam information in the beam information obtained by measurement and k1 selected pieces of beam information in the predicted beam information are consistent or inconsistent satisfies a third preset condition.
[0185] The second accuracy event type 2: the number of times that the order of the k2 selected beam information in the measured obtained beam information and the order of the k1 selected beam information in the predicted beam information are consistent or inconsistent satisfies a third preset condition;
[0186] The second accuracy event type 3: the matching degree of the order of the k2 selected beam information in the measured obtained beam information and the order of the k1 selected beam information in the predicted beam information satisfies a third preset condition;
[0187] The second accuracy event type 4: the number of times that the order of the k1 selected beam information in the predicted beam information and the order of the k1 selected beam information in the predicted beam information corresponding to the measured obtained beam information are consistent or inconsistent satisfies a third preset condition;
[0188] The second accuracy event type 5: the matching degree of the order of the k1 selected beam information in the predicted beam information and the order of the k1 selected beam information in the predicted beam information corresponding to the measured obtained beam information satisfies a third preset condition;
[0189] The third preset condition includes at least one of the following:
[0190] Greater than or equal to a preset number threshold;
[0191] Less than or equal to a preset number threshold;
[0192] Greater than or equal to a preset matching degree threshold;
[0193] Less than or equal to a preset matching degree threshold.
[0194] Optionally, the third preset condition includes at least one of the following: a preset number threshold, a preset matching degree threshold.
[0195] Optionally, the third preset conditions corresponding to the second accuracy event types are the same or different, and / or the third preset conditions corresponding to the second accuracy event types are determined by at least one of network configuration, protocol agreement and terminal reporting.
[0196] For example, the preset number threshold is 1, and the preset matching degree threshold is 0.8 or 80%.
[0197] The second accuracy event type x is any one of the second accuracy event type 1 to the first accuracy event type 5, and x takes any value from 1 to 5.
[0198] The beam prediction performance monitoring method provided by the embodiments of the present application defines a second accuracy rate index and a second accuracy rate event, and only when the second accuracy rate event meets a first preset condition, information related to the second accuracy rate event is reported, which can provide more timely and effective information for the network, avoid frequent reporting of performance monitoring results or corresponding performance indexes, reduce the overhead caused by performance monitoring, and improve the efficiency of performance monitoring.
[0199] Optionally, if the beam prediction performance event is a second accuracy rate event, the beam prediction performance event meets a first preset condition, and the first preset condition includes at least one of the following:
[0200] The number of occurrences of the second accuracy rate event type x reaches a second preset number;
[0201] The number of consecutive occurrences of the second accuracy rate event type x reaches a second preset number;
[0202] In a second time window, the number of occurrences of the first accuracy rate event type x reaches a second preset number;
[0203] In the second time window, the number of consecutive occurrences of the first accuracy rate event type x reaches a second preset number.
[0204] Optionally, the second preset number or the second time window can be determined by at least one of the following: protocol agreement, network configuration, and terminal reporting.
[0205] Optionally, the second preset number is the same as or different from the first preset number.
[0206] Optionally, the second time window is the same as or different from the first time window.
[0207] In some embodiments, if the second accuracy rate event type x meets the first preset condition, the first information reported by the terminal includes at least one of the following:
[0208] The second accuracy rate index type x;
[0209] The second accuracy rate event type x;
[0210] The number of occurrences of the second accuracy rate event type x.
[0211] For example, the third preset condition is less than or equal to a preset number threshold, and the preset number threshold is 1, and the second preset number is 1. When the number of times that the second accuracy event type 1 occurs is less than or equal to 1, for example, the number of times that the k2 selected pieces of beam information in the obtained beam information are inconsistent with the k1 selected pieces of beam information in the predicted beam information is 1, the second accuracy event type 1 occurs, the second preset number is reached, and the terminal reports the second accuracy indicator type 1.
[0212] Optionally, the content reported by the terminal is determined by network configuration. For example, when the second accuracy indicator type x is configured in the second accuracy event type x, the terminal reports the second accuracy indicator type x when the second accuracy event x occurs.
[0213] In some embodiments, if the second accuracy event type x meets the first preset condition, the second accuracy event type x is associated with one or more second accuracy indicator types y or second accuracy event types y, and the first information reported by the terminal includes at least one of the following:
[0214] The second accuracy indicator type x;
[0215] The second accuracy event type x;
[0216] The number of times that the second accuracy event type x occurs;
[0217] The second accuracy indicator type y;
[0218] The second accuracy event type y;
[0219] The number of times that the second accuracy event type y occurs;
[0220] Wherein, the value of y is different from the value of x.
[0221] The beam prediction performance monitoring method provided by the embodiments of the present application can not only report information related to the second accuracy event when the second accuracy event meets the first preset condition, but also report information related to the target beam prediction performance event or the target beam prediction performance indicator associated with the second accuracy event, so that the network can obtain more information to help timely beam management and improve communication performance.
[0222] In some embodiments, if the second accuracy event type x meets the first preset condition, the second accuracy event type x is associated with multiple second accuracy indicator types y or second accuracy event types y, and the activated second accuracy indicator type y or second accuracy event type y is determined according to network configuration, and the first information reported by the terminal includes at least one of the following:
[0223] The second accuracy indicator type x;
[0224] the second accuracy event type x;
[0225] the number of times the second accuracy event type x occurs;
[0226] the second accuracy indicator type y that is activated;
[0227] the second accuracy event type y that is activated;
[0228] the number of times the second accuracy event type y that is activated occurs;
[0229] wherein the value of y is different from the value of x.
[0230] Optionally, the terminal determines the second accuracy indicator type y or the second accuracy event type y that is activated according to a MAC CE or a DCI.
[0231] In some embodiments, the method further comprises:
[0232] In the case that the second accuracy event type x does not satisfy the first preset condition, and the second accuracy indicator type y associated with the second accuracy event type x satisfies the third preset condition corresponding to the second accuracy indicator type y, or the second accuracy event type y associated with the second accuracy event type x satisfies the first preset condition, the terminal reports second information, and the second information comprises at least one of the following:
[0233] the second accuracy indicator type y;
[0234] the second accuracy event type y;
[0235] the number of times the second accuracy event type y occurs.
[0236] For example, if the second accuracy event type x does not satisfy the first preset condition, the second accuracy event type x is associated with multiple second accuracy event types y, such as y1 and y2, when the second accuracy event type y1 satisfies the first preset condition, the terminal does not report the second accuracy event type y2 or the terminal does not report the second accuracy indicator type y2, or the terminal only reports at least one of the following:
[0237] the second accuracy indicator type y1;
[0238] the second accuracy event type y1;
[0239] the number of times the second accuracy event type y1 occurs.
[0240] For example, if the second accuracy event type x does not satisfy the first preset condition, the second accuracy event type x is associated with the first accuracy event type y1 and the second accuracy event type y2, when the first accuracy event type y1 satisfies the first preset condition, the terminal does not report the second accuracy event type y2 or the terminal does not report the second accuracy indicator type y2, or the terminal only reports at least one of the following:
[0241] The first accuracy indicator type y1;
[0242] The first accuracy event type y1;
[0243] The number of times of occurrence of the first accuracy event type y1.
[0244] The beam prediction performance monitoring method provided by the embodiments of the present application can report information related to the target beam prediction performance event or the target beam prediction performance indicator in the case that the second accuracy event does not satisfy the first preset condition, but the target beam prediction performance indicator associated with the second accuracy event satisfies the corresponding threshold value or the target beam prediction performance event satisfies the first preset condition, so that the network can obtain more information and further timely perform beam management to improve communication performance.
[0245] In some embodiments, the second accuracy event type x or the second accuracy indicator type x is associated with the second accuracy indicator type y, or the association method of the second accuracy event type x or the second accuracy indicator type x with the second accuracy event type y includes at least one of the following:
[0246] Configured in the same EventTriggerConfig;
[0247] Configured in the same eventID;
[0248] The second accuracy indicator type y is configured in the second accuracy indicator type x;
[0249] The second accuracy event type y is configured in the second accuracy indicator type x;
[0250] The second accuracy indicator type y is configured in the second accuracy event type x;
[0251] The second accuracy event type y is configured in the second accuracy event type x;
[0252] The second accuracy indicator type x is configured in the second accuracy event type x;
[0253] The second accuracy indicator type y is configured in the second accuracy event type y;
[0254] Configure the association information;
[0255] Wherein, the value of y is different from the value of x.
[0256] Optionally, the second accuracy rate event type corresponds to a second accuracy rate indicator type, which can be determined through at least one of network configuration, protocol agreement or terminal reporting. For example, the second accuracy rate event type x can be associated with the second accuracy rate indicator type y, or the protocol agreement can associate the second accuracy rate event type x with the second accuracy rate indicator type x.
[0257] In some embodiments, the beam information includes at least one of the following types:
[0258] 1) The first beam information is determined by the first indication information, which is determined by at least one of network configuration and protocol agreement;
[0259] For example, the protocol agreement indicates that the first indication information is the beam information corresponding to the TCI state indicated in the DCI, or the first indication information is configured in the corresponding configuration information to indicate the resources in a resource list.
[0260] In some embodiments, the first indication information is agreed by the protocol and includes at least one of the following:
[0261] The beam information contained or associated by at least one transmission configuration indication TCI state activated by downlink control information DCI;
[0262] The downlink beam information contained or associated by at least one TCI state activated by DCI;
[0263] The beam information contained or associated by one TCI state activated by medium access control layer control element MAC CE;
[0264] The beam information contained or associated by at least one TCI state activated by MAC CE;
[0265] The downlink beam information contained or associated by at least one TCI state activated by MAC CE;
[0266] The beam information with the worst beam quality information in the activated TCI state;
[0267] The beam information with the best beam quality information in the activated TCI state.
[0268] 2) The second beam information is k1 selected beam information in the predicted beam information;
[0269] 3) third beam information, the third beam information being beam information obtained according to measurement of part of the beam information in the first list, the first list including beam information used by the AI unit in beam prediction inference to determine a prediction result;
[0270] 4) fourth beam information, the fourth beam information being beam information obtained according to measurement of k1 selected beam information in the predicted beam information.
[0271] It can be understood that after the second beam information is fed back to the network, the network configures corresponding resources, and the fourth beam information is measurement results obtained by the UE actually measuring the corresponding resources.
[0272] For example, the quality of resources 1-4 in the AI model prediction result is the best, and there is a predicted RSRP value. After the UE feeds back, the network configures another resource, the other resource is associated with resources 1-4 (that is, transmitted by the beam of resources 1-4), and the UE measures the RSPR value corresponding to the other resource.
[0273] In some embodiments, the beam quality information includes at least one of the following: a measurement result of the beam information, a prediction result of the beam information.
[0274] The measurement result of the beam information can be understood as the measured beam quality information corresponding to the beam information, and the prediction result of the beam information can be the predicted beam quality information corresponding to the beam information.
[0275] Optionally, the beam quality information is measured beam quality information corresponding to the first beam information determined according to the first indication information, or predicted beam quality information corresponding to the first beam information determined according to the first indication information.
[0276] The beam quality information corresponding to different beam information can be different.
[0277] In some embodiments, the beam quality difference index includes at least one of the following types:
[0278] Beam quality difference index type 1: the difference between the beam quality information of the first beam information and the beam quality information of the second beam information;
[0279] Optionally, the difference between the beam quality information of the first beam information and the beam quality information of the second beam information comprises at least one of: a difference between a measurement result of the first beam information and a measurement result of the second beam information; a difference between the measurement result of the first beam information and a prediction result of the second beam information; a difference between a prediction result of the first beam information and the measurement result of the second beam information; and a difference between the prediction result of the first beam information and a prediction result of the second beam information.
[0280] The beam quality difference index type 2: a mean value of the difference between the beam quality information of the first beam information and the beam quality information of the second beam information under the fifth preset condition;
[0281] Optionally, the mean value of the difference between the beam quality information of the first beam information and the beam quality information of the second beam information under the fifth preset condition comprises at least one of: a mean value of the difference between a measurement result of the first beam information and a measurement result of the second beam information under the fifth preset condition; a mean value of the difference between the measurement result of the first beam information and a prediction result of the second beam information under the fifth preset condition; a mean value of the difference between a prediction result of the first beam information and the measurement result of the second beam information under the fifth preset condition; and a mean value of the difference between the prediction result of the first beam information and a prediction result of the second beam information under the fifth preset condition.
[0282] The beam quality difference index type 3: a difference between the beam quality information of the first beam information and the beam quality information of the third beam information;
[0283] Optionally, the difference between the beam quality information of the first beam information and the beam quality information of the third beam information comprises at least one of: a difference between a measurement result of the first beam information and a measurement result of the third beam information; a difference between the measurement result of the first beam information and a prediction result of the third beam information; a difference between a prediction result of the first beam information and the measurement result of the third beam information; and a difference between the prediction result of the first beam information and a prediction result of the third beam information.
[0284] The beam quality difference index type 4: a mean value of the difference between the beam quality information of the first beam information and the beam quality information of the third beam information under the fifth preset condition;
[0285] Optionally, the difference between the beam quality information of the first beam information and the beam quality information of the third beam information under the fifth preset condition includes at least one of: a difference between a measurement result of the first beam information and a measurement result of the third beam information under the fifth preset condition; a difference between the measurement result of the first beam information and a prediction result of the third beam information under the fifth preset condition; a difference between a prediction result of the first beam information and the measurement result of the third beam information under the fifth preset condition; and a difference between the prediction result of the first beam information and a prediction result of the third beam information under the fifth preset condition.
[0286] Beam quality difference index type 5: a difference between the beam quality information of the first beam information and the beam quality information of the fourth beam information.
[0287] Optionally, the difference between the beam quality information of the first beam information and the beam quality information of the fourth beam information includes at least one of: a difference between a measurement result of the first beam information and a measurement result of the fourth beam information; a difference between the measurement result of the first beam information and a prediction result of the fourth beam information; a difference between a prediction result of the first beam information and the measurement result of the fourth beam information; and a difference between the prediction result of the first beam information and a prediction result of the fourth beam information.
[0288] Beam quality difference index type 6: an average difference between the beam quality information of the first beam information and the beam quality information of the fourth beam information under a fifth preset condition.
[0289] Optionally, the average difference between the beam quality information of the first beam information and the beam quality information of the fourth beam information under the fifth preset condition includes at least one of: an average difference between a measurement result of the first beam information and a measurement result of the fourth beam information under the fifth preset condition; an average difference between the measurement result of the first beam information and a prediction result of the fourth beam information under the fifth preset condition; an average difference between a prediction result of the first beam information and the measurement result of the fourth beam information under the fifth preset condition; and an average difference between the prediction result of the first beam information and a prediction result of the fourth beam information under the fifth preset condition.
[0290] Beam quality difference index type 7: a difference between the beam quality information of the second beam information and the beam quality information of the third beam information.
[0291] Optionally, the difference between the beam quality information of the second beam information and the beam quality information of the third beam information comprises at least one of: a difference between a measurement result of the second beam information and a measurement result of the third beam information; a difference between the measurement result of the second beam information and a prediction result of the third beam information; a difference between a prediction result of the second beam information and the measurement result of the third beam information; and a difference between the prediction result of the second beam information and a prediction result of the third beam information.
[0292] Beam quality difference index type 8: average of the difference between the beam quality information of the second beam information and the beam quality information of the third beam information under the fifth preset condition;
[0293] Optionally, the average of the difference between the beam quality information of the second beam information and the beam quality information of the third beam information under the fifth preset condition comprises at least one of: an average of the difference between a measurement result of the second beam information and a measurement result of the third beam information under the fifth preset condition; an average of the difference between the measurement result of the second beam information and a prediction result of the third beam information under the fifth preset condition; an average of the difference between a prediction result of the second beam information and the measurement result of the third beam information under the fifth preset condition; and an average of the difference between the prediction result of the second beam information and a prediction result of the third beam information under the fifth preset condition.
[0294] Beam quality difference index type 9: difference between the beam quality information of the second beam information and the beam quality information of the fourth beam information;
[0295] Optionally, the difference between the beam quality information of the second beam information and the beam quality information of the fourth beam information comprises at least one of: a difference between a measurement result of the second beam information and a measurement result of the fourth beam information; a difference between the measurement result of the second beam information and a prediction result of the fourth beam information; a difference between a prediction result of the second beam information and the measurement result of the fourth beam information; and a difference between the prediction result of the second beam information and a prediction result of the fourth beam information.
[0296] Beam quality difference index type 10: average of the difference between the beam quality information of the second beam information and the beam quality information of the fourth beam information under the fifth preset condition;
[0297] Optionally, the difference between the beam quality information of the second beam information and the beam quality information of the fourth beam information under the fifth preset condition includes at least one of: a difference between a measurement result of the second beam information and a measurement result of the fourth beam information under the fifth preset condition; a difference between the measurement result of the second beam information and a prediction result of the fourth beam information under the fifth preset condition; a difference between a prediction result of the second beam information and the measurement result of the fourth beam information under the fifth preset condition; and a difference between the prediction result of the second beam information and a prediction result of the fourth beam information under the fifth preset condition.
[0298] Beam quality difference index type 11: a difference between the beam quality information of the third beam information and the beam quality information of the fourth beam information.
[0299] Optionally, the difference between the beam quality information of the third beam information and the beam quality information of the fourth beam information includes at least one of: a difference between a measurement result of the third beam information and a measurement result of the fourth beam information; a difference between the measurement result of the third beam information and a prediction result of the fourth beam information; a difference between a prediction result of the third beam information and the measurement result of the fourth beam information; and a difference between the prediction result of the third beam information and a prediction result of the fourth beam information.
[0300] Beam quality difference index type 12: an average difference between the beam quality information of the third beam information and the beam quality information of the fourth beam information under a fifth preset condition.
[0301] Optionally, the average difference between the beam quality information of the third beam information and the beam quality information of the fourth beam information under the fifth preset condition includes at least one of: an average difference between a measurement result of the third beam information and a measurement result of the fourth beam information under the fifth preset condition; an average difference between the measurement result of the third beam information and a prediction result of the fourth beam information under the fifth preset condition; an average difference between a prediction result of the third beam information and the measurement result of the fourth beam information under the fifth preset condition; and an average difference between the prediction result of the third beam information and a prediction result of the fourth beam information under the fifth preset condition.
[0302] Beam quality difference index type 13: a difference between a measurement result of the first beam information and a prediction result of the first beam information.
[0303] Beam quality difference index type 14: average difference between the measurement result of the first beam information and the prediction result of the first beam information under the fifth preset condition;
[0304] Beam quality difference index type 15: difference between the measurement result of the second beam information and the prediction result of the second beam information;
[0305] Beam quality difference index type 16: average difference between the measurement result of the second beam information and the prediction result of the second beam information under the fifth preset condition;
[0306] Beam quality difference index type 17: difference between the measurement result of the third beam information and the prediction result of the third beam information;
[0307] Beam quality difference index type 18: average difference between the measurement result of the third beam information and the prediction result of the third beam information under the fifth preset condition;
[0308] Beam quality difference index type 19: difference between the measurement result of the fourth beam information and the prediction result of the fourth beam information;
[0309] Beam quality difference index type 20: average difference between the measurement result of the fourth beam information and the prediction result of the fourth beam information under the fifth preset condition;
[0310] The fifth preset condition includes at least one of: a preset number of times; a preset number of occurrences; a preset value threshold; and a preset time window.
[0311] Optionally, in a case where the beam information in the beam quality difference index type corresponds to multiple beam information, the beam quality information of the beam information is a maximum value or a minimum value in the beam quality information of the multiple beam information.
[0312] Optionally, the fifth preset conditions corresponding to the beam quality difference index types are the same or different.
[0313] Optionally, the fifth preset conditions corresponding to the beam quality difference index types are determined by at least one of network configuration, protocol agreement, and terminal reporting.
[0314] Optionally, the beam quality difference index type x is used to represent any one of the beam quality difference index types 1 to 20, and the value of x is any value in 1 to 20.
[0315] In some embodiments, the beam quality difference event includes at least one of the following types:
[0316] Beam quality difference event type 1: a difference between the beam quality information of the first beam information and the beam quality information of the second beam information satisfies a fourth preset condition;
[0317] Optionally, the difference between the beam quality information of the first beam information and the beam quality information of the second beam information satisfying the fourth preset condition comprises at least one of the following: a difference between a measurement result of the first beam information and a measurement result of the second beam information satisfies the fourth preset condition; a difference between the measurement result of the first beam information and a prediction result of the second beam information satisfies the fourth preset condition; a difference between a prediction result of the first beam information and the measurement result of the second beam information satisfies the fourth preset condition; a difference between the prediction result of the first beam information and a prediction result of the second beam information satisfies the fourth preset condition.
[0318] Beam quality difference event type 2: an average of the difference between the beam quality information of the first beam information and the beam quality information of the second beam information under a fifth preset condition satisfies a fourth preset condition;
[0319] Optionally, the average of the difference between the beam quality information of the first beam information and the beam quality information of the second beam information under the fifth preset condition satisfying the fourth preset condition comprises at least one of the following: an average of the difference between the measurement result of the first beam information and the measurement result of the second beam information under the fifth preset condition satisfies the fourth preset condition; an average of the difference between the measurement result of the first beam information and the prediction result of the second beam information under the fifth preset condition satisfies the fourth preset condition; an average of the difference between the prediction result of the first beam information and the measurement result of the second beam information under the fifth preset condition satisfies the fourth preset condition; an average of the difference between the prediction result of the first beam information and the prediction result of the second beam information under the fifth preset condition satisfies the fourth preset condition.
[0320] Beam quality difference event type 3: the beam quality information of the first beam information is less than or equal to a sum of reference beam quality information and the beam quality information of the second beam information;
[0321] In the embodiments of the present application, the reference beam quality information threshold is a beam quality information reference value determined by protocol agreement, network configuration, etc., which can be positive or negative, and is not limited herein. The reference beam quality information can be 0.
[0322] Optionally, the first beam information being less than or equal to the sum of the reference beam quality information and the second beam information includes at least one of: the measurement result of the first beam information being less than or equal to the sum of the measurement result of the reference beam quality information and the second beam information; the measurement result of the first beam information being less than or equal to the sum of the measurement result of the reference beam quality information and the prediction result of the second beam information; the prediction result of the first beam information being less than or equal to the sum of the measurement result of the reference beam quality information and the second beam information; the prediction result of the first beam information being less than or equal to the sum of the prediction result of the reference beam quality information and the second beam information.
[0323] Beam quality difference event type 4: the first beam information being greater than or equal to the sum of the reference beam quality information and the second beam information;
[0324] Optionally, the first beam information being greater than or equal to the sum of the reference beam quality information and the second beam information includes at least one of: the measurement result of the first beam information being greater than or equal to the sum of the measurement result of the reference beam quality information and the second beam information; the measurement result of the first beam information being greater than or equal to the sum of the measurement result of the reference beam quality information and the prediction result of the second beam information; the prediction result of the first beam information being greater than or equal to the sum of the measurement result of the reference beam quality information and the second beam information; the prediction result of the first beam information being greater than or equal to the sum of the prediction result of the reference beam quality information and the second beam information.
[0325] Beam quality difference event type 5: the difference between the first beam information and the third beam information satisfying a fourth preset condition;
[0326] Optionally, the difference between the first beam information and the third beam information satisfying a fourth preset condition includes at least one of: the difference between the measurement result of the first beam information and the measurement result of the third beam information satisfying a fourth preset condition; the difference between the measurement result of the first beam information and the prediction result of the third beam information satisfying a fourth preset condition; the difference between the prediction result of the first beam information and the measurement result of the third beam information satisfying a fourth preset condition; the difference between the prediction result of the first beam information and the prediction result of the third beam information satisfying a fourth preset condition.
[0327] Beam quality difference event type 6: the average of the difference between the first beam information and the third beam information satisfying a fourth preset condition under a fifth preset condition;
[0328] Optionally, the fourth preset condition that the average of the difference between the beam quality information of the first beam information and the beam quality information of the third beam information under the fifth preset condition satisfies includes at least one of the following: the fourth preset condition that the average of the difference between the measurement result of the first beam information and the measurement result of the third beam information under the fifth preset condition satisfies; the fourth preset condition that the average of the difference between the measurement result of the first beam information and the prediction result of the third beam information under the fifth preset condition satisfies; the fourth preset condition that the average of the difference between the prediction result of the first beam information and the measurement result of the third beam information under the fifth preset condition satisfies; the fourth preset condition that the average of the difference between the prediction result of the first beam information and the prediction result of the third beam information under the fifth preset condition satisfies.
[0329] Beam quality difference event type 7: the beam quality information of the first beam information is less than or equal to the sum of the reference beam quality information and the beam quality information of the third beam information.
[0330] Optionally, the first beam information being less than or equal to the sum of the reference beam quality information and the beam quality information of the third beam information includes at least one of the following: the measurement result of the first beam information being less than or equal to the sum of the reference beam quality information and the measurement result of the third beam information; the measurement result of the first beam information being less than or equal to the sum of the reference beam quality information and the prediction result of the third beam information; the prediction result of the first beam information being less than or equal to the sum of the reference beam quality information and the measurement result of the third beam information; the prediction result of the first beam information being less than or equal to the sum of the reference beam quality information and the prediction result of the third beam information.
[0331] Beam quality difference event type 8: the beam quality information of the first beam information is greater than or equal to the sum of the reference beam quality information and the beam quality information of the third beam information.
[0332] Optionally, the first beam information being greater than or equal to the sum of the reference beam quality information and the beam quality information of the third beam information includes at least one of the following: the measurement result of the first beam information being greater than or equal to the sum of the reference beam quality information and the measurement result of the third beam information; the measurement result of the first beam information being greater than or equal to the sum of the reference beam quality information and the prediction result of the third beam information; the prediction result of the first beam information being greater than or equal to the sum of the reference beam quality information and the measurement result of the third beam information; the prediction result of the first beam information being greater than or equal to the sum of the reference beam quality information and the prediction result of the third beam information.
[0333] Beam quality difference event type 9: a difference between the beam quality information of the first beam information and the beam quality information of the fourth beam information satisfies a fourth preset condition;
[0334] Optionally, the difference between the beam quality information of the first beam information and the beam quality information of the fourth beam information satisfying the fourth preset condition comprises at least one of the following: a difference between the measurement result of the first beam information and the measurement result of the fourth beam information satisfies the fourth preset condition; a difference between the measurement result of the first beam information and the prediction result of the fourth beam information satisfies the fourth preset condition; a difference between the prediction result of the first beam information and the measurement result of the fourth beam information satisfies the fourth preset condition; a difference between the prediction result of the first beam information and the prediction result of the fourth beam information satisfies the fourth preset condition.
[0335] Beam quality difference event type 10: an average of the difference between the beam quality information of the first beam information and the beam quality information of the fourth beam information under a fifth preset condition satisfies a fourth preset condition;
[0336] Optionally, the average of the difference between the beam quality information of the first beam information and the beam quality information of the fourth beam information under the fifth preset condition satisfying the fourth preset condition comprises at least one of the following: an average of the difference between the measurement result of the first beam information and the measurement result of the fourth beam information under the fifth preset condition satisfies the fourth preset condition; an average of the difference between the measurement result of the first beam information and the prediction result of the fourth beam information under the fifth preset condition satisfies the fourth preset condition; an average of the difference between the prediction result of the first beam information and the measurement result of the fourth beam information under the fifth preset condition satisfies the fourth preset condition; an average of the difference between the prediction result of the first beam information and the prediction result of the fourth beam information under the fifth preset condition satisfies the fourth preset condition.
[0337] Beam quality difference event type 11: the beam quality information of the first beam information is less than or equal to a sum of reference beam quality information and the beam quality information of the fourth beam information;
[0338] Optionally, the first beam information beam quality information being less than or equal to the sum of the reference beam quality information and the fourth beam information beam quality information comprises at least one of: the first beam information measurement result being less than or equal to the sum of the reference beam quality information and the fourth beam information measurement result; the first beam information measurement result being less than or equal to the sum of the reference beam quality information and the fourth beam information prediction result; the first beam information prediction result being less than or equal to the sum of the reference beam quality information and the fourth beam information measurement result; and the first beam information prediction result being less than or equal to the sum of the reference beam quality information and the fourth beam information prediction result.
[0339] Beam quality difference event type 12: the first beam information beam quality information being greater than or equal to the sum of the reference beam quality information and the fourth beam information beam quality information;
[0340] Optionally, the first beam information beam quality information being greater than or equal to the sum of the reference beam quality information and the fourth beam information beam quality information comprises at least one of: the first beam information measurement result being greater than or equal to the sum of the reference beam quality information and the fourth beam information measurement result; the first beam information measurement result being greater than or equal to the sum of the reference beam quality information and the fourth beam information prediction result; the first beam information prediction result being greater than or equal to the sum of the reference beam quality information and the fourth beam information measurement result; and the first beam information prediction result being greater than or equal to the sum of the reference beam quality information and the fourth beam information prediction result.
[0341] Beam quality difference event type 13: the difference between the second beam information beam quality information and the third beam information beam quality information satisfying a fourth preset condition;
[0342] Optionally, the difference between the second beam information beam quality information and the third beam information beam quality information satisfying a fourth preset condition comprises at least one of: the difference between the second beam information measurement result and the third beam information measurement result satisfying the fourth preset condition; the difference between the second beam information measurement result and the third beam information prediction result satisfying the fourth preset condition; the difference between the second beam information prediction result and the third beam information measurement result satisfying the fourth preset condition; and the difference between the second beam information prediction result and the third beam information prediction result satisfying the fourth preset condition.
[0343] Beam quality difference event type 14: the average of the difference between the second beam information beam quality information and the third beam quality information satisfying a fourth preset condition under a fifth preset condition;
[0344] Optionally, the fourth preset condition that the average of the difference between the beam quality information of the second beam information and the beam quality information of the third beam information under the fifth preset condition satisfies includes at least one of the following: the fourth preset condition that the average of the difference between the measurement result of the second beam information and the measurement result of the third beam information under the fifth preset condition satisfies; the fourth preset condition that the average of the difference between the measurement result of the second beam information and the prediction result of the third beam information under the fifth preset condition satisfies; the fourth preset condition that the average of the difference between the prediction result of the second beam information and the measurement result of the third beam information under the fifth preset condition satisfies; the fourth preset condition that the average of the difference between the prediction result of the second beam information and the prediction result of the third beam information under the fifth preset condition satisfies.
[0345] Beam quality difference event type 15: the beam quality information of the second beam information is less than or equal to the sum of the reference beam quality information and the beam quality information of the third beam information;
[0346] Optionally, the beam quality information of the second beam information being less than or equal to the sum of the reference beam quality information and the beam quality information of the third beam information includes at least one of the following: the measurement result of the second beam information being less than or equal to the sum of the reference beam quality information and the measurement result of the third beam information; the measurement result of the second beam information being less than or equal to the sum of the reference beam quality information and the prediction result of the third beam information; the prediction result of the second beam information being less than or equal to the sum of the reference beam quality information and the measurement result of the third beam information; the prediction result of the second beam information being less than or equal to the sum of the reference beam quality information and the prediction result of the third beam information.
[0347] Beam quality difference event type 16: the beam quality information of the second beam information is greater than or equal to the sum of the reference beam quality information and the beam quality information of the third beam information;
[0348] Optionally, the beam quality information of the second beam information being greater than or equal to the sum of the reference beam quality information and the beam quality information of the third beam information includes at least one of the following: the measurement result of the second beam information being greater than or equal to the sum of the reference beam quality information and the measurement result of the third beam information; the measurement result of the second beam information being greater than or equal to the sum of the reference beam quality information and the prediction result of the third beam information; the prediction result of the second beam information being greater than or equal to the sum of the reference beam quality information and the measurement result of the third beam information; the prediction result of the second beam information being greater than or equal to the sum of the reference beam quality information and the prediction result of the third beam information.
[0349] Beam quality difference event type 17: a difference between the beam quality information of the second beam information and the beam quality information of the fourth beam information satisfies a fourth preset condition;
[0350] Optionally, the difference between the beam quality information of the second beam information and the beam quality information of the fourth beam information satisfying the fourth preset condition comprises at least one of the following: a difference between the measurement result of the second beam information and the measurement result of the fourth beam information satisfies the fourth preset condition; a difference between the measurement result of the second beam information and the prediction result of the fourth beam information satisfies the fourth preset condition; a difference between the prediction result of the second beam information and the measurement result of the fourth beam information satisfies the fourth preset condition; a difference between the prediction result of the second beam information and the prediction result of the fourth beam information satisfies the fourth preset condition.
[0351] Beam quality difference event type 18: an average of the difference between the beam quality information of the second beam information and the beam quality information of the fourth beam information under a fifth preset condition satisfies a fourth preset condition;
[0352] Optionally, the average of the difference between the beam quality information of the second beam information and the beam quality information of the fourth beam information under the fifth preset condition satisfying the fourth preset condition comprises at least one of the following: an average of the difference between the measurement result of the second beam information and the measurement result of the fourth beam information under the fifth preset condition satisfies the fourth preset condition; an average of the difference between the measurement result of the second beam information and the prediction result of the fourth beam information under the fifth preset condition satisfies the fourth preset condition; an average of the difference between the prediction result of the second beam information and the measurement result of the fourth beam information under the fifth preset condition satisfies the fourth preset condition; an average of the difference between the prediction result of the second beam information and the prediction result of the fourth beam information under the fifth preset condition satisfies the fourth preset condition.
[0353] Beam quality difference event type 19: the beam quality information of the second beam information is less than or equal to a sum of reference beam quality information and the beam quality information of the fourth beam information;
[0354] Optionally, the second beam information being less than or equal to the sum of the reference beam quality information and the fourth beam information includes at least one of: the measurement result of the second beam information being less than or equal to the sum of the measurement result of the reference beam quality information and the fourth beam information; the measurement result of the second beam information being less than or equal to the sum of the prediction result of the reference beam quality information and the fourth beam information; the prediction result of the second beam information being less than or equal to the sum of the measurement result of the reference beam quality information and the fourth beam information; and the prediction result of the second beam information being less than or equal to the sum of the prediction result of the reference beam quality information and the fourth beam information.
[0355] Beam quality difference event type 20: the second beam information being greater than or equal to the sum of the reference beam quality information and the fourth beam information;
[0356] Optionally, the second beam information being greater than or equal to the sum of the reference beam quality information and the fourth beam information includes at least one of: the measurement result of the second beam information being greater than or equal to the sum of the measurement result of the reference beam quality information and the fourth beam information; the measurement result of the second beam information being greater than or equal to the sum of the prediction result of the reference beam quality information and the fourth beam information; the prediction result of the second beam information being greater than or equal to the sum of the measurement result of the reference beam quality information and the fourth beam information; and the prediction result of the second beam information being greater than or equal to the sum of the prediction result of the reference beam quality information and the fourth beam information.
[0357] Beam quality difference event type 21: the difference between the third beam information and the fourth beam information satisfying a fourth preset condition;
[0358] Optionally, the difference between the third beam information and the fourth beam information satisfying a fourth preset condition includes at least one of: the difference between the measurement result of the third beam information and the measurement result of the fourth beam information satisfying a fourth preset condition; the difference between the measurement result of the third beam information and the prediction result of the fourth beam information satisfying a fourth preset condition; the difference between the prediction result of the third beam information and the measurement result of the fourth beam information satisfying a fourth preset condition; and the difference between the prediction result of the third beam information and the prediction result of the fourth beam information satisfying a fourth preset condition.
[0359] Beam quality difference event type 22: the average of the difference between the third beam information and the fourth beam information satisfying a fourth preset condition under a fifth preset condition;
[0360] Optionally, the fourth preset condition that the average of the difference between the beam quality information of the third beam information and the beam quality information of the fourth beam information under the fifth preset condition satisfies includes at least one of the following: the average of the difference between the measurement result of the third beam information and the measurement result of the fourth beam information under the fifth preset condition satisfies a fourth preset condition; the average of the difference between the measurement result of the third beam information and the prediction result of the fourth beam information under the fifth preset condition satisfies the fourth preset condition; the average of the difference between the prediction result of the third beam information and the measurement result of the fourth beam information under the fifth preset condition satisfies the fourth preset condition; and the average of the difference between the prediction result of the third beam information and the prediction result of the fourth beam information under the fifth preset condition satisfies the fourth preset condition.
[0361] The beam quality difference event type 23 is that the beam quality information of the third beam information is less than or equal to the sum of the reference beam quality information and the beam quality information of the fourth beam information.
[0362] Optionally, the third beam information being less than or equal to the sum of the reference beam quality information and the beam quality information of the fourth beam information includes at least one of the following: the measurement result of the third beam information is less than or equal to the sum of the reference beam quality information and the measurement result of the fourth beam information; the measurement result of the third beam information is less than or equal to the sum of the reference beam quality information and the prediction result of the fourth beam information; the prediction result of the third beam information is less than or equal to the sum of the reference beam quality information and the measurement result of the fourth beam information; and the prediction result of the third beam information is less than or equal to the sum of the reference beam quality information and the prediction result of the fourth beam information.
[0363] The beam quality difference event type 24 is that the beam quality information of the third beam information is greater than or equal to the sum of the reference beam quality information and the beam quality information of the fourth beam information.
[0364] Optionally, the third beam information being greater than or equal to the sum of the reference beam quality information and the beam quality information of the fourth beam information includes at least one of the following: the measurement result of the third beam information is greater than or equal to the sum of the reference beam quality information and the measurement result of the fourth beam information; the measurement result of the third beam information is greater than or equal to the sum of the reference beam quality information and the prediction result of the fourth beam information; the prediction result of the third beam information is greater than or equal to the sum of the reference beam quality information and the measurement result of the fourth beam information; and the prediction result of the third beam information is greater than or equal to the sum of the reference beam quality information and the prediction result of the fourth beam information.
[0365] The beam quality difference event type 25: a difference between the measurement result of the first beam information and the prediction result of the first beam information satisfies a fourth preset condition;
[0366] The beam quality difference event type 26: an average value of the difference between the measurement result of the first beam information and the prediction result of the first beam information under a fifth preset condition satisfies the fourth preset condition;
[0367] The beam quality difference event type 27: a difference between the measurement result of the second beam information and the prediction result of the second beam information satisfies the fourth preset condition;
[0368] The beam quality difference event type 28: an average value of the difference between the measurement result of the second beam information and the prediction result of the second beam information under a fifth preset condition satisfies the fourth preset condition;
[0369] The beam quality difference event type 29: a difference between the measurement result of the third beam information and the prediction result of the third beam information;
[0370] The beam quality difference event type 30: an average value of the difference between the measurement result of the third beam information and the prediction result of the third beam information under a fifth preset condition satisfies the fourth preset condition;
[0371] The beam quality difference event type 31: a difference between the measurement result of the fourth beam information and the prediction result of the fourth beam information satisfies the fourth preset condition;
[0372] The beam quality difference event type 32: an average value of the difference between the measurement result of the fourth beam information and the prediction result of the fourth beam information under a fifth preset condition satisfies the fourth preset condition;
[0373] The fourth preset condition includes at least one of the following:
[0374] Greater than or equal to a preset threshold;
[0375] Less than or equal to a preset threshold.
[0376] Optionally, the fourth preset conditions corresponding to the beam quality difference event types are the same or different.
[0377] Optionally, the fourth preset conditions corresponding to the beam quality difference event types are determined by at least one of network configuration, protocol agreement and terminal reporting.
[0378] Optionally, the fifth preset condition includes at least one of the following: a preset number of times; a preset number of occurrences; a preset value threshold; and a preset time window.
[0379] Optionally, the beam quality difference event type x is used to represent any one of the beam quality difference event type 1 to the beam quality difference event type 32, and x takes any value from 1 to 32.
[0380] The beam prediction performance monitoring method provided by the embodiments of the present application defines a beam quality difference index and a beam quality difference event, and only when the beam quality difference event meets a first preset condition, information related to the beam quality difference event is reported, which can provide more timely and effective information for the network, avoid frequent reporting of performance monitoring results or corresponding performance indexes, reduce the overhead caused by performance monitoring, and improve the efficiency of performance monitoring.
[0381] Optionally, if the beam prediction performance event is a beam quality difference event, the beam prediction performance event meets a first preset condition, including at least one of the following:
[0382] The number of times that the beam quality difference event type x occurs reaches a third preset number of times;
[0383] The number of times that the beam quality difference event type x occurs consecutively reaches a third preset number of times;
[0384] In a third time window, the number of times that the beam quality difference event type x occurs reaches a third preset number of times;
[0385] In a third time window, the number of times that the beam quality difference event type x occurs consecutively reaches a third preset number of times.
[0386] Optionally, the third preset number of times or the third time window can be determined by at least one of the following: agreement, network configuration, and terminal reporting.
[0387] Optionally, the third preset number of times is the same as or different from the first preset number of times.
[0388] Optionally, the third time window is the same as or different from the first time window.
[0389] Optionally, the third preset number of times is the same as or different from the second preset number of times.
[0390] Optionally, the third time window is the same as or different from the second time window.
[0391] In some embodiments, if the beam quality difference event x meets the first preset condition, the first information reported by the terminal includes at least one of the following:
[0392] The beam quality difference index type x;
[0393] The beam quality difference event type x;
[0394] a number of times that the beam quality difference event x occurs.
[0395] In some embodiments, if the beam quality difference event type x satisfies a first preset condition, and the beam quality difference event type x is associated with one or more beam quality difference event types y or beam quality difference indicator types y, the first information comprises at least one of:
[0396] a beam quality difference indicator type x;
[0397] a beam quality difference event type x;
[0398] a number of times that the beam quality difference event x occurs;
[0399] a beam quality difference indicator type y;
[0400] a beam quality difference event type y;
[0401] a number of times that the beam quality difference event y occurs;
[0402] wherein a value of y is different from a value of x.
[0403] In some embodiments, if the beam quality difference event type x satisfies a first preset condition, and the beam quality difference event type x is associated with multiple beam quality difference event types or beam quality difference indicator types, a beam quality difference event type y or a beam quality difference indicator type y that is activated is determined according to network configuration;
[0404] the first information comprises at least one of:
[0405] a beam quality difference indicator type x;
[0406] a beam quality difference event type x;
[0407] a number of times that the beam quality difference event x occurs;
[0408] an activated beam quality difference indicator type y;
[0409] an activated beam quality difference event type y;
[0410] a number of times that the activated beam quality difference event y occurs;
[0411] wherein a value of y is different from a value of x.
[0412] The beam prediction performance monitoring method provided by the embodiments of the present application can report information related to the beam quality difference value event and information related to a target beam prediction performance event associated with the beam quality difference value event when the beam quality difference value event meets the first preset condition, so that the network can obtain more information to help timely perform beam management and improve communication performance.
[0413] In some embodiments, the method further comprises:
[0414] In a case where the beam quality difference value event type x does not meet the first preset condition, the beam quality difference value event type x is associated with beam quality difference value event types y1 and y2, and the beam quality difference value index type y1 meets the fourth preset condition corresponding to the beam quality difference value index type y1, or the beam quality difference value event type y1 meets the first preset condition, the terminal does not report the beam quality difference value event type y2 or the beam quality difference value index type y2, or the terminal reports second information, and the second information includes at least one of the following:
[0415] The beam quality difference value event type y1;
[0416] The number of times of occurrence of the beam quality difference value event type y1;
[0417] The beam quality difference value index type y1.
[0418] In some embodiments, the method further comprises:
[0419] In a case where the beam quality difference value event type x does not meet the first preset condition, the beam quality difference value event type x is associated with first accuracy rate event type y1 and second accuracy rate event type y2, and the first accuracy rate index type y1 meets the fourth preset condition corresponding to the first accuracy rate index type y1, or the first accuracy rate event type y1 meets the first preset condition, the terminal does not report the second accuracy rate event type y2 or the second accuracy rate index type y2, or the terminal reports second information, and the second information includes at least one of the following:
[0420] The first accuracy rate event type y1;
[0421] The number of times of occurrence of the first accuracy rate event type y1;
[0422] The first accuracy rate index type y1.
[0423] The beam prediction performance monitoring method provided in the embodiments of the present application can report information related to the target beam prediction performance event or the target beam prediction performance index associated with the beam quality difference event in the case that the beam quality difference event does not satisfy the first preset condition but the target beam prediction performance index associated with the beam quality difference event satisfies the corresponding threshold value or the target beam prediction performance event satisfies the first preset condition, so that the network can obtain more information to help timely beam management and improve communication performance.
[0424] Optionally, when the beam quality difference index type x or the beam quality difference event type x satisfies the preset condition within the time window, the terminal triggers reporting of the corresponding beam quality difference index type x or the beam quality difference event type x.
[0425] The time window includes at least one of the following: a reference time node, a time unit length, a time window length, a beam quality difference index type x statistical number, a beam quality difference event type x statistical number, and the like.
[0426] The preset condition includes at least one of the following: the beam quality difference index type x occurs N times, the beam quality difference index type x occurs N times continuously, the beam quality difference event type x occurs N times, and the beam quality difference event type x occurs N times continuously. Wherein N is determined by at least one of protocol agreement, network configuration or terminal reporting.
[0427] In some embodiments, the association method of the beam quality difference event type x with the beam quality difference index type y or the beam quality difference event type y includes at least one of the following:
[0428] Configured in the same EventTriggerConfig;
[0429] Configured in the same eventID;
[0430] The beam quality difference index type y is configured in the beam quality difference index type x;
[0431] The beam quality difference event type y is configured in the beam quality difference index type x;
[0432] The beam quality difference index type y is configured in the beam quality difference event type x;
[0433] The beam quality difference event type y is configured in the beam quality difference event type x;
[0434] The beam quality difference index type x is configured in the beam quality difference event type x;
[0435] The beam quality difference index type y is configured in the beam quality difference event type y;
[0436] configuration association information.
[0437] In some embodiments, the beam quality difference event type corresponds to a beam quality difference indicator type determined by at least one of network configuration, protocol agreement and terminal reporting.
[0438] In some embodiments, the first information includes at least one of:
[0439] the beam prediction performance event;
[0440] the number of occurrences of the beam prediction performance event;
[0441] the beam prediction performance indicator corresponding to the beam prediction performance event.
[0442] It can be understood that the beam prediction performance event is at least one of the first accuracy event type, the second accuracy event type, and the beam quality difference event type.
[0443] In some embodiments, in the case that the beam prediction performance event is associated with one or more target beam prediction performance events or target beam prediction performance indicators, the first information includes:
[0444] the beam prediction performance event;
[0445] the number of occurrences of the beam prediction performance event;
[0446] the beam prediction performance indicator corresponding to the beam prediction performance event
[0447] the target beam prediction performance event;
[0448] the number of occurrences of the target beam prediction performance event;
[0449] the target beam prediction performance indicator;
[0450] wherein the type of the target beam prediction performance event is different from the type of the beam prediction performance event, and the target beam prediction performance indicator is a beam prediction performance indicator corresponding to the target beam prediction performance event.
[0451] It can be understood that the beam prediction performance event is any one of the first accuracy event type, the second accuracy event type, and the beam quality difference event type, and the type of the target beam prediction performance event is different from the type of the beam prediction performance event.
[0452] For example, if the beam prediction performance event is a first accuracy event type x, one target beam prediction performance event can be a first accuracy event type y, y has a value different from that of x, the target beam prediction performance event can also be any second accuracy event type in the foregoing embodiments, and the target beam prediction performance event can also be any beam quality difference event type in the foregoing embodiments.
[0453] Optionally, the multiple target beam prediction performance events can also be at least two event types from the first accuracy event type in the foregoing embodiments, the second accuracy event type in the foregoing embodiments, and the beam quality difference event type in the foregoing embodiments.
[0454] For example, if the beam prediction performance event is a second accuracy event type x, the multiple target beam prediction performance events can include: a second accuracy event type y, y has a value different from that of x, at least two event types from the first accuracy event type in the foregoing embodiments, and the beam quality difference event type in the foregoing embodiments.
[0455] For example, the beam quality difference event type x is associated with a beam quality difference indicator type y1 and a second accuracy indicator type y2, when the beam quality difference event type x satisfies a first preset condition, the terminal triggers to report at least one of the following:
[0456] The beam quality difference indicator type y1;
[0457] The beam quality difference event type x;
[0458] The number of times the beam quality difference event type x occurs;
[0459] The second accuracy indicator type y2.
[0460] For example, the beam quality difference event type x is associated with a beam quality difference indicator type y1 and a second accuracy event type y2, wherein the second accuracy event type y2 is associated with a second accuracy indicator type y3, when the beam quality difference event type x satisfies a first preset condition, the terminal triggers to report at least one of the following:
[0461] The beam quality difference indicator type y1;
[0462] The beam quality difference event type x;
[0463] The number of times the beam quality difference event type x occurs;
[0464] The second accuracy event type y2;
[0465] The number of times the second accuracy event type y2 occurs;
[0466] a second accuracy rate indicator type y3.
[0467] The beam prediction performance monitoring method provided by the embodiments of the present application provides a multi-level event reporting method, provides more and more timely effective information for the network, and improves the efficiency of performance monitoring.
[0468] In some embodiments, a plurality of target beam prediction performance events or target beam prediction performance indicators are associated with the beam prediction performance event, and in the case that the activated target beam prediction performance event or target beam prediction performance indicator in the plurality of target beam prediction performance events is determined according to network configuration,
[0469] The first information includes at least one of:
[0470] The beam prediction performance event;
[0471] The number of times of occurrence of the beam prediction performance event;
[0472] The beam prediction performance indicator corresponding to the beam prediction performance event;
[0473] The activated target beam prediction performance event;
[0474] The number of times of occurrence of the activated target beam prediction performance event;
[0475] The activated target beam prediction performance indicator;
[0476] The type of the target beam prediction performance event is different from the type of the beam prediction performance event, and the target beam prediction performance indicator is a beam prediction performance indicator corresponding to the target beam prediction performance event.
[0477] Optionally, the terminal determines the activated target beam prediction performance event or target beam prediction performance indicator in the plurality of target beam prediction performance events according to the MAC CE or the DCI.
[0478] In some embodiments, the method further includes:
[0479] In the case that the beam prediction performance event does not satisfy the first preset condition, and the target beam prediction performance indicator associated with the beam prediction performance event satisfies the preset condition corresponding to the target beam prediction performance indicator, or the target beam prediction performance event associated with the beam prediction performance event satisfies the first preset condition, the terminal reports second information, and the second information includes at least one of:
[0480] The target beam prediction performance event;
[0481] The number of times of occurrence of the target beam prediction performance event;
[0482] the target beam prediction performance indicator;
[0483] The target beam prediction performance indicator is a beam prediction performance indicator corresponding to a target beam prediction performance event, and the type of the target beam prediction performance event is different from the type of the beam prediction performance event.
[0484] Optionally, the terminal reports a target beam prediction performance event satisfying a first preset condition or a target beam prediction performance indicator satisfying a corresponding condition.
[0485] For example, the beam quality difference event type x is associated with the beam quality difference indicator type y1 and the second accuracy event type y2, the second accuracy event type y2 is associated with the second accuracy indicator type y3, the beam quality difference event type x does not satisfy the first preset condition, but the second accuracy event type y2 satisfies the first preset condition, or the second accuracy indicator type y3 satisfies the preset condition corresponding to the second accuracy indicator type y3, and the terminal triggers to report at least one of the following:
[0486] the second accuracy event type y2;
[0487] the number of times of occurrence of the second accuracy event type y2;
[0488] the second accuracy indicator type y3.
[0489] For example, the beam quality difference event type x is associated with the first accuracy event type y1 and the second accuracy event type y2, the second accuracy event type y2 is associated with the second accuracy indicator type y3, if the second accuracy event type y2 satisfies the first preset condition, or the second accuracy indicator type y3 satisfies the preset condition corresponding to the second accuracy indicator type y3, and the terminal triggers to report at least one of the following:
[0490] the second accuracy event type y2;
[0491] the number of times of occurrence of the second accuracy event type y2;
[0492] the second accuracy indicator type y3.
[0493] In some embodiments, the beam prediction performance event and the target beam prediction performance event or target beam prediction performance indicator are associated by at least one of the following manners:
[0494] configured in the same EventTriggerConfig;
[0495] configured in the same eventID;
[0496] The target beam prediction performance indicator is configured in the beam prediction performance indicator corresponding to the target beam prediction performance event.
[0497] The target beam prediction performance event is configured in the beam prediction performance indicator corresponding to the target beam prediction performance event.
[0498] The target beam prediction performance indicator is configured in the beam prediction performance event.
[0499] The target beam prediction performance event is configured in the beam prediction performance event.
[0500] The beam prediction performance indicator corresponding to the beam prediction performance event is configured in the beam prediction performance event.
[0501] The target beam prediction performance indicator is configured in the target beam prediction performance event.
[0502] Configuration association information is configured.
[0503] In some embodiments, the beam prediction performance indicator corresponding to the beam prediction performance event is determined by at least one of network configuration, protocol agreement, and terminal reporting.
[0504] In the above embodiments, the preset conditions corresponding to each indicator type and the preset conditions corresponding to each event type can be configured separately or at least partially shared, and the embodiments of the present application do not limit this.
[0505] The preset conditions corresponding to each indicator type and the preset conditions corresponding to each event type can be determined by at least one of protocol agreement, network configuration, or UE reporting. For example, the UE reports the threshold values corresponding to different events, and the network configures the corresponding threshold values according to the UE reporting.
[0506] Optionally, the terminal reports the capability of supporting at least one of the first accuracy indicator type, the second accuracy indicator type, and the beam quality difference indicator type.
[0507] The beam prediction performance monitoring method provided by the embodiments of the present application defines the definition of various beam prediction performance monitoring events in beam prediction, and provides a reporting method of multiple levels of events, which can reduce the overhead of performance monitoring, provide more timely and effective information for the network, and improve the efficiency of performance monitoring.
[0508] The beam prediction performance monitoring method provided by the embodiments of the present application can be executed by a beam prediction performance monitoring device. In the embodiments of the present application, the beam prediction performance monitoring device is taken as an example to illustrate the beam prediction performance monitoring device provided by the embodiments of the present application.
[0509] The embodiment of the present application provides a beam prediction performance monitoring device. As an example, the beam prediction performance monitoring device can be a communication device or a component in the communication device, such as a chip. The communication device can be a terminal or the like. For example, the terminal can include, but is not limited to, the types of the terminal 11 listed above, and the embodiment of the present application is not limited specifically.
[0510] The beam prediction performance monitoring device includes a receiving module, a sending module and a processing module. The receiving module, the sending module and the processing module can be implemented by software or by hardware. When implemented by hardware, the processing module can be implemented by a processor. For example, the processor can include a general-purpose processor, a special-purpose processor, a central processing unit (CPU), a microprocessor, a digital signal processor (DSP), an artificial intelligent (AI) processor, a graphics processing unit (GPU), an application specific integrated circuit (ASIC), a network processor (NP), a field programmable gate array (FPGA) or other programmable logic devices, a gate circuit, a transistor, a discrete hardware component, etc. The receiving module and the sending module can be implemented by a communication interface, which can include a transceiver, a pin, a circuit, a bus, a radio frequency unit or the like.
[0511] Specifically, FIG. 5 is a structural schematic diagram of the beam prediction performance monitoring device provided by the embodiment of the present application. Referring to FIG. 5, when the beam prediction performance monitoring device is a terminal or a component in the terminal, the beam prediction performance monitoring device 500 includes a sending module 501 configured to report first information when a beam prediction performance event meets a first preset condition, wherein the first information is information related to the beam prediction performance event.
[0512] The beam prediction performance event includes at least one of the following:
[0513] The first accuracy event occurs when a first accuracy index meets a second preset condition, and the first accuracy index is used to indicate a beam prediction accuracy counted in a preset time window, a preset number or a preset period.
[0514] a second accuracy event, the second accuracy event occurring when a second accuracy indicator meets a third preset condition, the second accuracy indicator being used to indicate a consistency or a consistency of order or a matching degree between the measured beam information and the predicted beam information;
[0515] a beam quality difference event, the beam quality difference event occurring when a beam quality difference indicator meets a fourth preset condition, the beam quality difference indicator including a difference between beam quality information of different beam information or a difference between different beam quality information of the same beam information;
[0516] The first preset condition that the beam prediction performance event meets includes at least one of the following:
[0517] The number of times that the beam prediction performance event occurs reaches a preset number of times;
[0518] The number of times that the beam prediction performance event occurs continuously reaches a preset number of times;
[0519] The number of times that the beam prediction performance event occurs reaches a preset number of times within a preset time window;
[0520] The number of times that the beam prediction performance event occurs continuously reaches a preset number of times within a preset time window.
[0521] Optionally, the first accuracy indicator includes at least one of the following types:
[0522] The first accuracy indicator type 1: 1 / 1 beam accuracy, the 1 / 1 beam accuracy being used to indicate a probability that one selected beam information in the predicted beam information and one selected beam information in the beam information obtained by measurement are consistent or inconsistent within a preset time window or a preset number or a preset period;
[0523] The first accuracy indicator type 2: 1 / k beam accuracy, the 1 / k beam accuracy being used to indicate a probability that one selected beam information in the predicted beam information belongs to or does not belong to k selected beam information in the beam information obtained by measurement within a preset time window or a preset number or a preset period;
[0524] The first accuracy indicator type 3: k / 1 beam accuracy, the k / 1 beam accuracy being used to indicate a probability that k selected beam information in the predicted beam information contains or does not contain one selected beam information in the beam information obtained by measurement within a preset time window or a preset number or a preset period;
[0525] The first accuracy indicator type 4 is a 1 / 1 beam accuracy with 1 dB margin, which is used to indicate a probability that a difference between beam quality information corresponding to one selected beam information in predicted beam information and beam quality information corresponding to one selected beam information in measured beam information is less than or greater than or equal to 1 dB within a preset time window or a preset number or a preset period.
[0526] The first accuracy indicator type 5 is a 1 / k beam accuracy with 1 dB margin, which is used to indicate a probability that a minimum value of a difference between beam quality information corresponding to one selected beam information in predicted beam information and beam quality information corresponding to k selected beam information in measured beam information is less than or greater than or equal to 1 dB within a preset time window or a preset number or a preset period.
[0527] The first accuracy indicator type 6 is a k / 1 beam accuracy with 1 dB margin, which is used to indicate a probability that a minimum value of a difference between beam quality information corresponding to k selected beam information in predicted beam information and beam quality information corresponding to one selected beam information in measured beam information is less than or greater than or equal to 1 dB within a preset time window or a preset number or a preset period.
[0528] wherein k is a positive integer greater than 1.
[0529] Optionally, the first accuracy indicator satisfies a second preset condition, including at least one of the following:
[0530] The first accuracy indicator type x is less than or equal to a threshold value corresponding to the first accuracy indicator type x.
[0531] The first accuracy indicator type x is greater than or equal to a threshold value corresponding to the first accuracy indicator type x.
[0532] The value of x is any value in 1 to 6.
[0533] The first accuracy event includes at least one of the following types:
[0534] The first accuracy event type 1 is that the 1 / 1 beam accuracy satisfies a second preset condition.
[0535] The first accuracy event type 2 is that the 1 / k beam accuracy satisfies a second preset condition.
[0536] The first accuracy event type 3 is that the k / 1 beam accuracy satisfies a second preset condition.
[0537] The first accuracy event type 4: the 1 / 1 beam accuracy with 1dB margin meets a second preset condition;
[0538] The first accuracy event type 5: the 1 / k beam accuracy with 1dB margin meets a second preset condition;
[0539] The first accuracy event type 6: the k / 1 beam accuracy with 1dB margin meets a second preset condition.
[0540] Optionally, the second preset conditions corresponding to the first accuracy event types are the same or different, and / or the second preset conditions corresponding to the first accuracy event types are determined by at least one of network configuration, protocol agreement and terminal reporting.
[0541] Optionally, the second accuracy index includes at least one of the following types:
[0542] The second accuracy index type 1: used for indicating whether k2 selected beam information in the measured beam information and k1 selected beam information in the predicted beam information are consistent or inconsistent;
[0543] The second accuracy index type 2: used for indicating whether the order of k2 selected beam information in the measured beam information and the order of k1 selected beam information in the predicted beam information are consistent or inconsistent;
[0544] The second accuracy index type 3: used for indicating the matching degree of the order of k2 selected beam information in the measured beam information and the order of k1 selected beam information in the predicted beam information;
[0545] The second accuracy index type 4: used for indicating whether the order of k1 selected beam information in the predicted beam information and the order of k1 selected beam information in the predicted beam information corresponding to the measured beam information are consistent or inconsistent;
[0546] The second accuracy index type 5: used for indicating the matching degree of the order of k1 selected beam information in the predicted beam information and the order of k1 selected beam information in the predicted beam information corresponding to the measured beam information;
[0547] The measured beam information corresponding to the k1 selected beam information in the predicted beam information is obtained by the terminal receiving a measurement resource list transmitted using the k1 selected beam information in the predicted beam information;
[0548] k1 and k2 are different, and k1 and k2 are positive integers greater than 1.
[0549] Optionally, the second accuracy event comprises at least one of the following types:
[0550] The second accuracy event type 1: the number of times that the k2 selected beam information in the measured beam information and the k1 selected beam information in the predicted beam information are consistent or inconsistent satisfies a third preset condition;
[0551] The second accuracy event type 2: the number of times that the order of the k2 selected beam information in the measured beam information and the order of the k1 selected beam information in the predicted beam information are consistent or inconsistent satisfies a third preset condition;
[0552] The second accuracy event type 3: the matching degree of the order of the k2 selected beam information in the measured beam information and the order of the k1 selected beam information in the predicted beam information satisfies a third preset condition;
[0553] The second accuracy event type 4: the number of times that the order of the k1 selected beam information in the predicted beam information and the order of the k1 selected beam information in the predicted beam information corresponding to the measured beam information are consistent or inconsistent satisfies a third preset condition;
[0554] The second accuracy event type 5: the matching degree of the order of the k1 selected beam information in the predicted beam information and the order of the k1 selected beam information in the predicted beam information corresponding to the measured beam information satisfies a third preset condition;
[0555] The third preset condition comprises at least one of the following:
[0556] Greater than or equal to a preset number threshold;
[0557] Less than or equal to a preset number threshold;
[0558] Greater than or equal to a preset matching degree threshold;
[0559] Less than or equal to a preset matching degree threshold.
[0560] Optionally, the third preset conditions corresponding to each second accuracy event type are the same or different, and / or the third preset conditions corresponding to each second accuracy event type are determined by at least one of network configuration, protocol agreement and terminal reporting.
[0561] Optionally, the beam information comprises at least one of the following types:
[0562] The first beam information, the first beam information is determined by first indication information, and the first indication information is determined by at least one of network configuration and protocol agreement;
[0563] The second beam information is the k1 selected beams from the predicted beam information;
[0564] The third beam information is beam information obtained by measuring a portion of the beam information in the first list, and the first list includes beam information used by the AI unit to determine the prediction result during the beam prediction inference process.
[0565] The fourth beam information is the measured beam information corresponding to k1 selected beam information in the predicted beam information; where k1 is a positive integer greater than or equal to 1.
[0566] Optionally, the first indication information is as agreed upon in the agreement, including at least one of the following:
[0567] At least one transmission configuration activated by downlink control information (DCI) indicates the beam information contained in or associated with the TCI status.
[0568] Downlink beam information contained in or associated with at least one TCI state activated by DCI;
[0569] The beam information contained in or associated with a TCI state activated by the Medium Access Control Layer (MAC) CE control element.
[0570] Beam information contained in or associated with at least one TCI state activated by MAC CE;
[0571] Downlink beam information contained in or associated with at least one TCI state activated by MAC CE;
[0572] The beam information with the worst beam quality information in the activated TCI state;
[0573] The beam information with the best beam quality information in the activated TCI state.
[0574] Optionally, the beam quality information includes at least one of the following: measurement results of beam information, and prediction results of beam information.
[0575] Optionally, the beam quality difference index includes at least one of the following types:
[0576] Beam quality difference index type 1: The difference between the beam quality information of the first beam information and the beam quality information of the second beam information;
[0577] Beam quality difference index type 2: The average difference between the beam quality information of the first beam information and the beam quality information of the second beam information under the fifth preset condition;
[0578] Beam quality difference index type 3: a difference between the beam quality information of the first beam information and the beam quality information of the third beam information;
[0579] Beam quality difference index type 4: a mean value of the difference between the beam quality information of the first beam information and the beam quality information of the third beam information under the fifth preset condition;
[0580] Beam quality difference index type 5: a difference between the beam quality information of the first beam information and the beam quality information of the fourth beam information;
[0581] Beam quality difference index type 6: a mean value of the difference between the beam quality information of the first beam information and the beam quality information of the fourth beam information under the fifth preset condition;
[0582] Beam quality difference index type 7: a difference between the beam quality information of the second beam information and the beam quality information of the third beam information;
[0583] Beam quality difference index type 8: a mean value of the difference between the beam quality information of the second beam information and the beam quality information of the third beam information under the fifth preset condition;
[0584] Beam quality difference index type 9: a difference between the beam quality information of the second beam information and the beam quality information of the fourth beam information;
[0585] Beam quality difference index type 10: a mean value of the difference between the beam quality information of the second beam information and the beam quality information of the fourth beam information under the fifth preset condition;
[0586] Beam quality difference index type 11: a difference between the beam quality information of the third beam information and the beam quality information of the fourth beam information;
[0587] Beam quality difference index type 12: a mean value of the difference between the beam quality information of the third beam information and the beam quality information of the fourth beam information under the fifth preset condition;
[0588] Beam quality difference index type 13: a difference between the measurement result of the first beam information and the prediction result of the first beam information;
[0589] Beam quality difference index type 14: a mean value of the difference between the measurement result of the first beam information and the prediction result of the first beam information under the fifth preset condition;
[0590] Beam quality difference index type 15: a difference between the measurement result of the second beam information and the prediction result of the second beam information;
[0591] The beam quality difference index type 16 is a mean value of a difference between a measurement result of the second beam information and a prediction result of the second beam information under the fifth preset condition;
[0592] The beam quality difference index type 17 is a difference between a measurement result of the third beam information and a prediction result of the third beam information;
[0593] The beam quality difference index type 18 is a mean value of a difference between a measurement result of the third beam information and a prediction result of the third beam information under the fifth preset condition;
[0594] The beam quality difference index type 19 is a difference between a measurement result of the fourth beam information and a prediction result of the fourth beam information;
[0595] The beam quality difference index type 20 is a mean value of a difference between a measurement result of the fourth beam information and a prediction result of the fourth beam information under the fifth preset condition;
[0596] The fifth preset condition includes at least one of a preset number of times, a preset number of occurrences, a preset value threshold, and a preset time window.
[0597] Optionally, in a case where the beam information in the beam quality difference index type corresponds to multiple beam information, the beam quality information of the beam information is a maximum value or a minimum value in the beam quality information of the multiple beam information.
[0598] Optionally, the fifth preset conditions corresponding to the beam quality difference index types are the same or different, and / or the fifth preset conditions corresponding to the beam quality difference index types are determined by at least one of network configuration, protocol agreement, and terminal reporting.
[0599] Optionally, the beam quality difference event includes at least one of the following types:
[0600] The beam quality difference event type 1 is that a difference between the beam quality information of the first beam information and the beam quality information of the second beam information satisfies a fourth preset condition;
[0601] The beam quality difference event type 2 is that a mean value of a difference between the beam quality information of the first beam information and the beam quality information of the second beam information under the fifth preset condition satisfies the fourth preset condition;
[0602] The beam quality difference event type 3 is that the beam quality information of the first beam information is less than or equal to a sum of reference beam quality information and the beam quality information of the second beam information;
[0603] Beam quality difference event type 4: the beam quality information of the first beam information is greater than or equal to the sum of the reference beam quality information and the beam quality information of the second beam information;
[0604] Beam quality difference event type 5: the difference between the beam quality information of the first beam information and the beam quality information of the third beam information satisfies the fourth preset condition;
[0605] Beam quality difference event type 6: the average of the difference between the beam quality information of the first beam information and the beam quality information of the third beam information under the fifth preset condition satisfies the fourth preset condition;
[0606] Beam quality difference event type 7: the beam quality information of the first beam information is less than or equal to the sum of the reference beam quality information and the beam quality information of the third beam information;
[0607] Beam quality difference event type 8: the beam quality information of the first beam information is greater than or equal to the sum of the reference beam quality information and the beam quality information of the third beam information;
[0608] Beam quality difference event type 9: the difference between the beam quality information of the first beam information and the beam quality information of the fourth beam information satisfies the fourth preset condition;
[0609] Beam quality difference event type 10: the average of the difference between the beam quality information of the first beam information and the beam quality information of the fourth beam information under the fifth preset condition satisfies the fourth preset condition;
[0610] Beam quality difference event type 11: the beam quality information of the first beam information is less than or equal to the sum of the reference beam quality information and the beam quality information of the fourth beam information;
[0611] Beam quality difference event type 12: the beam quality information of the first beam information is greater than or equal to the sum of the reference beam quality information and the beam quality information of the fourth beam information;
[0612] Beam quality difference event type 13: the difference between the beam quality information of the second beam information and the beam quality information of the third beam information satisfies the fourth preset condition;
[0613] Beam quality difference event type 14: the average of the difference between the beam quality information of the second beam information and the beam quality information of the third beam information under the fifth preset condition satisfies the fourth preset condition;
[0614] Beam quality difference event type 15: the beam quality information of the second beam information is less than or equal to the sum of the reference beam quality information and the beam quality information of the third beam information;
[0615] Beam quality difference event type 16: the beam quality information of the second beam information is greater than or equal to the sum of the reference beam quality information and the beam quality information of the third beam information;
[0616] Beam quality difference event type 17: the difference between the beam quality information of the second beam information and the beam quality information of the fourth beam information satisfies a fourth preset condition;
[0617] Beam quality difference event type 18: the average of the difference between the beam quality information of the second beam information and the beam quality information of the fourth beam information under a fifth preset condition satisfies a fourth preset condition;
[0618] Beam quality difference event type 19: the beam quality information of the second beam information is less than or equal to the sum of the reference beam quality information and the beam quality information of the fourth beam information;
[0619] Beam quality difference event type 20: the beam quality information of the second beam information is greater than or equal to the sum of the reference beam quality information and the beam quality information of the fourth beam information;
[0620] Beam quality difference event type 21: the difference between the beam quality information of the third beam information and the beam quality information of the fourth beam information satisfies a fourth preset condition;
[0621] Beam quality difference event type 22: the average of the difference between the beam quality information of the third beam information and the beam quality information of the fourth beam information under a fifth preset condition satisfies a fourth preset condition;
[0622] Beam quality difference event type 23: the beam quality information of the third beam information is less than or equal to the sum of the reference beam quality information and the beam quality information of the fourth beam information;
[0623] Beam quality difference event type 24: the beam quality information of the third beam information is greater than or equal to the sum of the reference beam quality information and the beam quality information of the fourth beam information;
[0624] Beam quality difference event type 25: the difference between the measurement result of the first beam information and the prediction result of the first beam information satisfies a fourth preset condition;
[0625] Beam quality difference event type 26: the average of the difference between the measurement result of the first beam information and the prediction result of the first beam information under a fifth preset condition satisfies a fourth preset condition;
[0626] a beam quality difference event type 27: a difference between the measurement result of the second beam information and the prediction result of the second beam information satisfies a fourth preset condition;
[0627] a beam quality difference event type 28: an average of the difference between the measurement result of the second beam information and the prediction result of the second beam information under a fifth preset condition satisfies the fourth preset condition;
[0628] a beam quality difference event type 29: a difference between the measurement result of the third beam information and the prediction result of the third beam information;
[0629] a beam quality difference event type 30: an average of the difference between the measurement result of the third beam information and the prediction result of the third beam information under a fifth preset condition satisfies the fourth preset condition;
[0630] a beam quality difference event type 31: a difference between the measurement result of the fourth beam information and the prediction result of the fourth beam information satisfies a fourth preset condition;
[0631] a beam quality difference event type 32: an average of the difference between the measurement result of the fourth beam information and the prediction result of the fourth beam information under a fifth preset condition satisfies the fourth preset condition;
[0632] the fourth preset condition comprises at least one of:
[0633] greater than or equal to a preset threshold;
[0634] less than or equal to a preset threshold.
[0635] Optionally, the fourth preset conditions corresponding to the beam quality difference event types are the same or different, and / or the fourth preset conditions corresponding to the beam quality difference event types are determined by at least one of network configuration, protocol agreement and terminal reporting.
[0636] Optionally, the first information comprises at least one of:
[0637] the beam prediction performance event;
[0638] a number of occurrences of the beam prediction performance event;
[0639] a beam prediction performance index corresponding to the beam prediction performance event.
[0640] Optionally, in a case where the beam prediction performance event is associated with one or more target beam prediction performance events or target beam prediction performance indexes, the first information comprises at least one of:
[0641] the beam prediction performance event;
[0642] a number of times the beam prediction performance event occurs;
[0643] a beam prediction performance indicator corresponding to the beam prediction performance event;
[0644] the target beam prediction performance event;
[0645] a number of times the target beam prediction performance event occurs;
[0646] the target beam prediction performance indicator;
[0647] wherein the type of the target beam prediction performance event is different from the type of the beam prediction performance event, and the target beam prediction performance indicator is a beam prediction performance indicator corresponding to the target beam prediction performance event.
[0648] Optionally, in a case where the beam prediction performance event is associated with a plurality of target beam prediction performance events or target beam prediction performance indicators, and the activated target beam prediction performance event or the activated target beam prediction performance indicator is determined according to network configuration,
[0649] the first information comprises at least one of:
[0650] the beam prediction performance event;
[0651] a number of times the beam prediction performance event occurs;
[0652] a beam prediction performance indicator corresponding to the beam prediction performance event;
[0653] the activated target beam prediction performance event;
[0654] a number of times the activated target beam prediction performance event occurs;
[0655] the activated target beam prediction performance indicator;
[0656] wherein the type of the target beam prediction performance event is different from the type of the beam prediction performance event, and the target beam prediction performance indicator is a beam prediction performance indicator corresponding to the target beam prediction performance event.
[0657] Optionally, the sending module is further configured to:
[0658] In a case where the beam prediction performance event does not satisfy the first preset condition, and a target beam prediction performance event associated with the beam prediction performance event satisfies a preset condition corresponding to a target beam prediction performance index of the target beam prediction performance event, or the target beam prediction performance event associated with the beam prediction performance event satisfies the first preset condition, the terminal reports second information, and the second information includes at least one of the following:
[0659] The target beam prediction performance event;
[0660] The number of times of occurrence of the target beam prediction performance event;
[0661] The target beam prediction performance index;
[0662] The target beam prediction performance index is a beam prediction performance index corresponding to the target beam prediction performance event, and the type of the target beam prediction performance event is different from the type of the beam prediction performance event.
[0663] Optionally, the beam prediction performance event is associated with the target beam prediction performance event or the target beam prediction performance index in at least one of the following manners:
[0664] Configured in the same EventTriggerConfig;
[0665] Configured in the same eventID;
[0666] The target beam prediction performance index is configured in a beam prediction performance index corresponding to the beam prediction performance event;
[0667] The target beam prediction performance event is configured in a beam prediction performance index corresponding to the beam prediction performance event;
[0668] The target beam prediction performance index is configured in the beam prediction performance event;
[0669] The target beam prediction performance event is configured in the beam prediction performance event;
[0670] A beam prediction performance index corresponding to the beam prediction performance event is configured in the beam prediction performance event;
[0671] The target beam prediction performance index is configured in the target beam prediction performance event;
[0672] Association information is configured.
[0673] Optionally, a beam prediction performance index corresponding to the beam prediction performance event is determined by at least one of network configuration, protocol agreement, and terminal reporting.
[0674] Optionally, the beam information comprises at least one of the following: beam ID information, beam angle information, beam gain information, beam width information, expectation information, and beam quality information.
[0675] The beam prediction performance monitoring apparatus provided in the embodiments of the present application defines the definition of various beam prediction performance monitoring events in beam prediction, and provides a multi-level event reporting method, which can reduce the performance monitoring overhead, provide more timely and effective information for the network, and improve the efficiency of performance monitoring.
[0676] The beam prediction performance monitoring apparatus provided in the embodiments of the present application can implement each process of the method embodiment of FIG. 4 and achieve the same technical effects. To avoid repetition, details are not described herein.
[0677] As shown in FIG. 6, the embodiments of the present application further provide a communication device 600, which includes a processor 601 and a memory 602, and the memory 602 stores programs or instructions executable on the processor 601. For example, when the communication device 600 is a terminal, the programs or instructions are executed by the processor 601 to implement each step of the above-described beam prediction performance monitoring method embodiments and achieve the same technical effects. When the communication device 600 is a network side device, the programs or instructions are executed by the processor 601 to implement each step of the above-described beam prediction performance monitoring method embodiments and achieve the same technical effects. To avoid repetition, details are not described herein.
[0678] The embodiments of the present application further provide a terminal, which includes a processor and a communication interface, the communication interface is coupled to the processor, and the processor is configured to run programs or instructions to implement the steps in the method embodiment shown in FIG. 4. The terminal embodiment corresponds to the above-described terminal side method embodiment, and each implementation process and implementation manner of the above-described method embodiment can be applied to the terminal embodiment and achieve the same technical effects. The terminal can be the beam prediction performance monitoring apparatus shown in FIG. 5. Specifically, FIG. 7 is a hardware structure schematic diagram of a terminal implementing the embodiments of the present application.
[0679] The terminal 700 includes, but is not limited to, at least part of the following components: a radio frequency unit 701, a network module 702, an audio output unit 703, an input unit 704, a sensor 705, a display unit 706, a user input unit 707, an interface unit 708, a memory 709, and a processor 710, etc.
[0680] Those skilled in the art can understand that the terminal 700 can further include a power supply (such as a battery) for supplying power to each component, and the power supply can be logically connected to the processor 710 through a power management system, so that the power management system can realize the functions of managing charging, discharging and power consumption management. The terminal structure shown in FIG. 7 does not constitute a limitation on the terminal, and the terminal can include more or fewer components than those shown, or combine certain components, or different component arrangements, which are not described here.
[0681] It should be understood that in the embodiments of the present application, the input unit 704 can include a graphics processor 7041 and a microphone 7042, and the graphics processor 7041 processes image data of a still picture or a video obtained by an image capture device (such as a camera) in a video capture mode or an image capture mode. The display unit 706 can include a display panel 7061, which can be configured in the form of a liquid crystal display, an organic light-emitting diode, etc. The user input unit 707 includes at least one of a touch panel 7071 and other input devices 7072. The touch panel 7071 is also called a touch screen. The touch panel 7071 can include two parts of a touch detection device and a touch controller. The other input devices 7072 can include, but are not limited to, a physical keyboard, function keys (such as volume control keys, on-off keys, etc.), trackballs, mice, joysticks, which are not described here.
[0682] In the embodiments of the present application, after the radio frequency unit 701 receives the downlink data from the network side device, it can be transmitted to the processor 710 for processing. In addition, the radio frequency unit 701 can send uplink data to the network side device. Generally, the radio frequency unit 701 includes, but is not limited to, an antenna, an amplifier, a transceiver, a coupler, a low noise amplifier, a duplexer, etc.
[0683] The memory 709 can be used to store software programs or instructions and various data. The memory 709 can mainly include a first storage area storing programs or instructions and a second storage area storing data, wherein the first storage area can store an operating system, application programs or instructions required by at least one function (such as a sound playing function, an image playing function, etc.), and the like. In addition, the memory 709 can include a volatile memory or a non-volatile memory. The non-volatile memory can be a Read-Only Memory (ROM), a Programmable ROM (PROM), an Erasable PROM (EPROM), an Electrically EPROM (EEPROM), or a flash memory. The volatile memory can be a Random Access Memory (RAM), a Static RAM (SRAM), a Dynamic RAM (DRAM), a Synchronous DRAM (SDRAM), a Double Data Rate SDRAM (DDR SDRAM), an Enhanced SDRAM (ESDRAM), a Synch link DRAM (SLDRAM), and a Direct Rambus RAM (DRRAM). The memory 709 in the embodiments of the present application includes but is not limited to these and any other suitable types of memory.
[0684] The processor 710 can include one or more processing units; optionally, the processor 710 integrates an application processor and a modem processor, wherein the application processor mainly processes operations related to an operating system, a user interface, and an application program, and the modem processor mainly processes wireless communication signals, such as a baseband processor. It can be understood that the above-mentioned modem processor can also not be integrated into the processor 710.
[0685] The radio frequency unit 701 is configured to report first information in a case where a beam prediction performance event meets a first preset condition, wherein the first information is information related to the beam prediction performance event.
[0686] The beam prediction performance event includes at least one of the following:
[0687] a first accuracy event, the first accuracy event occurring when a first accuracy indicator meets a second preset condition, the first accuracy indicator being used to indicate a beam prediction accuracy counted within a preset time window or a preset number or a preset period;
[0688] a second accuracy event, the second accuracy event occurring when a second accuracy indicator meets a third preset condition, the second accuracy indicator being used to indicate a consistency or an order consistency or a matching degree between measured beam information and predicted beam information;
[0689] a beam quality difference event, the beam quality difference event occurring when a beam quality difference indicator meets a fourth preset condition, the beam quality difference indicator including a difference between beam quality information of different beam information or a difference between different beam quality information of same beam information;
[0690] the first preset condition includes at least one of the following:
[0691] a number of times of occurrence of the beam prediction performance event reaches a preset number of times;
[0692] a number of consecutive times of occurrence of the beam prediction performance event reaches a preset number of times;
[0693] a number of times of occurrence of the beam prediction performance event reaches a preset number of times within a preset time window;
[0694] a number of consecutive times of occurrence of the beam prediction performance event reaches a preset number of times within a preset time window.
[0695] Optionally, the first accuracy indicator includes at least one of the following types:
[0696] a first accuracy indicator type 1: 1 / 1 beam accuracy, the 1 / 1 beam accuracy being used to indicate a probability of consistency or inconsistency between 1 selected beam information in predicted beam information counted within a preset time window or a preset number or a preset period and 1 selected beam information obtained through measurement;
[0697] a first accuracy indicator type 2: 1 / k beam accuracy, the 1 / k beam accuracy being used to indicate a probability of belonging or not belonging of 1 selected beam information in predicted beam information counted within a preset time window or a preset number or a preset period to k selected beam information obtained through measurement;
[0698] A first accuracy indicator type 3: a k / 1 beam accuracy, used to indicate a probability that k selected beam information in predicted beam information counted within a preset time window or a preset number or a preset period contains or does not contain 1 selected beam information in beam information obtained by measurement;
[0699] A first accuracy indicator type 4: a 1 / 1 beam accuracy with 1 dB margin, used to indicate a probability that a difference between beam quality information corresponding to 1 selected beam information in predicted beam information counted within a preset time window or a preset number or a preset period and beam quality information corresponding to 1 selected beam information in beam information obtained by measurement is less than or greater than or equal to 1 dB;
[0700] A first accuracy indicator type 5: a 1 / k beam accuracy with 1 dB margin, used to indicate a probability that a minimum value of a difference between beam quality information corresponding to 1 selected beam information in predicted beam information counted within a preset time window or a preset number or a preset period and beam quality information corresponding to k selected beam information in beam information obtained by measurement is less than or greater than or equal to 1 dB;
[0701] A first accuracy indicator type 6: a k / 1 beam accuracy with 1 dB margin, used to indicate a probability that a minimum value of a difference between beam quality information corresponding to k selected beam information in predicted beam information counted within a preset time window or a preset number or a preset period and beam quality information corresponding to 1 selected beam information in beam information obtained by measurement is less than or greater than or equal to 1 dB;
[0702] Wherein, k is a positive integer greater than 1.
[0703] Optionally, the first accuracy indicator satisfies a second preset condition, including at least one of:
[0704] The first accuracy indicator type x is less than or equal to a threshold value corresponding to the first accuracy indicator type x;
[0705] The first accuracy indicator type x is greater than or equal to a threshold value corresponding to the first accuracy indicator type x;
[0706] The value of x is any value in 1 to 6;
[0707] The first accuracy event includes at least one of the following types:
[0708] A first accuracy event type 1: the 1 / 1 beam accuracy satisfies a second preset condition;
[0709] The first accuracy event type 2: the 1 / k beam accuracy satisfies a second preset condition;
[0710] The first accuracy event type 3: the k / 1 beam accuracy satisfies a second preset condition;
[0711] The first accuracy event type 4: the 1 / 1 beam accuracy with 1 dB margin satisfies a second preset condition;
[0712] The first accuracy event type 5: the 1 / k beam accuracy with 1 dB margin satisfies a second preset condition;
[0713] The first accuracy event type 6: the k / 1 beam accuracy with 1 dB margin satisfies a second preset condition.
[0714] Optionally, the second preset conditions corresponding to the first accuracy event types are the same or different, and / or the second preset conditions corresponding to the first accuracy event types are determined by at least one of network configuration, protocol agreement and terminal reporting.
[0715] Optionally, the second accuracy index includes at least one of the following types:
[0716] The second accuracy index type 1: used to indicate whether k2 selected beam information in the measured beam information and k1 selected beam information in the predicted beam information are consistent or inconsistent;
[0717] The second accuracy index type 2: used to indicate whether the order of k2 selected beam information in the measured beam information and the order of k1 selected beam information in the predicted beam information are consistent or inconsistent;
[0718] The second accuracy index type 3: used to indicate the matching degree of the order of k2 selected beam information in the measured beam information and the order of k1 selected beam information in the predicted beam information;
[0719] The second accuracy index type 4: used to indicate whether the order of k1 selected beam information in the predicted beam information and the order of k1 selected beam information in the predicted beam information corresponding to the measured beam information are consistent or inconsistent;
[0720] The second accuracy index type 5: used to indicate the matching degree of the order of k1 selected beam information in the predicted beam information and the order of k1 selected beam information in the predicted beam information corresponding to the measured beam information;
[0721] The k1 selected beam information in the predicted beam information corresponds to the measured obtained beam information obtained by the terminal receiving a measurement resource list transmitted using the k1 selected beam information in the predicted beam information.
[0722] k1 is different from k2, and k1 and k2 are positive integers greater than 1.
[0723] Optionally, the second accuracy event includes at least one of the following types:
[0724] The second accuracy event type 1: the number of times that the k2 selected beam information in the measured obtained beam information and the k1 selected beam information in the predicted beam information are consistent or inconsistent satisfies a third preset condition.
[0725] The second accuracy event type 2: the number of times that the order of the k2 selected beam information in the measured obtained beam information and the order of the k1 selected beam information in the predicted beam information are consistent or inconsistent satisfies a third preset condition.
[0726] The second accuracy event type 3: the matching degree of the order of the k2 selected beam information in the measured obtained beam information and the order of the k1 selected beam information in the predicted beam information satisfies a third preset condition.
[0727] The second accuracy event type 4: the number of times that the order of the k1 selected beam information in the predicted beam information and the order of the measured obtained beam information corresponding to the k1 selected beam information in the predicted beam information are consistent or inconsistent satisfies a third preset condition.
[0728] The second accuracy event type 5: the matching degree of the order of the k1 selected beam information in the predicted beam information and the order of the measured obtained beam information corresponding to the k1 selected beam information in the predicted beam information satisfies a third preset condition.
[0729] The third preset condition includes at least one of the following:
[0730] Greater than or equal to a preset number threshold;
[0731] Less than or equal to a preset number threshold;
[0732] Greater than or equal to a preset matching degree threshold;
[0733] Less than or equal to a preset matching degree threshold.
[0734] Optionally, the third preset conditions corresponding to the second accuracy event types are the same or different, and / or the third preset conditions corresponding to the second accuracy event types are determined by at least one of network configuration, protocol agreement and terminal reporting.
[0735] Optionally, the beam information comprises at least one of the following types:
[0736] First beam information, the first beam information is determined by first indication information, the first indication information is determined by at least one of network configuration and protocol agreement;
[0737] Second beam information, the second beam information is k1 selected beam information in predicted beam information;
[0738] Third beam information, the third beam information is obtained according to the measurement of part of the beam information in the first list, the first list includes the beam information used to determine the prediction result in the beam prediction inference of the AI unit;
[0739] Fourth beam information, the fourth beam information is the beam information obtained by measuring the k1 selected beam information corresponding to the predicted beam information; wherein k1 is a positive integer greater than or equal to 1.
[0740] Optionally, the first indication information is agreed by protocol, including at least one of the following:
[0741] Beam information contained or associated by at least one transmission configuration indication (TCI) state activated by downlink control information (DCI);
[0742] Downlink beam information contained or associated by at least one TCI state activated by DCI;
[0743] Beam information contained or associated by one TCI state activated by medium access control layer control element (MAC CE);
[0744] Beam information contained or associated by at least one TCI state activated by MAC CE;
[0745] Downlink beam information contained or associated by at least one TCI state activated by MAC CE;
[0746] Beam information with the worst beam quality information in the activated TCI state;
[0747] Beam information with the best beam quality information in the activated TCI state.
[0748] Optionally, the beam quality information comprises at least one of the following: measurement result of beam information, prediction result of beam information.
[0749] Optionally, the beam quality difference index comprises at least one of the following types:
[0750] Beam quality difference index type 1: a difference between the beam quality information of the first beam information and the beam quality information of the second beam information;
[0751] Beam quality difference index type 2: a mean value of the difference between the beam quality information of the first beam information and the beam quality information of the second beam information under the fifth preset condition;
[0752] Beam quality difference index type 3: a difference between the beam quality information of the first beam information and the beam quality information of the third beam information;
[0753] Beam quality difference index type 4: a mean value of the difference between the beam quality information of the first beam information and the beam quality information of the third beam information under the fifth preset condition;
[0754] Beam quality difference index type 5: a difference between the beam quality information of the first beam information and the beam quality information of the fourth beam information;
[0755] Beam quality difference index type 6: a mean value of the difference between the beam quality information of the first beam information and the beam quality information of the fourth beam information under the fifth preset condition;
[0756] Beam quality difference index type 7: a difference between the beam quality information of the second beam information and the beam quality information of the third beam information;
[0757] Beam quality difference index type 8: a mean value of the difference between the beam quality information of the second beam information and the beam quality information of the third beam information under the fifth preset condition;
[0758] Beam quality difference index type 9: a difference between the beam quality information of the second beam information and the beam quality information of the fourth beam information;
[0759] Beam quality difference index type 10: a mean value of the difference between the beam quality information of the second beam information and the beam quality information of the fourth beam information under the fifth preset condition;
[0760] Beam quality difference index type 11: a difference between the beam quality information of the third beam information and the beam quality information of the fourth beam information;
[0761] Beam quality difference index type 12: a mean value of the difference between the beam quality information of the third beam information and the beam quality information of the fourth beam information under the fifth preset condition;
[0762] Beam quality difference index type 13: difference between the measurement result of the first beam information and the prediction result of the first beam information;
[0763] Beam quality difference index type 14: average of the difference between the measurement result of the first beam information and the prediction result of the first beam information under the fifth preset condition;
[0764] Beam quality difference index type 15: difference between the measurement result of the second beam information and the prediction result of the second beam information;
[0765] Beam quality difference index type 16: average of the difference between the measurement result of the second beam information and the prediction result of the second beam information under the fifth preset condition;
[0766] Beam quality difference index type 17: difference between the measurement result of the third beam information and the prediction result of the third beam information;
[0767] Beam quality difference index type 18: average of the difference between the measurement result of the third beam information and the prediction result of the third beam information under the fifth preset condition;
[0768] Beam quality difference index type 19: difference between the measurement result of the fourth beam information and the prediction result of the fourth beam information;
[0769] Beam quality difference index type 20: average of the difference between the measurement result of the fourth beam information and the prediction result of the fourth beam information under the fifth preset condition;
[0770] The fifth preset condition includes at least one of: a preset number of times; a preset number of occurrences; a preset value threshold; and a preset time window.
[0771] Optionally, in the case where the beam information in the beam quality difference index type corresponds to multiple beam information, the beam quality information of the beam information is the maximum or minimum of the beam quality information of the multiple beam information.
[0772] Optionally, the fifth preset conditions corresponding to each beam quality difference index type are the same or different, and / or the fifth preset conditions corresponding to each beam quality difference index type are determined by at least one of network configuration, protocol agreement and terminal reporting.
[0773] Optionally, the beam quality difference event includes at least one of the following types:
[0774] Beam quality difference event type 1: the difference between the beam quality information of the first beam information and the beam quality information of the second beam information satisfies the fourth preset condition.
[0775] Beam quality difference event type 2: the average of the difference between the beam quality information of the first beam information and the beam quality information of the second beam information meets the fourth preset condition under the fifth preset condition;
[0776] Beam quality difference event type 3: the beam quality information of the first beam information is less than or equal to the sum of the reference beam quality information and the beam quality information of the second beam information;
[0777] Beam quality difference event type 4: the beam quality information of the first beam information is greater than or equal to the sum of the reference beam quality information and the beam quality information of the second beam information;
[0778] Beam quality difference event type 5: the difference between the beam quality information of the first beam information and the beam quality information of the third beam information meets the fourth preset condition;
[0779] Beam quality difference event type 6: the average of the difference between the beam quality information of the first beam information and the beam quality information of the third beam information meets the fourth preset condition under the fifth preset condition;
[0780] Beam quality difference event type 7: the beam quality information of the first beam information is less than or equal to the sum of the reference beam quality information and the beam quality information of the third beam information;
[0781] Beam quality difference event type 8: the beam quality information of the first beam information is greater than or equal to the sum of the reference beam quality information and the beam quality information of the third beam information;
[0782] Beam quality difference event type 9: the difference between the beam quality information of the first beam information and the beam quality information of the fourth beam information meets the fourth preset condition;
[0783] Beam quality difference event type 10: the average of the difference between the beam quality information of the first beam information and the beam quality information of the fourth beam information meets the fourth preset condition under the fifth preset condition;
[0784] Beam quality difference event type 11: the beam quality information of the first beam information is less than or equal to the sum of the reference beam quality information and the beam quality information of the fourth beam information;
[0785] Beam quality difference event type 12: the beam quality information of the first beam information is greater than or equal to the sum of the reference beam quality information and the beam quality information of the fourth beam information;
[0786] Beam quality difference event type 13: a difference between the beam quality information of the second beam information and the beam quality information of the third beam information satisfies a fourth preset condition;
[0787] Beam quality difference event type 14: a mean value of a difference between the beam quality information of the second beam information and the beam quality information of the third beam information under a fifth preset condition satisfies a fourth preset condition;
[0788] Beam quality difference event type 15: the beam quality information of the second beam information is less than or equal to a sum of the reference beam quality information and the beam quality information of the third beam information;
[0789] Beam quality difference event type 16: the beam quality information of the second beam information is greater than or equal to a sum of the reference beam quality information and the beam quality information of the third beam information;
[0790] Beam quality difference event type 17: a difference between the beam quality information of the second beam information and the beam quality information of the fourth beam information satisfies a fourth preset condition;
[0791] Beam quality difference event type 18: a mean value of a difference between the beam quality information of the second beam information and the beam quality information of the fourth beam information under a fifth preset condition satisfies a fourth preset condition;
[0792] Beam quality difference event type 19: the beam quality information of the second beam information is less than or equal to a sum of the reference beam quality information and the beam quality information of the fourth beam information;
[0793] Beam quality difference event type 20: the beam quality information of the second beam information is greater than or equal to a sum of the reference beam quality information and the beam quality information of the fourth beam information;
[0794] Beam quality difference event type 21: a difference between the beam quality information of the third beam information and the beam quality information of the fourth beam information satisfies a fourth preset condition;
[0795] Beam quality difference event type 22: a mean value of a difference between the beam quality information of the third beam information and the beam quality information of the fourth beam information under a fifth preset condition satisfies a fourth preset condition;
[0796] Beam quality difference event type 23: the beam quality information of the third beam information is less than or equal to a sum of the reference beam quality information and the beam quality information of the fourth beam information;
[0797] Beam quality difference event type 24: the beam quality information of the third beam information is greater than or equal to the sum of the reference beam quality information and the beam quality information of the fourth beam information;
[0798] Beam quality difference event type 25: the difference between the measurement result of the first beam information and the prediction result of the first beam information satisfies a fourth preset condition;
[0799] Beam quality difference event type 26: the average of the difference between the measurement result of the first beam information and the prediction result of the first beam information under a fifth preset condition satisfies a fourth preset condition;
[0800] Beam quality difference event type 27: the difference between the measurement result of the second beam information and the prediction result of the second beam information satisfies a fourth preset condition;
[0801] Beam quality difference event type 28: the average of the difference between the measurement result of the second beam information and the prediction result of the second beam information under a fifth preset condition satisfies a fourth preset condition;
[0802] Beam quality difference event type 29: the difference between the measurement result of the third beam information and the prediction result of the third beam information;
[0803] Beam quality difference event type 30: the average of the difference between the measurement result of the third beam information and the prediction result of the third beam information under a fifth preset condition satisfies a fourth preset condition;
[0804] Beam quality difference event type 31: the difference between the measurement result of the fourth beam information and the prediction result of the fourth beam information satisfies a fourth preset condition;
[0805] Beam quality difference event type 32: the average of the difference between the measurement result of the fourth beam information and the prediction result of the fourth beam information under a fifth preset condition satisfies a fourth preset condition;
[0806] The fourth preset condition includes at least one of the following:
[0807] Greater than or equal to a preset threshold;
[0808] Less than or equal to a preset threshold.
[0809] Optionally, the fourth preset conditions corresponding to the beam quality difference event types are the same or different, and / or the fourth preset conditions corresponding to the beam quality difference event types are determined by at least one of network configuration, protocol agreement and terminal reporting.
[0810] Optionally, the first information includes at least one of the following:
[0811] the beam prediction performance event;
[0812] the number of times the beam prediction performance event occurs;
[0813] the beam prediction performance indicator corresponding to the beam prediction performance event.
[0814] Optionally, in the case that the beam prediction performance event is associated with one or more target beam prediction performance events or target beam prediction performance indicators, the first information comprises at least one of:
[0815] the beam prediction performance event;
[0816] the number of times the beam prediction performance event occurs;
[0817] the beam prediction performance indicator corresponding to the beam prediction performance event;
[0818] the target beam prediction performance event;
[0819] the number of times the target beam prediction performance event occurs;
[0820] the target beam prediction performance indicator;
[0821] wherein the type of the target beam prediction performance event is different from the type of the beam prediction performance event, and the target beam prediction performance indicator is a beam prediction performance indicator corresponding to the target beam prediction performance event.
[0822] Optionally, in the case that the beam prediction performance event is associated with multiple target beam prediction performance events or target beam prediction performance indicators, and the activated target beam prediction performance event or the activated target beam prediction performance indicator is determined according to network configuration,
[0823] the first information comprises at least one of:
[0824] the beam prediction performance event;
[0825] the number of times the beam prediction performance event occurs;
[0826] the beam prediction performance indicator corresponding to the beam prediction performance event;
[0827] the activated target beam prediction performance event;
[0828] the number of times the activated target beam prediction performance event occurs;
[0829] the activated target beam prediction performance indicator;
[0830] The type of the target beam prediction performance event is different from the type of the beam prediction performance event, and the target beam prediction performance indicator is a beam prediction performance indicator corresponding to the target beam prediction performance event.
[0831] Optionally, the radio frequency unit is configured to:
[0832] In a case where the beam prediction performance event does not satisfy the first preset condition, and a target beam prediction performance indicator associated with the beam prediction performance event satisfies a preset condition corresponding to the target beam prediction performance indicator, or a target beam prediction performance event associated with the beam prediction performance event satisfies the first preset condition, the terminal reports second information, and the second information includes at least one of the following:
[0833] The target beam prediction performance event;
[0834] The number of times of occurrence of the target beam prediction performance event;
[0835] The target beam prediction performance indicator;
[0836] The target beam prediction performance indicator is a beam prediction performance indicator corresponding to the target beam prediction performance event, and the type of the target beam prediction performance event is different from the type of the beam prediction performance event.
[0837] Optionally, the beam prediction performance event and the target beam prediction performance event or target beam prediction performance indicator are associated by at least one of the following manners:
[0838] Configured in a same EventTriggerConfig;
[0839] Configured in a same eventID;
[0840] The target beam prediction performance indicator is configured in a beam prediction performance indicator corresponding to the beam prediction performance event;
[0841] The target beam prediction performance event is configured in a beam prediction performance indicator corresponding to the beam prediction performance event;
[0842] The target beam prediction performance indicator is configured in the beam prediction performance event;
[0843] The target beam prediction performance event is configured in the beam prediction performance event;
[0844] A beam prediction performance indicator corresponding to the beam prediction performance event is configured in the beam prediction performance event;
[0845] The target beam prediction performance index is configured in the target beam prediction performance event.
[0846] The configuration association information is configured.
[0847] Optionally, the beam prediction performance index corresponding to the beam prediction performance event is determined by at least one of network configuration, protocol agreement and terminal reporting.
[0848] Optionally, the beam information includes at least one of the following: beam ID information, beam angle information, beam gain information, beam width information, expectation information, and beam quality information.
[0849] It can be understood that the implementation process of each implementation mode mentioned in the embodiment can refer to the related description of the method embodiment of beam prediction performance monitoring, and achieve the same or corresponding technical effects. To avoid repetition, it will not be repeated here.
[0850] The embodiment of the application also provides a readable storage medium, the readable storage medium stores a program or instructions, the program or instructions are executed by a processor to realize each process of the above-mentioned beam prediction performance monitoring method embodiment, and the same technical effects can be achieved. To avoid repetition, it will not be repeated here.
[0851] The processor is the processor in the terminal in the above-mentioned embodiment. The readable storage medium includes a computer readable storage medium, such as a computer readable memory (ROM), a random access memory (RAM), a magnetic disk or an optical disk, etc. In some examples, the readable storage medium can be a non-transitory readable storage medium.
[0852] The embodiment of the application further provides a chip, the chip includes a processor and a communication interface, the communication interface and the processor are coupled, the processor is used to run a program or instructions, realizes each process of the above-mentioned beam prediction performance monitoring method embodiment, and the same technical effects can be achieved. To avoid repetition, it will not be repeated here.
[0853] It should be understood that the chip mentioned in the embodiment of the application can also be referred to as a system chip, a system chip, a chip system or a system on chip, etc.
[0854] The embodiment of the application further provides a computer program / program product, the computer program / program product is stored in a storage medium, the computer program / program product is executed by at least one processor to realize each process of the above-mentioned beam prediction performance monitoring method embodiment, and the same technical effects can be achieved. To avoid repetition, it will not be repeated here.
[0855] This application also provides a communication system, including a terminal and a network-side device, wherein the terminal can be used to perform the steps of the beam prediction performance monitoring method described above.
[0856] It should be noted that, in this document, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element. Furthermore, it should be noted that the scope of the methods and apparatuses in the embodiments of this application is not limited to performing functions in the order shown or discussed, but may also include performing functions substantially simultaneously or in the reverse order, depending on the functions involved. For example, the described methods may be performed in a different order than described, and various steps may be added, omitted, or combined. Additionally, features described with reference to certain examples may be combined in other examples.
[0857] From the above description of the embodiments, those skilled in the art can clearly understand that the methods of the above embodiments can be implemented by means of computer software products plus necessary general-purpose hardware platforms, and of course, they can also be implemented by hardware. The computer software product is stored in a storage medium (such as ROM, RAM, magnetic disk, optical disk, etc.), and the computer software product includes several instructions to cause the terminal or network-side device to execute the methods described in the various embodiments of this application.
[0858] The embodiments of this application have been described above with reference to the accompanying drawings. However, this application is not limited to the specific embodiments described above. The specific embodiments described above are merely illustrative and not restrictive. Those skilled in the art can make many other implementations under the guidance of this application without departing from the spirit and scope of the claims. All of these implementations are within the protection scope of this application.
Claims
A method for monitoring beam prediction performance, comprising: reporting, by a terminal, first information when a beam prediction performance event meets a first preset condition, the first information being information related to the beam prediction performance event; the beam prediction performance event comprises at least one of: a first accuracy event, the first accuracy event occurring when a first accuracy indicator meets a second preset condition, the first accuracy indicator being used to indicate a beam prediction accuracy counted within a preset time window or a preset number or a preset period; a second accuracy event, the second accuracy event occurring when a second accuracy indicator meets a third preset condition, the second accuracy indicator being used to indicate a consistency or a sequence consistency or a matching degree between measured beam information and predicted beam information; a beam quality difference event, the beam quality difference event occurring when a beam quality difference indicator meets a fourth preset condition, the beam quality difference indicator comprising a difference between beam quality information of different beam information or a difference between different beam quality information of the same beam information; the beam prediction performance event meeting the first preset condition comprises at least one of: a number of occurrences of the beam prediction performance event reaching a preset number; a number of consecutive occurrences of the beam prediction performance event reaching a preset number; a number of occurrences of the beam prediction performance event within a preset time window reaching a preset number; a number of consecutive occurrences of the beam prediction performance event within a preset time window reaching a preset number. The beam prediction performance monitoring method of claim 1, wherein, the first accuracy indicator comprises at least one of the following types: a first accuracy indicator type 1: 1 / 1 beam accuracy, the 1 / 1 beam accuracy being used to indicate a probability of a selected one of predicted beam information and a selected one of measured beam information being consistent or inconsistent within a preset time window or a preset number or a preset period; a first accuracy indicator type 2: 1 / k beam accuracy, the 1 / k beam accuracy being used to indicate a probability of a selected one of predicted beam information belonging to or not belonging to k selected ones of measured beam information within a preset time window or a preset number or a preset period; a first accuracy indicator type 3: k / 1 beam accuracy, the k / 1 beam accuracy being used to indicate a probability of k selected ones of predicted beam information containing or not containing a selected one of measured beam information within a preset time window or a preset number or a preset period; a first accuracy indicator type 4: 1 / 1 beam accuracy with 1 dB margin, the 1 / 1 beam accuracy with 1 dB margin being used to indicate a probability of a difference between beam quality information corresponding to a selected one of predicted beam information and beam quality information corresponding to a selected one of measured beam information being less than or equal to or greater than or equal to 1 dB within a preset time window or a preset number or a preset period. The first accuracy rate indicator type 5 is a 1 / k beam accuracy rate with a 1 dB margin, which is used to indicate a probability that a minimum difference value between beam quality information corresponding to k selected beam information in predicted beam information and beam quality information corresponding to k selected beam information obtained through measurement is less than or greater than or equal to 1 dB within a preset time window or a preset number or a preset period. The first accuracy rate indicator type 6 is a k / 1 beam accuracy rate with a 1 dB margin, which is used to indicate a probability that a minimum difference value between beam quality information corresponding to 1 selected beam information in predicted beam information and beam quality information corresponding to k selected beam information obtained through measurement is less than or greater than or equal to 1 dB within a preset time window or a preset number or a preset period. The k is a positive integer greater than 1. The beam prediction performance monitoring method according to claim 2, wherein, The first accuracy rate indicator satisfies the second preset condition, including at least one of the following: The first accuracy rate indicator type x is less than or equal to a threshold value corresponding to the first accuracy rate indicator type x. The first accuracy rate indicator type x is greater than or equal to a threshold value corresponding to the first accuracy rate indicator type x. The value of x is any value in 1 to 6. The first accuracy rate event includes at least one of the following types: The first accuracy rate event type 1 is that the 1 / 1 beam accuracy rate satisfies the second preset condition. The first accuracy rate event type 2 is that the 1 / k beam accuracy rate satisfies the second preset condition. The first accuracy rate event type 3 is that the k / 1 beam accuracy rate satisfies the second preset condition. The first accuracy rate event type 4 is that the 1 / 1 beam accuracy rate with a 1 dB margin satisfies the second preset condition. The first accuracy rate event type 5 is that the 1 / k beam accuracy rate with a 1 dB margin satisfies the second preset condition. The first accuracy rate event type 6 is that the k / 1 beam accuracy rate with a 1 dB margin satisfies the second preset condition. The beam prediction performance monitoring method according to claim 3, wherein, The second preset conditions corresponding to each first accuracy rate event type are the same or different, and / or the second preset conditions corresponding to each first accuracy rate event type are determined by at least one of network configuration, protocol agreement and terminal reporting. The beam prediction performance monitoring method of claim 1, wherein, The second accuracy rate indicator includes at least one of the following types: The second accuracy rate indicator type 1 is used to indicate whether k2 selected beam information in the beam information obtained through measurement is consistent or inconsistent with k1 selected beam information in the predicted beam information. The second accuracy rate indicator type 2 is used to indicate whether an order of k2 selected beam information in the beam information obtained through measurement is consistent or inconsistent with an order of k1 selected beam information in the predicted beam information. The second accuracy rate indicator type 3 is used to indicate a matching degree of an order of k2 selected beam information in the beam information obtained through measurement and an order of k1 selected beam information in the predicted beam information. The second accuracy rate indicator type 4 is used to indicate whether the order of the k1 selected beam information in the predicted beam information and the order of the measurement obtained beam information corresponding to the k1 selected beam information in the predicted beam information are consistent or inconsistent. The second accuracy rate indicator type 5 is used to indicate the matching degree of the order of the k1 selected beam information in the predicted beam information and the order of the measurement obtained beam information corresponding to the k1 selected beam information in the predicted beam information. The measurement obtained beam information corresponding to the k1 selected beam information in the predicted beam information is obtained by the terminal receiving a measurement resource list sent using the k1 selected beam information in the predicted beam information. k1 and k2 are different, and k1 and k2 are positive integers greater than 1. The beam prediction performance monitoring method according to claim 5, wherein, The second accuracy rate event includes at least one of the following types: The second accuracy rate event type 1 is that the number of times that the k2 selected beam information in the measurement obtained beam information and the k1 selected beam information in the predicted beam information are consistent or inconsistent meets a third preset condition. The second accuracy rate event type 2 is that the number of times that the order of the k2 selected beam information in the measurement obtained beam information and the order of the k1 selected beam information in the predicted beam information are consistent or inconsistent meets a third preset condition. The second accuracy rate event type 3 is that the matching degree of the order of the k2 selected beam information in the measurement obtained beam information and the order of the k1 selected beam information in the predicted beam information meets a third preset condition. The second accuracy rate event type 4 is that the number of times that the order of the k1 selected beam information in the predicted beam information and the order of the measurement obtained beam information corresponding to the k1 selected beam information in the predicted beam information are consistent or inconsistent meets a third preset condition. The second accuracy rate event type 5 is that the matching degree of the order of the k1 selected beam information in the predicted beam information and the order of the measurement obtained beam information corresponding to the k1 selected beam information in the predicted beam information meets a third preset condition. The third preset condition meeting includes at least one of the following: Greater than or equal to a preset number threshold; Less than or equal to a preset number threshold; Greater than or equal to a preset matching degree threshold; Less than or equal to a preset matching degree threshold. The beam prediction performance monitoring method according to claim 6, wherein, The third preset conditions corresponding to each second accuracy rate event type are the same or different, and / or the third preset conditions corresponding to each second accuracy rate event type are at least one of network configuration, protocol agreement and terminal reporting. The beam prediction performance monitoring method according to any one of claims 1-7, wherein, The beam information includes at least one of the following types: The first beam information is determined by first indication information, and the first indication information is at least one of network configuration and protocol agreement. The second beam information is the k1 selected beam information in the predicted beam information. The third beam information is the measurement obtained beam information according to part of the beam information in the first list, and the first list includes the beam information used to determine the prediction result in the beam prediction inference of the AI unit. The fourth beam information is beam information obtained by measurement corresponding to k1 selected beam information in the predicted beam information; k1 is a positive integer greater than or equal to 1. The beam prediction performance monitoring method of claim 8, wherein, The first indication information is agreed by a protocol and includes at least one of the following: Beam information contained or associated by at least one transmission configuration indication (TCI) state activated by downlink control information (DCI); Downlink beam information contained or associated by at least one TCI state activated by DCI; Beam information contained or associated by one TCI state activated by a medium access control (MAC) control element (CE); Beam information contained or associated by at least one TCI state activated by a MAC CE; Downlink beam information contained or associated by at least one TCI state activated by a MAC CE; Beam information with the worst beam quality information in the activated TCI state; Beam information with the best beam quality information in the activated TCI state. The beam prediction performance monitoring method according to claim 1 or 8 or 9, wherein, The beam quality information includes at least one of the following: a measurement result of the beam information and a prediction result of the beam information. The beam prediction performance monitoring method according to claim 1 or 8 or 9 or 10, wherein, The beam quality difference index includes at least one of the following types: Beam quality difference index type 1: a difference between the beam quality information of the first beam information and the beam quality information of the second beam information; Beam quality difference index type 2: a mean value of the difference between the beam quality information of the first beam information and the beam quality information of the second beam information under a fifth preset condition; Beam quality difference index type 3: a difference between the beam quality information of the first beam information and the beam quality information of the third beam information; Beam quality difference index type 4: a mean value of the difference between the beam quality information of the first beam information and the beam quality information of the third beam information under a fifth preset condition; Beam quality difference index type 5: a difference between the beam quality information of the first beam information and the beam quality information of the fourth beam information; Beam quality difference index type 6: a mean value of the difference between the beam quality information of the first beam information and the beam quality information of the fourth beam information under a fifth preset condition; Beam quality difference index type 7: a difference between the beam quality information of the second beam information and the beam quality information of the third beam information; Beam quality difference index type 8: a mean value of the difference between the beam quality information of the second beam information and the beam quality information of the third beam information under a fifth preset condition; Beam quality difference index type 9: a difference between the beam quality information of the second beam information and the beam quality information of the fourth beam information; Beam quality difference index type 10: a mean value of the difference between the beam quality information of the second beam information and the beam quality information of the fourth beam information under a fifth preset condition; Beam quality difference index type 11: a difference between the beam quality information of the third beam information and the beam quality information of the fourth beam information; The beam quality difference index type 12 is a difference value average between the beam quality information of the third beam information and the beam quality information of the fourth beam information under the fifth preset condition; The beam quality difference index type 13 is a difference value between the measurement result of the first beam information and the prediction result of the first beam information; The beam quality difference index type 14 is a difference value average between the measurement result of the first beam information and the prediction result of the first beam information under the fifth preset condition; The beam quality difference index type 15 is a difference value between the measurement result of the second beam information and the prediction result of the second beam information; The beam quality difference index type 16 is a difference value average between the measurement result of the second beam information and the prediction result of the second beam information under the fifth preset condition; The beam quality difference index type 17 is a difference value between the measurement result of the third beam information and the prediction result of the third beam information; The beam quality difference index type 18 is a difference value average between the measurement result of the third beam information and the prediction result of the third beam information under the fifth preset condition; The beam quality difference index type 19 is a difference value between the measurement result of the fourth beam information and the prediction result of the fourth beam information; The beam quality difference index type 20 is a difference value average between the measurement result of the fourth beam information and the prediction result of the fourth beam information under the fifth preset condition; The fifth preset condition includes at least one of the following: a preset number of times; A preset number of occurrences; A preset value threshold; and a preset time window. The beam prediction performance monitoring method of claim 11, wherein, In the case where the beam information in the beam quality difference index type corresponds to multiple beam information, the beam quality information of the beam information is the maximum value or the minimum value in the beam quality information of the multiple beam information. The beam prediction performance monitoring method according to claim 11 or 12, wherein, The fifth preset conditions corresponding to each beam quality difference index type are the same or different, and / or the fifth preset conditions corresponding to each beam quality difference index type are determined by at least one of network configuration, protocol agreement and terminal reporting. The beam prediction performance monitoring method according to any one of claims 8-13, wherein, The beam quality difference event includes at least one of the following types: The beam quality difference event type 1 is that the difference value between the beam quality information of the first beam information and the beam quality information of the second beam information satisfies the fourth preset condition; The beam quality difference event type 2 is that the difference value average between the beam quality information of the first beam information and the beam quality information of the second beam information under the fifth preset condition satisfies the fourth preset condition; The beam quality difference event type 3 is that the beam quality information of the first beam information is less than or equal to the sum of the reference beam quality information and the beam quality information of the second beam information; The beam quality difference event type 4 is that the beam quality information of the first beam information is greater than or equal to the sum of the reference beam quality information and the beam quality information of the second beam information; The beam quality difference event type 5 is that the difference value between the beam quality information of the first beam information and the beam quality information of the third beam information satisfies the fourth preset condition; Beam quality difference event type 6: the average of the difference between the beam quality information of the first beam information and the beam quality information of the third beam information meets the fourth preset condition under the fifth preset condition; Beam quality difference event type 7: the beam quality information of the first beam information is less than or equal to the sum of the reference beam quality information and the beam quality information of the third beam information; Beam quality difference event type 8: the beam quality information of the first beam information is greater than or equal to the sum of the reference beam quality information and the beam quality information of the third beam information; Beam quality difference event type 9: the difference between the beam quality information of the first beam information and the beam quality information of the fourth beam information meets the fourth preset condition; Beam quality difference event type 10: the average of the difference between the beam quality information of the first beam information and the beam quality information of the fourth beam information meets the fourth preset condition under the fifth preset condition; Beam quality difference event type 11: the beam quality information of the first beam information is less than or equal to the sum of the reference beam quality information and the beam quality information of the fourth beam information; Beam quality difference event type 12: the beam quality information of the first beam information is greater than or equal to the sum of the reference beam quality information and the beam quality information of the fourth beam information; Beam quality difference event type 13: the difference between the beam quality information of the second beam information and the beam quality information of the third beam information meets the fourth preset condition; Beam quality difference event type 14: the average of the difference between the beam quality information of the second beam information and the beam quality information of the third beam information meets the fourth preset condition under the fifth preset condition; Beam quality difference event type 15: the beam quality information of the second beam information is less than or equal to the sum of the reference beam quality information and the beam quality information of the third beam information; Beam quality difference event type 16: the beam quality information of the second beam information is greater than or equal to the sum of the reference beam quality information and the beam quality information of the third beam information; Beam quality difference event type 17: the difference between the beam quality information of the second beam information and the beam quality information of the fourth beam information meets the fourth preset condition; Beam quality difference event type 18: the average of the difference between the beam quality information of the second beam information and the beam quality information of the fourth beam information meets the fourth preset condition under the fifth preset condition; Beam quality difference event type 19: the beam quality information of the second beam information is less than or equal to the sum of the reference beam quality information and the beam quality information of the fourth beam information; Beam quality difference event type 20: the beam quality information of the second beam information is greater than or equal to the sum of the reference beam quality information and the beam quality information of the fourth beam information; Beam quality difference event type 21: the difference between the beam quality information of the third beam information and the beam quality information of the fourth beam information meets the fourth preset condition; The beam quality difference event type 22: a difference between the beam quality information of the third beam information and the beam quality information of the fourth beam information satisfies a fourth preset condition under a fifth preset condition; The beam quality difference event type 23: the beam quality information of the third beam information is less than or equal to a sum of the reference beam quality information and the beam quality information of the fourth beam information; The beam quality difference event type 24: the beam quality information of the third beam information is greater than or equal to a sum of the reference beam quality information and the beam quality information of the fourth beam information; The beam quality difference event type 25: a difference between the measurement result of the first beam information and the prediction result of the first beam information satisfies a fourth preset condition; The beam quality difference event type 26: an average of the difference between the measurement result of the first beam information and the prediction result of the first beam information satisfies a fourth preset condition under a fifth preset condition; The beam quality difference event type 27: a difference between the measurement result of the second beam information and the prediction result of the second beam information satisfies a fourth preset condition; The beam quality difference event type 28: an average of the difference between the measurement result of the second beam information and the prediction result of the second beam information satisfies a fourth preset condition under a fifth preset condition; The beam quality difference event type 29: a difference between the measurement result of the third beam information and the prediction result of the third beam information; The beam quality difference event type 30: an average of the difference between the measurement result of the third beam information and the prediction result of the third beam information satisfies a fourth preset condition under a fifth preset condition; The beam quality difference event type 31: a difference between the measurement result of the fourth beam information and the prediction result of the fourth beam information satisfies a fourth preset condition; The beam quality difference event type 32: an average of the difference between the measurement result of the fourth beam information and the prediction result of the fourth beam information satisfies a fourth preset condition under a fifth preset condition; The fourth preset condition satisfying includes at least one of the following: Greater than or equal to a preset threshold; Less than or equal to a preset threshold. The beam prediction performance monitoring method of claim 14, wherein, The fourth preset conditions corresponding to each beam quality difference event type are the same or different, and / or the fourth preset conditions corresponding to each beam quality difference event type are determined by at least one of network configuration, protocol agreement and terminal reporting. The beam prediction performance monitoring method according to any one of claims 1 to 15, wherein, The first information includes at least one of the following: The beam prediction performance event; The number of times of occurrence of the beam prediction performance event; The beam prediction performance index corresponding to the beam prediction performance event. The beam prediction performance monitoring method according to any one of claims 1 to 15, wherein, In the case that the beam prediction performance event is associated with one or more target beam prediction performance events or target beam prediction performance indexes, the first information includes at least one of the following: The beam prediction performance event; The number of times of occurrence of the beam prediction performance event; The beam prediction performance index corresponding to the beam prediction performance event; The target beam prediction performance event; The number of times of occurrence of the target beam prediction performance event; The target beam prediction performance index; The type of the target beam prediction performance event is different from the type of the beam prediction performance event, and the target beam prediction performance indicator is a beam prediction performance indicator corresponding to the target beam prediction performance event. The beam prediction performance monitoring method according to any one of claims 1 to 15, wherein, In a case where the beam prediction performance event is associated with a plurality of target beam prediction performance events or target beam prediction performance indicators, and the activated target beam prediction performance event or the activated target beam prediction performance indicator in the plurality of target beam prediction performance events is determined according to network configuration, The first information includes at least one of the following: The beam prediction performance event; The number of times of occurrence of the beam prediction performance event; The beam prediction performance indicator corresponding to the beam prediction performance event; The activated target beam prediction performance event; The number of times of occurrence of the activated target beam prediction performance event; The activated target beam prediction performance indicator; The type of the target beam prediction performance event is different from the type of the beam prediction performance event, and the target beam prediction performance indicator is a beam prediction performance indicator corresponding to the target beam prediction performance event. The beam prediction performance monitoring method according to any one of claims 1 to 15, wherein, The method further includes: In a case where the beam prediction performance event does not satisfy the first preset condition, and the target beam prediction performance indicator associated with the beam prediction performance event satisfies a preset condition corresponding to the target beam prediction performance indicator, or the target beam prediction performance event associated with the beam prediction performance event satisfies the first preset condition, the terminal reports second information, and the second information includes at least one of the following: The target beam prediction performance event; The number of times of occurrence of the target beam prediction performance event; The target beam prediction performance indicator; The type of the target beam prediction performance event is different from the type of the beam prediction performance event, and the target beam prediction performance indicator is a beam prediction performance indicator corresponding to the target beam prediction performance event. The beam prediction performance monitoring method according to any one of claims 17 to 19, wherein, The beam prediction performance event and the target beam prediction performance event or target beam prediction performance indicator are associated in at least one of the following manners: Configured in the same EventTriggerConfig; Configured in the same eventID; The target beam prediction performance indicator is configured in a beam prediction performance indicator corresponding to the beam prediction performance event; The target beam prediction performance event is configured in a beam prediction performance indicator corresponding to the beam prediction performance event; The target beam prediction performance indicator is configured in the beam prediction performance event; The target beam prediction performance event is configured in the beam prediction performance event; The beam prediction performance indicator corresponding to the beam prediction performance event is configured in the beam prediction performance event; The target beam prediction performance indicator is configured in the target beam prediction performance event; Association information is configured. The beam prediction performance monitoring method according to any one of claims 16 to 20, wherein, The beam prediction performance indicator corresponding to the beam prediction performance event is determined in at least one of network configuration, protocol agreement and terminal reporting. The beam prediction performance monitoring method according to any one of claims 1 to 21, wherein, The beam information comprises at least one of the following: beam ID information, beam angle information, beam gain information, beam width information, expectation information, and beam quality information. A beam prediction performance monitoring apparatus comprises: A sending module configured to report first information when a beam prediction performance event meets a first preset condition, the first information being information related to the beam prediction performance event; The beam prediction performance event comprises at least one of the following: A first accuracy event, the first accuracy event occurring when a first accuracy indicator meets a second preset condition, the first accuracy indicator being used to indicate a beam prediction accuracy counted within a preset time window, a preset number, or a preset period; A second accuracy event, the second accuracy event occurring when a second accuracy indicator meets a third preset condition, the second accuracy indicator being used to indicate consistency, order consistency, or matching degree between measured beam information and predicted beam information; A beam quality difference event, the beam quality difference event occurring when a beam quality difference indicator meets a fourth preset condition, the beam quality difference indicator comprising a difference between beam quality information of different beam information or a difference between different beam quality information of the same beam information; The beam prediction performance event meeting the first preset condition comprises at least one of the following: The number of occurrences of the beam prediction performance event reaches a preset number; The number of consecutive occurrences of the beam prediction performance event reaches a preset number; The number of occurrences of the beam prediction performance event reaches a preset number within a preset time window; The number of consecutive occurrences of the beam prediction performance event reaches a preset number within a preset time window. The beam prediction performance monitoring apparatus of claim 23, wherein, The first accuracy indicator comprises at least one of the following types: A first accuracy indicator type 1: 1 / 1 beam accuracy, the 1 / 1 beam accuracy being used to indicate a probability that one selected beam information in predicted beam information counted within a preset time window, a preset number, or a preset period and one selected beam information obtained through measurement are consistent or inconsistent; A first accuracy indicator type 2: 1 / k beam accuracy, the 1 / k beam accuracy being used to indicate a probability that one selected beam information in predicted beam information counted within a preset time window, a preset number, or a preset period belongs to or does not belong to k selected beam information obtained through measurement; A first accuracy indicator type 3: k / 1 beam accuracy, the k / 1 beam accuracy being used to indicate a probability that k selected beam information in predicted beam information counted within a preset time window, a preset number, or a preset period contains or does not contain one selected beam information obtained through measurement; The first accuracy rate indicator type 4 is a 1 / 1 beam accuracy rate with a 1 dB margin, which is used to indicate a probability that a difference between beam quality information corresponding to one selected beam information in predicted beam information and beam quality information corresponding to one selected beam information in measured beam information is less than or greater than or equal to 1 dB within a preset time window or a preset number or a preset period. The first accuracy rate indicator type 5 is a 1 / k beam accuracy rate with a 1 dB margin, which is used to indicate a probability that a minimum value of a difference between beam quality information corresponding to one selected beam information in predicted beam information and beam quality information corresponding to k selected beam information in measured beam information is less than or greater than or equal to 1 dB within a preset time window or a preset number or a preset period. The first accuracy rate indicator type 6 is a k / 1 beam accuracy rate with a 1 dB margin, which is used to indicate a probability that a minimum value of a difference between beam quality information corresponding to k selected beam information in predicted beam information and beam quality information corresponding to one selected beam information in measured beam information is less than or greater than or equal to 1 dB within a preset time window or a preset number or a preset period. The first accuracy rate indicator satisfies a second preset condition, including at least one of the following: The beam prediction performance monitoring apparatus of claim 24, wherein, The first accuracy rate indicator type x is less than or equal to a threshold value corresponding to the first accuracy rate indicator type x. The first accuracy rate indicator type x is greater than or equal to a threshold value corresponding to the first accuracy rate indicator type x. The value of x is any value in 1 to 6. The first accuracy rate event includes at least one of the following types: The first accuracy rate event type 1 is that the 1 / 1 beam accuracy rate satisfies a second preset condition. The first accuracy rate event type 2 is that the 1 / k beam accuracy rate satisfies a second preset condition. The first accuracy rate event type 3 is that the k / 1 beam accuracy rate satisfies a second preset condition. The first accuracy rate event type 4 is that the 1 / 1 beam accuracy rate with a 1 dB margin satisfies a second preset condition. The first accuracy rate event type 5 is that the 1 / k beam accuracy rate with a 1 dB margin satisfies a second preset condition. The first accuracy rate event type 6 is that the k / 1 beam accuracy rate with a 1 dB margin satisfies a second preset condition. The second accuracy rate event includes at least one of the following types: The beam prediction performance monitoring apparatus of claim 23, wherein, The second accuracy rate event type 1 is that a number of times that k2 selected beam information in measured beam information and k1 selected beam information in predicted beam information are consistent or inconsistent satisfies a third preset condition. The second accuracy rate event type 2 is that a number of times that an order of k2 selected beam information in measured beam information and an order of k1 selected beam information in predicted beam information are consistent or inconsistent satisfies a third preset condition. The second accuracy event type 3: the matching degree of the order of the k2 selected beam information in the obtained beam information and the order of the k1 selected beam information in the predicted beam information satisfies a third preset condition; The second accuracy event type 4: the order of the k1 selected beam information in the predicted beam information and the order of the k1 selected beam information in the obtained beam information corresponding to the predicted beam information are consistent or inconsistent for a number of times satisfying a third preset condition; The second accuracy event type 5: the matching degree of the order of the k1 selected beam information in the predicted beam information and the order of the k1 selected beam information in the obtained beam information corresponding to the predicted beam information satisfies a third preset condition; The third preset condition includes at least one of the following: Greater than or equal to a preset number threshold; Less than or equal to a preset number threshold; Greater than or equal to a preset matching degree threshold; Less than or equal to a preset matching degree threshold; k1 and k2 are different, and k1 and k2 are positive integers greater than 1. The beam prediction performance monitoring apparatus of claim 23, wherein, The beam quality difference event includes at least one of the following types: The beam quality difference event type 1: the difference between the beam quality information of the first beam information and the beam quality information of the second beam information satisfies a fourth preset condition; The beam quality difference event type 2: the average of the difference between the beam quality information of the first beam information and the beam quality information of the second beam information under the fifth preset condition satisfies the fourth preset condition; The beam quality difference event type 3: the beam quality information of the first beam information is less than or equal to the sum of the reference beam quality information and the beam quality information of the second beam information; The beam quality difference event type 4: the beam quality information of the first beam information is greater than or equal to the sum of the reference beam quality information and the beam quality information of the second beam information; The beam quality difference event type 5: the difference between the beam quality information of the first beam information and the beam quality information of the third beam information satisfies the fourth preset condition; The beam quality difference event type 6: the average of the difference between the beam quality information of the first beam information and the beam quality information of the third beam information under the fifth preset condition satisfies the fourth preset condition; The beam quality difference event type 7: the beam quality information of the first beam information is less than or equal to the sum of the reference beam quality information and the beam quality information of the third beam information; The beam quality difference event type 8: the beam quality information of the first beam information is greater than or equal to the sum of the reference beam quality information and the beam quality information of the third beam information; The beam quality difference event type 9: the difference between the beam quality information of the first beam information and the beam quality information of the fourth beam information satisfies the fourth preset condition; The beam quality difference event type 10: the average of the difference between the beam quality information of the first beam information and the beam quality information of the fourth beam information under the fifth preset condition satisfies the fourth preset condition; Beam quality difference event type 11: the beam quality information of the first beam information is less than or equal to the sum of the reference beam quality information and the beam quality information of the fourth beam information; Beam quality difference event type 12: the beam quality information of the first beam information is greater than or equal to the sum of the reference beam quality information and the beam quality information of the fourth beam information; Beam quality difference event type 13: the difference between the beam quality information of the second beam information and the beam quality information of the third beam information satisfies the fourth preset condition; Beam quality difference event type 14: the average of the difference between the beam quality information of the second beam information and the beam quality information of the third beam information under the fifth preset condition satisfies the fourth preset condition; Beam quality difference event type 15: the beam quality information of the second beam information is less than or equal to the sum of the reference beam quality information and the beam quality information of the third beam information; Beam quality difference event type 16: the beam quality information of the second beam information is greater than or equal to the sum of the reference beam quality information and the beam quality information of the third beam information; Beam quality difference event type 17: the difference between the beam quality information of the second beam information and the beam quality information of the fourth beam information satisfies the fourth preset condition; Beam quality difference event type 18: the average of the difference between the beam quality information of the second beam information and the beam quality information of the fourth beam information under the fifth preset condition satisfies the fourth preset condition; Beam quality difference event type 19: the beam quality information of the second beam information is less than or equal to the sum of the reference beam quality information and the beam quality information of the fourth beam information; Beam quality difference event type 20: the beam quality information of the second beam information is greater than or equal to the sum of the reference beam quality information and the beam quality information of the fourth beam information; Beam quality difference event type 21: the difference between the beam quality information of the third beam information and the beam quality information of the fourth beam information satisfies the fourth preset condition; Beam quality difference event type 22: the average of the difference between the beam quality information of the third beam information and the beam quality information of the fourth beam information under the fifth preset condition satisfies the fourth preset condition; Beam quality difference event type 23: the beam quality information of the third beam information is less than or equal to the sum of the reference beam quality information and the beam quality information of the fourth beam information; Beam quality difference event type 24: the beam quality information of the third beam information is greater than or equal to the sum of the reference beam quality information and the beam quality information of the fourth beam information; Beam quality difference event type 25: the difference between the measurement result of the first beam information and the prediction result of the first beam information satisfies the fourth preset condition; Beam quality difference event type 26: the average of the difference between the measurement result of the first beam information and the prediction result of the first beam information under the fifth preset condition satisfies the fourth preset condition; The beam quality difference event type 27: a difference between the measurement result of the second beam information and the prediction result of the second beam information satisfies a fourth preset condition; The beam quality difference event type 28: a mean value of the difference between the measurement result of the second beam information and the prediction result of the second beam information under a fifth preset condition satisfies a fourth preset condition; The beam quality difference event type 29: a difference between the measurement result of the third beam information and the prediction result of the third beam information; The beam quality difference event type 30: a mean value of the difference between the measurement result of the third beam information and the prediction result of the third beam information under a fifth preset condition satisfies a fourth preset condition; The beam quality difference event type 31: a difference between the measurement result of the fourth beam information and the prediction result of the fourth beam information satisfies a fourth preset condition; The beam quality difference event type 32: a mean value of the difference between the measurement result of the fourth beam information and the prediction result of the fourth beam information under a fifth preset condition satisfies a fourth preset condition; The fourth preset condition includes at least one of the following: Greater than or equal to a preset threshold; Less than or equal to a preset threshold. The beam prediction performance monitoring apparatus of any one of claims 23-27, wherein, The first information includes at least one of the following: The beam prediction performance event; The number of times of occurrence of the beam prediction performance event; The beam prediction performance index corresponding to the beam prediction performance event. The beam prediction performance monitoring apparatus of any one of claims 23-27, wherein, In the case where the beam prediction performance event is associated with one or more target beam prediction performance events or target beam prediction performance indexes, the first information includes at least one of the following: The beam prediction performance event; The number of times of occurrence of the beam prediction performance event; The beam prediction performance index corresponding to the beam prediction performance event; The target beam prediction performance event; The number of times of occurrence of the target beam prediction performance event; The target beam prediction performance index; Wherein, the type of the target beam prediction performance event is different from the type of the beam prediction performance event, and the target beam prediction performance index is the beam prediction performance index corresponding to the target beam prediction performance event. The beam prediction performance monitoring apparatus of any one of claims 23-27, wherein, In the case where the beam prediction performance event is associated with multiple target beam prediction performance events or target beam prediction performance indexes, and the activated target beam prediction performance event or activated target beam prediction performance index in the multiple target beam prediction performance events is determined according to network configuration, The first information includes at least one of the following: The beam prediction performance event; The number of times of occurrence of the beam prediction performance event; The beam prediction performance index corresponding to the beam prediction performance event; The activated target beam prediction performance event; The number of times of occurrence of the activated target beam prediction performance event; The activated target beam prediction performance index; Wherein, the type of the target beam prediction performance event is different from the type of the beam prediction performance event, and the target beam prediction performance index is the beam prediction performance index corresponding to the target beam prediction performance event. The beam prediction performance monitoring apparatus of any one of claims 23-27, wherein, The sending module is further configured to In a case where the beam prediction performance event does not satisfy the first preset condition, and a target beam prediction performance index associated with the beam prediction performance event satisfies a preset condition corresponding to the target beam prediction performance index, or a target beam prediction performance event associated with the beam prediction performance event satisfies the first preset condition, a terminal reports second information, and the second information includes at least one of the following: the target beam prediction performance event; a number of times of occurrence of the target beam prediction performance event; the target beam prediction performance index; wherein the target beam prediction performance index is a beam prediction performance index corresponding to the target beam prediction performance event, and a type of the target beam prediction performance event is different from a type of the beam prediction performance event. A terminal, comprising a processor and a memory, wherein the memory stores programs or instructions executable on the processor, and the programs or instructions are executed by the processor to implement steps of the beam prediction performance monitoring method according to any one of claims 1 to 22. A readable storage medium, wherein the readable storage medium stores programs or instructions, and the programs or instructions are executed by a processor to implement steps of the beam prediction performance monitoring method according to any one of claims 1 to 22.
Citation Information
Patent Citations
Beam reporting method, beam information determining method and related equipment
CN114390580A
Communication method, terminal, network device and communication system
CN117378237A
Communication method, terminal, network device and communication system
CN117581581A
Method, device and computer storage medium of communication
WO2023236035A1